CN117412821A

CN117412821A - Automated particle inspection

Info

Publication number: CN117412821A
Application number: CN202280019950.1A
Authority: CN
Inventors: N·莱谢姆; E·雷瑟夫
Original assignee: Testing Technology Co ltd
Current assignee: Testing Technology Co ltd
Priority date: 2021-01-25
Filing date: 2022-01-16
Publication date: 2024-01-16
Also published as: EP4281227A1; IL304564A; WO2022157763A1; KR20230153371A; JP2024504708A

Abstract

Providing a management and control system for user interface with an inspection device having at least one digital optical instrument, the management and control system comprising: a processor configured to receive the image from the at least one digital optical instrument, analyze the image, and send instructions to the inspection device, and a display configured to display the analysis of the image, wherein a user is able to interface with the inspection device and provide instructions to the inspection device based on the analysis of the image, wherein the display simultaneously displays the histogram and the thumbnail generated based on the image in the processor. Methods and UIs for controlling and managing an item inspection device are disclosed.

Description

Automated particle inspection

Technical Field

The subject matter of the present disclosure relates to an automatic inspection device. More particularly, the subject matter of the present disclosure relates to management and control systems for user interface with inspection devices.

Background

Automated inspection is a process of inspecting small solid materials (typically hard) as part of controlling the quality of the particles in the production line. Optionally, the inspection process may have a sorting process of the material. Commercial inspection machines use optical sensors and image processing to determine impurities, geometric changes, and color. Typically, inspection machines compare solid particulate objects to a user-defined baseline threshold to determine whether the material is acceptable to production/transport or unacceptable.

Older manual inspection and/or sorting is subjective, unreliable, and inconsistent, while optical sorting improves overall product quality, maximizes throughput, increases yield, and reduces labor costs.

Inspection machines are available for products such as plastic pellets, metal or glass pellets, and the like, and food materials such as beans, spices, nuts, pellets, rice, vegetables, and fruits.

Disclosure of Invention

Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which the presently disclosed subject matter belongs. Although methods and materials similar or equivalent to those described herein can be used in the practice or testing of the presently disclosed subject matter, suitable methods and materials are described below. In the event of a conflict, the specification, including definitions, will control. In addition, the materials, methods, and embodiments are illustrative only and not intended to be limiting.

There is thus provided in accordance with the present subject matter a management and control system for user interface with an inspection device having at least one digital optical instrument, the management and control system comprising:

a processor configured to receive images from the at least one digital optical instrument, analyze the images, and send instructions to the inspection device;

A display configured to display an analysis of the image, wherein the user is able to interface with and provide instructions to the inspection device based on the analysis of the image, wherein the display simultaneously displays a histogram and a thumbnail generated based on the image in a processor.

According to another preferred embodiment, the inspection and sorting device is configured to inspect items selected from the group of items comprising beans, spices, nuts, pellets, rice, vegetables, fruits, plastic pellets, metal pellets, glass pellets, pills.

According to another preferred embodiment, the at least one digital optical instrument is selected from the group of optical instruments comprising an X-ray detector, a Magnetic Resonance Imaging (MRI) device, a Computed Tomography (CT) scanner, a 3D data scanner, a camera, an optical sensor.

According to another preferred embodiment, the display is selected from the group of displays comprising monitors, screens, electroluminescent (ELD) display devices, liquid Crystal Display (LCD) devices, light Emitting Diode (LED) devices, plasma (PDP) displays, electronic handheld devices such as tablet computers, smart phone devices.

According to another preferred embodiment, the instructions are selected from the group of instructions comprising: sorting items, enabling item ejection, disabling item ejection, generating reports, setting differentiation levels, transferring items, setting thresholds to generate alarms, defining datasets for automatic prediction and alarms, defining setpoints for line control.

According to another preferred embodiment, the management system further comprises a memory unit in communication with the processor, wherein the memory unit is configured to hold information selected from the group of information comprising the image, a reference image, a plurality of profiles of items, system settings, system reports, image analysis, a reference profile comprising thresholds of different types of items, statistical analysis associated with the reference profile.

According to another preferred embodiment, the display graphically displays a chart generated in the processor based on the image.

According to another preferred embodiment, the inspection device is incorporated within a production line.

There is also provided, in accordance with another preferred embodiment, a method of managing and controlling an article inspection device, the method including:

capturing an image of an item inspected by at least one digital optical instrument of the inspection device;

receiving, by the processor, an image from the at least one digital optical instrument;

analyzing, by the processor, the image to analyze the item;

displaying the analysis on a display, wherein a histogram representation and a thumbnail image are displayed simultaneously;

Instructions are received by the inspection device via the user interface.

According to another preferred embodiment, analyzing the image comprises determining a criterion for each item in the image, wherein the criterion is selected from the group comprising impurities, change in geometry, color of the item, dark spots, dark gels, dark and bright colored contaminations, foreign matter, discoloration, cross contamination, color measurement and color shift, dimensional deviation, shape irregularities, clumping, transparency, gloss of the item.

According to another preferred embodiment, the method further comprises generating a histogram representation of the dimensions and criteria of the item.

According to another preferred embodiment, the method further comprises setting the threshold value based on the histogram representation, the thumbnail image and the chart.

According to another preferred embodiment, the instructions of the user interface comprise instructions selected from the group of instructions comprising: sorting the items, enabling item ejection, disabling item ejection, generating reports, setting differentiation levels, transferring items, setting thresholds to generate alarms, defining data sets for automatic prediction and alarms, defining setpoints for line control.

According to another preferred embodiment, an interface is provided between a user and an inspection device to allow the user to receive visual and statistical information from the inspection device simultaneously and to provide instructions to the inspection device, the interface comprising:

A processor configured to receive an image from the inspection device, display at least a portion of the image, perform a statistical analysis based on the image and form a distribution histogram;

a display configured to simultaneously display at least the portion of the image and the distribution histogram;

and the input device is used for providing instructions for the processor by the user and interfacing with the checking and sorting device.

According to another preferred embodiment, at least part of the image and the distribution histogram correspond to each other.

Drawings

Some embodiments of the disclosed subject matter are described, by way of example only, with reference to the accompanying drawings. With specific reference now to the drawings in detail, it is stressed that the particulars shown are by way of example and for purposes of illustrative discussion of the preferred embodiments of the disclosed subject matter only, and are presented in the cause of providing what is believed to be the most useful and readily understood description of the principles and conceptual aspects of the disclosed subject matter. In this regard, no attempt is made to show structural details of the disclosed subject matter in more detail than is necessary for a fundamental understanding of the disclosed subject matter, the description taken with the drawings making apparent to those skilled in the art how the forms of the disclosed subject matter may be embodied in practice.

In the drawings:

FIG. 1 illustrates an automatic particle inspection apparatus (AIA) according to some exemplary embodiments of the disclosed subject matter;

FIG. 2A illustrates a front view of an automatic particle inspection apparatus according to some exemplary embodiments of the disclosed subject matter;

FIG. 2B illustrates a front view of the automatic particle inspection apparatus of FIG. 1 including a display device in accordance with some exemplary embodiments of the disclosed subject matter;

FIG. 2C illustrates a front view of another sorting system including a display device according to some exemplary embodiments of the disclosed subject matter;

FIG. 2D illustrates a front view of yet another sorting system including a display device according to some exemplary embodiments of the disclosed subject matter;

FIG. 3 illustrates a cross-sectional side view of an automatic particle inspection apparatus according to some exemplary embodiments of the disclosed subject matter;

FIG. 4 illustrates a top view of an automatic particle inspection apparatus according to some exemplary embodiments of the disclosed subject matter;

FIG. 5 is a screen shot of a video frame showing particles in an inspection process, according to some example embodiments of the disclosed subject matter;

FIG. 6 illustrates a block diagram of a particle inspection system in accordance with some exemplary embodiments of the disclosed subject matter;

FIG. 7 illustrates a flow chart of a method for particle inspection in accordance with some exemplary embodiments of the disclosed subject matter;

FIG. 8 illustrates a workstation screen shot depicting a results report in accordance with some exemplary embodiments of the disclosed subject matter;

FIG. 9 illustrates a workstation screenshot depicting another results report in accordance with some exemplary embodiments of the disclosed subject matter; and

FIG. 10 illustrates a workstation screenshot depicting yet another result report in accordance with some example embodiments of the disclosed subject matter.

FIG. 11 illustrates a workstation screen shot depicting a results report in accordance with some exemplary embodiments of the disclosed subject matter;

FIG. 12 illustrates a workstation screenshot depicting a results report in a trend view in accordance with some exemplary embodiments of the disclosed subject matter;

FIG. 13 illustrates a workstation screenshot depicting a results report in a thumbnail view in accordance with another embodiment of the disclosed subject matter;

14A and 14B illustrate workstation screen shots depicting a report of the results of a dark defect inspection in a thumbnail view in accordance with some exemplary embodiments of the disclosed subject matter;

15A and 15B illustrate workstation screen shots depicting a report of the results of a dimension monitoring inspection in a thumbnail view in accordance with some exemplary embodiments of the disclosed subject matter;

FIG. 16 illustrates a workstation screen shot depicting a report of the results of a yellowness inspection in a thumbnail view in accordance with some exemplary embodiments of the disclosed subject matter;

Detailed Description

Before explaining at least one embodiment of the disclosed subject matter in detail, it is to be understood that the disclosed subject matter is not limited in its application to the details of construction and to the arrangements of the components set forth in the following description or illustrated in the drawings. The disclosed subject matter is capable of other embodiments or of being practiced or of being carried out in various ways. Also, it is to be understood that the phraseology and terminology used herein is for the purpose of description and should not be regarded as limiting. The figures are generally not drawn to scale. For purposes of clarity, unnecessary elements are omitted from some of the figures.

The terms "comprising," "including," "comprising," "including," and "having" are intended to be inclusive and mean "including, but not limited to," along with their conjunctive words. The term "consisting of" and "consisting of" have the same meaning.

The term "consisting essentially of … …" means that the composition, method, or structure can include additional ingredients, steps, and/or portions, provided that such additional ingredients, steps, and/or portions do not materially alter the basic and novel characteristics of the claimed composition, method, or structure.

As used herein, the singular forms "a", "an" and "the" include plural referents unless the context clearly dictates otherwise. For example, the term "a compound" or "at least one compound" may include a plurality of compounds, including mixtures thereof.

Throughout this application, various embodiments of the presently disclosed subject matter may be presented in a range format. It should be understood that the description of the range format is merely for convenience and brevity and should not be interpreted as a inflexible limitation on the scope of the disclosed subject matter. Accordingly, the description of a range should be considered to have specifically disclosed all possible sub-ranges and individual values within that range.

It is appreciated that certain features of the disclosed subject matter, which are, for clarity, described in the context of separate embodiments, may also be provided in combination in a single embodiment. Conversely, various features of the disclosed subject matter, which are, for brevity, described in the context of a single embodiment, may also be provided separately or in any suitable subcombination or in any other described embodiment of the disclosed subject matter. Certain features described in the context of various embodiments are not to be considered essential features of such embodiments unless the embodiment is not operable without such elements.

Referring now to fig. 1, fig. 1 illustrates an automatic particle inspection apparatus (AIA) according to some exemplary embodiments of the disclosed subject matter. The AIA100 is a device configured to run a quality control process that inspects solid materials in a production line. In some exemplary embodiments, the AIA100 may be adapted to inspect and sort materials according to criteria such as color, size, shape, structural characteristics, any combination thereof, and the like. The material sorted by the AIA100 is a variety of discrete items such as beans, spices, nuts, particulates, rice, vegetables, fruits, plastic particulates, metal particulates, glass particulates, pills, any combination thereof, or the like.

For simplicity, the present disclosure hereinafter refers to the material sorted by AIA100 as "particles" or "articles".

In some exemplary embodiments, the AIA100 may be used online in a production line; the production line is used offline; parallel to the production line; and any combination thereof. In the linear exemplary embodiment, all particles to be consumed in production first enter the AIA100 through an inlet, preferably an inlet funnel 201, for inspection and enter the production line from an outlet 209 where the particles are discharged. In an off-line exemplary embodiment, all or a portion of the particles may be tested after being introduced into the production line. In a parallel exemplary embodiment, a portion of the material consumed in production enters the AIA100 through the inlet funnel 201 for inspection or sorting and enters the production line from the outlet 209.

Referring now to fig. 2A, a front view of an automatic particle inspection apparatus is shown in accordance with some exemplary embodiments of the disclosed subject matter. The AIA100 includes a housing 200 having an examination region, an inlet funnel 201, an outlet 209, a second outlet 212, and a sorting mechanism 213. In some exemplary embodiments, the inlet funnel 201 interfaces between the housing 200 and a feed tube or hopper (not shown) that is capable of pouring particles into the AIA 100. The housing 200 also includes a feeder mechanism 202, a slot feeder 204, a background surface, and preferably includes a first background surface 205, a second background surface 206, and a camera 207.

In some exemplary embodiments, the slot feeder 204 is adapted to receive particles from the inlet funnel 201 and release them into the inspection area of the housing in the form of a wire having a thickness substantially and preferably, but not necessarily, equal to the thickness of a single particle. In this way, the slot feeders 204 act as bumpers that collect the particles and arrange them in a single line on the housing 200 so that they fall like a curtain through the housing and through the examination region in which the particles are imaged. In some exemplary embodiments, the feeder mechanism 202 may be used to adjust the wire thickness of the outlet (not shown) of the slot feeder 204 to the thickness of an individual particle or any other suitable thickness. In some exemplary embodiments, the first background surface 205 and the second background surface 206 may each constitute a different background for the image captured by the camera 207. It should be noted that the camera 207 located on the camera compartment 210 faces (looks) the curtain releasing the particles and the backgrounds 205 and 206 located behind the curtain-falling particles.

It should also be noted that multiple cameras may be used. One or more of the plurality of cameras may be positioned opposite the camera depicted in fig. 2A. In this way, a relatively positioned camera may capture images from the other side of the particle. The oppositely positioned cameras may be equipped with a separate illumination system and a set of backgrounds. Such a dual function device is capable of capturing images for a comprehensive examination of the particles.

In some other exemplary embodiments, the particles may slide in a curtain-like structure on an inclined surface below the slot feeder, where the surface may be a background surface, as an example. This optional configuration may reduce the velocity of the particles as they pass through the examination region, thereby improving the quality of the image captured by the camera. Typically, particularly in this case, the slot in the slot feeder may be wider, or a feeder without a slot may be used and the particles pass through a feeder with another open profile.

In some exemplary embodiments, upon detecting particles that fail (reject) quality control inspection, the sorting mechanism 213 may be configured to deflect reject particles from the outlet 209 to the second outlet 212. According to one aspect of the present subject matter, there is provided a control system for a user to interface with an inspection device having at least one digital optical instrument, the control system comprising:

a display configured to display an analysis of the image, wherein a user is able to interface with and provide instructions to the inspection device based on the analysis of the image.

According to yet another aspect of the present subject matter, there is also provided an interface for interfacing between a user and an inspection device to allow the user to receive visual and statistical information from the inspection device and to provide instructions to the inspection device simultaneously, the interface comprising:

Referring now to fig. 2B, a front view of the automatic particle inspection apparatus of fig. 2 including a display device is shown, according to some exemplary embodiments of the disclosed subject matter. In this embodiment, the AIA100 also includes a display device 220, such as a screen capable of displaying information. The display device 220 may be, for example, an Electroluminescent (ELD) display device, a Liquid Crystal Display (LCD) device, a Light Emitting Diode (LED) device, a plasma (PDP) display, a combination thereof, or the like. The terms "display device" and "screen" are used for substantially the same features, and thus, these terms may be interchanged. The screen 220 may be connected to the AIA100 by wire or wirelessly. In some embodiments, screen 220 may be a computer monitor. In another embodiment, the screen 220 may be located on a remote device, such as an electronic handheld device, such as a tablet computer. In yet another embodiment, the screen 220 may be a smart phone device.

The information displayed on the screen 220 may be visual or tactile. Preferably, this information will be presented using a Graphical User Interface (GUI). The GUI is a form of user interface that allows a user to interact with the electronic device through graphical icons and audio indicators (e.g., primary symbols) rather than text-based user interfaces, typed command labels, or text navigation. This information is received from the camera 207 or from any other digital optical instrument, such as an X-ray detector, a Magnetic Resonance Imaging (MRI) device, a Computed Tomography (CT) scanner, a 3D data scanner, etc. Optionally, information may be retrieved from more than one digital optical instrument. The screen 220 displays a histogram, as will be described in detail below. The user interfaces with the AIA through an input device 221. The input device may be from a group of devices such as a keyboard, mouse, video, touch screen, etc.

Referring now to fig. 2C, fig. 2C illustrates a front view of another sorting system including a display device according to some exemplary embodiments of the disclosed subject matter. The sorting system 250 is operated to perform a quality control process that inspects the solid material in the production line. The sorting system 250 includes a material feeder 251 connected to a conveyor system 252. The transport system 252 is attached to an X-ray inspection unit 253, followed by at least one optical inspection unit 254. Additional optical inspection components 258 and color cameras 259 may be used to inspect the items. The sorting unit 255 sorts the inspected articles and separates them into a reject material reservoir 256 and a clean material reservoir 257. The screen 220 is attached to the sorting unit 250 and displays visual information related to the inspection of the articles, as will be discussed below.

Referring now to fig. 2D, fig. 2D illustrates a front view of yet another sorting system including a display device in accordance with some exemplary embodiments of the disclosed subject matter. The sorting system 270 is operated to perform quality control processes that inspect and sort solid materials in the production line. The sorting system 270 includes a pre-hopper 271 connected to a product supply 272. The product supply 272 is attached to a transport system 273 that moves the items into the inspection area. The examination region includes a Charge Coupled Device (CCD) 274 and a fluorescent lamp 275. The ejection nozzle 276 ejects the rejected inspection item into a reservoir 278. The non-rejected items are moved by the conversion system 273 to the second inspection area. The second examination region includes a Charge Coupled Device (CCD) 274 and a fluorescent lamp 275. The ejection nozzle 276 ejects the rejected inspection item into a reservoir 278. The non-rejected items are ejected into the reservoir 278. The screen 220 is attached to the sorting unit 270, displaying visual information of a histogram carrying visual information and statistical information related to the inspection of the items, such as the distribution of the particular type or size of items, as will be discussed below.

Referring now to fig. 3, fig. 3 illustrates a cross-sectional side view of an automatic particle inspection apparatus (AIA) in accordance with some exemplary embodiments of the disclosed subject matter. The slot feeder 204 basically includes two panels (204 a and 204 b) facing each other, however, each panel is inclined away from the vertical axis of the AIA 100. From a cross-sectional side view, slot feeder 204 has a trapezoidal shape, with the top and bottom of the trapezoid being open, rather than a narrow bottom (labeled "S" for slots), which can be adjusted by feeder mechanism 202. In some exemplary embodiments, the feeder mechanism 202 may adjust the slot 211 of the slot feeder 204 to a span corresponding to a typical coarseness of the type of particle being inspected.

Notably, particles poured into the inlet funnel 201 enter the slot feeder 204 through the so-called "top and bottom of the trapezoid" and exit the slot feeder in a curtain-like fashion into the outlet 209 while passing through the field of view (FOV) of the camera 207. In some exemplary embodiments, the span of the slot 211 may be manually adjusted by the feeder mechanism 202. Such as handles, levers, bolts, and any combination thereof, or any commercially available mechanical device. Additionally or alternatively, the feeder mechanism 202 may be configured to automatically adjust the span of the slot 211 by: an electric/pneumatic motor, an actuator, any combination thereof, and the like. In some exemplary embodiments, automatic adjustment of feeder mechanism 202 may be controlled by a controller of the present disclosure (described in further detail below).

In some exemplary embodiments, sorting mechanism 213 may be comprised of a plurality of mechanism types, such as deflection; removing the petals; pressurized air removal, diverter valves, any combination thereof, and the like.

Both flap removal and pressurized air removal can be used to reject relatively small amounts of particles that are not quality controlled. In some exemplary embodiments, when off-spec particles are detected (as will be described in further detail below), small amounts of the particles are removed from the production line by flap or pressurized air. It should be noted that such removal by flaps or by pressurized air may be used primarily, but not necessarily, in series and parallel line configurations. It should also be noted that the discarding (removal) process may be repeated as long as unacceptable particles are detected.

In some exemplary embodiments, the flap removal type may be based on, for example, a flat shelf hinged on one side that covers the opening. Upon activation, the flaps open to discard a predetermined number of particles.

In some exemplary embodiments, the pressurized air removal type may be based on a commercially available air nozzle that blows away a number of particles when activated. The approximate amount/number of particles to be discarded can be controlled by adjusting the blast duration and diameter of the air jet.

In some exemplary embodiments, the deflection sorting mechanism may be used primarily, but not necessarily, in an off-line production line configuration. The type of deflection mechanism may be based on a hinged door that operates as a selector, allowing the particles to reach the outlet 209, i.e. to the production line, or to deflect the particles to the second outlet 212. Typically, the activation deflection allows a relatively large number of particles to be discarded, i.e. the second outlet 212, to be opened to enable a predetermined number of particles to be discarded.

In some exemplary embodiments of the disclosed subject matter, sorting mechanisms 213 of the types listed above may utilize solenoids, motors, actuator pneumatic components, any combination thereof, and the like to implement any or all sorting mechanism types.

Fig. 3 depicts a side view of the camera 207, the first background surface 205, the second background surface 206, and the at least one background illumination 214, among other components. In some exemplary embodiments, camera 207 may be located in camera assembly 210 allowing the camera to be slid forward and backward, i.e., toward and away from background surfaces 205 and 206, such that the FOV of the camera should cover an area containing both backgrounds. Sliding of the camera 207 may be accomplished by a sliding mechanism 215 to adjust the distance between the focal point of the camera and a region covering the background (hereinafter region of interest (ROI)). In some exemplary embodiments, the slide mechanism 215 may be controlled manually and/or automatically by a Motion Control Unit (MCU) 604 (described in further detail below).

The camera 207 of the present disclosure is configured to obtain an image of particles falling from the slot feeder 204 in a curtain-like form in front of the first and second background surfaces 205 and 206. In some exemplary embodiments, the camera 207 may be a video camera, a line scan camera, a still camera, a monochrome camera, a color camera, an area array camera, any combination thereof, and the like. An area array camera is advantageous for use in current devices because it can capture a large number of particles on more than one background. The sensor used in an area camera has a large matrix of image pixels, so that a generally two-dimensional image can be generated in one exposure period, and therefore its efficiency is improved relative to other options. At least one of the plurality of cameras should be an area camera. Additionally or alternatively, the camera 207 may include filters (not shown) of different wavelengths, which may be configured as low pass, high pass, band pass, any combination thereof, and the like. Filters may be used for color correction; color conversion; color subtraction; contrast enhancement; polarization; a neutral density; crossing a screen; diffusion and contrast reduction, any combination thereof, and so forth. It should be noted that the filter may be used to enhance the spatial resolution, contrast and color resolution of the particles (as will be described in further detail below). In some example embodiments, the camera 207 may be comprised of a plurality of cameras, wherein each of the plurality of cameras may be configured to acquire different image attributes. It should be noted that the image may be a video, at least one still photograph, and combinations thereof, and wherein the image may be retained in a digital representation.

In some exemplary embodiments, the at least one background illumination 214 may be located in front of the background, behind the background, or both, i.e., in front of and behind the background. Additionally or alternatively, at least one of the background illuminations 214 may have a different wavelength or may use a subtractive filter intended for color separation. Additionally or alternatively, one of the surfaces may also act as a luminaire.

In some exemplary embodiments, the first background surface 205 may be (but is not limited to) white and the second background surface 206 may be (but is not limited to) black. It should be noted that the ROI acquired by the camera 207 is configured to capture particles that fall in front of white and black backgrounds (i.e., the first background surface 205 and the second background surface 206, respectively). In some example embodiments, the first background surface 205 and the second background surface 206 may each include a grid configured to facilitate image analysis. It will be appreciated that a white background facilitates analysis of particle pigmentation and/or other color defects, while a black background facilitates analysis of geometric (shape) defects of particles. In some exemplary embodiments, the second background surface 206 (black) may be recessed relative to the first background surface 205 (white). The black background is recessed relative to the white background to avoid reflection of the black background onto transparent particles still in front of the white background. In other words, if the black background is flush with the white background, the black background may cause artifacts to appear in the particles facing the white background. It should be noted that the color and hue of the image of the white background is analyzed for contamination, and thus black reflection (artifacts) may be confused as contamination.

It should be noted that the parameters of one or more of the backgrounds may be changed manually or automatically, such as the width of each background, the positioning of one background relative to the other, the color of the background, etc.

Referring now to fig. 4, fig. 4 illustrates a top view of an automatic particle inspection apparatus (AIA) 100 in accordance with some exemplary embodiments of the disclosed subject matter. The slot feeder 204 also includes a plurality of blades 208, also shown in fig. 2 and 3. In some exemplary embodiments, a plurality of blades 208 arranged vertically along the slot feeder 204 may facilitate uniform distribution of particles across the FOV, i.e., a curtain-like structure. The vanes 208 also help regulate the flow of particles through the feeder as the pile of particles can be controlled.

The blades may be moved manually or automatically relative to the other blades.

Reference is now made to fig. 5, which is a screen shot of a video frame showing particles during inspection, in accordance with some exemplary embodiments of the disclosed subject matter. Video frame 500 shows an image of particle 501 captured in the ROI in front of white portion 505 and black portion 506. It should be noted that the white portion 505 enables analysis of the quality of pigmentation, color and hue of the particles 501 relative to a predetermined threshold. On the other hand, the black portion 506 is capable of analyzing the geometric size, shape, and structural property qualification of the particle 501 with respect to a predetermined threshold. If the particles are dark colored, the information retrieved from each background is opposite to that of the light colored particles shown in FIG. 5.

Referring now to fig. 6, fig. 6 illustrates a block diagram of a particle inspection system 600 in accordance with some exemplary embodiments of the disclosed subject matter. The system 600 is a computerized device adapted to perform the method as shown in fig. 7.

In some exemplary embodiments, the system 600 includes an AIA100 in communication with a processor 601. The processor 601 is preferably a Central Processing Unit (CPU), microprocessor, electronic circuit, integrated Circuit (IC), or the like. Additionally or alternatively, the system 600 may be implemented as firmware written for or migrated to a particular processor (e.g., a Digital Signal Processor (DSP) or microcontroller), or may be implemented as hardware or configurable hardware, such as a Field Programmable Gate Array (FPGA) or Application Specific Integrated Circuit (ASIC). The processor 601 may be used to perform the calculations required by the system 600 or any sub-component thereof.

In some exemplary embodiments of the disclosed subject matter, the system 600 may include an input/output (I/O) module 602. The system 600 may utilize the I/O module 602 as an interface to send and/or receive information and instructions between the system 600 and external I/O devices using devices such as a mouse, keyboard, or touch screen. In some exemplary embodiments, the processor 601 is included within a workstation 605, the workstation 605 further including a memory 603, a display adapter 608, a communication module 609, and the like. Communication module 609 may interface with network 606.

In some example embodiments, the I/O module 602 may be used to provide an interface to a user of the system, for example, by providing output on the display 608 using a UI or GUI, reporting of visual results (e.g., depicted in fig. 5, 8, 9, and 10), such as particle size, incorrect cut monitoring, and color/hue defects, etc. The user may use workstation 605 to enter information such as pass/fail thresholds, discard particle lots, and make statistical calculations based on previous checks maintained in the system or network repository. However, it should be understood that system 600 may operate without manual operation.

In some example embodiments, the network 606 may be used to facilitate communication between the processor 601 and a cloud computing server (not shown) with enhanced extensibility, such as Amazon Web Services (AWS). Additionally or alternatively, the network 606 connection may be used to communicate with another device or data repository of the production facility. Additionally or alternatively, the system 600 may use the network 606 connection to maintain record information for the AIA100 in a cloud repository (not shown) or any other network storage.

In some exemplary embodiments, the system 600 includes a controller 604. The controller 604, which interfaces with the processor 601 via communication 609, is configured to drive and sense activities associated with the AIA100 and the electromechanical and/or pneumatic components of the camera 607 within the AIA, such as illumination, image capture, IO, and span of the slot. The controller 604 communicates with the processor 601 and may automatically control the AIA 100. In some exemplary embodiments, the driving and sensing activities may include manipulating the inlet funnel 201; a feeder mechanism 202; a slot feeder 204; a camera 207; a sorting mechanism 213; background illumination 214; a slide mechanism 215; and any combination thereof, and the like.

In some exemplary embodiments, the camera 607 in the AIA100 interfaces with the processor 601 to transmit captured images and to transmit digitally represented images to the processor 601 for image analysis. In some exemplary embodiments, the image captured from the at least one camera may include a camera selected from the group consisting of a video camera, a still camera, an area camera, a line scan camera, a video camera, a monochrome camera, a color camera, any combination thereof, and the like.

In some exemplary embodiments, the camera 607 may include an array of filters (not shown) adapted to be engaged by the controller 604 in front of the lens of at least one camera.

In some example implementations, the system 600 includes a memory unit 603. The memory unit 603 may be persistent or volatile. For example, the memory unit 603 may be an optical storage device such as a flash disk, random Access Memory (RAM), memory chip, CD, DVD, laser disc, etc.; magnetic storage devices such as tape, hard disk, storage Area Network (SAN), network Attached Storage (NAS), or others; semiconductor memory devices such as flash memory devices, memory sticks, and the like. In some example embodiments, the memory unit 603 may hold program code to activate the processor 601 to perform actions associated with any of the steps shown in fig. 7. The memory unit 603 may also be used to hold images captured by the camera 607, a plurality of particle profiles, results (reports) of the system 600, image analysis of each inspection sequence, reference profiles including thresholds for different types of particles, statistical analysis associated with the reference profiles; and any combination thereof, and the like.

The components detailed in system 600 may be implemented, for example, as one or more sets of interrelated computer instructions executed by processor 601 or another processor. These components may be arranged as one or more executable files, dynamic libraries, static libraries, methods, functions, services, etc. that are programmed in any programming language and under any computing environment.

Referring now to fig. 7, fig. 7 illustrates a flow chart of a method for particle inspection in accordance with some exemplary embodiments of the disclosed subject matter.

The actions of inspection system 600 are based on data generated by image processing itself with respect to the appearance of particulate matter. Optionally, the system 600 collects additional data from sensors directly connected to the system 600 and/or by importing data from other line control devices on the production line. For example, the system 600 may receive speed, temperature, and/or pressure readings from a production line and use information from those sensors alone, as well as information from the camera 207 or other cameras, in order to infer a desired action.

The data collected by system 600 is processed through statistical process control tools (SPC), artificial Intelligence (AI) algorithms, data trend analysis, and specially written algorithms to predict impending failures or existing production failure points.

In step 701, a particle profile is obtained. In some exemplary embodiments, the particle profile associated with the particle type to be inspected may be obtained from a data repository of the system 600, such as the memory 603 or a storage device connected to the network 606. The particle profile may be one of a plurality of particle profiles maintained in a repository, wherein each particle profile is associated with a different type of particle. In some exemplary embodiments, the types of particles may differ from each other in terms of size, color, shape, transparency, weight, any combination thereof, and the like. Thus, each type of known particle may have a profile that characterizes it for the AIA100 of the present disclosure.

In some exemplary embodiments, each of the plurality of grain profiles may include a predetermined parameter associated with the AIA100 setting. These parameters may include: camera configuration, lighting and background settings, span of slot feeders, and standard thresholds.

In step 702, a slot feeder is provided. In some exemplary embodiments, the system 600 adjusts the span 211 of the slot feeder 204 to meet the particle size requirements according to the parameters of the current particle profile.

In step 703, background illumination is set. In some exemplary embodiments, the system 600 may set at least one of the background lighting 214 to meet the requirements of particle color, hue, size, and transparency according to the parameters of the current particle profile. It should be noted that the illumination 214 may be configured to illuminate either side of the background as well as both sides simultaneously. Additionally or alternatively, the system 600 may cause the illumination 214 to alternate side illumination during the inspection process and dim illumination during the process, all to improve image resolution of the particle inspection.

In step 704, a camera is configured. In some exemplary embodiments, the system 600 may set up at least one camera 207 to meet the requirements for detecting impurities, geometric changes, and colors of particles according to the parameters of the current particle profile. The detection requirements may be, for example, impurities, dark spots or dark gels, dark and bright contaminants, foreign matter, discoloration, cross-contamination, color measurement and color shift, dimensional deviations, irregular shapes, clumping, transparency, gloss. It should be noted that, as previously described, more than one camera may be used simultaneously. Additionally or alternatively, the system 600 may cause one or more cameras 207 to alternate image capture during the sorting process and engage filters during the image capture process, all according to the current particle profile.

In step 705, particle dumping is enabled. In some exemplary embodiments, particles can enter the inlet funnel to initiate the particle monitoring and inspection process.

In step 706, images are captured and analyzed as well as data collected from other sources, such as other sensors and/or other production line systems. In some exemplary embodiments, the digital representation of the image may be routed by the video front end 207 to the processor 601 for image analysis. The image analysis is configured to determine a criterion for each particle in the image, wherein the criterion is selected from the group comprising requirements for: impurities, changes in geometry, particle color (e.g., impurities, dark spots or gels, dark and bright light contamination, foreign objects, discoloration, cross-contamination, color measurement and color shift, dimensional deviations, shape irregularities, clumping, transparency, gloss, in some exemplary embodiments, the image is retained in the repository at every 60 seconds record.

In step 707, a histogram is generated from all or a portion of the data collected in step 706. In some exemplary embodiments, the system 600 is adapted to generate a histogram representation, e.g., for the different criteria listed above, as depicted in fig. 8-16. It should be noted that the horizontal axis of each histogram represents size, preferably but not necessarily given in microns, and the vertical axis represents incidence of scaling with 100K particles. Each bar of each histogram contains a representative thumbnail for every 100K particles. Optionally, additional data may be used, such as data collected through statistical process control tools (SPC), artificial Intelligence (AI) algorithms, data trend analysis, and specially written algorithms. The SPC and AI may also be based on information from other sensors of other production lines or other sensors in the system.

Visual information, such as histograms, as will be depicted herein, may be connected and displayed for any of the sorting systems described previously herein, as well as in other sorting and inspection systems.

The inspection system may be used for additional actions-step 708-such as:

1. the use of an air nozzle or mechanical flap ejects the reject particles, which action allows the reject particles to be removed alone and zero to a relatively small amount of particles placed in its vicinity to be removed.

2. A diverter valve or other mechanism for diverting the entire flow of material is used to divert the flow of material being inspected. This action removes reject particles along with a greater number of reject particles present in the stream.

3. A command is sent to the line controller to stop production or to set a new set point for one of the production parameters (e.g., speed, temperature, pressure, and/or other parameters) to prevent manufacturing unacceptable particulates or to improve their quality.

4. An alarm is sent to the production line operator to indicate a production failure, or to indicate that production is transitioning from good and stable production to poor or unstable production, which may result in a production failure if the operator does not correct the situation.

5. A recommendation is made to the production line operator regarding the action to take to maintain or achieve good stable production.

In some exemplary embodiments, the sorting or other action is performed based on predetermined parameters of a given particle profile including standard thresholds. The threshold value specifies a predetermined pass/fail discrimination level for each criterion. The system 600 may also generate a quality report.

Reference is now made to fig. 8, 9 and 10. FIG. 8 shows a histogram of blackness criteria measured in gray scale; FIG. 9 shows a histogram of black size criteria measured in microns; fig. 10 shows a histogram of particle size criteria measured in microns. In some exemplary embodiments of the disclosed subject matter, the system 600 may react to any deviation from the standard in one or more of the actions described in step 708. It should be noted that other parameters such as particle size, particle shape, contaminant size and shape, color deviation, absolute color of particles or objects, etc. may be monitored, checked and represented in the histogram.

Referring now to fig. 11, fig. 11 illustrates a workstation screen shot depicting a results report in accordance with some example embodiments of the disclosed subject matter. The accuracy and reliability of the detection system is largely dependent on the capabilities and quality of operation of the system operator, as well as the proper management of the detection system settings and controls. In fact, this presents some very serious challenges to the user and even to the expert. Once a user is operating the inspection system, at least two types of information representations are important in order to provide the system with the correct instructions and to effectively perform the inspection process: statistical information and image information. According to embodiments of the disclosed subject matter, a user is able to interface with and provide instructions to an inspection device based on statistical analysis in combination with captured images such that both types of information are presented to the user at the same time. This feature will be described in further detail below. A control indicator 811 is displayed on the upper portion of the screen 220, the control indicator 811 showing the state of the result of the current inspection task. According to an embodiment of the present subject matter, the control indicator 811 includes an indication of the number of ejections and size. If the status is normal, the control indicator 811 is green. In the event of an abnormal condition, the control indicator 811 will be marked yellow or red. Any other color may be used without limiting the scope of the present subject matter. Optionally, more than one control indicator 811 may be displayed on the screen 220, displaying an indication of several factors upon request by the operator, such as displaying a failed inspection task or a prediction of failure. The central portion 810 of the screen 220 displays visual information about the inspected object. According to this embodiment, the screen shot shows the display of the inspected object during the particulate matter dark pollution inspection. In the mode tab 812, multiple display modes are presented, and the user can change from one mode to another. In this embodiment, the display mode is in the form of a thumbnail picture. In thumbnail mode, a real-time or reference view of a particular task at a particular time is presented. Another display mode is a trend, displaying a graphical view of the monitored parameter over a selected time interval, as will be further described in fig. 12. Another display mode is a camera view. State tab 814 has at least two states—a real-time view and a reference view, as will be further described in fig. 13. The central portion 810 of the screen 220 shows a thumbnail of the task-related particulate matter. The line 816 is operated to set the discrimination level. Each block 818 is a representation of an object examined in the AIA 100. The screen 220 may display a plurality of blocks 818 representing the inspected population. The latest image is displayed on the central portion 810 appearing at the bottom of the screen 220, pushing the image of the previous block 818 upward in a first-in-first-out stack. The number of squares 818 shown is associated with the number of particular particles and the height of the central portion 810. On the right side of the central portion 810, only one type of specific particle is detected, and thus, only this specific particle is displayed in the thumbnail, but on the left side of the central portion, there are more than 4 thumbnails, but only four of them are displayed. If the height of the center portion is higher, more thumbnail pictures will be presented. The lower portion 820 of the screen 220 displays the quantized date in a histogram view. Optionally, block 818 may display an image, such as the best image quality item or the most appropriate representative image, according to operator-determined criteria.

General task boxes include a technology login box 822, a golden reference box 824, a histogram box 826, a traffic box 828, a HW box 830, and a transient box 832. The technology login box 822 includes a login button 8221 and a logout button 8222 that will be pressed by the user into and out of the system. The golden reference block 824 is used to set up a snapshot of the golden reference during inspection, whether it is the current inspection task or generally for more than one inspection task. Once the user presses save button 8241, the current threshold, as well as all other applicable decisions and parameter settings, will be saved as the golden reference. Once the user presses the load button 8242, a graphical interface of the golden reference is displayed on the screen 220. Histogram box 826 displays the current task. The user may scroll down through the list of task options that appear in the histogram box, such as defect contrast, defect size, particle size, unfocused, yellowness, etc. When the user presses the clear histogram button 8261, the histogram shown in the central portion 810 of the screen 220 is cleared and the central portion 810 of the screen 220 is empty. The flow box 828 shows a count 8281 of particles per minute on the left. The flow box 828 shows the percentage 8282 of particulate separation on the right. The occlusion strip 8283 shows a visual indication of the flow of particles being inspected in the funnel 201. If the flow is good, the plug strip 8283 will be green. If there is an obstruction or poor flow, the obstruction bar 8283 will appear red. The HW box 830 disables the eject button 8302 may be red or green, and the color changes when the disable eject button 8302 is pressed. Upon pressing the report button 8304, a report of the current task is generated and sent to the user. At the bottom of HW block 830, an indication portion 8305 shows whether to disable pop-up. When the pop-up disable button 8302 is used to complete the pop-up enable, a short box 832 is used. In the transient box 832, the user may indicate by selecting the box in the name button 8321. Preferably, the name is a description of the task and shows a counter of the number of popups that occur. The user may reset the counter of the scratch pad (flex) by selecting the counter button 8322.

According to one embodiment of the disclosed subject matter, both types of information previously discussed herein are displayed on screen 220, allowing the user to view the results of the inspection process widely. On the central portion 810, a thumbnail view of the image of the inspected article appears. On the corresponding lower portion 820, a histogram view of statistical information about the inspected article appears. A particular block 818 that is part of column a# # is a thumbnail image of the inspected item that is part of the group that appears in that column. For example, column A# # is the segment of the task named defect size when the inspected item appears in histogram box 826. As previously described, if the height of the central portion 810 is higher, more thumbnail pictures may be presented—all from the same group. Statistical information, such as the intensity distribution of the parameters, associated with the items shown in column a# # is shown in the corresponding histogram bar b# #. In some embodiments of the present subject matter, at each column of buttons for A# #, a summary of the statistics is displayed. The two corresponding types of information (statistical information and visual information) can be explored simultaneously, so that the user can better know the inspection task and the specific article being inspected. According to the image information, the user can judge whether the irregular phenomenon is serious or not and decide whether an instruction needs to be sent to the system or not. Based on the statistical information, the user may make decisions regarding a particular one or more corresponding images and the entire inspection task. For example, the highest peak of the histogram represents the location of the most frequently occurring value in the dataset, also referred to as the mode of the dataset. This statistical information is constantly changing during the examination and may affect the instructions and decisions made by the user. Referring to peaks or modes in the corresponding histogram, while looking at the image information in column a#, provides the user with a broad and relevant knowledge base for analysis and instruction generation. For example, since the operator can check the image based on the statistical information, the threshold setting can be made more efficiently. For example, in some cases, the operator may be aware that the set defect size threshold is too stringent and that the size of the defect may be larger before classifying the article as defective.

Referring now to FIG. 12, a workstation screen shot depicting a results report in a trend view is shown, in accordance with some exemplary embodiments of the disclosed subject matter. In the trend view, the information is displayed as a chart of monitored parameters over a selected time interval (e.g., hours or days). The duration box 902 includes at least one button that displays a viewing time interval. The relevant information is displayed by pressing one of the buttons in the duration box 902. For example, when the 24-hour button is pressed, as shown in fig. 12, information of the last 24 hours is displayed. Parameter checkboxes 904 list parameters that can be monitored, such as black detection, pop-up, last 10 minutes pop-up, average particle count per minute, small excess threshold, particle size, etc. In the central portion 810 of the screen 220 there is parameter information and a graphical view that changes over time. On the right hand side of the central portion 810 of the screen 220, a graphical legend 906 appears, showing a specific graphical representation of each parameter. For example, the black detection mark is green, the pop-up mark is light brown, the last 10 minutes pop-up mark is dark red, and the average particle count per minute mark is blue. By clicking on a specific point 908, the interface changes to the thumbnail view as described previously. It should be noted that any combination of colors is possible. The trend view allows the user to intuitively evaluate history information of previous tasks about a specific time, and set a threshold according to such information, as will be explained later in fig. 14A, 14B, 15A, and 15B.

Referring now to fig. 13, fig. 13 illustrates a workstation screen shot depicting a results report in a thumbnail view in accordance with another embodiment of the disclosed subject matter. In thumbnail mode, view button 910 has two modes that the user needs to check: a real-time view or a reference view. If the real-time view is pressed, the view of the current inspection run is displayed. If the reference view is pressed, another run is displayed, such as a golden reference or any other historical reference. In reference block 912, a description of the reference is displayed and the user presses the option that he wants to display—gold, single, range, or none. In the lower part 820 of the screen 220, two histogram views are displayed-blue for the real-time view and green for the reference view. Other colors may be selected. The histogram display of current inspection tasks and general task statistics allows users to explore and compare information in order to make informed decisions. The general task statistics may be, for example, information about similar tasks within a selected time interval or golden reference graphical information. For example, having rich information about the current task in relation to other tasks in a particular system and other devices in order to compare results in different systems may provide an indication to an operator about the production line. Such information can be monitored over time to gain insight into how to improve the production line.

Referring now to fig. 14A, fig. 14A illustrates a workstation screen shot depicting a report of the results of a dark defect inspection in a thumbnail view in accordance with some exemplary embodiments of the disclosed subject matter. Setting a threshold or level of differentiation is a common activity performed by inspection system users in order to define goals related to a particular inspection or analysis task. The user may use a threshold to define a Key Performance Indicator (KPI) value for good or critical items. Green line 920 and green line 922 are set by the user. Green lines 920 and 922 are setting a level of discrimination of the small amount of contaminants allowed in the 200-400 micron range. Optionally, if the number reaches 1000, an alarm is activated, as shown by line 140 of FIG. 14B. Red line 924 sets the discrimination level for sorting dark contaminants above 700 microns. In a lower portion 820 of the screen 220, a corresponding histogram view is displayed. For example, in column 926, a thumbnail display of 3.9 particulates (normalized to 100k particulate particulates) with dark defects of 800 microns size is shown. The corresponding histogram display is shown in bar 928.

Referring now to fig. 15A, fig. 15A illustrates a workstation screen shot depicting a report of the results of a size monitoring inspection in a thumbnail view in accordance with some exemplary embodiments of the disclosed subject matter. The discrimination range or threshold range is generated by a threshold, such as a target range and a critical range. For example, depending on the threshold range in which the KPI value is located, it is good or critical. Green line 920 and green line 922 are set by the user. Green lines 920 and 922 are setting a discrimination level for the allowable small particle count (normalized to 100k particulates) in the 300-1200 micron range. If the number reaches 3k, an alarm is activated, as shown by line 150 of FIG. 15B. Red line 924 and red line 926 are setting the level of distinction of allowable changes in the mode of the histogram. If the mode change is below 2.3 mm or if the mode change exceeds 2.6 mm, an alarm is activated.

Referring now to fig. 16, fig. 16 illustrates a workstation screen shot depicting a report of the results of a yellowness check in a thumbnail view in accordance with some exemplary embodiments of the disclosed subject matter. The green line 920 is setting the differentiation level of too yellow particulates.

Other parameters may be displayed in the same or similar manner.

While the invention has been described in conjunction with specific embodiments thereof, it is evident that many alternatives, modifications and variations will be apparent to those skilled in the art. Accordingly, it is intended to embrace all such alternatives, modifications and variations that fall within the spirit and broad scope of the appended claims. All publications, patents, and patent applications mentioned in this specification are herein incorporated in their entirety by reference into the specification, to the same extent as if each individual publication, patent, or patent application was specifically and individually indicated to be incorporated herein by reference. In addition, citation or identification of any reference in this application shall not be construed as an admission that such reference is available as prior art to the present invention.

Claims

1. A management and control system for interfacing a user with an inspection device having at least one digital optical instrument, the management and control system comprising:

2. The management and control system of claim 1, wherein the histogram and the thumbnail correspond to each other.

3. The management and control system of claim 1, wherein the inspection and sorting device is configured to inspect items selected from the group of items consisting of beans, spices, nuts, particulates, rice, vegetables, fruits, plastic particulates, metal particulates, glass particulates, pills.

4. The management and control system of claim 1, wherein the at least one digital optical instrument is selected from the group of optical instruments comprising an X-ray detector, a Magnetic Resonance Imaging (MRI) device, a Computed Tomography (CT) scanner, a 3D data scanner, a camera, an optical sensor.

5. The management and control system of claim 1, wherein the display is selected from the group of displays consisting of monitors, screens, electroluminescent (ELD) display devices, liquid Crystal Display (LCD) devices, light Emitting Diode (LED) devices, plasma (PDP) displays, electronic handheld devices such as tablet computers, smart phone devices.

6. The management and control system of claim 2, wherein the instructions are selected from the group of instructions comprising: sorting items, enabling item ejection, disabling item ejection, generating reports, setting differentiation levels, transferring items, setting thresholds to generate alarms, defining datasets for automatic prediction and alarms, defining setpoints for line control.

7. The management and control system of claim 2, wherein the management system further comprises a memory unit in communication with the processor, wherein the memory unit is configured to hold information selected from the group of information comprising the image, a reference image, a plurality of profiles of items, system settings, system reports, image analysis, a reference profile comprising thresholds of different types of items, statistical analysis associated with the reference profile.

8. The management and control system of claim 1, wherein the display graphically displays a chart generated in the processor based on the image.

9. The management and control system of claim 1, wherein the inspection device is incorporated within a production line.

10. A method of managing and controlling an article inspection device, the method comprising:

analyzing, by the processor, the image to analyze the item;

instructions are received by the inspection device via the user interface.

11. The method of claim 10, wherein analyzing an image comprises determining a criterion for each item in the image, wherein the criterion is selected from the group consisting of an impurity, a change in geometry, a color of an item, a dark spot, a dark gel, a dark and bright contaminant, a foreign object, a color change, cross-contamination, color measurement and color shift, a dimensional deviation, a shape irregularity, a clump, a transparency, an item gloss.

12. The method of claim 10, further comprising: a histogram representation of the dimensions and criteria of the item is generated.

13. The method of claim 12, further comprising: the threshold is set based on the histogram representation, the thumbnail image, and the chart.

14. The method of claim 10, wherein the instructions by the user interface comprise instructions selected from the group of instructions comprising: sorting the items, enabling item ejection, disabling item ejection, generating reports, setting differentiation levels, transferring items, setting thresholds to generate alarms, defining data sets for automatic prediction and alarms, defining setpoints for line control.

15. The method of claim 10, wherein the histogram and the thumbnail image correspond to each other.

16. An interface interfacing between a user and an inspection device to allow the user to receive visual and statistical information from the inspection device and to provide instructions to the inspection device at the same time, the interface comprising:

17. The interface of claim 16, wherein the at least a portion of the image and the distribution histogram correspond to one another.