CN117391019B - Simulation test method, device, equipment and medium for EMI power filter - Google Patents
Simulation test method, device, equipment and medium for EMI power filter Download PDFInfo
- Publication number
- CN117391019B CN117391019B CN202311357315.7A CN202311357315A CN117391019B CN 117391019 B CN117391019 B CN 117391019B CN 202311357315 A CN202311357315 A CN 202311357315A CN 117391019 B CN117391019 B CN 117391019B
- Authority
- CN
- China
- Prior art keywords
- simulation test
- circuit
- filter
- test model
- circuit diagram
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000004088 simulation Methods 0.000 title claims abstract description 307
- 238000010998 test method Methods 0.000 title claims abstract description 24
- 238000012360 testing method Methods 0.000 claims abstract description 290
- 238000010586 diagram Methods 0.000 claims abstract description 126
- 238000001914 filtration Methods 0.000 claims abstract description 50
- 230000003071 parasitic effect Effects 0.000 claims description 27
- 230000008878 coupling Effects 0.000 claims description 20
- 238000010168 coupling process Methods 0.000 claims description 20
- 238000005859 coupling reaction Methods 0.000 claims description 20
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 16
- 229910052802 copper Inorganic materials 0.000 claims description 16
- 239000010949 copper Substances 0.000 claims description 16
- 238000004590 computer program Methods 0.000 claims description 14
- 239000011248 coating agent Substances 0.000 claims description 2
- 238000000576 coating method Methods 0.000 claims description 2
- 238000000034 method Methods 0.000 abstract description 11
- 230000000694 effects Effects 0.000 abstract description 3
- 238000003780 insertion Methods 0.000 description 7
- 230000037431 insertion Effects 0.000 description 7
- 230000010349 pulsation Effects 0.000 description 7
- 230000008569 process Effects 0.000 description 4
- 230000001960 triggered effect Effects 0.000 description 3
- 230000008859 change Effects 0.000 description 2
- 238000001514 detection method Methods 0.000 description 2
- 238000002474 experimental method Methods 0.000 description 2
- 230000006870 function Effects 0.000 description 2
- 230000001360 synchronised effect Effects 0.000 description 2
- 230000009471 action Effects 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000000052 comparative effect Effects 0.000 description 1
- 230000001808 coupling effect Effects 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
- 239000002699 waste material Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F30/00—Computer-aided design [CAD]
- G06F30/30—Circuit design
- G06F30/36—Circuit design at the analogue level
- G06F30/367—Design verification, e.g. using simulation, simulation program with integrated circuit emphasis [SPICE], direct methods or relaxation methods
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F30/00—Computer-aided design [CAD]
- G06F30/30—Circuit design
- G06F30/39—Circuit design at the physical level
- G06F30/392—Floor-planning or layout, e.g. partitioning or placement
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F30/00—Computer-aided design [CAD]
- G06F30/30—Circuit design
- G06F30/39—Circuit design at the physical level
- G06F30/398—Design verification or optimisation, e.g. using design rule check [DRC], layout versus schematics [LVS] or finite element methods [FEM]
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
- G06V30/00—Character recognition; Recognising digital ink; Document-oriented image-based pattern recognition
- G06V30/40—Document-oriented image-based pattern recognition
- G06V30/42—Document-oriented image-based pattern recognition based on the type of document
- G06V30/422—Technical drawings; Geographical maps
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E40/00—Technologies for an efficient electrical power generation, transmission or distribution
- Y02E40/40—Arrangements for reducing harmonics
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Theoretical Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- Geometry (AREA)
- Evolutionary Computation (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Architecture (AREA)
- Artificial Intelligence (AREA)
- Multimedia (AREA)
- Filters And Equalizers (AREA)
Abstract
The application relates to a simulation test method, a simulation test device, simulation test equipment and simulation test media for an EMI power filter, wherein the simulation test method comprises the steps of identifying a circuit diagram of a circuit to be tested, and generating a topology circuit diagram of the circuit to be tested according to a preset circuit element table; acquiring filter parameter information, and generating a first simulation test model according to the topological circuit diagram and the filter parameter information; generating a second simulation test model according to the topological circuit diagram and the first simulation test model; and obtaining a simulation test result based on the first simulation test model and the second simulation test model. The method and the device have the effect of improving accuracy of judging the filtering quality of the EMI power filter.
Description
Technical Field
The invention relates to the technical field of power supply filters, in particular to a simulation test method, a simulation test device, simulation test equipment and simulation test media of an EMI power supply filter.
Background
The EMI power filter is a filter circuit, which can effectively filter the noise conducted in the power line, simultaneously effectively inhibit the noise generated by the power equipment, and protect other equipment in the power grid from noise interference, therefore, the EMI power filter is widely applied to various electronic equipment,
in the related art, the simulation test method for the circuit using the EMI power supply filter basically measures the waveform of the output signal of the circuit directly, compares the waveform with the waveform of the input signal, and further judges the filtering quality of the EMI power supply filter, but because the load impedance and the power supply input frequency have fluctuation, the simple comparison cannot accurately judge the filtering quality of the EMI power supply filter.
The related technical scheme has the following defects: because the load impedance and the power input frequency of the circuit have fluctuation, the filtering quality of the EMI power filter cannot be accurately judged.
Disclosure of Invention
In order to improve accuracy in judging filtering quality of an EMI power supply filter, the application provides a simulation test method, a simulation test device, simulation test equipment and a simulation test medium of the EMI power supply filter.
In a first aspect, the above object of the present application is achieved by the following technical solutions:
a simulation test method of an EMI power filter, the simulation test method of the EMI power filter comprising:
identifying a circuit diagram of a circuit to be tested, and generating a topology circuit diagram of the circuit to be tested according to a preset circuit element table;
acquiring filter parameter information, and generating a first simulation test model according to the topological circuit diagram and the filter parameter information;
generating a second simulation test model according to the topological circuit diagram and the first simulation test model;
and obtaining a simulation test result based on the first simulation test model and the second simulation test model.
By adopting the technical scheme, the topology circuit diagram comprises the EMI power supply filter and the power supply and the load of the circuit to be tested, which are connected with the EMI power supply filter, and the topology circuit diagram can clearly show the relation between the EMI power supply filter and the power supply and the load without drawing a complex and complete circuit diagram, so that the waste of resources is avoided, the change of relevant parameters in the simulation model is controlled by using a control variable method based on the first simulation test model and the second simulation test model, and further, the more comprehensive simulation detection of the circuit to be tested is realized. In addition, simulation test results of the first simulation test model and the second simulation test model also have different expression modes, and the filtering quality of the EMI power supply filter is represented by different parameters, so that whether the filtering quality represented by different parameters is the same is judged, and the accuracy of judging the filtering quality of the EMI power supply filter is further improved.
The present application may be further configured in a preferred example to: the identifying the circuit diagram of the circuit to be tested, and generating the topology circuit diagram of the circuit to be tested according to a preset circuit element table specifically comprises the following steps:
identifying a circuit diagram of a circuit to be tested, and obtaining electrical parameter information of a circuit element of the circuit to be tested and copper coverage rate information of the circuit;
generating a topological circuit diagram of the circuit to be tested according to the electrical parameter information of the circuit element of the circuit to be tested and a preset circuit element table, and inputting the copper coating rate information of the circuit to the topological circuit diagram.
By adopting the technical scheme, the circuit copper-clad rate represents the copper-clad area of the circuit board of the circuit to be tested, and the circuit copper-clad rate can enable noise interference signals in the circuit to be tested to provide a low-impedance path which is unfavorable for detecting the filtering quality of the EMI power supply filter, so that the relevant parameters of the simulation test can be adjusted according to the circuit copper-clad rate, for example, the working frequency of a switching power supply is reduced, the influence of the circuit copper-clad rate is reduced, and the accuracy of judging the filtering quality of the EMI power supply filter is further improved.
The present application may be further configured in a preferred example to: the step of obtaining the filter parameter information, and generating a first simulation test model according to the topological circuit diagram and the filter parameter information, specifically includes:
acquiring filter parameter information, wherein the filter parameter information comprises capacitance capacity, leakage current parameters and power line length parameters;
according to the filter parameter information and the electric parameter information, obtaining a filter quality influence parameter of the circuit to be tested, wherein the filter quality influence parameter comprises an electromagnetic coupling influence parameter and a parasitic parameter influence parameter;
and generating a first simulation test model according to the filtering quality influence parameters and the topological circuit diagram.
By adopting the technical scheme, the filtering quality influence parameter represents a parameter which can negatively influence the filtering quality of the EMI power filter, for example, a parasitic parameter of a circuit to be tested is added on the basis of a topological circuit diagram, so that the simulation test is closer to the actual condition, and the accuracy of judging the filtering quality of the EMI power filter is improved.
The present application may be further configured in a preferred example to: the obtaining the filter quality influence parameter of the circuit to be tested according to the filter parameter information and the electrical parameter information specifically includes:
obtaining the electromagnetic coupling influence parameters according to the filter parameter information;
and obtaining parasitic parameter influence parameters according to the filter parameter information and the electric parameter information.
By adopting the technical scheme, the electromagnetic coupling influence parameter refers to the influence degree of electromagnetic coupling effect generated between the input line and the output line of the EMI power filter on the filtering quality of the EMI filter, the parasitic parameter influence parameter refers to the influence degree of parasitic capacitance, parasitic inductance and parasitic resistance in a circuit to be tested on the filtering quality of the EMI filter, and the parasitic parameter influence parameter and the electromagnetic coupling influence parameter can directly have negative influence on the filtering quality of the EMI power filter. Therefore, the filter quality influence parameter added in the first simulation test model ensures the accuracy of the test result of the first simulation test model.
The present application may be further configured in a preferred example to: generating a second simulation test model according to the topological circuit diagram and the first simulation test model, wherein the second simulation test model specifically comprises the following steps:
acquiring comparison electrical parameter information according to the filtering quality influence parameters, and generating a second topological circuit diagram according to the topological circuit diagram and the comparison electrical parameter information;
and generating a second simulation test model according to the second topological circuit diagram and the first simulation test model.
By adopting the technical scheme, the comparison electric parameter information refers to the generated electric parameter of the circuit with smaller filter quality influence parameter, and because the filter quality influence parameter in the first simulation test model is not the actual parameter obtained through actual measurement, the possibility of inaccuracy exists, and therefore, the simulation test results of the first simulation test model and the second simulation test model are compared through the second simulation test model with smaller filter quality influence on the EMI filter, and a more accurate simulation test result is obtained.
The present application may be further configured in a preferred example to: the step of obtaining a simulation test result based on the first simulation test model and the second simulation test model specifically comprises the following steps:
triggering a frequency calibration instruction based on the first simulation test model and the second simulation test model;
triggering a simulation test instruction based on the first simulation test model, the second simulation test model and a preset frequency limit threshold value to respectively obtain a first simulation test result and a second simulation test result;
and obtaining a simulation test result according to the first simulation test result and the second simulation test result.
By adopting the technical scheme, the frequency calibration instruction refers to an instruction for aligning the frequency bands and the frequency points of the first simulation test model and the second simulation test model to be uniform, the phenomenon that the output results cannot be compared and analyzed due to the fact that the frequency bands and the frequency points of the simulation test are not uniform is avoided, the frequency limit threshold refers to the threshold of the high frequency and the low frequency of the input frequency of the power supply, because the input noise can be generated when the input frequency of the power supply is too high, the frequency limit threshold can limit excessive input noise, further the simulation test results are prevented from being excessively interfered, and the accuracy of judging the filtering quality of the EMI power supply filter is further improved.
In a second aspect, the above object of the present application is achieved by the following technical solutions:
a simulation test apparatus of an EMI power filter, the simulation test apparatus of the EMI power filter comprising:
the topology circuit diagram acquisition module is used for identifying a circuit diagram of a circuit to be detected and generating the topology circuit diagram of the circuit to be detected according to a preset circuit element table;
the first simulation test model generation module is used for acquiring the parameter information of the filter and generating a first simulation test model according to the topological circuit diagram and the parameter information of the filter;
the second simulation test model generation module is used for generating a second simulation test model according to the topological circuit diagram and the first simulation test model;
the simulation test result acquisition module is used for acquiring a simulation test result based on the first simulation test model and the second simulation test model.
The present application may be further configured in a preferred example to: the topology circuit diagram acquisition module comprises:
the circuit information acquisition submodule to be tested is used for identifying a circuit diagram of the circuit to be tested and acquiring electrical parameter information of a circuit element of the circuit to be tested and circuit copper coverage rate information;
the topology circuit diagram acquisition submodule is used for generating a topology circuit diagram of the circuit to be tested according to the electrical parameter information of the circuit elements of the circuit to be tested and a preset circuit element table, and inputting the copper coverage rate information of the circuit to be tested into the topology circuit diagram.
In a third aspect, the above object of the present application is achieved by the following technical solutions:
a computer device comprising a memory, a processor and a computer program stored in the memory and executable on the processor, the processor implementing the steps of the above-described method for simulating testing of EMI power filters when the computer program is executed.
In a fourth aspect, the above object of the present application is achieved by the following technical solutions:
a computer readable storage medium storing a computer program which when executed by a processor performs the steps of the simulation test method of an EMI power filter described above.
In summary, the present application includes at least one of the following beneficial technical effects:
1. the control variable method is used for controlling the change of relevant parameters in the model, so that more comprehensive simulation detection of a circuit to be detected is realized, simulation test results of the first simulation test model and the second simulation test model also have different expression modes, the filtering quality of the EMI power filter is represented by different parameters, and whether the filtering quality represented by different parameters is the same is judged, so that the accuracy of judging the filtering quality of the EMI power filter is further improved;
2. comparing the simulation test results of the first simulation test model and the second simulation test model through a second simulation test model with smaller influence on the filtering quality of the EMI filter to obtain more accurate simulation test results;
3. because the input noise can be generated when the input frequency of the power supply is too high, the frequency limiting threshold can limit excessive input noise, so that the simulation test result is prevented from being interfered excessively, and the accuracy of judging the filtering quality of the EMI power supply filter is further improved.
Drawings
FIG. 1 is a flow chart of an implementation of a simulation test method of an EMI power filter in an embodiment of the present application;
FIG. 2 is a flowchart of an implementation of S10 of a simulation test method of an EMI power filter in an embodiment of the present application;
FIG. 3 is a flowchart of an implementation of S20 of a simulation test method of an EMI power filter in an embodiment of the present application;
FIG. 4 is a flowchart of an implementation of S22 of a simulation test method of an EMI power filter in an embodiment of the present application;
FIG. 5 is a flowchart of an implementation of S30 of a simulation test method of an EMI power filter in an embodiment of the present application;
FIG. 6 is a flowchart of an implementation of S40 of a simulation test method of an EMI power filter in an embodiment of the present application;
FIG. 7 is a schematic block diagram of a simulation test apparatus for an EMI power filter in an embodiment of the present application;
fig. 8 is an internal block diagram of a simulated test computer device for an EMI power filter in an embodiment of the application.
Detailed Description
The present application is described in further detail below in conjunction with figures 1-8.
In one embodiment, as shown in fig. 1, the application discloses a simulation test method of an EMI power filter, which specifically includes the following steps:
s10: and identifying a circuit diagram of the circuit to be tested, and generating a topological circuit diagram of the circuit to be tested according to a preset circuit element table.
In this embodiment, the topology circuit diagram refers to a circuit diagram of a connection relationship between a filter of a circuit to be tested and an input/output.
Specifically, the preset circuit element table includes components related to the simulation test in the embodiment, so as to remove redundant components and reduce the workload of the simulation, and therefore, identify a circuit diagram of the circuit to be tested, compare the circuit diagram of the circuit to be tested with the preset circuit element table according to the preset circuit element table, obtain components in the circuit to be tested and components corresponding to the preset circuit element table, and divide the obtained components corresponding to the preset circuit element table into an input circuit, an output circuit and a filter, so as to obtain a topology circuit diagram including the input circuit, the output circuit and the filter of the circuit to be tested.
S20: and acquiring the parameter information of the filter, and generating a first simulation test model according to the topological circuit diagram and the parameter information of the filter.
In this embodiment, the filter parameter information refers to impedance parameters of the EMI filter in the circuit under test. The first simulation test model refers to a circuit model that outputs insertion loss of a circuit under test.
Specifically, impedance parameters, namely filter parameter information, of an EMI filter in a circuit to be tested are obtained, wherein the filter parameter information comprises a plurality of capacitance and inductance, and a circuit model, namely a first simulation test model, for performing simulation tests, corresponding to the circuit to be tested and the filter is generated according to the circuit to be tested represented by a topological circuit diagram and the filter parameter information.
S30: and generating a second simulation test model according to the topological circuit diagram and the first simulation test model.
In this embodiment, the second simulation test model refers to a circuit model that outputs a ripple coefficient of the circuit under test.
Specifically, according to the circuit to be tested represented by the first simulation test model and elements required for measuring the pulsation coefficient, elements for measuring the pulsation coefficient are added on the basis of the first simulation test model, and a second simulation test model is generated.
S40: and obtaining a simulation test result based on the first simulation test model and the second simulation test model.
In this embodiment, the simulation test result refers to the filtering quality result information of the EMI filter in the circuit to be tested.
Specifically, simulation tests are performed based on a first simulation test model and a second simulation test model respectively, different test results based on the first simulation test model and the second simulation test model are obtained, parameters in the first simulation test model and parameters in the second simulation test model are different, output results of the first simulation test model and output results of the second simulation test model are also different, the second simulation test model has two different output results, and whether different parameters in the first simulation test model and the second simulation test model influence the simulation test results or not is judged through the respective comparison of the output results of the first simulation test model and the second simulation test model, and then filtering quality result information which is not influenced by parameter changes and indicates an EMI filter in a circuit to be tested is judged and obtained, namely the simulation test results.
In one embodiment, as shown in fig. 2, in step S10, a circuit diagram of a circuit to be tested is identified, and a topology circuit diagram of the circuit to be tested is generated according to a preset circuit element table, which specifically includes:
s11: and identifying a circuit diagram of the circuit to be tested, and obtaining electric parameter information of a circuit element of the circuit to be tested and copper coverage rate information of the circuit.
In this embodiment, the electrical parameter information refers to parameter information of a circuit element of the circuit to be tested. The circuit copper coverage information refers to the ratio of the area covered by copper on the circuit board of the circuit to be tested.
Specifically, a circuit diagram of the circuit to be tested is identified, the circuit diagram comprises an electrical drawing of the circuit to be tested, parameter information, namely electrical parameter information, of each circuit component in the circuit to be tested and ratio information, namely circuit copper coverage rate information, of the copper-covered area of the circuit board of the circuit to be tested are obtained from the electrical drawing of the circuit to be tested.
S12: generating a topology circuit diagram of the circuit to be tested according to the electrical parameter information of the circuit elements of the circuit to be tested and a preset circuit element table, and inputting the copper coverage information of the circuit to the topology circuit diagram.
Specifically, circuit elements corresponding to circuit elements in a circuit element list of a circuit to be tested are screened, a connection relation diagram of the circuit to be tested is generated according to the connection relation of the circuit elements represented by the circuit diagram of the circuit to be tested, the electrical parameter information and the electrical parameter information are marked on the corresponding circuit elements according to the electrical parameter information of the circuit elements of the circuit to be tested, a topology circuit diagram of the circuit to be tested is generated, and the copper coverage rate information of the circuit is input into the topology circuit diagram.
In one embodiment, as shown in fig. 3, in step S20, filter parameter information is acquired, and a first simulation test model is generated according to a topology circuit diagram and the filter parameter information, which specifically includes:
s21: and acquiring filter parameter information, wherein the filter parameter information comprises capacitance capacity, leakage current parameters and power line length parameters.
In the present embodiment, the capacitance capacity refers to a capacity value of a capacitance in the EMI filter. The leakage current parameter refers to the current magnitude of the leakage current generated by the EMI filter. The power line length parameter refers to the length of the power line to which the EMI filter is connected.
Specifically, filter parameter information is acquired, wherein the filter parameter information includes a capacitance capacity representing each capacitance in the EMI filter, a leakage current parameter representing a current magnitude value of a leakage current generated by the EMI filter, and a power line length parameter representing a length of a power line connected to the EMI filter.
S22: and obtaining the filter quality influence parameters of the circuit to be tested according to the filter parameter information and the electric parameter information, wherein the filter quality influence parameters comprise electromagnetic coupling influence parameters and parasitic parameter influence parameters.
In the present embodiment, the filter quality influence parameter refers to a negative influence value indicating the filter quality of the EMI filter. The electromagnetic coupling influence parameter is a value indicating the degree of coupling of the non-filtering action generated by the circuit to be measured. The parasitic parameter influencing parameter refers to a parameter value representing a parasitic parameter in the circuit under test.
Specifically, according to the filter parameter information and the electrical parameter information representing the parameter value of the circuit element of the circuit to be tested, the parameter value which can negatively affect the filtering quality of the EMI filter when the circuit to be tested is in power-on operation, namely, the filtering quality influence parameter is determined, wherein the greater the filtering quality influence parameter is, the worse the filtering quality is represented, and the filtering quality influence parameter comprises a value representing the degree of coupling of non-filtering effect generated by the circuit to be tested, namely, electromagnetic coupling influence parameter, namely, parasitic coupling, and a parameter value representing the parasitic parameter in the circuit to be tested, namely, parasitic parameter influence parameter.
S23: and generating a first simulation test model according to the filtering quality influence parameters and the topological circuit diagram.
Specifically, a circuit model of a circuit to be tested is generated according to a topological circuit diagram, and according to the filter quality influence parameters, the filter quality influence parameters are input into the generated circuit model, so that a first simulation test model is generated.
In one embodiment, as shown in fig. 4, in step S22, a filter quality influence parameter of the circuit to be tested is obtained according to the filter parameter information and the electrical parameter information, which specifically includes:
s221: and obtaining electromagnetic coupling influence parameters according to the filter parameter information.
Specifically, according to the filter parameter information, the operation of the EMI filter in the circuit to be tested is simulated, the filtering quality of the EMI filter is judged, and then according to the range of the influence degree coefficient of parasitic coupling on the filtering quality of the filter, which is obtained through a large number of experiments on different circuits, the electromagnetic coupling influence parameter of the circuit to be tested is judged, so that the electromagnetic coupling influence parameter is a coefficient value.
S222: and obtaining parasitic parameter influence parameters according to the filter parameter information and the electric parameter information.
Specifically, according to the parameter values of each circuit element of the circuit to be tested represented by the filter parameter information and the electric parameter information, an equivalent circuit of the circuit to be tested is simulated, then according to an original circuit diagram of the circuit to be tested, a parasitic parameter of the circuit to be tested is judged, and according to the obtained parasitic parameter and the range of the influence degree coefficient of the parasitic parameter obtained by a large number of experiments on different circuits on the filter quality, the parasitic parameter influence parameter of the circuit to be tested is judged, so that the parasitic parameter influence parameter is also a coefficient value.
In one embodiment, as shown in fig. 5, in step S30, a second simulation test model is generated according to the topology circuit diagram and the first simulation test model, and specifically includes:
s31: and acquiring comparison electrical parameter information according to the filtering quality influence parameters, and generating a second topological circuit diagram according to the topological circuit diagram and the comparison electrical parameter information.
In this embodiment, the comparative electrical parameter information refers to the adjusted electrical parameter information. The second topological circuit diagram refers to a topological circuit diagram after adjusting the electrical parameter information of the circuit to be tested.
Specifically, according to a negative influence value of the filtering quality of the EMI filter, which is represented by the filtering quality influence parameter, correspondingly adjusting a parameter value of a circuit element in the circuit to be detected to obtain comparison electrical parameter information, so that the filtering quality influence parameter of the circuit to be detected is reduced, and according to the topology circuit diagram and the comparison electrical parameter information, modifying a parameter value of a corresponding circuit element in the topology circuit diagram to obtain a second topology circuit diagram.
S32: and generating a second simulation test model according to the second topological circuit diagram and the first simulation test model.
Specifically, according to the second topological circuit diagram, the first simulation test model is correspondingly adjusted to generate a second simulation test model, and the output result of the second simulation test model also comprises a pulsation coefficient, so that the second simulation test model also comprises an element for measuring the pulsation coefficient.
Further, according to the filter parameter information and the comparison electric parameter information, the filter quality influence parameter based on the second topological circuit diagram is judged, and is input into the second simulation test model.
In one embodiment, as shown in fig. 6, in step S40, a simulation test result is obtained based on the first simulation test model and the second simulation test model, and specifically includes:
s41: the frequency calibration instructions are triggered based on the first simulation test model and the second simulation test model.
In this embodiment, the frequency calibration instruction refers to instruction information for calibrating the test frequency bands and frequency points of the first simulation test model and the second simulation test model.
Specifically, before the simulation test is performed based on the first simulation test model and the second simulation test model, the frequency band and the frequency point of the test performed by the first simulation test model and the second simulation test model are calibrated, namely, a frequency calibration instruction is triggered.
S42: triggering a simulation test instruction based on the first simulation test model, the second simulation test model and a preset frequency limit threshold value to respectively obtain a first simulation test result and a second simulation test result.
In this embodiment, the simulation test instruction refers to instruction information for performing a simulation test. The first simulation test result refers to an output result of the first simulation test model. The second simulation test result refers to an output result of the second simulation test model.
Specifically, simulation tests are respectively performed based on the first simulation test model and the second simulation test model, namely, a simulation test instruction is triggered, in the simulation test process, the input frequency of an input power supply of a circuit to be tested does not exceed a preset frequency limit threshold value, and after the simulation tests are completed, a first simulation test result and a second simulation test result based on the first simulation test model and the second simulation test model are respectively obtained.
S43: and obtaining a simulation test result according to the first simulation test result and the second simulation test result.
Specifically, the second simulation test result includes insertion loss and a pulsation coefficient, so that the filtering quality of the EMI filter represented by the insertion loss and the pulsation coefficient in the second simulation test result is respectively compared with the filtering quality of the EMI filter represented by the first simulation test result, if the comparison and judgment results are the same, the insertion loss in the second simulation test result is taken as a final simulation test result, if the comparison and judgment results are different, whether the filtering quality of the EMI filter represented by the insertion loss and the pulsation coefficient in the second simulation test result are consistent is judged, if the judgment results are different, the insertion loss of the first simulation test result is taken as a final simulation test result, and if the judgment results are the same, the insertion loss of the second simulation test result is taken as a final simulation test result.
It should be understood that the sequence number of each step in the foregoing embodiment does not mean that the execution sequence of each process should be determined by the function and the internal logic of each process, and should not limit the implementation process of the embodiment of the present application in any way.
In an embodiment, a simulation test device of an EMI power filter is provided, where the simulation test device of the EMI power filter corresponds to the simulation test method of the EMI power filter in the above embodiment one by one. As shown in fig. 7, the simulation test device of the EMI power filter includes a topology circuit diagram acquisition module, a first simulation test model generation module, a second simulation test model generation module, and a simulation test result acquisition module. The functional modules are described in detail as follows:
the topology circuit diagram acquisition module is used for identifying a circuit diagram of the circuit to be detected and generating the topology circuit diagram of the circuit to be detected according to a preset circuit element table;
the first simulation test model generation module is used for acquiring the parameter information of the filter and generating a first simulation test model according to the topological circuit diagram and the parameter information of the filter;
the second simulation test model generation module is used for generating a second simulation test model according to the topological circuit diagram and the first simulation test model;
the simulation test result acquisition module is used for acquiring a simulation test result based on the first simulation test model and the second simulation test model.
Optionally, the topology circuit diagram acquisition module includes:
the circuit information acquisition submodule to be tested is used for identifying a circuit diagram of the circuit to be tested and acquiring electrical parameter information of a circuit element of the circuit to be tested and circuit copper coverage rate information;
the topology circuit diagram acquisition submodule is used for generating a topology circuit diagram of the circuit to be tested according to the electrical parameter information of the circuit elements of the circuit to be tested and a preset circuit element table, and inputting the copper coverage rate information of the circuit to be tested into the topology circuit diagram.
Optionally, the first simulation test model generating module includes:
the filter parameter information acquisition sub-module is used for acquiring filter parameter information, wherein the filter parameter information comprises capacitance capacity, leakage current parameters and power line length parameters;
the filter quality influence parameter acquisition sub-module is used for acquiring filter quality influence parameters of the circuit to be tested according to the filter parameter information and the electric parameter information, wherein the filter quality influence parameters comprise electromagnetic coupling influence parameters and parasitic parameter influence parameters;
and the first simulation test model generation submodule is used for generating a first simulation test model according to the filtering quality influence parameters and the topological circuit diagram.
Optionally, the filtering quality influence parameter obtaining submodule includes:
the electromagnetic coupling influence parameter acquisition unit is used for acquiring electromagnetic coupling influence parameters according to the filter parameter information;
and the parasitic parameter influence parameter acquisition unit is used for acquiring the parasitic parameter influence parameter according to the filter parameter information and the electric parameter information.
Optionally, the second simulation test model generating module includes:
the second topological circuit diagram obtaining submodule is used for obtaining comparison electric parameter information according to the filtering quality influence parameters and generating a second topological circuit diagram according to the topological circuit diagram and the comparison electric parameter information;
and the second simulation test model generation submodule is used for generating a second simulation test model according to the second topological circuit diagram and the first simulation test model.
Optionally, the simulation test result obtaining module includes:
the frequency calibration instruction submodule is used for triggering a frequency calibration instruction based on the first simulation test model and the second simulation test model;
the simulation test instruction submodule is used for triggering a simulation test instruction based on the first simulation test model, the second simulation test model and a preset frequency limit threshold value to respectively obtain a first simulation test result and a second simulation test result;
the simulation test result obtaining sub-module is used for obtaining a simulation test result according to the first simulation test result and the second simulation test result.
The specific limitation of the simulation test apparatus for the EMI power filter can be referred to the limitation of the simulation test method for the EMI power filter hereinabove, and will not be repeated herein. The modules in the simulation test device of the EMI power filter can be implemented in whole or in part by software, hardware and a combination thereof. The above modules may be embedded in hardware or may be independent of a processor in the computer device, or may be stored in software in a memory in the computer device, so that the processor may call and execute operations corresponding to the above modules.
In one embodiment, a computer device is provided, which may be a server, and the internal structure of which may be as shown in fig. 8. The computer device includes a processor, a memory, a network interface, and a database connected by a system bus. Wherein the processor of the computer device is configured to provide computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system, computer programs, and a database. The internal memory provides an environment for the operation of the operating system and computer programs in the non-volatile storage media. The database of the computer device is used for storing a topological circuit diagram, a second topological circuit diagram, a first simulation test model and a second simulation test model. The network interface of the computer device is used for communicating with an external terminal through a network connection. The computer program, when executed by a processor, implements a method for simulated testing of an EMI power filter.
In one embodiment, a computer device is provided comprising a memory, a processor, and a computer program stored on the memory and executable on the processor, the processor implementing the steps of when executing the computer program:
identifying a circuit diagram of a circuit to be tested, and generating a topology circuit diagram of the circuit to be tested according to a preset circuit element table;
acquiring filter parameter information, and generating a first simulation test model according to the topological circuit diagram and the filter parameter information;
generating a second simulation test model according to the topological circuit diagram and the first simulation test model;
and obtaining a simulation test result based on the first simulation test model and the second simulation test model.
In one embodiment, a computer readable storage medium is provided having a computer program stored thereon, which when executed by a processor, performs the steps of:
identifying a circuit diagram of a circuit to be tested, and generating a topology circuit diagram of the circuit to be tested according to a preset circuit element table;
acquiring filter parameter information, and generating a first simulation test model according to the topological circuit diagram and the filter parameter information;
generating a second simulation test model according to the topological circuit diagram and the first simulation test model;
and obtaining a simulation test result based on the first simulation test model and the second simulation test model.
Those skilled in the art will appreciate that implementing all or part of the above described methods may be accomplished by way of a computer program stored on a non-transitory computer readable storage medium, which when executed, may comprise the steps of the embodiments of the methods described above. Any reference to memory, storage, database, or other medium used in the various embodiments provided herein may include non-volatile and/or volatile memory. The nonvolatile memory can include Read Only Memory (ROM), programmable ROM (PROM), electrically Programmable ROM (EPROM), electrically Erasable Programmable ROM (EEPROM), or flash memory. Volatile memory can include Random Access Memory (RAM) or external cache memory. By way of illustration and not limitation, RAM is available in a variety of forms such as Static RAM (SRAM), dynamic RAM (DRAM), synchronous DRAM (SDRAM), double Data Rate SDRAM (DDRSDRAM), enhanced SDRAM (ESDRAM), synchronous Link DRAM (SLDRAM), memory bus direct RAM (RDRAM), direct memory bus dynamic RAM (DRDRAM), and memory bus dynamic RAM (RDRAM), among others.
It will be apparent to those skilled in the art that, for convenience and brevity of description, only the above-described division of the functional units and modules is illustrated, and in practical application, the above-described functional distribution may be performed by different functional units and modules according to needs, i.e. the internal structure of the apparatus is divided into different functional units or modules to perform all or part of the above-described functions.
The above embodiments are only for illustrating the technical solution of the present application, and are not limiting; although the present application has been described in detail with reference to the foregoing embodiments, it should be understood by those of ordinary skill in the art that: the technical scheme described in the foregoing embodiments can be modified or some technical features thereof can be replaced by equivalents; such modifications and substitutions do not depart from the spirit and scope of the technical solutions of the embodiments of the present application, and are intended to be included in the scope of the present application.
Claims (7)
1. The simulation test method of the EMI power supply filter is characterized by comprising the following steps of:
identifying a circuit diagram of a circuit to be tested, and generating a topology circuit diagram of the circuit to be tested according to a preset circuit element table;
acquiring filter parameter information, and generating a first simulation test model according to the topological circuit diagram and the filter parameter information;
generating a second simulation test model according to the topological circuit diagram and the first simulation test model;
based on the first simulation test model and the second simulation test model, a simulation test result is obtained;
the step of obtaining the filter parameter information, and generating a first simulation test model according to the topological circuit diagram and the filter parameter information, specifically includes:
acquiring filter parameter information, wherein the filter parameter information comprises capacitance capacity, leakage current parameters and power line length parameters;
according to the filter parameter information and the electric parameter information, obtaining a filter quality influence parameter of the circuit to be tested, wherein the filter quality influence parameter comprises an electromagnetic coupling influence parameter and a parasitic parameter influence parameter;
generating a first simulation test model according to the filtering quality influence parameters and the topological circuit diagram;
generating a second simulation test model according to the topological circuit diagram and the first simulation test model, wherein the second simulation test model specifically comprises the following steps:
acquiring comparison electrical parameter information according to the filtering quality influence parameters, and generating a second topological circuit diagram according to the topological circuit diagram and the comparison electrical parameter information;
generating a second simulation test model according to the second topological circuit diagram and the first simulation test model;
the step of obtaining a simulation test result based on the first simulation test model and the second simulation test model specifically comprises the following steps:
triggering a frequency calibration instruction based on the first simulation test model and the second simulation test model;
triggering a simulation test instruction based on the first simulation test model, the second simulation test model and a preset frequency limit threshold value to respectively obtain a first simulation test result and a second simulation test result;
and obtaining a simulation test result according to the first simulation test result and the second simulation test result.
2. The simulation test method of the EMI power filter according to claim 1, wherein the identifying the circuit diagram of the circuit to be tested, generating the topology circuit diagram of the circuit to be tested according to a preset circuit element table, specifically comprises:
identifying a circuit diagram of a circuit to be tested, and obtaining electrical parameter information of a circuit element of the circuit to be tested and copper coverage rate information of the circuit;
generating a topological circuit diagram of the circuit to be tested according to the electrical parameter information of the circuit element of the circuit to be tested and a preset circuit element table, and inputting the copper coating rate information of the circuit to the topological circuit diagram.
3. The simulation test method of the EMI power filter according to claim 1, wherein the obtaining the filter quality influence parameter of the circuit to be tested according to the filter parameter information and the electrical parameter information specifically includes:
obtaining the electromagnetic coupling influence parameters according to the filter parameter information;
and obtaining parasitic parameter influence parameters according to the filter parameter information and the electric parameter information.
4. A simulation test apparatus of an EMI power filter, the simulation test apparatus of the EMI power filter comprising:
the topology circuit diagram acquisition module is used for identifying a circuit diagram of a circuit to be detected and generating the topology circuit diagram of the circuit to be detected according to a preset circuit element table;
the first simulation test model generation module is used for acquiring the parameter information of the filter and generating a first simulation test model according to the topological circuit diagram and the parameter information of the filter;
the second simulation test model generation module is used for generating a second simulation test model according to the topological circuit diagram and the first simulation test model;
the simulation test result acquisition module is used for acquiring a simulation test result based on the first simulation test model and the second simulation test model;
the first simulation test model generation module comprises:
the filter parameter information acquisition sub-module is used for acquiring filter parameter information, wherein the filter parameter information comprises capacitance capacity, leakage current parameters and power line length parameters;
the filter quality influence parameter acquisition sub-module is used for acquiring filter quality influence parameters of the circuit to be tested according to the filter parameter information and the electric parameter information, wherein the filter quality influence parameters comprise electromagnetic coupling influence parameters and parasitic parameter influence parameters;
the first simulation test model generation submodule is used for generating a first simulation test model according to the filtering quality influence parameters and the topological circuit diagram;
the second simulation test model generating module comprises:
the second topological circuit diagram obtaining submodule is used for obtaining comparison electrical parameter information according to the filtering quality influence parameters and generating a second topological circuit diagram according to the topological circuit diagram and the comparison electrical parameter information;
the second simulation test model generation submodule is used for generating a second simulation test model according to the second topological circuit diagram and the first simulation test model;
the simulation test result acquisition module comprises:
the frequency calibration instruction submodule is used for triggering a frequency calibration instruction based on the first simulation test model and the second simulation test model;
the simulation test instruction submodule is used for triggering a simulation test instruction based on the first simulation test model, the second simulation test model and a preset frequency limiting threshold value to respectively obtain a first simulation test result and a second simulation test result;
and the simulation test result acquisition sub-module is used for acquiring a simulation test result according to the first simulation test result and the second simulation test result.
5. The simulation test apparatus of the EMI power filter of claim 4, wherein the topology acquisition module comprises:
the circuit information acquisition submodule to be tested is used for identifying a circuit diagram of the circuit to be tested and acquiring electrical parameter information of a circuit element of the circuit to be tested and circuit copper coverage rate information;
the topology circuit diagram acquisition submodule is used for generating a topology circuit diagram of the circuit to be tested according to the electrical parameter information of the circuit elements of the circuit to be tested and a preset circuit element table, and inputting the copper coverage rate information of the circuit to be tested into the topology circuit diagram.
6. A computer device comprising a memory, a processor and a computer program stored in the memory and executable on the processor, characterized in that the processor, when executing the computer program, carries out the steps of the simulation test method of an EMI power filter according to any one of claims 1 to 3.
7. A computer readable storage medium storing a computer program, characterized in that the computer program when executed by a processor implements the steps of the simulation test method of an EMI power filter as claimed in any one of claims 1 to 3.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202311357315.7A CN117391019B (en) | 2023-10-18 | 2023-10-18 | Simulation test method, device, equipment and medium for EMI power filter |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202311357315.7A CN117391019B (en) | 2023-10-18 | 2023-10-18 | Simulation test method, device, equipment and medium for EMI power filter |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN117391019A CN117391019A (en) | 2024-01-12 |
| CN117391019B true CN117391019B (en) | 2024-03-22 |
Family
ID=89440513
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202311357315.7A Active CN117391019B (en) | 2023-10-18 | 2023-10-18 | Simulation test method, device, equipment and medium for EMI power filter |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN117391019B (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN118095159A (en) * | 2024-04-08 | 2024-05-28 | 广州泓锐信息技术有限公司 | Circuit simulation method and system based on Arduino |
Citations (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH10320440A (en) * | 1997-05-21 | 1998-12-04 | Oki Electric Ind Co Ltd | Logic simulation library, and method and device for confirming operation of electronic circuit |
| CN101629980A (en) * | 2009-09-10 | 2010-01-20 | 南京师范大学 | Method for testing performance of EMI filter based on scattering parameter |
| RU113014U1 (en) * | 2011-10-17 | 2012-01-27 | Открытое акционерное общество "Всероссийский научно-исследовательский и проектно-конструкторский институт электровозостроения" (ОАО "ВЭлНИИ") | DEVICE FOR DETERMINING PULSE LOSS OF ELECTRIC PULSING CURRENT MACHINES |
| CN205336099U (en) * | 2015-12-25 | 2016-06-22 | 北京泰派斯特科技发展有限公司 | EMI power filter emulation test equipment |
| WO2018000939A1 (en) * | 2016-06-30 | 2018-01-04 | 深圳市九洲电器有限公司 | Filter and electronic device |
| WO2018082340A1 (en) * | 2016-11-04 | 2018-05-11 | 宁德时代新能源科技股份有限公司 | Simulation test system and method |
| CN108964798A (en) * | 2018-07-18 | 2018-12-07 | Oppo广东移动通信有限公司 | Radio circuit adjustment method and relevant apparatus |
| CN111277125A (en) * | 2020-03-11 | 2020-06-12 | 中国建设银行股份有限公司 | Direct-current power supply filter assembly and direct-current power supply filter circuit |
| CN111353265A (en) * | 2020-03-30 | 2020-06-30 | 中车株洲电力机车研究所有限公司 | EMI filter insertion loss simulation system and method based on Matlab GUI platform |
| CN114818593A (en) * | 2021-01-19 | 2022-07-29 | 长鑫存储技术有限公司 | Simulation method, simulation device, power line topology network, test circuit and storage medium |
| WO2022183639A1 (en) * | 2021-03-01 | 2022-09-09 | 长鑫存储技术有限公司 | Semiconductor structure measuring method, and device |
| CN115270680A (en) * | 2022-06-08 | 2022-11-01 | 电子科技大学 | Design method for analog multi-passband filter |
| CN115327269A (en) * | 2022-08-10 | 2022-11-11 | 广汽埃安新能源汽车有限公司 | Conduction emission testing method and device for electric drive system |
| CN115422792A (en) * | 2022-07-29 | 2022-12-02 | 成都飞机工业（集团）有限责任公司 | Method, device, equipment and medium for analyzing electromagnetic interference of switching power supply |
| CN116008704A (en) * | 2023-01-03 | 2023-04-25 | 广州市德珑电子器件有限公司 | Safety regulation testing equipment and method for EMI power filter |
| CN116050185A (en) * | 2023-03-28 | 2023-05-02 | 敏业信息科技（上海）有限公司 | Electromagnetic interference filter simulation and verification method, device and computer readable medium |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8686746B2 (en) * | 2009-07-01 | 2014-04-01 | Delta Electronics, Inc. | Test apparatus and method for measuring common-mode capacitance |
| US8997034B2 (en) * | 2012-07-30 | 2015-03-31 | Synopsys, Inc. | Emulation-based functional qualification |
| JP6267918B2 (en) * | 2013-10-09 | 2018-01-24 | ローム株式会社 | Method for evaluating devices including noise sources |
-
2023
- 2023-10-18 CN CN202311357315.7A patent/CN117391019B/en active Active
Patent Citations (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH10320440A (en) * | 1997-05-21 | 1998-12-04 | Oki Electric Ind Co Ltd | Logic simulation library, and method and device for confirming operation of electronic circuit |
| CN101629980A (en) * | 2009-09-10 | 2010-01-20 | 南京师范大学 | Method for testing performance of EMI filter based on scattering parameter |
| RU113014U1 (en) * | 2011-10-17 | 2012-01-27 | Открытое акционерное общество "Всероссийский научно-исследовательский и проектно-конструкторский институт электровозостроения" (ОАО "ВЭлНИИ") | DEVICE FOR DETERMINING PULSE LOSS OF ELECTRIC PULSING CURRENT MACHINES |
| CN205336099U (en) * | 2015-12-25 | 2016-06-22 | 北京泰派斯特科技发展有限公司 | EMI power filter emulation test equipment |
| WO2018000939A1 (en) * | 2016-06-30 | 2018-01-04 | 深圳市九洲电器有限公司 | Filter and electronic device |
| WO2018082340A1 (en) * | 2016-11-04 | 2018-05-11 | 宁德时代新能源科技股份有限公司 | Simulation test system and method |
| CN108964798A (en) * | 2018-07-18 | 2018-12-07 | Oppo广东移动通信有限公司 | Radio circuit adjustment method and relevant apparatus |
| CN111277125A (en) * | 2020-03-11 | 2020-06-12 | 中国建设银行股份有限公司 | Direct-current power supply filter assembly and direct-current power supply filter circuit |
| CN111353265A (en) * | 2020-03-30 | 2020-06-30 | 中车株洲电力机车研究所有限公司 | EMI filter insertion loss simulation system and method based on Matlab GUI platform |
| CN114818593A (en) * | 2021-01-19 | 2022-07-29 | 长鑫存储技术有限公司 | Simulation method, simulation device, power line topology network, test circuit and storage medium |
| WO2022183639A1 (en) * | 2021-03-01 | 2022-09-09 | 长鑫存储技术有限公司 | Semiconductor structure measuring method, and device |
| CN115270680A (en) * | 2022-06-08 | 2022-11-01 | 电子科技大学 | Design method for analog multi-passband filter |
| CN115422792A (en) * | 2022-07-29 | 2022-12-02 | 成都飞机工业（集团）有限责任公司 | Method, device, equipment and medium for analyzing electromagnetic interference of switching power supply |
| CN115327269A (en) * | 2022-08-10 | 2022-11-11 | 广汽埃安新能源汽车有限公司 | Conduction emission testing method and device for electric drive system |
| CN116008704A (en) * | 2023-01-03 | 2023-04-25 | 广州市德珑电子器件有限公司 | Safety regulation testing equipment and method for EMI power filter |
| CN116050185A (en) * | 2023-03-28 | 2023-05-02 | 敏业信息科技（上海）有限公司 | Electromagnetic interference filter simulation and verification method, device and computer readable medium |
Non-Patent Citations (9)
| Title |
|---|
| EMI Filters, Ancillary Equipment for Active Filters;Karaisas, Petros等;TECHNOLOGIES AND MATERIALS FOR RENEWABLE ENERGY, ENVIRONMENT AND SUSTAINABILITY (TMREES19);20191231;全文 * |
| EMI电源滤波器的原理与分析;张娜;张团善;武玉婷;;变频器世界;20101215(第12期);全文 * |
| 反激式开关电源设计与传导EMI抑制研究;彭裘武;中国优秀硕士学位论文全文数据库 工程科技Ⅱ辑;20200215;全文 * |
| 可调稳压电源的设计与Multisim的仿真应用;吴晓云;刘超;;自动化与仪器仪表;20151225(第12期);全文 * |
| 基于Multisim的整流滤波电路仿真分析;杨威;左月明;吴海云;;山西农业大学学报(自然科学版);20120530(第03期);全文 * |
| 基于TOP243Y的多路输出开关电源设计;张春喜;闫正国;尤磊;;黑龙江水专学报;20100925(第03期);全文 * |
| 基于噪声仿真的EMI滤波器研究;邱燕;肖岚;曹海港;;电力自动化设备;20100910(第09期);全文 * |
| 某航空电子系统电源滤波电路性能仿真分析与测试;潘加明;胡超;朱赛赛;肖扬;景莘慧;周忠元;;航空电子技术;20200315(第01期);全文 * |
| 空调EMI电源滤波电路设计与仿真;吕继方;肖彪;王会;万今明;于洪涛;;计算机辅助工程;20180228(第01期);全文 * |
Also Published As
| Publication number | Publication date |
|---|---|
| CN117391019A (en) | 2024-01-12 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN117391019B (en) | Simulation test method, device, equipment and medium for EMI power filter | |
| US7559045B2 (en) | Database-aided circuit design system and method therefor | |
| CN113030609B (en) | Crosstalk effect testing method, circuit and device | |
| CN114397562B (en) | Automatic test method and system for EMC (electro magnetic compatibility) immunity of chip | |
| CN113406477A (en) | PCBA test method, system, computer equipment and storage medium | |
| CN108897929B (en) | Power plane frequency domain impedance simulation method, system and terminal | |
| CN113917313A (en) | Key board card fault prediction method and device | |
| CN117452103A (en) | EMI power supply filter reliability test system and method | |
| CN111812445B (en) | Intelligent capacitor error correction method and device, computer equipment and storage medium | |
| US11263100B2 (en) | Testing method and device to determine problem source of server failure | |
| CN114545120B (en) | Method, device, equipment and medium for testing radiation anti-interference degree of server | |
| CN110781642B (en) | Method for improving power supply noise based on frequency domain | |
| CN114118003A (en) | Method and device for detecting tin on wave-soldering part | |
| CN109061434B (en) | Board level circuit degradation testing method | |
| CN110967615B (en) | Circuit board fault diagnosis device and method | |
| JP2012154690A (en) | Current probe modeling method, current probe model creation device, simulation method, simulation device, and program | |
| CN114578104B (en) | Signal test probe, system and method | |
| CN112213615A (en) | Radio frequency circuit debugging method and device, electronic equipment and storage medium | |
| US20230341447A1 (en) | Method, device and system for measuring frequency domain characteristics, and storage medium | |
| CN117148025B (en) | Automobile complex electromagnetic environment adaptability test method, device, equipment and medium | |
| JP2021504721A (en) | A recursive time-series-based method for determining the state of an electrochemical reactor | |
| CN111260203B (en) | Data processing method and device, computer storage medium and electronic equipment | |
| CN112345912B (en) | Material characteristic testing method, device, electronic equipment and storage medium | |
| US11860222B2 (en) | Method, circuit and apparatus for testing crosstalk effect | |
| US20240210465A1 (en) | Method for determining wear in an electronic unit, and test apparatus |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |