CN1172359C - Pre-burning controller of integrated circuit - Google Patents
Pre-burning controller of integrated circuit Download PDFInfo
- Publication number
- CN1172359C CN1172359C CNB00133767XA CN00133767A CN1172359C CN 1172359 C CN1172359 C CN 1172359C CN B00133767X A CNB00133767X A CN B00133767XA CN 00133767 A CN00133767 A CN 00133767A CN 1172359 C CN1172359 C CN 1172359C
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- unit testing
- plate
- test sample
- tested
- sample book
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Abstract
The present invention relates to a calcination control device for an integrated circuit, which comprises a plurality of unit testing plates and a region distributing plate, wherein each unit testing plate comprises a testing sample generator and a die set which is to be tested, and the testing sample generator is used for generating a testing sample to the die set which is to be tested to determine whether a plurality of integrated circuits in the die set which is to be tested are effective or not; the region distributing plate is used for controlling the action of the testing sample generator in at least one unit testing plate and receiving testing results of the unit testing plate. The testing sample generator of each testing plate in the calcination control device can independently act, and the testing sample of each testing plate has the advantages of high generating speed and high random signal resistant capacity.
Description
Technical field
The present invention relates to a kind of device in order to the control integrated circuit quality, particularly a kind of before the integrated circuit shipment pre-burning controller of the integrated circuit of control integrated circuit quality, it is a kind of device that utilizes distributed control mode to reach quick pre-burning.
Background technology
The quality management control stage of integrated circuit (IC) before shipment, need through one section pre-burning (burn in) operation, this pre-burning operation is that the not good product of reliability (reliability) detects in advance after utilizing modes such as high temperature, high pressure or high humility to dispatch from the factory, and eliminated, to exempt in the future unnecessary cost recovery.Fig. 1 is the pre-burning controller of existing integrated circuit, this device is to utilize one will shared test sample book to deliver to several interior test boards 13 of a pre-burning stove 12 by the test sample book generator 11 of central authorities control (centralized control), and there is following shortcoming in this existing apparatus:
1, the test board far away apart from this test sample book generator 11, its time that receives test sample book will that is to say that each test board receives the time of test sample book with inconsistent greater than the time of reception of the nearer test board of distance test sample generator 11;
2, because all test boards all are connected to test sample book generator 11, and cause test sample book generator 11, that is to say that therefore the speed of test sample book generator 11 output test sample books will be restricted in the face of very heavy output loading.
3, test sample book generator 11 also may utilize several cables and be connected to several test boards 13, but such result will cause cable too much, and is difficult to management.
Summary of the invention
Purpose of the present invention with the pre-burning controller of the fast integrated circuit of the output speed that a kind of test sample book is provided.
For achieving the above object, the present invention takes following technical measures:
The pre-burning controller of integrated circuit of the present invention is a kind of distributing pre-burning controller, mainly be that the test sample book generator is arranged in each test board dispersedly, and the test sample book generator of each test board can be operated independently, therefore, the output speed of the test sample book of each test board can be accelerated, and can improve the ability of anti-assorted letter; Relatively, the test volume of its unit interval just can improve.In addition, device of the present invention has modular function, and promptly arbitrary test board is damaged the operation that can't influence other test board; And maintenance work is very convenient, when any test board is damaged, only must plug the test board of this damage.And each test board can must not add complicated artificial setting again according to its numbering of inserting its device of determining positions of pre-burning stove.
The present invention takes following concrete structure:
The pre-burning controller of integrated circuit of the present invention comprises: several unit testing plates; Also comprise a region allocation plate;
Each unit testing plate comprises a test sample book generator and a module to be tested; Whether the test sample book generator is used to produce test sample book effective with several integrated circuits to be measured that determine module to be tested to include to this module to be tested;
The region allocation plate is used for controlling the operation of the test sample book generator of at least one unit testing plate, and receives the test result of this unit testing plate.
Wherein, comprise that also one is used to analyze the described unit testing board test result's that described region allocation plate receives computer.
Wherein, described several unit testing plates connect in the mode of daisy chain each other, one of described region allocation plate output is used to show first unit testing plate that is tagged to daisy chain by which unit testing plate region of acceptance distribution plate control, first unit testing plate of daisy chain then compares when receiving this mark, and relatively this marks whether to be zero; If answer is sure, the then indication of the control signal that transmits of region of acceptance distribution plate; If answer is negated then this mark to be subtracted one, and reach the next unit testing plate of this daisy chain; The rest may be inferred, will have at least a meeting in several unit testing plates and receive that the value of including is zero mark.
Wherein, described unit testing plate also comprises:
One drive circuit, described test sample book generator is located in the drive circuit, and described module to be tested is connected with drive circuit.
Wherein, described drive circuit also comprises: a voltage conversion device and a signal stiffening device;
Voltage conversion device connects described module to be tested, test sample book generator and described signal stiffening device respectively;
The signal stiffening device is connected to module to be tested and test sample book generator, is used to strengthen the signal input of unit testing plate, and the output signal of picking up module to be tested.
This distributing pre-burning controller comprises a plurality of unit testing plates and a region allocation plate.These a plurality of unit testing plates are positioned at this pre-burning stove, and these a plurality of unit testing plates all respectively comprise a test sample book generator, and whether this test sample book generator can produce test sample book effective for a plurality of integrated circuits that this unit testing plate determines its module to be tested to include.This region allocation plate is used for controlling the operation of the test sample book generator of this unit testing plate, and receives the test result of this unit testing plate.
Description of drawings
Reaching embodiment in conjunction with the accompanying drawings is described in detail as follows architectural feature of the present invention:
Description of drawings:
Fig. 1: the connection diagram of existing pre-burning controller;
Fig. 2: the circuit block diagram of an embodiment of the pre-burning controller of integrated circuit of the present invention;
Fig. 3: the circuit block diagram of another embodiment of the pre-burning controller of integrated circuit of the present invention;
Fig. 4: the circuit block diagram of unit testing plate during the present invention is embodiment illustrated in fig. 2.
Embodiment
As shown in Figure 2, it is the circuit block diagram of an embodiment of the pre-burning controller of integrated circuit of the present invention; Wherein, a computer 14 (adopting PC in the present embodiment) connects a region allocation plate (ZONE board) 22, and region allocation plate 22 is connected to several unit testing plates 24 in the pre-burning stove 12; This computer 14 is used to analyze the state or the test result of several unit testing plates 24, and whether position or direction that several integrated circuits that include as analytic unit test board 24 are placed be correct.This operation is called pre-burning and monitors (monitor burn in).Region allocation plate 22 is used for initially (initiate) and controls the operation of these several unit testing plates 24, and the state or the test result of these several unit testing plates 24 transferred to this PC 14.Region allocation plate 22 is because of only being responsible for very simple operation, and therefore, its output delay is very little, and can not influence the operating rate of whole pre-burning controller.
As shown in Figure 3, it is the circuit block diagram of another embodiment of the pre-burning controller of integrated circuit of the present invention; Wherein, several unit testing plates 24 link to each other in the mode of daisy chain (daisy chain) each other.When region allocation plate 22 controls signal to several unit testing plates 24 one of output, send a mark (token) first unit testing plate 24 simultaneously to this daisy chain; This mark is used for showing by which unit testing plate 24 receives this control signal, and accepts the control of this region allocation plate 22.First unit testing plate 24 of this daisy chain is when receiving this mark, and then relatively this marks whether to be zero.If answer is sure, then accept the indication of the control signal that this region allocation plate 22 transmits.As if answer negate, then this mark is subtracted one, and reach the next unit testing plate 24 of this daisy chain, the rest may be inferred.To only have a meeting to receive that the value of including is zero mark in these several unit testing plates 24, and this unit testing plate 24 also is this region allocation plate 22 and control.The connected mode of this kind daisy chain has individual benefit, be that any unit testing plate 24 can be via inserting in arbitrary position of this daisy chain and detected its numbering in this daisy chain automatically, if this daisy chain is in the position of pre-burning stove 12 and ordering in proper order then also can detect the numbering of arbitrary unit testing plate 24 in pre-burning stove 12 automatically according to several unit testing plates 24.
As shown in Figure 4, it is the circuit block diagram of the present invention's middle unit testing plate embodiment illustrated in fig. 2, and wherein, unit testing plate 24 comprises a module 32 to be tested and a drive circuit 33; Module 32 to be tested comprises several integrated circuits to be measured (scheming not shown), places under the high temperature, and has several connectors can be connected to drive circuit 33, and drive circuit 33 is positioned under the normal temperature, and is used to produce test sample book.Drive circuit 33 comprises a voltage conversion device 34, a test sample book generator 35 and a signal stiffening device 36.Voltage conversion device 34 can provide the voltage of unit testing plate 24 different demands.Test sample book generator 35 is used to produce the array test sample book, and via the driving force of signal stiffening device 36 with the reinforcement test sample book.Signal stiffening device 36 and the output signal that can pick up module 32 to be tested, and by region allocation plate 22, deliver to computer 14 and make signal processing.Because unit testing plate 24 all has independently test sample book generator 35, so unit testing plate 24 can be carried out different test sample books according to different demands.Because of test sample book generator 35 all is present in the unit testing plate 24 in distributed mode, therefore, can a factor unit testing plate load of 24 accumulations excessive and reduce the generation speed of pre-burning controller test sample book.
Compared with prior art, the present invention has following effect:
Integrated circuit pre-burning controller of the present invention possesses modular function, and is therefore, all comparatively convenient on maintenance and error detecing capability.In addition, pre-burning controller of the present invention has good isolation (isolation) effect, for example one of them unit testing plate 24 has damaged, can't influence the running of other unit testing plate 24, and, unit testing plate 24 is only linked up with region allocation plate 22, therefore need not connect the complicated cable line, has also therefore reduced the delay issue that is produced by cable.The present invention also can be designed to have concurrently the structure of centralized pre-burning control and distributing pre-burning controlled function, the user can need and switching use wide area pattern (globalmode) according to system, it is the function that centralized pre-burning is controlled, or region mode (local mode), the function of promptly distributed pre-burning control.
Foregoing is to utilize embodiment that technical characterictic of the present invention is described, is not to be used to limit protection scope of the present invention, even there is the people to change slightly on the basis of the present invention's design, must belong in protection scope of the present invention.
Claims (5)
1, a kind of pre-burning controller of integrated circuit comprises: several unit testing plates; It is characterized in that, also comprise a region allocation plate;
Each unit testing plate comprises a test sample book generator and a module to be tested; Whether the test sample book generator is used to produce test sample book effective with several integrated circuits to be measured that determine module to be tested to include to this module to be tested;
The region allocation plate is used for controlling the operation of the test sample book generator of at least one unit testing plate, and receives the test result of this unit testing plate.
2, pre-burning controller according to claim 1 is characterized in that, comprises that also one is used to analyze the described unit testing board test result's that described region allocation plate receives computer.
3, pre-burning controller according to claim 1, it is characterized in that, described several unit testing plates connect in the mode of daisy chain each other, one of described region allocation plate output is used to show first unit testing plate that is tagged to daisy chain by which unit testing plate region of acceptance distribution plate control, first unit testing plate of daisy chain then compares when receiving this mark, and relatively this marks whether to be zero; If answer is sure, the then indication of the control signal that transmits of region of acceptance distribution plate; If answer is negated then this mark to be subtracted one, and reach the next unit testing plate of this daisy chain; The rest may be inferred, will have at least a meeting in several unit testing plates and receive that the value of including is zero mark.
According to claim 1 or 2 or 3 described pre-burning controllers, it is characterized in that 4, described unit testing plate also comprises:
One drive circuit, described test sample book generator is located in the drive circuit, and described module to be tested is connected with drive circuit.
5, pre-burning controller according to claim 4 is characterized in that, described drive circuit also comprises: a voltage conversion device and a signal stiffening device;
Voltage conversion device connects described module to be tested, test sample book generator and described signal stiffening device respectively;
The signal stiffening device is connected to module to be tested and test sample book generator, is used to strengthen the signal input of unit testing plate, and the output signal of picking up module to be tested.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB00133767XA CN1172359C (en) | 2000-10-31 | 2000-10-31 | Pre-burning controller of integrated circuit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB00133767XA CN1172359C (en) | 2000-10-31 | 2000-10-31 | Pre-burning controller of integrated circuit |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN1351372A CN1351372A (en) | 2002-05-29 |
| CN1172359C true CN1172359C (en) | 2004-10-20 |
Family
ID=4595922
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CNB00133767XA Expired - Lifetime CN1172359C (en) | 2000-10-31 | 2000-10-31 | Pre-burning controller of integrated circuit |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN1172359C (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6815966B1 (en) * | 2002-06-27 | 2004-11-09 | Aehr Test Systems | System for burn-in testing of electronic devices |
| DE10326317B4 (en) * | 2003-06-11 | 2007-05-10 | Infineon Technologies Ag | Test system for testing integrated components |
-
2000
- 2000-10-31 CN CNB00133767XA patent/CN1172359C/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| CN1351372A (en) | 2002-05-29 |
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Granted publication date: 20041020 |