CN117434426A - Test method, system and device of switched capacitor filter - Google Patents
Test method, system and device of switched capacitor filter Download PDFInfo
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- 238000001914 filtration Methods 0.000 claims abstract description 149
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- 238000005070 sampling Methods 0.000 claims description 18
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- G—PHYSICS
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- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
- G01R31/2834—Automated test systems [ATE]; using microprocessors or computers
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
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- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
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Abstract
The invention discloses a test method, a test system and a test device of a switched capacitor filter. According to the invention, a test environment meeting the test requirement on the target filter is constructed in advance, basic filtering data of the test environment is firstly obtained by using an analog waveform signal, then the filtering data of the target filter is obtained by using the test environment through an analog waveform, and then the filtering data of the target filter is compared with the basic filtering data in the test environment to obtain the filtering condition of the target filter; and judging the filtering condition of the target filter by utilizing the standard judgment information of the target filter, and judging whether the target filter is qualified or not. The influence on each device and instrument in the detection and test process of the target filter is small, the influence factors on the test result of the target filter are reduced, and the accuracy of the test result of the target filter is ensured. The defect that the test result of the switching capacitance filter is easy to distort in the prior art is overcome.
Description
Technical Field
The present invention relates to the field of testing technology of switched capacitor filters, and in particular, to a method, a system, and a device for testing a switched capacitor filter.
Background
The switch capacitor filter belongs to an integrated circuit, the size of the switch capacitor filter is small, the integration level is high, the cut-off frequency is in a proportional relation with the input clock, the performance is usually tested by adopting a vector network analyzer or a signal source and a frequency spectrograph, when the time frequency is changed, the frequency of the input signal is required to be reset so as to obtain amplitude-frequency responses under different cut-off frequencies, in addition, other instruments and meters are required to be used for testing direct current parameters, a set of full-parameter test platform is required to be constructed, a plurality of instruments and meters such as the vector network analyzer (or the signal source and the frequency spectrograph), a clock generator, a direct current power supply, a digital multimeter, an oscilloscope and the like are required, the cost is high, and the connection debugging difficulty between each test device and each instrument is increased in the test process by an upper computer, the influence of the performance of each test device and the instrument is large, and the test result of the switch capacitor filter is easy to be distorted.
Disclosure of Invention
The invention aims to solve the defect that a test result of a switched capacitor filter is easy to distort in the prior art, and provides a test method, a test system and a test device of the switched capacitor filter.
In order to achieve the above purpose, the present invention adopts the following technical scheme:
the first aspect of the present invention provides a method for testing a switched capacitor filter, including:
determining the type of a target filter and constructing a test environment of the target filter;
according to the type of the target filter, making an analog digital waveform of the target filter;
according to the analog digital waveform of the target filter, performing environment test on the test environment of the target filter to obtain basic filtering information in the test environment of the target filter;
testing the target filter by using a target filter testing environment to obtain filtering condition information of the target filter in the testing environment;
comparing the filtering condition information of the target filter in the test environment with basic filtering information in the test environment of the target filter to obtain an output characteristic signal of the target filter;
setting a judgment threshold interval of the target filter according to the type of the target filter to obtain standard judgment information of the target filter;
and matching the output characteristic signal of the target filter with the standard judgment information of the target filter to obtain the standard condition of the target filter.
In a possible embodiment, the method for obtaining basic filtering information in a test environment of a target filter includes:
determining working signal information of a target filter according to the type of the target filter;
determining characteristic information of the analog digital waveform according to the working signal information of the target filter;
writing the analog digital waveform into a test environment, and filtering the analog digital waveform by using the test environment to obtain a filtered output signal of the analog digital waveform;
and obtaining basic filtering information in the test environment according to the filtering output signals of the analog digital waveforms and combining characteristic information of the analog digital waveforms.
In a possible embodiment, the method for obtaining the output characteristic signal of the target filter includes:
writing the analog digital waveform into a test environment, and filtering the analog digital waveform by using the test environment to obtain a first filtered signal of the analog digital waveform;
inputting the first filtering signal of the analog digital waveform to the input end of the target filter, and obtaining the second filtering signal of the analog digital waveform after filtering by the target filter;
respectively carrying out quantization processing on the first filtering signal and the second filtering signal of the analog digital waveform to respectively obtain characteristic information of the first filtering signal and characteristic information of the second filtering signal;
and comparing the characteristic information of the first filtering signal with the characteristic information of the second filtering signal to obtain an output characteristic signal of the target filter.
In a possible embodiment, the method for obtaining the first filtered signal characteristic information includes:
let the analog-digital waveform be Wave, then:
wave=amp×sin (2pi×freq×t) formula 1
In formula 1, amp is the amplitude value of the target filter, freq is the frequency range variable of the target filter, and t is the time length variable;
wherein, freq and t are required to satisfy the following relationship:
freq/freqstep=t/tstep formula 2
In equation 2, freqstep is the frequency step; tstep is the time step;
inputting an analog digital waveform Wave into a test environment, and quantitatively acquiring a waveform output by the test environment to obtain a first filtering signal V1 as follows:
in the formula 3, V1 (x) is a frequency domain signal, N is a total sampling point number, N is a time domain current sampling point, x is a frequency domain current sampling point, and x (x) is a time domain signal.
In a possible embodiment, the method for obtaining the second filtered signal characteristic information includes:
the method comprises the steps of inputting an analog digital waveform Wave into a test environment, outputting a first filtering signal, inputting the first filtering signal into a target filter, and outputting a second filtering signal V2 by the target filter, wherein the second filtering signal V2 is:
in equation 4, V2 (x) is a frequency domain signal, N is a total sampling point number, N is a time domain current sampling point, x is a frequency domain current sampling point, and x (x) is a time domain signal.
In a possible embodiment, the method for obtaining the output characteristic signal of the target filter includes:
comparing the characteristic information of the first filtering signal with the characteristic information of the second filtering signal to obtain an output characteristic signal V (x) of the target filter, wherein the output characteristic signal V (x) is:
v (x) =v2 (x) -V1 (x), x=0, 1, 2.
In a possible embodiment, the method for obtaining the standard condition of the target filter includes:
obtaining characteristic information of the target filter according to the output characteristic signal of the target filter;
and identifying and judging the characteristic information of the target filter with the standard judgment information of the target filter to obtain whether the filtering condition of the target filter is qualified or not.
In a possible embodiment, the characteristic information of the target filter includes:
one or more of passband flatness, cutoff frequency, insertion loss, stop band attenuation of the filter.
A second aspect of the present invention provides a test system for a switched capacitor filter, using a test method for a switched capacitor filter as set forth in any one of the first aspects, the test system further comprising:
the waveform simulation module is used for simulating and generating a digital simulation waveform;
the basic filtering module is used for filtering the digital analog waveform;
and the quantization acquisition module is used for quantitatively acquiring the digital analog waveform subjected to filtering treatment.
A third aspect of the present invention provides a test apparatus for a switched capacitor filter, implementing a test method for a switched capacitor filter as described in any one of the first aspects or a test system employing a switched capacitor filter as described in the second aspect.
The beneficial effects of the invention are as follows:
according to the method, the test environment meeting the test requirements on the target filter is constructed in advance, basic filtering data of the test environment are firstly obtained by using analog waveform signals, then the filtering data of the target filter are obtained by using the test environment through analog waveforms, and then the filtering data of the target filter are compared with the basic filtering data in the test environment to obtain the filtering condition of the target filter; and judging the filtering condition of the target filter by utilizing the standard judgment information of the target filter, and judging whether the target filter is qualified or not. The influence on each device and instrument in the detection and test process of the target filter is small, the influence factors on the test result of the target filter are reduced, and the accuracy of the test result of the target filter is ensured. The defect that the test result of the switching capacitance filter is easy to distort in the prior art is overcome.
Drawings
Fig. 1 is an overall flow chart of a test method of a switched capacitor filter according to an embodiment of the present invention;
fig. 2 is a schematic partial flow chart of a test method of a switched capacitor filter according to an embodiment of the present invention;
fig. 3 is a waveform of a first filtered signal in a test method of a switched capacitor filter according to an embodiment of the present invention;
fig. 4 is a waveform of a second filtered signal in a test method of a switched capacitor filter according to an embodiment of the present invention;
fig. 5 is a waveform of an output characteristic signal in a test method of a switched capacitor filter according to an embodiment of the present invention.
Detailed Description
The following description of the embodiments of the present invention will be made clearly and fully with reference to the accompanying drawings, in which it is evident that the embodiments described are only some, but not all embodiments of the invention. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
It should be noted that all directional indicators (such as up, down, left, right, front, and rear … …) in the embodiments of the present invention are merely used to explain the relative positional relationship, movement, etc. between the components in a particular posture (as shown in the drawings), and if the particular posture is changed, the directional indicator is changed accordingly.
In the present invention, unless specifically stated and limited otherwise, the terms "connected," "affixed," and the like are to be construed broadly, and for example, "affixed" may be a fixed connection, a removable connection, or an integral body; can be mechanically or electrically connected; either directly or indirectly, through intermediaries, or both, may be in communication with each other or in interaction with each other, unless expressly defined otherwise. The specific meaning of the above terms in the present invention can be understood by those of ordinary skill in the art according to the specific circumstances.
In addition, if there is a description of "first", "second", etc. in the embodiments of the present invention, the description of "first", "second", etc. is for descriptive purposes only and is not to be construed as indicating or implying a relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defining "a first" or "a second" may explicitly or implicitly include at least one such feature. In addition, the meaning of "and/or" as it appears throughout includes three parallel schemes, for example "A and/or B", including the A scheme, or the B scheme, or the scheme where A and B are satisfied simultaneously. In addition, the technical solutions of the embodiments may be combined with each other, but it is necessary to base that the technical solutions can be realized by those skilled in the art, and when the technical solutions are contradictory or cannot be realized, the combination of the technical solutions should be considered to be absent and not within the scope of protection claimed in the present invention.
Examples
Referring to fig. 1 to 5, in order to solve the problem that a test result of a switched capacitor filter is easy to distort in the prior art, the first aspect of the present invention provides a test method of a switched capacitor filter, where a test environment meeting a test requirement for a target filter is pre-constructed, first basic filtering data of the test environment is obtained by using an analog waveform signal, then filtering data of the target filter is obtained by using the test environment through an analog waveform, and then filtering data of the target filter is compared with the basic filtering data in the test environment to obtain a filtering condition of the target filter; and judging the filtering condition of the target filter by utilizing the standard judgment information of the target filter, and judging whether the target filter is qualified or not. The influence on each device and instrument in the detection and test process of the target filter is small, the influence factors on the test result of the target filter are reduced, and the accuracy of the test result of the target filter is ensured. The defect that the test result of the switching capacitance filter is easy to distort in the prior art is overcome.
Specifically, the test method comprises the following steps: determining the type of a target filter and constructing a test environment of the target filter; i.e. according to the whole working power data of the filter to be tested, etc., the test detection environment (including but not limited to a clock source device capable of waveform simulation, a device capable of digital-to-analog conversion, a basic filtering device and a quantitative acquisition device) capable of meeting the filter to be tested is constructed. And then, a clock source device in the test environment is utilized to select the even acceleration digital waveform of the corresponding frequency band according to the type of the target filter, and the even acceleration digital waveform of the corresponding frequency band is utilized to manufacture the analog digital waveform of the target filter. Then, according to the analog digital waveform of the target filter, carrying out environment test on the test environment of the target filter to obtain basic filtering information (further comprising other processing conditions of the analog digital waveform in the test environment, such as transmission distortion conditions and loss conditions of the output digital waveform signal and attenuation conditions caused by the transmission of the digital waveform signal in the test environment after the test environment tests the analog digital waveform); namely, the evenly accelerated digital waveforms of the corresponding frequency bands generated in the test environment are obtained, the basic filtering waveform conditions existing in the test environment are obtained, then the various test environments in the test environment are known, and an effective basis is provided for the subsequent test result judgment of the target filter. When the target filter is detected, firstly, the evenly accelerated digital waveform of the corresponding frequency band is subjected to impurity removal treatment through basic filtering in a test environment, then is input into the input end of the target filter, and then the target filter is tested by utilizing the test environment of the target filter, so that the filtering condition information of the target filter in the test environment is obtained. Comparing the filtering condition information of the target filter in the test environment with basic filtering information in the test environment of the target filter to obtain an output characteristic signal of the target filter; the even acceleration digital waveform of the corresponding frequency band is compared with the condition before filtering after being filtered by the target filter for the second time, so that the filtering effect of the target filter on the even acceleration digital waveform after basic filtering is obtained. Before testing the target filter, the judgment threshold interval of the target filter needs to be set according to the type of the target filter and the normal condition of the qualified target filter so as to obtain the standard judgment information of the target filter. And then when the target filter is qualified, the output characteristic signal of the target filter can be matched and compared with the standard judgment information of the target filter to obtain the standard condition of the target filter. And then whether the filtering condition of the target filter meets the qualification requirement is realized, namely the effect of detecting the target filter is realized. In this embodiment, it should be noted that, the standard judgment information of the target filter may consider the situations of the pass band flatness, the cut-off frequency, the insertion loss, the stop band attenuation, and the like of the filtered waveform, that is, the characteristic information of the target filter includes: one or more combinations of pass band flatness, cut-off frequency, insertion loss, stop band attenuation of the waveform after filtering by the qualified target filter. In addition, in the present embodiment, the described analog-digital waveform means: and (3) manufacturing corresponding digital waveform electric signals according to the target filter detected in actual need, respectively knowing the conditions of the test environment, the signal receiving loss, the distortion and the like of the target filter according to the simulated digital waveform electric signals, and comparing according to the conditions of the test environment and the target filter, so as to obtain whether the signal transmission processing function of the target filter is normal or not, and further, providing a reference for whether the target filter is qualified or not. In the embodiment, a test environment meeting the test requirement of the target filter is pre-constructed, basic filtering data of the test environment is firstly obtained by using an analog waveform signal, then the filtering data of the target filter is obtained by using the test environment through an analog waveform, and then the filtering data of the target filter is compared with the basic filtering data in the test environment to obtain the filtering condition of the target filter; and judging the filtering condition of the target filter by utilizing the standard judgment information of the target filter, and judging whether the target filter is qualified or not. The influence on each device and instrument in the detection and test process of the target filter is small, the influence factors on the test result of the target filter are reduced, and the accuracy of the test result of the target filter is ensured. The defect that the test result of the switching capacitance filter is easy to distort in the prior art is overcome.
Referring to fig. 3, 4 and 5, in this embodiment, in order to facilitate understanding of how to acquire basic filtering information in a target filter test environment, the following description is made. Specifically, the method for obtaining basic filtering information in the test environment of the target filter includes:
determining working signal information of a target filter according to the type of the target filter; the method comprises the steps of determining the overall working data condition of a target filter, and then determining the uniform acceleration digital waveform required to be generated for detecting the target filter in a test environment according to the overall working data condition of the target filter. Determining characteristic information of analog digital waveforms according to the working signal information of the target filter; writing the even acceleration digital waveform into a test environment, and filtering the analog digital waveform by using the test environment to obtain a filtered output signal of the analog digital waveform; the uniformly accelerated digital waveform subjected to the basic filtering of the test environment can be subjected to discrete quantitative acquisition, the signal of the uniformly accelerated digital waveform subjected to the basic filtering of the test environment is acquired, a uniformly accelerated digital waveform graph (shown in fig. 3) subjected to the basic filtering of the test environment is obtained through Discrete Fourier Transform (DFT), and then the uniformly accelerated digital waveform graph subjected to the basic filtering of the test environment is subjected to image analysis, so that the basic filtering condition in the test environment is obtained. That is, according to the filtered output signal of the analog digital waveform, and combining the characteristic information of the analog digital waveform, the basic filtering information in the test environment is obtained. In this embodiment, clutter removal processing can be performed on the input signal of the target filter at the front end by using the basic filtering information in the test environment, so as to reduce the test influence on the target filter, that is, by using the basic filtering information in the test environment, the test factors of the target filter are ensured to be kept within a certain fixed frequency or frequency band, and the accuracy of the overall test condition of the target filter is ensured.
Referring to fig. 3, 4 and 5, in the present embodiment, in order to facilitate understanding of how the filtering condition of the target filter is acquired, the following description is made. Specifically, the method for obtaining the output characteristic signal of the target filter includes:
writing the analog digital waveform into a test environment, and filtering the analog digital waveform by using the test environment to obtain a first filtered signal of the analog digital waveform; the method comprises the steps of generating evenly accelerated digital analog waveforms in a test environment, acquiring basic filtering conditions in the test environment in advance, obtaining a first filtering signal in a certain fixed frequency after basic filtering, and reducing other clutter interference.
Inputting the first filtering signal of the analog digital waveform to the input end of the target filter, and obtaining the second filtering signal of the analog digital waveform after filtering by the target filter; i.e. the first filtered signal which is subjected to basic filtering in a certain fixed frequency is input to the input end of the target filter, and then the first filtered signal is filtered by the target filter, and a filtered waveform image output by the target filter is observed (see fig. 4). And then respectively carrying out quantization acquisition processing on the first filtering signal and the second filtering signal of the analog digital waveform, and respectively obtaining the characteristic information of the first filtering signal and the characteristic information of the second filtering signal through Discrete Fourier Transform (DFT). And then, comparing the characteristic information of the first filtering signal with the characteristic information of the second filtering signal to obtain an output characteristic signal of the target filter.
In this embodiment, in order to facilitate a specific understanding of how the detection condition of the target filter is acquired using the ramp-up digital waveform, the following description is made here. Specifically, the method for obtaining the characteristic information of the first filtering signal includes:
let the analog-digital waveform be Wave, then:
wave=amp×sin (2pi×freq×t) formula 1
In formula 1, amp is the amplitude value of the target filter, freq is the frequency range variable of the target filter, and t is the time length variable;
wherein, freq and t are required to satisfy the following relationship:
freq/freqstep=t/tstep formula 2
In equation 2, freqstep is the frequency step; tstep is the time step;
the corresponding even acceleration analog-digital waveform can be manufactured by using the test environment according to the amplitude value, the frequency range variable and the time length variable in the target filter;
then, inputting the analog digital waveform Wave into a test environment, and quantitatively acquiring the waveform output by the test environment to obtain a first filtering signal V1 as follows:
in the formula 3, V1 (x) is a frequency domain signal, N is a total sampling point number, N is a time domain current sampling point, x is a frequency domain current sampling point, and x (x) is a time domain signal.
The specific case of obtaining the second filtered signal characteristic information can be similarly described in detail herein, and the method for obtaining the second filtered signal characteristic information includes:
the method comprises the steps of inputting an analog digital waveform Wave into a test environment, outputting a first filtering signal, inputting the first filtering signal into a target filter, and outputting a second filtering signal V2 by the target filter, wherein the second filtering signal V2 is:
in equation 4, V2 (x) is a frequency domain signal, N is a total sampling point number, N is a time domain current sampling point, x is a frequency domain current sampling point, and x (N) is a time domain signal.
In this embodiment, in order to facilitate understanding how to acquire the output characteristic signal of the target filter by using the first filtering signal and the second filtering signal, the method for acquiring the output characteristic signal of the target filter includes:
comparing the characteristic information of the first filtering signal with the characteristic information of the second filtering signal to obtain an output characteristic signal V (x) of the target filter, wherein the output characteristic signal V (x) is:
v (x) =v2 (x) -V1 (x), x=0, 1,2, ·n-1 formula 5.
In this embodiment, the method for obtaining the standard condition of the target filter includes:
obtaining characteristic information of the target filter according to the output characteristic signal of the target filter;
and identifying and judging the characteristic information of the target filter with the standard judgment information of the target filter to obtain whether the filtering condition of the target filter is qualified or not. When the qualification condition of the target filter is analyzed, the image data feedback of the normal filtering condition of the qualified target filter is combined to manufacture corresponding qualification judging information, and then the characteristic signals output by the output end of the target filter are acquired and compared according to the corresponding qualification judging information, namely, the standard judging information of the target filter can consider the waveform passband flatness, cut-off frequency, insertion loss, stop band attenuation and the like after filtering the standard judging information of the target filter to be compared with the passband flatness, cut-off frequency, insertion loss and stop band attenuation condition of the waveform after filtering the qualified target filter, so that the basis is provided for judging the target filter.
In addition, in this embodiment, when performing the digital waveform conversion operation, the filtering operation, and the quantitative acquisition operation, the automatic control operation can be performed between each device or instrument in the test environment according to the test requirement of the test environment, which is not described herein in detail. Namely, when a corresponding uniform acceleration digital waveform is manufactured according to the model of the target filter, the corresponding discrete uniform acceleration signal can be output through a digital-to-analog converter, the corresponding discrete uniform acceleration signal is output and is input into the input end of basic filtering equipment in a test environment, a quantized collector is provided at the output end of the basic filtering equipment to acquire signals, and then discrete Fourier transform is performed on the quantized signals acquired by the output end of the basic filtering equipment to acquire a corresponding amplitude-frequency curve.
A second aspect of the present invention provides a test system for a switched capacitor filter, using a test method for a switched capacitor filter as set forth in any one of the first aspects, the test system further comprising: the device comprises a waveform simulation module, a basic filtering module and a quantization acquisition module, wherein the waveform simulation module is used for automatically or manually selecting a corresponding clock source frequency band to simulate, and simulating to generate a corresponding even acceleration digital waveform, namely a digital analog waveform; the basic filtering module is used for performing basic filtering on the digital analog waveform; the quantization acquisition module is used for quantitatively acquiring the digital analog waveform subjected to filtering treatment. In the embodiment, a waveform simulation module simulates and generates a uniform acceleration digital waveform, a basic filtering module of a test environment is firstly obtained by utilizing the uniform acceleration digital waveform, then a target filter is subjected to filtering data acquisition by utilizing the test environment through the uniform acceleration digital waveform, and meanwhile, filtering data of the target filter is matched with basic filtering data in the test environment through a quantization acquisition module to be obtained, and then the filtering conditions of the target filter are obtained by comparing; and judging the filtering condition of the target filter by utilizing the standard judgment information of the target filter, and judging whether the target filter is qualified or not. The influence on each device and instrument in the detection and test process of the target filter is small, the influence factors on the test result of the target filter are reduced, and the accuracy of the test result of the target filter is ensured. The defect that the test result of the switching capacitance filter is easy to distort in the prior art is overcome.
Additionally, in some embodiments, the test system may communicate using any currently known or future developed network protocol, such as HTTP (Hyper Text Transfer Protocol ), and may be interconnected with any form or medium of digital data communication (e.g., a communication network). Examples of communication networks include a local area network ("LAN"), a wide area network ("WAN"), the internet (e.g., the internet), and peer-to-peer networks (e.g., ad hoc peer-to-peer networks), as well as any currently known or future developed networks.
The functions described above herein may be performed, at least in part, by one or more hardware logic components. For example, without limitation, exemplary types of hardware logic components that may be used include: a Field Programmable Gate Array (FPGA), an Application Specific Integrated Circuit (ASIC), an Application Specific Standard Product (ASSP), a system on a chip (SOC), a Complex Programmable Logic Device (CPLD), and the like.
A third aspect of the present invention provides a test apparatus for a switched capacitor filter, implementing a test method for a switched capacitor filter as described in any one of the first aspects or a test system employing a switched capacitor filter as described in the second aspect. The test device can realize the test method of the first aspect by carrying the test system of the second aspect, namely the test device generates a uniform acceleration digital waveform by utilizing a waveform simulation module, firstly acquires a basic filter module of a test environment by utilizing the uniform acceleration digital waveform, then acquires filter data of a target filter by utilizing the test environment through the uniform acceleration digital waveform, and acquires the filter data of the target filter and the basic filter data in the test environment by matching with a quantitative acquisition module, and then compares the filter data of the target filter to obtain the filter condition of the target filter; and judging the filtering condition of the target filter by utilizing the standard judgment information of the target filter, and judging whether the target filter is qualified or not. The influence on each device and instrument in the detection and test process of the target filter is small, the influence factors on the test result of the target filter are reduced, and the accuracy of the test result of the target filter is ensured. The defect that the test result of the switching capacitance filter is easy to distort in the prior art is overcome.
The flowcharts and block diagrams in the figures illustrate the architecture, functionality, and operation of possible implementations of systems, methods and computer program products according to various embodiments of the present disclosure. In this regard, each block in the flowchart or block diagrams may represent a module, segment, or portion of code, which comprises one or more executable instructions for implementing the specified logical function(s). It should also be noted that, in some alternative implementations, the functions noted in the block may occur out of the order noted in the figures. For example, two blocks shown in succession may, in fact, be executed substantially concurrently, or the blocks may sometimes be executed in the reverse order, depending upon the functionality involved. It will also be noted that each block of the block diagrams and/or flowchart illustration, and combinations of blocks in the block diagrams and/or flowchart illustration, can be implemented by special purpose hardware-based systems which perform the specified functions or acts, or combinations of special purpose hardware and computer instructions.
In particular, according to some embodiments of the present disclosure, the processes described above with reference to flowcharts may be implemented as computer software programs. For example, some embodiments of the present disclosure include a computer program product comprising a computer program embodied on a computer readable medium, the computer program comprising program code for performing the method shown in the flow chart.
The foregoing description is only of the preferred embodiments of the present disclosure and description of the principles of the technology being employed. It will be appreciated by those skilled in the art that the scope of the invention in the embodiments of the present disclosure is not limited to the specific combination of the above technical features, but encompasses other technical features formed by any combination of the above technical features or their equivalents without departing from the spirit of the invention. Such as the above-described features, are mutually substituted with (but not limited to) the features having similar functions disclosed in the embodiments of the present disclosure.
Claims (10)
1. A method for testing a switched capacitor filter, comprising:
determining the type of a target filter and constructing a test environment of the target filter;
according to the type of the target filter, making an analog digital waveform of the target filter;
according to the analog digital waveform of the target filter, performing environment test on the test environment of the target filter to obtain basic filtering information in the test environment of the target filter;
testing the target filter by using a target filter testing environment to obtain filtering condition information of the target filter in the testing environment;
comparing the filtering condition information of the target filter in the test environment with basic filtering information in the test environment of the target filter to obtain an output characteristic signal of the target filter;
setting a judgment threshold interval of the target filter according to the type of the target filter to obtain standard judgment information of the target filter;
and matching the output characteristic signal of the target filter with the standard judgment information of the target filter to obtain the standard condition of the target filter.
2. The method for testing a switched capacitor filter of claim 1 wherein said method for obtaining basic filtering information in a test environment of a target filter comprises:
determining working signal information of a target filter according to the type of the target filter;
determining characteristic information of the analog digital waveform according to the working signal information of the target filter;
writing the analog digital waveform into a test environment, and filtering the analog digital waveform by using the test environment to obtain a filtered output signal of the analog digital waveform;
and obtaining basic filtering information in the test environment according to the filtering output signals of the analog digital waveforms and combining characteristic information of the analog digital waveforms.
3. The method for testing a switched capacitor filter according to claim 2, wherein said method for obtaining an output characteristic signal of a target filter comprises:
writing the analog digital waveform into a test environment, and filtering the analog digital waveform by using the test environment to obtain a first filtered signal of the analog digital waveform;
inputting the first filtering signal of the analog digital waveform to the input end of the target filter, and obtaining the second filtering signal of the analog digital waveform after filtering by the target filter;
respectively carrying out quantization processing on the first filtering signal and the second filtering signal of the analog digital waveform to respectively obtain characteristic information of the first filtering signal and characteristic information of the second filtering signal;
and comparing the characteristic information of the first filtering signal with the characteristic information of the second filtering signal to obtain an output characteristic signal of the target filter.
4. A method of testing a switched capacitor filter as claimed in claim 3, wherein said method of obtaining first filtered signal characteristic information comprises:
let the analog-digital waveform be Wave, then:
wave=amp×sin (2pi×freq×t) formula 1
In formula 1, amp is the amplitude value of the target filter, freq is the frequency range variable of the target filter, and t is the time length variable;
wherein, freq and t are required to satisfy the following relationship:
freq/freqstep=t/tstep formula 2
In equation 2, freqstep is the frequency step; tstep is the time step;
inputting an analog digital waveform Wave into a test environment, and quantitatively acquiring a waveform output by the test environment to obtain a first filtering signal V1 as follows:
in the formula 3, V1 (x) is a frequency domain signal, N is a total sampling point number, N is a time domain current sampling point, x is a frequency domain current sampling point, and x (N) is a time domain signal.
5. The method for testing a switched capacitor filter of claim 4 wherein said method for obtaining second filtered signal characteristic information comprises:
the method comprises the steps of inputting an analog digital waveform Wave into a test environment, outputting a first filtering signal, inputting the first filtering signal into a target filter, and outputting a second filtering signal V2 by the target filter, wherein the second filtering signal V2 is:
in equation 4, V2 (x) is a frequency domain signal, N is a total sampling point number, N is a time domain current sampling point, x is a frequency domain current sampling point, and x (N) is a time domain signal.
6. The method for testing a switched capacitor filter of claim 5 wherein said method for obtaining an output characteristic signal of a target filter comprises:
comparing the characteristic information of the first filtering signal with the characteristic information of the second filtering signal to obtain an output characteristic signal V (x) of the target filter, wherein the output characteristic signal V (x) is:
v (x) =v2 (x) -V1 (x), x=0, 1, 2.
7. The method for testing a switched capacitor filter of claim 6 wherein said method for obtaining a standard condition of a target filter comprises:
obtaining characteristic information of the target filter according to the output characteristic signal of the target filter;
and identifying and judging the characteristic information of the target filter with the standard judgment information of the target filter to obtain whether the filtering condition of the target filter is qualified or not.
8. The method for testing a switched capacitor filter of claim 7 wherein said characteristic information of said target filter comprises:
one or more of passband flatness, cutoff frequency, insertion loss, stop band attenuation of the filter.
9. A test system for a switched capacitor filter, characterized in that a test method for a switched capacitor filter according to any one of claims 1 to 8 is used, the test system further comprising:
the waveform simulation module is used for simulating and generating a digital simulation waveform;
the basic filtering module is used for filtering the digital analog waveform;
and the quantization acquisition module is used for quantitatively acquiring the digital analog waveform subjected to filtering treatment.
10. A test device for a switched capacitor filter, characterized in that a test method for a switched capacitor filter as claimed in any one of claims 1 to 8 or a test system employing a switched capacitor filter as claimed in claim 9 is implemented.
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