CN118033365A - Device and method for high-speed differential signal mass production test - Google Patents
Device and method for high-speed differential signal mass production test Download PDFInfo
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- CN118033365A CN118033365A CN202311784494.2A CN202311784494A CN118033365A CN 118033365 A CN118033365 A CN 118033365A CN 202311784494 A CN202311784494 A CN 202311784494A CN 118033365 A CN118033365 A CN 118033365A
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- 238000012360 testing method Methods 0.000 title claims abstract description 107
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 23
- 238000000034 method Methods 0.000 title claims abstract description 8
- 238000005070 sampling Methods 0.000 claims abstract description 35
- 239000003990 capacitor Substances 0.000 claims description 8
- 238000011990 functional testing Methods 0.000 claims description 4
- 238000010586 diagram Methods 0.000 description 5
- 230000003321 amplification Effects 0.000 description 3
- 238000003199 nucleic acid amplification method Methods 0.000 description 3
- 230000003071 parasitic effect Effects 0.000 description 3
- 239000004065 semiconductor Substances 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 230000003993 interaction Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000024241 parasitism Effects 0.000 description 1
- 239000000523 sample Substances 0.000 description 1
- 230000008054 signal transmission Effects 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
- 230000001360 synchronised effect Effects 0.000 description 1
Classifications
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/12—Analogue/digital converters
- H03M1/124—Sampling or signal conditioning arrangements specially adapted for A/D converters
- H03M1/1245—Details of sampling arrangements or methods
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H11/00—Networks using active elements
- H03H11/02—Multiple-port networks
- H03H11/32—Networks for transforming balanced signals into unbalanced signals and vice versa, e.g. baluns
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- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
The invention discloses a device and a method for high-speed differential signal mass production test, wherein the device comprises a differential-to-single-end sampling circuit, the differential-to-single-end sampling circuit is arranged between a test board card and equipment to be tested and is respectively connected with the test board card and the equipment to be tested, the differential-to-single-end sampling circuit is used for converting high-speed differential signals output by the equipment to be tested into single-end signals which can be measured by a test machine, and the single-end signals are sent into the test machine through the test board card. According to the invention, the high-speed differential signal is converted into the high-speed single-ended signal through the differential-to-single-ended sampling circuit, so that the high-speed differential signal sampling is realized without an external oscilloscope, and the accuracy of a test result is improved.
Description
Technical Field
The invention belongs to the field of high-speed differential signal mass production testing of semiconductor chips, and particularly relates to a testing method for converting differential signals into single-ended signals which can be used by a testing machine by utilizing an operational amplifier to construct a differential amplifying circuit, in particular to a device and a method for high-speed differential signal mass production testing.
Background
The current semiconductor chip high-speed differential signal test mainly comprises two test schemes:
(1) As shown in FIG. 1, a high-speed oscilloscope is externally connected to a test machine, and a differential probe of the high-speed oscilloscope is used for testing signals to be tested.
(2) As shown in FIG. 2, two channels of the machine are adopted to measure the differential signal single-end to the ground, the environmental connection is simple, but when the machine tests the high-speed signal, the differential signal result has time domain deviation due to the non-equal length of the wiring of the board card and the deviation of the acquired signal, and meanwhile, waveform distortion can occur when the high-speed signal arrives at the board card due to the problem of driving capability, and the test result is inaccurate.
Disclosure of Invention
In order to overcome the defects in the prior art, the invention provides a device and a method for mass production testing of high-speed differential signals, which convert the high-speed differential signals into high-speed single-ended signals through a differential-to-single-ended sampling circuit, realize high-speed differential signal sampling without an external oscilloscope, and improve the accuracy of test results.
According to an aspect of the present disclosure, a device for mass production testing of high-speed differential signals is provided, including a differential-to-single-ended sampling circuit, where the differential-to-single-ended sampling circuit is disposed between a test board and a device to be tested and connected to the test board and the test board, respectively, and is configured to convert high-speed differential signals output by the device to be tested into single-ended signals that can be measured by a test machine, where the single-ended signals are sent to the test machine through the test board.
As a further technical scheme, the test board card is also connected with a function test port of the device to be tested through a cable and is used for testing other functions of the device to be tested while testing the high-speed differential signals.
As a further technical scheme, the differential-to-single-ended sampling circuit comprises two analog amplifiers, wherein the positive end of a first analog amplifier is connected with the high end of a high-speed differential signal, and the output ends of the first analog amplifier are respectively connected with the negative ends of the two analog amplifiers; the positive end of the second analog amplifier is connected with the low end of the high-speed differential signal, and the output end of the second analog amplifier is respectively connected with the negative end of the second analog amplifier and the output end of the sampling circuit.
As a further technical scheme, the positive end of the first analog amplifier is connected with a first resistor in series, the positive end of the second analog amplifier is connected with a second resistor in series, and the resistance values of the first resistor and the second resistor are equal.
As a further technical scheme, the negative end of the first analog amplifier is grounded through a third resistor, the output end of the first analog amplifier is connected to the negative end of the first analog amplifier through a fourth resistor in parallel with a first capacitor in a feedback manner, and the resistance values of the third resistor and the fourth resistor are equal.
As a further technical scheme, the output end of the first analog amplifier is connected to the negative end of the second analog amplifier through a fifth resistor in series, the output end of the second analog amplifier is connected to the negative end of the second analog amplifier through a sixth resistor in parallel with a second capacitor in feedback, and the resistance values of the fifth resistor and the sixth resistor are equal.
As a further technical solution, the operational amplifier bandwidths of the two analog amplifiers are determined according to the actual signal frequency to be measured.
As a further technical scheme, the input end of the differential-to-single-ended sampling circuit is rail-to-rail high-resistance input.
According to an aspect of the present disclosure, there is provided a method for high-speed differential signal mass production testing, including:
Acquiring a high-speed differential signal of a device to be tested;
converting the high-speed differential signals to obtain single-ended signals which can be tested by a test machine;
And transmitting the single-ended signal to a test machine for testing.
Compared with the prior art, the invention has the beneficial effects that:
1. According to the invention, a differential sampling circuit is built by utilizing a basic analog device, so that a differential test signal is converted into a single-ended signal which can be measured by a mass production machine, and meanwhile, the problem that most test platforms cannot test negative pressure signals is solved.
2. The invention does not need extra oscilloscope instruments to carry out sampling test, so that the machine test environment is lower in cost and high in reliability.
3. According to the invention, the driving capability of the signal is enhanced after the sampling circuit is added at the near end of the signal to be tested, so that waveform distortion caused by the parasitic of the board card and the cable is reduced, and the test result is more accurate.
Drawings
FIG. 1 is a schematic diagram of the connection of test differential signals of an external oscilloscope of a machine in the prior art.
Fig. 2 is a schematic diagram of a connection of a machine for testing differential signals through two channels in the prior art.
Fig. 3 is a schematic diagram of test connection of a high-speed differential signal mass production test device according to an embodiment of the invention.
Fig. 4 is a schematic diagram of a differential-to-single-ended sampling circuit according to an embodiment of the invention.
Fig. 5 is a schematic diagram of input/output waveforms of a differential sampling circuit according to an embodiment of the present invention.
Detailed Description
It should be noted that, the board I/O port of the current machine station cannot directly test the differential signal, and the external oscilloscope is used for testing, so that the complexity of the machine station environment is increased, the oscilloscope testing rate is generally slower, the overall testing time is increased during mass production, and the testing cost is high. When two ports of the differential signal are tested respectively by using two channels, the machine is usually provided with longer wiring and parasitic capacitance, so that the waveform of the high-speed signal is distorted, and the testing error is larger. In addition, the two-channel test high-speed signal has asymmetry in time domain, so that the sampling signal and the real signal have difference.
Aiming at the problems, the invention utilizes the analog operational amplifier circuit, outputs the differential signal into the single-ended signal after differential amplification through high-speed sampling of the differential signal, and sends the single-ended signal to the test machine for testing without an external oscilloscope, and meanwhile, waveform distortion caused by board test card and cable parasitism is reduced, so that the test result is more accurate. The embodiment of the invention is suitable for the field of mass production differential signal testing of chips or other products.
The following description of the embodiments of the present invention will be made more apparent and fully hereinafter with reference to the accompanying drawings, in which some, but not all embodiments of the invention are shown. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to fall within the scope of the invention.
In the description of the present invention, it should be understood that the terms "first," "second," and the like are used for descriptive purposes only and are not to be construed as indicating or implying a relative importance or number of technical features indicated. Thus, a feature defining "a first" or "a second" may explicitly or implicitly include one or more of the described features. In the description of the present invention, the meaning of "a plurality" is two or more, unless explicitly defined otherwise.
In the description of the present invention, it should be noted that, unless explicitly specified and limited otherwise, the terms "mounted," "connected," and "connected" are to be construed broadly, and may be either fixedly connected, detachably connected, or integrally connected, for example; can be mechanically connected, electrically connected or can be communicated with each other; can be directly connected or indirectly connected through an intermediate medium, and can be communicated with the inside of two elements or the interaction relationship of the two elements. The specific meaning of the above terms in the present invention can be understood by those of ordinary skill in the art according to the specific circumstances.
Example 1
The embodiment provides a device for high-speed differential signal mass production test, which comprises a differential-to-single-ended sampling circuit, wherein the differential-to-single-ended sampling circuit is arranged between a test board card and equipment to be tested and is respectively connected with the test board card and the equipment to be tested and is used for converting high-speed differential signals output by the equipment to be tested into single-ended signals which can be measured by a test machine, and the single-ended signals are sent into the test machine through the test board card.
As shown in FIG. 3, the test machine station connects a plurality of signals to be tested to the test board card through the test bus, the test board card is connected to each signal port to be tested of the equipment to be tested EUT through the test bus, and the differential signals on the equipment to be tested EUT are connected to the test board card after passing through the differential-to-single-ended sampling circuit.
Further, one cable of the test board card is connected with the differential-to-single-ended sampling circuit, and other test buses are connected with the functional test ports of the equipment to be tested. The functional test port comprises power consumption, voltage, communication logic functions and the like, and the test machine can realize the functional tests of the equipment to be tested simultaneously when the chip differential signal test is realized.
As shown in fig. 4, the analog amplifiers OP1 and OP2 constitute an operational amplifier differential signal amplifying circuit.
Specifically, the high end of the differential input signal is connected to the positive end input of the analog amplifier OP1 through the series resistor R1, and the negative end input of the analog amplifier OP1 is connected to GND through the resistor R3.
The output end of the analog amplifier OP1 is connected to the negative end input of the analog amplifier OP1 through a resistor R4 and a capacitor C1 in parallel in a feedback manner, and the input signal is amplified to the output end by 2 times by configuring r3=r4.
The output of the analog amplifier OP1 is connected in series to the negative end input of the analog amplifier OP2 through a resistor R5, the low end of the differential input signal is connected in series to the positive end input of the analog amplifier OP2 through a resistor R2, the output end of the analog amplifier OP2 is connected in feedback to the negative end input of the analog amplifier OP2 through a resistor R6 and a capacitor C2 in parallel, and R5=R6 is configured to realize 2 times amplification of the input signal to the output end.
Further, the resistor is configured as r1=r2, r3=r4=r5=r6. For impedance matching of the board level, the R1/R2/R7 resistor is generally selected for impedance matching of 50 omega typical signal transmission, and 2 times of synchronous amplification of the difference value of the differential signals can be realized, so that a single-ended signal with 2 times of differential output is obtained.
Optionally, the operational amplifier bandwidths of the analog amplifiers OP1 and OP2 may select an operational amplifier with a bandwidth more than 10 times of the bandwidth of the signal to be tested according to the actual frequency of the signal to be tested, so as to meet the requirement of the high-speed differential signal for testing the universality.
Optionally, the differential operational amplifier input end is rail-to-rail high-resistance input and supports positive and negative pressure signal input, so that the common mode level of the differential signal supports positive and negative pressure input test, and the compatibility of the test platform is improved.
As shown in fig. 5, the signal sig_out=2 (sig_inp-sig_inn) at the output end of the differential-to-single-ended sampling circuit, where sig_inp and sig_inn are high-speed differential signals input by the differential-to-single-ended sampling circuit, respectively, and sig_out is an output signal of the differential-to-single-ended sampling circuit, and has an amplitude 2 times that of the original differential signal, and pulse width, frequency, and original differential signal values.
Example 2
Based on the same inventive concept as embodiment 1, this embodiment provides a method of high-speed differential signal mass production testing, including:
Acquiring a high-speed differential signal of a device to be tested;
converting the high-speed differential signals to obtain single-ended signals which can be tested by a test machine;
And transmitting the single-ended signal to a test machine for testing.
Specific functional implementation of the above steps is referred to the relevant content in the apparatus of embodiment 1, and is not repeated herein, and it is specifically noted that:
The conversion of the high-speed differential signal is realized through a differential-to-single-ended sampling circuit, and the differential-to-single-ended sampling circuit comprises two analog amplifiers, wherein the positive end of a first analog amplifier is connected with the high end of the high-speed differential signal, and the output ends of the first analog amplifier are respectively connected with the negative ends of the two analog amplifiers; the positive end of the second analog amplifier is connected with the low end of the high-speed differential signal, and the output end of the second analog amplifier is respectively connected with the negative end of the second analog amplifier and the output end of the sampling circuit.
The positive end of the first analog amplifier is connected with a first resistor in series, the positive end of the second analog amplifier is connected with a second resistor in series, and the resistance values of the first resistor and the second resistor are equal.
The negative end of the first analog amplifier is grounded through a third resistor, the output end of the first analog amplifier is connected to the negative end of the first analog amplifier in parallel with a first capacitor through a fourth resistor in a feedback manner, and the resistance values of the third resistor and the fourth resistor are equal.
The output end of the first analog amplifier is connected to the negative end of the second analog amplifier through a fifth resistor in series, the output end of the second analog amplifier is connected to the negative end of the second analog amplifier through a sixth resistor in parallel with a second capacitor in feedback, and the resistance values of the fifth resistor and the sixth resistor are equal.
In summary, according to the embodiment of the invention, the differential to single-ended sampling circuit at the near end of the chip is added on the mass production test single board, so that the high-speed differential signal is converted into the high-speed single-ended signal, an external oscilloscope is not required, and meanwhile, the high-speed signal is sent to the machine test board card by utilizing the high driving capability of the operational amplifier, so that the waveform distortion caused by the parasitic of the board card cable is reduced, the test environment is simplified, and the test precision is improved.
Finally, it should be noted that: the above embodiments are only for illustrating the technical solution of the present invention, and are not limiting; although the invention has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical scheme described in the foregoing embodiments can be modified or some or all of the technical features thereof can be replaced with equivalents; these modifications or substitutions do not depart from the essence of the corresponding technical solutions from the technical solutions of the embodiments of the present invention.
Claims (9)
1. The device for the mass production test of the high-speed differential signals is characterized by comprising a differential-to-single-ended sampling circuit, wherein the differential-to-single-ended sampling circuit is arranged between a test board card and equipment to be tested and is respectively connected with the test board card and the equipment to be tested and is used for converting the high-speed differential signals output by the equipment to be tested into single-ended signals which can be measured by a test machine, and the single-ended signals are sent into the test machine through the test board card.
2. The apparatus of claim 1, wherein the test board card is further connected to a functional test port of the device under test by a cable for testing other functions of the device under test while testing the high-speed differential signal.
3. The device for mass production testing of high-speed differential signals according to claim 1, wherein the differential-to-single-ended sampling circuit comprises two analog amplifiers, wherein the positive end of a first analog amplifier is connected with the high end of the high-speed differential signals, and the output ends of the first analog amplifier are respectively connected with the negative ends of the two analog amplifiers; the positive end of the second analog amplifier is connected with the low end of the high-speed differential signal, and the output end of the second analog amplifier is respectively connected with the negative end of the second analog amplifier and the output end of the sampling circuit.
4. The apparatus for mass production testing of high-speed differential signals as claimed in claim 3, wherein the positive terminal of the first analog amplifier is connected in series with a first resistor, the positive terminal of the second analog amplifier is connected in series with a second resistor, and the resistance values of the first resistor and the second resistor are equal.
5. A device for mass production testing of high-speed differential signals according to claim 3, wherein the negative terminal of the first analog amplifier is grounded through a third resistor, the output terminal of the first analog amplifier is connected to the negative terminal thereof through a fourth resistor in parallel with the first capacitor feedback, and the resistance values of the third resistor and the fourth resistor are equal.
6. A device for mass production testing of high-speed differential signals according to claim 3, wherein the output end of the first analog amplifier is connected to the negative end of the second analog amplifier through a fifth resistor in series, the output end of the second analog amplifier is connected to the negative end of the second analog amplifier through a sixth resistor in parallel with the second capacitor in feedback, and the resistance values of the fifth resistor and the sixth resistor are equal.
7. A device for high-speed differential signal mass production testing according to any of claims 3-6, wherein the operational amplifier bandwidths of two of said analog amplifiers are determined according to the actual signal frequency under test.
8. The apparatus for high-speed differential signal mass production testing according to any one of claims 3 to 6, wherein the input terminal of the differential-to-single-ended sampling circuit is a rail-to-rail high-resistance input.
9. A method for mass production testing of high-speed differential signals, comprising:
Acquiring a high-speed differential signal of a device to be tested;
converting the high-speed differential signals to obtain single-ended signals which can be tested by a test machine;
And transmitting the single-ended signal to a test machine for testing.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202311784494.2A CN118033365A (en) | 2023-12-21 | 2023-12-21 | Device and method for high-speed differential signal mass production test |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202311784494.2A CN118033365A (en) | 2023-12-21 | 2023-12-21 | Device and method for high-speed differential signal mass production test |
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| Publication Number | Publication Date |
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| CN118033365A true CN118033365A (en) | 2024-05-14 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN202311784494.2A Pending CN118033365A (en) | 2023-12-21 | 2023-12-21 | Device and method for high-speed differential signal mass production test |
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| CN (1) | CN118033365A (en) |
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- 2023-12-21 CN CN202311784494.2A patent/CN118033365A/en active Pending
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