CN117371378A - Adapter configuration design method for testing station with switch - Google Patents
Adapter configuration design method for testing station with switch Download PDFInfo
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- CN117371378A CN117371378A CN202311188263.5A CN202311188263A CN117371378A CN 117371378 A CN117371378 A CN 117371378A CN 202311188263 A CN202311188263 A CN 202311188263A CN 117371378 A CN117371378 A CN 117371378A
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- 238000012360 testing method Methods 0.000 title claims abstract description 87
- 238000000034 method Methods 0.000 title claims abstract description 22
- 238000013461 design Methods 0.000 title claims abstract description 13
- 238000013507 mapping Methods 0.000 claims abstract description 45
- 230000006870 function Effects 0.000 claims abstract description 10
- 230000009131 signaling function Effects 0.000 claims abstract description 10
- 238000004519 manufacturing process Methods 0.000 claims abstract description 6
- 239000011159 matrix material Substances 0.000 claims description 29
- 238000005259 measurement Methods 0.000 claims description 7
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F30/00—Computer-aided design [CAD]
- G06F30/30—Circuit design
- G06F30/38—Circuit design at the mixed level of analogue and digital signals
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
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Abstract
The invention belongs to the technical field of intelligent manufacturing, and particularly relates to an adapter configuration design method for a testing station with a switch, which comprises the following steps: carrying out information statistics on UUT ports; counting the signal constraint conditions of each connector of the front panel of the adapter; judging whether the constraint condition of the front panel of the adapter meets the test requirement of the same-test signal port required by UUT; counting the number of functional board cards of the test station; judging whether the number of analog signal function board channels in the testing station is not larger than the number of signal channels corresponding to UUT, acquiring the mapping relation from the function board card to the ICA, acquiring the mapping relation from the ICA to the back panel of the adapter, configuring the internal mapping of the adapter, and acquiring the mapping relation from the front panel of the adapter to the UUT.
Description
Technical Field
The invention belongs to the technical field of intelligent manufacturing, and particularly relates to an adapter configuration design method for a testing station with a switch.
Background
The adapter is positioned between the test equipment and the equipment to be tested, mainly completes the distribution and conditioning work of the test signals, and because the types and the characteristics of the signals of the tested object and the test equipment are different, the interface adapter is difficult to achieve certain universality, thereby providing challenges for the development period and the cost of the test equipment.
In order to improve the versatility of the adapter, most of researches have focused on realizing the versatility of the adapter in terms of hardware by modularization and increasing matrix switches, and no effective method is formed for the mapping configuration design of the adapter. For example, patent CN 102313565A realizes the universality of the interface adapter through a modularized adapting circuit board, and patent CN 103968868B introduces a matrix switch to realize the routing and switching of different signals.
Disclosure of Invention
Aiming at the problems in the prior art, a mapping configuration design method of an adapter is provided.
In order to achieve the technical effects, the technical scheme of the application is as follows:
a method for designing an adapter configuration for a test station having a switch, comprising the steps of:
step 1: carrying out information statistics on UUT ports;
further, the step 1 specifically includes: counting M classes of all ports in a connector interface of a UUT, wherein the number of the ports of all classes is { M } 1 ,M 2 ,…M m }，M i Represents the number of i-th signal ports, wherein the number of the required simultaneous signals is { T } 1 ,T 2 ,…T m }，T i Represents the number of i-th signal ports, T i ≤M i The simultaneous signal refers to a port that needs to be tested simultaneously.
Step 2: counting the signal constraint conditions of each connector of the front panel of the adapter;
further, the step 2 is specificallyThe method comprises the following steps: the number of connectors on the front panel of the adapter is n, and the connector number is { CT } 1 ,CT 2 …CT n The maximum number of different types of ports on the j-th connector is CT j {D j1 ,D j2 ,…D jm }, wherein D jk ,k∈[1,m]For the number of the kth type ports on the jth connector, the maximum supporting capacity { MX } of all the connectors on the front panel of the adapter for the number of the same-test signal ports is counted 1 ,MX 2 ,…MX m }, where MX p Representing the maximum support capability of the adapter for the number of p-th simultaneous signal ports,
step 3: judging whether the constraint condition of the front panel of the adapter meets the test requirement of the same-test signal port required by UUT;
further, the step 3 specifically comprises: needs MX p ≥M p ，p∈[1,m]Otherwise, the corresponding signal connection with the UUT cannot be completed, and the design of the front panel interface of the adapter needs to be modified.
Step 4: if the judgment result of the step 3 is yes, counting the number of the functional board cards of the testing station;
further, the step 4 specifically comprises: if MX p ≥T p Counting the number { G (G) of channels of various signals of the functional board card in the test station 1 ,G 2 ,…G m First, the functional board card in the test station needs to meet UUT and the same test port requirement, and the number of the functional board cards meets G p ≥T p ，p∈[1,m]Otherwise, supplementing the number of the function board cards;
the number of channels of the digital signal function board card in the test station is required to be not less than the maximum number of channels of the digital signal of the UUT, otherwise, the number of channels of the digital signal function board card is supplemented, and the former r signal types are assumed to be the digital signal interface types of the UUT, namely { G } 1 ,…G r }，G p ≥M p ，p∈[1,r]。
Step 5: when the two requirements in the step 4 are met at the same time, judging whether the analog signal function board card type channel in the test station is not more than the number of the corresponding signal channels of the UUT, if so, performing matrix switch design in the test station through switch switching in the test station, and judging whether the number of signal types switched through the switch is not less than the number of the switch input channels; judging whether the output systematic even number of the matrix switch covers the sum of the numbers of all the non-identical ports;
further, in the step 5, s analog signal resources in the statistics function board card resources can meet the simultaneous measurement requirement of all interfaces, and m-s-r analog signal resources can meet the simultaneous measurement requirement of all analog interfaces, namely, G p ≥M p ，p∈[r+1,r+s]Testing of non-identical analog signal interfaces by switching of switches in a test station, T q ≤G q <M q ，q∈[r+s+1,m]The signal directly enters the adapter without passing through the switch;
the number Si of input channels of the matrix switch is larger than or equal to m-s-r, the number of signals to be routed by the switch in the test station cannot be smaller than the number of input channels of the switch, and the number of output channels of the matrix switchThe number of output channels should cover the sum of the number of all non-identical ports, and if the number of output channels cannot meet the requirement, the matrix switch needs to be replaced or increased.
Step 6: when the two requirements in the step 5 are met simultaneously, the mapping relation from the functional board card to the ICA is obtained, f 1 : function board card→ica;
step 7: acquiring the mapping relation from ICA to the back panel of the adapter, f 2 : ica→adapter rear panel;
step 8: configuring an adapter internal map;
further, in the step 8, the following mapping relation needs to be specifically adapted:
1) Configuring the mapping relation of the r-type digital signal interfaces before configuration;
2) Configuring the mapping relation of the s-type analog signal interfaces;
3) Configuring the mapping relation of m-s-r analog signal interfaces, and sequentially adding each analog signal interfaceThe single channel of the switch is connected with the input of the matrix switch, and then the output channel of the switch is connected with the corresponding interface f of each analog signal on the front panel of the adapter in turn on the premise of meeting the constraint condition of the front panel of the adapter 3 。
Step 9: acquiring a mapping relation from the front panel of the adapter to the UUT, f 4 : the front panel of the adapter→uut,
to this end f 3 And f 4 I.e. the mapping configuration of the adapter and the cable to be finally designed, will f 4 To cable manufacturing units, f 3 And the processing unit which is sent to the adapter through the upper computer is used for automatic switching, or a technician performs connection according to the mapping relation.
The application has the advantages that:
the invention provides a mapping configuration design method of an adapter on the premise that the mapping relation of the adapter is unchanged in the testing process aiming at a testing station with a switch module, so that the mapping configuration problem of the adapter is effectively solved, and the configuration efficiency of the adapter is improved.
Drawings
FIG. 1 is a flow chart of the overall process of the present invention.
Fig. 2 is a schematic diagram of test equipment and product under test (UUT) hardware and connection structures.
FIG. 3 is a schematic diagram of the connection in example 2.
Detailed Description
For the purposes of making the objects, technical solutions and advantages of the embodiments of the present application more clear, the technical solutions of the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is apparent that the described embodiments are some embodiments of the present application, but not all embodiments. The components of the embodiments of the present application, which are generally described and illustrated in the figures herein, may be arranged and designed in a wide variety of different configurations.
Thus, the following detailed description of the embodiments of the present application, as provided in the accompanying drawings, is not intended to limit the scope of the application, as claimed, but is merely representative of selected embodiments of the application. All other embodiments, which can be made by one of ordinary skill in the art based on the embodiments herein without making any inventive effort, are intended to be within the scope of the present application.
It should be noted that: like reference numerals and letters denote like items in the following figures, and thus once an item is defined in one figure, no further definition or explanation thereof is necessary in the following figures.
In the description of the present application, it should be noted that, the terms "upper", "vertical", "inner", "outer", and the like indicate an azimuth or a positional relationship based on the azimuth or the positional relationship shown in the drawings, or an azimuth or a positional relationship conventionally put in use of the product of the application, or an azimuth or a positional relationship conventionally understood by one skilled in the art, are merely for convenience of description of the present application and for simplification of description, and do not indicate or imply that the apparatus or element to be referred to must have a specific azimuth, be configured and operated in a specific azimuth, and thus should not be construed as limiting the present application. Furthermore, the terms "first," "second," and the like, are used merely to distinguish between descriptions and should not be construed as indicating or implying relative importance.
In the description of the present application, it should also be noted that, unless explicitly specified and limited otherwise, the terms "disposed," "mounted," and "connected" are to be construed broadly, and may be, for example, fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; can be directly connected or indirectly connected through an intermediate medium, and can be communication between two elements. The specific meaning of the terms in this application will be understood by those of ordinary skill in the art in a specific context.
Example 1
As shown in fig. 1, a method for designing an adapter configuration of a test station with a switch includes the following steps:
step 1: carrying out information statistics on UUT ports;
further, the step 1 specifically includes: counting M classes of all ports in a connector interface of a UUT, wherein the number of the ports of all classes is { M } 1 ,M 2 ,…M m }，M i Represents the number of i-th signal ports, wherein the number of the required simultaneous signals is { T } 1 ,T 2 ,…T m }，T i Represents the number of i-th signal ports, T i ≤M i The simultaneous signals refer to ports that need to be tested simultaneously, i.e. cannot be time division multiplexed by a switch matrix.
Step 2: counting the signal constraint conditions of each connector of the front panel of the adapter;
further, the step 2 specifically includes: the number of connectors on the front panel of the adapter is n, and the connector number is { CT } 1 ,CT 2 …CT n The maximum number of different types of ports on the j-th connector is CT j {D j1 ,D j2 ,…D jm }, wherein D jk ,k∈[1,m]For the number of the kth type ports on the jth connector, the maximum supporting capacity { MX } of all the connectors on the front panel of the adapter for the number of the same-test signal ports is counted 1 ,MX 2 ,…MX m }, where MX p Representing the maximum support capability of the adapter for the number of p-th simultaneous signal ports,
step 3: judging whether the constraint condition of the front panel of the adapter meets the test requirement of the same-test signal port required by UUT;
further, the step 3 specifically comprises: needs MX p ≥M p ，p∈[1,m]Otherwise, the corresponding signal connection with the UUT cannot be completed, and the design of the front panel interface of the adapter needs to be modified.
Step 4: if the judgment result of the step 3 is yes, counting the number of the functional board cards of the testing station;
further, the step 4 specifically comprises: if MX p ≥T p Counting the number { G (G) of channels of various signals of the functional board card in the test station 1 ,G 2 ,…G m First, the functional board card in the test station needs to meet UUT and the same test port requirement, and the number of the functional board cards meets G p ≥T p ，p∈[1,m]Otherwise supplementThe number of functional board channels; the UUT simultaneous measurement port requirement refers to that the functional board card matches with UUT requirements in pin definition, measuring range, precision, signal type and transmission rate.
Considering that the matrix in the test station cannot switch digital signals, including bus signals such as CAN, RS422, LAN and the like, the number of channels of the digital signal function board card in the test station is required to be not less than the maximum number of channels of UUT digital signals, namely, the number of digital signal ports in the function board card resource CAN simultaneously meet the test requirements of all digital signals of UUT, otherwise, the number of the digital signal function board card is supplemented, and the former r signal types are assumed to be the digital signal interface types of UUT, namely { G } 1 ,…G r }，G p ≥M p ，p∈[1,r]。
Step 5: when the two requirements in the step 4 are met at the same time, judging whether the analog signal function board card type channel in the test station is not more than the number of the corresponding signal channels of the UUT, if so, performing matrix switch design in the test station through switch switching in the test station, and judging whether the number of signal types switched through the switch is not less than the number of the switch input channels; judging whether the output systematic even number of the matrix switch covers the sum of the numbers of all the non-identical ports;
further, in the step 5, s analog signal resources in the statistics function board card resources can meet the simultaneous measurement requirement of all interfaces, and m-s-r analog signal resources can meet the simultaneous measurement requirement of all analog interfaces, namely, G p ≥M p ，p∈[r+1,r+s]Testing of non-identical analog signal interfaces by switching of switches in a test station, T q ≤G q <M q ，q∈[r+s+1,m]The signal directly enters the adapter without passing through the switch;
the number Si of input channels of the matrix switch is larger than or equal to m-s-r, the number of signals to be routed by the switch in the test station cannot be smaller than the number of input channels of the switch, and the number of output channels of the matrix switchThe number of output channels is such that it covers all non-identical numbers of portsAnd if the sum cannot meet the requirement, the matrix switch needs to be replaced or added.
Step 6: when the two requirements in the step 5 are met simultaneously, the mapping relation from the functional board card to the ICA is obtained, f 1 : function board card→ica;
step 7: acquiring the mapping relation from ICA to the back panel of the adapter, f 2 : ica→adapter rear panel;
step 8: configuring an adapter internal map;
further, in the step 8, the following mapping relation needs to be specifically adapted:
1) Configuring the mapping relation of the r-type digital signal interfaces before configuration;
2) Configuring the mapping relation of the s-type analog signal interfaces;
3) And configuring the mapping relation of m-s-r analog signal interfaces, and sequentially connecting a single passage in each analog signal interface with the input of the matrix switch, namely shorting the input of the matrix switch on the rear panel of the adapter. On the premise of meeting the constraint condition of the front panel of the adapter, the switch output channel and the corresponding interface f of each type of analog signal on the front panel of the adapter are connected in sequence 3 。
Step 9: obtaining the mapping relation between the front panel of the adapter and UUT, namely the mapping relation of the cable, f 4 : the relation from the front panel of the adapter to the UUT is used sequentially according to the connector numbers and the statistics of the step 2, so that the test requirement is met.
To this end f 3 And f 4 I.e. the mapping configuration of the adapter and the cable to be finally designed, will f 4 To cable manufacturing units, f 3 And the processing unit which is sent to the adapter through the upper computer is used for automatic switching, or a technician performs connection according to the mapping relation.
As shown in fig. 2, in the schematic diagram of the test equipment and the product under test (UUT) hardware and the connection structure: a test station 1; the case back plate 11, the functional board card 12 comprises analog quantity AD, DA, discrete quantity DIO, pulse PWM, RS422/232/485, CAN, LAN, power supply and the like, and also comprises 1 or more matrix switches; the interface connector assembly 2 (ICA) includes a connection die strip 21; the adapter 3 can realize configuration of 12 channels and realize channel routing; the adapter rear panel 31 interfaces with the interface connector assembly 2; the mould strip 311 on the back panel is in butt joint with the connecting mould strip 21; an adapter front panel 32, with connectors 321 on the front panel connected to the UUT by test cables; the UUT4 of the product to be tested, the connector 41 of the product to be tested is connected with the connector 321 of the front panel through a cable; the test cable 5 is used to connect the connector 321 on the front panel with the connector on the 41 product under test.
Herein, the following is the case: ICA: an interface connector assembly; UUT: a tested product; CAN: a controller area network bus; RS422: a balanced voltage digital interface circuit; LAN: an Ethernet network.
Example 2
As shown in fig. 1-3, a method for designing an adapter configuration of a test station with a switch includes the steps of:
step 1: the ports in the connector interface of the UUT are of class 2, namely AD and RS422, the number of AD ports is 5, the number of RS422 ports is 10, the number of AD required simultaneous detection channels is 2, and the number of RS422 required simultaneous detection channels is 8.
Step 2: the front panel of the adapter is provided with 2 connectors, the number of AD channels of the connector 1 is 3, and the number of RS422 channels of the connector 1 is 6; connector 2 has an AD channel number of 3 and an rs422 channel number of 6. Statistics show that the maximum channel number of the front panel of the adapter supporting AD is 6, and the maximum channel of the RS422 is 12.
Step 3: the number of AD channels of the adapter front panel is 6 (not less than 5), and the number of RS422 channels is 12 (not less than 10), so that the adapter front panel does not need to be modified.
Step 4: the number of shared channels of the AD card in the test station is 2 (not less than 2), and the number of shared channels of the RS422 card is 12 (not less than 8), so that the requirement of the same-test resource is met.
And the number of the RS422 card channels in the test station is 12 (not less than 10), and each channel can be connected with the UUT through the adapter without increasing the number of the RS422 card channels.
Step 5: the number of AD card channels in the test station is 2, and the test requirements of all AD channels of the UUT cannot be met, so that the test station needs to be switched in and then enter the adapter.
The input channels of the matrix switch are 2 (not less than 1), the output channels of the matrix switch are 5 (not less than 4), 1 path of the AD card can directly enter the adapter to be connected with the UUT, and 1 path of the AD card is output through the adapter through the switch, so that the AD simultaneous testing requirement of the UUT can be met, and the testing requirement of all the AD of the UUT can be met through the switch switching in the testing station
Step 6: the space and logic of the functional board card to ICA are one-to-one mapping, f 1 :1 matrix.
Step 7: ICA to adapter back panel is spatially and logically one-to-one mapped, f 2 :1 matrix
Step 8: the adapter internal map is configured.
1) Configuring a mapping relation of an RS422 interface;
2) The method is free;
3) And configuring the mapping relation of the AD analog signal interfaces, and sequentially connecting a single passage in each type of analog signal interface with the input of the matrix switch, namely, shorting the rear panel of the adapter. On the premise of meeting the constraint condition of the front panel of the adapter, the switch output channel and the corresponding interface f of each type of analog signal on the front panel of the adapter are connected in sequence 3 。
Step 9: obtaining the mapping relation between the front panel of the adapter and UUT, namely the mapping relation of the cable, f 4 : and 2, the relation from the rear panel of the adapter to the UUT is used sequentially according to the connector numbers and the statistics of the step 2, so that the test requirement is met.
To this end f 3 And f 4 I.e. the mapping configuration of the final designed adapter and cable. Will f 4 To cable manufacturing units, f 3 And the processing unit which is sent to the adapter through the upper computer is used for automatic switching, or a technician performs connection according to the mapping relation.
The dark portions in fig. 3 represent simultaneous ports.
Claims (7)
1. A method for designing an adapter configuration for a test station including a switch, comprising: the method comprises the following steps:
step 1: carrying out information statistics on UUT ports;
step 2: counting the signal constraint conditions of each connector of the front panel of the adapter;
step 3: judging whether the constraint condition of the front panel of the adapter meets the test requirement of the same-test signal port required by UUT;
step 4: if the judgment result of the step 3 is yes, counting the number of the functional board cards of the testing station;
step 5: when the two requirements in the step 4 are met at the same time, judging whether the analog signal function board card type channel in the test station is not more than the number of the corresponding signal channels of the UUT, if so, performing matrix switch design in the test station through switch switching in the test station, and judging whether the number of signal types switched through the switch is not less than the number of the switch input channels; judging whether the output systematic even number of the matrix switch covers the sum of the numbers of all the non-identical ports;
step 6: when the two requirements in the step 5 are met simultaneously, the mapping relation from the functional board card to the ICA is obtained, f 1 : function board card→ica;
step 7: acquiring the mapping relation from ICA to the back panel of the adapter, f 2 : ica→adapter rear panel;
step 8: configuring internal mapping of the adapter, and connecting the switch output channel with corresponding interface f of each type of analog signal on the front panel of the adapter 3 ；
Step 9: acquiring a mapping relation from the front panel of the adapter to the UUT, f 4 : the front panel of the adapter→uut,
to this end f 3 And f 4 I.e. the mapping configuration of the adapter and the cable to be finally designed, will f 4 To cable manufacturing units, f 3 And the processing unit which is sent to the adapter through the upper computer is used for automatic switching, or a technician performs connection according to the mapping relation.
2. A method of designing an adapter configuration for a test station containing a switch as claimed in claim 1, wherein: the step 1 specifically comprises the following steps: counting M classes of all ports in a connector interface of a UUT, wherein the number of the ports of all classes is { M } 1 ,M 2 ,…M m }，M i Represents the number of i-th signal ports, wherein the number of the required simultaneous signals is { T } 1 ,T 2 ,…T m }，T i Represents the number of i-th signal ports, T i ≤M i The simultaneous signal refers to a port that needs to be tested simultaneously.
3. A method of designing an adapter configuration for a test station containing a switch as claimed in claim 2, wherein: the step 2 specifically comprises the following steps: the number of connectors on the front panel of the adapter is n, and the connector number is { CT } 1 ,CT 2 …CT n The maximum number of different types of ports on the j-th connector is CT j {D j1 ,D j2 ,…D jm }, wherein D jk ,k∈[1,m]For the number of the kth type ports on the jth connector, the maximum supporting capacity { MX } of all the connectors on the front panel of the adapter for the number of the same-test signal ports is counted 1 ,MX 2 ,…MX m }, where MX p Representing the maximum support capability of the adapter for the number of p-th simultaneous signal ports,
4. a method of designing an adapter configuration for a test station containing a switch as claimed in claim 3, wherein: the step 3 is specifically as follows: needs MX p ≥M p ，p∈[1,m]Otherwise, the corresponding signal connection with the UUT cannot be completed, and the design of the front panel interface of the adapter needs to be modified.
5. A method of designing an adapter configuration for a test station containing a switch as defined in claim 4, wherein: the step 4 is specifically as follows: if MX p ≥T p Counting the number { G (G) of channels of various signals of the functional board card in the test station 1 ,G 2 ,…G m First, the functional board card in the test station needs to meet UUT and the same test port requirement, and the number of the functional board cards meets G p ≥T p ，p∈[1,m]Otherwise, supplementing the number of the function board cards;
the number of channels of the digital signal function board card in the test station is required to be not less than the maximum number of channels of the digital signal of the UUT, otherwise, the number of channels of the digital signal function board card is supplemented, and the former r signal types are assumed to be the digital signal interface types of the UUT, namely { G } 1 ,…G r }，G p ≥M p ，p∈[1,r]。
6. A method of designing an adapter configuration for a test station containing a switch as defined in claim 5, wherein: in the step 5, the s analog signal resources in the statistic function board card resources can meet the simultaneous measurement requirement of all interfaces, and the m-s-r analog signal resources can meet the simultaneous measurement requirement of all the analog interfaces, namely G p ≥M p ，p∈[r+1,r+s]Testing of non-identical analog signal interfaces by switching of switches in a test station, T q ≤G q <M q ，q∈[r+s+1,m]The signal directly enters the adapter without passing through the switch;
the number Si of input channels of the matrix switch is larger than or equal to m-s-r, the number of signals to be routed by the switch in the test station cannot be smaller than the number of input channels of the switch, and the number of output channels of the matrix switchThe number of output channels should cover the sum of the number of all non-identical ports, and if the number of output channels cannot meet the requirement, the matrix switch needs to be replaced or increased.
7. A method of designing an adapter configuration for a test station containing a switch as defined in claim 6, wherein: in the step 8, the following mapping relation needs to be specifically adapted:
1) Configuring the mapping relation of the r-type digital signal interfaces before configuration;
2) Configuring the mapping relation of the s-type analog signal interfaces;
3) Configuring the mapping relation of m-s-r analog signal interfaces, and sequentially combining each typeThe single passage in the analog signal interface is connected with the input of the matrix switch, and then the output channel of the switch is connected with the corresponding interface f of each type of analog signal on the front panel of the adapter in turn on the premise of meeting the constraint condition of the front panel of the adapter 3 。
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