CN117704980A - Material coating thickness detection system and method capable of performing optical filter switching - Google Patents
Material coating thickness detection system and method capable of performing optical filter switching Download PDFInfo
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Abstract
The invention discloses a material coating thickness detection system and a method capable of performing optical filter switching, wherein the material coating thickness detection system capable of performing optical filter switching comprises the following components: a full spectrum light source; the switching unit is used for switching the optical filter to a target wavelength, outputting a light source with the target wavelength in the full-spectrum light source, and irradiating a material to be detected through the light source with the target wavelength; the material to be detected is used for receiving the light source with the target wavelength and transmitting the penetrating light source generated when the light source with the target wavelength penetrates through the material to the light sensor; the light sensor is used for receiving the penetrating light source and converting the penetrating light source into an optical signal to be transmitted to the MCU; and the MCU is used for receiving the optical signals and outputting the thickness of the material to be detected according to the optical signals, and the optical filter is switched by the switching unit, so that the accuracy of the detection result of the thickness of the material coating is improved, and the detection cost is reduced.
Description
Technical Field
The present disclosure relates to the field of material detection, and more particularly, to a system and method for detecting thickness of a material coating capable of performing optical filter switching.
Background
In the material detection process, the thickness of the material coating is an important detection parameter, so that accurate and efficient detection of the thickness of the material coating is a main research direction of a person skilled in the art.
In the prior art, the detection of the thickness of the material coating is mainly performed by a near infrared coating thickness monitor, as shown in fig. 1, which is a schematic structural diagram of the detection of the thickness of the material coating by the near infrared coating thickness monitor in the prior art, wherein two light sources with different wavelengths and two optical signal acquisition sensors with corresponding wavelengths are adopted. Due to the obstruction of the light path design and the compact light path irradiation, the position of the irradiated material still has deviation in the actual use process, so that the error of the reflected signal is increased, and the linearity of the numerical value is reduced after the processing in the algorithm. Meanwhile, the energy consumption of the two light sources is quite large, and the temperature-reducing and heat-radiating material coating thickness detection system is required to be additionally arranged in the monitor, so that the appearance of the machine is large, and the installation and the use are extremely inconvenient.
Therefore, the material coating thickness detection system capable of performing optical filter switching is provided, the optical filter can be switched, and detection errors and cost are reduced, so that the technical problem to be solved at present is solved.
Disclosure of Invention
The invention provides a material coating thickness detection system capable of performing optical filter switching, which is used for solving the technical problems of larger error and high use cost when a near infrared coating thickness monitor detects the thickness of a material coating in the prior art, and comprises the following components:
a full spectrum light source;
the switching unit is used for switching the optical filter to a target wavelength, outputting a light source with the target wavelength in the full-spectrum light source, and irradiating a material to be detected through the light source with the target wavelength;
the material to be detected is used for receiving the light source with the target wavelength and transmitting the penetrating light source generated when the light source with the target wavelength penetrates through the material to the light sensor; the light sensor is used for receiving the penetrating light source and converting the penetrating light source into an optical signal to be transmitted to the MCU;
and the MCU is used for receiving the optical signal and outputting the thickness of the material to be detected according to the optical signal.
In some embodiments of the present application, the full spectrum light source, the switching unit, the material to be detected, the light sensor, and the MCU are sequentially connected.
In some embodiments of the present application, the switching unit includes a motor and a rotating wheel, a plurality of optical filters are additionally installed on the rotating wheel, the rotating wheel is arranged at the top end of the motor, and the motor is used for driving the rotating wheel to rotate so as to switch the optical filters.
In some embodiments of the present application, an optical coupler is further disposed on the rotating wheel, and the MCU is further directly connected to the rotating wheel and collects optical coupler signals.
In some embodiments of the present application, the MCU is specifically configured to:
receiving the optical coupling signal and determining the current target wavelength based on the optical coupling signal;
and determining the coating thickness of the material to be detected based on the target wavelength and the optical signal.
In some embodiments of the present application, the MCU is further connected to an output device through a digital port or an analog port, and the MCU outputs the coating thickness of the material to be detected to the output device in a digital or analog form, and displays the coating thickness to a user through the output device.
In some embodiments of the present application, the digital port is specifically RS485 or RS232, and the analog quantity is specifically a voltage value or a current value.
In some embodiments of the present application, the light sensor is a sensor that includes all wavelengths of the optical signal.
In some embodiments of the present application, an amplifying unit is further disposed between the optical sensor and the MCU, and is configured to amplify an optical signal sent by the optical sensor and then send the amplified optical signal to the MCU.
Correspondingly, the invention also provides a method for detecting the thickness of the material coating capable of carrying out optical filter switching, which is applied to the system for detecting the thickness of the material coating capable of carrying out optical filter switching, and comprises the following steps:
switching the optical filter to an optical filter of a target wavelength by a motor in a switching unit;
filtering out other light sources except the target wavelength in the full spectrum light source through the optical filter of the target wavelength, and irradiating the light source of the target wavelength to a material to be detected;
transmitting a penetrating light source generated by penetrating the material to be detected to a light sensor, converting the penetrating light source into a light signal, amplifying the light signal and outputting the light signal to an MCU;
and acquiring an optical coupling signal in the switching unit through the MCU, determining the coating thickness of the material to be detected through the optical coupling signal and the optical signal, and outputting the coating thickness through an output port.
By applying the technical scheme, the material coating thickness detection system comprises: a full spectrum light source; the switching unit is used for switching the optical filter to a target wavelength, outputting a light source with the target wavelength in the full-spectrum light source, and irradiating a material to be detected through the light source with the target wavelength; the material to be detected is used for receiving the light source with the target wavelength and transmitting the penetrating light source generated when the light source with the target wavelength penetrates through the material to the light sensor; the light sensor is used for receiving the penetrating light source and converting the penetrating light source into an optical signal to be transmitted to the MCU; and the MCU is used for receiving the optical signals and outputting the thickness of the material to be detected according to the optical signals, and the optical filter is switched by the switching unit, so that the accuracy of the detection result of the thickness of the material coating is improved, and the detection cost is reduced.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings that are needed in the description of the embodiments will be briefly introduced below, it being obvious that the drawings in the following description are only some embodiments of the present application, and that other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
FIG. 1 shows a schematic flow chart of a prior art material coating thickness test;
fig. 2 is a schematic structural diagram of a system for detecting thickness of a material coating layer capable of performing optical filter switching according to an embodiment of the present invention;
fig. 3 is a schematic flow chart of a method for detecting thickness of a material coating capable of performing optical filter switching according to an embodiment of the present invention;
wherein, MCU mentioned in the figure specifically refers to micro control unit.
Detailed Description
The following description of the embodiments of the present application will be made clearly and fully with reference to the accompanying drawings, in which it is evident that the embodiments described are only some, but not all, of the embodiments of the present application. All other embodiments, which can be made by one of ordinary skill in the art without undue burden from the present disclosure, are within the scope of the present disclosure.
The embodiment of the application provides a material coating thickness detection system capable of performing optical filter switching, as shown in fig. 2, the material coating thickness detection system includes:
a full spectrum light source;
the switching unit is used for switching the optical filter to a target wavelength, outputting a light source with the target wavelength in the full-spectrum light source, and irradiating a material to be detected through the light source with the target wavelength;
the material to be detected is used for receiving the light source with the target wavelength and transmitting the penetrating light source generated when the light source with the target wavelength penetrates through the material to the light sensor; the light sensor is used for receiving the penetrating light source and converting the penetrating light source into an optical signal to be transmitted to the MCU;
and the MCU is used for receiving the optical signal and outputting the thickness of the material to be detected according to the optical signal.
In this embodiment, unlike the prior art that needs to use a light source with multiple target wavelengths, in this embodiment, a full spectrum light source is used, so that light sources with all the wavelengths can be provided, when the full spectrum light source passes through the optical filter with the target wavelength, light sources with other wavelengths than the target wavelength can be filtered, and by combining a full spectrum light source with the switching unit, light sources with multiple target wavelengths can be provided, so that the number of light sources is reduced, energy consumption is reduced, and temperature rise is reduced.
In this embodiment, the light source of the target wavelength output by the switching unit passes through the material to be detected, generates a penetrating light source and is received by the light sensor, and at this time, the light sensor generates an optical signal according to the penetrating light source and transmits the optical signal to the MCU, and the MCU determines the thickness of the coating of the material to be detected through the analysis processing of the optical signal and outputs the thickness of the coating.
In order to realize detection of the thickness of the material coating, in some embodiments of the present application, the full spectrum light source, the switching unit, the material to be detected, the light sensor and the MCU are sequentially connected.
It should be noted that, the sequential connection described in this embodiment should be understood as a physical connection or a limitation on a position thereof, for example, a transmission line or a structural connection in a practical sense may not exist among the full spectrum light source, the switching unit and the material to be detected, but rather, it indicates that the switching unit is located between the full spectrum light source and the material to be detected, and a physical connection may exist between the light sensor and the MCU, that is, an optical signal is transmitted to the MCU through the data transmission line, so that the sequential connection in this scheme refers to a more important positional relationship among the module devices, so as to ensure normal performance of the material coating thickness detection process.
In order to realize the switching of the optical filters, in some embodiments of the present application, the switching unit includes a motor and a rotating wheel, a plurality of optical filters are additionally installed on the rotating wheel, the rotating wheel is disposed at the top end of the motor, and the motor is used for driving the rotating wheel to rotate so as to switch the optical filters.
In the embodiment, a full spectrum light source is adopted, a plurality of optical filters are additionally arranged at the top end of the motor, and the optical filters are switched on a single light path through uniform rotation of the motor, so that the effect of switching light sources with different wavelengths is achieved.
In order to determine the thickness of the material coating, in some embodiments of the present application, an optical coupler is further disposed on the rotating wheel, and the MCU is further directly connected to the rotating wheel and collects an optical coupler signal.
In this embodiment, in order to determine the thickness of the coating, the MCU needs to receive the optical signal sent by the optical sensor, and further needs a specific wavelength value of the target wavelength of the current optical filter, so the switching unit is directly connected to the MCU, further, the rotating wheel in the switching unit is provided with an optocoupler, and the MCU can determine the wavelength value of the target wavelength by collecting the optocoupler signal.
In order to obtain the coating thickness of the material to be detected, in some embodiments of the present application, the MCU is specifically configured to:
receiving the optical coupling signal and determining the current target wavelength based on the optical coupling signal;
and determining the coating thickness of the material to be detected based on the target wavelength and the optical signal.
In this embodiment, the MCU performs algorithm processing on the optical signal values of different wavelengths, and calculates the coating thickness of the detected material.
In order to improve user experience, in some embodiments of the present application, the MCU is further connected to an output device through a digital port or an analog port, and the MCU outputs the coating thickness of the material to be detected to the output device in a digital or analog form, and displays the coating thickness to a user through the output device.
To achieve output of the coating thickness, in some embodiments of the present application, the digital quantity port is embodied as RS485 or RS232, and the analog quantity is embodied as a voltage value or a current value.
In order to reduce the cost, in some embodiments of the present application, the digital port is specifically RS485 or RS232, and the analog quantity is specifically a voltage value or a current value.
In this embodiment, compared with the prior art, only one full spectrum light source is needed in the present solution, and only one light sensor containing all wavelengths is needed, so that compared with the prior art, the algorithm requirement can be met by only one light sensor, and the cost and the fabrication cost of the monitor are greatly reduced.
In order to improve detection accuracy and reduce errors, in some embodiments of the present application, an amplifying unit is further disposed between the optical sensor and the MCU, and is configured to amplify an optical signal sent by the optical sensor and then send the amplified optical signal to the MCU.
In this embodiment, an amplifying unit is disposed between the light sensor and the MCU, and the amplifying unit may be an amplifier or other amplifying element for further amplifying the optical signal.
By applying the technical scheme, the material coating thickness detection system comprises: a full spectrum light source; the switching unit is used for switching the optical filter to a target wavelength, outputting a light source with the target wavelength in the full-spectrum light source, and irradiating a material to be detected through the light source with the target wavelength; the material to be detected is used for receiving the light source with the target wavelength and transmitting the penetrating light source generated when the light source with the target wavelength penetrates through the material to the light sensor; the light sensor is used for receiving the penetrating light source and converting the penetrating light source into an optical signal to be transmitted to the MCU; and the MCU is used for receiving the optical signals and outputting the thickness of the material to be detected according to the optical signals, and the optical filter is switched by the switching unit, so that the accuracy of the detection result of the thickness of the material coating is improved, and the detection cost is reduced.
Correspondingly, the invention also provides a method for detecting the thickness of the material coating capable of carrying out optical filter switching, which is applied to the system for detecting the thickness of the material coating capable of carrying out optical filter switching, as shown in fig. 3, and comprises the following steps:
s101, the filter is switched to the filter of the target wavelength by the motor in the switching unit.
S102, filtering out other light sources except the target wavelength in the full-spectrum light source through the optical filter with the target wavelength, and irradiating the light source with the target wavelength onto a material to be detected.
S103, transmitting the penetrating light source generated by the material to be detected to the light sensor, converting the penetrating light source into an optical signal, amplifying the optical signal and outputting the optical signal to the MCU.
S104, acquiring an optical coupling signal in the switching unit through the MCU, determining the coating thickness of the material to be detected through the optical coupling signal and the optical signal, and outputting the coating thickness through an output port.
In summary, compared with the prior art, the scheme has the following beneficial effects:
1. by adopting the technical scheme, the original light sources with various target wavelengths and the optical signal sensors with corresponding wavelengths can be saved to a cheaper full-spectrum light source and an optical sensor, the manufacturing cost of the monitor is greatly reduced, and the actual algorithm effect is not affected.
2. The single light source can ensure that the emitted light signals have consistent intensity and consistent position, so that in the algorithm calculation process, the light signals with different wavelengths have the same reference, the algorithm calculation is more accurate, and the linearity of the obtained higher-order function is better.
3. The reduction light source can reduce the energy consumption of monitor by a wide margin, reduces the inside temperature rise of detector simultaneously to can save the radiating part in order to practice thrift the space in the designing process, can effectively reduce monitor volume, more convenient on-the-spot use and installation.
Furthermore, the terms "first," "second," and the like, are used for descriptive purposes only and are not to be construed as indicating or implying a relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defining "a first" or "a second" may explicitly or implicitly include one or more such feature, and in the description of the invention, "a plurality" means two or more, unless otherwise specifically and clearly defined.
In the present invention, unless explicitly specified and limited otherwise, the terms "access", "connected", and the like are to be construed broadly, and may be, for example, fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; can be directly connected or indirectly connected through an intermediate medium, and can be communication between two elements. The specific meaning of the above terms in the present invention can be understood by those of ordinary skill in the art according to the specific circumstances.
In the description of the present specification, a description referring to terms "one embodiment," "some embodiments," "examples," "specific examples," or "some examples," etc., means that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the present invention. In this specification, schematic representations of the above terms do not necessarily refer to the same embodiments or examples. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples.
Although embodiments of the present invention have been shown and described above, it will be understood that the above embodiments are illustrative and not to be construed as limiting the invention, and that variations, modifications, alternatives, and variations may be made in the above embodiments by those skilled in the art without departing from the spirit and principles of the invention.
Claims (10)
1. A material coating thickness detection system capable of performing optical filter switching, the material coating thickness detection system comprising:
a full spectrum light source;
the switching unit is used for switching the optical filter to a target wavelength, outputting a light source with the target wavelength in the full-spectrum light source, and irradiating a material to be detected through the light source with the target wavelength;
the material to be detected is used for receiving the light source with the target wavelength and transmitting the penetrating light source generated when the light source with the target wavelength penetrates through the material to the light sensor; the light sensor is used for receiving the penetrating light source and converting the penetrating light source into an optical signal to be transmitted to the MCU;
and the MCU is used for receiving the optical signal and outputting the thickness of the material to be detected according to the optical signal.
2. The material coating thickness detection system according to claim 1, wherein the full spectrum light source, the switching unit, the material to be detected, the light sensor, and the MCU are sequentially connected.
3. The material coating thickness detection system according to claim 1, wherein the switching unit comprises a motor and a rotating wheel, a plurality of optical filters are additionally arranged on the rotating wheel, the rotating wheel is arranged at the top end of the motor, and the motor is used for driving the rotating wheel to rotate so as to switch the optical filters.
4. The material coating thickness detection system according to claim 3, wherein an optocoupler is further disposed on the rotating wheel, and the MCU is further directly connected to the rotating wheel and collects optocoupler signals.
5. The material coating thickness detection system of claim 4, wherein the MCU is specifically configured to:
receiving the optical coupling signal and determining the current target wavelength based on the optical coupling signal;
and determining the coating thickness of the material to be detected based on the target wavelength and the optical signal.
6. The material coating thickness detection system according to claim 1, wherein the MCU is further connected to an output device through a digital or analog port, and the MCU outputs the coating thickness of the material to be detected to the output device in the form of a digital or analog quantity and displays the coating thickness to a user through the output device.
7. The material coating thickness detection system according to claim 6, wherein the digital quantity port is embodied as RS485 or RS232, and the analog quantity is embodied as a voltage value or a current value.
8. The material coating thickness detection system of claim 1, wherein the light sensor is a sensor that includes all wavelengths of the optical signal.
9. The material coating thickness detection system according to claim 1, wherein an amplifying unit is further disposed between the light sensor and the MCU, and is configured to amplify an optical signal sent by the light sensor and then send the amplified optical signal to the MCU.
10. A method for detecting thickness of a material coating capable of performing optical filter switching, wherein the method is applied to a system for detecting thickness of a material coating capable of performing optical filter switching according to any one of claims 1 to 9, and the method comprises:
switching the optical filter to an optical filter of a target wavelength by a motor in a switching unit;
filtering out other light sources except the target wavelength in the full spectrum light source through the optical filter of the target wavelength, and irradiating the light source of the target wavelength to a material to be detected;
transmitting a penetrating light source generated by penetrating the material to be detected to a light sensor, converting the penetrating light source into a light signal, amplifying the light signal and outputting the light signal to an MCU;
and acquiring an optical coupling signal in the switching unit through the MCU, determining the coating thickness of the material to be detected through the optical coupling signal and the optical signal, and outputting the coating thickness through an output port.
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| CN214374283U (en) * | 2020-12-31 | 2021-10-08 | 四川高达科技有限公司 | Thin film material detection device |
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|---|---|---|---|---|
| CN1128346A (en) * | 1994-11-16 | 1996-08-07 | 大宇电子株式会社 | Apparatus for measuring a coating thickness |
| CN1405551A (en) * | 2002-08-07 | 2003-03-26 | 马军 | Laser light-emitting sensor |
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