CN118435619A - 阈值确定方法、阈值确定程序、阈值确定装置、光子数识别系统、光子数识别方法及光子数识别处理程序 - Google Patents

阈值确定方法、阈值确定程序、阈值确定装置、光子数识别系统、光子数识别方法及光子数识别处理程序 Download PDF

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Publication number
CN118435619A
CN118435619A CN202280085067.2A CN202280085067A CN118435619A CN 118435619 A CN118435619 A CN 118435619A CN 202280085067 A CN202280085067 A CN 202280085067A CN 118435619 A CN118435619 A CN 118435619A
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CN
China
Prior art keywords
probability
photon
value
distribution
probability distribution
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Pending
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CN202280085067.2A
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English (en)
Chinese (zh)
Inventor
樋口贵文
中本胜大
高桥辉雄
中岛真央
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Hamamatsu Photonics KK
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Hamamatsu Photonics KK
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Publication of CN118435619A publication Critical patent/CN118435619A/zh
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    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60Noise processing, e.g. detecting, correcting, reducing or removing noise
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/618Noise processing, e.g. detecting, correcting, reducing or removing noise for random or high-frequency noise
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70SSIS architectures; Circuits associated therewith
    • H04N25/76Addressed sensors, e.g. MOS or CMOS sensors
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/42Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/44Electric circuits
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/42Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/44Electric circuits
    • G01J2001/4413Type
    • G01J2001/442Single-photon detection or photon counting
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/616Noise processing, e.g. detecting, correcting, reducing or removing noise involving a correlated sampling function, e.g. correlated double sampling [CDS] or triple sampling
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70SSIS architectures; Circuits associated therewith
    • H04N25/76Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/77Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
    • H04N25/772Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components comprising A/D, V/T, V/F, I/T or I/F converters
    • H04N25/773Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components comprising A/D, V/T, V/F, I/T or I/F converters comprising photon counting circuits, e.g. single photon detection [SPD] or single photon avalanche diodes [SPAD]

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  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
CN202280085067.2A 2021-12-24 2022-11-10 阈值确定方法、阈值确定程序、阈值确定装置、光子数识别系统、光子数识别方法及光子数识别处理程序 Pending CN118435619A (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2021-211065 2021-12-24
JP2021211065 2021-12-24
PCT/JP2022/041948 WO2023119934A1 (ja) 2021-12-24 2022-11-10 閾値決定方法、閾値決定プログラム、閾値決定装置、光子数識別システム、光子数識別方法および光子数識別処理プログラム

Publications (1)

Publication Number Publication Date
CN118435619A true CN118435619A (zh) 2024-08-02

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CN202280085067.2A Pending CN118435619A (zh) 2021-12-24 2022-11-10 阈值确定方法、阈值确定程序、阈值确定装置、光子数识别系统、光子数识别方法及光子数识别处理程序

Country Status (5)

Country Link
US (1) US12574662B2 (https=)
EP (1) EP4422200A4 (https=)
JP (1) JPWO2023119934A1 (https=)
CN (1) CN118435619A (https=)
WO (1) WO2023119934A1 (https=)

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2011047542A1 (zh) * 2009-10-22 2011-04-28 浙江大学 基于空域预测的视频和图像编解码系统
WO2017080860A1 (en) 2015-11-10 2017-05-18 ID Quantique Method and device for optics based quantum random number generation
JP2020096646A (ja) * 2016-12-05 2020-06-25 キヤノン株式会社 放射線撮影装置、放射線撮影システム、放射線撮影方法、及びプログラム
KR102396261B1 (ko) 2017-01-30 2022-05-10 퍼듀 리서치 파운데이션 이미징 잡음 감소 시스템 및 방법
WO2019102636A1 (ja) * 2017-11-24 2019-05-31 浜松ホトニクス株式会社 フォトンカウンティング装置およびフォトンカウンティング方法
US10616512B2 (en) * 2018-07-27 2020-04-07 Wisconsin Alumni Research Foundation Systems, methods, and media for high dynamic range imaging using dead-time-limited single photon detectors
JP2020038129A (ja) * 2018-09-04 2020-03-12 浜松ホトニクス株式会社 平均光子数の推定方法及び平均光子数の推定装置
US12247875B2 (en) * 2022-11-11 2025-03-11 QC82 Inc. Low loss partial photon number-resolution detection

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Publication number Publication date
US12574662B2 (en) 2026-03-10
WO2023119934A1 (ja) 2023-06-29
EP4422200A4 (en) 2025-10-08
US20250016476A1 (en) 2025-01-09
JPWO2023119934A1 (https=) 2023-06-29
EP4422200A1 (en) 2024-08-28

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