CN117554779B - ACS (auto-seal) testing equipment for vertical conductive adhesive of metal wire and application method of ACS testing equipment - Google Patents

ACS (auto-seal) testing equipment for vertical conductive adhesive of metal wire and application method of ACS testing equipment Download PDF

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Publication number
CN117554779B
CN117554779B CN202311506663.6A CN202311506663A CN117554779B CN 117554779 B CN117554779 B CN 117554779B CN 202311506663 A CN202311506663 A CN 202311506663A CN 117554779 B CN117554779 B CN 117554779B
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China
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conductive adhesive
spur gear
limiting
friction roller
rotating shaft
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CN117554779A (en
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邬松
周艳萍
李楠
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Suzhou Weifei Semiconductor Co ltd
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Suzhou Weifei Semiconductor Co ltd
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Abstract

The invention discloses metal wire vertical conductive adhesive ACS test equipment and a use method thereof, and relates to the technical field of conductive adhesive test. According to the invention, through the adjusting component, the second rotating shaft is driven intermittently, so that the first friction roller drives the conductive adhesive to feed for a fixed distance, the chip test position and the working position are in a right-facing state when the chip test is carried out, the situation that the chip test result is inaccurate due to the fact that the chip test position and the working position are not right-facing is avoided, the follow-up test is carried out again with time, and the working strength and the working time are increased.

Description

ACS (auto-seal) testing equipment for vertical conductive adhesive of metal wire and application method of ACS testing equipment
Technical Field
The invention relates to the technical field of conductive adhesive testing, in particular to ACS (auto-static testing) equipment for vertical conductive adhesive of a metal wire and a using method thereof.
Background
The conductive adhesive is an adhesive with certain conductivity after solidification or drying, and can connect various conductive materials together to form an electric path between the connected materials, the conductive adhesive becomes an indispensable new material in the electronic industry, and a chip test conductive adhesive feeding device is disclosed in China patent application number 202111496681.1, wherein the chip test conductive adhesive feeding device comprises: the circuit board, conductive adhesive and friction runner are equipped with chip test position and supporting seat on the circuit board, and the conductive adhesive is banded, just is equipped with a plurality of non-overlapping working positions to the chip test position setting on the length direction of conductive adhesive, and friction runner rotates with the supporting seat and is connected, and friction runner and the one end butt of conductive adhesive, and friction runner drives conductive adhesive through the rotation and removes, so that a plurality of working positions just right the chip test position in proper order, realized the quick material loading of conductive adhesive, simplified the process of tearing open, dress conductive adhesive, improved test efficiency. "
This contrast file has only solved prior art, the complicated and low problem of work efficiency of process of changing the conductive adhesive before the chip test, the device specifically rotates through the friction pulley and drives the conductive adhesive and remove, and then make a plurality of work positions just right with the test position in proper order, and test, the device can not ensure that work position and test position are in just right state when detecting, only the manual work judges that there is the error, result of measurement inaccuracy, and the device is equipped with the friction pulley only in one end, result in the conductive adhesive to have the condition that part conductive adhesive still is located the stopper after the test is accomplished, need take out the conductive adhesive through the manual work.
Disclosure of Invention
The invention aims to provide a metal wire vertical conductive adhesive ACS test device and a use method thereof, so as to solve the problems in the background technology.
In order to achieve the above purpose, the present invention provides the following technical solutions: the metal wire vertical conductive adhesive ACS test equipment comprises a circuit board, wherein an installation substrate is fixedly installed at the top end of the circuit board, and bearing frames are respectively and fixedly installed at two sides of the top end of the installation substrate;
the adjusting component is movably connected to the front side of the inner cavity of the left bearing frame and comprises a first rotating shaft which is movably connected to the front side of the inner cavity of the left bearing frame;
the feeding assembly is movably arranged in the inner cavity of the bearing frame and comprises a second rotating shaft which is movably connected to the rear side of the inner cavity of the left bearing frame;
The test assembly is fixedly arranged at the top end of the bearing frame and comprises a mounting frame, and the two top ends of the bearing frame are fixedly arranged at the two ends of the mounting frame respectively.
Preferably, the feeding assembly further comprises a first friction roller, a belt, a third rotation shaft and a second friction roller, the first friction roller is mounted on the second rotation shaft through a flat key, the belt is movably arranged on the second rotation shaft, the third rotation shaft is movably arranged at one end, far away from the second rotation shaft, of the belt, the second friction roller is mounted on the third rotation shaft through a flat key, and the third rotation shaft is movably connected between the front side and the rear side of the inner cavity of the right bearing frame.
Preferably, the top end of the circuit board is provided with a chip test position, a limit groove is formed in the middle of the right side of the mounting substrate, a guide through hole is formed in the top end of the mounting substrate, and the guide through hole is a stepped hole.
Preferably, the test assembly further comprises an electric telescopic rod and a chip test pressure head, the electric telescopic rod is mounted at the middle of the top end of the inner cavity of the mounting frame through a screw, the chip test pressure head is mounted at the telescopic end of the electric telescopic rod through the screw, and the chip test pressure head is located right above the guide through hole.
Preferably, the limiting groove is movably provided with conductive adhesive, the conductive adhesive is in a strip shape, a plurality of non-overlapping working positions are equidistantly arranged in the length direction of the conductive adhesive, and the cross section sizes of the chip testing position and the working positions are equal.
Preferably, the left side the single-phase motor is installed through the screw to the carriage front side, and the left side the control cabinet is installed through the screw to the carriage top, single-phase motor and electric telescopic handle all pass through control cabinet and external power supply electric connection.
Preferably, the adjusting part further comprises a first spur gear, a fixed disc, limiting frames, a supporting rotary disc, limiting blocks, a second spur gear, a rotating handle and a sliding block, the first spur gear is welded on an output shaft of the single-phase motor, the second spur gear is installed on the first rotating shaft through a flat key, the first spur gear is meshed with the second spur gear, the fixed disc is welded on the second rotating shaft, four limiting frames are circumferentially installed on the front side of the fixed disc through screw uniform distribution, the supporting rotary disc is welded on one end, far away from the fixed disc, of the limiting frames, four limiting blocks are circumferentially uniformly welded on the front side of the supporting rotary disc, the rotating handle is welded on one end, far away from the bearing frame, of the first rotating shaft, and the sliding block is welded on one end, far away from the first rotating shaft, of the rear side of the rotating handle.
Preferably, the limiting block is provided with an arc-shaped chute, one end of the rotating handle, which is close to the first rotating shaft, is provided with an arc-shaped surface, one end of the rotating handle, which is provided with the arc-shaped surface, is movably arranged in the arc-shaped chute provided on the limiting block, and the sliding block is movably arranged in the limiting frame.
The application method of the ACS test equipment for the vertical conductive adhesive of the metal wire is characterized by comprising the following steps of:
S1: the method comprises the steps that conductive adhesive passes through a limiting groove, the left end of the conductive adhesive is abutted against a second friction roller, the first friction roller is abutted against the conductive adhesive, a plurality of chips to be tested are fixed on a working position, and in an initial state, a sliding block is movably arranged in a limiting frame;
S2: the single-phase motor is controlled to start through the control console, the single-phase motor rotates to drive the first spur gear to rotate, the first spur gear is meshed with the second spur gear to drive the second spur gear to rotate, the second spur gear drives the rotating handle to rotate through the rotating shaft, the rotating handle rotates to drive the sliding block to move in the limiting frame and drive the supporting rotary table to rotate, the supporting rotary table rotates to drive the fixing disc to rotate through the limiting frame, the fixing disc drives the friction roller I to rotate through the rotating shaft, the friction roller I rotates to drive the conductive adhesive to move in the length direction, meanwhile, the second rotating shaft drives the third rotating shaft to rotate through the belt, the third rotating shaft drives the friction roller II to rotate, and the friction roller II also drives the conductive adhesive to move in the length direction, so that the time required for the chip test position and the working position to be right against is reduced;
S3: when the sliding block is separated from the limiting frame and one end of the rotating handle, provided with an arc surface, starts to enter an arc-shaped chute formed in the limiting block, the supporting turntable stops rotating, at the moment, under the movement of the conductive adhesive, the chip testing position and the working position are in a right-facing state, the electric telescopic rod is started through the control console, the chip testing pressure head is driven to move downwards through the electric telescopic rod until the chip testing pressure head is pressed on the working position, so that the chip to be tested on the conductive adhesive is detected, and the conductivity of the conductive adhesive is detected;
S4: when one end of the rotating handle provided with an arc surface is separated from the arc chute formed in the limiting block, the sliding block starts to enter the limiting block, the supporting turntable starts to rotate, the same operation is carried out according to the steps, and the next detection is carried out.
Compared with the prior art, the invention has the beneficial effects that:
1. According to the invention, through the arranged adjusting component, the second rotating shaft is driven intermittently, so that the first friction roller drives the conductive adhesive to feed for a fixed distance, the chip test position and the working position are in a right-facing state when the chip test is carried out, the situation that the chip test result is inaccurate due to the fact that the chip test position and the working position are not right-facing is avoided, the follow-up test is carried out again with time, and the working strength and the working time are increased;
2. According to the invention, the feeding assembly is arranged, and when the chip test is performed, the first friction roller and the second friction roller are arranged at the two ends of the conductive adhesive, and meanwhile, the conductive adhesive is driven to move, so that the time required for the chip test position and the working position to be opposite is reduced, the working efficiency is improved, and the conductive adhesive can be separated from the limiting groove after the test is completed, and the conductive adhesive does not need to be manually processed.
Drawings
FIG. 1 is a schematic view of a first perspective structure of an embodiment of the present invention;
FIG. 2 is a schematic top view of a circuit board according to an embodiment of the invention;
FIG. 3 is a schematic top view of a conductive paste according to an embodiment of the invention;
FIG. 4 is a schematic perspective view of a mounting base according to an embodiment of the present invention;
FIG. 5 is a schematic perspective view of a feed assembly according to an embodiment of the present invention;
FIG. 6 is a schematic perspective view of a carrying frame according to an embodiment of the present invention;
fig. 7 is an enlarged schematic view of the three-dimensional structure a in fig. 6 according to an embodiment of the present invention.
In the figure: 1. a circuit board; 2.a mounting substrate; 3. a carrying frame; 4. a single-phase motor; 5. an adjustment assembly; 51. a spur gear I; 52. a fixed plate; 53. a limiting frame; 54. a supporting turntable; 55. a limiting block; 56. a first rotating shaft; 57. a spur gear II; 58. a rotating handle; 59. a slide block; 6. a feed assembly; 61. a second rotating shaft; 62. a friction roller I; 63. a belt; 64. a third rotating shaft; 65. friction roller II; 7. a testing component; 71. a mounting frame; 72. an electric telescopic rod; 73. a chip testing pressure head; 8. a console; 9. conducting resin; 10. a chip test bit; 11. a working position; 12. a limit groove; 13. and a guide through hole.
Detailed Description
The following description of the embodiments of the present invention will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present invention, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
Referring to fig. 1-7, the present invention provides a technical solution: the metal wire vertical conductive adhesive ACS test equipment comprises a circuit board 1, wherein a mounting substrate 2 is arranged at the top end of the circuit board 1 through screws, and bearing frames 3 are welded at two sides of the top end of the mounting substrate 2 respectively;
The adjusting component 5 is movably connected to the front side of the inner cavity of the left bearing frame 3, the adjusting component 5 comprises a first rotating shaft 56, and the first rotating shaft 56 is movably connected to the front side of the inner cavity of the left bearing frame 3;
The feeding assembly 6 is movably arranged in the inner cavity of the bearing frame 3, the feeding assembly 6 comprises a second rotating shaft 61, and the second rotating shaft 61 is movably connected to the rear side of the inner cavity of the left bearing frame 3;
The test assembly 7, test assembly 7 fixed mounting is on the top of bearing frame 3, and test assembly 7 includes mounting bracket 71, and two bear the both ends welding of frame 3 top and mounting bracket 71 respectively.
The feeding assembly 6 further comprises a first friction roller 62, a belt 63, a third rotating shaft 64 and a second friction roller 65, the first friction roller 62 is arranged on the second rotating shaft 61 through a flat key, the belt 63 is movably arranged on the second rotating shaft 61, a third rotating shaft 64 is movably arranged at one end, far away from the second rotating shaft 61, of the belt 63, the second friction roller 65 is arranged on the third rotating shaft 64 through a flat key, and the third rotating shaft 64 is movably connected between the front side and the rear side of the inner cavity of the right bearing frame 3; the conductive adhesive 9 is driven to move along the length direction by the arranged feeding component 6;
the top end of the circuit board 1 is provided with a chip test position 10, the middle part of the right side of the mounting substrate 2 is provided with a limit groove 12, the top end of the mounting substrate 2 is provided with a guide through hole 13, and the guide through hole 13 is a stepped hole; limiting the movement of the conductive adhesive 9 through the limiting groove 12;
The test assembly 7 further comprises an electric telescopic rod 72 and a chip test press head 73, the electric telescopic rod 72 is mounted in the middle of the top end of the inner cavity of the mounting frame 71 through screws, the chip test press head 73 is mounted at the telescopic end of the electric telescopic rod 72 through screws, and the chip test press head 73 is located right above the guide through hole 13; testing the conductive adhesive 9 through the arranged testing assembly 7;
The limiting groove 12 is internally and movably provided with a conductive adhesive 9, the conductive adhesive 9 is in a strip shape, a plurality of non-overlapping working positions 11 are equidistantly arranged in the length direction of the conductive adhesive 9, and the cross section sizes of the chip testing positions 10 and the working positions 11 are equal; the conductive adhesive 9 is tested by mounting the chip to be tested on the working position 11;
The front side of the left bearing frame 3 is provided with a single-phase motor 4 through screws, the top end of the left bearing frame 3 is provided with a console 8 through screws, and the single-phase motor 4 and an electric telescopic rod 72 are electrically connected with an external power supply through the console 8; because the single-phase motor 4 and the electric telescopic rod 72 are electrically connected with an external power supply through the control console 8, the single-phase motor 4 and the electric telescopic rod 72 are controlled to be switched on and off through the control console 8;
The adjusting component 5 further comprises a first spur gear 51, a fixed disc 52, limiting frames 53, a supporting turntable 54, limiting blocks 55, a second spur gear 57, a rotating handle 58 and a sliding block 59, wherein the first spur gear 51 is welded on an output shaft of the single-phase motor 4, the second spur gear 57 is installed on the first rotating shaft 56 through a parallel key, the first spur gear 51 is meshed with the second spur gear 57, the fixed disc 52 is welded on the second rotating shaft 61, four limiting frames 53 are uniformly installed on the front side of the fixed disc 52 in the circumferential direction through screws, one end, far away from the fixed disc 52, of each limiting frame 53 is welded with the supporting turntable 54, four limiting blocks 55 are uniformly welded on the front side of the supporting turntable 54 in the circumferential direction, one end, far away from the bearing frame 3, of the first rotating shaft 56 is welded with the rotating handle 58, and one end, far away from the first rotating shaft 56, of the rear side of the rotating handle 58 is welded with the sliding block 59; the feeding assembly 6 is driven to work through the arranged adjusting assembly 5;
An arc-shaped chute is formed in the limiting block 55, an arc-shaped surface is arranged at one end, close to the first rotating shaft 56, of the rotating handle 58, one end, provided with the arc-shaped surface, of the rotating handle 58 is movably arranged in the arc-shaped chute formed in the limiting block 55, and a sliding block 59 is movably arranged in the limiting frame 53; an arc chute is arranged so as to be matched with an arc surface arranged at one end of the rotating handle 58 close to the first rotating shaft 56;
The application method of the ACS test equipment for the vertical conductive adhesive of the metal wire comprises the following steps:
S1: the conductive adhesive 9 passes through the limit groove 12, the left end of the conductive adhesive 9 is abutted against the second friction roller 65, the first friction roller 62 is abutted against the conductive adhesive 9, a plurality of chips to be tested are fixed on the working position 11, and in an initial state, the sliding block 59 is movably arranged in the limit frame 53;
S2: the single-phase motor 4 is controlled to start by the control console 8, the single-phase motor 4 rotates to drive the first spur gear 51 to rotate, the first spur gear 51 drives the second spur gear 57 to rotate because the first spur gear 51 is meshed with the second spur gear 57, the second spur gear 57 drives the rotating handle 58 to rotate through the first rotating shaft 56, the rotating handle 58 drives the sliding block 59 to move in the limiting frame 53 and drives the supporting rotary table 54 to rotate, the supporting rotary table 54 drives the fixed disc 52 to rotate through the limiting frame 53, the fixed disc 52 drives the first friction roller 62 to rotate through the second rotating shaft 61, the first friction roller 62 rotates to drive the conductive adhesive 9 to move in the length direction, meanwhile, the second rotating shaft 61 drives the third rotating shaft 64 to rotate through the belt 63, the third rotating shaft 64 drives the second friction roller 65 to rotate, the second friction roller 65 also drives the conductive adhesive 9 to move in the length direction, and therefore the time required for the chip testing position 10 to be opposite to the working position 11 is reduced;
S3: when the sliding block 59 is separated from the limiting frame 53 and one end of the rotating handle 58 provided with an arc surface starts to enter an arc-shaped chute formed in the limiting block 55, the supporting turntable 54 stops rotating, at the moment, under the movement of the conductive adhesive 9, the chip testing position 10 and the working position 11 are in a right-facing state, the electric telescopic rod 72 is started through the control console 8, and the chip testing pressure head 73 is driven to move downwards through the electric telescopic rod 72 until the chip testing pressure head is pressed on the working position 11, so that a chip to be tested on the conductive adhesive 9 is detected, and the conductivity of the conductive adhesive 9 is detected;
s4: when the end of the rotation handle 58 provided with the arc surface is separated from the arc chute formed on the limiting block 55, the sliding block 59 starts to enter the limiting block 53, the supporting turntable 54 starts to rotate, and the same operation is performed according to the steps, so that the next detection is performed.
It is noted that relational terms such as first and second, and the like are used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Moreover, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus.
Although embodiments of the present invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made therein without departing from the principles and spirit of the invention, the scope of which is defined in the appended claims and their equivalents.

Claims (4)

1. The utility model provides a metal wire vertical conductive adhesive ACS test equipment, includes circuit board (1), its characterized in that: the top end of the circuit board (1) is fixedly provided with a mounting substrate (2), and two sides of the top end of the mounting substrate (2) are respectively fixedly provided with a bearing frame (3);
the adjusting assembly (5), the said adjusting assembly (5) is connected on the front side of inner cavity of the left side bearing frame (3) movably, the said adjusting assembly (5) includes the first rotary shaft (56), the said first rotary shaft (56) is connected on the front side of inner cavity of the left side bearing frame (3) movably;
the feeding assembly (6), the feeding assembly (6) is movably arranged in the inner cavity of the bearing frame (3), the feeding assembly (6) comprises a second rotating shaft (61), and the second rotating shaft (61) is movably connected to the rear side of the inner cavity of the left bearing frame (3);
the test assembly (7), the said test assembly (7) is fixedly mounted on the top of the bearing frame (3), the said test assembly (7) includes the mounting bracket (71), two said top of bearing frame (3) and both ends of the mounting bracket (71) are fixedly mounted separately;
The feeding assembly (6) further comprises a first friction roller (62), a belt (63), a third rotation shaft (64) and a second friction roller (65), the first friction roller (62) is arranged on the second rotation shaft (61) through a flat key, the belt (63) is movably arranged on the second rotation shaft (61), the third rotation shaft (64) is movably arranged at one end, far away from the second rotation shaft (61), of the belt (63), the second friction roller (65) is arranged on the third rotation shaft (64) through a flat key, and the third rotation shaft (64) is movably connected between the front side and the rear side of the inner cavity of the right bearing frame (3);
The chip testing device is characterized in that a chip testing position (10) is arranged at the top end of the circuit board (1), a limit groove (12) is formed in the middle of the right side of the mounting substrate (2), a guide through hole (13) is formed in the top end of the mounting substrate (2), and the guide through hole (13) is a stepped hole;
the testing assembly (7) further comprises an electric telescopic rod (72) and a chip testing pressure head (73), the middle part of the top end of the inner cavity of the mounting frame (71) is provided with the electric telescopic rod (72) through a screw, the telescopic end of the electric telescopic rod (72) is provided with the chip testing pressure head (73) through the screw, and the chip testing pressure head (73) is positioned right above the guide through hole (13);
the chip testing device is characterized in that a conductive adhesive (9) is movably arranged in the limiting groove (12), the conductive adhesive (9) is in a strip shape, a plurality of non-overlapping working positions (11) are equidistantly arranged in the length direction of the conductive adhesive (9), and the cross section sizes of the chip testing positions (10) and the working positions (11) are equal;
The adjusting component (5) further comprises a first spur gear (51), a fixed disc (52), a limiting frame (53), a supporting rotary disc (54), limiting blocks (55), a second spur gear (57), a rotating handle (58) and a sliding block (59), the first spur gear (51) is welded on an output shaft of the single-phase motor (4), the second spur gear (57) is installed on the first rotating shaft (56) through a flat key, the first spur gear (51) is meshed with the second spur gear (57), the fixed disc (52) is welded on the second rotating shaft (61), four limiting frames (53) are installed on the front side circumference of the fixed disc (52) through screw uniform distribution, the supporting rotary disc (54) is welded on one end of the limiting frame (53) away from the fixed disc (52), four limiting blocks (55) are welded on the front side circumference uniform distribution of the supporting rotary disc (54), the rotating handle (58) is welded on one end of the first rotating shaft (56) away from the bearing frame (3), and the sliding block (59) is welded on one end of the rotating handle (58) away from the rear side of the first rotating shaft.
2. The wire vertical conductive paste ACS test device according to claim 1, wherein: the left side load-bearing frame (3) front side is installed single-phase motor (4) through the screw, and the left side load-bearing frame (3) top is installed control cabinet (8) through the screw, single-phase motor (4) and electric telescopic handle (72) are all through control cabinet (8) and external power supply electric connection.
3. A wire vertical conductive adhesive ACS test device according to claim 2, wherein: an arc chute is formed in the limiting block (55), an arc surface is arranged at one end, close to the first rotating shaft (56), of the rotating handle (58), one end, provided with the arc surface, of the rotating handle (58) is movably arranged in the arc chute formed in the limiting block (55), and the sliding block (59) is movably arranged in the limiting frame (53).
4. A method of using a wire vertical conductive adhesive ACS test device according to claim 3, comprising the steps of:
S1: the conductive adhesive (9) passes through the limit groove (12), the left end of the conductive adhesive (9) is abutted with the friction roller II (65), the friction roller I (62) is abutted on the conductive adhesive (9), a plurality of chips to be tested are fixed on the working position (11), and in an initial state, the sliding block (59) is movably arranged in the limit frame (53);
S2: the single-phase motor (4) is controlled to start through the control console (8), the single-phase motor (4) rotates to drive the first spur gear (51) to rotate, the first spur gear (51) is connected with the second spur gear (57) in a meshed mode, the first spur gear (51) drives the second spur gear (57) to rotate, the second spur gear (57) drives the rotating handle (58) to rotate through the first rotating shaft (56), the rotating handle (58) rotates to drive the sliding block (59) to move in the limiting frame (53) and drive the supporting rotary disc (54) to rotate, the supporting rotary disc (54) rotates to drive the fixed disc (52) to rotate through the limiting frame (53), the fixed disc (52) drives the first friction roller (62) to rotate through the second rotating shaft (61), the second friction roller (62) drives the third friction roller (65) to rotate through the belt (63), and the second friction roller (65) also drives the conductive roller (9) to move in the length direction, so that the time required by the chip testing position (10) and the working position (11) is shortened;
S3: when the sliding block (59) is separated from the limiting frame (53) and one end of the rotating handle (58) provided with an arc surface starts to enter an arc chute formed in the limiting block (55), the supporting turntable (54) stops rotating, at the moment, under the movement of the conductive adhesive (9), the chip testing position (10) and the working position (11) are in a right-facing state, the electric telescopic rod (72) is started through the control console (8), the chip testing pressure head (73) is driven to move downwards through the electric telescopic rod (72) until the chip testing pressure head is pressed on the working position (11), so that a chip to be tested on the conductive adhesive (9) is detected, and the conductivity of the conductive adhesive (9) is detected;
S4: when one end of the rotating handle (58) provided with an arc surface is separated from the arc chute formed in the limiting block (55), the sliding block (59) starts to enter the limiting frame (53), the supporting turntable (54) starts to rotate, and the same operation is performed according to the steps, so that the next detection is performed.
CN202311506663.6A 2023-11-14 ACS (auto-seal) testing equipment for vertical conductive adhesive of metal wire and application method of ACS testing equipment Active CN117554779B (en)

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