CN117806891B

CN117806891B - Test system, method, device, equipment and medium based on server

Info

Publication number: CN117806891B
Application number: CN202410220308.0A
Authority: CN
Inventors: 王青; 谷风宝
Original assignee: Suzhou Metabrain Intelligent Technology Co Ltd
Current assignee: Suzhou Metabrain Intelligent Technology Co Ltd
Priority date: 2024-02-28
Filing date: 2024-02-28
Publication date: 2024-05-17
Anticipated expiration: 2044-02-28
Also published as: CN117806891A

Abstract

The invention discloses a test system, a method, a device, equipment and a medium based on a server, and relates to the technical field of server testing. The shell is used for accommodating the device to be tested of the server and isolating the memory of the device to be tested from other devices to be tested, and one end of the shell is provided with an air outlet; the memory temperature control system is positioned at the opposite end of the shell for accommodating the memory, provided with the air outlet, and comprises an air outlet device and a heater. The memory is isolated from other devices to be tested through the shell, so that heat dissipation or heating of the memory and the other devices to be tested are not interfered with each other. The memory does not need to consider the temperature simulation real scene of other components, and the real environment reflecting the memory is really built. For the memory temperature control system, through the cooperation of the air outlet device and the heater, the corresponding temperature environment simulation under two target wind power modes can be realized, and the reliability of performance test is improved.

Description

Test system, method, device, equipment and medium based on server

Technical Field

The present invention relates to the field of server testing technologies, and in particular, to a server-based testing system, method, apparatus, device, and medium.

Background

With the development of big data and artificial intelligence, the server is continuously optimized in terms of hardware performance. In order to meet the diversified application requirements of users, the memory of the server can be ensured to play the optimal performance in various application scenes.

The performance test of the current server memory is tested by a separate memory, but the real running environment inside the whole server cannot be simulated. If the performance of the whole server is tested in a certain temperature environment, the temperature of other components needs to be considered because the limit temperature of the memory and each component is different, so that the real memory temperature cannot be simulated. Both the above cases cannot reflect the real environment of the memory, resulting in reduced reliability of performance testing.

Therefore, how to improve the reliability of the performance test of the server memory is a technical problem that needs to be solved by those skilled in the art.

Disclosure of Invention

The invention aims to provide a test system, a method, a device, equipment and a medium based on a server, so as to solve the problem that the reliability of the performance test is reduced because the performance test of the current server memory cannot reflect the real environment of the memory.

In order to solve the technical problems, the invention provides a server-based test system, which comprises a shell and a temperature control system, wherein the temperature control system comprises a memory temperature control system;

the shell is used for accommodating a device to be tested of the server and isolating the memory of the device to be tested and other devices to be tested, and one end of the shell is provided with an air outlet;

The memory temperature control system is positioned at the opposite end of the shell for accommodating the memory, provided with an air outlet, and comprises an air outlet device and a heater, and is used for controlling the air outlet device to work for outputting air to the heater so as to output wind power in a target wind power mode of the memory, wherein the target wind power mode is a hot air mode or a cold air mode;

The controller is used for receiving the actual temperature and the target temperature of the memory, determining the corresponding target wind power mode according to the actual temperature and the target temperature, maintaining the target temperature of the memory to be stable, and performing performance test on the memory at the stable current temperature.

In one aspect, the number of memories of the device to be tested is a plurality of;

The number of the shells is the same as the number of the memories, and one shell comprises one memory;

The number of the memory temperature control systems is the same as that of the memories, and the memory temperature control systems are positioned at opposite ends of a shell accommodating the memories, wherein the opposite ends are provided with air outlets.

In another aspect, the housing comprises a first housing and a second housing;

the first shell is used for accommodating the memory of the device to be tested;

The second shell is used for accommodating other devices to be tested except the memory;

a separation plate is arranged between the first shell and the second shell.

On the other hand, the temperature control system also comprises other temperature control systems of devices to be tested;

the temperature control system of the other devices to be tested is positioned at the opposite end of the second shell, which is used for accommodating the other devices to be tested, and comprises a heat dissipation air outlet device, wherein the heat dissipation air outlet device is used for controlling the heat dissipation air outlet device to output cold air to the other devices to be tested by the controller;

and the controller is used for determining the wind power mode of cold wind according to the actual temperature and the preset temperature of the other devices to be tested so as to radiate the heat of the other devices to be tested.

On the other hand, the air outlet device of the memory temperature control system is positioned at the opposite end of the shell for accommodating the memory, the air outlet device is positioned at the middle position of the air outlet device and the memory, the air outlet of the air outlet device is completely blown to the heater, and the distance and the angle setting of the heater and the memory are determined based on the preset windward area of the memory.

In another aspect, the memory temperature control system further includes a heating device;

The heating device is positioned around the memory and is positioned at other areas except the preset windward area of the memory.

On the other hand, the opposite end of the shell, which is provided with the air outlet, is provided with a detachable air inlet for installing the air outlet device and the heater or the heat dissipation air outlet device.

In another aspect, the memory temperature control system further includes a monitoring device;

the monitoring devices are multiple in number and are used for monitoring the ambient temperature in the shell;

the monitoring device is arranged at the heater of the shell for accommodating the memory, the inner wall of the shell corresponding to the wind entering direction of the memory and the memory;

The monitoring device is further arranged around the memory and is spaced from the heating device by a preset distance.

In another aspect, the monitoring device is a temperature sensor;

and the controller is used for carrying out average processing on the temperature values in the shell acquired by the plurality of temperature sensors to obtain the actual temperature.

In order to solve the technical problems, the invention also provides a server-based testing method which is applied to a server-based testing system, wherein the testing system comprises a shell and a temperature control system, and the temperature control system comprises a memory temperature control system; the shell is used for accommodating a device to be tested of the server and isolating the memory of the device to be tested and other devices to be tested, and one end of the shell is provided with an air outlet; the memory temperature control system is positioned at the opposite end of the shell for accommodating the memory, provided with an air outlet, and comprises an air outlet device and a heater, and the testing method comprises the following steps:

receiving the actual temperature and the target temperature of the memory;

Determining a corresponding target wind power mode according to the actual temperature and the target temperature, wherein the target wind power mode is a hot air mode or a cold air mode;

And controlling the air outlet device of the memory temperature control system to work to outlet air to the heater so as to output the wind power in the target wind power mode of the memory to maintain the target temperature of the memory to be stable, and performing performance test on the memory at the current temperature after the stability.

In one aspect, the determining the corresponding target wind mode according to the actual temperature and the target temperature includes:

Acquiring an actual modulation pulse signal corresponding to the actual temperature and a target modulation pulse signal corresponding to the target temperature;

taking the target modulation pulse signal as a modulation pulse signal of the heater;

when the actual modulation pulse signal is larger than the modulation pulse signal of the heater or smaller than the modulation pulse signal of the heater, regulating and controlling the air-out rotating speed value of the air-out device according to the actual modulation pulse signal to determine a corresponding target air-out rotating speed value;

If the target air outlet rotating speed value is larger than a preset air outlet rotating speed value, determining that the target wind mode is the cold wind mode;

and if the target air outlet rotating speed value is smaller than the preset air outlet rotating speed value, determining that the target wind power mode is the hot air mode.

On the other hand, performing performance test on the memory at the stabilized current temperature, including:

Acquiring the corresponding memory under each load mode and read-write data under each speed type, wherein the load modes comprise full load, no load and running load modes of the memory;

And carrying out response capability test corresponding to the read-write data of each speed type on the memory in each load mode in the test system to obtain a test result.

invoking an abnormal fault tolerance mechanism based on the server and an error detection algorithm, wherein the error detection algorithm is based on a potential error scanning algorithm corresponding to an error factor of the memory;

And performing performance tests of the response capability, the abnormal fault tolerance mechanism and the error detection algorithm scanning corresponding to the read-write data of each speed type on the memory in each load mode in the test system to obtain test results.

In order to solve the technical problem, the invention also provides a server-based testing device which is applied to a server-based testing system, wherein the testing system comprises a shell and a temperature control system, and the temperature control system comprises a memory temperature control system; the shell is used for accommodating a device to be tested of the server and isolating the memory of the device to be tested and other devices to be tested, and one end of the shell is provided with an air outlet; the memory temperature control system is located and holds the memory the setting air outlet's of casing opposite end, and including air-out device and heater, testing arrangement includes:

The receiving module is used for receiving the actual temperature and the target temperature of the memory;

The determining module is used for determining a corresponding target wind power mode according to the actual temperature and the target temperature, wherein the target wind power mode is a hot air mode or a cold air mode;

And the output module is used for controlling the air outlet device of the memory temperature control system to work for air outlet to the heater so as to output the stable target temperature of the memory maintained by the wind power in the target wind power mode of the memory, so that the performance test is performed on the memory at the current temperature after the stable target temperature is achieved.

In order to solve the technical problem, the present invention further provides a server-based test device, including:

A memory for storing a computer program;

A processor for implementing the steps of the server-based testing method as described above when executing the computer program.

In order to solve the above technical problem, the present invention further provides a computer readable storage medium, on which a computer program is stored, which when executed by a processor, implements the steps of the server-based testing method as described above.

The invention provides a test system based on a server, which comprises a shell and a temperature control system, wherein the temperature control system comprises a memory temperature control system; the shell is used for accommodating the device to be tested of the server and isolating the memory of the device to be tested from other devices to be tested, and one end of the shell is provided with an air outlet; the memory temperature control system is located at the opposite end of the shell for accommodating the memory, provided with an air outlet, and comprises an air outlet device and a heater, and is used for controlling the air outlet device to work by air outlet to the heater so as to output wind power in a target wind power mode of the memory.

The invention has the beneficial effects that the memory is isolated from other devices to be tested through the shell, so that the heat dissipation or the heating of the memory and the other devices to be tested are not mutually interfered. Under the condition that the internal memory and other devices to be tested are mutually associated, the shell is isolated, the internal memory is prevented from having to consider the temperature simulation real scene of other devices, and the real environment reflecting the internal memory is truly built. In addition, for the memory temperature control system, through the cooperation of the air outlet device and the heater, the corresponding temperature environment simulation under two target wind power modes can be realized, and under the condition that the target temperature is exceeded or is smaller than the target temperature, the diversity of temperature output is improved in a limited space range through the heat dissipation and heating cooperation of the air outlet device and the heater, and the reliability of performance test is improved.

The isolation board is arranged between the first shell and the second shell, so that the memory and other devices to be tested are truly isolated, the two environmental temperatures do not influence interference, and the simulation authenticity of the environmental temperature of the memory is improved to improve the accuracy of the test performance of the memory; the temperature control system of other devices to be tested is used for ensuring the heat dissipation environment of other devices to be tested; the air outlet device, the heater and the memory are placed in relation to enlarge the air-bearing area of the memory, improve the air-bearing efficiency of the memory and enable the ambient temperature of the memory to reach the target temperature; considering the condition of disassembly, a detachable air inlet can be arranged at the opposite end of the shell provided with the air outlet, so that the air outlet device and the heater or the heat dissipation air outlet device can be conveniently installed; and (3) carrying out average treatment on the plurality of temperature values to obtain the actual temperature so as to be attached to the ambient temperature of the memory, thereby ensuring the balance.

In addition, the invention also provides a test method, a device, equipment and a medium based on the server, which have the same beneficial effects as the test system based on the server.

Drawings

For a clearer description of embodiments of the present invention, the drawings that are required to be used in the embodiments will be briefly described, it being apparent that the drawings in the following description are only some embodiments of the present invention, and other drawings may be obtained according to the drawings without inventive effort for those skilled in the art.

Fig. 1 is a schematic structural diagram of a server-based test system according to an embodiment of the present invention;

FIG. 2 is a flowchart of a testing method based on a server according to an embodiment of the present invention;

FIG. 3 is a schematic diagram of a memory temperature control system according to an embodiment of the present invention;

FIG. 4 is a block diagram of a server-based testing device according to an embodiment of the present invention;

fig. 5 is a block diagram of a server-based test apparatus according to an embodiment of the present invention.

Detailed Description

The following description of the embodiments of the present invention will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present invention, but not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by a person of ordinary skill in the art without making any inventive effort are within the scope of the present invention.

The invention provides a test system, a method, a device, equipment and a medium based on a server, which are used for solving the problem that the reliability of the performance test is reduced because the performance test of the current server memory cannot reflect the real environment of the memory.

In order to better understand the aspects of the present invention, the present invention will be described in further detail with reference to the accompanying drawings and detailed description.

The current server adopts a complex system architecture, including a multi-channel memory, an architecture and the like, and the complex design puts high requirements on the performance test of the memory. However, the hardware environment of the current server cannot reach the use environment of the real memory, the operation environment of other devices to be tested in the server can be considered in the memory test, the temperature environment of other devices to be tested is often smaller than that of the memory, if the performance test is performed on the memory under the whole server, the damage of the devices can occur to the other devices to be tested due to higher temperature, and even the whole server is down. Under the operating environment of other devices to be tested, the real environment of the memory cannot be reflected, so that the reliability of the performance test of the memory is reduced.

The device to be tested in the server comprises a memory, a central processing unit (Central Processing Unit, CPU) and the like, and the hardware construction environment corresponding to the current performance test is that the whole server is in the same temperature environment or only a single memory is tested. In either way, the temperature environment in which the performance test exists throughout the server cannot be reflected. Therefore, the server-based test system provided by the invention can solve the technical problems.

Fig. 1 is a schematic structural diagram of a server-based test system according to an embodiment of the present invention, where the test system includes a housing 1 and a temperature control system, and the temperature control system includes a memory temperature control system;

the device comprises a shell 1, a server and a control unit, wherein the shell 1 is used for accommodating a device to be tested of the server and isolating a memory 2 of the device to be tested from other devices to be tested, and an air outlet is formed in one end of the shell 1;

The memory temperature control system is positioned at the opposite end of the shell 1 for accommodating the memory 2, is provided with an air outlet, and comprises an air outlet device 3 and a heater 4, and is used for controlling the air outlet device 3 to work by air outlet to the heater 4 so as to output wind power in a target wind power mode of the memory 2, wherein the target wind power mode is a hot air mode or a cold air mode;

The controller is used for receiving the actual temperature and the target temperature of the memory 2, determining a corresponding target wind power mode according to the actual temperature and the target temperature, and maintaining the target temperature of the memory 2 to be stable, so as to perform performance test on the memory 2 at the stable current temperature.

Specifically, the housing is a device under test for accommodating the server, where the device under test includes other devices such as a memory and a CPU, and functions to isolate the memory and other devices under test of the device under test in addition to accommodating the device under test. It can be appreciated that the housing includes two types, the first type is that only the memory is accommodated to isolate the memory and other devices to be tested; the second type is to accommodate the memory and also accommodate other devices to be tested, and the second type of accommodation includes two types of housings.

The air outlet is arranged at one end of the shell to play a role in ventilation and heat dissipation, and because the invention considers that the wind power mode in the shell comprises a hot air mode and a cold air mode, if the air outlet is arranged at one end of the shell in order to improve the heat dissipation efficiency under the condition of the cold air mode.

The temperature control system of the test system of the invention can be two, one is a memory temperature control system, and the other temperature control system of the device to be tested except the memory is mainly corresponding to the performance test of the memory, therefore, the memory temperature control system is positioned at the opposite end of the shell containing the memory, where the air outlet is arranged, and the memory temperature control system can be inside the shell or outside the shell. If inside the casing, its opposite end can have the baffle, need not to set up the air outlet, if outside the casing, the opposite end of casing needs to set up the air intake for increase the temperature for the memory in order to simulate the real temperature environment of memory operation in-process.

The memory temperature control system comprises an air outlet device and a heater, wherein the air outlet device can be any device used for air outlet, such as a blower or a fan. Typically, fans are placed within the servers. The heater consists of a heating film and a radiator, and the temperature environment of the memory can be heated and radiated by blowing air to the heater through the adjustment of the rotating speed of the fan. The memory temperature control system is used for controlling the air outlet device to outlet air to the heater to work so as to output wind power in a target wind power mode of the memory. The target wind power modes include a hot air mode and a cold air mode, and it is to be noted that the hot air mode and the cold air mode are heating and radiating based on a temperature environment of a memory inside a shell containing the memory, and are specifically realized through adjusting the rotating speed of an air outlet device.

The controller receives the actual temperature and the target temperature of the memory, and the target temperature is given to the heater, so that the final purpose is that the temperature environment of the memory reaches the target temperature, and the performance test of the memory can be conveniently operated and checked at the target temperature.

The actual temperature is the actual temperature of the temperature environment of the current memory, and if the actual temperature is greater than the target temperature, the temperature needs to be reduced; if the actual temperature is less than the target temperature, the temperature is increased, and two different decisions correspond to the target wind power mode to maintain the target temperature of the memory stable, so that the subsequent memory performance test is facilitated. The wind power corresponding to the target wind power mode is that the controller controls the wind outlet device to outlet wind to the heater so as to output the wind power of the target wind power mode, thereby achieving the target temperature stability of the memory. Of course, the real-time change of the temperature environment of the memory is an ideal situation to ensure the constant target temperature, the target temperature may tend to be reached in the real floor construction process, the adjusted actual temperature may be close to the target temperature, for example, the difference between the adjusted actual temperature and the target temperature is 0.1 ℃, the target temperature is allowed to have a certain range, and the target temperature stability of the memory can be determined as long as the adjusted actual temperature is within the range of the target temperature.

In addition, the isolation distribution condition of the shell is not limited herein, and the isolation distribution condition can be adjusted based on the actual condition of the memory, and the memory and other devices to be tested are placed on the main board in a left-right mode, so that the shell can respectively set the memory and the other devices to be tested, or can only set the memory. In some embodiments, the height of the memory on the motherboard is higher than that of other devices to be tested, and the memory temperature control system and the temperature control system of other devices to be tested are in a stacked state on the motherboard, so that an upper layer design and a lower layer design can be realized, and therefore, an upper air duct and a lower air duct can be realized, as shown in fig. 1, the upper air duct is isolated from the lower air duct by a partition board between the upper air duct shell 1 and the lower air duct shell 1, and is used for simulating the temperature environment of the memory 2, and the lower air duct is used for simulating the temperature environment of other devices to be tested. The upper air duct comprises an upper air outlet device and a heater 4, the shell 1 guides the air heated by the upper air outlet device through the heater 4 to the memory 2 area, and meanwhile, the air can be discharged through an upper right air outlet. The lower layer air duct comprises a lower layer heat dissipation air outlet device and a main board 5, and the shell 1 blows the lower layer heat dissipation air outlet device to other devices to be tested. The upper air duct and the lower air duct are isolated, so that heat dissipation and heating of the memory 2 and other devices to be tested are not interfered with each other.

The air outlet device can realize the district regulation and control, does not limit the number of air outlet device here, can exist a plurality of, and every air outlet device can automatic regulation and control, realizes the fan rotational speed of different positions through regulation and control different to satisfy the amount of wind of different positions, realize the demand of accurate control amount of wind, realize automatic regulation and control according to ambient temperature change and part position power consumption change.

The embodiment of the invention provides a test system based on a server, which comprises a shell and a temperature control system, wherein the temperature control system comprises a memory temperature control system; the shell is used for accommodating the device to be tested of the server and isolating the memory of the device to be tested from other devices to be tested, and one end of the shell is provided with an air outlet; the memory temperature control system is located at the opposite end of the shell for accommodating the memory, provided with an air outlet, and comprises an air outlet device and a heater, and is used for controlling the air outlet device to work by air outlet to the heater so as to output wind power in a target wind power mode of the memory. According to the invention, the memory is isolated from other devices to be tested through the shell, so that the heat dissipation or heating of the memory and the other devices to be tested are not interfered with each other. Under the condition that the internal memory and other devices to be tested are mutually associated, the shell is isolated, the internal memory is prevented from having to consider the temperature simulation real scene of other devices, and the real environment reflecting the internal memory is truly built. In addition, for the memory temperature control system, through the cooperation of the air outlet device and the heater, the corresponding temperature environment simulation under two target wind power modes can be realized, and under the condition that the target temperature is exceeded or is smaller than the target temperature, the diversity of temperature output is improved in a limited space range through the heat dissipation and heating cooperation of the air outlet device and the heater, and the reliability of performance test is improved.

In some embodiments, the number of memories of the device under test is multiple;

the number of the shells is the same as that of the memories, and one shell comprises one memory;

The number of the memory temperature control systems is the same as that of the memories, and the memory temperature control systems are positioned at the opposite ends of the shell accommodating the memories, where the air outlets are arranged.

It can be understood that the number of memories in the device to be tested is multiple, one housing accommodates one memory, and in addition, in order to improve the reality of the environment temperature of the simulated memory, one memory temperature control system exists in one housing, so that the memories in the housing have pertinence, one memory temperature control system is responsible for one memory, and the accuracy of the temperature environment of the memory is ensured.

Based on the above embodiments, in some embodiments, the housing includes a first housing and a second housing;

a first housing for accommodating a memory of a device under test;

A second housing for accommodating other devices to be tested except the memory;

A separation plate is arranged between the first shell and the second shell.

In this embodiment, under the condition that the memory and other devices to be tested are connected, some first housing accommodating the memory or second housing accommodating other devices to be tested are not a closed space, and under the condition that an air outlet or an air inlet is also formed at the opposite end, a separation plate needs to be arranged between the first housing and the second housing, so as to separate the memory and other devices to be tested. In addition, the devices to be tested are all placed on the motherboard, the housing may have a shape similar to a high-level pulse signal, the high-level shape is internally accommodated in the device to be tested, the low-level shape is partially fixed on the motherboard, if the memory and other devices to be tested form an upper air channel and a lower air channel, as shown in fig. 1, a partition plate needs to be arranged between the upper air channel and the lower air channel, that is, between the first housing and the second housing.

In this embodiment, a separation plate is disposed between the first housing and the second housing, so that the memory and other devices to be tested are truly separated, the two environmental temperatures do not affect the interference, and the simulation authenticity of the environmental temperature of the memory is improved to improve the accuracy of the test performance of the memory.

In some embodiments, the temperature control system further comprises other device under test temperature control systems;

and the controller is used for determining the wind power mode of cold wind according to the actual temperature and the preset temperature of other devices to be tested so as to radiate heat of the other devices to be tested.

In the above embodiment, it is mentioned that the temperature control system further includes other temperature control systems for devices to be tested, where the location of the temperature control system may be the same as or different from the location in the housing that accommodates the memory in the above embodiment, which is not limited herein. In order to set uniformity, the device is positioned at the opposite end of the second shell, which is used for accommodating other devices to be tested, and is provided with an air outlet, the position of the device is the same as that in the shell for accommodating the memory. Because other devices to be tested only need heat dissipation treatment, the air outlet device in the embodiment is a heat dissipation air outlet device, and a heater is not needed, so that the air outlet mode of the corresponding heat dissipation air outlet device is determined through the actual temperature and the preset temperature of the other devices to be tested so as to dissipate heat of the other devices to be tested.

The temperature control system of other devices to be tested provided in the embodiment ensures the heat dissipation environment of other devices to be tested.

In the above embodiment, the air outlet device of the memory temperature control system is located at the opposite end of the housing accommodating the memory, where the air outlet is provided, the heater is located at the middle position of the air outlet device and the memory, and the air outlet of the air outlet device is completely blown to the heater, and the distance and angle between the heater and the memory are determined based on the preset air receiving area of the memory.

It can be understood that, for the actual placement positions of the air outlet device, the heater and the memory of the memory temperature control system, the air outlet device is located at the opposite end of the air outlet set on the shell, the heater is located at the middle position of the air outlet device and the memory, the placement is not on the same horizontal plane, but can be based on different horizontal planes, and based on the cross section, whether the heater is located at the middle position of the memory and the air outlet device or on the left side or the right side, in addition, in order to improve the heating and heat dissipation of the memory and reach the target temperature as soon as possible, the air outlet of the air outlet device is completely blown to the heater, and the distance and the angle between the heater and the memory are determined based on the preset air receiving area of the memory.

It should be noted that the setting of the heater and the memory may be based on the area consideration in the specific motherboard or the occupation area consideration of all the temperature control systems, on this basis, the heater may be in the same horizontal plane with the memory, or the setting height of the heater may be greater than the setting height of the memory, so as to increase the windward area of the memory, and may make the ambient temperature of the memory reach the target temperature faster. The angle setting is correspondingly different based on the difference in height of the heater. The distance setting is set in consideration of the entire length of the housing and the entire setting of the memory and the main board, and is not limited herein.

The placement relation among the air outlet device, the heater and the memory is provided in the embodiment, so that the air-bearing area of the memory is enlarged, the air-bearing efficiency of the memory is improved, and the ambient temperature of the memory reaches the target temperature.

In some embodiments, the memory temperature control system further comprises a heating device;

Considering that the peripheral area of the memory is not necessarily blown by the heater, a heating device is added around the memory to compensate the windward condition of other areas except the preset windward area of the memory, and the set position is also set at other areas to perform secondary compensation on the temperature change caused by the environmental temperature change. So that the ambient temperature of the memory reaches the target temperature at the highest speed.

On the basis of the above embodiments, in some embodiments, a detachable air inlet is provided at the opposite end of the housing where the air outlet is provided, for installing the air outlet device and the heater or the heat dissipation air outlet device.

In this embodiment, the disassembly condition of the air outlet device, the heater and the heat dissipation air outlet device of other devices to be tested is considered, and the detachable air inlet is arranged at the opposite end of the internal air outlet of the shell for assembly and disassembly. In addition, the shell at the top of the shell can be detachable corresponding to the detachment of the memory. The shell can be detachably mounted on the main board and fixed and detached through screws or parts.

In this embodiment, the disassembly condition is considered, and the detachable air inlet can be formed at the opposite end of the air outlet formed in the shell, so that the air outlet device and the heater or the heat dissipation air outlet device can be conveniently installed.

In some embodiments, the memory temperature control system further comprises a monitoring device;

The monitoring device is also arranged around the memory and is spaced by a preset distance from the heating device.

Specifically, the monitoring device in this embodiment is mainly used for monitoring the environmental temperature in the shell, and may be provided in a plurality of positions, distributed in a plurality of positions of the shell, provided at the heater, at the inner wall of the shell and the memory corresponding to the air inlet direction of the memory, or may be other positions, which is not limited herein, and may be set according to the actual situation. In addition, the method comprises the following steps. If the heating device is arranged around the memory, the monitoring device is arranged around the memory and is spaced with the heating device by a preset distance, so that temperature monitoring at different positions is realized, and the power consumption regulation and control of the heating device and the regulation and control of the rotating speed of the air outlet device are realized through temperature change.

In some embodiments, the monitoring device is a temperature sensor;

It can be understood that the temperature values in the shell collected by the temperature sensors are different, and a difference exists between the temperature values, so that the temperature values are averaged to obtain the actual temperature so as to be attached to the ambient temperature of the memory, and the balance is ensured.

FIG. 2 is a flow chart of a server-based testing method according to an embodiment of the present invention, the method is applied to a server-based testing system, the testing system includes a housing and a temperature control system, and the temperature control system includes a memory temperature control system; the shell is used for accommodating the device to be tested of the server and isolating the memory of the device to be tested from other devices to be tested, and one end of the shell is provided with an air outlet; the memory temperature control system is located at the opposite end of the housing for accommodating the memory, where the opposite end is provided with an air outlet, and includes an air outlet device and a heater, as shown in fig. 2, and the testing method includes:

S11: receiving the actual temperature and the target temperature of the memory;

S12: determining a corresponding target wind power mode according to the actual temperature and the target temperature;

The target wind power mode is a hot air mode or a cold air mode;

S13: and controlling an air outlet device of the memory temperature control system to outlet air to the heater to work so as to output the wind power in a target wind power mode of the memory to maintain the stable target temperature of the memory, and performing performance test on the memory at the stable current temperature.

Specifically, fig. 3 is a schematic diagram of a memory temperature control system provided in an embodiment of the present invention, as shown in fig. 3, a baseboard management controller 6 (Baseboard Management Controller, BMC) collects an actual temperature of a memory 2 and sends the actual temperature to a controller 7, the controller 7 obtains a target temperature and the actual temperature required by the memory 2, and controls a heater 4 and an air outlet device 3 to regulate, in the above embodiment, it is mentioned that the heater 4 is composed of a heating film and a radiator, and power consumption of the heating film is 0-120W adjustable. The controller 7 performs linear regulation and control on the power consumption of the heater 4, and the upper air outlet device 3 performs Proportional Integral Derivative (PID) regulation and control on the memory 2.

Specifically, the target temperature is a given temperature of the interior of the casing to be reached by the memory temperature control system, the target temperature is converted into a pulse width modulation (Pulse Width Modulation, PWM) signal and then is sent to the heater, the conversion between the temperature in the heater and the power consumption and the PWM signal can be obtained through a pre-established mapping relationship, table 1 is a heater power consumption table, and as shown in table 1, the corresponding heater PWM signal and the corresponding power consumption can be obtained according to the target temperature.

Table 1 heater power consumption meter

The method comprises the steps of converting the actual temperature of an acquisition memory into an actual PWM value, determining an adjusted PWM value according to comparison of the actual PWM value and a target PWM value, if the actual PWM value is larger than the target PWM value, reducing the pulse width corresponding to the actual PWM value to obtain an adjusted PWM value, supplying the adjusted PWM value to an air outlet device, and converting the adjusted PWM value into a corresponding air velocity heater to blow air based on the adjusted PWM value. And if the actual PWM value is smaller than the target PWM value, widening the pulse width corresponding to the actual PWM value to obtain an adjusted PWM value so as to convert the PWM value into wind speed.

Specifically, determining a corresponding target wind power mode according to the actual temperature and the target temperature includes:

Under the condition that the actual modulation pulse signal is larger than the modulation pulse signal of the heater or smaller than the modulation pulse signal of the heater, regulating and controlling the air-out rotating speed value of the air-out device according to the actual modulation pulse signal to determine a corresponding target air-out rotating speed value;

If the target air-out rotating speed value is larger than the preset air-out rotating speed value, determining that the target wind power mode is a cold wind mode;

if the target air-out rotating speed value is smaller than the preset air-out rotating speed value, determining that the target wind power mode is a hot air mode.

In this embodiment, the corresponding target air outlet rotational speed value is determined by adjusting and controlling the air outlet rotational speed value of the air outlet device according to the actual modulation pulse signal, which may be directly adjusted and controlled based on the actual modulation pulse signal, and the specific embodiment may be PID adjustment and control, and may be obtained by the following formula:

；

wherein, For/>Time,/>For/>Time,/>For/>Time,/>For/>PWM value corresponding to time,/>For/>PWM value corresponding to time,/>For/>The actual temperature at the moment in time is,For/>Actual temperature at time,/>Is P factor item,/>Is I factor item,/>Is D factor item,/>For/>Target temperature at time,/>For/>The actual temperature at the moment.

The controller inputs the memory detection target temperature and sends a heating command to the heater, and at the moment, the heater heats with the highest power consumption; simultaneously, the controller sends an initial rotating speed to the fan, the fan operates at a rotating speed value of 10%, and hot air at the heater is blown to the memory area. The BMC sends the memory temperature to the controller in real time, when the memory temperature reaches 85 ℃, the heater and the fan are started to regulate and control the mode, the controller converts the memory target temperature into a PWM signal which linearly corresponds to the power consumption value of the heater, and the specific corresponding relation is shown in the table 1. The fan performs PID control on the memory, and reduces the memory to the required temperature.

And if the actual PWM value is larger than the target PWM value, the pulse width corresponding to the actual PWM value is reduced to obtain an adjusted PWM value, the adjusted PWM value is given to the air outlet device, and the air is blown by the corresponding air velocity heater based on the conversion of the adjusted PWM value. If the actual PWM value is smaller than the target PWM value, the pulse width corresponding to the actual PWM value is widened to obtain an adjusted PWM value for converting the PWM value into the wind speed, which is not limited herein.

In addition, for determining the target wind power mode, if the PWM value of the air outlet device is obtained by the PID regulation mode, the target air outlet rotation speed value is determined based on the PWM value of the air outlet device, and since the initial rotation speed is sent at the initial time, the air outlet device can be operated at the 10% rotation speed value at this time, if the target air outlet rotation speed value is greater than the preset air outlet rotation speed value, the current ambient temperature of the memory needs to be radiated, and then the air outlet mode is determined, and conversely, the air outlet mode is determined to be the hot air mode.

In this embodiment, the corresponding target wind power mode is determined through the determination process of the PWM value of the wind outlet device, and the adjustment can be more accurate through PID regulation and control.

According to the server-based testing method provided by the embodiment of the invention, for the memory temperature control system, through the matching of the air outlet device and the heater, the corresponding temperature environment simulation under two target wind power modes can be realized, and under the condition that the target temperature is exceeded or is smaller than the target temperature, the heat dissipation and heating of the air outlet device and the heater are matched, so that the diversity of temperature output is improved in a limited space range, and the reliability of performance testing is improved.

In some embodiments, performing performance testing on the memory at the current temperature includes:

Acquiring corresponding memory under each load mode and read-write data under each speed type, wherein the load modes comprise full load, no load and running load modes of the memory;

And performing response capability test corresponding to the read-write data of each speed type on the memory under each load mode in the test system to obtain a test result.

It can be understood that in the actual performance test process, the speed test of the read and write data is mainly tested according to the read and write data of the corresponding memory in each load mode and the speed type, that is, based on the read and write data of each speed type in various different memory satisfying, idle load and running load modes, so as to evaluate the data transmission rate and stability of the server memory.

The method is characterized in that various read-write rates of memories in different load modes are evaluated based on various ambient temperatures, and then a proper data transmission rate is found under the condition of ensuring stable data transmission. In addition, the test system also needs to evaluate the response capability corresponding to the read-write data, and the test result is obtained based on the response capability tested at various read-write speeds. The test result in this embodiment determines that there is power consumption generated in the operation process, and at the same time, finds appropriate memories of different models corresponding to different ambient temperatures.

In other embodiments, performance testing of the memory at the current temperature includes:

Acquiring corresponding memories under each load mode and read-write data under various types, wherein the load modes comprise full load, no load and running load modes of the memories;

Invoking an abnormal fault tolerance mechanism based on a server and an error detection algorithm, wherein the error detection algorithm is based on a potential error scanning algorithm corresponding to an error factor of a memory;

And performing performance tests of corresponding response capability, abnormal fault tolerance mechanism and error detection algorithm scanning of the type of read-write data on the memory under each load mode in the test system to obtain test results.

On the basis of the embodiment, an abnormal fault tolerance mechanism and an error detection algorithm are added. The abnormal fault tolerance mechanism ensures the stability of the test system and processes the corresponding memory performance when the server crashes or the performance is reduced. And the error detection algorithm is used for comprehensively scanning the memory and injecting an error correction and repair mechanism of the memory of the potential error verification server corresponding to the error factors of the memory. The abnormal fault-tolerant mechanism is a mechanism which can be directly ignored when an abnormality occurs, and common abnormal fault-tolerant mechanisms include a failure automatic switching fault-tolerant mechanism, a quick failure fault-tolerant mechanism, a failure safety fault-tolerant mechanism, a failure automatic recovery fault-tolerant mechanism, a plurality of server fault-tolerant mechanisms which are called in parallel, and the like. The failure automatic switching fault-tolerant mechanism is to retry other servers when a situation occurs, and is usually used for reading operation; the quick failure fault-tolerant mechanism is to initiate a call only once, immediately report errors when the call fails, and is usually used for non-idempotent write operation, and if a machine is restarting, call failure can occur; the failure safety fault-tolerant mechanism is directly ignored when an abnormality occurs, and is generally used for writing audit logs and other operations; the failure automatic recovery fault-tolerant mechanism is that a background records a failure request, and is used for timing retransmission, and is usually used for informing unreliable operation and restarting loss; the fault-tolerant mechanism of calling a plurality of servers in parallel is to return as soon as one succeeds, and is usually used for read operation with higher real-time requirement.

The error detection algorithm is determined based on error factors of a server memory under potential error scanning, the potential error scanning algorithm is an algorithm for integrating common errors, loopholes and the like under the whole server, utilizing a scanner to realize loophole management, integrating a large number of disclosed loopholes of all utilization codes, automatically calling the loophole codes, and designating a corresponding test target for detecting and scanning for testing. And simulating and injecting corresponding loopholes (errors) in various detections under the memory test to verify the memory test capability of the server. For example, the test parameters are changed to obtain the bit state and the bit-free state of the memory to test the memory.

The latent error scanning algorithm in this embodiment may be performed based on an error detection tool (Address Sanitizer, ASAN), and may detect out-of-range access of data structures (heaps), stacks (stacks), global class data (globals) and security vulnerability type (use-after-free) errors. The method can also be used for detecting the memory faults based on a universal Boot loader (Universal Boot Loader, U-Boot) as a bootstrap program, for example, detecting data lines, address lines, physical storage components and the like, wherein the common errors of a memory chip are bit-stuck, in short, the memory chip is 0 and is biased to be 1; let it be 1 and bias it to 0, the detection method is also simple, i.e. using different pattern patterns to write all addresses as much as possible and read back the comparison. There are some commonly used patterns such as 0x5555, 0xAAAA, etc. In addition, modeling processing can be performed based on the memory error feature, a latent error scanning algorithm constructed by using a memory error feature model is utilized, corresponding error elements in the memory testing process exist in the model, and the error elements are used as error features for feature extraction processing, wherein the memory error feature model is not limited and can be established based on a deep learning model, a machine learning model and the like.

It should be noted that in the performance test process, initialization parameters of the server, including but not limited to server configuration, memory type and corresponding number, need to be set, so that the performance test method has high parameter flexibility to adapt to server systems of different types and scales, and meanwhile, a user can set the initialization parameters to meet actual test requirements. Moreover, the initialization parameters of the standard server configuration under each memory model can be provided, so that reference is provided, and the user operation is simplified. In the whole performance test process, corresponding log data and files with audit functions are generated, and the data in the memory problem or the running process are recorded in the log files so as to be convenient for tracking configuration changes, and the method is beneficial to troubleshooting the problem, knowing the reasons of the configuration changes and backtracking when needed.

In the embodiment, the performance test performed by the response capability, the abnormal fault tolerance mechanism and the error detection algorithm scanning is considered to obtain a test result, so that the test system is ensured to comprehensively and effectively evaluate the performance test of the memory, and powerful support is provided for system optimization and adjustment.

The invention further discloses a server-based testing device corresponding to the method, and fig. 4 is a structural diagram of the server-based testing device according to the embodiment of the invention. The system is applied to a server-based test system, the test system comprises a shell and a temperature control system, and the temperature control system comprises a memory temperature control system; the shell is used for accommodating the device to be tested of the server and isolating the memory of the device to be tested from other devices to be tested, and one end of the shell is provided with an air outlet; the memory temperature control system is located the setting air outlet's of the casing that holds the memory opposite end, and includes air-out device and heater, as shown in fig. 4, and the device includes:

a receiving module 11, configured to receive an actual temperature and a target temperature of the memory;

A determining module 12, configured to determine a corresponding target wind mode according to the actual temperature and the target temperature, where the target wind mode is a hot air mode or a cold air mode;

and the output module 13 is used for controlling the air outlet device of the memory temperature control system to outlet air to the heater so as to output the stable target temperature of the wind power maintenance memory in the target wind power mode of the memory, so that the performance test is performed on the memory at the current temperature after the stable target temperature.

In some embodiments, the determination module 12 includes:

The first acquisition submodule is used for acquiring an actual modulation pulse signal corresponding to the actual temperature and a target modulation pulse signal corresponding to the target temperature;

the first sub-module is used for taking the target modulation pulse signal as the modulation pulse signal of the heater;

the first regulation and control submodule is used for regulating and controlling the air-out rotating speed value of the air-out device according to the actual modulation pulse signal to determine a corresponding target air-out rotating speed value under the condition that the actual modulation pulse signal is larger than the modulation pulse signal of the heater or smaller than the modulation pulse signal of the heater;

The first determining submodule is used for determining that the target wind power mode is a cold wind mode if the target wind outlet rotating speed value is larger than a preset wind outlet rotating speed value;

And the second determining submodule is used for determining that the target wind power mode is a hot wind mode if the target wind outlet rotating speed value is smaller than the preset wind outlet rotating speed value.

In some embodiments, the performance test of the memory at the stabilized current temperature of the output module 13 includes:

The second acquisition sub-module is used for acquiring the corresponding memory under each load mode and the read-write data under each speed type, wherein the load modes comprise full load, no load and running load modes of the memory;

the first obtaining submodule is used for carrying out response capability test corresponding to read-write data of each speed type on the memory under each load mode in the test system so as to obtain a test result.

The third acquisition sub-module is used for acquiring the corresponding memory under each load mode and the read-write data under each speed type, wherein the load modes comprise full load, no load and running load modes of the memory;

The first calling sub-module is used for calling an abnormal fault-tolerant mechanism based on the server and an error detection algorithm, wherein the error detection algorithm is based on a potential error scanning algorithm corresponding to an error factor of the memory;

and the second obtaining submodule is used for carrying out performance tests of read-write data corresponding to each speed type, an abnormal fault-tolerant mechanism and an error detection algorithm scanning on the memory under each load mode in the test system so as to obtain a test result.

Since the embodiments of the device portion correspond to the above embodiments, the embodiments of the device portion are described with reference to the embodiments of the method portion, and are not described herein.

For the description of the server-based testing device provided by the invention, please refer to the above method embodiment, the description of the method is omitted herein, and the method has the same advantages as the server-based testing method.

Fig. 5 is a structural diagram of a server-based test device according to an embodiment of the present invention, as shown in fig. 5, where the device includes:

a memory 21 for storing a computer program;

A processor 22 for implementing the steps of the server-based test method when executing the computer program.

The server-based test device provided in this embodiment may include, but is not limited to, a tablet computer, a notebook computer, a desktop computer, or the like.

Processor 22 may include one or more processing cores, such as a 4-core processor, an 8-core processor, or the like, among others. The Processor 22 may be implemented in hardware in at least one of a digital signal Processor (DIGITAL SIGNAL Processor, DSP), field-Programmable gate array (fieldprogrammable GATE ARRAY, FPGA), programmable logic array (Programmable Logic Array, PLA). The processor 22 may also include a main processor, which is a processor for processing data in an awake state, also called a CPU, and a coprocessor; a coprocessor is a low-power processor for processing data in a standby state. In some embodiments, the processor 22 may be integrated with an image processor (Graphics Processing Unit, GPU) that is responsible for rendering and rendering of the content that the display screen is required to display. In some embodiments, the processor 22 may also include an artificial intelligence (ARTIFICIAL INTELLIGENCE, AI) processor for processing computing operations related to machine learning.

Memory 21 may include one or more computer-readable storage media, which may be non-transitory. Memory 21 may also include high-speed random access memory, as well as non-volatile memory, such as one or more magnetic disk storage devices, flash memory storage devices. In this embodiment, the memory 21 is at least used for storing a computer program 211, which, when loaded and executed by the processor 22, is capable of implementing the relevant steps of the server-based testing method disclosed in any of the foregoing embodiments. In addition, the resources stored in the memory 21 may further include an operating system 212, data 213, and the like, and the storage manner may be transient storage or permanent storage. Operating system 212 may include Windows, unix, linux, among other things. The data 213 may include, but is not limited to, data related to server-based testing methods, and the like.

In some embodiments, the server-based test device may further include a display screen 23, an input-output interface 24, a communication interface 25, a power supply 26, and a communication bus 27.

Those skilled in the art will appreciate that the architecture shown in fig. 5 is not limiting of the server-based test equipment and may include more or fewer components than illustrated.

The processor 22 implements the server-based test method provided in any of the above embodiments by calling instructions stored in the memory 21.

For the introduction of the server-based test device provided by the present invention, please refer to the above method embodiment, the description of the method is omitted herein, and the method has the same advantages as the above server-based test method.

Further, the present invention also provides a computer readable storage medium having a computer program stored thereon, which when executed by the processor 22 implements the steps of the server-based testing method as described above.

It will be appreciated that the methods of the above embodiments, if implemented in the form of software functional units and sold or used as stand-alone products, may be stored on a computer readable storage medium. Based on this understanding, the technical solution of the present invention may be embodied essentially or in part or in whole or in part in the form of a software product stored in a storage medium for performing all or part of the steps of the method according to the embodiments of the present invention. And the aforementioned storage medium includes: a U-disk, a removable hard disk, a Read-Only Memory (ROM), a random access Memory (Random Access Memory, RAM), a magnetic disk, or an optical disk, or other various media capable of storing program codes.

For an introduction to a computer readable storage medium provided by the present invention, please refer to the above method embodiment, the present invention is not described herein, and the method has the same advantages as the above server-based testing method.

The test system, the test method, the test device, the test equipment and the test medium based on the server provided by the invention are described in detail. In the description, each embodiment is described in a progressive manner, and each embodiment is mainly described by the differences from other embodiments, so that the same similar parts among the embodiments are mutually referred. For the device disclosed in the embodiment, since it corresponds to the method disclosed in the embodiment, the description is relatively simple, and the relevant points refer to the description of the method section. It should be noted that it will be apparent to those skilled in the art that the present invention may be modified and practiced without departing from the spirit of the present invention.

It should also be noted that in this specification, relational terms such as first and second, and the like are used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Moreover, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising one … …" does not exclude the presence of other like elements in a process, method, article, or apparatus that comprises an element.

Claims

1. The test system based on the server is characterized by comprising a shell and a temperature control system, wherein the temperature control system comprises a memory temperature control system;

the controller is used for receiving the actual temperature and the target temperature of the memory, determining the corresponding target wind power mode according to the actual temperature and the target temperature, maintaining the target temperature of the memory to be stable, and performing performance test on the memory at the stable current temperature;

wherein the number of the shells is the same as the number of the memories, and one shell comprises one memory;

2. The server-based test system of claim 1, wherein the number of memories of the device under test is a plurality.

3. The server-based testing system of claim 1, wherein the housing comprises a first housing and a second housing;

a separation plate is arranged between the first shell and the second shell.

4. The server-based test system of claim 3, wherein the temperature control system further comprises other device under test temperature control systems;

5. The server-based testing system of any one of claims 1-4, wherein an air outlet device of said memory temperature control system is located at an opposite end of said housing containing said memory where an air outlet is located, said heater is located at an intermediate position between said air outlet device and said memory, and an air outlet of said air outlet device is fully blown toward said heater, and a distance and angle setting of said heater and said memory is determined based on a preset air-receiving area of said memory.

6. The server-based testing system of claim 5, wherein said memory temperature control system further comprises a heating device;

7. The server-based testing system of claim 5, wherein a detachable air inlet is provided at an opposite end of the housing where the air outlet is provided for mounting the air outlet device and the heater or heat dissipating air outlet device.

8. The server-based testing system of claim 6, wherein the memory temperature control system further comprises a monitoring device;

9. The server-based test system of claim 8, wherein the monitoring device is a temperature sensor;

10. The test method based on the server is characterized by being applied to a test system based on the server, wherein the test system comprises a shell and a temperature control system, and the temperature control system comprises a memory temperature control system; the shell is used for accommodating a device to be tested of the server and isolating the memory of the device to be tested and other devices to be tested, and one end of the shell is provided with an air outlet; the memory temperature control system is positioned at the opposite end of the shell accommodating the memory, provided with an air outlet, and comprises an air outlet device and a heater; the number of the shells is the same as the number of the memories, and one shell comprises one memory; the number of the memory temperature control systems is the same as the number of the memories, and the memory temperature control systems are both positioned at opposite ends of a shell accommodating the memories, wherein the air outlet is arranged, and the testing method comprises the following steps:

receiving the actual temperature and the target temperature of the memory;

11. The server-based testing method of claim 10, wherein said determining a corresponding target wind pattern from said actual temperature and said target temperature comprises:

12. The server-based testing method according to claim 10 or 11, wherein performing performance testing on the memory at the current temperature after stabilization comprises:

13. The server-based testing method according to claim 10 or 11, wherein performing performance testing on the memory at the current temperature after stabilization comprises:

14. The test device based on the server is characterized by being applied to a test system based on the server, wherein the test system comprises a shell and a temperature control system, and the temperature control system comprises a memory temperature control system; the shell is used for accommodating a device to be tested of the server and isolating the memory of the device to be tested and other devices to be tested, and one end of the shell is provided with an air outlet; the memory temperature control system is positioned at the opposite end of the shell accommodating the memory, provided with an air outlet, and comprises an air outlet device and a heater; the number of the shells is the same as the number of the memories, and one shell comprises one memory; the number of the memory temperature control systems is the same as the number of the memories, and the memory temperature control systems are both positioned at opposite ends of a shell accommodating the memories, wherein the opposite ends are provided with air outlets, and the testing device comprises:

15. A server-based testing apparatus, comprising:

A memory for storing a computer program;

A processor for implementing the steps of the server-based testing method according to any of claims 10 to 13 when executing said computer program.

16. A computer readable storage medium, characterized in that it has stored thereon a computer program which, when executed by a processor, implements the steps of the server-based testing method according to any of claims 10 to 13.