CN118376960B - Electric connector and electric performance test system thereof - Google Patents
Electric connector and electric performance test system thereof Download PDFInfo
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Abstract
The invention relates to the technical field of connectors, in particular to an electric connector and an electric performance test system thereof, which comprises: the signal generating module is used for providing a test signal conforming to a test standard; the detection module is connected with the signal generation module and used for detecting the electrical performance of the electrical connector; and the control module is respectively connected with the signal generation module and the detection module and is used for adjusting the single maximum adjustment amplitude of the basic test signal when the stability of the electrical performance test is judged to be unsatisfactory according to the fluctuation amplitude of the insertion loss of the standard test signal, or primarily judging that the stability of the electrical parameter acquisition is unsatisfactory and secondarily judging the stability of the electrical parameter acquisition according to the variance of the electrical parameter detection of the electrical connector. The invention realizes the improvement of the stability of the electrical performance test.
Description
Technical Field
The present disclosure relates to electrical connectors, and particularly to an electrical connector and an electrical performance testing system thereof.
Background
In the prior art, an electric connector is an electronic component and is widely applied to various electric and electronic systems, such as aerospace, aviation, electronics, traffic and other industries. As a "nerve junction and contact" of the electrical signal transmission system, the electrical connector plays a key role in the circuit, and its quality directly affects the performance and quality of the product. The millimeter wave connector has the characteristics of high working frequency, small structural size, high precision requirement and the like, so that the electrical performance requirement on the millimeter wave connector is stricter, and the electrical performance of the millimeter wave connector needs to be strictly and accurately tested.
Chinese patent publication No.: CN116908603a discloses a connector-based reliability detection method and system, the method includes: inputting a test electrical signal to a connector to be detected, and obtaining a target electrical signal output by the connector to be detected; calculating a predicted electrical performance loss value according to the connector type, the connector length, the conductor core number and the electrical parameters of the connector to be detected; acquiring a working temperature value of a current detection environment, and calculating based on the working temperature value and the estimated electrical performance loss value to obtain a target electrical performance loss value; calculating an estimated electrical performance difference value according to the first electrical parameter of the test electrical signal and the second electrical parameter of the target electrical signal, and calculating based on the working temperature value and the estimated electrical performance difference value to obtain a target electrical performance difference value; and determining the reliability of the electrical performance of the connector to be detected according to the target electrical performance difference value and the target electrical performance loss value. Therefore, the reliability detection method and the system based on the connector have the problems that the power line is loosened due to the fact that the signal generator is subjected to multiple tests, the strength of an output test signal is unstable, and the voltage of the signal generator is unstable, so that the stability of an electrical performance test is reduced.
Disclosure of Invention
Therefore, the invention provides an electrical connector and an electrical performance testing system thereof, which are used for solving the problem that in the prior art, the power line is loosened due to the fact that a signal generator is subjected to multiple tests, the strength of an output test signal is unstable, and the stability of an electrical performance test is reduced due to the fact that the voltage of the signal generator is unstable.
In order to achieve the above object, the present invention provides an electrical performance testing system of an electrical connector, comprising: the signal generation module is used for providing a test signal conforming to a test standard, and comprises a signal generator used for generating a basic test signal and a filter connected with the signal generator and used for filtering the basic test signal to output the standard test signal; the detection module is connected with the signal generation module and used for detecting the electrical performance of the electrical connector, and comprises a voltage tester connected with the signal generator and used for detecting the test voltage of the electrical connector and an oscilloscope connected with a center needle in the electrical connector and used for displaying the waveform of a standard test signal; the control module is respectively connected with the signal generation module and the detection module and is used for adjusting the single maximum adjustment amplitude of the basic test signal when the stability of the electrical performance test is judged to be unsatisfactory according to the fluctuation amplitude of the insertion loss of the standard test signal, or primarily judging that the stability of the electrical parameter acquisition is not satisfactory and secondarily judging the stability of the electrical parameter acquisition according to the variance of the electrical parameter detection of the electrical connector; and adjusting the test voltage of the electrical connector when the stability of the electrical parameter acquisition is secondarily determined to be unsatisfactory, or adjusting the center frequency of the filter according to the waveform integrity of the standard test signal; the center frequency of the filter is secondarily adjusted according to the waveform distortion degree of the standard test signal under the preset working condition; the preset working condition is that the filter filters the basic test signal according to the adjusted center frequency.
Further, the control module is connected with the detection module and is used for calculating the fluctuation amplitude of the insertion loss of the standard test signal according to the insertion loss of the test signal in a plurality of test processes, and judging that the stability of the electrical performance test is not in accordance with the requirement when the fluctuation amplitude of the insertion loss of the standard test signal meets the first fluctuation amplitude condition or the second fluctuation amplitude condition;
the first fluctuation amplitude condition is that the fluctuation amplitude of the insertion loss of the standard test signal is larger than a preset first fluctuation amplitude and smaller than or equal to a preset second fluctuation amplitude; the second fluctuation amplitude condition is that the fluctuation amplitude of the insertion loss of the standard test signal is larger than a preset second fluctuation amplitude.
Further, the control module is connected with the detection module, and is used for primarily judging that the stability of the electrical parameter acquisition is not in accordance with the requirement when the fluctuation range of the insertion loss of the standard test signal only meets the first fluctuation range condition, and secondarily judging whether the stability of the electrical parameter acquisition is in accordance with the requirement according to the variance of the electrical parameter detection of the electrical connector.
Further, the control module is connected with the signal generator and is used for reducing the single maximum adjustment amplitude of the basic test signal when the fluctuation amplitude of the insertion loss of the standard test signal only meets the second fluctuation amplitude condition;
the single maximum adjustment amplitude of the reduced basic test signal is determined by the difference value between the fluctuation amplitude of the insertion loss of the standard test signal and the preset second fluctuation amplitude.
Further, the control module is connected with the detection module, and is used for secondarily judging that the stability of the electrical parameter acquisition is not in accordance with the requirement when the variance of the electrical parameter detection of the electrical connector meets the first variance condition or the second variance condition, primarily judging that the signal interference received in the test process is not in accordance with the requirement when the variance of the electrical parameter detection of the electrical connector only meets the second variance condition, and secondarily judging whether the signal interference received in the test process is in accordance with the requirement according to the waveform integrity of the standard test signal;
the control module is connected with the filter and is used for reducing the test voltage of the electric connector when the variance of the electric parameter detection of the electric connector only meets the first variance condition;
the reduced test voltage of the electric connector is determined by the difference value between the variance of the electric connector during electric parameter detection and the preset first variance;
The first variance condition is that the variance of the electric connector during electric parameter detection is larger than a preset first variance and smaller than or equal to a preset second variance; the second variance condition is that the variance of the electrical connector during electrical parameter detection is larger than a preset second variance.
Further, the calculation formula of the waveform integrity of the standard test signal is as follows:
Wherein Y is the waveform integrity of the standard test signal, S1 is the difference between the total waveform length of the standard test signal and the disconnected waveform length, and S2 is the total waveform length of the standard test signal.
Further, the control module is respectively connected with the oscilloscope and the filter, and is used for secondarily judging that signal interference received in the test process is not in accordance with the requirement when the waveform integrity of the standard test signal is smaller than the preset integrity, and increasing the center frequency of the filter.
Further, the center frequency of the increased filter is determined by the difference between the preset integrity and the waveform integrity of the standard test signal.
Further, the control module is respectively connected with the oscilloscope and the filter, and is used for judging that the effectiveness of filtering is not in accordance with the requirement when the waveform distortion degree of the standard test signal is larger than the preset distortion degree, and reducing the central frequency of the increased filter;
The center frequency of the reduced filter is determined by the difference between the waveform distortion degree of the standard test signal and the preset distortion degree.
The invention also provides an electrical connector comprising:
A housing;
An insulator provided inside the housing to prevent the standard test signal from leaking;
And the center pin is arranged inside the insulator and is used for transmitting standard test signals.
Compared with the prior art, the system has the beneficial effects that the signal generation module, the detection module and the control module are arranged, the single maximum adjustment amplitude of the basic test signal is adjusted according to the fluctuation amplitude of the insertion loss of the standard test signal, the power line is loosened due to the fact that the signal generator is subjected to multiple tests, the strength of the output test signal is unstable, the voltage of the signal generator is unstable, the influence of the sudden change of the signal amplitude on the damage of an interface of the electric connector is reduced by reducing the single maximum adjustment amplitude of the basic test signal, the test voltage of the electric connector is adjusted according to the variance of the electric parameter detection time of the electric connector, and partial wiring errors possibly occur due to the fact that the wiring of an access circuit is needed to be too much, the connection of certain ports which are not connected with the filter leads to larger voltage and further leads to increased heat of connecting wires, so that the resistance of the connecting wires is increased, the performance of certain connecting wires is reduced, the influence of inaccurate detection caused by overhigh heat of the connecting wires is reduced by reducing the test voltage of the electric connector, the center frequency of the filter is regulated according to the waveform integrity of a standard test signal, electromagnetic radiation is generated in the process of transmitting the high-frequency signal due to the fact that the millimeter wave connector has higher requirements for the signal frequency, the test signal is interfered, the waveform is broken, the accuracy of the test process is reduced, the influence of electromagnetic interference on the transmission of the test signal is reduced by increasing the center frequency of the filter, the center frequency of the filter is secondarily regulated according to the waveform distortion degree of the standard test signal, the central frequency of the filter is too large, so that the current of a high-frequency part is filtered or attenuated, the test signal is distorted, the waveform is deformed, the influence of the reduction of the accuracy of the test result caused by the too large filtering frequency is reduced by reducing the central frequency of the filter, and the stability of the electrical performance test is improved.
Furthermore, the system adjusts the single maximum adjustment amplitude of the basic test signal by setting the preset first fluctuation amplitude and the preset second fluctuation amplitude, and the output test signal intensity is unstable due to the fact that the power line is loosened caused by the fact that the signal generator is tested for multiple times, so that the voltage of the signal generator is unstable, and the influence of damage to an electric connector interface due to abrupt change of the signal amplitude is reduced by reducing the single maximum adjustment amplitude of the basic test signal, so that the stability of the electric performance test is further improved.
Furthermore, the system adjusts the test voltage of the electric connector by setting the preset first variance and the preset second variance, and because of excessive wiring of the access circuit, the error can be caused by the fact that part of wiring is needed, the voltage is larger due to the fact that ports which are not needed to be accessed are accessed, the heat quantity of the connecting wire is increased, the resistance of the connecting wire is increased, the performance of certain connecting wires is reduced, the influence of inaccurate detection due to the fact that the heat quantity of the connecting wire is too high is reduced by reducing the test voltage of the electric connector, and the stability of electric performance test is further improved.
Furthermore, the system adjusts the center frequency of the filter by setting the preset integrity, and electromagnetic radiation is generated in the high-frequency signal transmission process due to the fact that the millimeter wave connector has higher requirements on the signal frequency, so that the test signal is interfered, the waveform is broken, the accuracy of the test process is reduced, the influence of electromagnetic interference on the transmission of the test signal is reduced by increasing the center frequency of the filter, and the stability of the electrical performance test is further improved.
Furthermore, the system adjusts the center frequency of the filter by setting the preset distortion degree, and the current of the high-frequency part is filtered or attenuated due to the overlarge center frequency of the filter, so that the test signal is distorted, the waveform is deformed, the influence of the reduced accuracy of the test result due to the overlarge filter frequency is reduced by reducing the center frequency of the filter, and the stability of the electrical performance test is further improved.
Drawings
FIG. 1 is a schematic diagram of an electrical performance testing system of an electrical connector according to an embodiment of the present invention;
FIG. 2 is a schematic diagram showing a specific structure of an electrical connector of the electrical performance testing system of the electrical connector according to the embodiment of the present invention;
FIG. 3 is a block diagram showing the overall structure of an electrical performance testing system of an electrical connector according to an embodiment of the present invention;
FIG. 4 is a block diagram showing a specific structure of a signal generating module of an electrical performance testing system of an electrical connector according to an embodiment of the present invention;
The reference numerals are as follows: 1-signal generator, 2-filter, 3-voltage tester, 4-electric connector, 5-oscilloscope, 6-shell, 7-center needle, 8-insulator.
Detailed Description
In order that the objects and advantages of the invention will become more apparent, the invention will be further described with reference to the following examples; it should be understood that the specific embodiments described herein are for purposes of illustration only and are not intended to limit the scope of the invention.
Preferred embodiments of the present invention are described below with reference to the accompanying drawings. It should be understood by those skilled in the art that these embodiments are merely for explaining the technical principles of the present invention, and are not intended to limit the scope of the present invention.
It should be noted that, in the description of the present invention, terms such as "upper," "lower," "left," "right," "inner," "outer," and the like indicate directions or positional relationships based on the directions or positional relationships shown in the drawings, which are merely for convenience of description, and do not indicate or imply that the apparatus or elements must have a specific orientation, be constructed and operated in a specific orientation, and thus should not be construed as limiting the present invention.
Furthermore, it should be noted that, in the description of the present invention, unless explicitly specified and limited otherwise, the terms "mounted," "connected," and "connected" are to be construed broadly, and may be either fixedly connected, detachably connected, or integrally connected, for example; can be mechanically or electrically connected; can be directly connected or indirectly connected through an intermediate medium, and can be communication between two elements. The specific meaning of the above terms in the present invention can be understood by those skilled in the art according to the specific circumstances.
Fig. 1, fig. 2, fig. 3, and fig. 4 show an overall schematic diagram of an electrical connector and an electrical performance testing system thereof, a specific schematic diagram of the electrical connector, an overall schematic diagram of the electrical connector, and a specific schematic diagram of a signal generating module according to an embodiment of the invention. The invention relates to an electrical performance test system of an electrical connector, which comprises:
a signal generating module for providing a test signal conforming to a test standard, comprising a signal generator 1 for generating a basic test signal and a filter 2 connected to the signal generator 1 for filtering the basic test signal to output a standard test signal;
the detection module is connected with the signal generation module and used for detecting the electrical performance of the electrical connector 4, and comprises a voltage tester 3 connected with the signal generator 1 and used for detecting the test voltage of the electrical connector 4, and an oscilloscope 5 connected with a center pin 7 in the electrical connector 4 and used for displaying the waveform of a standard test signal;
The control module is respectively connected with the signal generation module and the detection module and is used for adjusting the single maximum adjustment amplitude of the basic test signal when the stability of the electrical performance test is judged to be unsatisfactory according to the fluctuation amplitude of the insertion loss of the standard test signal, or primarily judging that the stability of the electrical parameter acquisition is not satisfactory and secondarily judging the stability of the electrical parameter acquisition according to the variance of the electrical parameter detection of the electrical connector 4;
And adjusting the test voltage of the electrical connector 4 when the stability of the electrical parameter acquisition is secondarily determined to be unsatisfactory, or adjusting the center frequency of the filter 2 according to the waveform integrity of the standard test signal;
And secondarily adjusting the center frequency of the filter 2 according to the waveform distortion degree of the standard test signal under a preset working condition;
The preset working condition is that the filter 2 filters the basic test signal according to the adjusted center frequency.
Specifically, the meaning of the test signal conforming to the test standard is that the test signal is determined to conform to the test standard when the signal strength of the test signal is 30dBm or more.
Specifically, the basic test signal and the standard test signal are distinguished in that the noise of the standard test signal is less than the frequency spectrum of the basic test signal, the amplitude of the standard test signal is more stable than the amplitude of the basic test signal, and the phase of the standard test signal is more accurate than the phase of the basic test signal.
Specifically, the electrical parameter may be a resistance of the electrical connector, a capacitance of the electrical connector, an inductance of the electrical connector.
Specifically, the meaning of the electrical parameter detection time is an interval period between starting the detection of the electrical parameter and stopping the detection of the electrical parameter.
Specifically, the electrical connector 4 includes an NMD connector, an SMP connector, and a millimeter wave radio frequency coaxial connector, and a preferred embodiment of the present invention is a millimeter wave radio frequency coaxial connector.
Alternatively, the signal generator 1 may be an analog signal generator, a digital signal generator, a microwave signal generator, a preferred embodiment being a microwave signal generator.
Alternatively, the filter 2 may be a low-pass filter, a high-pass filter, a band-reject filter, a high-pass filter being a preferred embodiment.
Optionally, the control module may be a single-chip microcomputer, a PLC controller, or a microcontroller.
In the implementation, the system adjusts the single maximum adjustment amplitude of the basic test signal according to the fluctuation amplitude of the insertion loss of the standard test signal by arranging the signal generation module, the detection module and the control module, the power line is loosened due to the fact that the signal generator 1 is tested for multiple times, the output test signal intensity is unstable, the voltage instability of the signal generator 1 is caused, the influence of damage to the interface of the electric connector 4 due to the abrupt change of the signal amplitude is reduced by reducing the single maximum adjustment amplitude of the basic test signal, the test voltage of the electric connector 4 is adjusted according to the variance of the electric parameter detection time of the electric connector 4, errors can occur in part of wiring due to the fact that the connection of an access circuit is needed, the voltage is larger due to the fact that some ports which are not needed to be accessed are accessed, and further causes the heat of the connection lines to increase, so that the resistance of the connection lines to become large, thereby causing the performance of some connection lines to be degraded, the influence of detection inaccuracy caused by the excessively high heat of the connection lines is reduced by reducing the test voltage of the electrical connector 4, the center frequency of the filter 2 is adjusted according to the waveform integrity of the standard test signal, electromagnetic radiation is generated in the high-frequency signal transmission process due to the relatively high requirement of the millimeter wave connector for the signal frequency, thereby interfering the test signal, causing the waveform to break, the accuracy of the test process is reduced, the influence of electromagnetic interference on the transmission of the test signal is reduced by increasing the center frequency of the filter 2, the center frequency of the filter 2 is secondarily adjusted according to the waveform distortion of the standard test signal, the central frequency of the filter 2 is too large, so that the current of a high-frequency part is filtered or attenuated, the test signal is distorted, the waveform is deformed, the influence of the reduction of the accuracy of the test result caused by the too large filtering frequency is reduced by reducing the central frequency of the filter 2, and the stability of the electrical performance test is improved.
Specifically, the control module is connected with the detection module and is used for calculating the fluctuation amplitude of the insertion loss of the standard test signal according to the insertion loss of the test signal in a plurality of test processes, and judging that the stability of the electrical performance test is not in accordance with the requirement when the fluctuation amplitude of the insertion loss of the standard test signal meets the first fluctuation amplitude condition or the second fluctuation amplitude condition;
the first fluctuation amplitude condition is that the fluctuation amplitude of the insertion loss of the standard test signal is larger than a preset first fluctuation amplitude and smaller than or equal to a preset second fluctuation amplitude; the second fluctuation amplitude condition is that the fluctuation amplitude of the insertion loss of the standard test signal is larger than a preset second fluctuation amplitude.
It can be understood that three intervals corresponding to the preset first fluctuation range and the preset second fluctuation range correspond to three conditions respectively, wherein the first condition is that the fluctuation range of the insertion loss of the standard test signal is smaller than or equal to the preset first fluctuation range, and the stability of the electrical performance test is judged to be in accordance with the requirement; the second condition is that the fluctuation amplitude of the insertion loss of the standard test signal is larger than the preset first fluctuation amplitude and smaller than or equal to the preset second fluctuation amplitude, the stability of the electrical parameter acquisition is primarily judged to be inconsistent with the requirement, and whether the stability of the electrical parameter acquisition is consistent with the requirement is secondarily judged according to the variance of the electrical parameter detection of the electrical connector 4; and in the third case, the fluctuation amplitude of the insertion loss of the standard test signal is larger than the preset second fluctuation amplitude, and the single maximum adjustment amplitude of the basic test signal is reduced. In practice, the range of the preset first fluctuation range is generally selected to be [19dB,21dB ], the range of the preset second fluctuation range is generally selected to be [24dB,26dB ], when the selected value of the preset second fluctuation range is smaller than 24dB, the corresponding influencing factors will change, for example, due to the fact that the connection of the access circuit is required to be too much, the error occurs in part of the connection, the voltage is larger due to the fact that some ports which should not be accessed are accessed, the heat of the connection line is further increased, the resistance of the connection line is increased, the performance of some connection line is reduced, when the performance of some connection line is reduced, the variance of the electrical connector 4 during electrical parameter detection correspondingly changes, the power line is loosened due to the fact that the signal generator 1 is subjected to multiple tests, the intensity of the output test signal is unstable, the voltage instability of the signal generator 1 is higher than that the situation that the connection line is required to be accessed is too much, the error occurs due to the connection of part of the connection circuit, the voltage is larger due to the fact that some ports which should not be accessed are accessed, and the heat of the connection line is increased, the performance of the connection line is reduced, and the performance of the connection line is caused to be larger.
Preferably, the first fluctuation amplitude q1=20 dB is preset, and the second fluctuation amplitude q2=25 dB is preset.
Specifically, the fluctuation range of the insertion loss of the standard test signal is denoted as Q, the difference between the fluctuation range of the insertion loss of the standard test signal and the preset second fluctuation range is denoted as Δq, and Δq=q-Q2 is set.
Specifically, the insertion loss of the standard test signal means that the power line is loosened during the transmission of the standard test signal due to the signal generator 1 being subjected to a plurality of tests, resulting in unstable intensity of the output test signal and thus unstable voltage of the signal generator 1, thereby resulting in an amount of signal power loss occurring when the standard test signal is inserted into the electrical connector 4.
In implementation, the system judges the stability of the electrical performance test by setting the preset first fluctuation amplitude and the preset second fluctuation amplitude, reduces the influence of the reduction of the accuracy of the electrical performance test caused by inaccurate judgment of the stability of the electrical performance test, and further realizes the improvement of the stability of the electrical performance test.
Specifically, the calculation formula of the fluctuation amplitude of the insertion loss of the standard test signal is as follows:
Wherein F is the fluctuation amplitude of the insertion loss of the standard test signal, E1 is the maximum insertion loss of the test signal of a plurality of test processes, and E2 is the minimum insertion loss of the test signal of a plurality of test processes.
Specifically, the control module is connected with the detection module, and is used for primarily determining that the stability of the electrical parameter acquisition is not in accordance with the requirement when the fluctuation range of the insertion loss of the standard test signal only meets the first fluctuation range condition, and secondarily determining whether the stability of the electrical parameter acquisition is in accordance with the requirement according to the variance of the electrical parameter detection of the electrical connector 4.
Specifically, the control module is connected with the signal generator 1 and is used for reducing the single maximum adjustment amplitude of the basic test signal when the fluctuation amplitude of the insertion loss of the standard test signal only meets the second fluctuation amplitude condition;
the single maximum adjustment amplitude of the reduced basic test signal is determined by the difference value between the fluctuation amplitude of the insertion loss of the standard test signal and the preset second fluctuation amplitude.
Specifically, the specific process of determining the single maximum adjustment amplitude of the basic test signal by the difference value between the fluctuation amplitude of the insertion loss of the standard test signal and the preset second fluctuation amplitude is as follows:
If the delta Q is less than or equal to delta Q0, the control module uses a preset second adjustment amplitude adjustment coefficient to adjust the single maximum adjustment amplitude of the basic test signal to a first adjustment amplitude;
If DeltaQ > DeltaQ0, the control module uses a preset first adjustment amplitude adjustment coefficient to adjust the single maximum adjustment amplitude of the basic test signal to a second adjustment amplitude;
The preset first adjustment amplitude adjustment coefficient is smaller than the preset second adjustment amplitude adjustment coefficient.
Preferably, the fluctuation amplitude difference Δq0=5 dB is preset.
Preferably, the first adjustment amplitude adjustment coefficient α1=0.8 is preset, and the second adjustment amplitude adjustment coefficient α2=0.9 is preset.
Specifically, the single maximum adjustment amplitude of the basic test signal is denoted as V, the single maximum adjustment amplitude of the reduced basic test signal is denoted as V ', V' =v×αi is set, where αi is a preset i-th adjustment amplitude adjustment coefficient, and i=1, 2 is set.
Specifically, the decreasing amplitude of the single maximum adjustment amplitude V for the basic test signal is determined by the i-th adjustment amplitude coefficient αi.
Specifically, the meaning of the single maximum adjustment amplitude of the basic test signal is the maximum value of the amplitude variation of the basic test signal in a unit time, and by reducing the single maximum adjustment amplitude of the basic test signal, the influence of the sudden change of the amplitude of the basic test signal caused by the occurrence of a problem of the signal generator 1 on the damage of the interface of the electrical connector 4 is reduced.
In implementation, the system adjusts the single maximum adjustment amplitude of the basic test signal by setting the preset first fluctuation amplitude and the preset second fluctuation amplitude, and the output test signal intensity is unstable due to the fact that the power line is loosened caused by the fact that the signal generator 1 is tested for multiple times, so that the voltage of the signal generator 1 is unstable, and the influence of damage to an interface of the electric connector 4 due to abrupt change of the signal amplitude is reduced by reducing the single maximum adjustment amplitude of the basic test signal, so that the stability of the electric performance test is further improved.
Specifically, the control module is connected with the detection module, and is configured to secondarily determine that the stability of the electrical parameter acquisition is not required when the variance of the electrical parameter detection of the electrical connector 4 meets a first variance condition or a second variance condition, primarily determine that the signal interference received in the test process is not required when the variance of the electrical parameter detection of the electrical connector 4 only meets the second variance condition, and secondarily determine whether the signal interference received in the test process is required according to the waveform integrity of the standard test signal;
the control module is connected with the filter 2 and is used for reducing the test voltage of the electric connector 4 when the variance of the electric parameter detection of the electric connector 4 only meets the first variance condition;
The first variance condition is that the variance of the electrical connector 4 during electrical parameter detection is larger than a preset first variance and smaller than or equal to a preset second variance; the second variance condition is that the variance of the electrical parameter detection of the electrical connector 4 is larger than a preset second variance.
It can be understood that three intervals corresponding to the preset first variance and the preset second variance correspond to three situations respectively, wherein the first situation is that the variance of the electrical connector 4 during electrical parameter detection is smaller than or equal to the preset first variance, and the stability of electrical parameter acquisition is judged to be in accordance with the requirement for the second time; the second condition is that the variance of the electrical parameter of the electrical connector 4 during detection is larger than the preset first variance and smaller than or equal to the preset second variance, and the test voltage of the electrical connector 4 is reduced; the third condition is that the variance of the electrical connector 4 during electrical parameter detection is larger than the preset second variance, the signal interference received in the test process is primarily determined to be inconsistent with the requirement, and whether the signal interference received in the test process is consistent with the requirement is secondarily determined according to the waveform integrity of the standard test signal. In practice, the range of the preset first variance is generally selected to be [1s 2,2s2 ], the range of the preset second variance is generally selected to be [2.1s 2,3s2 ], when the selected value of the preset first variance exceeds 2s 2, the corresponding influencing factors change, for example, electromagnetic radiation is generated in the high-frequency signal transmission process due to high requirements of the millimeter wave connector on the signal frequency, so that test signals are interfered, waveforms are broken, the accuracy of the test process is reduced, when the waveforms are broken, the waveform integrity of the standard test signals correspondingly changes, due to the fact that the need of connecting circuits is too much, part of the connections possibly have errors, the connection ports which are not connected are connected lead to larger voltage, heat of the connection wires is increased, the resistance of the connection wires is increased, the performance of the connection wires is reduced, and the influence caused by the fact that the performance of the connection wires is reduced is greater than that the condition that the millimeter wave connector has high requirements on the signal frequency, electromagnetic radiation is generated in the high-frequency signal transmission process, the test signals are interfered, the waveforms are broken, and the accuracy of the test process is reduced is greatly influenced.
Preferably, the first variance p1=1.5s 2 is preset and the second variance p2=2.5s 2 is preset.
Specifically, the variance at the time of electrical parameter detection of the electrical connector 4 is denoted as P, the difference between the variance at the time of electrical parameter detection of the electrical connector 4 and the preset first variance is denoted as Δp, and Δp=p-P1 is set.
Specifically, the variance of the electrical parameter of the electrical connector 4 during the electrical parameter detection is the variance of the electrical parameter of the electrical connector 4 during several test periods, and the method for calculating the variance of the electrical parameter of the electrical connector 4 during the electrical parameter detection is a conventional technical means known to those skilled in the art, so the process of calculating the variance of the electrical parameter of the electrical connector 4 during the electrical parameter detection will not be described herein.
In implementation, the system of the invention carries out secondary judgment on the stability of the electrical parameter acquisition by setting the preset first variance and the preset second variance, thereby reducing the influence of the stability reduction of the electrical performance test caused by inaccurate secondary judgment on the stability of the electrical parameter acquisition and further realizing the improvement of the stability of the electrical performance test.
Specifically, the test voltage of the electric connector 4 after the reduction is determined by the difference between the variance at the time of the electric parameter detection of the electric connector 4 and the preset first variance.
Specifically, the specific process of determining the test voltage of the electrical connector 4 by the difference between the variance of the electrical parameter detection of the electrical connector 4 and the preset first variance is as follows:
if delta P is less than or equal to delta P0, the control module uses a preset second voltage adjustment coefficient to adjust the test voltage of the electrical connector 4 to a first voltage;
if DeltaP > DeltaP0, the control module adjusts the test voltage of the electrical connector 4 to a second voltage by using a preset first voltage adjustment coefficient;
Wherein the preset first voltage adjustment coefficient is smaller than the second voltage adjustment coefficient.
Preferably, the variance difference Δp0=2s 2 is preset.
Preferably, the first voltage adjustment coefficient β1=0.7 is preset, and the second voltage adjustment coefficient β2=0.8 is preset.
Specifically, the test voltage of the electrical connector 4 is denoted as H, the reduced test voltage of the electrical connector 4 is denoted as H ', H' =h×βj is set, where βj is a preset jth voltage adjustment coefficient, and j=1, 2 is set.
Specifically, the magnitude of the decrease in the test voltage H to the electrical connector 4 is determined by the jth voltage adjustment coefficient βj.
In implementation, the system adjusts the test voltage of the electric connector 4 by setting the preset first variance and the preset second variance, and because too many circuits need to be connected, the error can occur in part of connection, the voltage is larger due to the connection of certain ports which should not be connected, and the heat of the connecting wires is further increased, so that the resistance of the connecting wires is increased, the performance of certain connecting wires is reduced, the influence of inaccurate detection due to the too high heat of the connecting wires is reduced by reducing the test voltage of the electric connector 4, and the stability of the electric performance test is further improved.
Specifically, the control module is respectively connected with the oscilloscope 5 and the filter 2, and is configured to secondarily determine that signal interference received in the testing process does not meet the requirement when the waveform integrity of the standard test signal is smaller than the preset integrity, and increase the center frequency of the filter 2.
It can be understood that the preset integrity corresponds to two intervals, respectively corresponds to two conditions, and the first condition is that the waveform integrity of the standard test signal is smaller than the preset integrity, and increases the center frequency of the filter 2; the second condition is that the waveform integrity of the standard test signal is greater than or equal to the preset integrity, and the signal interference suffered by the secondary judgment test process meets the requirements. In practice, the preset integrity is generally selected in the range of [0,8,0.9], and when the preset integrity is less than 0.9, the corresponding influencing factors will change, for example, electromagnetic radiation is generated in the high-frequency signal transmission process due to the high requirement of the millimeter wave connector on the signal frequency, so that the test signal is interfered, the waveform is broken, and the accuracy of the test process is reduced.
Preferably, the preset integrity y0=0.85.
Specifically, the waveform integrity of the standard test signal is denoted as Y, the difference between the preset integrity and the waveform integrity of the standard test signal is denoted as Δy, and Δy=y0-Y is set.
In implementation, the system of the invention carries out secondary judgment on the signal interference received in the test process by setting the preset integrity, thereby reducing the influence of the reduction of the stability of the electrical performance test caused by inaccurate secondary judgment on the signal interference received in the test process and further realizing the improvement of the stability of the electrical performance test.
Specifically, the calculation formula of the waveform integrity of the standard test signal is as follows:
Wherein Y is the waveform integrity of the standard test signal, S1 is the difference between the total waveform length of the standard test signal and the disconnected waveform length, and S2 is the total waveform length of the standard test signal.
Specifically, the center frequency of the increased filter 2 is determined by the difference between the preset integrity and the waveform integrity of the standard test signal.
Specifically, the specific process of determining the center frequency of the filter 2 by the difference between the preset integrity and the waveform integrity of the standard test signal is:
if delta Y is less than or equal to delta Y0, the control module uses a preset first frequency adjustment coefficient to adjust the center frequency of the filter 2 to a first frequency;
if DeltaY > DeltaY0, the control module uses a preset second frequency adjustment coefficient to adjust the center frequency of the filter 2 to a second frequency;
wherein the preset first frequency adjustment coefficient is smaller than the preset second frequency adjustment coefficient.
Preferably, the preset integrity difference Δy0=0.1.
Preferably, the first frequency adjustment coefficient γ1=1.2 is preset, and the second frequency adjustment coefficient γ2=1.4 is preset.
Specifically, the center frequency of the filter 2 is denoted as L, the center frequency of the increased filter 2 is denoted as L ', L' =l×γm is set, where γm is a preset m frequency adjustment coefficient, and m=1, 2 is set.
Specifically, the increase amplitude of the center frequency L of the filter 2 is determined by the mth frequency adjustment coefficient γm.
In implementation, the system adjusts the center frequency of the filter 2 by setting the preset integrity, and electromagnetic radiation is generated in the high-frequency signal transmission process due to the fact that the millimeter wave connector has high requirements on the signal frequency, so that a test signal is interfered, the waveform is broken, the accuracy of the test process is lowered, the influence of electromagnetic interference on the test signal transmission is reduced by increasing the center frequency of the filter 2, and the stability of the electrical performance test is further improved.
Specifically, the control module is respectively connected with the oscilloscope 5 and the filter 2, and is configured to determine that the effectiveness of filtering is not satisfactory when the waveform distortion degree of the standard test signal is greater than the preset distortion degree, and reduce the center frequency of the increased filter 2.
It can be understood that the two intervals corresponding to the preset distortion degree correspond to two situations respectively, the first situation is that the waveform distortion degree of the standard test signal is smaller than or equal to the preset distortion degree, and the effectiveness of the filtering is judged to meet the requirement; the second case is that the waveform distortion degree of the standard test signal is greater than the preset distortion degree, and the center frequency of the filter 2 after the increase is reduced. In practice, the preset distortion is generally selected in the range of [0.1,0.2], and when the preset distortion exceeds 0.2, the corresponding influencing factors will change, for example, the current in the high-frequency part is filtered or attenuated due to the overlarge center frequency of the filter 2, resulting in distortion of the test signal and deformation of the waveform.
Preferably, the preset distortion r0=0.15.
Specifically, the waveform distortion degree of the standard test signal is denoted as R, the difference between the waveform distortion degree of the standard test signal and the preset distortion degree is denoted as Δr, and Δr=r—r0 is set.
Specifically, the calculation formula of the waveform distortion degree of the standard test signal is:
wherein, R is the waveform distortion degree of the standard test signal, T1 is the actual amplitude of the standard test signal, and T2 is the standard amplitude of the test signal.
Specifically, the standard waveform amplitude of the test signal means the amplitude of the waveform output without filtering or attenuating the current of the high frequency portion in the test signal.
In implementation, the system judges the validity of the filtering by setting the preset distortion degree, reduces the influence of the stability reduction of the electrical performance test caused by inaccurate judgment of the validity of the filtering, and further realizes the improvement of the stability of the electrical performance test.
Specifically, the center frequency of the reduced filter 2 is determined by the difference between the waveform distortion degree of the standard test signal and the preset distortion degree.
Specifically, the process of determining the center frequency of the filter 2 from the difference between the waveform distortion degree of the standard test signal and the preset distortion degree is:
If DeltaR is less than or equal to DeltaR 0, the control module secondarily adjusts the center frequency of the filter 2 to a third frequency by using a preset fourth frequency secondary adjustment coefficient;
if DeltaR > DeltaR0, the control module uses a preset third frequency secondary adjustment coefficient to secondarily adjust the center frequency of the filter 2 to a fourth frequency;
The preset third frequency secondary adjustment coefficient is smaller than the preset fourth frequency secondary adjustment coefficient.
Preferably, the distortion difference Δr0=0.05 is preset.
Preferably, the third frequency secondary adjustment coefficient γ3=0.75 is preset, and the fourth frequency secondary adjustment coefficient γ4=0.85 is preset.
Specifically, the center frequency of the increased filter 2 is denoted by L ", L" =l' ×γw is set, where γw is a preset w frequency secondary adjustment coefficient, and w=3, 4 is set.
Specifically, the magnitude of increase to the center frequency L' of the filter 2 is determined by the preset w-frequency secondary adjustment coefficient γw.
In implementation, the system adjusts the center frequency of the filter 2 by setting the preset distortion degree, and the current of a high-frequency part is filtered or attenuated due to the overlarge center frequency of the filter 2, so that a test signal is distorted, the waveform is deformed, the influence of the reduced accuracy of a test result due to the overlarge filter frequency is reduced by reducing the center frequency of the filter 2, and the stability of the electrical performance test is further improved.
An electrical connector 4, comprising:
A housing 6;
An insulator 8 provided inside the housing 6 to prevent the standard test signal from leaking;
A central pin 7, which is arranged inside the insulator 8, for transmitting standard test signals.
Specifically, the material of the center pin is a metal material.
Optionally, the material of the central needle can be copper alloy, stainless steel or tungsten.
Alternatively, the material of the insulator 8 may be polytetrafluoroethylene, polyimide, or polyether ketone.
Alternatively, the material of the casing 6 may be copper alloy, aluminum alloy, or stainless steel.
Specifically, the housing 6 is covered on the surface of the insulator 8, and the insulator 8 is covered on the surface of the center pin 7.
Example 1
In this embodiment 1, the electrical performance test system of the electrical connector is used to detect the electrical performance of the millimeter wave connector, and the control module adjusts the single maximum adjustment amplitude of the basic test signal according to the difference between the fluctuation amplitude of the insertion loss of the standard test signal and the preset second fluctuation amplitude, where the preset first adjustment amplitude adjustment coefficient is denoted as α1, the preset second adjustment amplitude adjustment coefficient is denoted as α2, the single maximum adjustment amplitude of the basic test signal is denoted as V, where 0 < α1 < α2 < 1, α1=0.8, α2=0.9, Δq0=5db, v=6v, q=31db, q2=25, and Δq=q-Q2.
In embodiment 1, Δq=6db is obtained, and the control module determines Δq > - Δq0 and adjusts the single maximum adjustment amplitude of the basic test signal to the second adjustment amplitude by using the preset first adjustment amplitude adjustment coefficient, so as to calculate V' =6v×0.8=4.8v.
Thus far, the technical solution of the present invention has been described in connection with the preferred embodiments shown in the drawings, but it is easily understood by those skilled in the art that the scope of protection of the present invention is not limited to these specific embodiments. Equivalent modifications and substitutions for related technical features may be made by those skilled in the art without departing from the principles of the present invention, and such modifications and substitutions will be within the scope of the present invention.
Claims (5)
1. An electrical performance testing system for an electrical connector, comprising:
the signal generation module is used for providing a test signal conforming to a test standard, and comprises a signal generator used for generating a basic test signal and a filter connected with the signal generator and used for filtering the basic test signal to output the standard test signal;
The detection module is connected with the signal generation module and used for detecting the electrical performance of the electrical connector, and comprises a voltage tester connected with the signal generator and used for detecting the test voltage of the electrical connector and an oscilloscope connected with a center needle in the electrical connector and used for displaying the waveform of a standard test signal;
The control module is respectively connected with the signal generation module and the detection module and is used for adjusting the single maximum adjustment amplitude of the basic test signal when the stability of the electrical performance test is judged to be unsatisfactory according to the fluctuation amplitude of the insertion loss of the standard test signal, or primarily judging that the stability of the electrical parameter acquisition is not satisfactory and secondarily judging the stability of the electrical parameter acquisition according to the variance of the electrical parameter detection of the electrical connector;
and adjusting the test voltage of the electrical connector when the stability of the electrical parameter acquisition is secondarily determined to be unsatisfactory, or adjusting the center frequency of the filter according to the waveform integrity of the standard test signal;
The center frequency of the filter is secondarily adjusted according to the waveform distortion degree of the standard test signal under the preset working condition;
The filter filters the basic test signal according to the adjusted center frequency;
the control module is connected with the detection module and is used for calculating the fluctuation amplitude of the insertion loss of the standard test signal according to the insertion loss of the test signal in a plurality of test processes and judging that the stability of the electrical performance test is not in accordance with the requirement when the fluctuation amplitude of the insertion loss of the standard test signal meets the first fluctuation amplitude condition or the second fluctuation amplitude condition;
the first fluctuation amplitude condition is that the fluctuation amplitude of the insertion loss of the standard test signal is larger than a preset first fluctuation amplitude and smaller than or equal to a preset second fluctuation amplitude; the second fluctuation amplitude condition is that the fluctuation amplitude of the insertion loss of the standard test signal is larger than a preset second fluctuation amplitude;
The control module is connected with the detection module and is used for primarily judging that the stability of the electrical parameter acquisition is not in accordance with the requirement when the fluctuation amplitude of the insertion loss of the standard test signal only meets the first fluctuation amplitude condition, and secondarily judging whether the stability of the electrical parameter acquisition is in accordance with the requirement according to the variance of the electrical parameter detection of the electrical connector;
The control module is connected with the signal generator and is used for reducing the single maximum adjustment amplitude of the basic test signal when the fluctuation amplitude of the standard test signal insertion loss only meets the second fluctuation amplitude condition;
The single maximum adjustment amplitude of the reduced basic test signal is determined by the difference value between the fluctuation amplitude of the standard test signal insertion loss and the preset second fluctuation amplitude;
the control module is connected with the detection module and is used for secondarily judging that the stability of the electrical parameter acquisition is not in accordance with the requirement when the variance of the electrical parameter detection of the electrical connector meets the first variance condition or the second variance condition, primarily judging that the signal interference received in the test process is not in accordance with the requirement when the variance of the electrical parameter detection of the electrical connector only meets the second variance condition, and secondarily judging whether the signal interference received in the test process is in accordance with the requirement according to the waveform integrity of the standard test signal;
the control module is connected with the filter and is used for reducing the test voltage of the electric connector when the variance of the electric parameter detection of the electric connector only meets the first variance condition;
the reduced test voltage of the electric connector is determined by the difference value between the variance of the electric connector during electric parameter detection and the preset first variance;
The first variance condition is that the variance of the electric connector during electric parameter detection is larger than a preset first variance and smaller than or equal to a preset second variance; the second variance condition is that the variance of the electric connector during electric parameter detection is larger than a preset second variance;
the control module is respectively connected with the oscilloscope and the filter and is used for secondarily judging that signal interference received in the test process is not in accordance with the requirement when the waveform integrity of the standard test signal is smaller than the preset integrity and increasing the center frequency of the filter.
2. The electrical performance testing system of an electrical connector of claim 1, wherein the standard test signal has a waveform integrity calculated by the formula:
；
Wherein Y is the waveform integrity of the standard test signal, S1 is the difference between the total waveform length of the standard test signal and the disconnected waveform length, and S2 is the total waveform length of the standard test signal.
3. The electrical performance testing system of an electrical connector of claim 2, wherein the center frequency of the increased filter is determined by a difference between a preset integrity and a waveform integrity of a standard test signal.
4. The electrical performance testing system of the electrical connector according to claim 3, wherein the control module is respectively connected with the oscilloscope and the filter, and is configured to determine that the validity of the filtering is not satisfactory when the waveform distortion degree of the standard test signal is greater than a preset distortion degree, and reduce the center frequency of the increased filter;
The center frequency of the reduced filter is determined by the difference between the waveform distortion degree of the standard test signal and the preset distortion degree.
5. An electrical connector for use in an electrical performance testing system for an electrical connector according to any one of claims 1-4, comprising:
A housing;
An insulator provided inside the housing to prevent the standard test signal from leaking;
And the center pin is arranged inside the insulator and is used for transmitting standard test signals.
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| CN116908603B (en) * | 2023-09-14 | 2023-11-14 | 深圳市艾联特电子科技有限公司 | Reliability detection method and system based on connector |
| CN117665335B (en) * | 2023-12-08 | 2024-05-14 | 广东诺帝恩智控机器人有限公司 | Testing system and method for hand-operated pulse generator |
| CN117909861A (en) * | 2023-12-21 | 2024-04-19 | 九江职业技术学院 | Filter fault detection system based on interval analysis |
| CN117760467A (en) * | 2023-12-27 | 2024-03-26 | 上海傲世控制科技股份有限公司 | Static performance testing device of fiber optic gyroscope |
| CN118131087A (en) * | 2024-04-15 | 2024-06-04 | 深圳市炜昕电子科技有限公司 | Electronic connector testing method and device |
| CN118138153B (en) * | 2024-05-08 | 2024-07-02 | 嘉兴翼波电子有限公司 | Online fault monitoring device and method for radio frequency cable |
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| CN116429232A (en) * | 2023-03-27 | 2023-07-14 | 中国船舶集团有限公司第七一五研究所 | System and method for testing insertion loss of array elements of optical fiber hydrophone array |
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