CN117743060B - Burr eliminating method and device for direct current parameter testing system, testing machine and medium - Google Patents
Burr eliminating method and device for direct current parameter testing system, testing machine and medium Download PDFInfo
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Abstract
The application relates to a burr eliminating method, a burr eliminating device, a tester and a medium of a direct current parameter testing system. The method comprises the following steps: invoking a direct current parameter measurement command to complete preprocessing on each functional module connected with an output line in the direct current parameter test system; the functional module comprises a PMU module; acquiring and storing program interface parameter setting information corresponding to a current working mode of the PMU module; the program interface parameter setting information comprises the sequence of program interface configuration parameters and the setting value of the corresponding configuration parameters; based on the sequence of the configuration parameters of the program interface, adopting the setting value of the corresponding configuration parameters to carry out the hardware configuration of the PMU module in the current working mode. Based on the application, burrs can be effectively eliminated, unnecessary test items do not need to be added, and the test burden is avoided.
Description
Technical Field
The application relates to the technical field of integrated circuit testing, in particular to a burr eliminating method, a burr eliminating device, a tester and a medium of a direct current parameter testing system.
Background
With the advent of the information age, ICs (INTEGRATED CIRCUIT integrated circuits) have entered a high-speed development phase, and their production flows include design, production processing, testing, packaging, etc., where testing is an important step in ensuring IC yields. The basic principle of integrated circuit testing is to apply stimulus to a chip under test (DUT) through testing, measure the output of the chip under test and compare with expected results. An ATE (Automatic Test Equipment automated tester) based test program mainly comprises three aspects: DC parameter test, AC parameter test and functional test. In the DC parameter test of a chip, a main test unit is a PMU (Precision Measurement Unit precision measurement unit) which can drive current into a device under test to measure voltage or apply voltage to the device under test to measure the generated current, and provides an accurate DC parameter measurement function for a tester.
However, during DC parametric testing of a tester connected to a DUT, mishandling may generate some glitches (noise pulses), such as switching between a PMU and other different test items or switching between different test modes under a PMU test item, the output of the previous test may affect the output of the next test, and thus may generate glitches, and variations in the drive range and measurement range of the PMU may also cause glitches. For example, if the tester outputs 2ma current and the external circuit loads 1k resistor, the measured voltage is 2V, and there is a short negative voltage output at the moment of closing the output switch connected to the output line, that is, burrs are generated, and the maximum amplitude of the negative voltage is more than-2V, and the duration is about 100us.
The test procedure creates burrs that risk damaging the DUT. Aiming at the generated burrs, the test items are generally added to avoid the burrs, so that the test burden is increased.
Disclosure of Invention
In view of the foregoing, it is desirable to provide a method, an apparatus, a tester, and a medium for removing burrs in a dc parameter test system, which can effectively suppress burrs while avoiding an increase in test load.
The first aspect of the present application provides a method for removing burrs of a dc parameter testing system, including:
Invoking a direct current parameter measurement command to complete preprocessing on each functional module connected with an output line in the direct current parameter test system; the functional module comprises a PMU module;
acquiring and storing program interface parameter setting information corresponding to a current working mode of the PMU module; the program interface parameter setting information comprises the sequence of program interface configuration parameters and the setting value of the corresponding configuration parameters;
and based on the sequence of the configuration parameters of the program interface, adopting the set value of the corresponding configuration parameter to carry out the hardware configuration of the PMU module in the current working mode.
A second aspect of the present application provides a burr eliminating device of a dc parameter testing system, comprising:
the preprocessing module is used for calling the direct current parameter measurement command to complete preprocessing on each functional module connected with the output line in the direct current parameter test system; the functional module comprises a PMU module;
The information acquisition module is used for acquiring and storing program interface parameter setting information corresponding to the current working mode of the PMU module; the program interface parameter setting information comprises the sequence of program interface configuration parameters and the setting value of the corresponding configuration parameters;
And the hardware configuration module is used for carrying out PMU module hardware configuration in the current working mode by adopting the set value of the corresponding configuration parameter based on the sequence of the configuration parameters of the program interface.
The third aspect of the present application provides a testing machine, comprising an upper computer and a digital board PE chip, wherein a software driver is provided in the upper computer, the upper computer issues program interface parameter setting information, and the software driver executes the burr eliminating method of the dc parameter testing system according to the received program interface parameter setting information, so as to eliminate burrs generated when the digital board PE chip executes testing.
A fourth aspect of the present application proposes a computer readable storage medium having stored thereon a computer program which, when executed by a processor, performs the steps of:
Invoking a direct current parameter measurement command to complete preprocessing on each functional module connected with an output line in the direct current parameter test system; the functional module comprises a PMU module;
acquiring and storing program interface parameter setting information corresponding to a current working mode of the PMU module; the program interface parameter setting information comprises the sequence of program interface configuration parameters and the setting value of the corresponding configuration parameters;
and based on the sequence of the configuration parameters of the program interface, adopting the set value of the corresponding configuration parameter to carry out the hardware configuration of the PMU module in the current working mode.
According to the burr eliminating method, the burr eliminating device, the testing machine and the computer readable storage medium of the direct current parameter testing system, the direct current parameter measuring command is called to complete preprocessing on each functional module connected with the output line, then the PMU module is subjected to hardware configuration by adopting the set value of the corresponding configuration parameter according to the sequence of the program interface configuration parameter in the current working mode of the PMU, on one hand, burrs (noise pulses) caused by pressure difference of an output end can be prevented by preprocessing each functional module before the PMU module is subjected to hardware configuration, on the other hand, the PMU module is subjected to hardware configuration by adopting the sequence of the program interface configuration parameter corresponding to the current working mode, so that the different working modes adopt different hardware configuration sequences, and the burrs can be effectively eliminated by optimizing the configuration sequence; therefore, burrs are effectively eliminated through pretreatment and reasonable arrangement of configuration sequences, unnecessary test items are not required to be added, test burden is avoided, and test efficiency can be improved.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments or the conventional techniques of the present application, the drawings required for the descriptions of the embodiments or the conventional techniques will be briefly described below, and it is apparent that the drawings in the following description are only some embodiments of the present application, and other drawings may be obtained according to the drawings without inventive effort for those skilled in the art.
FIG. 1 is a schematic diagram of a module structure in a PE chip;
FIG. 2 is a flow chart of a method for removing glitches in a DC parametric test system according to one embodiment;
FIG. 3 is a schematic diagram of a specific flow of setting each functional module of the DC parameter testing system connected to the output line in an output high-impedance state in one embodiment;
Fig. 4 is a circuit configuration diagram of a Drive mode of a PE chip;
FIG. 5 is a circuit diagram of a PE chip PMU mode;
FIG. 6 is a schematic diagram of a specific flow of setting each functional module of the DC parameter testing system connected to the output line in an output high-impedance state according to another embodiment;
FIG. 7 is a flow chart of configuration parameters of a program interface in an output current mode according to one embodiment;
FIG. 8 is a flow chart of configuration parameters of a program interface in an output voltage mode according to one embodiment;
FIG. 9 is a flow chart illustrating a hardware configuration of a PMU module in an output current mode according to one embodiment;
FIG. 10 is a flow chart illustrating a hardware configuration of a PMU module in an output voltage mode according to one embodiment;
fig. 11 is a block diagram illustrating a structure of a spur removing apparatus of a dc parameter testing system according to an embodiment.
Detailed Description
In order that the application may be readily understood, a more complete description of the application will be rendered by reference to the appended drawings. Embodiments of the application are illustrated in the accompanying drawings. This application may, however, be embodied in many different forms and should not be construed as limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete.
Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terminology used herein in the description of the application is for the purpose of describing particular embodiments only and is not intended to be limiting of the application.
It will be understood that when an element is referred to as being "connected" to another element, it can be directly connected to the other element or be connected to the other element through intervening elements. Further, "connection" in the following embodiments should be understood as "electrical connection", "communication connection", and the like if there is transmission of electrical signals or data between objects to be connected.
As used herein, the singular forms "a", "an" and "the" are intended to include the plural forms as well, unless the context clearly indicates otherwise. It will be further understood that the terms "comprises" and/or "comprising," and/or the like, specify the presence of stated features, integers, steps, operations, elements, components, or groups thereof, but do not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components, or groups thereof.
As described in the background, some burrs are generated during the connection of the tester to the DUT for dc parametric testing, and the burrs are not well removed by adding test items in the prior art, and the test load is increased. The inventor researches find that the cause of burrs during the direct current parameter test is as follows: taking a driving hardware PE chip as an example, the PE chip used for direct current parameter test comprises a PMU module and a Level module, wherein the Level module comprises a driving module and a Load module. As shown in FIG. 1, the PMU module shares the F/S line (output line) with the Drive mode of the Level module and the Load module shares the F/S line with the Load module through the output switch Con-Load-FS, so that the two test modes switch: namely, when the PMU mode is switched to the Level mode and different test items in the same mode are switched, the output of the previous test can influence the next test, and the situations of misprocessing of the output of various modes, misprocessing of the configuration sequence of PMU module hardware and the like can cause burrs.
For the above reasons, the present application provides a solution that can effectively eliminate burrs.
In one embodiment, as shown in fig. 2, a method for removing burrs of a dc parameter testing system is provided, the execution body is a software driver in an upper computer, and the method for removing burrs includes the following steps:
s110: and calling a direct current parameter measurement command to complete preprocessing on each functional module connected with the output line in the direct current parameter test system.
The functional module comprises a PMU module. The direct current parameter measurement command is sent to the software driver by the user through the upper computer, and comprises a direct current parameter measurement function, wherein the direct current parameter measurement function is a function used in the direct current parameter measurement process, and can be a measurement () function for example. The output line refers to a line connected to the device under test, such as the F/S line in fig. 1. In the dc parameter testing system, the functional modules connected to the output line may include a PMU module, a Drive module, and a Load module. The preprocessing of the functional module is completed, and the output state of the functional module can be preprocessed; when the direct current parameter measurement command is called, preprocessing is completed for each functional module before hardware configuration is performed on the PMU module, so that burrs (namely noise pulses) caused by output end pressure difference due to mode switching can be prevented. The direct current parameter measurement command may be a command, and the command may set output states of each functional module in the direct current parameter system simultaneously or in parallel to complete preprocessing.
S130: program interface parameter setting information corresponding to the current working mode of the PMU module is obtained and stored, wherein the program interface parameter setting information comprises the sequence of program interface configuration parameters and the setting value of the corresponding configuration parameters.
The working modes of the PMU module comprise an output Current mode (FI) and an output Voltage mode (FV), under the output Current mode FI, the PMU module can drive Current to be output to a tested device, and under the output Voltage mode FV, the PMU module can drive Voltage to be output to the tested device; the current mode of operation of the PMU module may be one of an output current mode FI and an output voltage mode FV.
The program interface parameter setting information is written by a programming user, and is issued to the software driver through the upper computer, and the software driver stores the program interface parameter setting information. The program interface parameter setting information is information of program interface configuration parameters, and comprises the sequence of the program interface configuration parameters and the setting values of the configuration parameters; the program interface configures parameters according to the operation of the programming user. The program interface is an API (Application Programming Interface application program interface), and the programming user configures parameters according to the configuration sequence of the user through the API according to the designed configuration sequence, where the API configures parameters according to the configuration sequence of the user, and the driver layer records the configuration sequence of the configuration parameters. Specifically, for different current working modes, the sequence of the configuration parameters of the program interface is different, and the corresponding configuration information of the parameters of the program interface is different.
The execution order of the step S110 and the step S130 is not limited, and the step S110 shown in fig. 2 is executed before the step S130, and it is understood that the step S110 may be executed after the step S130, so that the step S110 and the step S130 may be executed before the step S150.
S150: based on the sequence of the configuration parameters of the program interface, adopting the setting value of the corresponding configuration parameters to carry out the hardware configuration of the PMU module in the current working mode.
The hardware configuration of the PMU module refers to the configuration of hardware registers of the PMU module. Specifically, the hardware registers of the PMU module are configured according to the sequence of the configuration parameters of the program interface in the current working mode, and the set values of the corresponding configuration parameters are adopted, so that parameter configuration is issued to the hardware of the PMU module according to the sequence of the configuration parameters of the program interface. The sequence of the program interface configuration parameters is different in different current working modes, so that hardware configuration is carried out on the PMU module by adopting different sequences.
According to the burr eliminating method of the direct current parameter testing system, the direct current parameter measuring command is called to complete preprocessing on each functional module connected with the output line, then hardware configuration is carried out on the PMU module according to the sequence of the program interface configuration parameters in the current working mode of the PMU, on one hand, each functional module is preprocessed before hardware configuration is carried out on the PMU module, burrs (noise pulses) caused by pressure difference of an output end can be prevented, on the other hand, hardware configuration is carried out on the PMU module by adopting the sequence of the program interface configuration parameters corresponding to the current working mode, and therefore different hardware configuration sequences are adopted for different working modes, and burrs can be effectively eliminated by optimizing the configuration sequences; therefore, burrs are effectively eliminated through pretreatment and reasonable arrangement of configuration sequences, unnecessary test items are not required to be added, test burden is avoided, and test efficiency can be improved.
In one embodiment, step S110 includes: based on the direct current parameter measurement command, each functional module connected with the output line in the direct current parameter test system is set to be in an output high-resistance state.
Through preprocessing operation, each functional module is in an output high-resistance state, the PMU module is preset into an output voltage mode, loop stability is kept to avoid burr generation before a feedback link is connected to an output switch, and burrs (namely noise pulses) caused by voltage difference of an output end can be avoided.
In one embodiment, the functional modules connected to the output line further include a Drive module and a Load module. As shown in fig. 3, the step of setting each functional module connected to the output line in the dc parameter testing system in the step S110 in the output high-impedance state includes steps S111 to S119.
S111: the Load module and the PMU module are disconnected from the output switch of the output line.
For example, as shown in FIG. 1, the Load and PMU modules are connected to the output line F/S via output switch Con-Load-FS, and the output switch Con-Load-FS is opened to open the output path, which may be specifically Con-Load-FS register Bit configuration 0, via step S111.
S113: the output of the Drive module is set to be in a high resistance state.
Step S113 may include: the enable selection register is set to 0, and the serial port control enable register is set to 0 to switch the serial port control. Taking a PE chip as an example, the circuit of the Drive mode in the PE chip is shown in fig. 4. Firstly, setting an enable selection register Sel-En to 0, withdrawing Drive mode control rights, and selecting to be controlled by serial port programming; the serial port control enable register SP-EN is set to 0, i.e., EN is 0.
S115: the output of the Load module is set to be in a high resistance state.
Specifically, the power module control register may be set to 0, so that the Load module is disabled from power down and the output is in a high-impedance state.
S117: the PMU module is set to be in an output off state.
The output off state refers to the PMU module being in GateOff states. Taking a PMU module inside a PE chip as an example, as shown in fig. 5, the output off state refers to that the Force output terminal of the PMU module selects FV-Zero signal source for output. By setting Sel-Force <1:0> to 0x10, that is, the Force output end of the PMU module selects FV-Zero signal source for output, the PMU module is in an output off state, that is, the PMU module is rapidly switched to an output voltage 0 state, burrs caused by hot switching can be avoided.
S119: the output of the PMU module is set to be in a high impedance state.
Step S119 includes: the output current gear is configured to 0 and the output switch is turned off. For example, taking the PMU block of FIG. 5 as an example, IM4<4:0> is set to 0, and the Con-Load-FS switch is turned off, causing the output of the PMU block to be in a high impedance state.
In the process of testing the direct current parameters, the switching between different modes and the switching between different test items can be performed, the output of the previous test can influence the next test, and the voltage difference of the output end can possibly occur to cause noise pulses (burrs). In this embodiment, the direct current parameter measurement command is invoked, and by setting the output of each functional module to a high-impedance state before the hardware configuration is performed on the PMU module, burrs caused by the differential pressure of the output end can be prevented.
In one embodiment, after step S111 and before step S113, the method further includes: setting a driving high value of the driving module and a driving low value of the driving module, wherein the difference value between the driving high value and the driving low value is larger than a preset value, so that the measurement accuracy is prevented from being influenced by the super-power operation of the PE chip of the tester, and the normal operation of the PE chip is ensured.
In step S110, the execution sequence of setting the output of the Drive module, the Load module, and the PMU module in the high-impedance state may be determined according to the actual needs, and the subsequent setting is performed after the previous setting is successful. Fig. 6 is a flowchart of step S110 in a detailed embodiment, in which the serial port control is switched, that is, the output of the Drive module is set to be in a high-impedance state.
In one embodiment, the present operating mode includes one of an output current mode and an output voltage mode. When the current working mode is the output current mode, the sequence of the configuration parameters of the program interface comprises: setting a voltage clamp value, setting a current range value, setting a measurement mode, setting a connection output line, and setting a current output value.
When the current working mode is the output voltage mode, the sequence of the configuration parameters of the program interface comprises: setting a current clamp value, setting a current range value, setting a measurement mode, setting a voltage output value, and setting a connection output line.
In order to improve the measurement accuracy of the PMU module, the driving and measuring range of the PMU module is selected (RANGE SETTING) during programming, and a reasonable measuring range setting ensures the measurement accuracy. In the process of measuring the direct current parameters, the clamping voltage and the clamping current of the PMU module are set so as to inhibit the voltage/current from being in a safe range and avoid damaging the tested device. For example, when outputting current, it is necessary to set clamping voltage to protect the operator, test hardware and device under test circuit; when outputting voltage, for a pin of the DUT, the test opportunity increases the voltage to drive the DUT to reach the set voltage, and if the DUT path short circuit condition exists, clamping current needs to be set to prevent the channel and even the chip from being burnt out due to excessive current.
In the output current mode, the clamping voltage is set by setting the voltage clamping value. In the output voltage mode, the clamp current is set by setting the current clamp value. Wherein the voltage clamp value includes a voltage low clamp and a voltage high clamp. The current clamp value includes a current low clamp and a current high clamp. The current range values include an output current gear and a measured current gear. The current output value refers to a target value of the output current. The voltage output value refers to a target value of the output voltage.
Wherein the measurement mode includes an output on state and an output off state. The programming interface sets the measurement mode, and in particular the mode parameter, to a value that places the PMU module in an output on state. As shown in FIG. 5, taking the PMU module inside the PE chip as an example, the output on state is GateOn, which means that the Force output end of the PMU module selects the MVPMU_force signal source for output, in this embodiment, the mode parameter is data of Sel-Force <1:0>, set Sel-Force <1:0> to 0x10, that is, the Force output end selects the MVPMU_force signal source for output, so that the PMU module is in the output on state.
Setting the connection output line refers to setting the PMU module connection output line, and the program interface sets the connection output line, specifically, may set the relevant parameter to a value that makes the PMU module connect the output line. For example, the PMU module may be coupled to the output line via an output switch that may be closed to couple the output line by setting a value of a register that controls the state of the output switch.
The clamping of the hardware takes a certain time to take effect. In this embodiment, the setting sequence of the voltage clamping value/the current clamping value is placed before the setting of the current range value, and the clamping is set to ensure that the clamping is effective; by placing the setting sequence of the current range values before the connection output lines are set, the current range is not switched after the connection output lines are connected, and burrs caused by heat exchange can be avoided.
In the direct current parameter test process, other data required by the direct current parameter test can be set besides the voltage clamping value, the current range value, the measurement mode, the current output value and the voltage output value. For example, as shown in fig. 7, in the output current mode, voltage clamp values including a set voltage low clamp VclampL and a set voltage high clamp VclampH are set first, then current range value Irange, measurement mode Mtype, measurement mode Mmode are set in order, then connection output line, i.e., connect, is set, then current output value Iforce is set, and sampling number Smplesize and waiting time WaitTime are set again. When a direct current parameter measurement command is called, for example, when a direct current parameter measurement function measurement () is called, the output of each functional module is set to a high resistance state, and then hardware configuration is performed on the PMU module based on the sequence of program interface configuration parameters.
As shown in fig. 8, in the output voltage mode, the current clamp value is set first, including setting the current low clamp IclampL and setting the current high clamp IclampH, then the current range value Irange, setting the measurement mode Mtype, setting the measurement mode Mmode, setting the voltage output value Vforce, then the connection output line, i.e., connect, is set, and then the sampling number Smplesize and the waiting time WaitTime are set.
In one embodiment, when the current operation mode is the output current mode FI, step S150 includes steps (a 1) to (a 8).
Step (a 1): setting a voltage clamping value.
In the direct current parameter test, when the test is switched, the clamping type and the clamping value of the previous state are different from the clamping type to be set at this time, and in order to prevent abnormal high voltage and other conditions, the clamping value and the clamping type are set first. At this point the output switch is not closed and a voltage clamp source is required to be connected to the output switch (i.e., attn-Sense is selected) to suppress glitches. Since it takes a certain time for the clamping to take effect, the setting sequence of the voltage clamping values is placed before the setting of the current range values, ensuring that the clamping takes effect.
Step (a 2): the current range value is set.
The current range values include an output current gear and a measured current gear.
Step (a 3): the PMU module is set to be in an output on state.
When PMU hardware configuration is carried out, a measurement mode is set based on a program interface, and the PMU module is set to be in an output on state. Wherein the output on state is GateOn states.
In output current mode FI, if the current Range value, switching current Range, is then set while the PMU module is in GateOn, then glitches may occur on the output line F/S pin. The present embodiment can avoid burrs from being generated by switching the current when connecting the output lines by placing the setting order of the current range values before setting the connection output lines.
In one embodiment, step (a 3) comprises: the Sel-Force <1:0> register of the PMU module is set to 0x10 so that the PMU module is in GateOn. For example, in the PMU module of FIG. 5, sel-Force <1:0> is set to 0x10, i.e., the Force output selects the MVPMU_force source output.
Step (a 4): the PMU module is arranged to be connected with an output line.
Step (a 5): the current output value is set.
Step (a 6): and setting feedback and selecting current output.
After the PMU module is connected with the output line and the current output value is set, feedback and selected current output are set, so that the loop closing of the output line and the feedback is ensured before the selected current output, and the clamp voltage output on the output line is avoided. The PMU module outputs a current mode and an output voltage mode, which are configured by using the same register as an output, and the specific output current or the specific output voltage is set through feedback. In this embodiment, feedback is set immediately after the current output value is set, so that the voltage clamping source needs to be connected to the switch (i.e. Attn-Sense is selected) to suppress burrs before feedback is avoided after the current output value is set, and before the output channel switch is not closed at this time.
Taking the PMU module shown in fig. 5 as an example, step (a 6) may include: setting Sel-PMU-FB <2:0> to 011, selects the current output.
Step (a 7): setting a measurement target.
Setting a measurement target, i.e. selecting an object to be measured, the measurement target comprising a Measurement Voltage (MV) and a measurement current (MI). In the output current mode, the measurement target is set to be the measurement voltage. Specifically, the measurement path may be selected by setting a setting register, and the selection of the measurement target is achieved.
Step (a 8): the measurement path is connected to the monitoring module and the monitoring module is enabled.
Specifically, the measurement path may be connected to the Monitor module Monitor by setting the value of the path selection register, and Monitor may be enabled by setting the value of the Monitor control register.
In this embodiment, the hardware setting performed on the PMU module is performed according to the sequence of the configuration parameters of the program interface, and the sequence of the configuration parameters of the program interface is reasonably optimized, so that the hardware configuration is performed on the PMU module according to the sequence of the configuration parameters of the program interface, which can effectively eliminate the burrs generated in the process of testing the dc parameters.
In one embodiment, after step (a 8), the method may further include: a measurement is obtained. Specifically, the value of an ADC (analog-to-digital converter) of a PE chip can be read, and the measured value is obtained through calibration operation.
As shown in fig. 9, in the output current mode FI, after the output of each functional module is in the high impedance state, setting the voltage clamp value may include setting the voltage low clamp VClampL and the voltage high clamp VClampH, and then setting the current range value, including setting the output current range and setting the measurement current range. The PMU module is then set to the GateOn state, the PMU module is set to Connect the output lines, i.e., connect is implemented, and then the current output value Iforce is set. Feedback FeedBack, MV path (measurement target), connection Monitor, readAdc are then set in order, where ReadAdc refers to reading the value of the FE chip ADC.
In one embodiment, step (a 4) comprises: the output switch select register of the PMU module is set to 0, the output switch serial control register of the PMU module is set to1, and the output switch of the PMU module connected to the output line is closed.
Taking the PMU module shown in fig. 5 as an example, the output switch select register is a Sel-Con-Load-FS register, and the output switch serial port control register is an SP-Con-Load-FS register. The set-Con-Load-FS register of the PMU module is set to 0, the SP-Con-Load-FS register of the PMU module is set to 1, and an output switch Con-Load-FS connected to the output line of the PMU module is closed to realize Connect.
In one embodiment, when the current operation mode is the output voltage mode FV, step S150 includes steps (b 1) to (b 8).
Step (b 1): the current clamp value is set.
Step (b 2): the current range value is set.
Step (b 3): the PMU module is set to be in an output on state.
Step (b 4): the voltage output value is set.
Step (b 5): setting feedback and selecting voltage output.
Taking the PMU shown in fig. 5 as an example, step (b 5) includes: setting Sel-PMU-FB <2:0> to 010, selecting the voltage output.
Step (b 6): the PMU module is arranged to be connected with an output line.
In the case of a PMU module connected to the output line, the output switch is closed. Taking the PMU module shown in fig. 5 as an example, step (b 6) may include: the Sel-Con-Load-FS register is set to 0, the SP-Con-Load-FS register is set to 1, and the output switch Con-Load-FS is closed.
Step (b 7): setting a measurement target.
Step (b 8): the measurement path is connected to the monitoring module and the monitoring module is enabled.
In the output voltage mode, burrs are generated due to the fact that the output voltage value is set when the output switch is closed. In this embodiment, burrs can be avoided by setting the voltage output value and then setting the PMU module to connect the output line and close the output switch. The output voltage mode and the output current mode adopt different hardware configuration sequences, so that burrs are effectively eliminated according to different conditions, and the measurement precision and safety are improved.
In one embodiment, after step (b 8), the method may further include: a measurement is obtained. Specifically, the value of the FE chip ADC (analog-to-digital converter) can be read, and the measurement value is obtained through calibration operation.
As shown in fig. 10, in the output voltage mode, after the output of each functional module is set in the high impedance state by preprocessing, setting the current clamp value may include setting the current low clamp IClampL and the current high clamp IClampH, and then setting the current range value, including setting the output current range and setting the measurement current range. Setting the PMU module in GateOn states, setting a voltage output value Vsource and setting feedback FeedBack; the PMU module is then set to Connect the output lines, i.e. Connect is implemented, and then the MV path (measurement target), connection Monitor, readAdc, is set in order, where ReadAdc refers to reading the value of the PE chip ADC.
In one embodiment, as shown in fig. 11, there is provided a spur cancellation device of a direct current parameter test system, the device comprising:
the preprocessing module 110 is used for calling a direct current parameter measurement command to complete preprocessing on each functional module connected with an output line in the direct current parameter test system; the functional modules include a PMU module.
The information obtaining module 130 is configured to obtain and store program interface parameter setting information corresponding to a current working mode of the PMU module; the program interface parameter setting information comprises the sequence of program interface configuration parameters and the setting values of the corresponding configuration parameters.
The hardware configuration module 150 is configured to perform hardware configuration of the PMU module in the current working mode by using the set values of the corresponding configuration parameters based on the sequence of the configuration parameters of the program interface.
According to the burr eliminating device of the direct current parameter testing system, the direct current parameter measuring command is called to complete preprocessing on each functional module connected with the output line, then hardware configuration is carried out on the PMU module according to the sequence of program interface configuration parameters in the current working mode of the PMU, on one hand, burrs (noise pulses) caused by pressure difference of an output end can be prevented by preprocessing each functional module before the PMU module is subjected to hardware configuration, on the other hand, the PMU module is subjected to hardware configuration by adopting the sequence of the program interface configuration parameters corresponding to the current working mode, so that different hardware configuration sequences are adopted for different working modes, and burrs can be effectively eliminated by optimizing the configuration sequences; therefore, burrs are effectively eliminated through pretreatment and reasonable arrangement of configuration sequences, unnecessary test items are not required to be added, test burden is avoided, and test efficiency can be improved.
For specific limitations of the burr removal device of the dc parameter testing system, reference may be made to the above limitations of the burr removal method of the dc parameter testing system, and no further description is given here. The modules in the burr eliminating device of the direct current parameter testing system can be all or partially realized by software, hardware and the combination thereof. The above modules may be embedded in hardware or may be independent of a processor in the computer device, or may be stored in software in a memory in the computer device, so that the processor may call and execute operations corresponding to the above modules. It should be noted that, in the embodiment of the present application, the division of the modules is schematic, which is merely a logic function division, and other division manners may be implemented in actual implementation.
In one embodiment, a testing machine is provided, including an upper computer and a digital board PE chip, a software driver is disposed in the upper computer, the upper computer issues program interface parameter setting information, and the software driver executes steps in the above embodiments of the method according to the received program interface parameter setting information, so as to eliminate burrs generated when the digital board PE chip executes testing.
The testing machine can effectively eliminate burrs in the direct current parameter testing process, does not need to increase unnecessary testing items, avoids increasing testing burden and can improve testing efficiency due to the fact that the steps in the method embodiments can be realized in the same way.
In one embodiment, a computer-readable storage medium is provided, on which a computer program is stored which, when executed by a processor, implements the steps of the method embodiments described above.
The computer readable storage medium can be used for effectively eliminating burrs in the direct current parameter testing process, unnecessary test items are not required to be added, the test burden is avoided to be increased, and the test efficiency can be improved because the steps in the method embodiments can be realized when the stored computer program is executed by the processor.
Those skilled in the art will appreciate that implementing all or part of the above described methods may be accomplished by way of a computer program stored on a non-transitory computer readable storage medium, which when executed, may comprise the steps of the embodiments of the methods described above. Any reference to memory, storage, database, or other medium used in embodiments provided herein may include at least one of non-volatile and volatile memory. The nonvolatile Memory may include Read-Only Memory (ROM), magnetic tape, floppy disk, flash Memory, optical Memory, or the like. Volatile memory can include random access memory (Random Access Memory, RAM) or external cache memory. By way of illustration, and not limitation, RAM can be in various forms such as static random access memory (Static Random Access Memory, SRAM) or dynamic random access memory (Dynamic Random Access Memory, DRAM), etc.
In the description of the present specification, reference to the terms "some embodiments," "other embodiments," "desired embodiments," and the like, means that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the invention. In this specification, schematic descriptions of the above terms do not necessarily refer to the same embodiment or example.
The technical features of the above embodiments may be arbitrarily combined, and all possible combinations of the technical features in the above embodiments are not described for brevity of description, however, as long as there is no contradiction between the combinations of the technical features, they should be considered as the scope of the description.
The above examples illustrate only a few embodiments of the application, which are described in detail and are not to be construed as limiting the scope of the application. It should be noted that it will be apparent to those skilled in the art that several variations and modifications can be made without departing from the spirit of the application, which are all within the scope of the application. Accordingly, the scope of protection of the present application is to be determined by the appended claims.
Claims (10)
1. A method for removing burrs of a direct current parameter testing system, comprising:
Invoking a direct current parameter measurement command, and setting each functional module connected with an output line in a direct current parameter test system to be in an output high-resistance state based on the direct current parameter measurement command; the functional module comprises a PMU module, a Drive module and a Load module;
acquiring and storing program interface parameter setting information corresponding to a current working mode of the PMU module; the program interface parameter setting information comprises the sequence of program interface configuration parameters and the setting value of the corresponding configuration parameters;
and based on the sequence of the configuration parameters of the program interface, adopting the set value of the corresponding configuration parameter to carry out the hardware configuration of the PMU module in the current working mode.
2. The method of claim 1, wherein the present mode of operation comprises one of an output current mode and an output voltage mode;
When the current working mode is an output current mode, the sequence of the program interface configuration parameters comprises: setting a voltage clamping value, setting a current range value, setting a measurement mode, setting a connection output line and setting a current output value;
when the current working mode is an output voltage mode, the sequence of the program interface configuration parameters comprises: setting a current clamp value, setting a current range value, setting a measurement mode, setting a voltage output value, and setting a connection output line.
3. The method according to claim 2, wherein when the current operation mode is an output current mode, the PMU module hardware configuration in the current operation mode is performed by using a set value of a corresponding configuration parameter based on the sequence of the configuration parameters of the program interface, including:
setting a voltage clamping value;
Setting a current range value;
Setting the PMU module to be in an output starting state;
Setting the PMU module to be connected with the output line;
setting a current output value;
setting feedback and selecting current output;
Setting a measurement target;
The measurement path is connected to the monitoring module and the monitoring module is enabled.
4. A method according to claim 3, wherein said configuring said PMU module to connect said output line comprises:
and setting an output switch selection register of the PMU module to 0, setting an output switch serial port control register of the PMU module to 1, and closing an output switch of the PMU module connected to the output line.
5. The method according to claim 2, wherein when the current operation mode is an output voltage mode, the PMU module hardware configuration in the current operation mode is performed by using a set value of a corresponding configuration parameter based on the sequence of the configuration parameters of the program interface, including:
setting a current clamping value;
Setting a current range value;
Setting the PMU module to be in an output starting state;
Setting a voltage output value;
Setting feedback and selecting voltage output;
Setting the PMU module to be connected with the output line;
Setting a measurement target;
The measurement path is connected to the monitoring module and the monitoring module is enabled.
6. The method according to claim 1, wherein the setting each functional module connected to the output line in the dc parameter testing system in the output high-impedance state comprises:
disconnecting an output switch of the Load module and the PMU module connected to the output line;
Setting the output of the Drive module to be in a high-resistance state;
setting the output of the Load module to be in a high-resistance state;
setting the PMU module in an output closing state;
and setting the output of the PMU module to be in a high-resistance state.
7. The method of claim 6, wherein after said disconnecting said Load module and said PMU module from an output switch of said output line, and before said setting an output of said Drive module to a high impedance state, further comprises:
Setting a driving high value of the driving module and a driving low value of the driving module, wherein the difference value between the driving high value and the driving low value is larger than a preset value.
8. A spur cancellation apparatus for a dc parameter testing system, comprising:
the preprocessing module is used for calling a direct current parameter measurement command, and setting each functional module connected with an output line in the direct current parameter test system to be in an output high-resistance state based on the direct current parameter measurement command; the functional module comprises a PMU module, a Drive module and a Load module;
The information acquisition module is used for acquiring and storing program interface parameter setting information corresponding to the current working mode of the PMU module; the program interface parameter setting information comprises the sequence of program interface configuration parameters and the setting value of the corresponding configuration parameters;
And the hardware configuration module is used for carrying out PMU module hardware configuration in the current working mode by adopting the set value of the corresponding configuration parameter based on the sequence of the configuration parameters of the program interface.
9. A testing machine, comprising an upper computer and a digital board PE chip, wherein a software driver is provided in the upper computer, the upper computer issues program interface parameter setting information, and the software driver executes the method according to the received program interface parameter setting information to eliminate burrs generated when the digital board PE chip executes the test.
10. A computer readable storage medium, on which a computer program is stored, characterized in that the computer program, when being executed by a processor, implements the steps of the method of any of claims 1 to 7.
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