CN117760340A - Automatic optical measurement equipment and method thereof - Google Patents
Automatic optical measurement equipment and method thereof Download PDFInfo
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Abstract
The invention relates to an automatic optical measurement device and a method thereof, wherein the automatic optical measurement device comprises a control processing center and an illumination test platform, Y-axis guide rails are oppositely arranged on the illumination test platform, an X-axis guide rail is arranged between the two Y-axis guide rails, a Y-axis servo motor and an X-axis servo motor are arranged on the illumination test platform, the control processing center is used for driving the X-axis guide rail to move along the length direction of the Y-axis guide rail through the Y-axis servo motor, an optical measurement detector is movably arranged on the X-axis guide rail, the control processing center is used for driving the optical measurement detector to move along the length direction of the X-axis guide rail through the X-axis servo motor, and the control processing center is used for receiving and processing optical parameter data fed back by the optical measurement detector.
Description
Technical Field
The invention relates to the technical field of lamp optical measurement, in particular to automatic optical measurement equipment and a method thereof.
Background
Because of the need of meeting various stage performances, people now put forward higher requirements on stage lighting effects, and in order to meet the actual production practice and optical experiment demands of stage lamps, optical parameters of all characteristic irradiation points of various lamps need to be measured; the traditional measurement mode is that a tester needs to manually move to different irradiation points by using a photometer C-7000 to measure optical parameters and record the measured optical items one by one, so that the time consumption for measuring and recording data is large, the manual point selection error is uncontrollable, and the high-efficiency operation of a factory is seriously affected, and therefore, the development of equipment for measuring the optical data with high efficiency is urgently needed.
Disclosure of Invention
The invention is created to solve one of the technical problems, and provides an automatic optical measurement device, a method for measuring a beam angle and a floodlight angle by using the device, a method for measuring luminous flux and uniformity of light by using the device and a method for measuring brightness of an array-type lamp by using the device; the measuring equipment and the measuring method can be used for quickly and efficiently measuring the data of each optical parameter, and bring great convenience for the production experiment and quality control measurement of the lamp.
in order to solve the technical problems, the invention provides the following technical scheme:
The automatic optical measurement device comprises a control processing center and an illumination test platform which is vertically arranged, Y-axis guide rails are oppositely arranged on the illumination test platform, X-axis guide rails which are mutually perpendicular to the Y-axis guide rails are arranged between the Y-axis guide rails, a Y-axis servo motor and an X-axis servo motor are arranged on the illumination test platform, the control processing center is used for driving the X-axis guide rails to move along the length direction of the Y-axis guide rails through the Y-axis servo motor, an optical measurement detector is movably arranged on the X-axis guide rails, the control processing center is used for driving the optical measurement detector to move along the length direction of the X-axis guide rails through the X-axis servo motor, and the control processing center is used for receiving and processing optical parameter data fed back by the optical measurement detector.
As a preferred embodiment, it is further defined that the optical measurement probe is a illuminometer C7000.
As a preferred embodiment, it is further defined that the optical parameter data measured by the illuminometer C7000 includes color temperature, illuminance, color coordinates, color deviation value, chromaticity space nonuniformity, television illumination uniformity index and brightness, and the apparatus can calculate the beam angle, floodlight angle, luminous flux and uniformity of light of the optical parameter according to the illuminance measuring different detection points.
A method for measuring beam angle and flood angle using said apparatus, comprising the steps of:
Step 1, adjusting the distance between a lamp to be tested and an illumination test platform, irradiating a light-emitting source O' of the lamp to be tested on the illumination test platform to form a light spot, and controlling an optical measurement detector to move to the midpoint position of the light spot by a control processing center to measure the radius R of the light spot;
Step 2, the control processing center sets the midpoint position of the light spot as a center point O of an XY axis coordinate system, and the optical measurement detector collects the central illuminance value of the midpoint position of the light spot and records the central illuminance value as a numerical value A, and the numerical value A is fed back to the control processing center;
Step 3, the control processing center sets a 50% central illuminance value as a numerical value B; the control processing center controls the optical measurement detector to move to a position with a distance R/2 along the X-axis direction or the Y-axis direction, and the illuminance data of the position is recorded as a numerical value C1If the value B is smaller than the value C1The control processing center controls the optical measurement detector to move from the current position along the direction away from the center point O by a distance R/22Is the position of (2)at this time, illuminance data at the position is recorded as a value C2The method comprises the steps of carrying out a first treatment on the surface of the If the value B is greater than the value C1The control processing center controls the optical measurement detector to move from the current position by a distance R/2 along the direction close to the center point O2at this time, the illuminance data of the position is recorded as a value C2The method comprises the steps of carrying out a first treatment on the surface of the Combining the value B with the value C2continuing to compare; repeating the above-mentioned actions while limiting the movement of the optical measuring probe not to exceed the distance L, when the optical measuring probe is moved by the distance R/2n< L, at this time value CnAbout equal to or equal to the value B, the value C is determinednCalculating a beam angle from the known distances OO ' and OC ' for the position of the measurement point C ' of 50% of the center illuminance;
or/and the control processing center sets the central illuminance value of 10% as a value D; the control processing center controls the optical measurement detector to move to a position with a distance R/2 along the X-axis direction or the Y-axis direction, and illuminance data of the position is recorded as a numerical value E1If the value D is smaller than the value E1The control processing center controls the optical measurement detector to move from the current position along the direction away from the center point O by a distance R/22Is the position of (2)At this time, the illuminance data at the position is recorded as a value E2The method comprises the steps of carrying out a first treatment on the surface of the If the value D is greater than the value E1The control processing center controls the optical measurement detector to move from the current position by a distance R/2 along the direction close to the center point O2at this time, the illuminance data of the position is recorded as a value E2the method comprises the steps of carrying out a first treatment on the surface of the Combining the value D with the value E2continuing to compare; repeating the above-mentioned actions while limiting the movement of the optical measuring probe not to exceed the distance L, when the optical measuring probe is moved by the distance R/2n< L, at this time value EnAbout equal to or equal to the value D, the value E is determinednthe position of the measurement point E ' for 10% of the center illuminance, the floodlight angle was calculated from the known distances OO ' and OE '.
As a preferred embodiment, it is further defined that, in step 1, the light spot is scaled into a light spot, and the control processing center controls the optical measurement probe to move to the light spot, and then amplifies the light spot to form the light spot, and measures the radius R of the light spot; or the light spot is directly irradiated on the illumination test platform, the edge of the light spot is taken as a boundary line, two longest straight lines which are positioned in the boundary line and do not coincide are drawn on the illumination test platform, the intersection point of the two straight lines is taken as the midpoint of the light spot, and the control processing center controls the optical measurement detector to move to the midpoint position of the light spot.
as a preferred embodiment, it is further defined that in step 3, the distance L is defined in a range of 1-2mm.
a method for measuring luminous flux and uniformity of light using the apparatus, comprising the steps of:
Step 1, adjusting the distance between a lamp to be tested and an illumination test platform, irradiating a luminous source O' of the lamp to be tested on the illumination test platform to form light spots, and measuring the radius R of the light spots; the control processing center controls the optical measurement detector to move to the midpoint position of the light spot, and sets the midpoint position of the light spot as a center point O of an XY axis coordinate system;
And 2, the control processing center controls the optical measurement detector to move to 9 coordinate points of an XY coordinate system and collects optical parameter data of each coordinate point, wherein the 9 coordinate points comprise (0, 0), (0.5R, 0), (0,0.5R), (-0.5R, 0), (0, -0.5R), (0, -0.9R), (0.9R, 0), (0,0.9R) and (-0.9R, 0), and the control processing center processes and calculates luminous flux and light uniformity according to the optical parameter illuminance data collected on the 9 coordinate points.
As a preferred embodiment, it is further defined that the luminous flux ψ is calculated according to the formulaWherein/>For the illuminance of the i-th measurement point, the serial numbers of the 9 coordinate points (0, 0), (0.5R, 0), (0,0.5R), (-0.5R, 0), (0, -0.5R), (0, -0.9R), (0.9R, 0), (0,0.9R), and (-0.9R, 0) arranged in order correspond to i=1, 2..9, respectively; uniformity of the light/>Calculation according to the formula/>。
As a preferred embodiment, it is further defined that, in step 1, the light spot is scaled into a light spot, and the control processing center controls the optical measurement probe to move to the light spot, and then amplifies the light spot to form the light spot, and measures the radius R of the light spot; or the light spot is directly irradiated on the illumination test platform, the edge of the light spot is taken as a boundary line, two longest straight lines which are positioned in the boundary line and do not coincide are drawn on the illumination test platform, the intersection point of the two straight lines is taken as the midpoint of the light spot, and the control processing center controls the optical measurement detector to move to the midpoint position of the light spot.
A method for measuring the brightness of an array type lamp by using the device comprises the following steps:
Step 1, adjusting the distance between a lamp to be tested and an illumination test platform, and irradiating a luminous source of the lamp to be tested on the illumination test platform to form a plurality of light spots, wherein the light spots are sequentially arranged to form N rows and M columns of matrixes;
and 2, the control processing center sets corresponding points to be detected on each light spot and plans the movement track of the optical measurement detector to pass through each point to be detected in sequence, so that the optical measurement detector collects the brightness parameter data of each light spot.
After the technical scheme is adopted, the invention has at least the following beneficial effects: in the range of the illumination test platform, the control processing center can control the optical measurement detector to move to any position, so that the accuracy of the optical parameter test is ensured; the automatic measuring equipment can greatly improve the optical measurement efficiency of the lamp. Meanwhile, the invention also provides a method for measuring the beam angle and the floodlight angle, a method for measuring the luminous flux, the uniformity of light and the brightness by using the device; the measuring method has the advantages of higher efficiency, accurate point selection measurement, convenient and quick data processing, visual result reaction and automatic storage, and brings great convenience to the production experiment and quality control measurement of the lamp.
Drawings
FIG. 1 is a structural diagram of an illumination test platform of the present invention;
FIG. 2 is a schematic diagram of an optical measurement device of the present invention;
FIG. 3 is a schematic view of the beam angle and flood angle of the present invention;
FIG. 4 is a schematic diagram of the coordinate positions of 9 coordinate points in an XY axis coordinate system and the movement track of an optical measurement detector;
Fig. 5 is a schematic diagram of an N-row M-column matrix spot of the present invention.
Detailed Description
The application will be described in further detail with reference to the drawings and the specific examples.
As shown in the accompanying drawings 1 and 2, an automatic optical measurement device comprises a control processing center and an illumination test platform which is vertically arranged, Y-axis guide rails are oppositely arranged on the illumination test platform, X-axis guide rails which are mutually perpendicular to the Y-axis guide rails are arranged between the two Y-axis guide rails, a Y-axis servo motor and an X-axis servo motor are arranged on the illumination test platform, the control processing center is used for driving the X-axis guide rails to move along the length direction of the Y-axis guide rails through the Y-axis servo motor, an optical measurement detector is movably arranged on the X-axis guide rails, the optical measurement detector is an illuminometer C7000, the control processing center is used for driving the optical measurement detector to move along the length direction of the X-axis guide rails through the X-axis servo motor, and the control processing center is used for receiving and processing optical parameter data fed back by the optical measurement detector. Further, the control processing center is connected with the lamp to be tested through the DMX512 controller, so that the light emission of the lamp to be tested is controlled, and the control processing center can control the optical measurement detector to move to any position within the range of the illumination test platform, so that the accuracy of testing optical parameters is ensured; the automatic measuring equipment can greatly improve the optical measurement efficiency of the lamp.
Specifically, the optical parameter data measured by the illuminometer C7000 includes color temperature, illuminance, color coordinates, color deviation value, chromaticity space nonuniformity, television illumination uniformity index, brightness, and the like, and the device can calculate the beam angle, floodlight angle, luminous flux and uniformity of light of the optical parameter according to the illuminance of the measured different detection points. The invention also provides a measuring method of beam angle, floodlight angle, luminous flux, uniformity of light and brightness; the optical parameters described above are sufficient to meet the requirements of lamp testing.
As shown in fig. 1 to 3, a method for measuring a beam angle and a floodlight angle by using the device comprises the following steps:
Step 1, adjusting the distance between a lamp to be tested and an illumination test platform, wherein the adjustment of the distance comprises the adjustment of the height of the lamp to be tested and the adjustment of the vertical distance between the lamp to be tested and the illumination test platform, the lower distance OO 'is the vertical distance between the lamp to be tested and the illumination test platform, a light-emitting source O' of the lamp to be tested irradiates the illumination test platform and forms a light spot, and the control processing center controls the optical measurement detector to move to the midpoint position of the light spot and measures the radius R of the light spot;
Step 2, the control processing center sets the midpoint position of the light spot as a center point O of an XY axis coordinate system, and the optical measurement detector collects the central illuminance value of the midpoint position of the light spot and records the central illuminance value as a numerical value A, and the numerical value A is fed back to the control processing center;
Step 3, the control processing center sets a 50% central illuminance value as a numerical value B; the control processing center controls the optical measurement detector to move to a position with a distance R/2 along the X-axis direction or the Y-axis direction, and the illuminance data of the position is recorded as a numerical value C1if the value B is smaller than the value C, the characteristic that the illumination of the light spot gradually decreases along the distance from the center of the light spot is utilized1The control processing center controls the optical measurement detector to move from the current position along the direction away from the center point O by a distance R/22Is the position of (2)at this time, illuminance data at the position is recorded as a value C2The method comprises the steps of carrying out a first treatment on the surface of the If the value B is greater than the value C1The control processing center controls the optical measurement detector to move from the current position by a distance R/2 along the direction close to the center point O2at this time, the illuminance data of the position is recorded as a value C2The method comprises the steps of carrying out a first treatment on the surface of the Combining the value B with the value C2continuing to compare; repeating the above-mentioned actions while limiting the movement of the optical measuring probe not to exceed the distance L, when the optical measuring probe is moved by the distance R/2n< L, at this time value CnAbout equal to or equal to the value B, the value C is determinedncalculating a beam angle from the known distances OO ' and OC ' for the position of the measurement point C ' of 50% of the center illuminance; at this time, the beam angle is 2 times the angle OO 'C' angle value;
Similarly, the control processing center sets a center illuminance value of 10% as a numerical value D; the control processing center controls the optical measurement detector to move to a position with a distance R/2 along the X-axis direction or the Y-axis direction, and illuminance data of the position is recorded as a numerical value E1If the value D is smaller than the value E1The control processing center controls the optical measurement detector to move from the current position along the direction away from the center point O by a distance R/22Is the position of (2)At this time, the illuminance data at the position is recorded as a value E2The method comprises the steps of carrying out a first treatment on the surface of the If the value D is greater than the value E1The control processing center controls the optical measurement detector to move from the current position by a distance R/2 along the direction close to the center point O2at this time, the illuminance data of the position is recorded as a value E2the method comprises the steps of carrying out a first treatment on the surface of the Combining the value D with the value E2continuing to compare; repeating the above-mentioned actions while limiting the movement of the optical measuring probe not to exceed the distance L, when the optical measuring probe is moved by the distance R/2n< L, at this time value EnAbout equal to or equal to the value D, the value E is determinednCalculating a floodlight angle from the known distances OO ' and OE ' for the position of the measurement point E ' of 10% of the center illuminance; at this time, the floodlight angle is 2 times the angle OO 'E' angle value.
The method for measuring the beam angle and the floodlight angle can rapidly and accurately measure the angles of the beam angle and the floodlight angle.
In the step 1, the light spot is scaled into a light spot, the control processing center controls the optical measurement detector to move to the light spot, and then the light spot is amplified to form the light spot, and the radius R of the light spot is measured; or the light spot is directly irradiated on the illumination test platform, the edge of the light spot is taken as a boundary line, two longest straight lines which are positioned in the boundary line and do not coincide are drawn on the illumination test platform, the intersection point of the two straight lines is taken as a light spot midpoint, and the control processing center controls the optical measurement detector to move to the light spot midpoint position; the two modes can accurately determine the center position of the light spot, and can effectively reduce the measurement error of the optical parameters.
in step 3, the limiting range of the distance L is 1-2mm, and preferably, the moving distance L of the optical measurement detector is limited to be not more than 1mm, so that the angle values of the tested beam angle and the floodlight angle are ensured to be within the allowable error range.
as shown in fig. 1, 2 and 4, a method for measuring luminous flux and uniformity of light using the apparatus comprises the steps of:
Step 1, adjusting the distance between a lamp to be tested and an illumination test platform, irradiating a luminous source O' of the lamp to be tested on the illumination test platform to form light spots, and measuring the radius R of the light spots; the control processing center controls the optical measurement detector to move to the midpoint position of the light spot, and sets the midpoint position of the light spot as a center point O of an XY axis coordinate system;
Step 2, the control processing center controls the optical measurement detector to move to 9 coordinate points of an XY coordinate system and collects optical parameter data of each coordinate point, the 9 coordinate points comprise (0, 0), (0.5R, 0), (0,0.5R), (-0.5R, 0), (0, -0.5R), (0, -0.9R), (0.9R, 0), (0,0.9R), (-0.9R, 0), the control processing center sequentially collects optical parameter illuminance data according to the 9 coordinate points, and the luminous flux ψ is calculated according to a formulaWherein/>For the illuminance of the i-th measurement point, the serial numbers of the 9 coordinate points (0, 0), (0.5R, 0), (0,0.5R), (-0.5R, 0), (0, -0.5R), (0, -0.9R), (0.9R, 0), (0,0.9R), and (-0.9R, 0) arranged in order correspond to i=1, 2..9, respectively; uniformity of the light/>Calculation according to the formula/>The method comprises the steps of carrying out a first treatment on the surface of the And the control processing center reads the illuminance data according to the addresses on the 9 coordinate points, processes and calculates the uniformity of luminous flux and the light source, outputs measurement data according to a format set by a user, and automatically stores the measurement data, thereby improving the measurement efficiency.
In the step 1, the light spot is scaled into a light spot, the control processing center controls the optical measurement detector to move to the light spot, and then the light spot is amplified to form the light spot, and the radius R of the light spot is measured; or the light spot is directly irradiated on the illumination test platform, the edge of the light spot is taken as a boundary line, two longest straight lines which are positioned in the boundary line and do not coincide are drawn on the illumination test platform, the intersection point of the two straight lines is taken as a light spot midpoint, and the control processing center controls the optical measurement detector to move to the light spot midpoint position; the two modes can accurately determine the center position of the light spot, and can effectively reduce the measurement error of the optical parameters.
as shown in fig. 1, fig. 2 and fig. 5, a method for measuring the brightness of an array lamp by using the device comprises the following steps:
Step 1, adjusting the distance between a lamp to be tested and an illumination test platform, and irradiating a luminous source of the lamp to be tested on the illumination test platform to form a plurality of light spots, wherein the light spots are sequentially arranged to form N rows and M columns of matrixes; whether in the transverse direction or the longitudinal direction, the two adjacent light spots are required to be ensured not to interfere with each other, if the two adjacent light spots interfere with each other, one LED lamp bead is required to be selected not to emit light, so that the distance between the two adjacent light spots is ensured, and the test error of the optical brightness parameter is reduced;
And 2, the control processing center sets corresponding points to be detected on each light spot and plans the S-shaped track of the movement of the optical measurement detector to pass through each point to be detected in sequence, so that the optical measurement detector collects the brightness parameter data of each light spot.
Therefore, the brightness of each LED lamp bead of the array lamp can be rapidly measured, and the efficiency of measuring the optical parameters of the lamp is further improved.
Compared with the prior art, the measuring method has the advantages of higher efficiency, accurate point selection measurement, convenient and quick data processing, visual result reaction and automatic storage, and brings great convenience to the production experiment and quality control measurement of the lamp.
Although embodiments of the present invention have been shown and described, it will be understood by those skilled in the art that various equivalent changes, modifications, substitutions and alterations can be made to these embodiments without departing from the principles and spirit of the invention, the scope of which is defined in the appended claims and their equivalents.
Claims (10)
1. the automatic optical measurement device is characterized by comprising a control processing center and an illumination test platform which is vertically arranged, Y-axis guide rails are oppositely arranged on the illumination test platform, X-axis guide rails which are mutually perpendicular to the Y-axis guide rails are arranged between the two Y-axis guide rails, a Y-axis servo motor and an X-axis servo motor are arranged on the illumination test platform, the control processing center is used for driving the X-axis guide rails to move along the length direction of the Y-axis guide rails through the Y-axis servo motor, an optical measurement detector is movably arranged on the X-axis guide rails, the control processing center is used for driving the optical measurement detector to move along the length direction of the X-axis guide rails through the X-axis servo motor, and the control processing center is used for receiving and processing optical parameter data fed back by the optical measurement detector.
2. the automated optical measurement device of claim 1, wherein the optical measurement probe is illuminometer C7000.
3. the automated optical measurement device of claim 2 wherein the optical parameter data measured by the illuminometer C7000 includes color temperature, illuminance, color coordinates, color deviation values, chromaticity space non-uniformity, television illumination uniformity index, and brightness, and wherein the device calculates the beam angle, flood angle, luminous flux, and uniformity of light for the optical parameter based on measuring the illuminance at different detection points.
4. a method of measuring beam angle and flood angle using the apparatus of any one of claims 1 to 3, comprising the steps of:
Step 1, adjusting the distance between a lamp to be tested and an illumination test platform, irradiating a light-emitting source O' of the lamp to be tested on the illumination test platform to form a light spot, and controlling an optical measurement detector to move to the midpoint position of the light spot by a control processing center to measure the radius R of the light spot;
Step 2, the control processing center sets the midpoint position of the light spot as a center point O of an XY axis coordinate system, and the optical measurement detector collects the central illuminance value of the midpoint position of the light spot and records the central illuminance value as a numerical value A, and the numerical value A is fed back to the control processing center;
Step 3, the control processing center sets a 50% central illuminance value as a numerical value B; the control processing center controls the optical measurement detector to move to a position with a distance R/2 along the X-axis direction or the Y-axis direction, and the illuminance data of the position is recorded as a numerical value C1If the value B is smaller than the value C1The control processing center controls the optical measurement detector to move from the current position along the direction away from the center point O by a distance R/22at this time, the illuminance data of the position is recorded as a value C2The method comprises the steps of carrying out a first treatment on the surface of the If the value B is greater than the value C1The control processing center controls the optical measurement detector to move from the current position by a distance R/2 along the direction close to the center point O2at this time, the illuminance data of the position is recorded as a value C2The method comprises the steps of carrying out a first treatment on the surface of the Combining the value B with the value C2continuing to compare; repeating the above-mentioned actions while limiting the movement of the optical measuring probe not to exceed the distance L, when the optical measuring probe is moved by the distance R/2n< L, at this time value CnAbout equal to or equal to the value B, the value C is determinednCalculating a beam angle from the known distances OO ' and OC ' for the position of the measurement point C ' of 50% of the center illuminance;
or/and the control processing center sets the central illuminance value of 10% as a value D; the control processing center controls the optical measurement detector to move to a position with a distance R/2 along the X-axis direction or the Y-axis direction, and illuminance data of the position is recorded as a numerical value E1If the value D is smaller than the value E1The control processing center controls the optical measurement detector to move from the current position along the direction away from the center point O by a distance R/22at this time, the illuminance data of the position is recorded as a value E2The method comprises the steps of carrying out a first treatment on the surface of the If the value D is greater than the value E1The control processing center controls the optical measurement detector to move from the current position by a distance R/2 along the direction close to the center point O2at this time, the illuminance data of the position is recorded as a value E2the method comprises the steps of carrying out a first treatment on the surface of the Combining the value D with the value E2continuing to compare; repeating the above-mentioned actions while limiting the movement of the optical measuring probe not to exceed the distance L, when the optical measuring probe is moved by the distance R/2n< L, at this time value EnAbout equal to or equal to the value D, the value E is determinednthe position of the measurement point E ' for 10% of the center illuminance, the floodlight angle was calculated from the known distances OO ' and OE '.
5. The method of measuring beam angle and flood angle by the apparatus according to claim 4, wherein in step 1, the light spot is scaled to a light spot, the control processing center controls the optical measurement probe to move to the light spot, and then the light spot is enlarged to form the light spot, and the radius R of the light spot is measured; or the light spot is directly irradiated on the illumination test platform, the edge of the light spot is taken as a boundary line, two longest straight lines which are positioned in the boundary line and do not coincide are drawn on the illumination test platform, the intersection point of the two straight lines is taken as the midpoint of the light spot, and the control processing center controls the optical measurement detector to move to the midpoint position of the light spot.
6. the method for measuring beam angle and flood angle by a device according to claim 4, wherein in step 3, the distance L is defined in a range of 1-2mm.
7. A method of measuring luminous flux and uniformity of light using the apparatus of any one of claims 1-3, comprising the steps of:
Step 1, adjusting the distance between a lamp to be tested and an illumination test platform, irradiating a luminous source O' of the lamp to be tested on the illumination test platform to form light spots, and measuring the radius R of the light spots; the control processing center controls the optical measurement detector to move to the midpoint position of the light spot, and sets the midpoint position of the light spot as a center point O of an XY axis coordinate system;
And 2, the control processing center controls the optical measurement detector to move to 9 coordinate points of an XY coordinate system and collects optical parameter data of each coordinate point, wherein the 9 coordinate points comprise (0, 0), (0.5R, 0), (0,0.5R), (-0.5R, 0), (0, -0.5R), (0, -0.9R), (0.9R, 0), (0,0.9R) and (-0.9R, 0), and the control processing center processes and calculates luminous flux and light uniformity according to the optical parameter illuminance data collected on the 9 coordinate points.
8. The method of measuring luminous flux and uniformity of light according to claim 7, wherein said luminous flux ψ is calculated according to the formulaWherein/>For the illuminance of the i-th measurement point, the serial numbers of the 9 coordinate points (0, 0), (0.5R, 0), (0,0.5R), (-0.5R, 0), (0, -0.5R), (0, -0.9R), (0.9R, 0), (0,0.9R), and (-0.9R, 0) arranged in order correspond to i=1, 2..9, respectively; uniformity of the light/>Calculation according to the formula/>。
9. the method of measuring luminous flux and uniformity of light according to claim 7, wherein in step 1, the light spot is scaled to a light spot, said control processing center controls the optical measurement probe to move to the light spot, and then the light spot is amplified to form the light spot, and the radius R of the light spot is measured; or the light spot is directly irradiated on the illumination test platform, the edge of the light spot is taken as a boundary line, two longest straight lines which are positioned in the boundary line and do not coincide are drawn on the illumination test platform, the intersection point of the two straight lines is taken as the midpoint of the light spot, and the control processing center controls the optical measurement detector to move to the midpoint position of the light spot.
10. a method of measuring the brightness of an array lamp using the apparatus of any one of claims 1-3, comprising the steps of:
Step 1, adjusting the distance between a lamp to be tested and an illumination test platform, and irradiating a luminous source of the lamp to be tested on the illumination test platform to form a plurality of light spots, wherein the light spots are sequentially arranged to form N rows and M columns of matrixes;
and 2, the control processing center sets corresponding points to be detected on each light spot and plans the movement track of the optical measurement detector to pass through each point to be detected in sequence, so that the optical measurement detector collects the brightness parameter data of each light spot.
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Citations (18)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO1997009610A1 (en) * | 1995-09-04 | 1997-03-13 | Societe Française De Recherches Et D'investissements (S.F.R.I.) | Luminometer, particularly for medical assays |
| WO2004029540A2 (en) * | 2002-09-26 | 2004-04-08 | Metron Systems, Inc. | Determination of the angular position of a laser beam |
| US20080106987A1 (en) * | 2006-11-08 | 2008-05-08 | Hon Hai Precision Industry Co., Ltd. | Method and device for measuring eccentricity of optical disk |
| CN201653546U (en) * | 2010-01-06 | 2010-11-24 | 张弦 | Navaid light intensity automation measuring device |
| CN103353391A (en) * | 2013-07-10 | 2013-10-16 | 中国船舶重工集团公司第七一七研究所 | Measuring device and method for spatial luminosity distribution property of aiming lamp box |
| CN104089212A (en) * | 2014-08-05 | 2014-10-08 | 长沙信元电子科技有限公司 | Floodlight forming LED (light-emitting diode) average illumination |
| CN104165752A (en) * | 2013-05-15 | 2014-11-26 | 海洋王（东莞）照明科技有限公司 | Testing method and apparatus for illumination uniformity of light uniform lamp |
| RO129904A2 (en) * | 2013-04-26 | 2014-11-28 | Institutul Naţional De Cercetare-Dezvoltare Pentru Fizica Laserilor, Plasmei Şi Radiaţiei | Method for controlling the size and spatial profile of the laser spot in the target plane |
| CN204064619U (en) * | 2014-08-13 | 2014-12-31 | 北京航空航天大学 | Illumination tester |
| CN104964740A (en) * | 2015-06-19 | 2015-10-07 | 北京农业信息技术研究中心 | Automatic photosynthetic photon sensor detection and calibration system and method |
| CN105157958A (en) * | 2015-08-25 | 2015-12-16 | 公安部上海消防研究所 | Continuous-illuminance, centering, diameter-varying and angle-varying type test platform for lighting lamps |
| CN107560832A (en) * | 2017-09-06 | 2018-01-09 | 长春国科精密光学技术有限公司 | Measuring system and the method for measuring d-cinema projectors optical parametric |
| CN108872883A (en) * | 2018-04-28 | 2018-11-23 | 杭州远方光电信息股份有限公司 | A kind of light source Auto-Test System |
| CN212585954U (en) * | 2020-04-29 | 2021-02-23 | 厦门瑞显智能科技有限公司 | LED display screen photochromic parameter measurement experimental device |
| CN112747905A (en) * | 2020-12-31 | 2021-05-04 | 中国科学院长春光学精密机械与物理研究所 | Circumferential illumination measurement system and measurement method |
| CN213516284U (en) * | 2020-10-12 | 2021-06-22 | 东莞康耐德智能控制有限公司 | Detection system for LED ultraviolet exposure light source |
| CN218916773U (en) * | 2022-11-30 | 2023-04-25 | 武汉联影智融医疗科技有限公司 | Automatic optical parameter measuring mechanism and system |
| CN219965663U (en) * | 2023-05-24 | 2023-11-07 | 苏州尚集思智能技术有限公司 | Detection device for fire emergency lamp |
-
2024
- 2024-02-22 CN CN202410196777.3A patent/CN117760340B/en active Active
Patent Citations (18)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO1997009610A1 (en) * | 1995-09-04 | 1997-03-13 | Societe Française De Recherches Et D'investissements (S.F.R.I.) | Luminometer, particularly for medical assays |
| WO2004029540A2 (en) * | 2002-09-26 | 2004-04-08 | Metron Systems, Inc. | Determination of the angular position of a laser beam |
| US20080106987A1 (en) * | 2006-11-08 | 2008-05-08 | Hon Hai Precision Industry Co., Ltd. | Method and device for measuring eccentricity of optical disk |
| CN201653546U (en) * | 2010-01-06 | 2010-11-24 | 张弦 | Navaid light intensity automation measuring device |
| RO129904A2 (en) * | 2013-04-26 | 2014-11-28 | Institutul Naţional De Cercetare-Dezvoltare Pentru Fizica Laserilor, Plasmei Şi Radiaţiei | Method for controlling the size and spatial profile of the laser spot in the target plane |
| CN104165752A (en) * | 2013-05-15 | 2014-11-26 | 海洋王（东莞）照明科技有限公司 | Testing method and apparatus for illumination uniformity of light uniform lamp |
| CN103353391A (en) * | 2013-07-10 | 2013-10-16 | 中国船舶重工集团公司第七一七研究所 | Measuring device and method for spatial luminosity distribution property of aiming lamp box |
| CN104089212A (en) * | 2014-08-05 | 2014-10-08 | 长沙信元电子科技有限公司 | Floodlight forming LED (light-emitting diode) average illumination |
| CN204064619U (en) * | 2014-08-13 | 2014-12-31 | 北京航空航天大学 | Illumination tester |
| CN104964740A (en) * | 2015-06-19 | 2015-10-07 | 北京农业信息技术研究中心 | Automatic photosynthetic photon sensor detection and calibration system and method |
| CN105157958A (en) * | 2015-08-25 | 2015-12-16 | 公安部上海消防研究所 | Continuous-illuminance, centering, diameter-varying and angle-varying type test platform for lighting lamps |
| CN107560832A (en) * | 2017-09-06 | 2018-01-09 | 长春国科精密光学技术有限公司 | Measuring system and the method for measuring d-cinema projectors optical parametric |
| CN108872883A (en) * | 2018-04-28 | 2018-11-23 | 杭州远方光电信息股份有限公司 | A kind of light source Auto-Test System |
| CN212585954U (en) * | 2020-04-29 | 2021-02-23 | 厦门瑞显智能科技有限公司 | LED display screen photochromic parameter measurement experimental device |
| CN213516284U (en) * | 2020-10-12 | 2021-06-22 | 东莞康耐德智能控制有限公司 | Detection system for LED ultraviolet exposure light source |
| CN112747905A (en) * | 2020-12-31 | 2021-05-04 | 中国科学院长春光学精密机械与物理研究所 | Circumferential illumination measurement system and measurement method |
| CN218916773U (en) * | 2022-11-30 | 2023-04-25 | 武汉联影智融医疗科技有限公司 | Automatic optical parameter measuring mechanism and system |
| CN219965663U (en) * | 2023-05-24 | 2023-11-07 | 苏州尚集思智能技术有限公司 | Detection device for fire emergency lamp |
Non-Patent Citations (3)
| Title |
|---|
| 周宁科;米萌;杨艺;: "积分球和分布光度计测量灯具的光通量的差异", 电子产品可靠性与环境试验, no. 04, 20 August 2016 (2016-08-20) * |
| 王彦;: "2007年国外照明电器新进展(Ⅰ)", 中国照明电器, no. 05, 25 May 2008 (2008-05-25) * |
| 蔡丽枝;: "光照度计自动检定系统的研制", 机电技术, no. 02, 30 April 2015 (2015-04-30) * |
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