CN1407814A

CN1407814A - Image quality tester of electronic display device

Info

Publication number: CN1407814A
Application number: CN02129876A
Authority: CN
Inventors: 渡贯明男
Original assignee: Hitachi Kokusai Electric Inc
Current assignee: Hitachi Kokusai Electric Inc
Priority date: 2001-08-20
Filing date: 2002-08-20
Publication date: 2003-04-02
Anticipated expiration: 2022-08-20
Also published as: JP2003061115A; CN1283109C; KR20030016187A; KR100589109B1

Abstract

This invention provides an image quality inspection apparatus that can easily eliminate moire caused by an unemission part such as a barrier and an electrode or the like in a display device such as a plasma display device without using a high definition CCD camera and a high-speed image processor so as to detect a pixel defect such as a black point (unemitted pixel) or the like at a high-speed. The electronic display image quality inspection apparatus for imaging an electronic display screen to inspect a defect caused in pixels of an electronic display device by using the image, is provided with a means that moves an imaging element photographing the electronic displays screen by a prescribed distance in longitudinal and lateral directions, a means that integrates the image photographed by each movement in terms of frames, and a means that inspects a pixel defect of the electronic display device from the image whose frames are integrated.

Description

Image quality tester of electronic display device

Technical field

The present invention relates to a kind of image quality tester of electronic display device, its can the automatic inspection plasma scope etc. the display defect of electronic display unit.

Background technology

As an example of conventional art, will use the plasma scope image quality testing fixture of CCD (charge coupled cell) video camera to be illustrated in Fig. 3, below describe.

The 1st, electronic console devices such as plasma scope, the 2nd, the camera head of ccd video camera etc., the 3rd, to the signal generator of plasma scope displayed image, the 5th, from the photographs of plasma display picture, check the image processing apparatus of picture element flaw, the 6th, show or print the colour picture monitor of check result, the display unit of printer, the 7th, the operating means of this testing fixture.

In the past in the mode, as shown in Figure 3, with the whole display frame output at plasma scope 1 of the display pattern of display white, this image is taken in by the camera head 2 of ccd video camera etc., and sends to image processing apparatus 5 by signal generator 3.At 5 li stain display defects such as (the not pixels of sensitization) of checking this image of image processing apparatus.

But the light-emitting area of plasma scope 1, as shown in Figure 5, the dividing plate 1a of R, G, B light-emitting component and to connect the electrode 1b part of each light-emitting component not luminous.For this reason, with the video camera that has with the exploring degree of plasma scope exploring degree (resolution) equal extent, when taking in the light-emitting area of plasma scope 1, as shown in Figure 4, produce Moire fringe (interference fringe) phenomenon, be difficult to stain etc. not photosensitive pixel distinguish, therefore since flase drop etc. inspection brings obstacle to image quality.

In order to eliminate this Moire fringe phenomenon, just need a kind of mode, promptly, use is than the display display pixel number video camera of high-resolution more, perhaps consider to use the CCD component outline is carried out the video camera that half-pix moves the limit shooting with piezoelectric element, undertaken high-resolutionization by the image of being taken in, but in this mode, follow its pixel count of high-resolutionization also to increase, and be necessary with dividing plate, electrode etc. not luminous component and stain carry out separating treatment, so just need the high speed image processing unit of high price.

Summary of the invention

The object of the present invention is to provide a kind of image quality testing fixture, to eliminate these shortcomings, rely on this device, can not use high-precision ccd video camera and high speed image processing unit, just can eliminate the not Moire fringe phenomenon that produces of luminous component such as dividing plate in the display unit such as plasma scope, electrode at an easy rate, and can high speed detection go out stain pixel defectives such as (not photosensitive pixels).

The present invention in order to achieve the above object, a kind of image quality tester of electronic display device is provided, it takes in the picture of electronic console, and according to this image, check the defective that the pixel of electronic console produces, this device has: the imaging apparatus that will take in above-mentioned electronic console picture moves the device of preset distance in longitudinal and transverse direction, the image of absorption carries out the device of frame integration and from the device of the picture element flaw of the image inspection electronic console of this frame integration will this mobile at every turn the time.

And, a kind of image quality tester of electronic display device, it can take in the picture of electronic console, and according to this image, check the defective that the electronic console pixel produces, it has: the imaging apparatus that will take in above-mentioned electronic console picture longitudinal and transverse direction move preset distance device, detect and keep at every turn should be mobile the time institute's peaked device of the image of taking in and kept the peaked image device of inspection electronic console picture element flaw from detection.

Again, a kind of image quality tester of electronic display device, it can take in the picture of electronic console, and according to this image, check the defective that the electronic console pixel produces, it has: the time for exposure of the imaging apparatus of above-mentioned electronic console picture is taken in control, and in this exposure, with above-mentioned imaging apparatus longitudinal and transverse direction move preset distance device, from take in by above-mentioned imaging apparatus and come the image of integration according to the electric charge accumulation characteristic, check the device of the picture element flaw of electronic console.

Also have,, make making above-mentioned imaging apparatus just move the device of preset distance in longitudinal and transverse direction, at the 1/N pixel distance of the pel array spacing of longitudinal and transverse direction, above-mentioned imaging apparatus each move N time, count N ²Inferior device.

Its result, the light emitting pixel of plasma scope, with dividing plate or electrode etc. not the image level of luminous component average out, just can eliminate the Moire fringe phenomenon.

And, use maximum value detecting circuit to replace the frame integrating circuit also can eliminate the Moire fringe phenomenon.In addition, the time for exposure of control imaging apparatus is in exposure, by indulging. the imaging apparatus that transverse direction just moves every preset distance, can not use the frame integrating circuit, utilize the electric charge accumulation characteristic of imaging apparatus to make it carry out integration, can eliminate the Moire fringe phenomenon equally.

Description of drawings

Fig. 1 is the block diagram of an embodiment of expression plasma scope image quality testing fixture of the present invention.

Fig. 2 is principle is eliminated in expression according to a Moire fringe of the present invention processing mode key diagram.

Fig. 3 represents the block diagram of an example of plasma scope image quality testing fixture in the past.

Fig. 4 is the key diagram by the generation example of the generation Moire fringe phenomenon of ccd video camera absorption.

Fig. 5 is the key diagram of the not luminous component (electrode/dividing plate) etc. of expression plasma scope.

Label declaration

1: plasma scope 2: camera head (ccd video camera) 3: signal generator 4: frame integrating circuit 5: image processing apparatus 6: display unit 7: the piezoelectric element 9:CCD element of operating means 8:CCD video camera inside

The invention execution mode

Below, illustrate that with reference to Fig. 1 the present invention is applicable to an embodiment of plasma scope image quality testing fixture.

The 1st, electronic console devices, the 2nd such as plasma scope, camera heads such as ccd video camera, the 3rd make the signal generator, the 4th of plasma scope display image, and frame integrating circuit or maximum detect holding circuit, for example are made up of frame memory.If the frame integrating circuit when whenever reading in a two field picture, all repeats following action, that is, each pixel of the image of the image taken in and frame memory storage is carried out integration.If maximum detects holding circuit, when whenever reading in a two field picture, all repeat following action, that is, each pixel of the image of the image taken in and frame memory storage is all compared, then under the rank condition with higher with its updated stored.The 5th, from the frame integrated value or the maximum of the absorption image of plasma display picture, detect the image processing apparatus, the 6th of picture element flaw, show or print display unit, the 7th such as the colour picture monitor of testing result or printer, the operating means of this checkout gear.

Following with reference to Fig. 1, Fig. 2, describe this operation principle in detail.Fig. 2 is according to the present invention, and the figure of Moire fringe elimination principle is described, has shown 1 line waveform among Fig. 5 point A.

Here, export the display pattern of the white of the whole display surface that is shown in plasma scope by signal generator 3.And take in these images, and send to frame integrating circuit 4 by the camera head 2 of ccd video camera etc.

In 4 li in frame integrating circuit, one finishes reading in of 1 two field picture, just control the piezoelectric element 8 of camera head 2 inside, make CCD element 9 move the 1/N pixel unit of CCD pel array spacing in longitudinal and transverse direction, carry out the integration (perhaps detect keeping reading in the maximum of image) of each pixel and read in image with the image that read in last time, repeat this action again.

That is to say, with CCD element 9 longitudinal and transverse direction N time, the meter N ²The 1/N pixel unit (distance) of mobile inferiorly CCD pel array spacing reads in and frame integration (maximum detects and keeps) action to carry out image, exports to image processing apparatus 5 again.

Image processing apparatus 5, image behind the frame integration (maximum detects and keeps) and the defective judgment value SH that reserves are in advance compared, pixel below the setting is detected as defective (extinguishing pixel), and these defective datas of storage administration, display unit 6 exported to again.

Here, as shown in Figure 2, in the image of absorption, non-luminous partition part and non-luminous defect pixel part all show as low value, but because as mentioned above, CCD element 9 are being indulged. transverse direction, N time, meter N ²The 1/N pixel distance of mobile inferiorly CCD pel array spacing, read in and frame integration (maximum detects and keeps) to carry out image, therefore non-luminous partition part is eliminated, and only remaining non-luminous defect pixel part then can be used as defective and is detected below defective judgment value SH.

Display unit 6 shows this check result, prints as required etc.Operating means 7 is the devices that carry out the setting of the control of above-mentioned test beginning, end etc. and checks sequence.

And, in the foregoing description, used frame integrating circuit 4, but control the time for exposure of CCD element 9 in addition, the CCD element in the exposure is the same with above-mentioned situation, move in longitudinal and transverse direction, like this, can not use the frame integrating circuit, utilize the electric charge accumulation characteristic of CCD element to carry out integration, also can eliminate the Moire fringe phenomenon.

As above-mentioned illustrated, even there is not luminous component such as dividing plate, electrode in the display frames such as plasma scope, as shown in Figure 2, the limit can be moved the image of taking on CCD pixel limit and carry out the frame integration successively, be easy to eliminate the More like this and move the moving striation phenomenon, can only come out the defect pixel part as defects detection.

Claims

1, a kind of image quality tester of electronic display device, its picture to electronic console is made a video recording, and according to this image, check the defective of the pixel generation of electronic console, it is characterized in that having:, move the device of preset distance in longitudinal and transverse direction to the imaging apparatus that above-mentioned electronic console picture is made a video recording; The image of taking in when this is mobile at every turn carries out the device of frame integration; And the device of checking the picture element flaw of electronic console from the image of this frame integration.

2, a kind of image quality tester of electronic display device, the picture of its electronic console is made a video recording, and according to this image, check the defective of the pixel generation of electronic console, it is characterized in that having:, move the device of preset distance in longitudinal and transverse direction to the imaging apparatus that above-mentioned electronic console picture is made a video recording; Detect and keep the peaked device of each this mobile time image of taking in; And kept the peaked image from detection, check the device of electronic console picture element flaw.

3, a kind of image quality tester of electronic display device, the picture of its electronic console is made a video recording, and according to this image, check the defective of the pixel generation of electronic console, it is characterized in that having: the time for exposure of controlling the imaging apparatus that above-mentioned electronic console picture is made a video recording, and in this exposure, longitudinal and transverse direction move preset distance device, from take in by above-mentioned imaging apparatus and carry out according to the electric charge accumulation characteristic the image of integration, check the device of electronic console picture element flaw.

4, as any described image quality tester of electronic display device in the claim 1 to 3, it is characterized in that: above-mentioned imaging apparatus is moved the device of preset distance in direction in length and breadth, as 1/N pixel distance, just vertical every the pel array spacing of above-mentioned imaging apparatus. transverse direction move N time, count N ²Inferior mobile device.