CN117192196A - Circuit-mounted double-motor voltage measuring method - Google Patents
Circuit-mounted double-motor voltage measuring method Download PDFInfo
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Abstract
Embodiments of the present application provide a line-mounted dual-voltage electrical measurement method, apparatus, system, computer device, storage medium, and computer program product. The method comprises the following steps: under the condition that line voltage measurement is carried out on a target line based on the dual-voltage circuit, acquiring a plurality of power parameters of the dual-voltage circuit, and acquiring line voltage measurement values of the target line based on the plurality of power parameters; acquiring target power parameter sensitivity corresponding to the line voltage measured value; acquiring first dependency information of target power parameter sensitivity and hardware parameters of a dual-voltage circuit; and adjusting hardware parameters according to the first dependency information to obtain an adjusted dual-voltage circuit, and measuring the line voltage of the target line based on the adjusted dual-voltage circuit. In the method, the error between the line voltage measured value and the line voltage true value of the target line can be reduced, and the accuracy of voltage measurement is improved.
Description
Technical Field
The present application relates to the field of power monitoring technology, and in particular, to a line-mounted dual-voltage power measurement method, device, system, computer apparatus, storage medium, and computer program product.
Background
With the large-scale expansion of Internet engineering in each area and the large-scale grid connection of various distributed power supplies in China, the world very large-scale complex power grid with a countable yield is formed in China, and massive electric quantity monitoring equipment is urgently required to ensure the normal work of the power grid.
Currently, voltage measurement is generally performed mainly based on a single-phase line single-machine voltage measurement model. However, under different working conditions, the capacitance of the polar plate to the ground is different, and the value of the capacitance to the ground is difficult to realize measurement through an instrument, so that a single-machine measurement scheme cannot be directly applied to measurement of voltage under the variable working conditions, and the method has the problems of application limitation and low universality; in addition, when the power parameter fluctuates slightly, for example, there is a slight error between the measured value and the true value of the power parameter, which may cause an error in the amplification factor of the line voltage measured value, resulting in a problem of low measurement accuracy.
Disclosure of Invention
In view of the foregoing, it is desirable to provide a line-mounted dual-voltage electrical measurement method, apparatus, system, computer device, storage medium, and computer program product.
In a first aspect, the present application provides a line-mounted dual-voltage electrical measurement method. The method comprises the following steps:
under the condition that line voltage measurement is carried out on a target line based on a dual-voltage circuit, acquiring a plurality of power parameters of the dual-voltage circuit, and acquiring line voltage measurement values of the target line based on the plurality of power parameters;
acquiring target power parameter sensitivity corresponding to the line voltage measured value;
acquiring first dependency information of the sensitivity of the target power parameter and the hardware parameter of the dual-voltage circuit;
and adjusting the hardware parameters according to the first dependency information to obtain an adjusted dual-voltage circuit, and measuring the line voltage of the target line based on the adjusted dual-voltage circuit.
In one embodiment, the obtaining the target power parameter sensitivity corresponding to the line voltage measurement value includes: acquiring power parameter sensitivity of the line voltage measurement value to each of the power parameters; and acquiring target power parameter sensitivity from the plurality of power parameter sensitivities of the line voltage measured value according to a preset condition.
In one embodiment, the acquiring the line voltage measurement power parameter sensitivity to each of the power parameters includes: obtaining error values of measured values and true values of the power parameters; and obtaining the sensitivity of the power parameter based on the ratio of the error value to the line voltage measurement value.
In one embodiment, the deriving the power parameter sensitivity based on a ratio of the error value and the line voltage measurement includes: obtaining the deviation of the line voltage measured value on each electric power parameter; acquiring a relative error value of each electric power parameter; and obtaining the product of the ratio and the partial derivative, and determining the difference value between the product of the ratio and the partial derivative and the relative error value as the power parameter sensitivity.
In one embodiment, the obtaining the first dependency information of the target power parameter sensitivity and the hardware parameter of the dual-voltage circuit includes: acquiring a plurality of target power parameters contained in the target power parameter sensitivity; determining second dependency information of each target power parameter and the hardware parameter; and acquiring the first dependency information according to the second dependency information and the target power parameter sensitivity.
In one embodiment, the obtaining line voltage measurements of the target line based on the plurality of power parameters includes: acquiring a left side measurement circuit voltage and a right side measurement circuit voltage of the dual-voltage circuit based on the plurality of power parameters; the line voltage measurement is obtained based on the left side measurement circuit voltage and the right side measurement circuit voltage.
In a second aspect, the present application provides a line-mounted dual electro-mechanical measurement device. The device comprises:
the acquisition module is used for acquiring a plurality of electric power parameters of the dual-voltage circuit and acquiring line voltage measured values of the target line based on the plurality of electric power parameters under the condition that the line voltage of the target line is measured based on the dual-voltage circuit;
the first calculation module is used for obtaining the sensitivity of the target power parameter corresponding to the line voltage measured value;
the second calculation module is used for acquiring first dependency relationship information of the sensitivity of the target power parameter and the hardware parameter of the dual-voltage circuit;
and the adjusting module is used for adjusting the hardware parameters according to the first dependency information to obtain an adjusted dual-voltage circuit, and measuring the line voltage of the target line based on the adjusted dual-voltage circuit.
In a third aspect, the present application also provides a computer device. The computer device comprises a memory storing a computer program and a processor which when executing the computer program performs the steps of:
under the condition that line voltage measurement is carried out on a target line based on a dual-voltage circuit, acquiring a plurality of power parameters of the dual-voltage circuit, and acquiring line voltage measurement values of the target line based on the plurality of power parameters;
acquiring target power parameter sensitivity corresponding to the line voltage measured value;
acquiring first dependency information of the sensitivity of the target power parameter and the hardware parameter of the dual-voltage circuit;
and adjusting the hardware parameters according to the first dependency information to obtain an adjusted dual-voltage circuit, and measuring the line voltage of the target line based on the adjusted dual-voltage circuit.
In a fourth aspect, the present application also provides a computer-readable storage medium. The computer readable storage medium having stored thereon a computer program which when executed by a processor performs the steps of:
Under the condition that line voltage measurement is carried out on a target line based on a dual-voltage circuit, acquiring a plurality of power parameters of the dual-voltage circuit, and acquiring line voltage measurement values of the target line based on the plurality of power parameters;
acquiring target power parameter sensitivity corresponding to the line voltage measured value;
acquiring first dependency information of the sensitivity of the target power parameter and the hardware parameter of the dual-voltage circuit;
and adjusting the hardware parameters according to the first dependency information to obtain an adjusted dual-voltage circuit, and measuring the line voltage of the target line based on the adjusted dual-voltage circuit.
In a fifth aspect, the present application also provides a computer program product. The computer program product comprises a computer program which, when executed by a processor, implements the steps of:
under the condition that line voltage measurement is carried out on a target line based on a dual-voltage circuit, acquiring a plurality of power parameters of the dual-voltage circuit, and acquiring line voltage measurement values of the target line based on the plurality of power parameters;
acquiring target power parameter sensitivity corresponding to the line voltage measured value;
Acquiring first dependency information of the sensitivity of the target power parameter and the hardware parameter of the dual-voltage circuit;
and adjusting the hardware parameters according to the first dependency information to obtain an adjusted dual-voltage circuit, and measuring the line voltage of the target line based on the adjusted dual-voltage circuit.
In the above-mentioned line-mounted dual-voltage measurement method, apparatus, system, computer device, storage medium and computer program product, a dual-phase line dual-voltage circuit may be introduced into a power grid to measure a voltage of a target line in the power grid, and in the case of line voltage measurement of the target line based on the dual-phase voltage circuit, a plurality of power parameters (for example, equivalent capacitance, plate-to-ground capacitance, input resistance, etc.) of the dual-phase voltage circuit are obtained, and a line voltage measurement value of the target line is obtained based on the plurality of power parameters; next, power parameter sensitivities of the line voltage measurements to respective power parameters may be obtained, and a target power parameter sensitivity is determined therefrom as an adjustment factor; therefore, the first dependency relationship information of the sensitivity of the target power parameter and the hardware parameter of the dual-voltage circuit can be obtained; furthermore, according to the first dependency information, the sensitivity of the target power parameter is adjusted by adjusting the hardware parameter, so as to reduce the error between the measured line voltage value and the true line voltage value of the target line. In the line-mounted double-voltage measurement method provided by the embodiment of the application, on one hand, the method for measuring the voltage of the target line in the power grid by the double-circuit double-voltage circuit of the double-circuit line is provided, the limitation of the single-circuit voltage circuit in voltage measurement can be solved, furthermore, the sensitivity of the target power parameter can be adjusted by adjusting the hardware parameter according to the first dependency information, the error between the line voltage measured value and the line voltage true value of the target line is reduced, and the accuracy of the voltage measurement is improved.
Drawings
FIG. 1 is a schematic flow chart of a circuit-mounted dual-machine voltage measurement method according to an embodiment;
FIG. 2 is a circuit block diagram of a dual machine voltage circuit provided by one embodiment;
FIG. 3 is a schematic diagram of first dependency information according to one embodiment;
FIG. 4 is a block diagram of a circuit-mounted dual-motor voltage measurement device according to one embodiment;
fig. 5 is an internal structural diagram of a computer device according to an embodiment.
Detailed Description
The present application will be described in further detail with reference to the drawings and examples, in order to make the objects, technical solutions and advantages of the present application more apparent. It should be understood that the specific embodiments described herein are for purposes of illustration only and are not intended to limit the scope of the application. In one embodiment, as shown in fig. 1, a line-mounted dual-voltage measurement method is provided, where this embodiment is applied to a server for illustration, and it is understood that the method may also be applied to a terminal, and may also be applied to a system including a terminal and a server, and implemented through interaction between the terminal and the server. In this embodiment, the method includes the steps of:
Step S101, when the line voltage measurement is performed on the target line based on the dual voltage circuit, a plurality of power parameters of the dual voltage circuit are obtained, and the line voltage measurement value of the target line is obtained based on the plurality of power parameters.
In some possible implementations, line voltage in the power grid may be measured by a two-phase line two-machine voltage circuit (referred to as a two-machine voltage circuit), for example, a voltage measurement of a target line. As shown in fig. 2, the bipolar circuit comprises two plates, which may be cylindrical, a first cylindrical plate and a second cylindrical plate, respectively, and the lengths of the two cylindrical plates are the same, and further, the capacitances to ground of the two cylindrical plates are equal. It should be appreciated that spacing the first cylindrical electrode plate and the second cylindrical electrode plate by a certain distance may reduce a mutual capacitance between the first cylindrical electrode plate and the second cylindrical electrode plate, so that the left and right portions of the dual-machine voltage circuit may be regarded as two measurement circuits independent of each other, namely, a first measurement circuit corresponding to the first cylindrical electrode plate and a second measurement circuit corresponding to the second cylindrical electrode plate, where the first measurement circuit may utilize a trans-group op amp to perform signal acquisition, and the second measurement circuit may utilize an inverting amplifier circuit to perform signal acquisition. The target line may be any section of circuit in the power grid, and may be a line to be measured. The multiple power parameters of the dual voltage circuit may be parameters such as capacitance, resistance, etc. in the dual voltage circuit, for example, capacitance to ground, sampling resistance, and safety capacitance, etc. The line voltage measurement may be a measured voltage value of the target line based on a two-motor voltage measurement. The line voltage measurement can be calculated by the following formula (1):
Wherein u is 1 A first output voltage that is a first measured voltage; u (u) 2 A second output voltage that is a second measurement voltage; r is R f The sampling resistor is used for the dual-machine voltage circuit; c (C) f The safety capacitor is used for the dual-voltage circuit; c (C) 1 Equivalent capacitance between the target line and the pole plate of the dual-voltage circuit; omega is the angular frequency of the signal to be measured acquired by the double-motor circuit.
Step S102, obtaining the sensitivity of the target power parameter corresponding to the line voltage measured value.
The line voltage measurement value of the target line is calculated based on each power parameter of the dual-voltage circuit, so that when each power parameter slightly fluctuates, for example, a first error exists between the measurement value and the true value of each power parameter, a corresponding second error may occur in the line voltage measurement value. The relationship of the second error and the first error can be described by the following formula (2):
taking the power parameter as the first output voltage of the first measurement circuit as an example, deltau 1 A first error that may be the first output voltage;may be a partial derivative of the line voltage measurement to the first output voltage, and may be used to characterize a rate of change of the line voltage measurement as the first output voltage changes; ΔU may be a second error that results in the line voltage measurement in the presence of a first error in the first output voltage. In addition, +. >Can be calculated based on the following formula (3):
in some possible implementations, this is the case in equation (3)Can be equivalent to C x Thus, it is->It can also be calculated based on the following formula (4):
wherein C is x The capacitor can be the electrode plate grounding capacitor of the dual-machine voltage circuit.
Further, the relative error of the first output voltage can be calculated by the following equation (5):
Δu 1 ＝u 1 ·r (5)
where r may be the relative error of the first output voltage.
Thus, the sensitivity of the line voltage measurement to the power parameter of the first output voltage can be represented by the following equation (6):
wherein,the sensitivity of the line voltage measurement to the power parameter of the first output voltage may be used to characterize the relative error of the line voltage measurement as being amplified when the relative error of the first output voltage is r.
In summary, the power parameter sensitivity of the line voltage measurement to each power parameter can be sequentially obtained according to the methods from the formula (1) to the formula (5). The target power parameter sensitivity may be any one of a plurality of power parameter sensitivities corresponding to the line voltage measurements.
Equation (7) above may represent the power parameter sensitivity of the line voltage measurement to the second output voltage; equation (8) may represent the sensitivity of the line voltage measurement to the power parameters of the safety capacitor; equation (9) may represent the sensitivity of the line voltage measurement to the power parameter of the equivalent capacitance; equation (10) may represent the sensitivity of the line voltage measurement to the power parameter of the sampling resistor; equation (11) may represent the power parameter sensitivity of the line voltage measurement to the angular frequency of the signal under test.
Next, a target power parameter sensitivity may be determined from a plurality of power parameter sensitivities corresponding to the line voltage measurements. In some possible implementations, as can be seen from equations (6) through (11) above, the first error of the power parameters ω, rf will not cause the second error in the line voltage measurements, the power parameters Cf, u1, u2, C 1 Will cause a second error in the line voltage measurement and the measured amplification factor anddirect correlation, wherein C f Easy to change, C 1 But is not directly modifiable depending on the size of the coupling mechanism. Although C can be reduced f Reducing the value of (2) thereby reducing the sensitivity of the power parameter, but reducing the value will result in a smaller output amplitude of the second measurement circuit, which is detrimental to waveform sampling, and the lower limit of the sensitivity of the power parameter is still +.>The key to reduce the sensitivity of the power parameter is to reduce +.>Since it is only related to the size of the coupling mechanism, the primary measure to reduce the power parameter sensitivity is to select the appropriate plate size, whereby the target power parameter sensitivity can be determined as the power parameter sensitivity of the line voltage measurement to the equivalent capacitance.
Step S103, obtaining first dependency information of the sensitivity of the target power parameter and the hardware parameter of the dual-voltage circuit.
Taking the target power parameter sensitivity as the power parameter sensitivity of the line voltage measurement to the equivalent capacitanceAn example is described. The target power parameter sensitivity includes two power parameters C 1 And C x Thus, it can be based on C 1 And C x And obtaining first dependency relationship information of the target power parameter sensitivity and the hardware parameters of the dual-voltage circuit according to the dependency relationship of the hardware parameters of the dual-voltage circuit. C (C) 1 The dependence relationship with the hardware parameters of the dual-voltage circuit can be calculated by the following formula (12), C x The dependence relationship with the hardware parameter of the dual-voltage circuit can be calculated by the following formula (13):
wherein L is the length of the coupling polar plate, R is the line radius, and R is the radius of the cylindrical polar plate. Based on
Equations (12) and (13) may yield first dependency information of the target power parameter sensitivity and the hardware parameters of the dual-voltage circuit, as shown in fig. 3.
Step S104, adjusting hardware parameters according to the first dependency information to obtain an adjusted dual-voltage circuit, and measuring the line voltage of the target line based on the adjusted dual-voltage circuit.
The first dependency information represented by FIG. 3 is available when C 1 /C x As the radius R of the cylindrical plate becomes larger and monotonically decreases, the parameter sensitivity may also monotonically decrease, but as the device size increases, it is observed that C when the radius R of the plate is greater than 50mm 1 /C x For balancing the two constraints of device size and parameter sensitivity, it is preferable to choose a radius r=50 mm of the plate.
In the method of the embodiment, a dual-phase line double-machine voltage circuit can be introduced into a power grid to measure the voltage of a target line in the power grid, and under the condition that the line voltage of the target line is measured based on the double-machine voltage circuit, a plurality of power parameters (such as equivalent capacitance, polar plate capacitance to earth, input resistance and the like) of the double-machine voltage circuit are obtained, and line voltage measurement values of the target line are obtained based on the plurality of power parameters; next, power parameter sensitivities of the line voltage measurements to respective power parameters may be obtained, and a target power parameter sensitivity is determined therefrom as an adjustment factor; therefore, the first dependency relationship information of the sensitivity of the target power parameter and the hardware parameter of the dual-voltage circuit can be obtained; furthermore, according to the first dependency information, the sensitivity of the target power parameter is adjusted by adjusting the hardware parameter, so as to reduce the error between the measured line voltage value and the true line voltage value of the target line. In the line-mounted double-voltage measurement method provided by the embodiment of the application, on one hand, the method for measuring the voltage of the target line in the power grid by the double-circuit double-voltage circuit of the double-circuit line is provided, the limitation of the single-circuit voltage circuit in voltage measurement can be solved, furthermore, the sensitivity of the target power parameter can be adjusted by adjusting the hardware parameter according to the first dependency information, the error between the line voltage measured value and the line voltage true value of the target line is reduced, and the accuracy of the voltage measurement is improved.
In some embodiments, step S102 may include:
acquiring power parameter sensitivity of the line voltage measurement value to each power parameter; and acquiring target power parameter sensitivity from the plurality of power parameter sensitivities of the line voltage measured value according to a preset condition.
Wherein the power parameter sensitivity may be used to characterize the relative error of the line voltage measurement as amplified when the relative error of each power parameter is r. In some possible implementations, the preset condition may be that the first error of the power parameter causes a second error in the line voltage measurement, the second error corresponding to a magnification greater than a preset error threshold, and the line voltage measurement is adjustable in power parameter sensitivity to the power parameter.
Specifically, the line voltage measurement value of the target line is calculated based on each power parameter of the dual voltage circuit, so that in the case that each power parameter slightly fluctuates, for example, there is a first error between the measurement value and the true value of each power parameter, a corresponding second error may occur in the line voltage measurement value. The relationship of the second error and the first error can be described by the following formula (2):
Taking the power parameter as the first output voltage of the first measurement circuit as an example, deltau 1 A first error that may be the first output voltage;may be a partial derivative of the line voltage measurement to the first output voltage, and may be used to characterize a rate of change of the line voltage measurement as the first output voltage changes; ΔU may be a second error that results in the line voltage measurement in the presence of a first error in the first output voltage. In addition, +.>Can be calculated based on the following formula (3):
in some possible implementations, this is the case in equation (3)Can be equivalent to C x Thus, it is->It can also be calculated based on the following formula (4):
wherein C is x The capacitor can be the electrode plate grounding capacitor of the dual-machine voltage circuit.
Further, the relative error of the first output voltage can be calculated by the following equation (5):
Δu 1 ＝u 1 ·r (5)
where r may be the relative error of the first output voltage.
Thus, the sensitivity of the line voltage measurement to the power parameter of the first output voltage can be represented by the following equation (6):
wherein,the sensitivity of the line voltage measurement to the power parameter of the first output voltage may be used to characterize the relative error of the line voltage measurement as being amplified when the relative error of the first output voltage is r.
In summary, the power parameter sensitivity of the line voltage measurement to each power parameter can be sequentially obtained according to the methods from the formula (1) to the formula (5). The target power parameter sensitivity may be any one of a plurality of power parameter sensitivities corresponding to the line voltage measurements.
Equation (7) above may represent the power parameter sensitivity of the line voltage measurement to the second output voltage; equation (8) may represent the sensitivity of the line voltage measurement to the power parameters of the safety capacitor; equation (9) may represent the sensitivity of the line voltage measurement to the power parameter of the equivalent capacitance; equation (10) may represent the sensitivity of the line voltage measurement to the power parameter of the sampling resistor; equation (11) may represent the power parameter sensitivity of the line voltage measurement to the angular frequency of the signal under test.
Next, a target power parameter sensitivity may be determined from a plurality of power parameter sensitivities corresponding to the line voltage measurements. In some possible implementations, as can be seen from equations (6) through (11) above, the first error in the power parameters ω, rf will not cause a second error in the line voltage measurementsDifference, power parameters Cf, u1, u2, C 1 Will cause a second error in the line voltage measurement and the measured amplification factor anddirect correlation, wherein C f Easy to change, C 1 But is not directly modifiable depending on the size of the coupling mechanism. Although C can be reduced f Reducing the value of (2) thereby reducing the sensitivity of the power parameter, but reducing the value will result in a smaller output amplitude of the second measurement circuit, which is detrimental to waveform sampling, and the lower limit of the sensitivity of the power parameter is still +.>The key to reduce the sensitivity of the power parameter is to reduce +.>Since it is only related to the size of the coupling mechanism, the primary measure to reduce the power parameter sensitivity is to select the appropriate plate size, whereby the target power parameter sensitivity can be determined as the power parameter sensitivity of the line voltage measurement to the equivalent capacitance.
In the method of the embodiment, the power parameter sensitivity of the power parameter having a larger influence on the line voltage measured value can be obtained first, so that the error between the line voltage measured value and the line voltage true value of the target line can be reduced conveniently by adjusting the power parameter sensitivity later.
In some embodiments, obtaining the line voltage measurements for power parameter sensitivity of the respective power parameters may include:
Obtaining error values of measured values and true values of all power parameters; and obtaining the sensitivity of the power parameter based on the ratio of the error value and the line voltage measured value.
Specifically, in some embodiments, deriving the power parameter sensitivity based on the ratio of the error value and the line voltage measurement may include:
obtaining the deviation of the line voltage measured value on each power parameter; acquiring the relative error value of each electric power parameter; and obtaining the product of the ratio and the partial derivative, and determining the difference value of the product of the ratio and the partial derivative and the relative error value as the sensitivity of the power parameter.
In the method of the present embodiment, the power parameter sensitivity of the line voltage measurement value to each power parameter may be obtained, and a target power parameter sensitivity may be determined therefrom as the adjustment coefficient; therefore, the first dependency relationship information of the sensitivity of the target power parameter and the hardware parameter of the dual-voltage circuit can be obtained; furthermore, according to the first dependency information, the sensitivity of the target power parameter is adjusted by adjusting the hardware parameter, so as to reduce the error between the measured line voltage value and the true line voltage value of the target line. In the line-mounted double-voltage electric power measuring method provided by the embodiment of the application, the sensitivity of the target electric power parameter can be further adjusted by adjusting the hardware parameter according to the first dependency information, so that the error between the line voltage measured value and the line voltage true value of the target line is reduced, and the accuracy of the voltage measurement is improved.
In some embodiments, step S103 may include:
acquiring a plurality of target power parameters contained in the target power parameter sensitivity; determining second dependency information of each target power parameter and hardware parameter; and acquiring the first dependency information according to the second dependency information and the target power parameter sensitivity.
Taking the target power parameter sensitivity as the power parameter sensitivity of the line voltage measurement to the equivalent capacitanceAn example is described. The target power parameter sensitivity includes two power parameters C 1 And C x Thus, it can be based on C 1 And C x And obtaining first dependency relationship information of the target power parameter sensitivity and the hardware parameters of the dual-voltage circuit according to the dependency relationship of the hardware parameters of the dual-voltage circuit. C (C) 1 The dependency relationship with the hardware parameters of the dual voltage circuit can be calculated by the following formula (12)Obtained, C x The dependence relationship with the hardware parameter of the dual-voltage circuit can be calculated by the following formula (13):
wherein L is the length of the coupling polar plate, R is the line radius, and R is the radius of the cylindrical polar plate. Based on
Equations (12) and (13) may yield first dependency information of the target power parameter sensitivity and the hardware parameters of the dual-voltage circuit, as shown in fig. 3.
In some embodiments, step S101 may include:
acquiring a left side measurement circuit voltage and a right side measurement circuit voltage of the dual-voltage circuit based on a plurality of power parameters; line voltage measurements are obtained based on the left side measured circuit voltage and the right side measured circuit voltage.
In particular, in some possible implementations, line voltage in the power grid may be measured by a two-phase line two-machine voltage circuit (referred to as a two-machine voltage circuit), for example, a voltage measurement of a target line. As shown in fig. 2, the bipolar circuit comprises two plates, which may be cylindrical, a first cylindrical plate and a second cylindrical plate, respectively, and the lengths of the two cylindrical plates are the same, and further, the capacitances to ground of the two cylindrical plates are equal. It should be appreciated that spacing the first cylindrical electrode plate and the second cylindrical electrode plate by a certain distance may reduce a mutual capacitance between the first cylindrical electrode plate and the second cylindrical electrode plate, so that the left and right portions of the dual-machine voltage circuit may be regarded as two measurement circuits independent of each other, namely, a first measurement circuit corresponding to the first cylindrical electrode plate and a second measurement circuit corresponding to the second cylindrical electrode plate, where the first measurement circuit may utilize a trans-group op amp to perform signal acquisition, and the second measurement circuit may utilize an inverting amplifier circuit to perform signal acquisition. The target line may be any section of circuit in the power grid, and may be a line to be measured. The multiple power parameters of the dual voltage circuit may be parameters such as capacitance, resistance, etc. in the dual voltage circuit, for example, capacitance to ground, sampling resistance, and safety capacitance, etc. The line voltage measurement may be a measured voltage value of the target line based on a two-motor voltage measurement. The line voltage measurement can be calculated by the following formula (1):
Wherein u is 1 A first output voltage that is a first measured voltage; u (u) 2 A second output voltage that is a second measurement voltage; r is R f The sampling resistor is used for the dual-machine voltage circuit; c (C) f The safety capacitor is used for the dual-voltage circuit; c (C) 1 Equivalent capacitance between the target line and the pole plate of the dual-voltage circuit; omega is the angular frequency of the signal to be measured acquired by the double-motor circuit.
In the method of the embodiment, a dual-phase line double-machine voltage circuit can be introduced into a power grid to measure the voltage of a target line in the power grid, and under the condition that the line voltage of the target line is measured based on the double-machine voltage circuit, a plurality of power parameters (such as equivalent capacitance, polar plate capacitance to earth, input resistance and the like) of the double-machine voltage circuit are obtained, and line voltage measurement values of the target line are obtained based on the plurality of power parameters; next, power parameter sensitivities of the line voltage measurements to respective power parameters may be obtained, and a target power parameter sensitivity is determined therefrom as an adjustment factor; therefore, the first dependency relationship information of the sensitivity of the target power parameter and the hardware parameter of the dual-voltage circuit can be obtained; furthermore, according to the first dependency information, the sensitivity of the target power parameter is adjusted by adjusting the hardware parameter, so as to reduce the error between the measured line voltage value and the true line voltage value of the target line. In the line-mounted double-voltage measurement method provided by the embodiment of the application, on one hand, the method for measuring the voltage of the target line in the power grid by the double-circuit double-voltage circuit of the double-circuit line is provided, the limitation of the single-circuit voltage circuit in voltage measurement can be solved, furthermore, the sensitivity of the target power parameter can be adjusted by adjusting the hardware parameter according to the first dependency information, the error between the line voltage measured value and the line voltage true value of the target line is reduced, and the accuracy of the voltage measurement is improved.
It should be understood that, although the steps in the flowcharts related to the embodiments described above are sequentially shown as indicated by arrows, these steps are not necessarily sequentially performed in the order indicated by the arrows. The steps are not strictly limited to the order of execution unless explicitly recited herein, and the steps may be executed in other orders. Moreover, at least some of the steps in the flowcharts described in the above embodiments may include a plurality of steps or a plurality of stages, which are not necessarily performed at the same time, but may be performed at different times, and the order of the steps or stages is not necessarily performed sequentially, but may be performed alternately or alternately with at least some of the other steps or stages.
Based on the same inventive concept, the embodiment of the application also provides a line-mounted double-motor voltage measuring device for realizing the line-mounted double-motor voltage measuring method. The implementation of the solution provided by the device is similar to that described in the above method, so the specific limitation in the embodiments of the two-machine voltage measurement device with one or more circuit-mounted devices provided below may be referred to the limitation of the two-machine voltage measurement method with circuit-mounted devices hereinabove, and will not be repeated here.
In one embodiment, as shown in fig. 4, a line-mounted dual-machine voltage measurement apparatus is provided, comprising: an acquisition module 401, a first calculation module 402, a second calculation module 403, and an adjustment module 404, wherein:
an obtaining module 401, configured to obtain a plurality of power parameters of a dual voltage circuit when a line voltage measurement is performed on a target line based on the dual voltage circuit, and obtain a line voltage measurement value of the target line based on the plurality of power parameters;
a first calculation module 402, configured to obtain a target power parameter sensitivity corresponding to the line voltage measurement value;
a second calculation module 403, configured to obtain first dependency information of the target power parameter sensitivity and the hardware parameter of the dual-voltage circuit;
and the adjusting module 404 is configured to adjust the hardware parameter according to the first dependency information, obtain an adjusted dual-voltage circuit, and measure the line voltage of the target line based on the adjusted dual-voltage circuit.
In addition, the first computing module 402 is further configured to: acquiring power parameter sensitivity of the line voltage measurement value to each of the power parameters; and acquiring target power parameter sensitivity from the plurality of power parameter sensitivities of the line voltage measured value according to a preset condition.
The first calculation module 402 is further configured to: obtaining error values of measured values and true values of the power parameters; and obtaining the sensitivity of the power parameter based on the ratio of the error value to the line voltage measurement value.
The first calculation module 402 is further configured to: obtaining the deviation of the line voltage measured value on each electric power parameter; acquiring a relative error value of each electric power parameter; and obtaining the product of the ratio and the partial derivative, and determining the difference value between the product of the ratio and the partial derivative and the relative error value as the power parameter sensitivity.
Further, the second computing module 403 is further configured to: acquiring a plurality of target power parameters contained in the target power parameter sensitivity; determining second dependency information of each target power parameter and the hardware parameter; and acquiring the first dependency information according to the second dependency information and the target power parameter sensitivity.
The obtaining module 401 is further configured to: acquiring a left side measurement circuit voltage and a right side measurement circuit voltage of the dual-voltage circuit based on the plurality of power parameters; the line voltage measurement is obtained based on the left side measurement circuit voltage and the right side measurement circuit voltage.
The above-described respective modules in the line-mounted two-motor voltage measuring device may be implemented in whole or in part by software, hardware, and combinations thereof. The above modules may be embedded in hardware or may be independent of a processor in the computer device, or may be stored in software in a memory in the computer device, so that the processor may call and execute operations corresponding to the above modules.
In one embodiment, a computer device is provided, which may be a server, the internal structure of which may be as shown in fig. 5. The computer device includes a processor, a memory, and a network interface connected by a system bus. Wherein the processor of the computer device is configured to provide computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system, computer programs, and a database. The internal memory provides an environment for the operation of the operating system and computer programs in the non-volatile storage media. The database of the computer device is used to store dual-voltage electrical measurement related data. The network interface of the computer device is used for communicating with an external terminal through a network connection. The computer program, when executed by a processor, implements a line-mounted dual-voltage measurement method.
It will be appreciated by those skilled in the art that the structure shown in FIG. 5 is merely a block diagram of some of the structures associated with the present inventive arrangements and is not limiting of the computer device to which the present inventive arrangements may be applied, and that a particular computer device may include more or fewer components than shown, or may combine some of the components, or have a different arrangement of components.
In an embodiment, there is also provided a computer device comprising a memory and a processor, the memory having stored therein a computer program, the processor implementing the steps of the method embodiments described above when the computer program is executed.
In one embodiment, a computer-readable storage medium is provided, on which a computer program is stored which, when executed by a processor, carries out the steps of the method embodiments described above.
In an embodiment, a computer program product is provided, comprising a computer program which, when executed by a processor, implements the steps of the method embodiments described above.
The user information (including but not limited to user equipment information, user personal information, etc.) and the data (including but not limited to data for analysis, stored data, presented data, etc.) related to the present application are information and data authorized by the user or sufficiently authorized by each party.
Those skilled in the art will appreciate that implementing all or part of the above described methods may be accomplished by way of a computer program stored on a non-transitory computer readable storage medium, which when executed, may comprise the steps of the embodiments of the methods described above. Any reference to memory, database, or other medium used in embodiments provided herein may include at least one of non-volatile and volatile memory. The nonvolatile Memory may include Read-Only Memory (ROM), magnetic tape, floppy disk, flash Memory, optical Memory, high density embedded nonvolatile Memory, resistive random access Memory (ReRAM), magnetic random access Memory (Magnetoresistive Random Access Memory, MRAM), ferroelectric Memory (Ferroelectric Random Access Memory, FRAM), phase change Memory (Phase Change Memory, PCM), graphene Memory, and the like. Volatile memory can include random access memory (Random Access Memory, RAM) or external cache memory, and the like. By way of illustration, and not limitation, RAM can be in the form of a variety of forms, such as static random access memory (Static Random Access Memory, SRAM) or dynamic random access memory (Dynamic Random Access Memory, DRAM), and the like. The databases referred to in the embodiments provided herein may include at least one of a relational database and a non-relational database. The non-relational database may include, but is not limited to, a blockchain-based distributed database, and the like. The processor referred to in the embodiments provided in the present application may be a general-purpose processor, a central processing unit, a graphics processor, a digital signal processor, a programmable logic unit, a data processing logic unit based on quantum computing, or the like, but is not limited thereto.
The technical features of the above embodiments may be arbitrarily combined, and all possible combinations of the technical features in the above embodiments are not described for brevity of description, however, as long as there is no contradiction between the combinations of the technical features, they should be considered as the scope of the description.
The foregoing examples illustrate only a few embodiments of the application and are described in detail herein without thereby limiting the scope of the application. It should be noted that it will be apparent to those skilled in the art that several variations and modifications can be made without departing from the spirit of the application, which are all within the scope of the application. Accordingly, the scope of the application should be assessed as that of the appended claims.
Claims (10)
1. A method of line-mounted dual-voltage electrical measurement, the method comprising:
under the condition that line voltage measurement is carried out on a target line based on a dual-voltage circuit, acquiring a plurality of power parameters of the dual-voltage circuit, and acquiring line voltage measurement values of the target line based on the plurality of power parameters;
acquiring target power parameter sensitivity corresponding to the line voltage measured value;
Acquiring first dependency information of the sensitivity of the target power parameter and the hardware parameter of the dual-voltage circuit;
and adjusting the hardware parameters according to the first dependency information to obtain an adjusted dual-voltage circuit, and measuring the line voltage of the target line based on the adjusted dual-voltage circuit.
2. The method of claim 1, wherein the obtaining the target power parameter sensitivity for the line voltage measurement comprises:
acquiring power parameter sensitivity of the line voltage measurement value to each of the power parameters;
and acquiring target power parameter sensitivity from the plurality of power parameter sensitivities of the line voltage measured value according to a preset condition.
3. The method of claim 2, wherein said obtaining a power parameter sensitivity of the line voltage measurement to each of the power parameters comprises:
obtaining error values of measured values and true values of the power parameters;
and obtaining the sensitivity of the power parameter based on the ratio of the error value to the line voltage measurement value.
4. A method according to claim 3, wherein said deriving said power parameter sensitivity based on a ratio of said error value and said line voltage measurement comprises:
Obtaining the deviation of the line voltage measured value on each electric power parameter;
acquiring a relative error value of each electric power parameter;
and obtaining the product of the ratio and the partial derivative, and determining the difference value between the product of the ratio and the partial derivative and the relative error value as the power parameter sensitivity.
5. The method of claim 2, wherein the obtaining the first dependency information of the target power parameter sensitivity and the hardware parameter of the dual-voltage circuit comprises:
acquiring a plurality of target power parameters contained in the target power parameter sensitivity;
determining second dependency information of each target power parameter and the hardware parameter;
and acquiring the first dependency information according to the second dependency information and the target power parameter sensitivity.
6. The method of claim 1, wherein the obtaining line voltage measurements for the target line based on the plurality of power parameters comprises:
acquiring a left side measurement circuit voltage and a right side measurement circuit voltage of the dual-voltage circuit based on the plurality of power parameters;
the line voltage measurement is obtained based on the left side measurement circuit voltage and the right side measurement circuit voltage.
7. A line-mounted dual-voltage electrical measurement apparatus, the apparatus comprising:
the acquisition module is used for acquiring a plurality of electric power parameters of the dual-voltage circuit and acquiring line voltage measured values of the target line based on the plurality of electric power parameters under the condition that the line voltage of the target line is measured based on the dual-voltage circuit;
the first calculation module is used for obtaining the sensitivity of the target power parameter corresponding to the line voltage measured value;
the second calculation module is used for acquiring first dependency relationship information of the sensitivity of the target power parameter and the hardware parameter of the dual-voltage circuit;
and the adjusting module is used for adjusting the hardware parameters according to the first dependency information to obtain an adjusted dual-voltage circuit, and measuring the line voltage of the target line based on the adjusted dual-voltage circuit.
8. A computer device comprising a memory and a processor, the memory storing a computer program, characterized in that the processor implements the steps of the method of any of claims 1-6 when the computer program is executed.
9. A computer readable storage medium, on which a computer program is stored, characterized in that the computer program, when being executed by a processor, implements the steps of the method of any of claims 1-6.
10. A computer program product comprising a computer program, characterized in that the computer program, when being executed by a processor, implements the steps of the method according to any of claims 1-6.
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