CN117723815A - Chip voltage testing method, device, equipment and storage medium - Google Patents
Chip voltage testing method, device, equipment and storage medium Download PDFInfo
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
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Abstract
The embodiment of the invention discloses a chip voltage testing method, a device, equipment and a storage medium, relating to the field of chip testing, wherein the method comprises the following steps: acquiring a voltage threshold initial value of a chip to be tested; the voltage threshold initial value comprises a voltage upper limit initial value and a voltage lower limit initial value; determining an intermediate voltage value according to the initial value of the voltage threshold, and taking the intermediate voltage value as the current working voltage of the chip to be tested to determine the switching condition of the working state of the chip to be tested under the current working voltage; adjusting the initial value of the voltage threshold according to the switching condition to obtain the current value of the voltage threshold; and under the condition that the current magnitude relation of the current value of the voltage threshold meets the preset magnitude relation, performing voltage test on the chip to be tested according to the voltage threshold standard value of the chip to be tested. By adopting the technical scheme of the embodiment of the invention, the chip voltage testing method based on the adjustment of the dichotomy threshold value can be provided, so that the testing efficiency and the testing accuracy are improved for chip mass production testing.
Description
Technical Field
The embodiment of the invention relates to the technical field of chip testing, in particular to a chip voltage testing method, device, equipment and storage medium.
Background
In the chip test process, the threshold voltage for switching the working state of the chip in the power supply falling process needs to be found. Usually, the laboratory adjusts the working voltage of the chip step by step until the working state of the chip is switched, and the method can find the accurate threshold voltage, but has low efficiency, needs to take the interval of each step as the adjustment amount, and adjusts the working voltage step by step, thus being very time-consuming and not applicable to mass production test. The current method for testing mass production is to directly test the upper limit voltage and the lower limit voltage of the threshold value, record the working state of the chip and directly judge whether the chip meets the specification.
Disclosure of Invention
The embodiment of the invention provides a chip voltage testing method, a device, equipment and a storage medium, which are used for improving the testing efficiency and the testing accuracy for chip mass production testing based on the adjustment of a dichotomy threshold value.
In a first aspect, an embodiment of the present invention provides a method for testing a chip voltage, where the method includes:
acquiring a voltage threshold initial value of a chip to be tested; the voltage threshold initial value comprises a voltage upper limit initial value and a voltage lower limit initial value;
determining an intermediate voltage value according to the initial value of the voltage threshold, and taking the intermediate voltage value as the current working voltage of the chip to be tested to determine the switching condition of the working state of the chip to be tested under the current working voltage;
adjusting the initial value of the voltage threshold according to the switching condition to obtain the current value of the voltage threshold;
and under the condition that the current magnitude relation of the current value of the voltage threshold meets the preset magnitude relation, performing voltage test on the chip to be tested according to the voltage threshold standard value of the chip to be tested.
In a second aspect, an embodiment of the present invention further provides a chip voltage testing apparatus, where the apparatus includes:
the voltage threshold initial value acquisition module is used for acquiring the voltage threshold initial value of the chip to be tested; the voltage threshold initial value comprises a voltage upper limit initial value and a voltage lower limit initial value;
the switching condition determining module is used for determining an intermediate voltage value according to the initial value of the voltage threshold, and taking the intermediate voltage value as the current working voltage of the chip to be tested to determine the switching condition of the working state of the chip to be tested under the current working voltage;
the voltage threshold current value acquisition module is used for adjusting the voltage threshold initial value according to the switching condition to obtain a voltage threshold current value;
and the voltage testing module is used for carrying out voltage testing on the chip to be tested according to the voltage threshold standard value of the chip to be tested under the condition that the current magnitude relation of the current value of the voltage threshold meets the preset magnitude relation.
In a third aspect, an embodiment of the present invention provides an electronic device, including:
one or more processors;
a memory for storing one or more programs;
the one or more programs, when executed by the one or more processors, cause the one or more processors to implement the method for chip voltage testing as provided by any embodiment of the present invention.
In a fourth aspect, embodiments of the present invention further provide a computer readable storage medium having stored thereon a computer program which, when executed by a processor, implements a chip voltage test method as provided by any of the embodiments of the present invention.
The embodiments of the above invention have the following advantages or benefits:
according to the technical scheme, the initial value of the voltage threshold of the chip to be tested is obtained; the voltage threshold initial value comprises a voltage upper limit initial value and a voltage lower limit initial value; determining an intermediate voltage value according to the initial value of the voltage threshold, and taking the intermediate voltage value as the current working voltage of the chip to be tested to determine the switching condition of the working state of the chip to be tested under the current working voltage; adjusting the initial value of the voltage threshold according to the switching condition to obtain the current value of the voltage threshold; under the condition that the current magnitude relation of the current value of the voltage threshold meets the preset magnitude relation, the voltage test is carried out on the chip to be tested according to the voltage threshold standard value of the chip to be tested, the problems that the conventional method for reducing the chip voltage step by step to test the chip threshold voltage is time-consuming and cannot be used for mass production test, the test result is inaccurate due to the fact that the chip threshold voltage is tested only by using the upper limit voltage and the lower limit voltage in the mass production test, and therefore the test efficiency and the test accuracy of the mass production test cannot be guaranteed at the same time are solved.
Drawings
FIG. 1 is a flow chart of a method for testing chip voltage according to an embodiment of the present invention;
FIG. 2 is a schematic diagram showing a complete flow of a chip voltage testing method according to the present embodiment;
FIG. 3 is a schematic diagram of a chip voltage testing apparatus according to an embodiment of the present invention;
fig. 4 is a schematic structural diagram of an electronic device according to an embodiment of the present invention.
Detailed Description
The invention is described in further detail below with reference to the drawings and examples. It is to be understood that the specific embodiments described herein are merely illustrative of the invention and are not limiting thereof. It should be further noted that, for convenience of description, only some, but not all of the structures related to the present invention are shown in the drawings.
Fig. 1 is a flowchart of a method for testing chip voltage according to an embodiment of the present invention, where the embodiment is applicable to a case where a threshold voltage of a chip is tested. The method may be performed by a chip voltage testing apparatus integrated in a server, which may be implemented in software and/or hardware. As shown in fig. 1, the method specifically includes the following steps:
s110, acquiring a voltage threshold initial value of a chip to be tested; the voltage threshold initial values include a voltage upper limit initial value and a voltage lower limit initial value.
The initial value of the voltage threshold may refer to an upper limit value and a lower limit value of a working voltage set for a chip to be tested in advance, and the initial value of the voltage threshold may be obtained according to statistics results of a large amount of historical chip data.
In this embodiment, the upper voltage limit and the lower voltage limit may be initialized for the chip to be tested according to the statistical result of a large number of historical actual measured chip data.
S120, determining an intermediate voltage value according to the initial value of the voltage threshold, and taking the intermediate voltage value as the current working voltage of the chip to be tested to determine the switching condition of the working state of the chip to be tested under the current working voltage.
The intermediate voltage value may be an average value of the upper voltage limit initial value and the lower voltage limit initial value. The working state of the chip to be tested can be reflected by the states 0 and 1 set inside the chip.
In this embodiment, the intermediate voltage value of the initial value of the voltage threshold may be used as the current working voltage of the chip to be tested, to determine whether the current working state of the chip to be tested is switched, for example, from 0 to 1 or from 1 to 0.
S130, adjusting the initial value of the voltage threshold according to the switching condition to obtain the current value of the voltage threshold.
And S140, under the condition that the current magnitude relation of the current value of the voltage threshold meets the preset magnitude relation, performing voltage test on the chip to be tested according to the voltage threshold standard value of the chip to be tested.
Under the condition that the switching condition is that switching occurs, the initial value of the lower voltage limit is adjusted by utilizing the intermediate voltage value, so as to obtain the current value of the lower voltage limit; acquiring the current value of the upper voltage limit of the chip to be tested; under the condition that a first difference value between the current voltage upper limit value and the current voltage lower limit value is smaller than or equal to a preset voltage difference threshold value, if the current voltage upper limit value is a voltage upper limit initial value, taking the sum of the voltage upper limit standard value and the preset voltage difference threshold value in the voltage threshold standard values as the current working voltage of the chip to be tested; if the working state of the chip to be tested is switched under the current working voltage, the threshold voltage of the chip to be tested is not determined, and the voltage test is ended. The voltage threshold standard value may refer to an upper limit value and a lower limit value of a working voltage set by a chip to be tested in a factory. Optionally, if the first difference value is less than or equal to the preset voltage difference threshold value and the current voltage upper limit value is different from the initial voltage upper limit value, determining the intermediate voltage value as the threshold voltage of the chip to be tested and ending the voltage test. Optionally, when the first difference is greater than the preset voltage difference threshold, determining a new intermediate voltage value according to the current voltage upper limit value and the current voltage lower limit value, and returning to execute the operation of taking the intermediate voltage value as the current working voltage of the chip to be tested to determine the switching condition of the working state of the chip to be tested under the current working voltage.
In another case, when the switching condition is that the switching does not occur, the second difference value between the intermediate voltage value and the preset voltage difference threshold is utilized to adjust the initial value of the upper voltage limit, so as to obtain the current value of the upper voltage limit; acquiring a current value of a lower voltage limit of a chip to be tested; under the condition that the current value of the upper voltage limit is smaller than or equal to the current value of the lower voltage limit, if the threshold voltage of the chip to be tested is zero, taking the lower voltage limit standard value in the voltage threshold standard values as the current working voltage of the chip to be tested; if the working state of the chip to be tested is not switched under the current working voltage, the threshold voltage of the chip to be tested is not determined, and the voltage test is finished. Optionally, if the threshold voltage of the chip to be tested is not zero, or the working state of the chip to be tested is switched under the current working voltage, determining the threshold voltage of the chip to be tested and ending the voltage test. Optionally, when the current voltage limit is greater than the current voltage limit, determining a new intermediate voltage value according to the current voltage limit and the current voltage limit, and returning to execute the operation of taking the intermediate voltage value as the current working voltage of the chip to be tested to determine the switching condition of the working state of the chip to be tested under the current working voltage.
In order to better understand the implementation of the above two cases, fig. 2 is a schematic diagram of a complete flow of a chip voltage testing method according to the present embodiment.
Initializing a voltage upper limit value max and a voltage lower limit value min for a chip to be tested, setting an initial value of a threshold voltage vol of the chip to be tested as 0V, enabling a current intermediate voltage value to be mid= (max+min)/2, enabling the chip to be tested to work by taking mid as a working voltage, and judging whether a current working state is switched or not:
if the current working state of the chip to be tested is switched under the working voltage mid, the min=mid of the chip to be tested can be adjusted, and the vol=mid is recorded, at this time, the chip to be tested max-min is judged to be more than 10mv (namely, the preset voltage difference threshold value, 10mv is only one example): if max-min is more than 10mv, returning to recalculate the new intermediate voltage value, and judging whether the working state of the chip to be tested under the new intermediate voltage value is switched or not; if max-min is less than or equal to 10mv, when max is kept as the initial value of max, the upper limit voltage value (namely the voltage upper limit standard value) +10mv of the test vector can be used for judging whether the chip state is switched, if so, vol=mid is not the final threshold voltage and the test is finished, and if not, or max is not kept as the initial value of max, the threshold voltage vol=mid is found and the test is finished.
If the current working state of the chip to be tested is not switched under the working voltage mid, the max=mid-10 mv of the chip to be tested can be adjusted, and the condition that the current max is larger than min is judged: if max is more than min, the new intermediate voltage value can be calculated again, and whether the working state of the chip to be tested under the new intermediate voltage value is switched or not is judged; if max is less than or equal to min, when the vol=0v of the chip to be tested, judging whether the state of the chip is switched according to the lower limit voltage value (namely the voltage lower limit standard value) of the test vector, if not, not finding the final threshold voltage and ending the test, and if the final threshold voltage is not found, or if the final threshold voltage is not found, finding the threshold voltage vol and ending the test.
It should be noted that the present solution essentially consists of three steps for mass production testing:
the first step is to quickly find out the threshold voltage of the chip within the upper and lower limits of the voltage of the chip to be tested by adopting a dichotomy. The dichotomy requires exit conditions: setting a minimum upper and lower voltage difference threshold as exit condition, and exiting the dichotomy when the upper and lower voltage difference is smaller than the difference or the upper limit is smaller than the lower limit.
The second step is big data statistics: the actual threshold voltage of a large number of chips is tested, and the actual threshold voltage range of a large number of chips is counted through a large number of data, so that the upper limit value and the lower limit value of the dichotomy in the first step are reduced, the number of steps searched by the dichotomy is reduced, the testing speed of the dichotomy is further improved, and the purpose of rapidly positioning the threshold voltage is achieved.
The third step is special case special treatment: and (3) directly testing whether the standard values of the upper and lower limit voltages meet the switching conditions of the working states of the chips or not according to the upper and lower limit specifications (namely the standard values of the voltage threshold) in the test vector, and screening out the chips meeting the specifications.
By the test method, the threshold voltage of the chip in the working state switching process can be rapidly and accurately positioned, the test efficiency and the threshold voltage accuracy of the chip are greatly improved, the time cost of the chip in the actual mass production test is reduced, and the test accuracy is improved.
According to the technical scheme, the initial value of the voltage threshold of the chip to be tested is obtained; the voltage threshold initial value comprises a voltage upper limit initial value and a voltage lower limit initial value; determining an intermediate voltage value according to the initial value of the voltage threshold, and taking the intermediate voltage value as the current working voltage of the chip to be tested to determine the switching condition of the working state of the chip to be tested under the current working voltage; adjusting the initial value of the voltage threshold according to the switching condition to obtain the current value of the voltage threshold; under the condition that the current magnitude relation of the current value of the voltage threshold meets the preset magnitude relation, the voltage test is carried out on the chip to be tested according to the voltage threshold standard value of the chip to be tested, the problems that the conventional method for reducing the chip voltage step by step to test the chip threshold voltage is time-consuming and cannot be used for mass production test, the test result is inaccurate due to the fact that the chip threshold voltage is tested only by using the upper limit voltage and the lower limit voltage in the mass production test, and therefore the test efficiency and the test accuracy of the mass production test cannot be guaranteed at the same time are solved.
The following is an embodiment of a chip voltage testing apparatus provided in the embodiment of the present invention, which belongs to the same inventive concept as the chip voltage testing method of the first embodiment, and details of the embodiment of the chip voltage testing apparatus, which are not described in detail, may be referred to in the foregoing embodiments.
Fig. 3 is a schematic structural diagram of a chip voltage testing apparatus according to an embodiment of the present invention, where the apparatus includes: a voltage threshold initial value acquisition module 310, a switching condition determination module 320, a voltage threshold current value acquisition module 330 and a voltage test module 340. Wherein:
a voltage threshold initial value obtaining module 310, configured to obtain a voltage threshold initial value of a chip to be tested; the voltage threshold initial value comprises a voltage upper limit initial value and a voltage lower limit initial value;
the switching condition determining module 320 is configured to determine an intermediate voltage value according to the initial value of the voltage threshold, and use the intermediate voltage value as a current working voltage of the chip to be tested to determine a switching condition of a working state of the chip to be tested under the current working voltage;
a voltage threshold current value obtaining module 330, configured to adjust the voltage threshold initial value according to the switching condition, to obtain a voltage threshold current value;
and the voltage testing module 340 is configured to perform voltage testing on the chip to be tested according to a voltage threshold standard value of the chip to be tested when the current magnitude relation of the current value of the voltage threshold meets a preset magnitude relation.
According to the technical scheme, the initial value of the voltage threshold of the chip to be tested is obtained; the voltage threshold initial value comprises a voltage upper limit initial value and a voltage lower limit initial value; determining an intermediate voltage value according to the initial value of the voltage threshold, and taking the intermediate voltage value as the current working voltage of the chip to be tested to determine the switching condition of the working state of the chip to be tested under the current working voltage; adjusting the initial value of the voltage threshold according to the switching condition to obtain the current value of the voltage threshold; under the condition that the current magnitude relation of the current value of the voltage threshold meets the preset magnitude relation, the voltage test is carried out on the chip to be tested according to the voltage threshold standard value of the chip to be tested, the problems that the conventional method for reducing the chip voltage step by step to test the chip threshold voltage is time-consuming and cannot be used for mass production test, the test result is inaccurate due to the fact that the chip threshold voltage is tested only by using the upper limit voltage and the lower limit voltage in the mass production test, and therefore the test efficiency and the test accuracy of the mass production test cannot be guaranteed at the same time are solved.
Optionally, the voltage threshold current value obtaining module 330 may specifically be configured to:
when the switching condition is that switching occurs, the intermediate voltage value is utilized to adjust the initial value of the lower voltage limit, and the current value of the lower voltage limit is obtained;
accordingly, the voltage testing module 340 may specifically be configured to:
acquiring the current value of the upper voltage limit of the chip to be tested;
if the first difference value between the current voltage upper limit value and the current voltage lower limit value is smaller than or equal to a preset voltage difference threshold value, taking the sum of the current voltage upper limit value and the preset voltage difference threshold value in the current voltage threshold standard value as the current working voltage of the chip to be tested, wherein the current voltage upper limit value is the initial voltage upper limit value; if the working state of the chip to be tested is switched under the current working voltage, the threshold voltage of the chip to be tested is not determined and the voltage test is finished.
Optionally, the chip voltage testing device further includes a first testing module, configured to:
if the first difference value is smaller than or equal to the preset voltage difference threshold value and the current voltage upper limit value is different from the initial voltage upper limit value, the intermediate voltage value is determined to be the threshold voltage of the chip to be tested and the voltage test is finished.
Optionally, the chip voltage testing device further includes a first return execution module, configured to:
and under the condition that the first difference value is larger than the preset voltage difference threshold value, determining a new intermediate voltage value according to the current voltage upper limit value and the current voltage lower limit value, and returning to the operation of taking the intermediate voltage value as the current working voltage of the chip to be tested so as to determine the switching condition of the working state of the chip to be tested under the current working voltage.
Optionally, the voltage threshold current value obtaining module 330 may be specifically further configured to:
when the switching condition is that switching does not occur, the voltage upper limit initial value is adjusted by utilizing a second difference value between the intermediate voltage value and a preset voltage difference threshold value, so as to obtain a voltage upper limit current value;
accordingly, the voltage testing module 340 may be further specifically configured to:
acquiring the current value of the lower voltage limit of the chip to be tested;
under the condition that the current value of the upper voltage limit is smaller than or equal to the current value of the lower voltage limit, if the threshold voltage of the chip to be tested is zero, taking the lower voltage limit standard value in the voltage threshold standard values as the current working voltage of the chip to be tested; if the working state of the chip to be tested is not switched under the current working voltage, the threshold voltage of the chip to be tested is not determined, and the voltage test is finished.
Optionally, the chip voltage testing device further includes a second testing module, configured to:
if the threshold voltage of the chip to be tested is not zero or the working state of the chip to be tested is switched under the current working voltage, determining the threshold voltage of the chip to be tested and ending the voltage test.
Optionally, the chip voltage testing device further includes a second return execution module, configured to:
and under the condition that the current voltage upper limit value is larger than the current voltage lower limit value, determining a new intermediate voltage value according to the current voltage upper limit value and the current voltage lower limit value, and returning to the operation of taking the intermediate voltage value as the current working voltage of the chip to be tested so as to determine the switching condition of the working state of the chip to be tested under the current working voltage.
The chip voltage testing device provided by the embodiment of the invention can execute the chip voltage testing method provided by the first embodiment of the invention, and has the corresponding functional modules and beneficial effects of executing the chip voltage testing method.
Fig. 4 is a schematic structural diagram of an electronic device according to an embodiment of the present invention. Fig. 4 illustrates a block diagram of an exemplary server 12 suitable for use in implementing embodiments of the present invention. The server 12 shown in fig. 4 is merely an example, and should not be construed as limiting the functionality and scope of use of embodiments of the present invention.
As shown in fig. 4, the server 12 is in the form of a general purpose computing device. The components of server 12 may include, but are not limited to: one or more processors or processing units 16, a system memory 28, a bus 18 that connects the various system components, including the system memory 28 and the processing units 16.
Bus 18 represents one or more of several types of bus structures, including a memory bus or memory controller, a peripheral bus, an accelerated graphics port, a processor, and a local bus using any of a variety of bus architectures. By way of example, and not limitation, such architectures include Industry Standard Architecture (ISA) bus, micro channel architecture (MAC) bus, enhanced ISA bus, video Electronics Standards Association (VESA) local bus, and Peripheral Component Interconnect (PCI) bus.
Server 12 typically includes a variety of computer system readable media. Such media can be any available media that is accessible by server 12 and includes both volatile and nonvolatile media, removable and non-removable media.
The system memory 28 may include computer system readable media in the form of volatile memory, such as Random Access Memory (RAM) 30 and/or cache memory 32. The server 12 may further include other removable/non-removable, volatile/nonvolatile computer system storage media. By way of example only, storage system 34 may be used to read from or write to non-removable, nonvolatile magnetic media (not shown in FIG. 4, commonly referred to as a "hard disk drive"). Although not shown in fig. 4, a magnetic disk drive for reading from and writing to a removable non-volatile magnetic disk (e.g., a "floppy disk"), and an optical disk drive for reading from or writing to a removable non-volatile optical disk (e.g., a CD-ROM, DVD-ROM, or other optical media) may be provided. In such cases, each drive may be coupled to bus 18 through one or more data medium interfaces. The system memory 28 may include at least one program product having a set (e.g., at least one) of program modules configured to carry out the functions of the embodiments of the invention.
A program/utility 40 having a set (at least one) of program modules 42 may be stored in, for example, system memory 28, such program modules 42 including, but not limited to, an operating system, one or more application programs, other program modules, and program data, each or some combination of which may include an implementation of a network environment. Program modules 42 generally perform the functions and/or methods of the embodiments described herein.
The server 12 may also communicate with one or more external devices 14 (e.g., keyboard, pointing device, display 24, etc.), one or more devices that enable a user to interact with the server 12, and/or any devices (e.g., network card, modem, etc.) that enable the server 12 to communicate with one or more other computing devices. Such communication may occur through an input/output (I/O) interface 22. Also, the server 12 may communicate with one or more networks such as a Local Area Network (LAN), a Wide Area Network (WAN) and/or a public network, such as the Internet, via a network adapter 20. As shown, network adapter 20 communicates with the other modules of server 12 via bus 18. It should be appreciated that although not shown, other hardware and/or software modules may be used in connection with server 12, including, but not limited to: microcode, device drivers, redundant processing units, external disk drive arrays, RAID systems, tape drives, data backup storage systems, and the like.
The processing unit 16 executes various functional applications and data processing by running programs stored in the system memory 28, for example, implementing a chip voltage testing method step provided in the present embodiment, the method includes:
acquiring a voltage threshold initial value of a chip to be tested; the voltage threshold initial value comprises a voltage upper limit initial value and a voltage lower limit initial value;
determining an intermediate voltage value according to the initial value of the voltage threshold, and taking the intermediate voltage value as the current working voltage of the chip to be tested to determine the switching condition of the working state of the chip to be tested under the current working voltage;
adjusting the initial value of the voltage threshold according to the switching condition to obtain the current value of the voltage threshold;
and under the condition that the current magnitude relation of the current value of the voltage threshold meets the preset magnitude relation, performing voltage test on the chip to be tested according to the voltage threshold standard value of the chip to be tested.
Of course, those skilled in the art will understand that the processor may also implement the technical solution of the chip voltage testing method provided in any embodiment of the present invention.
The present embodiment provides a computer-readable storage medium having stored thereon a computer program which, when executed by a processor, implements a chip voltage testing method step as provided in the foregoing embodiment of the present invention, the method comprising:
acquiring a voltage threshold initial value of a chip to be tested; the voltage threshold initial value comprises a voltage upper limit initial value and a voltage lower limit initial value;
determining an intermediate voltage value according to the initial value of the voltage threshold, and taking the intermediate voltage value as the current working voltage of the chip to be tested to determine the switching condition of the working state of the chip to be tested under the current working voltage;
adjusting the initial value of the voltage threshold according to the switching condition to obtain the current value of the voltage threshold;
and under the condition that the current magnitude relation of the current value of the voltage threshold meets the preset magnitude relation, performing voltage test on the chip to be tested according to the voltage threshold standard value of the chip to be tested.
The computer storage media of embodiments of the invention may take the form of any combination of one or more computer-readable media. The computer readable medium may be a computer readable signal medium or a computer readable storage medium. The computer readable storage medium may be, for example, but not limited to: an electrical, magnetic, optical, electromagnetic, infrared, or semiconductor system, apparatus, or device, or a combination of any of the foregoing. More specific examples (a non-exhaustive list) of the computer-readable storage medium would include the following: an electrical connection having one or more wires, a portable computer diskette, a hard disk, a Random Access Memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber, a portable compact disc read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the foregoing. In this document, a computer readable storage medium may be any tangible medium that can contain, or store a program for use by or in connection with an instruction execution system, apparatus, or device.
The computer readable signal medium may include a propagated data signal with computer readable program code embodied therein, either in baseband or as part of a carrier wave. Such a propagated data signal may take any of a variety of forms, including, but not limited to, electro-magnetic, optical, or any suitable combination of the foregoing. A computer readable signal medium may also be any computer readable medium that is not a computer readable storage medium and that can communicate, propagate, or transport a program for use by or in connection with an instruction execution system, apparatus, or device.
Program code embodied on a computer readable medium may be transmitted using any appropriate medium, including but not limited to: wireless, wire, fiber optic cable, RF, etc., or any suitable combination of the foregoing.
Computer program code for carrying out operations of the present invention may be written in one or more programming languages, including an object oriented programming language such as Java, smalltalk, C ++ and conventional procedural programming languages, such as the "C" programming language or similar programming languages. The program code may execute entirely on the user's computer, partly on the user's computer, as a stand-alone software package, partly on the user's computer and partly on a remote computer or entirely on the remote computer or server. In the case of a remote computer, the remote computer may be connected to the user's computer through any kind of network, including a Local Area Network (LAN) or a Wide Area Network (WAN), or may be connected to an external computer (for example, through the Internet using an Internet service provider).
It will be appreciated by those of ordinary skill in the art that the modules or steps of the invention described above may be implemented in a general purpose computing device, they may be centralized on a single computing device, or distributed over a network of computing devices, or they may alternatively be implemented in program code executable by a computer device, such that they are stored in a memory device and executed by the computing device, or they may be separately fabricated as individual integrated circuit modules, or multiple modules or steps within them may be fabricated as a single integrated circuit module. Thus, the present invention is not limited to any specific combination of hardware and software.
Note that the above is only a preferred embodiment of the present invention and the technical principle applied. It will be understood by those skilled in the art that the present invention is not limited to the particular embodiments described herein, but is capable of various obvious changes, rearrangements and substitutions as will now become apparent to those skilled in the art without departing from the scope of the invention. Therefore, while the invention has been described in connection with the above embodiments, the invention is not limited to the embodiments, but may be embodied in many other equivalent forms without departing from the spirit or scope of the invention, which is set forth in the following claims.
Claims (10)
1. A method for testing chip voltage, the method comprising:
acquiring a voltage threshold initial value of a chip to be tested; the voltage threshold initial value comprises a voltage upper limit initial value and a voltage lower limit initial value;
determining an intermediate voltage value according to the initial value of the voltage threshold, and taking the intermediate voltage value as the current working voltage of the chip to be tested to determine the switching condition of the working state of the chip to be tested under the current working voltage;
adjusting the initial value of the voltage threshold according to the switching condition to obtain the current value of the voltage threshold;
and under the condition that the current magnitude relation of the current value of the voltage threshold meets the preset magnitude relation, performing voltage test on the chip to be tested according to the voltage threshold standard value of the chip to be tested.
2. The method of claim 1, wherein adjusting the initial value of the voltage threshold to obtain the current value of the voltage threshold according to the handover situation comprises:
when the switching condition is that switching occurs, the intermediate voltage value is utilized to adjust the initial value of the lower voltage limit, and the current value of the lower voltage limit is obtained;
under the condition that the current magnitude relation of the current value of the voltage threshold meets the preset magnitude relation, performing voltage test on the chip to be tested according to the voltage threshold standard value of the chip to be tested, wherein the voltage test comprises the following steps:
acquiring the current value of the upper voltage limit of the chip to be tested;
if the first difference value between the current voltage upper limit value and the current voltage lower limit value is smaller than or equal to a preset voltage difference threshold value, taking the sum of the current voltage upper limit value and the preset voltage difference threshold value in the current voltage threshold standard value as the current working voltage of the chip to be tested, wherein the current voltage upper limit value is the initial voltage upper limit value; if the working state of the chip to be tested is switched under the current working voltage, the threshold voltage of the chip to be tested is not determined and the voltage test is finished.
3. The method as recited in claim 2, further comprising:
if the first difference value is smaller than or equal to the preset voltage difference threshold value and the current voltage upper limit value is different from the initial voltage upper limit value, the intermediate voltage value is determined to be the threshold voltage of the chip to be tested and the voltage test is finished.
4. The method as recited in claim 2, further comprising:
and under the condition that the first difference value is larger than the preset voltage difference threshold value, determining a new intermediate voltage value according to the current voltage upper limit value and the current voltage lower limit value, and returning to the operation of taking the intermediate voltage value as the current working voltage of the chip to be tested so as to determine the switching condition of the working state of the chip to be tested under the current working voltage.
5. The method of claim 1, wherein adjusting the initial voltage threshold value according to the handover situation, to obtain an adjusted initial voltage threshold value, comprises:
when the switching condition is that switching does not occur, the voltage upper limit initial value is adjusted by utilizing a second difference value between the intermediate voltage value and a preset voltage difference threshold value, so as to obtain a voltage upper limit current value;
under the condition that the current magnitude relation of the current value of the voltage threshold meets the preset magnitude relation, performing voltage test on the chip to be tested according to the voltage threshold standard value of the chip to be tested, wherein the voltage test comprises the following steps:
acquiring the current value of the lower voltage limit of the chip to be tested;
under the condition that the current value of the upper voltage limit is smaller than or equal to the current value of the lower voltage limit, if the threshold voltage of the chip to be tested is zero, taking the lower voltage limit standard value in the voltage threshold standard values as the current working voltage of the chip to be tested; if the working state of the chip to be tested is not switched under the current working voltage, the threshold voltage of the chip to be tested is not determined, and the voltage test is finished.
6. The method as recited in claim 5, further comprising:
if the threshold voltage of the chip to be tested is not zero or the working state of the chip to be tested is switched under the current working voltage, determining the threshold voltage of the chip to be tested and ending the voltage test.
7. The method as recited in claim 5, further comprising:
and under the condition that the current voltage upper limit value is larger than the current voltage lower limit value, determining a new intermediate voltage value according to the current voltage upper limit value and the current voltage lower limit value, and returning to the operation of taking the intermediate voltage value as the current working voltage of the chip to be tested so as to determine the switching condition of the working state of the chip to be tested under the current working voltage.
8. A chip voltage testing apparatus, comprising:
the voltage threshold initial value acquisition module is used for acquiring the voltage threshold initial value of the chip to be tested; the voltage threshold initial value comprises a voltage upper limit initial value and a voltage lower limit initial value;
the switching condition determining module is used for determining an intermediate voltage value according to the initial value of the voltage threshold, and taking the intermediate voltage value as the current working voltage of the chip to be tested to determine the switching condition of the working state of the chip to be tested under the current working voltage;
the voltage threshold current value acquisition module is used for adjusting the voltage threshold initial value according to the switching condition to obtain a voltage threshold current value;
and the voltage testing module is used for carrying out voltage testing on the chip to be tested according to the voltage threshold standard value of the chip to be tested under the condition that the current magnitude relation of the current value of the voltage threshold meets the preset magnitude relation.
9. An electronic device, the electronic device comprising:
one or more processors;
a memory for storing one or more programs;
when executed by the one or more processors, causes the one or more processors to implement the chip voltage test method of any of claims 1-7.
10. A computer readable storage medium having stored thereon a computer program, which when executed by a processor implements the chip voltage testing method according to any of claims 1-7.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202311719878.6A CN117723815A (en) | 2023-12-13 | 2023-12-13 | Chip voltage testing method, device, equipment and storage medium |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202311719878.6A CN117723815A (en) | 2023-12-13 | 2023-12-13 | Chip voltage testing method, device, equipment and storage medium |
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| Publication Number | Publication Date |
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| CN117723815A true CN117723815A (en) | 2024-03-19 |
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| CN202311719878.6A Pending CN117723815A (en) | 2023-12-13 | 2023-12-13 | Chip voltage testing method, device, equipment and storage medium |
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| Country | Link |
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| CN (1) | CN117723815A (en) |
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- 2023-12-13 CN CN202311719878.6A patent/CN117723815A/en active Pending
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