CN117007300A - Method and device for testing passive electronic lock, electronic equipment and storage medium - Google Patents

Method and device for testing passive electronic lock, electronic equipment and storage medium Download PDF

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Publication number
CN117007300A
CN117007300A CN202311017963.8A CN202311017963A CN117007300A CN 117007300 A CN117007300 A CN 117007300A CN 202311017963 A CN202311017963 A CN 202311017963A CN 117007300 A CN117007300 A CN 117007300A
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China
Prior art keywords
electronic lock
passive electronic
testing
test
lock
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CN202311017963.8A
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Chinese (zh)
Inventor
黎世滨
樊俊超
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Shenzhen Meikai Innovation Technology Co ltd
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Shenzhen Meikai Innovation Technology Co ltd
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Priority to CN202311017963.8A priority Critical patent/CN117007300A/en
Publication of CN117007300A publication Critical patent/CN117007300A/en
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M13/00—Testing of machine parts
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D21/00—Measuring or testing not otherwise provided for
    • G01D21/02—Measuring two or more variables by means not covered by a single other subclass
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02D—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN INFORMATION AND COMMUNICATION TECHNOLOGIES [ICT], I.E. INFORMATION AND COMMUNICATION TECHNOLOGIES AIMING AT THE REDUCTION OF THEIR OWN ENERGY USE
    • Y02D30/00—Reducing energy consumption in communication networks
    • Y02D30/70—Reducing energy consumption in communication networks in wireless communication networks

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Lock And Its Accessories (AREA)

Abstract

The application provides a method, a device, electronic equipment and a storage medium for testing a passive electronic lock, wherein the method for testing the passive electronic lock comprises the following steps: determining a lockset test parameter according to the equipment identification information of the passive electronic lock, wherein the lockset test parameter comprises at least one of pressing force, pressing stroke, pressing time interval and pressing times; determining signal transmission parameters of the NFC transmission module according to the equipment identification information and the lockset test parameters; transmitting a radio frequency signal through the NFC transmitting module according to the signal transmitting parameter to charge the passive electronic lock; and testing the passive electronic lock according to the lockset testing parameters and the charging electric quantity of the passive electronic lock. According to the technical scheme, the passive electronic lock is automatically tested through the electronic equipment, and the testing efficiency of the passive electronic lock is provided.

Description

Method and device for testing passive electronic lock, electronic equipment and storage medium
Technical Field
The application relates to the technical field of passive NFC control, in particular to a method and a device for testing a passive electronic lock, electronic equipment and a storage medium (computer readable storage medium).
Background
At present, with the development of the field of passive NFC ((Near Field Communication, near field communication) devices, logistics industries such as express delivery and co-city distribution begin to use passive NFC devices to replace existing common devices.
Disclosure of Invention
The embodiment of the application provides a method, a device, electronic equipment and a storage medium for testing a passive electronic lock, which aim to solve the problems that the conventional passive electronic lock in the prior art is different in form, needs to be tested manually and is very inconvenient to test.
In one aspect, an embodiment of the present application provides a method for testing a passive electronic lock, which is applied to an electronic device, where the electronic device is in communication connection with the passive electronic lock, the electronic device is provided with an NFC transmitting module, and the passive electronic lock is provided with an NFC receiving module;
The testing method of the passive electronic lock comprises the following steps:
determining a lockset test parameter according to the equipment identification information of the passive electronic lock, wherein the lockset test parameter comprises at least one of pressing force, pressing stroke, pressing time interval and pressing times;
determining signal transmission parameters of the NFC transmission module according to the equipment identification information and the lockset test parameters;
transmitting a radio frequency signal through the NFC transmitting module according to the signal transmitting parameter to charge the passive electronic lock;
and testing the passive electronic lock according to the lockset testing parameters and the charging electric quantity of the passive electronic lock.
In one possible implementation manner of the present application, the determining, according to the device identification information of the passive electronic lock, a lock test parameter includes:
inquiring a preset parameter mapping table, and acquiring pressing force, pressing stroke, pressing time interval and pressing times corresponding to the equipment identification information;
and setting the pressing force, the pressing stroke, the pressing time interval and the pressing times as lockset test parameters.
In one possible implementation manner of the present application, the determining, according to the device identification information and the lock test parameter, a signal transmission parameter of the NFC transmission module includes:
Inquiring a preset emission parameter mapping table, and acquiring an emission position parameter corresponding to the antenna position of an NFC receiving module in the passive electronic lock;
obtaining the transmitting duration of the NFC transmitting module according to the pressing time interval in the lockset testing parameter;
and obtaining the signal transmission intensity of the NFC transmission module according to the transmission duration and the preset electric quantity threshold corresponding to the equipment identification information, and taking the transmission position parameter and the signal transmission intensity as signal transmission parameters.
In one possible implementation manner of the present application, the testing the passive electronic lock according to the lock testing parameter and the charging capacity of the passive electronic lock includes:
if the charged electric quantity is detected to be larger than a preset electric quantity threshold value corresponding to the equipment identification information, an unlocking instruction is sent, and unlocking state information is acquired through a preset proximity sensor;
if the unlocking state information of the passive electronic lock is that the unlocking is successful, inquiring a preset driving data table, and acquiring driving power corresponding to the pressing force in the lockset test parameters;
and controlling the test assembly to run according to the driving power and the pressing stroke, and testing the passive electronic lock.
In one possible implementation manner of the present application, after the unlocking instruction is sent and the unlocking state information is acquired through the preset proximity sensor if the charging electric quantity is detected to be greater than the preset electric quantity threshold corresponding to the equipment identification information, the method includes:
if the unlocking state information of the passive electronic lock is unlocking failure, secondarily sending an unlocking instruction, and adjusting the unlocking passing rate of the passive electronic lock;
outputting an unlocking failure prompt until the unlocking passing rate of the passive electronic lock is lower than a preset passing rate threshold value or the unlocking failure times of the passive electronic lock exceeds a preset first threshold value.
In one possible implementation manner of the present application, after the passive electronic lock is tested according to the lock test parameter and the charging capacity of the passive electronic lock, the method includes:
acquiring the test times of the passive electronic lock;
outputting a command for passing the service life test of the passive electronic lock if the test times exceed a preset second threshold value;
if the test times do not exceed the preset second threshold value, detecting fault information of the element information of the passive electronic lock, and outputting a maintenance prompt.
In one possible implementation manner of the present application, after the passive electronic lock is tested according to the lock test parameter and the charging capacity of the passive electronic lock, the method includes:
obtaining test result information of each target passive electronic lock of the production batch corresponding to the equipment identification information;
and counting the test passing times and the test failing times in the test result information to obtain the test passing rate and average service life information of the production batch of the passive electronic locks.
In another aspect, the present application provides a testing apparatus for a passive electronic lock, including:
the first determining module is used for determining lockset testing parameters according to the equipment identification information of the passive electronic lock, wherein the lockset testing parameters comprise at least one of pressing force, pressing stroke, pressing time interval and pressing times;
the second determining module is used for determining signal transmission parameters of the NFC transmitting module according to the equipment identification information and the lockset test parameters;
the charging module is used for transmitting radio frequency signals through the NFC transmitting module according to the signal transmitting parameters and charging the passive electronic lock;
And the testing module is used for testing the passive electronic lock according to the lockset testing parameters and the charging quantity of the passive electronic lock.
On the other hand, the application also provides electronic equipment which is in communication connection with the passive electronic lock, and the electronic equipment is provided with an NFC transmitting module; the electronic equipment supplies power to the passive electronic lock through the NFC transmitting module and executes test operation;
the electronic device includes:
one or more processors;
a memory; and
one or more applications, wherein the one or more applications are stored in the memory and configured to be executed by the processor to implement the steps of the method of testing a passive electronic lock described above.
In another aspect, the present application also provides a computer readable storage medium having stored thereon a computer program, the computer program being loaded by a processor to perform the steps of the method for testing a passive electronic lock.
The method for testing the passive electronic lock in the embodiment of the application comprises the following steps: determining a lockset test parameter according to the equipment identification information of the passive electronic lock, wherein the lockset test parameter comprises at least one of pressing force, pressing stroke, pressing time interval and pressing times; determining signal transmission parameters of the NFC transmission module according to the equipment identification information and the lockset test parameters; transmitting a radio frequency signal through the NFC transmitting module according to the signal transmitting parameter to charge the passive electronic lock; and testing the passive electronic lock according to the lockset testing parameters and the charging electric quantity of the passive electronic lock. According to the technical scheme, the lock testing parameters are determined according to the equipment identification information of the passive electronic lock, so that the passive electronic lock is charged and tested according to the lock testing parameters, the passive electronic lock is automatically tested by the electronic equipment, and the testing efficiency of the passive electronic lock is improved.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings that are needed in the description of the embodiments will be briefly described below, it being obvious that the drawings in the following description are only some embodiments of the present application, and that other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
Fig. 1 is a schematic view of a testing method of a passive electronic lock according to an embodiment of the present application;
FIG. 2 is a flow chart of an embodiment of a method for testing a passive electronic lock according to an embodiment of the present application;
FIG. 3 is a flowchart of an embodiment of acquiring lock test parameters in the method for testing a passive electronic lock according to an embodiment of the present application;
FIG. 4 is a schematic flow chart of an embodiment of a passive electronic lock test in the method for testing a passive electronic lock according to the embodiment of the present application;
FIG. 5 is a flow chart of an embodiment of a passive electronic lock life test in a method for testing a passive electronic lock according to an embodiment of the present application;
FIG. 6 is a schematic structural diagram of an embodiment of a testing device for a passive electronic lock according to an embodiment of the present application;
Fig. 7 is a schematic structural diagram of an embodiment of a passive electronic lock according to an embodiment of the present application.
Detailed Description
The following description of the embodiments of the present application will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present application, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the application without making any inventive effort, are intended to fall within the scope of the application.
In the description of the present application, it should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", etc. indicate orientations or positional relationships based on the drawings are merely for convenience in describing the present application and simplifying the description, and do not indicate or imply that the apparatus or elements referred to must have a specific orientation, be configured and operated in a specific orientation, and thus should not be construed as limiting the present application. Furthermore, the terms "first," "second," and the like, are used for descriptive purposes only and are not to be construed as indicating or implying a relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defining "a first" or "a second" may explicitly or implicitly include one or more of the described features. In the description of the present application, the meaning of "a plurality" is two or more, unless explicitly defined otherwise.
In the present application, the term "exemplary" is used to mean "serving as an example, instance, or illustration. Any embodiment described as "exemplary" in this disclosure is not necessarily to be construed as preferred or advantageous over other embodiments. The following description is presented to enable any person skilled in the art to make and use the application. In the following description, details are set forth for purposes of explanation. It will be apparent to one of ordinary skill in the art that the present application may be practiced without these specific details. In other instances, well-known structures and processes have not been described in detail so as not to obscure the description of the application with unnecessary detail. Thus, the present application is not intended to be limited to the embodiments shown, but is to be accorded the widest scope consistent with the principles and features disclosed herein.
At present, with the development of the field of passive NFC ((Near Field Communication, near field communication) equipment, logistics industries such as express delivery, co-city distribution and the like begin to use passive NFC equipment to replace existing common equipment.
Based on the above, the application provides a method, a device, equipment and a computer readable storage medium for testing a passive electronic lock, so as to solve the technical problem of poor communication security of the passive electronic lock in the prior art.
The testing method of the passive electronic lock is applied to the testing device of the passive electronic lock, the testing device of the passive electronic lock is arranged in the passive electronic lock, one or more processors, a memory and one or more application programs are arranged in the passive electronic lock, and the one or more application programs are stored in the memory and are configured to be executed by the processor to implement the testing method of the passive electronic lock; the passive electronic lock is intelligent lock equipment provided with an NFC receiving module and a target lock assembly, wherein the NFC receiving module comprises an NFC receiving module, a processor, a memory and a power supply capacitor.
As shown in fig. 1, fig. 1 is a schematic view of a scenario of a testing method of a passive electronic lock according to an embodiment of the present application, where the testing scenario of the passive electronic lock includes a passive electronic lock 100 (a testing device of the passive electronic lock is integrated in the passive electronic lock 100) and an electronic device 200, and a computer readable storage medium corresponding to the testing method of the passive electronic lock is run in the passive electronic lock 100, so as to execute steps of the testing method of the passive electronic lock. The electronic device 200 performs near field communication with the passive electronic lock 100 to drive an intelligent terminal in the passive electronic lock, and optionally, the electronic device 200 may be a mobile phone, a tablet computer, a smart watch, a smart bracelet, or other wearable intelligent devices.
It may be understood that the passive electronic lock in the scenario of the testing method of the passive electronic lock shown in fig. 1, or the device included in the passive electronic lock, is not limited to the embodiment of the present invention, that is, the number of devices and the type of devices included in the scenario of the testing method of the passive electronic lock, or the number of devices and the type of devices included in each device do not affect the overall implementation of the technical solution in the embodiment of the present invention, and may be calculated as equivalent replacement or derivative of the technical solution claimed in the embodiment of the present invention.
The passive electronic lock 100 in the embodiment of the invention is mainly used for: determining a lockset test parameter according to the equipment identification information of the passive electronic lock, wherein the lockset test parameter comprises at least one of pressing force, pressing stroke, pressing time interval and pressing times; determining signal transmission parameters of the NFC transmission module according to the equipment identification information and the lockset test parameters; transmitting a radio frequency signal through the NFC transmitting module according to the signal transmitting parameter to charge the passive electronic lock; and testing the passive electronic lock according to the lockset testing parameters and the charging electric quantity of the passive electronic lock.
The passive electronic lock 100 in the embodiment of the present application may be an independent passive electronic lock, or may be a test network of a passive electronic lock or a test cluster of a passive electronic lock, which is composed of a plurality of passive electronic locks.
The embodiment of the application provides a method, a device, equipment and a computer readable storage medium for testing a passive electronic lock, and the method, the device and the equipment are respectively described in detail below.
It will be understood by those skilled in the art that the application environment shown in fig. 1 is only one application scenario related to the present application, and is not limited to the application scenario of the present application, and other application environments may also include more or fewer passive electronic locks than those shown in fig. 1, or a test network connection relationship of a passive electronic lock, for example, only one passive electronic lock is shown in fig. 1, and it is understood that a scenario of a test method of the passive electronic lock may also include one or more passive electronic locks, which is not limited herein in particular; a memory may also be included in the passive electronic lock 100 for storing sensor data and other data.
It should be noted that, the schematic view of the scenario of the testing method of the passive electronic lock shown in fig. 1 is only an example, and the scenario of the testing method of the passive electronic lock described in the embodiment of the present application is for more clearly describing the technical solution of the embodiment of the present application, and does not constitute a limitation to the technical solution provided by the embodiment of the present application.
Based on the above-mentioned scenario of the testing method of the passive electronic lock, various embodiments of the testing method of the passive electronic lock disclosed by the application are provided.
As shown in fig. 2, fig. 2 is a flow chart of an embodiment of a testing method of a passive electronic lock according to an embodiment of the present application, where the testing method of the passive electronic lock includes the following steps 201 to 204:
201. determining a lockset test parameter according to the equipment identification information of the passive electronic lock, wherein the lockset test parameter comprises at least one of pressing force, pressing stroke, pressing time interval and pressing times;
the testing method of the passive electronic lock is applied to electronic equipment, the electronic equipment is in communication connection with the passive electronic lock, the electronic equipment is provided with an NFC transmitting module, and the passive electronic lock is provided with an NFC receiving module;
the type and the number of the passive electronic locks are not particularly limited, that is, the passive electronic locks can be intelligent lock devices which are not provided with power supply inside and are powered by the passive electronic locks after being communicated with the NFC transmitting module on the electronic device through the NFC receiving module so as to execute switching lock or data interaction. In a specific embodiment, the passive electronic lock is a passive NFC electronic lock based on an NFC receiving module. Specifically, the passive electronic lock is configured to lock a specified packaging box, a cabinet or a door, detect electronic equipment close to the passive electronic lock, charge a power supply capacitor in the passive electronic lock through a built-in NFC receiving module, and output electric energy according to the capacitance electric quantity of the power supply capacitor to supply the passive electronic lock, so that the passive electronic lock can execute unlocking, locking and other interactive functions.
Specifically, the passive electronic lock in the embodiment of the application comprises an NFC receiving module and a target lock component, where the NFC receiving module includes the following components:
1. the NFC receiving module is used for detecting the electronic equipment, performing near field communication with the electronic equipment when the electronic equipment is close to the electronic equipment, acquiring radio frequency signals of the electronic equipment, and performing radio frequency signal conversion to charge a capacitor in the passive electronic lock.
2. And the processor is used for detecting the capacitance electric quantity, adjusting the data acquisition frequency of the sensor according to the capacitance electric quantity, checking the user identity information, and outputting target sensing data corresponding to the user identity information to the electronic screen for display.
3. And the memory is used for storing the communication protocol and other preset information.
4. And the power supply capacitor is used for storing electric quantity and supplying power for the passive electronic lock.
Alternatively, each component in the passive electronic lock is not limited by the embodiment, and a person skilled in the art may set more or less components according to practical application requirements, for example, when the passive electronic lock is applied to logistics transportation, a plurality of sensors are set to detect the express mail transportation condition in the logistics box locked by the passive electronic lock.
The passive electronic lock test device is applied to electronic equipment, and comprises a processor, a memory and a test component which interacts with the passive electronic lock, wherein the test component comprises a passive NFC emission module, a driver, a proximity sensor, a pressing module and the like.
The electronic equipment queries a preset parameter mapping table, lockset test parameters corresponding to different equipment identification information are stored in the preset parameter mapping table in advance, and the equipment identification information refers to identification information for uniquely identifying the passive lockset, such as the number of the passive lockset; specifically, the method comprises the following steps:
1. inquiring a preset parameter mapping table, and acquiring pressing force, pressing stroke, pressing time interval and pressing times corresponding to the equipment identification information;
2. and setting the pressing force, the pressing stroke, the pressing time interval and the pressing times as lockset test parameters.
According to the embodiment of the application, the electronic equipment determines the lockset test parameters according to the equipment identification information, and can supply power to the passive electronic lock according to the lockset test parameters and perform test operation, in particular:
202. and determining signal transmission parameters of the NFC transmission module according to the equipment identification information and the lockset test parameters.
According to the embodiment of the application, the electronic equipment determines the rated electric quantity of the passive electronic lock according to the equipment identification information; the electronic equipment determines the charging time length of the passive electronic lock according to the test time interval in the lockset test parameters, and the electronic equipment determines the signal emission parameters of the NFC emission module according to the rated electric quantity, the NFC receiving module position information and the charging time length; wherein the signal transmission parameters include: the signal emission intensity, the signal emission duration, the signal emission direction and the like.
203. And transmitting a radio frequency signal through the NFC transmitting module according to the signal transmitting parameter, and charging the passive electronic lock.
Specifically, the electronic equipment transmits radio frequency signals according to the signal transmission parameters through the NFC transmission module, the passive electronic lock detects the radio frequency signals through the NFC receiving module, near field communication is performed, radio frequency signal conversion is performed through the NFC receiving module, and the power supply capacitor in the passive electronic lock is charged through the converted radio frequency signals, so that the passive electronic lock can be powered without setting a power supply in the passive electronic lock.
Optionally, in a specific embodiment, the electronic device and the passive electronic lock perform near field communication, the NFC receiving module performs radio frequency signal conversion on a radio frequency signal after receiving the radio frequency signal transmitted by the electronic device, so as to obtain converted electric energy generated by the radio frequency signal, rectifies and stabilizes the converted electric energy, generates direct current electric energy, and inputs the direct current electric energy into a power supply capacitor in the NFC receiving module for charging. Optionally, the electronic device is an intelligent terminal pre-bound to the passive electronic lock, and optionally, in a specific embodiment, the electronic device includes an intelligent terminal such as a mobile phone, a tablet computer, and a smart watch, and may perform a passive electronic lock test operation.
204. And testing the passive electronic lock according to the lockset testing parameters and the charging electric quantity of the passive electronic lock.
The method comprises the steps that electronic equipment obtains the charging electric quantity of a passive electronic lock, and the electronic equipment compares the charging electric quantity with a preset electric quantity threshold, wherein the preset electric quantity threshold is the minimum electric quantity for unlocking the passive electronic lock; if the charged electric quantity is not higher than the preset electric quantity threshold value, a test delay prompt is sent; if the charging electric quantity is higher than the preset electric quantity threshold value, the electronic equipment tests the passive electronic lock according to the lockset test parameter, namely, the electronic equipment detects that the charging electric quantity exceeds the preset electric quantity threshold value, the electronic equipment sends an unlocking instruction to the passive electronic lock, the passive electronic lock executes unlocking operation according to the unlocking instruction, after primary unlocking is completed, the electronic equipment automatically restores the passive electronic lock to a locked state according to the pressing force, the pressing stroke, the pressing time interval and the pressing times in the lockset test parameter, namely, the electronic equipment controls the pressing device to press and adjust the passive electronic lock to the locked state.
The testing method of the passive electronic lock comprises the following steps: determining a lockset test parameter according to the equipment identification information of the passive electronic lock, wherein the lockset test parameter comprises at least one of pressing force, pressing stroke, pressing time interval and pressing times; determining signal transmission parameters of the NFC transmission module according to the equipment identification information and the lockset test parameters; transmitting a radio frequency signal through the NFC transmitting module according to the signal transmitting parameter to charge the passive electronic lock; and testing the passive electronic lock according to the lockset testing parameters and the charging electric quantity of the passive electronic lock. According to the technical scheme, the passive electronic lock is automatically tested through the electronic equipment, and the testing efficiency of the passive electronic lock is provided.
As shown in fig. 3, fig. 3 is a schematic flow chart of an embodiment of obtaining a lock test parameter in the test method of the passive electronic lock according to the embodiment of the present application, specifically, in the embodiment, step 202 of the previous embodiment determines, according to the device identification information and the lock test parameter, a refinement step of a signal transmission parameter of the NFC transmission module, and the test method of the passive electronic lock in the embodiment further includes steps 301 to 303:
301. inquiring a preset emission parameter mapping table, and acquiring an emission position parameter corresponding to the antenna position of an NFC receiving module in the passive electronic lock;
302. obtaining the transmitting duration of the NFC transmitting module according to the pressing time interval in the lockset testing parameter;
303. and obtaining the signal transmission intensity of the NFC transmission module according to the transmission duration and the preset electric quantity threshold corresponding to the equipment identification information, and taking the transmission position parameter and the signal transmission intensity as signal transmission parameters.
In the embodiment of the application, a preset emission parameter mapping table is preset in the electronic equipment, the preset emission parameter mapping table contains signal emission parameters corresponding to different passive electronic locks, the signal emission parameters comprise signal intensity, emission time, emission position and the like, and the electronic equipment inquires the preset emission parameter mapping table to acquire the emission position parameters corresponding to the antenna positions of the NFC receiving modules in the passive electronic locks; the electronic equipment obtains the transmitting duration of the NFC transmitting module according to the pressing time interval in the lockset testing parameter; and obtaining the signal transmission intensity of the NFC transmission module according to the transmission duration and the preset electric quantity threshold corresponding to the equipment identification information, and taking the transmission position parameter and the signal transmission intensity as signal transmission parameters.
For example, the electronic device determines the antenna position of the NFC receiving module of the passive electronic lock according to the device identification information of the passive electronic lock, so as to determine the antenna position of the NFC transmitting module in the electronic device, then obtains the transmitting time of the NFC transmitting module according to the pressing time interval, and finally obtains the signal transmitting intensity of the NFC transmitting module according to the transmitting time and the preset electric quantity threshold corresponding to the device identification information, so as to control the electronic device to charge the passive electronic lock. The electric quantity of the passive electronic lock is ensured, and the unlocking and locking operations of the electronic lock in the later testing process are conveniently executed.
As shown in fig. 4, fig. 4 is a schematic flow chart of an embodiment of a passive electronic lock test in the method for testing a passive electronic lock according to the embodiment of the present application, and specifically, in this embodiment, the method for testing a passive electronic lock further includes steps 401 to 403:
401. and if the charged electric quantity is detected to be larger than the preset electric quantity threshold value corresponding to the equipment identification information, sending an unlocking instruction and acquiring unlocking state information through a preset proximity sensor.
And the electronic equipment detects the charging electric quantity of the passive electronic lock in real time, and if detecting that the charging electric quantity is larger than a preset electric quantity threshold corresponding to the equipment identification information, the electronic equipment sends an unlocking instruction and unlocking state information acquired through a preset proximity sensor.
402. If the unlocking state information of the passive electronic lock is that the unlocking is successful, inquiring a preset driving data table, and acquiring driving power corresponding to the pressing force in the lockset test parameters; and controlling the test assembly to run according to the driving power and the pressing stroke, and testing the passive electronic lock.
If the unlocking state information of the passive electronic lock is successful in unlocking, a preset driving data table is queried, wherein the preset driving data table comprises driving powers corresponding to different types of test locks, namely, a test assembly is arranged in the electronic equipment, a pressing piece, a hydraulic driving piece and the like are arranged in the test assembly, and the hydraulic driving piece drives the pressing piece to move on a set stroke, so that the passive electronic lock can be pressed to recover the locking state; in the embodiment of the application, the electronic equipment inquires a preset driving data table and obtains the driving power corresponding to the pressing force in the lockset test parameters; and controlling the test assembly to run according to the driving power and the pressing stroke, locking the passive electronic lock, and repeating the operation.
403. If the unlocking state information of the passive electronic lock is unlocking failure, secondarily sending an unlocking instruction, and adjusting the unlocking passing rate of the passive electronic lock; outputting an unlocking failure prompt until the unlocking passing rate of the passive electronic lock is lower than a preset passing rate threshold value or the unlocking failure times of the passive electronic lock exceeds a preset first threshold value.
If the unlocking state information of the passive electronic lock is unlocking failure, the electronic equipment secondarily sends an unlocking instruction and adjusts the unlocking passing rate of the passive electronic lock; outputting an unlocking failure prompt until the unlocking passing rate of the passive electronic lock is lower than a preset passing rate threshold value or the unlocking failure times of the passive electronic lock exceeds a preset first threshold value. In the embodiment of the application, the electronic equipment updates the test data in real time and can be repeated for a plurality of times to obtain the service life information of the passive electronic lock.
As shown in fig. 5, fig. 5 is a schematic flow chart of an embodiment of a life test of a passive electronic lock in the test method of a passive electronic lock according to the embodiment of the present application, and specifically, in this embodiment, the test method of a passive electronic lock further includes steps 501 to 503:
501, acquiring the test times of the passive electronic lock;
502, outputting a command for passing the service life test of the passive electronic lock if the test times exceed a preset second threshold value;
503, if the number of tests does not exceed a preset second threshold, detecting fault information of the element information of the passive electronic lock, and outputting a maintenance prompt.
The electronic equipment obtains the test times of the passive electronic lock; the electronic equipment compares the test times with a preset second threshold, wherein the preset second threshold is the preset use times of the passive electronic lock, and if the test times exceed the preset second threshold, a command for passing the service life test of the passive electronic lock is output; if the test times do not exceed the preset second threshold, repeating the test until the test times reach the preset second threshold, or detecting the fault information of the element information of the passive electronic lock, and outputting a maintenance prompt.
Further, in some embodiments of the present application, the method for testing a passive electronic lock further includes:
obtaining test result information of each target passive electronic lock of the production batch corresponding to the equipment identification information;
and counting the test passing times and the test failing times in the test result information to obtain the test passing rate and average service life information of the production batch of the passive electronic locks.
In this embodiment, the electronic device obtains test result information of each target passive electronic lock of the production lot corresponding to the device identification information; counting the test passing times and the test failing times in the test result information to obtain the test passing rate and average service life information of the production batch of passive electronic locks; according to the embodiment of the application, the statistics can be carried out on a plurality of passive electronic locks in the same production batch to obtain the test passing rate and average service life information of the passive electronic locks in the production batch, so that batch test and batch statistics are realized, the test efficiency is ensured, and the state of the passive electronic locks in each batch is conveniently followed.
In order to better implement the method for testing the passive electronic lock in the embodiment of the present application, on the basis of the method for testing the passive electronic lock, the embodiment of the present application further provides a device for testing the passive electronic lock, as shown in fig. 6, fig. 6 is a schematic structural diagram of the device for testing the passive electronic lock provided in the embodiment of the present application, and specifically, the device 600 for testing the passive electronic lock includes:
A first determining module 601, configured to determine a lock test parameter according to device identification information of the passive electronic lock, where the lock test parameter includes at least one of a pressing force, a pressing stroke, a pressing time interval, and a pressing number;
a second determining module 602, configured to determine a signal transmission parameter of the NFC transmitting module according to the device identification information and the lock test parameter;
the charging module 603 is configured to transmit a radio frequency signal according to the signal transmission parameter through the NFC transmission module, so as to charge the passive electronic lock;
and the test module 604 is configured to test the passive electronic lock according to the lock test parameter and the charging capacity of the passive electronic lock.
In one possible implementation manner of this embodiment, the first determining module 601 in the testing device of the passive electronic lock is further configured to:
inquiring a preset parameter mapping table, and acquiring pressing force, pressing stroke, pressing time interval and pressing times corresponding to the equipment identification information;
and setting the pressing force, the pressing stroke, the pressing time interval and the pressing times as lockset test parameters.
In one possible implementation manner of this embodiment, the second determining module 602 in the testing device of the passive electronic lock is further configured to:
Inquiring a preset emission parameter mapping table, and acquiring an emission position parameter corresponding to the antenna position of an NFC receiving module in the passive electronic lock;
obtaining the transmitting duration of the NFC transmitting module according to the pressing time interval in the lockset testing parameter;
and obtaining the signal transmission intensity of the NFC transmission module according to the transmission duration and the preset electric quantity threshold corresponding to the equipment identification information, and taking the transmission position parameter and the signal transmission intensity as signal transmission parameters.
In one possible implementation manner of this embodiment, the test module 604 in the test apparatus of the passive electronic lock is further configured to:
if the charged electric quantity is detected to be larger than a preset electric quantity threshold value corresponding to the equipment identification information, an unlocking instruction is sent, and unlocking state information is acquired through a preset proximity sensor;
if the unlocking state information of the passive electronic lock is that the unlocking is successful, inquiring a preset driving data table, and acquiring driving power corresponding to the pressing force in the lockset test parameters;
and controlling the test assembly to run according to the driving power and the pressing stroke, and testing the passive electronic lock.
In one possible implementation manner of this embodiment, the testing device of the passive electronic lock is further configured to:
If the unlocking state information of the passive electronic lock is unlocking failure, secondarily sending an unlocking instruction, and adjusting the unlocking passing rate of the passive electronic lock;
outputting an unlocking failure prompt until the unlocking passing rate of the passive electronic lock is lower than a preset passing rate threshold value or the unlocking failure times of the passive electronic lock exceeds a preset first threshold value.
In one possible implementation manner of this embodiment, the testing device of the passive electronic lock is further configured to:
acquiring the test times of the passive electronic lock;
outputting a command for passing the service life test of the passive electronic lock if the test times exceed a preset second threshold value;
if the test times do not exceed the preset second threshold value, detecting fault information of the element information of the passive electronic lock, and outputting a maintenance prompt.
In one possible implementation manner of this embodiment, the testing device of the passive electronic lock is further configured to:
obtaining test result information of each target passive electronic lock of the production batch corresponding to the equipment identification information;
and counting the test passing times and the test failing times in the test result information to obtain the test passing rate and average service life information of the production batch of the passive electronic locks.
According to the testing device of the passive electronic lock, according to the equipment identification information of the passive electronic lock, lock testing parameters are determined, wherein the lock testing parameters comprise at least one of pressing force, pressing stroke, pressing time interval and pressing times; determining signal transmission parameters of the NFC transmission module according to the equipment identification information and the lockset test parameters; transmitting a radio frequency signal through the NFC transmitting module according to the signal transmitting parameter to charge the passive electronic lock; and testing the passive electronic lock according to the lockset testing parameters and the charging electric quantity of the passive electronic lock. According to the technical scheme, the lock testing parameters are determined according to the equipment identification information of the passive electronic lock, so that the passive electronic lock is charged and tested according to the lock testing parameters, the passive electronic lock is automatically tested by the electronic equipment, and the testing efficiency of the passive electronic lock is improved.
The embodiment of the application also provides a passive electronic lock, as shown in fig. 7, and fig. 7 is a schematic structural diagram of an embodiment of the passive electronic lock provided in the embodiment of the application.
The passive electronic lock integrates the testing device of any one of the passive electronic locks provided by the embodiment of the application, and the passive electronic lock comprises:
One or more processors;
a memory; and
one or more application programs, wherein the one or more application programs are stored in the memory and configured to be executed by the processor to perform the steps in the method for testing a passive electronic lock described in any of the method embodiments for testing a passive electronic lock described above.
Specifically, the present invention relates to a method for manufacturing a semiconductor device. The passive electronic lock may include one or more processor cores 'processors 701, one or more computer-readable storage media's memory 702, NFC receive module 703, power supply capacitance 704, and sensor 705, among other components. It will be appreciated by those skilled in the art that the passive electronic lock structure shown in fig. 7 is not limiting of the passive electronic lock and may include more or fewer components than shown, or may combine certain components, or a different arrangement of components. Wherein:
the processor 701 is a control center of the passive electronic lock, and uses various interfaces and lines to connect various parts of the entire passive electronic lock, and by running or executing software programs and/or modules stored in the memory 702, and invoking data stored in the memory 702, performs various functions of the passive electronic lock and processes the data, thereby performing overall monitoring of the passive electronic lock. Optionally, processor 701 may include one or more processing cores; preferably, the processor 701 may integrate an application processor and a modem processor, wherein the application processor primarily handles operating systems, user interfaces, applications, etc., and the modem processor primarily handles wireless communications. It will be appreciated that the modem processor described above may not be integrated into the processor 701.
The memory 702 may be used to store software programs and modules, and the processor 701 executes various functional applications and data processing by executing the software programs and modules stored in the memory 702. The memory 702 may mainly include a storage program area and a storage data area, wherein the storage program area may store an operating system, an application program (such as a sound playing function, an image playing function, etc.) required for at least one function, and the like; the storage data area may store data created from the use of the passive electronic lock, etc. In addition, the memory 702 may include high-speed random access memory, and may also include non-volatile memory, such as at least one magnetic disk storage device, flash memory device, or other volatile solid-state storage device. Accordingly, the memory 702 may also include a memory controller to provide access to the memory 702 by the processor 701.
The passive electronic lock further comprises an NFC receiving module for radio frequency signal conversion to each supply capacitor 704 and the supply capacitor 704. The passive electronic lock further includes a target lock assembly for opening or closing the passive electronic lock.
Although not shown, the passive electronic lock may further include a display unit or the like, which is not described herein. Specifically, in this embodiment, the processor 701 in the passive electronic lock loads executable files corresponding to the processes of one or more application programs into the memory 702 according to the following instructions, and the processor 701 executes the application programs stored in the memory 702, so as to implement various functions as follows:
Determining a lockset test parameter according to the equipment identification information of the passive electronic lock, wherein the lockset test parameter comprises at least one of pressing force, pressing stroke, pressing time interval and pressing times;
determining signal transmission parameters of the NFC transmission module according to the equipment identification information and the lockset test parameters;
transmitting a radio frequency signal through the NFC transmitting module according to the signal transmitting parameter to charge the passive electronic lock;
and testing the passive electronic lock according to the lockset testing parameters and the charging electric quantity of the passive electronic lock.
To this end, embodiments of the present invention provide a computer-readable storage medium, which may include: read Only Memory (ROM), random access Memory (RAM, random Access Memory), magnetic or optical disk, and the like. And a computer program is stored thereon, and the computer program is loaded by a processor to execute the steps in any of the methods for testing the passive electronic lock provided by the embodiments of the present invention. For example, the loading of the computer program by the processor may perform the steps of:
determining a lockset test parameter according to the equipment identification information of the passive electronic lock, wherein the lockset test parameter comprises at least one of pressing force, pressing stroke, pressing time interval and pressing times;
Determining signal transmission parameters of the NFC transmission module according to the equipment identification information and the lockset test parameters;
transmitting a radio frequency signal through the NFC transmitting module according to the signal transmitting parameter to charge the passive electronic lock;
and testing the passive electronic lock according to the lockset testing parameters and the charging electric quantity of the passive electronic lock.
In the foregoing embodiments, the descriptions of the embodiments are focused on, and the portions of one embodiment that are not described in detail in the foregoing embodiments may be referred to in the foregoing detailed description of other embodiments, which are not described herein again.
In the implementation, each unit or structure may be implemented as an independent entity, or may be implemented as the same entity or several entities in any combination, and the implementation of each unit or structure may be referred to the foregoing method embodiments and will not be repeated herein.
The specific implementation of each operation above may be referred to the previous embodiments, and will not be described herein.
The foregoing describes in detail a method for testing a passive electronic lock provided by the embodiment of the present application, and specific embodiments are applied to describe the principles and implementations of the present application, where the description of the foregoing embodiments is only for helping to understand the method and core ideas of the present application; meanwhile, as those skilled in the art will have variations in the specific embodiments and application scope in light of the ideas of the present application, the present description should not be construed as limiting the present application.

Claims (10)

1. The testing method of the passive electronic lock is characterized by being applied to electronic equipment, wherein the electronic equipment is in communication connection with the passive electronic lock, an NFC transmitting module is arranged on the electronic equipment, and an NFC receiving module is arranged on the passive electronic lock;
the testing method of the passive electronic lock comprises the following steps:
determining a lockset test parameter according to the equipment identification information of the passive electronic lock, wherein the lockset test parameter comprises at least one of pressing force, pressing stroke, pressing time interval and pressing times;
determining signal transmission parameters of the NFC transmission module according to the equipment identification information and the lockset test parameters;
transmitting a radio frequency signal through the NFC transmitting module according to the signal transmitting parameter to charge the passive electronic lock;
and testing the passive electronic lock according to the lockset testing parameters and the charging electric quantity of the passive electronic lock.
2. The method for testing a passive electronic lock according to claim 1, wherein determining the lock testing parameter according to the device identification information of the passive electronic lock comprises:
inquiring a preset parameter mapping table, and acquiring pressing force, pressing stroke, pressing time interval and pressing times corresponding to the equipment identification information;
And setting the pressing force, the pressing stroke, the pressing time interval and the pressing times as lockset test parameters.
3. The method for testing a passive electronic lock as claimed in claim 1, wherein determining the signal transmission parameters of the NFC transmission module according to the device identification information and the lock test parameters includes:
inquiring a preset emission parameter mapping table, and acquiring an emission position parameter corresponding to the antenna position of an NFC receiving module in the passive electronic lock;
obtaining the transmitting duration of the NFC transmitting module according to the pressing time interval in the lockset testing parameter;
and obtaining the signal transmission intensity of the NFC transmission module according to the transmission duration and the preset electric quantity threshold corresponding to the equipment identification information, and taking the transmission position parameter and the signal transmission intensity as signal transmission parameters.
4. The method for testing the passive electronic lock according to claim 1, wherein the testing the passive electronic lock according to the lock testing parameter and the charging amount of the passive electronic lock comprises:
if the charged electric quantity is detected to be larger than a preset electric quantity threshold value corresponding to the equipment identification information, an unlocking instruction is sent, and unlocking state information is acquired through a preset proximity sensor;
If the unlocking state information of the passive electronic lock is that the unlocking is successful, inquiring a preset driving data table, and acquiring driving power corresponding to the pressing force in the lockset test parameters;
and controlling the test assembly to run according to the driving power and the pressing stroke, and testing the passive electronic lock.
5. The method for testing a passive electronic lock according to claim 4, wherein after the step of sending an unlocking command and the unlocking state information acquired by a preset proximity sensor if the charged electric quantity is detected to be greater than a preset electric quantity threshold corresponding to the equipment identification information, the method comprises:
if the unlocking state information of the passive electronic lock is unlocking failure, secondarily sending an unlocking instruction, and adjusting the unlocking passing rate of the passive electronic lock;
outputting an unlocking failure prompt until the unlocking passing rate of the passive electronic lock is lower than a preset passing rate threshold value or the unlocking failure times of the passive electronic lock exceeds a preset first threshold value.
6. The method for testing the passive electronic lock according to claim 1, wherein after the passive electronic lock is tested according to the lock testing parameter and the charging amount of the passive electronic lock, the method comprises:
Acquiring the test times of the passive electronic lock;
outputting a command for passing the service life test of the passive electronic lock if the test times exceed a preset second threshold value;
if the test times do not exceed the preset second threshold value, detecting fault information of the element information of the passive electronic lock, and outputting a maintenance prompt.
7. The method for testing a passive electronic lock according to any one of claims 1 to 6, wherein after the passive electronic lock is tested according to the lock testing parameter and the charge amount of the passive electronic lock, the method comprises:
obtaining test result information of each target passive electronic lock of the production batch corresponding to the equipment identification information;
and counting the test passing times and the test failing times in the test result information to obtain the test passing rate and average service life information of the production batch of the passive electronic locks.
8. A testing device of a passive electronic lock, characterized in that the testing device of a passive electronic lock comprises:
the first determining module is used for determining lockset testing parameters according to the equipment identification information of the passive electronic lock, wherein the lockset testing parameters comprise at least one of pressing force, pressing stroke, pressing time interval and pressing times;
The second determining module is used for determining signal transmission parameters of the NFC transmitting module according to the equipment identification information and the lockset test parameters;
the charging module is used for transmitting radio frequency signals through the NFC transmitting module according to the signal transmitting parameters and charging the passive electronic lock;
and the testing module is used for testing the passive electronic lock according to the lockset testing parameters and the charging quantity of the passive electronic lock.
9. An electronic device is characterized in that the electronic device is in communication connection with a passive electronic lock, and an NFC transmitting module is arranged on the electronic device; the electronic equipment supplies power to the passive electronic lock through the NFC transmitting module and executes test operation;
the electronic device includes:
one or more processors;
a memory; and
one or more applications, wherein the one or more applications are stored in the memory and are configured to be executed by the processor to implement the steps of the method of testing a passive electronic lock of any one of claims 1 to 7.
10. A computer readable storage medium, having stored thereon a computer program, the computer program being loaded by a processor to perform the steps of the method of testing a passive electronic lock as claimed in any one of claims 1 to 7.
CN202311017963.8A 2023-08-11 2023-08-11 Method and device for testing passive electronic lock, electronic equipment and storage medium Pending CN117007300A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202311017963.8A CN117007300A (en) 2023-08-11 2023-08-11 Method and device for testing passive electronic lock, electronic equipment and storage medium

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202311017963.8A CN117007300A (en) 2023-08-11 2023-08-11 Method and device for testing passive electronic lock, electronic equipment and storage medium

Publications (1)

Publication Number Publication Date
CN117007300A true CN117007300A (en) 2023-11-07

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Country Status (1)

Country Link
CN (1) CN117007300A (en)

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