CN116980959A - Test method, test device and related equipment - Google Patents
Test method, test device and related equipment Download PDFInfo
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- CN116980959A CN116980959A CN202210454099.7A CN202210454099A CN116980959A CN 116980959 A CN116980959 A CN 116980959A CN 202210454099 A CN202210454099 A CN 202210454099A CN 116980959 A CN116980959 A CN 116980959A
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- 238000012360 testing method Methods 0.000 title claims abstract description 472
- 238000010998 test method Methods 0.000 title claims description 18
- 238000004891 communication Methods 0.000 claims abstract description 16
- 238000000034 method Methods 0.000 claims description 51
- 230000006870 function Effects 0.000 claims description 50
- 238000012423 maintenance Methods 0.000 claims description 12
- 230000003287 optical effect Effects 0.000 claims description 11
- 238000012545 processing Methods 0.000 claims description 9
- 238000004590 computer program Methods 0.000 claims description 4
- 238000010586 diagram Methods 0.000 description 13
- 230000005540 biological transmission Effects 0.000 description 10
- 238000012795 verification Methods 0.000 description 8
- 238000007689 inspection Methods 0.000 description 7
- 230000000694 effects Effects 0.000 description 5
- 238000009432 framing Methods 0.000 description 5
- 238000013507 mapping Methods 0.000 description 3
- 230000003313 weakening effect Effects 0.000 description 3
- 238000001514 detection method Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 238000012544 monitoring process Methods 0.000 description 2
- 230000001360 synchronised effect Effects 0.000 description 2
- DWSYCUKCNSVBRA-UHFFFAOYSA-N 4-(5-methylsulfonyltetrazol-1-yl)phenol Chemical compound CS(=O)(=O)C1=NN=NN1C1=CC=C(C=C1)O DWSYCUKCNSVBRA-UHFFFAOYSA-N 0.000 description 1
- 101150012532 NANOG gene Proteins 0.000 description 1
- 101100396520 Saccharomyces cerevisiae (strain ATCC 204508 / S288c) TIF3 gene Proteins 0.000 description 1
- 101710167643 Serine/threonine protein phosphatase PstP Proteins 0.000 description 1
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- 238000005538 encapsulation Methods 0.000 description 1
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04W—WIRELESS COMMUNICATION NETWORKS
- H04W24/00—Supervisory, monitoring or testing arrangements
- H04W24/10—Scheduling measurement reports ; Arrangements for measurement reports
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04J—MULTIPLEX COMMUNICATION
- H04J3/00—Time-division multiplex systems
- H04J3/16—Time-division multiplex systems in which the time allocation to individual channels within a transmission cycle is variable, e.g. to accommodate varying complexity of signals, to vary number of channels transmitted
- H04J3/1605—Fixed allocated frame structures
- H04J3/1652—Optical Transport Network [OTN]
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
- H04L41/00—Arrangements for maintenance, administration or management of data switching networks, e.g. of packet switching networks
- H04L41/08—Configuration management of networks or network elements
- H04L41/0803—Configuration setting
- H04L41/0813—Configuration setting characterised by the conditions triggering a change of settings
- H04L41/0816—Configuration setting characterised by the conditions triggering a change of settings the condition being an adaptation, e.g. in response to network events
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- Computer Networks & Wireless Communication (AREA)
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Abstract
The invention provides a testing method, a testing device and related equipment, and relates to the technical field of communication, wherein the testing method comprises the following steps: receiving a configuration request sent by Customer Premise Equipment (CPE) OTN test equipment, and configuring an equipment mode into a CPE OTN test mode based on the configuration request; sending a configuration result corresponding to the configuration request to the CPEOTN test equipment; receiving a test instruction sent by the CPE OTN test equipment; and executing test operation and sending an operation result corresponding to the test operation to the CPE OTN test equipment. The embodiment of the invention can improve the reliability of CPE OTN equipment.
Description
Technical Field
The present invention relates to the field of communications technologies, and in particular, to a testing method, an apparatus, and a related device.
Background
In the prior art, when a 5G service is transmitted and a multi-service access is faced, a slice packet network (Slicing Packet Network, SPN)/optical transport network (Optical Transport Network, OTN) needs to support transmission pipelines of a plurality of different services, including at least 5G, 4G, customer collection and home width, different transmission grades are required for different services, and different transmission pipelines are required to be configured for different transmission grades to meet different service requirements, wherein the transmission grades are determined according to bandwidth, time delay, jitter, reliability, security and the like.
After the customer side OTN equipment (Customer Premise Equipment OTN, CPE OTN) is produced, the CPE OTN technical specification requirements may not be satisfied. When the CPE OTN equipment is put into the network, the CPE OTN equipment may have the problem of weakening the chip, such as weakening of an interface module, simplification of service functions and the like, so that the CPE OTN equipment cannot meet the technical specification requirements of the CPE OTN when the CPE OTN equipment is accessed into the service, and the reliability is low.
Disclosure of Invention
The embodiment of the invention provides a testing method, a testing device and related equipment, which are used for solving the problems that the conventional CPE OTN equipment cannot meet the technical specification requirements of CPE OTN when being accessed to service and has lower reliability.
In order to solve the technical problems, the invention is realized as follows:
in a first aspect, an embodiment of the present invention provides a testing method, applied to a device under test, where the method includes:
receiving a configuration request sent by Customer Premise Equipment (CPE) OTN test equipment, and configuring an equipment mode into a CPE OTN test mode based on the configuration request;
sending a configuration result corresponding to the configuration request to the CPE OTN test equipment;
receiving a test instruction sent by the CPE OTN test equipment;
and executing test operation and sending an operation result corresponding to the test operation to the CPE OTN test equipment.
Optionally, the executing the test operation and sending an operation result corresponding to the test operation to the CPE OTN test device includes:
receiving a test service stream sent by the CPE OTN test equipment;
processing the test service flow in the test mode to obtain an operation result corresponding to the test operation;
and sending an operation result corresponding to the test operation to the CPE OTN test equipment, so that the CPE OTN test equipment can automatically verify the operation result according to the preset test specification requirement and feed back the result.
Optionally, the configuration request carries CPE OTN test configuration information corresponding to the interface to be tested and the function to be tested;
the configuring the device mode to the CPE OTN test mode based on the configuration request includes:
and executing service function configuration, interface type configuration and service loop configuration of the equipment to be tested based on the CPE OTN test configuration information so as to configure the equipment mode into a CPE OTN test mode.
Optionally, the receiving the configuration request sent by the CPE OTN test device includes:
receiving a configuration request sent by CPE OTN test equipment through a configuration management and control channel, wherein the configuration management and control channel comprises a general communication channel GCC management and control channel or an operation maintenance management OAM management and control channel;
Or alternatively, the process may be performed,
and receiving a configuration request sent by the CPE OTN test equipment through the chip management and control layer of the equipment to be tested.
In a second aspect, an embodiment of the present invention provides a testing method, applied to CPE OTN testing equipment, where the method includes:
sending a configuration request to equipment to be tested, wherein the configuration request is used for requesting to configure an equipment mode into a CPE OTN test mode;
receiving a configuration result corresponding to the configuration request, which is sent by the device to be tested;
under the condition that the configuration result represents that the configuration is completed, a test instruction is sent to the equipment to be tested;
and receiving an operation result which is sent by the equipment to be tested and corresponds to the test operation executed by the equipment to be tested.
Optionally, after the sending the test instruction to the device under test, the method further includes:
transmitting a test service flow to the equipment to be tested, so that the equipment to be tested processes the test service flow in the CPE OTN test mode to obtain an operation result corresponding to test operation;
after receiving the operation result corresponding to the test operation performed by the device to be tested, the method further includes:
And automatically verifying the operation result according to the preset test specification requirement, and feeding back the result.
Optionally, the configuration request carries CPE OTN test configuration information corresponding to the interface to be tested and the function to be tested.
Optionally, the sending the configuration request to the device under test includes:
transmitting a configuration request to equipment to be tested through a configuration management and control channel, wherein the configuration management and control channel comprises a general communication channel GCC management and control channel or an operation maintenance management OAM management and control channel;
or alternatively, the process may be performed,
and sending a configuration request to the equipment to be tested through the chip management and control layer of the equipment to be tested.
In a third aspect, an embodiment of the present invention provides a testing apparatus applied to a device under test, where the testing apparatus includes:
the configuration module is used for receiving a configuration request sent by CPE OTN test equipment of the customer side optical transport network equipment and configuring the equipment mode into a CPE OTN test mode based on the configuration request;
a sending module, configured to send a configuration result corresponding to the configuration request to the CPE OTN test device;
the receiving module is used for receiving a test instruction sent by the CPE OTN test equipment;
and the execution module is used for executing the test operation and sending an operation result corresponding to the test operation to the CPE OTN test equipment.
Optionally, the execution module is specifically configured to:
receiving a test service stream sent by the CPE OTN test equipment;
processing the test service flow in the test mode to obtain an operation result corresponding to the test operation;
and sending an operation result corresponding to the test operation to the CPE OTN test equipment, so that the CPE OTN test equipment can automatically verify the operation result according to the preset test specification requirement and feed back the result.
Optionally, the configuration request carries CPE OTN test configuration information corresponding to the interface to be tested and the function to be tested;
the configuration module is specifically configured to:
receiving a configuration request sent by Customer Premise Equipment (CPE) OTN test equipment;
and executing service function configuration, interface type configuration and service loop configuration of the equipment to be tested based on the CPE OTN test configuration information so as to configure the equipment mode into a CPE OTN test mode.
Optionally, the configuration module is specifically configured to:
receiving a configuration request sent by CPE OTN test equipment through a configuration management and control channel, wherein the configuration management and control channel comprises a general communication channel GCC management and control channel or an operation maintenance management OAM management and control channel; or receiving a configuration request sent by CPE OTN test equipment through a chip management and control layer of the equipment to be tested;
And configuring the equipment mode into a CPE OTN test mode based on the configuration request.
In a fourth aspect, an embodiment of the present invention provides a testing apparatus applied to a CPE OTN testing device, where the apparatus includes:
the device comprises a first sending module, a second sending module and a third sending module, wherein the first sending module is used for sending a configuration request to the device to be tested, and the configuration request is used for requesting to configure the device mode into a CPE OTN test mode;
the first receiving module is used for receiving a configuration result corresponding to the configuration request, which is sent by the equipment to be tested;
the second sending module is used for sending a test instruction to the equipment to be tested under the condition that the configuration result represents that the configuration is completed;
and the second receiving module is used for receiving an operation result which is sent by the equipment to be tested and corresponds to the test operation executed by the equipment to be tested.
Optionally, the apparatus further includes:
the third sending module is used for sending a test service flow to the equipment to be tested so that the equipment to be tested processes the test service flow in the CPE OTN test mode to obtain an operation result corresponding to the test operation;
and the verification module is used for automatically verifying the operation result according to the preset test specification requirement and feeding back the result.
Optionally, the configuration request carries CPE OTN test configuration information corresponding to the interface to be tested and the function to be tested.
Optionally, the first sending module is specifically configured to:
transmitting a configuration request to equipment to be tested through a configuration management and control channel, wherein the configuration management and control channel comprises a general communication channel GCC management and control channel or an operation maintenance management OAM management and control channel;
or alternatively, the process may be performed,
and sending a configuration request to the equipment to be tested through the chip management and control layer of the equipment to be tested.
In a fifth aspect, an embodiment of the present invention provides a device under test, including: a processor, a memory and a program stored on the memory and executable on the processor, which when executed by the processor implements the steps of the test method described in the first aspect.
In a sixth aspect, an embodiment of the present invention provides a CPE OTN test apparatus, including: a processor, a memory and a program stored on the memory and executable on the processor, which when executed by the processor implements the steps of the test method described in the second aspect above.
In a seventh aspect, an embodiment of the present invention provides a computer readable storage medium, where a computer program is stored, where the computer program, when executed by a processor, implements the steps of the test method described in the first aspect above; or which when executed by a processor implements the steps of the test method of the second aspect described above.
In the embodiment of the invention, a configuration request sent by CPE OTN test equipment of customer side optical transport network equipment is received, and an equipment mode is configured into a CPE OTN test mode based on the configuration request; sending a configuration result corresponding to the configuration request to the CPE OTN test equipment; receiving a test instruction sent by the CPE OTN test equipment; and executing test operation and sending an operation result corresponding to the test operation to the CPE OTN test equipment. In this way, the CPE OTN test equipment can be used for carrying out CPE OTN test on the CPE OTN equipment, so that the CPE OTN equipment can meet the requirements of the CPE OTN technical specification when the CPE OTN equipment is accessed into service, and the reliability of the CPE OTN equipment is improved.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings that are needed in the description of the embodiments of the present invention will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and other drawings may be obtained according to these drawings without inventive effort to a person of ordinary skill in the art.
FIG. 1 is one of the flow charts of a test method provided in an embodiment of the present invention;
Fig. 2 is a schematic structural diagram of a CPE OTN chip according to an embodiment of the present invention;
FIG. 3 is a schematic diagram of a CPE OTN chip according to an embodiment of the present invention;
fig. 4 is a third schematic structural diagram of a CPE OTN chip according to an embodiment of the present invention;
fig. 5 is a schematic structural diagram of a CPE OTN chip according to an embodiment of the present invention;
fig. 6 is a schematic diagram of a CPE OTN chip according to an embodiment of the present invention;
fig. 7 is a schematic diagram of a test of a CPE OTN chip according to an embodiment of the present invention;
FIG. 8 is a second schematic diagram illustrating a test of a CPE OTN chip according to an embodiment of the present invention;
FIG. 9 is a second flowchart of a testing method according to an embodiment of the present invention;
FIG. 10 is a third flowchart of a testing method according to an embodiment of the present invention;
FIG. 11 is a fourth flowchart of a testing method according to an embodiment of the present invention;
FIG. 12 is a schematic diagram of a testing device according to an embodiment of the present invention;
FIG. 13 is a second schematic diagram of a testing apparatus according to an embodiment of the present invention;
FIG. 14 is a schematic diagram of a device under test according to an embodiment of the present invention;
Fig. 15 is a schematic structural diagram of a CPE OTN testing device according to an embodiment of the present invention.
Detailed Description
The following description of the embodiments of the present invention will be made clearly and fully with reference to the accompanying drawings, in which it is evident that the embodiments described are some, but not all embodiments of the invention. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
In the embodiment of the invention, a testing method, a testing device and related equipment are provided to solve the problems that the conventional CPE OTN equipment cannot meet the technical specification requirements of CPE OTN when being accessed to service and has lower reliability.
Referring to fig. 1, fig. 1 is a flowchart of a testing method provided by an embodiment of the present invention, for a device under test, as shown in fig. 1, the method includes the following steps:
and step 101, receiving a configuration request sent by Customer Premise Equipment (CPE) OTN test equipment, and configuring an equipment mode into a CPE OTN test mode based on the configuration request.
The configuration request may carry CPE OTN test configuration information corresponding to the interface to be tested and the function to be tested, and after the device to be tested receives the CPE OTN test configuration information, the device mode may be configured into a CPE OTN test mode according to the CPE OTN test configuration information, including service function configuration, interface type configuration, service loopback configuration, and the like.
In addition, the CPE OTN test device may send a configuration request to the device under test through a device line or a management layer.
In one embodiment, the device under test may include a device under test chip, and may include, for example, a CPE OTN device chip. The CPE OTN test device may include a CPE OTN test enhancement chip.
And 102, sending a configuration result corresponding to the configuration request to the CPE OTN test equipment.
Under the condition that the configuration request is completed, the device to be tested can send a configuration result corresponding to the configuration request to the CPE OTN test device, inform the CPE OTN test device that the device to be tested has completed configuration, and start testing.
In addition, the configuration result may be used to indicate that the device under test has completed configuration of the device mode, and testing may begin.
And step 103, receiving a test instruction sent by the CPE OTN test equipment.
And 104, executing test operation and sending an operation result corresponding to the test operation to the CPE OTN test equipment.
The test operation may include at least one of a device interface test, a device function test, and a basic performance test, among others. The equipment to be tested can receive the test service flow sent by the CPE OTN test equipment; and processing the test service flow in the test mode to obtain an operation result corresponding to the test operation.
In addition, after receiving an operation result corresponding to a test operation executed by the device to be tested, the CPE OTN test device may parse the operation result to obtain a parsed result, compare the parsed result with an expected result, and display a test result corresponding to the compared result.
In one embodiment, the CPE OTN test device may detect a chip interface function of the device under test by sending a test traffic stream; the equipment to be tested processes the transmitted test service flow according to the CPE OTN test configuration information, and returns the processed test service flow on the interface; the CPE OTN test equipment analyzes the returned processed test service flow, determines whether the processed test service flow meets the expected result, compares the analysis result with the expected result, and displays the test result corresponding to the comparison result. For example, the comparison result may be in agreement with the expected result, and the test result may be a test pass; alternatively, the comparison result may be that the test does not match the expected result, and the test result may be that the test does not pass.
It should be noted that, at present, the 5G network can support multiple services and application scenarios, for example, enhanced mobile broadband service (Enhanced Mobile Broadband, eMBB) with higher bandwidth and lower time delay, internet of things service (emtc) with mass user connection, ultra high reliability, ultra low latency (Ultra real & Low Latency Communication, uirllc) and other services, or be applied to application scenarios such as high-speed mobile application with high definition, ultra high definition, 3D holographic film and video, high speed mobile application with speed greater than 350km/h, sensor network, haptic internet, E-Health, natural disaster monitoring and the like. However, since the 5G network needs to support transmission of different service types at the same time, the existing 4G transmission technology cannot meet the 5G challenge in all aspects, and therefore, a new slice transmission network technical system is required to support transmission of the 5G service. It is against this background that slice packet networks (Slicing Packet Network, SPN)/optical transport networks (Optical Transport Network, OTN) have evolved.
The CPE OTN device comprises CPE OTN chips which execute multi-service (E1, FE, GE, 10GE LAN, STM-1, STM-4 and other customer service) access, OTN service transmission, MSTP multi-service and ETH functions. CPE OTN chip support functions include service mapping processing, link monitoring and protection, ethernet VLAN forwarding and OAM, frequency synchronization and other functions.
For multiple service accesses, multiple interfaces, service mapping paths and OTN service processing are required to be supported on the CPE OTN chip. In OTN traffic handling, various cascade mappings (VC 12, VC4, STM1, STM4, STM16, OTN0, OTN1, etc.), various encapsulation (GFP, GMP, AMP/BMP, etc.), SNCP protection, etc. need to be handled.
It should be noted that, the current network uses CPE OTN chips to realize weakening of the chip, and the laboratory test is not the same version, and the problem of failing to meet the technical specification requirements is solved. According to the invention, a new simple test architecture is defined by optimizing the test verification flow at the CPE OTN chip layer, the chip test verification capability is optimized, the chip function and performance of a tester are completely verified, a more concise and complete network detection test scheme is provided, and reliable network equipment assurance can be provided for network application.
As a specific embodiment, as shown in fig. 2, the CPE OTN chip has the following functional features and interface features when meeting the technical specification requirements:
e1 Framer (Framer) function 2 x E1;
SDH framing function (1-4) x 2;
grouping function (2 FE/GE);
OTN frames OUT 0/1 2 Ports (Ports).
Wherein 2 x E1 characterizes 2E 1 interfaces, and 2FE/GE characterizes 2 fast ethernet or gigabit ethernet interfaces. SDH (Synchronous Digital Hierarchy) is a synchronous digital hierarchy, and SDH framing functions involve a total of 2 interfaces, each comprising 4 interfaces.
In order to save cost, weaken actual chip function, when CPE OTN equipment chip is applied to the present network, the condition of using unqualified chip includes following two kinds: a chip weakened by an interface module is used; a chip with simplified service functions is used. For example, as shown in fig. 3, the SDH framing function and the packet function are absent, as shown in fig. 4, the E1 framer function and the packet function are absent, as shown in fig. 5, the interface of the SDH framing function is simplified from (1-4) x 2 to 1*2, as shown in fig. 6, the OTN framing OUT port is simplified from 2 to 1, and the packet function interface is simplified from 2 to 1.
In the embodiment of the present invention, the CPE OTN test device may include a CPE OTN test enhancement chip, as shown in fig. 7, by performing chip test enhancement on the CPE OTN chip, adding a CPE OTN test function on the CPE OTN chip layer, changing the CPE OTN chip into a CPE OTN test enhancement chip with a test function, and notifying the test configuration to the device to be tested through a management control or line side interface, where the test function of the CPE OTN test enhancement chip uses the standard function of the CPE OTN test enhancement chip to perform comprehensive test on the device to be tested of the current network, and verifies the technical specification degree of the chip and the device. The test function of the CPE OTN test enhancement chip defines test operation, can automatically test and verify the interfaces and functions of the existing network equipment, and returns test results.
In the embodiment of the invention, a configuration request sent by CPE OTN test equipment of customer side optical transport network equipment is received, and an equipment mode is configured into a CPE OTN test mode based on the configuration request; sending a configuration result corresponding to the configuration request to the CPE OTN test equipment; receiving a test instruction sent by the CPE OTN test equipment; and executing test operation and sending an operation result corresponding to the test operation to the CPE OTN test equipment. In this way, the CPE OTN test equipment can be used for carrying out CPE OTN test on the CPE OTN equipment, so that the CPE OTN equipment can meet the requirements of the CPE OTN technical specification when the CPE OTN equipment is accessed into service, and the reliability of the CPE OTN equipment is improved.
Optionally, the executing the test operation and sending an operation result corresponding to the test operation to the CPE OTN test device includes:
receiving a test service stream sent by the CPE OTN test equipment;
processing the test service flow in the test mode to obtain an operation result corresponding to the test operation;
and sending an operation result corresponding to the test operation to the CPE OTN test equipment, so that the CPE OTN test equipment can automatically verify the operation result according to the preset test specification requirement and feed back the result.
The device to be tested receives the test service flow sent by the CPE OTN test device, and can process the test service flow sent by the CPE OTN test device according to CPE OTN test configuration information to obtain an operation result corresponding to test operation, wherein the operation result can be the processed test service flow, and the device to be tested can return the processed test service flow on an interface.
In addition, the CPE OTN test apparatus automatically verifies the operation result according to a preset test specification requirement and feeds back the result, which may include: the CPE OTN test equipment analyzes the operation result to obtain an analysis result; and comparing the analysis result with an expected result, and displaying a test result corresponding to the comparison result.
In this embodiment, a test service stream sent by the CPE OTN test device is received; and processing the test service flow in the test mode to obtain an operation result corresponding to the test operation, so that the test operation of operators can be simplified, and the network use is convenient.
Optionally, the configuration request carries CPE OTN test configuration information corresponding to the interface to be tested and the function to be tested;
the configuring the device mode to the CPE OTN test mode based on the configuration request includes:
And executing service function configuration, interface type configuration and service loop configuration of the equipment to be tested based on the CPE OTN test configuration information so as to configure the equipment mode into a CPE OTN test mode.
The CPE OTN test configuration information may be used to configure a device mode of a device to be tested into a CPE OTN test mode, and specifically, may be that the device to be tested executes service function configuration, interface type configuration, service loopback configuration, and the like of the device to be tested. After the service function configuration, the interface type configuration and the service loop configuration corresponding to the CPE OTN test mode are completed, the equipment to be tested is in the CPE OTN test mode, so that test service flows sent by the CPE OTN test equipment can be received, and the test service flows are processed in the test mode to obtain operation results corresponding to test operations.
In this embodiment, the service function configuration, the interface type configuration and the service loop configuration of the device to be tested are performed based on the CPE OTN test configuration information, so that the device to be tested is configured as a CPE OTN test mode, and thus the device to be tested can implement simple test verification on the device to be tested through the CPE OTN test configuration information sent by the CPE OTN test device.
Optionally, the receiving the configuration request sent by the CPE OTN test device includes:
receiving a configuration request sent by CPE OTN test equipment through a configuration management channel, wherein the configuration management channel comprises a general communication channel (General Communications Channel, GCC) management channel or an operation maintenance management (Operation Administration and Maintenance, OAM) management channel;
or alternatively, the process may be performed,
and receiving a configuration request sent by the CPE OTN test equipment through the chip management and control layer of the equipment to be tested.
Wherein, a configuration management and control channel can be established between CPE OTN test equipment and equipment to be tested. The CPE OTN test equipment can send CPE OTN test configuration information corresponding to the interface to be tested and the function to be tested to the equipment to be tested.
In one embodiment, the device to be tested receives a configuration request sent by the CPE OTN test device through the GCC control channel, so as to implement test configuration in a device line configuration manner. The device to be tested can transmit a configuration request through 4 bits (bit) of the GCC control channel, wherein bit1 and bit2 are bits of a description type (type), and bit3 and bit4 are bits of a description parameter (parameter).
Wherein the following definitions may be made:
type:00, starting factory test configuration; 01, finishing the configuration of the factory test and starting the test; 10, finishing the factory test and returning a result; 11, reserved.
param:00, testing parameter configuration; xx, the test result is returned, wherein xx is a value except 00.
For example, the device to be tested may be a factory inspection device chip, and the CPE OTN test device may be a test enhancement chip, and the test method includes the following steps:
(1) The test enhancement chip sends CPE OTN test configuration information to the factory inspection equipment chip through the GCC control channel;
(2) After receiving CPE OTN test configuration information, the factory inspection equipment chip starts to configure equipment ports, protocols and the like, and sends test configuration '00' to the test enhancement chip;
(3) After the factory verification equipment chip finishes configuration, transmitting '01' to the test enhancement chip;
(4) The test enhancement chip sends '01' to the factory inspection equipment chip and starts to send test service flow;
(5) After the test is finished, the factory inspection equipment chip sends 10 to the test enhancement chip;
(6) After the test enhancement chip receives '10', it sends '10', and returns the test result.
It should be noted that, after the test enhancement chip receives the configuration result of the factory inspection device chip to complete configuration, the test instruction will start to be executed. If the feedback configuration of the factory inspection equipment chip is unsuccessful, the test enhancement chip waits.
In addition, the CPE OTN test equipment can also realize test configuration in a mode of equipment management configuration. As shown in fig. 8, the CPE OTN test device may send CPE OTN test configuration information corresponding to the interface to be tested and the function to be tested to the device to be tested management and control layer, and after the device to be tested receives the CPE OTN test configuration information, the device mode may be configured as a test mode according to the CPE OTN test configuration information.
In this embodiment, a configuration request sent by a CPE OTN test device is received through a configuration management channel, where the configuration management channel includes a general communication channel GCC management channel or an operation maintenance management OAM management channel; or receiving the configuration request sent by the CPE OTN test equipment through the chip control layer of the equipment to be tested, so that the configuration request can be sent through the configuration control channel or the chip control layer.
Referring to fig. 9, fig. 9 is a flowchart of a testing method provided by an embodiment of the present invention, for a CPE OTN testing device, as shown in fig. 9, the method includes the following steps:
step 201, a configuration request is sent to a device to be tested, where the configuration request is used to request that a device mode be configured into a CPE OTN test mode;
Step 202, receiving a configuration result corresponding to the configuration request, which is sent by the device to be tested;
step 203, sending a test instruction to the device to be tested under the condition that the configuration result represents that the configuration is completed;
step 204, receiving an operation result corresponding to the test operation executed by the device to be tested, which is sent by the device to be tested.
Optionally, after the sending the test instruction to the device under test, the method further includes:
transmitting a test service flow to the equipment to be tested, so that the equipment to be tested processes the test service flow in the CPE OTN test mode to obtain an operation result corresponding to test operation;
after receiving the operation result corresponding to the test operation performed by the device to be tested, the method further includes:
and automatically verifying the operation result according to the preset test specification requirement, and feeding back the result.
Optionally, the configuration request carries CPE OTN test configuration information corresponding to the interface to be tested and the function to be tested.
Optionally, the sending the configuration request to the device under test includes:
transmitting a configuration request to equipment to be tested through a configuration management and control channel, wherein the configuration management and control channel comprises a general communication channel GCC management and control channel or an operation maintenance management OAM management and control channel;
Or alternatively, the process may be performed,
and sending a configuration request to the equipment to be tested through the chip management and control layer of the equipment to be tested.
It should be noted that, in this embodiment, as an implementation manner of the CPE OTN test device corresponding to the embodiment shown in fig. 1, a specific implementation manner of the CPE OTN test device may refer to a description related to the embodiment shown in fig. 1, so that in order to avoid repeated description, the embodiment is not described again, and the same beneficial effects may be achieved.
In one embodiment, as shown in fig. 10, the CPE OTN test device sends a configuration request to the device under test, and waits for the configuration of the device under test to be completed; after the configuration of the equipment to be tested is completed, sending a test service flow to the equipment to be tested; the CPE OTN test equipment receives and detects the test service flow processed by the equipment to be tested, compares the test service flow with the expected result and feeds back the test result; and the CPE OTN test equipment completes the test through the equipment to be tested. As shown in fig. 11, the device to be tested receives a configuration request sent by the CPE OTN test device, and performs configuration according to the configuration request; after the configuration is completed, waiting for testing the service flow; the device to be tested processes the test service flow and returns the processed test service flow; after the test is completed, the device to be tested feeds back the test result of the completed test, exits the test mode and enters the working state.
In one embodiment, the device under test includes a device under test chip, the CPE OTN test device includes a CPE OTN test enhancement chip, and the test method may include the following steps:
(1) And the device chip to be tested receives CPE OTN test configuration information which is sent by the CPE OTN test enhancement chip and corresponds to the interface to be tested and the function to be tested, configures the current device mode into a test mode based on the CPE OTN test configuration information, and returns a configuration result, wherein the CPE OTN test enhancement chip has the CPE OTN test function.
The CPE OTN test configuration information may be sent in the following two manners:
the method one, a configuration control channel is established, wherein the configuration control channel is used for realizing communication between a CPE OTN test enhancement chip and a device chip to be tested, and comprises at least a GCC control channel and an OAM control channel; the CPE OTN test enhancement chip sends CPE OTN test configuration information to the device chip to be tested through the configuration management and control channel, the device chip to be tested configures the current mode of the test device into a test mode based on the CPE OTN test configuration information, and the configuration result is returned to the test enhancement chip;
the second mode is that the CPE OTN test enhancement chip sends CPE OTN test configuration information to the chip management and control layer of the equipment to be tested, after the chip management and control layer of the equipment to be tested receives the CPE OTN test configuration information, the current mode of the test equipment is configured into a test mode based on the CPE OTN test configuration information, and a configuration result is returned to the test enhancement chip;
(2) After receiving the configuration result, the CPE OTN test enhancement chip sends a test instruction to the device chip to be tested under the condition that the configuration result is determined to be the configuration completion;
(3) After receiving the test instruction, the device chip to be tested processes the test service flow sent by the CPE OTN test enhancement chip to obtain an operation result corresponding to the test operation, and returns the operation result to the test enhancement chip;
(4) The CPE OTN test enhancement chip analyzes the operation result to obtain an analysis result; and comparing the analysis result with an expected result, and displaying a test result corresponding to the comparison result.
According to the invention, a new simple test architecture is defined by optimizing the test verification flow at the CPE OTN chip layer, the chip test verification capability is optimized, the chip function and performance of a tester are completely verified, a more concise and complete network detection test scheme is provided, and reliable network equipment assurance can be provided for network application.
Referring to fig. 12, fig. 12 is a schematic structural diagram of a test apparatus according to an embodiment of the present invention, where the test apparatus is applied to a device under test, and as shown in fig. 12, a test apparatus 300 includes:
a configuration module 301, configured to receive a configuration request sent by a CPE OTN test device of a customer premise equipment optical transport network device, and configure a device mode to be a CPE OTN test mode based on the configuration request;
A sending module 302, configured to send a configuration result corresponding to the configuration request to the CPE OTN test device;
a receiving module 303, configured to receive a test instruction sent by the CPE OTN test device;
and the execution module 304 is configured to execute a test operation, and send an operation result corresponding to the test operation to the CPE OTN test device.
Optionally, the execution module is specifically configured to:
receiving a test service stream sent by the CPE OTN test equipment;
processing the test service flow in the test mode to obtain an operation result corresponding to the test operation;
and sending an operation result corresponding to the test operation to the CPE OTN test equipment, so that the CPE OTN test equipment can automatically verify the operation result according to the preset test specification requirement and feed back the result.
Optionally, the configuration request carries CPE OTN test configuration information corresponding to the interface to be tested and the function to be tested;
the configuration module is specifically configured to:
receiving a configuration request sent by Customer Premise Equipment (CPE) OTN test equipment;
and executing service function configuration, interface type configuration and service loop configuration of the equipment to be tested based on the CPE OTN test configuration information so as to configure the equipment mode into a CPE OTN test mode.
Optionally, the configuration module is specifically configured to:
receiving a configuration request sent by CPE OTN test equipment through a configuration management and control channel, wherein the configuration management and control channel comprises a general communication channel GCC management and control channel or an operation maintenance management OAM management and control channel; or receiving a configuration request sent by CPE OTN test equipment through a chip management and control layer of the equipment to be tested;
and configuring the equipment mode into a CPE OTN test mode based on the configuration request.
The device to be tested can implement each process implemented in the method embodiment of fig. 1, and achieve the same technical effects, and in order to avoid repetition, a detailed description is omitted here.
Fig. 13 is a schematic structural diagram of a testing device according to an embodiment of the present invention, where the testing device is applied to CPE OTN testing equipment, and as shown in fig. 13, the testing device 400 includes:
a first sending module 401, configured to send a configuration request to a device under test, where the configuration request is used to request that a device mode be configured as a CPE OTN test mode;
a first receiving module 402, configured to receive a configuration result corresponding to the configuration request sent by the device to be tested;
a second sending module 403, configured to send a test instruction to the device under test when the configuration result characterizes that the configuration is completed;
And the second receiving module 404 is configured to receive an operation result sent by the device under test and corresponding to a test operation performed by the device under test.
Optionally, the apparatus further includes:
the third sending module is used for sending a test service flow to the equipment to be tested so that the equipment to be tested processes the test service flow in the CPE OTN test mode to obtain an operation result corresponding to the test operation;
and the verification module is used for automatically verifying the operation result according to the preset test specification requirement and feeding back the result.
Optionally, the configuration request carries CPE OTN test configuration information corresponding to the interface to be tested and the function to be tested.
Optionally, the first sending module is specifically configured to:
transmitting a configuration request to equipment to be tested through a configuration management and control channel, wherein the configuration management and control channel comprises a general communication channel GCC management and control channel or an operation maintenance management OAM management and control channel;
or alternatively, the process may be performed,
and sending a configuration request to the equipment to be tested through the chip management and control layer of the equipment to be tested.
The CPE OTN test device can implement each process implemented in the method embodiment of fig. 9, and achieve the same technical effects, and in order to avoid repetition, a detailed description is omitted here.
As shown in fig. 14, the embodiment of the present invention further provides a device under test 500, including: the processor 501, the memory 502, and the program stored in the memory 502 and capable of running on the processor 501, when executed by the processor 501, implement the above-mentioned respective processes of the test method embodiment applied to the device under test, and achieve the same technical effects, so that repetition is avoided, and no further description is given here.
As shown in fig. 15, an embodiment of the present invention further provides a CPE OTN test device 600, including: the processor 601, the memory 602, and the program stored in the memory 602 and capable of running on the processor 601, when the program is executed by the processor 601, implement the above-mentioned respective processes of the test method embodiment applied to the CPE OTN test device, and achieve the same technical effects, so that repetition is avoided, and no further description is given here.
The embodiment of the invention also provides a computer readable storage medium, on which a computer program is stored, which when executed by a processor, implements the respective processes of the above-mentioned test method embodiment, and can achieve the same technical effects, and in order to avoid repetition, the description is omitted here. Wherein the computer readable storage medium is such as ROM, RAM, magnetic or optical disk.
It should be noted that, in this document, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising one … …" does not exclude the presence of other like elements in a process, method, article, or apparatus that comprises the element.
From the above description of the embodiments, it will be clear to those skilled in the art that the above-described embodiment method may be implemented by means of software plus a necessary general hardware platform, but of course may also be implemented by means of hardware, but in many cases the former is a preferred embodiment. Based on such understanding, the technical solution of the present invention may be embodied essentially or in a part contributing to the prior art in the form of a software product stored in a storage medium (e.g. ROM/RAM, magnetic disk, optical disk) comprising instructions for causing a terminal (which may be a mobile phone, a computer, a server, an air conditioner, or a network device, etc.) to perform the method according to the embodiments of the present invention.
The embodiments of the present invention have been described above with reference to the accompanying drawings, but the present invention is not limited to the above-described embodiments, which are merely illustrative and not restrictive, and many forms may be made by those having ordinary skill in the art without departing from the spirit of the present invention and the scope of the claims, which are to be protected by the present invention.
Claims (13)
1. A method of testing applied to a device under test, the method comprising:
receiving a configuration request sent by Customer Premise Equipment (CPE) OTN test equipment, and configuring an equipment mode into a CPE OTN test mode based on the configuration request;
sending a configuration result corresponding to the configuration request to the CPE OTN test equipment;
receiving a test instruction sent by the CPE OTN test equipment;
and executing test operation and sending an operation result corresponding to the test operation to the CPE OTN test equipment.
2. The method according to claim 1, wherein the performing a test operation and sending an operation result corresponding to the test operation to the CPE OTN test device includes:
Receiving a test service stream sent by the CPE OTN test equipment;
processing the test service flow in the test mode to obtain an operation result corresponding to the test operation;
and sending an operation result corresponding to the test operation to the CPE OTN test equipment, so that the CPE OTN test equipment can automatically verify the operation result according to the preset test specification requirement and feed back the result.
3. The method according to claim 1, wherein the configuration request carries CPE OTN test configuration information corresponding to an interface to be tested and a function to be tested;
the configuring the device mode to the CPE OTN test mode based on the configuration request includes:
and executing service function configuration, interface type configuration and service loop configuration of the equipment to be tested based on the CPE OTN test configuration information so as to configure the equipment mode into a CPE OTN test mode.
4. The method of claim 1, wherein receiving the configuration request sent by the CPE OTN test device comprises:
receiving a configuration request sent by CPE OTN test equipment through a configuration management and control channel, wherein the configuration management and control channel comprises a general communication channel GCC management and control channel or an operation maintenance management OAM management and control channel;
Or alternatively, the process may be performed,
and receiving a configuration request sent by the CPE OTN test equipment through the chip management and control layer of the equipment to be tested.
5. A test method applied to CPE OTN test equipment, the method comprising:
sending a configuration request to equipment to be tested, wherein the configuration request is used for requesting to configure an equipment mode into a CPE OTN test mode;
receiving a configuration result corresponding to the configuration request, which is sent by the device to be tested;
under the condition that the configuration result represents that the configuration is completed, a test instruction is sent to the equipment to be tested;
and receiving an operation result which is sent by the equipment to be tested and corresponds to the test operation executed by the equipment to be tested.
6. The method of claim 5, wherein after the sending the test instruction to the device under test, the method further comprises:
transmitting a test service flow to the equipment to be tested, so that the equipment to be tested processes the test service flow in the CPE OTN test mode to obtain an operation result corresponding to test operation;
after receiving the operation result corresponding to the test operation performed by the device to be tested, the method further includes:
And automatically verifying the operation result according to the preset test specification requirement, and feeding back the result.
7. The method of claim 5, wherein the configuration request carries CPE OTN test configuration information corresponding to an interface to be tested and a function to be tested.
8. The method of claim 5, wherein the sending the configuration request to the device under test comprises:
transmitting a configuration request to equipment to be tested through a configuration management and control channel, wherein the configuration management and control channel comprises a general communication channel GCC management and control channel or an operation maintenance management OAM management and control channel;
or alternatively, the process may be performed,
and sending a configuration request to the equipment to be tested through the chip management and control layer of the equipment to be tested.
9. A test apparatus for use with a device under test, the apparatus comprising:
the configuration module is used for receiving a configuration request sent by CPE OTN test equipment of the customer side optical transport network equipment and configuring the equipment mode into a CPE OTN test mode based on the configuration request;
a sending module, configured to send a configuration result corresponding to the configuration request to the CPE OTN test device;
the receiving module is used for receiving a test instruction sent by the CPE OTN test equipment;
And the execution module is used for executing the test operation and sending an operation result corresponding to the test operation to the CPE OTN test equipment.
10. A test device for use in CPE OTN test equipment, said device comprising:
the device comprises a first sending module, a second sending module and a third sending module, wherein the first sending module is used for sending a configuration request to the device to be tested, and the configuration request is used for requesting to configure the device mode into a CPE OTN test mode;
the first receiving module is used for receiving a configuration result corresponding to the configuration request, which is sent by the equipment to be tested;
the second sending module is used for sending a test instruction to the equipment to be tested under the condition that the configuration result represents that the configuration is completed;
and the second receiving module is used for receiving an operation result which is sent by the equipment to be tested and corresponds to the test operation executed by the equipment to be tested.
11. A device under test, comprising: a processor, a memory and a program stored on the memory and executable on the processor, which when executed by the processor, implements the steps of the test method according to any one of claims 1 to 4.
12. A CPE OTN test device, comprising: a processor, a memory and a program stored on the memory and executable on the processor, which when executed by the processor implements the steps of the test method according to any one of claims 5 to 8.
13. A computer readable storage medium, characterized in that the computer readable storage medium has stored thereon a computer program which, when executed by a processor, implements the steps of the test method according to any of claims 1 to 4 or which, when executed by a processor, implements the steps of the test method according to any of claims 5 to 8.
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