CN117916563A - Spd阵列中的持久性过滤 - Google Patents

Spd阵列中的持久性过滤 Download PDF

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Publication number
CN117916563A
CN117916563A CN202280060751.5A CN202280060751A CN117916563A CN 117916563 A CN117916563 A CN 117916563A CN 202280060751 A CN202280060751 A CN 202280060751A CN 117916563 A CN117916563 A CN 117916563A
Authority
CN
China
Prior art keywords
spd
observation
signal
windows
condition
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN202280060751.5A
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English (en)
Chinese (zh)
Inventor
W·万德藤佩尔
J·W·佩特斯
A·B·米奥德兹基
C·穆拉德
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Voxel Sensor Co ltd
Original Assignee
Voxel Sensor Co ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Voxel Sensor Co ltd filed Critical Voxel Sensor Co ltd
Publication of CN117916563A publication Critical patent/CN117916563A/zh
Pending legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/44—Electric circuits
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/95—Computational photography systems, e.g. light-field imaging systems
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/77—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
    • H04N25/772—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components comprising A/D, V/T, V/F, I/T or I/F converters
    • H04N25/773—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components comprising A/D, V/T, V/F, I/T or I/F converters comprising photon counting circuits, e.g. single photon detection [SPD] or single photon avalanche diodes [SPAD]
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F77/00—Constructional details of devices covered by this subclass
    • H10F77/95—Circuit arrangements
    • H10F77/953—Circuit arrangements for devices having potential barriers
    • H10F77/959—Circuit arrangements for devices having potential barriers for devices working in avalanche mode
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/44—Electric circuits
    • G01J2001/4413—Type
    • G01J2001/442—Single-photon detection or photon counting
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N17/00—Diagnosis, testing or measuring for television systems or their details
    • H04N17/002—Diagnosis, testing or measuring for television systems or their details for television cameras

Landscapes

  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Computing Systems (AREA)
  • Theoretical Computer Science (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Optical Radar Systems And Details Thereof (AREA)
  • Measurement Of The Respiration, Hearing Ability, Form, And Blood Characteristics Of Living Organisms (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
CN202280060751.5A 2021-09-21 2022-09-13 Spd阵列中的持久性过滤 Pending CN117916563A (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
BE20215744A BE1029775B9 (nl) 2021-09-21 2021-09-21 Persistentiefiltering bij spd arrays
BEBE2021/5744 2021-09-21
PCT/IB2022/058609 WO2023047245A1 (en) 2021-09-21 2022-09-13 Persistence filtering in spd arrays

Publications (1)

Publication Number Publication Date
CN117916563A true CN117916563A (zh) 2024-04-19

Family

ID=77914206

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202280060751.5A Pending CN117916563A (zh) 2021-09-21 2022-09-13 Spd阵列中的持久性过滤

Country Status (7)

Country Link
US (1) US20240406582A1 (enExample)
EP (2) EP4241051B1 (enExample)
JP (1) JP2024534413A (enExample)
KR (1) KR20240063146A (enExample)
CN (1) CN117916563A (enExample)
BE (1) BE1029775B9 (enExample)
WO (1) WO2023047245A1 (enExample)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP4534951A1 (en) * 2023-10-06 2025-04-09 VoxelSensors SRL Depth sensing system and method
WO2025176834A1 (en) 2024-02-22 2025-08-28 Voxelsensors Srl Optical sensing system
EP4671816A1 (en) 2024-06-27 2025-12-31 VoxelSensors SRL OPTICAL DETECTION SYSTEM
WO2025261994A1 (en) 2024-06-17 2025-12-26 Voxelsensors Srl System and method for visual awareness
EP4749401A1 (en) 2024-11-20 2026-05-27 VoxelSensors SRL System and method for visual awareness
EP4718143A1 (en) 2024-09-26 2026-04-01 VoxelSensors SRL Projector and method of projection
WO2025262029A1 (en) 2024-06-18 2025-12-26 Voxelsensors Srl Projector and method of projection

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20150097951A1 (en) * 2013-07-17 2015-04-09 Geoffrey Louis Barrows Apparatus for Vision in Low Light Environments
EP3159711A1 (en) * 2015-10-23 2017-04-26 Xenomatix NV System and method for determining a distance to an object
CN110537124B (zh) * 2017-03-01 2021-12-07 奥斯特公司 用于lidar的准确光检测器测量
EP3688809B1 (en) * 2017-09-27 2025-08-20 The Commonwealth of Australia A neuromorphic single photon avalanche detector (spad) array microchip
WO2019093208A1 (ja) * 2017-11-07 2019-05-16 江藤　剛治 高速イメージセンサ
US10497738B2 (en) * 2018-04-20 2019-12-03 Omnivision Technologies, Inc. First photon correlated time-of-flight sensor
KR102747641B1 (ko) * 2019-06-26 2024-12-27 삼성전자주식회사 비전 센서, 이를 포함하는 이미지 처리 장치 및 비전 센서의 동작 방법
WO2021054688A1 (ko) 2019-09-19 2021-03-25 한양대학교 산학협력단 온도감응형 자성중심 덴드리머 및 이의 제조방법

Also Published As

Publication number Publication date
JP2024534413A (ja) 2024-09-20
US20240406582A1 (en) 2024-12-05
EP4241051A1 (en) 2023-09-13
EP4471391A1 (en) 2024-12-04
BE1029775B1 (nl) 2023-04-17
KR20240063146A (ko) 2024-05-09
BE1029775A1 (nl) 2023-04-13
EP4241051B1 (en) 2024-08-21
WO2023047245A1 (en) 2023-03-30
BE1029775B9 (nl) 2023-10-09
BE1029775A9 (nl) 2023-10-02

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