CN118103773A - 高折射率光刻胶组合物 - Google Patents

高折射率光刻胶组合物 Download PDF

Info

Publication number
CN118103773A
CN118103773A CN202280068662.5A CN202280068662A CN118103773A CN 118103773 A CN118103773 A CN 118103773A CN 202280068662 A CN202280068662 A CN 202280068662A CN 118103773 A CN118103773 A CN 118103773A
Authority
CN
China
Prior art keywords
group
photoresist composition
resin
negative photoresist
composition
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN202280068662.5A
Other languages
English (en)
Chinese (zh)
Inventor
傅鹏飞
张元凡
J·埃尔
郑勉和
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Dow Silicones Corp
Original Assignee
Dow Corning Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Dow Corning Corp filed Critical Dow Corning Corp
Publication of CN118103773A publication Critical patent/CN118103773A/zh
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/075Silicon-containing compounds
    • G03F7/0757Macromolecular compounds containing Si-O, Si-C or Si-N bonds
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08GMACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
    • C08G77/00Macromolecular compounds obtained by reactions forming a linkage containing silicon with or without sulfur, nitrogen, oxygen or carbon in the main chain of the macromolecule
    • C08G77/04Polysiloxanes
    • C08G77/38Polysiloxanes modified by chemical after-treatment
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/0005Production of optical devices or components in so far as characterised by the lithographic processes or materials used therefor
    • G03F7/0007Filters, e.g. additive colour filters; Components for display devices
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/038Macromolecular compounds which are rendered insoluble or differentially wettable
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/16Coating processes; Apparatus therefor
    • G03F7/162Coating on a rotating support, e.g. using a whirler or a spinner
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/20Exposure; Apparatus therefor
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/26Processing photosensitive materials; Apparatus therefor
    • G03F7/30Imagewise removal using liquid means
    • G03F7/32Liquid compositions therefor, e.g. developers
    • G03F7/322Aqueous alkaline compositions
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/027Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Polymers & Plastics (AREA)
  • Organic Chemistry (AREA)
  • Medicinal Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • General Chemical & Material Sciences (AREA)
  • Materials For Photolithography (AREA)
  • Silicon Polymers (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Electroluminescent Light Sources (AREA)
CN202280068662.5A 2021-10-15 2022-08-01 高折射率光刻胶组合物 Pending CN118103773A (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US202163255974P 2021-10-15 2021-10-15
US63/255974 2021-10-15
PCT/US2022/039032 WO2023064023A1 (en) 2021-10-15 2022-08-01 High refractive index photoresist composition

Publications (1)

Publication Number Publication Date
CN118103773A true CN118103773A (zh) 2024-05-28

Family

ID=83049938

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202280068662.5A Pending CN118103773A (zh) 2021-10-15 2022-08-01 高折射率光刻胶组合物

Country Status (7)

Country Link
US (1) US20240337943A1 (enExample)
EP (1) EP4416553A1 (enExample)
JP (1) JP2024541191A (enExample)
KR (1) KR20240093557A (enExample)
CN (1) CN118103773A (enExample)
TW (1) TW202334286A (enExample)
WO (1) WO2023064023A1 (enExample)

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6858370B2 (en) 2001-02-23 2005-02-22 Fuji Photo Film Co., Ltd. Positive photosensitive composition
US7756384B2 (en) 2004-11-08 2010-07-13 Dow Corning Corporation Method for forming anti-reflective coating
KR101293937B1 (ko) * 2006-06-28 2013-08-09 다우 코닝 코포레이션 전자 유인성 관능 그룹을 갖는 염기 첨가제를 함유한 실세스퀴옥산 수지 시스템
KR102858984B1 (ko) * 2016-02-19 2025-09-12 다우 실리콘즈 코포레이션 에이징된 중합체 실세스퀴옥산
WO2017192345A1 (en) 2016-05-03 2017-11-09 Dow Corning Corporation Silsesquioxane resin and oxaamine composition
KR102395936B1 (ko) * 2016-06-16 2022-05-11 다우 실리콘즈 코포레이션 규소-풍부 실세스퀴옥산 수지
TWI742160B (zh) * 2016-09-30 2021-10-11 美商道康寧公司 橋接聚矽氧樹脂、膜、電子裝置及相關方法
JP7234631B2 (ja) * 2017-03-29 2023-03-08 東レ株式会社 ネガ型感光性樹脂組成物、硬化膜、硬化膜を具備する素子及び有機elディスプレイ、並びにその製造方法

Also Published As

Publication number Publication date
EP4416553A1 (en) 2024-08-21
WO2023064023A1 (en) 2023-04-20
TW202334286A (zh) 2023-09-01
US20240337943A1 (en) 2024-10-10
JP2024541191A (ja) 2024-11-08
KR20240093557A (ko) 2024-06-24

Similar Documents

Publication Publication Date Title
CN101910253B (zh) 倍半硅氧烷树脂
CN101072896B (zh) 形成抗反射涂层的方法
US20110311788A1 (en) Silphenylene-containing photocurable composition, pattern formation method using same, and optical semiconductor element obtained using the method
JP5644339B2 (ja) レジスト下層膜形成用組成物、レジスト下層膜及びパターン形成方法
CN103995437B (zh) 负型感光性硅氧烷组合物
TW200932791A (en) Siloxane-based resin composition
KR102266587B1 (ko) 수지 조성물, 그 경화막과 그 제조방법, 및 고체촬상소자
KR101751714B1 (ko) 실록산 수지 함유 도포 조성물
CN111148805B (zh) 正型感光性硅氧烷组合物以及使用了其的固化膜
CN107922620A (zh) 低温固化组合物、由所述低温固化组合物形成的固化膜以及具有固化膜的电子装置
TWI712861B (zh) 可低溫硬化之負型感光性組成物、硬化膜及其製造方法、以及元件
CN101073038B (zh) 形成抗反射涂层的方法
CN103959168B (zh) 负型感光性硅氧烷组合物
CN104246612A (zh) 负型感光性硅氧烷组合物
CN102419515A (zh) 聚硅氧烷组合物、聚硅氧烷组合物的制造方法、显示元件的固化膜及其形成方法
WO2012086370A1 (ja) 感光性樹脂組成物
CN111512230B (zh) 感光性硅氧烷组合物以及使用了其的图案形成方法
KR20130113635A (ko) 유기실록산 중합체를 포함하는 감광성 수지 조성물
KR20130113666A (ko) 유기실록산 중합체를 포함하는 감광성 수지 조성물 및 이로부터 제조된 경화막
JP6639724B1 (ja) ポジ型感光性ポリシロキサン組成物
TWI609927B (zh) 含有機聚矽氧烷之可固化樹脂組成物
CN118103773A (zh) 高折射率光刻胶组合物
US8653217B2 (en) Method for forming anti-reflective coating
KR20180044626A (ko) 감광성 수지 조성물, 그로부터 형성된 경화막, 및 상기 경화막을 갖는 전자 장치
TW202502914A (zh) 負型感光性組成物

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination