CN118034010A - Ammeter clock error compensation method and device, terminal equipment and storage medium - Google Patents
Ammeter clock error compensation method and device, terminal equipment and storage medium Download PDFInfo
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Abstract
The embodiment of the invention provides an ammeter clock error compensation method, an ammeter clock error compensation device, terminal equipment and a storage medium, wherein the ammeter clock error compensation method calculates a corresponding clock error predicted value through a polynomial model for indicating the relation between temperature and the clock error predicted value based on the temperature value of a clock chip; and then, calculating a final value to be compensated by combining the clock error predicted value, the clock error initial value and the temperature compensation value, and inputting the final value to be compensated into a clock chip of the ammeter so that the ammeter compensates the current clock error according to the second value to be compensated.
Description
Technical Field
The present invention relates to the field of electrical monitoring, and in particular, to a method and apparatus for compensating clock error of an ammeter, a terminal device, and a storage medium.
Background
Along with the development of science and technology and national economy, the application of electric meters is increasing. The real-time clock is an integral part of the electricity meter and relates to the time correctness of the electricity consumption record. In the national standard of the ammeter, the clock error is required to be smaller than 0.5s/d, the clock source (crystal oscillator) in the ammeter is easy to be influenced by temperature to generate error, and the error can change along with the change of the temperature, thereby influencing the accuracy of clock counting. There is therefore a need for a method to dynamically compensate for clock errors.
Disclosure of Invention
The embodiment of the invention provides an ammeter clock error compensation method, an ammeter clock error compensation device, terminal equipment and a storage medium, which can enable an ammeter to compensate clock errors of a clock chip according to real-time temperature.
An embodiment of the present application provides a method for compensating clock errors of an ammeter, including: in the operation process of the ammeter, periodically acquiring the temperature value of the clock chip;
Calculating a clock error predicted value corresponding to a temperature value according to the temperature value and a polynomial model for indicating the relation between the temperature and the clock error predicted value;
acquiring a clock error initial value of a clock chip, and calculating the sum of the clock error initial value and the clock error predicted value to obtain a first value to be compensated;
determining a target temperature section to which the temperature value belongs, and then acquiring a temperature compensation value of the target temperature section;
calculating the sum of the first value to be compensated and the temperature compensation value to obtain a second value to be compensated;
And inputting the second value to be compensated into a clock chip of the ammeter so that the ammeter compensates the current clock error according to the second value to be compensated.
Further, the constructing of the polynomial model includes:
Acquiring the ADC value of each temperature of a clock chip of an ammeter in a preset test environment and a first time Zhong Wu difference value obtained after the ammeter is measured by a daily timing error meter of each corresponding temperature;
and fitting each temperature ADC value and each corresponding first clock error value to obtain the polynomial model.
Further, when fitting each temperature ADC value and each corresponding first clock error value, each temperature ADC value is attenuated by a preset multiple.
Further, the obtaining the initial value of the clock error of the clock chip includes:
acquiring a second clock error value obtained after the electric meter is measured by a daily timing error meter at a preset temperature;
Calculating a third clock error value at the preset temperature through the polynomial model based on a temperature value corresponding to the preset temperature;
and calculating the difference value between the second clock error value and the third clock error value to obtain the clock error initial value of the clock chip.
On the basis of the method item embodiments, the invention correspondingly provides device item embodiments;
an embodiment of the present invention provides an ammeter clock error compensation device, including: the device comprises a temperature extraction module, a clock error prediction value determination module, a first to-be-compensated value determination module, a temperature compensation value determination module, a second compensation value determination module and a transmission module;
the temperature extraction module is used for periodically acquiring the temperature value of the clock chip in the operation process of the ammeter;
The clock error prediction value determining module is used for calculating a clock error prediction value corresponding to a temperature value according to the temperature value and a polynomial model for indicating the relation between the temperature and the clock error prediction value;
The first to-be-compensated value determining module is used for obtaining a clock error initial value of the clock chip, and calculating the sum of the clock error initial value and the clock error predicted value to obtain a first to-be-compensated value;
the temperature compensation value determining module is used for determining a target temperature section to which the temperature value belongs, and then acquiring a temperature compensation value of the target temperature section;
The second compensation value determining module is used for calculating the sum of the first value to be compensated and the temperature compensation value to obtain a second value to be compensated;
The transmission module is used for inputting the second value to be compensated into a clock chip of the ammeter so that the ammeter compensates the current clock error according to the second value to be compensated.
Further, the system also comprises a polynomial model construction module;
The polynomial model construction module is used for acquiring the ADC value of each temperature of a clock chip of an ammeter under a preset test environment and a first time Zhong Wu difference value obtained after the ammeter is measured by a daily timing error meter under each corresponding temperature; and fitting each temperature ADC value and each corresponding first clock error value to obtain the polynomial model.
Further, the polynomial model construction module is further configured to attenuate each temperature ADC value by a preset multiple when fitting each temperature ADC value and each corresponding first clock error value.
Further, the first to-be-compensated value determining module obtains a clock error initial value of the clock chip, including: acquiring a second clock error value obtained after the electric meter is measured by a daily timing error meter at a preset temperature;
Calculating a third clock error value at the preset temperature through the polynomial model based on a temperature value corresponding to the preset temperature;
and calculating the difference value between the second clock error value and the third clock error value to obtain the clock error initial value of the clock chip.
On the basis of the above method embodiment, another embodiment of the present invention provides a terminal device, where the terminal device includes: a processor, a memory, and a computer program stored in the memory and configured to be executed by the processor, where the processor executes the computer program to implement the method for compensating clock errors of an ammeter according to any one of the above method embodiments of the present invention.
On the basis of the method embodiments, another embodiment of the present invention provides a storage medium, where the storage medium includes a stored computer program, where when the computer program runs, the device where the storage medium is located is controlled to execute the method for compensating the clock error of the ammeter according to any one of the method embodiments of the present invention.
The embodiment of the invention has the following beneficial effects:
the embodiment of the invention provides an ammeter clock error compensation method, an ammeter clock error compensation device, terminal equipment and a storage medium, wherein the ammeter clock error compensation method is used for calculating a corresponding clock error predicted value through a polynomial model for indicating the relation between temperature and a clock error predicted value based on a temperature value of a clock chip; and then, calculating a final value to be compensated by combining the clock error predicted value, the clock error initial value and the temperature compensation value, and inputting the final value to be compensated into a clock chip of the ammeter so that the ammeter compensates the current clock error according to the second value to be compensated.
Drawings
Fig. 1 is a flowchart of an ammeter clock error compensation method according to an embodiment of the present invention.
Fig. 2 is a schematic structural diagram of an ammeter clock error compensation device according to an embodiment of the present invention.
Detailed Description
The following description of the embodiments of the present invention will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present invention, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs; the terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the application; the terms "comprising" and "having" and any variations thereof in the description of the application and the claims and the description of the drawings above are intended to cover a non-exclusive inclusion.
In the description of embodiments of the present application, the technical terms "first," "second," and the like are used merely to distinguish between different objects and are not to be construed as indicating or implying a relative importance or implicitly indicating the number of technical features indicated, a particular order or a primary or secondary relationship. In the description of the embodiments of the present application, the meaning of "plurality" is two or more unless explicitly defined otherwise.
Reference herein to "an embodiment" means that a particular feature, structure, or characteristic described in connection with the embodiment may be included in at least one embodiment of the application. The appearances of such phrases in various places in the specification are not necessarily all referring to the same embodiment, nor are separate or alternative embodiments mutually exclusive of other embodiments. Those of skill in the art will explicitly and implicitly appreciate that the embodiments described herein may be combined with other embodiments.
In the description of the embodiments of the present application, the term "and/or" is merely an association relationship describing an association object, and indicates that three relationships may exist, for example, a and/or B may indicate: a exists alone, A and B exist together, and B exists alone. In addition, the character "/" herein generally indicates that the front and rear associated objects are an "or" relationship.
In the description of the embodiments of the present application, the term "plurality" means two or more (including two), and similarly, "plural sets" means two or more (including two), and "plural sheets" means two or more (including two).
In the description of the embodiments of the present application, unless explicitly specified and limited otherwise, the terms "mounted," "connected," "secured" and the like should be construed broadly and may be, for example, fixedly connected, detachably connected, or integrally formed; or may be mechanically or electrically connected; can be directly connected or indirectly connected through an intermediate medium, and can be communicated with the inside of two elements or the interaction relationship of the two elements. The specific meaning of the above terms in the embodiments of the present application will be understood by those of ordinary skill in the art according to specific circumstances.
As shown in fig. 1, an embodiment of the present invention provides a method for compensating clock error of an electric meter, at least comprising the following steps:
And step S1, periodically acquiring a temperature value of the clock chip in the operation process of the ammeter.
Illustratively, during the operation of the ammeter, the temperature value of the clock chip can be obtained according to a preset time period, and when each time period arrives, the temperature value of the clock chip is extracted once; the preset time period may be set according to the actual situation, and may be, for example, 10 seconds.
And step S2, calculating a clock error predicted value corresponding to the temperature value according to the temperature value and a polynomial model for indicating the relation between the temperature and the clock error predicted value.
In a preferred embodiment, the construction of the polynomial model comprises:
Acquiring the ADC value of each temperature of a clock chip of an ammeter in a preset test environment and a first time Zhong Wu difference value obtained after the ammeter is measured by a daily timing error meter of each corresponding temperature;
and fitting each temperature ADC value and each corresponding first clock error value to obtain the polynomial model.
In a preferred embodiment, each temperature ADC value is attenuated by a predetermined multiple when fitted to each corresponding first clock error value.
Specifically, in an actual scenario, a polynomial model may be constructed as follows:
(1) Placing an ammeter in a constant temperature and humidity box, setting the temperature and humidity of the constant temperature and humidity box, and enabling the interior of the box to reach the target temperature and humidity (namely forming the preset test environment);
(2) The control ammeter outputs 1Hz clock pulse to the daily timing error meter, and starts the daily timing error meter to perform error measurement;
(3) Reading an ADC value of a clock chip of an ammeter and a clock error value measured by a day time error meter;
(4) Repeating the operations (2) to (3) according to the number of the required error points until all the measurement points finish measurement;
(5) Setting a polynomial curve fitting model: y=ax 4+bx3+cx2 +dx+e; y is a clock error predicted value, and x is a temperature value; deducing a relation between the coefficient a, b, c, d, e and the temperature and the error according to the data corresponding to each measuring point obtained in the steps according to a least square method; because the ADC value spans are larger at different temperatures, the fitting effect is poor, so that the ADC values are attenuated by a certain multiple, for example, all the ADC values are reduced by 10 times, the temperature abscissa is denser, and the fitting accuracy is improved;
(6) Polynomial curve fitting is performed on all temperature and error values (i.e., the first time Zhong Wu difference values described above) to obtain coefficients, resulting in a polynomial model y=ax 4+bx3+cx2 +dx+e with known a, b, c, d, e coefficients.
After the polynomial model is determined, substituting the temperature value into the polynomial to obtain a clock error predicted value E p under the corresponding temperature value.
Step S3, obtaining a clock error initial value of a clock chip, and calculating the sum of the clock error initial value and the clock error predicted value to obtain a first value to be compensated;
In a preferred embodiment, the obtaining the initial value of the clock error of the clock chip includes:
acquiring a second clock error value obtained after the electric meter is measured by a daily timing error meter at a preset temperature;
Calculating a third clock error value at the preset temperature through the polynomial model based on a temperature value corresponding to the preset temperature;
and calculating the difference value between the second clock error value and the third clock error value to obtain the clock error initial value of the clock chip.
Specifically, the clock chip temperature T and the clock error E t (i.e., the second clock error value) at a preset temperature (e.g., room temperature) are measured by a day time error meter;
Calculating an error E c (namely the third clock error value) at the current temperature T according to the fitted polynomial;
Calculating an initial value of clock error: e init＝Et-Ec;
And then adding the clock error initial value and the clock error predicted value to obtain a first value to be compensated, wherein the specific formula is as follows: e b＝Einit+Ep; wherein E b is a first to-be-compensated value.
S4, determining a target temperature section to which the temperature value belongs, and then acquiring a temperature compensation value of the target temperature section;
Specifically, in actual situations, a temperature segmentation threshold corresponding to the electric meter is set before the electric meter leaves the factory. Temperature compensation values for each temperature segment;
In the present invention, it is specifically classified into: three target temperature segments of high temperature, low temperature and normal temperature; the high temperature segmentation threshold may be expressed as: t high; the room temperature segmentation threshold may be expressed as: t is a T; the low temperature segmentation threshold may be denoted as T low; the temperature compensation value of the high temperature segment can be expressed as: c high; the temperature compensation value of the room temperature segment can be expressed as: c room; the temperature compensation value of the low temperature section can be expressed as: c low; the values of the temperature segmentation threshold and the temperature compensation value can be set according to actual conditions.
And comparing the current temperature value with each temperature segmentation threshold value to determine a target temperature segmentation to which the temperature value belongs and a corresponding temperature compensation value.
S5, calculating the sum of the first value to be compensated and the temperature compensation value to obtain a second value to be compensated;
Specifically, the second value to be compensated may be calculated by the following formula:
E is the second value to be compensated, namely the finally determined value to be compensated.
And S6, inputting the second value to be compensated into a clock chip of the ammeter so that the ammeter compensates the current clock error according to the second value to be compensated.
Specifically, the E value is converted into a register value of the clock chip and written into the clock chip, so that the ammeter compensates the current clock error according to the E value.
By implementing the embodiment of the invention, dynamic error compensation can be performed according to the real-time temperature of the clock chip.
On the basis of the method item embodiment, the invention correspondingly provides a device item embodiment;
As shown in fig. 2, an embodiment of the present invention provides an ammeter clock error compensation device, including: the device comprises a temperature extraction module, a clock error prediction value determination module, a first to-be-compensated value determination module, a temperature compensation value determination module, a second compensation value determination module and a transmission module;
the temperature extraction module is used for periodically acquiring the temperature value of the clock chip in the operation process of the ammeter;
The clock error prediction value determining module is used for calculating a clock error prediction value corresponding to a temperature value according to the temperature value and a polynomial model for indicating the relation between the temperature and the clock error prediction value;
The first to-be-compensated value determining module is used for obtaining a clock error initial value of the clock chip, and calculating the sum of the clock error initial value and the clock error predicted value to obtain a first to-be-compensated value;
the temperature compensation value determining module is used for determining a target temperature section to which the temperature value belongs, and then acquiring a temperature compensation value of the target temperature section;
The second compensation value determining module is used for calculating the sum of the first value to be compensated and the temperature compensation value to obtain a second value to be compensated;
The transmission module is used for inputting the second value to be compensated into a clock chip of the ammeter so that the ammeter compensates the current clock error according to the second value to be compensated.
In a preferred embodiment, the method further comprises a polynomial model construction module;
The polynomial model construction module is used for acquiring the ADC value of each temperature of a clock chip of an ammeter under a preset test environment and a first time Zhong Wu difference value obtained after the ammeter is measured by a daily timing error meter under each corresponding temperature; and fitting each temperature ADC value and each corresponding first clock error value to obtain the polynomial model.
In a preferred embodiment, the polynomial model building module is further configured to attenuate each temperature ADC value by a preset multiple when fitting each temperature ADC value and each corresponding first clock error value.
In a preferred embodiment, the first to-be-compensated value determining module obtains a clock error initial value of a clock chip, including: acquiring a second clock error value obtained after the electric meter is measured by a daily timing error meter at a preset temperature;
Calculating a third clock error value at the preset temperature through the polynomial model based on a temperature value corresponding to the preset temperature;
and calculating the difference value between the second clock error value and the third clock error value to obtain the clock error initial value of the clock chip.
It should be noted that the above-described apparatus embodiments are merely illustrative, and the units described as separate units may or may not be physically separate, and units shown as units may or may not be physical units, may be located in one place, or may be distributed over a plurality of network units. Some or all of the modules may be selected according to actual needs to achieve the purpose of the solution of this embodiment. In addition, in the drawings of the embodiment of the ammeter clock error compensation device provided by the invention, the connection relation between the modules represents that the modules are in communication connection, and the ammeter clock error compensation device can be specifically realized as one or more communication buses or signal lines. Those of ordinary skill in the art will understand and implement the present invention without undue burden.
It will be clearly understood by those skilled in the art that, for convenience and brevity, the specific working process of the apparatus described above may refer to the corresponding process in the foregoing method embodiment, which is not repeated herein.
On the basis of the embodiments of the above method items, the present invention correspondingly provides a terminal device, which comprises a processor, a memory and a computer program stored in the memory and configured to be executed by the processor, wherein the processor executes the computer program to realize the ammeter clock error compensation method.
The Processor may be a central processing unit (Central Processing Unit, CPU), other general purpose Processor, digital signal Processor (DIGITAL SIGNAL Processor, DSP), application SPECIFIC INTEGRATED Circuit (ASIC), off-the-shelf Programmable gate array (Field-Programmable GATE ARRAY, FPGA) or other Programmable logic device, discrete gate or transistor logic device, discrete hardware components, or the like. The general purpose processor may be a microprocessor or the processor may be any conventional processor or the like, which is a control center of the terminal device, and which connects various parts of the entire terminal device using various interfaces and lines.
The memory may be used to store the computer program, and the processor may implement various functions of the terminal device by running or executing the computer program stored in the memory and invoking data stored in the memory. The memory may mainly include a storage program area and a storage data area, wherein the storage program area may store an operating system, an application program required for at least one function, and the like; the storage data area may store data created according to the use of the cellular phone, etc. In addition, the memory may include high-speed random access memory, and may also include non-volatile memory, such as a hard disk, memory, plug-in hard disk, smart memory card (SMART MEDIA CARD, SMC), secure Digital (SD) card, flash memory card (FLASH CARD), at least one disk storage device, flash memory device, or other volatile solid-state storage device.
On the basis of the method item embodiment of the invention, another embodiment is provided;
an embodiment of the present invention provides a storage medium, where the storage medium includes a stored computer program, where the computer program controls a device where the storage medium is located to execute the method for compensating clock error of an ammeter according to any one of the foregoing embodiments of the present invention when running the computer program.
The storage medium referred to herein is a computer-readable storage medium. The modules/units integrated in the meter clock error compensation method may be stored in a computer readable storage medium if implemented in the form of software functional units and sold or used as a stand alone product. Based on such understanding, the present invention may implement all or part of the flow of the method of the above embodiment, or may be implemented by a computer program to instruct related hardware, where the computer program may be stored in a computer readable storage medium, and when the computer program is executed by a processor, the computer program may implement the steps of each of the method embodiments described above. Wherein the computer program comprises computer program code which may be in source code form, object code form, executable file or some intermediate form etc. The computer readable medium may include: any entity or device capable of carrying the computer program code, a recording medium, a U disk, a removable hard disk, a magnetic disk, an optical disk, a computer Memory, a Read-Only Memory (ROM), a random access Memory (RAM, random Access Memory), an electrical carrier signal, a telecommunications signal, a software distribution medium, and so forth.
While the foregoing is directed to the preferred embodiments of the present invention, it will be appreciated by those skilled in the art that changes and modifications may be made without departing from the principles of the invention, such changes and modifications are also intended to be within the scope of the invention.
Claims (10)
1. An ammeter clock error compensation method, comprising:
In the operation process of the ammeter, periodically acquiring the temperature value of the clock chip;
Calculating a clock error predicted value corresponding to a temperature value according to the temperature value and a polynomial model for indicating the relation between the temperature and the clock error predicted value;
acquiring a clock error initial value of a clock chip, and calculating the sum of the clock error initial value and the clock error predicted value to obtain a first value to be compensated;
determining a target temperature section to which the temperature value belongs, and then acquiring a temperature compensation value of the target temperature section;
calculating the sum of the first value to be compensated and the temperature compensation value to obtain a second value to be compensated;
And inputting the second value to be compensated into a clock chip of the ammeter so that the ammeter compensates the current clock error according to the second value to be compensated.
2. The meter clock error compensation method of claim 1, wherein the constructing of the polynomial model comprises:
Acquiring the ADC value of each temperature of a clock chip of an ammeter in a preset test environment and a first time Zhong Wu difference value obtained after the ammeter is measured by a daily timing error meter of each corresponding temperature;
and fitting each temperature ADC value and each corresponding first clock error value to obtain the polynomial model.
3. The meter clock error compensation method of claim 2, wherein each temperature ADC value is attenuated by a predetermined multiple when fitting each temperature ADC value and each corresponding first clock error value.
4. The method for compensating clock error of an electric meter according to claim 3, wherein the step of obtaining the initial value of the clock error of the clock chip comprises:
acquiring a second clock error value obtained after the electric meter is measured by a daily timing error meter at a preset temperature;
Calculating a third clock error value at the preset temperature through the polynomial model based on a temperature value corresponding to the preset temperature;
and calculating the difference value between the second clock error value and the third clock error value to obtain the clock error initial value of the clock chip.
5. An ammeter clock error compensation device, comprising: the device comprises a temperature extraction module, a clock error prediction value determination module, a first to-be-compensated value determination module, a temperature compensation value determination module, a second compensation value determination module and a transmission module;
the temperature extraction module is used for periodically acquiring the temperature value of the clock chip in the operation process of the ammeter;
The clock error prediction value determining module is used for calculating a clock error prediction value corresponding to a temperature value according to the temperature value and a polynomial model for indicating the relation between the temperature and the clock error prediction value;
The first to-be-compensated value determining module is used for obtaining a clock error initial value of the clock chip, and calculating the sum of the clock error initial value and the clock error predicted value to obtain a first to-be-compensated value;
the temperature compensation value determining module is used for determining a target temperature section to which the temperature value belongs, and then acquiring a temperature compensation value of the target temperature section;
The second compensation value determining module is used for calculating the sum of the first value to be compensated and the temperature compensation value to obtain a second value to be compensated;
The transmission module is used for inputting the second value to be compensated into a clock chip of the ammeter so that the ammeter compensates the current clock error according to the second value to be compensated.
6. The meter clock error compensation device of claim 5, further comprising a polynomial model building module;
The polynomial model construction module is used for acquiring the ADC value of each temperature of a clock chip of an ammeter under a preset test environment and a first time Zhong Wu difference value obtained after the ammeter is measured by a daily timing error meter under each corresponding temperature; and fitting each temperature ADC value and each corresponding first clock error value to obtain the polynomial model.
7. The meter clock error compensation device of claim 6, wherein the polynomial model building block is further configured to attenuate each temperature ADC value by a predetermined multiple when fitting each temperature ADC value and each corresponding first clock error value.
8. The meter clock error compensation device of claim 7, wherein the first to-be-compensated value determination module obtains a clock error initial value of a clock chip, comprising: acquiring a second clock error value obtained after the electric meter is measured by a daily timing error meter at a preset temperature;
Calculating a third clock error value at the preset temperature through the polynomial model based on a temperature value corresponding to the preset temperature;
and calculating the difference value between the second clock error value and the third clock error value to obtain the clock error initial value of the clock chip.
9. A terminal device comprising a processor, a memory and a computer program stored in the memory and configured to be executed by the processor, the processor implementing the ammeter clock error compensation method according to any one of claims 1 to 4 when executing the computer program.
10. A storage medium comprising a stored computer program, wherein the computer program, when run, controls a device in which the storage medium is located to perform the method of ammeter clock error compensation as claimed in any one of claims 1 to 4.
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| Application Number | Priority Date | Filing Date | Title |
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| CN202311852727.8A CN118034010A (en) | 2023-12-29 | 2023-12-29 | Ammeter clock error compensation method and device, terminal equipment and storage medium |
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| CN202311852727.8A CN118034010A (en) | 2023-12-29 | 2023-12-29 | Ammeter clock error compensation method and device, terminal equipment and storage medium |
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