CN117554709A

CN117554709A - S parameter measurement method for suppressing ripple, electronic device and storage medium

Info

Publication number: CN117554709A
Application number: CN202311567262.1A
Authority: CN
Inventors: 唐章宏; 吴智澳; 王群; 王碧瑶; 施展; 张小栋
Original assignee: Beijing University of Technology
Current assignee: Beijing University of Technology
Priority date: 2023-11-22
Filing date: 2023-11-22
Publication date: 2024-02-13

Abstract

The invention provides an S parameter measurement method for suppressing ripple, electronic equipment and a storage medium, wherein the S parameter measurement method comprises the following steps: selecting a tested piece with the maximum length from a plurality of different lengths of the tested pieces as a first tested piece, and controlling a vector network analyzer to calibrate and sweep the first tested piece in a target test frequency range based on preset scanning power and preset scanning points to determine S parameters of the first tested piece; under the condition that the S parameter is determined to have ripple waves, determining a plurality of new tested pieces by removing the tested piece with the maximum length from the plurality of tested pieces, and repeatedly executing the steps; and determining that the S parameter without the ripple is the target S parameter after the first measured piece inhibits the ripple. According to the invention, the ripple wave of the S parameter caused by the fixed length of the tested piece is restrained by continuously reducing the length of the tested piece, the testing frequency range is not required to be changed, and the accuracy and the stability of the parameter curve measurement of the S parameter in the electromagnetic measurement field are greatly improved.

Description

S parameter measurement method for suppressing ripple, electronic device and storage medium

Technical Field

The present invention relates to the field of electromagnetic measurement technologies, and in particular, to a method for measuring S parameters, an electronic device, and a storage medium for suppressing ripples.

Background

Electromagnetic measurement is an important means for determining the electromagnetic performance of materials, and along with the development of scientific technology, the requirements of radar navigation, aerospace, missile guidance, electronic technology, novel materials and other different fields on the accuracy and stability of the electromagnetic measurement of the materials are higher. In the electromagnetic measurement process, the S parameter is used as an important parameter for electromagnetic measurement, so that ripple phenomenon often occurs, namely resonance, fluctuation, mutation and the like of the curve of the S parameter occur, and the accuracy and stability of a measurement result are reduced. Therefore, how to inhibit the S-parameter ripple occurring in the electromagnetic measurement process is important to ensure the accuracy and stability of the measurement result.

Disclosure of Invention

The invention provides an S parameter measurement method, electronic equipment and storage medium for inhibiting ripples, which are used for solving the defect that the S parameter ripples occur in the existing electromagnetic measurement process, and inhibiting the ripples occurring due to the fact that the S parameter is limited by the fixed length of a measured piece in a manner of continuously reducing the length of the measured piece.

The invention provides an S parameter measurement method for inhibiting ripples, which is applied to a parameter test system, wherein the parameter test system comprises a vector network analyzer, a coaxial cable and a tested piece, and two ends of the coaxial cable are respectively connected with the vector network analyzer and the first tested piece; the method comprises the following steps:

selecting a tested piece with the maximum length from a plurality of different lengths of a plurality of tested pieces as the first tested piece, and controlling the vector network analyzer to calibrate and sweep the first tested piece in a target test frequency range based on preset scanning power and preset scanning points to determine an S parameter of the first tested piece;

removing the measured piece with the maximum length from the plurality of measured pieces under the condition that the S parameter is determined to have ripple waves, so as to obtain an updated measured piece;

determining the updated tested piece as a new tested piece, and repeatedly executing the steps; and determining that the S parameter without the ripple is the target S parameter after the first measured piece inhibits the ripple.

According to the S parameter measurement method for suppressing the ripple, the determination process of the target test frequency range comprises the following steps:

Determining a target measured piece with a preset length from a plurality of different lengths of the measured pieces;

determining the highest test frequency and the lowest test frequency by taking a first preset working wavelength of the target tested piece with the preset length larger than the highest test frequency and a second preset working wavelength of the target tested piece with the preset length larger than the lowest test frequency as targets;

the target test frequency range is determined based on the highest test frequency and the lowest test frequency.

According to the S parameter measurement method for suppressing the ripple, the determination process of the different lengths of the measured pieces comprises the following steps:

the plurality of different lengths are predetermined from a preset length range, and a plurality of tested pieces with the different lengths are prepared in an indication mode; the distance between every two adjacent measured pieces is equal.

According to the S parameter measurement method for suppressing the ripple, the determining process of the preset length range comprises the following steps:

determining the preset length as a maximum length;

determining the working wavelength corresponding to the lowest test frequency in the target test frequency range as the minimum length;

And determining the preset length range based on the maximum length and the minimum length.

According to the S parameter measurement method for suppressing the ripple, provided by the invention, the method further comprises the following steps:

and comparing and analyzing the parameter curve of the S parameter with a preset ripple-free parameter curve, and determining that the S parameter has ripple under the condition that the parameter curve of the S parameter is not matched with the preset ripple-free parameter curve.

under the condition that incident waves vertically incident into the first tested piece are reflected and transmitted for multiple times through the first tested piece, determining a first ratio of the power of all reflected waves in the first tested piece to the power of the incident waves and a second ratio of the power of all transmitted waves in the first tested piece to the power of the incident waves;

and determining that the S parameter has ripple under the condition that the difference between the amplitude of the first ratio and 0 is minimum and/or the difference between the amplitude of the second ratio and 1 is minimum.

According to the S parameter measurement method for suppressing the ripple, the determination process of the first ratio and the second ratio comprises the following steps:

Determining the first ratio and the second ratio based on a reflection coefficient of the first measured piece, a length of the first measured piece, an effective permittivity of the first measured piece, an effective permeability of the first measured piece, and a propagation constant of the incident wave in the first measured piece;

wherein the effective permittivity and the effective permeability are both the permittivity and the permeability of a medium of the same electromagnetic performance as the first measured piece filled with a single medium or filled with at least two media.

and under the condition that at least one target length smaller than the length of the first to-be-tested piece corresponding to the target S parameter exists in the plurality of to-be-tested pieces, controlling the vector network analyzer to respectively calibrate and sweep the first to-be-tested pieces corresponding to the existing at least one target length in the target test frequency range based on the preset scanning power and the preset scanning point number, and determining the target S parameter after each suppression of the ripple of all the first to-be-tested pieces in the plurality of to-be-tested pieces.

The invention also provides an electronic device comprising a memory, a processor and a computer program stored on the memory and capable of running on the processor, wherein the processor realizes the S parameter measurement method for suppressing the ripple when executing the program.

The present invention also provides a non-transitory computer readable storage medium having stored thereon a computer program which, when executed by a processor, implements the S parameter measurement method of suppressing ripple as described in any one of the above.

According to the S parameter measurement method for suppressing the ripples, the electronic equipment and the storage medium, the S parameter obtained by calibrating and sweeping the first tested piece in the target test frequency range by the control vector network analyzer is used as the first tested piece by the electronic equipment, when the S parameter is determined to have the ripples, the maximum length of the ripples is removed from different tested pieces with different lengths, the tested piece with the maximum length is redetermined to serve as the first tested piece, and the calibration and sweeping test is repeated based on the redetermined first tested piece until the target S parameter of the first tested piece after the ripples are suppressed is determined. Therefore, the ripple wave generated by the fact that the S parameter is limited by the fixed length of the tested piece can be restrained by continuously reducing the length of the tested piece, and the test frequency range, the scanning power and the scanning point number do not need to be changed in the whole calibration test process, so that the accuracy and the stability of the parameter curve measurement of the S parameter in the electromagnetic measurement field are effectively improved on the premise of not increasing the measurement cost and the test complexity.

Drawings

In order to more clearly illustrate the invention or the technical solutions of the prior art, the following description will briefly explain the drawings used in the embodiments or the description of the prior art, and it is obvious that the drawings in the following description are some embodiments of the invention, and other drawings can be obtained according to the drawings without inventive effort for a person skilled in the art.

FIG. 1 is a flow chart of a method for testing S parameters for suppressing ripples;

FIG. 2 is a schematic diagram of the S-parameter testing system according to the present invention;

fig. 3A is a schematic cross-sectional view of a coaxial line provided by the present invention;

fig. 3B is a schematic perspective view of a coaxial line provided by the present invention;

fig. 4A is a schematic cross-sectional view of a microstrip line provided by the present invention;

fig. 4B is a schematic perspective view of a microstrip line provided by the present invention;

FIG. 5 is a schematic diagram of a transmission process of the first measured member for the incident electromagnetic wave according to the present invention;

FIG. 6 is a schematic diagram showing the first two reflection and transmission responses of the first device under test to the incident electromagnetic wave;

FIG. 7 is a schematic diagram of the transmission of electromagnetic waves through a three-layer medium according to the present invention;

FIG. 8 is a schematic diagram of an amplitude curve of an S parameter of a first tested member using a coaxial line according to the present invention;

FIG. 9 is a schematic diagram of a second amplitude curve of the S parameter of the coaxial line as the first tested piece according to the present invention;

fig. 10 is a schematic diagram of an amplitude curve of an S parameter of a first tested element using the microstrip line provided by the present invention;

FIG. 11 is a second schematic diagram of an amplitude curve of the S parameter of the microstrip line as the first tested piece according to the present invention;

FIG. 12 is a schematic structural diagram of an S parameter testing apparatus for suppressing ripple waves provided by the present invention;

fig. 13 is a schematic structural diagram of an electronic device provided by the present invention.

Detailed Description

For the purpose of making the objects, technical solutions and advantages of the present invention more apparent, the technical solutions of the present invention will be clearly and completely described below with reference to the accompanying drawings, and it is apparent that the described embodiments are some embodiments of the present invention, not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.

The invention is described below with reference to fig. 1 to 13, which illustrate a method for testing S parameters for suppressing ripple, an electronic device, and a storage medium, wherein the method for testing S parameters for suppressing ripple is applied to a parameter testing system, the parameter testing system includes a vector network analyzer, a coaxial cable, and a tested piece, and two ends of the coaxial cable are respectively connected to the vector network analyzer and the first tested piece; in addition, an execution main body of the S parameter testing method for inhibiting the ripple is electronic equipment, the electronic equipment is connected with a vector network analyzer in the parameter testing system, and the electronic equipment at least has a frequency range determining function, a length range determining function and a calibration testing control function; the electronic device can be a personal computer (Personal Computer, PC), a notebook computer, a tablet computer and other devices; further, the S parameter test method for suppressing the ripple may be applied to an S parameter test device for suppressing the ripple provided in the electronic apparatus, where the S parameter test device for suppressing the ripple may be implemented by software, hardware, or a combination of both. The following describes the S parameter test method for suppressing the ripple, taking the execution subject of the S parameter test method for suppressing the ripple as a controller built in the electronic device as an example.

In order to facilitate understanding of the method for testing the S parameter for suppressing the ripple provided by the embodiment of the present invention, the method for testing the S parameter for suppressing the ripple provided by the present invention will be described in detail by the following several exemplary embodiments. It is to be understood that the following several exemplary embodiments may be combined with each other and that some embodiments may not be repeated for the same or similar concepts or processes.

Referring to fig. 1, a flow chart of the method for testing S parameters for suppressing ripples provided by the present invention is shown in fig. 1, and the method for testing S parameters for suppressing ripples includes the following steps 110 to 130.

Step 110, selecting a measured piece with the maximum length from a plurality of different lengths of a plurality of measured pieces as a first measured piece, and controlling a vector network analyzer to calibrate and sweep frequency test the first measured piece in a target test frequency range based on preset scanning power and preset scanning points to determine an S parameter of the first measured piece.

The lengths of the measured pieces are different, the materials of the measured pieces are the same, for example, coaxial lines with different lengths or microstrip lines with different lengths, each measured piece can be equivalent to a symmetrical two-port network, and the first measured piece with the maximum length in the measured pieces with different lengths can also be equivalent to the symmetrical two-port network; for example, referring to the schematic structural diagram of the parameter testing system shown in fig. 2, two different ports of the vector network analyzer may be connected to one ends of two coaxial cables, where, as shown in fig. 2, the other ends of the two coaxial cables are respectively connected to two ports of the first tested piece; so as to simplify the analysis of the electromagnetic response of a homogeneous test piece. In addition, the S-parameter (i.e., scattering parameter) can be used to evaluate the performance of reflected and transmitted signals from the device under test (Device Under Test, DUT).

Specifically, in step 110, for a plurality of pre-prepared measured pieces with different lengths, a measured piece with the maximum length may be selected from the plurality of measured pieces as the first measured piece, and a mapping relationship between a medium filler and a length range may be pre-stored in the electronic device, where the mapping relationship may be determined according to human actual experience and/or other manners such as combining relevant records in cloud big data; determining the mapping relation, namely limiting the maximum length and the minimum length of the tested piece for preparing different medium fillers, wherein the length of the S parameter ripple of the tested piece and the length of the tested piece for inhibiting the S parameter ripple are necessarily included in the tested pieces with different lengths prepared between the maximum length and the minimum length; for example, the maximum length must have ripple and the minimum ripple must not have ripple.

Based on the above, when a plurality of measured pieces with different lengths are prepared based on the mapping relation, the plurality of different lengths of the plurality of measured pieces can be input into the electronic equipment, wherein the input modes include, but are not limited to, modes such as input on application of the terminal equipment, voice input, photographing input and the like; for example, the image recognition method may be obtained by a manner that a user manually inputs a plurality of different lengths of a plurality of pieces to be tested in other electronic device applications connected to the electronic device, or by a manner that the user or other electronic devices outputs a plurality of different lengths of a plurality of pieces to be tested through voice, or by a manner that photographed images containing a plurality of different lengths of pieces to be tested are uploaded to the electronic device for image recognition. The present invention is not particularly limited herein.

At this time, when the electronic device selects a measured piece with the maximum length from a plurality of different lengths of the measured pieces as a first measured piece, the vector network analyzer may be controlled to start the calibration and the sweep test on the first measured piece within the target test frequency range based on the preset scan power (for example, 1W) and the preset scan point number (for example, 201), that is, a control instruction may be issued to the vector network analyzer, where the control instruction is used to instruct the vector network analyzer to start the calibration and the sweep test; thereby obtaining the S parameter of the first measured piece.

It should be noted that, in order to design the characteristic impedance of the first tested piece conveniently, the invention adopts the effective dielectric constant and the effective magnetic permeability to represent the electromagnetic performance of the first tested piece in the test environment, when the coaxial line is used as the first tested piece, the coaxial line is filled with a uniform medium, the cross section of which is shown in fig. 3A, and the dielectric constant and the magnetic permeability of the medium are the effective dielectric constant and the effective magnetic permeability of the coaxial line, which are the dielectric constant and the effective magnetic permeability of the coaxial line; a schematic perspective view of the coaxial line is shown in fig. 3B, and the coaxial line comprises an outer conductor, a shielding layer, an inner conductor and a dielectric layer, wherein the inner conductor and the outer conductor are made of copper, the middle dielectric material is polytetrafluoroethylene, and the effective dielectric constant and the effective magnetic permeability of the coaxial line are respectively 2.1 epsilon ₀ Sum mu ₀ The outer diameter of the coaxial line is 7mm, the inner diameter of the coaxial line is 3mm, and the length of the coaxial line is 15mm; wherein ε ₀ Represents the dielectric constant in vacuum, μ ₀ Representing permeability in vacuum.

When the microstrip line is used as a first tested piece, the microstrip line is filled with two or more media, and the section of the microstrip line is shown in fig. 4A, and the microstrip line comprises a conductor strip 401, a grounding plate 402 and a dielectric layer 403; the perspective schematic diagram of the microstrip line is shown in fig. 4B, and includes a conductor strip, a dielectric layer and a ground plate; in FIG. 4B, the material of the conductor strip and the ground plate are copper, the material of the dielectric substrate is Rogers5880, and the effective permittivity and effective permeability of the microstrip line are 1.8ε, respectively ₀ Sum mu ₀ The thickness of the conductor strip is 35 mu m, the width of the conductor strip is 0.6mm, the thickness of the dielectric substrate is 0.508mm, the thickness of the grounding plate is 35 mu m, the width of the microstrip line is 20mm, and the length of the microstrip line is 50mm; at this time, the effective dielectric constant and the effective magnetic permeability of the microstrip line can be obtained by using a conformal mapping method, and the solving process is as shown in formulas (1) and (2).

In the formulas (1) and (2), ε _eff Represents the effective dielectric constant, mu _eff Representing effective permeability, epsilon ₀ Represents the dielectric constant in vacuum, μ ₀ Represents permeability in vacuum, q ₀ Representing the filling factor of the air layer; q _i (i=1, 2, …, n+m) represents the filling factor of the i-th layer medium, satisfying: represents the relative dielectric constant, mu, of the i-th layer medium _r(i) (i=1, 2, …, n+m) represents the relative permeability of the i-th layer medium,n represents the number of dielectric layers below the conductor strip in the microstrip line, i.e. dielectric layers 1,2, …, n below the conductor strip in the microstrip line, and m represents the number of dielectric layers above the conductor strip in the microstrip line, i.e. n+1, n+2, …, n+m above the conductor strip in the microstrip line.

Based on the characteristic impedance of the first measured piece is not matched with the characteristic impedance of the signal source, and the parameter test system provided by the invention is particularly a non-matching test system, so that the reflection and transmission response of the first measured piece to electromagnetic waves is increased; compared with the matching, the characteristic impedance of the first measured piece and the characteristic impedance of the signal source are not matched, the reflection characteristic and the transmission characteristic of the first measured piece for electromagnetic waves output by the vector network analyzer are both increased, and the fluctuation degree of the curve amplitude of the S parameter obtained by testing is also increased; in addition, the unmatched degree of the characteristic impedance of the first measured piece and the characteristic impedance of the signal source is determined by the reflection coefficient R of the two ends of the first measured piece; r=0 indicates that the characteristic impedance of the first measured member is matched with the characteristic impedance of the signal source, and the larger the difference between the absolute value of R and 0 is, the larger the degree of mismatch between the characteristic impedance of the first measured member and the characteristic impedance of the signal source is; if the absolute value of R is too large, the transmission characteristic of the first measured piece to the incident electromagnetic wave is extremely small, and if the absolute value of R is too small, the reflection characteristic of the first measured piece to the incident electromagnetic wave is extremely small; based on the above, the R value is preset, and is not suitable to be too large or too small, and the value range is generally |R|=0.1-0.8; the characteristic impedance of the signal source is known, and the R value and the characteristic impedance of the signal source are used to determine the characteristic impedance of the first measured member, where the characteristic impedance of the first measured member can be calculated by equation (3).

In the formula (3), R represents the reflection coefficient of two ends of the first tested piece, Z _L Representing the characteristic impedance of the first measured member, Z _C Representing the characteristic impedance of the signal source.

Then, according to the obtained characteristic impedance of the first measured piece, the effective dielectric constant and the effective magnetic permeability of the first measured piece and the characteristic impedance design formulas of the first measured piece shown in formulas (4) - (7), the section size of the first measured piece can be further obtained, and the design of the section size of the unmatched measured piece is realized.

When the coaxial line is used as the first test piece, the cross-sectional dimensions thereof (inner diameter a and outer diameter b of the coaxial line) can be determined by formula (4).

In the formula (4), the amino acid sequence of the compound,representing the characteristic impedance, epsilon, of the coaxial line _eff Represents the effective dielectric constant, mu, of the coaxial line _eff The effective permeability of the coaxial line is represented, b represents the outer diameter of the coaxial line, and a represents the inner diameter of the coaxial line.

When the microstrip line is used as the first test piece, the cross-sectional dimensions thereof (dielectric substrate thickness h and conductor strip width w) can be determined by equations (5) to (7).

In the formulas (5) to (7),representing the characteristic impedance of the microstrip line, ε _eff Represents the effective dielectric constant, mu, of the microstrip line _eff Indicating the effective permeability of the microstrip line, h indicating the thickness of the dielectric substrate of the microstrip line, t' indicating the conductor of the microstrip line The thickness of the tape.

And 120, removing the measured piece with the maximum length from the measured pieces under the condition that the ripple exists in the S parameter, and obtaining the updated measured piece.

Step 130, determining the updated tested piece as a plurality of new tested pieces, and repeatedly executing step 110 and step 120; and determining the S parameter without ripple as a target S parameter, and determining the first measured piece corresponding to the target S parameter as a second measured piece capable of inhibiting the S parameter ripple.

Specifically, for a measured piece with the maximum length selected from different lengths of a plurality of measured pieces for the first time as a first measured piece, that is, an S parameter determined for the first time by controlling a vector network analyzer, the measured piece can be used as a first S parameter, and it is determined that the first S parameter has certain ripple; when the electronic device obtains the first S parameter through controlling the vector network analyzer, the maximum length may be moved from a plurality of different lengths, and the measured piece with the maximum length is selected again from the different lengths of the remaining plurality of measured pieces as a new first measured piece, and the steps 110 and 120 are executed in a return manner.

Otherwise, for the S parameter which is not determined for the first time by the control vector network analyzer, the S parameter may be the second S parameter, and at this time, the parameter curve of the second S parameter may be analyzed to determine whether at least one of the conditions of resonance, fluctuation, mutation, and the like exists in the parameter curve of the second S parameter, and if it is determined that the condition of resonance, fluctuation, mutation, and the like does not exist in the parameter curve of the second S parameter, it may be determined that the condition of resonance, fluctuation, mutation, and the like does not exist in the parameter curve of the second S parameter, and the second S parameter without the existence of the ripple is determined as the target S parameter after the first measured piece inhibits the ripple; on the contrary, if it is determined that at least one of resonance, fluctuation, abrupt change, and the like exists in the parameter curve of the second S parameter, it may be determined that the second S parameter has a ripple,

The electronic equipment can sort a plurality of different lengths of a plurality of tested pieces from large to small, select the tested piece with the maximum length as a first tested piece to perform calibration and scanning test based on the sorting result, then determine whether the first S parameter obtained by the test has ripple, namely select the tested piece with the maximum length as a new first tested piece to perform calibration and scanning test, and judge whether the second S parameter obtained again has ripple; steps 110 and 120 are cyclically executed in this manner until it is determined that the second S parameter in which no ripple exists is the target S parameter after the first measured piece suppresses the ripple.

It should be noted that, because the characteristic impedance of the tested piece is not matched with the characteristic impedance of the signal source, the phenomenon of presenting and suppressing the ripple can be amplified under the condition that whether the ripple exists or not is not changed by utilizing the characteristic of the mismatch, and the method for suppressing the S parameter ripple is obtained by measuring a plurality of pre-designed and prepared tested pieces with different lengths, namely, the ratio of the length of the first tested piece to the working wavelength of the first tested piece is kept to be smaller than or equal to A in the target test frequency range; wherein A is the maximum value of the ratio of the length of the first measured piece to the working wavelength of the first measured piece.

The electronic device may determine that the second S parameter has a ripple when at least one of a resonance, a fluctuation, and a sudden change occurs in the parameter curve of the second S parameter by analyzing a change condition of the amplitude curve of the S parameter, where the ripple must occur when the length of the measured piece is close to one half of the operating wavelength and an integer multiple thereof in the target test frequency range, that is, when a is close to 0.5, at this time, the first measured piece may be redetermined from a plurality of different lengths of a plurality of measured pieces, and repeatedly performing steps 110 and 120 to redefine the second S parameter instead of the second S parameter obtained last time; and obtaining the target S parameter after the first measured piece inhibits the ripple. If it is determined that the second S parameter does not have the ripple, the second S parameter that does not have the ripple is the target S parameter after the first measured piece suppresses the ripple when the first measured piece is measured and selected from a plurality of measured pieces of different lengths, which are designed and prepared in advance, while maintaining the target test frequency range.

According to the S parameter testing method for suppressing the ripple, provided by the embodiment of the invention, the electronic equipment is used for controlling the S parameter obtained by calibrating and sweeping the first tested piece in the target testing frequency range by the vector network analyzer, when the S parameter is determined to have the ripple, the tested piece with the maximum length is removed from different tested pieces with different lengths and the maximum length is redetermined as the first tested piece, and the calibration and sweeping testing is repeated based on the redetermined first tested piece until the target S parameter of the first tested piece after the ripple suppression is determined. Therefore, the ripple wave generated by the fact that the S parameter is limited by the fixed length of the tested piece can be restrained by continuously reducing the length of the tested piece, and the test frequency range, the scanning power and the scanning point number do not need to be changed in the whole calibration test process, so that the accuracy and the stability of the parameter curve measurement of the S parameter in the electromagnetic measurement field are effectively improved on the premise of not increasing the measurement cost and the test complexity.

Based on the above-mentioned S-parameter test method for suppressing ripples shown in fig. 1, in an exemplary embodiment, for a target test frequency range required in the whole scan test process, the relationship between the operating wavelength of a maximum length of a plurality of test pieces under test at different test frequencies and the maximum length may be determined. Based on this, the determination process of the target test frequency range may specifically include:

firstly, determining a target measured piece with a preset length from a plurality of different lengths of a plurality of measured pieces; still further, the highest test frequency and the lowest test frequency are determined by taking a first preset working wavelength with a preset length larger than the highest test frequency of the target tested piece and a second preset working wavelength with a preset length larger than the lowest test frequency of the target tested piece as targets; then, a target test frequency range is determined based on the highest test frequency and the lowest test frequency.

Specifically, the electronic device may select a measured piece with a maximum length from a plurality of different lengths of the plurality of measured pieces as a target measured piece with a preset length, and may determine the highest test frequency by using a target measured piece with a half of a working wavelength of the target measured piece under the highest test frequency within the target test frequency range smaller than the preset length of the target measured piece as a target; determining that the second percent of working wavelength of the target tested piece under the lowest test frequency in the target test frequency range is smaller than the preset length of the target tested piece as a target, and determining the lowest test frequency; the test frequency range containing the lowest test frequency and the highest test frequency obtained in this way is the target test frequency range.

It should be noted that, the objective test frequency range is set in this way in order to obtain the S parameter (e.g. the first S parameter obtained by the first test) with the ripple wave, so that the objective S parameter without the ripple wave can be rapidly and accurately determined by performing calibration and sweep test in the objective test frequency range in a manner of continuously reducing the length of the tested piece.

Based on the above-mentioned S parameter test method for suppressing the ripple shown in fig. 1, in an exemplary embodiment, in order to ensure that there must be a tested piece containing the S parameter ripple and a tested piece suppressing the S parameter ripple among a plurality of pre-prepared tested pieces with different lengths, a plurality of tested pieces with equidistant lengths may be prepared within a preset length range. Based on this, the specific determination process of the plurality of different lengths of the plurality of measured pieces may include:

a plurality of different lengths are predetermined from a preset length range, and a plurality of tested pieces with different lengths are prepared in an indication mode; the distance between every two adjacent measured pieces is equal.

The preset length range may be a length range including a maximum length and a minimum length, and the S parameter of the measured piece with the maximum length has a ripple, and the S parameter of the measured piece with the minimum length has no ripple; in addition, the preset length range can be determined according to the length of a target measured piece with preset length in the measured pieces with different lengths.

Specifically, the electronic device may determine p equidistant lengths from a preset length range, where the p lengths are different from each other, and instruct to prepare p tested pieces with p lengths, where the prepared p tested pieces are filled with the same type of medium, for example, coaxial lines filled with a single medium, or microstrip lines filled with at least two types of medium; the value range of p is more than or equal to L _b /(B·λ)，L _b ＝|L _max -L _min |，L _max Represents the maximum length of the preset length range, L _min The minimum length of the preset length range is represented, and lambda represents the working wavelength of the target measured piece; b is a preset constant, the value of B is the standard that the measured piece ripple with the equidistant adjacent length can be obviously observed, and the value range of B is more than or equal to 0.005. Therefore, the aim of designing and preparing a plurality of tested pieces with different lengths in advance in the preset length range is fulfilled.

Exemplary, based on the above-mentioned S parameter test method for suppressing ripple shown in fig. 1, in an exemplary embodiment, the determining process of the preset length range includes:

determining preset lengths of a plurality of different lengths of a plurality of tested pieces as maximum lengths, and further determining the working wavelength corresponding to the lowest test frequency in the target test frequency range as minimum length; then, a preset length range is determined based on the maximum length and the minimum length.

Specifically, the electronic device may determine a preset length of a plurality of different lengths of the plurality of measured pieces as a maximum length, where the preset length is the maximum length of the plurality of different lengths; and determining the working wavelength corresponding to the lowest test frequency in the target test frequency range as the minimum length of the tested piece, so that the minimum length is equal to the two-hundredth working wavelength of the tested piece under the lowest test frequency. Exemplary, when the maximum length of the preset length range is L _max Minimum length L _min When the length L of each measured piece in the plurality of measured pieces with different lengths which are designed and prepared in advance is L _max >L≥L _min 。

It should be noted that, the setting of the target frequency test range and the design and preparation of the different lengths of the tested pieces in this way are to avoid that the length of the tested piece in the target frequency test range is equal to or close to an integer multiple of one half wavelength, and ensure that the length of the tested piece for effectively suppressing the S-parameter ripple is included in the value range of the length of the pre-designed and prepared tested piece, that is, the preset length range; if the length of the tested piece is equal to or close to an integral multiple of half of the working wavelength at a certain frequency in the target test frequency range, the phenomena of resonance, fluctuation, mutation and the like can occur in the parameter curve of the S parameter, namely the parameter curve of the S parameter has ripple waves; the reason for this phenomenon is also the reason for setting the lowest test frequency of the target test frequency range and designing and preparing a plurality of tested pieces of different lengths in advance, and can be analyzed sequentially from three aspects of phase superposition and cancellation, multilayer medium propagation and transmission reflection theory.

For the phase superposition and cancellation of the S parameter, consider that the electromagnetic wave perpendicularly enters the first measured piece, and the electromagnetic wave is reflected and transmitted for multiple times through the first measured piece, the electromagnetic wave transmission process is shown in fig. 5, as the transmission times increase, the phase of the electromagnetic wave gradually increases, but the intensity gradually weakens, so that the phase superposition and cancellation only determines the phase difference between the secondary reflected wave and the primary reflected wave and the phase difference between the secondary transmitted wave and the primary transmitted wave, and the superposition and cancellation condition of the amplitude of the reflected wave and the amplitude of the transmitted wave is obtained, and fig. 6 is a schematic diagram of the first measured piece for the first two reflection and transmission responses of the incident electromagnetic wave.

According to the electromagnetic wave transmission principle and characteristics, the phase difference of the multiple reflected wave and the primary reflected wave, and the phase difference of the multiple transmitted wave and the primary transmitted wave can be represented by equations (8) and (9).

In the formulas (8) and (9),representing the phase difference of the reflected wave +.>Represents the phase difference of the transmitted wave, ω represents the angular frequency, t represents the time of the electromagnetic wave passing through the first measured memberL represents the length of the first measured piece, and lambda' represents the working wavelength of the first measured piece.

And obtaining the maximum anti-phase cancellation of the reflected wave, the minimum amplitude, the maximum in-phase superposition of the transmitted waves and the maximum amplitude when the length of the first measured piece is half wavelength and integer multiple thereof according to the phase difference between the secondary reflected wave and the primary reflected wave and the phase difference between the secondary transmitted wave and the primary transmitted wave.

For the propagation of the multi-layer medium, the electromagnetic wave is considered to be perpendicularly incident to the first measured piece, and the number of layers of the medium structure is not limited, and here, the three-layer medium is taken as an example, and the conclusion can be applied to the multi-layer medium. The transmission process of the electromagnetic wave in the medium with the three-layer structure is shown as fig. 7, namely a medium 1, a medium 2 and a medium 3 are sequentially arranged from left to right, the medium 1 and the medium 3 are semi-infinitely long mediums, the electromagnetic wave is close to electromagnetic measurement conditions, and the electromagnetic wave is vertically incident.

As shown in fig. 7, the three-layer medium has two medium interfaces, interface 1 and interface 2, which affect electromagnetic wave transmission, and the reflection coefficient and transmission coefficient of each interface are shown in formulas (10) to (14).

In the formulae (10) to (14), R ₂ Representing the reflection coefficient at interface 2, τ ₂ Representing the transmission coefficient at interface 2, R ₁ Representing the reflection coefficient at interface 1, τ ₁ Representing the position at interface 1Transmission coefficient, eta ₁ Representing the wave impedance, eta of the medium 1 ₂ Representing the wave impedance, eta of the medium 2 ₃ Representing the wave impedance of the medium 3, gamma ₂ Representing the propagation constant of an electromagnetic wave in the medium 2, l ₂ Representing the length of the medium 2; η (eta) _ef Representing the equivalent wave impedance of medium 2 and medium 3 at interface 1, can be expressed as:

when the length of the intermediate medium in the three-layer medium structure is one half of the working wavelength and integral multiple thereof, the wave impedance eta of the other two media ₁ And eta ₃ The same method can lead the obtained electromagnetic wave to pass through the three-layer medium structure without loss, and the incident electromagnetic wave completely passes through the first measured piece without reflected wave; according to the electromagnetic wave transmission analysis of the three-layer medium structure, the method can be expanded to the electromagnetic wave transmission analysis of the medium structure with more than three layers.

For the transmission reflection method, considering that electromagnetic waves perpendicularly enter a first tested piece, the reflection and transmission response of the first tested piece to the incident electromagnetic waves for a plurality of times are shown as a ratio S of all reflected wave power to incident wave power in FIG. 5 ₁₁ Ratio S of all transmitted wave power to incident wave power ₂₁ The expression (15) to (17) can be expressed.

In the formulas (15) to (17), R represents the reflection coefficient of the two ends of the measured piece, gamma represents the propagation constant of the incident wave in the measured piece, l represents the length of the measured piece,omega represents angular frequency, mu _eff Indicating the effective permeability, epsilon, of the measured member _eff Indicating the effective dielectric constant of the test piece.

According to theory and formula of transmission reflection method, if the length of the first measured piece is half of the working wavelength and integer multiple thereof, obtaining transmission coefficient amplitude value of 1, at this time S ₁₁ Is a minimum of 0,S ₂₁ The amplitude of (2) is at most 1.

In the field of electromagnetic measurement, for better representation and calculation of S parameters, the representation unit of S parameters adopts dB, wherein S is ₁₁ If expressed in dB, S is close to 0 ₁₁ Is close to minus infinity (- ≡); s is S ₂₁ If expressed in dB, S is close to 1 ₂₁ Is close to 0. Based on the above, when the length of the first measured object is equal to or close to one half of the operating wavelength and integer multiple thereof in the test frequency range, the amplitude of all the reflected electromagnetic waves is minimum, S ₁₁ In the dB representation, close to- ≡, this will lead to deviations of the parameter curves of the S-parameters from normal values such as resonance, fluctuation and abrupt changes, i.e. the S parameter exhibits ripple phenomena.

Since the ripple phenomenon occurs in the parameter curve of the S parameter when the length of the first measured member is equal to or close to an integer multiple of the half of the operating wavelength, the ratio of the length of the first measured member to the maximum value a of the operating wavelength of the first measured member should be a <0.5, and the ripple existing in the S parameter cannot be effectively suppressed, based on which, according to a large number of simulations and actual tests, it is determined that the ripple existing in the S parameter can be effectively suppressed when a is less than or equal to 0.45; when the length of the first tested piece is equal to or close to 0 times of the working wavelength, namely, the lowest test frequency in the target test frequency range is very small, the S parameter is caused to have a ripple phenomenon; according to a large number of simulation and actual test, if the target test frequency range is kept unchanged, a plurality of different lengths of the pre-designed and prepared tested pieces should be at least greater than two percent of the working wavelength of the tested piece under the lowest test frequency, which is also the basis for setting the lowest test frequency in the target test frequency range, so that the phenomenon that the S parameters of the different tested pieces with different lengths have ripples at the lowest test frequency accessories due to the fact that the lowest test frequency is too low in the target test frequency range is avoided, and the accuracy and the reliability of the method for suppressing the S parameter ripples are better highlighted.

Based on the method, a plurality of detected pieces with different lengths are designed and prepared in advance, the detected piece with the maximum length is selected as a target detected piece, the minimum value of the preset length of the target detected piece is based on the fact that the ratio of the preset length of the target detected piece to the working wavelength of the target detected piece is equal to 0.005, p equidistant lengths are determined in the preset length range in advance according to the preset length range, the p lengths are different, and p detected pieces with p lengths are indicated to be prepared; the value range of p is more than or equal to L _b /(B·λ)，L _b ＝|L _max -L _min |，L _max Represents the maximum length of the preset length range, L _min The minimum length of the preset length range is represented, and lambda represents the working wavelength of the target measured piece; b is a preset constant, the value of B is the standard that the measured piece ripple with the equidistant adjacent length can be obviously observed, and the value range of B is more than or equal to 0.005. Therefore, the aim of designing and preparing a plurality of tested pieces with different lengths in advance in the preset length range is fulfilled.

Based on the above-mentioned S parameter test method for suppressing ripple shown in fig. 1, in an exemplary embodiment, when a parameter curve of an S parameter without ripple standard parameter is stored in an electronic device in advance, whether the S parameter has a ripple is determined by matching a currently determined parameter curve of the S parameter with the parameter curve of the S parameter without ripple standard parameter. Based on this, the S parameter test method for suppressing the ripple provided by the present invention may further include:

And under the condition that the parameter curve of the S parameter is not matched with the preset ripple-free parameter curve, determining that the S parameter has ripple.

The preset ripple-free parameter curve may specifically be a standard parameter curve in which the S parameter does not have resonance, fluctuation, abrupt change, and the like.

Specifically, in order to improve the efficiency of determining whether the S-curve has the ripple, a preset ripple-free parameter curve representing that the S-parameter has no ripple may be preset and stored, and matched with the S-parameter obtained by the current test, and if the parameter curve of the S-parameter obtained by the current test is determined to be not matched with the preset ripple-free parameter curve by matching, the S-parameter obtained by the current test is determined to have the ripple.

It should be noted that, if the S parameter obtained by the current test is determined to match the preset ripple-free parameter curve by matching, the S parameter obtained by the current test is the target S parameter after the first tested piece suppresses the ripple.

The coaxial line shown in FIG. 3B is used as a tested piece, namely the inner conductor material and the outer conductor material are both copper, the middle dielectric material is polytetrafluoroethylene, and the effective dielectric constant and the effective magnetic permeability of the coaxial line are respectively 2.1 epsilon ₀ Sum mu ₀ The outer diameter of the coaxial line is 7mm, the inner diameter of the coaxial line is 3mm, and the length of the coaxial line is 10mm; at this time, in the case where the target test frequency range is 600MHz-40GHz, the preset scan power is 1W, and the preset number of scan points is 201, an amplitude curve diagram of the S parameter of the coaxial line as the first tested piece shown in fig. 8 can be obtained in dB.

The target test frequency range is kept at 600MHz-40GHz, the pre-designed and prepared coaxial line with the length of 2mm is measured, the preset scanning power is 1W, the preset scanning point number is 201, and the amplitude curve schematic diagram of the S parameter of the coaxial line as the first tested piece shown in fig. 9 can be obtained, wherein the unit is dB.

The microstrip line shown in fig. 4B is used as a tested piece, as shown in fig. 4B, the microstrip line is filled with two mediums, the conductor band and the grounding plate material are both copper, that is, the dielectric substrate material is Rogers5880, and the effective dielectric constant and the effective magnetic permeability of the microstrip line are respectively 1.8ε ₀ Sum mu ₀ The thickness of the conductor strip is 35 mu m, the width of the conductor strip is 0.6mm, the thickness of the dielectric substrate is 0.508mm, the thickness of the grounding plate is 35 mu m, the width of the microstrip line is 20mm, and the length of the microstrip line is 40mm; at this time, in the target test frequency range of 150MHz-10GHz, the preset scan power is 1W, When the number of preset scan points is 201, a schematic diagram of the amplitude of the S parameter of the first measured piece, in dB, can be obtained by using the microstrip line shown in fig. 10.

Keeping the target test frequency range between 150MHz and 10GHz, measuring the pre-designed and prepared coaxial line with the length of 10mm, and presetting the scanning power to be 1W and the number of the preset scanning points to be 201, thereby obtaining the amplitude curve schematic diagram of the S parameter of the microstrip line as the first tested piece, wherein the unit is dB.

Based on the above-mentioned S parameter test method for suppressing the ripple shown in fig. 1, in an example embodiment, in a case where an electromagnetic wave is perpendicularly incident on a first test object and the perpendicularly incident electromagnetic wave is transmitted multiple times in the first test object by multiple reflections and multiple transmissions, it may be determined whether the S parameter obtained by the present test has a ripple according to the relationship among the reflected wave, the transmitted wave and the incident wave. Based on this, the S parameter testing method for suppressing the ripple provided by the embodiment of the present invention may further include:

firstly, under the condition that incident waves vertically entering a first tested piece are reflected and transmitted for multiple times through the first tested piece, determining a first ratio of power of all reflected waves in the first tested piece to power of the incident waves and a second ratio of power of all transmitted waves in the first tested piece to power of the incident waves; then, determining that the S parameter of the first measured piece has ripple under the condition that the difference between the amplitude of the first ratio and 0 is minimum and/or the difference between the amplitude of the second ratio and 1 is minimum.

Specifically, the difference between the magnitude of the first ratio and 0 is the smallest, which may be specifically that the magnitude of the first ratio is close to 0, and if expressed in dB, it may be determined that the magnitude of the first ratio is close to minus infinity (- ≡); the difference between the magnitude of the second ratio and 1 is the smallest, and specifically, the second ratio may be close to 1, and if expressed in dB, it may be determined that the magnitude of the second ratio is close to 0. At least one of the two conditions can lead to the conditions that the parameter curve of the S parameter is subjected to resonance, fluctuation, mutation and the like which deviate from normal values, namely the S parameter is subjected to ripple phenomenon. Therefore, in the case that the incident wave perpendicularly incident into the first measured member is reflected and transmitted through the first measured member for multiple times, it may be determined whether the S parameter of the first measured member has a ripple by determining whether the difference between the magnitude of the first ratio of the power of all reflected waves in the first measured member to the power of the incident wave and 0 is minimum and/or whether the difference between the magnitude of the second ratio of the power of all transmitted waves in the first measured member to the power of the incident wave and 1 is minimum. The flexibility and the accuracy of determining whether the S parameter has the ripple are improved.

Based on the above-mentioned S-parameter test method for suppressing ripples shown in fig. 1, in an example embodiment, in a case where the first test piece is filled with a single medium (such as the test piece is a coaxial line) or at least two kinds of medium (such as the test piece is a microstrip line), by determining the dielectric constant and the magnetic permeability of the medium with the same electromagnetic performance as those of the first test piece, the effective dielectric constant and the effective magnetic permeability of the corresponding first test piece are determined, and the first ratio and the second ratio are determined according to the effective dielectric constant and the effective magnetic permeability, and the specific determination process may include:

the first ratio and the second ratio are determined based on a reflection coefficient of the first measured member, a length of the first measured member, an effective permittivity of the first measured member, and an effective permeability of the first measured member, and a propagation constant of an incident wave in the first measured member.

Wherein the effective permittivity and the effective permeability are both the permittivity and the permeability of the medium with the same electromagnetic performance as the first measured piece filled with a single medium or filled with at least two media.

Specifically, the first ratio is the ratio S of all reflected wave power to incident wave power ₁₁ The second ratio is the ratio S of all transmitted wave power to incident wave power ₂₁ In the above-described embodiment, the first ratio and the second ratio may be determined by the formulas (15) to (17) in the foregoing embodiment. The specific determination process and the related diagram description referred to herein can refer to the foregoing embodiments. And will not be described in detail herein.

Based on the method for testing the S parameters for suppressing the ripple shown in fig. 1, in an example embodiment, if the target S parameters are determined in a plurality of different lengths of the plurality of tested pieces, calibration and sweep test may be performed on the remaining tested pieces that are not traversed, so as to determine the target S parameters after each of the first tested pieces suppresses the ripple from the plurality of tested pieces. Based on this, the S parameter measurement method for suppressing the ripple provided by the present invention may further include:

and under the condition that at least one target length smaller than the length of the first to-be-tested piece corresponding to the target S parameter exists in the plurality of to-be-tested pieces, based on the preset scanning power and the preset scanning point number, controlling the vector network analyzer to respectively calibrate and sweep the first to-be-tested pieces corresponding to the at least one existing target length in the target test frequency range, and determining the target S parameter after the suppression of the ripple of each of all the first to-be-tested pieces in the plurality of to-be-tested pieces.

Specifically, for a plurality of detected pieces with different lengths, if the S parameter obtained by calibration and sweep frequency test of the first detected piece selected from the plurality of detected pieces does not have ripple, it may be determined that the S parameter without ripple is the target S parameter after the first detected piece suppresses ripple, and it may also be determined whether at least one target length smaller than the length of the target S parameter corresponding to the first detected piece is still present in the plurality of different detected pieces with different lengths, and if so, the detected piece with at least one target length corresponding to each present is used as the first detected piece and calibration and sweep frequency test are performed to obtain the target S parameter after all the first detected pieces in the plurality of detected pieces suppress ripple.

It should be noted that, if there is no target length smaller than the length of the first measured piece corresponding to the target S parameter in the plurality of different measured pieces with different lengths, it may be considered that when only the measured piece with the smallest length in the plurality of different lengths is used as the first measured piece, the target S parameter after the first measured piece inhibits the ripple may be obtained.

The following describes the S parameter test device for suppressing the ripple provided by the present invention, and the S parameter test device for suppressing the ripple described below and the S parameter test method for suppressing the ripple described above may be referred to correspondingly to each other.

The S parameter testing device for suppressing the ripple is applied to a parameter testing system, and the parameter testing system comprises a vector network analyzer, a coaxial cable and a first tested piece, wherein two ends of the coaxial cable are respectively connected with the vector network analyzer and the first tested piece.

Referring to fig. 12, a schematic structural diagram of an S parameter testing apparatus for suppressing ripple provided by the present invention, as shown in fig. 12, the S parameter testing apparatus 1200 for suppressing ripple includes: a control test module 1210 and a part under test update module 1220.

The control test module 1210 is configured to select a measured piece with a maximum length from a plurality of different lengths of the plurality of measured pieces as the first measured piece, and based on a preset scan power and a preset number of scan points, control the vector network analyzer to calibrate and sweep test the first measured piece in a target test frequency range, and determine an S parameter of the first measured piece;

the measured piece updating module 1220 is configured to remove a measured piece with a maximum length from the plurality of measured pieces to obtain an updated measured piece when it is determined that the S parameter has a ripple; determining the updated tested piece as a plurality of new tested pieces, repeatedly executing the step of selecting the tested piece with the maximum length from a plurality of different lengths of the tested pieces as the first tested piece, and controlling the vector network analyzer to calibrate and sweep the first tested piece in a target test frequency range based on preset scanning power and preset scanning point number to determine the S parameter of the first tested piece; and determining that the S parameter without the ripple is the target S parameter after the first measured piece inhibits the ripple.

Optionally, the control test module 1210 is specifically configured to determine a target measured piece with a preset length from a plurality of different lengths of a plurality of measured pieces; the method comprises the steps of determining the highest test frequency and the lowest test frequency by taking a first preset working wavelength of a preset length larger than a target tested piece under the highest test frequency and a second preset working wavelength of the preset length larger than the target tested piece under the lowest test frequency as targets; a target test frequency range is determined based on the highest test frequency and the lowest test frequency.

Optionally, the control test module 1210 is specifically configured to pre-determine a plurality of different lengths from a preset length range, and instruct to prepare a plurality of tested pieces with a plurality of different lengths; the distance between every two adjacent measured pieces is equal.

Optionally, the control test module 1210 is specifically configured to determine the preset length as the maximum length; determining the working wavelength corresponding to the lowest test frequency in the target test frequency range as the minimum length; a preset length range is determined based on the maximum length and the minimum length.

Optionally, the measured piece updating module 1220 is specifically configured to determine that the S parameter has a ripple when comparing the parameter curve of the S parameter with the preset ripple-free parameter curve and determining that the parameter curve of the S parameter does not match with the preset ripple-free parameter curve.

Optionally, the measured piece updating module 1220 is specifically configured to determine a first ratio of power of all reflected waves to power of the incident wave in the first measured piece and a second ratio of power of all transmitted waves to power of the incident wave in the first measured piece when the incident wave perpendicularly incident into the first measured piece is reflected and transmitted for multiple times by the first measured piece; and determining that the S parameter has ripple in the condition that the difference between the amplitude of the first ratio and 0 is minimum and/or the difference between the amplitude of the second ratio and 1 is minimum.

Optionally, the measured piece updating module 1220 is specifically configured to determine the first ratio and the second ratio based on a reflection coefficient of the first measured piece, a length of the first measured piece, an effective dielectric constant of the first measured piece, an effective magnetic permeability of the first measured piece, and a propagation constant of an incident wave in the first measured piece; wherein the effective permittivity and the effective permeability are both the permittivity and the permeability of the medium with the same electromagnetic performance as the first measured piece filled with a single medium or filled with at least two media.

Optionally, the measured piece updating module 1220 is specifically configured to, when at least one target length smaller than the length of the first measured piece corresponding to the target S parameter exists in the plurality of measured pieces, control the vector network analyzer to calibrate and sweep the first measured piece corresponding to the existing at least one target length in the target test frequency range based on the preset scan power and the preset scan point number, and determine the target S parameter after the suppression of the ripple of each of all the first measured pieces in the plurality of measured pieces.

The implementation principle and the specific implementation process of the S parameter test device 1200 for suppressing the ripple provided in the embodiment of the present invention may be similar to those of the S parameter test method for suppressing the ripple, and may be referred to the implementation principle and the specific implementation process of the S parameter test method for suppressing the ripple, which are not described herein.

Fig. 13 illustrates a physical structure diagram of an electronic device, as shown in fig. 13, which may include: processor 1310, communication interface 1320, memory 1330 and communication bus 1340, wherein processor 1310, communication interface 1320, memory 1330 communicate with each other via communication bus 1340. Processor 1310 may invoke logic instructions in memory 1330 to perform a method of S-parameter measurement to suppress ripple, the method comprising:

selecting a tested piece with the maximum length from a plurality of different lengths of the tested pieces as a first tested piece, and controlling a vector network analyzer to calibrate and sweep the first tested piece in a target test frequency range based on preset scanning power and preset scanning points to determine S parameters of the first tested piece; under the condition that the S parameter is determined to have ripple waves, removing the measured piece with the maximum length from the plurality of measured pieces to obtain an updated measured piece; determining the updated measured piece as a plurality of new measured pieces, and repeatedly executing the steps; and determining that the S parameter without the ripple is the target S parameter after the first measured piece inhibits the ripple.

Further, the logic instructions in the memory 1330 can be implemented in the form of software functional units and can be stored in a computer readable storage medium when sold or used as a stand alone product. Based on this understanding, the technical solution of the present invention may be embodied essentially or in a part contributing to the prior art or in a part of the technical solution, in the form of a software product stored in a storage medium, comprising several instructions for causing a computer device (which may be a personal computer, a server, a network device, etc.) to perform all or part of the steps of the method according to the embodiments of the present invention. And the aforementioned storage medium includes: a U-disk, a removable hard disk, a Read-Only Memory (ROM), a random access Memory (RAM, random Access Memory), a magnetic disk, or an optical disk, or other various media capable of storing program codes.

In another aspect, the present invention also provides a computer program product, the computer program product including a computer program, the computer program being storable on a non-transitory computer readable storage medium, the computer program, when executed by a processor, being capable of executing the method for measuring S parameter of suppressing ripple provided by the above methods, the method comprising:

In yet another aspect, the present invention also provides a non-transitory computer readable storage medium having stored thereon a computer program which, when executed by a processor, is implemented to perform the method for measuring S parameter of suppressing ripple provided by the above methods, the method comprising:

The apparatus embodiments described above are merely illustrative, wherein the elements illustrated as separate elements may or may not be physically separate, and the elements shown as elements may or may not be physical elements, may be located in one place, or may be distributed over a plurality of network elements. Some or all of the modules may be selected according to actual needs to achieve the purpose of the solution of this embodiment. Those of ordinary skill in the art will understand and implement the present invention without undue burden.

From the above description of the embodiments, it will be apparent to those skilled in the art that the embodiments may be implemented by means of software plus necessary general hardware platforms, or of course may be implemented by means of hardware. Based on this understanding, the foregoing technical solution may be embodied essentially or in a part contributing to the prior art in the form of a software product, which may be stored in a computer readable storage medium, such as ROM/RAM, a magnetic disk, an optical disk, etc., including several instructions for causing a computer device (which may be a personal computer, a server, or a network device, etc.) to execute the method described in the respective embodiments or some parts of the embodiments.

Finally, it should be noted that: the above embodiments are only for illustrating the technical solution of the present invention, and are not limiting; although the invention has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical scheme described in the foregoing embodiments can be modified or some technical features thereof can be replaced by equivalents; such modifications and substitutions do not depart from the spirit and scope of the technical solutions of the embodiments of the present invention.

Claims

1. The S parameter measurement method for suppressing the ripple is characterized by being applied to a parameter test system, wherein the parameter test system comprises a vector network analyzer, a coaxial cable and a tested piece, and two ends of the coaxial cable are respectively connected with the vector network analyzer and the first tested piece; the method comprises the following steps:

2. The method for measuring S-parameters suppressing ripples as set forth in claim 1, wherein the determining of the target test frequency range includes:

3. The method for measuring S-parameters for suppressing ripples as recited in claim 2, wherein the determining of the plurality of different lengths of the plurality of measured pieces includes:

4. The method for measuring S-parameters for suppressing ripples as set forth in claim 3, wherein the determining of the preset length range includes:

determining the preset length as a maximum length;

5. The S-parameter measurement method for suppressing ripple according to any one of claims 1 to 4, wherein the method further comprises:

6. The S-parameter measurement method for suppressing ripple according to any one of claims 1 to 4, wherein the method further comprises:

7. The method of claim 6, wherein the determining the first ratio and the second ratio comprises:

8. A method of testing for S parameters for ripple suppression according to any one of claims 1 to 3, further comprising:

9. An electronic device comprising a memory, a processor and a computer program stored on the memory and executable on the processor, wherein the processor implements the S-parameter test method of suppressing ripple as claimed in any one of claims 1 to 8 when the program is executed by the processor.

10. A non-transitory computer readable storage medium having stored thereon a computer program, wherein the computer program when executed by a processor implements the S-parameter test method of suppressing ripple as claimed in any one of claims 1 to 8.