CN117389875A

CN117389875A - Method, device, equipment and storage medium for testing software function

Info

Publication number: CN117389875A
Application number: CN202311329207.9A
Authority: CN
Inventors: 秦秀丽; 张沛; 杨雨苍; 陈瑶; 刘子硕
Original assignee: China United Network Communications Group Co Ltd
Current assignee: China United Network Communications Group Co Ltd
Priority date: 2023-10-13
Filing date: 2023-10-13
Publication date: 2024-01-12

Abstract

The application provides a method, a device, equipment and a storage medium for testing a software function, relates to the technical field of software testing, and is used for solving the problem of low information content of a test result of the software function. The method comprises the following steps: obtaining a defect information set of a target functional module in software to be tested, wherein the defect information set comprises a plurality of target defect information used for indicating the defect state of the target functional module, and the target defect information comprises: target defect level. And determining a defect weight value of the target functional module according to a preset corresponding relation and a target defect grade of each target defect information in the defect information set, wherein the preset corresponding relation is a corresponding relation between a plurality of preset weight values and a plurality of preset defect grades. If the defect weight value is smaller than the preset weight threshold value, generating first prompt information, wherein the first prompt information is used for indicating that the test of the target functional module is completed.

Description

Method, device, equipment and storage medium for testing software function

Technical Field

The present disclosure relates to the field of software testing technologies, and in particular, to a method, an apparatus, a device, and a storage medium for testing a software function.

Background

In recent years, with development of technology, functions of software are becoming more and more abundant, and management requirements of management devices (such as servers and terminals) on the functions of the software are also becoming higher and higher. For example, the server tests software functions.

At present, in the process of testing a software function by a server, the server needs to call a test case corresponding to a function module in the software to obtain an execution record of the test case, determine a defect state of the function module according to the execution record, and further obtain a test result of the software function. However, in the above-described technical solution, the defect state of the functional module is used only as a test result of the software function, so that the defect state of the functional module is not fully utilized, and the information amount of the test result of the software function is reduced.

Disclosure of Invention

The application provides a method, a device, equipment and a storage medium for testing a software function, which are used for solving the problem of low information content of a test result of the software function.

In order to achieve the above purpose, the present application adopts the following technical scheme:

in a first aspect, the present application provides a method for testing a software function, the method comprising: a test device for software functions (hereinafter referred to as "test device") obtains a defect information set of a target function module in software to be tested, the defect information set including a plurality of target defect information for indicating a defect state of the target function module, the target defect information including: target defect level. The testing device determines a defect weight value of the target functional module according to a preset corresponding relation and a target defect grade of each target defect information in the defect information set, wherein the preset corresponding relation is a corresponding relation between a plurality of preset weight values and a plurality of preset defect grades. If the defect weight value is smaller than the preset weight threshold value, the testing device generates first prompt information, and the first prompt information is used for indicating that the testing of the target functional module is completed.

The technical scheme provided by the application at least brings the following beneficial effects: the test device may acquire a defect information set of a target functional module in the software to be tested, the defect information set including a plurality of target defect information for indicating a defect state of the target functional module, and the target defect information may include: target defect level. Then, the testing device can determine the defect weight value of the target functional module according to the preset corresponding relation and the target defect grade of each target defect information in the defect information set, wherein the preset corresponding relation is the corresponding relation between a plurality of preset weight values and a plurality of preset defect grades. Then, the testing device can determine whether the defect weight value is smaller than a preset weight threshold value, and generate first prompt information under the condition that the defect weight value is smaller than the preset weight threshold value, wherein the first prompt information is used for indicating that the testing of the target functional module is completed. That is, the testing device can determine the hidden trouble degree of the functional module according to the hidden trouble degree of each defect state of the functional module in the software, so as to determine whether to continue testing the functional module or not, and guide the testing of the functional module. Therefore, the utilization rate of the defect state of the functional module can be improved, the information quantity of the test result of the software function is improved, and the hidden danger degree of the functional module is managed.

Optionally, the target defect information further includes: defect discovery time, the method further comprising: the testing device determines the accumulated defect trend of the target functional module according to the defect discovery time of each target defect information in the defect information set. The method for generating the first prompt information by the testing device comprises the following steps: if the defect weight value is smaller than the preset weight threshold value and the accumulated defect trend is converged, the testing device generates first prompt information.

Optionally, the method further comprises: the testing device determines the target number of target defect information in the defect information set according to the defect information set. The method for generating the first prompt information by the testing device comprises the following steps: if the defect weight value is smaller than the preset weight threshold value, the accumulated defect trend converges, and the target number is larger than the first preset number threshold value, the testing device generates first prompt information.

Optionally, the method further comprises: if the defect information set does not meet the preset condition, the testing device generates second prompt information, wherein the second prompt information is used for indicating that the test of the target functional module is not completed, and the preset condition comprises at least one of the following: the defect weight value is smaller than a preset weight threshold, the accumulated defect trend converges, and the target number is larger than a first preset number threshold.

Optionally, the target defect information further includes: defect source information, the method further comprising: the testing device takes target defect information, which takes defect source information as first source information in the defect information set, as first defect information to obtain first quantity of first defect information, wherein the first source information is used for indicating the defect information determined by a test case corresponding to the target functional module. The testing device determines a target proportion value according to the target number and the first number, wherein the target proportion value is used for indicating the proportion of the first defect information in the defect information set. If the target proportion value is smaller than the preset proportion threshold value, the testing device generates third prompt information, and the third prompt information is used for indicating the test case corresponding to the target functional module to be updated.

Optionally, the target defect information further includes: the stage mark of the defect is any one of the following preset stage marks: the identification of the demand phase, the identification of the design phase, the identification of the code and joint debugging phase and the identification of the test phase. The method further comprises the steps of: the testing device determines at least one first information set from the defect information set according to the stage identification of the defect of each target defect information in the defect information set, wherein the stage identifications of the defect of the second defect information in the first information set are all the first stage identifications, and one first information set corresponds to one first stage identification. For each first information set, the testing device generates prompt information for indicating the stage state of the target functional module according to target operation, wherein the target operation comprises the following steps: a second amount of second defect information in a second set of information, any one of the at least one first set of information, is determined. It is determined whether the second number is greater than a second preset number threshold. If the second number is greater than a second preset number threshold, generating fourth prompt information according to the identification of the second stage corresponding to the second information set, wherein the fourth prompt information is used for indicating that the second stage of the target functional module has defects.

In a second aspect, the present application provides a software functional testing apparatus, the apparatus comprising: an acquisition module and a processing module.

The system comprises an acquisition module, a target function module and a test module, wherein the acquisition module is used for acquiring a defect information set of the target function module in software to be tested, the defect information set comprises a plurality of target defect information used for indicating the defect state of the target function module, and the target defect information comprises: target defect level. The processing module is used for determining the defect weight value of the target functional module according to the preset corresponding relation and the target defect grade of each target defect information in the defect information set, wherein the preset corresponding relation is the corresponding relation between a plurality of preset weight values and a plurality of preset defect grades. The processing module is further configured to generate first prompt information if the defect weight value is smaller than a preset weight threshold, where the first prompt information is used to indicate that the test on the target functional module is completed.

Optionally, the target defect information further includes: defect discovery time. And the processing module is also used for determining the accumulated defect trend of the target functional module according to the defect discovery time of each target defect information in the defect information set. The processing module is specifically configured to generate a first prompt message if the defect weight value is smaller than a preset weight threshold and the cumulative defect trend converges.

Optionally, the processing module is further configured to determine, according to the defect information set, a target number of target defect information in the defect information set. The processing module is specifically configured to generate a first prompt message if the defect weight value is smaller than a preset weight threshold, the cumulative defect trend converges, and the target number is greater than a first preset number threshold.

Optionally, the processing module is further configured to generate a second hint information if the defect information set does not meet a preset condition, where the second hint information is used to indicate that the test of the target functional module is not completed, and the preset condition includes at least one of: the defect weight value is smaller than a preset weight threshold, the accumulated defect trend converges, and the target number is larger than a first preset number threshold.

Optionally, the target defect information further includes: defect source information. The processing module is further configured to obtain a first number of first defect information by using, as the first defect information, target defect information, which is obtained by using defect source information in the defect information set as first source information, where the first source information is used to indicate defect information determined by a test case corresponding to the target function module. The processing module is further used for determining a target proportion value according to the target quantity and the first quantity, wherein the target proportion value is used for indicating the proportion of the first defect information in the defect information set. The processing module is further configured to generate third prompt information if the target proportion value is smaller than the preset proportion threshold value, where the third prompt information is used to indicate a test case corresponding to the target functional module to be updated.

Optionally, the target defect information further includes: the stage mark of the defect is any one of the following preset stage marks: the identification of the demand phase, the identification of the design phase, the identification of the code and joint debugging phase and the identification of the test phase. The processing module is further used for determining at least one first information set from the defect information set according to the stage identifiers of the defects of each target defect information in the defect information set, wherein the stage identifiers of the defects of the second defect information in the first information set are all identifiers of the first stage, and one first information set corresponds to one first stage identifier. The processing module is further configured to generate, for each first information set, a hint information for indicating a phase state of the target function module according to a target operation, where the target operation includes: a second amount of second defect information in a second set of information, any one of the at least one first set of information, is determined. It is determined whether the second number is greater than a second preset number threshold. If the second number is greater than a second preset number threshold, generating fourth prompt information according to the identification of the second stage corresponding to the second information set, wherein the fourth prompt information is used for indicating that the second stage of the target functional module has defects.

In a third aspect, the present application provides a software functional test apparatus, the apparatus comprising: a processor and a memory coupled to store one or more programs, the one or more programs comprising computer-executable instructions that the processor executes when the software functional testing device is operating to implement the method of testing a software function as described in any of the above first aspects or alternatives to the first aspect.

In a fourth aspect, the present application provides a computer readable storage medium having instructions stored therein which, when run on a computer, cause the computer to perform the method of testing the software function described in any of the above first aspects or the alternative of the first aspect.

In a fifth aspect, the present application provides a computer program product for use with a server, the computer program product comprising computer instructions which, when run on the server, implement the method of testing the software function as described in any of the above first aspects or optional first aspects.

In the above solutions, the technical problems and the technical effects that can be solved by the testing apparatus, the device, the computer storage medium or the computer program product for software functions may be referred to the technical problems and the technical effects that can be solved by the above first aspect, and are not described herein again.

Drawings

FIG. 1 is an example schematic diagram of an execution record of a test case according to an embodiment of the present application;

FIG. 2 is a schematic diagram illustrating an example of defect level distribution of software according to an embodiment of the present application;

FIG. 3 is a schematic diagram illustrating an example of distribution of defect attribution modules according to an embodiment of the present application;

fig. 4 is a schematic diagram of a communication system according to an embodiment of the present application;

fig. 5 is a flow chart of a method for testing a software function according to an embodiment of the present application;

FIG. 6 is a flowchart of another software function testing method according to an embodiment of the present application;

FIG. 7 is a flowchart of another software function testing method according to an embodiment of the present application;

FIG. 8 is a flowchart of another software function testing method according to an embodiment of the present disclosure;

FIG. 9 is a flowchart of another software function testing method according to an embodiment of the present application;

FIG. 10 is a flowchart of another method for testing software functions according to an embodiment of the present disclosure;

FIG. 11 is a flowchart of another method for testing software functions according to an embodiment of the present disclosure;

FIG. 12 is a schematic flow chart of generating an analysis report according to an embodiment of the present application;

FIG. 13 is a flowchart of another software function testing method according to an embodiment of the present disclosure;

fig. 14 is a schematic structural diagram of a testing device for software functions according to an embodiment of the present application;

FIG. 15 is a schematic structural diagram of a software functional test device according to an embodiment of the present application;

fig. 16 is a conceptual partial view of a computer program product provided by embodiments of the present application.

Detailed Description

The following description of the embodiments of the present application will be made clearly and fully with reference to the accompanying drawings, in which it is evident that the embodiments described are only some, but not all, of the embodiments of the present application. All other embodiments, which can be made by one of ordinary skill in the art without undue burden from the present disclosure, are within the scope of the present disclosure.

The character "/" herein generally indicates that the associated object is an "or" relationship. For example, A/B may be understood as A or B.

The terms "first" and "second" in the description and in the claims of the present application are used for distinguishing between different objects and not for describing a particular sequential order of objects.

Furthermore, references to the terms "comprising" and "having" and any variations thereof in the description of the present application are intended to cover a non-exclusive inclusion. For example, a process, method, system, article, or apparatus that comprises a list of steps or modules is not limited to only those steps or modules but may include other steps or modules not listed or inherent to such process, method, article, or apparatus.

In addition, in the embodiments of the present application, words such as "exemplary" or "such as" are used to mean serving as examples, illustrations, or descriptions. Any embodiment or design described herein as "exemplary" or "e.g." should not be construed as preferred or advantageous over other embodiments or designs. Rather, the use of words such as "exemplary" or "such as" is intended to present concepts in a concrete fashion.

Before describing the software function testing method provided in the embodiment of the present application in detail, the implementation environment and application field Jing Jinhang of the embodiment of the present application will be described.

First, an application scenario of the embodiment of the present application will be described.

At present, in the process of testing a software function by a server, the server needs to call a test case corresponding to a function module in the software to obtain an execution record of the test case, determine a defect state of the function module according to the execution record, and further obtain a test result of the software function.

Exemplary, as shown in fig. 1, an execution record of a test case corresponding to a functional module in software is shown. The functional module a of the item P1 in the software corresponds to 66 test cases, the number of test cases passing the test is 57, the number of test cases failing the test is 4, the number of test cases blocking is 5, the number of test cases not starting to be neutralized is 0, and the test passing rate of the functional module a is 86.4%. Similarly, the functional module B of the item P2 in the software corresponds to 7 test cases, the number of test cases passing the test is 2, the number of test cases failing the test is 0, the number of test cases blocking is 5, the number of test cases not starting to be neutralized is 0, and the test passing rate of the functional module B is 28.6%.

The software test analysis report (i.e. the test result of the software function) is used as an indispensable delivery object in the software test activity process, and a high-quality software test analysis report plays a significant role in iterative delivery of products and construction and development of a quality assurance system of a project group.

The current existing software test analysis report generation method mainly comprises the following steps:

manually compiling a software test analysis report according to a template file;

the second mode is to automatically acquire the actual execution result of the test case and output a test report;

and thirdly, automatically generating a test report based on the universal template.

As shown in fig. 2, which shows the defect level distribution of the software in the test results of the software functions. Among them, there are 4 defect states with a defect level of deadly, 20 defect states with a defect level of severe, 33 defect states with a defect level of general, and 10 defect states with a defect level of hint.

As shown in fig. 3, which shows the distribution of defective home modules in the test results of the software functions. The number of defect states of the rear end in the function module a is 6, the number of defect states of the front end in the function module a is 4, the number of defect states of the rear end in the function module B is 7, the number of defect states of the front end in the function module B is 8, and the number of defect states of the rear end and the number of defect states of the front end in the function module C are 11.

However, in the actual test report generation process, the current manual test report generation method consumes more energy due to factors such as personnel capacity, time urgency and the like, and in the automatic test report generation method, the number of template content dimensions is relatively small, and original data need to be searched and analyzed again when one dimension is added, so that the method is not only time-consuming and labor-consuming due to strong dependence on working experience, but also is not easy to maintain; most of the current implementation methods analyze predictive data without defects, cannot effectively guide the direction of later-stage version testing, and have no mention on the construction and development of a quality assurance system of a project group.

That is, in the related art, only by taking the defective state of the functional module as the test result of the software function, the utilization of the defective state of the functional module is insufficient, and the information amount of the test result of the software function is reduced.

In order to solve the above-mentioned problems, the embodiment of the present application provides a method for testing a software function, and the method for testing a software function provided in the embodiment of the present application is applied to a scenario for testing a software function. The testing device can acquire a plurality of defect information for indicating the defect state of the target functional module in the software to be tested, and determine a defect weight value for indicating the hidden danger degree of the target functional module according to the defect grade for indicating the hidden danger degree of the defect state of the target functional module in each defect information and the corresponding relation between a plurality of preset weight values and a plurality of defect grades. Then, the testing device can compare the defect weight value with a preset weight threshold value, and generate prompt information for indicating that the test of the target functional module is completed under the condition that the defect weight value is smaller than the preset weight threshold value. That is, the testing device can determine the hidden trouble degree of the functional module according to the hidden trouble degree of each defect state of the functional module in the software, so as to determine whether to continue testing the functional module or not, and guide the testing of the functional module. Therefore, the utilization rate of the defect state of the functional module can be improved, the information quantity of the test result of the software function is improved, and the hidden danger degree of the functional module is managed.

The following describes an implementation environment of an embodiment of the present application.

As shown in fig. 4, a schematic diagram of a communication system according to an embodiment of the present application may include: a software function execution device (e.g., terminal 401) and a test apparatus (e.g., server 402). Wherein the terminal 401 can perform wired/wireless communication with the server 402, and the terminal 401 is deployed with software to be tested.

Specifically, the terminal 401 may determine the defect state of the target functional module by calling a test case corresponding to the target functional module in the software to be tested, and send the defect state of the target functional module to the server 402. Then, the server 402 may determine, according to the defect status of the target function module in the software to be tested from the terminal 401, a defect weight value, an accumulated defect trend, and a defect number of the target function module, and determine whether to complete the test of the target function module in the software to be tested by determining whether the defect weight value is smaller than a preset weight value, whether the accumulated defect trend converges, and whether the defect number is greater than a preset number threshold.

The terminal (e.g., terminal 401) may be a mobile phone, a tablet computer, a desktop, a laptop, a handheld computer, a notebook, an Ultra-mobile personal computer (mobile Personal Computer, UMPC), a netbook, or other devices with a transceiver function, and the specific form of the terminal is not particularly limited in this application. The system can perform man-machine interaction with a user through one or more modes of a keyboard, a touch pad, a touch screen, a remote controller, voice interaction or handwriting equipment and the like.

The server (e.g., server 402) may be a single physical server or may be a server cluster formed of a plurality of servers. Alternatively, the server cluster may also be a distributed cluster. Alternatively, the server may be a cloud server. The embodiment of the application does not limit the specific implementation manner of the server.

After the application scenario and the implementation environment of the embodiment of the present application are described, the method for testing the software function provided by the embodiment of the present application is described in detail below with reference to the implementation environment.

The methods in the following embodiments may be implemented in the application scenario and implementation environment described above. Embodiments of the present application will be specifically described below with reference to the drawings attached to the specification.

Fig. 5 is a flow chart of a testing method for software functions according to an embodiment of the present application. As shown in fig. 5, the method may include: S501-S504.

S501, the testing device acquires a defect information set of a target functional module in software to be tested.

Wherein the defect information set includes a plurality of target defect information indicating defect states of the target functional module, and the target defect information may include: and the target defect grade is used for indicating the hidden danger degree of the defect state of the corresponding target functional module.

It should be noted that, in the embodiment of the present application, the defect status of the target functional module is not limited. For example, the defect status of the target functional module may be a picture loading failure. For another example, the defect status of the target functional module may be that the front-end and back-end data are not synchronized. For another example, the defect status of the target function module may be a prompt box display location anomaly.

Exemplary, the defect information set includes: information a (i.e., target defect information) indicating a defect state a (i.e., a defect state of the target functional module), information B indicating a defect state B, information C indicating a defect state C, and information D indicating a defect state D. The defect level in the information a (i.e., the target defect level) is fatal, the defect level in the information B is severe, the defect level in the information C is general, and the defect level in the information D is a hint.

In one possible implementation, the testing apparatus may receive a set of defect information from a software running device. The software running equipment is deployed with software to be tested, and the target defect information is defect information collected by the software running equipment when a target functional module in the software to be tested is run.

In another possible implementation, the test device is deployed with software to be tested. The testing device can acquire target defect information by operating a target functional module in the software to be tested, so as to acquire a defect information set.

S502, the testing device determines a defect weight value of the target functional module according to the preset corresponding relation and the target defect grade of each target defect information in the defect information set.

The preset corresponding relation is a corresponding relation between a plurality of preset weight values and a plurality of preset defect levels, and the defect weight values are used for indicating hidden danger degrees of the target functional modules.

In one possible implementation, the test device stores a preset correspondence. For each target defect level, the testing device may use a preset weight value corresponding to the same preset defect level as the target defect level in the plurality of preset defect levels as a target weight value, so as to obtain a plurality of target weight values, where one target defect level corresponds to one target weight value. Then, the testing device may perform summation processing on the plurality of target weight values to determine a defect weight value of the target functional module.

Exemplary, the preset correspondence relationship includes: the correspondence between deadlines and 10 (i.e., preset weight values), the correspondence between severity and 3, the correspondence between general and 1, and the correspondence between hints and 0.1. If the target defect levels of the plurality of target defect information in the defect information set are serious, general, prompt, serious and deadly respectively, the testing device determines that the plurality of target weight values are 3, 1, 0.1, 3 and 10 respectively, and determines that the defect weight value of the target functional module is 17.1.

S503, the testing device determines whether the defect weight value is smaller than a preset weight threshold.

In one possible implementation, the test device stores a preset weight threshold. The testing device can determine whether the defect weight value is smaller than the preset weight threshold value by comparing the defect weight value with the preset weight threshold value.

In some embodiments, if the testing apparatus determines that the defect weight value is less than the preset weight threshold, the testing apparatus performs S504.

S504, the testing device generates first prompt information.

The first prompt message is used for indicating that the test of the target functional module is completed.

The technical scheme provided by the embodiment at least brings the following beneficial effects: the test device may acquire a defect information set of a target functional module in the software to be tested, the defect information set including a plurality of target defect information for indicating a defect state of the target functional module, and the target defect information may include: target defect level. Then, the testing device can determine the defect weight value of the target functional module according to the preset corresponding relation and the target defect grade of each target defect information in the defect information set, wherein the preset corresponding relation is the corresponding relation between a plurality of preset weight values and a plurality of preset defect grades. Then, the testing device can determine whether the defect weight value is smaller than a preset weight threshold value, and generate first prompt information under the condition that the defect weight value is smaller than the preset weight threshold value, wherein the first prompt information is used for indicating that the testing of the target functional module is completed. That is, the testing device can determine the hidden trouble degree of the functional module according to the hidden trouble degree of each defect state of the functional module in the software, so as to determine whether to continue testing the functional module or not, and guide the testing of the functional module. Therefore, the utilization rate of the defect state of the functional module can be improved, the information quantity of the test result of the software function is improved, and the hidden danger degree of the functional module is managed.

In some embodiments, the target defect information may further include: defect discovery time. The defect discovery time is the time for determining the defect state in the operation process of the target functional module.

Exemplary, the defect information set includes: information a (i.e., target defect information) indicating a defect state a (i.e., a defect state of the target function module), and the defect state a is a defect state of the function module a (i.e., the target function module) when operating at 8 a.m. 2 minutes, the defect discovery time in the information a is 8 a.m. 2 minutes.

In an embodiment of the present application, as shown in fig. 6, before S504, the method may further include: S601-S602.

S601, the testing device determines the accumulated defect trend of the target functional module according to the defect discovery time of each target defect information in the defect information set.

The accumulated defect trend is used for indicating the stability of normal operation of the target functional module.

S602, the testing device determines whether the cumulative defect trend is converged.

It should be noted that, for the process of determining whether the cumulative defect trend converges, reference may be made to the description of determining the convergence condition according to the line graph in the prior art, which is not described herein.

In some embodiments, if the testing apparatus determines that the cumulative defect trend converges, the testing apparatus executes S504.

It can be understood that the testing device can determine the cumulative defect trend of the target functional module according to the defect discovery time of each target defect information in the defect information set. Then, the testing device can determine whether the cumulative defect trend converges, and generate the first prompt message under the condition that the defect weight value is smaller than the preset weight threshold value and the cumulative defect trend converges. That is, the testing device can determine the stability of the normal operation of the functional module according to the time of each defect state determined by the functional module in the software during operation, and determine whether to continue testing the functional module or not according to the hidden trouble degree of the functional module, so as to guide the testing of the functional module. Therefore, the utilization rate of the defect state of the functional module can be improved, the information quantity of the test result of the software function is improved, and the hidden danger degree of the functional module and the stability degree of the normal operation of the functional module are managed.

In some embodiments, as shown in fig. 7, prior to S504, the method may further include: S701-S702.

S701, the testing device determines the target quantity of target defect information in the defect information set according to the defect information set.

Exemplary, if the defect information set includes: defect information a (i.e., target defect information), defect information B, defect information C, and defect information D, the target number is 4.

S702, the testing device determines whether the target number is larger than a first preset number threshold.

In one possible implementation, the test device stores a first preset number of thresholds. The test device may determine whether the target number is greater than a first preset number threshold by comparing the size between the target number and the first preset number threshold.

In some embodiments, if the test device determines that the target number is greater than the first preset number threshold, the test device performs S504.

It will be appreciated that the testing device may determine the target number of target defect information in the defect information set based on the defect information set. Then, the testing device can determine whether the target number is greater than a first preset number threshold, and generate first prompt information under the conditions that the defect weight value is smaller than the preset weight threshold, the accumulated defect trend converges, and the target number is greater than the first preset number threshold. That is, the testing device can determine whether to continue testing the functional module according to the number of defect states of the functional module in the software and by combining the hidden trouble degree of the functional module and the stability degree of normal operation of the functional module, and instruct the testing of the functional module. Therefore, the utilization rate of the defect state of the functional module can be improved, the information quantity of the test result of the software function is improved, and the hidden danger degree of the functional module, the stability degree of the normal operation of the functional module and the hidden danger quantity of the functional module are managed.

In some embodiments, the test device stores preset conditions including at least one of: the defect weight value is smaller than a preset weight threshold, the accumulated defect trend converges, and the target number is larger than a first preset number threshold. The test device can generate prompt information for indicating the test condition of the target functional module by determining whether the defect information set meets the preset condition.

In one possible implementation, if the testing apparatus determines that the defect information set meets the preset condition, the testing apparatus executes S504.

That is, the testing device may generate the first prompt information when the defect weight value is smaller than the preset weight threshold, the cumulative defect trend converges, and the target number is greater than the first preset number threshold.

In an embodiment of the present application, as shown in fig. 8, if the testing device determines that the defect information set does not meet the preset condition, the method may further include: s801.

S801, the testing device generates second prompt information.

The second prompt information is used for indicating that the test of the target functional module is not completed.

It can be understood that the testing device may generate the second prompt information when the defect weight value is greater than or equal to the preset weight threshold, the cumulative defect trend is not converged, and the target number is less than or equal to the first preset number threshold, where the second prompt information is used to indicate that the test of the target functional module is not completed. That is, the test device may determine to continue to test the functional module and instruct the test of the functional module when any one of the number of defect states of the functional module, the hidden trouble degree of the functional module, and the stability degree of the normal operation of the functional module does not meet the preset condition. Therefore, the utilization rate of the defect state of the functional module can be improved, the information quantity of the test result of the software function is improved, and the hidden danger degree of the functional module, the stability degree of the normal operation of the functional module and the hidden danger quantity of the functional module are managed.

In some embodiments, the target defect information may further include: defect source information.

It should be noted that, the defect source information may indicate defect information determined by a test case corresponding to the target functional module, or the defect source information may also indicate defect information reported by a user using the software to be tested.

In an embodiment of the present application, as shown in fig. 9, after S504, the method may further include: S901-S904.

S901, the testing device takes target defect information with defect source information in the defect information set as first source information as first defect information to obtain first defect information of a first quantity.

The first source information is used for indicating defect information determined by the test case corresponding to the target functional module.

Exemplary, the defect information set includes: target defect information a, target defect information B, and defect information C. The defect source information of the target defect information a is source information a, the defect source information of the target defect information B is source information B, and the defect source information of the defect information C is source information a. If the first source information is source information a, the target defect information a and the defect information C are both first defect information, and the first number is 2.

S902, the testing device determines a target proportion value according to the target number and the first number.

Wherein the target proportion value is used for indicating the proportion of the first defect information in the defect information set.

For example, if the target number is 50 and the first number is 5, the target ratio value is 0.25.

S903, the testing device determines whether the target proportion value is smaller than a preset proportion threshold value.

In some embodiments, if the testing device determines that the target ratio value is less than the preset ratio threshold, the testing device performs S904.

S904, the testing device generates third prompt information.

The third prompt information is used for indicating the test case corresponding to the target functional module to be updated.

In other embodiments, if the testing device determines that the target ratio value is greater than or equal to the preset ratio threshold, the testing device generates a fifth alert message. The fifth prompt information is used for indicating that the test case corresponding to the target functional module does not need to be updated.

It is understood that the testing device may determine, in a state in which it is determined that the target functional module has completed the test, a first quantity of the first defect information in the defect information set, which is determined by the test case corresponding to the target functional module, and determine a specific gravity of the first defect information in the defect information set by determining a target ratio value between the first quantity and the target quantity. Then, the testing device can compare the size between the target proportion value and the preset proportion threshold value, and generate third prompt information for indicating the test case corresponding to the target functional module to be updated under the condition that the target proportion value is smaller than the preset proportion threshold value. That is, the test apparatus may determine whether the test case corresponding to the functional module needs to be updated by determining a specific gravity of the defect information determined by the test case corresponding to the functional module among the plurality of defect information of the functional module when it is determined that the functional module has completed the test, and instruct management of the test case corresponding to the functional module. Therefore, the utilization rate of the defect state of the functional module can be improved, the information quantity of the test result of the software function is improved, and the management of the test case corresponding to the functional module is realized.

In some embodiments, the target defect information may further include: the stage in which the defect is located is identified.

Wherein the defect stage identifier is used for indicating the operation stage of the target functional module when determining the defect state of the target functional module.

In the embodiment of the application, the stage identifier where the defect is located may be any one of the following stage identifiers: the identification of the demand phase, the identification of the design phase, the identification of the code and joint debugging phase and the identification of the test phase.

In an embodiment of the present application, as shown in fig. 10, after S504, the method may further include: s1001.

S1001, the testing device determines at least one first information set from the defect information set according to the stage identification of the defect of each target defect information in the defect information set.

The stage identifiers of the defects of the second defect information in the first information set are all identifiers of the first stage, and one first information set corresponds to one first stage identifier.

Exemplary, the defect information set includes: target defect information a, target defect information B, and defect information C. If the stage of the defect of the target defect information a is identified as the identifier a, the stage of the defect of the target defect information B is identified as the identifier B, and the stage of the defect information C is identified as the identifier a, the at least one first information set includes: a first information set a corresponding to the identifier a and a first information set B corresponding to the identifier B, where the first information set a includes: target defect information a and defect information C, the first information set B including: target defect information B.

In the embodiment of the application, for each first information set, the testing device may generate, according to the target operation, a prompt message for indicating a stage state of the target functional module. Wherein the target operation may include: s1002 to S1004.

S1002, the testing device determines a second quantity of second defect information in the second information set.

Wherein the second information set is any one of the at least one first information set.

S1003, the testing device determines whether the second number is larger than a second preset number threshold.

In one possible implementation, the test device stores a second preset number of thresholds. The test device may determine whether the second number is greater than a second preset number threshold by comparing the magnitude between the second number and the second preset number threshold.

In some embodiments, if the testing device determines that the second number is greater than the second preset number threshold, the testing device performs S1004.

S1004, the testing device generates fourth prompt information according to the identification of the second stage corresponding to the second information set.

The fourth prompt information is used for indicating that the second stage of the target functional module has defects.

In other embodiments, if the testing device determines that the second number is less than or equal to the second preset number threshold, the testing device generates the sixth prompting message according to the identifier of the second stage corresponding to the second information set. The sixth prompt message is used for indicating that the second stage of the target functional module has no defect.

It can be understood that the testing device may determine, in a state in which it is determined that the target functional module has completed testing, at least one first information set from the defect information set according to a stage identifier of a defect of each target defect information in the defect information set, where the stage identifiers of defects of second defect information in the first information set are all identifiers of a first stage, and one first information set corresponds to one identifier of the first stage. Then, for each first information set, the test apparatus may generate a hint information indicating a stage state of the target functional module according to the target operation, including: for each first information set, the test device may generate prompt information for indicating a stage state of the target functional module according to the target operation, and the second information set is any one of the at least one first information set. The testing device determines whether the second number is larger than a second preset number threshold value, and generates fourth prompt information according to the identification of the second stage corresponding to the second information set when the second number is larger than the second preset number threshold value, wherein the fourth prompt information is used for indicating that defects exist in the second stage of the target functional module. That is, the test apparatus may instruct management of the stage states of the functional module by determining the number of defective states determined by the functional module at different operation stages, determining the stage state of each operation stage of the functional module, when it is determined that the functional module has completed the test. Therefore, the utilization rate of the defect state of the functional module can be improved, the information quantity of the test result of the software function is improved, and the management of the corresponding stage state of the functional module is realized.

In some embodiments, the test apparatus may perform the steps of S901-S904 and/or S1001-S1004 in the above embodiments in a state where it is determined that the target functional module does not complete the test (i.e., S801).

In some embodiments, the target defect information may further include: the defect belonging module identifier of the target defect information is the identifier of the target functional module.

In this embodiment of the present application, the test device further stores a preset template. After the testing device obtains the defect information set, the testing device can respond to an operation instruction input by a user and used for indicating information in target defect information to display, and fill a preset template according to the information in the target defect information (such as defect grade, defect belonging module identification, defect discovery time, defect stage identification or defect source information) to generate a test report of the software to be tested.

Optionally, after the testing device fills the preset template, the testing device may combine the target number, the accumulated defect trend, the defect weight value, the first prompt information (or the second prompt information), the third prompt information (or the fifth prompt information) and the fourth prompt information (or the sixth prompt information) to generate a test report of the software to be tested.

Illustratively, as shown in table 1, information of a plurality of defect analysis dimensions among defect information is shown.

Table 1 information of multiple defect analysis dimensions in defect information

In some embodiments, as shown in fig. 11, the testing apparatus may configure a defect analysis dimension (i.e., the testing apparatus is responsive to an operation instruction input by a user to instruct presentation of information in the target defect information) and obtain a defect list set (i.e., a defect information set). Then, the testing device can perform data analysis on the defect list set to obtain an analysis report (namely, the testing device fills a preset template according to the information in the target defect information to generate a test report of the software to be tested). And then, the testing device can call a preset evaluation method to process the defect list set (namely S501-S504), and generate conclusion information (namely, the testing device combines the first prompt information (or the second prompt information), the third prompt information (or the fifth prompt information) and the fourth prompt information (or the sixth prompt information) to generate a test report of the software to be tested) by combining the analysis report.

It should be noted that, in the process of acquiring the defect list set from the testing device and performing data analysis on the defect list set to obtain the defect information set, reference may be made to the prior art that the defect information is acquired by running a functional module in software, so as to further acquire the introduction of the defect information set, which is not described herein.

In an embodiment of the present application, as shown in fig. 12, the process of obtaining an analysis report by the testing device performing data analysis on the defect list set may include: the test device obtains the data analysis result (such as defect grade, defect belonging module identification, defect discovery time, defect stage identification or defect source information). Then, the testing device can be filled according to template combinations, and receives a confirmation instruction input by a user to generate an analysis report.

The following describes a method for testing a software function provided in an embodiment of the present application with reference to a specific example, as shown in fig. 13, including:

step one, a testing device obtains database configuration (such as preset corresponding relation, preset weight threshold, first preset quantity threshold and second preset quantity threshold), a testing case set (such as testing case corresponding to a target functional module) and a defect list set (namely defect information set).

Step two, the testing device performs data preprocessing on the defect list set to obtain a processed defect list set.

In one possible implementation manner, the testing device may fill the information with the defect list set as a null value according to a preset filling value, so as to obtain a processed defect list set.

And step three, the testing device determines whether the user-defined template is needed.

In one possible implementation manner, the testing device may determine whether the custom template is needed by determining whether an operation instruction input by the user for indicating presentation of information in the defect information is received.

In some embodiments, if the testing device determines that the custom template is required, the testing device performs step four.

And step four, determining the custom template by the testing device.

In one possible implementation, the testing device may update the default template by determining the extended presentation item in the default template, and determine the custom template.

In some embodiments, after the test device performs step four, the test device may perform step five.

In some embodiments, if the testing apparatus determines that the custom template is not needed, the testing apparatus may perform step five.

And fifthly, the testing device performs data analysis. (i.e., S501-S504).

And step six, the testing device generates a report (namely a testing report).

In one possible implementation, if the testing device performs data analysis based on a default template, the testing device may generate a report according to the default template.

In another possible implementation, if the testing device performs data analysis based on the custom template, a report may be generated at the testing device according to the custom template.

In one possible design, the testing device may aggregate the data according to a custom template to generate the report.

And step seven, the testing device determines whether to share the report.

In one possible implementation manner, the testing device may determine whether to share the report by determining whether an operation instruction for indicating to share the report, which is input by the user, is received.

In one possible implementation, the test device may share the report in the form of a mail.

In some embodiments, if the testing device determines not to share the report, the testing device performs step eight.

And step eight, the testing device locally stores the report.

In other embodiments, if the testing device determines to share the report, the testing device performs step nine.

And step nine, the testing device sends a report to a preset mailbox.

In one possible implementation, the database configuration of the testing device stores address information of a preset mailbox, and the testing device may send a report to the preset mailbox according to the address information of the preset mailbox.

In one possible design, the report sent to the preset mailbox may be a report generated based on a default template, or the report sent to the preset mailbox may be a report generated based on a custom template.

That is, the template content comprises the conventional version number, system information and test case execution conditions, and also comprises preset defect analysis with different dimensions combined with twenty-eight laws, namely 80% of software defects are gathered in 20% of modules of the software, a suggestion for further testing in the later period is given, a functional module with higher defect possibility is purposefully tested, hidden defects are found and repaired to the greatest extent and the greatest extent, meanwhile, management staff can train short-board skills of related staff in a targeted manner according to defect distribution, the product quality is gradually perfected, the system construction and development are guaranteed, and the team product delivery quality and efficiency are improved.

The foregoing description of the solution provided by the embodiments of the present application has been presented mainly from the perspective of a computer device. It will be appreciated that the computer device, in order to carry out the functions described above, comprises corresponding hardware structures and/or software modules that perform the respective functions. Those of skill in the art will readily appreciate that the method steps of testing the software functions of the examples described in connection with the embodiments disclosed herein may be implemented as hardware or a combination of hardware and computer software. Whether a function is implemented as hardware or computer software driven hardware depends upon the particular application and design constraints imposed on the solution. Skilled artisans may implement the described functionality in varying ways for each particular application, but such implementation decisions should not be interpreted as causing a departure from the scope of the present application.

The embodiment of the application also provides a device for testing the software function. The device for testing the software function can be a computer device, a CPU in the computer device, a processing module for testing the software function in the computer device, or a client for testing the software function in the computer device.

The embodiment of the application may divide the functional modules or functional units of the software functional test device according to the above method examples, for example, each functional module or functional unit may be divided corresponding to each function, or two or more functions may be integrated into one processing module. The integrated modules may be implemented in hardware, or in software functional modules or functional units. The division of the modules or units in the embodiments of the present application is merely a logic function division, and other division manners may be implemented in practice.

Fig. 14 is a schematic structural diagram of a software function testing device according to an embodiment of the present application. The software function test apparatus for executing the software function test method shown in fig. 5, 6, 7, 8, 9 or 10 may include: an acquisition module 1401 and a processing module 1402.

An obtaining module 1401, configured to obtain a defect information set of a target function module in software to be tested, where the defect information set includes a plurality of target defect information for indicating a defect state of the target function module, and the target defect information includes: target defect level. The processing module 1402 is configured to determine a defect weight value of the target functional module according to a preset correspondence and a target defect level of each target defect information in the defect information set, where the preset correspondence is a correspondence between a plurality of preset weight values and a plurality of preset defect levels. The processing module 1402 is further configured to generate first hint information if the defect weight is less than a preset weight threshold, where the first hint information is used to indicate that the testing of the target function module is completed.

Optionally, the target defect information further includes: defect discovery time. The processing module 1402 is further configured to determine an accumulated defect trend of the target function module according to the defect discovery time of each target defect information in the defect information set. The processing module 1402 is specifically configured to generate a first hint information if the defect weight is less than a preset weight threshold and the cumulative defect trend converges.

Optionally, the processing module 1402 is further configured to determine a target number of target defect information in the defect information set according to the defect information set. The processing module 1402 is specifically configured to generate a first hint information if the defect weight is less than a preset weight threshold, the cumulative defect trend converges, and the target number is greater than a first preset number threshold.

Optionally, the processing module 1402 is further configured to generate a second hint information if the defect information set does not meet a preset condition, where the second hint information is used to indicate that the test of the target function module is not completed, and the preset condition includes at least one of: the defect weight value is smaller than a preset weight threshold, the accumulated defect trend converges, and the target number is larger than a first preset number threshold.

Optionally, the target defect information further includes: defect source information. The processing module 1402 is further configured to obtain a first number of first defect information by using, as the first defect information, target defect information having defect source information in the defect information set as first source information, where the first source information is used to indicate defect information determined by a test case corresponding to the target function module. The processing module 1402 is further configured to determine a target scale value according to the target number and the first number, the target scale value being used to indicate a specific gravity of the first defect information in the defect information set. The processing module 1402 is further configured to generate third hint information if the target proportion value is less than the preset proportion threshold, where the third hint information is used to indicate that the test case corresponding to the target function module is to be updated.

Optionally, the target defect information further includes: the stage mark of the defect is any one of the following preset stage marks: the identification of the demand phase, the identification of the design phase, the identification of the code and joint debugging phase and the identification of the test phase. The processing module 1402 is further configured to determine at least one first information set from the defect information set according to a stage identifier of the defect of each target defect information in the defect information set, where the stage identifiers of the defect of the second defect information in the first information set are all identifiers of the first stage, and one first information set corresponds to one identifier of the first stage. The processing module 1402 is further configured to generate, for each first information set, a hint information indicating a stage status of the target function module according to a target operation, where the target operation includes: a second amount of second defect information in a second set of information, any one of the at least one first set of information, is determined. It is determined whether the second number is greater than a second preset number threshold. If the second number is greater than a second preset number threshold, generating fourth prompt information according to the identification of the second stage corresponding to the second information set, wherein the fourth prompt information is used for indicating that the second stage of the target functional module has defects.

Fig. 15 is a schematic diagram showing a hardware configuration of a test apparatus for software functions according to an exemplary embodiment. The software function testing device may include a processor 1502, where the processor 1502 is configured to execute application program codes to implement the software function testing method in the present application.

The processor 1502 may be a CPU, microprocessor, application-specific integrated circuit (ASIC), or one or more integrated circuits for controlling the execution of programs in accordance with aspects of the present application.

As shown in fig. 15, the software functional test device may further include a memory 1503. The memory 1503 is used for storing application program codes for executing the embodiments of the present application, and is controlled by the processor 1502 to execute.

The memory 1503 may be, but is not limited to, a read-only memory (ROM) or other type of static storage device that can store static information and instructions, a random access memory (random access memory, RAM) or other type of dynamic storage device that can store information and instructions, or an electrically erasable programmable read-only memory (electrically erasable programmable read-only memory, EEPROM), a compact disc read-only memory (compact disc read-only memory) or other optical disk storage, a compact disc storage (including compact disc, laser disc, optical disc, digital versatile disc, blu-ray disc, etc.), a magnetic disk storage medium or other magnetic storage device, or any other medium that can be used to carry or store desired program code in the form of instructions or data structures and that can be accessed by a computer. The memory 1503 may be implemented separately and coupled to the processor 1502 via the bus 1504. The memory 1503 may also be integrated with the processor 1502.

As shown in fig. 15, the software functional test device may further comprise a communication interface 1501, wherein the communication interface 1501, the processor 1502, and the memory 1503 may be coupled to each other, for example, via a bus 1504. The communication interface 1501 is used for information interaction with other devices, for example, a test device supporting a software function.

It should be noted that the device structure shown in fig. 15 does not constitute a limitation of the test device of the software function, and the test device of the software function may include more or less components than those shown in fig. 15, or may combine some components, or may be arranged of different components.

In actual implementation, the functions implemented by the processing module 1402 may be implemented by the processor 1502 shown in fig. 15 calling program code in the memory 1503.

The present application also provides a computer readable storage medium having instructions stored thereon that, when executed by a processor of a computer device, enable the computer to perform the testing of software functions provided by the above-described illustrated embodiments. For example, the computer readable storage medium may be the memory 1503 including instructions executable by the processor 1502 of the computer device to perform the methods described above. Alternatively, the computer readable storage medium may be a non-transitory computer readable storage medium, for example, a ROM, RAM, CD-ROM, a magnetic tape, a floppy disk, an optical data storage device, and the like.

Fig. 16 exemplarily illustrates a conceptual partial view of a computer program product provided by embodiments of the present application, the computer program product comprising a computer program for executing a computer process on a computing device.

In one embodiment, a computer program product is provided using signal bearing medium 1600. Signal bearing medium 1600 may include one or more program instructions that when executed by one or more processors may provide the functionality or portions of the functionality described above with respect to fig. 5, 6, 7, 8, 9, or 10. Thus, for example, referring to the embodiment shown in fig. 5, one or more features of S501-S504 may be carried by one or more instructions associated with the signal bearing medium 1600. Further, the program instructions in fig. 16 also describe example instructions.

In some examples, signal bearing medium 1600 may include a computer readable medium 1601 such as, but not limited to, a hard disk drive, compact Disk (CD), digital Video Disk (DVD), digital magnetic tape, memory, read-only memory (ROM), or random access memory (random access memory, RAM), among others.

In some implementations, the signal bearing medium 1600 may include a computer recordable medium 1602, such as, but not limited to, memory, read/write (R/W) CD, R/W, DVD, and the like.

In some implementations, the signal bearing medium 1600 may include a communication medium 1603, such as, but not limited to, digital and/or analog communication media (e.g., fiber optic cable, waveguide, wired communications link, wireless communications link, etc.).

The signal bearing medium 1600 may be conveyed by a communication medium 1603 in wireless form. The one or more program instructions may be, for example, computer-executable instructions or logic-implemented instructions.

In some examples, a test device such as the software functions described with respect to fig. 14 may be configured to provide various operations, functions, or actions in response to program instructions through one or more of computer readable medium 1601, computer recordable medium 1602, and/or communication medium 1603.

It will be apparent to those skilled in the art from this description that, for convenience and brevity of description, only the above-described division of the functional modules is illustrated, and in practical application, the above-described functional allocation may be performed by different functional modules according to needs, i.e. the internal structure of the apparatus is divided into different functional modules, so as to perform all the above-described classification or part of the functions.

In the several embodiments provided in this application, it should be understood that the disclosed apparatus and method may be implemented in other ways. For example, the apparatus embodiments described above are merely illustrative, e.g., the division of modules or units is merely a logical function division, and there may be additional divisions when actually implemented, e.g., multiple units or components may be combined or integrated into another apparatus, or some features may be omitted or not performed. Alternatively, the coupling or direct coupling or communication connection shown or discussed with each other may be an indirect coupling or communication connection via some interfaces, devices or units, which may be in electrical, mechanical or other form.

The units described as separate parts may or may not be physically separate, and the parts displayed as units may be one physical unit or a plurality of physical units, may be in one place, or may be distributed in a plurality of different places. The purpose of the embodiment scheme can be achieved by selecting part or all of the classification part units according to actual needs.

In addition, each functional unit in each embodiment of the present application may be integrated in one processing unit, or each unit may exist alone physically, or two or more units may be integrated in one unit. The integrated units may be implemented in hardware or in software functional units.

The integrated units, if implemented in the form of software functional units and sold or used as stand-alone products, may be stored in a readable storage medium. Based on such understanding, the technical solution of the embodiments of the present application may be essentially or partly contributing to the prior art or the whole classification part or part of the technical solution may be embodied in the form of a software product stored in a storage medium, including several instructions to cause a device (may be a single-chip microcomputer, a chip or the like) or a processor (processor) to perform the whole classification part or part of the steps of the methods of the embodiments of the present application. The storage medium includes a usb disk, a removable hard disk, a ROM, a RAM, a magnetic disk, or an optical disk, etc. which can store the program codes.

The foregoing is merely a specific embodiment of the present application, but the protection scope of the present application is not limited thereto, and any changes or substitutions within the technical scope of the present disclosure should be covered in the protection scope of the present application. Therefore, the protection scope of the present application shall be subject to the protection scope of the claims.

Claims

1. A method for testing software functions, the method comprising:

Obtaining a defect information set of a target functional module in software to be tested, wherein the defect information set comprises a plurality of target defect information used for indicating defect states of the target functional module, and the target defect information comprises: a target defect level;

determining a defect weight value of the target functional module according to a preset corresponding relation and the target defect grade of each target defect information in the defect information set, wherein the preset corresponding relation is a corresponding relation between a plurality of preset weight values and a plurality of preset defect grades;

if the defect weight value is smaller than a preset weight threshold value, generating first prompt information, wherein the first prompt information is used for indicating that the test of the target functional module is completed.

2. The method of claim 1, wherein the target defect information further comprises: defect discovery time, the method further comprising:

determining the accumulated defect trend of the target functional module according to the defect discovery time of each target defect information in the defect information set;

generating the first prompt message includes:

and if the defect weight value is smaller than the preset weight threshold value and the accumulated defect trend is converged, generating the first prompt information.

3. The method according to claim 2, wherein the method further comprises:

determining the target quantity of the target defect information in the defect information set according to the defect information set;

generating the first prompt message includes:

and if the defect weight value is smaller than the preset weight threshold, the accumulated defect trend converges, and the target number is larger than a first preset number threshold, generating the first prompt information.

4. A method according to claim 3, characterized in that the method further comprises:

if the defect information set does not meet the preset condition, generating second prompt information, wherein the second prompt information is used for indicating that the test of the target functional module is not completed, and the preset condition comprises at least one of the following: the defect weight value is smaller than the preset weight threshold, the accumulated defect trend converges, and the target number is larger than the first preset number threshold.

5. The method according to any one of claims 1-4, wherein the target defect information further comprises: defect source information, the method further comprising:

taking the target defect information, which is the defect source information in the defect information set, as first defect information, to obtain a first number of first defect information, wherein the first source information is used for indicating the defect information determined by the test case corresponding to the target functional module;

Determining a target proportion value according to the target quantity and the first quantity, wherein the target proportion value is used for indicating the proportion of the first defect information in the defect information set;

if the target proportion value is smaller than a preset proportion threshold value, third prompt information is generated, and the third prompt information is used for indicating the test case corresponding to the target functional module to be updated.

6. The method according to any one of claims 1-4, wherein the target defect information further comprises: the stage mark of the defect is any one of the following preset stage marks: identification of a demand stage, identification of a design stage, identification of a coding and joint debugging stage and identification of a test stage; the method further comprises the steps of:

determining at least one first information set from the defect information set according to the stage identifiers of the defects of each target defect information in the defect information set, wherein the stage identifiers of the defects of the second defect information in the first information set are all identifiers of a first stage, and one first information set corresponds to one first stage identifier;

for each first information set, generating prompt information for indicating the stage state of the target functional module according to target operation, wherein the target operation comprises the following steps:

Determining a second amount of the second defect information in a second information set, the second information set being any one of the at least one first information set;

determining whether the second number is greater than a second preset number threshold;

and if the second number is greater than the second preset number threshold, generating fourth prompt information according to the identification of the second stage corresponding to the second information set, wherein the fourth prompt information is used for indicating that the second stage of the target functional module has defects.

7. A device for testing software functions, the device comprising:

the device comprises an acquisition module, a test module and a test module, wherein the acquisition module is used for acquiring a defect information set of a target functional module in software to be tested, the defect information set comprises a plurality of target defect information used for indicating the defect state of the target functional module, and the target defect information comprises: a target defect level;

the processing module is used for determining a defect weight value of the target functional module according to a preset corresponding relation and the target defect grade of each target defect information in the defect information set, wherein the preset corresponding relation is a corresponding relation between a plurality of preset weight values and a plurality of preset defect grades;

The processing module is further configured to generate first prompt information if the defect weight value is smaller than a preset weight threshold, where the first prompt information is used to indicate that the test of the target functional module is completed.

8. The apparatus of claim 7, wherein the target defect information further comprises: defect discovery time;

the processing module is further configured to determine an accumulated defect trend of the target function module according to the defect discovery time of each target defect information in the defect information set;

the processing module is specifically configured to generate the first prompt message if the defect weight value is smaller than the preset weight threshold and the cumulative defect trend converges.

9. The apparatus of claim 8, wherein the device comprises a plurality of sensors,

the processing module is further used for determining the target quantity of the target defect information in the defect information set according to the defect information set;

the processing module is specifically configured to generate the first prompt message if the defect weight value is smaller than the preset weight threshold, the cumulative defect trend converges, and the target number is greater than a first preset number threshold.

10. The apparatus of claim 9, wherein the device comprises a plurality of sensors,

the processing module is further configured to generate a second prompt message if the defect information set does not meet a preset condition, where the second prompt message is used to indicate that the test of the target functional module is not completed, and the preset condition includes at least one of the following: the defect weight value is smaller than the preset weight threshold, the accumulated defect trend converges, and the target number is larger than the first preset number threshold.

11. The apparatus according to any one of claims 7-10, wherein the target defect information further comprises: defect source information;

the processing module is further configured to use the target defect information, in which the defect source information is first source information in the defect information set, as first defect information, to obtain a first number of first defect information, where the first source information is used to indicate defect information determined by a test case corresponding to the target functional module;

the processing module is further configured to determine a target proportion value according to the target number and the first number, where the target proportion value is used to indicate a specific gravity of the first defect information in the defect information set;

The processing module is further configured to generate third prompt information if the target proportion value is smaller than a preset proportion threshold, where the third prompt information is used to indicate a test case corresponding to the target functional module to be updated.

12. The apparatus according to any one of claims 7-10, wherein the target defect information further comprises: the stage mark of the defect is any one of the following preset stage marks: identification of a demand stage, identification of a design stage, identification of a coding and joint debugging stage and identification of a test stage;

the processing module is further configured to determine at least one first information set from the defect information set according to a stage identifier of the defect of each target defect information in the defect information set, where the stage identifiers of the defects of the second defect information in the first information set are all identifiers of a first stage, and one first information set corresponds to one identifier of the first stage;

the processing module is further configured to generate, for each of the first information sets, a hint information for indicating a phase state of the target function module according to a target operation, where the target operation includes:

13. A software functional test device, comprising: a processor and a memory; the processor and the memory are coupled; the memory is used for storing one or more programs, the one or more programs comprising computer-executable instructions, which when executed by the software functional testing device, cause the software functional testing device to perform the software functional testing method of any of claims 1-6.

14. A computer readable storage medium having instructions stored therein, wherein when the instructions are executed by a computer, the computer performs the method of testing the software function of any of claims 1-6.