CN116980959A - Test method, test device and related equipment - Google Patents

Abstract

The present invention provides a testing method, device and related equipment, which relate to the field of communication technology. The testing method includes: receiving a configuration request sent by a client-side optical transport network equipment CPE OTN test equipment, and changing the device mode based on the configuration request. Configure the CPE OTN test mode; send the configuration result corresponding to the configuration request to the CPEOTN test device; receive the test instruction sent by the CPE OTN test device; perform the test operation, and send the configuration result to the CPE OTN test device. The operation results corresponding to the above test operations. The embodiments of the present invention can improve the reliability of CPE OTN equipment.

Description

Test methods, devices and related equipment

Technical field

The present invention relates to the field of communication technology, and in particular, to a testing method, device and related equipment.

Background technique

In the existing technology, for the transmission of 5G services, when facing multi-service access, the Slicing Packet Network (SPN)/Optical Transport Network (OTN) needs to support the transmission pipelines of multiple different services, at least Including 5G, 4G, Jike, and home broadband, different services require different transmission levels, and for different transmission levels, different transmission pipelines need to be configured to meet different business needs. Among them, the transmission level is based on bandwidth, Delay, jitter, reliability and security are determined.

After production, the client-side OTN equipment (Customer Premise Equipment OTN, CPE OTN) may not meet the CPE OTN technical specification requirements. When CPE OTN equipment is put into use on the live network, the CPE OTN equipment may have problems with weakened chips, such as weakened interface modules and simplified business functions. As a result, the CPE OTN equipment cannot meet the requirements of CPE OTN technical specifications when accessing services, and its reliability is relatively low. Low.

Contents of the invention

Embodiments of the present invention provide a testing method, device and related equipment to solve the problem that existing CPE OTN equipment cannot meet CPE OTN technical specification requirements and has low reliability when accessing services.

In order to solve the above technical problems, the present invention is implemented as follows:

In a first aspect, embodiments of the present invention provide a testing method, which is applied to equipment under test. The method includes:

Receive a configuration request sent by the client-side optical transport network equipment CPE OTN test equipment, and configure the device mode to the CPE OTN test mode based on the configuration request;

Send the configuration result corresponding to the configuration request to the CPE OTN test equipment;

Receive test instructions sent by the CPE OTN test equipment;

Perform a test operation and send the operation results corresponding to the test operation to the CPE OTN test equipment.

Optionally, performing a test operation and sending operation results corresponding to the test operation to the CPE OTN test equipment, including:

Receive the test service flow sent by the CPE OTN test equipment;

Process the test business flow in the test mode to obtain the operation results corresponding to the test operation;

Send the operation result corresponding to the test operation to the CPE OTN test equipment, so that the CPE OTN test equipment automatically verifies the operation result according to the preset test specification requirements and feeds back the result.

Optionally, the configuration request carries CPE OTN test configuration information corresponding to the interface to be tested and the function to be tested;

Configuring the device mode to the CPE OTN test mode based on the configuration request includes:

Based on the CPE OTN test configuration information, perform service function configuration, interface type configuration and service loopback configuration of the device under test to configure the device mode to the CPE OTN test mode.

Optionally, receiving the configuration request sent by the CPE OTN test equipment includes:

Receive the configuration request sent by the CPE OTN test equipment through the configuration management and control channel, which includes the general communication channel GCC control channel or the operation and maintenance management OAM control channel;

or,

The configuration request sent by the CPE OTN test device is received through the chip management and control layer of the device under test.

In a second aspect, embodiments of the present invention provide a testing method applied to CPE OTN testing equipment. The method includes:

Send a configuration request to the device under test, where the configuration request is used to request that the device mode be configured as the CPEOTN test mode;

Receive a configuration result corresponding to the configuration request sent by the device under test;

When the configuration result indicates that the configuration is completed, send a test instruction to the device under test;

Receive an operation result sent by the device under test corresponding to the test operation performed by the device under test.

Optionally, after sending a test instruction to the device under test, the method further includes:

Send a test service flow to the device under test, so that the device under test processes the test service flow in the CPE OTN test mode and obtains an operation result corresponding to the test operation;

After receiving the operation result corresponding to the test operation performed by the device under test sent by the device under test, the method further includes:

Automatically verify the operation results according to the preset test specification requirements and feedback the results.

Optionally, the configuration request carries CPE OTN test configuration information corresponding to the interface to be tested and the function to be tested.

Optionally, sending a configuration request to the device under test includes:

Send a configuration request to the device under test through a configuration management and control channel, which includes a general communication channel GCC control channel or an operation and maintenance management OAM control channel;

or,

Send a configuration request to the device under test through the chip management and control layer of the device under test.

In a third aspect, embodiments of the present invention provide a testing device, which is applied to equipment under test. The testing device includes:

A configuration module configured to receive a configuration request sent by the client-side optical transport network equipment CPE OTN test equipment, and configure the device mode to the CPE OTN test mode based on the configuration request;

A sending module, configured to send the configuration result corresponding to the configuration request to the CPE OTN test equipment;

A receiving module, used to receive test instructions sent by the CPE OTN test equipment;

An execution module is used to perform test operations and send operation results corresponding to the test operations to the CPE OTN test equipment.

Optionally, the execution module is specifically used for:

Receive the test service flow sent by the CPE OTN test equipment;

Process the test business flow in the test mode to obtain the operation results corresponding to the test operation;

Send the operation result corresponding to the test operation to the CPE OTN test equipment, so that the CPE OTN test equipment automatically verifies the operation result according to the preset test specification requirements and feeds back the result.

Optionally, the configuration request carries CPE OTN test configuration information corresponding to the interface to be tested and the function to be tested;

The configuration module is specifically used for:

Receive the configuration request sent by the client-side optical transport network equipment CPE OTN test equipment;

Based on the CPE OTN test configuration information, perform service function configuration, interface type configuration and service loopback configuration of the device under test to configure the device mode to the CPE OTN test mode.

Optionally, the configuration module is specifically used for:

Receive the configuration request sent by the CPE OTN test equipment through the configuration management and control channel, which includes the general communication channel GCC control channel or the operation and maintenance management OAM control channel; or receive the CPE OTN test through the chip control layer of the device under test Configuration request sent by the device;

Configure the device mode to the CPE OTN test mode based on the configuration request.

In the fourth aspect, embodiments of the present invention provide a testing device applied to CPE OTN testing equipment. The device includes:

The first sending module is used to send a configuration request to the device under test, where the configuration request is used to request to configure the device mode to the CPE OTN test mode;

A first receiving module configured to receive a configuration result corresponding to the configuration request sent by the device under test;

a second sending module, configured to send a test instruction to the device under test when the configuration result indicates that the configuration is completed;

The second receiving module is configured to receive the operation result sent by the device under test corresponding to the test operation performed by the device under test.

Optionally, the device also includes:

The third sending module is used to send a test service flow to the device under test, so that the device under test processes the test service flow in the CPE OTN test mode and obtains the operation result corresponding to the test operation;

The verification module is used to automatically verify the operation results according to the preset test specification requirements and feed back the results.

Optionally, the configuration request carries CPE OTN test configuration information corresponding to the interface to be tested and the function to be tested.

Optionally, the first sending module is specifically used for:

Send a configuration request to the device under test through a configuration management and control channel, which includes a general communication channel GCC control channel or an operation and maintenance management OAM control channel;

or,

Send a configuration request to the device under test through the chip management and control layer of the device under test.

In a fifth aspect, embodiments of the present invention provide a device under test, including: a processor, a memory, and a program stored on the memory and executable on the processor. When the program is executed by the processor Implement the steps of the testing method described in the first aspect above.

In a sixth aspect, embodiments of the present invention provide a CPE OTN test equipment, including: a processor, a memory, and a program stored on the memory and executable on the processor, and the program is executed by the processor. When implementing the steps of the testing method described in the second aspect above.

In a seventh aspect, embodiments of the present invention provide a computer-readable storage medium. A computer program is stored on the computer-readable storage medium. When the computer program is executed by a processor, the test method described in the first aspect is implemented. or the steps of implementing the testing method described in the second aspect when the computer program is executed by the processor.

In the embodiment of the present invention, a configuration request sent by the client-side optical transport network equipment CPE OTN test equipment is received, and the device mode is configured as the CPE OTN test mode based on the configuration request; and the configuration request is sent to the CPE OTN test equipment. Configuration results corresponding to the configuration request; receiving test instructions sent by the CPE OTN test equipment; performing test operations, and sending operation results corresponding to the test operations to the CPE OTN test equipment. In this way, CPE OTN equipment can be tested by CPE OTN equipment through CPE OTN test equipment, so that CPE OTN equipment can meet the requirements of CPE OTN technical specifications when accessing services and improve the reliability of CPE OTN equipment.

Description of the drawings

In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings needed to be used in the description of the embodiments of the present invention will be briefly introduced below. Obviously, the drawings in the following description are only some embodiments of the present invention. For those of ordinary skill in the art, other drawings can be obtained based on these drawings without exerting any creative effort.

Figure 1 is one of the flow charts of a testing method provided by an embodiment of the present invention;

Figure 2 is one of the structural schematic diagrams of a CPE OTN chip provided by an embodiment of the present invention;

Figure 3 is the second structural schematic diagram of a CPE OTN chip provided by an embodiment of the present invention;

Figure 4 is the third structural schematic diagram of a CPE OTN chip provided by an embodiment of the present invention;

Figure 5 is the fourth schematic structural diagram of a CPE OTN chip provided by an embodiment of the present invention;

Figure 6 is a fifth structural schematic diagram of a CPE OTN chip provided by an embodiment of the present invention;

Figure 7 is one of the test schematic diagrams of a CPE OTN chip provided by an embodiment of the present invention;

Figure 8 is the second schematic diagram of testing a CPE OTN chip provided by an embodiment of the present invention;

Figure 9 is the second flow chart of a testing method provided by an embodiment of the present invention;

Figure 10 is the third flow chart of a testing method provided by the embodiment of the present invention;

Figure 11 is the fourth flow chart of a testing method provided by an embodiment of the present invention;

Figure 12 is one of the structural schematic diagrams of a testing device provided by an embodiment of the present invention;

Figure 13 is the second structural schematic diagram of a testing device provided by an embodiment of the present invention;

Figure 14 is a schematic structural diagram of a device to be tested provided by an embodiment of the present invention;

Figure 15 is a schematic structural diagram of a CPE OTN test equipment provided by an embodiment of the present invention.

Detailed ways

The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without making creative efforts fall within the scope of protection of the present invention.

In the embodiment of the present invention, a testing method, device and related equipment are proposed to solve the problem that existing CPE OTN equipment cannot meet the requirements of CPE OTN technical specifications and has low reliability when accessing services.

Referring to Figure 1, Figure 1 is a flow chart of a testing method provided by an embodiment of the present invention, which is used for equipment under test. As shown in Figure 1, the method includes the following steps:

Step 101: Receive a configuration request sent by the client-side optical transport network device CPE OTN test device, and configure the device mode to the CPE OTN test mode based on the configuration request.

Among them, the configuration request can carry CPE OTN test configuration information corresponding to the interface to be tested and the function to be tested. After the device under test receives the CPE OTN test configuration information, the device mode can be configured to CPE OTN test according to the CPE OTN test configuration information. Mode, including service function configuration, interface type configuration, service loopback configuration, etc.

In addition, CPE OTN test equipment can send configuration requests to the device under test through the equipment line or management and control layer.

In one implementation, the device under test may include a device chip under test, and for example, may include a CPE OTN device chip. CPE OTN test equipment may include CPE OTN test enhancement chips.

Step 102: Send the configuration result corresponding to the configuration request to the CPE OTN test equipment.

When the device under test completes the configuration request, the device under test can send the configuration result corresponding to the configuration request to the CPE OTN test device, notifying the CPE OTN test device that the device under test has completed the configuration and can start testing.

In addition, the configuration results can be used to indicate that the device under test has completed the configuration of the device mode and can start testing.

Step 103: Receive the test command sent by the CPE OTN test equipment.

Step 104: Perform a test operation and send the operation result corresponding to the test operation to the CPE OTN test equipment.

The testing operation may include at least one of device interface testing, device function testing and basic performance testing. The device under test can receive the test service flow sent by the CPE OTN test device; process the test service flow in the test mode to obtain the operation result corresponding to the test operation.

In addition, after the CPE OTN test equipment receives the operation results corresponding to the test operations performed by the device under test and is sent by the device under test, it can analyze the operation results to obtain the analysis results, and compare the analysis results with the expected results. The results are compared and the test results corresponding to the comparison results are displayed.

In one implementation, the CPE OTN test device can detect the chip interface function of the device under test by sending a test service flow; the device under test processes the sent test service flow according to the CPE OTN test configuration information, and returns the processing on the interface The CPE OTN test equipment parses the returned processed test service flow to determine whether the processed test service flow meets the expected results, compares the parsed results with the expected results, and displays the results corresponding to the comparison test results. For example, the comparison result may be consistent with the expected result, and the test result may be that the test passes; or, the comparison result may be inconsistent with the expected result, and the test result may be that the test fails.

It should be noted that at present, 5G networks can support a variety of services and application scenarios, such as Enhanced Mobile Broadband (eMBB) with higher bandwidth and lower latency, and Massive Internet of Things (IoT) services with massive user connections. Machine-Type Communication (mMTC) and ultra-high reliability, ultra-low latency communication (uRLLC) and other services, or are used in high-definition, ultra-high-definition and 3D holographic films and videos, greater than 350km/h High-speed mobile applications, sensor networks, tactile Internet, E-Health, natural disaster monitoring and other application scenarios. However, because the 5G network needs to support the transmission of different service types at the same time, the existing 4G transmission technology cannot meet the 5G challenges in all aspects. Therefore, a new slicing transmission network technology system is needed to support the transmission of 5G services. Slicing Packet Network (SPN)/Optical Transport Network (OTN) was developed under this background.

CPE OTN equipment includes CPE OTN chips, which perform multi-service (E1, FE, GE, 10GE LAN, STM-1, STM-4 and other customer services) access, OTN service transmission, MSTP multi-service and ETH functions. CPE OTN chip support functions include service mapping processing, link monitoring and protection, Ethernet VLAN forwarding and OAM, frequency synchronization and other functions.

For multiple service access, the CPE OTN chip needs to support multiple interfaces, service mapping paths and OTN service processing. When processing OTN services, it is necessary to process multiple cascade mappings (VC12, VC4, STM1, STM4, STM16, OTN0 and OTN1, etc.), multiple encapsulations (GFP, GMP, AMP/BMP, etc.), SNCP protection, etc.

It should be noted that the CPE OTN chip used in the existing network has the problem that the chip implementation is weakened, is not the same version as the laboratory test, and cannot meet the technical specifications. This invention optimizes the test verification process at the CPE OTN chip layer, defines a new simple test architecture, optimizes chip test verification capabilities, completely verifies the chip function and performance of the test party, and provides a more concise and complete live network detection and test solution, which can Provide reliable network equipment guarantee for existing network applications.

As a specific embodiment, as shown in Figure 2, the CPE OTN chip has the following functional features and interface features when meeting the technical specification requirements:

E1 framer (Framer) function 2*E1;

SDH framing function (1-4)*2;

Grouping function (2FE/GE);

OTN framing OUT 0/1 2 ports (Ports).

Among them, 2*E1 represents two E1 interfaces, and 2FE/GE represents two Fast Ethernet or Gigabit Ethernet interfaces. SDH (Synchronous Digital Hierarchy) is a synchronous digital system. The SDH framing function involves a total of 2 interfaces, each including 4 interfaces.

In order to save costs, some manufacturers weaken the actual chip functions. When applying CPE OTN equipment chips to the existing network, they use substandard chips in the following two situations: using chips with weakened interface modules; using chips with simplified business functions. For example, as shown in Figure 3, the SDH framing function and grouping function are missing. As shown in Figure 4, the E1 framer function and grouping function are missing. As shown in Figure 5, the SDH framing function interface is composed of (1- 4)*2 is simplified to 1*2. As shown in Figure 6, the OTN framing OUT port is simplified from 2 to 1, and the packet function interface is simplified from 2 to 1.

In the embodiment of the present invention, the CPE OTN test equipment may include a CPE OTN test enhancement chip. As shown in Figure 7, by performing chip test enhancement on the CPE OTN chip, the CPE OTN test function is added at the CPE OTN chip level, and the CPE OTN chip is It becomes a CPE OTN test enhancement chip with test functions, and notifies the device under test of the test configuration through the management and control or line side interface. The test function of the CPE OTN test enhancement chip uses the standard functions of the CPE OTN test enhancement chip to test the existing network. The equipment undergoes comprehensive testing to verify the technical specifications of the chip and equipment. The test function of the CPE OTN test enhancement chip defines test operations, which can automatically test and verify the interfaces and functions of existing network equipment and return test results.

In the embodiment of the present invention, a configuration request sent by the client-side optical transport network equipment CPE OTN test equipment is received, and the device mode is configured as the CPE OTN test mode based on the configuration request; and the configuration request is sent to the CPE OTN test equipment. Configuration results corresponding to the configuration request; receiving test instructions sent by the CPE OTN test equipment; performing test operations, and sending operation results corresponding to the test operations to the CPE OTN test equipment. In this way, CPE OTN equipment can be tested by CPE OTN equipment through CPE OTN test equipment, so that CPE OTN equipment can meet the requirements of CPE OTN technical specifications when accessing services and improve the reliability of CPE OTN equipment.

Optionally, performing a test operation and sending operation results corresponding to the test operation to the CPE OTN test equipment, including:

Receive the test service flow sent by the CPE OTN test equipment;

Process the test business flow in the test mode to obtain the operation results corresponding to the test operation;

Send the operation result corresponding to the test operation to the CPE OTN test equipment, so that the CPE OTN test equipment automatically verifies the operation result according to the preset test specification requirements and feeds back the result.

Wherein, the device under test receives the test service flow sent by the CPE OTN test device, and can process the test service flow sent by the CPE OTN test device according to the CPE OTN test configuration information to obtain the operation result corresponding to the test operation, and the operation result can be For the processed test service flow, the device under test can return the processed test service flow on the interface.

In addition, the CPE OTN test equipment automatically verifies the operation results according to the preset test specification requirements and feeds back the results, which may include: the CPE OTN test equipment analyzes the operation results to obtain the analysis results; The results are compared with the expected results, and the test results corresponding to the comparison results are displayed.

In this implementation, the test service flow sent by the CPE OTN test equipment is received; the test service flow is processed in the test mode to obtain the operation result corresponding to the test operation, thereby simplifying the operator's test operation and making it convenient Used on existing network.

Optionally, the configuration request carries CPE OTN test configuration information corresponding to the interface to be tested and the function to be tested;

Configuring the device mode to the CPE OTN test mode based on the configuration request includes:

Based on the CPE OTN test configuration information, perform service function configuration, interface type configuration and service loopback configuration of the device under test to configure the device mode to the CPE OTN test mode.

Among them, the CPE OTN test configuration information can be used to configure the device mode of the device under test to the CPE OTN test mode. Specifically, the device under test can perform the service function configuration, interface type configuration and service loopback of the device under test. Configuration etc. After completing the service function configuration, interface type configuration and service loopback configuration corresponding to the CPE OTN test mode, the device under test is in the CPE OTN test mode, so that it can receive the test service flow sent by the CPE OTN test device. In the test mode The test business flow is processed as follows to obtain the operation results corresponding to the test operation.

In this implementation, the service function configuration, interface type configuration and service loopback configuration of the device under test are performed based on the CPE OTN test configuration information to configure the device mode to the CPE OTN test mode, so that the device under test can pass The CPE OTN test configuration information sent by the CPE OTN test equipment enables simple test verification of the equipment under test.

Optionally, receiving the configuration request sent by the CPE OTN test equipment includes:

Receive the configuration request sent by the CPE OTN test equipment through the configuration management and control channel, which includes the general communications channel (General Communications Channel, GCC) control channel or the operation and maintenance management (Operation Administration and Maintenance, OAM) control channel;

or,

The configuration request sent by the CPE OTN test device is received through the chip management and control layer of the device under test.

Among them, a configuration management and control channel can be established between the CPE OTN test equipment and the device under test. The CPE OTN test equipment can send the CPE OTN test configuration information corresponding to the interface to be tested and the function to be tested to the equipment under test.

In one implementation, the device under test receives the configuration request sent by the CPE OTN test device through the GCC management and control channel, thereby implementing the test configuration through device line configuration. The device under test can transmit the configuration request through the 4 bits of the GCC control channel, where bit1 and bit2 are bits describing the type (type), and bit3 and bit4 are bits describing the parameter (param).

Among them, the following definitions can be made:

type: 00, start the factory inspection test configuration; 01, complete the factory inspection test configuration, start testing; 10, complete the factory inspection test, return the results; 11, retain.

param: 00, test parameter configuration; xx, test result return, where xx is a value other than 00.

For example, the device to be tested can be a factory inspection equipment chip, and the CPE OTN test equipment can be a test enhancement chip. The test method includes the following process:

(1) The test enhancement chip sends the CPE OTN test configuration information to the factory inspection equipment chip through the GCC control channel;

(2) After receiving the CPE OTN test configuration information, the factory inspection equipment chip starts to configure the device port, protocol, etc., and sends the test configuration "00" to the test enhancement chip;

(3) After the factory inspection equipment chip is configured, send "01" to the test enhancement chip;

(4) The test enhancement chip sends "01" to the factory inspection equipment chip and starts sending the test business flow;

(5) After completing the test, the factory inspection equipment chip sends "10" to the test enhancement chip;

(6) After receiving "10", the test enhancement chip sends "10" and returns the test result.

It should be noted that after the test enhancement chip receives the configuration result of the factory inspection equipment chip, it will start executing the test instructions. If the chip feedback configuration of the factory inspection equipment is not successful, the test enhancement chip will wait.

In addition, CPE OTN test equipment can also implement test configuration through device management and control configuration. As shown in Figure 8, the CPE OTN test equipment can send the CPE OTN test configuration information corresponding to the interface to be tested and the function to be tested to the management and control layer of the device under test. After receiving the CPE OTN test configuration information, the device under test can perform the test according to the CPE OTN test configuration information. The test configuration information configures the device mode to test mode.

In this embodiment, the configuration request sent by the CPE OTN test equipment is received through the configuration management and control channel. The configuration management and control channel includes the general communication channel GCC control channel or the operation and maintenance management OAM control channel; or, through the chip management and control of the device under test The layer receives the configuration request sent by the CPE OTN test equipment, so that it can send the configuration request through the configuration management channel or chip management and control layer.

Referring to Figure 9, Figure 9 is a flow chart of a test method provided by an embodiment of the present invention, which is used for CPE OTN test equipment. As shown in Figure 9, the method includes the following steps:

Step 201: Send a configuration request to the device under test, where the configuration request is used to request to configure the device mode to the CPE OTN test mode;

Step 202: Receive the configuration result corresponding to the configuration request sent by the device under test;

Step 203: When the configuration result indicates that the configuration is completed, send a test instruction to the device under test;

Step 204: Receive an operation result sent by the device under test corresponding to the test operation performed by the device under test.

Optionally, after sending a test instruction to the device under test, the method further includes:

Send a test service flow to the device under test, so that the device under test processes the test service flow in the CPE OTN test mode and obtains an operation result corresponding to the test operation;

After receiving the operation result corresponding to the test operation performed by the device under test sent by the device under test, the method further includes:

Automatically verify the operation results according to the preset test specification requirements and feedback the results.

Optionally, the configuration request carries CPE OTN test configuration information corresponding to the interface to be tested and the function to be tested.

Optionally, sending a configuration request to the device under test includes:

Send a configuration request to the device under test through a configuration management and control channel, which includes a general communication channel GCC control channel or an operation and maintenance management OAM control channel;

or,

Send a configuration request to the device under test through the chip management and control layer of the device under test.

It should be noted that this embodiment is an implementation of the CPE OTN test equipment corresponding to the embodiment shown in Figure 1. For its specific implementation, please refer to the relevant description of the embodiment shown in Figure 1. In order to avoid repeated explanations , this embodiment will not be described in detail, and the same beneficial effects can also be achieved.

In one implementation, as shown in Figure 10, the CPE OTN test device sends a configuration request to the device under test and waits for the configuration of the device under test to be completed; after the configuration of the device under test is completed, it sends a test service flow to the device under test; CPE OTN The test equipment receives and detects the test business flow processed by the equipment under test, compares it with the expected results, and feeds back the test results; the CPEOTN test equipment completes the test through the equipment under test. As shown in Figure 11, the device under test receives the configuration request sent by the CPE OTN test device and configures it according to the configuration request; after completing the configuration, it waits for the test service flow; the device under test processes the test service flow and returns the processed The test business flow; after the test is completed, the device under test will feedback the test results of the completed test, exit the test mode and enter the working state.

In one implementation, the device under test includes a device chip under test, and the CPE OTN test equipment includes a CPE OTN test enhancement chip. The test method may include the following process:

(1) The chip of the device under test receives the CPE OTN test configuration information corresponding to the interface to be tested and the function to be tested sent by the CPE OTN test enhancement chip, and based on the CPE OTN test configuration information, configures the current device mode to the test mode, and Returns the configuration result, in which the CPE OTN test enhancement chip has the CPE OTN test function.

Among them, CPE OTN test configuration information can be sent in the following two ways:

Method 1: Establish a configuration management and control channel. The configuration management and control channel is used to realize communication between the CPE OTN test enhancement chip and the device chip under test. The configuration management and control channel at least includes the GCC control channel and the OAM control channel; the CPE OTN test enhancement chip passes Configure the management and control channel to send the CPE OTN test configuration information to the chip of the device under test. The chip of the device under test configures the current mode of the test device to the test mode based on the CPE OTN test configuration information, and returns the configuration result to the test enhancement chip;

Method 2: The CPE OTN test enhancement chip sends the CPE OTN test configuration information to the chip management and control layer of the device under test. When the chip management and control layer of the device under test receives the CPE OTN test configuration information, it configures the current mode of the test device based on the CPE OTN test configuration information. It is in test mode and returns the configuration results to the test enhancement chip;

(2) After receiving the configuration result, the CPE OTN test enhancement chip sends a test command to the device chip under test when it is determined that the configuration result is complete;

(3) After receiving the test instruction, the device chip under test processes the test business flow sent by the CPE OTN test enhancement chip, obtains the operation result corresponding to the test operation, and returns the operation result to the test enhancement chip;

(4) The CPE OTN test enhancement chip analyzes the operation results to obtain the analysis results; compares the analysis results with the expected results, and displays the test results corresponding to the comparison results.

This invention optimizes the test verification process at the CPE OTN chip layer, defines a new simple test architecture, optimizes chip test verification capabilities, completely verifies the chip function and performance of the test party, and provides a more concise and complete live network detection and test solution, which can Provide reliable network equipment guarantee for existing network applications.

See Figure 12. Figure 12 is a schematic structural diagram of a test device provided by an embodiment of the present invention. The test device is applied to equipment under test. As shown in Figure 12, the test device 300 includes:

The configuration module 301 is configured to receive a configuration request sent by the client-side optical transport network equipment CPE OTN test equipment, and configure the device mode to the CPE OTN test mode based on the configuration request;

The sending module 302 is configured to send the configuration result corresponding to the configuration request to the CPE OTN test equipment;

The receiving module 303 is used to receive test instructions sent by the CPE OTN test equipment;

The execution module 304 is used to perform a test operation and send the operation result corresponding to the test operation to the CPE OTN test equipment.

Optionally, the execution module is specifically used for:

Receive the test service flow sent by the CPE OTN test equipment;

Process the test business flow in the test mode to obtain the operation results corresponding to the test operation;

Send the operation result corresponding to the test operation to the CPE OTN test equipment, so that the CPE OTN test equipment automatically verifies the operation result according to the preset test specification requirements and feeds back the result.

Optionally, the configuration request carries CPE OTN test configuration information corresponding to the interface to be tested and the function to be tested;

The configuration module is specifically used for:

Receive the configuration request sent by the client-side optical transport network equipment CPE OTN test equipment;

Based on the CPE OTN test configuration information, perform service function configuration, interface type configuration and service loopback configuration of the device under test to configure the device mode to the CPE OTN test mode.

Optionally, the configuration module is specifically used for:

Receive the configuration request sent by the CPE OTN test equipment through the configuration management and control channel, which includes the general communication channel GCC control channel or the operation and maintenance management OAM control channel; or receive the CPE OTN test through the chip control layer of the device under test Configuration request sent by the device;

Configure the device mode to the CPE OTN test mode based on the configuration request.

The device under test can implement each process implemented in the method embodiment of Figure 1 and can achieve the same technical effect. To avoid repetition, details will not be described here.

See Figure 13. Figure 13 is a schematic structural diagram of a test device provided by an embodiment of the present invention. The test device is applied to CPE OTN test equipment. As shown in Figure 13, the test device 400 includes:

The first sending module 401 is used to send a configuration request to the device under test, where the configuration request is used to request to configure the device mode to the CPE OTN test mode;

The first receiving module 402 is configured to receive the configuration result corresponding to the configuration request sent by the device under test;

The second sending module 403 is configured to send a test instruction to the device under test when the configuration result indicates that the configuration is completed;

The second receiving module 404 is configured to receive an operation result sent by the device under test corresponding to the test operation performed by the device under test.

Optionally, the device also includes:

The third sending module is used to send a test service flow to the device under test, so that the device under test processes the test service flow in the CPE OTN test mode and obtains the operation result corresponding to the test operation;

The verification module is used to automatically verify the operation results according to the preset test specification requirements and feed back the results.

Optionally, the configuration request carries CPE OTN test configuration information corresponding to the interface to be tested and the function to be tested.

Optionally, the first sending module is specifically used for:

Send a configuration request to the device under test through a configuration management and control channel, which includes a general communication channel GCC control channel or an operation and maintenance management OAM control channel;

or,

Send a configuration request to the device under test through the chip management and control layer of the device under test.

The CPE OTN test equipment can implement each process implemented in the method embodiment of Figure 9 and can achieve the same technical effect. To avoid duplication, it will not be described again here.

As shown in Figure 14, the embodiment of the present invention also provides a device to be tested 500, including: a processor 501, a memory 502, and a program stored on the memory 502 and capable of running on the processor 501, so When the above program is executed by the processor 501, each process of the above-mentioned testing method embodiment applied to the device under test is implemented, and the same technical effect can be achieved. To avoid duplication, the details will not be described here.

As shown in Figure 15, this embodiment of the present invention also provides a CPE OTN test equipment 600, which includes: a processor 601, a memory 602, and a program stored on the memory 602 and capable of running on the processor 601. When the program is executed by the processor 601, each process of the above-mentioned test method embodiment applied to CPE OTN test equipment is implemented, and the same technical effect can be achieved. To avoid duplication, the details will not be described here.

Embodiments of the present invention also provide a computer-readable storage medium. A computer program is stored on the computer-readable storage medium. When the computer program is executed by a processor, each process of the above-mentioned test method embodiment is implemented and the same technical effect can be achieved. , to avoid repetition, will not be repeated here. Wherein, the computer-readable storage medium is such as ROM, RAM, magnetic disk or optical disk.

It should be noted that, in this document, the terms "comprising", "comprises" or any other variations thereof are intended to cover a non-exclusive inclusion, such that a process, method, article or device that includes a series of elements not only includes those elements, It also includes other elements not expressly listed or inherent in the process, method, article or apparatus. Without further limitation, an element defined by the statement "comprises a..." does not exclude the presence of additional identical elements in a process, method, article or apparatus that includes that element.

Through the above description of the embodiments, those skilled in the art can clearly understand that the methods of the above embodiments can be implemented by means of software plus the necessary general hardware platform. Of course, it can also be implemented by hardware, but in many cases the former is better. implementation. Based on this understanding, the technical solution of the present invention can be embodied in the form of a software product in essence or the part that contributes to the existing technology. The computer software product is stored in a storage medium (such as ROM/RAM, disk, CD), including several instructions to cause a terminal (which can be a mobile phone, a computer, a server, an air conditioner, or a network device, etc.) to execute the methods described in various embodiments of the present invention.

The embodiments of the present invention have been described above in conjunction with the accompanying drawings. However, the present invention is not limited to the above-mentioned specific implementations. The above-mentioned specific implementations are only illustrative and not restrictive. Those of ordinary skill in the art will Under the inspiration of the present invention, many forms can be made without departing from the spirit of the present invention and the scope protected by the claims, all of which fall within the protection of the present invention.

Claims (13)

1. A method of testing applied to a device under test, the method comprising:

receiving a configuration request sent by Customer Premise Equipment (CPE) OTN test equipment, and configuring an equipment mode into a CPE OTN test mode based on the configuration request;

sending a configuration result corresponding to the configuration request to the CPE OTN test equipment;

receiving a test instruction sent by the CPE OTN test equipment;

and executing test operation and sending an operation result corresponding to the test operation to the CPE OTN test equipment.

2. The method according to claim 1, wherein the performing a test operation and sending an operation result corresponding to the test operation to the CPE OTN test device includes:

Receiving a test service stream sent by the CPE OTN test equipment;

processing the test service flow in the test mode to obtain an operation result corresponding to the test operation;

and sending an operation result corresponding to the test operation to the CPE OTN test equipment, so that the CPE OTN test equipment can automatically verify the operation result according to the preset test specification requirement and feed back the result.

3. The method according to claim 1, wherein the configuration request carries CPE OTN test configuration information corresponding to an interface to be tested and a function to be tested;

the configuring the device mode to the CPE OTN test mode based on the configuration request includes:

and executing service function configuration, interface type configuration and service loop configuration of the equipment to be tested based on the CPE OTN test configuration information so as to configure the equipment mode into a CPE OTN test mode.

4. The method of claim 1, wherein receiving the configuration request sent by the CPE OTN test device comprises:

receiving a configuration request sent by CPE OTN test equipment through a configuration management and control channel, wherein the configuration management and control channel comprises a general communication channel GCC management and control channel or an operation maintenance management OAM management and control channel;

Or,

and receiving a configuration request sent by the CPE OTN test equipment through the chip management and control layer of the equipment to be tested.

5. A test method applied to CPE OTN test equipment, the method comprising:

sending a configuration request to equipment to be tested, wherein the configuration request is used for requesting to configure an equipment mode into a CPE OTN test mode;

receiving a configuration result corresponding to the configuration request, which is sent by the device to be tested;

under the condition that the configuration result represents that the configuration is completed, a test instruction is sent to the equipment to be tested;

and receiving an operation result which is sent by the equipment to be tested and corresponds to the test operation executed by the equipment to be tested.

6. The method of claim 5, wherein after the sending the test instruction to the device under test, the method further comprises:

transmitting a test service flow to the equipment to be tested, so that the equipment to be tested processes the test service flow in the CPE OTN test mode to obtain an operation result corresponding to test operation;

after receiving the operation result corresponding to the test operation performed by the device to be tested, the method further includes:

And automatically verifying the operation result according to the preset test specification requirement, and feeding back the result.

7. The method of claim 5, wherein the configuration request carries CPE OTN test configuration information corresponding to an interface to be tested and a function to be tested.

8. The method of claim 5, wherein the sending the configuration request to the device under test comprises:

transmitting a configuration request to equipment to be tested through a configuration management and control channel, wherein the configuration management and control channel comprises a general communication channel GCC management and control channel or an operation maintenance management OAM management and control channel;

or,

and sending a configuration request to the equipment to be tested through the chip management and control layer of the equipment to be tested.

9. A test apparatus for use with a device under test, the apparatus comprising:

the configuration module is used for receiving a configuration request sent by CPE OTN test equipment of the customer side optical transport network equipment and configuring the equipment mode into a CPE OTN test mode based on the configuration request;

a sending module, configured to send a configuration result corresponding to the configuration request to the CPE OTN test device;

the receiving module is used for receiving a test instruction sent by the CPE OTN test equipment;

And the execution module is used for executing the test operation and sending an operation result corresponding to the test operation to the CPE OTN test equipment.

10. A test device for use in CPE OTN test equipment, said device comprising:

the device comprises a first sending module, a second sending module and a third sending module, wherein the first sending module is used for sending a configuration request to the device to be tested, and the configuration request is used for requesting to configure the device mode into a CPE OTN test mode;

the first receiving module is used for receiving a configuration result corresponding to the configuration request, which is sent by the equipment to be tested;

the second sending module is used for sending a test instruction to the equipment to be tested under the condition that the configuration result represents that the configuration is completed;

and the second receiving module is used for receiving an operation result which is sent by the equipment to be tested and corresponds to the test operation executed by the equipment to be tested.

11. A device under test, comprising: a processor, a memory and a program stored on the memory and executable on the processor, which when executed by the processor, implements the steps of the test method according to any one of claims 1 to 4.

12. A CPE OTN test device, comprising: a processor, a memory and a program stored on the memory and executable on the processor, which when executed by the processor implements the steps of the test method according to any one of claims 5 to 8.

13. A computer readable storage medium, characterized in that the computer readable storage medium has stored thereon a computer program which, when executed by a processor, implements the steps of the test method according to any of claims 1 to 4 or which, when executed by a processor, implements the steps of the test method according to any of claims 5 to 8.