CN114371324B - Method for measuring source impedance of spike signal generator - Google Patents
Method for measuring source impedance of spike signal generator Download PDFInfo
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- CN114371324B CN114371324B CN202111468554.0A CN202111468554A CN114371324B CN 114371324 B CN114371324 B CN 114371324B CN 202111468554 A CN202111468554 A CN 202111468554A CN 114371324 B CN114371324 B CN 114371324B
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- 238000000034 method Methods 0.000 title claims abstract description 32
- 230000001939 inductive effect Effects 0.000 claims abstract description 71
- 239000000523 sample Substances 0.000 claims abstract description 28
- 239000000758 substrate Substances 0.000 claims 1
- 238000005259 measurement Methods 0.000 description 12
- 238000010586 diagram Methods 0.000 description 5
- 238000012360 testing method Methods 0.000 description 4
- 238000004832 voltammetry Methods 0.000 description 4
- 238000002847 impedance measurement Methods 0.000 description 3
- 238000007796 conventional method Methods 0.000 description 2
- 238000000691 measurement method Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
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Abstract
The embodiment of the invention discloses a method for measuring the source impedance of a spike signal generator, which comprises the following steps: s10, connecting a first measuring loop, wherein the first measuring loop comprises a spike signal generator, a first noninductive resistor, a voltage probe and an oscilloscope; s20, adjusting the voltage value of the spike signal generator to be a preset voltage value; s30, measuring a first voltage value generated on the first non-inductive resistor by the oscilloscope; s40, connecting a second measuring loop, wherein the second measuring loop comprises a spike signal generator, a first non-inductive resistor, a second non-inductive resistor, a voltage probe and an oscilloscope, and the first non-inductive resistor and the second non-inductive resistor are connected in parallel to form a non-inductive resistor assembly; s50, the oscilloscope measures a second voltage value generated on the non-inductive resistance component; s60, calculating the source impedance of the spike generator, wherein,Wherein Z is the source impedance of the spike generator; u 1 is a first voltage value; u 2 is a second voltage value, with the unit being V; r 1 is the resistance value of the first non-inductive resistor; r 2 is the resistance value of the second non-inductive resistor.
Description
Technical Field
The invention relates to the technical field of signal generators. And more particularly to a method of measuring spike generator source impedance.
Background
The spike generator is used for a CS106 power line spike conduction sensitivity test in GJB151B-2013 to test the capability of tested equipment to bear spike signals applied to the power line and evaluate the performance of military equipment or subsystems when the military equipment or subsystems are interfered by spike signals. The peak voltage is caused by circuit conversion and has the duration of microsecond, and the peak voltage is characterized by short duration, steep voltage rising edge and high peak value, and has great harm to an electric system, and military, aerospace and aviation airborne equipment always looks at the test of the peak voltage very much, so that a peak signal generator is widely used in electromagnetic compatibility tests.
At this stage, there are equivalent impedance methods and voltammetry for the spike generator source impedance measurement method, wherein the voltammetry measurement schematic block diagram is shown in fig. 1. The open circuit voltage is measured by an oscilloscope, then the short circuit current is measured by a current probe, and the peak signal generator source impedance is calculated by the measured voltage value and the short circuit current value. The calculation formula is as follows:
The existing measurement method for the spike generator source impedance is briefly described below.
In order to realize the measurement of the source impedance of the spike generator, the direct measurement is usually carried out by adopting the voltammetry, the open-circuit voltage is measured by using an oscilloscope firstly during the measurement, then the short-circuit current is measured by using a current probe, and the source impedance of the spike generator is calculated according to the measured voltage value and the short-circuit current value.
Disclosure of Invention
To solve at least one of the above problems, the present application proposes a method of measuring a spike generator source impedance, the method comprising:
s10, connecting a first measuring loop, wherein the first measuring loop comprises a spike signal generator, a first noninductive resistor, a voltage probe and an oscilloscope;
s20, adjusting the voltage value of the spike signal generator to be a preset voltage value;
s30, the oscilloscope measures a first voltage value generated by the spike signal generator on the first non-inductive resistor;
S40, connecting a second measuring loop, wherein the second measuring loop comprises the spike signal generator, the first non-inductive resistor, a second non-inductive resistor, the voltage probe and the oscilloscope, and the first non-inductive resistor and the second non-inductive resistor are connected in parallel to form a non-inductive resistor component;
s50, the oscilloscope measures a second voltage value generated by the spike signal generator on the non-inductive resistance component;
s60, calculating the source impedance of the spike generator, wherein,
Wherein Z is the source impedance of the spike signal generator and the unit is omega; u 1 is the first voltage value, and the unit is V; u 2 is a second voltage value, with the unit being V; r 1 is the resistance value of the first non-inductive resistor, and the unit is omega; r 2 is the resistance value of the second non-inductive resistor, and the unit is omega.
In a specific embodiment, the output end of the spike signal generator is connected with the first end of the first non-inductive resistor, the second end of the first non-inductive resistor is connected with the input end of the voltage probe, and the output end of the voltage probe is connected with the oscilloscope.
In a specific embodiment, the output end of the spike signal generator is connected with the first end of the non-inductive resistance component, the second end of the non-inductive resistance component is connected with the input end of the voltage probe, and the output end of the voltage probe is connected with the oscilloscope.
In a specific embodiment, the preset voltage value is 200V or 400V.
In a specific embodiment, the source impedance of the spike generator has an impedance value of 2 Ω or less.
In a specific embodiment, the method further comprises:
and starting up and preheating the spike signal generator and the oscilloscope so as to stabilize the internal temperatures of the spike signal generator and the oscilloscope.
In one particular embodiment, the spike generator is model 2854-1.
In one particular embodiment, the oscilloscope model is DPO4104.
In one embodiment, the voltage probe is of model P5100A and the first non-inductive resistor and the second non-inductive resistor are of model 8525-1.
The beneficial effects of the invention are as follows:
Aiming at the existing problems at present, the application provides a method for measuring the source impedance of the spike signal generator, which effectively avoids the influence of factors such as devices, circuit distribution parameters, short-circuit current and the like, and solves the problems that the service life of the spike signal generator is influenced and even the spike signal generator is damaged; compared with the conventional method, the method has better adaptability and integrity for measuring the source impedance of the spike signal generator.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings required for the description of the embodiments will be briefly described below, and it is apparent that the drawings in the following description are only some embodiments of the present invention, and other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
Fig. 1 shows a schematic diagram of prior art measurement of source impedance using voltammetry.
Fig. 2 shows a flow diagram of a method of measuring a spike generator source impedance according to an embodiment of the application.
Fig. 3 shows a schematic diagram of a first measurement loop according to an embodiment of the application.
Fig. 4 shows a schematic diagram of a second measurement loop according to an embodiment of the application.
Detailed Description
In order to make the technical scheme and advantages of the present invention more apparent, embodiments of the present invention will be described in further detail with reference to the accompanying drawings.
The existing measuring method of the source impedance of the spike signal generator mainly adopts a volt-ampere method, and in the actual measuring process, the service life of the spike signal generator can be influenced, even the spike signal generator can be damaged due to the influence of factors such as devices, circuit distribution parameters, pulse current and the like when short-circuit current is measured, and measurement deficiency exists.
To this end, an embodiment of the present application proposes a method for measuring a spike generator source impedance, which mainly uses an oscilloscope, a voltage probe and a non-inductive resistor to implement the measurement of the spike generator source impedance, as shown in fig. 2, the method includes:
S10, connecting a first measuring loop, wherein the first measuring loop comprises a spike signal generator, a first noninductive resistor, a voltage probe and an oscilloscope.
In a specific example, as shown in fig. 3, the output end of the spike signal generator is connected to a first end of a first non-inductive resistor, a second end of the first non-inductive resistor is connected to the input end of the voltage probe, and the output end of the voltage probe is connected to the oscilloscope, wherein the resistance value of the first non-inductive resistor is R 1.
S20, adjusting the voltage value of the spike signal generator to be a preset voltage value.
In a specific example, the preset voltage value is the output voltage of the spike generator, wherein the preset voltage value is 200V or 400V. It should be noted that 200V or 400V is exemplary, and does not constitute undue limitation on the output voltage of the spike generator, and those skilled in the art can set a corresponding preset voltage value according to actual situations.
S30, the oscilloscope measures a first voltage value generated by the spike signal generator on the first non-inductive resistor;
And S40, connecting a second measuring loop, wherein the second measuring loop comprises the spike signal generator, the first non-inductive resistor, the second non-inductive resistor, the voltage probe and the oscilloscope, and the first non-inductive resistor and the second non-inductive resistor are connected in parallel to form a non-inductive resistor assembly.
In a specific example, as shown in fig. 4, the output end of the spike signal generator is connected to the first end of the non-inductive resistor component, the second end of the non-inductive resistor component is connected to the input end of the voltage probe, and the output end of the voltage probe is connected to the oscilloscope, where the resistance value of the second non-inductive resistor is R 2.
Wherein the model of the spike signal generator is 2854-1; the model of the oscilloscope is DPO4104; the voltage probe is of the type P5100A, and the first non-inductive resistor and the second non-inductive resistor are of the type 8525-1.
The above-mentioned device model is exemplary, and does not constitute undue limitation on the device model, and those skilled in the art can select a spike generator, an oscilloscope, a voltage probe, a first non-inductive resistor, and a second non-inductive resistor of corresponding models according to actual situations.
S50, the oscilloscope measures a second voltage value generated by the spike signal generator on the non-inductive resistance component;
s60, calculating the source impedance of the spike signal generator, wherein the source impedance of the spike signal generator has an impedance value less than or equal to 2Ω, specifically,
In the formula (1), Z is the source impedance of the spike signal generator, and the unit is omega; u 1 is the first voltage value, and the unit is V; u 2 is the 2 nd voltage value, the unit is V; r 1 is the resistance value of the first non-inductive resistor, and the unit is omega; r 2 is the resistance value of the second non-inductive resistor, and the unit is omega.
It should be apparent to those skilled in the art that the method for measuring the source impedance of the spike generator according to the present embodiment further includes preheating the spike generator and the oscilloscope at power-on to stabilize the internal temperatures of the spike generator and the oscilloscope, thereby completing the subsequent measurement.
The measurement method of the present embodiment will be described below taking the first non-inductive resistor R 1 as 5Ω and the second non-inductive resistor R 2 as 5Ω as an example:
An oscilloscope model DPO4104, a voltage probe model P5100A, a first non-inductive resistor of 5 omega model 8525-1 and a second non-inductive resistor were selected to measure the source impedance of a spike generator model 2854-1.
According to the method, a first measuring loop is connected as shown in fig. 3, the voltage value of the spike signal generator is slowly adjusted to a preset voltage value, the voltage U 1 of the spike signal generator on a first non-inductive resistor of 5 ohms is measured by an oscilloscope, namely, the first voltage value, further, the first non-inductive resistor and a second non-inductive resistor are connected in parallel, a second measuring loop is connected as shown in fig. 4, and after 2 non-inductive resistors of 5 ohms are measured by the oscilloscope in parallel, the voltage U 2 of the spike signal generator is measured, namely, the second voltage value. Wherein the preset voltage value is 200V or 400V. Further, substituting the values of R 1、R2、U1 and U 2 into equation (1) yields spike generator source impedance measurement data as shown in table 1:
TABLE 1
As can be seen from the data in table 1, under different voltages, namely different preset voltages, the measured values of the source impedance of the spike signal generator (namely 1.43 Ω and 1.45 Ω) of the model are compared with the source impedance value required in the standard of GJB151B-2013 to be less than 2 Ω, thereby meeting the use requirement of the standard of GJB151B-2013, further proving that the source impedance of the spike signal generator meets the theoretical requirement well, and verifying the rationality and the integrity of the measuring method of the invention.
In an alternative example, the resistance value R 1 of the first non-inductive resistor is infinity, i.e. R 1 = infinity, and in actual operation, i.e. the first measurement loop is not connected to the first non-inductive resistor, the open-circuit output voltage of the spike signal generator is measured to be U 1, i.e. the first voltage value by using an oscilloscope; further, a second non-inductive resistor connected to 5Ω forms a second measurement loop, i.e. R 2＝5Ω,R1 = infinity (regarded as an open circuit), and the voltage U 2, i.e. the second voltage value, of the spike generator output voltage on the second non-inductive resistor of 5Ω is measured with an oscilloscope.
Further, substituting the values of R 1、R2、U1 and U 2 into equation (1) yields spike generator source impedance measurement data as shown in table 2:
TABLE 2
As can be seen from the data in table 2, under different voltages, namely different preset voltages, the measured value of the source impedance of the spike generator (namely 1.44 Ω and 1.45 Ω) and the source impedance value required in the GJB151B-2013 standard are compared to be less than 2 Ω, so that the use requirement of the GJB151B-2013 standard is met, the source impedance of the spike generator is further proved to be well in accordance with the theoretical requirement, and the rationality and the integrity of the measuring method are verified.
Aiming at the existing problems at present, the application provides a method for measuring the source impedance of the spike signal generator, which effectively avoids the influence of factors such as devices, circuit distribution parameters, short-circuit current and the like, and solves the problems that the service life of the spike signal generator is influenced and even the spike signal generator is damaged; compared with the conventional method, the method has better adaptability and integrity for measuring the source impedance of the spike signal generator.
It should be understood that the foregoing examples of the present invention are provided merely for clearly illustrating the present invention and are not intended to limit the embodiments of the present invention, and that various other changes and modifications may be made therein by one skilled in the art without departing from the spirit and scope of the present invention as defined by the appended claims.
Claims (9)
1. A method of measuring a spike generator source impedance, comprising:
s10, connecting a first measuring loop, wherein the first measuring loop comprises a spike signal generator, a first noninductive resistor, a voltage probe and an oscilloscope;
s20, adjusting the voltage value of the spike signal generator to be a preset voltage value;
s30, the oscilloscope measures a first voltage value generated by the spike signal generator on the first non-inductive resistor;
S40, connecting a second measuring loop, wherein the second measuring loop comprises the spike signal generator, the first non-inductive resistor, a second non-inductive resistor, the voltage probe and the oscilloscope, and the first non-inductive resistor and the second non-inductive resistor are connected in parallel to form a non-inductive resistor component;
s50, the oscilloscope measures a second voltage value generated by the spike signal generator on the non-inductive resistance component;
s60, calculating the source impedance of the spike generator, wherein,
Wherein Z is the source impedance of the spike signal generator and the unit is omega; u 1 is the first voltage value, and the unit is V; u 2 is a second voltage value, with the unit being V; r 1 is the resistance value of the first non-inductive resistor, and the unit is omega; r 2 is the resistance value of the second non-inductive resistor, and the unit is omega.
2. The method of claim 1, wherein the output of the spike generator is connected to a first end of a first non-inductive resistor, a second end of the first non-inductive resistor is connected to an input of the voltage probe, and an output of the voltage probe is connected to the oscilloscope.
3. The method of claim 1, wherein the step of determining the position of the substrate comprises,
The output end of the spike signal generator is connected with the first end of the non-inductive resistance component, the second end of the non-inductive resistance component is connected with the input end of the voltage probe, and the output end of the voltage probe is connected with the oscilloscope.
4. The method of claim 1, wherein the predetermined voltage value is 200V or 400V.
5. The method of claim 1, wherein the source impedance of the spike generator has an impedance value of 2 Ω or less.
6. The method as recited in claim 1, further comprising:
and starting up and preheating the spike signal generator and the oscilloscope so as to stabilize the internal temperatures of the spike signal generator and the oscilloscope.
7. The method of claim 1, wherein the spike generator is model 2854-1.
8. The method of claim 1, wherein the oscilloscope is model number DPO4104.
9. The method of claim 1, wherein the voltage probe is model P5100A and the first non-inductive resistor and the second non-inductive resistor are model 8525-1.
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| CN106324450A (en) * | 2016-08-05 | 2017-01-11 | 中国电力科学研究院 | Characteristic impedance matching method in cable transmission attenuation characteristic test |
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| EP2620114A1 (en) * | 2012-01-27 | 2013-07-31 | Covidien LP | Systems and methods for phase predictive impedance loss model calibration and compensation |
| CN103222892A (en) * | 2012-01-27 | 2013-07-31 | 科维蒂恩有限合伙公司 | Systems and methods for phase predictive impedance loss model calibration and compensation |
| CN106324450A (en) * | 2016-08-05 | 2017-01-11 | 中国电力科学研究院 | Characteristic impedance matching method in cable transmission attenuation characteristic test |
| CN110346054A (en) * | 2019-06-14 | 2019-10-18 | 东南大学 | A kind of single photon difference detecting circuit inhibiting gate spike noise using semifixed resistor structure |
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