CN114168397A - Method, device and equipment for testing performance of solid state disk and storage medium - Google Patents
Method, device and equipment for testing performance of solid state disk and storage medium Download PDFInfo
- Publication number
- CN114168397A CN114168397A CN202111415438.2A CN202111415438A CN114168397A CN 114168397 A CN114168397 A CN 114168397A CN 202111415438 A CN202111415438 A CN 202111415438A CN 114168397 A CN114168397 A CN 114168397A
- Authority
- CN
- China
- Prior art keywords
- solid state
- state disk
- tested
- temperature
- test
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2273—Test methods
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/26—Functional testing
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Computer Hardware Design (AREA)
- Quality & Reliability (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
The application discloses a performance test method of a solid state disk, after the solid state disk to be tested is connected to a test host, the solid state disk to be tested is respectively controlled to be in a fixed temperature state and a temperature change state, so that the performance test of the solid state disk to be tested is carried out in different target temperature states, and a performance test result of the solid state disk to be tested in the target temperature state is obtained. The application also discloses a performance testing device, equipment and a storage medium of the solid state disk, and the device, the equipment and the storage medium have the beneficial effects.
Description
Technical Field
The present application relates to the field of solid state disk technologies, and in particular, to a method, an apparatus, a device, and a storage medium for testing performance of a solid state disk.
Background
A Solid State Disk (SSD), also called Solid State drive, is a hard Disk made of an array of Solid State electronic memory chips. When the solid state disk is subjected to read-write operation, the solid state disk calculates a comprehensive temperature representing the temperature of the disk, and the temperature of the solid state disk rises along with the increase of the read-write pressure. And transmitting the comprehensive temperature calculated by the solid state disk to the server side. When the temperature of the solid state disk rises to a certain value, the server increases the rotating speed of the fan through calculation to cool the solid state disk; when the temperature of the solid state disk is reduced, the rotating speed of the fan can be reduced by the server, the power consumption of the server is reduced, the solid state disk is maintained at the optimal temperature in the reading and writing process, and the reading and writing performance is exerted to the maximum, stable and reliable. In the development and test of the solid state disk, the actual operation scene of the solid state disk is simulated according to the control mode of the operation process, and then the performance parameters of the solid state disk are tested.
However, by simulating the control scenario of the server on the hard disk, the obtained performance parameters of the solid state disk are only performance test results when the solid state disk is at the optimal temperature, and the conditions that the solid state disk is possibly in other temperature states in the actual operation cannot be covered, so that the test results are incomplete, and the hidden problem of the solid state disk cannot be found.
Disclosure of Invention
The application aims to provide a method, a device, equipment and a storage medium for testing the performance of a solid state disk, which are used for obtaining a more comprehensive performance test result in the development test of the solid state disk.
In order to solve the above technical problem, the present application provides a method for testing performance of a solid state disk, including:
after a solid state disk to be tested is connected to a test host, controlling the solid state disk to be tested to be in a target temperature state;
performing performance test on the solid state disk to be tested;
acquiring a performance test result of the solid state disk to be tested in the target temperature state;
wherein the target temperature state includes a fixed temperature state and a temperature change state.
Optionally, the fixed temperature state specifically includes a plurality of temperature ranges.
Optionally, the temperature change state includes at least one of a temperature oscillation change state, a constant rate temperature change state and a temperature shock state.
Optionally, the controlling the to-be-tested solid state disk to be in the target temperature state specifically includes:
and after the solid state disk to be tested is read, written and pressurized, the server fan is controlled to control the temperature of the solid state disk to be tested so as to enable the solid state disk to be tested to be in the target temperature state.
Optionally, after the to-be-tested solid state disk is subjected to read-write pressurization, the server fan is controlled to perform temperature control on the to-be-tested solid state disk, so that the solid state disk is in the target temperature state, and the method specifically includes:
and repeatedly executing the steps of reading, writing and pressurizing the solid state disk to be tested until the temperature of the solid state disk to be tested rises, adjusting the rotating speed of the server fan to be the maximum, and adjusting the rotating speed of the server fan to be the minimum after the temperature of the solid state disk to be tested falls so as to enable the solid state disk to be tested to be in a temperature oscillation change state.
Optionally, the controlling the to-be-tested solid state disk to be in the target temperature state specifically includes:
and adjusting the temperature of the solid state disk to be detected by using a temperature adjusting device to enable the solid state disk to be detected to be in the target temperature state.
Optionally, the performance test specifically includes: at least one of high-low lattice test, trimming test, normal power test, abnormal power test, protocol test, sequential read-write test, random read-write test, mixed read-write test and stability test.
In order to solve the above technical problem, the present application further provides a performance testing apparatus for a solid state disk, including:
the control unit is used for controlling the solid state disk to be tested to be in a target temperature state after the solid state disk to be tested is connected to the test host;
the test unit is used for carrying out performance test on the solid state disk to be tested;
the acquisition unit is used for acquiring a performance test result of the solid state disk to be tested in the target temperature state;
wherein the target temperature state includes a fixed temperature state and a temperature change state.
In order to solve the above technical problem, the present application further provides a performance testing apparatus for a solid state disk, including:
the memory is used for storing instructions, and the instructions comprise the steps of the performance testing method of any one of the solid state disks;
a processor to execute the instructions.
In order to solve the above technical problem, the present application further provides a storage medium having a computer program stored thereon, where the computer program is executed by a processor to implement the steps of the method for testing the performance of the solid state disk according to any one of the above items.
The solid state disk performance testing method provided by the application, after the solid state disk to be tested is connected to the testing host, the solid state disk to be tested is controlled to be in the fixed temperature state and the temperature change state respectively, so that the solid state disk to be tested is subjected to performance testing in different target temperature states, and a performance testing result of the solid state disk to be tested in the target temperature state is obtained.
The application also provides a performance testing device, equipment and storage medium of the solid state disk, which have the beneficial effects and are not repeated herein.
Drawings
For a clearer explanation of the embodiments or technical solutions of the prior art of the present application, the drawings needed for the description of the embodiments or prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present application, and for those skilled in the art, other drawings can be obtained according to these drawings without creative efforts.
Fig. 1 is a flowchart of a method for testing performance of a solid state disk according to an embodiment of the present application;
fig. 2 is a schematic diagram illustrating a temperature control effect of a solid state disk to be tested according to an embodiment of the present application;
fig. 3 is a schematic diagram illustrating a temperature control effect of another solid state disk to be tested according to an embodiment of the present application;
fig. 4 is a schematic structural diagram of a performance testing apparatus for a solid state disk according to an embodiment of the present application;
fig. 5 is a schematic structural diagram of a performance testing apparatus for a solid state disk according to an embodiment of the present application.
Detailed Description
The core of the application is to provide a method, a device, equipment and a storage medium for testing the performance of a solid state disk, which are used for obtaining a more comprehensive performance test result in the development test of the solid state disk.
The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are only a part of the embodiments of the present application, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
Example one
Fig. 1 is a flowchart of a method for testing performance of a solid state disk according to an embodiment of the present application.
As shown in fig. 1, a method for testing performance of a solid state disk provided in the embodiment of the present application includes:
s101: and after the solid state disk to be tested is connected to the test host, controlling the solid state disk to be tested to be in a target temperature state.
S102: and carrying out performance test on the solid state disk to be tested.
S103: and acquiring a performance test result of the solid state disk to be tested in a target temperature state.
Wherein the target temperature state comprises a fixed temperature state and a temperature change state.
In specific implementation, the performance testing method for the solid state disk provided in the embodiment of the present application may be executed based on one server, that is, a testing host, or may be executed based on another server connected to the testing host.
Generally, the temperature control strategy of a solid state disk is that, in the process of reading and writing, if the temperature of the solid state disk is always increased, the bandwidth of the solid state disk is reduced, and the damage of the solid state disk caused by overhigh temperature is avoided by reducing the performance of the solid state disk; and when the temperature of the solid state disk is reduced, the bandwidth of the solid state disk is increased, and the performance of the solid state disk is improved. When the temperature is too high, the bandwidth of the solid state disk is reduced to 0, and all data Input and Output (IO) is stopped. For step S101, the method for controlling the solid state disk to be tested to be in the target temperature state may specifically be that after the solid state disk to be tested is read, written and pressurized, the server fan is controlled to perform temperature control on the solid state disk to be tested, so that the solid state disk to be tested is in the target temperature state. When the test host executes the test, the solid state disk can be read, written and pressurized simultaneously to enable the inside of the solid state disk to be subjected to temperature change, and the server fan is controlled to cool the outside of the solid state disk so as to enable the solid state disk to be tested to reach a target temperature state.
Specifically, the test host can adopt an FIO tool to read, write and pressurize the solid state disk to be tested, and control the rotating speed of the server fan through an ipmitool tool. The rotating speed of the server fan is adjusted through an ipmitool tool, and the method is specifically realized as follows:
turning on the ipmitool regulation server fan function:
ipmitool-I lan plus-U ipmi user name-P ipmi password-H server address raw 0x300x 300x 010 x00 (the command is a server private command, different from different manufacturer commands).
Server fan was regulated by ipmitool:
the method comprises the steps of ipmitool-I lan plus-U ipmi user name-P ipmi password-H server address raw 0x300x 200 xff 0x20 (the command is a server private command, different manufacturer commands are different, the last 16-system number represents the fan rotating speed, and the fan rotating speed is higher when the value is larger).
The commands may be written into an automation control script to automatically invoke execution of control of the server fan.
Alternatively, in the step S101, the mode of controlling the to-be-tested solid state disk to be in the target temperature state may also be that the temperature of the to-be-tested solid state disk is adjusted by using a temperature adjusting device, so that the to-be-tested solid state disk is in the target temperature state. The temperature adjusting device can adopt a heat flow hood, a rapid temperature change experiment box and the like, the solid state disk to be detected is placed in the temperature adjusting device, and the self temperature of the solid state disk to be detected is changed by changing the environmental temperature of the solid state disk to be detected, so that the solid state disk to be detected reaches a target temperature state.
The test host can read the comprehensive temperature of the solid state disk to be tested through the NVMe smart-log, and can also obtain the comprehensive temperature of the solid state disk to be tested through the temperature sensor arranged on the solid state disk to be tested.
For step S102, when the solid state disk to be tested is in the target temperature state, performing a performance test on the solid state disk to be tested may specifically include: at least one of a high-low grid test, a trim (trim) test, a normal power test, an abnormal power test, a protocol test, a sequential read-write test, a random read-write test, a hybrid read-write test, and a stability test. One or more tests can be selected according to development requirements, the test sequence is arranged, and the tests are executed in the target temperature state.
For step S103, the test parameters may be read from the solid state disk to be tested, and the performance test result may be obtained through analysis.
It should be noted that the temperature scenes that need to be covered in the embodiment of the present application include a fixed temperature state and a temperature change state, that is, at least two actual temperature scenes are included, and then steps S101 to S103 need to be performed at least twice, and one time corresponds to one target temperature state.
According to the performance test method of the solid state disk, after the solid state disk to be tested is connected to the test host, the solid state disk to be tested is controlled to be in the fixed temperature state and the temperature change state respectively, so that performance test is conducted on the solid state disk to be tested in different target temperature states, and a performance test result of the solid state disk to be tested in the target temperature state is obtained.
Example two
Fig. 2 is a schematic diagram of a temperature control effect of a solid state disk to be tested according to an embodiment of the present application.
On the basis of the above embodiments, it is considered that the solid state disk may not always maintain the optimal temperature in actual operation, and the temperature may deviate from the optimal temperature along with the conditions of increased load, poor adjustment of the server fan, virus intrusion and the like. Therefore, on the basis of the above embodiments, in the performance test method of the solid state disk provided in the embodiment of the present application, the solid state disk to be tested is controlled to be in the fixed temperature state of the target temperature state, specifically including a plurality of temperature ranges.
In specific implementation, a temperature range in which the solid state disk to be tested can operate can be determined according to a temperature control strategy of the solid state disk to be tested, and then a plurality of temperature ranges are intercepted from the temperature range, for example, the temperature ranges can be divided into a temperature range 1 (normal temperature to 60 ℃), a temperature range 2(60 ℃) to 70 ℃), a temperature range 3(70 ℃) to 80 ℃) and a temperature range 4 (above 80 ℃). In addition, the temperature range can be divided more finely by a specific temperature control strategy of the solid state disk to be tested.
When the solid state disk to be tested is controlled to be in the target temperature state in step S101, if the solid state disk to be tested is subjected to read-write pressurization, and then the server fan is controlled to perform temperature control on the solid state disk to be tested, so that the solid state disk to be tested is in the target temperature state, in the specific control, the read-write pressure of the solid state disk to be tested can be increased to raise the temperature of the solid state disk to be tested to a certain temperature within the current temperature range to be tested (for example, temperature range 1) or to be slightly higher than the current temperature range to be tested. The ipmitool command is used, the rotating speed of the server fan is adjusted through a PID control algorithm, the temperature of the solid state disk to be tested is controlled, the temperature of the solid state disk to be tested is in a current temperature range (such as a temperature range 1) to be tested, the ipmitool command needs to be dynamically issued to adjust the rotating speed of the server fan, the temperature of the solid state disk to be tested is dynamically and automatically controlled, and the temperature control effect shown in the figure 2 is achieved.
As shown in fig. 2, when the temperature of the solid state disk to be tested is stable within the current temperature range to be tested (e.g., temperature range 1), step S102 may be performed to perform a performance test on the solid state disk to be tested, and after a performance test result in the temperature range is obtained, an automatic test on the performance and stability of the solid state disk to be tested in other temperature ranges (temperature range 2, temperature range 3, and temperature range 4) is performed in the same manner based on the above method.
In practical application, specific parameters of the fixed temperature state to be simulated, including temperature values corresponding to various temperature ranges, allowable error values and the like, can be selected according to the performance target and the actual needs of the solid state disk to be tested.
EXAMPLE III
Fig. 3 is a schematic diagram of a temperature control effect of another solid state disk to be tested according to an embodiment of the present application.
On the basis of the above embodiments, in consideration of the fact that the solid state disk is fixed in a certain temperature range in actual operation, a sudden temperature change (a sudden temperature increase or a sudden temperature decrease) may occur, and at this time, some performance problems of the solid state disk may also be exposed. Therefore, on the basis of the foregoing embodiment, in the performance testing method for a solid state disk provided in the embodiment of the present application, the temperature change state of the solid state disk to be tested in the target temperature state is controlled, which may specifically include at least one of a temperature oscillation change state, a constant-rate temperature change state, and a temperature shock change state.
In a specific implementation, if the performance of the solid state disk to be tested in the temperature oscillation change state is tested, after the solid state disk to be tested is read, written and pressurized, the server fan is controlled to perform temperature control on the solid state disk to be tested, so that the solid state disk is in the target temperature state, which specifically includes:
and repeatedly executing the steps of reading, writing and pressurizing the solid state disk to be tested until the temperature of the solid state disk to be tested rises, adjusting the rotating speed of the server fan to be the maximum, and adjusting the rotating speed of the server fan to be the minimum after the temperature of the solid state disk to be tested decreases, so that the solid state disk to be tested is in a temperature oscillation change state.
Specifically, after the temperature of the solid state disk to be tested is increased by increasing the reading and writing pressure of the solid state disk to be tested, an ipmitool command is used for controlling a server fan, and after the temperature of the solid state disk to be tested is increased, the rotating speed of the server fan is adjusted to be the maximum; after the temperature of the solid state disk to be tested is reduced, the rotating speed of the server fan is adjusted to the lowest rotating speed, so that the temperature oscillation change effect of the solid state disk to be tested as shown in fig. 3 is achieved, the automatic adjustment of the sudden temperature increase and drop of the solid state disk to be tested is realized, and at the moment, the performance test can be performed on the solid state disk to be tested in a selected time period.
If the performance of the solid state disk to be tested in the constant-rate temperature change state or the temperature shock state is tested, a time period can be intercepted from the temperature oscillation change state for testing, and the temperature of the solid state disk to be tested can be changed from the outside in a temperature adjusting device (matched by a server fan), so that the temperature of the solid state disk to be tested is in the constant-rate temperature change state or the temperature shock state.
In practical application, specific parameters of the temperature change state to be simulated, including the temperature range and the temperature change rate of the temperature change state, can be selected according to the performance target and the actual requirement of the solid state disk to be tested.
On the basis of the above detailed description of the embodiments corresponding to the performance testing method of the solid state disk, the present application also discloses a performance testing apparatus, a device and a storage medium of the solid state disk corresponding to the above method.
Example four
Fig. 4 is a schematic structural diagram of a performance testing apparatus for a solid state disk according to an embodiment of the present application.
As shown in fig. 4, the performance testing apparatus for a solid state disk provided in the embodiment of the present application includes:
the control unit 401 is configured to control the solid state disk to be tested to be in a target temperature state after the solid state disk to be tested is connected to the test host;
the testing unit 402 is used for performing performance testing on the solid state disk to be tested;
an obtaining unit 403, configured to obtain a performance test result of the solid state disk to be tested in a target temperature state;
wherein the target temperature state comprises a fixed temperature state and a temperature change state.
Specifically, the fixed temperature state may include a plurality of temperature ranges.
Specifically, the temperature change state may include at least one of a temperature oscillation change state, a constant rate temperature change state, and a temperature shock state.
Further, the control unit 401 controls the solid state disk to be tested to be in a target temperature state, specifically:
and after the solid state disk to be tested is read, written and pressurized, the server fan is controlled to control the temperature of the solid state disk to be tested so as to enable the solid state disk to be tested to be in a target temperature state.
Further, after the control unit 401 reads and writes pressurization to the solid state disk to be tested, the control server fan performs temperature control to the solid state disk to be tested, so that the solid state disk is in a target temperature state, which specifically includes:
and repeatedly executing the steps of reading, writing and pressurizing the solid state disk to be tested until the temperature of the solid state disk to be tested rises, adjusting the rotating speed of the server fan to be the maximum, and adjusting the rotating speed of the server fan to be the minimum after the temperature of the solid state disk to be tested decreases, so that the solid state disk to be tested is in a temperature oscillation change state.
Further, the control unit 401 controls the solid state disk to be tested to be in a target temperature state, specifically:
and adjusting the temperature of the solid state disk to be measured by using the temperature adjusting device to enable the solid state disk to be measured to be in a target temperature state.
Specifically, the performance test may specifically include: at least one of high-low lattice test, trimming test, normal power test, abnormal power test, protocol test, sequential read-write test, random read-write test, mixed read-write test and stability test.
Since the embodiments of the apparatus portion and the method portion correspond to each other, please refer to the description of the embodiments of the method portion for the embodiments of the apparatus portion, which is not repeated here.
According to the performance testing device of the solid state disk, the control unit controls the solid state disk to be tested to be in the fixed temperature state and the temperature change state respectively after the solid state disk to be tested is connected to the testing host, so that the testing unit can perform performance testing on the solid state disk to be tested in different target temperature states, the obtaining unit obtains the performance testing result of the solid state disk to be tested in the target temperature state, compared with the prior art that the performance testing result is obtained only when the solid state disk is in the optimal temperature, the performance testing method of the solid state disk provided by the embodiment of the application covers the temperature state of the solid state disk more comprehensively, and therefore the more reliable performance testing result of the solid state disk is obtained, developers are helped to find the hidden problem of the solid state disk and aim solution is achieved.
EXAMPLE five
Fig. 5 is a schematic structural diagram of a performance testing apparatus for a solid state disk according to an embodiment of the present application.
As shown in fig. 5, the performance testing apparatus for a solid state disk provided in the embodiment of the present application includes:
a memory 510, configured to store instructions, where the instructions include the steps of the method for testing performance of a solid state disk according to any one of the embodiments described above;
a processor 520 for executing the instructions.
Among other things, processor 520 may include one or more processing cores, such as a 3-core processor, an 8-core processor, and so on. The processor 520 may be implemented in at least one hardware form of a Digital Signal Processing (DSP), a Field-Programmable Gate Array (FPGA), a Programmable Logic Array (PLA), or a Programmable Logic Array (PLA). Processor 520 may also include a main processor and a coprocessor, where the main processor is a processor for Processing data in an awake state, and is also called a central Processing unit (cpu); a coprocessor is a low power processor for processing data in a standby state. In some embodiments, the processor 520 may be integrated with an image processor GPU (graphics Processing unit) that is responsible for rendering and drawing the content that the display screen needs to display. In some embodiments, processor 520 may also include an Artificial Intelligence (AI) (artificial intelligence) processor for processing computational operations related to machine learning.
Memory 510 may include one or more storage media, which may be non-transitory. Memory 510 may also include high speed random access memory, as well as non-volatile memory, such as one or more magnetic disk storage devices, flash memory storage devices. In this embodiment, the memory 510 is at least used for storing the following computer program 511, wherein after the computer program 511 is loaded and executed by the processor 520, the relevant steps in the performance testing method for a solid state disk disclosed in any of the foregoing embodiments can be implemented. In addition, the resources stored in the memory 510 may also include an operating system 512, data 513, and the like, and the storage manner may be a transient storage or a permanent storage. The operating system 512 may be Windows, among others. Data 513 may include, but is not limited to, data involved with the above-described methods.
In some embodiments, the performance testing apparatus for a solid state disk may further include a display screen 530, a power supply 540, a communication interface 550, an input/output interface 560, a sensor 570, and a communication bus 580.
Those skilled in the art will appreciate that the configuration shown in fig. 5 does not constitute a limitation of the performance testing apparatus of the solid state disk, and may include more or fewer components than those shown.
The performance test equipment for the solid state disk comprises a memory and a processor, wherein when the processor executes a program stored in the memory, after the solid state disk to be tested is connected to a test host, the solid state disk to be tested is respectively controlled to be in a fixed temperature state and a temperature change state, so that the performance of the solid state disk to be tested is tested in different target temperature states, and a performance test result of the solid state disk to be tested in the target temperature state is obtained.
EXAMPLE six
It should be noted that the above-described embodiments of the apparatus and device are merely illustrative, for example, the division of modules is only one division of logical functions, and there may be other divisions when actually implementing, for example, a plurality of modules or components may be combined or integrated into another system, or some features may be omitted or not executed. In addition, the shown or discussed mutual coupling or direct coupling or communication connection may be an indirect coupling or communication connection through some interfaces, devices or modules, and may be in an electrical, mechanical or other form. Modules described as separate parts may or may not be physically separate, and parts displayed as modules may or may not be physical modules, may be located in one place, or may be distributed on a plurality of network modules. Some or all of the modules may be selected according to actual needs to achieve the purpose of the solution of the present embodiment.
In addition, functional modules in the embodiments of the present application may be integrated into one processing module, or each of the modules may exist alone physically, or two or more modules are integrated into one module. The integrated module can be realized in a hardware mode, and can also be realized in a software functional module mode.
The integrated module, if implemented in the form of a software functional module and sold or used as a separate product, may be stored in a storage medium. Based on such understanding, the technical solutions of the present application may be embodied in the form of a software product, which is stored in a storage medium and executes all or part of the steps of the methods described in the embodiments of the present application, or all or part of the technical solutions.
To this end, an embodiment of the present application further provides a storage medium, where a computer program is stored on the storage medium, and when the computer program is executed by a processor, the steps of the performance testing method of the solid state disk are implemented.
The storage medium may include: various media capable of storing program codes, such as a usb disk, a removable hard disk, a Read-Only Memory ROM (Read-Only Memory), a random Access Memory ram (random Access Memory), a magnetic disk, or an optical disk.
The computer program included in the storage medium provided in this embodiment can be executed by the processor, and after the solid state disk to be tested is connected to the test host, the solid state disk to be tested is respectively controlled to be in the fixed temperature state and the temperature change state, so as to perform performance test on the solid state disk to be tested in different target temperature states, and obtain a performance test result of the solid state disk to be tested in the target temperature state.
The method, the device, the equipment and the storage medium for testing the performance of the solid state disk provided by the application are described in detail above. The embodiments are described in a progressive manner in the specification, each embodiment focuses on differences from other embodiments, and the same and similar parts among the embodiments are referred to each other. The device, the equipment and the storage medium disclosed by the embodiment correspond to the method disclosed by the embodiment, so that the description is simple, and the relevant points can be referred to the method part for description. It should be noted that, for those skilled in the art, it is possible to make several improvements and modifications to the present application without departing from the principle of the present application, and such improvements and modifications also fall within the scope of the claims of the present application.
It is further noted that, in the present specification, relational terms such as first and second, and the like are used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other identical elements in a process, method, article, or apparatus that comprises the element.
Claims (10)
1. A performance test method of a solid state disk is characterized by comprising the following steps:
after a solid state disk to be tested is connected to a test host, controlling the solid state disk to be tested to be in a target temperature state;
performing performance test on the solid state disk to be tested;
acquiring a performance test result of the solid state disk to be tested in the target temperature state;
wherein the target temperature state includes a fixed temperature state and a temperature change state.
2. The performance testing method of claim 1, wherein the fixed temperature state specifically includes a plurality of temperature ranges.
3. The performance testing method of claim 1, wherein the temperature-varying state comprises at least one of a temperature oscillation variation state, a constant rate temperature-varying state, and a temperature shock state.
4. The performance testing method according to claim 1, wherein the controlling the solid state disk to be tested to be in a target temperature state specifically comprises:
and after the solid state disk to be tested is read, written and pressurized, the server fan is controlled to control the temperature of the solid state disk to be tested so as to enable the solid state disk to be tested to be in the target temperature state.
5. The performance testing method according to claim 4, wherein after the reading and writing pressurization are performed on the solid state disk to be tested, the server fan is controlled to perform temperature control on the solid state disk to be tested, so that the solid state disk is in the target temperature state, and specifically the method comprises:
and repeatedly executing the steps of reading, writing and pressurizing the solid state disk to be tested until the temperature of the solid state disk to be tested rises, adjusting the rotating speed of the server fan to be the maximum, and adjusting the rotating speed of the server fan to be the minimum after the temperature of the solid state disk to be tested falls so as to enable the solid state disk to be tested to be in a temperature oscillation change state.
6. The performance testing method according to claim 1, wherein the controlling the solid state disk to be tested to be in a target temperature state specifically comprises:
and adjusting the temperature of the solid state disk to be detected by using a temperature adjusting device to enable the solid state disk to be detected to be in the target temperature state.
7. The performance testing method according to claim 1, wherein the performance testing specifically comprises: at least one of high-low lattice test, trimming test, normal power test, abnormal power test, protocol test, sequential read-write test, random read-write test, mixed read-write test and stability test.
8. The utility model provides a performance test device of solid state hard drives which characterized in that includes:
the control unit is used for controlling the solid state disk to be tested to be in a target temperature state after the solid state disk to be tested is connected to the test host;
the test unit is used for carrying out performance test on the solid state disk to be tested;
the acquisition unit is used for acquiring a performance test result of the solid state disk to be tested in the target temperature state;
wherein the target temperature state includes a fixed temperature state and a temperature change state.
9. The utility model provides a performance test equipment of solid state hard drives which characterized in that includes:
a memory for storing instructions, the instructions comprising the steps of the method for testing the performance of the solid state disk according to any one of claims 1 to 7;
a processor to execute the instructions.
10. A storage medium having a computer program stored thereon, wherein the computer program, when executed by a processor, implements the steps of the method for testing the performance of a solid state disk according to any one of claims 1 to 7.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202111415438.2A CN114168397A (en) | 2021-11-25 | 2021-11-25 | Method, device and equipment for testing performance of solid state disk and storage medium |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202111415438.2A CN114168397A (en) | 2021-11-25 | 2021-11-25 | Method, device and equipment for testing performance of solid state disk and storage medium |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN114168397A true CN114168397A (en) | 2022-03-11 |
Family
ID=80480640
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202111415438.2A Pending CN114168397A (en) | 2021-11-25 | 2021-11-25 | Method, device and equipment for testing performance of solid state disk and storage medium |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN114168397A (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116524993A (en) * | 2023-07-05 | 2023-08-01 | 四川和恩泰半导体有限公司 | Solid state disk detection equipment and detection method |
| CN117234826A (en) * | 2023-11-10 | 2023-12-15 | 深圳市领德创科技有限公司 | Solid state disk reliability verification interference-free test platform and working method |
| CN117806891A (en) * | 2024-02-28 | 2024-04-02 | 苏州元脑智能科技有限公司 | Test system, method, device, equipment and medium based on server |
| CN117806891B (en) * | 2024-02-28 | 2024-05-17 | 苏州元脑智能科技有限公司 | Test system, method, device, equipment and medium based on server |
-
2021
- 2021-11-25 CN CN202111415438.2A patent/CN114168397A/en active Pending
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116524993A (en) * | 2023-07-05 | 2023-08-01 | 四川和恩泰半导体有限公司 | Solid state disk detection equipment and detection method |
| CN116524993B (en) * | 2023-07-05 | 2023-09-12 | 四川和恩泰半导体有限公司 | Solid state disk detection equipment and detection method |
| CN117234826A (en) * | 2023-11-10 | 2023-12-15 | 深圳市领德创科技有限公司 | Solid state disk reliability verification interference-free test platform and working method |
| CN117234826B (en) * | 2023-11-10 | 2024-04-05 | 深圳市领德创科技有限公司 | Solid state disk reliability verification interference-free test platform and working method |
| CN117806891A (en) * | 2024-02-28 | 2024-04-02 | 苏州元脑智能科技有限公司 | Test system, method, device, equipment and medium based on server |
| CN117806891B (en) * | 2024-02-28 | 2024-05-17 | 苏州元脑智能科技有限公司 | Test system, method, device, equipment and medium based on server |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN114168397A (en) | Method, device and equipment for testing performance of solid state disk and storage medium | |
| US8386205B2 (en) | Rotational vibration test system and method | |
| CN103377115A (en) | System event log management system and system event log management method | |
| CN111211937B (en) | Method, device and system for testing stability of server link signals | |
| CN110515917B (en) | Method, device and medium for controlling reconstruction speed | |
| CN110941395A (en) | Dynamic random access memory, memory management method, system and storage medium | |
| US20220358269A1 (en) | Simulation execution system, simulation execution method, and computer readable medium | |
| CN111814354B (en) | Simulation test method, system, medium and electronic device for instrument performance | |
| CN112996020A (en) | Bluetooth-based automatic testing method and device and Bluetooth testing terminal | |
| TW202004393A (en) | Smart overclocking method capable of automatically evaluating a thermal dissipation environment of a multi-core CPU and offering the optimized proposals for overclocking | |
| CN112417802B (en) | Method, system, equipment and storage medium for simulating storage chip | |
| CN112732556A (en) | Automatic testing method, device, equipment and storage medium for distributed system | |
| CN113272785B (en) | Method for mounting file system, terminal equipment and storage medium | |
| CN111124773A (en) | Batch volume IO read-write test method, system and equipment based on vdbech | |
| CN111736680A (en) | Control method, control device, control equipment and storage medium for power supply slow start | |
| WO2019092849A1 (en) | Simulation device, simulation method, and simulation program | |
| CN115145634A (en) | System management software self-adaption method, device and medium | |
| US8499199B2 (en) | GPU computational assist for drive media waveform generation of media emulators | |
| CN114185720A (en) | Method, device, equipment and storage medium for server dynamic hot backup | |
| WO2021038636A1 (en) | Verification device, verification method, and verification program | |
| US20100205598A1 (en) | Method for installing operating system in computer | |
| CN111177027A (en) | Dynamic random access memory, memory management method, system and storage medium | |
| CN113625956B (en) | Cache setting method and device of RAID card, electronic equipment and storage medium | |
| TWI704494B (en) | Processor performance optimization method and motherboard using the same | |
| CN114121138B (en) | Memory voltage testing method, device, computing equipment and system |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination |