CN1373886A - Electric circuit board, TFT array substrate using same, and liquid crystal display - Google Patents

Electric circuit board, TFT array substrate using same, and liquid crystal display Download PDF

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Publication number
CN1373886A
CN1373886A CN00812572A CN00812572A CN1373886A CN 1373886 A CN1373886 A CN 1373886A CN 00812572 A CN00812572 A CN 00812572A CN 00812572 A CN00812572 A CN 00812572A CN 1373886 A CN1373886 A CN 1373886A
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China
Prior art keywords
film
electrode
metal
tft array
wiring
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CN00812572A
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CN1225719C (en
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小川一文
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Panasonic Holdings Corp
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Matsushita Electric Industrial Co Ltd
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    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/12—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body
    • H01L27/1214—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs
    • H01L27/124—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs with a particular composition, shape or layout of the wiring layers specially adapted to the circuit arrangement, e.g. scanning lines in LCD pixel circuits
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
    • G02F1/1362—Active matrix addressed cells
    • G02F1/136286—Wiring, e.g. gate line, drain line
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/12—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/12—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body
    • H01L27/1214—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs
    • H01L27/1259—Multistep manufacturing methods
    • H01L27/1288—Multistep manufacturing methods employing particular masking sequences or specially adapted masks, e.g. half-tone mask
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/1333—Constructional arrangements; Manufacturing methods
    • G02F1/1345—Conductors connecting electrodes to cell terminals
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
    • G02F1/1362—Active matrix addressed cells
    • G02F1/136231—Active matrix addressed cells for reducing the number of lithographic steps
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
    • G02F1/1362—Active matrix addressed cells
    • G02F1/1368—Active matrix addressed cells in which the switching element is a three-electrode device

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Nonlinear Science (AREA)
  • Mathematical Physics (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Manufacturing & Machinery (AREA)
  • Liquid Crystal (AREA)
  • Thin Film Transistor (AREA)

Abstract

A TFT array substrate used for a liquid-crystal display panel is disclosed of which the manufacturing process is simplified and the manufacturing cost is reduced by reducing the number of masks used in manufacturing the TFT array substrate. A gate wiring metal film, a gate insulating film, a semiconductor film, and a contact electrode metal film are formed on a substrate surface. The contact electrode metal film, the semiconductor film, the gate insulating film, and the gate wiring metal film are sequentially etched by photolithography using a first pattern, and the gate wiring and a part of the side of the gate wiring metal film pattern which is to serve as a gate electrode are oxidized. A transparent conductive film is formed. The transparent conductive film, the contact electrode metal film, and a part of the semiconductor film are sequentially etched by photolithography using a second pattern.

Description

Circuit substrate, the tft array substrate that uses this substrate and liquid crystal indicator
Technical field
The present invention relates to can be applicable to neotectonics, the tft array substrate of using this structure, the liquid crystal indicator that uses this tft array substrate and their manufacture method of the circuit substrate of other purposes.
Background technology
In the past, TFT (the Thin Film Transistor that uses at color liquid crystal display arrangement; Thin film transistor (TFT)) in the manufacturing of array base palte, uses 5～9 pieces photomask, and, make and become numerous and diverse, so be difficult to reduce manufacturing cost because the many and corresponding manufacturing step of the use piece number of photomask is many.
On the other hand, in the manufacture process of diode array substrate, proposed the use piece number of photomask can be reduced to 2 pieces technology (special table clear 62-502361 communique (Japan)).But, since diode array substrate on performance than tft array substrate difference, so be unsuitable for colour television set.
Summary of the invention
Therefore, the objective of the invention is to, in the manufacture method of tft array substrate, provide the neotectonics of the use sheet number that can reduce photomask.
(1) relates to the circuit board structure that can be used for SIC (semiconductor integrated circuit) etc. for first invention that realizes this purpose.The following formation of first invention.
A kind of circuit substrate comprises: the X wiring that is formed respectively by same conductive metal film in the same plane on the insulativity substrate; And intermittently connected up by the Y with X wiring isolation of described X wiring cut-off with cross section that described X wiring intersects; The side and being insulated property of the upper surface film of described X wiring cover; Be electrically connected by the Y that forms on the described insulating film connection electrode that intermittently connects up between the X wiring cut-off that is covered by described insulating film, the interrupted wiring of the Y of isolation.
If it is this structure can be contained in the X line that can switch on, the circuit bank of Y line chiasma type in the extremely thin plane individually, therefore, integrated with this circuit can being carried out multilayer.Therefore, this structure makes the consistance of semiconductor devices very good, by adopting this structure, can improve the integrated level of semiconductor circuit etc. significantly.
In this structure, the insulating film of the side of described at least X wiring is the metal oxide film that described conductive metal film is carried out the oxidation gained, and described metal oxide film can be the anode oxide film that forms by anodizing.If anode oxide film, even Bao film so also can obtain good insulation performance.
The circuit board of said structure can be made according to following manufacture method high productivity ground.That is, this method comprises: first step, on the insulativity substrate, pile up the conductive metal rete; Second step is corroded described conductive metal rete, the cross section that intersects with X wiring and by described X wiring cut-off and described X wiring and be formed on simultaneously in the same plane with the connect up interrupted wiring of Y of isolation of X; Third step after described second step, carries out oxidation to the side and the upper surface of described X wiring, covers this side and upper surface with the metal oxide film of insulativity; And the 4th step, behind described third step, pile up the electric conductivity rete, so that cover described cross section at least, and make between the interrupted wiring of the Y that isolates by described X wiring cut-off and be electrically connected.
In this manufacture method, can carry out the oxidation of the X wiring in described the 2nd step by anodizing.If anodizing can have and select and only oxidation X wiring expeditiously.
The circuit board of said structure can be made with high productivity by following manufacture method.That is, this manufacture method comprises: first step, on the insulativity substrate, pile up conductive metal rete and insulativity rete at least successively; Second step, the layer that comprises described insulativity rete and described conductive metal rete is corroded, in same plane, X wiring and the cross section that intersects at described X wiring are formed in the same plane simultaneously by described X wiring cut-off and with the interrupted wiring of Y that the X wiring is isolated; Third step after described second step, carries out oxidation to the side of described X wiring, covers this side with the metal oxide film of insulativity; And the 4th step, behind described third step, pile up the electric conductivity rete, so that cover described cross section at least, and make between the interrupted wiring of the Y that isolates by described X wiring cut-off and be electrically connected.
In this manufacture method, can carry out the oxidation of the side of the X wiring in described second step by anodizing.
(2) the 2nd inventions relate to the bottom gate type tft array substrate that uses foregoing circuit, as the formation of getting off.
This bottom gate type tft array substrate comprises: gate electrode directly or by the interior rete that is coated be formed on the substrate, and the side covers with insulating film; Gate insulating film, lamination is on described gate electrode; Semiconductor film, lamination have source region, drain region and are folded in the channel region in two zones on described gate insulating film; The source electrode contact electrode, lamination is on the source region of described semiconductor film; The drain electrode contact electrode, lamination is on the drain region of described semiconductor film; Pixel capacitors is connected to the drain region of described semiconductor film by described drain electrode contact electrode; Grid wiring is connected to described gate electrode, and side and being insulated property of upper surface film cover; Source electrode intermittently connects up, and is formed in the same plane with described grid wiring, intersects with described grid wiring in same plane, is by described grid wiring at this cross part and cuts off the shape of isolating; And the source electrode connection electrode, will be cut off between the interrupted wiring of the source electrode of isolating to be electrically connected by grid wiring via the top of grid wiring.
If this structure can provide reliability good bottom gate type tft array substrate.
And described pixel capacitors and described source electrode line connection electrode can be made of the electrically conducting transparent membrane material of homogeneity.
And, intermittently the connect up orlop of zoning figure of the source electrode that the interrupted wiring of described source electrode is positioned at 5 layers of structure that each film of intermittently wiring of source electrode, gate insulating film, semiconductor film, contacting metal film, nesa coating constitutes; Described grid wiring is positioned at the orlop of the grid wiring zoning figure of 5 layers of structure that each film of grid wiring, gate insulating film, semiconductor film, contacting metal film, nesa coating constitutes; And interrupted wiring of described source electrode and described grid wiring are present in the same plane on the described substrate.
And the insulating film of the side of described at least grid wiring can be made of described conductive metal film.
And described oxide film can be the anode oxide film that forms by anodizing.
Described semiconductor film can form the double-layer structural of i type amorphous silicon layer and n type amorphous silicon layer.
In addition, also can use the conducting membrane material of light reflective to replace described electrically conducting transparent membrane material, can constitute the bottom gate type tft array substrate of reflection-type thus.
Above bottom gate type tft array substrate can be made according to the manufacture method high productivity ground of following formation.
Promptly, can make according to the manufacture method of bottom gate type tft array substrate, this method comprises: (A) step, on the insulativity substrate surface, pile up G-S metallic diaphragm, gate insulator rete, semiconductor film and the contacting metal rete that is used to form the interrupted wiring of gate electrode, grid wiring and source electrode at least successively; (B) step, after described (A) step, with the 1st resist figure, by photoetching process described each layer corroded to described insulativity substrate surface, form gate electrode zoning figure, grid wiring zoning figure, and source electrode dashed line zoning figure, gate electrode zoning graphics package contains gate electrode, the grid metal film of lamination successively thereon, gate insulating film, semiconductor film and contacting metal film, grid wiring zoning figure comprises the grid wiring that connects on the described gate electrode, the grid metal film of lamination successively thereon, gate insulating film, semiconductor film and contacting metal film, and source electrode dashed line zoning figure is included in the source electrode dashed line that is cut off isolation with the cross part of described grid wiring, the grid metal film of lamination successively thereon, gate insulating film, semiconductor film and contacting metal film; (C) step, after described (B) step, to described semiconductor film surface, the metal oxide film that oxidation generates electrical insulating property is carried out in the side to described gate electrode and grid wiring on described semiconductor film with the corrosion of the contacting metal membrane portions on the gate electrode zoning figure; (E) step after described (C) step, is piled up transparent conductive film layer from described contacting metal film on the whole surface of substrate, and the interrupted wiring of described at least source electrode is electrically connected by conducting film each other; And (F) step, after described (E) step,,, described transparent conductive film layer corrosion is formed pixel capacitors for the figure of regulation according to photoetching process with the 2nd resist figure, also by this corrosion, form the channel region that exposes simultaneously.
In this manufacture method, can carry out the oxidation of described grid wiring side by anodizing.
In addition, described semiconductor film is the double-layer structural of n type amorphous silicon layer and i type amorphous silicon layer, and the corrosion of the contacting metal membrane portions on the gate electrode zoning figure in described (F) step is that the part of the part of contacting metal film and coupled n type amorphous silicon layer is corroded to i type amorphous silicon layer.
In addition, conductive film layer that can the lamination light reflective replaces the described transparent conductive film layer in described (E) step.
(3) the 3rd inventions relate to the liquid crystal indicator that uses the bottom gate type tft array substrate, can followingly constitute.
A kind of liquid crystal indicator, with the face that forms TFT as the inboard, gap in accordance with regulations makes bottom gate type tft array substrate and counter substrate opposed, in this gap, keep liquid crystal, wherein, the bottom gate type tft array substrate comprises: directly or by primary coat apply gate electrode that rete forms and that the side covers with insulating film on substrate; The gate insulating film of lamination on described gate electrode; On described gate insulating film lamination, have source region and drain region and be interposed in the semiconductor film of the channel region in two zones; The source electrode contact electrode of lamination on the source region on the described semiconductor film; The drain electrode contact electrode of lamination on the drain region of described semiconductor film; Be connected to the pixel capacitors of the drain region of described semiconductor film by described drain electrode contact electrode; With the grid wiring that is connected to described gate electrode, side and upper surface are covered by insulating film; Be formed in the same plane with described grid wiring, in same plane, intersect, be the source electrode of isolating shape at this cross section and intermittently connect up by described grid wiring cut-out with described grid wiring; And the source electrode line connection electrode that makes electrical connection between the interrupted wiring of the source electrode that is cut off by grid wiring via the top of grid wiring.
In this structure, can add following structure.That is, can form the structure of protecting the surface of described FT array base palte with diaphragm, and described diaphragm can be silicon dioxide film or silicon nitride film.
Described pixel capacitors can be made of transparent metal film.
Described pixel capacitors can be made of the light reflective metal film.
(4) the 4th inventions (scheme 24-30) relate to the bottom gate type tft array substrate, by following formation.
(scheme 24)
A kind of bottom gate type tft array substrate comprises intermittently wiring of source electrode, grid wiring, gate insulating film, semiconductor film and reflection pixel metal electrode group, it is characterized in that,
At least the side of gate electrode and grid wiring is oxidized, reflection pixel metal electrode is the double-layer structural of contacting metal electrode and other metal electrode films, be connected to the drain region of TFT by the contacting metal electrode, source electrode intermittently connects up by contacting metal electrode and this two-layer source region that is connected to TFT of metal electrode.
(scheme 25)
Bottom gate type tft array substrate as scheme 24 is characterized in that, reflection pixel metal electrode group is the alloy of aluminium or aluminium system.
(scheme 26)
Bottom gate type tft array substrate as scheme 24 is characterized in that, the part of the interrupted wiring of source electrode is the double-layer structural of the metal electrode film of contact electrode metal film and aluminium system.
(scheme 27)
Bottom gate type tft array substrate as scheme 24 is characterized in that, forms gate insulating film and semiconductor film between gate electrode metal and contacting metal electrode film.
(scheme 28)
Bottom gate type tft array substrate as scheme 24 is characterized in that, the interrupted wiring of source electrode is cut off by grid wiring, comes cross connection by contacting metal electrode and metal electrode are two-layer on grid wiring.
(scheme 29)
Bottom gate type tft array substrate as scheme 24 is characterized in that, the part of semiconductor film is i type layer and n +The double-layer structural of type layer.
(scheme 30)
Bottom gate type tft array substrate as scheme 24 is characterized in that, forms end coated film between insulativity substrate surface and grid wiring metal film.
(5) the 5th invention (scheme 31-35) following formations.
(scheme 31)
A kind of manufacture method of bottom gate type tft array substrate comprises: the step that forms grid wiring metal film, gate insulating film and semiconductor film at least on the insulativity substrate surface; Corrode the step of described semiconductor film, gate insulating film and grid wiring metal film successively with the 1st figure with photoetching process; The step that oxidation is carried out in the side of grid wiring metal film figure that becomes grid wiring and gate electrode part; Form the step of contact electrode metal film and metal electrode film; And the step of corroding the part of described metal electrode film, contact electrode metal film and semiconductor film with photoetching process with the 2nd figure.
(scheme 32)
Manufacture method as the bottom gate type tft array substrate of scheme 31 is characterized in that, as the metal electrode film, forms the alloy film of aluminium film or aluminium system.
(scheme 33)
Manufacture method as the bottom gate type tft array substrate of scheme 31 is characterized in that, is included in the step of the silica-based end coated film of formation between insulativity substrate surface and the grid wiring metal film.
(scheme 34)
Manufacture method as the bottom gate type tft array substrate of scheme 31 is characterized in that, as the grid wiring metal film, forms the alloy film of aluminium system at least.
(scheme 35)
Manufacture method as the bottom gate type tft array substrate of scheme 31 is characterized in that, in oxidation step, uses anodizing in neutral solution.
(5) the 5th invention (scheme 36-38) following formations.
(scheme 36)
A kind of liquid crystal indicator, it is characterized in that, color filter one side of the filter substrate of the array side of bottom gate type tft array substrate and the opposed transparency electrode of formation is opposed, keep predetermined gap to fit, in described gap, insert and put liquid crystal as alignment films, wherein, in bottom gate type tft array substrate side, at least gate electrode and grid wiring side are oxidized, reflection pixel metal electrode is the double-layer structural of contacting metal electrode and other metal electrode films, be connected to the drain region of TFT by the contacting metal electrode, source electrode intermittently connects up by contacting metal electrode and the two-layer source region that is connected to TFT of metal electrode.
(scheme 37)
Liquid crystal indicator as scheme 36 is characterized in that, the protected film of the part of tft array covers at least.
(scheme 38)
Liquid crystal indicator as scheme 37 is characterized in that, diaphragm is an inorganics.
(6) the 6th invention (scheme 39-41) following formations.
(scheme 39)
A kind of manufacture method of liquid crystal indicator, it is characterized in that, comprising: by on the insulativity substrate surface, forming the step of grid wiring metal film and gate insulating film and semiconductor film at least, use photoetching process to form the step of described semiconductor film and gate insulating film and grid wiring metal film successively by the 1st figure, to grid wiring with become the step that oxidation is carried out in the side of the grid wiring metal film figure of gate electrode part, form the step of contact electrode metal film and metal electrode film, the step of with the 2nd figure the part of described metal electrode film and contact electrode metal film and semiconductor film being corroded with photoetching process is made the step of bottom gate type tft array substrate; Form the step of alignment films more thereon; Form opposed transparency electrode and on the opposite electrode side surface of filter substrate, form the step of alignment films and described two alignment films keep predetermined gap with the inboard respectively and with the bond step of fixing periphery of position alignment; And the step of between the described the 1st and the 2nd substrate, injecting the liquid crystal of regulation.
(scheme 40)
Manufacture method as the liquid crystal indicator of scheme 39 is characterized in that comprising, after the step of making the bottom gate type tft array substrate, covers the step of the part of described tft array at least with diaphragm before forming alignment films.
(scheme 41)
Manufacture method as the liquid crystal indicator of scheme 39 is characterized in that metal electrode and contacting metal electrode are formed at one deck by identical material.
(7) the 7th invention (scheme 42-47) following formations.
(scheme 42)
A kind of bottom gate type tft array substrate comprises intermittently wiring of source electrode, grid wiring, gate insulating film, semiconductor film and comb shape pixel capacitors group, it is characterized in that,
At least oxidation is carried out in gate electrode and grid wiring side and the 1st comb shape pixel capacitors side, the 2nd comb shape pixel metal electrode is connected to the drain region of TFT through the contact electrode metal, and the interrupted wiring of source electrode is connected to the source region of TFT through contact electrode metal and metal electrode.
(scheme 43)
Bottom gate type tft array substrate as scheme 42 is characterized in that, the oxide film of 4 of gate electrodes and the 1st comb shape pixel capacitors side is an anode oxide film.
(scheme 44)
Bottom gate type tft array substrate as scheme 42 is characterized in that, five layers of structure that the part of the interrupted wiring of source electrode and the 1st comb shape pixel capacitors become grid wiring metal film, semiconductor film, contact electrode metal film and metal electrode film.
(scheme 45)
Bottom gate type tft array substrate as scheme 42 is characterized in that, forms the contact electrode metal in the junction of semiconductor film and comb poles.
(scheme 46)
Bottom gate type tft array substrate as scheme 42 is characterized in that, the interrupted wiring of source electrode is cut off, carried out cross connection through contact electrode metal and metal electrode on grid wiring and the 1st comb poles by grid wiring and the 1st comb poles.
(scheme 47)
Bottom gate type tft array substrate as scheme 42 is characterized in that, the part of semiconductor film is the double-layer structural of i type layer and n type layer.
(scheme 48)
Bottom gate type tft array substrate as scheme 42 is characterized in that, forms end coated film between insulativity substrate surface and grid wiring metal film.
(8) the 8th invention (scheme 49-53) following formations.
(scheme 49)
A kind of manufacture method of bottom gate type tft array substrate is characterized in that, comprising: the step that forms grid wiring metal film, gate insulating film, semiconductor film and contact electrode metal film at least on the insulativity substrate surface; Corrode the step of described contact electrode metal film, semiconductor film, gate insulating film and grid wiring metal film successively with the 1st figure with photoetching process; To grid wiring, gate electrode with become the step that oxidation is carried out in the side of the metal film figure of the 1st comb shape pixel capacitors part; Form the step of metal electrode film; And the step of corroding the part of described metal electrode film, contact electrode metal film and semiconductor film with photoetching process with the 2nd figure successively.
(scheme 50)
Manufacture method as the bottom gate type tft array substrate of scheme 49 is characterized in that, grid wiring and gate electrode and the part that becomes the 1st comb shape pixel capacitors are corroded simultaneously.
(scheme 51)
Manufacture method as the bottom gate type tft array substrate of scheme 49 is characterized in that, is included in the step that forms end coated film between insulativity substrate surface and the grid wiring metal film.
(scheme 52)
Manufacture method as the bottom gate type tft array substrate of scheme 49 is characterized in that, forms grid wiring metal film, gate insulating film and semiconductor film at least continuously.
(scheme 53)
Manufacture method as the bottom gate type tft array substrate of scheme 49 is characterized in that, uses anodizing in oxidation step.
(9) the 9th invention (scheme 54-56) following formations.
(scheme 54)
A kind of liquid crystal indicator, it is characterized in that, the electrode side of bottom gate type tft array substrate and the color filter side of filter substrate are opposed, keep predetermined gap and applying, in described gap, insert and put liquid crystal as alignment films, wherein, in the bottom gate type tft array substrate, at least gate electrode, grid wiring side and the 1st comb poles side are oxidized, the 2nd comb shape pixel metal electrode is connected to the drain region of TFT through the contact electrode metal, and the interrupted wiring of source electrode is connected to the source region of TFT through contact electrode metal and metal electrode.
(scheme 55)
Liquid crystal indicator as scheme 54 is characterized in that, the protected film of the part of tft array covers at least.
(scheme 56)
Liquid crystal indicator as scheme 55 is characterized in that, diaphragm is an inorganics.
(10) the 10th invention (scheme 57-58) following formations.
(scheme 57)
A kind of manufacture method of liquid crystal indicator, it is characterized in that comprising, by on the insulativity substrate surface, forming the grid wiring metal film at least, gate insulating film, the step of semiconductor film and contact electrode metal film, corrode described contact electrode metal film with photoetching process successively with the 1st figure, semiconductor film, the step of gate insulating film and grid wiring metal film, to grid wiring, gate electrode and become the step that oxidation is carried out in the side of the metal film figure of the 1st comb shape pixel capacitors part, form the step of metal electrode film, corrode described metal electrode film successively with the 2nd image with photoetching process, the step of the part of contact electrode metal film and semiconductor film is made the step of bottom gate type tft array substrate; And the step that forms alignment films thereon; Form the step of alignment films on the surface of filter substrate and make described two alignment films keep predetermined gap and position alignment is carried out the fixing step of periphery with the inboard respectively; And the step of between the described the 1st and the 2nd substrate, injecting the liquid crystal of regulation.
(scheme 58)
Manufacture method as the liquid crystal indicator of scheme 57 is characterized in that, comprising: after the step of making the bottom gate type tft array substrate, before forming alignment films, cover the step of the part of described tft array at least with diaphragm; And as mask metal electrode film, contact electrode metal film, semiconductor film and gate insulating film are corroded and step that the grid wiring terminal is exposed with this diaphragm.
(scheme 59)
Manufacture method as the liquid crystal indicator of scheme 58; it is characterized in that; after the step of making the bottom gate type tft array substrate; before forming alignment films; part to the described tft array of major general is covered by diaphragm; as mask and corrode the grid wiring terminal is exposed, form silicon dioxide film or silicon nitride film with this diaphragm as diaphragm.
(11) the 11st invention (scheme 60-66) following formations.
(scheme 60)
A kind of bottom gate type tft array substrate, comprise intermittently wiring of source electrode, grid wiring, gate insulating film, semiconductor film and comb shape pixel metal electrode group, it is characterized in that, at least gate electrode and grid wiring side are oxidized, comb shape reflection pixel metal electrode is the double-layer structural of contacting metal electrode and other metal electrode films, be connected to the drain region of TFT by the contacting metal electrode, source electrode intermittently connects up by contacting metal electrode and the two-layer source region that is connected to TFT of metal electrode.
(scheme 61)
Bottom gate type tft array substrate as scheme 60 is characterized in that, uses the metal of aluminium system on gate electrode, and the dielectric film of side is an anode oxide film.
(scheme 62)
Bottom gate type tft array substrate as scheme 60 is characterized in that, the part of the interrupted wiring of source electrode is five layers of structure of grid wiring metal film, gate insulating film, semiconductor film, contact electrode metal film and metal electrode film.
(scheme 63)
Bottom gate type tft array substrate as scheme 60 is characterized in that, forms the contacting metal electrode between source electrode, comb poles and semiconductor film.
(scheme 64)
Bottom gate type tft array substrate as scheme 60 is characterized in that, the interrupted wiring of source electrode is cut off by grid wiring, carries out cross connection by contacting metal electrode and metal electrode are two-layer on grid wiring.
(scheme 65)
Bottom gate type tft array substrate as scheme 60 is characterized in that, the part of semiconductor film is the double-layer structural of i type layer and n type layer.
(scheme 66)
Bottom gate type tft array substrate as scheme 60 is characterized in that, forms end coated film between insulativity substrate surface and grid wiring metal film.
(12) the 12nd inventions (scheme 67-71)
(scheme 67)
A kind of manufacture method of bottom gate type tft array substrate is characterized in that, comprising: the step that forms grid wiring metal film, gate insulating film and semiconductor film at least on the insulating film substrate surface; Corrode the step of described semiconductor film, gate insulating film and grid wiring metal film successively with the 1st figure with photoetching process; To grid wiring, gate electrode with become the step that oxidation is carried out in the side of the grid wiring metal film figure of the 1st comb poles part; Form the step of contact electrode metal film and metal electrode film; And the step of corroding the part of described metal electrode film, contact electrode metal film and semiconductor film with photoetching process with the 2nd figure.
(scheme 68)
Manufacture method as the bottom gate type tft array substrate of scheme 67 is characterized in that semiconductor film is the double-layer structural of i type layer and n type layer, and the part of n type layer is corroded to i type layer.
(scheme 69)
Manufacture method as the bottom gate type tft array substrate of scheme 67 is characterized in that, is included in the step that forms end coated film between insulativity substrate surface and the grid wiring metal film.
(scheme 70)
Manufacture method as the bottom gate type tft array substrate of scheme 67 is characterized in that, forms grid wiring metal film, gate insulating film and semiconductor film at least continuously.
(scheme 71)
Manufacture method as the bottom gate type tft array substrate of scheme 67 is characterized in that, uses anodizing in oxidation step.
(13) the 13rd invention (scheme 72-74) following formations.
(scheme 72)
A kind of liquid crystal indicator, it is characterized in that, color filter one side of the filter substrate of the array side of bottom gate type tft array substrate and the opposed transparency electrode of formation is opposed, keep predetermined gap to fit, in described gap, insert and put liquid crystal as alignment films, wherein, in bottom gate type tft array substrate side, at least gate electrode and grid wiring side are oxidized, the 1st comb shape pixel metal electrode is the double-layer structural of contacting metal electrode and other metal electrode films, be connected to the drain region of TFT by the contacting metal electrode, source electrode intermittently connects up by contacting metal electrode and the two-layer source region that is connected to TFT of metal electrode.
(scheme 73)
Liquid crystal indicator as scheme 72 is characterized in that, the protected film of the part of tft array covers at least.
(scheme 74)
Liquid crystal indicator as scheme 72 is characterized in that, diaphragm is an inorganics.
(14) the 14th invention (scheme 75-77) following formations.
(scheme 75)
A kind of manufacture method of liquid crystal indicator, it is characterized in that, comprise: by on the insulativity substrate surface, forming the grid wiring metal film at least, the step of gate insulating film and semiconductor film, corrode described semiconductor film with photoetching process successively with the 1st figure, the step of gate insulating film and grid wiring metal film, to grid wiring, gate electrode and become the step that oxidation is carried out in the side of the grid wiring metal film figure of the 1st comb poles part, form the step of contact electrode metal film and metal electrode film, corrode described metal electrode film with the 2nd figure with photoetching process, the step of the part of contact electrode metal film and semiconductor film is made the step of bottom gate type tft array substrate; Form the step of alignment films more thereon; The step and described two alignment films that form alignment films on the opposite electrode side surface of filter substrate keep predetermined gap and position alignment are engaged fixing peripheral step with the inboard respectively; And the step of between the described the 1st and the 2nd substrate, injecting the liquid crystal of regulation.
(scheme 76)
Manufacture method as the liquid crystal indicator of scheme 75 is characterized in that, be included in the step of making the bottom gate type tft array substrate after, the step that before forming alignment films, covers with diaphragm to the part of the described tft array of major general.
(scheme 77)
Manufacture method as the liquid crystal indicator of scheme 75 is characterized in that metal electrode and contacting metal electrode form with one deck with identical material.
(15) the 15th invention (scheme 78-84) following formations.
(scheme 78)
A kind of bottom gate type tft array substrate, comprise intermittently wiring of source electrode, grid wiring, gate insulating film, semiconductor film and comb shape pixel capacitors group, it is characterized in that, at least the side of gate electrode and grid wiring is oxidized, the 1st comb shape pixel capacitors is connected to the drain region of TFT by the contacting metal electrode, the interrupted wiring of source electrode is connected to the source region of TFT by contacting metal electrode and metal electrode, and forms the 2nd comb shape opposite electrode by dielectric film.
(scheme 79)
Bottom gate type tft array substrate as scheme 78 is characterized in that the oxide film of gate electrode side is an anode oxide film.
(scheme 80)
Bottom gate type tft array substrate as scheme 78 is characterized in that, the part of the interrupted wiring of source electrode becomes five layers of structure of grid wiring metal film, semiconductor film, contact electrode metal film and metal electrode film.
(scheme 81)
Bottom gate type tft array substrate as scheme 78 is characterized in that, forms the contact electrode metal between semiconductor film, source electrode and drain electrode.
(scheme 82)
Bottom gate type tft array substrate as scheme 78 is characterized in that, the interrupted wiring of source electrode is cut off by grid wiring, carries out cross connection by contact electrode metal and metal electrode on grid wiring.
(scheme 83)
Bottom gate type tft array substrate as scheme 78 is characterized in that, the part of semiconductor film is the double-layer structural of i type layer and n type layer.
(scheme 84)
Bottom gate type tft array substrate as scheme 78 is characterized in that, forms end coated film between insulativity substrate surface and grid wiring metal film.
(16) the 16th invention (scheme 85-89) following formations.
(scheme 85)
A kind of manufacture method of bottom gate type tft array substrate is characterized in that, comprising: the step that forms grid wiring metal film, gate insulating film, semiconductor film and contact electrode metal film at least on the insulativity substrate surface; Corrode the step of described contact electrode metal film, semiconductor film, gate insulating film and grid wiring metal film successively with the 1st figure with photoetching process; To grid wiring with become the step that oxidation is carried out in the side of the metal film figure of gate electrode part; Form the step of metal electrode film; Corrode the step of the part of described metal electrode film, contact electrode metal film and semiconductor film successively with the 2nd figure with photoetching process; And the step that forms the 2nd comb shape opposite electrode by dielectric film with the 3rd figure.
(scheme 86)
Manufacture method as the bottom gate type tft array substrate of scheme 85 is characterized in that semiconductor film is the double-layer structural of i type layer and n type layer, and the part of n type layer is corroded.
(scheme 87)
Manufacture method as the bottom gate type tft array substrate of scheme 85 is characterized in that, is included in the step that forms end coated film between insulativity substrate surface and the grid wiring metal film.
(scheme 88)
Manufacture method as the bottom gate type tft array substrate of scheme 85 is characterized in that, forms grid wiring metal film, gate insulating film and semiconductor film at least continuously.
(scheme 89)
Manufacture method as the bottom gate type tft array substrate of scheme 85 is characterized in that, uses anodizing in oxidation step.
(17) the 17th invention (scheme 90-92) following formations.
(scheme 90)
A kind of liquid crystal indicator, it is characterized in that, color filter one side of the filter substrate of the array side of bottom gate type tft array substrate and the opposed transparency electrode of formation is opposed, keep predetermined gap to fit, in described gap, insert and put liquid crystal as alignment films, wherein, in bottom gate type tft array substrate side, at least gate electrode and grid wiring side are oxidized, the 1st comb shape pixel metal electrode is connected to the drain region of TFT by the contact electrode metal, the interrupted wiring of source electrode is connected to the source region of TFT by contacting metal electrode and metal electrode, and is formed with the 2nd comb shape opposite electrode by dielectric film.
(scheme 91)
Liquid crystal indicator as scheme 90 is characterized in that, the protected film of the part of tft array covers at least.
(scheme 92)
Liquid crystal indicator as scheme 90 is characterized in that, diaphragm is an inorganics.
(18) the 18th invention (scheme 93-95) following formations.
(scheme 93)
A kind of manufacture method of liquid crystal indicator is characterized in that comprising: by form the step of grid wiring metal film, gate insulating film semiconductor film and contact electrode metal film at least on the insulativity substrate surface; Corrode the step of contact electrode metal film, described semiconductor film, gate insulating film and grid wiring metal film successively with the 1st figure with photoetching process, to grid wiring, gate electrode with become the step that oxidation is carried out in the side of the grid wiring metal film figure of the 1st comb poles part, form the step of metal electrode film, corrode the step of the part of described metal electrode film, contact electrode metal film and semiconductor film with photoetching process successively with the 2nd figure, the step that forms the 2nd comb shape opposite electrode with the 3rd figure by diaphragm is made the step of bottom gate type tft array substrate; Form the step of alignment films more thereon; The step and described two alignment films that form alignment films on the opposite electrode side surface of filter substrate keep predetermined gap and position alignment are engaged fixing peripheral step with the inboard respectively; And the step of between the described the 1st and the 2nd substrate, injecting the liquid crystal of regulation.
(scheme 94)
Manufacture method as the liquid crystal indicator of scheme 93 is characterized in that, be included in form the 2nd comb shape opposite electrode after, the step that covers with diaphragm to the part of described the 2nd comb shape opposite electrode of major general.
(scheme 95)
Manufacture method as the liquid crystal indicator of scheme 93 is characterized in that, forms silicon dioxide film or silicon nitride film as diaphragm.
(19) the 19th invention (scheme 96-97) following formations.
(scheme 96)
A kind of bottom gate type tft array substrate, comprise intermittently wiring of source electrode, grid wiring, gate insulating film, semiconductor film and comb shape pixel capacitors group, it is characterized in that, at least the side of gate electrode and grid wiring is oxidized, the 1st comb shape pixel metal electrode is connected to the drain region of TFT by the double-layer structural of contacting metal electrode, the interrupted wiring of source electrode is connected to the source region of TFT by contact electrode metal and metal electrode, and forms the 2nd comb shape opposite electrode by dielectric film.
(scheme 97)
Bottom gate type tft array substrate as scheme 96 is characterized in that, the interrupted wiring of source electrode is connected by the double-layer structural of metal electrode with the contact electrode metal at least.
(20) the 20th invention (scheme 98) following formations.
(scheme 98)
A kind of manufacture method of bottom gate type tft array substrate is characterized in that, comprising: the step that forms grid wiring metal film, gate insulating film and semiconductor film at least on the insulativity substrate surface; Corrode the step of described semiconductor film, gate insulating film and grid wiring metal film successively with the 1st figure with photoetching process; To grid wiring with become the step that oxidation is carried out in the side of the metal film figure of gate electrode part; Form the step of contact electrode metal film and metal electrode film; Corrode the step of the part of described metal electrode film, contact electrode metal film and semiconductor film successively with the 2nd figure with photoetching process; And the step that forms the 2nd comb shape opposite electrode by dielectric film with the 3rd figure.
(21) the 21st invention (scheme 99) following formations.
(scheme 99)
A kind of liquid crystal indicator, it is characterized in that, color filter one side of the electrode side of bottom gate type tft array substrate and filter substrate is opposed, keep predetermined gap to fit, in described gap, insert and put liquid crystal as alignment films, wherein, in bottom gate type tft array substrate side, at least gate electrode and grid wiring side are oxidized, the 1st comb shape pixel metal electrode is connected to the drain region of TFT by the contacting metal electrode, the interrupted wiring of source electrode is connected to the source region of TFT by contact electrode metal and 2 layers of structure of metal electrode, and forms the opposite electrode of the 2nd comb shape by dielectric film.
(22) the 22nd invention (scheme 100-101) following formations.
(scheme 100)
A kind of manufacture method of liquid crystal indicator, it is characterized in that comprising: by on the insulativity substrate surface, forming the grid wiring metal film at least, the step of gate insulating film and semiconductor film, corrode described semiconductor film with photoetching process successively with the 1st figure, the step of gate insulating film and grid wiring metal film, to grid wiring with become the step that oxidation is carried out in the side of the metal film figure of gate electrode part, form the step of contact electrode metal film and metal electrode film, corrode described metal electrode film with photoetching process successively with the 2nd figure, the step of the part of contact electrode metal film and semiconductor film, and the step of making the bottom gate type tft array substrate by the step that diaphragm forms the 2nd comb shape opposite electrode with the 3rd figure; Form the step of alignment films more thereon; The step and described two alignment films that form alignment films on color filter one side surface of filter substrate keep predetermined gap and position alignment are engaged fixing peripheral step with the inboard respectively; And the step of between the described the 1st and the 2nd substrate, injecting the liquid crystal of regulation.
(scheme 101)
Manufacture method as the liquid crystal indicator of scheme 100 is characterized in that, comprises the step that covers the part of described at least the 2nd comb shape opposite electrode with diaphragm.
Description of drawings
Fig. 1 is the diagrammatic cross-section of manufacturing step of the circuit board of explanation embodiment of the invention 1-1.
Fig. 2 is the planimetric map that is illustrated among the embodiments of the invention 1-1 state of the substrate surface after corroding with the first resist figure.
Fig. 3 is illustrated in the planimetric map of piling up conductive film stratiform condition among the embodiments of the invention 1-1 on the whole base plate surface.
Fig. 4 is the planimetric map that is illustrated in the figure that among the embodiments of the invention 1-1 electric conductivity rete on the substrate is processed into regulation (Y intermittently connect up connection electrode) situation.
Fig. 5 is the step diagrammatic cross-section of manufacturing step of the tft array of explanation embodiment of the invention 2-1.
Fig. 6 is the step diagrammatic cross-section of manufacturing step of the tft array of explanation embodiment of the invention 2-1.
Fig. 7 is a plane model figure of observing Fig. 6 (b) from the top.
Fig. 8 is the step diagrammatic cross-section of manufacturing step of the tft array of explanation embodiment of the invention 2-1.
Fig. 9 is the step diagrammatic cross-section of manufacturing step of the tft array of explanation embodiment of the invention 2-1.
Figure 10 is the step diagrammatic cross-section of manufacturing step of the tft array of explanation embodiment of the invention 2-1.
Figure 11 is the step diagrammatic cross-section of manufacturing step of the tft array of explanation embodiment of the invention 2-1.
Figure 12 is the plane model figure of the tft array substrate of embodiment 2-1.
Figure 13 is the diagrammatic cross-section of the liquid crystal indicator of explanation embodiment of the invention 2-2.
Figure 14 is the figure of manufacturing step of the tft array of explanation embodiment of the invention 2-3.
Figure 15 is the figure of manufacturing step of the tft array of explanation embodiment of the invention 2-3.
Figure 16 is the figure of manufacturing step of the tft array of explanation embodiment of the invention 2-3.
Figure 17 is the figure of manufacturing step of the tft array of explanation embodiment of the invention 2-3.
Figure 18 is the figure of manufacturing step of the tft array of explanation embodiment of the invention 2-3.
Figure 19 is the figure of manufacturing step of the tft array of explanation embodiment of the invention 2-3.
Figure 20 is the figure of manufacturing step of the tft array of explanation embodiment of the invention 2-3.
Figure 21 is the diagrammatic cross-section of the liquid crystal indicator of explanation embodiment of the invention 2-4.
Figure 22 is the diagrammatic cross-section of the TFT of embodiment of the invention 2-5.
Figure 23 is the diagrammatic cross-section of the TFT of embodiment of the invention 2-7.
Figure 24 is the diagrammatic cross-section of the TFT of embodiment of the invention 2-9.
Figure 25 is the diagrammatic cross-section of the TFT of embodiment of the invention 2-11.
Figure 26 is the overall diagram of the tft array substrate of embodiment of the invention 2-1.
Embodiment
Below, specify content of the present invention according to embodiment.
(embodiment 1-1)
The transparent glass substrate (insulativity substrate) 101 that preparation was well cleaned is in advance piled up the silicon dioxide (SiO that applies rete 102 as primary coat with the CVD method with 0.4 micron thickness 2) rete.Then, with Al-Zr (97: 3) the alloy rete about sputtering method plating formation thickness 200nm.As the metallic diaphragm 103 that forms X wiring and the interrupted wiring of Y.Subsequently, use plasma CVD method to pile up the SiN of 150nm xFilm is as insulating film layer 104 (Fig. 1).
Then, use the first resist figure 105 (Fig. 1), corrode on insulating film layer 104 by photoetching process, apply rete 102 until reaching primary coat, intermittently being connected up by X wiring cut-off and the Y that formed the gap shape between X wiring and the interrupted wiring of Y with X wiring 106, with the cross part of X wiring 107 is formed on (Fig. 2) on the substrate by figure.
Then, whole base plate is immersed in the pH that uses boric acid ammonia to be about in 7 the electrolytic solution, only make the method (anodizing) of X wiring energising come the side of oxidation X wiring with periphery, form metal oxide film 106 ' (the principal ingredient Al of insulativity in the side from substrate 2O 3).
Then, on insulativity rete 104, pile up for example electric conductivity rete 108 of tin indium oxide (ITO) formation, so that with X wiring and the interrupted gap landfill (Fig. 3) that connects up of Y on the whole base plate surface.Then, use the second resist figure, as shown in Figure 4, unwanted conducting film on the dielectric film is corroded, form the Y connection electrode 109 that intermittently connects up.By this corrosion, disconnect the conducting between the interrupted wiring of adjacent Y of parallel arranged, and finish by the Y connection electrode 109 that intermittently connects up and carry out circuit board at the XY cross part embodiment 1-1 that the conducting (connections) between the interrupted wiring is constructed by the Y of X wiring cut-off.
(embodiment 1-2)
Do not pile up insulating film layer in embodiment 1-2, and use the described first resist figure 105 on metallic diaphragm 103, metallic diaphragm 103 is corroded, apply rete 102 until reaching primary coat, making not, the X wiring and the Y of lamination dielectric film intermittently connect up.
Then, use the anode oxidation method identical, carry out the oxidation of X wiring, use Al with the foregoing description 1-1 2O 3Cover the side and the upper surface of X wiring for the oxide film of principal ingredient.According to the method identical with the foregoing description 1-1, the reason that the side and the upper surface of X wiring carried out oxidation is, and is different with the situation of embodiment 1-1 in embodiment 1-2, do not cover metallic diaphragm 103 with insulating film layer 104.
Then, on the whole surface of this substrate, pile up electric conductivity rete (for example using ITO, Al etc.), same with embodiment 1-1 then, use the second resist figure, remove unwanted conductive film layer by corrosion.Thus, finish the conducting between the interrupted wiring of the adjacent Y that does not have parallel arranged, the circuit board of the embodiment 1-2 that between the interrupted wiring of the Y that the XY cross part cuts off, connects by conductive film.
In embodiment 1-1 and 1-2, with anodizing metallic film surface is carried out oxidation, and if this method, owing to can only in X wiring, form the dielectric film of metal oxide film formation selectively, so the throughput rate height.
In above-mentioned Fig. 4, the banded connection electrode that formation is intermittently connected up along Y, but be not limited thereto, for example, by changing the shape of the above-mentioned second resist figure, the connection electrode figure that forms the square shape that only covers the cross section that X wiring and Y connect up or toroidal is also passable.
(embodiment 2-1)
Prepare the good in advance transparent glass substrate (insulativity substrate) 201 that cleans, apply rete 202, pile up 0.4 micron silicon dioxide (SiO with the CVD method as primary coat 2) film.Then, Al-Zr (97: 3) alloy plating is formed up to thickness about 200nm, the G-S metallic diaphragm 203 that intermittently connects up and use as gate electrode and grid wiring and source electrode with sputtering method.Then, pile up the SiN of 150nm with plasma CVD method xFilm is as gate insulator rete 204.Then, pile up amorphous silicon free from foreign meter (the i type a-Si) film 205 of 50nm, the amorphous silicon (n that contains n type impurity of 50nm continuously +A-Si) rete 206, as semiconductor film 299, at last as contacting metal film 207, with sputtering method Ti metal film plating is formed up to thickness about 100nm after, form the 1st resist figure 208 (Fig. 5) that the 1st photoetching process used with usual way.
Then, corrode contacting metal rete 207 (Ti metal film), n successively + A-Si film 206, i type a-Si film 205, gate insulator rete 204 (SiN xFilm), and G-S metallic diaphragm 203 (Al-Zr film), formed lamination gate electrode 203 ' or grid wiring 203 ", source electrode intermittently connects up 209 ' 209 ", the 1st figure 210 (Fig. 6) of gate insulator rete 204 ', semiconductor film 299 (205 '+206 ') and contacting metal film 207 '.
Here, Fig. 7 represents to observe from the top plane model figure of Fig. 6 (b).As can be seen from Figure 7, grid wiring 203 " extend along depth direction from drawing the place ahead, source electrode intermittently connects up 209 ' 209 " along perpendicular to 203 " direction (left and right directions of drawing) extend.And source electrode intermittently connects up 209 ' 209 " by grid wiring 203 " crosscut is between the two and by disjunction, at grid wiring 203 " and source electrode intermittently connect up 209 ' 209 " between form certain clearance.This gap is the size of same degree with the aggregate thickness (corrosion depth) of each layer just in time.
Fig. 6 (b) is the X-Y line sectional view of Fig. 7.
Then, in that to use boric acid ammonia be to described gate electrode 203 ' and grid wiring 203 in about 7 the electrolytic solution at PH " carry out anodic oxidation selectively, form with Al in the side of figure 2O 3Dielectric film 211 for principal ingredient.
Then, forming the transparent and electrically conductive film 212 (Fig. 9) that the indium oxide tin film (ITO) about thickness 100nm constitutes with sputtering method difference plating on the whole base plate surface.
This transparent transparent and electrically conductive film 212 be used for connecting on the pixel transparency electrode 215 that will connect on the drain region and the source area and the interrupted wiring of source electrode of disjunction between connect (source electrode intermittently connect up connection electrode).
Then, form the 2nd resist figure 208 ' (Figure 10) of the 2nd photoetching process use with usual way.Then, corrosion is removed described transparent and electrically conductive film 212, contacting metal film 207 ', is reached the n on the gate electrode successively +The part of a-Si film 206 ', until reaching i type-a-Si film 205, the interrupted wiring of source region 213 and source electrode 209 ' is connected with nesa coating 214 with contact electrode 207 ', and pixel transparency electrode 215 is connected to drain region 216 (Figure 11) by contact electrode 207 '.
Thus, the interrupted wiring 209 ' 209 of the source electrode of disjunction " by grid wiring 203 " on transparent and electrically conductive film 214 ' be connected (Figure 19 right side) with contacting metal film 207 '.
At last; fire the periphery that method is removed substrate with printing; the diaphragm 217 that forms 300nm covers TFT, and then, to be mask from the laminated layer of the peripheral part that is connected with external drive circuit corrode removes i type a-Si film 205, gate insulator rete 204 (SiN with this silicon dioxide protective film figure x), make grid G-S metal film 203 expose (with reference to Figure 26).Thus, can make the tft array substrate 218 (Figure 26) that can in transmission type liquid crystal display device, use.
Figure 12 is the plane model figure that amplifies tft array substrate 218 major parts of present embodiment making.Here, Figure 11 (a) is A-A ' the line section part among Figure 12, and Figure 11 (b) is the B-B line section part among Figure 18.
According to the present embodiment of above explanation, in same plane, form grid wiring simultaneously and source electrode intermittently connects up, oxidation and insulation are carried out selectively by anodic oxidation in the side of grid wiring.Then, be connected with nesa coating by the contacting metal film of the interrupted wiring of the source electrode of grid wiring disjunction by lamination on the grid wiring.Therefore, source wiring resistance is improved significantly.Utilize this structure, can make the step difference on tft array surface very little.
The photomask that uses in the manufacturing of tft array substrate needs 5～7 in existing method, and according to the method for present embodiment, just can with two.Therefore, according to the method for present embodiment, can reduce the manufacturing cost of tft array substrate significantly.
And, to the lamination of substrate the time, by continuous accumulation G-S metallic diaphragm, gate insulator rete and semiconductor film, the bottom gate type tft array substrate that the pollution that can make the groove border is less, reliability is high.
As method for oxidation, be 7 electrolytic solution if use PH, use anode oxidation method, so can high-level efficiency, the side of oxidation gate electrode and connected grid wiring only selectively.And, according to this method, owing to can form the high-quality oxide film that does not have pin hole, so can realize the wiring that grid leak is few.
In the present embodiment, because the interrupted wiring of source electrode is G-A metal film, semiconductor film, contacting metal film, and five layers of structure of conductive film, the resistance decreasing so source electrode as a whole intermittently connects up.
In the present embodiment, owing between G-S metal film (gate electrode, grid wiring, source electrode intermittently connect up) and contacting metal film (contact electrode), pile up gate insulating film and semiconductor film, be difficult for producing electric leakage.
In the present embodiment, because semiconductor film is the double-layer structural of i type layer and n type layer, so can reduce the contact resistance of source electrode and drain electrode.
Because rete is applied in the configuration primary coat between insulativity substrate surface and grid wiring metal film, can prevent diffusion of contaminants from substrate.
In the above-described embodiments, made the tft array substrate of infiltration type, but replaced transparent and electrically conductive film, can make the reflection-type FT array base palte that can in reflection-type liquid-crystal display device, use by the high metal film of reflectivity with Al or Al alloy etc.
(embodiment 2-2)
Below, with Figure 13 the tft array substrate that uses the foregoing description 2-1 to make is described, the actual manufacture process of making under the liquid crystal display device situation.
At first, at the tft array substrate of using the two slice masks identical to make with embodiment 2-1, promptly in the 1st electrode group 221 of rectangular loading with have on the 1TFT array base palte 223 of the transistor group 222 that drives this electrode and have on the filter substrate 226 that makes with the color filter group 224 of the opposed loading of the 1st electrode group and the 2nd electrode 225, respectively with usual way coating, cure polyimide resin, polish, make liquid crystal orientation film 227.
Then, make described the 1st substrate 223 and the 2nd substrate 226 aligned in position and make electrode contraposition, with dividing plate 228 and cementing agent 229 with about 5 microns gap production unit.Then, after injecting described TN liquid crystal 230 between the described the 1st and the 2nd substrate, polarization plates 231,232 is assembled on the crossed nicols, finishes display device.
Such device is by being radiated on the whole surface backlight 233, and drives each transistor with vision signal, can be on the direction of arrow A display image.At this moment,, before alignment films forms, carry out covering at least the step of a part of described tft array substrate with diaphragm if after the step of making the bottom gate type tft array substrate, so can the high liquid crystal indicator of fabrication reliability.
As diaphragm, if use the silicon dioxide film or the silicon nitride film of inorganics, so can the higher liquid crystal indicator of fabrication reliability.
Formed the tft array substrate that the metal electrode film replaces transparent and electrically conductive film if use, can make reflection-type liquid-crystal display device so.
(embodiment 2-3)
Same with embodiment 2-1, prepare the good in advance transparent glass substrate 201 that cleans, apply rete 202 as primary coat, pile up 0.4 micron silicon dioxide (SiO with the CVD method 2) film.Then, Al-Zr (97: 3) alloy plating is formed up to thickness about 200nm, the G-S metallic diaphragm 203 that intermittently connects up and use as gate electrode and grid wiring and source electrode with sputtering method.Then, pile up the SiN of 150nm continuously with plasma CVD method xFilm is as the amorphous silicon free from foreign meter as semiconductor film (the i type a-Si) film 205 of gate insulator rete, 200nm, the amorphous silicon (n that contains n type impurity of 50nm +A-Si) rete 206.
Here, because at n +Do not pile up the contacting metal film on the a-Si rete 206, so different with embodiment 2-1 in this.
Then, form the 1st resist figure 208 (Figure 14) of the 1st time photoetching process use with usual way.
Then, corrode n successively + A-Si film 206, i type a-Si film 205, SiN xFilm 204 (SiN xFilm), and G-S metallic diaphragm 203 (Al-Ta film), formed lamination gate electrode 203 ', grid wiring 203 ", source electrode intermittently connects up 209 ', the 1st figure 240 (Figure 15) of gate insulator rete 204 ' and semiconductor film (205 '+206 ').
Then, in electrolytic solution to described gate electrode 203 ' and grid wiring 203 " carry out anodic oxidation, form with Al in their side 2O 3Behind the dielectric film 211 (Figure 16) for principal ingredient, with sputtering method respectively plating form the contact electrode metal (Ti) 241 of 50nm and the metal electrode film 242 (Figure 17) that aluminium film (Al) constitutes, contact electrode metal 241 will connect between the interrupted wiring of source electrode that connect on the pixel metal electrode that connect on the drain region and the source area.
Then, form the 2nd resist figure (Figure 18) that the 2nd photoetching process use with usual way after, successively corrosion remove described metal electrode film 242, contact electrode metal film (Ti) 241, and gate electrode on n +The part of a-Si film 206 ', the interrupted wiring of source region 213 and source electrode 209 ' is connected with metal electrode film pattern 242 ' with metal electrode metal film (Ti) 241 with contact electrode 7, and forms pixel metal electrode film 243 and drain region 216 (Figure 19) continuously.At this moment, the source electrode that cuts off in advance intermittently is routed in grid wiring 209 ' at grid wiring 203 " upward be connected with metal electrode film pattern 242 ' by contact electrode metal film (Ti) 241 '.
At last; fire the periphery that method is removed substrate with printing; the diaphragm 217 that forms 300nm covers TFT; then; if with this silicon dioxide protective film figure is that mask corrodes the oxide film on the gate electrode metal of removing with the driving circuit coupling part, can make so to have the tft array substrate 245 of reflection-type pixel metal electrode (Figure 20) on pixel section.
According to present embodiment, owing to intermittently connect up by the two-layer source electrode that is connected of contacting metal electrode and metal electrode, so can make the resistance of source wiring very low.
By on reflection pixel metal electrode, using aluminium or aluminum series alloy (Al-Zr, Ag-Pd-Cu alloy etc.), can make the good tft array substrate of reflectivity.
Between insulativity substrate surface and grid wiring metal film, form silica-based end coated film by come plating with sol-gal process, can absorptive substrate stress.
As the grid wiring metal film,, can make the few tft array substrate of wiring concave-convex surface so if form the alloy film of aluminium system.
In oxidation step,, can make the good tft array substrate of gate insulator by in neutral solution, using anodizing.
At this moment, if the oxide film of gate electrode side is neutral anode oxide film, so can the high tft array substrate of fabrication reliability.
If five layers of structure with interrupted part formation grid wiring metal film, gate insulating film, semiconductor film, contact electrode metal film and the metal electrode film that connects up of source electrode can make the resistance of the interrupted wiring of source electrode little so.
And, if between gate electrode metal and contacting metal electrode, form the gate insulating film and the semiconductor film of silicon nitride series, can make the tft array substrate of excellent in stability so.
If the interrupted wiring of source electrode is cut off by grid wiring, on grid wiring, carry out cross connection by contact electrode metal and metal electrode are two-layer, it is poor to reduce the tft array substrate surface step so.
If make the part formation i type layer of semiconductor film and the double-layer structural of n type layer, can reduce the contact resistance of source electrode, drain electrode so.
If after forming end coated film between insulativity substrate surface and the grid wiring metal film, so can the high tft array substrate of fabrication reliability.
(embodiment 2-4)
Below, illustrate with the manufacture process under the situation of the next actual manufacturing liquid crystal indicator of the tft array substrate of embodiment 2-3 acquisition with Figure 21.
At first, on the tft array substrate of using the two slice masks identical to make with embodiment 2-3, promptly in the 1st electrode group 321 of rectangular loading with have on the 1TFT array base palte 323 of the transistor group 322 that drives this electrode and have on the filter substrate 326 that makes with the color filter group 324 of the opposed loading of the 1st electrode group and the 2nd electrode 325, respectively with usual way coating, cure polyimide resin, polish, make liquid crystal orientation film 327.
Then, make described the 1st substrate 323 and the 2nd substrate 326 aligned in position and make electrode contraposition, with dividing plate 328 and cementing agent 329 with about 5 microns gap production unit.Then, after injecting described TN liquid crystal 330 between the described the 1st and the 2nd substrate, polarization plates 331 is assembled on the color filter one side unit surface, finishes reflection type liquid crystal display element.
Such device is by driving each transistor with vision signal, can be on the direction of arrow A display image.
(embodiment 2-5)
Same with embodiment 2-1, prepare the good in advance transparent glass substrate 201 that cleans, apply rete 202 as primary coat, pile up 0.4 micron silicon dioxide (SiO with the CVD method 2) film.Then, Al-Zr (97: 3) alloy plating is formed up to thickness about 200nm, the G-S metallic diaphragm 203 that intermittently connects up and use as gate electrode and grid wiring and source electrode with sputtering method.Then, pile up the SiN of 150nm continuously with plasma CVD method xFilm is as the amorphous silicon free from foreign meter as semiconductor film (the i type a-Si) film 205 of gate insulator rete, 50nm, the amorphous silicon (n that contains n type impurity of 50nm +A-Si) film 206, at last as contacting metal rete 207, with sputtering method Ti metal film plating are formed up to thickness about 100nm.Then, form the 1st resist figure of the 1st time photoetching process use with usual way.
Then, corrode Ti metal film 207, n successively + A-Si film 206, i type a-Si film 205, SiN xFilm 204, and G-S metallic diaphragm (Al-Zr film) 203, formed lamination gate electrode 203 ' or grid wiring 203 ", source electrode intermittently connects up 209 ', the 1st figure that comprises comb shape pixel metal electrode 251 of gate insulator rete 204 ', semiconductor film (205 ').
Then, using boric acid ammonia is to described gate electrode 203 ' and grid wiring 203 in about 7 the electrolytic solution at PH " carry out anodic oxidation, form with Al in the side of figure 2O 3Dielectric film 211 for principal ingredient.
And, the 2nd comb shape pixel metal electrode that connects on the drain region is connected with the source region, form interrupted metal (Al) electrode film that connects up of source electrode that the connection about thickness 100nm is cut off with the sputtering method plating.
Then, form the 2nd resist figure that the 2nd photoetching process use with usual way after, successively corrosion remove described metal electrode film 212 ', contact electrode 207 ', and gate electrode on n +The part of a-Si film 206 ', until reaching i type-a-Si film, the interrupted wiring of source region 213 and source electrode 209 ' is connected with metal electrode 214 ' with contact electrode 7, and forms the 2nd comb shape pixel metal electrode 252 and drain region 216 continuously by contact electrode metal 207 '.
At this moment, the source electrode that cuts off in advance intermittently is routed in grid wiring 209 ", 209 " ' at grid wiring 203 " go up by contact electrode metal 7 ' by contact electrode metal 214 " connect.
At last; the silicon dioxide protective film 217 of firing method formation 300nm with printing covers TFT; then; if with this silicon dioxide protective film figure is that mask corrodes i type-a-Si film 205, the SiNx film 204 on the gate electrode metal of removing with the external drive circuit coupling part, can make the tft array substrate 253 (Figure 22) that can in plane conversion (IPS) type liquid crystal indicator, use so.
At this moment, if corrode part simultaneously, can not increase mask ground so and make IPS type tft array substrate as grid wiring, gate electrode and the 1st comb shape pixel capacitors.
If between insulativity substrate surface and grid wiring metal film, form end coated film, can make the tft array substrate of excellent in stability so.
If form grid wiring metal film, gate insulating film and semiconductor film continuously, can prevent the pollution of channel part so.
If in oxidation step, in neutral electrolyte, carry out anodic oxidation, can only carry out oxide isolated selectively so to gate electrode side and the 1st comb shape pixel capacitors side.
If, can provide the interrupted cloth line resistance of source electrode little tft array substrate so with the part of the interrupted wiring of source electrode and five layers of structure of the 1st comb shape pixel capacitors formation grid wiring metal film, semiconductor film, contact electrode metal film and metal electrode film.
And, if form the contact electrode metal, can provide the drain electrode contact resistance little tft array substrate so in being connected of semiconductor film and comb poles.
If the interrupted wiring of source electrode is cut off by grid wiring, on grid wiring, carry out cross connection by contact electrode metal and metal electrode, can provide the surface step difference little tft array substrate so.
If make the part of semiconductor film form the double-layer structural of i type layer and n type layer, can provide contact resistance little tft array substrate so.
If after forming end coated film between insulativity substrate surface and the grid wiring metal film, can prevent so the diffusion of contaminants that moves from substrate from can provide reliability high tft array substrate.
(embodiment 2-6)
Below, illustrate with the manufacture process under the actual manufacturing of the above-mentioned tft array substrate IPS type liquid crystal display device situation.
At first, the tft array substrate of using with IPS with the same two mask manufacturings of embodiment 2-5, promptly in the 1st comb poles group of rectangular loading with have the 1TFT array base palte of the transistor group that drives this electrode and have on the filter substrate that makes with the color filter group of the opposed loading of the 1st electrode group, respectively with usual way coating, cure polyimide resin, polish, make liquid crystal orientation film.
Then, make the described the 1st and the 2nd substrate position alignment and make electrode contraposition, with dividing plate and cementing agent with about 5 microns gap production unit.Then, after injecting nematic liquid crystal between the described the 1st and the 2nd substrate, two polarization plates are assembled on the crossed nicols, finish display element (, omitting) owing to only removed the 2nd electrode 225 of Figure 19 among the figure.
Such device is backlight by shining from the inside, and drives each transistor with vision signal, can display image.At this moment, angle of visibility is can reach 160 ° wide angle of visibility up and down at 10 o'clock in contrast.
At this moment, after the step of making IPS type tft array substrate,, implement to cover the step of the part of described at least tft array substrate with diaphragm if before alignment films forms, so can the high liquid crystal indicator of fabrication reliability.
At this moment; after the step of making the bottom gate type tft array substrate; before alignment films forms; if cover the part of described at least tft array substrate with diaphragm; with this diaphragm as mask; metal electrode film, contact electrode metal film, semiconductor film and gate insulating film are corroded, the grid wiring terminal is exposed, can make liquid crystal indicator with low cost so.
(embodiment 2-7)
Same with embodiment 2-3, prepare the good in advance transparent glass substrate 201 that cleans, apply rete 202 as primary coat, pile up 0.4 micron silicon dioxide (SiO with the CVD method 2) film.Then, Al-Zr (97: 3) alloy plating is formed up to thickness about 200nm, the G-S metallic diaphragm 203 that intermittently connects up and use as gate electrode and grid wiring and source electrode with sputtering method.Then, pile up the SiN of 150nm continuously with plasma CVD method xFilm is as the amorphous silicon free from foreign meter as semiconductor film (the i type a-Si) film 205 of gate insulator rete, 50nm, the amorphous silicon (n that contains n type impurity of 50nm +A-Si) film 206, form the 1st resist figure 208 of the 1st time photoetching process use with usual way.
Then, corrode n successively + A-Si film 206, i type a-Si film 205, SiN xFilm 204, and Al-Ta film 203, formed lamination gate electrode 203 ' or grid wiring 203 ", source electrode intermittently connects up 209 ', the 1st figure with the 1st comb shape pixel capacitors 261 of gate insulator rete 204 ', semiconductor film 205 '.
Then, use in the boric acid ammonia electrolytic solution described gate electrode 203 ', grid wiring 203 " and the 1st comb shape pixel capacitors 261 carry out anodic oxidation, form with Al in the side of figure 2O 3Dielectric film 211 for principal ingredient.
And, the 2nd comb shape pixel metal electrode that connects on the drain region is connected with the source region, forms thickness with the sputtering method plating and be respectively metal electrode (Ti) film 241 that is connected the interrupted wiring of cutting off of source electrode about 50nm and 100nm and the metal electrode film 242 that aluminium film (Al) is formed.
Then, form the 2nd resist figure that the 2nd photoetching process with the 2nd comb poles figure use with usual way after, the n on described metal electrode film 242, contact electrode metal (Ti) 41 and the gate electrode is removed in corrosion successively +The part of a-Si film 206 ', the interrupted wiring of source region 213 and source electrode 209 ' is connected with metal electrode film pattern 242 ' with contact electrode metal (Ti) film 241 ', and by contacting metal electrode formation the 2nd comb shape pixel metal electrode 262 and drain region 216 continuously.
At this moment, the interrupted wiring 209 ' of the source electrode that cuts off is in advance gone up at grid wiring 203 ' and is connected with contact electrode metal (Ti) film pattern 241 ' by metal electrode film pattern 242 '.
At last; fire the diaphragm 217 that is used to cover TFT that method forms 300nm with printing; then; with this silicon dioxide protective film figure is after mask corrodes oxide film on the gate electrode metal with the driving circuit coupling part, can be produced on the tft array substrate 263 (Figure 23) that has the 2nd comb shape pixel metal electrode in the pixel section.
At this moment, semiconductor film is the double-layer structural of i type layer and n type layer, if the part of n type layer is corroded to i type layer, can make does not so increase photomask, tft array substrate that cost is low.
If between insulativity substrate surface and grid wiring metal film, form end coated film, can prevent the diffusion of contaminants that substrate produces so, can the high tft array substrate of fabrication reliability.
And, if form grid wiring metal film, gate insulating film and semiconductor film continuously, can make the stable tft array substrate of Vt with the contamination preventing of groove to Min. so.
If in oxidation step, in neutral solution, carry out anodic oxidation, can make the tft array substrate that pin hole is few, leakage current is little so.
And, if use silicon dioxide or contain the part that diaphragm that the dead matter of silicon dioxide constitute covers tft array substrate with sol-gal process, so can the high tft array substrate of fabrication reliability.
(embodiment 2-8)
Below, illustrate with above-mentioned tft array substrate and come the actual manufacturing step of making under the liquid crystal display device situation.
At first, on the 1TFT array base palte and having that the IPS that uses the two slice mask manufacturings identical with embodiment 2-7 with tft array substrate, promptly has the 1st comb poles group of rectangular loading and driving the transistor group of this electrode makes filter substrate with the color filter group of the opposed loading of the 1st comb poles group, respectively with usual way apply, the cure polyimide resin, polish, make liquid crystal orientation film.
Then, make the described the 1st and the 2nd substrate position alignment and make electrode contraposition, with dividing plate and cementing agent with about 4 microns gap production unit.Then, after injecting nematic liquid crystal between the described the 1st and the 2nd substrate, two polarization plates are assembled on the crossed nicols, finish display element.
Such device is backlight by shining from the inside, and drives each transistor with vision signal, can display image.At this moment, angle of visibility is can reach 160 ° wide angle of visibility up and down at 10 o'clock in contrast.
At this moment, after making the step of tft array substrate,, implement to cover the step of the part of described tft array substrate with diaphragms such as silicon dioxide if at least before alignment films forms, so can the high liquid crystal indicator of fabrication reliability.
If form metal electrode and contacting metal electrode, can further simplify step so with the identical material individual layer.
(embodiment 2-9)
Same with embodiment 2-1, prepare the good in advance transparent glass substrate 1 that cleans, apply rete 202 as primary coat, pile up 0.4 micron silicon dioxide (SiO with the CVD method 2) film.Then, Al-Zr (97: 3) alloy plating is formed up to thickness about 200nm, the G-S metallic diaphragm 203 that intermittently connects up and use as gate electrode and grid wiring and source electrode with sputtering method.Then, pile up the SiN of 150nm continuously with plasma CVD method xFilm is as the amorphous silicon free from foreign meter as semiconductor film (the i type a-Si) film 205 of gate insulator rete, 50nm, the amorphous silicon (n that contains n type impurity of 50nm +A-Si) film 206, form the 1st resist figure 208 of the 1st time photoetching process use with usual way.
Then, corrode Ti metal film 207, n successively + A-Si film 206, i type a-Si film 205, SiN xFilm 204, and Al-Zr film 203, formed lamination gate electrode 203 ' or grid wiring 203 ", source electrode intermittently connects up 209 ', the 1st figure 210 of gate insulator rete 204 ', semiconductor film (205 ' and 206 ') and contact electrode metal 207 '.
Then, using boric acid ammonia is to described gate electrode 3 ' and grid wiring 3 in about 7 the electrolytic solution at PH " carry out anodic oxidation, form with Al in the side of figure 2O 3Dielectric film 211 for principal ingredient.
And, the 1st comb shape pixel metal electrode that connects on the drain region is connected with the source region, form the interrupted metal electrode film that connects up of source electrode that the connection about thickness 100nm is cut off with the sputtering method plating.
Then, form the 2nd resist figure that the 2nd photoetching process with the 1st comb poles figure use with usual way after, successively corrosion remove described transparent and electrically conductive film 212, contact electrode 207 ', and gate electrode on n +The part of a-Si film 206 ', until reaching i type-a-Si film, with the interrupted wiring 209 ' of source region 213 and source electrode with contact electrode 207 ' and metal electrode 214 " be connected, and form the 1st comb shape pixel metal electrode 71 and drain region 216 continuously by contact electrode metal 207 '.
At this moment, the source electrode that cuts off in advance intermittently is routed in grid wiring 209 ", 209 " ' at grid wiring 203 " go up by contact electrode metal 207 ' by contact electrode metal 214 " connect.
Then; with the sol-gal process printing, fire the silicon dioxide protective film 217 that forms 300nm and cover TFT; then, be that mask corrodes i type-a-Si film 205, the SiNx film 204 on the gate electrode metal of removing with the external drive circuit coupling part with this silicon dioxide protective film figure.
Then, plating forms the Al-Zr alloy of 150nm thickness on this surface, form the 2nd comb shape pixel metal electrode 272 with having the 2nd comb poles figure, can make the tft array substrate 273 (Figure 24) that can be used for IPS usefulness transmission type liquid crystal display device with three photomasks.
At this moment, semiconductor film is the double-layer structural of i type layer and n type layer, if the part of n type layer is corroded to i type layer, can simplify the step of TFT so.
If between insulativity substrate surface and grid wiring metal film, form end coated film, can make the tft array substrate of stability of characteristics so.
If in oxidation step, use anodizing, can make the few dielectric film of pin hole so, can make the few tft array substrate of grid leak.
At this moment, if form the oxide film of gate electrode side, can make the tft array substrate of sewing characteristic good so with anode oxide film.
If make the part of the interrupted wiring of source electrode become five layers of structure of grid wiring metal film, semiconductor film, contact electrode metal film and metal electrode film, can reduce the interrupted cloth line resistance of source electrode so, can make the little tft array substrate of characteristic deviation.
And, if between semiconductor film and source electrode and drain electrode, form the contact electrode metal, can make the little tft array substrate of internal resistance so.
If the interrupted wiring of source electrode is cut off by grid wiring, on grid wiring, carry out cross connection by contact electrode metal and metal electrode, can make the little tft array substrate of the interrupted cloth line resistance of source electrode so.
If make the part of semiconductor film form the double-layer structural of i type layer and n type layer, can omit n type diffusion of contaminants step so.
After forming end coated film between insulativity substrate surface and the grid wiring metal film, can reduce stress influence from substrate.
(embodiment 2-10)
Below, illustrate that the tft array substrate of making of the foregoing description 2-9 comes the actual manufacturing step of making under the liquid crystal display device situation.
At first, at the tft array substrate of using the two slice mask manufacturings identical with embodiment 2-9, promptly the 1TFT array base palte 223 and having that has the 1st electrode group 221 of rectangular loading and driving the transistor group 222 of this electrode makes on the filter substrate 226 with the color filter group 224 of the opposed loading of the 1st, the 2nd comb poles group, apply and the cure polyimide resin with usual way respectively, polish, make liquid crystal orientation film 227.
Then, make the described the 1st and the 2nd substrate 223,226 aligned in position and make electrode contraposition, making direction of orientation with dividing plate 228 and cementing agent 229 with about 5 microns gap is the unit that 90 degree reverse.Then, after the described the 1st and the 2nd substrate injects described TN liquid crystal 230, polarization plates 231,232 is assembled on the crossed nicols, finishes display element (because Ben Tu is identical with Figure 21, so omit).
Such device is backlight by shining from the inside, and drives each transistor with vision signal, can display image.At this moment, angle of visibility is can reach 160 ° wide angle of visibility up and down at 210 o'clock in contrast.
At this moment, after making the step of tft array substrate, at least before alignment films forms, after implementing to cover the step of a part of described tft array substrate with diaphragms such as silicon dioxide, can the high liquid crystal indicator of fabrication reliability.
(embodiment 2-11)
Same with embodiment 2-8, prepare the good in advance transparent glass substrate 1 that cleans, apply rete 202 as primary coat, pile up 0.4 micron silicon dioxide (SiO with the CVD method 2) film.Then, Al-Zr (97: 3) alloy plating is formed up to thickness about 200nm, the G-S metallic diaphragm 203 that intermittently connects up and use as gate electrode and grid wiring and source electrode with sputtering method.Then, pile up the SiN of 150nm continuously with plasma CVD method xFilm is as the amorphous silicon free from foreign meter as semiconductor film (the i type a-Si) film 205 of gate insulator rete, 50nm, the amorphous silicon (n that contains n type impurity of 50nm +A-Si) film 206, form the 1st resist figure 208 of the 1st time photoetching process use with usual way.
Then, corrode n successively + A-Si film 206, i type a-Si film 205, SiN xFilm 204, and Al-Zr film 203, formed lamination gate electrode 203 ' or grid wiring 203 ", source electrode intermittently connects up 209 ', gate insulator rete 204 ', and the 1st figure 210 of semiconductor film (205 ' and 206 ').
Then, using boric acid ammonia is to described gate electrode 203 ' and grid wiring 203 in about 7 the electrolytic solution at PH " carry out anodic oxidation, form with Al in the side of figure 2O 3Dielectric film 211 for principal ingredient.
And, as connecting contacting metal membrane electrode 207 that be connected, that connect the interrupted wiring of cutting off of source electrode on the 1st comb shape pixel metal electrode that connects on the drain region and the source region, after using sputtering method that Ti metal film plating is formed up to thickness about 100nm, will be formed up to thickness about 100nm as the Al-Zr film plating of metal electrode film with sputtering method.
Then, form the 2nd resist figure that the 2nd photoetching process with the 1st comb poles figure use with usual way after, successively corrosion remove described transparent and electrically conductive film 12, contact electrode 7 ', and gate electrode on n +The part of a-Si film 6 ', until reaching i type-a-Si film, with the interrupted wiring 209 ' of source region 13 and source electrode with contact electrode 207 ' and metal electrode 14 " be connected, and pass through contact electrode metal 7 ' the 1st comb shape pixel metal electrode 81 and drain region 16 formed continuously.
At this moment, the source electrode that cuts off in advance intermittently is routed in grid wiring 9 ", 9 " ' at grid wiring 3 " go up with contact electrode metal 7 ' and metal electrode 14 " double-layer structural be connected.
Then; with the sol-gal process printing, fire the silicon dioxide protective film 17 that forms 300nm and cover TFT; then, be that mask corrodes i type-a-Si film 5, the SiNx film 4 on the gate electrode metal of removing with the external drive circuit coupling part with this silicon dioxide protective film figure.
At last, thickness by 150nm comes plating to form the Al-Zr alloy on whole surface once more, form the 2nd comb shape pixel metal electrode 82 with photomask, can make the tft array substrate 83 (Figure 25) that can on the IPS transmission type liquid crystal display device, use with three photomasks with the 2nd comb poles figure.
Thus, because the interrupted wiring of source electrode is connected with the double-layer structural of metal electrode with the contact electrode metal at least,, can make the good tft array substrate of image display feature so can reduce the interrupted cloth line resistance of source electrode.
(embodiment 2-12)
Below, illustrate that the tft array substrate of making of the foregoing description 2-11 comes the actual manufacturing step of making under the liquid crystal display device situation.
At first, at the tft array substrate of using the two slice mask manufacturings identical with embodiment 2-9, promptly the 1TFT array base palte 223 and having that has the 1st electrode group 221 of rectangular loading and driving the transistor group 222 of this electrode makes on the filter substrate 226 with the color filter group 224 of the opposed loading of the 1st, the 2nd comb poles group, apply and the cure polyimide resin with usual way respectively, polish, make liquid crystal orientation film 227.
Then, make the described the 1st and the 2nd substrate 223,226 aligned in position and make electrode contraposition, making direction of orientation with dividing plate 228 and cementing agent 229 with about 5 microns gap is the unit that 90 degree reverse.Then, after the described the 1st and the 2nd substrate injects described TN liquid crystal 230, polarization plates 231,232 is assembled on the crossed nicols, finishes display element.
Such device is backlight by shining from the inside, and drives each transistor with vision signal, can display image.At this moment, angle of visibility is can reach 160 ° wide angle of visibility up and down at 10 o'clock in contrast.
At this moment; after making the step of tft array substrate, at least before alignment films forms, after implementing to cover the step of a part of described tft array substrate with diaphragms such as silicon dioxide; can the high liquid crystal indicator (Yin Bentu is identical with Figure 21, so omit) of fabrication reliability.
As described above, according to the present invention, can make the circuit board of XY wiring in high throughput rate ground with crossing on the same level type.Such circuit board can be used for general electron device.Having used the tft array substrate of the present invention of such circuit board can make with two photomasks, so can reduce the manufacturing cost of tft array substrate significantly.And, by using such tft array substrate, can produce the effect that liquid crystal indicator is provided more cheaply.Therefore, significant on the industry of the present invention.

Claims (101)

1. a circuit substrate is characterized in that, comprising: the X wiring that is formed respectively by same conductive metal film in the same plane on the insulativity substrate; And intermittently connected up by the Y with X wiring isolation of described X wiring cut-off with cross section that described X wiring intersects;
The side and being insulated property of the upper surface film of described X wiring cover;
Be electrically connected by the Y that forms on the described insulating film connection electrode that intermittently connects up between the X wiring cut-off that is covered by described insulating film, the interrupted wiring of the Y of isolation.
2. circuit substrate as claimed in claim 1 is characterized in that, the insulating film of the side of described X wiring is the metal oxide film that described conductive metal film is carried out the oxidation gained at least.
3. circuit substrate as claimed in claim 2 is characterized in that, described metal oxide film is the anode oxide film that forms by anodizing.
4. the manufacture method of a circuit substrate is characterized in that, comprising:
First step is piled up the conductive metal rete on the insulativity substrate;
Second step is corroded described conductive metal rete, the cross section that intersects with X wiring and with described X wiring by described X wiring cut-off and be formed on simultaneously in the same plane with the interrupted wiring of Y of X wiring isolation;
Third step after described second step, carries out oxidation to the side and the upper surface of described X wiring, covers this side and upper surface with the metal oxide film of insulativity; And
The 4th step behind described third step, is piled up the electric conductivity rete, covers described cross section at least, and the Y that is isolated by described X wiring cut-off intermittently is electrically connected between the wiring.
5. the manufacture method of circuit substrate as claimed in claim 4 is characterized in that, carries out the oxidation of the X wiring in described the 2nd step by anodizing.
6. the manufacture method of a circuit substrate comprises:
First step is piled up conductive metal rete and insulativity rete at least successively on the insulativity substrate;
Second step, the layer that comprises described insulativity rete and described conductive metal rete is corroded, in same plane, X wiring and the cross section that intersects at described X wiring are formed in the same plane simultaneously by described X wiring cut-off and with the interrupted wiring of Y that the X wiring is isolated;
Third step after described second step, carries out oxidation to the side of described X wiring, covers this side with the metal oxide film of insulativity; And
The 4th step behind described third step, is piled up the electric conductivity rete, covers described cross section at least, and the interrupted wiring of being isolated by described X wiring cut-off of Y is electrically connected to each other.
7. the manufacture method of circuit substrate as claimed in claim 6 is characterized in that, carries out the oxidation of the side of the X wiring in described second step by anodizing.
8. bottom gate type tft array substrate comprises:
Gate electrode directly or by the interior rete that is coated be formed on the substrate, and the side is covered by insulating film;
Gate insulating film, lamination is on described gate electrode;
Semiconductor film, lamination have the channel region that source region, drain region and two zones insert and put on described gate insulating film;
The source electrode contact electrode, lamination is on the source region of described semiconductor film;
The drain electrode contact electrode, lamination is on the drain region of described semiconductor film;
Pixel capacitors is connected to the drain region of described semiconductor film by described drain electrode contact electrode;
Grid wiring is connected to described gate electrode, and side and being insulated property of upper surface film cover;
Source electrode intermittently connects up, and is formed in the same plane with described grid wiring, intersects with described grid wiring in same plane, is by described grid wiring at this cross part and cuts off the shape of isolating; And
The source electrode connection electrode will be cut off the interrupted wiring of isolating of source electrode by grid wiring via the top of grid wiring and be electrically connected to each other.
9. a bottom gate type tft array substrate is characterized in that, described pixel capacitors and described source electrode line connection electrode are made of the electrically conducting transparent membrane material of homogeneity.
10. bottom gate type tft array substrate as claimed in claim 9, it is characterized in that intermittently the connect up orlop of zoning figure of the source electrode that the interrupted wiring of described source electrode is positioned at 5 layers of structure that each film of intermittently wiring of source electrode, gate insulating film, semiconductor film, contacting metal film, nesa coating constitutes;
Described grid wiring is positioned at the orlop of the grid wiring zoning figure of 5 layers of structure that each film of grid wiring, gate insulating film, semiconductor film, contacting metal film, nesa coating constitutes;
And interrupted wiring of described source electrode and described grid wiring are present in the same plane on the described substrate.
11. the bottom gate type tft array substrate as claim 10 is characterized in that the insulating film of the side of described at least grid wiring is made of the oxide film of described conductive metal film.
12. the bottom gate type tft array substrate as claim 11 is characterized in that, described oxide film is the anode oxide film that forms by anodizing.
13. the bottom gate type tft array substrate as claim 11 is characterized in that, semiconductor film is the double-layer structural of i type amorphous silicon layer and n type amorphous silicon layer.
14. bottom gate type tft array substrate as claimed in claim 9 is characterized in that, uses the conducting membrane material of light reflective to replace described electrically conducting transparent membrane material.
15. the manufacture method of a bottom gate type tft array substrate comprises:
(A) step is piled up G-S metallic diaphragm, gate insulator rete, semiconductor film and the contacting metal rete that is used to form the interrupted wiring of gate electrode, grid wiring and source electrode at least successively on the insulativity substrate surface;
(B) step, after described (A) step, with the 1st resist figure, by photoetching process described each layer corroded to described insulativity substrate surface, form gate electrode zoning figure, grid wiring zoning figure, and source electrode dashed line zoning figure, gate electrode zoning graphics package contains gate electrode, the grid metal film of lamination successively thereon, gate insulating film, semiconductor film and contacting metal film, grid wiring zoning figure comprises the grid wiring that is connected with described gate electrode, the grid metal film of lamination successively thereon, gate insulating film, semiconductor film and contacting metal film, and source electrode dashed line zoning figure is included in the source electrode dashed line that is cut off isolation with the cross part of described grid wiring, the grid metal film of lamination successively thereon, gate insulating film, semiconductor film and contacting metal film;
(C) step, after described (B) step, to described semiconductor film surface, oxidation is carried out in the side to described gate electrode and grid wiring on described semiconductor film with the corrosion of the contacting metal membrane portions on the gate electrode zoning figure, generates the metal oxide film of electrical insulating property;
(E) step after described (C) step, is piled up transparent conductive film layer from described contacting metal film on the whole surface of substrate, and the interrupted wiring of described at least source electrode is electrically connected by conducting film each other; And
(F) step after described (E) step, with the 2nd resist figure, according to photoetching process, with the figure of described transparent conductive film layer corrosion for regulation, forms pixel capacitors, also by this corrosion, forms the channel region that exposes simultaneously.
16. the manufacture method as the bottom gate type tft array substrate of claim 15 is characterized in that, carries out the oxidation of described grid wiring side by anodizing.
17. manufacture method as the bottom gate type tft array substrate of claim 15, it is characterized in that, described semiconductor film is the double-layer structural of n type amorphous silicon layer and i type amorphous silicon layer, and the corrosion of the contacting metal membrane portions on the gate electrode zoning figure in described (F) step is that the part of the part of contacting metal film and coupled n type amorphous silicon layer is corroded to i type amorphous silicon layer.
18. the manufacture method as the bottom gate type tft array substrate of claim 15 is characterized in that the conductive film layer of lamination light reflective replaces the described transparent conductive film layer in described (E) step.
19. liquid crystal indicator, with the face that forms TFT as the inboard, gap in accordance with regulations makes bottom gate type tft array substrate and counter substrate opposed, in this gap, keep liquid crystal, wherein, the bottom gate type tft array substrate comprises: on substrate directly or by form and the gate electrode that the side is covered by insulating film of coating rete down; The gate insulating film of lamination on described gate electrode; On described gate insulating film lamination, have source region and drain region and be interposed in the semiconductor film of the channel region in two zones; The source electrode contact electrode of lamination on the source region on the described semiconductor film; The drain electrode contact electrode of lamination on the drain region of described semiconductor film; Be connected to the pixel capacitors of the drain region of described semiconductor film by described drain electrode contact electrode; The grid wiring that is connected with described gate electrode, side and upper surface are covered by insulating film; Be formed in the same plane with described grid wiring, in same plane, intersect, be the source electrode of isolating shape at this cross section and intermittently connect up by described grid wiring cut-out with described grid wiring; And the source electrode line connection electrode that the interrupted wiring of the source electrode that is cut off by grid wiring is electrically connected to each other via the top of grid wiring.
20. the liquid crystal indicator as claim 19 is characterized in that, by the surface of diaphragm protection tft array substrate.
21. the liquid crystal indicator as claim 20 is characterized in that, described diaphragm is silicon dioxide film or silicon nitride film.
22. the liquid crystal indicator as claim 19 is characterized in that, described pixel capacitors is made of transparent metal film.
23. the liquid crystal indicator as claim 19 is characterized in that, described pixel capacitors is made of the light reflective metal film.
24. a bottom gate type tft array substrate comprises intermittently wiring of source electrode, grid wiring, gate insulating film, semiconductor film and reflection pixel metal electrode group, it is characterized in that,
At least the side of gate electrode and grid wiring is oxidized, reflection pixel metal electrode is the double-layer structural of contacting metal electrode and other metal electrode films, be connected to the drain region of TFT by the contacting metal electrode, source electrode intermittently connects up by contacting metal electrode and this two-layer source region that is connected to TFT of metal electrode.
25. the bottom gate type tft array substrate as claim 24 is characterized in that, reflection pixel metal electrode group is the alloy of aluminium or aluminium system.
26. the bottom gate type tft array substrate as claim 24 is characterized in that, the part of the interrupted wiring of source electrode is the double-layer structural of the metal electrode film of contact electrode metal film and aluminium system.
27. the bottom gate type tft array substrate as claim 24 is characterized in that, forms gate insulating film and semiconductor film between gate electrode metal and contacting metal electrode film.
28. the bottom gate type tft array substrate as claim 24 is characterized in that, the interrupted wiring of source electrode is cut off by grid wiring, comes cross connection by contacting metal electrode and metal electrode are two-layer on grid wiring.
29. the bottom gate type tft array substrate as claim 24 is characterized in that, the part of semiconductor film is i type layer and n +The double-layer structural of type layer.
30. the bottom gate type tft array substrate as claim 24 is characterized in that, forms end coated film between insulativity substrate surface and grid wiring metal film.
31. the manufacture method of a bottom gate type tft array substrate comprises: the step that on the insulativity substrate surface, forms grid wiring metal film, gate insulating film and semiconductor film at least; Corrode the step of described semiconductor film, gate insulating film and grid wiring metal film successively with the 1st figure with photoetching process; The step that oxidation is carried out in the side of grid wiring metal film figure that becomes grid wiring and gate electrode part; Form the step of contact electrode metal film and metal electrode film; And the step of corroding the part of described metal electrode film, contact electrode metal film and semiconductor film with photoetching process with the 2nd figure.
32. the manufacture method as the bottom gate type tft array substrate of claim 31 is characterized in that, forms the alloy film of aluminium film or aluminium system, as the metal electrode film.
33. the manufacture method as the bottom gate type tft array substrate of claim 31 is characterized in that, is included in the step of the silica-based following coated film of formation between insulativity substrate surface and the grid wiring metal film.
34. the manufacture method as the bottom gate type tft array substrate of claim 31 is characterized in that, forms the alloy film of aluminium system at least, as the grid wiring metal film.
35. the manufacture method as the bottom gate type tft array substrate of claim 31 is characterized in that, in oxidation step, uses anodizing in neutral solution.
36. liquid crystal indicator, it is characterized in that, the color filter side of the filter substrate of the array side of bottom gate type tft array substrate and the opposed transparency electrode of formation is opposed, keep predetermined gap to fit, in described gap, insert and put liquid crystal by alignment films, wherein, in bottom gate type tft array substrate side, at least gate electrode and grid wiring side are oxidized, reflection pixel metal electrode is the double-layer structural of contacting metal electrode and other metal electrode films, be connected to the drain region of TFT by the contacting metal electrode, source electrode intermittently connects up by contacting metal electrode and the two-layer source region that is connected to TFT of metal electrode.
37. the liquid crystal indicator as claim 36 is characterized in that, the protected film of the part of tft array covers at least.
38. the liquid crystal indicator as claim 37 is characterized in that, diaphragm is an inorganics.
39. the manufacture method of a liquid crystal indicator, it is characterized in that, comprising: by on the insulativity substrate surface, forming the step of grid wiring metal film and gate insulating film and semiconductor film at least, use photoetching process to form the step of described semiconductor film and gate insulating film and grid wiring metal film successively by the 1st figure, to grid wiring with become the step that oxidation is carried out in the side of the grid wiring metal film figure of gate electrode part, form the step of contact electrode metal film and metal electrode film, the step of with the 2nd figure the part of described metal electrode film and contact electrode metal film and semiconductor film being corroded with photoetching process is made the step of bottom gate type tft array substrate; Form the step of alignment films more thereon; Form opposed transparency electrode and on the opposite electrode side surface of filter substrate, form the step of alignment films and described two alignment films are kept predetermined gap and position alignment is engaged fixing peripheral step with the inboard respectively; And the step of between the described the 1st and the 2nd substrate, injecting the liquid crystal of regulation.
40. the manufacture method as the liquid crystal indicator of claim 39 is characterized in that comprising, after the step of making the bottom gate type tft array substrate, covers the step of the part of described tft array at least with diaphragm before forming alignment films.
41. the manufacture method as the liquid crystal indicator of claim 39 is characterized in that metal electrode and contacting metal electrode are formed at one deck by identical material.
42. a bottom gate type tft array substrate comprises intermittently wiring of source electrode, grid wiring, gate insulating film, semiconductor film and comb shape pixel capacitors group, it is characterized in that,
At least oxidation is carried out in gate electrode and grid wiring side and the 1st comb shape pixel capacitors side, the 2nd comb shape pixel metal electrode is connected to the drain region of TFT through the contact electrode metal, and the interrupted wiring of source electrode is connected to the source region of TFT through contact electrode metal and metal electrode.
43. the bottom gate type tft array substrate as claim 42 is characterized in that, the oxide film of gate electrode side and the 1st comb shape pixel capacitors side is an anode oxide film.
44. the bottom gate type tft array substrate as claim 42 is characterized in that, five layers of structure that the part of the interrupted wiring of source electrode and the 1st comb shape pixel capacitors become grid wiring metal film, semiconductor film, contact electrode metal film and metal electrode film.
45. the bottom gate type tft array substrate as claim 42 is characterized in that, forms the contact electrode metal in the junction of semiconductor film and comb poles.
46. the bottom gate type tft array substrate as claim 42 is characterized in that, the interrupted wiring of source electrode is cut off, carried out cross connection through contact electrode metal and metal electrode on grid wiring and the 1st comb poles by grid wiring and the 1st comb poles.
47. the bottom gate type tft array substrate as claim 42 is characterized in that, the part of semiconductor film is the double-layer structural of i type layer and n type layer.
48. the bottom gate type tft array substrate as claim 42 is characterized in that, forms end coated film between insulativity substrate surface and grid wiring metal film.
49. the manufacture method of a bottom gate type tft array substrate is characterized in that, comprising: the step that on the insulativity substrate surface, forms grid wiring metal film, gate insulating film, semiconductor film and contact electrode metal film at least; Corrode the step of described contact electrode metal film, semiconductor film, gate insulating film and grid wiring metal film successively with the 1st figure with photoetching process; To grid wiring, gate electrode with become the step that oxidation is carried out in the side of the metal film figure of the 1st comb shape pixel capacitors part; Form the step of metal electrode film; And the step of corroding the part of described metal electrode film, contact electrode metal film and semiconductor film with photoetching process with the 2nd figure successively.
50. the manufacture method as the bottom gate type tft array substrate of claim 49 is characterized in that, grid wiring and gate electrode and the part that becomes the 1st comb shape pixel capacitors are corroded simultaneously.
51. the manufacture method as the bottom gate type tft array substrate of claim 49 is characterized in that, is included in the step that forms end coated film between insulativity substrate surface and the grid wiring metal film.
52. the manufacture method as the bottom gate type tft array substrate of claim 49 is characterized in that, forms grid wiring metal film, gate insulating film and semiconductor film at least continuously.
53. the manufacture method as the bottom gate type tft array substrate of claim 49 is characterized in that, uses anodizing in oxidation step.
54. liquid crystal indicator, it is characterized in that, the electrode side of bottom gate type tft array substrate and the color filter side of filter substrate are opposed, keep predetermined gap and applying, in described gap, insert and put liquid crystal as alignment films, wherein, in the bottom gate type tft array substrate, at least gate electrode, grid wiring side and the 1st comb poles side are oxidized, the 2nd comb shape pixel metal electrode is connected to the drain region of TFT through the contact electrode metal, and the interrupted wiring of source electrode is connected to the source region of TFT through contact electrode metal and metal electrode.
55. the liquid crystal indicator as claim 54 is characterized in that, the protected film of the part of tft array covers at least.
56. the liquid crystal indicator as claim 55 is characterized in that, diaphragm is an inorganics.
57. the manufacture method of a liquid crystal indicator, it is characterized in that comprising, by on the insulativity substrate surface, forming the grid wiring metal film at least, gate insulating film, the step of semiconductor film and contact electrode metal film, corrode described contact electrode metal film with photoetching process successively with the 1st figure, semiconductor film, the step of gate insulating film and grid wiring metal film, to grid wiring, gate electrode and become the step that oxidation is carried out in the side of the metal film figure of the 1st comb shape pixel capacitors part, form the step of metal electrode film, corrode described metal electrode film successively with the 2nd image with photoetching process, the step of the part of contact electrode metal film and semiconductor film is made the step of bottom gate type tft array substrate; And the step that forms alignment films thereon; Form the step of alignment films on the surface of filter substrate and make described two alignment films keep predetermined gap and position alignment is carried out the fixing step of periphery with the inboard respectively; And the step of between the described the 1st and the 2nd substrate, injecting the liquid crystal of regulation.
58. the manufacture method as the liquid crystal indicator of claim 57 is characterized in that, comprising: after the step of making the bottom gate type tft array substrate, before forming alignment films, cover the step of the part of described tft array at least with diaphragm; And as mask metal electrode film, contact electrode metal film, semiconductor film and gate insulating film are corroded and step that the grid wiring terminal is exposed with this diaphragm.
59. manufacture method as the liquid crystal indicator of claim 58; it is characterized in that; after the step of making the bottom gate type tft array substrate; before forming alignment films; part to the described tft array of major general is covered by diaphragm; corrode as mask with this diaphragm the grid wiring terminal is exposed, form silicon dioxide film or silicon nitride film again as diaphragm.
60. bottom gate type tft array substrate, comprise intermittently wiring of source electrode, grid wiring, gate insulating film, semiconductor film and comb shape pixel metal electrode group, it is characterized in that, at least gate electrode and grid wiring side are oxidized, comb shape reflection pixel metal electrode is the double-layer structural of contacting metal electrode and other metal electrode films, be connected to the drain region of TFT by the contacting metal electrode, source electrode intermittently connects up by contacting metal electrode and the two-layer source region that is connected to TFT of metal electrode.
61. the bottom gate type tft array substrate as claim 60 is characterized in that, uses the metal of aluminium system on gate electrode, the dielectric film of side is an anode oxide film.
62. the bottom gate type tft array substrate as claim 60 is characterized in that, the part of the interrupted wiring of source electrode is five layers of structure of grid wiring metal film, gate insulating film, semiconductor film, contact electrode metal film and metal electrode film.
63. the bottom gate type tft array substrate as claim 60 is characterized in that, forms the contacting metal electrode between source electrode, comb poles and semiconductor film.
64. the bottom gate type tft array substrate as claim 60 is characterized in that, the interrupted wiring of source electrode is cut off by grid wiring, carries out cross connection by contacting metal electrode and metal electrode are two-layer on grid wiring.
65. the bottom gate type tft array substrate as claim 60 is characterized in that, the part of semiconductor film is the double-layer structural of i type layer and n type layer.
66. the bottom gate type tft array substrate as claim 60 is characterized in that, forms end coated film between insulativity substrate surface and grid wiring metal film.
67. the manufacture method of a bottom gate type tft array substrate is characterized in that, comprising: the step that on the insulating film substrate surface, forms grid wiring metal film, gate insulating film and semiconductor film at least; Corrode the step of described semiconductor film, gate insulating film and grid wiring metal film successively with the 1st figure with photoetching process; To grid wiring, gate electrode with become the step that oxidation is carried out in the side of the grid wiring metal film figure of the 1st comb poles part; Form the step of contact electrode metal film and metal electrode film; And the step of corroding the part of described metal electrode film, contact electrode metal film and semiconductor film with photoetching process with the 2nd figure.
68. the manufacture method as the bottom gate type tft array substrate of claim 67 is characterized in that semiconductor film is the double-layer structural of i type layer and n type layer, and the part of n type layer is corroded to i type layer.
69. the manufacture method as the bottom gate type tft array substrate of claim 67 is characterized in that, is included in the step that forms end coated film between insulativity substrate surface and the grid wiring metal film.
70. the manufacture method as the bottom gate type tft array substrate of claim 67 is characterized in that, forms grid wiring metal film, gate insulating film and semiconductor film at least continuously.
71. the manufacture method as the bottom gate type tft array substrate of claim 67 is characterized in that, uses anodizing in oxidation step.
72. liquid crystal indicator, it is characterized in that, color filter one side of the filter substrate of the array side of bottom gate type tft array substrate and the opposed transparency electrode of formation is opposed, keep predetermined gap to fit, in described gap, insert and put liquid crystal as alignment films, wherein, in bottom gate type tft array substrate side, at least gate electrode and grid wiring side are oxidized, the 1st comb shape pixel metal electrode is the double-layer structural of contacting metal electrode and other metal electrode films, be connected to the drain region of TFT by the contacting metal electrode, source electrode intermittently connects up by contacting metal electrode and the two-layer source region that is connected to TFT of metal electrode.
73. the liquid crystal indicator as claim 72 is characterized in that, the protected film of the part of tft array covers at least.
74. the liquid crystal indicator as claim 72 is characterized in that, diaphragm is an inorganics.
75. the manufacture method of a liquid crystal indicator, it is characterized in that, comprise: by on the insulativity substrate surface, forming the grid wiring metal film at least, the step of gate insulating film and semiconductor film, corrode described semiconductor film with photoetching process successively with the 1st figure, the step of gate insulating film and grid wiring metal film, to grid wiring, gate electrode and become the step that oxidation is carried out in the side of the grid wiring metal film figure of the 1st comb poles part, form the step of contact electrode metal film and metal electrode film, corrode described metal electrode film with the 2nd figure with photoetching process, the step of the part of contact electrode metal film and semiconductor film is made the step of bottom gate type tft array substrate; Form the step of alignment films more thereon; On the opposite electrode side surface of filter substrate, form the step of alignment films and described two alignment films and keep the be adhesively fixed step of periphery of predetermined gap and position alignment with the inboard respectively; And the step of between the described the 1st and the 2nd substrate, injecting the liquid crystal of regulation.
76. the manufacture method as the liquid crystal indicator of claim 75 is characterized in that, be included in the step of making the bottom gate type tft array substrate after, the step that before forming alignment films, covers with diaphragm to the part of the described tft array of major general.
77. the manufacture method as the liquid crystal indicator of claim 75 is characterized in that metal electrode and contacting metal electrode form with one deck with identical material.
78. bottom gate type tft array substrate, comprise intermittently wiring of source electrode, grid wiring, gate insulating film, semiconductor film and comb shape pixel capacitors group, it is characterized in that, at least the side of gate electrode and grid wiring is oxidized, the 1st comb shape pixel capacitors is connected to the drain region of TFT by the contacting metal electrode, the interrupted wiring of source electrode is connected to the source region of TFT by contacting metal electrode and metal electrode, and forms the 2nd comb shape opposite electrode by dielectric film.
79. the bottom gate type tft array substrate as claim 78 is characterized in that the oxide film of gate electrode side is an anode oxide film.
80. the bottom gate type tft array substrate as claim 78 is characterized in that, the part of the interrupted wiring of source electrode becomes five layers of structure of grid wiring metal film, semiconductor film, contact electrode metal film and metal electrode film.
81. the bottom gate type tft array substrate as claim 78 is characterized in that, is formed with the contact electrode metal between semiconductor film, source electrode and drain electrode.
82. the bottom gate type tft array substrate as claim 78 is characterized in that, the interrupted wiring of source electrode is cut off by grid wiring, carries out cross connection by contact electrode metal and metal electrode on grid wiring.
83. the bottom gate type tft array substrate as claim 78 is characterized in that, the part of semiconductor film is the double-layer structural of i type layer and n type layer.
84. the bottom gate type tft array substrate as claim 78 is characterized in that, forms end coated film between insulativity substrate surface and grid wiring metal film.
85. the manufacture method of a bottom gate type tft array substrate is characterized in that, comprising: the step that on the insulativity substrate surface, forms grid wiring metal film, gate insulating film, semiconductor film and contact electrode metal film at least; Corrode the step of described contact electrode metal film, semiconductor film, gate insulating film and grid wiring metal film successively with the 1st figure with photoetching process; To grid wiring with become the step that oxidation is carried out in the side of the metal film figure of gate electrode part; Form the step of metal electrode film; Corrode the step of the part of described metal electrode film, contact electrode metal film and semiconductor film successively with the 2nd figure with photoetching process; And the step that forms the 2nd comb shape opposite electrode by dielectric film with the 3rd figure.
86. the manufacture method as the bottom gate type tft array substrate of claim 85 is characterized in that semiconductor film is the double-layer structural of i type layer and n type layer, and the part of n type layer is corroded.
87. the manufacture method as the bottom gate type tft array substrate of claim 85 is characterized in that, is included in the step that forms end coated film between insulativity substrate surface and the grid wiring metal film.
88. the manufacture method as the bottom gate type tft array substrate of claim 85 is characterized in that, forms grid wiring metal film, gate insulating film and semiconductor film at least continuously.
89. the manufacture method as the bottom gate type tft array substrate of claim 85 is characterized in that, uses anodizing in oxidation step.
90. liquid crystal indicator, it is characterized in that, color filter one side of the filter substrate of the array side of bottom gate type tft array substrate and the opposed transparency electrode of formation is opposed, keep predetermined gap to fit, in described gap, insert and put liquid crystal as alignment films, wherein, in bottom gate type tft array substrate side, at least gate electrode and grid wiring side are oxidized, the 1st comb shape pixel metal electrode is connected to the drain region of TFT by the contacting metal electrode, the interrupted wiring of source electrode is connected to the source region of TFT by contact electrode metal and metal electrode, and passes through dielectric film Cheng Youdi 2 comb shape opposite electrodes.
91. the liquid crystal indicator as claim 90 is characterized in that, the protected film of the part of tft array covers at least.
92. the liquid crystal indicator as claim 90 is characterized in that, diaphragm is an inorganics.
93. the manufacture method of a liquid crystal indicator, it is characterized in that comprising: by on the insulativity substrate surface, forming the grid wiring metal film at least, gate insulating film, the step of semiconductor film and contact electrode metal film, corrode the contact electrode metal film with photoetching process successively with the 1st figure, described semiconductor film, the step of gate insulating film and grid wiring metal film, to grid wiring with become the step that oxidation is carried out in the side of the metal film figure of gate electrode part, form the step of metal electrode film, corrode described metal electrode film with photoetching process successively with the 2nd figure, the step of the part of contact electrode metal film and semiconductor film, the step that forms the 2nd comb shape opposite electrode with the 3rd figure by diaphragm is made the step of bottom gate type tft array substrate; Form the step of alignment films more thereon; The step and described two alignment films that form alignment films on the opposite electrode side surface of filter substrate keep predetermined gap and position alignment to engage the step of fixing periphery with the inboard respectively; And the step of between the described the 1st and the 2nd substrate, injecting the liquid crystal of regulation.
94. the manufacture method as the liquid crystal indicator of claim 93 is characterized in that, be included in form the 2nd comb shape opposite electrode after, the step that covers with diaphragm to the part of described the 2nd comb shape opposite electrode of major general.
95. the manufacture method as the liquid crystal indicator of claim 93 is characterized in that, forms silicon dioxide film or silicon nitride film as diaphragm.
96. bottom gate type tft array substrate, comprise intermittently wiring of source electrode, grid wiring, gate insulating film, semiconductor film and comb shape pixel capacitors group, it is characterized in that, at least the side of gate electrode and grid wiring is oxidized, the 1st comb shape pixel metal electrode is connected to the drain region of TFT by the double-layer structural of contacting metal electrode, the interrupted wiring of source electrode is connected to the source region of TFT by contact electrode metal and metal electrode, and forms the 2nd comb shape opposite electrode by dielectric film.
97. the bottom gate type tft array substrate as claim 96 is characterized in that, the interrupted wiring of source electrode is connected by the double-layer structural of metal electrode with the contact electrode metal at least.
98. the manufacture method of a bottom gate type tft array substrate is characterized in that, comprising: the step that on the insulativity substrate surface, forms grid wiring metal film, gate insulating film and semiconductor film at least; Corrode the step of described semiconductor film, gate insulating film and grid wiring metal film successively with the 1st figure with photoetching process; To grid wiring with become the step that oxidation is carried out in the side of the metal film figure of gate electrode part; Form the step of contact electrode metal film and metal electrode film; Corrode the step of the part of described metal electrode film, contact electrode metal film and semiconductor film successively with the 2nd figure with photoetching process; And the step that forms the 2nd comb shape opposite electrode by dielectric film with the 3rd figure.
99. liquid crystal indicator, it is characterized in that, color filter one side of the electrode side of bottom gate type tft array substrate and filter substrate is opposed, keep predetermined gap to fit, in described gap, insert and put liquid crystal as alignment films, wherein, in bottom gate type tft array substrate side, at least gate electrode and grid wiring side are oxidized, the 1st comb shape pixel metal electrode is connected to the drain region of TFT by 2 layers of structure of contact electrode metal, the interrupted wiring of source electrode is connected to the source region of TFT by contact electrode metal and metal electrode, and forms the opposite electrode of the 2nd comb shape by dielectric film.
100. the manufacture method of a liquid crystal indicator, it is characterized in that comprising: by on the insulativity substrate surface, forming the grid wiring metal film at least, the step of gate insulating film and semiconductor film, corrode described semiconductor film with photoetching process successively with the 1st figure, the step of gate insulating film and grid wiring metal film, to grid wiring with become the step that oxidation is carried out in the side of the metal film figure of gate electrode part, form the step of contact electrode metal film and metal electrode film, corrode described metal electrode film with photoetching process successively with the 2nd figure, the step of the part of contact electrode metal film and semiconductor film, and the step of making the bottom gate type tft array substrate by the step that diaphragm forms the 2nd comb shape opposite electrode with the 3rd figure; Form the step of alignment films more thereon; The step and described two alignment films that form alignment films on color filter one side surface of filter substrate keep predetermined gap and position alignment to engage the step of fixing periphery with the inboard respectively; And the step of between the described the 1st and the 2nd substrate, injecting the liquid crystal of regulation.
101. the manufacture method as the liquid crystal indicator of claim 100 is characterized in that, comprises the step that covers the part of described at least the 2nd comb shape opposite electrode with diaphragm.
CNB008125724A 1999-09-08 2000-09-08 Electric circuit board, TFT array substrate using same, and liquid crystal display Expired - Fee Related CN1225719C (en)

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US6885110B1 (en) 2005-04-26
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