CN118242998B - Thickness testing device and thickness measuring method for blown film - Google Patents
Thickness testing device and thickness measuring method for blown film Download PDFInfo
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- CN118242998B CN118242998B CN202410660431.4A CN202410660431A CN118242998B CN 118242998 B CN118242998 B CN 118242998B CN 202410660431 A CN202410660431 A CN 202410660431A CN 118242998 B CN118242998 B CN 118242998B
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- 238000012360 testing method Methods 0.000 title claims abstract description 19
- 238000000034 method Methods 0.000 title claims description 19
- 238000001816 cooling Methods 0.000 claims description 17
- 239000000498 cooling water Substances 0.000 claims description 10
- 238000013016 damping Methods 0.000 claims description 3
- 230000002035 prolonged effect Effects 0.000 claims description 3
- 238000005516 engineering process Methods 0.000 abstract description 5
- 238000001514 detection method Methods 0.000 abstract description 2
- 239000010408 film Substances 0.000 description 208
- 238000005259 measurement Methods 0.000 description 11
- 239000000463 material Substances 0.000 description 6
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 4
- 238000010521 absorption reaction Methods 0.000 description 3
- 230000000712 assembly Effects 0.000 description 2
- 238000000429 assembly Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000002329 infrared spectrum Methods 0.000 description 2
- 230000001788 irregular Effects 0.000 description 2
- 239000012785 packaging film Substances 0.000 description 2
- 229920006280 packaging film Polymers 0.000 description 2
- 238000004806 packaging method and process Methods 0.000 description 2
- 230000000149 penetrating effect Effects 0.000 description 2
- 239000002985 plastic film Substances 0.000 description 2
- 229920006255 plastic film Polymers 0.000 description 2
- 230000035939 shock Effects 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 238000007405 data analysis Methods 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 238000005137 deposition process Methods 0.000 description 1
- 238000001914 filtration Methods 0.000 description 1
- 230000031700 light absorption Effects 0.000 description 1
- 238000000691 measurement method Methods 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
Abstract
The invention discloses a thickness testing device for a blown film, which relates to the technical field of thickness detection of blown films and comprises an upper bracket and a lower bracket, wherein a gap for the film to pass through is reserved between the upper bracket and the lower bracket. The invention sets a rotating end and an infrared light-emitting piece connected with the rotating end on the upper bracket, the infrared light-emitting piece sweeps the film in a swinging movement mode, and the infrared sensor on the lower bracket slides left and right along with the swinging of the infrared light-emitting piece to receive infrared light transmitted by the infrared light-emitting piece. The infrared sensor unit receives the infrared light intensity change according to the infrared light path change of the transmitted film so as to judge whether the film is wrinkled, so that the problem that the film wrinkling is difficult to be measured by the existing infrared thickness measuring technology after the film wrinkling is not overlapped in the prior art is solved.
Description
Technical Field
The invention relates to the technical field of blown film thickness detection, in particular to a blown film thickness testing device and a film thickness measuring method.
Background
In addition to proper film materials and deposition processes, the thickness of the film during deposition should be precisely controlled during the film preparation process. The thickness of the film determines the mechanical property of the film packaging articles, and when packaging articles of different types and different materials, the requirements on the packaging film are different, and besides the requirements on the materials, the thickness of the packaging film is another important index for measuring whether the film is suitable for the materials.
At present, the thickness test of a film is mostly based on the infrared thickness measurement principle, as shown in fig. 1, an infrared light source 1 is arranged on a rack, an infrared sensor 2 is arranged under the infrared light source, a film 3 passes through a gap of the rack, modulated infrared light passes through the film 3 and is received by the infrared sensor 2, the infrared sensor 2 receives corresponding signals, the signals are input into a collection card after hardware filtration, and the collection card is used for carrying out data analysis and final thickness result display after collection and AD conversion, and then the collection card is sent into a computer.
In the above prior art, the film 3 passes through the gap of the frame by the acting force of the traction roller, and the wrinkling problem of the traction film 3 occurs due to the angle position and the traction speed of the traction roller, if the wrinkling film is not overlapped, the thickness of the wrinkling film is unchanged and is difficult to detect by infrared thickness measurement, because the thickness of the plastic film made of the same material is the same, the molecular groups are the same, and the infrared absorption capability is the same. Only plastic films of the same material have different thicknesses and contain different numbers of molecular groups, and the more the groups are contained, the stronger the infrared light absorption capacity is, so that the formed infrared spectrum can be differentiated to detect the thickness change of the films.
Disclosure of Invention
One of the purposes of the invention is to solve the problem that the film wrinkling is difficult to be measured by the existing infrared thickness measurement technology after the film wrinkling is not overlapped in the prior art.
The second objective of the present invention is to provide a thin film thickness measuring method.
In order to achieve one of the above purposes, the present invention adopts the following technical scheme: the thickness testing device for the blown film comprises an upper support and a lower support, wherein a gap for the film to pass through is reserved between the upper support and the lower support, a rotating end is arranged on the upper support, an infrared luminous piece is fixed at the rotating end, and the infrared luminous piece faces downwards.
The lower support is provided with a chute, and the chute is in sliding connection with the infrared sensing unit.
The infrared sensing unit is located under the infrared light emitting piece, the infrared light emitting piece swings left and right in a reciprocating mode through the rotary motion of the rotary end, and the infrared sensing unit moves left and right in a reciprocating mode along with the swing of the infrared light emitting piece, so that the infrared sensing unit receives infrared light emitted by the infrared light emitting piece in the swing process of the infrared light emitting piece.
In the above technical scheme, when the film passes through the gap between the upper bracket and the lower bracket, the embodiment of the invention transmits infrared light to the film below through the infrared light emitting part of the upper bracket, and after the infrared light passes through the film, the infrared light passing through the film is received through the infrared sensing unit of the lower bracket.
And then the infrared light-emitting piece is driven to rotate through the rotating end of the upper bracket, so that the infrared light-emitting piece scans the film in a mode of reciprocating left and right, and the infrared sensing unit moves in a reciprocating left and right mode along with the swing of the infrared light-emitting piece, so that the infrared sensing unit receives infrared light emitted by the infrared light-emitting piece in the swing process of the infrared light-emitting piece.
When the film is flat, after the infrared light emitting piece swings leftwards or rightwards from the angle position perpendicular to the film, the path of the film through which the infrared light emitted by the infrared light emitting piece passes is regularly prolonged, and at the moment, the intensity of the infrared light received by the infrared sensor unit and passing through the film is regularly reduced.
When the film is wrinkled, after the infrared light emitting piece swings leftwards or rightwards from the angle position perpendicular to the film, the path of the film through which infrared light emitted by the infrared light emitting piece passes changes irregularly, and at the moment, the intensity of infrared light received by the infrared sensing unit and passing through the film also changes irregularly.
Based on the same swinging angle of the infrared light emitting piece, comparing the infrared light intensity received by the infrared sensing unit when the film is flat, and judging whether the film is wrinkled or not.
Further, in the embodiment of the invention, an infrared light emitting element and an infrared sensor unit are paired to form a group of film thickness measuring assemblies, and the blown film thickness testing device is provided with five groups of film thickness measuring assemblies.
Further, in the embodiment of the present invention, a rotating motor is disposed in the upper bracket, and the rotating motor is connected to the rotating end, and the rotating end is driven by the rotating motor to perform a rotating motion.
The sliding chute is internally provided with a telescopic structure, the telescopic mechanism is connected with the sensor, and the telescopic mechanism drives the sensor to reciprocate left and right.
Further, in an embodiment of the present invention, the thickness testing device for blown film further includes a main frame, two sides of the main frame are provided with supporting frames, the upper frame is fixed between the supporting frames, and the lower frame is slidably disposed between the supporting frames.
Still further, in an embodiment of the present invention, the main frame is provided with a lifter, a lifting end of the lifter is fixed to the bottom of the lower frame, and lifting of the lower frame is controlled by the lifter. So as to adjust the infrared sensor unit on the lower bracket to receive the infrared light.
Further, in the embodiment of the present invention, the front and rear ends of the upper bracket are respectively provided with a light shielding plate, the light shielding plates extend downward to the position of the lower bracket, and the light shielding plates block external light from entering the gap between the upper bracket and the lower bracket.
When the film passes through the gaps of the upper bracket and the lower bracket, the light shielding plates at the front end and the rear end of the upper bracket block external light from entering the gaps, so that the interference of the external light on infrared light emitted by the infrared light emitting piece is improved, and the thickness measurement accuracy of the film is improved.
Further, in an embodiment of the present invention, each of the front and rear directions of the lower bracket is provided with a film roller, and the film roller is located between the light shielding plate and the lower bracket.
Before the film enters the gap, the film is lapped on the film roller at the left side of the lower bracket from bottom to top, then passes through the gap between the upper bracket and the lower bracket from front to back, is lapped on the film roller at the right side of the lower bracket, and moves out of the gap from top to bottom.
Still further, in an embodiment of the present invention, a cooling tube is disposed in the film roll, a bearing is disposed between the cooling tube and the film roll, a cavity is left between the cooling tube and the film roll, and a waterproof layer is disposed between the cavity and the bearing. The cooling pipe part positioned in the cavity is provided with a water inlet and a water outlet.
Cooling water is introduced into the inner cavity of the film roll through the cooling pipe in the film roll, and the cooling water in the cavity is used as damping buffer when the film is pulled, and meanwhile, the film is cooled, so that the film is hardened, and wrinkling of the film is improved.
The beneficial effects of the invention are as follows:
The invention sets a rotating end and an infrared light-emitting piece connected with the rotating end on the upper bracket, the infrared light-emitting piece sweeps the film in a swinging movement mode, and the infrared sensor on the lower bracket slides left and right along with the swinging of the infrared light-emitting piece to receive infrared light transmitted by the infrared light-emitting piece. The infrared sensor unit receives the infrared light intensity change according to the infrared light path change of the transmitted film so as to judge whether the film is wrinkled, so that the problem that the film wrinkling is difficult to be measured by the existing infrared thickness measuring technology after the film wrinkling is not overlapped in the prior art is solved.
In order to achieve the second purpose, the invention adopts the following technical scheme: a film thickness measuring method based on the thickness measuring apparatus for a blown film described in one of the above objects, comprising the steps of:
when the film passes through the gap between the upper bracket and the lower bracket, infrared light is emitted to the film downwards through the infrared light emitting part of the upper bracket, and after the infrared light penetrates through the film, the infrared light penetrating through the film is received through the infrared sensing unit of the lower bracket.
And then the infrared light-emitting piece is driven to rotate through the rotating end of the upper bracket, so that the infrared light-emitting piece scans the film in a mode of reciprocating left and right, and the infrared sensing unit moves in a reciprocating left and right mode along with the swing of the infrared light-emitting piece, so that the infrared sensing unit receives infrared light emitted by the infrared light-emitting piece in the swing process of the infrared light-emitting piece.
When the film is flat, after the infrared light emitting piece swings leftwards or rightwards from the angle position perpendicular to the film, the path of the film through which the infrared light emitted by the infrared light emitting piece passes is regularly prolonged, and at the moment, the intensity of the infrared light received by the infrared sensor unit and passing through the film is regularly reduced.
When the film is wrinkled, after the infrared light emitting piece swings leftwards or rightwards from the angle position perpendicular to the film, the path of the film through which infrared light emitted by the infrared light emitting piece passes changes irregularly, and at the moment, the intensity of infrared light received by the infrared sensing unit and passing through the film also changes irregularly.
Based on the same swinging angle of the infrared light emitting piece, comparing the infrared light intensity received by the infrared sensing unit when the film is flat, and judging whether the film is wrinkled or not.
Further, in the embodiment of the invention, when the film passes through the gap between the upper bracket and the lower bracket, the light shielding plates at the front end and the rear end of the upper bracket block external light from entering the gap, so that interference of the external light on infrared light emitted by the infrared light emitting part is improved, and thickness measurement accuracy of the film is improved.
Further, in the embodiment of the present invention, before the film enters the gap, the film is wound around the film roller on the left side of the lower bracket from bottom to top, then passes through the gap between the upper bracket and the lower bracket from top to bottom, is wound around the film roller on the right side of the lower bracket, and is removed from top to bottom.
Meanwhile, cooling water is introduced into the inner cavity of the film roll through the cooling pipe in the film roll, and the cooling water in the cavity is used as damping buffer when the film is pulled, and meanwhile, the film is cooled, so that the film is hardened, and wrinkling of the film is improved.
Drawings
Fig. 1 is a schematic diagram based on the infrared thickness measurement principle in the prior art.
FIG. 2 is a schematic view of a blown film thickness test apparatus according to an embodiment of the present invention.
FIG. 3 is a schematic diagram showing the thickness measurement effect of a normal film according to an embodiment of the present invention.
FIG. 4 is a schematic view showing the thickness measurement effect of a wrinkled film according to an embodiment of the present invention.
FIG. 5 is a schematic side view of a blown film thickness test apparatus according to an embodiment of the invention.
FIG. 6 is a schematic view of a film roll according to an embodiment of the present invention.
1. An infrared light source 2, an infrared sensor 3 and a film;
10. The device comprises an upper bracket, 11, a rotating end, 12, an infrared luminous piece, 13 and a light shielding plate;
20. the lower bracket, 21, the chute, 22, the infrared sensing unit;
30. a main frame, 31, a supporting frame, 32 and a lifter;
40. film roll 41, cooling tube 42, bearing 43, cavity 44, waterproof layer.
Detailed Description
In order to make the objects, technical solutions, and advantages of the present invention more apparent, the embodiments of the present invention will be further described in detail with reference to the accompanying drawings. It should be understood that the specific embodiments described herein are some, but not all, embodiments of the present invention, are intended to be illustrative only and not limiting of the embodiments of the present invention, and that all other embodiments obtained by persons of ordinary skill in the art without making any inventive effort are within the scope of the present invention.
In the description of the present invention, it should be noted that the terms "center," "middle," "upper," "lower," "left," "right," "inner," "outer," "top," "bottom," "side," "vertical," "horizontal," and the like indicate orientations or positional relationships based on the orientation or positional relationships shown in the drawings, merely to facilitate description of the present invention and simplify the description, and do not indicate or imply that the apparatus or elements referred to must have a specific orientation, be configured and operated in a specific orientation, and thus should not be construed as limiting the present invention. Furthermore, the terms "a," an, "" the first, "" the second, "" the third, "" the fourth, "" the fifth, "and the sixth" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance.
In the description of the present invention, it should be noted that, unless explicitly specified and limited otherwise, the terms "mounted," "connected," and "connected" are to be construed broadly, and may be either fixedly connected, detachably connected, or integrally connected, for example; can be mechanically or electrically connected; can be directly connected or indirectly connected through an intermediate medium, and can be communication between two elements. The specific meaning of the above terms in the present invention will be understood in specific cases by those of ordinary skill in the art.
For purposes of brevity and description, the principles of the embodiments are described primarily by reference to examples. In the following description, numerous specific details are set forth in order to provide a thorough understanding of the embodiments. However, it is apparent that. It will be apparent to one of ordinary skill in the art that the embodiments may be practiced without limitation to these specific details. In some instances, well known film thickness measurement methods and structures have not been described in detail to avoid unnecessarily obscuring such embodiments. In addition, all embodiments may be used in combination with each other.
Example 1
The drawings of the specification are taken as the content of the specification, and the structural shapes, connection relationships, coordination relationships and positional relationships which can be obtained unambiguously in the drawings of the specification are understood as the content of the specification.
The thickness testing device for the blown film comprises an upper bracket 10 and a lower bracket 20, wherein a gap for the film 3 to pass through is reserved between the upper bracket 10 and the lower bracket 20, a rotating end 11 is arranged on the upper bracket 10, an infrared luminous piece 12 is fixed on the rotating end 11, and the infrared luminous piece 12 faces downwards.
The lower bracket 20 is provided with a chute 21, and the chute 21 is in sliding connection with the infrared sensor unit 22.
The infrared sensing unit 22 is located directly under the infrared light emitting member 12, the infrared light emitting member 12 swings back and forth through the rotation of the rotation end 11, and the infrared sensing unit 22 follows the swing of the infrared light emitting member 12 to reciprocate back and forth, so that the infrared sensing unit 22 receives infrared light emitted from the infrared light emitting member 12 during the swing of the infrared light emitting member 12.
The method comprises the steps that when the film 3 passes through the gap between the upper bracket 10 and the lower bracket 20, infrared light is emitted to the film 3 below through the infrared light emitting piece 12 of the upper bracket 10, and after the infrared light passes through the film 3, the infrared light passing through the film 3 is received through the infrared sensor unit 22 of the lower bracket 20.
Then, the infrared light emitting element 12 is driven to rotate by the rotating end 11 of the upper bracket 10, so that the infrared light emitting element 12 sweeps the film 3 in a mode of swinging left and right in a reciprocating manner, and the infrared sensor unit 22 moves left and right in a reciprocating manner along with the swinging of the infrared light emitting element 12, so that the infrared sensor unit 22 receives infrared light emitted by the infrared light emitting element 12 in the swinging process of the infrared light emitting element 12.
As shown in fig. 3, when the film 3 is flat, after the infrared light emitting member 12 swings leftwards or rightwards from the angular position perpendicular to the film 3, the path of the film 3 through which the infrared light emitted from the infrared light emitting member 12 passes becomes long regularly, and at this time, the intensity of the infrared light received by the infrared sensor unit 22 and passing through the film 3 becomes low regularly.
As shown in fig. 4, when the film 3 is wrinkled, after the infrared light emitting member 12 swings leftwards or rightwards from the angular position perpendicular to the film 3, the path of the film 3 through which the infrared light emitted by the infrared light emitting member 12 passes changes irregularly, at this time, the intensity of the infrared light received by the infrared sensor unit 22 and passing through the film 3 also changes irregularly, and at this time, the film 3 is wrinkled.
The regularity means that the path length of the infrared light passing through the flat film 3 corresponds to the intensity of the received infrared light. As shown in fig. 3, taking a flat film 3 of 3.82mm as an example, the infrared light emitting member 12 emits infrared light vertically to the film 3, and the path length of the film 3 through which the infrared light passes is 3.82mm, and then the infrared light intensity received by the infrared sensor unit 22 should be coincident with the infrared light intensity of the path through the film 3 of 3.82 mm. After the infrared light emitting member 12 swings to the right by 13.93 degrees, the infrared light emitting member 12 emits infrared light to the film 3, and the path length of the film 3 through which the infrared light passes is 3.93mm, so that the intensity of the infrared light received by the infrared sensor unit 22 should be consistent with the intensity of the infrared light passing through the path of the film 3 of 3.93 mm.
As shown in fig. 4, taking the corrugated film 3 of 3.82mm as an example, the infrared light emitting member 12 emits infrared light vertically to the film 3, and the path length of the film 3 through which the infrared light passes is 3.82mm, and the infrared light intensity received by the infrared sensor unit 22 corresponds to the infrared light intensity of the path through which the film 3 of 3.82mm passes. And after the infrared light emitting member 12 swings to the right by 13.93 °, the path length of the infrared light emitted from the infrared light emitting member 12 to the film 3, through which the infrared light passes through the film 3, is 4.06mm, and at this time, the intensity of the infrared light received by the infrared sensor unit 22 does not conform to the intensity of the infrared light passing through the path of the film 3 of 3.93mm, so that the variation is irregular.
In the prior art, the change of the intensity of the infrared light transmitted through the film 3 received by the infrared sensing unit 22 can be understood by the peak of the infrared spectrum measurement displayed by the display device of the computing device, so that the explanation will not be expanded in detail.
The invention has the advantages that the upper bracket 10 is provided with the rotating end 11 and the infrared light emitting piece 12 connected with the rotating end 11, the infrared light emitting piece 12 sweeps the film 3 in a swinging motion mode, and the infrared sensing unit 22 on the lower bracket 20 slides left and right along with the swinging of the infrared light emitting piece 12 so as to receive the infrared light emitted by the infrared light emitting piece 12 and penetrating the film 3. The infrared sensor unit 22 receives the infrared light intensity change according to the infrared light path change transmitted through the film 3 to judge whether the film 3 is wrinkled, so as to solve the problem that the film 3 is wrinkled and is difficult to measure by the existing infrared thickness measuring technology after the film 3 is wrinkled and is not overlapped in the prior art.
Specifically, as shown in fig. 2, an infrared light emitting member 12 and an infrared sensor unit 22 are paired to form a set of film thickness measuring modules, and the blown film thickness measuring device is provided with five sets of film thickness measuring modules.
Specifically, a rotary motor (not shown) is disposed in the upper bracket 10, and the rotary motor is connected to the rotary end 11, and the rotary end 11 is driven by the rotary motor to perform a rotary motion.
The chute 21 is provided with a telescopic structure (not shown), which may be a cylinder, a hydraulic rod, a screw rod structure, or the like, and the present invention is not limited thereto. The telescopic mechanism is connected with the sensor and drives the sensor to reciprocate left and right.
Specifically, as shown in fig. 2, the thickness testing device for blown film further includes a main frame 30, two sides of the main frame 30 are provided with supporting frames 31, the upper frame 10 is fixed between the supporting frames 31, and the lower frame 20 is slidably disposed between the supporting frames 31.
More specifically, as shown in fig. 2, the main frame 30 is provided with a lifter 32, the lifting end of the lifter 32 is fixed to the bottom of the lower frame 20, and the lifting of the lower frame 20 is controlled by the lifter 32. So as to adjust the reception of infrared light by the infrared sensor unit 22 on the lower bracket 20.
Specifically, as shown in fig. 5, the front and rear ends of the upper bracket 10 are each provided with a light shielding plate 13, the light shielding plates 13 extend downward to the position of the lower bracket 20, and external light is blocked from being irradiated into the gap between the upper bracket 10 and the lower bracket 20 by the light shielding plates 13.
When the film 3 passes through the gap between the upper bracket 10 and the lower bracket 20, the light shielding plates 13 at the front end and the rear end of the upper bracket 10 block external light from entering the gap, so that interference of the external light on infrared light emitted by the infrared light emitting piece 12 is improved, and thickness measurement accuracy of the film 3 is improved.
More specifically, as shown in fig. 5, the lower brackets 20 are each provided with a film roller 40 in the front-rear direction, the film roller 40 being located between the light shielding plate 13 and the lower brackets 20.
Before the film 3 enters the gap, the film 3 is lapped on the film roller 40 at the left side of the lower bracket 20 from bottom to top, then passes through the gap between the upper bracket 10 and the lower bracket 20 from front to back, lapped on the film roller 40 at the right side of the lower bracket 20, and moves out of the gap from top to bottom.
More specifically, as shown in fig. 6, a cooling tube 41 is disposed in the film roll 40, a bearing 42 is disposed between the cooling tube 41 and the film roll 40, a cavity 43 is left between the cooling tube 41 and the film roll 40, and a waterproof layer 44 is disposed between the cavity 43 and the bearing 42. The cooling tube 41 portion located in the cavity 43 is provided with a water inlet and a water outlet.
Cooling water is introduced into the cavity 43 in the film roll 40 through the cooling pipe 41 in the film roll 40, and the cooling water in the cavity 43 serves as a shock absorption buffer when the film 3 is pulled, and simultaneously, the film 3 is cooled, so that the film 3 is hardened, and the wrinkling of the film 3 is improved.
Example 2
As shown in fig. 2, the film thickness measuring method is based on the blown film thickness measuring apparatus in the above-described embodiment 1, and comprises the steps of:
when the film 3 passes through the gap between the upper bracket 10 and the lower bracket 20, infrared light is emitted to the film 3 downward by the infrared light emitting member 12 of the upper bracket 10, and after the infrared light passes through the film 3, the infrared light passing through the film 3 is received by the infrared sensor unit 22 of the lower bracket 20.
Then, the infrared light emitting element 12 is driven to rotate by the rotating end 11 of the upper bracket 10, so that the infrared light emitting element 12 sweeps the film 3 in a mode of swinging left and right in a reciprocating manner, and the infrared sensor unit 22 moves left and right in a reciprocating manner along with the swinging of the infrared light emitting element 12, so that the infrared sensor unit 22 receives infrared light emitted by the infrared light emitting element 12 in the swinging process of the infrared light emitting element 12.
When the film 3 is flat, after the infrared light emitting member 12 swings leftwards or rightwards from the angular position perpendicular to the film 3, the path of the film 3 through which the infrared light emitted by the infrared light emitting member 12 passes becomes long regularly, and at this time, the intensity of the infrared light received by the infrared sensor unit 22 and passing through the film 3 becomes low regularly.
When the film 3 is wrinkled, after the infrared light emitting piece 12 swings leftwards or rightwards from the angle position of the vertical film 3, the path of the film 3 through which the infrared light emitted by the infrared light emitting piece 12 passes changes irregularly, and at the moment, the intensity of the infrared light received by the infrared sensor unit 22 and passing through the film 3 also changes irregularly;
based on the same swinging angle of the infrared light emitting member 12, the infrared light intensity received by the infrared sensor unit 22 when the film 3 is flat is compared, so as to determine whether the film 3 is wrinkled.
The regularity means that the path length of the infrared light passing through the flat film 3 corresponds to the intensity of the received infrared light. As shown in fig. 3, taking a flat film 3 of 3.82mm as an example, the infrared light emitting member 12 emits infrared light vertically to the film 3, and the path length of the film 3 through which the infrared light passes is 3.82mm, and then the infrared light intensity received by the infrared sensor unit 22 should be coincident with the infrared light intensity of the path through the film 3 of 3.82 mm. After the infrared light emitting member 12 swings to the right by 13.93 degrees, the infrared light emitting member 12 emits infrared light to the film 3, and the path length of the film 3 through which the infrared light passes is 3.93mm, so that the intensity of the infrared light received by the infrared sensor unit 22 should be consistent with the intensity of the infrared light passing through the path of the film 3 of 3.93 mm.
As shown in fig. 4, taking the corrugated film 3 of 3.82mm as an example, the infrared light emitting member 12 emits infrared light vertically to the film 3, and the path length of the film 3 through which the infrared light passes is 3.82mm, and the infrared light intensity received by the infrared sensor unit 22 corresponds to the infrared light intensity of the path through which the film 3 of 3.82mm passes. And after the infrared light emitting member 12 swings to the right by 13.93 °, the path length of the infrared light emitted from the infrared light emitting member 12 to the film 3, through which the infrared light passes through the film 3, is 4.06mm, and at this time, the intensity of the infrared light received by the infrared sensor unit 22 does not conform to the intensity of the infrared light passing through the path of the film 3 of 3.93mm, so that the variation is irregular.
The invention judges whether the film 3 is wrinkled according to the infrared light intensity change received by the infrared sensing unit 22 caused by the infrared light path change transmitted through the film 3, so as to solve the problem that the film 3 is difficult to measure the wrinkling of the film 3 by the existing infrared thickness measuring technology after the film 3 is wrinkled and is not overlapped in the prior art.
Specifically, in the above steps, as shown in fig. 5, when the film 3 passes through the gap between the upper bracket 10 and the lower bracket 20, the light shielding plates 13 at the front and rear ends of the upper bracket 10 block the external light from entering the gap, so as to improve the interference of the external light on the infrared light emitted by the infrared light emitting member 12 and improve the thickness measurement accuracy of the film 3.
More specifically, in the above steps, as shown in fig. 6, before the film 3 enters the gap, the film 3 is wound around the film roll 40 on the left side of the lower frame 20 from the bottom up, then passes through the gap between the upper frame 10 and the lower frame 20 from the front back, is wound around the film roll 40 on the right side of the lower frame 20, and is removed from the top down.
At the same time, cooling water is introduced into the cavity 43 in the film roll 40 through the cooling pipe 41 in the film roll 40, and the cooling water in the cavity 43 serves as a shock absorption buffer when the film 3 is pulled, and simultaneously cools the film 3, so that the film 3 is hardened, and wrinkling of the film 3 is improved.
While the foregoing describes the illustrative embodiments of the present invention so that those skilled in the art may understand the present invention, the present invention is not limited to the specific embodiments, and all inventive innovations utilizing the inventive concepts are herein within the scope of the present invention as defined and defined by the appended claims, as long as the various changes are within the spirit and scope of the present invention.
Claims (9)
1. The thickness testing device of the blown film comprises an upper bracket and a lower bracket, wherein a gap for the film to pass through is reserved between the upper bracket and the lower bracket;
The lower bracket is provided with a chute which is in sliding connection with the infrared sensing unit;
the infrared sensing unit is positioned right below the infrared light emitting piece, the infrared light emitting piece swings left and right in a reciprocating manner through the rotary motion of the rotary end, and the infrared sensing unit moves left and right in a reciprocating manner along with the swing of the infrared light emitting piece, so that the infrared sensing unit receives infrared light emitted by the infrared light emitting piece in the swing process of the infrared light emitting piece;
the upper bracket is provided with a rotating motor, the rotating motor is connected with the rotating end, and the rotating end is driven by the rotating motor to realize rotating motion;
The sliding chute is internally provided with a telescopic structure, the telescopic structure is connected with the infrared sensing unit, and the telescopic structure drives the infrared sensing unit to reciprocate left and right;
based on the same swinging angle of the infrared light emitting piece, comparing the infrared light intensity received by the infrared sensing unit when the film is flat, and judging whether the film is wrinkled or not.
2. The blown film thickness test apparatus according to claim 1, further comprising a main frame, wherein the main frame has supporting frames on both sides, the upper frame is fixed between the supporting frames, and the lower frame is slidably disposed between the supporting frames.
3. The blown film thickness test apparatus according to claim 2, wherein the main frame is provided with a lifter, a lifting end of which is fixed to a bottom of the lower frame, and lifting of the lower frame is controlled by the lifter.
4. The blown film thickness test device according to claim 1, wherein a light shielding plate is installed at each of front and rear ends of the upper bracket, the light shielding plate extends downward to the lower bracket position, and external light is blocked from being irradiated into a gap between the upper bracket and the lower bracket by the light shielding plate.
5. The blown film thickness test apparatus according to claim 4, wherein each of the lower frames is provided with a film roll in a front-rear direction, the film roll being located between the light shielding plate and the lower frame.
6. The blown film thickness test apparatus according to claim 5, wherein a cooling tube is provided in the film roll, a bearing is provided between the cooling tube and the film roll, a cavity is left between the cooling tube and the film roll, and a waterproof layer is provided between the cavity and the bearing.
7. A film thickness measuring method, characterized in that the film thickness measuring method is based on the blown film thickness testing device according to any one of the preceding claims 1-6, the film thickness measuring method comprising the steps of:
When the film passes through the gap between the upper bracket and the lower bracket, infrared light is emitted to the film downwards through the infrared light emitting part of the upper bracket, and after the infrared light passes through the film, the infrared light passing through the film is received through the infrared sensing unit of the lower bracket;
Then the infrared light-emitting piece is driven to rotate through the rotating end of the upper bracket, so that the infrared light-emitting piece scans the film in a mode of reciprocating left and right, and the infrared sensing unit moves in a reciprocating manner left and right along with the swinging of the infrared light-emitting piece, so that the infrared sensing unit receives infrared light emitted by the infrared light-emitting piece in the swinging process of the infrared light-emitting piece;
When the film is flat, after the infrared light emitting piece swings leftwards or rightwards from the angle position of the vertical film, the path of the film through which infrared light emitted by the infrared light emitting piece passes is regularly prolonged, and at the moment, the intensity of infrared light received by the infrared sensor unit and passing through the film is regularly reduced;
When the film is wrinkled, after the infrared light emitting piece swings leftwards or rightwards from the angle position of the vertical film, the path of the film through which infrared light emitted by the infrared light emitting piece passes changes irregularly, and at the moment, the intensity of infrared light received by the infrared sensing unit and passing through the film also changes irregularly;
based on the same swinging angle of the infrared light emitting piece, comparing the infrared light intensity received by the infrared sensing unit when the film is flat, and judging whether the film is wrinkled or not.
8. The method according to claim 7, wherein in the step, when the film passes through the gap between the upper bracket and the lower bracket, the light shielding plates at the front and rear ends of the upper bracket block the external light from entering the gap, so as to improve the interference of the external light to the infrared light emitted by the infrared light emitting member.
9. The method according to claim 8, wherein before the film enters the gap, the film is wound around the film roll on the left side of the lower bracket from bottom to top, then passes through the gap between the upper bracket and the lower bracket from front to back, is wound around the film roll on the right side of the lower bracket, and is removed from top to bottom;
meanwhile, cooling water is introduced into the inner cavity of the film roll through the cooling pipe in the film roll, and the cooling water in the cavity is used as damping buffer when the film is pulled, and meanwhile, the film is cooled, so that the film is hardened, and wrinkling of the film is improved.
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN1576783A (en) * | 2003-07-23 | 2005-02-09 | Lg电子株式会社 | Method and apparatus for detecting position of mobile robot |
| CN106225694A (en) * | 2016-08-31 | 2016-12-14 | 成都尽知致远科技有限公司 | A kind of integrated die surface measured film thickness instrument of intelligence |
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| JP4089057B2 (en) * | 1998-12-08 | 2008-05-21 | 東洋紡績株式会社 | Film edge thickness measuring apparatus and film edge thickness measuring method |
| JP3944693B2 (en) * | 2001-10-04 | 2007-07-11 | オムロン株式会社 | Film thickness measuring device |
| CN209447338U (en) * | 2018-09-19 | 2019-09-27 | 安徽慧视金瞳科技有限公司 | A kind of infrared light film thickness adjustment structure |
| CN112710245B (en) * | 2021-01-13 | 2022-08-30 | 佛山市联慧科自动化设备有限公司 | Thickness gauge |
| KR102343841B1 (en) * | 2021-10-08 | 2021-12-27 | 감기백 | Simulation apparatus for painting with enhanced IR motion tracking |
| CN216770483U (en) * | 2022-01-26 | 2022-06-17 | 福建玮晟机械有限公司 | Drench membrane machine production line with circulating movable formula calibrator |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN1576783A (en) * | 2003-07-23 | 2005-02-09 | Lg电子株式会社 | Method and apparatus for detecting position of mobile robot |
| CN106225694A (en) * | 2016-08-31 | 2016-12-14 | 成都尽知致远科技有限公司 | A kind of integrated die surface measured film thickness instrument of intelligence |
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