CN118032704A

CN118032704A - Millimeter wave/terahertz wave parameter testing device, millimeter wave/terahertz wave parameter testing method, millimeter wave/terahertz wave parameter processing method and millimeter wave/terahertz wave parameter processing equipment

Info

Publication number: CN118032704A
Application number: CN202310097549.6A
Authority: CN
Inventors: 王懋; 周奇; 秦华; 于润; 靳琳
Original assignee: Suzhou Institute of Nano Tech and Nano Bionics of CAS
Current assignee: Suzhou Institute of Nano Tech and Nano Bionics of CAS
Priority date: 2023-02-10
Filing date: 2023-02-10
Publication date: 2024-05-14

Abstract

The invention discloses a millimeter wave/terahertz wave parameter testing device, a testing method, a parameter processing method and processing equipment. The emission source assembly comprises an emission source capable of continuously modulating frequencies, the emission source is used for emitting millimeter waves or terahertz waves, the emission source assembly is provided with an emission surface, and the millimeter waves or terahertz waves emitted by the emission source are emitted from the emission surface; the detector takes the position of the emergent surface as the circle center and is rotatably arranged relative to the emission source component, and the detector is used for receiving millimeter waves or terahertz waves emitted by the emergent surface. The millimeter wave/terahertz wave parameter testing device, the testing method, the parameter processing method and the processing equipment can realize the testing of a plurality of parameters of millimeter wave/terahertz wave beams and acquire a plurality of key parameter indexes of the beams, and have important significance for the rapid, efficient and standardized testing of the tested millimeter wave/terahertz wave beams.

Description

Millimeter wave/terahertz wave parameter testing device, millimeter wave/terahertz wave parameter testing method, millimeter wave/terahertz wave parameter processing method and millimeter wave/terahertz wave parameter processing equipment

Technical Field

The invention relates to the technical field of electromagnetic wave testing, in particular to a millimeter wave and terahertz wave parameter testing device, a testing method, a parameter processing method and processing equipment.

Background

In recent years, with the rapid development of wireless mobile communication technology, the age of 6G wireless communication technology development has been advanced, and the capacity of 6G communication will be mainly increased by utilizing terahertz band (0.3 THz-3 THz) to millimeter wave band (30-300 GHz). The band in the range of 0.3THz to 3THz has not been allocated for any use worldwide and therefore has the potential to achieve desirably high data rates. The beam regulation device prepared from passive or active super-surface materials, super-structure materials and metamaterials is used as a key technology in a 6G communication wireless channel, and has few reports on key parameter testing technologies such as regulating bandwidth, regulating frequency, beam angle, gain effect and the like, and the development of the 6G communication wireless channel is restricted by the lack of a testing mode.

The information disclosed in this background section is only for enhancement of understanding of the general background of the invention and should not be taken as an acknowledgement or any form of suggestion that this information forms the prior art already known to a person of ordinary skill in the art.

Disclosure of Invention

The invention aims to provide a millimeter wave and terahertz wave parameter testing device, a testing method, a parameter processing method and processing equipment, which can realize the testing of a plurality of parameters of millimeter wave/terahertz wave beams and acquire a plurality of key parameter indexes of the beams, and have important significance for the rapid, efficient and standardized testing of the millimeter wave/terahertz wave beams to be tested.

In order to achieve the above purpose, an embodiment of the present invention provides a millimeter wave and terahertz wave parameter testing apparatus, which includes an emission source assembly and a detector. The emission source assembly comprises an emission source capable of continuously modulating frequencies, the emission source is used for emitting millimeter waves or terahertz waves, the emission source assembly is provided with an emission surface, and the millimeter waves or terahertz waves emitted by the emission source are emitted from the emission surface; the detector takes the position of the emergent surface as the circle center and is rotatably arranged relative to the emission source component, and the detector is used for receiving millimeter waves or terahertz waves emitted by the emergent surface.

In one or more embodiments of the present invention, the millimeter wave and terahertz wave parameter testing apparatus further includes a host computer, where the host computer is connected to the emission source assembly and the detector, and is configured to control and record an emission frequency of the emission source, control and record a rotation angle of the detector relative to the emission source assembly, and acquire detection data of the detector.

In one or more embodiments of the present invention, the millimeter wave and terahertz wave parameter testing apparatus further includes an arc track or a circular track, and a stepper motor, where the stepper motor is connected to the upper computer; the emitting surface of the emitting source component is positioned at the arc center of the arc track or at the circle center of the circular track, the detector is arranged on the arc track or the circular track and connected with the stepping motor, and the detector can move along the arc track or the circular track under the control of the stepping motor.

In one or more embodiments of the present invention, the emission source includes a microwave source, a frequency multiplier for multiplying the microwave emitted by the microwave source to a millimeter wave or terahertz wave band, and a waveguide antenna disposed at an emission end of the frequency multiplier, where the emission end of the waveguide antenna is the emission surface.

In one or more embodiments of the present invention, the emission source assembly further includes a beam steering device, the beam steering device is located on an emission light path of the emission source, and an exit end of the beam steering device is the exit surface.

In one or more embodiments of the present invention, the emission source includes a microwave source, a frequency multiplier for multiplying the microwave emitted from the microwave source to a millimeter wave or terahertz wave band, and a waveguide antenna provided at a side of the frequency multiplier remote from the microwave source.

In one or more embodiments of the invention, the beam steering device comprises a transmissive or reflective active or passive electromagnetic wave steering device made of a metasurface material or a metamaterial.

In one or more embodiments of the invention, the waveguide antenna comprises a pyramid horn antenna or a cone horn antenna or a sector horn antenna or a horn lens antenna or a corrugated horn antenna or a waveguide probe antenna.

In one or more embodiments of the present invention, the millimeter wave and terahertz wave parameter testing apparatus further includes an optical element group disposed on an optical path emitted by the emission source, where the optical element group is used to focus the millimeter wave or terahertz wave onto the detector.

In one or more embodiments of the invention, the optical element group includes a collimating lens disposed between the waveguide antenna and the beam steering device.

In one or more embodiments of the present invention, the collimating lens comprises one or more of a high-resistance silicon lens, a TPX lens, a polytetrafluoroethylene lens, a high-density polyethylene lens.

In one or more embodiments of the present invention, the optical element group further includes an off-axis parabolic mirror disposed between the beam steering device and the detector, and the off-axis parabolic mirror is disposed in synchronous and co-rotating manner with the detector, for reflecting millimeter waves or terahertz waves onto the detector.

The invention also provides a testing method based on the millimeter wave and terahertz wave parameter testing device, which comprises the following steps: controlling the emission source component to emit millimeter waves or terahertz waves with continuous frequency modulation, wherein the frequency of the millimeter waves or the terahertz waves is increased by a fixed frequency modulation step length; controlling the detector to rotate and scan at a fixed angle step length to receive the millimeter wave or terahertz wave; and collecting the frequency of millimeter waves or terahertz waves emitted by the emission source component, and rotating the scanning angle of the detector at the frequency and the amplitude intensity received by the detector in the previous fixed frequency modulation step length when the frequency is reached so as to obtain a three-dimensional graph of the amplitude intensity, frequency and angle relation distribution of millimeter wave or terahertz wave beams.

In one or more embodiments of the invention, the frequency modulation range is 30 to 300GHz or 0.3THz to 3THz; the rotation scanning angle is 0-360 degrees.

The invention also provides a processing method of millimeter wave and terahertz wave parameters, which comprises the following steps: obtaining a three-dimensional graph of amplitude intensity, frequency and angular relation distribution of millimeter wave or terahertz wave beams; based on the three-dimensional graph, acquiring millimeter wave or terahertz wave beam frequency-intensity characteristics, millimeter wave or terahertz wave beam frequency-angle characteristics, 3dB wave beam angle characteristics, a direction graph of the frequency to be analyzed and wave beam change analysis data by utilizing a data algorithm.

In one or more embodiments of the present invention, the acquiring, based on the three-dimensional map, the millimeter wave or terahertz beam frequency-intensity characteristic using a data algorithm includes: and extracting the maximum amplitude intensity in the rotating scanning angle range in each frequency point based on the three-dimensional graph, and acquiring the frequency-intensity characteristic of the millimeter wave or terahertz wave beam, wherein the frequency is an abscissa axis, and the maximum amplitude intensity is an ordinate axis.

In one or more embodiments of the present invention, the acquiring millimeter wave or terahertz wave beam frequency-angle characteristics using a data algorithm based on the three-dimensional map includes: and extracting an angle value corresponding to the maximum amplitude intensity of each frequency point based on the three-dimensional graph, and acquiring the frequency-angle characteristic of the millimeter wave or terahertz wave beam, wherein the frequency is an abscissa axis, and the angle value corresponding to the maximum amplitude is an ordinate.

In one or more embodiments of the present invention, the acquiring the-3 dB beam angle characteristic using a data algorithm based on the three-dimensional map includes: and extracting an angle and amplitude distribution diagram of a frequency point to be analyzed, wherein the angle is an abscissa axis, the amplitude intensity is an ordinate axis, and-3 dB is extracted as an effective value to analyze the divergence angle of the-3 dB beam angle and the angle value of the-3 dB beam angle.

In one or more embodiments of the present invention, the obtaining, based on the three-dimensional map, a pattern of frequencies to be analyzed using a data algorithm includes: and extracting amplitude ranges corresponding to angle values of the frequency points to be analyzed, and establishing an analysis result in a polar coordinate system (r _E, theta), wherein the value r _E is amplitude intensity, and the value theta is an angle value.

In one or more embodiments of the present invention, the three-dimensional map includes a three-dimensional map based on a waveguide antenna and a three-dimensional map based on a beam steering device; based on the three-dimensional graph, acquiring beam change analysis data by using a data algorithm comprises the following steps: and carrying out subtraction or division operation on the obtained three-dimensional diagram based on the beam regulation device and the obtained three-dimensional diagram based on the waveguide antenna, wherein an operation result is qualitative or quantitative beam change analysis data.

In order to achieve the above object, another technical scheme adopted by the present application is as follows:

There is provided an electronic device comprising:

At least one processor; and

A memory storing instructions that, when executed by the at least one processor, cause the at least one processor to perform the method of processing millimeter wave, terahertz wave parameters as described in any of the embodiments above.

There is provided a machine-readable storage medium storing executable instructions that, when executed, cause the machine to perform a method of processing millimeter wave, terahertz wave parameters as described in any one of the embodiments above.

Compared with the prior art, the millimeter wave and terahertz wave parameter testing device, the testing method, the parameter processing method and the processing equipment realize the testing of a plurality of parameters of millimeter wave/terahertz wave beams. The amplitude intensity, frequency and angle relation distribution test of the millimeter wave/terahertz wave beam is carried out in a polar coordinate system (r, theta), a related three-dimensional graph is obtained, and a plurality of key parameter indexes of the beam can be extracted by utilizing the data result of the three-dimensional graph, so that the method has important significance for the rapid, efficient and standardized test of the millimeter wave/terahertz wave beam to be tested.

The millimeter wave and terahertz wave parameter testing device, the testing method, the parameter processing method and the processing equipment are simple, and the testing can be completed only by continuously frequency-modulated millimeter wave and terahertz wave emission sources and equipment such as an arc-shaped track or a circular ring-shaped track of a stepping motor at a detector for responding to a tested wave band.

The millimeter wave and terahertz wave parameter testing method is efficient, and the three-dimensional data results obtained through testing can be used for extracting the testing results of the frequency-intensity characteristic, the frequency-angle characteristic, -3dB beam angle characteristic, the direction diagram of the frequency to be analyzed, the wave beam change, the gain condition and the like of the tested millimeter wave and terahertz wave beam, and the wave-guide antenna or the wave-beam regulating device.

The millimeter wave and terahertz wave parameter testing method of the embodiment of the invention has wide applicable range of the to-be-tested sample, and can test the waveguide antenna sample, the optical element group formed by the dielectric material, the active or passive super-surface or super-structure or super-glume material prepared wave beam regulation chip and the like.

Drawings

Fig. 1 is a schematic diagram of a millimeter wave and terahertz wave parameter testing apparatus according to embodiment 1 of the present invention;

Fig. 2 is a schematic structural diagram of a millimeter wave and terahertz wave parameter testing apparatus according to embodiment 2 of the present invention;

Fig. 3 is a schematic structural diagram of a millimeter wave and terahertz wave parameter testing apparatus according to embodiment 3 of the present invention;

Fig. 4 is a block diagram of a millimeter wave and terahertz wave parameter testing apparatus of embodiment 3 of the invention;

FIG. 5 is a schematic flow chart of a millimeter wave and terahertz wave parameter testing method according to an embodiment of the invention;

Fig. 6 is a schematic flow chart of a processing method of millimeter wave and terahertz wave parameters according to an embodiment of the invention;

FIG. 7 is a three-dimensional plot of amplitude intensity, frequency and angular relationship distribution of millimeter-wave, terahertz beams in accordance with one embodiment of the invention;

Fig. 8 is a diagram illustrating an analysis of millimeter wave, terahertz beam frequency-intensity characteristics according to an embodiment of the invention.

Fig. 9 is a diagram illustrating frequency-angle characteristics of millimeter wave and terahertz beams according to an embodiment of the invention.

Fig. 10 is a diagram illustrating millimeter wave, terahertz beam-3 dB beam angle characteristics analysis according to an embodiment of the present invention.

Fig. 11 is a millimeter wave, terahertz beam pattern according to an embodiment of the invention.

Fig. 12 is a comparative analysis diagram of a change of millimeter wave and terahertz wave beams by a device for regulating electromagnetic waves of a super surface material according to an embodiment of the present invention.

Detailed Description

The following detailed description of embodiments of the invention is, therefore, to be taken in conjunction with the accompanying drawings, and it is to be understood that the scope of the invention is not limited to the specific embodiments.

Throughout the specification and claims, unless explicitly stated otherwise, the term "comprise" or variations thereof such as "comprises" or "comprising", etc. will be understood to include the stated element or component without excluding other elements or components.

Example 1:

as shown in fig. 1, an embodiment of the present invention provides a millimeter wave and terahertz wave parameter testing apparatus, which includes a track 10, a stepping motor 20, an emission source assembly, and a detector 40.

The track 10 is preferably a circular ring track with a radius d or a circular arc track with a radius d, which has a center or arc center. In this embodiment, the track radius d may have a value ranging from 30mm to 5000mm.

The source assembly is disposed within the track 10. The transmission source assembly includes a continuously frequency-tunable transmission source 31 for transmitting millimeter waves or terahertz waves. The emission source 31 includes a microwave source, a frequency multiplier for multiplying the microwave emitted from the microwave source by multiple times to the millimeter wave or terahertz wave band, and a waveguide antenna 311 provided at the exit end of the frequency multiplier. Wherein the frequency after millimeter wave frequency multiplication is 30-300 GHz, and the frequency after terahertz wave frequency multiplication is 0.3-3 THz. The exit end of the waveguide antenna 311 is an exit surface of millimeter wave or terahertz wave. The emergent surface is arranged at the center of the circular orbit or at the arc center of the circular orbit.

In this embodiment, the waveguide antenna 311 includes a pyramid horn antenna or a cone horn antenna or a sector horn antenna or a horn lens antenna or a corrugated horn antenna or a waveguide probe antenna.

The detector 40 is disposed on the track 10 and connected to the stepper motor 20, and the stepper motor 20 is used for controlling the deflection angle of the detector 40. The detector 40 is rotatably movable relative to the emission source assembly along a circular arc track or a circular ring track under the action of the stepping motor 20, and is used for receiving millimeter waves or terahertz waves emitted from the emission end of the waveguide antenna 311. Detector 40 may be a direct detector or heterodyne detector or pyroelectric detector in the form of a cell or line array or a face array, or the like.

The millimeter wave and terahertz wave parameter testing apparatus of this embodiment further includes an upper computer, where the upper computer is connected to the stepper motor 20, the emission source component and the detector 40, and is configured to control and record the emission frequency of the emission source 31, control and record the rotation angle of the detector 40 relative to the emission source component, and acquire the detection data of the detector 40. Illustratively, the upper computer is a computer or FPGA controller or PLC controller with programmable control functions for controlling the emission source 31, the detector 40, the stepper motor 20, and collecting and analyzing the data results.

The working principle of this embodiment 1 is:

The continuously tunable millimeter wave of 30-300 GHz or the terahertz wave of 0.3-3 THz is emitted by the continuously tunable emission source 31 through the multiple frequency multiplier. For example, the frequency modulation range of the microwave source emitted by the emitting source 31 is 100kHz to 12.75/20/31.8/40GHz, and after 3 times frequency multiplier and 8 times frequency multiplier, namely 24 times frequency multiplier. The frequency modulation range of the microwave source is set to be 12.5-20.8 GHz, and millimeter waves with the frequency of 300-500 GHz can be output after 24 times of frequency multiplication. The frequency multipliers are generally 2,3, 4, 6, 8 and 9 times, and the frequency multipliers are combined and multiplied according to actual use conditions to obtain millimeter waves or terahertz waves of a required frequency band.

The millimeter wave or terahertz wave after frequency multiplication is emitted by the waveguide antenna 311, the emitting end of the waveguide antenna 311 is positioned at the center of the circular orbit, the beam emitted by the waveguide antenna 311 diverges to reach the detector 40, the beam is received by the detector 40, and the beam amplitude intensity signal is converted into a voltage signal of the detector 40 and is read by an upper computer. The central axes of the waveguide antenna 311 and the detector 40 are positioned on a plane to ensure the accuracy of measurement.

In the measuring process, the detector 40 rotates in a circular ring-shaped track, the radius of the circular ring-shaped track is d, the value range of d can be 30 mm-5000 mm, and the value of r is the distance from the waveguide antenna 311 to the detector 40. The center axis of the beam emitted from the millimeter wave or terahertz wave waveguide antenna 311 is the optical axis, and the value θ is the divergence half angle of the waveguide antenna 311.

In the test, the rotation scanning angle range of the detector 40 is set to be + -alpha, the value range of alpha is set to be 0-360 degrees, and meanwhile, the beam frequency range of millimeter waves or terahertz waves emitted by the emission source 31 is set to be + -lambda, and the value range of lambda is set to be within 30-300 GHz or 0.3-3-THz. The detector 40 moves according to a set fixed angle step x DEG and a rotation scanning angle + -alpha range; the continuous frequency modulated reflection source 31 performs a round of output for beams with a fixed frequency modulation step n and a frequency range ± λ for each x ° movement of the detector 40. The upper computer synchronously collects the amplitude intensity with the fixed frequency modulation step length of n and the frequency range of + -lambda under the angle, and after the rotation scanning angle range of + -alpha is completed, a three-dimensional graph of the amplitude intensity-frequency-angle relation distribution of the emergent beam of the waveguide antenna 311 can be obtained.

For example, when the outgoing beam of the waveguide antenna 311 is tested, the scanning frequency range may be set to 300 to 500GHz, and the fixed frequency modulation step n >10GHz in the coarse scanning state, or the fixed frequency modulation step n <2GHz in the fine scanning state in order to obtain more detailed data. The rotation scanning angle + -alpha is in the range of 30-90 DEG, and the same applies to the fixed angle step x DEG >5 DEG in the coarse scanning state and the fixed angle step x DEG <0.5 DEG in the fine scanning state. For example, in a fine scanning state, the detector rotates from 30 ° with an angle of 0.5 ° for each rotation. At 30 °, the source 31 scans at a fixed frequency modulation step of 2GHz, starting from 300 to 500GHz, i.e. 300, 302, 304, 306 … 498, 500GHz; after the emission source 31 is output in one round, the detector rotates 0.5 degrees, namely, when the emission source 31 is at 30.5 degrees, the emission source 31 starts scanning from 300 to 500GHz at a fixed frequency modulation step length of 2GHz, namely, 300, 302, 304, 306 … 498 and 500 GHz.

In other embodiments, the rotation scan angle ±α may be set to be in the range of 30 to 90 ° when the outgoing beam of the waveguide antenna 311 is tested. In the coarse scanning state of the angle, the fixed angle step length x DEG is larger than 5 DEG, and in the fine scanning state, the fixed angle step length x DEG is smaller than 0.5 DEG; the scanning frequency ranges from 300 to 500GHz, and the fixed frequency modulation step length n is more than 10GHz in the rough scanning state, or the fixed frequency modulation step length n is less than 2GHz in the fine scanning state in order to obtain more detailed data. For example, in a fine scanning state, the emission source 31 starts scanning from 300 to 500GHz with a fixed frequency modulation step length of 2GHz. At 300GHz, the probe rotates from 30 ° with each rotation angle of 0.5 °, i.e., 30.5 °,31 °, 31.5 °.90 °. After the detector completes the rotation scanning angle + -alpha, the emission source 31 is increased by a fixed frequency modulation step length of 2GHz, namely, at 302GHz, the detector starts to rotate from 30 degrees, and each rotation angle is 0.5 degrees, namely, 30.5 degrees, 31 degrees and 31.5 degrees. ... Repeating the test, each time the frequency of the emission source 31 is changed, collecting the amplitude intensity, so as to obtain three-dimensional data of frequency-amplitude-angle, and finally obtaining three-dimensional map data of the amplitude intensity, frequency and angle relation distribution of the millimeter wave and terahertz wave beams in fig. 7.

Finally, the data results such as millimeter wave or terahertz wave beam frequency-intensity characteristics, frequency-angle characteristics, -3dB wave beam angle characteristics, patterns of frequencies to be analyzed and the like of the wave beam emitted by the waveguide antenna 311 can be obtained by utilizing a quantity analysis algorithm of an upper computer.

Example 2:

as shown in fig. 2, an embodiment of the present invention provides a millimeter wave and terahertz wave parameter testing apparatus, which includes a track 10, a stepping motor 20, an emission source assembly, and a detector 40.

The source assembly is disposed within the track 10. The source assembly includes a continuously frequency tunable source 31, a beam steering device 32, and a set of optical elements. The emission source 31 is used for emitting millimeter waves or terahertz waves, and the beam regulating device 32 is positioned on an emission light path of the emission source 31 and used for regulating the millimeter waves or terahertz waves emitted by the emission source 31; the optical element group includes a collimator lens 331 disposed between the waveguide antenna 31 and the beam steering device 32, the collimator lens 331 being for collimating millimeter waves or terahertz waves emitted through the emission source 31. The emission source 31 includes a microwave source, a frequency multiplier for multiplying the microwave emitted from the microwave source by multiple times to the millimeter wave or terahertz wave band, and a waveguide antenna 311 provided at the exit end of the frequency multiplier. Wherein the frequency after millimeter wave frequency multiplication is 30-300 GHz, and the frequency after terahertz wave frequency multiplication is 0.3-3 THz. The emission end of the beam steering device 32 is an emission surface of millimeter wave or terahertz wave. The emergent surface is arranged at the center of the circular orbit or at the arc center of the circular orbit.

In this embodiment, the waveguide antenna 311 includes a pyramid horn antenna or a cone horn antenna or a sector horn antenna or a horn lens antenna or a corrugated horn antenna or a waveguide probe antenna. The beam steering device 32 comprises a transmissive or reflective active or passive electromagnetic wave steering device made of a metasurface material or a metamaterial. The collimating lens 331 includes one or more of a high-resistance silicon lens, a TPX lens, a polytetrafluoroethylene lens, and a high-density polyethylene lens.

The detector 40 is disposed on the track 10 and connected to the stepper motor 20, and the stepper motor 20 is used for controlling the deflection angle of the detector 40. The detector 40 is rotatably movable relative to the emission source assembly along a circular arc track or a circular ring track under the action of the stepping motor 20, and is configured to receive millimeter waves or terahertz waves emitted from the emission end of the beam modulating device 32. Detector 40 may be a direct detector or heterodyne detector or pyroelectric detector in the form of a cell or line array or a face array, or the like.

The working principle of this embodiment 2 is:

The millimeter wave or terahertz wave after frequency multiplication is emitted by the waveguide antenna 311 and then passes through the collimating lens 331 or directly emits into one side surface of the beam regulating device 32, the emitting end of the beam regulating device 32 is positioned at the circle center of the circular orbit, the millimeter wave or terahertz wave emitted by the emitting source 31 is reflected or transmitted by the beam regulating device 32 and then reaches the detector 40, the millimeter wave or terahertz wave is received by the detector 40, the beam amplitude intensity signal is converted into a voltage signal of the detector 40, and the voltage signal is read by an upper computer. The central axes of the waveguide antenna 311, the collimating lens 331, the beam steering device 32 and the detector 40 are positioned on a plane to ensure the accuracy of measurement.

In the measuring process, the detector 40 rotates in a circular ring-shaped track, the radius of the circular ring-shaped track is d, the value range of d can be 30 mm-5000 mm, and the r value is the distance from the emergent end of the beam regulating device 32 to the detector 40. The central axis of the beam emitted by the millimeter wave or terahertz wave waveguide antenna 311 is the optical axis, the value θ is the angle between the beam transmitted by the beam adjusting device 32 and the optical axis, and the value β is the angle between the beam reflected by the beam adjusting device 32 and the optical axis. The detector 40 moves along the circular orbit with the center of the circular orbit as the center.

In the test, the rotation scanning angle range of the detector 40 is set to be + -alpha, the value range of alpha is set to be 0-360 degrees, and meanwhile, the beam frequency range of millimeter waves or terahertz waves emitted by the emission source 31 is set to be + -lambda, and the value range of lambda is set to be within 30-300 GHz or 0.3-3-THz. The detector 40 moves according to a set fixed angle step x DEG and a rotation scanning angle + -alpha range; the continuous frequency modulated reflection source 31 performs a round of output for beams with a fixed frequency modulation step n and a frequency range ± λ for each x ° movement of the detector 40. The upper computer synchronously collects the amplitude intensity with the fixed frequency modulation step length of n and the frequency range of + -lambda under the angle, and obtains a three-dimensional graph of the amplitude intensity-frequency-angle relation distribution of the millimeter wave or terahertz wave beam regulated and controlled by the beam regulating device 32 after finishing the rotation scanning angle range of + -alpha scanning.

Finally, the data results of millimeter wave or terahertz wave beam frequency-intensity characteristics, frequency-angle characteristics, -3dB beam angle characteristics, patterns of the frequencies to be analyzed and the like of the emergent beam regulated and controlled by the beam regulating device 32 can be obtained by utilizing a quantity analysis algorithm of an upper computer.

Example 3:

As shown in fig. 3 and 4, an embodiment of the present invention provides a millimeter wave and terahertz wave parameter testing apparatus, which includes a track 10, a stepping motor 20, an emission source assembly, and a detector 40.

The source assembly is disposed within the track 10. The source assembly includes a continuously frequency tunable source 31, a beam steering device 32, and a set of optical elements. The emission source 31 is used for emitting millimeter waves or terahertz waves, and the beam regulating device 32 is positioned on an emission light path of the emission source 31 and used for regulating the millimeter waves or terahertz waves emitted by the emission source 31; the optical element set includes a collimating lens 331 disposed between the waveguide antenna 31 and the beam steering device 32, and an off-axis parabolic mirror 332 disposed between the beam steering device 32 and the detector 40. The collimator lens 331 is for collimating millimeter wave or terahertz wave emitted via the emission source 31. The off-axis parabolic mirror 332 rotates in the same direction in synchronization with the detector 40, and is used to reflect the millimeter wave or terahertz wave modulated by the beam modulating device 32 onto the detector 40. The emission source 31 includes a microwave source, a frequency multiplier for multiplying the microwave emitted from the microwave source by multiple times to the millimeter wave or terahertz wave band, and a waveguide antenna 311 provided at the exit end of the frequency multiplier. Wherein the frequency after millimeter wave frequency multiplication is 30-300 GHz, and the frequency after terahertz wave frequency multiplication is 0.3-3 THz. The emission end of the beam steering device 32 is an emission surface of millimeter wave or terahertz wave. The emergent surface is arranged at the center of the circular orbit or at the arc center of the circular orbit.

In this embodiment, the waveguide antenna 311 includes a pyramid horn antenna or a cone horn antenna or a sector horn antenna or a horn lens antenna or a corrugated horn antenna or a waveguide probe antenna. The beam steering device 32 comprises a transmissive or reflective active or passive electromagnetic wave steering device made of a metasurface material or a metamaterial. The collimating lens 331 includes one or more of a high-resistance silicon lens, a TPX lens, a polytetrafluoroethylene lens, and a high-density polyethylene lens. The off-axis parabolic mirror 332 is preferably a gold plated off-axis parabolic mirror.

The working principle of this embodiment 3 is:

The millimeter wave or terahertz wave after frequency multiplication is emitted by the waveguide antenna 311 and then passes through the collimating lens 331 or directly emits into one side surface of the beam regulating device 32, the emitting end of the beam regulating device 32 is positioned at the circle center of the circular orbit, the millimeter wave or terahertz wave emitted by the emitting source 31 is reflected or transmitted by the beam regulating device 32 and then is converged by the off-axis parabolic mirror 332 to reach the detector 40, the millimeter wave or terahertz wave is received by the detector 40, and the beam amplitude intensity signal is converted into a voltage signal of the detector 40 and is read by an upper computer. The central axes of the waveguide antenna 311, the collimating lens 331, the beam steering device 32, the off-axis parabolic mirror 332 and the detector 40 are in a plane position, and the detector 40 is in the focal position of the off-axis parabolic mirror 332, so as to ensure the accuracy of measurement.

In the measurement process, the detector 40 and the off-axis parabolic mirror 332 perform synchronous rotation motion in a circular ring-shaped track, the radius of the circular ring-shaped track is d, the value range of d can be 30 mm-5000 mm, the r value is the distance from the exit end of the beam adjusting and controlling device 32 to the off-axis parabolic mirror 332 plus the distance from the off-axis parabolic mirror 332 to the detector 40, and f is the focal length of the off-axis parabolic mirror 332, namely r=d+f. The central axis of the beam emitted by the millimeter wave or terahertz wave waveguide antenna 311 is the optical axis, the value θ is the angle between the beam transmitted by the beam adjusting device 32 and the optical axis, and the value β is the angle between the beam reflected by the beam adjusting device 32 and the optical axis. The detector 40 and the off-axis parabolic mirror 332 are integrated, and synchronously perform circular motion along the circular orbit with the circle center of the circular orbit as the center, and the incident light of the off-axis parabolic mirror 332 is always coaxial with the radius of the circular orbit.

In the test, the rotation scanning angle range of the detector 40 is set to be + -alpha, the value range of alpha is set to be 0-360 degrees, and meanwhile, the beam frequency range of millimeter waves or terahertz waves emitted by the emission source 31 is set to be + -lambda, and the value range of lambda is set to be within 30-300 GHz or 0.3-3-THz. The detector 40 and off-axis parabolic mirror 332 move in accordance with a set fixed angular step x° and rotational scan angle + - α range; the continuously chirped source 31 performs a round of output for a beam of fixed frequency step n and frequency range ± λ for each x ° movement of the detector 40 and off-axis parabolic mirror 332. The upper computer synchronously collects the amplitude intensity with the fixed frequency modulation step length of n and the frequency range of + -lambda under the angle, and after the rotation scanning angle range of + -alpha is completed, a three-dimensional graph of the amplitude intensity-frequency-angle relation distribution of the millimeter wave or terahertz wave beam reflected by the off-axis parabolic mirror 332 after being regulated by the beam regulating device 32 can be obtained.

Finally, the data results such as millimeter wave or terahertz wave beam frequency-intensity characteristics, frequency-angle characteristics, -3dB wave beam angle characteristics, patterns of frequencies to be analyzed and the like, which are reflected by the off-axis parabolic mirror 332 after being regulated by the wave beam regulating device 32, can be obtained by utilizing the quantity analysis algorithm of the upper computer.

As shown in fig. 5, the invention further provides a testing method based on the millimeter wave and terahertz wave parameter testing device, which comprises the following steps:

Step 101: controlling the emission source component to emit millimeter wave or terahertz wave with continuous frequency modulation, wherein the frequency of the millimeter wave or terahertz wave is increased by a fixed frequency modulation step;

Step 102: controlling the detector to rotate and scan at a fixed angle step to receive millimeter waves or terahertz waves;

step 103: and collecting the frequency of millimeter waves or terahertz waves emitted by the emission source component, and rotating the scanning angle of the detector at the frequency and the amplitude intensity received by the detector in the previous fixed frequency modulation step length when the frequency is reached so as to obtain a three-dimensional graph of the amplitude intensity, frequency and angle relation distribution of millimeter waves or terahertz wave beams.

Illustratively, testing in a polar coordinate system (r, theta), and obtaining a three-dimensional graph of amplitude intensity, frequency and angular relation distribution of millimeter wave and terahertz wave beams by using a millimeter wave with continuous frequency modulation function, a terahertz wave emission source and a detector through measurement experiments in a circular orbit;

And r in the polar coordinate system (r, theta) is the distance from the emergent surface of the emission source component to the detected point of the millimeter wave and terahertz wave to be detected, and the value of theta is an included angle which is perpendicular to the axis of the emergent surface of the emission source component and is used for carrying out rotary scanning on the terahertz wave and the detector. The frequency modulation range of the emission source is 30-300 GHz or 0.3-3 THz; the rotation scanning angle of the detector is 0-360 degrees.

As shown in fig. 6, the present invention further provides a method for processing millimeter wave and terahertz wave parameters, including:

Step 201: obtaining a three-dimensional graph of amplitude intensity, frequency and angular relation distribution of millimeter wave or terahertz wave beams;

step 202: based on the three-dimensional graph, acquiring millimeter wave or terahertz wave beam frequency-intensity characteristics, millimeter wave or terahertz wave beam frequency-angle characteristics, 3dB wave beam angle characteristics, a direction graph of the frequency to be analyzed and wave beam change analysis data by utilizing a data algorithm.

Illustratively, acquiring the millimeter wave or terahertz wave beam frequency-intensity characteristic by using a data algorithm based on a three-dimensional graph of amplitude intensity, frequency and angular relationship distribution of the millimeter wave or terahertz wave beam comprises: and extracting the maximum amplitude intensity in the rotating scanning angle range in each frequency point based on the three-dimensional graph of the amplitude intensity, frequency and angle relation distribution of the millimeter wave or terahertz wave beam, and obtaining the frequency-intensity characteristic of the millimeter wave or terahertz wave beam, wherein the frequency is an abscissa axis, and the maximum amplitude intensity is an ordinate, as shown in fig. 8.

Illustratively, acquiring the millimeter wave or terahertz wave beam frequency-angle characteristic by using a data algorithm based on a three-dimensional graph of amplitude intensity, frequency and angle relation distribution of the millimeter wave or terahertz wave beam comprises: based on a three-dimensional graph of amplitude intensity, frequency and angular relation distribution of millimeter wave or terahertz wave beams, extracting an angle value corresponding to the maximum amplitude intensity of each frequency point, and obtaining frequency-angle characteristics of the millimeter wave or terahertz wave beams, wherein the frequency is an abscissa axis, and the angle value corresponding to the maximum amplitude is an ordinate, as shown in fig. 9.

Illustratively, acquiring the-3 dB beam angle characteristic using a data algorithm based on a three-dimensional plot of amplitude intensity, frequency, and angular relationship distribution of millimeter wave or terahertz wave beams, includes: the angle and amplitude distribution diagram of the frequency point to be analyzed is extracted, wherein the angle is the abscissa axis, the amplitude intensity is the ordinate axis, and-3 dB is extracted as an effective value to analyze the divergence angle of-3 dB beam angle, and the angle value of-3 dB beam angle, as shown in fig. 10.

Illustratively, based on a three-dimensional graph of amplitude intensity, frequency and angular relationship distribution of millimeter wave or terahertz wave beams, obtaining a pattern of frequencies to be analyzed by using a data algorithm includes: and extracting amplitude ranges corresponding to the angle values of the frequency points to be analyzed, and establishing an analysis result in a polar coordinate system (r _E, theta), wherein the value r _E is amplitude intensity, and the value theta is an angle value, as shown in fig. 11.

Exemplary three-dimensional figures include waveguide antenna-based three-dimensional figures as experimentally obtained in example 1 and beam steering device-based three-dimensional figures as experimentally obtained in example 2; based on the three-dimensional map of the two, acquiring beam change analysis data by using a data algorithm, including: the obtained three-dimensional diagram based on the beam regulation device and the obtained three-dimensional diagram based on the waveguide antenna are subjected to subtraction or division operation, and the operation result is qualitative or quantitative beam change analysis data, as shown in fig. 12.

The present invention also provides an electronic device that may include at least one processor, memory (e.g., non-volatile memory), memory, and a communication interface, and the at least one processor, memory, and communication interface are coupled together via a bus. The at least one processor executes at least one computer-readable instruction stored or encoded in the memory.

It should be understood that computer-executable instructions stored in memory, when executed, cause at least one processor to perform the various operations and functions described in the various embodiments of the present specification.

In embodiments of the present description, an electronic device may include, but is not limited to: personal computers, server computers, workstations, desktop computers, laptop computers, notebook computers, mobile electronic devices, smart phones, tablet computers, cellular phones, personal Digital Assistants (PDAs), handsets, messaging devices, wearable electronic devices, consumer electronic devices, and the like.

According to one embodiment, a program product, such as a machine-readable medium, is provided. The machine-readable medium may have instructions (i.e., elements described above that are implemented in software) that, when executed by a machine, cause the machine to perform the various operations and functions described in various embodiments of this specification. In particular, a system or apparatus provided with a readable storage medium having stored thereon software program code implementing the functions of any of the above embodiments may be provided, and a computer or processor of the system or apparatus may be caused to read out and execute instructions stored in the readable storage medium.

In this case, the program code itself read from the readable medium may implement the functions of any of the above embodiments, and thus the machine-readable code and the readable storage medium storing the machine-readable code form part of the present specification.

Examples of readable storage media include floppy disks, hard disks, magneto-optical disks, optical disks (e.g., CD-ROMs, CD-R, CD-RWs, DVD-ROMs, DVD-RAMs, DVD-RWs), magnetic tapes, nonvolatile memory cards, and ROMs. Alternatively, the program code may be downloaded from a server computer or cloud by a communications network.

It will be appreciated by those skilled in the art that embodiments of the present invention may be provided as a method, system, or computer program product. Accordingly, the present invention may take the form of an entirely hardware embodiment, an entirely software embodiment or an embodiment combining software and hardware aspects. Furthermore, the present invention may take the form of a computer program product embodied on one or more computer-usable storage media (including, but not limited to, disk storage, CD-ROM, optical storage, and the like) having computer-usable program code embodied therein.

The present invention is described with reference to flowchart illustrations and/or block diagrams of methods, apparatus (systems) and computer program products according to embodiments of the invention. It will be understood that each flow and/or block of the flowchart illustrations and/or block diagrams, and combinations of flows and/or blocks in the flowchart illustrations and/or block diagrams, can be implemented by computer program instructions. These computer program instructions may be provided to a processor of a general purpose computer, special purpose computer, embedded processor, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, create means for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.

These computer program instructions may also be stored in a computer-readable memory that can direct a computer or other programmable data processing apparatus to function in a particular manner, such that the instructions stored in the computer-readable memory produce an article of manufacture including instruction means which implement the function specified in the flowchart flow or flows and/or block diagram block or blocks.

These computer program instructions may also be loaded onto a computer or other programmable data processing apparatus to cause a series of operational steps to be performed on the computer or other programmable apparatus to produce a computer implemented process such that the instructions which execute on the computer or other programmable apparatus provide steps for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.

In the above embodiments, the hardware units or modules may be implemented mechanically or electrically. For example, a hardware unit, module or processor may include permanently dedicated circuitry or logic (e.g., a dedicated processor, FPGA or ASIC) to perform the corresponding operations. The hardware unit or processor may also include programmable logic or circuitry (e.g., a general purpose processor or other programmable processor) that may be temporarily configured by software to perform the corresponding operations. The particular implementation (mechanical, or dedicated permanent, or temporarily set) may be determined based on cost and time considerations.

The previous description of the disclosure is provided to enable any person skilled in the art to make or use the disclosure. Various modifications to the disclosure will be readily apparent to those skilled in the art, and the generic principles defined herein may be applied to other variations without departing from the scope of the disclosure. Thus, the disclosure is not limited to the examples and designs described herein but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.

Claims

1. The millimeter wave and terahertz wave parameter testing device is characterized by comprising:

the emission source assembly comprises an emission source capable of continuously modulating frequencies, the emission source is used for emitting millimeter waves or terahertz waves, the emission source assembly is provided with an emission surface, and the millimeter waves or terahertz waves emitted by the emission source are emitted from the emission surface;

The detector is rotatably arranged relative to the emission source component by taking the position of the emission surface as the circle center, and is used for receiving millimeter waves or terahertz waves emitted by the emission surface.

2. The millimeter wave and terahertz wave parameter testing apparatus of claim 1, further comprising a host computer connected to the emission source assembly and the detector, for controlling and recording the emission frequency of the emission source, controlling and recording the rotation angle of the detector relative to the emission source assembly, and acquiring the detection data of the detector.

3. The millimeter wave and terahertz wave parameter testing apparatus of claim 2, further comprising an arc-shaped track or a circular ring-shaped track and a stepping motor, wherein the stepping motor is connected with the upper computer;

The emitting surface of the emitting source component is positioned at the arc center of the arc track or at the circle center of the circular track, the detector is arranged on the arc track or the circular track and connected with the stepping motor, and the detector can move along the arc track or the circular track under the control of the stepping motor.

4. The millimeter wave and terahertz wave parameter testing apparatus of claim 1, wherein the emission source includes a microwave source, a frequency multiplier that multiplies microwaves emitted by the microwave source to a millimeter wave or terahertz wave band, and a waveguide antenna provided at an exit end of the frequency multiplier, the exit end of the waveguide antenna being the exit face.

5. The millimeter wave, terahertz wave parameter testing apparatus of claim 1, wherein the emission source assembly further includes a beam steering device located on an emission optical path of the emission source, an exit end of the beam steering device being the exit face.

6. The millimeter wave, terahertz wave parameter testing apparatus of claim 5, wherein the emission source includes a microwave source, a frequency multiplier for multiplying the microwaves emitted by the microwave source by a multiple of the millimeter wave or terahertz wave band, and a waveguide antenna provided on a side of the frequency multiplier remote from the microwave source.

7. The millimeter wave, terahertz wave parameter testing apparatus of claim 5, wherein the beam steering device comprises a transmissive or reflective active or passive electromagnetic wave steering device made of a metasurface material or a metamaterial.

8. The millimeter wave, terahertz wave parameter testing apparatus of claim 4 or 6, wherein the waveguide antenna comprises a pyramid horn antenna or a cone horn antenna or a sector horn antenna or a horn lens antenna or a corrugated horn antenna or a waveguide probe antenna.

9. The millimeter wave, terahertz wave parameter testing apparatus of claim 6, further comprising an optical element group provided on an emission light path of the emission source, the optical element group being for focusing the millimeter wave or terahertz wave onto the detector.

10. The millimeter wave, terahertz wave parameter testing apparatus of claim 9, wherein the optical element group includes a collimator lens disposed between the waveguide antenna and the beam steering device.

11. The millimeter wave, terahertz wave parameter testing apparatus of claim 10, wherein the collimating lens comprises one or more of a high-resistance silicon lens, a TPX lens, a polytetrafluoroethylene lens, a high-density polyethylene lens.

12. The millimeter wave, terahertz wave parameter testing apparatus of claim 9, wherein the optical element group further includes an off-axis parabolic mirror disposed between the beam steering device and the detector, the off-axis parabolic mirror being disposed in synchronous corotation with the detector for reflecting millimeter waves or terahertz waves onto the detector.

13. A testing method based on the millimeter wave and terahertz wave parameter testing apparatus according to any one of claims 1 to 12, characterized by comprising:

controlling the emission source component to emit millimeter waves or terahertz waves with continuous frequency modulation, wherein the frequency of the millimeter waves or the terahertz waves is increased by a fixed frequency modulation step length;

controlling the detector to rotate and scan at a fixed angle step length to receive the millimeter wave or terahertz wave;

And collecting the frequency of millimeter waves or terahertz waves emitted by the emission source component, and rotating the scanning angle of the detector at the frequency and the amplitude intensity received by the detector in the previous fixed frequency modulation step length when the frequency is reached so as to obtain a three-dimensional graph of the amplitude intensity, frequency and angle relation distribution of millimeter wave or terahertz wave beams.

14. The test method of claim 13, wherein the frequency modulation range is 30 to 300GHz or 0.3THz to 3THz; the rotation scanning angle is 0-360 degrees.

15. The processing method of millimeter wave and terahertz wave parameters is characterized by comprising the following steps:

obtaining a three-dimensional graph of amplitude intensity, frequency and angular relation distribution of millimeter wave or terahertz wave beams;

Based on the three-dimensional graph, acquiring millimeter wave or terahertz wave beam frequency-intensity characteristics, millimeter wave or terahertz wave beam frequency-angle characteristics, 3dB wave beam angle characteristics, a direction graph of the frequency to be analyzed and wave beam change analysis data by utilizing a data algorithm.

16. The method for processing millimeter wave and terahertz wave parameters according to claim 15, wherein the acquiring millimeter wave or terahertz wave beam frequency-intensity characteristics based on the three-dimensional map using a data algorithm includes:

Based on the three-dimensional graph, extracting the maximum amplitude intensity in the rotating scanning angle range in each frequency point, and acquiring the frequency-intensity characteristic of the millimeter wave or terahertz wave beam, wherein the frequency is an abscissa axis, and the maximum amplitude intensity is an ordinate axis; and/or

Based on the three-dimensional map, the method for acquiring the millimeter wave or terahertz wave beam frequency-angle characteristic by using a data algorithm comprises the following steps:

Based on the three-dimensional graph, extracting an angle value corresponding to the maximum amplitude intensity of each frequency point, and acquiring the frequency-angle characteristic of the millimeter wave or terahertz wave beam, wherein the frequency is an abscissa axis, and the angle value corresponding to the maximum amplitude is an ordinate; and/or

Based on the three-dimensional graph, the method for acquiring the-3 dB beam angle characteristic by using a data algorithm comprises the following steps:

Extracting an angle and amplitude distribution diagram of a frequency point to be analyzed, wherein the angle is an abscissa axis, the amplitude intensity is an ordinate axis, and-3 dB is extracted as an effective value to analyze the divergence angle of the-3 dB beam angle and the angle value of the-3 dB beam angle; and/or

The obtaining the direction diagram of the frequency to be analyzed by using a data algorithm based on the three-dimensional diagram comprises the following steps:

Extracting amplitude ranges corresponding to angle values of a frequency point to be analyzed, and establishing an analysis result in a polar coordinate system (r _E, theta), wherein the value r _E is amplitude intensity, and the value theta is an angle value; and/or

The three-dimensional graph comprises a three-dimensional graph based on a waveguide antenna and a three-dimensional graph based on a beam regulation device;

based on the three-dimensional graph, acquiring beam change analysis data by using a data algorithm comprises the following steps:

and carrying out subtraction or division operation on the obtained three-dimensional diagram based on the beam regulation device and the obtained three-dimensional diagram based on the waveguide antenna, wherein an operation result is qualitative or quantitative beam change analysis data.

17. An electronic device, comprising:

At least one processor; and

A memory storing instructions that, when executed by the at least one processor, cause the at least one processor to perform the method of processing millimeter wave, terahertz wave parameters of claim 15 or 16.

18. A machine-readable storage medium, characterized in that executable instructions are stored, which instructions, when executed, cause the machine to perform the method of processing millimeter wave, terahertz wave parameters as claimed in claim 15 or 16.