CN117558327A - Refresh time testing method, electronic device and storage medium - Google Patents

Refresh time testing method, electronic device and storage medium Download PDF

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Publication number
CN117558327A
CN117558327A CN202210929193.3A CN202210929193A CN117558327A CN 117558327 A CN117558327 A CN 117558327A CN 202210929193 A CN202210929193 A CN 202210929193A CN 117558327 A CN117558327 A CN 117558327A
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China
Prior art keywords
interval time
temperature
refresh
current temperature
test method
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CN202210929193.3A
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Chinese (zh)
Inventor
陈海涛
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Zhongshan Longsys Electronics Co ltd
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Zhongshan Longsys Electronics Co ltd
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Priority to CN202210929193.3A priority Critical patent/CN117558327A/en
Publication of CN117558327A publication Critical patent/CN117558327A/en
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    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G11C29/78—Masking faults in memories by using spares or by reconfiguring using programmable devices
    • G11C29/84—Masking faults in memories by using spares or by reconfiguring using programmable devices with improved access time or stability
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/30—Monitoring
    • G06F11/3058—Monitoring arrangements for monitoring environmental properties or parameters of the computing system or of the computing system component, e.g. monitoring of power, currents, temperature, humidity, position, vibrations
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C11/406—Management or control of the refreshing or charge-regeneration cycles
    • G11C11/40626—Temperature related aspects of refresh operations
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02D—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN INFORMATION AND COMMUNICATION TECHNOLOGIES [ICT], I.E. INFORMATION AND COMMUNICATION TECHNOLOGIES AIMING AT THE REDUCTION OF THEIR OWN ENERGY USE
    • Y02D10/00—Energy efficient computing, e.g. low power processors, power management or thermal management

Abstract

The application provides a refresh time test method, electronic equipment and a storage medium, which are used for testing refresh interval time of a dynamic storage device, wherein the refresh time test method comprises the following steps: determining whether the undetermined interval time meets the equipment operation condition; when the interval time to be determined meets the equipment operation condition, assigning the value of the interval time to be determined to the result interval time; increasing the value of the interval time to be determined according to the increment rule, and determining whether the interval time to be determined meets the equipment operation condition; when the undetermined interval time does not meet the equipment operation condition, determining whether the current temperature meets a first temperature condition; when the current temperature meets the first temperature condition, modifying the value of the undetermined interval time to be an initial value; it is again determined whether the pending interval satisfies the device operating conditions. By adopting the embodiment of the application, the refresh interval time of the dynamic storage device can be adjusted according to the test result, and the performance loss and the power consumption waste generated by refreshing the dynamic storage device can be reduced.

Description

Refresh time testing method, electronic device and storage medium
Technical Field
The present disclosure relates to the technical field of memories, and in particular, to a refresh time testing method, an electronic device, and a storage medium.
Background
Dynamic memory devices are provided in electronic devices such as servers and personal computers to provide temporary data storage media for the system to obtain other program operations. The dynamic memory device may be a dynamic random access memory (Dynamic Random Access Memory, DRAM) including a plurality of base memory cells (cells), a plurality of capacitors and a plurality of diodes connected to form the plurality of base memory cells. When the dynamic random access memory stores information, the capacitors are required to be periodically refreshed, namely periodically charged, so as to maintain the level state in the capacitors and maintain the accurate storage of the information in the basic memory cells.
Currently, a standard interval is generally adopted for the refresh time of the dynamic memory device, and the standard interval is a refresh interval which is common in the related field, well known and accords with the industry standard. When the dynamic memory device is produced by adopting an electronic component with data retention capacity higher than the related industry standard, when the dynamic memory device works at normal temperature, the refresh interval time required by the dynamic memory device on the premise of maintaining accurate storage of information is longer than the standard interval time. When the dynamic memory device uses the standard interval time as the refresh interval time, more performance loss and power consumption waste are generated due to unnecessary refresh of the dynamic memory device.
Disclosure of Invention
In view of the foregoing, it is necessary to provide a refresh time testing method, an electronic device, and a storage medium, which can test refresh interval time and refresh interval time applicable to a dynamic storage device that are not applicable at different temperatures, and the refresh interval time of the dynamic storage device can be adjusted according to a test result, so that unnecessary and frequent refreshes of the dynamic storage device can be reduced, and performance loss and power consumption waste caused by refreshing the dynamic storage device can be reduced.
In a first aspect, embodiments of the present application provide a refresh time testing method for testing refresh interval time of a dynamic memory device, the refresh time testing method including: determining whether the undetermined interval time meets the equipment operation condition; when the undetermined interval time meets the equipment operation condition, assigning the numerical value of the undetermined interval time to the result interval time; increasing the value of the undetermined interval time according to an increment rule, and determining whether the undetermined interval time meets the equipment operation condition; when the undetermined interval time does not meet the equipment operation condition, determining whether the current temperature meets a first temperature condition; when the current temperature meets the first temperature condition, modifying the value of the undetermined interval time to be an initial value; again determining whether the pending interval time satisfies the device operating condition.
Optionally, the refresh time test method further includes: the refresh time test method further comprises the following steps: determining whether the current temperature meets a second temperature condition; and when the current temperature meets the second temperature condition, acquiring target interval time from a plurality of result interval time according to a value selection rule.
Optionally, the refresh time test method further includes: when the undetermined interval time does not meet the equipment operation condition, determining whether the result interval time is an initial value; and when the result interval time is not an initial value, determining whether the current temperature meets the first temperature condition.
Optionally, the refresh time test method further includes: and outputting reminding information when the result interval time is not the initial value.
Optionally, the determining whether the current temperature satisfies the first temperature condition includes: determining whether the current temperature reaches a target temperature in a temperature sequence; when the current temperature reaches the target temperature, the current temperature meets the first temperature condition.
Optionally, the refresh time test method further includes: acquiring the current temperature; and when the undetermined interval time does not meet the equipment operation condition, acquiring a target temperature which is larger than the current temperature in the temperature sequence and has a difference value with the current temperature smaller than the difference value between other temperatures in the temperature sequence and the current temperature.
Optionally, the determining whether the current temperature satisfies a second temperature condition includes: determining whether the current temperature reaches a maximum temperature in a temperature sequence; when the current temperature reaches the maximum temperature, the current temperature satisfies the second temperature condition.
Optionally, the refresh time test method further includes: and when the undetermined interval time does not meet the running condition of the equipment, recording that the undetermined interval time is the error interval time of the current temperature.
In a second aspect, embodiments of the present application provide an electronic device, including: a memory for storing a computer program; a processor for executing the computer program stored by the memory, the processor being configured to perform the refresh time test method as claimed in any one of the preceding claims when the computer program is executed.
In a third aspect, embodiments of the present application provide a storage medium comprising a computer program which, when run on an electronic device, causes the electronic device to perform a refresh time test method as claimed in any one of the preceding claims.
The refresh time testing method, the electronic device and the storage medium provided by the implementation manner of the application can test the refresh interval time and the refresh interval time which are not applicable to the dynamic storage device at different temperatures, and can also obtain a target interval time as the initial refresh and interval time of the dynamic storage device. Unnecessary and frequent refreshing of the dynamic storage device can be reduced, and performance loss and power consumption waste generated by refreshing the dynamic storage device can be reduced.
Drawings
Fig. 1 is a schematic diagram of an electronic device according to an embodiment of the present application.
FIG. 2 is a flow chart of a refresh time test method according to an embodiment of the present application.
Fig. 3 is a flowchart of a refresh time test method according to another embodiment of the present application.
Fig. 4 is a flowchart of a refresh time test method according to another embodiment of the present application.
Description of the main reference signs
Electronic device 100
Dynamic memory device 10
Processor 20
Memory 30
Computer program 31
Temperature detecting member 40
Detailed Description
The technical solutions in the implementation manner of the present application will be clearly and completely described below with reference to the drawings in the implementation manner of the present application, and it is obvious that the described implementation manner is only a part of the implementation manner of the present application, not all the implementation manners.
Referring to fig. 1, fig. 1 is a schematic diagram of an electronic device 100 according to an embodiment of the present application. It will be appreciated that the electronic device 100 is configured to run a refresh time test method for testing the dynamic memory device 10 to derive a refresh interval time applicable to the dynamic memory device 10.
In this embodiment, the electronic device 100 may include a processor 20 and a memory 30. The processor 20 and the memory 30 may be connected and interconnected by a communication bus.
The processor 20 may be a general purpose Central Processing Unit (CPU), a microprocessor, an application-specific integrated circuit (ASIC), or one or more integrated circuits for controlling the execution of the above program schemes.
The Memory 30 may be, but is not limited to, a read-Only Memory (ROM) or other type of static storage device that can store static information and instructions, or an electrically erasable programmable read-Only Memory (EEPROM), a compact disk read-Only Memory (CD-ROM) or other optical disk storage, optical disk storage (including compact disk, laser disk, optical disk, digital versatile disk, blu-ray disk, etc.), magnetic disk storage media or other magnetic storage devices, or any other medium that can be used to carry or store desired program code in the form of instructions or data structures and that can be accessed by a computer. The memory 30 may be stand alone and may be coupled to the processor 20 via a bus. Memory 30 may also be integrated with processor 20.
The memory 30 may store an executing computer program 31 and the processor 20 is configured to execute the computer program 31 stored in the memory 30. The computer program 31 stored in the memory 30 may perform a refresh time test method.
It is to be appreciated that the processor 20 is communicatively coupled to the dynamic storage device 10. In embodiments of the present application, the dynamic memory device 10 is a dynamic random access memory (Dynamic Random Access Memory, DRAM), and the types of dynamic random access memory may include, but are not limited to, DDR4, DDR5, LPDDR4, LPDDR5, etc.
It is understood that the dynamic memory device 10 may include a plurality of basic memory cells (cell units). The dynamic memory device 10 includes a plurality of capacitors and a plurality of diodes, one capacitor and one diode may form one basic memory cell. When the dynamic memory device 10 stores information, it is necessary to periodically refresh the plurality of capacitors, that is, periodically and synchronously charge the plurality of capacitors, so as to maintain the level states in the plurality of capacitors, so that the basic memory cell can accurately store information.
In one implementation, the electronic device 100 may implement a communication connection of the dynamic storage device 10 through a communication connection of the processor 20 with the dynamic storage device 10. In another implementation, the electronic device 100 may include a dynamic storage device 10, where the dynamic storage device 10 and the processor 20 are coupled to each other via a communication bus. The embodiments of the present application are not limited in this regard.
For example, the electronic device 100 may be a personal computer, the processor 20 may be a central processor 20 in the personal computer, the memory 30 may be a hard disk in the personal computer, and the dynamic storage device 10 may be a memory bank in the personal computer.
In this embodiment, the processor 20 executes a refresh time test method when the processor 20 executes the computer program 31. The refresh time test method can adjust the refresh interval time of the dynamic memory device 10 to reduce the refresh frequency of the dynamic memory device 10 exceeding the use requirement of the dynamic memory device 10, and reduce the performance loss and the power consumption waste of the dynamic memory device 10.
Referring to fig. 2, fig. 2 is a flowchart of a refresh time test method according to an embodiment of the present application. It will be appreciated that the subject of the refresh time test method may be the processor 20.
In this embodiment, the refresh time test method may include the following steps:
step S21: the current temperature of the dynamic storage device is obtained.
It is understood that the electronic device 100 may include a temperature sensing element 40. The temperature detecting member 40 is used for detecting the temperature of the dynamic storage device 10. The temperature detecting element 40 is communicatively connected to the processor 20, and the temperature detecting element 40 can output detection information to the processor 20 after detecting the temperature of the dynamic storage device 10, and the processor 20 can determine the temperature of the dynamic storage device 10 by analyzing the detection information.
It is understood that the temperature detecting member 40 may be an electronic device having a temperature detecting function, and the temperature detecting member 40 may be, but is not limited to, a temperature sensor.
In one implementation, the detecting end of the temperature detecting element 40 is connected to the dynamic storage device 10, and the temperature detecting element 40 can directly detect the temperature of the dynamic storage device 10; in another implementation, the temperature detecting unit 40 may detect the temperature of the environment in which the dynamic storage device 10 is located, and the processor 20 runs the refresh time test method using the temperature of the operating environment of the dynamic storage device 10 as the temperature of the dynamic storage device 10. The embodiments of the present application are not limited in this regard.
Step S22: an initial pending interval is obtained.
It is understood that the initial pending interval may be a refresh interval that is common in the relevant art, well known and in compliance with industry standards, and that enables the dynamic memory device 10 to accurately store information at normal temperatures prior to production of the dynamic memory device 10. The initial waiting interval time is known, and the initial waiting interval time may be pre-stored in a temporary storage space of the dynamic storage device 10, and when the processor 20 is connected with the dynamic storage device 10 and the processor 20 works, the processor 20 may acquire the initial waiting interval time from the temporary storage space in the dynamic storage device 10; the initial waiting interval time may also be manually stored in the memory 30, and the processor 20 may obtain the initial waiting interval time from the memory 30 when the processor 20 and the memory 30 are operated. The embodiments of the present application are not limited in this regard.
It is understood that the normal temperature may be a temperature range, and the normal temperature may be a temperature range in which the dynamic storage device 10 can be maintained for the longest period of time when the dynamic storage device 10 is operated in a common environment, such as in a server, a personal computer, or the like, or a temperature range in which the dynamic storage device 10 can be maintained for the longest period of time when the dynamic storage device 10 is operated in an environment. For example, the normal temperature may be 35 degrees celsius to 45 degrees celsius.
It is understood that the pending interval time may be a time in microseconds. For example, the initial pending interval time may be 7.9 microseconds.
It will be appreciated that when the data retention capability of the electronic components employed by the dynamic memory device 10 is higher than the relevant industry standard, and the minimum refresh interval time required by the dynamic memory device 10 at normal temperature may be longer than the refresh interval time commonly known in the relevant art and conforming to the industry standard, that is, the minimum refresh interval time required by the dynamic memory device 10 at normal temperature may be longer than the initial pending interval time, under the condition that the dynamic memory device 10 can accurately store information. The refresh time test method provided by the embodiment of the application can test the dynamic memory device 10 produced by adopting the electronic element with the data retention capacity higher than the related industry standard, and obtain the inapplicable refresh interval time of the dynamic memory device 10 at different temperatures on the premise of accurately storing information; further, the refresh interval time applicable to the dynamic memory device 10 at normal temperature can also be derived.
Step S23: determining whether the interval time to be determined meets the equipment operation condition, and entering step S24 when the interval time to be determined meets the equipment operation condition; when the pending interval time does not satisfy the device operation condition, the process proceeds to step S26.
It will be appreciated that the processor 20 may periodically refresh, i.e., periodically charge, the dynamic memory device 10 according to the pending interval. The device operation condition may be that the dynamic storage device 10 can accurately store information when the dynamic storage device 10 is refreshed by taking the pending interval time as the refresh interval time.
It will be appreciated that the dynamic memory device 10 may capacitively store a charge to represent whether a binary bit (bit) is a 1 or a 0, i.e., whether the base memory cell stores a 1 or a 0 is determined by the charge stored in the capacitor. In reality, since the capacitor has a leakage condition, the capacitor needs to be periodically charged in order to maintain the state of the memory 1 in the basic memory cell of the memory 1. In this embodiment, the method for determining whether the pending interval time satisfies the device operation condition may be to determine whether the basic memory cell of the previous memory 1 in the dynamic memory device 10 can still maintain the state of the memory 1 when the dynamic memory device 10 is refreshed by taking the pending interval time as the refresh interval time. If it is determined whether the basic storage unit of the previous storage 1 in the dynamic storage device 10 can still maintain the state of the storage 1, it can be determined that the to-be-determined interval time satisfies the equipment operation condition; otherwise, determining that the undetermined interval time does not meet the equipment operation condition.
For example, the processor 20 may run a Basic input output system (Basic Input Output System, BIOS), and the processor 20 may determine whether the pending interval satisfies the device operating conditions via an open source tool or algorithm such as Basic Test, rowhammer, and/or SMTest in the BIOS.
Step S24: the value of the resulting interval is adjusted to a value equal to the value of the interval to be determined.
It is understood that the resulting interval time may be a time value having an initial value. When the pending interval satisfies the equipment operating condition, the processor 20 may delete the initial value of the resulting interval and modify the value of the resulting interval to the value of the pending interval.
It is understood that the result interval time and the pending interval time may be data with a time unit or data without a unit, which is not limited in the embodiments of the present application.
It will be appreciated that the initial values of the resulting interval may be pre-stored in the memory 30 prior to operation of the electronic device 100. The embodiments of the present application do not limit the initial value of the result interval time. For example, the initial value of the resulting interval time may be 0.
Step S25: the value of the undetermined interval time is increased according to the increment rule, and the process returns to step S23.
It will be appreciated that, when the predetermined interval time satisfies the device operation condition, the processor 20 may adjust the value of the predetermined interval time according to the brightness enhancement rule, obtain a predetermined interval time having a value greater than the value of the predetermined interval time, and re-determine whether the device operation condition is satisfied according to the adjusted predetermined interval time. In the case where the adjusted pending interval still satisfies the equipment operation condition, the value of the resulting interval obtained in step S24 may be increased after the steps S23 to S25 are repeated a plurality of times.
It is understood that the resulting interval is the expected interval for refreshing the dynamic memory device 10. The resulting increase in the interval time, which represents a reduction in the refresh frequency of the dynamic memory device 10, reduces the performance loss and power consumption waste associated with refreshing the dynamic memory device 10.
It will be appreciated that when the adjusted pending interval still satisfies the device operating condition, indicating that, at the current temperature, the dynamic storage device 10 performs refresh with the adjusted pending interval as the interval time, the dynamic storage device 10 may maintain storage of information, that is, the adjusted pending interval time is closer to the minimum refresh interval time of the dynamic storage device 10 in the current temperature environment than the original pending interval time, and the adjusted result interval time is closer to the minimum refresh interval time of the dynamic storage device 10 in the current temperature environment than the original result interval time.
It can be appreciated that the closer the resulting interval is to the minimum refresh interval of the dynamic memory device 10 in the current temperature environment, the less performance loss and power consumption waste are generated to refresh the dynamic memory device 10 on the basis that the dynamic memory device 10 can be maintained to store accurately.
In one implementation, the increment rule for increasing the pending interval time may be to increase the value of the pending interval time by a preset value, for example by 0.5; in another implementation, the value of the undetermined interval time is multiplied by a natural number greater than 1, for example, multiplied by 1.2; the embodiments of the present application are not limited in this regard.
Step S26: determining whether the result interval time is an initial value, and when the result interval time is the initial value, proceeding to step S27; when the result interval time is not the initial value, the process advances to step S28.
It will be appreciated that when the initial pending interval does not meet the device operating conditions, the resulting interval is not reassigned and remains the initial value. When the initial undetermined interval time meets the equipment operation condition and the adjusted undetermined interval time does not meet the equipment operation condition, the result interval time is not an initial value.
It will be appreciated that when the pending interval does not satisfy the device operating condition and the resulting interval is still an initial value, it may be determined that the dynamic memory device 10 cannot accurately store information when the initial pending interval is taken as the refresh interval. Since the initial waiting interval time is a refresh interval time preset for the dynamic storage device 10 by the producer, when the initial waiting interval time cannot meet the operation condition of the apparatus, the dynamic storage device 10 may have a fault.
Step S27: and outputting reminding information.
It will be appreciated that when the pending interval does not satisfy the device operating condition and the resulting interval is an initial value, it may be determined that the dynamic memory device 10 has failed to achieve accurate storage of information at a refresh interval that is common in the relevant art, well known and in compliance with industry standards. Therefore, at this time, the dynamic storage device 10 may fail, and the processor 20 may output a reminding message to remind the tester to replace or repair the dynamic storage device 10.
It will be appreciated that the initial value of the resulting interval may be a value that is not practically achievable by the refresh interval of the dynamic memory device 10, e.g., the initial value of the resulting interval may be 0.
It will be appreciated that the embodiments of the present application are not limited to the content or form of the reminder information.
In one implementation, processor 20 may output alert information to an external device (not shown) communicatively coupled to electronic device 100, which may include, but is not limited to, a display, a speaker, etc. For example, the processor 20 may control the display to display the text of "memory failure" to alert the tester; for another example, the processor 20 may control the speaker to play a preset alert audio to alert the tester.
It is to be understood that the communication connection may be a wireless communication connection implemented by a wireless network, bluetooth, or the like, or may be a wired communication connection implemented by a data line, an electric wire, or the like, which is not limited in the embodiments of the present application.
In another implementation, the processor 20 may be communicatively coupled to a user terminal (not shown) to enable the communication connection of the electronic device 100 with the user terminal. The processor 20 may output a reminder to the user terminal to remind the tester to replace or repair the dynamic storage device 10. The user terminal may be an electronic terminal having an information communication function, an information processing function, and a man-machine interaction function, and may include, but is not limited to, a smart phone, a smart watch, a tablet computer, and the like.
For example, the user terminal may be a smart phone, and the reminding information output to the user terminal by the processor 20 may be a short message with text content of "memory failure".
It will be appreciated that after the processor 20 outputs the reminding information, the electronic device 100 may be controlled to be turned off to wait for the inspection of the tester.
Step S28: recording the current temperature, and recording the undetermined interval time corresponding to the current temperature as the error interval time.
It will be appreciated that the current temperature corresponds one-to-one to the current pending interval, i.e., the current temperature corresponds one-to-one to the error interval, and the processor 20 may tag the current temperature at the pending interval and store it in the memory 30. The error interval time recorded in the memory 30 can provide a reference for the user when the user uses the dynamic storage device 10 and needs to manually modify the refresh time of the dynamic storage device 10, so that the user is prevented from adopting the error interval time corresponding to a certain temperature as the refresh interval time of the dynamic storage device 10 at the temperature, and the probability that the dynamic storage device 10 cannot accurately store information when the user uses the dynamic storage device 10 is reduced.
Step S29: recording the current temperature and the result interval time corresponding to the current temperature.
It will be appreciated that the current temperature corresponds one-to-one with the current resulting interval time. Processor 20 may mark the current temperature over the resulting interval time and store the target temperature and resulting interval information in memory 30.
It will be appreciated that when the refresh time test method is performed at different temperatures, a plurality of resulting intervals corresponding to the different temperatures, respectively, may be obtained. When the user uses the dynamic memory device 10 and needs to adjust the refresh interval time of the dynamic memory device 10, the plurality of temperatures stored in the memory 30 and the resulting interval time corresponding to the temperatures can be used as references for the user to adjust the refresh interval time. When the user needs to maximize the refresh time of the dynamic storage device 10, the user searches for a result interval time with the corresponding temperature being the same as or similar to the current temperature of the dynamic storage device 10 from the plurality of result intervals, and takes the result interval time as the refresh interval time of the dynamic storage device 10.
In some embodiments, the processor 20 may omit step S28 or step S29 when executing the refresh time test method according to different test requirements. For example, when the test purpose at the time of one test is to learn the error interval time at the current temperature, the refresh time test method performed may not include step S29. For another example, when the test purpose is to learn the refresh interval time closest to the maximum refresh interval time of the dynamic memory device 10 at the current temperature at the time of the test, the refresh time test method performed may not include step S28.
In the embodiment of the present application, the node for obtaining the current temperature of the dynamic storage device 10, that is, the execution of step S21 is not limited. In some embodiments, step S21 is performed before step S22. In other embodiments, step S21 may be performed between step S23 and step S26. In still other embodiments, step S21 may be performed between step S26 and step S27 or between step S27 and step S28, and may be performed between step S27 and step S29.
It will be appreciated that after steps S21 to S29 are performed once, a result interval and an error interval corresponding to the current temperature may be obtained. By executing steps S21 to S29 at different temperatures a plurality of times, it is also possible to obtain the resulting interval time and the error interval time corresponding to the different temperatures. The plurality of resulting intervals and the plurality of error intervals may provide a reference to a user when the user needs to adjust the refresh interval of the dynamic memory device 10.
In some embodiments, after the step S29 and/or the step S28 is performed, the refresh time test method may further include step S210: and acquiring a target temperature which is larger than the current temperature in the temperature sequence and has a difference value with the current temperature smaller than the difference value between other temperatures in the temperature sequence and the current temperature.
In this embodiment, before the refresh test method is performed, a temperature sequence may be preset according to the operable temperature range of the dynamic memory device 10. The operable temperature range of the dynamic storage device 10 may be determined by the material used in the production of the dynamic storage device 10, and the operable temperature of the dynamic storage device 10 may be known, for example, the operable temperature of the dynamic storage device 10 may be 0 to 85 degrees celsius. The temperature sequence includes a plurality of temperatures arranged from small to large in value. In the temperature sequence, the difference between two adjacent temperatures and the difference between the other two adjacent temperatures may be the same or different, which is not limited in the embodiment of the present application.
It is understood that the temperatures in the temperature sequence may be values with or without units, and embodiments of the present application are not limited thereto.
For example, the operable temperature range of the dynamic storage device 10 may be 0 to 85 degrees celsius and the temperature sequence may include 0, 10, 20, 30, 40, 50, 60, 70, 80, 85.
It will be appreciated that the tester may adjust the temperature of the test environment and thus the temperature of the dynamic storage device 10 or the environment in which it is located. The manner in which the tester adjusts the test temperature may include, but is not limited to, adjusting the air speed, temperature, etc. of the air conditioner, which embodiments of the present application do not limit. When the tester makes the current temperature detected by the temperature detecting member 40 equal to the minimum temperature in the temperature series, the worker can control the processor 20 to start executing step S21 and execute steps S22 to S29 for the first time. After the processor 20 executes step S29, the processor 20 may determine that the temperature located in the next order from the current temperature in the temperature sequence from the small to the large is the target temperature.
For example, the temperature sequence may include 0, 10, 20, 30, 40, 50, 60, 70, 80, 85. After the step S28 and/or the step S29 are/is performed, if the current temperature is 0 degrees celsius or the difference between the current temperature and 0 degrees celsius is within the preset error range, the processor 20 determines that the current temperature is 10 degrees celsius as the target temperature when performing the step S210.
Referring to fig. 3, in some embodiments, after the step S210 is performed, the refresh time test method may include the following steps:
step S31: the current temperature of the dynamic storage device 10 is obtained.
Step S32: determining whether the current temperature meets the first temperature condition, and when the current temperature meets the first temperature condition, proceeding to step S33; when the current time does not satisfy the first temperature condition, the process returns to step S31.
It will be appreciated that after the above steps S21 to S210 are performed, the operator can adjust the temperature of the test environment to adjust the temperature of the dynamic storage device 10 or the temperature of the environment. The temperature sensing element 40 may continuously monitor the current temperature of the dynamic storage device 10 and the processor 20 may continuously obtain the current temperature from the temperature sensing element 40.
In some embodiments, the first temperature condition may be that the current temperature reaches a target temperature in a temperature sequence. The method of determining whether the current temperature satisfies the first temperature condition may include: determining whether the current temperature reaches a target temperature in the temperature sequence, and if the current temperature reaches the target temperature, enabling the current temperature to meet a first temperature condition; if the current temperature does not reach the target temperature, the current temperature does not meet the first temperature condition.
It will be appreciated that the target temperature used in the execution of step S31 is obtained in step S210 that was executed last time before the execution of step S31 by the processor 20.
It is understood that when the current temperature is equal to the target temperature or the difference between the current temperature and the target temperature is within a preset error range, it may be determined that the current temperature reaches the target temperature. The embodiments of the present application do not limit the error range. For example, the error range may be ±1 degree celsius.
It will be appreciated that the processor 20 may detect the temperature of the dynamic storage device 10 or the temperature of the environment in which the dynamic storage device 10 is located in real time through the temperature detecting member 40, and when the current temperature obtained by the processor 20 does not reach the target temperature, may continue to obtain a new target temperature and continue to determine whether the target temperature satisfies the first temperature condition.
Step S33: the value of the pending interval time is modified to an initial value and returns to step S22.
It can be appreciated that, in this embodiment, when the current temperature is the minimum temperature in the temperature sequence and the current temperature is determined to be the minimum temperature in the temperature sequence for testing, the result interval time stored in step S29 is greater than the refresh interval time which is commonly used in the related art and is well known and meets the industry standard, i.e. is greater than the initial value of the pending interval time, when the current temperature is the minimum temperature in the temperature sequence for the first time in steps S22 to S210. The tester then increases the temperature of the test environment of the dynamic memory device 10 to test the refresh time of the dynamic memory device 10 at a higher temperature in the temperature sequence. Therefore, steps S22 to S210 can be performed again with the initial value of the predetermined interval time, so as to reduce the problem that the accuracy of the test result is reduced due to the fact that the accurate storage of the information by the dynamic memory device 10 cannot be maintained during the larger predetermined interval time when the refresh interval time test method is started to be performed with the larger predetermined interval time.
It will be understood that after the first execution of steps S21 to S210, the processor 20 starts executing steps S31 to S33, and executes steps S22 to S210 again after the execution of step S33. After the steps S31 to S33 and the steps S22 to S210 are performed multiple times, a plurality of error intervals and a plurality of result intervals corresponding to a plurality of temperatures in the temperature sequence can be obtained. When the user uses the dynamic memory device 10 and needs to adjust the refresh interval time of the dynamic memory device 10, the multiple error intervals and the multiple result intervals corresponding to the multiple temperatures respectively can provide references for the user.
It will be appreciated that when the user is using the dynamic memory device 10 and needs to adjust the refresh interval time, the user may refer to a plurality of error intervals obtained by the refresh time test method, so as to avoid modifying the refresh interval time by an amount equal to or greater than the error interval time corresponding to the current temperature. The user can also refer to a plurality of result interval times obtained by the refresh time test method, and modify the refresh interval time to be equal to or smaller than the result interval time corresponding to the current temperature, so that the refresh interval time of the dynamic memory device 10 is close to the minimum refresh interval time required by the dynamic memory device 10 to maintain accurate storage of information at the current temperature, the refresh times of the dynamic memory device 10 are reduced, the performance loss and the energy consumption waste generated when the dynamic memory device 10 is refreshed can be reduced, and the service life of the dynamic memory device 10 can be prolonged.
Referring to fig. 4, in some embodiments, after the step S210 is performed and before the step S31 is performed, the refresh time test method may include the following steps S44 and S45:
step S41: determining whether the current temperature meets the second temperature condition, and when the current temperature meets the second temperature condition, proceeding to step S42; when the current temperature does not satisfy the second temperature condition, the process advances to step S31.
It is understood that when steps S21 to S210 are performed for the first time, the current temperature in step S41 may be the current temperature acquired by the processor 20 when step S21 is performed. When steps S22 to S29 are performed at least on both sides and steps S31 to S33 are performed at least once, the current temperature in step S41 may be the current temperature acquired by the processor 20 when step S31 is performed.
In some embodiments, the second temperature condition may be that the current temperature reaches a maximum temperature in the temperature sequence. The method of determining whether the current temperature satisfies the second temperature condition may include: determining whether the current temperature reaches the maximum temperature in the temperature sequence, and if the current temperature reaches the maximum temperature, enabling the current temperature to meet a second temperature condition; if the current temperature does not reach the maximum temperature, the current temperature does not meet the second temperature condition.
It will be appreciated that when the current temperature is equal to the maximum temperature in the temperature sequence, or the difference between the current temperature and the maximum temperature in the temperature sequence is within a preset error range, it may be determined that the current temperature reaches the maximum temperature in the temperature sequence. The embodiments of the present application do not limit the error range. For example, the error range may be ±1 degree celsius.
Step S42: and acquiring target interval time from the plurality of result interval time according to the value selection rule.
It will be appreciated that when steps S22 to S210, and steps S31 to S33 are performed a plurality of times, the resulting interval time and the error interval time corresponding to a plurality of temperatures in the temperature sequence may be obtained, and when the processor 20 determines that the current temperature acquired in step S21 or step S31 has reached the maximum temperature in the temperature sequence after one time of the step S210 execution is completed, the processor 20 may stop continuing to perform the refresh time test method after acquiring the target interval time.
It will be appreciated that, after the refresh time test method is finished, the target interval time may be a refresh interval time preset for the dynamic memory device 10 when the production of the dynamic memory device 10 is completed, that is, in a non-extreme environment, the dynamic memory device 10 may accurately store information when the target interval time is taken as the refresh interval time.
In the embodiment of the present application, after the dynamic memory device 10 produced by using the electronic component with the data retention capability higher than the related industry standard is tested, the obtained target interval time is greater than the refresh interval time which is common in the related field, known and accords with the industry standard, and the dynamic memory device 10 realizes the accurate storage of the information at the normal temperature, that is, the standard refresh time is greater than the initial value of the pending interval time when the refresh time test method is executed.
It should be noted that, the embodiment of the present application does not limit the specific content of the value selection rule. For example, the value selection rule may be a median rule, and when the processor 20 executes step S42, the processor 20 takes an intermediate value as a target interval time from among the obtained plurality of result intervals, where the intermediate value is a ranking of the result intervals located in the middle in a ranking of the plurality of result intervals from small to large or from large to small. For another example, the value selection rule may include: obtaining a result interval time corresponding to the normal temperature as a target interval time; for example, the normal temperature may be 35 degrees celsius to 45 degrees celsius, the temperature sequence includes 0, 10, 20, 30, 40, 50, 60, 70, 80, 85, the temperature corresponding to the normal temperature in the temperature sequence is 40 degrees celsius, and according to the value selection rule, the processor 20 obtains the result interval time corresponding to the 40 degrees celsius in the temperature sequence as the target interval time.
It can be appreciated that when the preset refresh interval time of the dynamic storage device 10 is the target interval time, the refresh time of the dynamic storage device 10 can be longer than the refresh interval time which is commonly used in the related field and well known and accords with the industry standard when the user uses the dynamic storage device 10, so that the number of times of refreshing the dynamic storage device 10 can be reduced on the premise of maintaining the stable storage information of the dynamic storage device 10, the performance loss and the power consumption waste generated when refreshing the dynamic storage device 10 can be reduced, and the service life of the dynamic storage device 10 can be prolonged.
The refresh time test method provided by the embodiment of the present application can test the refresh interval time applicable and the refresh interval time inapplicable to the dynamic memory device 10 at different temperatures, namely, the stored result interval time and the error interval time. A target interval may also be determined from among the plurality of resulting intervals so that the dynamic storage device 10 may operate at the target interval after production is complete. The target interval time and the result interval time corresponding to at least part of the temperature are both larger than the refresh interval time which is commonly used in the related field at present and is well known and accords with the industry standard. When the dynamic storage device 10 works practically with the target interval time as the refresh interval or when the user adjusts the interval time to the result interval time corresponding to a certain temperature, the number of times of refreshing the dynamic storage device 10 can be reduced, and the performance loss and the power consumption waste of the equipment for charging the dynamic storage device 10 and the dynamic storage device 10 can be reduced.
The electronic device 100 provided in the embodiments of the present application may perform the refresh time test method shown in fig. 2 to 4. The electronic device 100 performs a refresh time test method that may test for both refresh intervals that are applicable and refresh intervals that are not applicable to the dynamic memory device 10 at different temperatures, i.e., stored result intervals and error intervals. A target interval may also be determined from among the plurality of resulting intervals so that the dynamic storage device 10 may operate at the target interval after production is complete. The performance loss and the power consumption waste of the apparatus for charging the dynamic storage device 10 and the dynamic storage device 10 are reduced.
Based on the same conception, the present embodiment also provides a storage medium including the computer program 31, which when the computer program 31 runs on the electronic device 100, causes the electronic device 100 to execute the refresh time test method provided in the present embodiment.
It will be evident to those skilled in the art that the present application is not limited to the details of the foregoing illustrative embodiments, and that the present application may be embodied in other specific forms without departing from the spirit or essential characteristics thereof. The above-described embodiments of the application are, therefore, to be considered in all respects as illustrative and not restrictive, the scope of the application being indicated by the appended claims rather than by the foregoing description, and all changes which come within the meaning and range of equivalency of the claims are therefore intended to be embraced therein.

Claims (10)

1. A refresh time test method for testing refresh interval time of a dynamic memory device, the refresh time test method comprising:
determining whether the undetermined interval time meets the equipment operation condition;
when the undetermined interval time meets the equipment operation condition, assigning the numerical value of the undetermined interval time to the result interval time;
increasing the value of the undetermined interval time according to an increment rule, and determining whether the undetermined interval time meets the equipment operation condition;
when the undetermined interval time does not meet the equipment operation condition, determining whether the current temperature meets a first temperature condition;
when the current temperature meets the first temperature condition, modifying the value of the undetermined interval time to be an initial value;
again determining whether the pending interval time satisfies the device operating condition.
2. The refresh time test method of claim 1, further comprising:
determining whether the current temperature meets a second temperature condition;
and when the current temperature meets the second temperature condition, acquiring target interval time from a plurality of result interval time according to a value selection rule.
3. The refresh time test method of claim 1, further comprising:
when the undetermined interval time does not meet the equipment operation condition, determining whether the result interval time is an initial value;
and when the result interval time is not an initial value, determining whether the current temperature meets the first temperature condition.
4. The refresh time test method of claim 3, further comprising:
and outputting reminding information when the result interval time is an initial value.
5. The refresh time test method of claim 1, wherein the determining whether the current temperature satisfies a first temperature condition comprises:
determining whether the current temperature reaches a target temperature in a temperature sequence;
when the current temperature reaches the target temperature, the current temperature meets the first temperature condition.
6. The refresh time test method of claim 5, further comprising:
acquiring the current temperature;
and when the undetermined interval time does not meet the equipment operation condition, acquiring a target temperature which is larger than the current temperature in the temperature sequence and has a difference value with the current temperature smaller than the difference value between other temperatures in the temperature sequence and the current temperature.
7. The refresh time test method of claim 2, wherein the determining whether the current temperature satisfies a second temperature condition comprises:
determining whether the current temperature reaches a maximum temperature in a temperature sequence;
when the current temperature reaches the maximum temperature, the current temperature satisfies the second temperature condition.
8. The refresh time test method of claim 1, further comprising:
and when the undetermined interval time does not meet the running condition of the equipment, recording that the undetermined interval time is the error interval time of the current temperature.
9. An electronic device, comprising:
a memory for storing a computer program;
a processor for executing the computer program stored by the memory, the processor being for executing the refresh time test method according to any one of claims 1 to 8 when the computer program is executed.
10. A storage medium comprising a computer program which, when run on an electronic device, causes the electronic device to perform the refresh time test method of any one of claims 1 to 8.
CN202210929193.3A 2022-08-03 2022-08-03 Refresh time testing method, electronic device and storage medium Pending CN117558327A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202210929193.3A CN117558327A (en) 2022-08-03 2022-08-03 Refresh time testing method, electronic device and storage medium

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202210929193.3A CN117558327A (en) 2022-08-03 2022-08-03 Refresh time testing method, electronic device and storage medium

Publications (1)

Publication Number Publication Date
CN117558327A true CN117558327A (en) 2024-02-13

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Country Status (1)

Country Link
CN (1) CN117558327A (en)

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