CN117590111A - Testing device and method for electronic equipment - Google Patents

Abstract

The embodiment of the application provides a testing device and a testing method of electronic equipment, which relate to the technical field of automatic control, wherein the testing device comprises: the device comprises a detection box, a test platform arranged in a closed space of the detection box, a mechanical arm and control equipment positioned outside the detection box; the detection box is used for providing a testing environment which meets the testing requirements; the test platform is used for fixing the electronic equipment to be tested, and the electronic equipment is used for being electrically connected with the control equipment in the test process so as to send test data generated by the electronic equipment to the control equipment; the control device is used for controlling the mechanical arm to execute a test task and determining a test result of the electronic device under a test environment based on test data corresponding to the test task; the test task is to execute touch operation on the electronic equipment. In this embodiment of the application, through arranging arm, test platform in airtight detection case, can guarantee at the in-process to electronic equipment test, test environment can not change, the accuracy and the efficiency of the test of promotion.

Description

Testing device and method for electronic equipment

Technical Field

The present disclosure relates to the field of automatic control technologies, and in particular, to a testing device and method for an electronic device.

Background

In extreme environments, the quality and life of an electronic device may be known by testing some performance parameters of the electronic device. For example, in an extreme temperature environment, the life, performance, reliability, etc. of an electronic device can be known through a burn-in test.

However, in the extreme environment, for example, in the extreme temperature environment, when the electronic device needs to be tested for touch control and display effect, the electronic device needs to be placed in the incubator for a period of time, and then the electronic device is taken out from the incubator for testing, so that it is not possible to completely ensure that the electronic device is tested in the extreme temperature environment.

Disclosure of Invention

The embodiment of the application provides a testing device and method for electronic equipment, which are used for improving the testing accuracy of the electronic equipment in an extreme temperature environment.

In a first aspect, an embodiment of the present application provides a test apparatus for an electronic device, including: the device comprises a detection box, a test platform arranged in a closed space of the detection box, a mechanical arm and control equipment positioned outside the detection box;

the detection box is used for providing a testing environment meeting testing requirements;

the test platform is used for fixing electronic equipment to be tested, and the electronic equipment is used for being electrically connected with the control equipment in the test process so as to send test data generated by the electronic equipment to the control equipment;

the control equipment is used for controlling the mechanical arm to execute a test task and determining a test result of the electronic equipment in the test environment based on test data corresponding to the test task; the test task is to execute touch operation on the electronic equipment.

In this embodiment of the application, through arranging arm, test platform in airtight detection case, through external control equipment control arm, replace the manual work with the arm, test the electronic equipment on the test platform in airtight detection case, can guarantee at the in-process to the electronic equipment test, test environment can not change, guaranteed test data's accuracy. Meanwhile, the effect of automatic test can be achieved through the simulation of the mechanical arm, and the accuracy and the efficiency of the test are improved.

Optionally, a first motor and a first sensor are fixed on the mechanical arm, the first motor is electrically connected with the control device, and the first sensor is electrically connected with the control device;

the first sensor is used for monitoring the offset angle of the mechanical arm and transmitting the offset angle to the control equipment;

the control device is also used for controlling the first motor according to the offset angle so as to enable the mechanical arm to be at a standard angle.

In this embodiment of the application, through the first sensor on the arm, can confirm the offset angle of arm, when the arm is in non-standard angle, can be through the first motor on the arm, control the arm and remove, make the arm be in standard angle. Therefore, before the test starts, the mechanical arm is adjusted to be at a standard angle through the first motor, and the problem of inaccurate test results is avoided.

Optionally, the mechanical arm is fixed on the top of the detection box through a sliding rail and/or the test platform is fixed on the bottom of the detection box through a sliding rail;

the sliding rail is provided with a second motor, and the second motor is electrically connected with the control equipment;

the control device is also used for controlling the mechanical arm and/or the test platform to slide on the respective slide rail through the second motor.

In this embodiment of the application, be provided with the slide rail at the top and/or the bottom of detecting the case, fix arm and/or test platform sliding on the slide rail, can control the free movement of arm and/or slide rail through the second motor, make things convenient for arm and/or test platform to coordinate each other and look for the test position.

Optionally, the test platform is a rotatable test platform, and a third motor is arranged on the test platform and is electrically connected with the control device;

the control device is also used for controlling the test platform to rotate through the third motor.

In this embodiment of the application, through setting up the third motor on test platform, can control test platform rotatory through the third motor, when involving to the side or the back to electronic equipment test, can carry out nimble test to electronic equipment through rotatory test platform.

Optionally, the method further comprises: the image acquisition device is positioned on the mechanical arm and is electrically connected with the control device;

the control equipment is also used for assisting in positioning the mechanical arm according to the image acquired by the image acquisition equipment.

In this embodiment of the application, when using the arm to test electronic equipment, through setting up image acquisition equipment on the arm, can fix a position the electronic equipment on the test platform fast, saved test time.

Optionally, a loading piece is arranged at the tail end of the mechanical arm, and a pressure sensor is arranged on the loading piece;

the loading piece is used for loading the stylus; and the mechanical arm executes touch operation on the electronic equipment through the touch pen.

In the embodiment of the application, the loading piece is arranged on the mechanical arm, so that the mechanical arm can load the stylus, and the electronic equipment is tested through the stylus.

Optionally, the method further comprises: the storage rack is positioned on the bottom sliding rail in the detection box and is used for placing a plurality of touch pens.

In the embodiment of the application, a plurality of touch pens can be stored by arranging the storage rack, and when different test types are needed, different touch pens can be selected to finish the test.

In a second aspect, a method for testing an electronic device includes:

the control equipment acquires a test task;

the control equipment controls the mechanical arm according to the test task and preset parameters so as to enable the mechanical arm to move to a testable position;

the control equipment controls the mechanical arm to test the electronic equipment according to the test task and acquires test data corresponding to the test task;

and the control equipment determines a test result of the electronic equipment under the test environment provided by the detection box based on the test data.

Optionally, before the testing of the electronic device, the method further comprises:

the control device controls the mechanical arm through the first motor based on the offset angle of the mechanical arm monitored by the first sensor so that the mechanical arm is at a standard angle.

Optionally, the control device determines, based on the test data, a test result of the electronic device in a test environment provided by the test box, including:

and the control equipment determines a test result of the electronic equipment under the test environment provided by the detection box based on the test data and the pressure data monitored by the pressure sensor.

Optionally, it stores a computer program executable by a computer device, which when run on the computer device causes the computer device to perform the steps of any of the methods described above.

In a third aspect, embodiments of the present application provide a computer device comprising a memory, a processor and a computer program stored on the memory and executable on the processor, the processor implementing the steps of the above method when executing the program.

In a fourth aspect, embodiments of the present application provide a computer readable storage medium storing a computer program executable by a computer device, the program when run on the computer device causing the computer device to perform the steps of the above method.

Drawings

In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings that are needed in the description of the embodiments will be briefly described below, it will be apparent that the drawings in the following description are only some embodiments of the present invention, and that other drawings can be obtained according to these drawings without inventive effort for a person skilled in the art.

Fig. 1 is a schematic structural diagram of an electronic device testing apparatus according to an embodiment of the present application;

fig. 2 is a schematic structural diagram of a second electronic device testing apparatus according to an embodiment of the present application;

fig. 3 is a schematic structural diagram III of an electronic device testing apparatus according to an embodiment of the present application;

fig. 4 is a schematic structural diagram of an electronic device testing apparatus according to an embodiment of the present application;

fig. 5 is a schematic structural diagram of an electronic device testing apparatus according to an embodiment of the present application;

fig. 6 is a schematic structural diagram of an electronic device testing apparatus according to an embodiment of the present application;

fig. 7 is a schematic structural diagram seventh of an electronic device testing apparatus according to an embodiment of the present application;

fig. 8 is a flow chart of a method for testing electronic equipment according to an embodiment of the present application;

fig. 9 is a schematic structural diagram of a mechanical arm according to an embodiment of the present disclosure;

fig. 10 is a schematic diagram of a computer device according to an embodiment of the present application.

Detailed Description

In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention will be described in further detail below with reference to the accompanying drawings, and it is apparent that the described embodiments are only some embodiments of the present invention, not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.

In order to facilitate understanding of the present solution, an application scenario of the present solution is described below.

The electronic product is tested in an extreme environment, and the performance, service life and reliability of the electronic device can be known through the test parameters in the extreme environment. However, in the prior art, the test is generally performed manually in an extreme environment, for example, when the electronic device is tested for touch performance, display effect and the like in a high-low temperature environment, the door of the temperature box needs to be opened in the whole process to perform the test, so that there is no way to ensure that the temperature of the test is always unchanged, and the accuracy of the test result is affected. The embodiment of the application provides a testing device and a testing method of electronic equipment, and the specific operation steps are as follows:

firstly, the test device for the electronic equipment provided by the embodiment of the application comprises a detection box, wherein the detection box is airtight and cannot be connected with the outside in the test process. The detection box is internally provided with a mechanical arm which is connected with external control equipment, and the control equipment controls the mechanical arm to act. And a test platform is also arranged in the detection box and used for fixing the electronic equipment to be tested. And then, setting corresponding test tasks in advance according to the electronic equipment to be tested. Finally, the control device controls the mechanical arm to test the electronic device, the electronic device is placed at the test position of the detection box, the mechanical arm is contacted with the electronic device, which is equivalent to manually operating the electronic device, and in the test process, the control device acquires test data of the electronic device, so that the service life, quality or reliability of the electronic device in an extreme environment are judged.

Referring to fig. 1, a test apparatus for an electronic device according to an embodiment of the present application includes: a detection box 101, a test platform 102 arranged in a closed space of the detection box 101, a mechanical arm 103 and a control device 104 positioned outside the detection box; the detection box 101 is used for providing a test environment meeting test requirements; the test platform 102 is used for fixing an electronic device to be tested, and the electronic device is used for being electrically connected with the control device 104 in the test process so as to send test data generated by the electronic device to the control device 104; the control device 104 is configured to control the mechanical arm 103 to execute a test task, and determine a test result of the electronic device in a test environment based on test data corresponding to the test task; the test task is to execute touch operation on the electronic equipment.

Specifically, the detection box 101 is a closed space, and conditions such as temperature, pressure or humidity of the detection box can be adjusted and controlled through relevant settings, so that the detection box 101 can provide a test environment meeting test requirements. The control of the detection box 101 can be completed by the detection box itself or by external control equipment, for example, the detection box is a constant temperature detection box 101, a control button can be arranged on the box body of the detection box 101, and the temperature of the detection box 101 can be adjusted through the control button; the detection box may also be connected to an external control device 104, the temperature of the detection box being controlled by the external control device 104.

A robot arm 103 is also provided in the closed space of the detection box 101. The mechanical arm 103 is used for simulating the action of a person, so that the mechanical arm 103 performs a test operation on the electronic device.

In the closed space of the detection box 101, a test platform 102 is further provided, where the test platform 102 is used for fixing the electronic device to be tested. The test platform can be fixed and used for testing the electronic equipment only needing to test the front side, and can also be rotated and used for testing the side surface and the back surface of the electronic equipment.

A control device 104 is provided outside the detection box 101, the control device 104 being electrically connectable to the detection box 101 for controlling the testing environment of the detection box 101. The control device 104 is electrically connected with the mechanical arm 103, and is used for controlling the mechanical arm 103 to execute a test task on the electronic device to be tested, the control device 104 is electrically connected with the electronic device, and after the mechanical arm 103 finishes executing the electronic device based on the test task, test data generated by the electronic device are obtained.

In some embodiments, as shown in fig. 2, a first motor 1031 and a first sensor 1032 are fixed on the mechanical arm 103, the first motor 1031 is electrically connected to the control device 104, and the first sensor 1032 is electrically connected to the control device 104; the first sensor 1032 is configured to monitor an offset angle of the robotic arm 103 and transmit the offset angle to the control device 104; the control device 104 is further configured to control the first motor 1031 according to the offset angle, so that the robot arm 103 is at a standard angle.

Specifically, a first motor 1031 and a first sensor 1032 are fixed to the robot arm 103, the first motor 1031 is electrically connected to the control device 104, and the first sensor 1032 is electrically connected to the control device 104. The first sensor 1032 is configured to monitor an offset angle of the mechanical arm 103, and generally, the mechanical arm 103 may have an offset angle after long-term use, which may affect a test result. Therefore, before the test, it is necessary to check whether the angle of the mechanical arm 103 is deviated, and if the angle of the mechanical arm 103 is deviated, the first sensor 1032 transmits the deviated angle to the control device 104, and the control device 104 corrects the angle of the mechanical arm 103, so that the mechanical arm 103 is tested under the standard angle.

After receiving the offset angle of the mechanical arm 103 transmitted from the first sensor 1032, the control device 104 controls the first motor 1031 to drive the mechanical arm 103 so that the mechanical arm is at the standard angle. When the cross section of the mechanical arm 103 is rectangular, two adjacent sides need a first sensor 1032 and a first motor 1031 matched with the first sensor 1032; when the mechanical arm is in a circular cross section, only one first sensor 1032 and one first motor 1031 are required.

In some embodiments, as shown in fig. 3, the robotic arm is secured to the top of the test cassette 101 by a slide rail 105 and/or the test platform is secured to the bottom of the test cassette 101 by a slide rail 105; the slide rail 105 is provided with a second motor 1051, and the second motor 1051 is electrically connected with the control equipment 104; the control device 104 is further configured to control the robot arm 103 and/or the test platform 102 to slide on the respective slide rail 105 via the second motor 1051.

Specifically, the mechanical arm 103 may be fixed to the top of the detection box 101 by a slide rail 105, and the test platform 102 is fixed to the bottom of the detection box 101 by the slide rail 105; alternatively, the mechanical arm 103 may be fixed to the top of the detection box 101 through a slide rail 105, and the test platform 102 is directly fixed to the bottom of the detection box 101; alternatively, the mechanical arm 103 is directly fixed to the top of the test box 101, and the test platform 102 is fixed to the bottom of the test box 101 through the slide rail 105.

The second motor 1051 is arranged on the slide rail 105, the second motor 1051 is electrically connected with the control device 104, the control device 104 controls the mechanical arm 103 on the slide rail 105 to slide through the second motor 1051, or the control device 104 controls the test platform 102 on the slide rail 105 to slide through the second motor 1051.

In some embodiments, as shown in fig. 4, the test platform 102 is a rotatable test platform, and the test platform 102 has a third motor 1021 thereon, and the third motor 1021 is electrically connected with the control device 104; the control device 104 is further configured to control the rotation of the test platform 102 by means of the third motor 1021.

Specifically, the test platform 102 may be a rotatable test platform, a third motor 1021 is provided on the test platform 102, the third motor 1021 is electrically connected to the control device 104, and the control device 104 may implement rotation of the test platform 102 by controlling the third motor 1021. If the electronic equipment to be tested only needs to be tested on the front surface, the electronic equipment does not need to be rotated; if the side or the back of the electronic equipment to be tested is required to be tested, the side and the back of the electronic equipment are required to be tested through rotation of the test platform.

For example, if the touch control of the electronic device is to be tested in a high-temperature environment, a fingerprint touch control area is arranged on the front side of the electronic device, and the fingerprint touch control test of the electronic device can be completed without rotating the test platform; if the fingerprint touch area of the electronic device is located on the side or the back of the electronic device, the third motor 1021 is controlled by the control device 104 to drive the test platform 102 to rotate, so that fingerprint touch testing on the side or the back of the electronic device can be achieved.

In some embodiments, as shown in fig. 5, the test apparatus further comprises: an image capturing device 1033 located on the mechanical arm 103, the image capturing device 1033 being electrically connected to the control device 104; the control device 104 is further configured to assist in positioning the mechanical arm 103 according to the image acquired by the image acquisition device 1033.

Specifically, the control device 104 controls the mechanical arm 103 to perform the test on the electronic device, the test is generally performed at the middle position of the detection box 101, and the initial position of the mechanical arm 103 is generally at one side of the detection box, so that when the electronic device is tested, the mechanical arm 103 needs to be moved from the initial position to the testing position. Therefore, an image acquisition device 1033 is further provided on the robot arm 103, and the robot arm 103 is assisted in finding a test position by the image acquisition device 1033.

The image capturing device 1033 may capture the position of the electronic device, the image capturing device 1033 is electrically connected with the control device 104, and the control device 104 controls the movement of the mechanical arm 103 through the position information captured by the image capturing device 1033, so that the mechanical arm 103 is placed at the test position.

In some embodiments, as shown in fig. 6, the test apparatus further comprises: the tail end of the mechanical arm 103 is provided with a loading piece 1034, and the loading piece 1034 is provided with a pressure sensor; the loader is used to load the stylus 106; the mechanical arm 103 performs a touch operation on the electronic device through the stylus 106.

Specifically, the mechanical arm 103 contacts the electronic device through the stylus 106, thereby completing the test of the electronic device. The end of the mechanical arm 103 is provided with a loader 1034, and the loader 1034 is used for loading the stylus 106, and the stylus 106 is contacted with the electronic device, so that the electronic device is simulated to be tested manually. The loading element is further provided with a pressure sensor, which is electrically connected to the control device 104.

When testing the electronic device, the stylus 106 is in contact with the electronic device, generating pressure, and the pressure value is transmitted to the control device 104 via the pressure sensor. A value range of the pressure value is set at the control device 104, and when the pressure value transmitted by the pressure sensor is in the value range, the stylus 106 is proved to be in good contact with the electronic device; if the pressure value transmitted by the pressure sensor exceeds the value range, the stylus 106 and the electronic device are in poor contact or have excessive pressure, and at this time, the control device 104 needs to control the stylus 106 to adjust the contact pressure, so as to avoid inaccurate test or damage to the electronic device caused by excessive pressure due to poor contact.

When the stylus 106 is used for testing the electronic device, whether the touch state of the electronic device is good or not can be completed by clicking or scribing the electronic device through the stylus.

In some embodiments, as shown in fig. 7, the test apparatus further comprises: the rack 107 is located on the bottom rail in the detection box 101, and is used for placing a plurality of touch pens.

Specifically, on the bottom sliding rail in the detection box 101, a rack 107 is further provided, where the rack 107 is used for placing a plurality of touch pens 106, and the touch pens 106 may be copper columns used for simulating hands of a person or handwriting pens. Therefore, the placement frame can be used for simulating different touch pens when different electronic equipment is tested in different scenes.

Next, a test method of the electronic device of the present application will be specifically described, referring to a flowchart of the test method of the electronic device shown in fig. 8, where the method is executed by the control device 104, and specific procedures are as follows:

step 801: the control device obtains a test task.

Specifically, before testing the electronic equipment, a corresponding test task is firstly obtained according to the electronic equipment to be tested. The test task can be established through a new use case, which contains the following contents: the "case name" is a specific item tested under the case, for example, the case is a touch test (i.e., TP test) performed on the electronic device at a high temperature; the "action type" is the touch type of the mechanical arm required by the touch test, and can be "TP click test" or "TP connection test" and the like; the attribute name is the name of the parameter to be tested; the attribute value is a specific numerical value corresponding to the name of the test parameter; "description" is an interpretation of parameter names. After the configuration of the test content is completed, the use case is added into a new task, and the control equipment starts to test the electronic equipment according to the new task.

Step 802: and the control equipment controls the mechanical arm according to the preset parameters according to the test task so as to enable the mechanical arm to move to a testable position.

Specifically, the control device controls the mechanical arm to move to the test position according to the parameters preset in the test. The preset parameter is the attribute value.

Step 803: the control device controls the mechanical arm to test the electronic device according to the test task and obtains test data corresponding to the test task.

Specifically, the control device controls the mechanical arm to test the electronic device according to the test task, and test data are obtained.

For example, when the touch control of the electronic device is tested in a high-temperature environment, the test tasks of the "new use case" are: under the 'high temperature TP click test', wherein the temperature of a detection box is set to 45 degrees, after the temperature reaches 45 degrees, the test is started after waiting 300 seconds, a copper column is selected as a test stylus during the test, the test is performed under a matrix of which the test matrix is 3*3, the test is performed 1000 times at a speed of 20mm/s, the time for pressing the stylus is 100ms, the time for lifting the stylus is 100ms, and the height of the stylus from an electronic device is 6mm. When the touch control test is performed on the electronic equipment, test data generated by the electronic equipment can be connected with the external control equipment through the USB, so that the test data is sent to the external control equipment.

Step 804: the control device determines a test result of the electronic device in a test environment provided by the detection box based on the test data.

Specifically, the control device stores conventional parameters of the electronic device, and after the control device acquires the test data, the test data is compared with the pre-stored conventional parameters.

For example, the conventional parameters of the touch area of the electronic device are stored at the control device, and the electronic device is clicked 1000 times in a high-temperature environment to test the touch of the electronic device. If the test data generated by clicking the touch area of the electronic equipment for the 1 st to 1000 th times accords with the conventional touch parameters, the touch of the electronic equipment is proved to be good; if the test data generated 100 times before clicking accords with the conventional parameters, judging that the touch of the electronic equipment is abnormal if the test data generated 100 times after clicking does not accord with the conventional parameters.

In some embodiments, the control device determines a test result of the electronic device in a test environment provided by the test box based on the test data, including: the control device determines a test result of the electronic device in a test environment provided by the detection box based on the test data and the pressure data monitored by the pressure sensor.

Specifically, when the pressure sensor generates pressure data, it cannot be completely proven to be the result of the test of the stylus on the electronic device, and the pressure generated by the stylus touching other positions may occur; similarly, the test results produced by the electronic device may not be completely proven to be the result of a stylus clicking or scribing on the electronic device, and may be test data produced by other objects touching the electronic device. Thus, when the pressure data generated by the pressure sensor matches the test results, it can be demonstrated that the stylus contacts the electronic device to generate test data.

In some embodiments, prior to testing the electronic device, further comprising: the control device controls the mechanical arm through the first motor based on the offset angle of the mechanical arm monitored by the first sensor so that the mechanical arm is at a standard angle.

Specifically, the mechanical arm needs to be subjected to angular offset correction before the electronic device is tested. As shown in fig. 9, taking the cross section of the mechanical arm 103 as a rectangle as an example, the first sensor 1032 of the mechanical arm 103 is composed of a sensor No. 1 and a sensor No. 2, and a motor No. 1 and a motor No. 2 matched with the sensor No. 1 and the sensor No. 2, and the process of controlling the mechanical arm 103 to be at a standard angle by the control device 104 is specifically as follows:

(1) The control device 104 stores factory initial state data of the mechanical arm 103, namely standard angles: inclination angle αa, αb;

(2) After the mechanical arm 103 is electrified, the sensor No. 1 in the first sensor 103 reports angle data alpha 1 to the control equipment 104, and compares the angle data with alpha a, if alpha 1 is not equal to alpha a, a calibration command is returned to the motor No. 1, and the control equipment 104 stops working after controlling the motor No. 1 to rotate to alpha 1 = alpha a;

(3) The No. 2 inclination sensor in the first sensor 103 reports angle data alpha 2 to the control device 104, and compares the angle data with alpha b, if alpha 2 is not equal to alpha b, a calibration command is returned to the No. 2 motor, and the control device 104 stops working after controlling the motor to rotate to alpha 2 = alpha b;

(4) The robot 103 abnormality detection and self-recovery process is completed.

The electronic device testing apparatus provided in the embodiments of the present application may perform data interaction with a computer device to implement testing of an electronic device, where the computer device may be a terminal or a server, as shown in fig. 10, and includes at least one processor 1001 and a memory 1002 connected to the at least one processor, and in the embodiments of the present application, specific connection media between the processor 1001 and the memory 1002 are not limited, and in fig. 10, the processor 1001 and the memory 1002 are connected by a bus for example. The buses may be divided into address buses, data buses, control buses, etc.

In the embodiment of the present application, the memory 1002 stores instructions executable by the at least one processor 1001, and the at least one processor 1001 may execute the steps included in the above-described method for recovering an exception of the host computer by executing the instructions stored in the memory 1002.

The processor 1001 is a control center of the computer device, and may use various interfaces and lines to connect various parts of the computer device, and execute or execute instructions stored in the memory 1002 and call data stored in the memory 1002, so as to perform active/standby exception recovery. Alternatively, the processor 1001 may include one or more processing units, and the processor 1001 may integrate an application processor and a modem processor, wherein the application processor primarily processes an operating system, a user interface, an application program, and the like, and the modem processor primarily processes wireless communication. It will be appreciated that the modem processor described above may not be integrated into the processor 1001. In some embodiments, the processor 1001 and the memory 1002 may be implemented on the same chip, and in some embodiments they may be implemented separately on separate chips.

The processor 1001 may be a general purpose processor, such as a Central Processing Unit (CPU), digital signal processor, application specific integrated circuit (ApplicationSpecificIntegratedCircuit, ASIC), field programmable gate array or other programmable logic device, discrete gate or transistor logic, discrete hardware components, which may implement or perform the methods, steps and logic blocks disclosed in embodiments of the present application. The general purpose processor may be a microprocessor or any conventional processor or the like. The steps of a method disclosed in connection with the embodiments of the present application may be embodied directly in a hardware processor for execution, or in a combination of hardware and software modules in the processor for execution.

The memory 1002 is a non-volatile computer-readable storage medium that can be used to store non-volatile software programs, non-volatile computer-executable programs, and modules. The memory 1002 may include at least one type of storage medium, which may include, for example, flash memory, hard disk, multimedia card, card memory, random access memory (RandomAccessMemory, RAM), static random access memory (StaticRandomAccessMemory, SRAM), programmable read only memory (ProgrammableReadOnlyMemory, PROM), read only memory (ReadOnlyMemory, ROM), charged erasable programmable read only memory (electrically erasable programmable read only memory-OnlyMemory, EEPROM), magnetic memory, magnetic disk, optical disk, and the like. Memory 1002 is any other medium that can be used to carry or store desired program code in the form of instructions or data structures and that can be accessed by a computer, but is not limited to such. The memory 1002 in the embodiments of the present application may also be circuitry or any other device capable of implementing a memory function for storing program instructions and/or data.

Based on the same inventive concept, embodiments of the present application provide a computer-readable storage medium storing a computer program executable by a computer device, which when run on the computer device, causes the computer device to perform the steps of the above-described electronic device testing method.

Based on the same inventive concept, embodiments of the present application provide a computer program product, characterized in that the computer program product comprises a computer program stored on a computer readable storage medium, the computer program comprising program instructions, which when executed by a computer device, cause the computer device to perform the steps of the above-mentioned electronic device testing method.

It will be appreciated by those skilled in the art that embodiments of the present application may be provided as a method, system, or computer program product. Accordingly, the present application may take the form of an entirely hardware embodiment, an entirely software embodiment, or an embodiment combining software and hardware aspects. Furthermore, the present application may take the form of a computer program product embodied on one or more computer-usable storage media (including, but not limited to, disk storage, CD-ROM, optical storage, and the like) having computer-usable program code embodied therein.

The present application is described with reference to flowchart illustrations and/or block diagrams of methods, apparatus (systems) and computer program products according to the application. It will be understood that each flow and/or block of the flowchart illustrations and/or block diagrams, and combinations of flows and/or blocks in the flowchart illustrations and/or block diagrams, can be implemented by computer program instructions. These computer program instructions may be provided to a processor of a general purpose computer, special purpose computer, embedded processor, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, create means for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.

These computer program instructions may also be stored in a computer-readable memory that can direct a computer or other programmable data processing apparatus to function in a particular manner, such that the instructions stored in the computer-readable memory produce an article of manufacture including instruction means which implement the function specified in the flowchart flow or flows and/or block diagram block or blocks.

These computer program instructions may also be loaded onto a computer or other programmable data processing apparatus to cause a series of operational steps to be performed on the computer or other programmable apparatus to produce a computer implemented process such that the instructions which execute on the computer or other programmable apparatus provide steps for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.

It will be apparent to those skilled in the art that various modifications and variations can be made in the present application without departing from the spirit or scope of the application. Thus, if such modifications and variations of the present application fall within the scope of the claims and the equivalents thereof, the present application is intended to cover such modifications and variations.

Claims (11)

1. A test apparatus for an electronic device, comprising: the device comprises a detection box, a test platform arranged in a closed space of the detection box, a mechanical arm and control equipment positioned outside the detection box;

the detection box is used for providing a testing environment meeting testing requirements;

the test platform is used for fixing electronic equipment to be tested, and the electronic equipment is used for being electrically connected with the control equipment in the test process so as to send test data generated by the electronic equipment to the control equipment;

the control equipment is used for controlling the mechanical arm to execute a test task and determining a test result of the electronic equipment in the test environment based on test data corresponding to the test task; the test task is to execute touch operation on the electronic equipment.

2. The testing device of claim 1, wherein a first motor and a first sensor are fixed to the mechanical arm, the first motor being electrically connected to the control device, the first sensor being electrically connected to the control device;

the first sensor is used for monitoring the offset angle of the mechanical arm and transmitting the offset angle to the control equipment;

the control device is also used for controlling the first motor according to the offset angle so as to enable the mechanical arm to be at a standard angle.

3. The testing device of claim 1, wherein the robotic arm is secured to the top of the test case by a slide rail and/or the testing platform is secured to the bottom of the test case by a slide rail;

the sliding rail is provided with a second motor, and the second motor is electrically connected with the control equipment;

the control device is also used for controlling the mechanical arm and/or the test platform to slide on the respective slide rail through the second motor.

4. The test apparatus of claim 1, wherein the test platform is a rotatable test platform, and a third motor is provided on the test platform, and the third motor is electrically connected to the control device;

the control device is also used for controlling the test platform to rotate through the third motor.

5. The test device of any one of claims 1-4, further comprising: the image acquisition device is positioned on the mechanical arm and is electrically connected with the control device;

the control equipment is also used for assisting in positioning the mechanical arm according to the image acquired by the image acquisition equipment.

6. The testing device according to any one of claims 1 to 4, wherein a loading member is provided at the end of the mechanical arm, and a pressure sensor is provided on the loading member;

the loading piece is used for loading the stylus; and the mechanical arm executes touch operation on the electronic equipment through the touch pen.

7. The test apparatus of claim 6, further comprising: the storage rack is positioned on the bottom sliding rail in the detection box and is used for placing a plurality of touch pens.

8. A test method of an electronic device, characterized by being applied to the test apparatus as claimed in any one of claims 1 to 7, comprising:

the control equipment acquires a test task;

the control equipment controls the mechanical arm according to the test task and preset parameters so as to enable the mechanical arm to move to a testable position;

the control equipment controls the mechanical arm to test the electronic equipment according to the test task and acquires test data corresponding to the test task;

and the control equipment determines a test result of the electronic equipment under the test environment provided by the detection box based on the test data.

9. The method of claim 8, further comprising, prior to said testing the electronic device:

the control device controls the mechanical arm through the first motor based on the offset angle of the mechanical arm monitored by the first sensor so that the mechanical arm is at a standard angle.

10. The method of claim 8, wherein the control device determining test results of the electronic device in a test environment provided by the test box based on the test data comprises:

and the control equipment determines a test result of the electronic equipment under the test environment provided by the detection box based on the test data and the pressure data monitored by the pressure sensor.

11. A computer readable storage medium, characterized in that it stores a computer program executable by a computer device, which program, when run on the computer device, causes the computer device to perform the steps of the method according to any one of claims 8-10.