CN1208176A - 具有最大显示更新速率和最大显示带宽的仪器 - Google Patents
具有最大显示更新速率和最大显示带宽的仪器 Download PDFInfo
- Publication number
- CN1208176A CN1208176A CN98108916A CN98108916A CN1208176A CN 1208176 A CN1208176 A CN 1208176A CN 98108916 A CN98108916 A CN 98108916A CN 98108916 A CN98108916 A CN 98108916A CN 1208176 A CN1208176 A CN 1208176A
- Authority
- CN
- China
- Prior art keywords
- display
- acquisition
- time window
- maximum
- sample value
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000000034 method Methods 0.000 claims description 6
- 230000015654 memory Effects 0.000 abstract description 15
- 238000005457 optimization Methods 0.000 abstract description 2
- 230000003252 repetitive effect Effects 0.000 abstract description 2
- 238000005070 sampling Methods 0.000 description 33
- 238000012545 processing Methods 0.000 description 6
- 238000000605 extraction Methods 0.000 description 3
- 238000003860 storage Methods 0.000 description 3
- 238000001914 filtration Methods 0.000 description 2
- 238000004088 simulation Methods 0.000 description 2
- 238000000151 deposition Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000012432 intermediate storage Methods 0.000 description 1
- 230000002045 lasting effect Effects 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000008929 regeneration Effects 0.000 description 1
- 238000011069 regeneration method Methods 0.000 description 1
- 238000007634 remodeling Methods 0.000 description 1
- 238000010183 spectrum analysis Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R13/00—Arrangements for displaying electric variables or waveforms
- G01R13/02—Arrangements for displaying electric variables or waveforms for displaying measured electric variables in digital form
- G01R13/0218—Circuits therefor
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G1/00—Control arrangements or circuits, of interest only in connection with cathode-ray tube indicators; General aspects or details, e.g. selection emphasis on particular characters, dashed line or dotted line generation; Preprocessing of data
- G09G1/06—Control arrangements or circuits, of interest only in connection with cathode-ray tube indicators; General aspects or details, e.g. selection emphasis on particular characters, dashed line or dotted line generation; Preprocessing of data using single beam tubes, e.g. three-dimensional or perspective representation, rotation or translation of display pattern, hidden lines, shadows
- G09G1/14—Control arrangements or circuits, of interest only in connection with cathode-ray tube indicators; General aspects or details, e.g. selection emphasis on particular characters, dashed line or dotted line generation; Preprocessing of data using single beam tubes, e.g. three-dimensional or perspective representation, rotation or translation of display pattern, hidden lines, shadows the beam tracing a pattern independent of the information to be displayed, this latter determining the parts of the pattern rendered respectively visible and invisible
- G09G1/16—Control arrangements or circuits, of interest only in connection with cathode-ray tube indicators; General aspects or details, e.g. selection emphasis on particular characters, dashed line or dotted line generation; Preprocessing of data using single beam tubes, e.g. three-dimensional or perspective representation, rotation or translation of display pattern, hidden lines, shadows the beam tracing a pattern independent of the information to be displayed, this latter determining the parts of the pattern rendered respectively visible and invisible the pattern of rectangular co-ordinates extending over the whole area of the screen, i.e. television type raster
- G09G1/162—Control arrangements or circuits, of interest only in connection with cathode-ray tube indicators; General aspects or details, e.g. selection emphasis on particular characters, dashed line or dotted line generation; Preprocessing of data using single beam tubes, e.g. three-dimensional or perspective representation, rotation or translation of display pattern, hidden lines, shadows the beam tracing a pattern independent of the information to be displayed, this latter determining the parts of the pattern rendered respectively visible and invisible the pattern of rectangular co-ordinates extending over the whole area of the screen, i.e. television type raster for displaying digital inputs as analog magnitudes, e.g. curves, bar graphs, coordinate axes, singly or in combination with alpha-numeric characters
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Controls And Circuits For Display Device (AREA)
Abstract
Description
Claims (1)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US910,184 | 1997-08-13 | ||
US08/910,184 US5898420A (en) | 1997-08-13 | 1997-08-13 | Instrument with maximum display update rate and maximized display bandwidth given the display update rate |
US910184 | 2001-07-20 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1208176A true CN1208176A (zh) | 1999-02-17 |
CN1168990C CN1168990C (zh) | 2004-09-29 |
Family
ID=25428423
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CNB98108916XA Expired - Lifetime CN1168990C (zh) | 1997-08-13 | 1998-05-13 | 显示波形的数字化样值的方法 |
Country Status (3)
Country | Link |
---|---|
US (1) | US5898420A (zh) |
JP (1) | JPH11108958A (zh) |
CN (1) | CN1168990C (zh) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN112067870A (zh) * | 2020-09-15 | 2020-12-11 | 中电科仪器仪表有限公司 | 一种基于fpga的示波器参数自动测量装置及方法 |
Families Citing this family (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6384825B2 (en) * | 1998-06-25 | 2002-05-07 | Tektronix, Inc. | Method of controlling a sparse vector rasterizer |
US6304297B1 (en) * | 1998-07-21 | 2001-10-16 | Ati Technologies, Inc. | Method and apparatus for manipulating display of update rate |
US6980183B1 (en) * | 1999-07-30 | 2005-12-27 | Intel Corporation | Liquid crystal over semiconductor display with on-chip storage |
US6681191B1 (en) * | 1999-12-21 | 2004-01-20 | Tektronix, Inc. | Frequency domain analysis system for a time domain measurement instrument |
US6807496B2 (en) * | 2002-05-02 | 2004-10-19 | Tektronix, Inc. | Acquisition system for a long record length digital storage oscilloscope |
US6748335B2 (en) * | 2002-05-06 | 2004-06-08 | Tektronix, Inc. | Acquisition system for a multi-channel relatively long record length digital storage oscilloscope |
US6693576B2 (en) | 2002-05-23 | 2004-02-17 | Tektronix, Inc. | Methods and apparatus providing multiple concurrent acquisition modes in a digitizing measurement instrument |
US6975251B2 (en) * | 2002-06-20 | 2005-12-13 | Dakota Technologies, Inc. | System for digitizing transient signals with waveform accumulator |
US6934646B2 (en) * | 2002-10-21 | 2005-08-23 | Agilent Technologies, Inc. | Waveform complexity detector |
GB2422081B (en) * | 2005-01-05 | 2010-09-29 | Ling Dynamic Systems | Statistical streaming |
JP4671704B2 (ja) * | 2005-01-31 | 2011-04-20 | 株式会社東京精密 | 寸法測定装置 |
US20070027675A1 (en) * | 2005-07-26 | 2007-02-01 | Lecroy Corporation | Spectrum analyzer control in an oscilloscope |
US9804200B2 (en) * | 2012-02-15 | 2017-10-31 | Keysight Technologies, Inc. | Digital oscilloscope comprising multiple data acquisition pathways |
US9858240B2 (en) * | 2012-12-13 | 2018-01-02 | Tektronix, Inc. | Automatic center frequency and span setting in a test and measurement instrument |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3683398A (en) * | 1968-09-27 | 1972-08-08 | Mandrel Industries | Seismic data time varying time scale display and process |
US4486857B1 (en) * | 1982-10-06 | 1993-10-12 | Quickview Partners | Display system for the suppression and regeneration of characters in a series of fields in a stored record |
TW232732B (zh) * | 1991-10-02 | 1994-10-21 | Philips Gloeilamdenfabrieken Nv | |
US5375067A (en) * | 1992-12-11 | 1994-12-20 | Nicolet Instrument Corporation | Method and apparatus for adjustment of acquisition parameters in a data acquisition system such as a digital oscilloscope |
US5397981A (en) * | 1994-02-28 | 1995-03-14 | Fluke Corporation | Digital storage oscilloscope with automatic time base |
US5530454A (en) * | 1994-04-13 | 1996-06-25 | Tektronix, Inc. | Digital oscilloscope architecture for signal monitoring with enhanced duty cycle |
US5740064A (en) * | 1996-01-16 | 1998-04-14 | Hewlett-Packard Co. | Sampling technique for waveform measuring instruments |
-
1997
- 1997-08-13 US US08/910,184 patent/US5898420A/en not_active Expired - Lifetime
-
1998
- 1998-05-13 CN CNB98108916XA patent/CN1168990C/zh not_active Expired - Lifetime
- 1998-07-24 JP JP10208829A patent/JPH11108958A/ja active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN112067870A (zh) * | 2020-09-15 | 2020-12-11 | 中电科仪器仪表有限公司 | 一种基于fpga的示波器参数自动测量装置及方法 |
CN112067870B (zh) * | 2020-09-15 | 2023-04-28 | 中电科思仪科技股份有限公司 | 一种基于fpga的示波器参数自动测量装置及方法 |
Also Published As
Publication number | Publication date |
---|---|
US5898420A (en) | 1999-04-27 |
JPH11108958A (ja) | 1999-04-23 |
CN1168990C (zh) | 2004-09-29 |
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Legal Events
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C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C53 | Correction of patent for invention or patent application | ||
CB02 | Change of applicant information |
Applicant after: Agarlent Technologies Inc. Applicant before: Hewlett-Packard Co. |
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COR | Change of bibliographic data |
Free format text: CORRECT: APPLICANT; FROM: HEWLETT-PACKARD DEVELOPMENT COMPANY TO: AGARLENT TECHNOLOGIES INC. |
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C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
REG | Reference to a national code |
Ref country code: HK Ref legal event code: GR Ref document number: 1049463 Country of ref document: HK |
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ASS | Succession or assignment of patent right |
Owner name: SHIDE TECHNOLOGY CO., LTD. Free format text: FORMER OWNER: ANJELEN SCI. + TECH. INC. Effective date: 20150204 |
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C41 | Transfer of patent application or patent right or utility model | ||
TR01 | Transfer of patent right |
Effective date of registration: 20150204 Address after: California, USA Patentee after: AGILENT TECHNOLOGIES, INC. Address before: California, USA Patentee before: Agilent Technologies, Inc. |
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CX01 | Expiry of patent term |
Granted publication date: 20040929 |
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CX01 | Expiry of patent term |