CN1322322C - Quantum coherent micro-detection device - Google Patents

Quantum coherent micro-detection device Download PDF

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Publication number
CN1322322C
CN1322322C CNB2004100890226A CN200410089022A CN1322322C CN 1322322 C CN1322322 C CN 1322322C CN B2004100890226 A CNB2004100890226 A CN B2004100890226A CN 200410089022 A CN200410089022 A CN 200410089022A CN 1322322 C CN1322322 C CN 1322322C
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China
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crystal
detector according
rubidium
quantum interfering
microscopic detector
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CN1614390A (en
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金石琦
龚尚庆
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Shanghai Institute of Optics and Fine Mechanics of CAS
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Shanghai Institute of Optics and Fine Mechanics of CAS
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Abstract

A quantum coherent microscopic detection device comprises a crystal as a core element, a resonant cavity, a fiber probe in front of the resonant cavity, a micro-cantilever connected to one end of the fiber probe, a bimorph element tightly connected to the other end of the micro-cantilever and arranged above a sample, a piezoelectric transistor tightly connected to the lower surface of the sample, a laser arranged above the fiber probe, a pair of gratings arranged at the exit end of the resonant cavity and having an inner cavity obliquely above the pair of gratings, a filter arranged in the inner cavity and connected to a computer, a reflecting element arranged at the other side of the pair of gratings, a first dichroic plate arranged at one side of the reflecting element, a second dichroic plate arranged below the first dichroic plate, a rubidium box arranged in the direction of light reflected by the second dichroic plate and connected to the computer, a mirror-locked oscillator connected to the microcontroller and the piezoelectric transistor, and a pump light source arranged at one side of the crystal, the idler light from the crystal enters the collimating element on the other side through the refractive element and the second dichroic plate into the rubidium cell.

Description

Quantum interfering microscopic detector
Technical field
The present invention relates to microscopic detector, particularly a kind of quantum interfering microscopic detector.Mainly realize the detection of microcosmic sample by the optical system of controllable way generation nonlinearities change and the nonlinear kinetics of quantum coherent and micro-cantilever.
Background technology
In the prior art this. you. (S.L.Lee) people of etc.ing Lee has discussed the mechanism of the nonlinear kinetics of micro-cantilever in " nonlinear kinetics of piston type atomic force microscope micro-cantilever: the theoretical and comparison of testing " (Nonlinear dynamics ofmicro-cantilevers in tapping mode atomic force micro-scopy:Acomparison between theory and experiment, Physical Review B 66115049 (2002)) literary composition.Braak. reach people such as prolonging (Bavak Dayan) and " using conversion method realization coherent control two-photon absorption under the bbo crystal I type non-colinear in convert light coherent control two-photon absorption under the broadband (Twophoton absorption and coherent control with Broadbanddown-converted light; Physical Review Letters is V.93; N.2, (the 2004)) literary composition.
Summary of the invention
The purpose of this invention is to provide a kind of quantum interfering microscopic detector, this device has the high characteristics of detection accuracy.
The principle of quantum interfering microscopic detector of the present invention is: utilize the control piezotransistor to drive the cantilever concussion, the scanning samples tissue surface, when laser illumination probe and sample, the nonlinear dynamic characteristic of micro-cantilever makes reflected light carry the interaction information of potential field between probe and the sample, utilize nonlinear effect to amplify in nonlinear crystal itself and pump light, the flashlight of outgoing enters the rubidium box with idle light by the dichroic sheet behind filter delay.Excite rubidium atom 5S-4D energy level, realize fluorescence signal output, spectral characteristic has reflected the information of sample tissue.This device has the high characteristics of detection accuracy.
Technical solution of the present invention is as follows:
A kind of quantum interfering microscopic detector, characteristics are that its formation comprises: an atomic force microscope, the fibre-optical probe of this atomic force microscope links to each other with bimorph cell by micro-cantilever, sample places on the piezotransistor, the laser that laser instrument sends is radiated on the described sample through described fibre-optical probe, the flashlight that this sample produces enters in the resonator cavity and incides on the interior crystal of this resonator cavity, one pump light source places described resonator cavity to reach a side of crystal outward, the pump light that this pump light source is sent enters this crystal and forms amplifying signal light and idle light with the flashlight interaction, by the amplifying signal light of resonator cavity output successively through first grating of grating pair, inner chamber and interior wave filter thereof, second grating of grating pair, the right angle reflecting element, the first dichroic sheet and the second dichroic sheet, amplifying signal light by the reflection of the second dichroic sheet incides in the rubidium box, described idle light is through collimating element, the refracting element and the second dichroic sheet enter in the described rubidium box, an output terminal of this rubidium box is connected with computing machine, another output terminal is through phase-locked oscilaltor, microcontroller links to each other with described piezotransistor, and described wave filter is connected with described computing machine.
Described laser instrument and pump laser can be the optical fiber solid state laser, or semiconductor laser.
Described bimorph cell is to have birefringent crystal.
Described micro-cantilever is the higher metal of elasticity.
Described fibre-optical probe has the total internal reflection characteristic and forms through hf etching.
Described resonator cavity is a plane mirror, and plano-concave catoptron outgoing minute surface is semi-transparent semi-reflecting combining.
Described crystal is barium metaborate BBO, or three lithium borate LBO, or potassium dihydrogen phosphate KDP, or KTP KTP nonlinear crystal.。
Described inner chamber is that the concave surface completely reflecting mirror combines.
Described grating pair is the plane blazed grating.
Described wave filter is to select mode filter.
Described reflecting element is the plane, and the plano-concave catoptron is formed.
Described dichroic sheet is the plated film level crossing, a transmission, the inaccurate reverse transmission of reflected light.
Described rubidium box is the can that has entrance port and exit portal.
Described phase-locked oscilaltor is a digital to analog converter, and electronic component constitutes.
Described microcontroller is a converter, and electronic component is integrated.
Described collimating element is a parallel light tube, or telescope, or two concavees lens groups.
Described piezotransistor has the piezoelectric property material and makes.
The advantage of quantum coherent control two-photon absorption microscopic detector of the present invention:
1. use quantum interfering microscopic detector of the present invention can be realized the detection accuracy than flashlight self bandwidth and 3-5 the order of magnitude of pulsewidth raising.
2. directly do not contact sample surfaces, do not damage sample, the soft tissue surfaces that is particularly suitable for easily hindering is surveyed.
3. sample is changed easily, and the kind of use is many.
4. signal to noise ratio (S/N ratio) is higher.
Description of drawings
Fig. 1 is the most preferred embodiment structural representation of quantum interfering microscopic detector of the present invention.
Among the figure:
The 1-bimorph cell 2-micro-cantilever 3-fibre-optical probe 4-laser instrument 5-resonator cavity 6-pump laser 7-crystal 8-inner chamber 9-grating pair 10-wave filter 11-reflecting element 12-first dichroic sheet 13-rubidium box 14-phase-locked oscilaltor 15-microcontroller 16-computing machine 17-second dichroic sheet 18-refracting element 19-collimating element 20-piezotransistor 21-sample.
Embodiment:
See also Fig. 1 earlier, Fig. 1 is a quantum interfering microscopic detector optimum structure embodiment synoptic diagram of the present invention, as seen from the figure, quantum interfering microscopic detector of the present invention, comprise most crucial element crystal 7, crystal 7 places within the resonator cavity 5, is fibre-optical probe 3 before the resonator cavity 5, and fibre-optical probe is connected an end of the micro-cantilever 2 of atomic force microscope.The other end of this micro-cantilever 2 and bimorph cell 1 are being close to, and place on the sample 21.Be close to then piezotransistor 20 below the sample 21, laser instrument 4 places fibre-optical probe 3 tops, resonator cavity 5 exit ends are being placed grating pair 9, the oblique upper of grating pair 9 is inner chambers 8, wave filter 10 places inner chamber 8, and be connected in computing machine 16, grating pair 9 opposite sides are placed reflecting element 11, the first dichroic sheet 12 places reflecting element 11 left sides, and the second dichroic sheet 17 places the first dichroic sheet, 12 belows, and rubidium box 13 places after the second dichroic sheet 17, and be connected with computing machine 16, phase-locked oscilaltor 14 places respectively after the rubidium box 13 with microcontroller 15, and millimicro controller 15 is connected with piezotransistor 20, and another road pumping laser light source 6 places crystal 7 left sides.Crystal 7 right sides are collimating elements 19, and refracting element 18 places after the collimating element 19, and are positioned at before the second dichroic sheet 17.
Said laser instrument 4 and pump laser 6 can be the optical fiber solid state laser, or semiconductor laser.
Said bimorph cell 1 is the multipolymer of Kynoar (PVDF) and trifluoro-ethylene, or odd nylons is made.
Said cantilever 2 is that the high metal of elasticity is made.
Said fibre-optical probe 3 is that the optical fiber with total internal reflection characteristic forms through hf etching.
Said resonator cavity 5 is plane mirrors, the plano-concave catoptron, and concave mirror, the incident end is coated with total reflection film, and exit end plates semi-transparent semi-reflecting film.
Said crystal 7 is BBO, LBO, KDP, KTP nonlinear crystal.
The concave surface completely reflecting mirror that said inner chamber 8 is plating total reflection films forms.
Said grating pair 9 is the plane blazed grating.
Said wave filter 10 is to select mode filter.
Said reflecting element 11 is planes, and the plano-concave catoptron is formed.
Said dichroic sheet 12 and 17 is plated film level crossings, a transmission, the inaccurate reverse transmission of reflected light.
Said rubidium box 13 is the cans that have incidence window and outgoing window, and incidence window is that infrared glass is made, and the outgoing window is a multichannel photomultiplier passage multiplier tube.
Said phase-locked oscilaltor 14 is that the digital to analog converter electronic component constitutes.
Said millimicro controller 15 is register (SAR) converters, A/D converter, and electronic component is integrated.
Said piezotransistor 20 is high uniformity, the quartz of high integrality, or lithium niobate, or lithium tantalate, or lithium tetraborate, or potassium niobate is made.
Said collimating element 19 is parallel light tubes, or telescope, or two convex lens groups.
Said refracting element 18 is a glass, or the flat board made of transparent polymer.
But said computing machine 16 processing control signals.
The quantum interfering microscopic detector course of work of the present invention is:
The laser radiation of sending when laser instrument 4 is during to fibre-optical probe 3, fibre-optical probe 3 has the characteristics of motion of self under the drive of bimorph cell 1 and micro-cantilever 2, sample 21 is subjected to also to have under the control of microcontroller 15 and phase-locked oscilaltor 14 characteristics of motion of himself at piezotransistor 20, the illumination of fibre-optical probe 3 transmission is mapped to the sample 21 surfaces reflex time information of having carried nonlinear dynamic characteristic between micro-cantilever 2 and the sample 21 again, the flashlight Is that has the reflection of interaction information enters and incides on the nonlinear crystal 7 in the resonator cavity 5, pump light Ip that pump laser 6 sends and flashlight Is are angled to be incided in the crystal 7, nonlinear coupling effects when flashlight Is and pump light Ip meet in crystal 7, flashlight Is is exaggerated, by two kinds of light of crystal 7 outputs, a kind of is the flashlight Gs that is exaggerated, another kind of light is called idle light Gi, idle light Gi collimates after the refracting element 18 directives second dichroic sheet 17 through collimating element 19, flashlight Gs changes directive inner chamber 8 by first grating of grating pair 9, wave filter 10 in inner chamber 8 is selected corresponding waveform, select the programmed control of Waveform Control by computing machine 16, the flashlight Gs that selects waveform converges to second grating of grating pair 9 through inner chamber 8 other end catoptrons, directive reflecting element 11 and dichroic sheet 12 and 17 then, between flashlight Gs and the idle light Gi delay is arranged, through the flashlight Gs of dichroic sheet 17 and idle light Gi directive rubidium box 13 together, 5S-4D energy level in the rubidium is excited and produces fluorescence Spectra after the transition, and fluorescence Spectra is to be sent to after multichannel photomultiplier passage multiplier tube receives to handle out readable data and figure on the computing machine 16 by rubidium box 13 outgoing windows.
In device shown in Figure 1, laser instrument 4 is to make light source with solid state laser, and output wavelength is 800nm, and crystal is BBO, pump laser output 3ns pulse, and wavelength 516.65nm, a megawatt peak power records sample and differentiates 0.04nm.

Claims (10)

1, a kind of quantum interfering microscopic detector, be characterised in that its formation comprises: an atomic force microscope, the fibre-optical probe of this atomic force microscope (3) links to each other with bimorph cell (1) by micro-cantilever (2), sample (21) places on the piezotransistor (20), the laser that a laser instrument (4) sends is radiated on the described sample (21) through described fibre-optical probe (3), the flashlight (Is) that this sample (21) produces enters in the resonator cavity (5) and incides on the interior crystal (7) of this resonator cavity (5), one pump light source (6) places the outer side that reaches crystal (7) of described resonator cavity (5), the pump light (Ip) that this pump light source (6) is sent enters this crystal (7) and forms amplifying signal light (Gs) and idle light (Gi) with flashlight (Is) interaction, by the amplifying signal light (Gs) of resonator cavity (5) output successively through first grating of grating pair (9), inner chamber (8) and interior wave filter (10) thereof, second grating of grating pair (9), right angle reflecting element (11), the first dichroic sheet (12) and the second dichroic sheet (17), amplifying signal light (Gs) by the reflection of the second dichroic sheet (17) incides in the rubidium box (13), described idle light (Gi) is through collimating element (19), the refracting element (18) and the second dichroic sheet (17) enter in the described rubidium box (13), an output terminal of this rubidium box (13) is connected with computing machine (16), another output terminal is through phase-locked oscilaltor (14), microcontroller (15) links to each other with described piezotransistor (20), and described wave filter (10) is connected with described computing machine (16).
2, quantum interfering microscopic detector according to claim 1 is characterized in that described laser instrument (4) and pump light source (6) are the optical fiber solid state laser, or semiconductor laser.
3, quantum interfering microscopic detector according to claim 1 is characterized in that described bimorph cell (1) is to have birefringent crystal, be the multipolymer of Kynoar and trifluoro-ethylene, or odd nylons is made.
4, quantum interfering microscopic detector according to claim 1 is characterized in that described crystal (7) is barium metaborate BBO, or three lithium borate LBO, or potassium dihydrogen phosphate KDP, or KTP KTP nonlinear crystal.
5, quantum interfering microscopic detector according to claim 1 is characterized in that described inner chamber (8) is the concave surface completely reflecting mirror formation of plating total reflection film.
6, quantum interfering microscopic detector according to claim 1 is characterized in that described grating pair (9) is right for the plane blazed grating.
7, quantum interfering microscopic detector according to claim 1 is characterized in that described reflecting element (11) is a plane mirror, or the plano-concave catoptron.
8, quantum interfering microscopic detector according to claim 1 is characterized in that the described first dichroic sheet (12) and the second dichroic sheet (17) are transmissions, the plated film level crossing of the inaccurate reverse transmission of reflected light.
9, quantum interfering microscopic detector according to claim 1 is characterized in that described rubidium box (13) is the can that has incidence window and outgoing window, and incidence window is that infrared glass is made, and the outgoing window is a multichannel photomultiplier passage multiplier tube.
10, quantum interfering microscopic detector according to claim 1 is characterized in that described piezotransistor (20) is the quartz by the high uniformity high integrality, or lithium niobate, or lithium tantalate, or lithium tetraborate, or potassium niobate is made.
CNB2004100890226A 2004-12-02 2004-12-02 Quantum coherent micro-detection device Expired - Fee Related CN1322322C (en)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103162845A (en) * 2011-12-12 2013-06-19 金石琦 Femtosecond time domain single photon space multi-wavelength detector

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000338027A (en) * 1999-05-25 2000-12-08 Shimadzu Corp Scanning probe microscope
JP2002323432A (en) * 2001-02-26 2002-11-08 Seiko Instruments Inc Ultra-high sensitivity displacement measuring system applied by scanning nonlinear permittivity microscope
CN2566262Y (en) * 2002-09-06 2003-08-13 中国科学院上海光学精密机械研究所 Observer with atomic force microscope
CN1445525A (en) * 2003-04-29 2003-10-01 浙江大学 Detector head of doublet atomic force microscope
CN1490606A (en) * 2003-09-15 2004-04-21 北京中科奥纳科技有限公司 Scanning probe microscope
CN1544913A (en) * 2003-11-19 2004-11-10 中国科学院电工研究所 Nonlinear correction method for piezoelectric ceramic tube scanner

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000338027A (en) * 1999-05-25 2000-12-08 Shimadzu Corp Scanning probe microscope
JP2002323432A (en) * 2001-02-26 2002-11-08 Seiko Instruments Inc Ultra-high sensitivity displacement measuring system applied by scanning nonlinear permittivity microscope
CN2566262Y (en) * 2002-09-06 2003-08-13 中国科学院上海光学精密机械研究所 Observer with atomic force microscope
CN1445525A (en) * 2003-04-29 2003-10-01 浙江大学 Detector head of doublet atomic force microscope
CN1490606A (en) * 2003-09-15 2004-04-21 北京中科奥纳科技有限公司 Scanning probe microscope
CN1544913A (en) * 2003-11-19 2004-11-10 中国科学院电工研究所 Nonlinear correction method for piezoelectric ceramic tube scanner

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