CN117608935A - Circuit for detecting assembly problem of plug-in unit and server - Google Patents
Circuit for detecting assembly problem of plug-in unit and server Download PDFInfo
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- CN117608935A CN117608935A CN202311368772.6A CN202311368772A CN117608935A CN 117608935 A CN117608935 A CN 117608935A CN 202311368772 A CN202311368772 A CN 202311368772A CN 117608935 A CN117608935 A CN 117608935A
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- 238000001514 detection method Methods 0.000 claims abstract description 33
- 230000015654 memory Effects 0.000 claims description 80
- 230000002159 abnormal effect Effects 0.000 claims description 30
- 238000013507 mapping Methods 0.000 claims description 21
- 210000001503 joint Anatomy 0.000 claims description 6
- 230000005856 abnormality Effects 0.000 description 27
- 238000000034 method Methods 0.000 description 14
- 230000008569 process Effects 0.000 description 8
- 238000010586 diagram Methods 0.000 description 7
- 230000006854 communication Effects 0.000 description 6
- 238000004891 communication Methods 0.000 description 5
- 238000003780 insertion Methods 0.000 description 4
- 230000037431 insertion Effects 0.000 description 4
- 230000008878 coupling Effects 0.000 description 3
- 238000010168 coupling process Methods 0.000 description 3
- 238000005859 coupling reaction Methods 0.000 description 3
- 230000005540 biological transmission Effects 0.000 description 2
- 238000001914 filtration Methods 0.000 description 2
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- 238000013461 design Methods 0.000 description 1
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- 238000012545 processing Methods 0.000 description 1
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/66—Testing of connections, e.g. of plugs or non-disconnectable joints
- G01R31/68—Testing of releasable connections, e.g. of terminals mounted on a printed circuit board
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2273—Test methods
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/30—Monitoring
- G06F11/32—Monitoring with visual or acoustical indication of the functioning of the machine
- G06F11/324—Display of status information
- G06F11/325—Display of status information by lamps or LED's
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/12—Analogue/digital converters
- H03M1/124—Sampling or signal conditioning arrangements specially adapted for A/D converters
- H03M1/1245—Details of sampling arrangements or methods
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- Details Of Connecting Devices For Male And Female Coupling (AREA)
Abstract
The invention relates to a circuit and a server for detecting assembly problems of plug-ins, and relates to the technical field of assembly detection of plug-ins. The invention comprises the following steps: set up the detection pad in the plug-in components buckle department of slot, detect the pad and include: two contacts of the connecting part of the connecting buckle are connected, one contact is grounded, the other contact is connected with a pull-up resistor Rup through a resistor Rx, the pull-up resistor Rup is connected with a power supply VDD, and the resistance values of the resistors Rx connected with different contacts are different; the plug-in unit buckles the buckling connection part when the plug-in unit is completely plugged in, so that the contact is conducted; the non-power supply VDD terminal of the pull-up resistor Rup is electrically connected to an analysis circuit for determining the snap-in connection state of the plug-in unit. According to the invention, the resistances of the resistors Rx connected with different contacts are different, and the equivalent resistances formed by connecting different resistors Rx and any resistor Rx in parallel are different, so that when the connection conditions of the resistors Rx are different, the voltages of the non-power supply VDD end of the pull-up resistor Rup are different, and the analysis circuit is supported to position the assembly problem, so that the detection of the assembly problem is realized.
Description
Technical Field
The present invention relates to the field of package assembly detection technologies, and in particular, to a circuit and a server for detecting package assembly problems.
Background
The server board card is provided with a plurality of slots for connecting the expansion elements, such as a memory slot and a PCIE slot. The socket is typically configured with a bit detection circuit to detect whether it is in place, however, the existing bit detection circuit will indicate that the card is in place if the circuit is on. The insert is in place and does not reflect whether the insertion of the insert is complete. Such as: the memory card is inserted in the memory slot, so that under the condition that the in-place detection circuit sends out an in-place signal, if the memory card is incompletely inserted, pin contact between the memory card and the memory slot is incomplete, the electrical property of a circuit is unstable, shake is easy to generate in communication, the error rate in the communication process is increased, server faults are caused, and the hidden danger of the server caused by incomplete insertion is generally not easy to find in short test, so that a circuit for detecting the assembly problem of the plug-in connector is needed in the connection process for detecting whether the insertion is complete in real time.
Disclosure of Invention
In order to solve the above technical problems or at least partially solve the above technical problems, the present invention provides a circuit and a server for detecting a package assembly problem.
In a first aspect, the present invention provides a circuit for detecting a package assembly problem, comprising: the detection pad that sets up in plug-in components buckle department, the detection pad includes: two contacts connected with the buckle connecting part, wherein one contact is grounded, the other contact is connected with a pull-up resistor Rup through a resistor Rx, the pull-up resistor Rup is connected with a power supply VDD, the resistance values of the resistors Rx connected with different contacts are different, and the resistance values of equivalent resistors formed by connecting different resistors Rx and any resistor Rx in parallel are different; the plug-in buckle is in butt joint with the buckle connecting part when the plug-in is completely inserted, so that the contact is conducted;
the non-power supply VDD end of the pull-up resistor Rup is electrically connected with an analysis circuit for determining the snap-in connection state of the plug-in unit.
Furthermore, when any type of plug-in is configured with two plug-in buckles, the resistor Rx corresponding to the plug-in buckle on the same side of the plug-in is connected to the same pull-up resistor Rup.
Still further, the analysis circuit includes: the input end of the comparator is electrically connected with one end of the pull-up resistor Rup, the other input end of the comparator is electrically connected with an adjustable reference circuit, the output end of the comparator is connected with an indicator lamp, the reference circuit is provided with a reference mark corresponding to the voltage of the pull-up resistor Rup at the end of the pull-up resistor Rup, and the reference mark is used for indicating the plug-in card buckle with abnormal connection.
The adjustable reference circuit includes: the voltage dividing resistor Ra of the power supply VDD is connected, the voltage dividing resistor Ra is consistent with the specification of the pull-up resistor Rup, the voltage dividing resistor Ra is connected with the potentiometer Rb in series, the potentiometer Rb is grounded, the other input end of the comparator is connected between the voltage dividing resistor Ra and the potentiometer Rb, the potentiometer Rb is provided with a reference mark corresponding to the voltage of the non-power supply VDD end of the pull-up resistor Rup under different abnormal conditions, and the reference mark is used for indicating the card buckle of the abnormal connection.
Still further, the adjustable reference circuit includes: the voltage dividing resistor Ra of the power supply VDD is connected, the voltage dividing resistor Ra is consistent with the specification of the pull-up resistor Rup, the voltage dividing resistor Ra is connected with the selector, the control end of the selector is electrically connected with the controller, the selector is electrically connected with a plurality of fixed value resistors which are respectively connected with the voltage dividing resistor Ra in series, the fixed value resistors connected with the selector are grounded, the voltage division of different fixed value resistors corresponds to the voltage of the voltage dividing resistor Rup at the non-power supply VDD end under different abnormal conditions, the other input end of the comparator is connected with the voltage dividing resistor Ra at the non-power supply VDD end, the controller is electrically connected with the passage indicator lamp, and the passage indicator lamp is provided with a reference mark.
Still further, the analysis circuit includes: the analog-to-digital converters are connected to the non-power supply VDD end of the voltage dividing resistor Rup, and are electrically connected with the controller, and the controller is electrically connected with an indication circuit, wherein the indication circuit comprises, but is not limited to, a plug-in state indicator lamp or/and a plug-in state display.
Still further, the power supply VDD is electrically connected with a voltage detection circuit, the voltage detection circuit is electrically connected with a controller, the voltage detection circuit is used for detecting that the power supply VDD voltage reaches a set value, the controller is electrically connected with a voltage indicator lamp, and when the power supply VDD voltage reaches the set value, the controller controls the voltage indicator lamp to work.
Furthermore, the controller configures a first mapping table of a mapping relation between the recording voltage and the plugging state indicator lamp according to the memory connected with the controller or/and configures a second mapping table of a mapping relation between the recording voltage and the plugging state indicator lamp according to the first mapping table and the voltage-dividing resistor Rup non-power supply VDD terminal voltage, and the controller controls the plugging state indicator according to the second mapping table and the voltage-dividing resistor Rup non-power supply VDD terminal voltage.
Still further, the total loop in which the pull-up resistor Rup is located is electrically connected to a current sensor, the current sensor is electrically connected to analog-to-digital converters, each analog-to-digital converter is electrically connected to a controller, the controller is electrically connected to an indication circuit, and the knowledge circuit includes, but is not limited to, a plug-in status indicator lamp or/and a plug-in status display.
Furthermore, an integral-differential modulation high-precision analog-to-digital converter is used for constructing an analysis circuit of the application, anti-aliasing filtering is carried out on the input of the analog-to-digital converter, and digital filtering is carried out on the output of the digital-to-analog converter; the integral-differential modulation high-precision analog-to-digital converter comprises a differential, an integrator, a comparator and a modulator, wherein the modulator is connected with the output of the comparator and outputs the output to the differential to form feedback. The modulator operates at a rate greater than the input signal bandwidth to provide oversampling; the input and the feedback signal are subjected to differential comparison, and the differential output generated by the comparison is fed back into the integrator; the output of the integrator is then fed into a comparator, the output of which simultaneously conveys a feedback signal to the differential, and the output is fed into a digital filter.
In a second aspect, the present invention provides a server, the server including a socket for connecting a card, the socket being provided with the circuit for detecting a card assembly problem.
Compared with the prior art, the technical scheme provided by the embodiment of the invention has the following advantages:
according to the invention, a circuit for detecting whether the plug-in is completely inserted or not in assembly is formed by matching the pull-up resistor Rup, the resistor Rx, the detection bonding pad, the plug-in buckle and the buckle connecting part, wherein the resistor Rx connected with different contacts has different resistance values, the equivalent resistor formed by connecting different resistors Rx and any resistor Rx in parallel has different resistance values, so that when the connection condition of the resistor Rx is different, the voltage of the pull-up resistor Rup non-power supply VDD terminal is different, and the positioning of the assembly problem is supported.
The analysis circuit applying the comparator, the indicator lamp and the adjustable reference circuit adjusts the adjustable reference circuit under the guidance of the state of the indicator lamp to check the connection state of the plug-in unit, and has the advantages of simple circuit structure, low cost and small occupied space.
According to the method, the device and the system, the analysis circuit of the analog-to-digital converter and the controller or the analysis circuit of the current sensor and the controller is used, the plug-in connection state is directly determined based on the electric signal without operation, the indication is carried out through the indication circuit, the communication with the server baseboard management controller is more visual, and the in-band out-of-band transmission of the plug-in connection state is realized.
Drawings
The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the invention and together with the description, serve to explain the principles of the invention.
In order to more clearly illustrate the embodiments of the invention or the technical solutions of the prior art, the drawings which are used in the description of the embodiments or the prior art will be briefly described, and it will be obvious to a person skilled in the art that other drawings can be obtained from these drawings without inventive effort.
FIG. 1 is a schematic diagram of a circuit for detecting assembly problems of a card according to an embodiment of the present invention;
FIG. 2 is a schematic diagram of a memory socket and an end plug-in buckle;
FIG. 3 is a schematic diagram of an analysis circuit using a comparator and a potentiometer according to an embodiment of the present invention;
FIG. 4 is a schematic diagram of an analysis circuit employing a comparator, a selector and a constant value resistor according to an embodiment of the present invention;
FIG. 5 is a schematic diagram of an analysis circuit using an analog-to-digital converter and a controller according to an embodiment of the present invention;
FIG. 6 is a schematic diagram of an analog-to-digital converter according to an embodiment of the present invention;
fig. 7 is a schematic diagram of a current sensor according to an embodiment of the present invention.
Detailed Description
For the purpose of making the objects, technical solutions and advantages of the embodiments of the present invention more apparent, the technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention, and it is apparent that the described embodiments are some embodiments of the present invention, but not all embodiments of the present invention. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
It should be noted that, in this document, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising one … …" does not exclude the presence of other like elements in a process, method, article, or apparatus that comprises the element.
Example 1
Referring to fig. 1, a circuit for detecting a package assembly problem according to an embodiment of the present invention includes: the detection pad that sets up in plug-in components buckle department, the detection pad includes: two contacts of the connecting part of the connecting buckle are connected, one contact is grounded, the other contact is connected with a pull-up resistor Rup through a resistor Rx, the pull-up resistor Rup is connected with a power supply VDD, and the resistance values of the pull-up resistor Rup and the resistor Rx connected with the contacts are different; the plug-in buckle is in butt joint with the buckle connecting part when the plug-in is completely inserted, so that the contact is conducted; the non-power supply VDD end of the pull-up resistor Rup is electrically connected with an analysis circuit for determining the snap-in connection state of the plug-in unit.
In the specific implementation process, different circuits for detecting the assembly problem of the plug-in units are arranged for different types of plug-in units, and when any type of plug-in units are provided with two plug-in unit buckles, the resistor Rx corresponding to the plug-in unit buckle on the same side of the plug-in unit is connected to the same pull-up resistor Rup. Taking a server as an example, the server generally configures a plurality of processor cores, and each of the internal processor cores needs to be connected with a plurality of memory cards, and the memory cards are inserted into the internal memory slots. Referring to fig. 2, the plug-in buckles are arranged at two ends of the memory slot of the server, the detection pad is arranged on the board card where the memory slot is located, the detection pad is connected with a buckle connection part for the butt joint buckle, and the buckle connection part is connected with the detection pad. When the memory card is inserted and is completely abutted with the memory slot, the plug-in buckle is abutted with the buckle connecting part to enable the contact of the detection bonding pad to be conducted, and the resistor Rx is connected with the pull-up resistor Rup in series.
In this embodiment, referring to fig. 3, the analysis circuit includes: the non-power supply VDD end of the pull-up resistor Rup is electrically connected to the non-inverting input end of the comparator, the inverting input end of the comparator is electrically connected with an adjustable reference circuit, the output end of the comparator is connected with an indicator lamp, the reference circuit is provided with a reference mark corresponding to the non-power supply VDD end voltage of the pull-up resistor Rup, and the reference mark is used for indicating a plug-in buckle with abnormal connection. In this embodiment, the adjustable reference circuit includes: the voltage dividing resistor Ra of the power supply VDD is connected in series with the potentiometer Rb, the potentiometer Rb is grounded, the other input end of the comparator is connected between the voltage dividing resistor Ra and the potentiometer Rb, the potentiometer Rb is provided with reference marks corresponding to the non-power supply VDD terminal voltages of the pull-up resistor Rup under different abnormal conditions, and the reference marks are used for indicating plug-in card buckles with abnormal connection. The resistance value of the potentiometer Rb at the reference mark corresponds to the resistance value of the equivalent resistance of the resistor Rx connected under different abnormal conditions.
Taking the example of detecting the memory card assembly problem on four memory slots, three and up-draw power is required to detect the single-side card buckle of four memory slotsThe resistor R1, the resistor R2, the resistor R3 and the resistor R4 connected with the resistor Rup have different resistance values, so that abnormal memory slot positions generated when different memories are abnormal in plug-in connection are supported. In the implementation process, an exemplary resistor Rup takes on 4.7kohm, a power supply VDD takes on 3.3V, a resistor R1 takes on 1kohm, a resistor R2 takes on 2.2kohm, a resistor R3 takes on 3.3kohm, and a resistor R4 takes on 4.7kohm. If the memory is plugged in place: all resistors Rx are connected in, and the equivalent resistor R all =1 Kohm//2.2Kohm//3.3Kohm//4.7 kohm=0.506 Kohm; traversing the connection condition of the resistor Rx and the equivalent resistance of the connected resistor Rx when one memory, two memories, three memories and four memories are connected abnormally in a single-side connection mode. If the memory plug corresponding to the resistor R1 is abnormal, the resistor R1 is not connected, and the resistor R is equivalent to -1 =2.2K// 3.3K//4.7 kohm=1.03 Kohm; if the memory plug corresponding to the resistor R2 is abnormal, the resistor R2 is not connected, and the resistor R is equivalent -2 =1 Kohm//3.3Kohm//4.7 kohm=0.660 Kohm; if the memory plug corresponding to the resistor R3 is abnormal, the resistor R3 is not connected, and the resistor R is equivalent -3 =1 Kohm//2.2Kohm//4.7 kohm=0.600 Kohm; if the memory plug corresponding to the resistor R4 is abnormal, the resistor R4 is not connected, and the resistor R is equivalent -4 =1 Kohm//2.2Kohm//3.3 kohm=0.569 Kohm; if the memory plug corresponding to the resistor R1 and the resistor R2 is abnormal, the resistor R1 and the resistor R2 are not connected, and the equivalent resistor R -12 =3.3 Kohm//4.7 kohm= 1.939Kohm; if the memory plug corresponding to the resistor R1 and the resistor R3 is abnormal, the resistor R1 and the resistor R3 are not connected, and the equivalent resistor R -13 =2.2K// 4.7 kohm=1.499 Kohm; if the memory plug corresponding to the resistor R1 and the resistor R4 is abnormal, the resistor R1 and the resistor R4 are not connected, and the equivalent resistor R -14 =3.3 Kohm//2.2 kohm=1.32 Kohm; if the memory plug corresponding to the resistor R2 and the resistor R3 is abnormal, the resistor R2 and the resistor R3 are not connected, and the resistor R is equivalent -23 =1 Kohm//4.7 kohm=0.825 Kohm; if the memory plug corresponding to the resistor R2 and the resistor R4 is abnormal, the resistor R2 and the resistor R4 are not connected, and the resistor R is equivalent -24 =3.3 Kohm//1 kohm=0.767 Kohm; if the memory plug corresponding to the resistor R3 and the resistor R4 is abnormal, the resistor R3 and the resistor R4 are not connected, and the equivalent resistor R -34 =1 Kohm//2.2 kohm=0.6875 Kohm; if the resistor R1 and R2 and R3 correspond to each otherIf the memory plug is abnormal, the resistor R1, the resistor R2 and the resistor R3 are not connected, and the equivalent resistor R -123 =4.7 Kohm; if the memory plug corresponding to the resistor R1, R2 and R4 is abnormal, the resistor R1, R2 and R4 are not connected, and the equivalent resistor R -124 =3.3 Kohm; if the memory plug corresponding to the resistor R1, R3 and R4 is abnormal, the resistor R1, R3 and R4 are not connected, and the equivalent resistor R -134 =2.2 Kohm; if the memory plug corresponding to the resistor R2 resistor R3 resistor R4 is abnormal, the resistor R2 resistor R3 resistor R4 is not connected, and the equivalent resistor R -234 =1 Kohm. If the memory plug corresponding to the resistor R1, R2, R3 and R4 is abnormal, the resistor R1, R3 and R4 are not connected, and the equivalent resistor R -1234 = ≡kohm. In this example, reference marks are set at 0.569Kohm, 0.600Kohm, 0.660Kohm, 0.6875Kohm, 0.767Kohm, 0.825Kohm, 1Kohm, 1.03Kohm, 1.32Kohm, 1.499Kohm, 1.939Kohm, 2.2Kohm, 3.3Kohm, 4.7Kohm of the potentiometer Rb.
Example 2
Referring to fig. 4, in this embodiment, the analysis circuit includes: the non-power supply VDD end of the pull-up resistor Rup is electrically connected to the non-inverting input end of the comparator, the inverting input end of the comparator is electrically connected with an adjustable reference circuit, the output end of the comparator is connected with an indicator lamp, the reference circuit is provided with a reference mark corresponding to the non-power supply VDD end voltage of the pull-up resistor Rup, and the reference mark is used for indicating a plug-in buckle with abnormal connection. This embodiment differs from embodiment 1 in that the design of the adjustable reference circuit is different, and the adjustable reference circuit includes: the voltage dividing resistor Ra is connected with the power supply VDD, the voltage dividing resistor Ra is connected with the selector, the control end of the selector is electrically connected with the controller, the selector is electrically connected with a plurality of fixed value resistors which are respectively connected with the voltage dividing resistor Ra in series, the fixed value resistors connected with the selector are grounded, the voltage division of different fixed value resistors corresponds to the voltage of the voltage dividing resistor Rup non-power supply VDD end under different abnormal conditions, and the inverting input end of the comparator is connected with the voltage dividing resistor Ra non-power supply VDD end. In a preferred embodiment, to display the fixed resistance to which the selector is connected, the controller is electrically connected to a passage indicator lamp configured with a reference mark. In another embodiment, a passage indicator light is provided between the selector contact and the fixed resistor.
Also, taking the example of detecting the memory card assembly problem on the four memory slots, the selector switch selects the 16-select 1 switch, which comprises 14 constant resistors with the resistance values of 0.569Kohm, 0.600Kohm, 0.660Kohm, 0.6875Kohm, 0.767Kohm, 0.825Kohm, 1Kohm, 1.03Kohm, 1.32Kohm, 1.499Kohm, 1.939Kohm, 2.2Kohm, 3.3Kohm and 4.7Kohm.
Example 3
The circuit for detecting the assembly problem of the plug-in unit provided by the embodiment of the invention comprises the following components: the detection pad that sets up in plug-in components buckle department, the detection pad includes: two contacts of the connecting part of the connecting buckle are connected, one contact is grounded, the other contact is connected with a pull-up resistor Rup through a resistor Rx, the pull-up resistor Rup is connected with a power supply VDD, and the resistance values of the pull-up resistor Rup and the resistor Rx connected with the contacts are different; the plug-in buckle is in butt joint with the buckle connecting part when the plug-in is completely inserted, so that the contact is conducted; the non-power supply VDD end of the pull-up resistor Rup is electrically connected with an analysis circuit for determining the snap-in connection state of the plug-in unit.
Referring to fig. 5, the analysis circuit in this embodiment includes: the analog-to-digital converters are connected to the non-power supply VDD end of the voltage dividing resistor Rup, and are electrically connected with the controller, and the controller is electrically connected with an indication circuit, wherein the indication circuit comprises, but is not limited to, a plug-in state indicator lamp or/and a plug-in state display. Because the voltage of the power supply VDD needs to be guaranteed to be a set value, the power supply VDD is electrically connected with a voltage detection circuit, the voltage detection circuit is electrically connected with a controller, the voltage detection circuit is used for detecting that the voltage of the power supply VDD reaches the set value, the controller is electrically connected with a voltage indicator lamp, and when the voltage of the power supply VDD reaches the set value, the controller controls the voltage indicator lamp to work. As shown in fig. 4, the voltage detection circuit is implemented through an analog-to-digital converter U4, and the controller controls the voltage indicator lamp to work when detecting that the voltage of the power supply VDD reaches a set value through the analog-to-digital converter U4. And detecting the assembly problem of the plug-in under the condition that the voltage indicator lamp works.
In the implementation process, the controller is connected with a first mapping table of the mapping relation between the memory configuration record voltage and the plugging state indicator lamp or/and is connected with a second mapping table of the mapping relation between the memory configuration record voltage and the plugging state indicator lamp, the controller controls the plugging state indicator lamp according to the first mapping table and the voltage dividing resistor Rup non-power supply VDD terminal voltage, and the controller controls the plugging state display according to the second mapping table and the voltage dividing resistor Rup non-power supply VDD terminal voltage.
Similarly, taking the case of detecting the memory card assembly problem on the four memory slots, the resistance values of the equivalent resistances of the accessed resistances Rx are respectively 0.569Kohm (memory socket abnormality corresponding to the resistance R4), 0.600Kohm (memory socket abnormality corresponding to the resistance R3), 0.660Kohm (memory socket abnormality corresponding to the resistance R2), 0.6875Kohm (memory socket abnormality corresponding to the resistance R3 resistance R4), 0.767Kohm (memory socket abnormality corresponding to the resistance R2 resistance R4), 0.825Kohm (memory socket abnormality corresponding to the resistance R2 resistance R3), 1Kohm (memory socket abnormality corresponding to the resistance R2 resistance R3), 1.03Kohm (memory socket abnormality corresponding to the resistance R1), 1.32Kohm (memory socket abnormality corresponding to the resistance R4), 1.499Kohm (memory socket abnormality corresponding to the resistance R1), 1.939Kohm (memory socket abnormality corresponding to the resistance R2), 2Kohm (memory socket abnormality corresponding to the resistance R2) and 2Kohm (memory socket abnormality corresponding to the resistance R3) 4; the voltage division measured at the non-power supply VDD terminal of the pull-up resistor Rup is 0.356V, 0.374V, 0.406V, 0.421V, 0.463V, 0.493V, 0.579V, 0.593V, 0.724V, 0.798V, 0.964V, 1.052V, 1.361V, 1.65V when the power supply VDD voltage is 3.3V and the equivalent resistor is connected. In the second mapping table, 0.356V maps to a memory socket anomaly corresponding to resistor R4, 0.374V maps to a memory socket anomaly corresponding to resistor R3, 0.406V maps to a memory socket anomaly corresponding to resistor R2, 0.421V maps to a memory socket anomaly corresponding to resistor R3 resistor R4, 0.463V maps to a memory socket anomaly corresponding to resistor R2 resistor R4, 0.493V maps to a memory socket anomaly corresponding to resistor R2 resistor R3 resistor R4, 0.579V maps to a memory socket anomaly corresponding to resistor R2 resistor R3 resistor R4, 0.593V maps to a memory socket anomaly corresponding to resistor R1 resistor R4, 0.724V maps to a memory socket anomaly corresponding to resistor R1 resistor R4, 0.798V maps to a memory socket anomaly corresponding to resistor R1 resistor R2, 1.052V maps to a memory socket anomaly corresponding to resistor R3 resistor R4, and 1.361V maps to a memory socket anomaly corresponding to resistor R1 resistor R2R 3. In the first mapping table, the voltages in the second mapping table are mapped to the plugging status indicator lights indicating the corresponding anomalies.
In the implementation process, an integral-differential modulation high-precision analog-to-digital converter is used for constructing the analysis circuit, and the accuracy is more than 20 bits. The input of the analog-to-digital converter is anti-aliasing filtered and the output of the digital-to-analog converter is digitally filtered. The operation and implementation formula of the integral-differential modulation high-precision analog-to-digital converter is as follows: dout= (Vin/Vref) 2 n. An analog-to-digital converter with n-bits resolution performs a division with Vref as the divisor and expresses the result in n-bit bins. The integral-differential modulation high-precision analog-to-digital converter comprises a differential, an integrator, a comparator and a modulator, wherein the modulator is connected with the output of the comparator and outputs the output to the differential to form feedback. The modulator operates at a rate greater than the input signal bandwidth to provide oversampling. The input is differentially compared to the feedback signal. The differential output generated by the comparison is fed back into the integrator. The output of the integrator is then fed into a comparator. The output of the comparator simultaneously passes the feedback signal to the differential and the output is fed into the digital filter. The result of the comparator output is 1 or 0, forming a high precision data voltage output.
Example 4
The circuit for detecting the assembly problem of the plug-in unit provided by the embodiment of the invention comprises the following components: the detection pad that sets up in plug-in components buckle department, the detection pad includes: two contacts of the connecting part of the connecting buckle are connected, one contact is grounded, the other contact is connected with a pull-up resistor Rup through a resistor Rx, the pull-up resistor Rup is connected with a power supply VDD, and the resistance values of the pull-up resistor Rup and the resistor Rx connected with the contacts are different; the plug-in buckle is in butt joint with the buckle connecting part when the plug-in is completely inserted, so that the contact is conducted; the total loop where the pull-up resistor Rup is located is electrically connected with a current sensor, the current sensor is electrically connected with analog-to-digital converters, each analog-to-digital converter is electrically connected with a controller, the controller is electrically connected with an indication circuit, and the knowledge circuit comprises but is not limited to a plug-in state indicator lamp or/and a plug-in state display. Referring to fig. 6, the current sensor includes an operational amplifier U5, a voltage divider circuit formed by connecting a resistor r8 and a resistor r9 in series is connected to an in-phase input end of the operational amplifier U5, the resistor r9 is grounded, an inverting input end of the operational amplifier is connected to a resistor r11, an output end of the operational amplifier is coupled to the inverting input end through a resistor r10, a resistor r9 is connected between the resistor r11 and the resistor r8, and the resistor r9 is disposed on a total loop where the pull-up resistor Rup is located for measuring a total current.
Similarly, taking the case of detecting the memory card assembly problem on the four memory slots, the resistance values of the equivalent resistances of the accessed resistances Rx are respectively 0.569Kohm (memory socket abnormality corresponding to the resistance R4), 0.600Kohm (memory socket abnormality corresponding to the resistance R3), 0.660Kohm (memory socket abnormality corresponding to the resistance R2), 0.6875Kohm (memory socket abnormality corresponding to the resistance R3 resistance R4), 0.767Kohm (memory socket abnormality corresponding to the resistance R2 resistance R4), 0.825Kohm (memory socket abnormality corresponding to the resistance R2 resistance R3), 1Kohm (memory socket abnormality corresponding to the resistance R2 resistance R3), 1.03Kohm (memory socket abnormality corresponding to the resistance R1), 1.32Kohm (memory socket abnormality corresponding to the resistance R4), 1.499Kohm (memory socket abnormality corresponding to the resistance R1), 1.939Kohm (memory socket abnormality corresponding to the resistance R2), 2Kohm (memory socket abnormality corresponding to the resistance R2) and 2Kohm (memory socket abnormality corresponding to the resistance R3) 4; when the VDD voltage of the power supply is 3.3V and the equivalent resistor is accessed, the output values of the obtained current sensor are 0.626×r9, 0.622×r9, 0.615×r9, 0.612×r9, 0.603×r9, 0.597×r9, 0.579×r9, 0.575×r9, 0.548×r9, 0.532×r9, 0.497×r9, 0.478×r9, 0.4125×r9, and 0.351×r9, respectively. The controller indicates corresponding plugging abnormality according to the obtained output value.
Example 5
The embodiment of the invention provides a server, which is provided with a slot for connecting a plug-in unit, wherein the slot is provided with a circuit for detecting the assembly problem of the plug-in unit.
In one implementation manner, when the analysis circuit including the controller in embodiment 3 or embodiment 4 is applied, the controller is connected to a baseboard management controller of the server, the baseboard management controller obtains a plug-in connection state from the controller, and a web end of the baseboard management controller provides a UI, and the UI displays the plug-in connection state.
In one embodiment, an indication circuit for indicating the card insertion status or the selector path selection status is provided on the server chassis.
According to the invention, a circuit for detecting whether the plug-in is completely inserted or not in assembly is formed by matching the pull-up resistor Rup, the resistor Rx, the detection bonding pad, the plug-in buckle and the buckle connecting part, wherein the resistor Rx connected with different contacts has different resistance values, the equivalent resistor formed by connecting different resistors Rx and any resistor Rx in parallel has different resistance values, so that when the connection condition of the resistor Rx is different, the voltage of the pull-up resistor Rup non-power supply VDD terminal is different, and the positioning of the assembly problem is supported.
The analysis circuit applying the comparator, the indicator lamp and the adjustable reference circuit adjusts the adjustable reference circuit under the guidance of the state of the indicator lamp to check the connection state of the plug-in unit, and has the advantages of simple circuit structure, low cost and small occupied space.
According to the method, the device and the system, the analysis circuit of the analog-to-digital converter and the controller or the analysis circuit of the current sensor and the controller is used, the plug-in connection state is directly determined based on the electric signal without operation, the indication is carried out through the indication circuit, the communication with the server baseboard management controller is more visual, and the in-band out-of-band transmission of the plug-in connection state is realized.
In the embodiments provided in the present invention, it should be understood that the disclosed structures and methods may be implemented in other manners. For example, the structural embodiments described above are merely illustrative, and for example, the division of the units is merely a logical function division, and there may be other manners of division in actual implementation, for example, multiple units or components may be combined or integrated into another system, or some features may be omitted, or not performed. Alternatively, the coupling or direct coupling or communication connection shown or discussed with each other may be an indirect coupling or communication connection via interfaces, structures or units, which may be in electrical, mechanical or other forms.
The units described as separate units may or may not be physically separate, and units shown as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the solution of this embodiment.
In addition, each functional unit in the embodiments of the present invention may be integrated in one processing unit, or each unit may exist alone physically, or two or more units may be integrated in one unit. The integrated units may be implemented in hardware or in software functional units.
The foregoing is only a specific embodiment of the invention to enable those skilled in the art to understand or practice the invention. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the generic principles defined herein may be applied to other embodiments without departing from the spirit or scope of the invention. Thus, the present invention is not intended to be limited to the embodiments shown herein but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.
Claims (10)
1. A circuit for detecting a package assembly problem, comprising: the detection pad of the plug-in components buckle department of setting in the slot, the detection pad includes: two contacts connected with the buckle connecting part, wherein one contact is grounded, the other contact is connected with a pull-up resistor Rup through a resistor Rx, the pull-up resistor Rup is connected with a power supply VDD, the resistance values of the resistors Rx connected with different contacts are different, and the resistance values of equivalent resistors formed by connecting different resistors Rx and any resistor Rx in parallel are different; the plug-in buckle is in butt joint with the buckle connecting part when the plug-in is completely inserted, so that the contact is conducted;
the non-power supply VDD end of the pull-up resistor Rup is electrically connected with an analysis circuit for determining the snap-in connection state of the plug-in unit.
2. The circuit for detecting package assembly problems according to claim 1, wherein when any one of the packages is configured with two package snaps, the resistor Rx corresponding to the package snap on the same side of the package is connected to the same pull-up resistor Rup.
3. The circuit for detecting a package assembly problem of claim 1, wherein the analysis circuit comprises: the input end of the comparator is electrically connected with one end of the pull-up resistor Rup, the other input end of the comparator is electrically connected with an adjustable reference circuit, the output end of the comparator is connected with an indicator lamp, the reference circuit is provided with a reference mark corresponding to the voltage of the pull-up resistor Rup at the end of the pull-up resistor Rup, and the reference mark is used for indicating the plug-in card buckle with abnormal connection.
4. A circuit for detecting package assembly problems as in claim 3 wherein said adjustable reference circuit comprises: the voltage dividing resistor Ra is connected with the power supply VDD, the voltage dividing resistor Ra is consistent with the pull-up resistor Rup in specification, the voltage dividing resistor Ra is connected with the potentiometer Rb in series, the potentiometer Rb is grounded, the other input end of the comparator is connected between the voltage dividing resistor Ra and the potentiometer Rb, the potentiometer Rb is provided with reference marks corresponding to the voltages of the pull-up resistor Rup non-power supply VDD end under different abnormal conditions, and the reference marks are used for indicating plug-in card buckles connected abnormally;
alternatively, the adjustable reference circuit includes: the voltage dividing resistor Ra of the power supply VDD is connected, the voltage dividing resistor Ra is consistent with the specification of the pull-up resistor Rup, the voltage dividing resistor Ra is connected with the selector, the control end of the selector is electrically connected with the controller, the selector is electrically connected with a plurality of fixed value resistors which are respectively connected with the voltage dividing resistor Ra in series, the fixed value resistors connected with the selector are grounded, the voltage division of different fixed value resistors corresponds to the voltage of the voltage dividing resistor Rup at the non-power supply VDD end under different abnormal conditions, the other input end of the comparator is connected with the voltage dividing resistor Ra at the non-power supply VDD end, the controller is electrically connected with the passage indicator lamp, and the passage indicator lamp is provided with a reference mark.
5. The circuit for detecting a package assembly problem of claim 1, wherein the analysis circuit comprises: the analog-to-digital converters are connected to the non-power supply VDD end of the voltage dividing resistor Rup, and are electrically connected with the controller, and the controller is electrically connected with an indication circuit, wherein the indication circuit comprises, but is not limited to, a plug-in state indicator lamp or/and a plug-in state display.
6. The circuit for detecting package assembly of claim 5, wherein the power supply VDD is electrically connected to a voltage detection circuit, the voltage detection circuit is electrically connected to a controller, the voltage detection circuit is configured to detect that the power supply VDD voltage reaches a set value, the controller is electrically connected to a voltage indicator, and the controller controls the voltage indicator to operate when the power supply VDD voltage reaches the set value.
7. The circuit for detecting plug-in assembly problems according to claim 5, wherein the memory connected to the controller is configured with a first mapping table for recording a mapping relationship between voltage and plug-in status indicator lamp or/and the memory connected to the controller is configured with a second mapping table for recording a mapping relationship between voltage and plug-in status indicator lamp, the controller controls the plug-in status indicator lamp according to the first mapping table and the voltage dividing resistor Rup non-power supply VDD terminal voltage, and the controller controls the plug-in status display according to the second mapping table and the voltage dividing resistor Rup non-power supply VDD terminal voltage.
8. The circuit for detecting package assembly problems according to claim 5, wherein the analysis circuit of the present application is constructed using an integral-differential modulation high precision analog-to-digital converter, wherein the input of the analog-to-digital converter is anti-aliasing filtered, and wherein the output of the digital-to-analog converter is digitally filtered; the integral-differential modulation high-precision analog-to-digital converter comprises a differential, an integrator, a comparator and a modulator, wherein the modulator is connected with the output of the comparator and outputs the output to the differential to form feedback. The modulator operates at a rate greater than the input signal bandwidth to provide oversampling; the input and the feedback signal are subjected to differential comparison, and the differential output generated by the comparison is fed back into the integrator; the output of the integrator is then fed into a comparator, the output of which simultaneously conveys a feedback signal to the differential, and the output is fed into a digital filter.
9. The circuit for detecting package assembly problems according to claim 1, wherein the total circuit in which the pull-up resistor Rup is located is electrically connected to a current sensor, the current sensor is electrically connected to analog-to-digital converters, each analog-to-digital converter is electrically connected to a controller, the controller is electrically connected to an indication circuit, and the knowledge circuit includes, but is not limited to, a plug-in status indicator light or/and a plug-in status display.
10. A server comprising a socket for connection of a plug-in, said socket being provided with a circuit for detecting assembly problems of a plug-in according to any one of claims 1 to 9.
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CN202311368772.6A CN117608935A (en) | 2023-10-20 | 2023-10-20 | Circuit for detecting assembly problem of plug-in unit and server |
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CN202311368772.6A CN117608935A (en) | 2023-10-20 | 2023-10-20 | Circuit for detecting assembly problem of plug-in unit and server |
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CN202311368772.6A Pending CN117608935A (en) | 2023-10-20 | 2023-10-20 | Circuit for detecting assembly problem of plug-in unit and server |
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