CN1240948A - Method for obtaining image by tomography system - Google Patents

Method for obtaining image by tomography system Download PDF

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CN1240948A
CN1240948A CN 99104171 CN99104171A CN1240948A CN 1240948 A CN1240948 A CN 1240948A CN 99104171 CN99104171 CN 99104171 CN 99104171 A CN99104171 A CN 99104171A CN 1240948 A CN1240948 A CN 1240948A
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image
plane
sectional
cross
ray
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CN 99104171
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金亨哲
金晋永
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三星电子株式会社
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一采用层析X-射线照相系统并通过对先前获取的截面图像数据进行计算获取图像的方法,其不需将物体移动,或反复在物体上照射。 Chromatography using a X- ray radiographing system, and acquires the image data by the sectional image previously acquired calculation method, which was used without moving objects, or repeatedly irradiated on the object. 其步骤为:获得物体参考截面图像,获得物体其他截面假想过渡截面图像,得到假想过渡截面图像的中心点。 Comprising the steps of: obtaining a sectional image of the reference object, the virtual object is to obtain cross-sectional image other transition cross section, the center point of the imaginary transition obtain sectional images. 通过合成假想过渡截面图像以便在中心点D聚焦并平均,得到物体另外截面的图像。 By a transition to an imaginary cross-sectional image combining and averaging, to obtain additional cross-sectional image of the object at the center point D focus. 其可迅速获得物体的多个截面图像,适于医院的CT扫描,印刷电路板,电子元件,和机械零件的检测过程采用。 Which can quickly obtain a plurality of cross-sectional images of objects, suitable for hospital CT scan, a printed circuit board, electronic components, mechanical parts and the use of the detection process.

Description

利用层析X-射线照相系统获取图像的方法 Methods chromatography X- radiographic image acquisition system

本发明涉及一种用于无损检测的层析X-射线照相系统,具体说涉及在预定的高度极限内获取物体各截面图像的方法。 The present invention relates to a method for chromatographic X- ray radiographing system for non-destructive testing, particularly, to obtain the respective cross-sectional images of the object within a predetermined height limit.

现已证明,在焊接部位的无损检测领域中层析X-射线照相是非常有用的。 It has been demonstrated in the field of non-destructive testing of welded portions chromatography X- ray radiography is useful. 例如,在印刷电路板上,很难用肉眼检查焊接部位的状态(以确定该元件是否已经牢固地被焊接固定)。 For example, a printed circuit board, it is difficult to check visually the state of the welded portion (to determine whether the component is firmly fixed by welding). 在这种情况下,可以利用层析X-射线照相系统获取该物体的截面图像。 In this case, the X- ray radiography using the chromatography system to obtain a sectional image of the object.

用于获取被检测物体的截面图像的层析X-射线照相系统如图1所示。 Chromatography X- ray radiographing system for obtaining sectional images of an object to be detected as shown in FIG.

如图1所示,层析X-射线照相系统包括XYZ-平台10,扫描X-射线管20,图像放大器30,视图选择器40,和照相机50。 As shown, chromatography X- ray radiographing system 1 comprises a platform 10 XYZ- scanning X- ray tube 20, image intensifier 30, a view selector 40, and a camera 50. 被检测物体1放在XYZ一平台10上。 XYZ object 1 placed on a platform 10. 扫描X-射线管20将X-射线放射到装载在XYZ-平台10上的物体1上。 20 The X- ray radiation to scan X- ray tube 10 mounted on the platform on the object XYZ- 1. 图像放大器30将穿过物体1的X-射线转换为可视的光线。 The image intensifier 30 converts the object 1 through the X- ray to visible light. 视图选择器40从在图像放大器30的成像平面上投射出的多个截面图像中选出要求检测的截面的截面图像。 A cross-sectional view of the image selector 40 to select the required cross-section from the detected plurality of cross-sectional images projected on the imaging plane of the image intensifier 30. 照相机50将从视图选择器40接收的图像转换成电信号。 The camera 50 from the view selector 40 receives the image into an electric signal.

虽然在图中未示出,层析X-射线照相系统还可以包括用于移动XYZ-平台的驱动部分,用于控制偏转线圈的控制部分,以及通过计算机与照相机50电连接的显示器,其中偏转线圈用于对从扫描X-射线管20中放射出的X-射线进行偏转。 Although not shown in the drawings, chromatography X- ray radiographing system may further include a driving section moving XYZ- platform, the control section for controlling the deflection coil, and a display electrically connected to the computer via the camera 50, wherein the deflection from deflecting coil 20 for scanning in the X- ray emitted X- ray tube.

下面描述层析X-射线照相系统的检测过程。 The following chromatography procedure detects X- ray photographic system is described.

首先,将需要检测的物体1固定装载在XYZ-平台10上。 First, an object to be detected is fixed on the loading platform 10 XYZ-. 然后,上下左右地往复移动XYZ-平台10,直到物体1的需要检测的截面高度被置于聚焦平面上。 Then, to reciprocate vertically and laterally XYZ- platform 10, until the desired cross section of the object 1 detected height is disposed on the focal plane.

之后,从扫描X-射线管20放射出X-射线,并照射到XYZ-平台10上的物体1上。 Thereafter, the X- rays 20 emitted from the scanning X- ray tube and irradiated onto the object 10 XYZ- 1 on the internet. 从扫描X-射线管20的端部放射出的X-射线照射在物体1上,并且在扫描X-射线管20与物体1保持平行关系的同时,X-射线被旋转地照射在物体1上。 From X- X- ray irradiation while scanning the end portion of the emitted ray tube 20 on the object 1, and the X- ray scanning tube 20 and the object holding parallel relationship, X- rays are irradiated on the rotating object 1 .

照射在物体1上的X-射线穿过物体1并且在图像放大器30的成像平面以过渡图像的形式聚焦。 X- rays irradiated on the object 1 through the object 1 and focused to form an image transition in the imaging plane of the image amplifier 30. 然后,视图选择器40就从这些图像中选出需要的并且将选出的图像传输给照相机50。 Then, the view selector 40 is selected from these images and the image transmission needs to be selected camera 50. 照相机50将图像发送给显示器,在显示器上将这些图像以一个图像的形式显示。 The camera 50 will be sent to the display image, the image is displayed as one image on a display.

下面参照图2对获取物体1的截面图像的方法进行更详细的描述。 Referring method of acquiring two pairs of cross-sectional images of the object 1 will be described in more detail in FIG.

图2是解释采用如图1所示层析X-射线照相系统获取截面图像的基本原理的视图。 FIG 2 is explained using FIG chromatography X- ray radiographing system shown in FIG. 1 the basic principle of getting a cross-sectional view of the image. 图2是这个系统的关于层析X-射线照相系统的中心轴线C截取的截面图。 FIG 2 is a sectional view chromatographed on X- ray radiographing system taken center axis C of the system. 尽管X-射线实际上是在X-射线束旋转平面(2-1)上转动的,而在示意性的截面图图2的描述下,仅示出了中心轴线C和X-射线的两个位置。 Although the X- ray is actually on the plane of rotation of the X- ray beam (2-1) rotate, and described in schematic cross-sectional view of FIG. 2 shows only two central axes C and X- rays position.

当X-射线从X-射线束旋转平面(2-1)的位置RS处放射出来并照射到位于截面平面(2-2)上的物体1时,在图像放大器30的透视成像平面(2-3)上形成过渡图像,即RS(2-4),其与X-射线束旋转平面(2-1)的位置RS成对角线关系。 When the position of the RS emanating from the plane of rotation of the X- ray X- ray beam (2-1) positioned to illuminate the cross-sectional plane (2-2) on the object 1, the image intensifier fluoroscopic imaging plane (2- 30 3) an image is formed on the transition, i.e. RS (2-4), the position of the plane (2-1) with the rotation of X- ray beam RS diagonal relationship. 与上文类似,当X-射线从X-射线束旋转平面(2-1)的位置-RS处放射出来,在图像放大器30的透射成像平面(2-3)上出现物体1过渡图像,即-RS(2-5),其与X-射线束旋转平面(2-1)的位置-RS成对角线关系。 Similarly to the above, when the position of the X- ray -RS plane of rotation of the X- ray beam (2-1) out of the radiation, a transition occurs on the transmission image of an object plane of the image forming amplifier 30 (2-3), i.e., -RS (2-5), which position of the rotating plane X- ray beam (2-1) -RS diagonal relationship.

于是在透视成像平面上形成了关于物体在截面平面(2-2)的中心点(O)的图像RS(2-4)和-RS(2-5),以使中心点(O)的过渡图像RS(2-4)和-RS(2-5)相互重叠。 Thus the transition object image is formed on a center point in the RS sectional plane (2-2) (O) (2-4) and -RS (2-5) on the fluoroscopic imaging plane so that the central point (O) of image RS (2-4) and -RS (2-5) overlap each other. 合成图像RS(2-4)和-RS(2-5)被平均(除以2),从而得到物体在截面(2-2)的截面图像。 Composite image RS (2-4) and -RS (2-5) are averaged (divided by 2), thereby obtaining a sectional image of the object in the cross-section (2-2).

同时,为了获取类似如图2所示的RS和-RS间隔一百八十度(180°)的图像,可以通过下述步骤获得更多相并截面图像,即由从多个角度放射X-射线获取多个过渡图像,再对图像进行合成和平均。 Meanwhile, in order to obtain similar -RS shown in FIG. 2 and RS image hundred eighty degrees (180 °) intervals, and more phases may be obtained by the following steps sectional image, i.e., by the radiation from a plurality of angles X- acquiring a plurality of transition-ray images, the image synthesis and then averaged. 这样,物体1在截面(2-2)上的截面图像则清晰地显示出来,同时其它平面(高于或低于截面(2-2))的截面图像就被抹去。 Thus, a sectional image of the object 1 in cross-section (2-2) is clearly displayed, while the other plane (above or below the cross-section (2-2)) in the cross-sectional image was erased.

因此,当得到物体在一个截面的截面图像后,如果使用者需要获取物体上相异截面的图像,就需要将物体的另外一个截面再次调整到截面平面,并再一次用X-射线照射物体。 Thus, when the object to obtain a cross sectional image, if the user needs to acquire the object of different cross-sectional image, the object needs to be adjusted again another cross section of the cross-sectional plane, and again with X- ray irradiation object. 如果使用者需要检测分别安装在印刷电路板的上侧和下侧的多个电子元件的焊接状态,例如,他首先将安装在印刷电路板的一侧的电子元件的焊接部分调整到系统的截面平面,并获取该焊接部分的截面图像;之后,使用者必须将安装在印刷电路板的另外一侧的电子元件的焊接部分重新调整到系统的截面平面,并获取其截面图像。 If the user to be detected are mounted a plurality of electronic components welding condition upper and lower sides of the printed circuit board, for example, he first electronic component mounted on the welded portion of one side of the printed circuit board is adjusted to the cross section of the system plane, and acquires an image of the cross section of the welded portion; Thereafter, the user must install the welded portion of the electronic component to the other side of the printed circuit board to readjust the system cross-sectional plane, and to obtain cross-sectional images thereof. 如上所述,为了用传统方法获取相异的截面图像,物体必须经过向上或向下移动而反复被调整到系统的截面平面。 As described above, in order to acquire cross-sectional images of different conventional methods, the object must be moved up or down repeatedly adjusted to a section plane of the system. 这意味着繁重的劳动和较常的拍摄时间。 This means heavy labor and more often shooting time. 而且,为了从各个截面获取截面图像,X-射线必须反复照射过物体。 Further, in order to acquire cross-sectional images from the respective cross-section, X- ray irradiated object must be repeated.

本发明是针对上述问题提出的,因此本发明的目的是提供一种在预定的高度范围内获取被检测物体的各个截面的截面图像的方法,不需要用X-射线反复照射过物体,也不需要反复向上、向下调整物体,而只需要对先前通过层析X-射线照相系统得到的截面图像数据进行计算。 The present invention is proposed for the above-mentioned problems, therefore an object of the present invention is to provide a cross-section of each sectional image acquiring object to be detected is within a predetermined height range of the method, does not require repeated using X- ray irradiated object, nor requires repeated upward, downward adjustment of the object, but only on the sectional image data previously obtained by chromatography calculated X- ray radiographing system.

本发明的目的是这样实现的,即提供一种通过层析X-射线照相系统获取图像的方法,包括下述步骤:a)调整被检测物体的截面,以使截面位于层析X-射线照相系统的聚焦平面上;b)从扫描X-射线管生成的X-射线在扫描X-射线管的圆周上的至少两个位置照射物体;c)通过合成在图像放大器的成像平面上汇聚出的至少两个过渡图像,以便将其关于其中心点彼此重叠,并对合成图像进行平均,从而获得参考截面平面的截面图像;d)通过构造图线,获得关于参考截面平面的预定高度范围内的上侧和下侧平面的假想过渡图像,通过构造图线,获得假想过渡图像的中心点D;和e)通过在重叠假想过渡图像的中心点D的同时,合成假想过渡图像,并且平均合成的假想过渡图像,从而得到物体在预定高度上的一截面在新截面平面上的新截面图像。 Object of the present invention is achieved, i.e., to provide a method for obtaining an image by chromatography X- ray radiographing system, comprising the steps of: a) adjusting section of the object to be detected, so that the cross-section is located chromatography X- ray radiography the focal plane of the system; b) generating from the scanning X- ray tube X- ray irradiation target object at least two positions in the circumferential scanning of the X- ray tube; c) synthesized by the converged on the imaging plane of the image amplifier at least two transition images, so as to be overlapped with each other with respect to its center point, and the synthetic image is averaged to obtain a reference sectional plane of the sectional image; D) by constructing a line, is obtained within a predetermined height range on the reference sectional plane upper and lower flat virtual transition images by constructing a line, the central point D to obtain the imaginary transition images; and e) at the same time by overlapping the imaginary center point D transition images synthesized virtual transition images, and the average synthetic hypothetical transition images, the object to obtain a sectional image of the new section on the new sectional plane in a predetermined height.

此处,中心点D是从中心距离Ri和距离dRi的和获得的,其中Ri即是与参考截面平面对应的过渡图像的中心距离,而dRi则是与物体的截面平面的高度变化相对应的距离放大,也即中心点D可以从公式Ti+dRi得到,其中Ri可以由公式-Rs×Hi/Ho得到,并且dRi可以由公式-Rs(Hi+dH)/(Ho-dH)-Ri得到。 Here, the central point D is the center distance and the distance Ri and dRi obtained, i.e., where Ri is the distance from the center of the reference sectional plane image corresponding to the transition, but the height variation is dRi cross-sectional plane of the object from the corresponding distance amplification, i.e., the central point D can be obtained from the formula Ti + dRi, wherein Ri can -Rs × Hi / Ho obtained by the formula, and the formula can be made dRi -Rs (Hi + dH) / (Ho-dH) -Ri give .

上述公式中的'Rs','Ho',和'Hi'是层析X-射线照相系统的光学系统的输入值,更具体说,'Rs'是在X-射线旋转平面上X-射线放射位置的距离,'Ho'是从X-射线旋转平面到截面平面的距离,'Hi'是从截面平面到透视成像平面的距离。 In the above equation 'Rs', 'Ho', and 'Hi' is an input value of the optical system is chromatographed X- ray photographic system, more specifically, 'Rs' is in the plane of rotation of X- ray X- ray radiation distance position, 'Ho' is the distance to the plane of rotation from the cross-sectional plane of X- ray, 'Hi' is a distance from a perspective cross-sectional plane of the imaging plane. 而且,'dH'是从参考截面平面到新截面平面的高度。 Further, 'dH' is a height from the reference plane to the sectional plane of the new section.

本发明还包括下列步骤,f)调整假想过渡图像的尺寸R2,使其与在步骤d)后得到的参考截面图像的尺寸相等。 The present invention further comprises the steps of, f) adjusting the size of the imaginary transition images R2, equal to the cross-sectional size of the reference image after it in step d) is obtained. 此处,可以通过公式R2=R1×(Ho-dH)/Ho得到。 Here, by the formula R2 = R1 × (Ho-dH) / Ho obtained.

由此,一旦获得了在预定范围内的截面的截面图像,则其上、下截面的其它截面图像可以通过计算获得,因此不需要移动物体,或反复用射线照射过物体。 Thus, once the section of the sectional image is obtained within a predetermined range, which can be obtained by calculation of cross sections of other cross-sectional image, and therefore does not require a moving object, or repeated object irradiated with radiation. 结果,检测过程可以方便地高速地进行。 As a result, the detection process may conveniently be carried out at high speed.

通过下述参照附图对优选实施例的描述,可以使本发明的上述目的和优点更为明显。 The above object can be made and advantages of the present invention are more apparent from the following description of the preferred embodiments with reference to the accompanying drawings. 附图中:图1是传统层析X-射线照相系统的透视图;图2是解释采用如图1所示系统获取截面图像的基本原理的视图;图3是解释根据本发明获取截面图像的方法的视图;图4是解释利用根据本发明的方法获取截面图像的最大极限的视图。 In the drawings: FIG. 1 is a perspective view of a conventional chromatography X- ray photographic system; FIG. 2 is explained using the system shown in FIG. 1 acquires a cross-sectional view of the basic principle of the image; FIG. 3 is an explanatory cross-sectional image acquisition according to the present invention. a method of view; FIG. 4 is an explanatory view of a maximum limit of using the obtained cross-sectional image according to the method of the present invention.

如上文所述,在传统技术中为了获取被检测物体的截面图像,必须获取该物体的截面平面的图像中心。 As described above, in the conventional art, in order to acquire cross-sectional images of the object to be detected, the center must obtain a sectional image of the object plane. 随后,获取了关于图像中心的两个图像(当X-射线从X射线束旋转平面的两个位置上放射出时,会出现上述情况;但是,X-射线也可以从不同数目的位置上放射出),并对这两个图像进行合成和平均。 Subsequently, two images are acquired on the center of the image (when two positions X- ray emitted from the plane of rotation of the X-ray beam, the above situation occurs; however, X- rays may be radiated from a number of different positions out), and these two images are synthesized and averaged.

根据本发明之获取截面图像的基本原理,在从如图3所示的构造图线获取了物体的于预定高度的一截面在截面平面的假想过渡截面图像之后,通过获取过渡图像的新中心D,从而从先前获得的截面图像获得在物体预定高度的其它截面的新截面图像,这样不必移动物体,也不必再用X-射线照射物体。 The cross-section of a basic principle of the present invention acquires cross-sectional images of the object acquired from the configuration shown in FIG. 3 shown in FIG line to a predetermined height after the imaginary cross-sectional plane of the sectional image transition, transition images by acquiring new center D , thereby obtaining a sectional image previously obtained from the new section in other cross-sectional image of an object a predetermined height, so that without moving the object, then there is no need X- ray irradiation object.

下面参照图3更详细地描述上述过程。 It is described below with reference to FIG. 3 above-described process in more detail.

如图3所示,截面平面(2-2)的图像中心是点'E',该点与X-射线束旋转平面(2-1)的中心C的距离为'Ri',其中截面平面(2-2)与X-射线束旋转平面(2-1)的距离为'Ho'。 3, the cross-sectional plane (2-2) is the image center point 'E', the distance between the point and the plane of rotation X- ray beam (2-1) of the center C 'Ri', wherein the cross-sectional plane ( from 2-2) X- ray beam and the plane of rotation (2-1) is 'Ho'. 类似的,需要得到的截面平面B的图像中心点是D,该点与X-射线束旋转平面(2-1)的中心C的距离为'Ri+dRi',其中截面平面B与X-射线束旋转平面(2-1)的距离为'Ho-dH'。 Similarly, the cross-sectional center of the image plane need to be B is D, between the point and the plane of rotation X- ray beam (2-1) from the center C of 'Ri + dRi', wherein the X- ray sectional plane B beam rotation from the plane (2-1) is 'Ho-dH'. 由此,当透视成像平面(2-3)的左边和右边的图像关于D点(该点与X-射线束旋转平面(2-1)的中心C的距离为'Ri+dRi')合成并平均时,就获得了物体的另一个截面的截面图像。 Thus, when the fluoroscopic imaging plane (2-3) of the left and right images on the point D (the distance between the point and the plane of rotation X- ray beam (2-1) of the center C 'Ri + dRi') and Synthesis when the average, is obtained a cross-sectional another cross-sectional image of the object.

下面详细描述用于获得新的图像中心点D的方法。 The following detailed description of a method for obtaining a new image of the center point D.

在图3中,Ho∶Hi=-Rs∶Ri (1)从公式(1),令m=Hi/Ho,由于三角形ABO和OCD是相似的,公式(1)可以写成如下形式:(Ho-dH)∶(Hi+dH)=-Rs∶(Ri+dRi)。 In Figure 3, Ho:Hi = -Rs:Ri (1) from equation (1), so that m = Hi / Ho, since the triangles ABO and OCD are similar, equation (1) can be written as: (Ho- dH): (Hi + dH) = - Rs: (Ri + dRi).

关于dRi重新整理公式,得:dRi=-Rs(Hi+dH)/(Ho-dH)-Ri,并且将m代入公式,得dRi=-Rs[(Hi+dH)/(Ho-dH)-m] (2)如图3所示,'D'距中心C的距离等于Ri+dRi,因此'Ri'可以从公式1得到,并且当将下面提到的四个值代入公式(2)时,就可得到'dRi'的值。 Rearranging Equation dRi respect to give: dRi = -Rs (Hi + dH) / (Ho-dH) -Ri, and m into the formula to give dRi = -Rs [(Hi + dH) / (Ho-dH) - and when the below-mentioned four values ​​in equation (2) m] (2) as shown, 'D' 3 is equal to the distance from the center C Ri + dRi, thus 'Ri' can be obtained from equation 1, , the value can be obtained 'dRi' of.

上述公式中的'Rs','Ho',和'Hi'是层析X-射线照相系统的光学系统的输入值,其中,'Rs'是在X-射线旋转平面(2-1)上X-射线放射位置的距离,'Ho'是从X-射线旋转平面(2-1)到截面平面(2-2)的距离,'Hi'是从截面平面(2-2)到透视成像平面(2-3)的距离。 In the above equation 'Rs', 'Ho', and 'Hi' is an input value of the optical system is chromatographed X- ray photographic system, wherein, 'Rs' is X- X-ray on a plane of rotation (2-1) - from ray radiation position, 'Ho' X- rays from the plane of rotation (2-1) to the sectional plane (2-2) away, 'Hi' is a cross-sectional plane from the (2-2) to fluoroscopic imaging plane ( 2-3) distance. 'dH'是从参考截面平面(2-2)到物体新截面平面B的高度。 'DH' is a cross-sectional height from a reference plane (2-2) to the new object-sectional plane B. 此外,'Ri'是从X-射线旋转平面(2-1)中心C到参考截面平面(2-2)的过渡图像的图像中心E的距离,'dRi'是从过渡图像的中心E到新中心D的距离,该值是关于截面平面的变化的高度而被放大的。 Further, 'Ri' is a distance from the image center E (2-1) center C X- ray cross-sectional plane to the reference plane of rotation (2-2) transition image, 'dRi' is from the center E of the transition to the new image the center distance D, which is about the value of the cross-sectional plane of the height variation is amplified.

一旦从上述公式中得到过渡图像的中心'D',则通过将左侧和右侧的过渡图像关于新图像中心'D'合成并平均,即可得到预定高度上的新截面图像。 Once the image transition from the center of the above equation 'D', through the transition left and right images on the new image center 'D' are synthesized and averaged to obtain a new image on a predetermined cross-sectional height.

而且,如图3所示,在参考截面平面(2-2)上的图像的图像比例是(Hi+Ho)/Ho,同时与参考截面平面(2-2)相距'dH'的物体的截面平面B的图像则以下述比例投射到透视成像平面(2-3)上:在dH的图像比例=(Hi+Ho)/(Ho-dH)由于dH>0,所以投射图像(过渡图像)的尺寸将大于参考截面平面(2-2)的过渡图像的尺寸。 Further, as shown in FIG. 3, the image scale of the image on the reference sectional plane (2-2) is (Hi + Ho) / Ho, while the cross-sectional 'dH' of the object with the reference sectional plane (2-2) away places the image plane B is projected onto the following proportions fluoroscopic imaging plane (2-3): dH ratio of image = (Hi + Ho) / (Ho-dH) Since dH> 0, so the projected image (image transition) of the size of the reference size is larger than a cross-sectional plane (2-2) transition image. 因此,通过下述公式,可以使与参考截面平面(2-2)离开该距离的截面平面B的过渡图像的图像比例与参考截面平面(2-2)的过渡图像的比例一致。 Accordingly, the following formula can be made with reference to a sectional plane (2-2) leaving the same ratio of the transition ratio of the transition image an image of the image plane B of the cross section of the reference sectional plane distance (2-2).

R2=R1×(Ho-dH)/Ho (3)其中,公式(3)中的R1是参考截面平面(2-2)的过渡图像的尺寸,Ho是X-射线旋转平面(2-1)到参考截面平面(2-2)的距离,dH是新截面B到参考截面平面(2-2)的高度,而使用者需要获取的是截面B的截面图像。 R2 = R1 × (Ho-dH) / Ho (3) wherein, R1 (3) in the formula is a reference sectional plane (2-2) transition image size, Ho X- ray is the plane of rotation (2-1) Referring to the sectional plane (2-2) distance, dH is the new section to the reference sectional plane B (2-2) in height, and the user needs to be acquired is a cross-sectional image of the B.

通过将新截面的截面图像的图像比例调整并统一到先前得到的截面图像(上述参考截面平面的过渡图像)的图像比例上,物体的两个不同截面可以进行充分比较。 The ratio of cross-sectional image by the image of the new section and is adjusted to a uniform ratio of cross-sectional image on an image (an image of the transition of the reference sectional plane) of the previously obtained, two different section of the object can be fully comparable.

同时,上述方法不能获得物体的所有截面的截面图像。 Meanwhile, the above method can not be obtained for all cross-sectional image of the object. 就是说,当通过对参考截面平面获得的截面图像数据进行计算而获得参考截面平面上侧和下侧的截面的截面图像时,存在着高度极限。 That is, when when calculates sectional image data obtained by the reference sectional plane obtained by reference to cross-section plane of the upper and lower sides of the sectional image, there is a height limit.

为从公式(2)中解出dH,dH×(-Rs)+Hi(-Rs)=Ho(Ri+dRi)-dH(Ri+dRi)dH(-Rs+Ri+dRi)=Ho(Ri+dRi)-Hi×(-Rs)dH=[Ho(Ri+dRi)-Hi×(-Rs)]/(-Rs+Ri+dRi)参考上述公式和图4,当'dH'为正值(+)的最大值时,'dRi'是一个正值,与照相机视野的一半对应。 DH is solved from equation (2), dH × (-Rs) + Hi (-Rs) = Ho (Ri + dRi) -dH (Ri + dRi) dH (-Rs + Ri + dRi) = Ho (Ri + dRi) -Hi × (-Rs) dH = [Ho (Ri + dRi) -Hi × (-Rs)] / (- Rs + Ri + dRi) and reference to the above equation 4, when the 'dH' positive the maximum value (+) of, 'dRi' is a positive value, corresponding to half of the camera's view. 当'dH'为负值(-)的最大值时,'dRi'是一个负值,与照相机视野的一半对应。 When 'dH' is negative (-) when the maximum value, 'dRi' is a negative value, corresponds to half the field of view of the camera. 通过这种方法,使用者可以对可通过合成参考截面图像得到物体的各截面图像的极限进行估计,由此不必进行试验,同时避免了误差。 User can be estimated limit for each cross-sectional image may be obtained by reference sectional object image synthesized by this method, whereby the need for testing, while avoiding the error.

如上所述,根据本发明中的用于获得物体截面图像的方法,在通过传统方法获得参考截面平面图像之后,通过对参考截面平面图像的数据进行计算,可以迅速精确地获得物体预定高度极限内其它截面的图像。 As described above, according to the method of the present invention for obtaining sectional images of an object, after the reference sectional plane image is obtained by a conventional method, by reference sectional plane image data is calculated, the object can be quickly and precisely obtain a predetermined height within limits images of other cross-section. 因此,被检测的物体不必反复移动和调整,并且X-射线也不必反复照射物体。 Thus, the object to be detected does not have to repeatedly move and adjust, and also the need for repeated X- ray irradiation object.

根据本发明,在预定截面获得了参考截面图像后,不必移动物体,也不必反复用X-射线照射物体,就可获得在预定的上侧下侧高度极限内的截面图像。 According to the present invention, the section being taken at a predetermined reference sectional image, without moving the object, do not have to repeatedly with X- ray irradiation object can be obtained in the cross-sectional image at a predetermined height limit side of the upper side. 因此,检测工作就变得简单,并且暴露在射线下的可能也减少。 Accordingly, inspection work becomes simple, and the radiation exposure may be reduced.

尽管结合优选实施例对本发明进行了详细描述,本领域技术人员应该理解的是,在不超出所附权利要求限定的精神和范围下,可以对本发明的形式和细节作各种修改。 While various embodiments of the present invention has been described in detail, those skilled in the art will appreciate that, without departing from the spirit and scope as defined in the appended claims, various modifications may be made in form and detail of the invention.

Claims (2)

  1. 1.一种通过层析X-射线照相系统获取图像的方法,包括下列步骤:a)调整被检测物体的一截面,以使该截面位于层析X-射线照相系统的聚焦平面上;b)从扫描X-射线管生成的X-射线在扫描X-射线管的圆周上的至少两个位置照射物体;c)通过合成在图像放大器的成像平面上会聚出的至少两个过渡图像,而将其关于其中心点彼此重叠,并对合成图像进行平均,从而获得参考截面平面的截面图像;d)通过构造图线,获得关于参考截面平面的预定高度范围内的上侧和下侧截面的假想过渡图像,通过构造图线,获得假想过渡图像的中心点D;和e)通过在重叠假想过渡图像的中心点D的同时,合成假想过渡图像,并且平均合成的假想过渡图像,从而得到物体在预定高度上一截面在新截面平面上的新截面图像,Ri=-Rs×Hi/Ho (1)dRi=-Rs(Hi+dH)/(Ho-dH)-Ri (2)D=Ri+dRi 1. A method for obtaining by chromatographic methods X- ray radiographing system image, comprising the steps of: a) adjusting a section of the object to be detected, so that the cross-section is located on the focal plane chromatographed X- ray photographic system; b) X- ray generated from the scanning of the X- ray tube at least two positions on the circumference of the irradiation target object scanning X- ray tube; c) synthesized by condensing an image on the imaging plane of the amplifier at least two transition images, and the which overlap with each other with respect to its center point, and the synthetic image is averaged to obtain a reference sectional plane of the sectional image; D) by constructing a line is obtained on the imaginary cross-sectional side cross-sectional plane of the reference on the predetermined height range and a lower side transition images, by constructing a line, to obtain a virtual image of the center point D transition; and e) by transition images while overlapping the imaginary center point D of the synthesized virtual image transition, and the imaginary transition images average synthesis, to thereby obtain the object the predetermined image height of the new section on the new section in a sectional plane, Ri = -Rs × Hi / Ho (1) dRi = -Rs (Hi + dH) / (Ho-dH) -Ri (2) D = Ri + dRi (3)其中,Rs是在X-射线旋转平面上的X-射线放射位置的距离,Ho是从X-射线旋转平面到参考截面平面的距离,Hi是从参考截面平面到透视成像平面的距离;dH是从参考截面平面到物体新截面平面的高度;Ri是从X-射线旋转平面中心到参考截面平面的过渡图像的图像中心的距离,dRi是从过渡图像的图像中心到新图像中心的距离,该值是关于参考截面平面的变化的高度而被放大的。 (3) wherein, Rs is the distance X- ray radiation position on the plane of rotation of X- ray, Ho X- ray from the distance to the reference plane of rotation of the cross-sectional plane, Hi is the distance from the reference plane to the sectional plane of the fluoroscopic imaging ; dH is the height from the reference plane to the sectional plane of the cross section of the new object; Ri of the plane of rotation is the center of the image center from the reference sectional plane image to the transition from the X- ray, dRi image transition from the image center to the new center of the image distance, which is about the height variation value with reference to the sectional plane is enlarged.
  2. 2.如权利要求1所述的方法,其特征在于,还包括步骤f),通过下述公式(4)调整假想过渡图像的尺寸R2,使其与在步骤d)后得到的参考截面图像的尺寸相等,公式(4)为R2=R1×(Ho-dH)/Ho (4)其中R1是参考截面平面的过渡图像的尺寸,Ho是X-射线旋转平面到参考截面平面的距离,dH是新截面B到参考截面平面的高度。 2. The method as claimed in claim 1 is reacted with the reference sectional image in step d) to give the claims, characterized in that, further comprising a step f), (4) adjusting the size of the imaginary transition images R2 by the following equation, equal size, equation (4) R2 = R1 × (Ho-dH) / Ho (4) wherein R1 is a reference sectional plane image, the size of the transition, Ho X- rays is a cross-sectional plane of rotation to the reference plane distance, dH is the new B-sectional height to the reference sectional plane.
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Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN100465629C (en) 2000-12-06 2009-03-04 泰拉丁公司 An off-center chromatography X ray photography combining method
CN1969761B (en) 2005-07-13 2010-09-29 美国西门子医疗解决公司 4-dimensional digital tomosynthesis and its applications in radiation therapy
CN101686817B (en) 2007-06-29 2011-06-15 株式会社岛津制作所 Radiation imaging apparatus
CN1854723B (en) 2005-04-29 2011-07-13 依科视朗国际射线有限公司 Method for automatic defect recognition in testpieces by means of an X-ray examination unit

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN100465629C (en) 2000-12-06 2009-03-04 泰拉丁公司 An off-center chromatography X ray photography combining method
CN1854723B (en) 2005-04-29 2011-07-13 依科视朗国际射线有限公司 Method for automatic defect recognition in testpieces by means of an X-ray examination unit
CN1969761B (en) 2005-07-13 2010-09-29 美国西门子医疗解决公司 4-dimensional digital tomosynthesis and its applications in radiation therapy
CN101686817B (en) 2007-06-29 2011-06-15 株式会社岛津制作所 Radiation imaging apparatus

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