CN1174342A - Sculpture technology for composite containing polyurethane - Google Patents

Sculpture technology for composite containing polyurethane Download PDF

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Publication number
CN1174342A
CN1174342A CN 96116473 CN96116473A CN1174342A CN 1174342 A CN1174342 A CN 1174342A CN 96116473 CN96116473 CN 96116473 CN 96116473 A CN96116473 A CN 96116473A CN 1174342 A CN1174342 A CN 1174342A
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CN
China
Prior art keywords
etching
polyurethane
weight
acrylonitrile
styrene
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CN 96116473
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Chinese (zh)
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CN1060570C (en
Inventor
谢静薇
江明
张勤
叶惠娟
卢文奎
谢文炳
王浩
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Sinopec Shanghai Research Institute of Petrochemical Technology
Fudan University
China Petrochemical Corp
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Sinopec Shanghai Research Institute of Petrochemical Technology
Fudan University
China Petrochemical Corp
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Application filed by Sinopec Shanghai Research Institute of Petrochemical Technology, Fudan University, China Petrochemical Corp filed Critical Sinopec Shanghai Research Institute of Petrochemical Technology
Priority to CN 96116473 priority Critical patent/CN1060570C/en
Publication of CN1174342A publication Critical patent/CN1174342A/en
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Publication of CN1060570C publication Critical patent/CN1060570C/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Abstract

The said sculpture technology uses 0.5-5 wt% alcohol solution of alkali metal hydroxide as sculpturing agent and sculptures agent and sculptures at 10-40 deg. c for 24-300 hr, so as to sculpture effectively the polyurethane component in copolymer and to reflect the phase structure of copolymer. The said technology is used in sculpture of composite containing polyurethane.

Description

Be used to contain the lithographic technique of urethane composition
The present invention relates to the lithographic technique that the STUDY ON Scanning Electron Microscope high polymer alloy is used, particularly contain the lithographic technique of urethane composition about STUDY ON Scanning Electron Microscope.
Scanning electron microscope is widely used in studying the form and the phase structure of polymer blend because sample preparation is quick, easy.The zone that black and white is different on the stereoscan photograph is because the pattern on sample respective regions surface determines.Under individual cases, for example when sample be two phase structure, and disperse phase is when being spherical particle, on the cold section of low temperature, dispersed phase particles or protrude in and observe the surface or only stay pothole on the surface, this moment, surface topography directly reflected two phase structure.Yet in most of the cases, the two phase structure of blend is often covered by the surface topography of sample, thus the conclusion that leads to errors.In order to obtain the real phase structure of blend, adopt solvent or reagent that less important composition dissolving or branch in two phase compositions are taken off usually, real phase structure is fully come out.Therefore, to the polymer blend of forming by two or more polymkeric substance, it is even more important that the selection of etching agent and etching condition just seems, should guarantee the adequacy to disperse phase (minor consistuent) etching, avoids etching agent to external phase (main component) structural damage again.Only in this way, could clearly observe the true form of each component in the blend.
For the blend that contains polyurethane elastomer, can't find a kind ofly to make polyurethane dissolving and to the undissolved suitable solvent of other component of polymkeric substance in the past.Document Journal of Applied polymer Science, Vol.50 has introduced the lithographic technique of polyurethane/styrene-acrylonitrile random copolymer composition among the 719-727 (1993).But only introduced the technology of etching styrene-acrylonitrile random copolymers in the document, thereby the form of composition can not observe polyurethane as minor consistuent the time.In order to overcome the shortcoming that conventional art exists, provide a kind of can be with scanning electron microscopic observation to the technology that contains the urethane composition true form, the present inventor has invented the lithographic technique that is used to contain urethane composition.
Technical purpose of the present invention is to realize by following technical scheme: a kind of lithographic technique that is used to contain urethane composition, etching agent to polyurethane component is the alcoholic solution of alkali metal hydroxide, its concentration is 0.5~5% (weight), etching time is 24~300 hours, and etching temperature is 10~40 ℃.
Above-mentioned etching agent alkali metal hydroxide is NaOH, potassium hydroxide.Alkali metal hydroxide alcoholic solution concentration preferable range is 1~2% (weight), and the etching time preferable range is 120~240 hours, and the etching temperature preferable range is 20~30 ℃.
Fig. 1 wherein, Fig. 2, Fig. 3, Fig. 4 is respectively the random copolymers of styrene-acrylonitrile and the composition that thermoplastic polyurethane forms, wherein the ratio of the random copolymers of styrene-acrylonitrile and thermoplastic polyurethane is 90: 10,80: 20,70: 30,60: 40, with the electromicroscopic photograph after the alkali metal alcohol solution etching polyurethane component, Fig. 5 is the random copolymers of styrene-acrylonitrile and the ternary composition of polyurethane component and ethylene-vinyl acetate formation, with the electromicroscopic photograph after the alkali metal alcohol solution etching polyurethane component.
Present technique is utilized the hydrolyzable of polyurethane, adopts the alkali metal hydroxide alcoholic solution as the chemical etching of polyurethane Agent is carried out etching to the polyurethane component that contains in two yuan of polyurethane component or the ternary composition, and it is true to have obtained composition Phase structure, obtained good technique effect.
[embodiment 1]
The composition that forms with the thermoplastic polyurethane of the random copolymers and 10% (weight) of the styrene-acrylonitrile of STUDY ON Scanning Electron Microscope 90% (weight), with the NaOH alcoholic solution of 2% (weight) etching agent as polyurethane component, under 20 ℃ of temperature conditions of temperature, after the etching 60 hours, from Fig. 1, can observe, polyurethane component has obtained good dispersion in the random copolymers external phase of styrene-acrylonitrile, dispersed phase size is in the great majority at 0.5 μ m.[embodiment 2]
The composition that forms with the thermoplastic polyurethane of the random copolymers and 20% (weight) of the styrene-acrylonitrile of STUDY ON Scanning Electron Microscope 80% (weight), with the potassium hydroxide alcoholic solution of 0.8% (weight) etching agent as polyurethane component, under 25 ℃ of temperature conditions, after the etching 150 hours, can observe from Fig. 2, polyurethane component has obtained good dispersion in the random copolymers external phase of styrene-acrylonitrile.[embodiment 3]
The composition that forms with the thermoplastic polyurethane of the random copolymers and 30% (weight) of the styrene-acrylonitrile of STUDY ON Scanning Electron Microscope 70% (weight), with the NaOH alcoholic solution of 4% (weight) etching agent as polyurethane component, under 30 ℃ of temperature conditions, after the etching 240 hours, can observe from Fig. 3, polyurethane component has obtained good dispersion in the random copolymers external phase of styrene-acrylonitrile.[embodiment 4]
The composition that forms with the thermoplastic polyurethane of the random copolymers and 40% (weight) of the styrene-acrylonitrile of STUDY ON Scanning Electron Microscope 60% (weight), with the NaOH alcoholic solution of 1.5% (weight) etching agent as polyurethane component, under 25 ℃ of temperature conditions, after the etching 200 hours, can observe from Fig. 4, polyurethane component has obtained good dispersion in the random copolymers external phase of styrene-acrylonitrile.[embodiment 5]
Contain the thermoplastic polyurethane of random copolymers and 5% (weight) of styrene-acrylonitrile of 76% (weight) and the ternary composition that 19% ethylene-vinyl acetate forms with STUDY ON Scanning Electron Microscope, with the NaOH alcoholic solution of 1.0% (weight) etching agent as polyurethane component, under 26 ℃ of temperature conditions, after the etching 160 hours, after from Fig. 5, can observing polyurethane component and being etched, the ethylene-vinyl acetate disperse phase is by the embedding of polyurethane component institute, polyurethane component is positioned on the interface of random copolymers external phase of ethylene-vinyl acetate disperse phase and styrene-acrylonitrile, has played compatilizer.

Claims (4)

1. lithographic technique that is used to contain urethane composition, the etching agent that it is characterized in that polyurethane component is the alcoholic solution of alkali metal hydroxide, and concentration is 0.5~5% (weight), and etching time is 24~300 hours, and etching temperature is 10~40 ℃.
2. according to the described lithographic technique that is used to contain urethane composition of claim 1, it is characterized in that alkali metal hydroxide is NaOH, potassium hydroxide.
3. according to the described lithographic technique that is used to contain urethane composition of claim 1, the concentration that it is characterized in that the alkali metal hydroxide alcoholic solution is 1~2% (weight).
4. according to the described lithographic technique that is used to contain urethane composition of claim 1, the time that it is characterized in that the etching polyurethane component is 120~240 hours, and temperature is 20~30 ℃.
CN 96116473 1996-08-20 1996-08-20 Sculpture technology for composite containing polyurethane Expired - Fee Related CN1060570C (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN 96116473 CN1060570C (en) 1996-08-20 1996-08-20 Sculpture technology for composite containing polyurethane

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN 96116473 CN1060570C (en) 1996-08-20 1996-08-20 Sculpture technology for composite containing polyurethane

Publications (2)

Publication Number Publication Date
CN1174342A true CN1174342A (en) 1998-02-25
CN1060570C CN1060570C (en) 2001-01-10

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Application Number Title Priority Date Filing Date
CN 96116473 Expired - Fee Related CN1060570C (en) 1996-08-20 1996-08-20 Sculpture technology for composite containing polyurethane

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CN (1) CN1060570C (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108330703A (en) * 2018-04-04 2018-07-27 东莞市联洲知识产权运营管理有限公司 A kind of Waterproof warm fabric and preparation method thereof of imitative sea otter hair knot structure

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108330703A (en) * 2018-04-04 2018-07-27 东莞市联洲知识产权运营管理有限公司 A kind of Waterproof warm fabric and preparation method thereof of imitative sea otter hair knot structure

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