CN1184826C - System for testing functions of broad-band switch device - Google Patents
System for testing functions of broad-band switch device Download PDFInfo
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Abstract
The present invention relates to the technical field of communication, particularly to a system for testing functions of a broad-band switch device. The present invention comprises a backboard module, a test resource module connected with the backboard module, and a service and switching path test module, wherein the test resource module is used for providing control bus resources, CPU resources and clock resources for other modules, and the service and switching path test module is used for testing a switching path of a switching module which is tested and testing service paths of a main control module, a route processing module and an interface module which are tested. The system for testing functions of a broad-band switch device of the present invention can overcome the disadvantages of the existing test technology and can provide a plate level test solution for each function module of various broad-band switch devices.
Description
Technical field
The present invention relates to communication technical field, more particularly, relate to a kind of system that is used for the broadband connections switching equipment is carried out functional test.
Background technology
Modern communications constantly develops to high bandwidth, multiple services direction, and international broadband switching equipment manufacturer all constantly releases bigger, the professional abundanter communication equipment of exchange capacity.Thereby explore the function test method of this class broadband trade-to product, be a very important and significant thing.
As shown in Figure 1, Xian Dai broadband switching equipment substantially all comprises following modules: main control module, Switching Module, clock module, line processing module and interface module.Wherein line processing module, main control module, Switching Module and clock module are that backboard by the broadband switching equipment couples together.Usually when switch is realized, the corresponding a kind of veneer of each module.Main control module, Switching Module and clock module have control bus, interchange channel bus and clock signal to link to each other with line processing module respectively, that is to say that each line processing module all is connected to this three modules, these three intermodules also have certain annexation certainly.The backboard that connects each module is different according to different exchange capacities, and exchange capacity is big more, and interchange channel quantity is just many more, and the backboard transmission speed is just high more, highest signal speed by the hundreds of mbit/to several gigabit/sec.Interface module generally has a variety of, and these interface modules are to take one or several interchange channel jointly with line processing module.
In functional test, as follows to the test of various modules:
1), for the various interface module, mainly comprise test whether it normal with the interface (not comprising the service channel interface) of other module (generally being line processing module), its service channel whether normally, whether it offers the reference clock of line processing module or clock recovery function normal etc.
2), for line processing module, mainly comprise test whether it normal with the interface of other module (generally comprising interface module, main control module, Switching Module, clock module etc.), whether its service channel normal, its clock passage whether normally, whether its other functional unit (as memory cell, common logic unit etc.) normal or the like.
3), for main control module, comprise mainly whether its controlled function that other each module is provided of test normal, whether it normal to the service channel of Switching Module, whether its other functional unit normal, whether it and other module or external communication interface normal.
4), for clock module, comprise that mainly whether normal whether its clock of externally providing of test normal, whether the phase-locked function of its clock normal, the outside offers this module clock or the like.
5), for Switching Module, comprise mainly that the function of exchange of testing its whole interchange channels is whether normal, it with the control channel of main control module whether normally, whether its other functional unit normal.
For the broadband switching equipment, general function test method is to utilize broadband test instrument such as ATM tester, IP analyzer to test under exchange complete machine environment.The switch complete machine comprises that machine frame, tool model (the intrinsic veneer of switch) and tested module etc. partly form, and different tested modules needs different tool models.This moment is as follows to the method for testing of various modules:
One, to the method for testing of various interface module
Adopt line processing module and clock module as tool model (what have may also need main control module or Switching Module), so that the various necessary condition of interface module work to be provided, dock with interface module by tester then and send out data to the line processing module loopback, the data of regaining by the tester analysis are tested its service channel again.The test of the control interface of interface module and line module, by being that masters is tested with the line processing module, but line processing module may not supported whole interface signal tests.The clock recovery functional test of line module also will reach test purpose by the test function of this module and line processing module self.
Two, to the method for testing of line processing module
Adopt main control module, Switching Module, clock module and interface module as tool model.The control interface method of it and interface module is the same, but generally has test leakage.The interface testing of it and main control module requires this module and main control module to support the test of control bus simultaneously, realizes test by two ends control.The interface of it and clock module generally has the input and output clock, for the clock of input, to control clock module and exports separately, and this module has the clock detection function, for the clock of output, this module can be simulated the output clock, and clock module can detect this clock.The method of testing of line processing module service channel is that a kind of interface module is connected with line processing module, utilize tester and interface module to the sending and receiving data, exchange to this module through line processing module to Switching Module, by interface module data are sent back to the tester analysis again, thereby finish the service channel test.The test of other functional unit (as memory cell, common logic unit etc.) that circuit is handled is finished by self self check.
Three, to the method for testing of main control module
Utilize interface module that full configuration puts, line processing module, Switching Module, clock module as tool model.The test of the controlled function that other each module is provided for it is to produce control signal by terminal control main control module, reads relevant state to controlled module again.And other module is input to the state information of main control module, then reads the signal condition of related tool module at main control module.It is to send out data to interface board by tester to the service channel test of Switching Module, by exchanging to main control module to the switching network module after the line processing module, turn back to tester analysis through identical path again, thereby reach test service channel.Other functional unit (as memory cell, RTC etc.) of main control module is to be realized by itself self-test.It and other module or external communication interface are then by receiving these interfaces test with carrying out Interoperability Testing on the PC.
Four, to the method for testing of clock module
Utilize usual way to be difficult to test comprehensively, utilize tester can only test the phase-locked function of clock.All can there be test leakage, or tests insufficient a large amount of inputs, output clock.
Five, to the method for testing of Switching Module
Utilize interface module that full configuration puts, line processing module, main control module, clock module as tool model.Analyze the function of exchange test that data reach whole interchange channels by the tester transmitting-receiving.The control channel test of it and main control module is with the method for testing of circuit processing module.Other functional unit test of Switching Module then will be supported by himself.
As can be seen, there is following shortcoming in existing measuring technology from top description:
1), adopt the method for testing of exchange complete machine to require test according to tested module selection tool module, particularly Switching Module, need the complete machine full configuration to put, increase production test operation complexity and functional test cost.
2), adopted numerous tool models after, the fault location difficulty increases.
3), the design of switch often focuses on the complete machine function and realizes the test imperfection that self supports.The space of each module coverage rate is less, has the test leakage problem.
4), the reliability and stability of tool model are required very high, this is often at switching equipment small lot commitment, because the effect of the de-stabilising effect functional test of product self.
5), existing broadband test instrument generally only provides the test port of standard, the port kind is single, if the port kind of switching equipment is a lot, may need multiple tester could satisfy test, the functional localization of tester is poor in addition, costs an arm and a leg, and the functional test cost is very high.
Summary of the invention
The technical problem that will solve of the present invention is, above-mentioned shortcoming at existing measuring technology, provide a kind of system that is used for testing functions of broad-band switch device, for each functional module of various broadbands switching equipment is provided convenience, accurate and lower-cost testing scheme.
Technical program of the present invention lies in, construct a kind of system that is used for testing functions of broad-band switch device, it is characterized in that, comprising: be used to connect the test module of native system, and can connect the rear panel module of tested Switching Module, clock module, main control module, circuit processing and interface module; The test resource module that is connected with described rear panel module; Business that is connected with described rear panel module and interchange channel test module.
In test macro of the present invention, described rear panel module comprises: the test resource module slot position, business and the test module groove position, interchange channel that are used for inserting respectively described two test modules; The Switching Module groove position, clock module groove position, main control module groove position, the circuit that are used for inserting respectively described each tested module are handled and interface module groove position; Be used to draw described test resource module and described tested each module control interface, realize back of the body outlet draw the test control interface;
In test macro of the present invention, described test resource module comprises: CPU element; The clock source generation unit, clock detection unit, control bus detecting unit and the control bus generation unit that are connected with described CPU element; Interface driver element that is connected with described CPU and control interface unit; Power subsystem for described each functional unit power supply in this module.
In test macro of the present invention, described business and interchange channel test module can be taked two kinds of functional structures, and wherein first kind of structure comprises: be used to connect the Switching Module interface of described tested Switching Module, generation of test data source, interchange channel and the analytic unit that is connected with described Switching Module interface; Be used to connect described test line is handled and the circuit of interface module handles and the interface module interface, with the circuit that described circuit is handled and the interface module interface is connected manage business generation of lane testing data source and analytic unit; Be used to connect the main control module interface of described tested main control module, generation of master control service channel test data source and the analytic unit that is connected with described main control module interface; With the cpu i/f that each described test data source produces and analytic unit is connected; Power subsystem for described each functional unit power supply in this module.
Wherein second kind of structure comprises: be respectively applied for the Switching Module interface, the circuit that connect described tested Switching Module, circuit processing and interface module and main control module and handle and interface module interface and main control module interface; The electric switch matrix that is connected with described three interfaces; The test data source that is connected with described electric switch matrix by parallel serial conversion unit produces and analytic unit; With the cpu i/f that described test data source produces and analytic unit is connected; Power subsystem for described each functional unit power supply in this module.
After system of the present invention adopts technique scheme, have following major advantage:
1) need not buy expensive tester and a large amount of tool model of use, realize low cost test;
2) enlarge plate functional test coverage, solve test leakage, the mistake survey problem of conventional method;
3) minimizing customizes complete plate testing scheme to the control of multiple instrument and tool model, improves functional test efficient;
4) improve the reliability of testing, make things convenient for the fault location of measurand;
5) this method can fully satisfy the test of existing and later broadband switching equipment.
Further specify characteristics of the present invention below in conjunction with drawings and Examples.
Description of drawings
Fig. 1 is the basic comprising schematic diagram of broadband switching equipment;
Fig. 2 is that test macro of the present invention connects the structured flowchart when going up tested module;
Fig. 3 is the functional structure chart of test macro dorsulum module of the present invention;
Fig. 4 is the functional structure chart of test resource module in the test macro of the present invention;
Fig. 5 is the functional structure chart of professional and interchange channel test module in the test macro of the present invention;
Fig. 6 is the another kind of functional structure chart of professional and interchange channel test module in the test macro of the present invention;
Fig. 7 is the structure chart when utilizing test macro of the present invention that circuit and interface processing module are tested;
Fig. 8 is the structure chart when utilizing test macro of the present invention that main control module is tested;
Fig. 9 is the structure chart when utilizing test macro of the present invention that Switching Module is tested;
Figure 10 is the structure chart when utilizing test macro of the present invention that clock module is tested.
Embodiment
We know that the broadband switching equipment all comprises main control module, Switching Module, clock module, line processing module and interface module usually from the description of front.These basic comprising modules normally remain unchanged, the just bandwidth of operation and the traffic handing capacity of module of variation.Therefore, we can propose a kind of function test system at the broadband switching equipment.The structure of this system as shown in Figure 2.As can be seen from the figure, rear panel module 1, test resource module 2 and business and interchange channel test module 3 are core components of this test macro.Wherein, rear panel module 1 mainly plays a part to connect test module 2,3 and each tested module 4,5,6,7: test resource module 2, business and 3 of interchange channel test modules provide the whole external testing resources to the broadband switching equipment, test resource module 2 also provides cpu bus professional and that interchange channel test module 3 will use in addition, if certain business and interchange channel test module 3 itself have CPU then do not need the outside to provide.Above-mentioned three kinds of modules when design realizes, can be two kinds of veneers, three kinds of veneers and multiple veneer form.
One, rear panel module
Rear panel module 1 is a test module and the bridge that is connected of each tested module, the functional structure chart of this module as shown in Figure 3, comprise the groove position 11,12 that is used to insert test module, be used to insert the groove position 13,14,15,16 of tested module, also comprise power supply access port 17 and draw test control interface 18.
Power supply access interface 17 among the figure is power inputs of whole test system, can directly be connected with civil power, primary power source or secondary power supply, is the whole system power supply.Drawing test control mouth 18 mainly is the control interface (serial ports, network interface or the like) of drawing test resource module, tested each module, realizes back side outlet, rather than the panel outlet, and this interface is an option, can decide as the case may be when design realizes.
The major function of rear panel module 1 is between test module and test module and tested module formation annexation, realizes the interface butt joint of backboard.Cpu bus wherein, control bus and part clock line may be the low speed signal lines; Interchange channel, service channel and part clock signal may be HW High Way, and these high-speed line are the places of wanting special concern in the back plate design.
In addition, rear panel module 1 in design can be with the backboard consistent size or the difference of broadband switching equipment, and this will decide according to actual conditions and the integration environment.In design, also can be designed to the test module band simultaneously by redundancy backup or support multistation test (test when a backboard can be supported the polylith veneer).
Two, test resource module
As can be seen from Figure 3, the function of test resource module 2 comprises: for the business in this test macro and interchange channel test module 3 provide cpu resource; For measured clock module 4, test line processing and interface module 6 provide the clock resource; For four tested modules 4,5,6,7 provide the control bus resource; Realization is tested or the like clock rate testing, output control and the status signal of tested module.This module externally provides control interface simultaneously, and this interface links to each other with PC or other terminal equipment, realizes the controllability test.The functional block diagram of test resource module comprises CPU element 21, clock source generation unit 22, clock detection unit 23, control bus detecting unit 24, interface driving circuit 25, power subsystem 26, control interface 27 and control bus generation unit 28 as shown in Figure 4.
The clock source generation unit 22 of test resource module 2 is decided according to clock and employed timing reference input that the broadband switching equipment is provided.Common clock kind has 2MBPS, 2MHZ, high accuracy TTL clock, gps clock etc., and the clock source that switching equipment is provided is higher than the clock grade of switching equipment self clock module usually.In functional test, often require a road of multipath clock to export separately, can select output by CPU when therefore exporting in the clock source.Clock detection unit 23 mainly is to detect clock module whether output to the clock of other module normal, the realization of this part can realize by writing test logic by FPGA or EPLD, the device of FPGA and EPLD can be selected any of manufacturers such as ALTERA, XILINX for use, and selector will carry out emulation and determine that the resource of selected device can meet the demands.
Control bus generation unit 28 is under the control of CPU, produces various control signals or emulation mode index signal formation control bus in FPGA or EPLD.The kind of control bus may be different according to different broadband switching equipment, but commonly used having: each module reset signal, signal on the throne, groove position signal or the like., also can detect simultaneously, and read testing result and report by CPU by detecting logic in this module for the output control and the status signal of broadband each module of switching equipment.
Three, business and interchange channel test module
As can be seen from Figure 3, function professional and interchange channel test module 3 comprises: for tested Switching Module 5 provides the interchange channel test function; For tested main control module 7, circuit processing and interface module 6 provide the service channel test function.The functional block diagram of this module realizes that dual mode is arranged, as Fig. 5, shown in Figure 6.
In structured flowchart shown in Figure 5, all to produce data source respectively at each interchange channel, line processing module service channel, main control module service channel, and transceive data is analyzed respectively.Comprise Switching Module interface 31, line processing module interface 32 and main control module interface 33, produce and analytic unit 36,37,38 with the test data source that described three interfaces were not connected in 31,32 minutes 33.Also be included as the cpu i/f 34 that is connected with described CPU element 21 in the test resource 1.Power subsystem 35 for described each functional unit power supply in this module.In design realized, the way of realization of each passage was identical.And each module interface among Fig. 5 is respectively at the passage of disparate modules and the interface type identical with tested module that designs, thereby achieves a butt joint test.
The difference that structured flowchart shown in Figure 6 is compared with Fig. 5 is: be not all will produce data source separately at each passage, but whole test only produces one group of data source, after string and converting unit 311, enter switch matrix 310 and select transceiver channel, turn back to the data that the test data source produces and analytic unit 312 analyses receive again.The interface that each tested module connects among Fig. 6 and Fig. 5 function class are seemingly.
Above-mentioned dual mode is all practical to general testing functions of broad-band switch device, but will select the method that is more suitable for as the case may be sometimes.In design realized, data source is produced can select the interface chip identical with tested module for use with the interface of tested module.
Below we describe in detail and utilize this method is how to realize the test of broadband switching equipment:
1), realization is to the test of various interface module
As shown in Figure 7, test resource module 2, business and interchange channel test module 3 and test line and interface processing module 6 have been inserted in the groove position of rear panel module at this moment.That is to say, when the docking port module is tested, need line module as tool model; Require to provide test resource module 2 and professional and interchange channel test module 3 for test module.
The entry condition of control bus major control circuit handling implement module and tested interface module operate as normal wherein.Clock line provides the interface module reference clock by test resource module 2 on the one hand, on the other hand interface module circuit clock recovered is delivered to 2 tests of test resource module.The test of the service channel of interface module is to be produced with the service channel of analytic unit generation packet by rear panel module 1 by the CPU control of test resource module 2 data source professional and interchange channel test module 3 to send to line processing module, arrive interface module then, be looped back to the data source generation through identical path again and carry out data analysis with analytic unit.This kind method can realize the interface module test of any interface type.
2), realization is to the test of line processing module
As shown in Figure 7, when being tested, line processing module 6 need provide test resource module 2, business and interchange channel test module 3.The service channel test all becomes butt joint by relevant tunnel-shaped with clock test, tests.The interface module that requires to select for use with the interface testing of interface module reaches test as tool model by control bus and service channel.The various interface modules of selecting for use that main control module offers line processing module in the 2 artificial actual work of test resource module reach test as tool model by control bus and service channel.Main control module offers the various control signals of line processing module in the 2 artificial actual work of test resource module, and the various condition indicative signals of line processing module output are simultaneously also tested in test resource module 2.
3), realization is to the test of main control module
As shown in Figure 8, to the test of main control module 7 by test resource module 2, business and interchange channel test module 3 combined tests.The method of testing of service channel and the method for testing of line processing module are similar.The control signal of 7 pairs of whole switching equipment of main control module is all guided to test resource module 2 and is tested, and simultaneously all condition indicative signals to main control module 7 provide by test resource module 2 and by the main control module reading state and report in the switching equipment.Other test item is with the conventionally test unanimity.
4), realization is to the test of Switching Module
As shown in Figure 9, the test of interchange channel in the Switching Module 5 is finished test in test resource module 2 control business and interchange channel test module 3.The method of testing front is by the agency of, is not giving unnecessary details herein.
5), realization is to the test of clock module
Test to clock module 4 mainly is to be undertaken by test resource module 2, and its test structure figure as shown in figure 10.Method of testing is that the input of measured clock module 4, output clock and control are all linked to each other with 2 butt joints of test resource module with status signal, realizes test.
Claims (7)
1, a kind of system that is used for testing functions of broad-band switch device is characterized in that, comprising:
Be used for connecting the test module of native system, and can connect the rear panel module of tested Switching Module, clock module, main control module, circuit processing and interface module;
Be connected with described rear panel module, can be described tested module the control bus resource is provided, for measured clock module, test line processing and interface module provide the clock resource, and the test resource module that can carry out clock rate testing, output control and status signal test to described tested module;
Be connected with described rear panel module, be used for the interchange channel of described tested Switching Module is tested, and to described tested main control module, circuit are handled and the service channel of interface module is tested business and interchange channel test module.
2, the system that is used for testing functions of broad-band switch device according to claim 1 is characterized in that, described rear panel module comprises:
Be used for inserting respectively test resource module slot position, business and the test module groove position, interchange channel of described two test modules;
The Switching Module groove position, clock module groove position, main control module groove position, the circuit that are used for inserting respectively described each tested module are handled and interface module groove position;
The control interface that is used to draw described test resource module and described tested each module is drawn the test control interface with what realize back of the body outlet;
Be used for the power supply access interface that is connected with external power source.
3, the system that is used for testing functions of broad-band switch device according to claim 1 is characterized in that, described test resource module comprises:
Be used to realize the clock source selection control of this module, the CPU element that time detecting is controlled and testing result reports;
The clock source generation unit, clock detection unit, control bus detecting unit and the control bus generation unit that are connected with described CPU element;
Interface driver element that is connected with described CPU and control interface unit;
Power subsystem for described each functional unit power supply in this module.
4, the system that is used for testing functions of broad-band switch device according to claim 1 is characterized in that, described business and interchange channel test module comprise:
Be used to connect the Switching Module interface of described tested Switching Module, generation of test data source, interchange channel and the analytic unit that is connected with described Switching Module interface;
Be used to connect described test line is handled and the circuit of interface module handles and the interface module interface, with the circuit that described circuit is handled and the interface module interface is connected manage business generation of lane testing data source and analytic unit;
Be used to connect the main control module interface of described tested main control module, generation of master control service channel test data source and the analytic unit that is connected with described main control module interface;
With the cpu i/f that each described test data source produces and analytic unit is connected;
Power subsystem for described each functional unit power supply in this module.
5, the system that is used for testing functions of broad-band switch device according to claim 1 is characterized in that, described business and interchange channel test module comprise:
Being respectively applied for the Switching Module interface, the circuit that connect described tested Switching Module, circuit processing and interface module and main control module handles and interface module interface and main control module interface;
The electric switch matrix that is connected with described three interfaces;
The test data source that is connected with described electric switch matrix by parallel serial conversion unit produces and analytic unit;
With the cpu i/f that described test data source produces and analytic unit is connected;
Power subsystem for described each functional unit power supply in this module.
6, the system that is used for testing functions of broad-band switch device according to claim 2 is characterized in that, also comprises on the described rear panel module:
Be connected the cpu bus between described test resource module slot position and described business and the interchange channel test groove;
Be connected the clock line between described test resource module slot position and described measured clock module slot position, test line processing and the interface module groove position;
Be connected the control bus between described test resource module slot position and described tested Switching Module groove position, measured clock module slot position, tested main control module groove position, test line processing and the interface module groove position.
7, the system that is used for testing functions of broad-band switch device according to claim 2 is characterized in that, also comprises on the described rear panel module:
Be connected the interchange channel line between described business and interchange channel test groove and the described tested Switching Module groove position;
Be connected the service channel line between described business and interchange channel test groove and described tested main control module groove position, test line processing and the interface module groove position.
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| Application Number | Priority Date | Filing Date | Title |
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| CNB011227605A CN1184826C (en) | 2001-07-18 | 2001-07-18 | System for testing functions of broad-band switch device |
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| CNB011227605A CN1184826C (en) | 2001-07-18 | 2001-07-18 | System for testing functions of broad-band switch device |
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| CN1184826C true CN1184826C (en) | 2005-01-12 |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN1299471C (en) * | 2003-04-18 | 2007-02-07 | 中兴通讯股份有限公司 | Broadband insertion server testing gating and testing method |
| CN1725713B (en) | 2004-07-22 | 2010-04-28 | 华为技术有限公司 | Broadband testing grab wire and protecting device |
| CN101257414B (en) * | 2008-02-29 | 2011-09-14 | 福建星网锐捷网络有限公司 | Method and apparatus for testing module |
| CN102200940A (en) * | 2010-03-26 | 2011-09-28 | 鸿富锦精密工业（深圳）有限公司 | HDD (Hard Disk Driver) backboard testing system |
| CN101937222B (en) * | 2010-08-17 | 2012-04-25 | 北京交大资产经营有限公司 | Board level testing system |
| CN102130612B (en) * | 2010-12-20 | 2014-03-12 | 中国电力科学研究院 | Integrated control sub-module board for simulating multi-level modular converter (MMC) sub-module |
| CN102231685A (en) * | 2011-06-17 | 2011-11-02 | 中兴通讯股份有限公司 | Test method, server and system |
| CN103631688B (en) * | 2013-12-05 | 2017-03-08 | 迈普通信技术股份有限公司 | A kind of method and system of test interface signal |
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