CN116994045A - Test system for electronic equipment - Google Patents

Test system for electronic equipment Download PDF

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Publication number
CN116994045A
CN116994045A CN202310935121.4A CN202310935121A CN116994045A CN 116994045 A CN116994045 A CN 116994045A CN 202310935121 A CN202310935121 A CN 202310935121A CN 116994045 A CN116994045 A CN 116994045A
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test
detection
camera
image data
cover plate
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朱瑞平
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China Mobile Communications Group Co Ltd
China Mobile Communications Ltd Research Institute
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China Mobile Communications Group Co Ltd
China Mobile Communications Ltd Research Institute
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Priority to CN202310935121.4A priority Critical patent/CN116994045A/en
Publication of CN116994045A publication Critical patent/CN116994045A/en
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    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/70—Arrangements for image or video recognition or understanding using pattern recognition or machine learning
    • G06V10/764—Arrangements for image or video recognition or understanding using pattern recognition or machine learning using classification, e.g. of video objects
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/70—Arrangements for image or video recognition or understanding using pattern recognition or machine learning
    • G06V10/77—Processing image or video features in feature spaces; using data integration or data reduction, e.g. principal component analysis [PCA] or independent component analysis [ICA] or self-organising maps [SOM]; Blind source separation
    • G06V10/774—Generating sets of training patterns; Bootstrap methods, e.g. bagging or boosting

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  • Evolutionary Computation (AREA)
  • General Health & Medical Sciences (AREA)
  • Medical Informatics (AREA)
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  • Databases & Information Systems (AREA)
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  • General Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

The application discloses a test system of electronic equipment. The test system comprises a control device and a test device, wherein the control device is configured to generate an execution instruction based on a test case; the testing device is in communication connection with the control equipment and is used for executing equipment detection corresponding to the testing instruction based on the execution instruction and sending detection data of the equipment detection to the control equipment; the control device is further configured to determine test parameters of the electronic device under test based on the detection data; wherein, testing arrangement includes: the image acquisition device, the detection data includes image data and image acquisition parameter at least, confirm the test parameter of the electronic equipment that awaits measuring based on the detection data, include: generating annotation information representing the detection object for the image data based on the test case; classifying the image data based on the labeling information and the image acquisition parameters to obtain a classified image data set; and carrying out image recognition on the classified image data set based on the image detection module to obtain test parameters corresponding to the labeling information.

Description

Test system for electronic equipment
Technical Field
The application relates to the field of equipment detection, in particular to a test system of electronic equipment.
Background
Detection of relevant parameters is often required before the electronic device is shipped. Taking a notebook computer as an example, the notebook computer needs to be subjected to relevant detection such as weight detection, thickness detection, product nameplate detection, external interface type detection and the like. In addition, due to different manufacturers and models of electronic equipment, different test cases of each detection and other factors, related detection operation is complex, repeatability is high and workload is large.
In the related art, the general test method and mode are: aiming at each test case of each electronic device, the test cases are executed by a manual mode in turn, so that the efficiency is low; and in addition, sample retention inspection is needed during the test of part of use cases, so that the test cost is high. In addition, for BIOS (Basic Input Output System ) parameters of the tested equipment, because the BIOS interface cannot be captured by screenshot software of the operating system, the BIOS can only be obtained by shooting by means of a camera of a third party, the related testing method is often that after entering the BIOS interface of the tested equipment, a tester shoots by using the camera of the mobile phone after checking, then derives the photo, the whole process is operated purely manually, and the waste time and the waste force are low in detection efficiency.
Disclosure of Invention
In view of this, the embodiment of the application provides a test system for electronic equipment, which aims to improve the automation degree and the test efficiency of the test of the electronic equipment and reduce the test workload.
The technical scheme of the embodiment of the application is realized as follows:
the embodiment of the application provides a test system of electronic equipment, which comprises the following components:
the control device is configured to generate an execution instruction based on the test case;
the testing device is in communication connection with the control equipment and is used for executing equipment detection corresponding to the execution instruction based on the execution instruction and sending detection data of the equipment detection to the control equipment;
the control device is further configured to determine test parameters of the electronic device to be tested based on the detection data;
wherein, the testing arrangement includes: the image acquisition device, the detection data at least includes image data and image acquisition parameters, the test parameters of the electronic equipment to be tested are determined based on the detection data, and the image acquisition device comprises:
generating labeling information representing a detection object for the image data based on the test case;
classifying the image data based on the labeling information and the image acquisition parameters to obtain a classified image data set;
and carrying out image recognition on the classified image data set based on the image detection module to obtain the test parameters corresponding to the annotation information.
In the above scheme, the testing device further includes: a base, the base comprising:
a frame body, wherein an accommodating space is formed in the frame body;
the cover plate is connected with the frame body in a sliding fit manner, and is provided with an opening state dislocated with the frame body and a closing state for covering the frame body; the upper surface of the cover plate is used as a detection plane for placing the electronic equipment to be detected.
In the above scheme, the testing device further includes:
the industrial personal computer is connected with the image acquisition device and is in communication connection with the control equipment, and is used for controlling the working state of the image acquisition device based on the execution instruction, acquiring the image data and the image acquisition parameters and sending the image data and the image acquisition parameters to the control equipment.
In the above scheme, the testing device further includes: a weight detecting device located in the accommodation space; the industrial personal computer is connected with the weight detection device and is used for controlling the working state of the weight detection device based on the execution instruction, acquiring weight detection data of the weight detection device and sending the weight detection data to the control equipment.
In the above scheme, the testing device further includes:
the first driving device is arranged in the frame body and connected with the cover plate, and the industrial personal computer is further used for controlling the first driving device to drive the cover plate to switch between the open state and the closed state based on a first execution instruction for indicating weight detection.
In the above scheme, the testing device further includes:
a thickness detection device;
the industrial personal computer is connected with the thickness detection device and is used for controlling the working state of the thickness detection device based on the execution instruction, acquiring thickness test image data of the thickness detection device acquired by the image acquisition device and sending the thickness test image data to the control equipment;
the control device is used for determining the thickness of the electronic device to be tested based on the thickness test image data.
In the above-mentioned scheme, thickness detection device for set up in the dipperstick on the apron, the dipperstick have accomodate in the first state of the accommodation area of apron and perpendicular to the second state of the upper surface of apron.
In the above scheme, the testing device further includes:
the second driving device is arranged on the cover plate, and the industrial personal computer is further used for controlling the second driving device to drive the measuring ruler to switch between the first state and the second state based on a second execution instruction for indicating thickness detection.
In the above-mentioned scheme, the image acquisition device includes:
the bearing bracket is fixed on the cover plate and comprises a first bracket positioned on the central line of the left side and the right side of the cover plate and a second bracket positioned on the central line of the front side and the rear side of the cover plate;
the plurality of cameras comprise a first camera arranged on the left side of the first bracket, a second camera arranged on the right side of the first bracket, a third camera arranged on the front side of the second bracket and a fourth camera arranged at the intersection of the first bracket and the second bracket;
the first camera, the second camera and the third camera are movably connected with the bearing support.
In the above scheme, the testing device further includes:
the third driving device is used for adjusting the position of at least one of the first camera, the second camera and the third camera, and the industrial personal computer is also used for controlling the third driving device to adjust the position of at least one of the first camera, the second camera and the third camera based on at least one of a third execution instruction indicating BIOS test and a fourth execution instruction indicating interface test.
In the above scheme, the test parameters of the electronic device to be tested include at least one of the following: thickness, weight, interface type, nameplate parameters, and BIOS parameters.
According to the technical scheme provided by the embodiment of the application, the test system of the electronic equipment comprises control equipment and a test device, wherein the control equipment is configured to generate an execution instruction based on a test case; the testing device is in communication connection with the control equipment and is used for executing equipment detection corresponding to the testing instruction based on the execution instruction and sending detection data of the equipment detection to the control equipment; the control device is further configured to determine test parameters of the electronic device under test based on the detection data; wherein, testing arrangement includes: the image acquisition device, the detection data includes image data and image acquisition parameter at least, confirm the test parameter of the electronic equipment that awaits measuring based on the detection data, include: generating annotation information representing the detection object for the image data based on the test case; classifying the image data based on the labeling information and the image acquisition parameters to obtain a classified image data set; and carrying out image recognition on the classified image data set based on the image detection module to obtain test parameters corresponding to the labeling information. Therefore, based on the matching of the control equipment and the testing device, the automation degree of the electronic equipment test can be improved, the manpower is liberated, the testing time is shortened, the testing efficiency is further improved, and the testing workload is reduced; in addition, the embodiment of the application carries out image recognition on the classified image data set based on the image detection module, can realize automatic detection of BIOS parameters and the like of the electronic equipment to be detected, and has simple operation and high test efficiency.
Drawings
FIG. 1 is a schematic diagram of a test system of an electronic device according to an embodiment of the present application;
FIG. 2 is a schematic diagram of a testing device according to an embodiment of the present application;
FIG. 3 is a flowchart illustrating a BIOS parameter test in an application example according to the present application;
fig. 4 is a flow chart of an interface parameter test in an application example of the present application.
Reference numerals illustrate:
100. a control device; 200. a testing device; 300. an Ethernet line;
210. an industrial personal computer; 220. a weight detecting device; 230. a thickness detection device;
240. an image acquisition device; 241. a first bracket; 242. a second bracket; 243. a first camera;
244. a second camera; 245. a third camera;
246. a fourth camera; 247. a fifth camera;
250. a base; 251. a frame; 252. and a cover plate.
Detailed Description
The present application will be described in further detail with reference to the accompanying drawings and examples.
Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terminology used herein in the description of the application is for the purpose of describing particular embodiments only and is not intended to be limiting of the application.
The embodiment of the application provides a test system of electronic equipment, as shown in fig. 1, the test system of the electronic equipment comprises: the control device 100 and the test apparatus 200 are in communication connection, for example, the control device 100 and the test apparatus 200 are connected through an ethernet cable 300, and transmission of the execution instruction and the detection data is completed.
In the embodiment of the present application, the control device 100 is configured to generate an execution instruction based on a test case; the testing device 200 is communicatively connected to the control apparatus 100, and is configured to execute, based on the execution instruction, an apparatus detection corresponding to the execution instruction, and send detection data of the apparatus detection to the control apparatus 100. The control device 100 is further configured to determine test parameters of the electronic device under test based on the detection data. Wherein, the testing arrangement includes: the image acquisition device, the detection data at least includes image data and image acquisition parameters, the test parameters of the electronic equipment to be tested are determined based on the detection data, and the image acquisition device comprises: generating labeling information representing a detection object for the image data based on the test case; classifying the image data based on the labeling information and the image acquisition parameters to obtain a classified image data set; and carrying out image recognition on the classified image data set based on the image detection module to obtain the test parameters corresponding to the annotation information.
It should be noted that the foregoing image capturing parameters represent the operating parameters of the image capturing device, for example, including but not limited to at least one of the following: camera resolution, focal length, acquisition height, camera ID, and timestamp. After the control device receives the image data and the image acquisition parameters generated by the test device based on the image acquisition device, label information can be added to the image data based on the content of the test case, and the label information is used for identifying the detection object. For example, using BIOS testing as an example, the control device may add annotation information corresponding to different detected objects to the received image data, including, but not limited to: the detection objects such as CPU model, main frequency of memory, CPU core number, hard disk space and the like. The control device may classify the image data based on the labeling information and the image acquisition parameters of the image data, for example, divide the received image data into different image data sets based on different detection objects and corresponding image acquisition parameters, and then perform image recognition on the classified image data sets based on the image detection module, so as to obtain test parameters corresponding to each detection object, for example, automatically recognize BIOS parameters of the electronic device to be detected.
It should be noted that the image detection module needs to be trained in advance, for example, a convolutional neural network (Convolutional Neural Network, CNN) model may be used. For example, the image detection model may be trained based on a training set formed by the pre-labeled detection objects in different image acquisition parameters, so that the effect that the image detection model automatically identifies the classified image data set may be achieved. Preferably, in order to enhance the generalization performance of the image detection model, a training set can be generated periodically based on the image data set in the detection process, and the image detection model is trained and updated, so that the image recognition capability of the image detection model is improved.
It can be appreciated that, based on the cooperation of the control device 100 and the testing apparatus 200, the degree of automation of the electronic device testing can be improved, the manpower can be liberated, the testing time can be shortened, the testing efficiency can be further improved, and the testing workload can be reduced; in addition, the embodiment of the application carries out image recognition on the classified image data set based on the image detection module, can realize automatic detection of BIOS parameters and the like of the electronic equipment to be detected, and has simple operation and high test efficiency.
Illustratively, the control device 100 may have a test scheduler module and a detection module configured thereon. The test scheduling module is used for managing and organizing test cases and sending execution instructions to the test device based on the test cases. The detection module can automatically identify and determine the test parameters of the electronic equipment to be tested based on the detection data generated by the test device.
The detection module may be the foregoing image detection module, and the test calling module may add labeling information to the image data received by the control device based on the content of the test case, classify the received image data based on the labeling information and the image acquisition parameters, and input the classified image dataset into the value image detection module, and the image detection module outputs a detection result, that is, the test parameters of the detection object.
Here, the electronic device to be tested may be an electronic device such as a notebook computer or a tablet computer. Illustratively, the test parameters of the electronic device under test include at least one of: thickness, weight, interface type, nameplate parameters, and BIOS parameters.
The test scheduling module may pre-configure a plurality of test cases, and the test calling module issues an execution instruction to the test device 200 based on a test step of the test case, so that the test device 200 executes corresponding detection based on the execution instruction and sends detection data of the corresponding detection to the control device 100. For example, test cases may include, but are not limited to: BIOS test cases, interface test cases, weight test cases, thickness test cases, etc.
Illustratively, the test apparatus may include a base including: a frame body and a cover plate. An accommodating space is formed in the frame body, a cover plate is connected with the frame body in a sliding fit manner, and the cover plate is provided with an opening state dislocated with the frame body and a closing state for covering the frame body; the upper surface of the cover plate is used as a detection plane for placing the electronic equipment to be detected. Therefore, the related equipment detection can be carried out on the electronic equipment to be detected on the cover plate, and the related operation can be conveniently carried out by the testers.
Illustratively, the testing apparatus may further comprise: and the industrial personal computer. The industrial personal computer is connected with the image acquisition device and is in communication connection with the control equipment, and is used for controlling the working state of the image acquisition device based on the execution instruction, acquiring the image data and the image acquisition parameters and sending the image data and the image acquisition parameters to the control equipment. Therefore, the execution mechanism of the testing device can be controlled based on the industrial personal computer and the detection data can be uploaded to the control equipment.
In an application example, taking a BIOS test as an example, after receiving image data and corresponding image acquisition parameters of a BIOS test of an electronic device to be tested returned by an industrial personal computer, a control device may add labeling information to the returned image data of the BIOS test in combination with an execution sequence of an execution instruction in the test case, classify the image data based on the labeling information and the image acquisition parameters, and divide the classified image data into different image data sets, and identify the BIOS parameters by using a convolutional neural network (Convolutional Neural Network, CNN) based on the image data sets. For example, based on the timing and/or orientation of the BIOS interface display, the following labeling information may be added: CPU type, main frequency of memory, etc. and classifying the image data.
Illustratively, the test apparatus further comprises: a weight detecting device located in the accommodation space; the industrial personal computer is connected with the weight detection device and is used for controlling the working state of the weight detection device based on the execution instruction, acquiring weight detection data of the weight detection device and sending the weight detection data to the control equipment. Thus, the control device can realize automatic test of weight detection of the electronic device to be tested.
Illustratively, the test apparatus further comprises: a thickness detection device; the industrial personal computer is connected with the thickness detection device and is used for controlling the working state of the thickness detection device based on the execution instruction, acquiring thickness test image data of the thickness detection device acquired by the image acquisition device and sending the thickness test image data to the control equipment; the control device is used for determining the thickness of the electronic device to be tested based on the thickness test image data. Thus, the control device can realize automatic test of thickness detection of the electronic device to be tested.
Illustratively, as shown in FIG. 2, the test apparatus 200 includes: industrial personal computer 210, weight detecting device 220, thickness detecting device 230, and image detecting device 240. The weight detecting device 220 is configured to detect a weight of the electronic device to be detected; the thickness detection device 230 is used for detecting the thickness of the electronic device to be detected; the image acquisition device 240 is used for acquiring image data of the electronic device to be tested. The industrial personal computer 210 is connected with the image acquisition device 240, the weight detection device 220 and the thickness detection device 230, and the industrial personal computer 210 is in communication connection with the control device 100, and is used for controlling the working state of at least one of the image acquisition device 240, the weight detection device 220 and the thickness detection device 230 based on the execution instruction generated by the test scheduling module, acquiring detection data, and sending the detection data to the control device 100.
It can be appreciated that, based on the testing apparatus 200 described above, weight detection, thickness detection and related image detection of the electronic device to be tested can be automatically implemented.
Illustratively, the test apparatus 200 further comprises: the base 250, the image acquisition device 240, the weight detection device 220, the thickness detection device 230 and the industrial personal computer 210 are all arranged on the base 250. The base 250 is understood herein to be the carrier of the associated test device of the test device 200 and may provide a test plane for the electronic device under test.
Illustratively, base 250 includes: a frame 251 and a cover 252. An accommodating space for accommodating the industrial personal computer 210 and the weight detecting device 220 is formed in the frame 251; wherein the weight detecting device 220 is located on the industrial personal computer 210; the cover plate 252 is connected with the frame body 251 in a sliding fit manner, and the cover plate 252 is provided with an opening state which is dislocated with the frame body 251 to expose the weight detection device 220 and a closing state which covers the frame body 251; wherein the upper surface of the cover plate 252 is used as a detection plane for placing the electronic device to be tested.
The weight detecting device 220 may be an electronic scale, and the electronic scale is disposed on the industrial personal computer 210, when the cover plate 252 is in an open state, the electronic device to be tested may be placed on the electronic scale, so that the electronic scale may obtain the weight data of the electronic device to be tested and transmit the weight data to the industrial personal computer 210, and then the industrial personal computer 210 sends the weight data of the electronic device to be tested to the control device 100, so that the control device 100 may obtain and record the weight data of the electronic device to be tested.
Illustratively, the test apparatus 200 further comprises: the first driving device (not shown in fig. 2) is disposed in the frame 251 and connected to the cover 252, and the industrial personal computer 210 is further configured to control the first driving device to drive the cover 252 to switch between an open state and a closed state based on a first execution instruction indicating weight detection.
It is understood that the control device 100 may send the first execution instruction to the industrial personal computer 210 based on the weight measurement case. After the industrial personal computer 210 receives the first execution instruction for weight detection sent by the test case, the first driving device can be controlled to drive the cover plate 252 to be switched to an open state, so that a tester can conveniently place the electronic equipment to be tested on the electronic scale for weighing detection, after receiving weight detection data generated by the electronic scale, the industrial personal computer 210 can output prompt information for prompting the tester to take away the electronic equipment to be tested, and after confirming that the electronic equipment to be tested is removed from the weight detection device 220, the first driving device can be controlled to drive the cover plate 252 to be switched to a closed state, so that the electronic equipment to be tested can conveniently carry out subsequent related tests on the upper surface of the cover plate 252. Therefore, the automatic operation level of the test can be effectively improved, the test efficiency is improved, and the test workload is reduced.
Illustratively, a guide rail may be disposed at an upper end of the frame 251, the cover 252 may be slidably coupled to the frame 251 along the guide rail, and the first driving device may be a motor for driving the cover 252 to move.
Illustratively, the thickness detecting device 230 may be a measuring scale provided on the cover plate 252, the measuring scale having a first state of being received in a receiving area of the cover plate 252 and a second state of being perpendicular to an upper surface of the cover plate 252. It can be appreciated that when there is a thickness test requirement, the measuring scale can be switched to the second state, so as to test the thickness of the electronic device to be tested. After the thickness test, the measuring scale can be switched to the first state, so that the measuring scale is stored in the storage area of the cover plate 252, and the upper surface of the cover plate 252 is attractive and neat.
Illustratively, the test apparatus 200 further comprises: the second driving device (not shown in fig. 2) is disposed on the cover plate 252, and the industrial personal computer 210 is further configured to control the second driving device to drive the measuring scale to switch between the first state and the second state based on a second execution instruction indicating thickness detection.
It is understood that the control device may send a second execution instruction indicating thickness detection to the industrial personal computer 210 based on the thickness test case. After the industrial personal computer 210 receives the second execution instruction for thickness detection sent by the test case, the second driving device can be controlled to drive the measuring ruler to switch to the second state, so that the measuring ruler is convenient for detecting the thickness of the electronic equipment to be detected placed on the cover plate 252, and after the industrial personal computer 210 receives the thickness data, the second driving device can be controlled to drive the measuring ruler to switch to the first state, so that the measuring ruler is stored in the storage area of the cover plate 252. Therefore, the automatic operation level of the test can be effectively improved, the test efficiency is improved, and the test workload is reduced.
Illustratively, the image capture device 240 includes: the bearing bracket and the plurality of cameras are fixed on the cover plate 252, and the bearing bracket comprises a first bracket 241 positioned on the central line of the left side and the right side of the cover plate 252 and a second bracket 242 positioned on the central line of the front side and the rear side of the cover plate 252; the plurality of cameras comprise a first camera 243 arranged on the left side of the first support 241, a second camera 244 arranged on the right side of the first support 241, a third camera 245 arranged on the front side of the second support 242 and a fourth camera 246 arranged at the intersection of the first support 241 and the second support 242.
It can be appreciated that by providing the plurality of cameras, image collection in a plurality of directions such as a top view angle, a left view angle, a right view angle, a forward view angle, and the like of the electronic device to be tested can be achieved, and the obtained image data can be sent to the control device 100 by the industrial personal computer 210.
Illustratively, the first camera 243, the second camera 244, and the third camera 245 are all movably connected to the bearing bracket. For example, the first camera 243 and the second camera 244 can be movably adjusted along the up-down direction of the first bracket 241, so that the first camera 243 can collect clear image data at the left viewing angle of the electronic device to be tested, and the second camera 244 can collect clear image data at the right viewing angle of the electronic device to be tested. Optionally, the third camera 245 can be movably adjusted along the up-down direction of the second support 242, so that the third camera 245 can collect clear image data at the front view angle of the electronic device to be tested.
Illustratively, the test apparatus further comprises: the third driving device is used for adjusting the position of at least one of the first camera, the second camera and the third camera, and the industrial personal computer is also used for controlling the third driving device to adjust the position of at least one of the first camera, the second camera and the third camera based on at least one of a third execution instruction indicating BIOS test and a fourth execution instruction indicating interface test.
It can be understood that the industrial personal computer can control the third driving device to drive the first camera 243 to adjust the position along the up-down direction of the first bracket 241, and can control the third driving device to drive the second camera 244 to adjust the position along the up-down direction of the first bracket 241, so as to automatically calibrate the positions of the first camera 243 and the second camera 244 in the up-down direction, further effectively obtain the image data on the left view angle and the right view angle of the electronic device to be tested, reduce the manual calibration process, effectively improve the automatic operation level of the test, improve the test efficiency and reduce the test workload.
The industrial personal computer may further control the third driving device to drive the third camera 245 to adjust the position along the up-down direction of the second bracket 242, so as to effectively obtain the image data of the electronic device to be tested in the forward viewing angle.
A fifth camera 247 may be disposed on the rear side of the second bracket 242, for example, to facilitate image acquisition of the rearward viewing angle of the electrical device under test. Preferably, the fifth camera 247 can also be movably adjusted along the up-down direction of the second bracket 242, for example, the industrial personal computer can also control the third driving device to drive the fifth camera 247 to adjust the position along the up-down direction of the second bracket 242, so that the fifth camera 247 can collect clear image data at the backward viewing angle of the electronic device to be tested.
For example, taking a notebook computer test as an example, the industrial personal computer 210 may capture left image data of the notebook computer based on an execution instruction sent by the control device 100, the first camera 243 may capture right image data of the notebook computer, the third camera 245 may capture forward image data of the notebook computer, the fourth camera 246 may capture top image data of the notebook computer, the industrial personal computer 210 may send each image data and an image acquisition parameter to the control device 100, the control device 100 may add label information to each image data after receiving the left image data, the right image data, the forward image data (may correspond to a BIOS parameter interface) and the top image data of the notebook computer, and classify the image data based on the label information and the image acquisition parameter to form a classified image data set, and each image data set automatically identifies test parameters such as a LOGO, nameplate information, each external interface type and BIOS parameter of the notebook computer through an AI convolutional neural network. For example, the external interface types may include: type of USB (Type-A, type-B or Type-C), video output interface (VGA, HDMI, DP or DVI), audio output interface (3.5 mm), etc. Therefore, the automatic detection and identification of the test parameters of the electronic equipment to be tested can be realized, the degree of automation is high, the test efficiency is improved, and the test workload is effectively reduced.
The following describes an exemplary operation of the test system according to the embodiment of the present application with reference to an application example:
in this application example, the electronic device to be tested is a notebook computer. When the notebook computer is tested, the test scheduling module of the control equipment invokes the test case of the notebook computer of the model, sends an execution instruction to the test device based on the test case, carries out relevant detection on the notebook computer based on the execution instruction, sends detection data of the relevant detection to the control equipment, and the control equipment determines the test parameters of the notebook computer based on the detection data, records and saves the test parameters to realize the automatic test flow of the notebook computer.
Illustratively, in performing thickness detection of a notebook computer, the D-side (i.e., back side) of the notebook computer is placed on a horizontal table of the testing device. The measuring ruler automatically stretches out from the cover plate and then rotates to a vertical shape and is in a working state, and the scale 0 of the ruler is aligned with the horizontal table top strictly. The measuring jaw capable of automatically sliding up and down is arranged on the staff gauge, and the sliding is stopped when the measuring jaw is attached to the A surface (namely the front surface) of the notebook computer; the front camera (i.e. the third camera 245) is called to translate up and down along the track and stay at a proper position, so that the measuring jaw position of the measuring staff gauge is automatically focused, then photographing is completed, the photo is transmitted to the control workstation (i.e. the control equipment 100), the staff gauge scale is identified by the convolutional neural network module, and further the thickness measured value of the notebook computer to be measured is automatically obtained. After the test is finished, the measuring ruler is automatically retracted into the cover plate.
For example, when photographing the a-plane of the notebook computer, the tested notebook computer is horizontally placed in the scribing area on the horizontal table surface of the test bench (the geometric center of the plane of the tested notebook computer is basically coincident with the cross intersection point on the horizontal table surface of the test device, and the four frames of the tested notebook computer are respectively parallel to the corresponding scribing lines on the horizontal table surface of the test device), the camera (the fourth camera 246) at the top can photograph the a-plane of the tested notebook computer, and then the photograph is transmitted to the control workstation, so that the convolutional neural network module can automatically identify the LOGO of the tested notebook computer.
For example, when photographing the D-side of the notebook computer, the tested notebook computer can be placed flat on the scribing area on the horizontal table surface of the test table by a tester with the D-side facing upwards. And (3) completing photographing by the top camera, transmitting the photograph to a control workstation, and automatically identifying the nameplate of the tested equipment by the convolutional neural network module.
For example, when photographing the left and right sides of the notebook computer, the notebook computer to be tested may be placed in the scribing area on the horizontal table surface, so that the left and right sides of the notebook computer to be tested are respectively opposite to the cameras located at the left and right sides of the test bench, photographing the left and right sides of the notebook computer to be tested is completed by means of the two cameras (i.e., the first camera 243 and the second camera 244), and then the photographs are transferred to the background control workstation, and the convolutional neural network module performs automatic identification of the types of external interfaces of the tested device.
When the step of photographing the BIOS of the notebook computer is needed, the BIOS interface is called, the notebook computer to be tested is placed in the scribing area of the horizontal table top, an instruction is issued to the front camera through the control workstation, the front camera (namely the third camera 245) is called to automatically focus the display screen of the notebook computer to be tested, photographing is completed, then image data is uploaded to the control workstation, recognition and labeling are completed through the convolutional neural network module, and automatic archiving is performed.
FIG. 3 is a flow chart illustrating BIOS parameter testing in an application example.
In this application example, before the BIOS parameter test needs to be performed on the electronic device to be tested, a tester may place the electronic device to be tested on the horizontal plane of the test bench according to the test case requirement, for example, place the electronic device to be tested in the specified area of the cover plate 252, for example, the geometric center of the plane of the electronic device to be tested is basically overlapped with the intersection point of the first support 241 and the second support 242 of the cover plate 252, that is, overlapped with the cross intersection point on the horizontal table surface of the cover plate 252, the four sides of the electronic device to be tested are respectively parallel to the corresponding sides of the cover plate 252, and the display angle (that is, the angle of the surface a is adjusted) of the display screen of the electronic device to be tested is adjusted, so that the related BIOS page containing the BIOS parameter to be tested is called out, and the preparation work before the test is completed. The tester can send an instruction for starting the test case to the control workstation (namely the control equipment) and trigger the starting of the test case. And (3) sequentially issuing corresponding execution instructions from the step (1) by the control workstation, and executing corresponding actions after the test bench industrial personal computer receives the execution instructions. Specifically, the front camera (i.e., the third camera 245) is called by the test bench industrial personal computer based on the execution instruction to obtain image data of the electronic device to be tested in the forward view angle, the test industrial personal computer uploads the shot image data and the image acquisition parameters to the control workstation, that is, uploads the shot photo and the working parameters of the image acquisition device, for example, the resolution, focal length, height, camera ID, timestamp and the like of the shot camera, the control workstation combines the content of the test case, adds labeling information, such as a CPU model, a main memory frequency and the like, classifies the image data based on the labeling information and the image acquisition parameters, obtains a classified image data set, and identifies the BIOS parameters of the classified image data set by adopting a convolutional neural network (Convolutional Neural Network, CNN). The control workstation can start the execution instruction of the subsequent step 2 after confirming the end of the step 1 based on man-machine interaction operation until the test case is ended, and the automatic test operation control is completed.
Fig. 4 shows a flow chart of an interface parameter test in an application example.
In this application example, before the interface test needs to be performed on the electronic device to be tested, the tester may place the electronic device to be tested on the horizontal plane of the test bench, for example, place the electronic device to be tested in the specified area of the cover plate 252, for example, the geometric center of the plane of the electronic device to be tested is substantially coincident with the intersection point of the first support 241 and the second support 242 of the cover plate 252, that is, coincident with the cross intersection point on the horizontal table surface of the cover plate 252, and the four sides of the electronic device to be tested are respectively parallel to the corresponding sides of the cover plate 252. The tester can send an instruction for starting the test case to the control workstation (namely the control equipment) and trigger the starting of the test case. And (3) sequentially issuing corresponding execution instructions from the step (1) by the control workstation, and executing corresponding actions after the test bench industrial personal computer receives the execution instructions. Specifically, based on the execution instruction in step 1, the test industrial personal computer invokes the left camera (i.e., the first camera 243) to complete the left side shooting of the electronic device to be tested, uploads the image data and the image acquisition parameters of the left side view angle to the control workstation, i.e., uploads the shot photos and the working parameters of the image acquisition device, for example, the resolution, focal length, height, camera ID, timestamp, etc. of the shooting camera, the control workstation combines the content of the test case, adds labeling information to the received image data, such as displaying the type of output interface, classifies the image data based on the labeling information and the image acquisition parameters, obtains a classified image dataset, and identifies the interface parameters by adopting CNN to the classified image dataset. The control workstation can start the execution instruction of the subsequent step 2 after the end of the confirmation step 1 based on man-machine interaction operation, namely, the automatic identification of the interface parameters on the right side of the electronic equipment to be tested is realized, and the automatic test operation control is completed until the test case is ended.
It should be noted that: "first," "second," etc. are used to distinguish similar objects and not necessarily to describe a particular order or sequence.
In addition, the embodiments of the present application may be arbitrarily combined without any collision.
The foregoing is merely illustrative of the present application, and the present application is not limited thereto, and any person skilled in the art will readily recognize that variations or substitutions are within the scope of the present application. Therefore, the protection scope of the application is subject to the protection scope of the claims.

Claims (11)

1. A test system for an electronic device, comprising:
the control device is configured to generate an execution instruction based on the test case;
the testing device is in communication connection with the control equipment and is used for executing equipment detection corresponding to the execution instruction based on the execution instruction and sending detection data of the equipment detection to the control equipment;
the control device is further configured to determine test parameters of the electronic device to be tested based on the detection data;
wherein, the testing arrangement includes: the image acquisition device, the detection data at least includes image data and image acquisition parameters, the test parameters of the electronic equipment to be tested are determined based on the detection data, and the image acquisition device comprises:
generating labeling information representing a detection object for the image data based on the test case;
classifying the image data based on the labeling information and the image acquisition parameters to obtain a classified image data set;
and carrying out image recognition on the classified image data set based on the image detection module to obtain the test parameters corresponding to the annotation information.
2. The test system of claim 1, wherein the test device further comprises: a base, the base comprising:
a frame body, wherein an accommodating space is formed in the frame body;
the cover plate is connected with the frame body in a sliding fit manner, and is provided with an opening state dislocated with the frame body and a closing state for covering the frame body; the upper surface of the cover plate is used as a detection plane for placing the electronic equipment to be detected.
3. The test system of claim 2, wherein the test device further comprises:
the industrial personal computer is connected with the image acquisition device and is in communication connection with the control equipment, and is used for controlling the working state of the image acquisition device based on the execution instruction, acquiring the image data and the image acquisition parameters and sending the image data and the image acquisition parameters to the control equipment.
4. A test system according to claim 3, wherein the test device further comprises: a weight detecting device located in the accommodation space; the industrial personal computer is connected with the weight detection device and is used for controlling the working state of the weight detection device based on the execution instruction, acquiring weight detection data of the weight detection device and sending the weight detection data to the control equipment.
5. The test system of claim 4, wherein the test device further comprises:
the first driving device is arranged in the frame body and connected with the cover plate, and the industrial personal computer is further used for controlling the first driving device to drive the cover plate to switch between the open state and the closed state based on a first execution instruction for indicating weight detection.
6. A test system according to claim 3, wherein the test device further comprises:
a thickness detection device;
the industrial personal computer is connected with the thickness detection device and is used for controlling the working state of the thickness detection device based on the execution instruction, acquiring thickness test image data of the thickness detection device acquired by the image acquisition device and sending the thickness test image data to the control equipment;
the control device is used for determining the thickness of the electronic device to be tested based on the thickness test image data.
7. The test system of claim 6, wherein the test system comprises a plurality of test cells,
the thickness detection device is a measuring ruler arranged on the cover plate, and the measuring ruler is provided with a first state of being contained in a containing area of the cover plate and a second state of being perpendicular to the upper surface of the cover plate.
8. The test system of claim 7, wherein the test device further comprises:
the second driving device is arranged on the cover plate, and the industrial personal computer is further used for controlling the second driving device to drive the measuring ruler to switch between the first state and the second state based on a second execution instruction for indicating thickness detection.
9. A test system according to claim 3, wherein the image acquisition means comprises:
the bearing bracket is fixed on the cover plate and comprises a first bracket positioned on the central line of the left side and the right side of the cover plate and a second bracket positioned on the central line of the front side and the rear side of the cover plate;
the plurality of cameras comprise a first camera arranged on the left side of the first bracket, a second camera arranged on the right side of the first bracket, a third camera arranged on the front side of the second bracket and a fourth camera arranged at the intersection of the first bracket and the second bracket;
the first camera, the second camera and the third camera are movably connected with the bearing support.
10. The test system of claim 9, wherein the test device further comprises:
the third driving device is used for adjusting the position of at least one of the first camera, the second camera and the third camera, and the industrial personal computer is also used for controlling the third driving device to adjust the position of at least one of the first camera, the second camera and the third camera based on at least one of a third execution instruction indicating BIOS test and a fourth execution instruction indicating interface test.
11. The test system of any one of claims 1 to 10, wherein the test parameters of the electronic device under test include at least one of: thickness, weight, interface type, nameplate parameters, and BIOS parameters.
CN202310935121.4A 2023-07-27 2023-07-27 Test system for electronic equipment Pending CN116994045A (en)

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Application Number Priority Date Filing Date Title
CN202310935121.4A CN116994045A (en) 2023-07-27 2023-07-27 Test system for electronic equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202310935121.4A CN116994045A (en) 2023-07-27 2023-07-27 Test system for electronic equipment

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Publication Number Publication Date
CN116994045A true CN116994045A (en) 2023-11-03

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