CN117309030A - Analog testing device of sensor - Google Patents

Abstract

The invention discloses a simulation test device of a sensor, which is used for testing signal transmission conditions of a plurality of sensors and comprises a plurality of test ports, a simulation device and a communication port. The test port is correspondingly coupled with the control device of the sensor, and the simulation device is coupled with the test port. The simulation device provides a plurality of simulation signals to the corresponding test ports, so that the control device correspondingly provides a plurality of transmission signals based on the simulation signals. The communication port is coupled with the test port and the management equipment, and the control device is communicated with the management equipment through the communication port, so that the management equipment can know the signal transmission condition of the control device. The analog signal is a signal received by the simulation sensor during actual operation.

Description

Analog testing device of sensor

Technical Field

The present invention relates to a simulation test device, and more particularly to a simulation test device for a sensor.

Background

The sensors for temperature, liquid level, flow rate and the like usually have wired or wireless communication function output, and are usually tested on line by a single host computer with multiple sensors for system integration program design. This approach is limited to a single sequential communication test for a programmer, and cannot simulate synchronous communication of multiple gateways (gateways) or actual measurement of various functions such as communication speed formats, lock codes, etc. during design. After the programming is completed, the problem is found when the programming is actually used on site, and the programming must be modified or rewritten to meet the current requirements.

If the product sales requirement is met, the customers mostly cannot purchase a plurality of online tests at a time when the customers need to perform the system function test, and only the online tests can be simply tested by a prototype. When a plurality of gateways (Gateway) are purchased, synchronous communication or communication speed format and locking codes are obtained, the system cannot be normally executed. At this time, both the manufacturer and the client start to develop the solution, which results in waste of communication time between the two parties, or abandon the use of the system due to the inability of online communication, and the more serious communication errors result in irreparable loss.

In the conventional sensor, if the on-line function is to be tested, a plurality of finished products must be generated, then a connection is tested on line by adopting a serial sequence, and if the problem exists, the circuit or the program must be completely disassembled to be modified again, so that time or material is wasted. The invention designs a simulation test device of sensors, which is used for ensuring that the control device of each sensor avoids the situation that the signal transmission situation needs to be checked one by one when in actual operation after actual installation, and is a great subject for the inventor to study.

Disclosure of Invention

In order to solve the above-mentioned problems, the present invention provides an analog testing device for a sensor, so as to overcome the problems of the prior art. Therefore, the simulation test device is used for testing the signal transmission conditions of a plurality of sensors and comprises a plurality of test ports, a simulation device, a communication port and a power module. The plurality of test ports are correspondingly coupled to the control device of the sensor. The simulation device is coupled with the test port and provides a plurality of simulation signals to the corresponding test port, so that the control device correspondingly provides a plurality of transmission signals based on the simulation signals. The communication port is coupled with the test port and the management equipment, and the control device is communicated with the management equipment through the communication port, so that the management equipment can know the signal transmission condition of the control device. The power module is used for supplying power to the analog testing device and selectively supplying power by a battery or an external power supply. The analog signal is a signal received by the simulation sensor during actual operation.

In one embodiment, the simulation test device further includes an expansion port, and the expansion port is coupled to a communication port of another simulation test device to form a serial simulation test system with the management device.

In one embodiment, the analog testing device further includes an encrypting and decrypting device, the encrypting and decrypting device is coupled to the testing port, and encrypts/decrypts the transmission signal and the signal provided by the management device; the encryption/decryption device uses the non-plain code as encryption/decryption, and the encryption/decryption is selected from at least one of HEX hexadecimal code, hash function, symmetric key and asymmetric key.

In an embodiment, the analog testing device further includes a plurality of controllable switches, the controllable switches are coupled to the testing ports, and the coupling relationship between the testing ports and the communication ports can be selectively predefined to be turned on or off. Wherein the switch is at least one selected from the group consisting of a relay, a transistor, and a coaxial switch.

In one embodiment, the sensor is a wired sensor, and the control device of the sensor is coupled to the test port by wired connection; or the sensor is a wireless sensor, and the control device of the sensor is coupled with the test port in a wireless transmission mode; alternatively, the sensor is a wired sensor or a wireless sensor.

In one embodiment, the control device of the sensor is used for sensing the condition of the material flow, and the simulation signal provided by the simulation device is a flow velocity, a total flow and/or a direction of the material flow, and the material flow is simulated by the pulse signal with a specific frequency; the material flow may be a flow of solid particles, liquid or gas.

In an embodiment, the control device of the sensor is applied to sensing a material stock condition, and the simulation device includes a plurality of simulation modules, and the simulation modules are correspondingly coupled to the test ports to respectively and correspondingly provide the simulation signals to the corresponding test ports.

In an embodiment, each analog module includes a capacitor set, and the capacitor set includes a plurality of capacitor control modules, each of which is coupled in parallel with each other and includes a capacitor and a switch connected in series. Each simulation module controls whether a switch of the capacitance control module is conducted or not to adjust the capacitance value, so that a material level signal of the material stock is simulated through the change of the capacitance value.

In one embodiment, each analog module includes a plurality of temperature sensors and a plurality of heaters, the plurality of temperature sensors are coupled in series with each other, and the plurality of heaters are coupled in series with each other. Each simulation module controls the heater to heat, and influences the ambient temperature around the temperature sensor through the heating of the heater, and the temperature sensor respectively senses the ambient temperature to simulate the temperature signal of the material stock.

In one embodiment, each analog module includes a plurality of humidity sensors coupled in series with each other. Each simulation module simulates the humidity signal of the stock of materials by adjusting the humidity parameter value of the humidity sensor.

The main purpose and effect of the invention is that the analog testing device provides analog signals to pre-test the signal transmission condition between each control device and the management equipment, so as to ensure that the control device of each sensor can avoid the condition that the signal transmission is required to be checked one by one when the control device of each sensor is actually installed and operated.

For a further understanding of the technology, means, and efficacy of the present invention, reference should be made to the following detailed description of the invention and to the accompanying drawings, which are included to provide a further understanding of the invention, and to the features and aspects of the invention, however, are given by way of illustration and not limitation.

Drawings

FIG. 1 is a circuit block diagram of an analog testing device of the sensor of the present invention;

FIG. 2 is a circuit block diagram of a first embodiment of an analog testing device of the sensor of the present invention;

FIGS. 3A and 3B are circuit block diagrams of a second embodiment of an analog testing device of the sensor of the present invention; and

FIG. 4 is a schematic diagram of a sensor configuration for material inventory according to the present invention.

Wherein, the reference numerals:

100 … simulation test device

1. 1-1 to 1-N … control device

12 … sense line

122 … sensing unit

2-1-2-N … test port

3 … simulator

321-32N … simulation module

34 … capacitor bank

C … capacitor

SW … switch

36 … temperature sensor

38 … heater

40 … humidity sensor

42 … second controllable switch

44 … expansion module

4 … communication port

5 … expansion port

6 … encryption and decryption device

7 … power supply module

72 … battery

74 … converter

200 … management device

300 … stock of material

302 … material

Sa 1-SaN … analog signals

St 1-StN … transmit signals

SW 1-SWN … first controllable switch

Vin … external power supply

Detailed Description

The technical content and detailed description of the present invention are described below with reference to the drawings:

FIG. 1 is a block diagram of an analog testing apparatus of a sensor according to the present invention. The simulation test device 100 of the sensor is coupled to the management apparatus 200 and is used for testing signal transmission conditions of the plurality of sensors and the management apparatus 200. Specifically, the simulation test apparatus 100 includes a plurality of test ports 2-1 to 2-8, a simulation apparatus 3, and a communication port 4. The test ports 2-1-2-8 are correspondingly coupled to the control devices 1-8 of the sensor, and the simulation device 3 is coupled to the test ports 2-1-2-8. The simulation device 3 provides a plurality of simulation signals Sa 1-Sa 8 to the corresponding test ports 2-1-2-8, so that the control device 1-8 correspondingly provides a plurality of transmission signals St 1-St 8 to the test ports 2-1-2-8 based on the received simulation signals Sa 1-Sa 8 to perform simulation test on the control device 1-8 of the sensor. The communication port 4 is coupled to each of the test ports 2-1 to 2-8 and the management device 200, and the control devices 1-1 to 1-8 communicate with the management device 200 through the communication port 4 to obtain the signal transmission status between the management device 200 and the control devices 1-1 to 1-8. The signal transmission status refers to the online transmission quality of the management device 200 and the control devices 1-1 to 1-8, the accuracy of the numerical value transmission between the two devices, and whether the two devices have program BUGs (bus) in the process of mutual transmission.

Taking the sensor as an example of a flow rate sensor, the flow rate sensor (i.e., a flow meter) typically includes a pipeline, a runner, and a control device. In actual operation of the flow sensor, after the water flows through the pipeline to drive the water wheel, the control device generally obtains the flow speed and direction of the water flow through a sensing manner, and transmits the flow speed and direction to a Gateway (Gateway) and other back-end devices. Since in practice the flow rate sensor is typically located, for example but not limited to, in the attic of each building and connected to a remote Gateway (Gateway) or management device 200 in a wired or wireless manner. However, in the actual system configuration, each flow rate sensor must be installed to test the on-line transmission quality between the management device 200 and the control devices 1-1 to 1-8 one by one, and even after the completion of the test, data can be transmitted to and from the management device 200, when the whole system is in operation, additional transmission problems will occur due to the simultaneous operation of the whole system. Such as, but not limited to, a system crash due to too large a packet being transmitted, or a squeeze condition due to data transfer. These problems must not occur until the whole system is operated, and then the installation positions must be checked one by one at the time, which causes a lot of inconvenience.

The control devices 1-1 to 1-8 of the sensor are used for sensing the flow condition of the material, and the analog signals Sa1 to Sa8 provided by the analog device 3 are used for simulating the flow speed of the material flow, the total flow rate of the material flow and/or the direction of the material flow, and simulate the material flow by pulse signals with specific frequencies, for example and without limitation. The material flow may be a flow of solid particles, liquid or gas. Therefore, the main purpose and effect of the present invention is to pre-test the signal transmission status between each control device 1-8 and the management apparatus 200 by providing the analog signals Sa 1-Sa 8 by the analog testing device 100, so as to ensure that each sensor control device 1-8 is prevented from being checked one by one due to the signal transmission status during the actual operation after the actual installation. Taking the above sensor as a flow rate sensor as an example, the analog signals Sa1 to Sa8 provided by the analog device 3 can simulate the signals received by the flow rate sensor during actual operation, i.e. the received signals can be signals corresponding to the flow rate or direction of the water flow.

Referring to fig. 1 again, the simulation test apparatus 100 further includes an expansion port 5, and the expansion port 5 is used to couple with the communication port 4 of another simulation test apparatus 100 to form a serial simulation test system with the management device 200. Preferably, the analog test device 100, for example and without limitation, may include 8 sets of test ports 2-1-2-8, and each set of test ports 2-1-2-8 may be coupled to one control device 1-8. Typically in a small-scale sensing system (such as, but not limited to, a single building), sensors are typically configured below 8 groups, and testing of the small-scale sensing system in advance can be accomplished using a single group of analog test devices 100. However, in a larger sensing system (such as but not limited to a factory floor), the sensors are typically configured in more than 8 groups, so that the system is tested by connecting another simulation test device 100 in series to more than 8 groups of control devices 1-8 using the expansion port 5.

In another aspect, the analog testing apparatus 100 further includes a plurality of first controllable switches SW1 to SW8, and the on/off of the first controllable switches SW1 to SW8 may be controlled manually or by the management device 200. The first controllable switches SW 1-SW 8 are coupled to the test ports 2-1-2-8 and selectively switch on or off the coupling relationship between the test ports 2-1-2-8 and the communication port 4. Specifically, when some of the test ports 2-1 to 2-8 of the analog test device 100 are not coupled to the control devices 1-1 to 1-8, or some of the control devices 1-1 to 1-8 fail, or it is desired to exclude testing of some of the control devices 1-1 to 1-8, the corresponding first controllable switches SW1 to SW8 may be turned off manually or under the control of the management apparatus 200, so as to avoid being affected by the test ports 2-1 to 2-8 (for example, but not limited to, possibly transmitting signals by mistake, or transmitting signals by mistake, etc.) during the test of the signal transmission status of the analog test device 100.

Furthermore, the analog testing device 100 may further include an encryption/decryption device 6. The encryption/decryption device 6 is coupled to the test ports 2-1 to 2-8 and provides an encryption/decryption conversion mechanism for a specific data transmission format to perform encryption conversion before the transmission signals St1 to St8 are provided to the communication port 4, and perform decryption conversion on the signals when the management apparatus 200 provides the control devices 1-1 to 1-8 with the signals. The encryption and decryption device 6 may be disposed at a position shown in fig. 1, and may also be disposed at each of the test ports 2-1 to 2-8 (i.e., a plurality of decryption devices 6). In addition, the encryption/decryption device 6 uses a non-plain code as the encryption/decryption, and the encryption/decryption may be selected from at least one of HEX hexadecimal code, hash Function (hash Function), symmetric key and asymmetric key. The encryption and decryption device 6 mainly responds to the special data transmission format requirement of each manufacturer, so as to avoid the system erected by each manufacturer from stealing the data transmitted in the actual operation of the sensor and management equipment 200. Therefore, the conversion status of the encryption/decryption of the sensor and the management apparatus 200 can be tested in advance by the encryption/decryption means 6.

Further, the simulation test apparatus 100 may further comprise a power module 7 for supplying power to the simulation test apparatus 100. The power module 7 may include a battery 72 or an external power source Vin, and optionally, when powered using the external power source Vin, a converter 74 may be used to convert the external power source Vin to suitable power. Since the simulation test apparatus 100 of the present invention can be powered by the battery 72, the simulation test of the control apparatuses 1-1 to 1-8 can be started as long as a suitable placement position is found without being limited by the power distribution of the test field.

It should be noted that, in an embodiment of the present invention, the sensors used by the control devices 1-1 to 1-8 may be wired sensors or wireless sensors. When the control devices 1-1 to 1-8 are applied to the wired sensor, the control devices 1-1 to 1-8 are coupled to the test ports 2-1 to 2-8 by wired connection. When the control devices 1-1 to 1-8 are applied to the wireless sensor, the control devices 1-1 to 1-8 are coupled with the test ports 2-1 to 2-8 in a wireless transmission manner. Likewise, the test ports 2-1-2-8 may also be coupled to the management device 200 by wired or wireless means, optionally based on user demand.

Fig. 2 is a circuit block diagram of an analog testing device of the sensor according to a first embodiment of the invention, and fig. 1 is also referred to. In the embodiment of fig. 2, the sensor is used for sensing the condition of the water flow, and the control devices 1-1 to 1-8 of the sensor are used for receiving signals corresponding to the flow rate and the water flow direction. Specifically, the simulation apparatus 3 includes a plurality of simulation modules 321 to 328. The analog modules 321-328 are correspondingly coupled to the test ports 2-1-2-8 to respectively provide the analog signals Sa 1-Sa 8 to the corresponding test ports 2-1-2-8. Therefore, the simulation modules 321 to 328 of the simulation device 3 respectively provide the simulation signals Sa1 to Sa8 to the test ports 2-1 to 2-8, and the simulation signals Sa1 to Sa8 simulate the flow velocity and/or the direction of the water flow. Taking the flow rate of the water flow as an example, the simulation modules 321 to 328 simulate the flow rate of the water flow by pulse signals (i.e. the simulation signals Sa1 to Sa 8) with specific frequencies. After receiving the pulse signal with the specific frequency, the control devices 1-8 respectively provide the transmission signals St 1-St 8 to the test ports 2-1-2-8 based on the pulse signal, so as to provide the transmission signals St 1-St 8 to the management device 200 through the paths from the test ports 2-1-2-8 to the communication port 4, and know the signal transmission conditions between the test ports 2-1-2-8 and the management device 200. Therefore, the control devices 1-1 to 1-8 communicate with the management apparatus 200 through the communication port 4, and the signal transmission status between the management apparatus 200 and the control devices 1-1 to 1-8 can be known.

Please refer to fig. 3A and 3B, which are block diagrams of a second embodiment of an analog testing device of the sensor according to the present invention, in combination with fig. 1. In the embodiment of fig. 3A and 3B, the sensor is used to sense the state of stock of material, and the control devices 1-N of the sensor are used to receive signals corresponding to the state of stock of material. Sensor for stock of materials as shown in fig. 4, stock of materials 300 may be provided with single or multiple multi-function composite sensors to sense the condition of material 302. The multifunctional composite sensor generally comprises a control device 1 and a sensing line 12. The sensing line 12 includes a plurality of sensing cells 122 therein. Each sensing unit 122 may sense the temperature, humidity of the stock of material, and may also sense the level of the stock of material through a linear change in physical quantity. The simulation modules 321-32N mainly provide signals simulating the temperature, humidity and material level of the material stock to test the signal transmission conditions of the control devices 1-N of the multifunctional composite sensor. It should be noted that, in an embodiment of the present invention, the remaining elements not shown in fig. 3A and 3B or elements not further described are the same as those in fig. 2, and are not repeated here.

Specifically, each analog module 321-32N includes a capacitor bank 34. Each capacitor bank 34 is coupled to each test port 2-1-2-N, respectively, and includes a plurality of capacitance control modules. Each of the capacitance control modules is coupled in parallel with each other and includes a capacitor C and a switch SW connected in series. Each of the analog modules 321 to 32N controls the on/off state of the switch SW of the capacitance control module to adjust the capacitance value, so as to provide the level signals Sa1 to SaN of the analog material stock 300 through the change of the capacitance value. (i.e., analog signals)

Each of the simulation modules 321-32N may further include a plurality of temperature sensors 36 and a plurality of heaters 38, each of the temperature sensors 36 being coupled in series with each other, and the serially connected head ends being coupled to each of the test ports 2-1-2-N, respectively. Each heater 38 is also coupled in series with each other, and the head end of the series is coupled to each test port 2-1-2-N, respectively. Each of the simulation modules 321 to 32N controls the heater 38 to heat, and influences the ambient temperature around the temperature sensor 36 by the heating of the heater 38. The temperature sensor 36 senses the ambient temperature to provide temperature signals Sa 1-SaN (i.e., analog signals) simulating the material inventory 300, respectively. Wherein the number of heaters 38 may be different than the number of temperature sensors 36. However, in practical testing, to be able to more finely simulate the temperature of the stock 300, the number of heaters 38 is designed to be the same as the number of temperature sensors 36, and are accordingly arranged in parallel as in the preferred embodiment.

Each of the analog modules 321-32N may further include a plurality of humidity sensors 40, each of the humidity sensors 40 being coupled in series with each other, and the serially connected head ends being coupled to each of the test ports 2-1-2-N, respectively. Each of the simulation modules 321 to 32N provides the humidity signal Sa1 to SaN (i.e., the simulation signal) of the simulated material stock 300 by adjusting the humidity parameter value of the humidity sensor 40. Specifically, the humidity parameter value may be a resistance value or a capacitance value, and the adjustment of the resistance value (or the capacitance value) may simulate the humidity, so that the humidity signals Sa 1-SaN simulating the material stock 300 may be provided by the change of the resistance value or the capacitance value. Wherein the humidity will typically be different at the bottom and top of the inventory 300, two humidity sensors 40 may typically be used to simulate the humidity at the bottom and top of the inventory 300 during actual testing. However, the simulation modules 321-32N may further include more than two humidity sensors 40 to simulate the humidity variation between the bottom and the top of the material stock 300. Therefore, in summary, the analog signals Sa1 to SaN can represent at least one of the level signal, the temperature signal, the humidity signal, and the like.

Each of the simulation modules 321 to 32N may further include a plurality of second controllable switches 42, and each of the second controllable switches 42 is respectively connected in series with the serial ends of the temperature sensor 36 string, the heater 38 string and the humidity sensor 40 string, and selectively turns on or off the coupling relationship between the serial ends of the temperature sensor 36 string, the heater 38 string and the humidity sensor 40 string and the test ports 2-1 to 2-N. When the analog test of temperature, humidity or level is not required, the corresponding second controllable switch 42 may be turned off manually or under the control of the management device 200 (the analog test of level may be performed by turning off all the switches SW) so as to avoid being affected by the test ports 2-1 to 2-N (for example, but not limited to, a possible signal transmission error, or a signal transmission error, etc.) during the test of the signal transmission status of the analog test device 100. The first controllable switches SW1 to SW8 and the second controllable switch 42 may be a combination of a conventional Relay (Relay) output control, a transistor (PNP/NPN) output control, and a coaxial switch (SPDT/DPDT) control.

It should be noted that in an embodiment of the present invention, each of the simulation modules 321 to 32N may further include an expansion module 44. Specifically, since the material stock 300 is large and small in practical application, the heights of the material stock are different, so the lengths of the sensing lines 12 are different, and the included sensing units 122 are also different. The number of the capacitor set 34, the temperature sensor 36, the heater 38 and the humidity sensor 40 can be expanded by the expansion module 44 to adjust the number of the above components according to the different lengths of the sensing lines 12.

In summary, the present invention utilizes the common board concept to design similar functional circuits on a single analog test device 100, which can be 6, 8 or more integrated on a single board according to the complexity of the circuit. When a user needs to make multiple online connections, only one board or a plurality of board combinations are needed to test various online functions (such as but not limited to RS-485, 232 or 4G, 5G, NBIoT and other multi-machine integrated system communication online). Therefore, the integrated system can be applied to integrated building water meters, various functional design tests, industrial 4.0 precision machining machines, program simulation tests of partial instrument control integrated systems, warehouse temperature monitoring and the like, and hundreds of sensor communication program design tests are used. Greatly shortens the development time of the product and improves the quality of the product.

When the manufacturer needs to provide the product for the customer to test, the manufacturer only needs to provide the product for the customer to test online by the male board. If the function meets the requirement of the customer, the purchasing can be performed, and the condition that the two parties communicate inconveniently when a large number of products are purchased for online testing in the past and a problem occurs is avoided. Therefore, the simulation test apparatus 100 of the present invention has functionality, innovation and novelty for development and test of various industrial automation programming.

However, the above detailed description and drawings of the preferred embodiments of the present invention are merely illustrative, and the present invention is not limited thereto, but rather, the scope of the present invention is defined by the following claims, and all embodiments falling within the spirit and scope of the present invention and similar variations are included in the scope of the present invention, and any variations or modifications easily recognized by those skilled in the art are included in the scope of the present invention.

Of course, the present invention is capable of other various embodiments and its several details are capable of modification and variation in light of the present invention by one skilled in the art without departing from the spirit and scope of the invention as defined in the appended claims.

Claims (10)

1. An analog testing device for testing a signal transmission condition of a plurality of sensors, comprising:

a plurality of test ports, correspondingly coupled to a control device of the sensor;

the simulation device is coupled with the test port and provides a plurality of simulation signals to the corresponding test port, so that the control device correspondingly provides a plurality of transmission signals based on the simulation signals;

the communication port is coupled with the test port and a management device, and the control device is communicated with the management device through the communication port so that the management device can know the signal transmission condition of the control device; and

The power supply module is used for supplying power to the analog testing device and selectively supplying power by a battery or an external power supply;

the analog signal simulates a signal received by the sensor during actual operation.

2. The simulation test apparatus according to claim 1, further comprising:

and the expansion port is coupled with the communication port of the other simulation test device to form a serial simulation test system with the management equipment.

3. The simulation test apparatus according to claim 1, further comprising:

an encrypting/decrypting device coupled to the test port and encrypting/decrypting the transmission signal and the signal provided by the management device; the encryption/decryption device uses a non-plain code as the encryption/decryption device, and the encryption/decryption device is selected from at least one of HEX hexadecimal code, hash function, symmetric key and asymmetric key.

4. The simulation test apparatus according to claim 1, further comprising:

the controllable switches are coupled with the test ports and can selectively define the coupling relation between the on/off test ports and the communication ports in advance;

wherein the switch is at least one selected from a relay, a transistor and a coaxial switch.

5. The analog testing device of claim 1, wherein the sensor is a wired sensor and the control device of the sensor is coupled to the test port by a wired connection; or the sensor is a wireless sensor, and the control device of the sensor is coupled with the test port in a wireless transmission mode; alternatively, the sensor is a wired sensor or a wireless sensor.

6. The simulation test apparatus according to claim 1, wherein the control device of the sensor is used for sensing a material flow condition, and the simulation signal provided by the simulation device simulates a flow velocity of the material flow, a total flow rate of the material flow and/or a direction of the material flow, and simulates the material flow by a pulse signal with a specific frequency; the material flow is a flow of solid particles, liquid or gas.

7. The simulation test apparatus according to claim 1, wherein the control device of the sensor is applied to sense a condition of the stock of material, and the simulation apparatus comprises:

the plurality of analog modules are correspondingly coupled with the test ports to respectively and correspondingly provide the analog signals to the corresponding test ports.

8. The analog testing device of claim 7, wherein each analog module comprises:

a capacitor bank comprising:

the capacitive control modules are coupled in parallel and comprise a capacitor and a switch which are connected in series;

each simulation module controls the on/off of the switch of the capacitance control module to adjust the capacitance value so as to simulate the material level signal of the material stock through the change of the capacitance value.

9. The analog testing device of claim 7, wherein each analog module comprises:

a plurality of temperature sensors coupled in series with each other; and

A plurality of heaters coupled in series with each other;

each simulation module controls the heater to heat, and influences the ambient temperature around the temperature sensor through the heating of the heater, and the temperature sensor respectively senses the ambient temperature to simulate the temperature signal of the material stock.

10. The analog testing device of claim 7, wherein each analog module comprises:

a plurality of humidity sensors coupled in series with each other;

each simulation module simulates a humidity signal of the stock of materials by adjusting a humidity parameter value of the humidity sensor.