CN117940782A - Test system and test device - Google Patents

Test system and test device Download PDF

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Publication number
CN117940782A
CN117940782A CN202180101651.8A CN202180101651A CN117940782A CN 117940782 A CN117940782 A CN 117940782A CN 202180101651 A CN202180101651 A CN 202180101651A CN 117940782 A CN117940782 A CN 117940782A
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CN
China
Prior art keywords
module
power
signal
connector
distribution module
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CN202180101651.8A
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Chinese (zh)
Inventor
王家琪
刘启蒙
钟龙平
熊华清
周婷婷
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Huawei Technologies Co Ltd
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Huawei Technologies Co Ltd
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Publication of CN117940782A publication Critical patent/CN117940782A/en
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/303—Contactless testing of integrated circuits

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

A test system (300, 400, 500, 600, 700) and a test apparatus, the test system (300, 400, 500, 600, 700) comprising: one or more modules under test; the control center is used for managing the control module and one or more modules to be tested; a power center (320, 420, 520, 620, 720) for providing power to the test system (300, 400, 500, 600, 700); a signal and power distribution module (330, 430, 530, 630, 730) comprising a signal distribution module (331, 431, 531, 631, 731) and a power distribution module (332, 432, 532, 632, 732), wherein the signal distribution module (331, 431, 531, 631, 731) is configured to issue instructions to the control module according to data of the control center, and the power distribution module (332, 432, 532, 632, 732) is configured to provide power of the power center (320, 420, 520, 620, 720) to the control module and to one or more modules under test; the control module is used for receiving the instruction to manage one or more modules to be tested, so that the integration level of the test system can be improved, and the test efficiency is further improved.

Description

Test system and test device Technical Field
Embodiments of the present application relate to the field of testing, and more particularly, to a testing system and testing apparatus.
Background
In the testing field, system level testing (SYSTEM LEVEL TEST, SLT) tests from the angle of an integrated circuit (INTEGRATED CHIP, IC) functional module, and can achieve higher coverage rate under lower testing cost, but the interfaces in the testing system are more, various interfaces are not uniform, and the number of cables is more, so that the integration level of the testing system is lower, and the testing efficiency is affected.
Therefore, how to improve the test efficiency is a technical problem to be solved.
Disclosure of Invention
The embodiment of the application provides a test system and a test device, which are used for improving the integration level of the test system and further improving the test efficiency.
In a first aspect, there is provided a test system comprising: one or more modules under test; the control center is used for managing the control module and the one or more modules to be tested; the power supply center is used for providing power supply for the test system; the signal and power supply distribution module comprises a signal distribution module and a power supply distribution module, wherein the signal distribution module is used for sending an instruction to the control module according to the data of the control center, and the power supply distribution module is used for providing the power supply of the power center for the control module and the one or more modules to be tested; and the control module is used for receiving the instruction so as to manage the one or more modules to be tested.
Based on the embodiment of the application, the signal and power distribution module can distribute the data of the control center to the control module and the module to be tested and provide the power supply to the control module and the module to be tested, thereby being beneficial to improving the integration level of the test system and further being beneficial to improving the test efficiency.
With reference to the first aspect, in certain implementation manners of the first aspect, the control center is connected with the signal and power distribution module through a first connector, the power center is connected with the signal and power distribution module through a second connector, the control module is connected with the signal and power distribution module through a third connector, and the control module is connected with the one or more modules to be tested through a fourth connector.
Based on the embodiment of the application, the modules of the test system are connected by adopting the connector, so that the test system can be simplified, the integration level of the system is greatly improved, more devices to be tested can be tested in the same test area, and the test efficiency is improved.
With reference to the first aspect, in certain implementation manners of the first aspect, the control center is connected with the signal and power distribution module through a first connector, the power center is connected with the signal and power distribution module through a second connector, the control module is connected with the signal and power distribution module through a third connector, and the module to be tested is connected with the signal and power distribution module through a fourth connector.
With reference to the first aspect, in certain implementation manners of the first aspect, the control module includes a first power module and a first control module, where the first power module is configured to provide power for the control module and the module to be tested according to a power supply of the power distribution module, and the first control module is configured to manage the module to be tested according to an instruction of the signal distribution module.
With reference to the first aspect, in certain implementation manners of the first aspect, the control module is integrated in each of the one or more modules under test, and the one or more modules under test and the signal and power distribution module are connected through a fifth connector respectively.
According to the embodiment of the application, the control module is positioned in the module to be tested, so that the thickness of the test system can be reduced while the integration level of the test system is improved.
With reference to the first aspect, in certain implementation manners of the first aspect, the control module is in the signal and power distribution module, the signal distribution module is connected with the control module, the control module is connected with the module to be tested through a sixth connector, and the control module corresponds to the module to be tested one by one; the module to be tested also comprises a first power module, and the first power module is used for providing power for the module to be tested according to the power of the power distribution module.
According to the embodiment of the application, the control module is arranged in the signal and power supply distribution module, so that the thickness of the test system can be reduced while the integration level of the test system is improved.
With reference to the first aspect, in certain implementation manners of the first aspect, the control module is integrated in the signal and power distribution module, and the signal distribution module is connected to the control module, and the signal and power distribution module further includes:
and the exchanger is connected with the control module and is used for forwarding the instruction of the control module to the one or more modules to be tested.
Based on the embodiment of the application, the control module is integrated in the signal and power distribution module, and one control module is adopted to manage all the modules to be tested.
With reference to the first aspect, in certain implementations of the first aspect, the first connector and the second connector are one of a pogo pin, a cable, and a gold finger; the third connector and the fourth connector are one of a connecting wire, a flat cable, a power wire and a signal wire.
In a second aspect, there is provided a test apparatus comprising: the signal and power supply distribution module comprises a signal distribution module and a power supply distribution module, wherein the signal distribution module is used for sending an instruction to the control module according to data of the control center, and the power supply distribution module is used for providing power supply for the control module and one or more modules to be tested; and the control module is used for receiving the instruction so as to manage the one or more modules to be tested.
Based on the embodiment of the application, the signal and power distribution module can distribute the data of the control center to the control module and the module to be tested and provide the power supply to the control module and the module to be tested, thereby being beneficial to improving the integration level of the test system and further being beneficial to improving the test efficiency.
With reference to the second aspect, in certain implementation manners of the second aspect, the control module includes a first power module and a first control module, where the first power module is configured to provide power for the control module and the one or more modules to be tested according to a power supply of the power distribution module, and the first control module is configured to manage the one or more modules to be tested according to an instruction of the signal distribution module.
With reference to the second aspect, in some implementations of the second aspect, the control modules are in one-to-one correspondence with the one or more modules under test.
With reference to the second aspect, in certain implementations of the second aspect, the control module is in the module under test.
With reference to the second aspect, in certain implementation manners of the second aspect, the control module is in the signal and power distribution module, and the signal and power distribution module further includes: and the exchanger is connected with the control module and is used for forwarding the instruction of the control module to the one or more modules to be tested.
With reference to the second aspect, in certain implementations of the second aspect, the signal and power distribution module is connected to the control module through a seventh connector, and the signal and power distribution module is connected to the one or more modules under test through an eighth connector.
With reference to the second aspect, in certain implementations of the second aspect, the seventh connector is one of a pogo pin, a cable, and a gold finger; the eighth connector is one of a connecting wire, a flat cable, a power wire and a signal wire.
Drawings
FIG. 1 is a schematic diagram of an SLT test system.
FIG. 2 is a schematic diagram of another SLT test system.
Fig. 3 is a schematic diagram of an SLT test system according to an embodiment of the present application.
Fig. 4 is a schematic diagram of another SLT testing system according to an embodiment of the present application.
FIG. 5 is a schematic diagram of another SLT test system according to an embodiment of the present application.
FIG. 6 is a schematic diagram of another SLT test system according to an embodiment of the present application.
FIG. 7 is a schematic diagram of another SLT test system according to an embodiment of the present application.
Detailed Description
The technical solutions in the embodiments of the present application will be described below with reference to the accompanying drawings.
In the testing field, SLT is a functional level test based on an integrated circuit, and is different from a design for test (DFT) vector, a dedicated load board (loadboard) and an ATE machine for test control of automatic test equipment (auto test equipment, ATE), when SLT is tested, an IC runs product software and a functional vector, a test board is often modified by a product board, and an SLT test flow is generally controlled by test management software running on a test master (a computer or other control device capable of executing software), so that SLT can realize test development, import and mass production more quickly and at lower cost.
With the increasing of the scale of the IC transistor, the function defect of the IC caused by the defect is continuously increased, the test coverage rate of the IC circuit is difficult to be further improved in the traditional DFT test due to the test cost, and the SLT tests from the angle of the IC function module, so that the higher coverage rate can be realized under the lower test cost.
The SLT test board and the control system generally adopt universal interfaces, and the integration level of the SLT test board and the electrical system is low, so that the efficiency of the test system is low.
FIG. 1 is a schematic diagram of an SLT test system. As shown in fig. 1, the test system 100 may include a power supply 110, a switch 120, a first test master 130, a debug interface 131 and a power supply 132 of the first test master 130, a first test board 150 and its debug devices 155 and power supplies 154, a second test master 140, a debug interface 141 and a power supply 142 of the second test master 140, a second test board 160 and its debug devices 165 and a power supply 164.
The first test master 130 may include a communication interface 134 and a communication interface 133, wherein the communication interface 134 is used for communicating with the switch 120, and the communication interface 133 is used for communicating with the first test board 150.
The second test master 140 may include a communication interface 144 for communicating with the switch 120 and a communication interface 143 for communicating with the first test board 160.
The first test board 150 may include a communication interface 151 for communicating with the first test master 130, a debug interface 152 for interfacing with a debug device 155, and a power interface 153 for interfacing with a power supply 154 to provide power to the first test board.
The second test board 160 may include a communication interface 161, a debug interface 162, and a power interface 163, the communication interface 161 for communicating with the first test master 140, the debug interface 162 for interfacing with a debug device 165, and the power interface 163 for interfacing with a power source 164 to provide power to the second test board.
Referring to fig. 1, each test board can form a test station, and during testing, the test stations are arranged according to the position of the lower pressure head of the SLT test machine, each test station has a corresponding test master control, and a communication interface on the test master control is connected to a communication interface in the test board through a cable and controls the test board. The communication interfaces on the plurality of test masters are connected to the switch through cables, so that the test networking of SLT is realized.
It should be understood that the embodiment of the present application is described by taking two test boards as an example, but the number of the test boards is not limited by the present application, and in other embodiments, the number of the test boards may be more, for example, 3, n is an integer greater than 3, etc.
Each test station in the test system 100 has a separate power supply, debug interface, communication interface, and cable, and each test station corresponds to a test master that is typically placed in close proximity to the test station, which also requires a separate power supply, maintenance interface, etc., and is connected to the switch via the cable. The test system has more interfaces, various interfaces are not uniform, and the number of cables is large, so that the integration level of the test system is lower.
FIG. 2 is a schematic diagram of another SLT test system. As shown in fig. 2, the test system 200 may include a power supply 210, a switch 220, a test master 240, a test board 260, and a test board 270.
The test master 240 has a debug interface 230 and a power source 250, and the test board 260 further includes a communication interface 261, a debug interface 262 and a power source interface 263, where the communication interface 261 is used for being connected with the switch 220 to receive control data sent by the test master, and the debug interface 262 is used for interfacing with the debug device 265, and the power source interface 263 is used for being connected with the power source 264 to provide power for the test board 260.
The test board 270 further comprises a communication interface 271, a debug interface 272 and a power interface 273, wherein the communication interface 271 is adapted to be connected to the switch 220, e.g. via a communication cable, for receiving control data sent by a test master, etc., the debug interface 272 is adapted to interface with a debug device 275, and the power interface 273 is adapted to be connected to a power source 274 for providing power to the test board 270.
The test system 200 uses a test master to manage and control a plurality of test boards, such as managing test flows, test states, logs, etc. of the test boards. However, each test board has an independent power supply, a communication interface, a debugging interface and the like, a plurality of cables are needed, and the specifications of the interfaces are not uniform, so that the installation and maintenance of the test system are complicated, and the efficiency of the test system is reduced.
In view of the above, the embodiment of the application provides a testing system and a testing device, which can improve the integration level of the testing system, thereby improving the testing efficiency.
The test system according to the embodiment of the present application will be described with reference to fig. 3 to 7.
Fig. 3 is a schematic diagram of a test system according to an embodiment of the present application. As shown in fig. 3, the test system 300 may include a remote control terminal 310, a power center 320, a signal and power distribution module 330, a first control terminal 340, a second control terminal 350, a first end-to-be-tested 360, and a second end-to-be-tested 370.
Wherein the signal and power distribution module 330 includes a signal distribution module 331 and a power distribution module 332, the first control terminal 340 may include a first power module 341 and a control unit 342, and the second control terminal 350 may include a second power module 351 and a control unit 352.
The first power module 341 may be connected to the control unit 342 by a connector, or may be electrically connected to the control unit 342 by a trace of a printed circuit board (printed circuit board, PCB), and the first power module 341 and the control unit 342 may be located on one PCB or may be located on a different PCB, which is not limited in the embodiment of the present application.
Similarly, the second power module 351 and the control unit 352 may be connected through a connector, or may be electrically connected through a trace of a PCB, where the second power module 351 and the control unit 352 may be located on one PCB or may be located on a different PCB, which is not limited in the embodiment of the present application.
In the embodiment of the present application, the remote control end 310 is responsible for running the SLT test software, and performs management control on the first control end and the second control end. The remote control terminal 310 is connected to a signal distribution module 331 through a connector, the signal distribution module is connected to a control unit 342 in the first control terminal through a connector 344, the signal distribution module is connected to a control unit 352 in the second control terminal through a connector 354, the control unit 342 is in butt joint with a first end 360 to be tested through a connector, and the control unit 352 is in butt joint with a second end 370 to be tested through a connector. Therefore, the remote control end can manage and control all the control ends and the ends to be tested through the signal distribution module.
It should be appreciated that the control unit 342 and the control unit 352 may be a central processing unit (central processing unit, CPU), a micro control unit (microcontroller unit, MCU), a complex programmable logic device (complex programmable logic device, CPLD), or a field-programmable gate array (FPGA), etc.
The connector in the embodiment of the present application may be a spring pin (pogo pin), a cable, a golden finger, a flat cable, etc., which is not limited in the embodiment of the present application.
The connection between the control unit 342 and the first end to be tested 360 may be through a connector, or may be through a power line, a signal line, etc.; the connection between the control unit 342 and the first end 360 to be tested may be through one connector or through a plurality of connectors.
The power center 320 is responsible for providing power to all hardware modules in the test system. The power center 320 is connected to a power distribution module 332 by a connector, the power distribution module 332 is connected to a first power module 341 by a connector 343, and the power distribution module 332 is connected to a second power module 351 by a connector 353.
The power supply provided by the power supply center of the power supply distribution module is directly distributed to each control end or distributed to each control end after being reduced in voltage, the power supply module is integrated in the control end, the control center controls the power supply module to provide power for the end to be tested, and the control unit can also manage the test state of the end to be tested.
According to the embodiment of the application, the to-be-tested end can be arranged above (on the front side) the power supply and the signal distribution module, the control end can be arranged below (on the back side) the power supply and the signal distribution module, and the control end and the to-be-tested end penetrate through the power supply and the signal distribution module to be directly in butt joint.
According to the technical scheme, the modules of the test system can be in butt joint by using connectors with uniform specifications, the signal distribution module can send instructions of the remote control end to the control ends, and the power distribution module distributes power of the power supply center to the control ends, so that the integration level of the test system is higher, and the test efficiency can be improved.
It should be understood that the end to be tested is a test board, and the embodiment of the application uses two ends to be tested as an example, but the number of the ends to be tested is not limited in the application, and in other embodiments, the number of the ends to be tested may be n, where n is an integer greater than 2.
The number of the terminals to be tested is 3, i.e. the test system further comprises a third terminal to be tested and a third control terminal, which may comprise a third power module and a control unit.
FIG. 4 is a schematic diagram of another test system according to an embodiment of the present application. As shown in fig. 4, the test system 400 may include a remote control terminal 410, a power center 420, a signal and power distribution module 430, a first control terminal 440, a second control terminal 450, a first end-to-be-tested 460, and a second end-to-be-tested 470.
The signal and power distribution module 430 includes a signal distribution module 431 and a power distribution module 432, the first control terminal 440 may include a first power module 441 and a control unit 442, and the second control terminal 450 may include a second power module 451 and a control unit 452.
It should be understood that the specific functions and roles of the remote control terminal 410, the power center 420, the signal and power distribution module 430, the first power module 441, the second power module 451, the control unit 442, and the control unit 452 may be described with reference to fig. 3, and are not repeated for brevity.
Referring to fig. 4, the power distribution module 432 interfaces with the first power module 441 through the connector 443, and the power distribution module 432 interfaces with the second power module 451 through the connector 453. The first power module 441 is in butt joint with the signal and power distribution module 430 through the connector 444, and the first end 460 to be tested is in butt joint with the signal and power distribution module 430 through the connector 461, so that the first end 460 to be tested can be provided with electric power; the second power module 451 interfaces with the signal and power distribution module 430 through the connector 453, and the second end 470 to be measured interfaces with the signal and power distribution module 430 through the connector 463, so that the second end 470 to be measured may be provided with power.
The signal distribution module 431 interfaces with the control unit 442 via a connector 445, and the signal distribution module 431 also interfaces with the control unit 452 via a connector 455. The control unit 442 is in butt joint with the signal and power supply distribution module 430 through the connector 446, and the first end 460 to be tested is in butt joint with the signal and power supply distribution module 430 through the connector 462, so that the first end 460 to be tested can receive the instruction of the control unit 442; the control unit 452 interfaces with the signal and power distribution module 430 through the connector 456, and the second end under test 470 interfaces with the signal and power distribution module 430 through the connector 464, so that the second end under test 470 can receive instructions of the control unit 452.
According to the technical scheme, the modules of the test system can be in butt joint by using connectors with uniform specifications, the signal distribution module can send instructions of the remote control end to the control ends, and the power distribution module distributes power of the power supply center to the control ends, so that the integration level of the test system is higher, and the test efficiency can be improved.
The connector in the embodiment of the present application may be a Pogo Pin, a cable, a golden finger, a flat cable, etc., which is not limited in the embodiment of the present application.
It should be understood that the end to be tested is a test board, and the embodiment of the application uses two ends to be tested as an example, but the number of the ends to be tested is not limited in the application, and in other embodiments, the number of the ends to be tested may be n, where n is an integer greater than 2.
The number of the terminals to be tested is 3, i.e. the test system further comprises a third terminal to be tested and a third control terminal, which may comprise a third power module and a control unit.
FIG. 5 is a schematic diagram of another test system according to an embodiment of the present application. As shown in fig. 5, the test system 500 may include a remote control terminal 510, a power center 520, a signal and power distribution module 530, a first end-to-be-tested 540, and a second end-to-be-tested 550.
The signal and power distribution module 530 may include a signal distribution module 531 and a power distribution module 532, among others. The first to-be-tested terminal 540 may include a first power module 541, a control unit 542, and a to-be-tested chip 543, and the second to-be-tested terminal 550 may include a second power module 551, a control unit 552, and a to-be-tested chip 553.
It should be understood that the specific functions and roles of the remote control terminal 510, the power center 520, the signal and power distribution module 530, the first power module 541, the second power module 551, the control unit 542, and the control unit 552 may be referred to in the corresponding descriptions in fig. 3, and are not repeated for brevity.
Referring to fig. 5, the signal distribution module 531 is docked with the control unit 542 via the connector 534, and the signal distribution module 531 is docked with the control unit 552 via the connector 536.
The power distribution module 532 interfaces with a first power module via connector 533 and the power distribution module 532 interfaces with a second power module 551 via connector 535.
The connector in the embodiment of the application can be a spring needle, a cable, a golden finger, a flat cable, etc., which is not limited in the embodiment of the application.
In the embodiment of the application, the control unit is integrated at the end to be tested, so that the test end and the control end are integrally designed, and the end to be tested can be placed above the signal and power distribution module during testing, thereby being beneficial to reducing the thickness of the test system while ensuring the high integration level of the system.
It should be understood that the end to be tested is a test board, and the embodiment of the application uses two ends to be tested as an example, but the number of the ends to be tested is not limited in the application, and in other embodiments, the number of the ends to be tested may be n, where n is an integer greater than 2.
The number of the terminals to be tested is 3, i.e. the test system further comprises a third terminal to be tested, which may comprise a chip to be tested, a third power module and a control unit.
FIG. 6 is a schematic diagram of another test system according to an embodiment of the present application. As shown in fig. 6, the test system 600 may include a remote control terminal 610, a power center 620, a signal and power distribution module 630, a first end-to-be-tested 640, and a second end-to-be-tested 650.
The signal and power distribution module 630 may include a signal distribution module 631, a power distribution module 632, a first control unit 661, and a second control unit 662, among others.
The first end to be tested 640 may include a first power module 642 and a chip to be tested 641, and the second end to be tested 650 may include a second power module 652 and a chip to be tested 651.
The signal distribution module 631 may be connected to the first control unit 661 and the second control unit 662 through connectors. The first control unit 661 interfaces with the first end to be tested 640 through the connector 634, and the second control unit interfaces with the second end to be tested 650 through the connector 636.
It should be appreciated that the signal distribution module 631 may also be electrically connected to the first control unit 661 and the second control unit 662 by means of a trace of a PCB.
The power distribution module 632 may interface with the first power module 642 via connector 633 and the power distribution module 632 may interface with the second power module 652 via connector 635.
The connector in the embodiment of the application can be a spring needle, a cable, a golden finger, a flat cable, etc., which is not limited in the embodiment of the application.
It should be understood that the specific functions and roles of the remote control terminal 610, the power center 620, the signal and power distribution module 630, the first power module 642, the second power module 652, the first control unit 661, and the second control unit 662 may be referred to as corresponding descriptions in fig. 3, and are not repeated for brevity.
Based on the embodiment of the application, the control unit is integrated in the signal and power distribution module, and the technical scheme can ensure the high integration level of the system and is beneficial to reducing the thickness of the test system.
It should be understood that the end to be tested is a test board, and the embodiment of the application uses two ends to be tested as an example, but the number of the ends to be tested is not limited in the application, and in other embodiments, the number of the ends to be tested may be n, where n is an integer greater than 2.
The number of the terminals to be tested is 3, i.e. the test system further comprises a third terminal to be tested, which may comprise a third power module and a chip to be tested.
FIG. 7 is a schematic diagram of another test system according to an embodiment of the present application. As shown in fig. 7, the test system 700 may include a remote control terminal 710, a power center 720, a signal and power distribution module 730, a first end under test 740, and a second end under test 750.
The signal and power distribution module 730 may include, among other things, a signal distribution module 731, a power distribution module 732, a control unit 761, and a switch 762.
The signal distribution module 731 may be connected to the control unit 761 through a connector, the control unit 761 is connected to the switch 762, the switch 762 is configured to forward data of the control unit to a to-be-tested terminal, the switch 762 is docked with the first to-be-tested terminal 740 through a connector 734, and the switch 762 is docked with the second to-be-tested terminal 750 through a connector 736.
It should be appreciated that the signal distribution module 731 may also be electrically connected to the control unit 761 by a trace of a PCB.
The power distribution module 732 interfaces with the first power module 742 via the connector 733 and interfaces with the second power module 752 via the connector 735 to power the first and second terminals 740 and 750.
The connector in the embodiment of the application can be a spring needle, a cable, a golden finger, a flat cable, etc., which is not limited in the embodiment of the application.
It should be understood that the specific functions and roles of the remote control terminal 710, the power center 720, the signal and power distribution module 730, the first power module 742, the second power module 752, and the control unit 761 may be referred to the corresponding descriptions in fig. 3, and will not be repeated for brevity.
Based on the embodiment of the application, the control unit is integrated in the signal and power distribution module, and one control unit is adopted to manage all the ends to be tested.
It should be understood that the end to be tested is a test board, and the embodiment of the application uses two ends to be tested as an example, but the number of the ends to be tested is not limited in the application, and in other embodiments, the number of the ends to be tested may be n, where n is an integer greater than 2.
The number of the terminals to be tested is 3, i.e. the test system further comprises a third terminal to be tested, which may comprise a third power module and a chip to be tested.
In other embodiments, the signal and power distribution module 730 may not include a control unit, in which case the signal distribution module 731 may be connected to the switch 762, i.e., the functions of the control unit may be integrated into the signal distribution module 731, which performs the functions of the control unit.
The embodiment of the application also provides a testing device, which can comprise: the signal and power supply distribution module comprises a signal distribution module and a power supply distribution module, wherein the signal distribution module is used for sending an instruction to the control module according to data of the control center, and the power supply distribution module is used for providing power supply for the control module and one or more modules to be tested; and the control module is used for receiving the instruction so as to manage the one or more modules to be tested.
Illustratively, referring to fig. 3, the signal and power distribution module may be a signal and power distribution module 330, the signal distribution module may be a signal distribution module 331, the power distribution module may be a power distribution module 332, the control center may be a remote control terminal 310, and the control module may be a first control terminal and/or a second control terminal.
Based on the embodiment of the application, the signal and power distribution module can distribute the data of the control center to the control module and the module to be tested and provide the power supply to the control module and the module to be tested, thereby being beneficial to improving the integration level of the test system and further being beneficial to improving the test efficiency.
In one possible design, the control module includes a first power module and a first control module, where the first power module is configured to provide power to the control module and the one or more modules under test according to a power of the power distribution module, and the first control module is configured to manage the one or more modules under test according to an instruction of the signal distribution module.
Illustratively, referring to FIG. 4, when the test system includes a test end, such as a first test end 360, the control module may be a first control end 340, the first power module may be a first power module 341, and the first control module may be a control unit 342.
In one possible design, the control modules are in one-to-one correspondence with the one or more modules under test.
For example, referring to fig. 3 and 4, the control module is a control terminal, and the module to be tested is a terminal to be tested.
In one possible design, the control module is located in the module under test.
For example, referring to fig. 5, the control module may include a first power module 541 and a control unit 542.
In one possible design, the control module is in the signal and power distribution module, and the signal and power distribution module further includes: and the exchanger is connected with the control module and is used for forwarding the instruction of the control module to the one or more modules to be tested.
For example, referring to fig. 7, the control module may be a control unit 761 and the switch may be a switch 762.
Based on the embodiment of the application, the control module is integrated in the signal and power distribution module, and one control module is adopted to manage all the modules to be tested.
In one possible design, the signal and power distribution module is connected to the control module via a seventh connector, and the signal and power distribution module is connected to the one or more modules under test via an eighth connector.
Illustratively, referring to fig. 4, the seventh connector may be the connector 443, the connector 444, the connector 445, and the connector 446 between the first control end 440 and the signal and power distribution module 430, and the eighth connector may be the connector 461 and the connector 462 between the first end to be tested 340 and the signal and power distribution module 430.
In some embodiments, the connector 443 and the connector 445 may or may not be identical, and the connector 444 and the connector 446 may or may not be identical.
In some embodiments, the connector 461 and the connector 462 may or may not be identical, which is not limited in this embodiment.
The embodiment of the application also provides a test system, which can comprise:
One or more modules under test;
The control center is used for managing the control module and the one or more modules to be tested;
the power supply center is used for providing power supply for the test system;
The signal and power supply distribution module comprises a signal distribution module and a power supply distribution module, wherein the signal distribution module is used for sending an instruction to the control module according to the data of the control center, and the power supply distribution module is used for providing the power supply of the power center for the control module and the one or more modules to be tested;
and the control module is used for receiving the instruction so as to manage the one or more modules to be tested.
In one example, referring to fig. 3, the one or more modules under test may be a first end under test 360, a second end under test 370, i.e., the module under test, the control center may be a remote control end 310, the power center may be a power center 320, the signal and power distribution module may be a signal and power distribution module 330, and the control module may be a first control end 340 or a second control end 350, i.e., the control module is the control end in the previous embodiment.
In another example, referring to fig. 6, the one or more modules under test may be a first end under test 640, a second end under test 650, the control center may be a remote control end 610, the power center may be a power center 620, the signal and power distribution module may be a signal and power distribution module 630, and the control module may be the first control unit 340 or the second control unit 350.
Based on the embodiment of the application, the signal and power distribution module can distribute the data of the control center to the control module and the module to be tested and provide the power supply to the control module and the module to be tested, thereby being beneficial to improving the integration level of the test system and further being beneficial to improving the test efficiency.
In one possible design, the control center is connected with the signal and power distribution module through a first connector, the power center is connected with the signal and power distribution module through a second connector, the control module is connected with the signal and power distribution module through a third connector, and the control module is connected with the one or more modules under test through a fourth connector.
Illustratively, referring to fig. 3, the first connector may be a connector between the remote control terminal 310 and the signal and power distribution module 330, the second connector may be a connector between the power center 320 and the signal and power distribution module 330, the third connector may be a connector 343 and a connector 344 between the first control terminal 340 and the signal and power distribution module 330, and the fourth connector may be a connector between the first control terminal 340 and the first end 360 to be tested.
It should be appreciated that in some embodiments, the first connector and the second connector may be the same connector, i.e., the connector may transmit both data and power.
In some embodiments, the connector 343 and the connector 344 may or may not be the same, which is not limited by the embodiment of the present application.
Based on the embodiment of the application, the modules of the test system are connected by adopting the connector, so that the test system can be simplified, the integration level of the system is greatly improved, more devices to be tested can be tested in the same test area, and the test efficiency is improved.
In one possible design, the control center is connected with the signal and power distribution module through a first connector, the power center is connected with the signal and power distribution module through a second connector, the control module is connected with the signal and power distribution module through a third connector, and the module to be tested is connected with the signal and power distribution module through a fourth connector.
Illustratively, referring to fig. 4, the first connector may be a connector between the remote control terminal 410 and the signal and power distribution module 430, the second connector may be a connector between the power center 420 and the signal and power distribution module 430, the third connector may be a connector 443, a connector 444, a connector 445, and a connector 446 between the first control terminal 440 and the signal and power distribution module 430, and the fourth connector may be a connector 461 and a connector 462 between the first end to be tested 340 and the signal and power distribution module 430.
In some embodiments, the connector 443 and the connector 445 may or may not be identical, and the connector 444 and the connector 446 may or may not be identical.
In some embodiments, the connector 461 and the connector 462 may or may not be identical, which is not limited in this embodiment.
In one possible design, the control module includes a first power module and a first control module, where the first power module is configured to provide power for the control module and the module to be tested according to a power supply of the power distribution module, and the first control module is configured to manage the module to be tested according to an instruction of the signal distribution module.
Illustratively, referring to fig. 3, the control module may be a first control terminal 340, the first power module may be a first power module 341, and the first control module may be a control unit 342.
In one possible design, the control module is integrated in each of the one or more modules under test, which are connected to the signal and power distribution module via fifth connectors, respectively.
Illustratively, referring to fig. 5, the control module may include a first power module 541 and a control unit 542, and the fifth connector may be a connector 533 and a connector 534; the control module may also be the second power module 551 and the control unit 552, and the fifth connector may be the connector 535 and the connector 536.
The fifth connector may be one of a pogo pin, a cable, and a gold finger.
According to the embodiment of the application, the control module is positioned in the module to be tested, so that the thickness of the test system can be reduced while the integration level of the test system is improved.
In one possible design, the control module is located in the signal and power distribution module, the signal distribution module is connected with the control module, the control module is connected with the module to be tested through a sixth connector, and the control module corresponds to the module to be tested one by one; the module to be tested also comprises a first power module, and the first power module is used for providing power for the module to be tested according to the power of the power distribution module.
For example, referring to fig. 6, the control module may be a first control unit 661 and a second control unit 662. The sixth connector may be one of a connection line, a flat cable, a power line, and a signal line.
According to the embodiment of the application, the control module is arranged in the signal and power supply distribution module, so that the thickness of the test system can be reduced while the integration level of the test system is improved.
In one possible design, the control module is integrated in the signal and power distribution module, the signal distribution module is connected with the control module, and the signal and power distribution module further includes:
and the exchanger is connected with the control module and is used for forwarding the instruction of the control module to the one or more modules to be tested.
For example, referring to fig. 7, the control module may be a control unit 761 and the switch may be a switch 762.
Based on the embodiment of the application, the control module is integrated in the signal and power distribution module, and one control module is adopted to manage all the modules to be tested.
In one possible design, the first connector and the second connector are one of spring pins, cables and golden fingers; the third connector and the fourth connector are one of a connecting wire, a flat cable, a power wire and a signal wire.
Those of ordinary skill in the art will appreciate that the various illustrative elements and algorithm steps described in connection with the embodiments disclosed herein may be implemented as electronic hardware, or combinations of computer software and electronic hardware. Whether such functionality is implemented as hardware or software depends upon the particular application and design constraints imposed on the solution. Skilled artisans may implement the described functionality in varying ways for each particular application, but such implementation decisions should not be interpreted as causing a departure from the scope of the present application.
It will be clear to those skilled in the art that, for convenience and brevity of description, specific working procedures of the above-described systems, apparatuses and units may refer to corresponding procedures in the foregoing method embodiments, and are not repeated herein.
In the several embodiments provided by the present application, it should be understood that the disclosed systems, devices, and methods may be implemented in other manners. For example, the apparatus embodiments described above are merely illustrative, e.g., the division of the units is merely a logical function division, and there may be additional divisions when actually implemented, e.g., multiple units or components may be combined or integrated into another system, or some features may be omitted or not performed. Alternatively, the coupling or direct coupling or communication connection shown or discussed with each other may be an indirect coupling or communication connection via some interfaces, devices or units, which may be in electrical, mechanical or other form.
The units described as separate units may or may not be physically separate, and units shown as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the solution of this embodiment.
In addition, each functional unit in the embodiments of the present application may be integrated in one processing unit, or each unit may exist alone physically, or two or more units may be integrated in one unit.
The functions, if implemented in the form of software functional units and sold or used as a stand-alone product, may be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present application may be embodied essentially or in a part contributing to the prior art or in a part of the technical solution, in the form of a software product stored in a storage medium, comprising several instructions for causing a computer device (which may be a personal computer, a server, a network device, etc.) to perform all or part of the steps of the method according to the embodiments of the present application. And the aforementioned storage medium includes: a U-disk, a removable hard disk, a read-only memory (ROM), a random access memory (random access memory, RAM), a magnetic disk, or an optical disk, or other various media capable of storing program codes.
The foregoing is merely illustrative of the present application, and the present application is not limited thereto, and any person skilled in the art will readily recognize that variations or substitutions are within the scope of the present application. Therefore, the protection scope of the present application shall be subject to the protection scope of the claims.

Claims (15)

  1. A test system, comprising:
    One or more modules under test;
    The control center is used for managing the control module and the one or more modules to be tested;
    the power supply center is used for providing power supply for the test system;
    The signal and power supply distribution module comprises a signal distribution module and a power supply distribution module, wherein the signal distribution module is used for sending an instruction to the control module according to the data of the control center, and the power supply distribution module is used for providing the power supply of the power center for the control module and the one or more modules to be tested;
    and the control module is used for receiving the instruction so as to manage the one or more modules to be tested.
  2. The test system of claim 1, wherein the control center is coupled to the signal and power distribution module via a first connector, the power center is coupled to the signal and power distribution module via a second connector, the control module is coupled to the signal and power distribution module via a third connector, and the control module is coupled to the one or more modules under test via a fourth connector.
  3. The test system of claim 1, wherein the control center is connected to the signal and power distribution module through a first connector, the power center is connected to the signal and power distribution module through a second connector, the control module is connected to the signal and power distribution module through a third connector, and the module under test is connected to the signal and power distribution module through a fourth connector.
  4. A test system as claimed in any one of claims 1 to 3, wherein the control module comprises a first power module and a first control module, wherein the first power module is configured to provide power to the control module and the module under test according to the power of the power distribution module, and the first control module is configured to manage the module under test according to the instructions of the signal distribution module.
  5. The test system of claim 1, wherein the control module is integrated in each of the one or more modules under test, the one or more modules under test and the signal and power distribution module being connected by a fifth connector, respectively.
  6. The test system of claim 1, wherein the control module is in the signal and power distribution module, the signal distribution module is connected to the control module, the control module is connected to the module under test through a sixth connector, and the control module corresponds to the module under test one to one; the module to be tested also comprises a first power module, and the first power module is used for providing power for the module to be tested according to the power of the power distribution module.
  7. The test system of claim 1, wherein the control module is integrated in the signal and power distribution module, the signal distribution module being coupled to the control module, the test system further comprising:
    and the exchanger is positioned in the signal and power supply distribution module, is connected with the control module and is used for forwarding the instruction of the control module to the one or more modules to be tested.
  8. The test system of claim 2 or 3, wherein the first connector and the second connector are one of pogo pins, cables, and gold fingers; the third connector and the fourth connector are one of a connecting wire, a flat cable, a power wire and a signal wire.
  9. A test device, comprising:
    The signal and power supply distribution module comprises a signal distribution module and a power supply distribution module, wherein the signal distribution module is used for sending an instruction to the control module according to data of the control center, and the power supply distribution module is used for providing power supply for the control module and one or more modules to be tested;
    and the control module is used for receiving the instruction so as to manage the one or more modules to be tested.
  10. The test apparatus of claim 9, wherein the control module comprises a first power module and a first control module, wherein the first power module is configured to provide power to the control module and the one or more modules under test based on a power of the power distribution module, and wherein the first control module is configured to manage the one or more modules under test based on instructions of the signal distribution module.
  11. The test apparatus of claim 10, wherein the control module corresponds one-to-one with the one or more modules under test.
  12. The test device of claim 10, wherein the control module is in the module under test.
  13. The test apparatus of claim 9, wherein the control module is in the signal and power distribution module, the signal and power distribution module further comprising:
    and the exchanger is connected with the control module and is used for forwarding the instruction of the control module to the one or more modules to be tested.
  14. The test device of any one of claims 9-13, wherein the signal and power distribution module is connected to the control module via a seventh connector and the signal and power distribution module is connected to the one or more modules under test via an eighth connector.
  15. The test device of claim 14, wherein the seventh connector is one of a pogo pin, a cable, a gold finger; the eighth connector is one of a connecting wire, a flat cable, a power wire and a signal wire.
CN202180101651.8A 2021-10-21 2021-10-21 Test system and test device Pending CN117940782A (en)

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CN201726066U (en) * 2010-05-25 2011-01-26 广州科易光电技术有限公司 Hardware structure of airborne system of power line patrol-inspection helicopter
CN204129649U (en) * 2014-10-28 2015-01-28 浪潮电子信息产业股份有限公司 A kind of electric power-feeding structure supporting Intel X86 tetra-road server
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KR102014643B1 (en) * 2018-04-05 2019-10-21 한국전력공사 Test apparatus for intelligent electronic device and testing method of intelligent electronic device using the same
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