CN117092501A - Fracture joint voltage test loop for switching device and measuring method - Google Patents
Fracture joint voltage test loop for switching device and measuring method Download PDFInfo
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- 238000012360 testing method Methods 0.000 title claims abstract description 158
- 238000000034 method Methods 0.000 title claims abstract description 13
- 239000003990 capacitor Substances 0.000 claims abstract description 52
- 238000002955 isolation Methods 0.000 claims abstract description 23
- 208000032767 Device breakage Diseases 0.000 claims abstract description 14
- 238000005070 sampling Methods 0.000 claims description 10
- 239000012212 insulator Substances 0.000 claims description 8
- 238000009413 insulation Methods 0.000 description 8
- 238000000691 measurement method Methods 0.000 description 8
- 238000005259 measurement Methods 0.000 description 6
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/327—Testing of circuit interrupters, switches or circuit-breakers
- G01R31/3271—Testing of circuit interrupters, switches or circuit-breakers of high voltage or medium voltage devices
- G01R31/3272—Apparatus, systems or circuits therefor
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- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E60/00—Enabling technologies; Technologies with a potential or indirect contribution to GHG emissions mitigation
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Abstract
The invention relates to the technical field of voltage testing of switching devices, and discloses a fracture joint voltage test loop for a switching device and a measuring method, wherein the test loop comprises the switching device, a surge voltage test system, a direct current voltage test system, test equipment, an isolation capacitor and an external resistor; the high-voltage end of the impulse voltage test system is connected with one end of the isolation capacitor, the other end of the isolation capacitor is connected with the first high-voltage end of the switch device fracture, and the grounding of the impulse voltage test system is grounded; the high-voltage end of the direct-current voltage test system is connected with one end of an external resistor, the other end of the external resistor is connected with a second high-voltage end of a fracture of the switching device, and the grounding of the direct-current voltage test system is grounded; the high-voltage ends at two sides of the testing equipment are correspondingly connected to the first high-voltage end and the second high-voltage end of the fracture of the switching device respectively and are used for collecting impulse voltage and direct-current voltage, so that the effective assessment of the fracture of the switching device is ensured.
Description
Technical Field
The invention relates to the technical field of voltage testing of switching devices, in particular to a fracture joint voltage test loop for a switching device and a measuring method.
Background
The switching device is an indispensable part of a direct current GIS (Gas Insulated Switchgear) product, and the switching device fracture combined voltage test is also a part of a direct current GIS product insulation test. The international large power grid conference D1/B3.57 working group, month 9 of 2021, drafted the technical document cigare 842 on insulation tests of gas insulated dc power transmission systems. The related insulation test of the direct-current GIS product is specified in the technical document CIGRE 842, and the test of the combined voltage of the break of the switching device in the direct-current GIS product is proposed to check the insulation capability of the switching device. The fracture joint voltage test is specified as follows: the fracture of the switch device is in a brake-separating state, two high-voltage ends of the fracture are respectively A and B, and the shell is grounded. The fracture joint voltage test conditions are shown in table 1.
TABLE 1 fracture joint voltage test conditions
Because the fracture joint voltage test relates to two voltage sources of impulse voltage and direct current voltage, the construction and arrangement of a test loop and the measurement method of fracture voltage are core technical problems to be solved urgently.
In the prior art, the assessment of the insulation tolerance capability of the fracture of the switching device in the direct-current GIS product is carried out by adopting a mode of single-ended application of impulse voltage. The test parameters of the fracture joint voltage test of the switching device in the direct-current GIS product are required to be a surge voltage and a direct-current voltage with polarity opposite to that of the surge voltage, and the test parameters of the fracture lightning surge joint voltage test of the switching device in the 550kV direct-current GIS product are shown in Table 2.
Table 2 fracture lightning impulse combined voltage test parameters
In the prior art, an independent impulse voltage is applied to perform the examination, and a fracture lightning impulse combined voltage test of a switching device in a 550kV direct-current GIS product is taken as an example, namely, an impulse voltage of 2225kV (1675 kV+550kV) is applied to perform the examination. The specific implementation mode of the prior art scheme is as follows: under the conditions that the fracture of the switching device is in a breaking state, the shell of the switching device is not grounded, and the whole switching device is placed on an insulating platform, impulse voltage (the sum of the absolute value of direct current voltage and the absolute value of impulse voltage, which are specified by test parameters) is applied to one high-voltage end of the fracture of the switching device in a direct current GIS product, and the other high-voltage end is grounded.
The purpose of the switchgear fracture joint voltage test in the direct current GIS product is to simulate the actual working condition faced by the switchgear fracture when the switchgear fracture is opened, namely, under the condition that the switchgear fracture is opened and the shell is grounded, one side of the fracture is the direct current running voltage, and the other side of the fracture is subjected to the condition of lightning overvoltage or operation overvoltage invasion. In the prior art, single-ended impact voltage application is adopted for examination, meanwhile, the shell is not grounded, the switch device is placed on the insulating platform and is seriously different from the actual working condition, meanwhile, the applied impact voltage is simply determined to be the sum of the absolute value of the direct current voltage and the absolute value of the impact voltage specified by the test parameters, and the scientificity is lacking. The switch device in the direct-current GIS product is checked in a mode of single-end application of impulse voltage, and the effectiveness of the check cannot be guaranteed, so that the insulation tolerance test accuracy of the switch device in the direct-current GIS product is low.
Disclosure of Invention
In order to overcome the defects in the prior art, the invention aims to provide a fracture joint voltage test loop for a switching device and a measurement method thereof, so as to solve the technical problem that the insulation tolerance assessment is inaccurate due to the mode of applying impulse voltage to a single end of the switching device in the prior art.
The invention is realized by the following technical scheme:
a fracture joint voltage test loop for a switching device comprises the switching device, an impulse voltage test system, a direct current voltage test system, test equipment, an isolation capacitor and an external resistor; the high-voltage end of the impulse voltage test system is connected with one end of the isolation capacitor, the other end of the isolation capacitor is connected with the first high-voltage end of the switch device fracture, and the grounding of the impulse voltage test system is grounded; the high-voltage end of the direct-current voltage test system is connected with one end of an external resistor, the other end of the external resistor is connected with a second high-voltage end of a fracture of the switching device, and the grounding of the direct-current voltage test system is grounded; the high-voltage ends are respectively arranged on two sides of the testing equipment, and the high-voltage ends on two sides of the testing equipment are respectively and correspondingly connected to the first high-voltage end and the second high-voltage end of the fracture of the switching device and are used for collecting impulse voltage and direct-current voltage, and the grounding end of the testing equipment is grounded.
Preferably, the test equipment comprises a first universal voltage divider and a second universal voltage divider with the same scale factors, wherein the high-voltage end of the first universal voltage divider is connected with the first high-voltage end of the fracture of the switching device, and the grounding end of the first universal voltage divider is grounded; the high-voltage end of the second general voltage divider is connected with the second high-voltage end of the break of the switching device, and the grounding end of the second general voltage divider is grounded.
Further, a multichannel digital measuring instrument is connected between the measuring ends of the first universal voltage divider and the second universal voltage divider; the ground of the multichannel digital measuring instrument is grounded, and the multichannel digital measuring instrument at least comprises 2 channels.
Preferably, the high-voltage end of the compensation capacitor is connected to the high-voltage end of the external resistor, and the grounding of the compensation capacitor is grounded.
Preferably, the isolation capacitor is provided with a lifting point, and the isolation capacitor is lifted into the air by lifting the isolation capacitor on the lifting point through the insulator row.
Preferably, the external resistor is provided with a lifting point, and is lifted to the air through the insulator row and lifted on the lifting point.
The fracture joint voltage measuring method for the switching device is based on the fracture joint voltage test loop for the switching device, and comprises the following steps of:
step 1, obtaining an absolute value U of a surge voltage waveform peak value through test equipment IP Absolute value U of sampling point average value of direct current voltage waveform at moment when no impact is applied DC1 And absolute value U of waveform peak at impact time DC2 ；
Step 2, according to the absolute value U of the average value of the sampling points of the direct-current voltage waveform at the moment when no impact is applied DC1 And absolute value U of waveform peak at impact time DC2 Calculating to obtain a DC voltage drop value U DROP ；
Step 3, if the DC voltage drop value U DROP If the voltage drop value is larger than the first preset threshold value, the capacitance is increased for retesting, otherwise, the voltage drop value U is reduced according to the direct current voltage DROP Calculating to obtain fracture voltage U;
and step 4, if the fracture voltage U is smaller than a second preset threshold value, increasing the capacitance for retesting, and otherwise, ending the test.
Preferably, in step 1, the absolute value U of the peak value of the surge voltage waveform is obtained by a first universal voltage divider IP The absolute value U of the average value of the sampling points of the direct-current voltage waveform at the moment when no impact is applied is respectively obtained through a second general voltage divider DC1 And absolute value U of waveform peak at impact time DC2 。
Preferably, in step 2, the DC voltage drop value U DROP The calculation formula of (2) is as follows:
U DROP =|U DC1 -U DC2 |；
in step 3, according to the DC voltage drop value U DROP The fracture voltage U is calculated, wherein the specific formula is as follows:
U=U IP +U DC1 -U DROP 。
preferably, in step 3 and step 4, the capacitance is increased by a compensation capacitor, wherein the compensation capacitor is a high-voltage oil-immersed capacitor, and the capacitance is greater than 100nF.
Compared with the prior art, the invention has the following beneficial technical effects:
the invention provides a fracture joint voltage test loop for a switching device, which constructs the fracture joint voltage test loop for the switching device by reasonably designing a test voltage source, an isolation capacitor, external resistors and measuring equipment and orderly arranging the test voltage source, the isolation capacitor, the external resistors and the measuring equipment, ensures effective assessment of the fracture of the switching device, and can respectively acquire impulse voltage and direct current voltage during fracture joint voltage test by connecting the test equipment at high-voltage ends at two sides of the fracture of the switching device in a shell of the switching device, thereby improving the accuracy of measurement of the fracture joint voltage test of the switching device. Meanwhile, through the isolation capacitor and the external resistor, the protectiveness of the surge voltage test system and the direct-current voltage test system is enhanced, and the safety and stability of the test loop are improved.
Further, the test equipment comprises a first universal voltage divider and a second universal voltage divider, the high-voltage end of the first universal voltage divider is connected with the first high-voltage end of the fracture of the switching device, impact voltage during fracture joint voltage test is effectively collected, the high-voltage end of the second universal voltage divider is connected with the second high-voltage end of the fracture of the switching device, direct-current voltage during fracture joint voltage test is effectively collected, and accuracy of fracture joint voltage test measurement of the switching device is improved through the first universal voltage divider and the second universal voltage divider.
Further, a multichannel digital measuring instrument is connected between measuring ends of the first universal voltage divider and the second universal voltage divider, and the multichannel digital measuring instrument can be used for simultaneously displaying voltage waveforms acquired by the first universal voltage divider and the second universal voltage divider, so that the fracture joint voltage test measurement of the switching device can be conveniently observed, and the accuracy of the fracture joint voltage test measurement of the switching device is improved.
Further, the fracture joint voltage test loop for the switching device further comprises a compensation capacitor, when the direct-current voltage drop and the fracture voltage do not meet the test parameter requirements, adjustment measures can be effectively carried out, so that the direct-current voltage drop and the fracture voltage meet the test parameter requirements, and the effectiveness of the fracture joint voltage test of the switching device is improved.
The invention also provides a fracture joint voltage measurement method for the switching device, which fully considers the measurement of the fracture joint voltage in the fracture joint voltage test of the switching device, so that the measurement method completely meets the standard requirement and is more accurate. Meanwhile, an adjustment measure for increasing the capacitance when the direct-current voltage drops and the fracture voltage does not meet the test parameter requirement is provided, and the compliance of the fracture joint voltage test of the switching device is effectively improved.
Drawings
FIG. 1 is a schematic diagram of a circuit for a fracture-joint voltage test for a switchgear of the present invention;
FIG. 2 is a flow chart of a method for measuring combined voltage according to the present invention;
in the figure: 1-a switching device; 2-switchgear enclosure; 3-switching device break; 4-an impulse voltage test system; 5-a direct current voltage test system; 6-a first universal voltage divider; 7-a second universal voltage divider; 8-a compensation capacitor; 9-multichannel digital measuring instrument; a C-isolation capacitor; r-external resistor.
Detailed Description
In order that those skilled in the art will better understand the present invention, a technical solution in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in which it is apparent that the described embodiments are only some embodiments of the present invention, not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the present invention without making any inventive effort, shall fall within the scope of the present invention.
The invention is described in further detail below with reference to the attached drawing figures:
the invention aims to provide a fracture joint voltage test loop for a switching device and a measurement method, which are used for solving the technical problem of inaccurate insulation tolerance assessment caused by a mode of applying impulse voltage to a single end of the switching device in the prior art.
Referring to fig. 1, the invention provides a fracture joint voltage test loop for a switching device, which comprises a switching device 1, a surge voltage test system 4, a direct current voltage test system 5, test equipment, an isolation capacitor C and an external resistor R; the switching device 1 comprises a switching device shell 2, a switching device fracture 3 is arranged in the switching device shell 2, the high-voltage end of the impulse voltage test system 4 is connected with one end of the isolation capacitor C, the other end of the isolation capacitor C is connected with the first high-voltage end of the switching device fracture 3, and the grounding end of the impulse voltage test system 4 is grounded; the high-voltage end of the direct-current voltage test system 5 is connected with one end of an external resistor R, the other end of the external resistor R is connected with the second high-voltage end of the switch device fracture 3, and the grounding end of the direct-current voltage test system 5 is grounded; the high-voltage ends are respectively arranged on two sides of the testing equipment, the high-voltage ends on two sides of the testing equipment are respectively correspondingly connected to the first high-voltage end and the second high-voltage end of the switch device fracture 3 and are used for collecting impulse voltage and direct-current voltage, and the grounding of the testing equipment is grounded.
Specifically, the test equipment comprises a first universal voltage divider 6 and a second universal voltage divider 7 with the same scale factors, wherein the high-voltage end of the first universal voltage divider 6 is connected with the first high-voltage end of the fracture 3 of the switching device, and the grounding of the first universal voltage divider 6 is grounded; the high voltage end of the second general voltage divider 7 is connected with the second high voltage end of the switch device fracture 3, and the grounding end of the second general voltage divider 7 is grounded.
Wherein, a multichannel digital measuring instrument 9 is connected between the measuring ends of the first universal voltage divider 6 and the second universal voltage divider 7; the ground of the multi-channel digital measuring instrument 9 is grounded, and the multi-channel digital measuring instrument 9 at least comprises 2 channels.
Specifically, the fracture joint voltage test loop for the switching device further comprises a compensation capacitor 8, wherein the high-voltage end of the compensation capacitor 8 is connected to the high-voltage end of the external resistor R, and the grounding of the compensation capacitor 8 is grounded.
In the invention, the switch device fracture 3 is arranged in the switch device shell 2, and the switch device shell 2 is grounded.
The switching device 1 according to the invention is used for devices for closing and/or opening a circuit, such as disconnectors in dc GIS products.
Direct current GIS product: at least partially, a gas above atmospheric pressure is used as an insulating medium and is applied to a metal-enclosed switchgear and a control device of a direct current transmission system.
General voltage divider: the voltage divider is generally referred to as a resistor Rong Hunlian voltage divider, which can measure DC voltage, AC voltage and surge voltage, and the scale factors of the DC voltage, AC voltage and surge voltage can be kept consistent.
The test voltage source comprises two parts, namely a surge voltage test system 4 and a direct current voltage test system 5, wherein the surge voltage test system 4 is used for providing lightning surge voltage and operation surge voltage required in the test, and the direct current voltage test system 5 is used for providing direct current voltage required in the test.
The isolating capacitor C is provided with two high-voltage wiring terminals and two lifting points, and the isolating capacitor C is lifted to the air by adopting an insulator to be matched with a laboratory crane when in use, and meanwhile, the distance between the insulator and the ground of the isolating capacitor C is ensured to bear the impulse voltage which is larger than the impulse voltage specified in the fracture joint voltage test parameters. The withstand voltage level of the isolation capacitor C should be greater than the dc voltage specified in the fracture-joint voltage test parameters.
The external resistor R is provided with two high-voltage wiring terminals and two lifting points, and the external resistor R is lifted to the air by adopting an insulator to be matched with a laboratory crane when in use, and meanwhile, the distance between the insulator and the ground of the external resistor R is ensured to bear direct-current voltage which is larger than the direct-current voltage specified in fracture joint voltage test parameters. The withstand voltage level of the external resistor R should be greater than the surge voltage specified in the fracture joint voltage test parameters.
The invention also provides a fracture joint voltage measurement method for the switching device, which is based on the fracture joint voltage test loop for the switching device and comprises the following steps:
step 1, obtaining an absolute value U of a surge voltage waveform peak value through test equipment IP Absolute value U of sampling point average value of direct current voltage waveform at moment when no impact is applied DC1 And absolute value U of waveform peak at impact time DC2 ；
Specifically, the surge voltage waveform is obtained by the first universal voltage divider 6Absolute value of peak value U IP The absolute value U of the average value of the sampling points of the direct-current voltage waveform at the moment when no impact is applied is respectively obtained through a second common voltage divider 7 DC1 And absolute value U of waveform peak at impact time DC2 。
Step 2, according to the absolute value U of the average value of the sampling points of the direct-current voltage waveform at the moment when no impact is applied DC1 And absolute value U of waveform peak at impact time DC2 Calculating to obtain a DC voltage drop value U DROP ；
Specifically, the DC voltage drop value U DROP The calculation formula of (2) is as follows:
U DROP =|U DC1 -U DC2 |；
step 3, if the DC voltage drop value U DROP If the voltage drop value is larger than the first preset threshold value, the capacitance is increased for retesting, otherwise, the voltage drop value U is reduced according to the direct current voltage DROP Calculating to obtain fracture voltage U;
specifically, according to the DC voltage drop value U DROP The fracture voltage U is calculated, wherein the specific formula is as follows:
U=U IP + U DC1 -U DROP ；
and step 4, if the fracture voltage U is smaller than a second preset threshold value, increasing the capacitance for retesting, and otherwise, ending the test.
In the step 3 and the step 4, the capacitance is increased by the compensation capacitor 8, wherein the compensation capacitor 8 is a high-voltage oil-immersed capacitor, the capacitance is more than 100nF, and the rated voltage is required to be more than the direct-current voltage specified in the fracture joint voltage test parameters.
The invention relates to an interruption joint voltage test: when the switchgear break 3 is in the open state and the switchgear case 2 is grounded, a dc voltage is applied to one side of the switchgear break 3, and a voltage test of a surge voltage is applied to the other side.
Dc voltage drop: due to the capacitive coupling effect of the switching device in the open state of the break 3, a surge voltage is coupled to the dc voltage at the time of applying the surge voltage, resulting in a voltage difference between the actual recorded voltage value of the dc voltage and the predetermined value, the resulting voltage difference being referred to as a dc voltage drop.
Examples
According to fig. 2, the embodiment provides a method for measuring the voltage of the fracture joint of a switch device of a direct current GIS product, which specifically comprises the following steps:
step 1, reading the absolute value U of the peak value of the impulse voltage waveform acquired by the first universal voltage divider 6 IP ；
Reading the absolute value U of the average value of the sampling points of the direct-current voltage waveform at the moment of no impact, which is acquired by the second universal voltage divider 7 DC1 ；
Step 2, reading the absolute value U of the waveform peak value at the time of impact application acquired by the second universal voltage divider 7 DC2 ；
Step 3, calculating the DC voltage drop U DROP DC voltage drop U DROP The calculation formula of (2) is as follows:
U DROP =|U DC1 -U DC2 |；
step 4, setting a first preset threshold value to be 0.05, and judging a DC voltage drop value U DROP Whether or not it is greater than U DC1 X 0.05, and if it is larger than the above value, the capacitance of the compensation capacitor 8 is increased, and then the test is performed again.
And 5, calculating a fracture voltage U, wherein the fracture voltage U is calculated according to the following formula:
U=U IP +U DC1 -U DROP ；
step 6, setting the second preset threshold value to be 0.97, and judging whether the fracture voltage U is smaller than (U) IP + U DC1 ) X 0.97, and if it is smaller than the above value, the capacitance of the compensation capacitor 8 is increased, and then the test is performed again.
Fig. 1 shows a break joint voltage test loop for constructing a switching device in a dc GIS product according to this embodiment. After the test loop arrangement is completed, the direct current voltage test system 5 is firstly boosted until the direct current voltage measured on the second universal voltage divider 7 reaches the required voltage, and the direct current voltage test system 5 stops boosting and continuously maintains the voltage. The surge voltage test system 4 applies a prescribed surge voltage, and then reads and stores the voltage waveforms collected by the first universal voltage divider 6 and the second universal voltage divider 7 on the multi-channel digital measuring instrument 9. The dc voltage drop value is calculated according to fig. 2, and if the dc voltage drop value exceeds 5% of the absolute value of the dc voltage specified by the test parameter, the compensation capacitor is appropriately increased and then the test is performed again, and if the dc voltage drop value does not exceed 5%, the fracture joint voltage is calculated. If the fracture joint voltage does not meet the test parameter requirement, namely the calculated fracture joint voltage is lower than 97% of the sum of the absolute value of the direct-current voltage and the absolute value of the impulse voltage, which are specified by the test parameter, the compensation capacitor can be properly increased to perform the test again so as to meet the requirement.
In the embodiment, a surge voltage test system 4 and a direct current voltage test system 5 are selected to be used as test voltage sources meeting the requirements of the combined voltage test parameters of the break of the switching device in the direct current GIS product. An isolation capacitor C with a larger capacitance value (generally 60nF and above) is selected to be connected in series between the surge voltage test system 4 and one high-voltage end of the switch device fracture 3 in the direct-current GIS product, and is used as isolation protection equipment of the surge voltage test system 4. An external resistor R with a larger resistance value (generally 2MΩ and above) is selected to be connected in series between the direct-current voltage test system 5 and the other high-voltage end of the switch device fracture 3 in the direct-current GIS product to be used as external protection equipment of the direct-current voltage test system 5. The direct-current voltage test system 5 is connected with an external resistor R in series and then is connected with a compensation capacitor for inhibiting direct-current voltage drop at the moment of applying impulse voltage. The two sides of the fracture 3 of the switching device in the DC GIS product are respectively connected with a universal voltage divider meeting the requirements of fracture joint voltage test parameters in parallel to serve as measuring equipment, respectively collect impulse voltage and DC voltage during fracture joint voltage test, and input the collected impulse voltage and DC voltage into a multi-channel digital measuring instrument 9 (2 channels and above) for display. Meanwhile, the multichannel digital measuring instrument 9 calculates to obtain the fracture joint voltage of the switching device in the direct-current GIS product through a certain method.
In summary, the test voltage source, the isolation capacitor C, the external resistor R and the measuring equipment are reasonably designed and orderly arranged, so that the fracture joint voltage test loop for the switching device in the direct-current GIS product is constructed, the effective assessment of the fracture of the switching device in the direct-current GIS product is ensured, and the related requirements of the technical document CIGRE 842 are completely met.
The method fully considers the measurement of the fracture joint voltage in the fracture joint voltage test of the direct-current GIS product switching device, so that the measurement method completely meets the standard requirement and is more accurate. Meanwhile, an adjustment measure is provided when the direct current voltage drops and the fracture voltage does not meet the test parameter requirement.
For a fracture joint voltage test for a switching device in a direct-current GIS product, a scientific and reasonable measurement method for the fracture joint voltage is provided. The invention provides effective protection for the impulse voltage test system 4 and the direct current voltage test system 5, and enhances the safety and stability of a test loop.
Finally, it should be noted that: the above embodiments are only for illustrating the technical aspects of the present invention and not for limiting the same, and although the present invention has been described in detail with reference to the above embodiments, it should be understood by those of ordinary skill in the art that: modifications and equivalents may be made to the specific embodiments of the invention without departing from the spirit and scope of the invention, which is intended to be covered by the claims.
Claims (10)
1. The fracture joint voltage test loop for the switching device is characterized by comprising the switching device (1), an impulse voltage test system (4), a direct current voltage test system (5), test equipment, an isolation capacitor (C) and an external resistor (R); the switching device (1) comprises a switching device fracture (3), the high-voltage end of the impulse voltage test system (4) is connected with one end of the isolation capacitor (C), the other end of the isolation capacitor (C) is connected with the first high-voltage end of the switching device fracture (3), and the grounding end of the impulse voltage test system (4) is grounded; the high-voltage end of the direct-current voltage test system (5) is connected with one end of an external resistor (R), the other end of the external resistor (R) is connected with the second high-voltage end of the switch device fracture (3), and the grounding end of the direct-current voltage test system (5) is grounded; the high-voltage ends are respectively arranged on two sides of the testing equipment, and are respectively and correspondingly connected to the first high-voltage end and the second high-voltage end of the fracture (3) of the switching device, and are used for collecting impulse voltage and direct-current voltage, and the grounding of the testing equipment is grounded.
2. A circuit for a combined voltage test of a break for a switching device according to claim 1, characterized in that the test equipment comprises a first universal voltage divider (6) and a second universal voltage divider (7) with the same scale factor, the high voltage end of the first universal voltage divider (6) being connected to the first high voltage end of the break (3) of the switching device, the ground of the first universal voltage divider (6) being grounded; the high-voltage end of the second general voltage divider (7) is connected with the second high-voltage end of the break (3) of the switch device, and the grounding end of the second general voltage divider (7) is grounded.
3. A circuit for combined voltage testing of a break for a switching device according to claim 2, characterized in that a multichannel digital measuring instrument (9) is connected between the measuring ends of said first universal voltage divider (6) and said second universal voltage divider (7); the grounding end of the multichannel digital measuring instrument (9) is grounded, and the multichannel digital measuring instrument (9) at least comprises 2 channels.
4. The circuit for a combined voltage test of a break for a switching device according to claim 1, further comprising a compensation capacitor (8), wherein the high voltage terminal of the compensation capacitor (8) is connected to the high voltage terminal of the external resistor (R), and the ground of the compensation capacitor (8) is grounded.
5. A circuit for a combined voltage test of a breaking joint for a switching device according to claim 1, characterized in that the isolating capacitor (C) is provided with a lifting point, and the isolating capacitor (C) is lifted into the air by lifting the isolating capacitor (C) on the lifting point via the row of insulators.
6. The fracture joint voltage test circuit for a switching device according to claim 1, wherein the external resistor (R) is provided with a lifting point, and the external resistor (R) is lifted to the air by lifting the external resistor (R) on the lifting point through an insulator row.
7. A method of measuring a combined voltage across a break for a switchgear based on the combined voltage across a break test loop for a switchgear according to any one of claims 1-6, comprising the steps of:
step 1, obtaining an absolute value U of a surge voltage waveform peak value through test equipment IP Absolute value U of sampling point average value of direct current voltage waveform at moment when no impact is applied DC1 And absolute value U of waveform peak at impact time DC2 ；
Step 2, according to the absolute value U of the average value of the sampling points of the direct-current voltage waveform at the moment when no impact is applied DC1 And absolute value U of waveform peak at impact time DC2 Calculating to obtain a DC voltage drop value U DROP ；
Step 3, if the DC voltage drop value U DROP If the voltage drop value is larger than the first preset threshold value, the capacitance is increased for retesting, otherwise, the voltage drop value U is reduced according to the direct current voltage DROP Calculating to obtain fracture voltage U;
and step 4, if the fracture voltage U is smaller than a second preset threshold value, increasing the capacitance for retesting, and otherwise, ending the test.
8. The method for measuring a combined voltage across a break for a switching device according to claim 7, wherein in step 1, the absolute value U of the peak value of the surge voltage waveform is obtained by a first universal voltage divider (6) IP The absolute value U of the average value of the sampling points of the direct-current voltage waveform at the moment when no impact is applied is respectively obtained through a second universal voltage divider (7) DC1 And absolute value U of waveform peak at impact time DC2 。
9. A method for measuring a voltage across a switch device according to claim 7, wherein, in step 2,DC voltage drop value U DROP The calculation formula of (2) is as follows:
U DROP =|U DC1 -U DC2 |；
in step 3, according to the DC voltage drop value U DROP The fracture voltage U is calculated, wherein the specific formula is as follows:
U=U IP +U DC1 -U DROP 。
10. the method for measuring a voltage across a gap for a switching device according to claim 7, wherein in step 3 and step 4, the capacitance is increased by a compensation capacitor (8), wherein the compensation capacitor (8) is a high voltage oil immersed capacitor, and the capacitance is larger than 100nF.
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Citations (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| SU1103159A2 (en) * | 1983-01-19 | 1984-07-15 | Ленинградский Электротехнический Институт Связи Им.Проф.М.А.Бонч-Бруевича | Device for measuring parameters of pulse signals |
| SU1118941A2 (en) * | 1982-09-30 | 1984-10-15 | Саранский Ордена Трудового Красного Знамени Завод "Электровыпрямитель" | Device for measuring maximum-permissible rate of thyristor direct voltage increase |
| SU1506399A1 (en) * | 1987-10-19 | 1989-09-07 | Предприятие П/Я А-3635 | Apparatus for checking workability of gas discharge gaps of protective apparatus |
| JP2004259892A (en) * | 2003-02-25 | 2004-09-16 | Kyocera Corp | Method for screening capacitor |
| DE102005024030A1 (en) * | 2005-05-25 | 2006-12-07 | Technische Universität Chemnitz | Semiconductor structure e.g. conducting path, testing circuit arrangement, has impulse generator with transmission lines whose impedances form system impedance, and absorption branch with resistance having same value as system impedance |
| WO2012071773A1 (en) * | 2010-12-01 | 2012-06-07 | 中国电力科学研究院 | Impulse voltage combined fault current test method for high voltage direct current transmission converter valve |
| CN203350399U (en) * | 2013-07-12 | 2013-12-18 | 南方电网科学研究院有限责任公司 | Synthesized voltage testing system used for high altitude region direct current and impact |
| JP2014050166A (en) * | 2012-08-30 | 2014-03-17 | Panasonic Corp | Dc power supply |
| CN104617584A (en) * | 2015-02-12 | 2015-05-13 | 阳光电源股份有限公司 | Full power wind power system grid fault ride-through method and device |
| CN105785247A (en) * | 2016-04-29 | 2016-07-20 | 中国南方电网有限责任公司超高压输电公司检修试验中心 | Circuit-breaker alternating current and direct current mixing voltage withstanding wiring loop used for alternating current filter and test method thereof |
| CN111025219A (en) * | 2019-11-29 | 2020-04-17 | 中国电力科学研究院有限公司 | Device and method for testing transient response of direct-current voltage transformer |
| CN115308585A (en) * | 2022-08-03 | 2022-11-08 | 西安高压电器研究院股份有限公司 | Direct-current superposition impact voltage-withstand test loop and test method thereof |
-
2023
- 2023-10-18 CN CN202311349664.4A patent/CN117092501B/en active Active
Patent Citations (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| SU1118941A2 (en) * | 1982-09-30 | 1984-10-15 | Саранский Ордена Трудового Красного Знамени Завод "Электровыпрямитель" | Device for measuring maximum-permissible rate of thyristor direct voltage increase |
| SU1103159A2 (en) * | 1983-01-19 | 1984-07-15 | Ленинградский Электротехнический Институт Связи Им.Проф.М.А.Бонч-Бруевича | Device for measuring parameters of pulse signals |
| SU1506399A1 (en) * | 1987-10-19 | 1989-09-07 | Предприятие П/Я А-3635 | Apparatus for checking workability of gas discharge gaps of protective apparatus |
| JP2004259892A (en) * | 2003-02-25 | 2004-09-16 | Kyocera Corp | Method for screening capacitor |
| DE102005024030A1 (en) * | 2005-05-25 | 2006-12-07 | Technische Universität Chemnitz | Semiconductor structure e.g. conducting path, testing circuit arrangement, has impulse generator with transmission lines whose impedances form system impedance, and absorption branch with resistance having same value as system impedance |
| WO2012071773A1 (en) * | 2010-12-01 | 2012-06-07 | 中国电力科学研究院 | Impulse voltage combined fault current test method for high voltage direct current transmission converter valve |
| JP2014050166A (en) * | 2012-08-30 | 2014-03-17 | Panasonic Corp | Dc power supply |
| CN203350399U (en) * | 2013-07-12 | 2013-12-18 | 南方电网科学研究院有限责任公司 | Synthesized voltage testing system used for high altitude region direct current and impact |
| CN104617584A (en) * | 2015-02-12 | 2015-05-13 | 阳光电源股份有限公司 | Full power wind power system grid fault ride-through method and device |
| CN105785247A (en) * | 2016-04-29 | 2016-07-20 | 中国南方电网有限责任公司超高压输电公司检修试验中心 | Circuit-breaker alternating current and direct current mixing voltage withstanding wiring loop used for alternating current filter and test method thereof |
| CN111025219A (en) * | 2019-11-29 | 2020-04-17 | 中国电力科学研究院有限公司 | Device and method for testing transient response of direct-current voltage transformer |
| CN115308585A (en) * | 2022-08-03 | 2022-11-08 | 西安高压电器研究院股份有限公司 | Direct-current superposition impact voltage-withstand test loop and test method thereof |
Non-Patent Citations (2)
| Title |
|---|
| MENG SHEN 等: "Research on Suppression Methods of Overshoot and Power-frequency Voltage Drop During Lightning Impulse Test of UHV Switchgear", 《2019 5TH INTERNATIONAL CONFERENCE ON ELECTRIC POWER EQUIPMENT - SWITCHING TECHNOLOGY (ICEPE-ST)》, 8 December 2019 (2019-12-08) * |
| 余良清 等: "1100KV SF6断路器断口联合电压试验研究", 《电气工程学报》, vol. 10, no. 6, pages 84 - 87 * |
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