CN1297044C - Detection method for terminal crimping state - Google Patents

Abstract

In a method for testing a crimped state of a terminal, in step S1, when a terminal in a good crimped state is obtained, a reference waveform is generated on the basis of a load, and the reference waveform is divided into a plurality of reference waveforms Fragments to set some singularity. In step S2, these reference waveform segments including the singular points of the segments are integrated. In step S3, when a crimped terminal to be tested is obtained, a characteristic waveform is generated based on the load. The characteristic waveform thus generated is divided into a number of sampled waveform segments, and these waveform segments corresponding to the reference waveform segments are integrated. In step S4, the integrated value of the reference waveform segment is compared with the sampled waveform segment and the integrated value, thereby determining whether the crimped state of the crimped terminal is good or not. With this structure, the crimped state of the terminal can be stably determined, defects can be accurately detected, and the time required for testing can be shortened.

Description

Test method for terminal crimp condition

technical field

The invention relates to a terminal crimping equipment, which is used to make a wire with a terminal, and the wire with a terminal can form a wire harness. In particular, the invention relates to a method for testing the crimping state of a terminal. It is used to test the crimp state of the terminal by terminal crimping equipment.

Background technique

To attach a terminal to a wire, a terminal crimping device is traditionally used. In the case of electric wires, before attaching the terminals to the electric wires, parts of the coating, such as the ends thereof, are removed to expose the cores at the ends. That is, the electric wire is subjected to a scratching operation. The above-mentioned terminal is provided with a core caulking leg for caulking the exposed core and a wire caulking leg for caulking the electric wire for each coated portion.

Traditionally, terminals are crimped onto wires in such a way that the core shim legs and the wire shim legs are caulked by terminal crimping equipment. What may happen is that during the crimping process, there will be poor crimping. In order to detect a bad crimp condition of a crimped terminal, a bad crimp detection device is used.

This equipment tests whether a wire with a terminal is bad by comparing the characteristic waveform obtained by sampling some characteristic values in time series during the crimping step with a reference waveform, that is, a characteristic waveform obtained from a wire with a good terminal in advance. This is based on the fact that the characteristic value (load) at abnormal crimping changes in a different way compared to normal crimping, that is, the obtained characteristic curve is different from the reference waveform.

JP-A-185457 discloses an example of a bad crimp detection device. This bad crimp detection device tests whether a wire with a terminal is good or not by comparing the integral value at the time of sampling the characteristic curve with the integral value of the reference waveform obtained when the wire with the terminal is normally crimped.

However, there are varying degrees of waveform differences between the reference waveform and the characteristic waveform, depending on the degree of defect. For example, if the wire is not scratched at the desired location and the coating is partly caulked by the core shim legs, there will be a large difference between the characteristic waveform obtained and the reference waveform. Further, when the core cut at a scraping position is filled by the core filling leg, there will be a large difference between the obtained characteristic waveform and the reference waveform. When these defects are high, it is easy to determine whether the crimped state of the crimped terminal is good or not. However, when there is a small difference between the reference waveform and the characteristic waveform, it will be difficult to judge whether the crimped wire is good or not.

In the bad crimping detection method disclosed in JP-A-185457, the degree of severe defect that produces a large difference in the integral value can be easily detected. However, compared with the reference waveform, the characteristic waveform is high at the start time of crimping and low at the end time of crimping, so that it is difficult to produce a difference in integral value. This will make it difficult to judge whether the crimped wire is good or not.

The judgment as to whether the crimping state of the terminal is good or not is made in the step of crimping the terminal to the wire. This requires shortening the time taken for operation.

As mentioned above, the terminal is provided with a core shim leg and a wire shim leg. These legs are simultaneously caulked by terminal crimping equipment. Therefore, if a bad crimp occurs, it will be difficult to identify a singularity.

Contents of the invention

It is an object of the present invention to provide a terminal crimping state detection device which can stably determine whether the crimping state is good or not, reliably detect a slight degree of failure, and shorten the time required for the determination.

According to the present invention, there is provided a method for testing the crimped state of a terminal on the basis of waveforms of characteristic values obtained during crimping the terminal to the core of an electric wire, comprising the steps : Obtain a reference waveform from the characteristic waveform when the terminal is normally crimped, divide the reference waveform into many first reference waveform segments; divide a characteristic waveform obtained when crimping a terminal to be tested onto the wire into A plurality of segments corresponding to those segments on the reference waveform; determining whether the crimping state of the terminal is good or not based on some first reference waveform segments on the reference waveform and some waveform segments on the characteristic waveform.

According to the above method, since the crimping state of the terminal is tested on the basis of a part of the characteristic waveform divided into some waveform segments, it is possible to stably determine whether the crimping state of the terminal is good, thereby accurately detecting the case of bad crimping . Incidentally, this portion of the characteristic waveform used for determination should preferably be a region that significantly shows a difference in characteristic value depending on whether the crimping state is good or not.

Whether or not the crimp state is good is determined based on the divided waveform segments of a part of the characteristic waveform, which shortens the time required for the determination. Incidentally, the characteristic waveform preferably shows the load applied to the terminal when the terminal is deformed during the crimping operation or during displacement of the crimping device used for crimping. The reference waveform segment and the sampling waveform segment for judging whether the crimping state is good or not are preferably selected according to the terminal and the wire.

In the above method, preferably, the singular points of the reference waveforms are pre-obtained on the basis of reference waveform increments; these first reference waveform segments include these singular points.

According to the above method, since a part of the reference waveform segment used for the judgment includes a singular point, in the case of a terminal on which the load value varies at and around a singular point depending on whether the crimped state is good or not, the Bad crimps can be detected more accurately. Incidentally, a part of the characteristic waveform used for the determination is preferably a region where the characteristic value changes drastically depending on whether the crimping state is good or not.

These singularities are preferably points at which the pair of caulking legs on a crimped terminal are brought together and mutually deformed during crimping by terminal crimping equipment. The point at contact; the point at which the pair of caulking legs of the crimped terminal come into contact with the core and the load begins to rise; the point at which the load changes from "up" to "down" during the process of caulking the core; load The point at which the peak value is reached and thus cannot still be applied.

In the above method, preferably, the singular points of the reference waveform are pre-obtained on the basis of reference waveform increments; the first reference waveform segment is located between these singular points.

According to the above method, since a part of the reference waveform segment used for judgment is located between these singular points, in the case of such a terminal, that is, the degree of ease (or difficulty) of deformation, that is, the load value thereon depends on the crimping Good or bad conditions vary between these singularities, enabling precise and deterministic determination of bad crimp conditions. Incidentally, a part of the characteristic waveform used for the determination is preferably a region where the characteristic value changes drastically depending on whether the crimping state is good or not. Further, in the crimping operation of the terminal, the terminal deforms mainly between these singular points.

These singularities are preferably points at which the pair of caulking legs on a crimped terminal are brought together and mutually deformed during crimping by terminal crimping equipment. The point at which contact is made; the point at which the pair of shim legs of the crimped terminal come into contact with the core; the point at which the load begins to rise; the load increment changes from "up" to "down" during the process of shimring the core The point at which the load reaches its peak value because it cannot still be applied.

According to the present invention, there is also provided a method for testing the crimped state of a terminal on the basis of waveforms of characteristic values obtained in the process of crimping the terminal to the core of an electric wire, characterized in that The method includes the steps of: obtaining a reference waveform from the characteristic waveform when the terminal is normally crimped; obtaining some singular points thereof based on the increment of the reference waveform; obtaining some second reference waveform segments including these singular points; obtaining some including Second waveform segments of points corresponding to these singular points in the characteristic waveform obtained when the terminal to be tested has been crimped onto the electric wire; with these second reference waveform segments and these second waveform segments The crimp condition of the terminal is judged to be good or not based on the fragment.

According to the above method, some of the second reference waveform segments used for making the decision include some singular points, and the second waveform segments of the characteristic waveform to be tested include some segments corresponding to these singular points. Based on the second reference waveform segments and the second sampling waveform segments, it is determined whether the crimping state of the terminal is good. Therefore, in the case of a terminal on which the load value changes at these singular points and its vicinity depending on whether the crimped state is good or not, it is possible to more accurately detect the case of poor crimping. Incidentally, a part of the characteristic waveform used for the determination is preferably a region where the characteristic value changes drastically depending on whether the crimping state is good or not.

The crimping state is determined based on these second reference waveform segments, ie, a part of the reference waveform, and the second sampled waveform segment, ie, a part of the characteristic waveform. This shortens the time required for determination.

Incidentally, the characteristic waveform preferably shows the load applied to the terminal when the terminal is deformed during the crimping operation or during displacement of the crimping device used for crimping. These singularities are preferably points at which the pair of caulking legs on a crimped terminal are brought together and mutually deformed during crimping by terminal crimping equipment. The point at contact; the point at which the pair of caulking legs of the crimped terminal come into contact with the core and the load begins to rise; the point at which the load increment changes from "up" to "down" during the process of caulking the core ;The point at which the load reaches its peak value and cannot be applied any further.

In the above method, preferably, these singular points are the points when the increment of the reference waveform is maximum or zero.

According to the method described above, these singular points where the reference waveform increment is maximum or zero are the points where the pair of shim legs on the crimped terminal are deformed after they are crimped by terminal crimping equipment. The point at which they are brought together to touch each other during the process of caulking; the point at which the pair of caulking legs of the crimped terminal come into contact with the core and the load begins to rise; during the process of caulking the load increments from " The point at which "up" changes to "down"; the point at which the load reaches its peak and cannot still be applied. This allows for a more precise and more certain detection of bad crimp conditions.

According to the present invention, there is also provided a method for testing the crimped state of a terminal on the basis of waveforms of characteristic values obtained in the process of crimping the terminal to the core of an electric wire, characterized in that Include steps:

A reference waveform is obtained from the characteristic waveform when the terminal is normally crimped, and some reference characteristic values are obtained at uniform time intervals of the reference waveform; uniformity of the characteristic waveform obtained when the terminal to be tested has been crimped to the wire Obtain some eigenvalues at time intervals; based on these reference eigenvalues and these eigenvalues, it is judged whether the crimping state of the terminal is good or not.

According to the above method, since the crimping state of the terminal is determined based on these characteristic values at uniform time intervals of the characteristic waveform, the crimping state of the terminal can be stably determined, allowing more accurate determination of bad crimping.

Since the crimp state is judged on the basis of these characteristic values at uniform time intervals of the characteristic waveform, the time taken for the judgment can be shortened. Incidentally, the characteristic waveform is preferably a load applied to the terminal when the terminal is deformed during a crimping operation or displacement of a crimping device used for crimping.

In the above method, preferably, the electric wire has a coating applied to the core, and the terminals have caulking legs to fill the core, and when these caulking legs fill the coating and the core, a first wave is obtained from the waveform. a bad waveform, and a first singular point of the singularities is obtained from the reference waveform and the first bad waveform.

According to the method described above, when these shim legs shim the coating and the core, the first singularity is obtained from the first bad waveform and the reference waveform at normal crimping. This allows deterministic definition of the first singularity.

In the above method, preferably, the first singular point is defined as a point at which the characteristic value of the first bad waveform exceeds the reference waveform as the crimping operation time elapses.

According to the above method, the first singular point is defined as the point when the eigenvalue of the first bad waveform exceeds that of the reference waveform. This allows deterministic definition of the first singularity.

In the above method, preferably, the core is made up of a plurality of conductors bundled together; the terminal has some caulking legs which are used to fill the core; Less when the end is crimped normally, a second bad waveform is obtained from the characteristic waveform; and

A second singularity is obtained from the reference waveform and the second bad waveform.

According to the method described above, when the shim legs shim the conductors, the number of these conductors is less than when the terminal is normally crimped, and the second singularity is defined by a second bad waveform and the reference waveform during normal crimping. This allows deterministic definition of the second singularity.

In the above method, preferably, the second singular point is defined as the point when the characteristic value of the first defective waveform drops below the reference waveform as the crimping operation time elapses. This allows deterministic definition of the second singularity.

The above and other objects and features of the present invention will be more clearly described below in conjunction with the accompanying drawings.

Description of drawings

1 is a front view of a terminal crimping apparatus to which a method for testing a terminal crimping state according to a first embodiment of the present invention is applied;

Figure 2 is a side view of the terminal crimping apparatus shown in Figure 1;

FIG. 3 is a view showing a state where a pressure sensor is attached to the first embodiment;

Fig. 4 is a block diagram of a device used to detect the degree of crimping failure in the first embodiment;

5A and 5B are diagrams showing a reference waveform, an incremental waveform, some singularities, and some first reference waveform segments in the first embodiment;

6A to 6E are sectional views showing the process of crimping a crimping pliers, an anvil, a pair of core caulking legs 50 and a core;

7A and 7B are graphs showing the relationship between a reference waveform and some characteristic waveforms corresponding to different bad states;

FIG. 8 is a flowchart of an example of a process of judging a crimping state according to the first embodiment;

FIG. 9 is a diagram showing a reference waveform, some singular points, and some second reference waveform segments in a second embodiment;

10A and 10B are graphs showing the relationship between reference waveforms and some characteristic waveforms corresponding to different bad states in the second embodiment;

11A and 11B are diagrams showing a reference waveform, some singular points, and some second reference waveform segments in a third embodiment;

12A and 12B are graphs showing the relationship between reference waveforms and some characteristic waveforms corresponding to different bad states in the third embodiment;

13A and 13B are views showing a reference waveform in the fourth embodiment;

14A and 14B are graphs showing the relationship between reference waveforms and some characteristic waveforms corresponding to different bad states in the third embodiment;

15 is a perspective view of a wire and a crimped terminal attached to each other using terminal crimping equipment;

FIG. 16 is a view explaining another technique for obtaining a singularity A in the first to third embodiments;

FIG. 17 is a view explaining another technique for obtaining a singular point B in the first to third embodiments.

Detailed ways

Embodiment 1

Referring now to FIGS. 1 to 8 and 15, a description will be given of a first embodiment of the present invention. Fig. 1 is a front view of a terminal crimping apparatus to which the invention is applied. FIG. 2 is a side view of the terminal crimping apparatus shown in FIG. 1 . A terminal crimping apparatus 200 shown in FIGS. 1 and 2 is used to crimp a crimped terminal 51 to a wire 61 as shown in FIG. 15 .

The wire 61 includes a conductive core 60 and an insulating coating 62 coated on the conductive core 60 . The core 60 is a bundle of a plurality of wires, the cross section of which is circular. These wires in the core 60 are made of conductive metal, such as copper, copper alloy, aluminum or aluminum alloy, and the like. The coating 62 is made of insulating synthetic resin. Before crimping a crimped terminal 51 onto the wire 61, the coating of the wire 61 is partially removed so that the core 60 is partially exposed.

The crimped terminal 51 is formed by bending a conductive metal plate. The crimped terminal 51 is a female end with a cylindrical electrical contact 53 (described later). The crimped terminal 51 includes a wire connection portion 52 to be connected to an electric wire 61, an electrical contact 53 to be connected to other terminal metal fittings, and a bottom wall connecting the wire connection portion 52 to the wire contact 53 54.

The wire connection portion 52 includes a pair of wire caulking legs 55 and a pair of core caulking legs 50 . The pair of wire legs 55 extend upright from both sides of the bottom wall 54 . The pair of wire shim legs 55 bend further toward the bottom wall 54 , sandwiching the coating 62 of the wire 61 between itself and the bottom wall 54 . Thus, the pair of wire caulking legs 55 caulks the coating of the wire 61 .

The pair of core shim legs 50 extend upright from either side of the bottom wall 54 . The pair of core shim legs 50 bend further toward the bottom wall 54 , sandwiching the exposed core 60 between itself and the bottom wall 54 . Thus, the pair of core shim legs 50 caulks the core 60 . The terminal crimping apparatus 200 is used to bend these caulking legs 50 and 55 toward the bottom wall 54 to crimp the crimped terminal 51 onto the wire 61 . In FIG. 1, a frame 1 of a terminal crimping apparatus 200 includes a bottom plate 2 and side plates 3, 3 on both sides.

A servomotor 4 equipped with a reduction gear 5 is fastened in the upper rear region of the two side panels 3 , 3 . A wheel 7 having an eccentric pin (crankshaft) 8 is provided axially around the output shaft 6 of the speed reducer 5 . A slider 9 is rotatably attached to the eccentric pin 8 . Slider 9 is slidably mounted between seats 10 and 10a attached to ram 11 . When the wheel 7 is rotated, the slider 9 slides between these seats 10 and 10a in the horizontal direction, and the ram 11 moves in the vertical direction.

The ram 11 is mounted to ram guide rails 12, 12 formed on the inner surfaces of the two side plates 3, 3 so that they can slide in the vertical direction. Wheel disc 7, slider 9, these seats 10, 10a, ram 11 and ram guide rail 12 form a piston crank mechanism. The ram 11 has a concave engaging portion 13 at the lower end. A crimping pliers holder 15 equipped with a crimping pliers 14 has a protruding engaging portion 16 which is removably mounted in the concave engaging portion 13 .

The crimping pliers 14 are opposed to an anvil 17 . The anvil 17 is fastened on an anvil mount 24 on the base plate 2 . Between the ram 11 and the crimping jaw holder 15 there is a pressure sensor 100 . The pressure sensor 100 is connected to a bad crimp detection device 300 . The bad crimp detecting device 300 is used to detect a vertical load (hereinafter referred to as a load value) from the crimping jaw 14 based on the output of the pressure sensor 100 . During the crimping process, the detected load value is handled as a characteristic value. Incidentally, it should be noted that this load serves as a reaction force from and a force applied to the crimped terminal 51 .

In FIG. 1, reference numeral 18 denotes a terminal supply device of known construction. The terminal supply apparatus 18 includes a terminal rail 19 for supporting crimped terminals 51 connected in a chain (not shown), a terminal press 20, a terminal carrier on one end The terminal carrying arm 22 of the pallet 21, a swing lever 23 for moving the arm 22, and the like.

The swing rod 23 swings back and forth as the ram 11 descends and ascends, so that the terminal carrying pallet 21 delivers the crimped terminals 51 to the anvil 17 one by one. The anvil 17 is modified such that its alignment with the crimping jaws 14 and its removal or replacement can be easily achieved.

The servo motor 4 is reversibly rotatable, so that the ram 11 , that is, the crimping jaw 14 is raised or lowered by a piston-crank mechanism. The servomotor 4 is connected to a drive unit 32 for controlling the drive of the servomotor 4 . As the crimping pliers 14 rise or fall, the crimped terminal 51 is crimped onto the wire 61 between the crimping pliers 14 and the anvil 17 .

An input unit 33 is connected to the drive unit 32 . The input unit 33 is modified to input reference data such as the standard (or size) of the crimped terminal 51 , the size of the corresponding wire 61 , the crimping height, the load (current) applied to the servo motor 4 . An encoder 31 is attached to the output shaft (not shown) of the servo motor 4 . Based on its rotational speed, the position of the crimping tool 14 can be detected and this position information can be fed back to the drive 32 .

FIG. 4 is a block diagram of a bad crimp detection device 300 in this embodiment. The bad crimp detection device 300 includes an amplifier 41 that amplifies the output of the pressure sensor 100, an A/D converter 42 that converts an analog voltage signal generated from the amplifier 41 into digital voltage data, an input unit 43, and a CPU 44. , ROM45, RAM46, display unit 47 and a communication interface 48.

The input unit 43, CPU44, ROM45, RAM46, display unit 47 and communication interface 48 form a microcomputer. The CPU 44 uses a work area in the RAM 46 to execute control operations in a control program stored in the ROM 45 .

In particular, data from the A/D converter 42, which correspond to load values obtained by the pressure sensor, are sampled as characteristic values. The CPU 44 performs operations on the basis of such sampled eigenvalues, and executes the process of creating a reference waveform 71 (as shown in FIG. 5 and other figures), the process of dividing the reference waveform 71 into some reference waveform segments, detecting the reference waveform Singularity at 71, integrating reference waveforms 72a, 72b, 72c, and 72d (described later), entering a threshold and an acceptable range, detecting bad crimps, etc. The resulting results are displayed on the display unit 47 .

When the crimped terminal 51 is crimped, the load data, ie, the characteristic value, obtained by the pressure sensor 100 is obtained, so that the characteristic waveform 71 shown in FIG. 5A is obtained. The characteristic waveform 71 represents the variation of the load over time. The waveform shown in FIG. 5A is a waveform when crimping is normally achieved. When crimping is performed normally, a large number of waveforms are obtained, and they are stored in RAM46 in a prescribed format. Incidentally, the characteristic waveform 71 is hereinafter referred to as a reference waveform 71 .

A/D converter 42 generates data as long as digital data is determined within a specified conversion cycle. Thus, the CPU 44 can sample the characteristic values in a time series on the time axis within the time limit in which the above-mentioned data were generated. The reference waveform (characteristic waveform) 71 can be stored in the RAM 46 as time-series data. Data of the reference waveform 71 is generated in the RAM 46 by averaging a large amount of characteristic waveform data generated when crimping is normally completed.

In the following description, the word "characteristic waveform" is used both when the crimping is completed normally and when it is not completed normally. The word "reference waveform" refers to the characteristic waveform produced when the crimp is normally completed.

Once the reference waveform 71 shown in FIG. 5A has been obtained, the CPU 44 obtains a characteristic value increment per unit time based on the data of the reference waveform 71, thereby generating data of the incremental waveform 73.

Based on the data of the incremental waveform 73, the locations of these extrema or zero crossings (positions on the time axis) can be detected. These locations are defined as singularities. In the example illustrated in FIG. 5B, there are four points A, B, C and D that define singular points. In addition to these four points, points representing the extremum values of the increments are also located at these positions. As described below in one cycle of the crimping process, these four points are special points and their approximate positions are known in advance, enabling their extraction.

Singular points A, B, C, and D are points representing a maximum increment of the reference waveform 71, their neighboring points, or points representing a zero increment and their neighboring points.

6A to 6E are cross-sectional views of the crimping process involving a crimping jaw 14, anvil 17, a pair of caulking legs 50 and a core 60 on a crimped terminal 51. FIGS. 6A to 6D show states at four singular points A, B, C and D, respectively. Fig. 6E shows the state immediately before starting crimping. The four singular points A, B, C and D are points as described below. Incidentally, it should be noted that singular point A corresponds to the first singular point defined in the claims, and singular point B corresponds to the second singular point defined in the claims.

Point A: As illustrated in FIG. 6A, the pair of core shim legs 50 on the crimped terminal 51 are brought together into contact with each other during deformation by the upper R (curved portion) of the crimping pliers.

Point B: As illustrated in Figure 6B, the pair of core shim legs 50 on the crimped terminal 51 come into contact with the core 60 and the force (load) starts to rise.

Point C: As illustrated in Figure 6C, during the process of caulking the core 60 by the pair of core caulking legs 50 on the crimped terminal 51, the increment of the force (load) changes from "rising" to "falling" .

Point D: As illustrated in Figure 6D, the core 60 has been completely caulked by the pair of core caulking legs 50, and the force (load) has reached its peak.

Needless to say, both the data of the reference waveform 71 and the incremental waveform 73 can be handled as time-series data on the same time axis as the characteristic waveform data. Further, the locations of these singular points can be stored as time-bound data that is associated with these time-series data.

The CPU 44 divides the reference waveform 71 into many segments, and among these many segments includes the above singular points A, B, C, and D as reference waveform segments 72a, 72b, 72c, and 72d, which are shaded. Based on the characteristic waveform of each of the reference waveform segments 72a, 72b, 72c and 72d, it can be confirmed whether the crimping state is normal. In the illustrated example, the reference waveform 71 is divided into 20 waveform segments at uniform time intervals.

For each reference waveform segment 72a, 72b, 72c, and 72d, when a bad crimp is identified, the CPU 44 precomputes each reference waveform segment 72a, 72b, 72c and 72d are shaded areas as shown in FIG. 5 .

When crimping the electric wire 61 on which the crimped terminal 51 to be tested is crimped, the CPU 44 generates a characteristic waveform 81 (delineated by a chain line in FIG. 7) and the above-mentioned reference waveform 71. Like the reference waveform 71, the CPU 44 divides the characteristic waveform 81 into segments, and calculates the areas of the waveform segments 82a, 82b, 82c, and 82d corresponding to the reference waveform segments 72a, 72b, 72c, and 72d.

Thereafter, CPU 44 calculates the area differences between reference waveform segments 72a, 72b, 72c, and 72d and waveform segments 82a, 82b, 82c, and 82d, respectively (the differences are indicated by shading in Figures 7A and 7B). If at least one of the differences exceeds a defined threshold, it can be determined that the crimped terminal is not in good condition. If all the differences are within the prescribed threshold range, it can be judged that the crimped state of the crimped terminal is good.

In this way, if a determination is made for each segment including singularities A, B, C, and D, normal crimping (good product) and abnormal crimping (defective product) can be easily distinguished from each other. In the case of abnormal crimping of the bonding coating 62, as can be seen from FIG. 7A, between points A and B, B and C, the characteristic waveform 81 is higher than the reference waveform 71, and between points C and D, The characteristic waveform 81 is lower than the reference waveform 71 .

In comparison, in the case of abnormal crimping in which the core 60 is cut at the scratched position or the amount of wire is insufficient, as seen from FIG. 7B , between points A and B, the characteristic waveform 81 is equal to the reference waveform 71, and and C, between points C and D, the characteristic waveform 81 is lower than the reference waveform 71 .

In this way, since the characteristic waveforms of each segment including singularities A, B, C and D clearly represent the characteristics of each defect, the ability to identify bad crimps can be improved by studying the characteristic waveforms.

Referring now to the flow chart in FIG. 8, an explanation will be given of the process of judging whether the crimped state of the crimped terminal is good or not.

In step S1 , the crimped terminal 51 is crimped onto an electric wire 61 by the terminal crimping device 200 . The wire 61 with the crimped terminal 51 well crimped thereon is generated multiple times to establish the reference waveform 71 .

In step S2, the reference waveform 71 is divided into many waveform segments by the CPU 44 . The CPU 44 or an operation operator sets the singularities A, B, C and D. CPU 44 integrates reference waveform segments 72a, 72b, 72c and 72d including singularities A, B, C and D, respectively.

In step S3 , the crimped terminal 51 to be tested is crimped onto the wire 61 . Like the reference waveform 71 , the characteristic waveform 81 obtained when the crimped terminal 51 is crimped on the electric wire 61 is also divided into waveform segments. Waveform segments 82a, 82b, 82c, and 82d corresponding to reference waveform segments 72a, 72b, 72c, and 72d are integrated.

In step S4, the integrated values (areas) of the reference waveform segments 72a, 72b, 72c, and 72d are compared with the integrated values (areas) of the waveform segments 82a, 82b, 82c, and 82d, respectively. If the difference between them exceeds a threshold, then it can be determined that the wire in question is a bad product, and if the difference between them does not exceed this threshold, then it can be judged that the wire in dispute is a good product.

According to this embodiment, since the crimped state of the crimped terminal 51 is determined on the basis of the characteristic waveform divided into many waveform segments, the crimped state of the crimped terminal 51 can be stably determined, thereby enabling accurate Detects the condition of a bad crimp.

Singularity A is when the pair of core-shim legs 50 on the crimped terminal 51 are deformed by the R (curved portion) of the crimping pliers 14 when the pair of core-shim legs 50 are brought together into contact with each other point. Singularity B is the point at which the value of the load generated when the pair of core shim legs 50 come into contact with the core 60 starts to rise. Singularity C is the point at which the load increment changes from "up" to "down" during the course of the caulking core 60 . Singularity D is the point when the load reaches its peak value (no load is applied). To determine whether the crimped state of the crimped terminal 51 crimped to the electric wire 61 is good, reference waveform segments 72a, 72b, 72c and 72d including singular points A, B, C and D are used. Therefore, when the crimped terminal 51 is crimped, the load can vary at and near the singular points A, B, C, and D depending on whether the crimping condition is good or not, thereby making it possible to accurately and surely determine the cause of the bad crimping. Condition.

Since the crimp state is tested on the basis of the waveform segments 82a, 82b, 82c, and 82d of the characteristic waveform 81 divided into many segments, the time taken for determination can be shortened.

Embodiment 2

Referring now to Figures 9 and 10, a description of a second embodiment of the present invention is given. Like reference numerals denote like symbols.

In this embodiment, after CPU 44 divides the generated reference waveform 71 into some segments and sets singular points A, B, C and D, it sets a reference waveform segment 72e at a position between points B and C, at point The position between C and D sets the reference local waveform 72f of another segment. The CPU 44 calculates the areas of the reference waveforms 72e and 72f.

In order to judge whether the crimping state is good or not, like the reference waveform 71, the characteristic waveform 81 (delineated by a dotted line in FIG. 10 ) obtained when the crimped terminal 51 is crimped to the electric wire 61 is divided into some waveform segments . Whether or not the crimping state is good is judged on the basis of the area difference (shaded portion in FIG. 10 ) between the waveform segments 82e and 82f and those corresponding waveform segments 72e and 72f. In FIG. 10A, the dotted line represents an abnormal crimp (insulation bonding) in which the coating 62 is bonded. In FIG. 10B , the dotted line represents an abnormal crimp (absence of core) where the core 60 is cut at the scraped location or the number of wires of the core 60 is low.

Also in this embodiment, whether or not the crimping state of the terminal is good is determined based on the waveform segments 82e and 82f which are part of the characteristic waveform 81 divided into many segments. For this reason, the time taken for judgment can be shortened.

Singularity A is when the pair of core-shim legs 50 on the crimped terminal 51 are deformed by the R (curved portion) of the crimping pliers 14 when the pair of core-shim legs 50 are brought together into contact with each other point. Singularity B is the point at which the value of the load generated when the pair of core shim legs 50 come into contact with the core 60 starts to rise. Singularity C is the point at which the load increment changes from "up" to "down" during the course of the caulking core 60 . Singularity D is the point when the load reaches its peak value (no load is applied). To determine whether the crimped state of the crimped terminal 51 crimped to the electric wire 61 is good, reference waveform segments 72a, 72b, 72c and 72d including singular points A, B, C and D are used. Therefore, when the crimped terminal 51 is crimped, the load can vary at and near the singular points A, B, C, and D depending on whether the crimping condition is good or not, thereby making it possible to accurately and surely determine the cause of the bad crimping. Condition.

Further, when the crimped terminal 51 is crimped, the crimped terminal 51 may be deformed between singular points A, B, C, and D. FIG. In this case, the ease (or difficulty) of deformation, that is, the load, varies depending on whether the crimping state is good or not. In this way, if the load changes between the singular points A, B, C and D, the crimp state is determined by the area of the segment of the characteristic waveform between the singular points A, B, C and D, so that it can Precise and deterministic detection of bad crimps.

Embodiment 3

Referring now to Figures 11 and 12, a description of a third embodiment of the present invention is given. In Figs. 11 and 12, like reference numerals designate like parts in the first and second embodiments.

In this embodiment, unlike the first and second embodiments, after the CPU 44 generates the reference waveform 71, it does not divide the reference waveform 71 into many waveform segments. Like the first embodiment, the CPU 44 sets singular points A, B, C, and D from the reference waveform 71, as shown in FIG. 11B. The elapsed times TA, TB, TC, and TD from when crimping was started can be obtained. The area within the time period ΔT before and after each elapsed time TA, TB, TC, and TD on the reference waveform 71 is set as the second reference waveform segments 74a, 74b, 74c, and 74d. The respective areas of these second reference waveform segments 74a, 74b, 74c and 74d are calculated.

In order to determine whether the crimped state of the terminal is good or not, based on the elapsed times TA, TB, TC and Td and the time period ΔT, a characteristic waveform 81 obtained when the crimped terminal 51 is crimped to the electric wire 61 (in FIG. The second waveform segments 84a, 84b, 84c and 84d on the dash-dotted line in 12). The second waveform segments 84a, 84b, 84c and 84d correspond to the second reference waveform segments 74a, 74b, 74c and 74d, respectively. These second waveform segments 84a, 84b, 84c and 84d include regions corresponding to singularities A, B, C and D.

Whether the crimping state is good or not is determined based on the difference (shaded portion in FIG. 12A ) between the second waveform segments 84a, 84b, 84c, and 84d and the reference waveform segments 74a, 74b, 74c, and 74d. At the time of determination, if all differences are within a specified threshold, the wire in question is determined to be a good product. If at least one of the differences exceeds a specified threshold, the wire in question is judged to be a bad product.

Incidentally, in FIG. 12A , the dotted line represents abnormal crimping (insulation bonding) in which the coating 62 is bonded. In FIG. 12B , the dotted line represents an abnormal crimp (absence of core) where the core 60 is cut at the scrape location or the number of wires of the core 60 is low.

In this way, according to this embodiment, the second reference waveforms 74a, 74b, 74c and 74d including the singularities A, B, C and D and the regions corresponding to the singularities A, B, C and D Based on these second waveform segments 84a, 84b, 84c and 84d, it is determined whether the crimping state is good or not.

Also in this embodiment, whether the crimping state is good or not is judged on the basis of these second waveform segments 84a, 84b, 84c, and 84d, which are features divided into many segments part of waveform 81. For this reason, the time taken for judgment can be shortened.

Singularity A is when the pair of core-shim legs 50 on the crimped terminal 51 are deformed by the R (curved portion) of the crimping pliers 14 when the pair of core-shim legs 50 are brought together into contact with each other point. Singularity B is the point at which the value of the load generated when the pair of core shim legs 50 come into contact with the core 60 starts to rise. Singularity C is the point at which the load increment changes from "up" to "down" during the course of the caulking core 60 . Singularity D is the point when the load reaches its peak value (no load is applied). To judge whether the crimped state of the crimped terminal 51 is good, reference waveform segments 72a, 72b, 72c, and 72d including singular points A, B, C, and D are used. Therefore, when the crimped terminal 51 is crimped, the load can vary at and near the singular points A, B, C, and D depending on whether the crimping condition is good, thereby making it possible to accurately and surely determine the cause of the bad crimping. Condition.

In this embodiment, since whether or not the crimped state is good is judged on the basis of these second waveform segments 84a, 84b, 84c, and 84d, in the case of such a terminal, that is, depending on whether the crimped state is good or not, the Varying the load at and near singularities A, B, C, and D enables precise and deterministic detection of bad crimps.

Embodiment 4

Referring now to Figures 13 and 14, a description of a fourth embodiment of the present invention is given. In FIGS. 13 and 14, like reference numerals designate like parts from the first to third embodiments.

In this embodiment, the CPU 44 divides the reference waveform 71 into a number of fixed time periods T after generating it, without setting singular points A, B, C, and D. As shown in FIG. 13 , the CPU 44 calculates reference loads P1 , P2 , P3 , . . . , Pn as reference characteristic values for these time periods T.

To judge whether the crimped state is good or not, the CPU 44 divides a characteristic curve (delineated by a dotted line in FIG. 14 ) obtained when the crimped terminal 51 is crimped to the electric wire 61 into a number of fixed time periods T. The CPU 44 calculates load values Pa1, Pa2, Pa3, . . . , Pan, which are characteristic values of these fixed time periods T.

The difference between the reference load values P1, P2, P3, ..., Pn of the reference waveform 71 and the load values Pa1, Pa2, Pa3, ..., Pan of the characteristic curve 81 (symbols ΔP2, ΔP3, ΔP4, ΔP5, ΔP6 ... ΔPn) to determine whether the crimping state is good or not. When judging, if all the differences ΔP2, ΔP3, ΔP4, ΔP5, ΔP6...ΔPn are within a specified threshold range, then it is determined that the wire in question is a good product. If at least one difference among ΔP2, ΔP3, ΔP4, ΔP5, ΔP6... ΔPn exceeds a specified threshold, it is determined that the wire at issue is a defective product.

Incidentally, in FIG. 14A, the dotted line represents abnormal crimping (insulation bonding) in which the coating 62 is bonded. In FIG. 14B , the dotted line represents an abnormal crimp (absence of core) where the core 60 is cut at the scrape location or the number of wires of the core 60 is low.

In this way, in this embodiment, whether or not the crimping state is good is judged on the basis of these load values for a fixed time period T.

Also in this embodiment, whether or not the crimping state is good is determined based on load values Pa1, Pa2, Pa3, . . . , Pan which are part of the characteristic waveform 81 . For this reason, the time taken for judgment can be shortened.

Whether or not the crimping state is good is judged on the basis of many load values, that is, these load values Pa1, Pa2, Pa3, . . . , Pan for a fixed time period T. For this reason, in the case of abnormal crimping (insulation bonding), where the coating 62 is bonded, as shown in FIG. 14A, and in abnormal crimping (absence of core), where the core 60 is cut or In the case where the number of wires of the core 60 is small, as shown in FIG. 14B , it is possible to accurately identify the bad crimping.

In the fourth embodiment, these fixed time periods T are set equal. However, as long as the reference waveform 71 is made to correspond to the characteristic waveform 81, load values for different fixed time periods may be used.

In the first to third embodiments, singular points A, B can be defined as follows. First, as described above, a characteristic waveform (drawn by a solid line in FIG. The crimp core 60 and coating 62 are caulked by the core caulking legs 50 .

The crimping operation continues over time. The elapsed time TA from when the load (characteristic value) of the crimping to the first bad waveform 91 starts to exceed the reference waveform 71 can be obtained. The point at which the elapsed time TA ends is defined as a singularity (the first singularity) A. In this case, since the pair of core shim legs 50 are brought together to contact each other at singularity A, the loading (eigenvalue) of the first bad waveform 91 begins to exceed the reference waveform 71 . Therefore, the first singular point A can be definitely defined on the basis of the load value of the first bad waveform 91 and the reference waveform 71 . This allows precise detection of bad crimp conditions.

After the reference waveform 71 (delineated by the solid line in FIG. 17 ) is generated, a second bad waveform 92 (delineated by the dotted line in FIG. 17 ) is generated in a bad crimp (absent core) where 60 includes a smaller number of wires than normal crimping. The elapsed time TB from when the load (characteristic value) of the second defective waveform 92 does not reach the reference waveform 71 can be obtained.

The point at which the elapsed time TB ends is defined as a singularity (the second singularity) B. In this case, as the pair of core shim legs 50 are brought together to contact each other at singularity B, the loading (eigenvalue) of the second bad waveform 92 begins to drop below the reference waveform 71 . Therefore, the second singular point B can be definitely defined on the basis of the load value of the second bad waveform 92 and the reference waveform 71 . This allows precise detection of bad crimp conditions.

The above bad crimping detection device 300 can be configured as a network system by means of the communication interface 48, for example, many bad crimping detection devices 300 attached to many terminal crimping devices 200 are connected to a portable computer through the network. The data of the reference waveform 71 set by each bad crimp detecting device 300 is supplied to the portable computer and stored on a hard disk installed in the portable computer. The reference waveform 71 in each bad crimp detection device 300 is managed.

In all of the above-mentioned embodiments, the load applied from the crimping jaw holder 15 to the ram 11 is detected as a characteristic value during the crimping process. However, the pressure (load) applied to the anvil 17 or the stress applied from the crimping jaw 14 to the crimping jaw holder and applied to the ram 11, which can be detected by the pressure sensor 100, can also be used as Eigenvalues.

A certain amount of elastic deformation of the elastic deformation portion can be formed in advance on a part of the ram 11, and can also be used as a characteristic value. In this case, it is preferable to arrange the probe on the displacement sensor to be in contact with the elastically deformable portion. The displacement sensor can be arranged between the side plates 3 on the base 1 .

In particular, in the terminal crimping apparatus 200 for crimping the crimped terminal 51 , the frame 1 is deformed by receiving a reaction force during crimping. The amount of deformation will vary depending on the type of terminal crimping apparatus 200 . This is because machine bases of different structures have different rigidities. Some terminal crimping equipment produces large frame deflection, while some terminal crimping equipment produces small frame deflection. It may be assumed that a terminal crimping device produces essentially zero deformation, but this is not practical.

Thus, the actually used terminal crimping apparatus 200 is basically deformed. This amount of deformation can be used as an eigenvalue. Thus, the displacement sensor can be installed in the terminal crimping apparatus 200 by not only measuring the amount of deformation of the machine base 1 but also by providing a groove in the piston crank mechanism which facilitates deformation like a ram.

An acceleration sensor can also be used instead of the displacement sensor. In this case, the acceleration sensor measures the deformation process of the machine base 1 . The characteristic waveform 81 during crimping is obtained from the measurements, thus providing sufficient data to distinguish good products from defective ones.

Depending on its type, the sensor can generate a characteristic value differently, thus providing a different incremental waveform than that in Figure 5B. Also in this case, using the zero-crossing points of the eigenvalues and a peak point, the singular points A, B, C, and D can be obtained as special points within a single cycle in the same crimping process, as shown in Figure 6 shown.

In the embodiments described above, the terminal crimping apparatus 200 which crimps the crimped terminal 51 by driving the servo motor is used. However, it goes without saying that the invention is applicable to any crimping mechanism.

The above-mentioned embodiments all point to a situation that the singularities A, B, C and D are relatively clearly displayed. However, this invention can handle cases where singularities A, B, C and D are not clearly shown. In this case, the characteristic waveform 71 in the case where the crimping state of the terminal is good is compared with the characteristic waveform 81 in the case where the crimping state of the terminal is poor, and those segments with larger integral values are used as reference waveforms Fragments 72a, 72b, 72c, 72d, 72e, 72f, 74a, 74b, 74c and 74d.

In the first embodiment, reference waveform segments 72a, 72b, 72c and 72d including singularities A, B, C and D are used. In the second embodiment, reference waveform segments 72e and 72f excluding singularities A, B, C and D are used. However, according to the present invention, as long as the reference waveform 71 and the characteristic waveform 81 are not all used, the reference waveform segment and the characteristic can be appropriately selected from the waveform segments of the reference waveform 71 and the characteristic waveform 81 according to the crimped terminal 51 and the electric wire 61. Waveform fragment. Further, also in the case where there are four singular points A, B, C, and D, as long as there is a significant difference in the load value according to the crimping state, according to the present invention, for example, three waveform segments can be used.

Claims (9)

1. method of testing terminal crimping state, this method comprises the steps: based on the waveform of some characteristic values of obtaining in the process of terminal crimping to the core of a wire

Obtain reference waveform the signature waveform during from the normal crimping of terminals;

On the basis of the data of described reference waveform, calculate the characteristic value increment of each unit time;

On the time shaft of described reference waveform, determine singular point for extreme value or zero detected position;

When terminal crimping to be tested is to electric wire, obtain signature waveform; And

Judge based on described singular point and signature waveform whether the crimped status of terminals is good.

2. the method for test terminal crimping state according to claim 1 comprises the steps:

Described reference waveform is divided into a plurality of first reference waveform fragments;

A signature waveform that obtains when terminals to be tested of crimping are to electric wire is divided into the corresponding fragment of those fragments on a plurality of and described reference waveform;

With the area discrepancy between the waveform segment of the first reference waveform fragment of the described reference waveform between described singular point place or these singular points and described signature waveform is that the basis judges whether the crimped status of terminals is good.

3. the method for test terminal crimping state according to claim 1 comprises the steps:

Acquisition begins lapse of time to described singular point from crimping;

Acquisition comprises the second reference waveform fragment of described singular point;

Acquisition comprises second waveform segment of the point corresponding with described singular point, and described second waveform segment is in the signature waveform that obtains when crimping terminals to be tested are to electric wire; And

With the area discrepancy between described second reference waveform fragment and described second waveform segment is that the basis judges whether the crimped status of terminals is good.

4. the method for test terminal crimping state according to claim 3 is characterized in that: described electric wire has the coating that one deck is used to apply described core,

Described terminals have the calking leg that is used for the described core of calking,

When described coating of described calking leg calking and described core, from waveform, obtain one first bad waveform,

From the described reference waveform and the described first bad waveform, obtain one first singular point in the described singular point.

5. the method for test terminal crimping state according to claim 4, it is characterized in that: described first singular point is defined as a passage along with the crimping operation time, the point the when characteristic value of the described first bad waveform surpasses the characteristic value of described reference waveform.

6. the method for test terminal crimping state according to claim 3 is characterized in that:

Described core is wrapped up into a branch of conductor and is formed by a plurality of;

Described terminals have the calking leg that is used for the described core of calking;

When the described conductor of described calking leg calking, from signature waveform, obtain one second bad waveform, wherein, the quantity of the quantity of these conductors during than the normal crimping of terminals is lacked; And

From the described reference waveform and the described second bad waveform, obtain one second singular point.

7. according to the method for claim 4 or 5 described test terminal crimping states, it is characterized in that:

Described core is wrapped up into a branch of conductor and is formed by a plurality of;

When the described conductor of described calking leg calking, from signature waveform, obtain one second bad waveform, wherein, the quantity of the quantity of these conductors during than the normal crimping of terminals is lacked; And

From the described reference waveform and the described second bad waveform, obtain one second singular point.

8. the method for test terminal crimping state according to claim 6, it is characterized in that: described second singular point is defined as a passage along with the crimping operation time, the point the when characteristic value of the described second bad waveform drops under the characteristic value of described reference waveform.

9. the method for test terminal crimping state according to claim 7, it is characterized in that: described second singular point is defined as a passage along with the crimping operation time, the point the when characteristic value of the described second bad waveform drops under the characteristic value of described reference waveform.

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