CN117092447A - Resistor disc combination wave screening method based on line lightning arrester - Google Patents
Resistor disc combination wave screening method based on line lightning arrester Download PDFInfo
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Abstract
The invention relates to the field of resistor disc detection, in particular to a resistor disc combined wave screening method based on a line arrester.
Description
Technical Field
The invention relates to the field of resistor disc detection, in particular to a resistor disc combination wave screening method based on a line lightning arrester.
Background
The arrester is an electrical device for protecting electrical equipment from high transient overvoltage, when overvoltage is generated by a system according to different installation positions, the arrester has low resistance in overvoltage due to nonlinear volt-ampere characteristics, the nonlinear volt-ampere characteristics of the arrester are provided by internal zinc oxide resistor pieces, therefore, the quality of the resistor pieces directly influences the functions of the arrester, and related detection is important.
For example, chinese patent: CN115555274a discloses a resistor screening method, device and screening equipment. The method comprises the following steps: under the condition that the first sequence impact current is applied to the current batch of resistor plates in the whole batch of resistor plates, performing defect detection on the current batch of resistor plates to obtain the first screening qualification rate; under the condition that the application of the second sequence impact current to the current batch of resistor plates is completed, performing defect detection on the current batch of resistor plates to obtain a second screening qualification rate; under the condition that the third sequence impact current is applied to the current batch of resistor plates, performing defect detection on the current batch of resistor plates to obtain a third screening qualification rate; and determining that the resistor screening for the direct current lightning arrester is finished until all batches of resistor in the whole batch of resistor are qualified resistor. The application improves the screening rate of the defect resistor disc of the direct current lightning arrester through the combined screening of square waves and sine half waves.
However, the prior art has the following problems,
in the prior art, the difference of a plurality of resistor pieces under the actual working condition is not considered, the difference of the resistor pieces can cause thermal breakdown when the lightning arrester acts, especially the defect characteristics of part of the resistor pieces are not obvious, the temperature of the resistor pieces can change in the actual working condition boosting process so as to excite part of the defects, the actual performance of the resistor pieces is changed, the defect characteristics are not strong in data representation, and the traditional screening method is easy to miss.
Disclosure of Invention
In order to solve the above problems, the present invention provides a method for screening a resistive sheet combination wave based on a line arrester, comprising:
step S1, connecting each resistor to be tested into a parallel circuit, introducing combined square wave current into the parallel circuit, and measuring characteristic parameters of each resistor in real time, wherein the characteristic parameters comprise the temperature of the resistor and voltage data of a passage where the resistor is located;
step S2, a voltage change curve is constructed based on voltage data of a path where each resistor sheet is located, characteristic curve sections of each voltage change curve are collected, difference characterization parameters corresponding to the resistor sheets are calculated by the difference amount of basic parameters in each characteristic curve section, the difference states of each resistor sheet are divided based on the difference characterization parameters, the characteristic curve sections are voltage change curve sections corresponding to the voltage in an ascending trend, and the basic parameters comprise average slope and peak values;
step S3, determining screening modes of the resistor sheets based on the difference states of the resistor sheets, wherein,
under a first preset condition, a first screening action is executed,
under a second preset condition, executing a second screening action after executing the first screening action,
the first preset condition is that the resistor sheets in the first difference state exist, and the resistor sheets in the second difference state do not exist;
the second preset condition is that the resistor disc is in a first difference state and a second difference state;
the first screening action is to acquire a temperature difference coefficient corresponding to a resistor in a first difference state, verify whether the temperature is abnormal based on the temperature difference coefficient, judge that the resistor is abnormal if the temperature is abnormal, and screen out the resistor;
the second screening action is used for obtaining a temperature difference coefficient corresponding to the resistor disc in a second difference state, adjusting the duration time and the peak intensity of the combined square wave current based on the average value of the temperature difference coefficient, returning to the step S1, and introducing the adjusted combined square wave current into the parallel circuit;
and calculating the temperature difference coefficient based on the gradient difference value of the temperature change curve corresponding to each resistor sheet when the voltage is in the rising trend.
Further, in the step S2, the difference characterizing parameters corresponding to the resistive patches are calculated according to the formula (1) by extracting the difference amounts of the basic parameters in each of the characteristic curve segments,
in the formula (1), E represents a difference characterization parameter, n represents the total number of the resistor pieces, ki represents the average slope of the characteristic curve segment of the voltage change curve corresponding to the i-th resistor piece, Δk represents the average value of the average slope of each characteristic curve segment, hi represents the peak value of the characteristic curve segment of the voltage change curve corresponding to the i-th resistor piece, and Δh represents the average value of the peak value of the characteristic curve segment.
Further, dividing the difference state of each resistor disc based on the difference characterization parameters, wherein the difference characterization parameters corresponding to the resistor discs are compared with a preset first parameter comparison threshold value and a preset second parameter comparison threshold value,
under a first preset comparison condition, judging that the resistor disc belongs to a first difference state;
under a second preset comparison condition, judging that the resistance sheet belongs to a second difference state;
under a third preset comparison condition, judging that the resistance sheet belongs to a third difference state;
the first preset comparison condition is that the difference characterization parameter is greater than or equal to the second parameter comparison threshold, the second preset comparison condition is that the difference characterization parameter is smaller than the second parameter comparison threshold and greater than the first parameter comparison threshold, and the third preset comparison condition is that the difference characterization parameter is smaller than the first parameter comparison threshold.
Further, in the step S3, a temperature difference coefficient corresponding to the resistor sheet is calculated according to the formula (2) based on the slope difference amount of the temperature change curve corresponding to each resistor sheet when the voltage is in the rising trend,
in the formula (2), te represents a temperature difference coefficient, n represents the total number of the resistor pieces, ki represents an average slope of the i-th resistor piece corresponding to the temperature change curve in which the voltage is in an upward trend, Δk represents an average value of the average slopes of the respective temperature change curves, hi represents a peak value of the i-th resistor piece corresponding to the temperature change curve in which the voltage is in an upward trend, and Δh represents an average value of the peak values of the respective temperature change curves.
Further, in the step S3, whether the temperature is abnormal is verified based on the temperature difference coefficient, wherein,
comparing the temperature difference coefficient with a preset temperature difference coefficient comparison threshold value,
and if the temperature difference coefficient is larger than the temperature difference coefficient comparison threshold value, verifying that the temperature is abnormal.
Further, in the step S3, the duration of the combined square wave current is adjusted based on the average value of the temperature difference coefficient, wherein,
a plurality of adjustment modes for adjusting the duration of the combined square wave based on the average value of the temperature difference coefficients are preset, and the adjustment amounts of the adjustment modes on the duration of the combined square wave are different.
Further, in the step S3, the peak intensity of the combined square wave is adjusted based on the average value of the temperature difference coefficient, wherein,
a plurality of adjustment modes for adjusting the peak intensity of the combined square wave based on the average value of the temperature difference coefficients are preset, and the adjustment amounts of the adjustment modes on the peak intensity of the combined square wave are different.
Further, only a single second screening action is performed during a single screening process.
Further, in the step S1, the parallel circuit is the same as the built-in parallel circuit when the line arrester is actually applied.
Further, in the step S2, a voltage change curve is constructed based on the case that the voltage changes with time.
Compared with the prior art, the method has the advantages that the voltage change curve is built based on the voltage data of the path where each resistor piece is located, the characteristic curve sections of each voltage change curve are collected, the difference characterization parameters corresponding to the resistor pieces are calculated according to the difference amounts of the basic parameters in each characteristic curve section, the difference states of each resistor piece are divided based on the difference characterization parameters, the screening mode of the resistor pieces is determined based on the difference states of each resistor piece, when the first screening action is executed, the temperature verification is combined, whether the resistor pieces are abnormal or not is judged, when the second screening action is executed, the output parameters of the combined square wave current are adjusted by combining the temperature difference coefficients, then the hidden defect characteristics of the resistor pieces in the second difference states are detected again, defect characteristic omission is reduced, and screening accuracy and reliability are improved.
In particular, the invention extracts the difference characterization parameters corresponding to the difference calculation resistor sheets of the basic parameters in each characteristic curve section, in the actual situation, the voltage is the basic parameter in the actual operation process of the resistor sheets, the operation state of the resistor sheets can be characterized to a certain extent, the resistor sheets with obvious differences between the operation situation and other resistor sheets are determined by calculating the difference characterization parameters, the subsequent combination temperature verification is facilitated, whether the resistor sheets are abnormal or not is judged, and the screening accuracy and reliability are further improved.
Particularly, the invention divides the difference state of the resistor disc based on the difference characterization parameter, in the actual situation, the first difference state characterizes the larger difference of the resistor disc, in the situation, the combination temperature verification can rapidly and reliably judge whether the resistor disc is abnormal or not, in the second difference state, the difference of the resistor disc is smaller, but partial difference characteristics are reflected, hidden defect characteristics possibly exist, and especially, under the condition of temperature rise, the hidden defect characteristics can be amplified when the property of the resistor disc is changed, so that the characteristics cannot be ignored, the combined square wave current is required to be adjusted, the hidden characteristics are adaptively excited, the missing of fine defects is avoided, and the screening accuracy and reliability are further improved.
Particularly, the invention adjusts the duration and the peak intensity of the combined square wave current based on the average value of the temperature difference coefficient, in the practical situation, the resistance sheet can be partially changed along with the temperature rising property, and the fine defect is amplified, and the average value of the temperature difference coefficient represents the difference and the temperature change trend to a certain extent, so the duration and the peak intensity of the combined square wave current are adaptively adjusted based on the temperature difference coefficient, thereby being convenient for adaptively exciting hidden characteristics, avoiding missing the fine defect, and further improving the screening accuracy and reliability.
Drawings
Fig. 1 is a schematic diagram of steps of a screening method of a resistor disc combination wave based on a line arrester according to an embodiment of the invention.
Detailed Description
In order that the objects and advantages of the invention will become more apparent, the invention will be further described with reference to the following examples; it should be understood that the specific embodiments described herein are for purposes of illustration only and are not intended to limit the scope of the invention.
Preferred embodiments of the present invention are described below with reference to the accompanying drawings. It should be understood by those skilled in the art that these embodiments are merely for explaining the technical principles of the present invention, and are not intended to limit the scope of the present invention.
It should be noted that, in the description of the present invention, terms such as "upper," "lower," "left," "right," "inner," "outer," and the like indicate directions or positional relationships based on the directions or positional relationships shown in the drawings, which are merely for convenience of description, and do not indicate or imply that the apparatus or elements must have a specific orientation, be constructed and operated in a specific orientation, and thus should not be construed as limiting the present invention.
Furthermore, it should be noted that, in the description of the present invention, unless explicitly specified and limited otherwise, the terms "mounted," "connected," and "connected" are to be construed broadly, and may be either fixedly connected, detachably connected, or integrally connected, for example; can be mechanically or electrically connected; can be directly connected or indirectly connected through an intermediate medium, and can be communication between two elements. The specific meaning of the above terms in the present invention can be understood by those skilled in the art according to the specific circumstances.
Referring to fig. 1, which is a schematic step diagram of a method for screening a resistor disc combined wave based on a line arrester according to an embodiment of the present invention, the method for screening a resistor disc combined wave based on a line arrester of the present invention includes:
step S1, connecting each resistor to be tested into a parallel circuit, introducing combined square wave current into the parallel circuit, and measuring characteristic parameters of each resistor in real time, wherein the characteristic parameters comprise the temperature of the resistor and voltage data of a passage where the resistor is located;
step S2, a voltage change curve is constructed based on voltage data of a path where each resistor sheet is located, characteristic curve sections of each voltage change curve are collected, difference characterization parameters corresponding to the resistor sheets are calculated by the difference amount of basic parameters in each characteristic curve section, the difference states of each resistor sheet are divided based on the difference characterization parameters, the characteristic curve sections are voltage change curve sections corresponding to the voltage in an ascending trend, and the basic parameters comprise average slope and peak values;
step S3, determining screening modes of the resistor sheets based on the difference states of the resistor sheets, wherein,
under a first preset condition, a first screening action is executed,
under a second preset condition, executing a second screening action after executing the first screening action,
the first preset condition is that the resistor sheets in the first difference state exist, and the resistor sheets in the second difference state do not exist;
the second preset condition is that the resistor disc is in a first difference state and a second difference state;
the first screening action is to acquire a temperature difference coefficient corresponding to a resistor in a first difference state, verify whether the temperature is abnormal based on the temperature difference coefficient, judge that the resistor is abnormal if the temperature is abnormal, and screen out the resistor;
the second screening action is used for obtaining a temperature difference coefficient corresponding to the resistor disc in a second difference state, adjusting the duration time and the peak intensity of the combined square wave current based on the average value of the temperature difference coefficient, returning to the step S1, and introducing the adjusted combined square wave current into the parallel circuit;
and calculating the temperature difference coefficient based on the gradient difference value of the temperature change curve corresponding to each resistor sheet when the voltage is in the rising trend.
Specifically, the mode of introducing the combined wave current is not particularly limited, and in this embodiment, a combined wave generator can be adopted to simulate the combined wave current under the actual working condition of the lightning arrester, and the description is omitted here.
Specifically, the invention does not make specific measurement for the temperature of the resistor and the measurement mode of the voltage of the path, a non-contact temperature sensor can be adopted for measuring the temperature, and a matched voltage test device can be adopted for a person skilled in the art for measuring the voltage, which is the prior art and is not repeated.
Specifically, in the step S2, the difference characterizing parameters corresponding to the resistive patches are calculated according to the formula (1) by extracting the difference amounts of the basic parameters in each of the characteristic curve segments,
in the formula (1), E represents a difference characterization parameter, n represents the total number of the resistor pieces, ki represents the average slope of the characteristic curve segment of the voltage change curve corresponding to the i-th resistor piece, Δk represents the average value of the average slope of each characteristic curve segment, hi represents the peak value of the characteristic curve segment of the voltage change curve corresponding to the i-th resistor piece, and Δh represents the average value of the peak value of the characteristic curve segment.
According to the invention, the difference representing parameters corresponding to the resistance sheet are calculated by extracting the difference of the basic parameters in each characteristic curve section, in the actual situation, the voltage is the basic parameter in the actual operation process of the resistance sheet, the operation state of the resistance sheet can be represented to a certain extent, the resistance sheet with obvious difference between the operation situation and other resistance sheets is determined by calculating the difference representing parameters, further, the subsequent combination temperature verification is facilitated, whether the resistance sheet is abnormal or not is judged, and further, the screening accuracy and reliability are improved.
Specifically, the differential states of the resistor sheets are divided based on the differential characterization parameters, wherein the differential characterization parameters corresponding to the resistor sheets are compared with a preset first parameter comparison threshold value and a preset second parameter comparison threshold value,
under a first preset comparison condition, judging that the resistor disc belongs to a first difference state;
under a second preset comparison condition, judging that the resistance sheet belongs to a second difference state;
under a third preset comparison condition, judging that the resistance sheet belongs to a third difference state;
the first preset comparison condition is that the difference characterization parameter is greater than or equal to the second parameter comparison threshold, the second preset comparison condition is that the difference characterization parameter is smaller than the second parameter comparison threshold and greater than the first parameter comparison threshold, and the third preset comparison condition is that the difference characterization parameter is smaller than the first parameter comparison threshold.
Specifically, in this embodiment, the first parameter comparison threshold E1 and the second parameter comparison threshold E2 are determined by pre-experiments, in which, a plurality of screened resistors meeting the standard are accessed into a parallel circuit to be tested, a combined square wave current is introduced, a difference characterization parameter E of each resistor is calculated, an average value E0 of the difference characterization parameters is solved, e1=α1×e0, e2=α2×e0 is set, α1 is a first precision coefficient 1.1 < α1 < 1.15, α2 is a second precision coefficient, and 1.15 < α2 < 1.3.
According to the invention, the difference states of the resistor sheets are divided based on the difference characterization parameters, in the actual situation, the first difference state characterizes that the difference of the resistor sheets is larger, in such situations, the abnormal state of the resistor sheets can be rapidly and reliably judged by combining temperature verification, in the second difference state, the difference of the resistor sheets is smaller, but partial difference characteristics are reflected, hidden defect characteristics possibly exist, and especially, under the condition of temperature rising, the hidden defect characteristics can be amplified by the change of the properties of the resistor sheets, so that the characteristics cannot be ignored, the combined square wave current is required to be regulated, the hidden characteristics are adaptively excited, the missing of fine defects is avoided, and the screening accuracy and reliability are further improved.
Specifically, in the step S3, the temperature difference coefficient corresponding to the resistor sheet is calculated according to the formula (2) based on the gradient difference amount of the temperature change curve corresponding to each resistor sheet when the voltage is in the rising trend,
in the formula (2), te represents a temperature difference coefficient, n represents the total number of the resistor pieces, ki represents an average slope of the i-th resistor piece corresponding to the temperature change curve in which the voltage is in an upward trend, Δk represents an average value of the average slopes of the respective temperature change curves, hi represents a peak value of the i-th resistor piece corresponding to the temperature change curve in which the voltage is in an upward trend, and Δh represents an average value of the peak values of the respective temperature change curves.
Specifically, in the step S3, whether the temperature is abnormal is verified based on the temperature difference coefficient, wherein,
comparing the temperature difference coefficient with a preset temperature difference coefficient comparison threshold value,
and if the temperature difference coefficient is larger than the temperature difference coefficient comparison threshold value, verifying that the temperature is abnormal.
In this embodiment, the temperature difference coefficient comparison threshold Te0 is obtained by pre-experiment, in which, a plurality of screened out resistors which do not meet the standard are connected into a parallel circuit and are connected into a combined square wave current for testing, the temperature difference coefficient Te corresponding to each resistor is calculated, the average value Δte of the temperature difference coefficients is solved, te 0= Δte×β is set, β represents the temperature precision coefficient, and 0.75 < β < 9.
Specifically, in the step S3, the duration of the combined square wave current is adjusted based on the average value of the temperature difference coefficient, wherein,
a plurality of adjustment modes for adjusting the duration of the combined square wave based on the average value of the temperature difference coefficients are preset, and the adjustment amounts of the adjustment modes on the duration of the combined square wave are different.
In this embodiment, at least three duration adjustment modes are set, wherein,
comparing the average value DeltaTe of the temperature difference coefficient with a first temperature difference coefficient adjustment threshold Te1 and a second temperature difference coefficient adjustment threshold Te2,
if DeltaTe is less than Te1, adopting a first duration adjustment mode to adjust the duration to a first duration T1, and setting T1=T0×t1;
if Te1 is more than or equal to DeltaTe and less than or equal to Te2, adopting a second duration adjustment mode to adjust the duration to a second duration T2, and setting T2=T0×t2;
if DeltaTe is less than Te1, adopting a third duration adjustment mode to adjust the duration to a third duration T3, and setting T3=T0×t3;
wherein T0 represents an initial duration, T1 represents a first duration adjustment coefficient, T2 represents a second duration adjustment coefficient, and T3 represents a third duration adjustment coefficient, 0.1T0 < T1 < 0.15T0 < T2 < 0.25T0T3 < 0.35T0.
Te1 and Te2 are set based on Te0, te1=g1×te0, te2=g2×te0, g1 represents a first difference coefficient, 0.7 < g1 < 0.9,1.1 < g2 < 1.3.
Specifically, in the step S3, the peak intensity of the combined square wave is adjusted based on the average value of the temperature difference coefficient, wherein,
a plurality of adjustment modes for adjusting the peak intensity of the combined square wave based on the average value of the temperature difference coefficients are preset, and the adjustment amounts of the adjustment modes on the peak intensity of the combined square wave are different.
In this embodiment, at least three peak intensity adjustment modes are set, wherein,
comparing the average value DeltaTe of the temperature difference coefficient with a first temperature difference coefficient adjustment threshold Te1 and a second temperature difference coefficient adjustment threshold Te2,
if Δte < Te1, adjusting the intensity peak to a first intensity peak P1 by a first intensity peak adjustment method, and setting p1=p0×p1;
if Te1 is less than or equal to DeltaTe and less than or equal to Te2, adjusting the intensity peak to a first intensity peak P2 by adopting a second intensity peak adjustment mode, and setting P2=P0×p2
If Δte < Te1, the intensity peak is adjusted to a third intensity peak P3 by a third intensity peak adjustment method, and p3=p0×p3 is set
Wherein, P0 represents an initial intensity peak, P1 represents a first intensity adjustment coefficient, P2 represents a second intensity adjustment coefficient, and P3 represents a third intensity adjustment coefficient, 0.1P0 < P1 < 0.14P0 < P2 < 0.18P0 < P3 < 0.2P0.
According to the invention, the duration and the peak intensity of the combined square wave current are adjusted based on the average value of the temperature difference coefficient, in the actual situation, the resistance sheet is partially changed along with the temperature rising property, the fine defect is amplified, and the difference and the temperature change trend are represented to a certain extent by the average value of the temperature difference coefficient, so that the duration and the peak intensity of the combined square wave current are adaptively adjusted based on the temperature difference coefficient, thereby being convenient for adaptively exciting hidden characteristics, avoiding missing the fine defect, and further improving screening accuracy and reliability.
Specifically, only one second screening action is performed during a single screening process.
Specifically, in the step S1, the parallel circuit is the same as the built-in parallel circuit when the line arrester is actually applied.
Specifically, in the step S2, a voltage change curve is constructed based on the case where the voltage changes with time.
Thus far, the technical solution of the present invention has been described in connection with the preferred embodiments shown in the drawings, but it is easily understood by those skilled in the art that the scope of protection of the present invention is not limited to these specific embodiments. Equivalent modifications and substitutions for related technical features may be made by those skilled in the art without departing from the principles of the present invention, and such modifications and substitutions will be within the scope of the present invention.
Claims (10)
1. A screening method of a resistor disc combination wave based on a line lightning arrester is characterized by comprising the following steps:
step S1, connecting each resistor to be tested into a parallel circuit, introducing combined square wave current into the parallel circuit, and measuring characteristic parameters of each resistor in real time, wherein the characteristic parameters comprise the temperature of the resistor and voltage data of a passage where the resistor is located;
step S2, a voltage change curve is constructed based on voltage data of a path where each resistor sheet is located, characteristic curve sections of each voltage change curve are collected, difference characterization parameters corresponding to the resistor sheets are calculated by the difference amount of basic parameters in each characteristic curve section, the difference states of each resistor sheet are divided based on the difference characterization parameters, the characteristic curve sections are voltage change curve sections corresponding to the voltage in an ascending trend, and the basic parameters comprise average slope and peak values;
step S3, determining screening modes of the resistor sheets based on the difference states of the resistor sheets, wherein,
under a first preset condition, a first screening action is executed,
under a second preset condition, executing a second screening action after executing the first screening action,
the first preset condition is that the resistor sheets in the first difference state exist, and the resistor sheets in the second difference state do not exist;
the second preset condition is that the resistor disc is in a first difference state and a second difference state;
the first screening action is to acquire a temperature difference coefficient corresponding to a resistor in a first difference state, verify whether the temperature is abnormal based on the temperature difference coefficient, judge that the resistor is abnormal if the temperature is abnormal, and screen out the resistor;
the second screening action is used for obtaining a temperature difference coefficient corresponding to the resistor disc in a second difference state, adjusting the duration time and the peak intensity of the combined square wave current based on the average value of the temperature difference coefficient, returning to the step S1, and introducing the adjusted combined square wave current into the parallel circuit;
and calculating the temperature difference coefficient based on the gradient difference value of the temperature change curve corresponding to each resistor sheet when the voltage is in the rising trend.
2. The method for screening combined wave of resistor disc based on line arresters according to claim 1, wherein in step S2, the difference characterizing parameters corresponding to the resistor disc are calculated according to formula (1) by extracting the difference amounts of the basic parameters in each of the characteristic curve segments,
in the formula (1), E represents a difference characterization parameter, n represents the total number of the resistor pieces, ki represents the average slope of the characteristic curve segment of the voltage change curve corresponding to the i-th resistor piece, Δk represents the average value of the average slope of each characteristic curve segment, hi represents the peak value of the characteristic curve segment of the voltage change curve corresponding to the i-th resistor piece, and Δh represents the average value of the peak value of the characteristic curve segment.
3. The method for screening combined wave of resistor discs based on line arresters according to claim 2, wherein in the step S2, the differential states of each resistor disc are divided based on the differential characterization parameters, wherein the differential characterization parameters corresponding to the resistor discs are compared with a preset first parameter comparison threshold and a preset second parameter comparison threshold,
under a first preset comparison condition, judging that the resistor disc belongs to a first difference state;
under a second preset comparison condition, judging that the resistance sheet belongs to a second difference state;
under a third preset comparison condition, judging that the resistance sheet belongs to a third difference state;
the first preset comparison condition is that the difference characterization parameter is greater than or equal to the second parameter comparison threshold, the second preset comparison condition is that the difference characterization parameter is smaller than the second parameter comparison threshold and greater than the first parameter comparison threshold, and the third preset comparison condition is that the difference characterization parameter is smaller than the first parameter comparison threshold.
4. The method for screening combined wave of resistive sheets based on line arresters according to claim 1, wherein in the step S3, the temperature difference coefficient corresponding to the resistive sheet is calculated according to the formula (2) based on the gradient difference amount of the temperature change curve corresponding to each resistive sheet when the voltage is in the rising trend,
in the formula (2), te represents a temperature difference coefficient, n represents the total number of the resistor pieces, ki represents an average slope of the i-th resistor piece corresponding to the temperature change curve in which the voltage is in an upward trend, Δk represents an average value of the average slopes of the respective temperature change curves, hi represents a peak value of the i-th resistor piece corresponding to the temperature change curve in which the voltage is in an upward trend, and Δh represents an average value of the peak values of the respective temperature change curves.
5. The method for screening a resistive patch assembly wave based on a line arrestor as recited in claim 4, wherein in the step S3, it is verified whether the temperature is abnormal based on the temperature difference coefficient, wherein,
comparing the temperature difference coefficient with a preset temperature difference coefficient comparison threshold value,
and if the temperature difference coefficient is larger than the temperature difference coefficient comparison threshold value, verifying that the temperature is abnormal.
6. The method for screening combined wave of resistor disc based on line arresters according to claim 1, wherein in the step S3, the duration of the combined square wave current is adjusted based on the average value of the temperature difference coefficient, wherein,
a plurality of adjustment modes for adjusting the duration of the combined square wave based on the average value of the temperature difference coefficients are preset, and the adjustment amounts of the adjustment modes on the duration of the combined square wave are different.
7. The method for screening combined wave of resistor disc based on line arresters according to claim 1, wherein in the step S3, the peak intensity of the combined square wave is adjusted based on the average value of the temperature difference coefficient, wherein,
a plurality of adjustment modes for adjusting the peak intensity of the combined square wave based on the average value of the temperature difference coefficients are preset, and the adjustment amounts of the adjustment modes on the peak intensity of the combined square wave are different.
8. The method of screening a resistive patch based on a line arrestor as defined in claim 1, wherein the second screening action is performed only once during a single screening process.
9. The method for screening a resistive patch composite wave based on a line arrester according to claim 1, wherein in the step S1, the parallel circuit is the same as a built-in parallel circuit when the line arrester is actually applied.
10. The method according to claim 1, wherein in the step S2, the voltage change curve is constructed based on the condition that the voltage changes with time.
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| CN202311071838.5A CN117092447B (en) | 2023-08-24 | 2023-08-24 | Resistor disc combination wave screening method based on line lightning arrester |
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| CN202311071838.5A CN117092447B (en) | 2023-08-24 | 2023-08-24 | Resistor disc combination wave screening method based on line lightning arrester |
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