CN118130954A - Testing device, testing system and testing method - Google Patents
Testing device, testing system and testing method Download PDFInfo
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- CN118130954A CN118130954A CN202410382732.5A CN202410382732A CN118130954A CN 118130954 A CN118130954 A CN 118130954A CN 202410382732 A CN202410382732 A CN 202410382732A CN 118130954 A CN118130954 A CN 118130954A
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- 238000012360 testing method Methods 0.000 title claims abstract description 69
- 239000000523 sample Substances 0.000 claims abstract description 154
- 238000000034 method Methods 0.000 claims description 19
- 238000010998 test method Methods 0.000 claims description 5
- 238000002788 crimping Methods 0.000 claims description 3
- 230000008054 signal transmission Effects 0.000 claims 1
- 230000005540 biological transmission Effects 0.000 description 5
- 238000010586 diagram Methods 0.000 description 4
- 238000004891 communication Methods 0.000 description 2
- 238000001514 detection method Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000002457 bidirectional effect Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0416—Connectors, terminals
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
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- General Physics & Mathematics (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Abstract
The application discloses a testing device, a testing system and a testing method, wherein the testing device comprises: a probe module including a plurality of probes; the controllable module comprises a first connecting end and a second connecting end, wherein the first connecting end comprises a plurality of first terminals, and the first terminals are correspondingly and electrically connected with the probes; the second connecting end is electrically connected with the signal generator, and the controllable module controls a first target terminal in the first terminals to output a first signal and simultaneously controls a second target terminal in the first terminals to receive a second signal and sends the second signal to the signal generator. The testing device provided by the application can judge whether any two probes in the probe module are short-circuited.
Description
Technical Field
The present application relates to the field of display technologies, and in particular, to a testing device, a testing system, and a testing method.
Background
The process of the display module can be detected in multiple stages, the detection process can be simply described as crimping the connector of the display module onto the probe module, and then the signal generator is used for powering on the display module through the probe module and sending out a picture signal, so that the display module is detected. However, the inventor of the present application has long studied and found that there is a case where the module is scrapped due to a short circuit of the probes in the probe module during the current test.
Disclosure of Invention
The application provides a testing device, a testing system and a testing method, which can judge whether any two probes in a probe module are short-circuited.
A first aspect of an embodiment of the present application provides a test apparatus, including: a probe module including a plurality of probes; the controllable module comprises a first connecting end and a second connecting end, wherein the first connecting end comprises a plurality of first terminals, and the first terminals are correspondingly and electrically connected with the probes; the second connecting end is electrically connected with the signal generator, and the controllable module controls a first target terminal of the first terminals to output a first signal, and simultaneously controls a second target terminal of the first terminals to receive a second signal and send the second signal to the signal generator.
A second aspect of an embodiment of the present application provides a test system, the test system including a signal generator and a test device according to any one of the preceding claims.
A third aspect of the embodiment of the present application provides a testing method, the method being applied to a testing system, the testing system including a signal generator electrically connected and a testing device, the testing device including a probe module and a controllable module, the probe module including a plurality of probes, the controllable module including a first connection end and a second connection end, the first connection end including a plurality of first terminals, the plurality of first terminals being electrically connected to the plurality of probes, the second connection end being electrically connected to the signal generator, the testing method comprising: the controllable module controls a first target terminal in the first terminals to output a first signal, and simultaneously controls a second target terminal in the first terminals to receive a second signal, wherein the first signal is a high-level signal; transmitting the second signal to the signal generator; the signal generator determines a short circuit between the probe electrically connected to the first target terminal and the probe electrically connected to the second target terminal in response to the level of the second signal being greater than a first level threshold.
The beneficial effects of the application are as follows: the testing device comprises a probe module and a controllable module, wherein the probe module comprises a plurality of probes, the controllable module comprises a first connecting end and a second connecting end, a first terminal of the first connecting end is correspondingly and electrically connected with the plurality of probes, the second connecting end is electrically connected with a signal generator, the second connecting end is electrically connected with the signal generator, the controllable module controls a first target terminal in a plurality of first terminals to output a first signal, and simultaneously controls a second target terminal in the plurality of first terminals to receive a second signal and send the second signal to the signal generator. The test equipment has a simple and effective structure, and can detect the probe module before the signal generator powers on the display module, so that the condition that the display module is scrapped due to short circuit of the probe can be avoided.
Drawings
In order to more clearly illustrate the embodiments of the application or the technical solutions in the prior art, the drawings that are required in the embodiments or the description of the prior art will be briefly described, it being obvious that the drawings in the following description are only some embodiments of the application, and that other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
FIG. 1 is a schematic diagram of a testing device according to an embodiment of the present application;
FIG. 2 is a schematic diagram of a test system according to an embodiment of the present application;
FIG. 3 is a schematic diagram of another embodiment of the test system of the present application;
FIG. 4 is a flow chart of an embodiment of the testing method of the present application;
FIG. 5 is a schematic diagram of a display module according to an embodiment of the application;
Fig. 6 is a schematic structural view of the connector in fig. 5.
Detailed Description
The following description of the embodiments of the present application will be made clearly and fully with reference to the accompanying drawings, in which it is evident that the embodiments described are only some, but not all embodiments of the application. All other embodiments, which can be made by those skilled in the art based on the embodiments of the application without making any inventive effort, are intended to be within the scope of the application.
Referring to fig. 1 and 2, in one embodiment, a test apparatus 100 includes a probe module 110 and a controllable module 120, the probe module 110 including a plurality of probes 1101. The controllable module 120 includes a first connection terminal 111 and a second connection terminal 112, where the first connection terminal 111 includes a plurality of first terminals 113, and the plurality of first terminals 113 are electrically connected to the plurality of probes 1101.
The second connection end 112 is electrically connected to the signal generator 210, and the controllable module 120 sequentially controls a first target terminal of the plurality of first terminals 113 to output a first signal, a second target terminal of the plurality of first terminals 113 to receive a second signal, and sends the second signal to the signal generator 210 through the second connection end 112.
Specifically, the probe module 110 includes a plurality of probes 1101, and when testing the display module, the plurality of probes 1101 in the probe module 110 are pressed onto connectors in the display module, and then signals sent by the signal generator 210 are sent to the display module through the probe module 110, so that the display module is tested.
In the prior art, when testing the display module, there is a case that the display module is scrapped due to the short circuit between the pads on the connectors caused by the short circuit between the probes 1101 in the probe module 110, and in order to avoid the situation, the signal generator 210 detects the short circuit between the two probes 1101 in the probe module 110 through the controllable module 120 before the probe module 110 is crimped to the connector in the display module.
Wherein for convenience of explanation, as shown in fig. 1, a plurality of probes 1101 in the probe module 110 are numbered sequentially from 1, that is, a plurality of probes 1101 are defined as probe 1, probe 2, … …, probe N in sequence. Where N is the total number of probes 1101. The first terminal 113 electrically connected to the probe 1 in the first connection terminal 111 is defined as a first terminal 1', the first terminal 113 electrically connected to the probe 2 is defined as a first terminal 2', … …, and the first terminal 113 electrically connected to the probe N is defined as a first terminal N '.
When it is desired to detect whether two probes 1101 in the probe module 110 are shorted, the test procedure is as follows, wherein for convenience of explanation, it is assumed that two probes 1101 to be tested are probe 2 and probe 4 in fig. 1, and the probe 2 and probe 4 are adjacently disposed, and it should be noted that whether the probe 2 and the probe 4 are adjacently disposed, the following method can be used to test whether the two are shorted:
During testing, the signal generator 210 controls the controllable module 120 to sequentially send a first signal with a high level through the first terminal 2' (i.e. the first target terminal) through the second connection terminal 112, receive a second signal returned by the first terminal 4' through the first terminal 4' (i.e. the second target terminal), then the controllable module 120 returns the second signal to the signal generator 210 through the second connection terminal 112, and finally the signal generator 210 determines whether the probe 2 and the probe 4 are shorted according to the second signal: if the level of the second signal is greater than the first level threshold, a short circuit between probe 2 and probe 4 is determined, otherwise no short circuit between probe 2 and probe 4 is determined. It will be appreciated that if the level of the second signal is equal to the level of the first signal, it is unambiguously stated that, at this time, because of a short circuit between the probes 2 and 4, the first signal is transmitted directly to the probe 4 and further to the first terminal 4' after receiving the first signal transmitted by the first terminal 2', whereas if the level of the second signal is smaller than the level of the first signal but greater than the first level threshold, the reason why the first terminal 4' is able to receive the second signal is considered to be also a short circuit between the probes 2 and 4, only because of the presence of a resistor on the transmission path, which results in the level of the second signal being smaller than the level of the first signal.
Wherein, whether a short circuit exists between any two probes 1101 in the probe module 110 can be detected according to the method, and after determining that no short circuit exists between any two probes 1101, the probe module 110 can be pressed onto a connector in the display module, and then the signal generator 210 sends a test signal to the display module through the probe module 110, so as to test the display module. It should be noted that, in the process that the signal generator 210 sends the test signal to the display module through the probe module 110, the signal generator 210 may send the test signal to the probe module 110 directly, and the test signal does not need to pass through the controllable module 120. The process of directly sending the test signal to the probe module 110 by the signal generator 210 belongs to the prior art, and the application is equivalent to adding a communication path based on the connection structure of the existing signal generator 210 and the probe module 110, and setting the controllable module 120 to electrically connect the signal generator 210 and the probe module 110 on the newly added communication path.
From the above, it can be seen that the test device 100 of the present application has a simple and effective structure, and can detect the probe module 110 before the signal generator 210 powers on the display module, so as to avoid the display module being scrapped due to the short circuit of the probe 1101.
With continued reference to fig. 1 and 2, in an embodiment, the second connection end 112 includes a second terminal 114, where the second terminal 114 is electrically connected to the signal generator 210, and the number of second terminals 114 is one, the second terminal 114 is used to bi-directionally transmit signals between the signal generator 210 and the controllable module 120, or the number of second terminals 114 is multiple, where at least one second terminal 114 is used to transmit signals sent by the signal generator 210 to the controllable module 120, and at least one second terminal 114 is used to transmit signals output by the controllable module 120 to the signal generator 210.
Specifically, when the number of the second terminals 114 is one, the second terminals 114 are used for bidirectional data transmission between the signal generator 210 and the controllable module 120; when the number of the second terminals 114 is plural, the second terminals 114 may unidirectionally transmit data, that is, at least one second terminal 114 is used to transmit a signal transmitted from the signal generator 210 to the controllable module 120, and at least one second terminal 114 is used to transmit a signal output from the controllable module 120 to the signal generator 210.
In one embodiment, the controllable module 120 further includes a third connection terminal 115, and the third connection terminal 115 is electrically connected to a power source, so as to supply power to the controllable module 120. In yet another embodiment, the controllable module 120 further includes a fourth connection terminal 116, and the fourth connection terminal 116 is grounded to ensure the normal operation of the controllable module 120. In another embodiment, the controllable module 120 is a controllable chip, and in other embodiments, the controllable module 120 may be an integrated circuit such as a single chip, a controller, or the like.
Referring to fig. 2 and 3, in one embodiment, the test system 200 includes a signal generator 210 and the test apparatus 100 according to any of the above embodiments, and thus, the test system 200 also has a function of detecting whether or not any two probes 1101 in the probe module 110 are shorted.
With continued reference to fig. 3, in one embodiment, the test system 200 further includes an alarm device 220, the alarm device 220 is electrically connected to the signal generator 210, and the alarm device 220 generates a first alarm signal when the level of the second signal received by the signal generator 210 is greater than a first level threshold.
Specifically, as can be seen from the above analysis, when the level of the second signal is greater than the first level threshold, it is indicated that the probe 1101 electrically connected to the first target terminal is shorted to the probe 1101 electrically connected to the second target terminal, and the alarm device 220 generates the first alarm signal and alarms, so that the operator can be prompted to adjust the probe 1101. Wherein the alarm means 220 may be e.g. a buzzer, a flashing light or the like. In another embodiment, the alarm device 220 may not be provided.
In one embodiment, the alarm device 220 is integrated with the signal generator 210, which may reduce the volume and cost of the test system 200. In other embodiments, the alarm device 220 and the signal generator 210 may be independently configured to be electrically connected by wires.
In an embodiment, referring to fig. 1,2 and 4, in an embodiment of the present application, a testing method applied to the testing system 200 includes:
S110: the controllable module 120 controls a first target terminal of the plurality of first terminals 113 to output a first signal, and simultaneously controls a second target terminal of the plurality of first terminals 113 to receive a second signal, wherein the first signal is a high level signal.
S120: the second signal is transmitted to the signal generator 210.
S130: the signal generator 210 determines a short circuit between the probe 1101 electrically connected to the first target terminal and the probe 1101 electrically connected to the second target terminal in response to the level of the second signal being greater than the first level threshold.
The specific process of steps S110-S130 is described above, and reference is made to the above related content, which is not described herein.
In one embodiment, the specific process of step S110 includes:
s111: the signal generator 210 sends a first control instruction to the controllable module 120 through the second connection end 112, where the first control instruction carries a first target terminal, a second target terminal and a first duration, so that the controllable module 120 outputs a first signal through the first target terminal after receiving the first control instruction, and receives a second signal through the second target terminal after the first duration.
For ease of understanding, the description herein will remain with respect to the examples of fig. 1 and 2: in the test, if it is desired to determine whether the probes 2 and 4 are shorted, the signal generator 210 sends a first control command carrying the first terminal 2', the first terminal 4', and the first duration to the controllable module 120 through the second connection 112, and the controllable module 120 parses the first control command after receiving the first control command, outputs a first signal through the first terminal 2 'after parsing, and receives a second signal through the first terminal 4' after the first duration.
In other embodiments, the first control command may not carry the first duration, but only carry the first target terminal and the second target terminal, and after receiving the first control command, the controllable module 120 outputs the first signal through the first target terminal, and then receives the second signal through the second target terminal after a preset fixed duration.
In one embodiment, referring to fig. 1, 5 and 6, the test method further comprises:
S210: after determining that there is no short circuit between any two probes 1101 in the probe module 110, the probe module 110 is press-bonded to the connector 310 in the display module 300, and the connector 310 includes a plurality of pads corresponding to the plurality of probes 1101.
S220: the controllable module 120 controls a third target terminal of the plurality of first terminals 113 to output a third signal, and simultaneously controls a fourth target terminal of the plurality of first terminals 113 to receive a fourth signal, wherein the third signal is a high level signal.
S230: the fourth signal is transmitted to the signal generator 210.
S240: the signal generator 210 determines that the alignment between the probe module 110 and the connector 310 is inaccurate in response to the level of the fourth signal being greater than the second level threshold.
Specifically, to better understand the above process, the description is provided herein in connection with the examples of fig. 1 and 2: the third target terminal may be any one of the first terminals 113, and the fourth target terminal may be any one of the first terminals 113, as long as the fourth target terminal is different from the third target terminal, and for convenience of explanation, it is assumed that the third target terminal is the first terminal 2 'in fig. 1, and the fourth target terminal is the first terminal 4' in fig. 1:
During testing, the signal generator 210 controls the controllable module 120 to sequentially send a third signal with a high level through the first terminal 2 '(i.e. the third target terminal) through the second connection terminal 112, receive a fourth signal returned by the first terminal 4' through the first terminal 4 '(i.e. the fourth target terminal), and the plurality of pads on the connector 310 are in one-to-one correspondence with the plurality of probes 1101, at this time, if the alignment between the probe module 110 and the connector 310 is inaccurate, there may be a probe 2 electrically connected to the first terminal 2', and the probe 4 electrically connected to the first terminal 4 'is shorted through the pad on the connector, so there may be a third signal transmitted to the probe 4 through the pad after the third signal sent by the first terminal 2' is received, and further transmitted to the first terminal 4', at this time, the level of the received signal of the first terminal 4' is equal to the level of the third signal, that is equal to the level of the fourth signal, that is equal to the level of the third signal, or because the level of the transmission path resistance exists, is smaller than the level of the third signal, but the level of the fourth signal is greater than the level of the second signal, and therefore indicates that the level of the fourth signal is not accurately aligned between the probe module 110 and the connector 310 and the probe 110 is accurately aligned with respect to the second level, if the fourth signal is not aligned between the level of the probe module and the probe module 110.
In one embodiment, the third signal and the first signal have the same level, and in another embodiment, the third signal and the first signal may have different levels, and may all be high. In one embodiment, the first level threshold is equal to the second level threshold, and in another embodiment, the first level threshold may be different from the second level threshold.
In another embodiment, the test method of the present embodiment further includes:
s310: after determining that there is no short circuit between any two probes 1101 in the probe module 110, the probe module 110 is press-bonded to the connector 310 in the display module 300, the connector 310 includes a plurality of pads corresponding to the plurality of probes 1101, and the plurality of pads includes a first pad and a second pad electrically connected.
S320: the controllable module 120 controls the first terminal 113 corresponding to the first pad to output a fifth signal, and controls the first terminal 113 corresponding to the second pad to receive a sixth signal, wherein the fifth signal is a high level signal.
S330: the sixth signal is transmitted to the signal generator 210.
S340: the signal generator 210 determines that alignment between the probe module 110 and the connector 310 is accurate in response to the level of the sixth signal being greater than the third level threshold.
Specifically, for better understanding, assuming that the first pad is pad 1 "in fig. 6 and the second pad is pad 2" in fig. 6, unlike the above embodiment, when the first pad 1 "is electrically connected to the second pad 2", and just because the first pad 1 "is electrically connected to the second pad 2", it means that if the alignment between the probe module 110 and the connector 310 is accurate, the first terminal 113 electrically connected to the first pad 1 "and the first terminal 113 electrically connected to the second pad 2" can also be indirectly electrically connected, the level of the sixth signal received by the first terminal 113 electrically connected to the second pad 2 "is equal to the level of the fifth signal, or because of the transmission path resistance, the level of the sixth signal is smaller than the level of the fifth signal but greater than the third level threshold, it means that if the level of the sixth signal is greater than the third level threshold, it means that the alignment between the probe module 110 and the connector 310 is accurate, otherwise it means that the alignment between the probe module 110 and the connector 310 is inaccurate, the first terminal 113 that should be electrically connected to the first pad 1" and the first terminal 113 is not electrically connected to the first pad 2", or the first terminal 113 that the first terminal 113 should be electrically connected to the first pad 1" and the second terminal 113 is not electrically connected to the first pad 2 "and the first pad 2" should be electrically offset, and the first terminal 113 is not electrically connected to the second pad 2 "should be electrically connected to the second terminal 2" and the second terminal is not electrically connected to the second pad 2 ".
It is understood that the electrical connection between the first pad and the second pad does not affect the normal function of the connector and the normal display of the display module.
In one embodiment, the levels of the fifth signal and the first signal are the same, and in another embodiment, the levels of the fifth signal and the first signal may be different and may be both high. In one embodiment, the third level threshold is equal to the first level threshold, and in another embodiment, the third level threshold may be different from the first level threshold.
In an embodiment, the plurality of pads further includes a third pad, the first pad, the second pad, and the third pad being electrically connected. At this time, the controllable module 120 controls the first terminal 113 corresponding to the first pad to output the fifth signal, and controls the first terminal 113 corresponding to the second pad to receive the sixth signal at step S320: the controllable module 120 controls the first terminal 113 corresponding to the first pad to output the fifth signal while the first terminal 113 corresponding to the second pad receives the sixth signal and the first terminal 113 corresponding to the third pad receives the seventh signal.
The step S330 of transmitting the sixth signal to the signal generator 210 includes: the sixth signal and the seventh signal are sequentially transmitted to the signal generator 210 through the second connection 112.
At this time, in response to the level of the sixth signal being greater than the third level threshold, the determining that the alignment between the probe module 110 and the connector 310 is accurate includes: in response to the level of the sixth signal being greater than the third level threshold and the level of the seventh signal being greater than the fourth level threshold, it is determined that alignment between the probe module 110 and the connector 310 is accurate.
Specifically, for better understanding, assuming that the first pad is pad 1 "in fig. 6, the second pad is pad 2" in fig. 6, and the third pad is pad N-1 "in fig. 6, because the first pad 1", the second pad 2 "and the third pad N-1" are shorted, if the alignment between the probe module 110 and the connector 310 is accurate, the first terminal 113 electrically connected to the first pad 1", the first terminal 113 electrically connected to the second pad 2" and the first terminal 113 electrically connected to the third pad N-1 "can also be indirectly electrically connected, the level of the sixth signal received by the first terminal 113 electrically connected to the second pad 2" is equal to the level of the fifth signal, the level of the seventh signal received by the first terminal 113 corresponding to the third pad N-1 "is equal to the level of the fifth signal, or because of the presence of the transmission path resistance, the level of the sixth signal is less than the level of the fifth signal but greater than the third level threshold, the level of the seventh signal is less than the level of the fifth signal but greater than the fourth level threshold, and the alignment between the probe module 110 and the connector 310 is not accurately aligned with respect to the probe module 110.
It can be understood that, at this time, the sixth signal output by the first terminal 113 corresponding to the second pad 2″ and the seventh signal output by the first terminal 113 corresponding to the third pad N-1″ are combined together, so that the alignment between the probe module 110 and the connector 310 is determined to be accurate, and the accuracy of the detection can be improved.
It can be understood that the electrical connection of the first pad, the second pad and the third pad does not affect the normal function of the connector and the normal display of the display module.
In one embodiment, the third level threshold is equal to the fourth level threshold, and in another embodiment, the third level threshold and the fourth level threshold may be different.
In an embodiment, the first pads and the second pads are arranged along a first direction, and the second pads and the third pads are arranged along a second direction, wherein the first direction intersects the second direction. Specifically, since one surface is determined by three points, if the first bonding pad, the second bonding pad, and the third bonding pad are aligned with the first terminal 113 accurately, it is indicated that all bonding pads are aligned with the first terminal 113 accurately, and accuracy of the test result can be ensured. Of course in other embodiments, the number of pads used for testing may be two, four, etc.
In one embodiment, in response to the level of the second signal being greater than the first level threshold in step S130, determining a short circuit between the probe 1101 electrically connected to the first target terminal and the probe 1101 electrically connected to the second target terminal includes:
In response to the level of the second signal being greater than the first level threshold, the alarm device 220, which is electrically connected to the signal generator 210, generates a first alarm signal that is used to indicate a short between the probe 1101, which is electrically connected to the first target terminal, and the probe 1101, which is electrically connected to the second target terminal.
Specifically, when the level of the second signal received by the signal generator 210 is greater than the first level threshold, it is indicated that the probe 1101 electrically connected to the first target terminal is shorted to the probe 1101 electrically connected to the second target terminal, and the alarm device 220 generates a first alarm signal and alarms. In other embodiments, the alarm device 220 may not be provided.
After determining that the alignment between the probe module 110 and the connector 310 is accurate, the signal generator 210 powers up the display module 300, thereby testing the display module 300.
It should be noted that, in the present application, the signal generator 210 may be used to power up the display module 300 after detecting that any two probes 1101 are not shorted, or after detecting that any two probes 1101 are not shorted, whether the alignment between the probe module 110 and the connector 310 is accurate may be further detected, and after determining that the alignment between the probe module 110 and the connector 310 is accurate, the signal generator 210 may be used to power up the display module 300.
The foregoing description is only of embodiments of the present application, and is not intended to limit the scope of the application, and all equivalent structures or equivalent processes using the descriptions and the drawings of the present application or directly or indirectly applied to other related technical fields are included in the scope of the present application.
Claims (10)
1. A test device, the test device comprising:
A probe module including a plurality of probes;
The controllable module comprises a first connecting end and a second connecting end, wherein the first connecting end comprises a plurality of first terminals, and the first terminals are correspondingly and electrically connected with the probes;
The second connecting end is electrically connected with the signal generator, and the controllable module controls a first target terminal of the first terminals to output a first signal, and simultaneously controls a second target terminal of the first terminals to receive a second signal and send the second signal to the signal generator.
2. The test device of claim 1, wherein the second connection end comprises a second terminal electrically connected to the signal generator, wherein the number of second terminals is one, the second terminal being for bi-directional transmission of signals between the signal generator and the controllable module; or the number of the second terminals is a plurality, wherein at least one second terminal is used for transmitting the signal sent by the signal generator to the controllable module, and at least one second terminal is used for transmitting the signal output by the controllable module to the signal generator;
preferably, the controllable module further comprises a third connection end, and the third connection end is electrically connected with a power supply;
preferably, the controllable module further comprises a fourth connection end, and the fourth connection end is grounded;
preferably, the controllable module is a controllable chip.
3. A test system comprising a signal generator and a test device as claimed in any one of claims 1 to 2.
4. The test system of claim 3, wherein the test system further comprises:
The alarm device is electrically connected with the signal generator, and generates a first alarm signal when the level of the second signal received by the signal generator is greater than a first level threshold value;
Preferably, the alarm device is integrated on the signal generator.
5. A test method, the method being applied to a test system, the test system including a signal generator and a test device electrically connected, the test device including a probe module and a controllable module, the probe module including a plurality of probes, the controllable module including a first connection end and a second connection end, the first connection end including a plurality of first terminals, the plurality of first terminals being electrically connected with the plurality of probes, the second connection end being electrically connected with the signal generator, the test method comprising:
the controllable module controls a first target terminal in the first terminals to output a first signal, and simultaneously controls a second target terminal in the first terminals to receive a second signal, wherein the first signal is a high-level signal;
transmitting the second signal to the signal generator;
the signal generator determines a short circuit between the probe electrically connected to the first target terminal and the probe electrically connected to the second target terminal in response to the level of the second signal being greater than a first level threshold.
6. The method of claim 5, wherein the step of determining the position of the probe is performed,
The controllable module controls a first target terminal of the first terminals to output a first signal, and simultaneously controls a second target terminal of the first terminals to receive a second signal, and the controllable module comprises:
The signal generator sends a first control instruction to the controllable module through the second connection end, wherein the first control instruction carries the first target terminal, the second target terminal and a first duration, so that the controllable module outputs the first signal through the first target terminal after receiving the first control instruction, and receives the second signal through the second target terminal after the first duration.
7. The method of claim 5, wherein the method further comprises:
After determining that no short circuit phenomenon exists between any two probes in the probe module, crimping the probe module onto a connector in a display module, wherein the connector comprises a plurality of bonding pads, and the bonding pads correspond to the probes;
the controllable module controls a third target terminal in the first terminals to output a third signal, and simultaneously controls a fourth target terminal in the first terminals to receive a fourth signal, wherein the third signal is a high-level signal;
transmitting the fourth signal to the signal generator;
The signal generator determines that the alignment between the probe module and the connector is inaccurate in response to the level of the fourth signal being greater than a second level threshold;
Preferably, the third signal is at the same level as the first signal;
preferably, the first level threshold is equal to the second level threshold.
8. The method of claim 5, wherein the method further comprises:
after determining that no short circuit phenomenon exists between any two probes in the probe module, crimping the probe module onto a connector in a display module, wherein the connector comprises a plurality of bonding pads, the bonding pads correspond to the probes, and the bonding pads comprise a first bonding pad and a second bonding pad which are electrically connected;
The controllable module controls the first terminal corresponding to the first bonding pad to output a fifth signal and simultaneously controls the first terminal corresponding to the second bonding pad to receive a sixth signal, wherein the fifth signal is a high-level signal;
Transmitting the sixth signal to the signal generator;
the signal generator responds to the fact that the level of the sixth signal is larger than a third level threshold value, and the probe module and the connector are accurately aligned;
Preferably, the fifth signal is at the same level as the first signal;
preferably, the third level threshold is equal to the first level threshold.
9. The method of claim 8, wherein the step of determining the position of the first electrode is performed,
The plurality of pads further includes a third pad, the first pad, the second pad, and the third pad being electrically connected;
The controllable module controls the first terminal corresponding to the first bonding pad to output a fifth signal, and simultaneously controls the first terminal corresponding to the second bonding pad to receive a sixth signal, and the controllable module comprises:
The controllable module controls the first terminal corresponding to the first bonding pad to output the fifth signal, and simultaneously controls the first terminal corresponding to the second bonding pad to receive the sixth signal and the first terminal corresponding to the third bonding pad to receive a seventh signal;
the step of transmitting the sixth signal to the signal generator comprises:
transmitting the sixth signal and the seventh signal to the signal generator in sequence;
The step of determining that the alignment between the probe module and the connector is accurate in response to the level of the sixth signal being greater than a third level threshold includes:
Determining that alignment between the probe module and the connector is accurate in response to the level of the sixth signal being greater than the third level threshold and the level of the seventh signal being greater than the fourth level threshold;
Preferably, the third level threshold is equal to the fourth level threshold;
Preferably, the first pads and the second pads are arranged along a first direction, and the second pads and the third pads are arranged along a second direction, wherein the first direction intersects the second direction.
10. The method of claim 5, wherein the step of determining the position of the probe is performed,
The step of determining a short circuit between the probe electrically connected to the first target terminal and the probe electrically connected to the second target terminal in response to the level of the second signal being greater than a first level threshold, comprising:
And responding to the level of the second signal being greater than the first level threshold, generating a first alarm signal by an alarm device electrically connected with the signal generator, wherein the first alarm signal is used for prompting a short circuit between the probe electrically connected with the first target terminal and the probe electrically connected with the second target terminal.
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| CN202410382732.5A CN118130954A (en) | 2024-03-29 | 2024-03-29 | Testing device, testing system and testing method |
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| Application Number | Priority Date | Filing Date | Title |
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| CN202410382732.5A CN118130954A (en) | 2024-03-29 | 2024-03-29 | Testing device, testing system and testing method |
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| CN118130954A true CN118130954A (en) | 2024-06-04 |
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