CN116973268A - Detection method of coating surface density, coating device and coating production line - Google Patents
Detection method of coating surface density, coating device and coating production line Download PDFInfo
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- CN116973268A CN116973268A CN202310871406.6A CN202310871406A CN116973268A CN 116973268 A CN116973268 A CN 116973268A CN 202310871406 A CN202310871406 A CN 202310871406A CN 116973268 A CN116973268 A CN 116973268A
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- 238000000576 coating method Methods 0.000 title claims abstract description 278
- 239000011248 coating agent Substances 0.000 title claims abstract description 269
- 238000001514 detection method Methods 0.000 title claims abstract description 69
- 238000004519 manufacturing process Methods 0.000 title abstract description 16
- 239000002002 slurry Substances 0.000 claims abstract description 112
- 239000007888 film coating Substances 0.000 claims abstract description 59
- 238000009501 film coating Methods 0.000 claims abstract description 59
- 239000007787 solid Substances 0.000 claims abstract description 42
- 238000000034 method Methods 0.000 claims abstract description 26
- 230000007246 mechanism Effects 0.000 claims description 175
- 238000005259 measurement Methods 0.000 claims description 76
- 238000004364 calculation method Methods 0.000 claims description 25
- 238000009826 distribution Methods 0.000 claims description 18
- 239000000758 substrate Substances 0.000 claims description 15
- 238000004891 communication Methods 0.000 claims description 9
- 238000004590 computer program Methods 0.000 claims description 6
- 238000011144 upstream manufacturing Methods 0.000 claims description 6
- 238000003860 storage Methods 0.000 claims description 5
- 238000012544 monitoring process Methods 0.000 abstract description 3
- 238000001739 density measurement Methods 0.000 description 9
- WHXSMMKQMYFTQS-UHFFFAOYSA-N Lithium Chemical compound [Li] WHXSMMKQMYFTQS-UHFFFAOYSA-N 0.000 description 8
- 229910052744 lithium Inorganic materials 0.000 description 8
- 239000002904 solvent Substances 0.000 description 7
- 239000011247 coating layer Substances 0.000 description 5
- 239000000463 material Substances 0.000 description 5
- 238000005336 cracking Methods 0.000 description 4
- 239000010410 layer Substances 0.000 description 4
- 238000010586 diagram Methods 0.000 description 3
- 230000008569 process Effects 0.000 description 3
- 230000009467 reduction Effects 0.000 description 2
- 238000005096 rolling process Methods 0.000 description 2
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 1
- HBBGRARXTFLTSG-UHFFFAOYSA-N Lithium ion Chemical compound [Li+] HBBGRARXTFLTSG-UHFFFAOYSA-N 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000011267 electrode slurry Substances 0.000 description 1
- 238000005265 energy consumption Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000014509 gene expression Effects 0.000 description 1
- 229910002804 graphite Inorganic materials 0.000 description 1
- 239000010439 graphite Substances 0.000 description 1
- 229910001416 lithium ion Inorganic materials 0.000 description 1
- 230000005012 migration Effects 0.000 description 1
- 238000013508 migration Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000001556 precipitation Methods 0.000 description 1
- 239000002994 raw material Substances 0.000 description 1
- 230000000630 rising effect Effects 0.000 description 1
- 239000000523 sample Substances 0.000 description 1
- 239000002356 single layer Substances 0.000 description 1
- 238000003756 stirring Methods 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05C—APPARATUS FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05C11/00—Component parts, details or accessories not specifically provided for in groups B05C1/00 - B05C9/00
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N9/00—Investigating density or specific gravity of materials; Analysing materials by determining density or specific gravity
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01M—PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSION OF CHEMICAL ENERGY INTO ELECTRICAL ENERGY
- H01M4/00—Electrodes
- H01M4/02—Electrodes composed of, or comprising, active material
- H01M4/04—Processes of manufacture in general
- H01M4/0402—Methods of deposition of the material
Abstract
The application discloses a detection method of coating surface density, a coating device and a coating production line, wherein the detection method comprises the following steps: s1, obtaining the volume flow Q of slurry and the density rho of the slurry; s2, obtaining a coating speed V and a coating width L during coating; s3, calculating the average wet film coating surface density M according to the volume flow Q of the slurry, the density rho of the slurry, the coating speed V and the coating width L ave The method comprises the steps of carrying out a first treatment on the surface of the S4, obtaining the solid content alpha of the slurry; s5, according to the average wet film coating surface density M ave Calculating the average dry film coating surface density m by adding the solid content alpha of the slurry ave . According to the technical scheme provided by the application, the surface density of the dry film coating can be calculated before the coating is baked, so that the monitoring requirement on the surface density of the coating is met.
Description
Technical Field
The application belongs to the technical field of pole piece coating, and particularly relates to a detection method of coating surface density, a computer readable storage medium, a coating device and a coating production line.
Background
In the lithium battery manufacturing process, the areal density of the coating needs to be monitored during the coating process. The prior art areal density measuring device is usually arranged at the end of the coating process, i.e. the areal density of the coating is measured after the coating has been baked. However, the problem of dry cracking of the coating occurs after baking the positive electrode and the negative electrode of the lithium battery, and in the charge-discharge cycle, the dry cracking of the coating increases the lithium ion migration path to cause lithium precipitation, thereby causing short-circuit failure.
In the prior art, part of the solvent is reserved in the coating after baking so as to solve the problem of coating dry cracking. However, in measuring the coating surface density, the measurement system may misinterpret this portion of the solvent that has not evaporated as the coating surface density, ultimately resulting in a coating surface density measurement that is greater than the true value (i.e., dry coating weight). The prior art surface density measuring device cannot accurately measure the true surface density of the coating because it cannot be determined how much solvent is not evaporated.
There is a need for improved methods of detecting the areal density of a coating.
Disclosure of Invention
An object of an embodiment of the application is to provide a method for detecting the surface density of a coating, a computer readable storage medium, a coating device and a coating production line.
According to a first aspect of an embodiment of the present application, there is provided a method for detecting a coating areal density, the method comprising the steps of:
s1, obtaining the volume flow Q of slurry and the density rho of the slurry;
s2, obtaining a coating speed V and a coating width L during coating;
s3, calculating the average wet film coating surface density M according to the volume flow Q of the slurry, the density rho of the slurry, the coating speed V and the coating width L ave ；
S4, obtaining the solid content alpha of the slurry;
s5, according to the average wet film coating surface density M ave Calculating the average dry film coating surface density m by adding the solid content alpha of the slurry ave 。
Alternatively, in the S3, the average wet film coating surface density M is calculated by the following formula ave ：
Alternatively, in said S5, the average dry film coating surface density m is calculated by the formula ave ：
m ave ＝M ave ·α。
Optionally, the detection method further comprises the following steps:
s6, obtaining the coating thickness percentage t, and calculating the dry film coating surface density m through the following formula:
m＝t*m ave 。
optionally, in the step S6, a measurement period is set, and a coating thickness distribution T in the coating width direction of each measurement period is obtained i ＝f i (x) Calculating the average thickness of the coating according to the coating thickness distribution at different positions in one measuring period
wherein ,Ti For the coating thickness of the ith measurement period, f i For the coating thickness distribution in the ith measurement period, x is the position of the coating in the width direction;
the percent coating thickness t at different positions in the coating width direction was calculated by the following formula:
wherein ,the average thickness of the coating at different locations over a measurement period.
According to a second aspect of embodiments of the present application, there is provided a computer readable storage medium having stored thereon a computer program which, when executed by a processor, implements the above-described detection method.
According to a third aspect of the embodiments of the present application, there is provided a coating apparatus for implementing the above-mentioned method for detecting a coating area density, the coating apparatus including:
the first coating mechanism is arranged on the upstream of the first coating mechanism, the density detection mechanism and the volume flow detection mechanism are arranged on the downstream of the first coating mechanism, and the speed measurement mechanism and the first width measurement mechanism are arranged on the downstream of the first coating mechanism;
the density detection mechanism is used for detecting the density of the slurry, the volume flow detection mechanism is used for detecting the volume flow of the slurry, the slurry solid content detection mechanism is used for detecting the solid content of the slurry, the speed measurement mechanism is used for detecting the coating speed, and the first width measurement mechanism is used for detecting the coating width;
the calculating module is respectively in communication connection with the density detecting mechanism, the volume flow detecting mechanism, the speed measuring mechanism and the first width measuring mechanism;
the calculation module is used for receiving the density of the slurry, the volume flow of the slurry, the solid content of the slurry, the coating speed and the coating width, and calculating the coating surface density according to the density of the slurry, the volume flow of the slurry, the solid content of the slurry, the coating speed and the coating width.
Optionally, the coating device further comprises a feeding mechanism, the feeding mechanism is arranged at the upstream of the first coating mechanism, and the density detection mechanism, the volume flow detection mechanism and the slurry solid content detection mechanism are arranged between the feeding mechanism and the first coating mechanism.
Optionally, the coating device further includes a first thickness measurement mechanism, the first thickness measurement mechanism is disposed downstream of the first width measurement mechanism, the first thickness measurement mechanism is used for detecting a thickness of the coating, and the first thickness measurement mechanism is in communication connection with the calculation module.
Optionally, the coating device further includes a second coating mechanism, a second width measuring mechanism and a second thickness measuring mechanism, the second coating mechanism is disposed at the downstream of the first thickness measuring mechanism, the second thickness measuring mechanism is disposed at the downstream of the second coating mechanism, the width measuring mechanism is disposed between the second coating mechanism and the second thickness measuring mechanism, and the second width measuring mechanism and the second thickness measuring mechanism are respectively in communication connection with the computing module.
Optionally, the coating device further comprises an oven, which is arranged downstream of the second thickness measuring device or the first thickness measuring device.
According to a fourth aspect of embodiments of the present application, there is provided a coating line equipped with the coating apparatus described above.
The method has the technical effects that the surface density of the dry film coating is calculated by obtaining the relevant parameters of the slurry and the relevant parameters of the coating, so that the real coating surface density can be obtained even if the coating after baking contains a solvent, and the monitoring requirement on the coating surface density is met.
Other features of the present application and its advantages will become apparent from the following detailed description of exemplary embodiments of the application, which proceeds with reference to the accompanying drawings.
Drawings
The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments of the application and together with the description, serve to explain the principles of the application.
FIG. 1 is a schematic structural diagram of a coating apparatus according to an embodiment of the present application;
FIG. 2 is a schematic structural diagram of a first thickness measurement mechanism according to an embodiment of the present application;
fig. 3 is a schematic structural diagram of a coating device according to another embodiment of the present application.
Reference numerals illustrate: a coating device 100; a feeding mechanism 1; a density detection mechanism 2; a slurry solid content detection mechanism 3; a volume flow detection mechanism 4; a first coating mechanism 5; a speed measuring mechanism 6; a first width measuring mechanism 7; a first thickness measuring mechanism 8; a first sensor 81; a second sensor 82; mass flow detection mechanism 9, oven 10.
Detailed Description
Various exemplary embodiments of the present application will now be described in detail with reference to the accompanying drawings. It should be noted that: the relative arrangement of the components and steps, numerical expressions and numerical values set forth in these embodiments do not limit the scope of the present application unless it is specifically stated otherwise.
The following description of at least one exemplary embodiment is merely exemplary in nature and is in no way intended to limit the application, its application, or uses.
Techniques, methods, and apparatus known to one of ordinary skill in the relevant art may not be discussed in detail, but are intended to be part of the specification where appropriate.
In all examples shown and discussed herein, any specific values should be construed as merely illustrative, and not a limitation. Thus, other examples of exemplary embodiments may have different values.
It should be noted that: like reference numerals and letters denote like items in the following figures, and thus once an item is defined in one figure, no further discussion thereof is necessary in subsequent figures.
According to a first aspect of an embodiment of the present application, there is provided a method for detecting a coating areal density, the method comprising the steps of:
s1, obtaining the volume flow Q of slurry and the density rho of the slurry;
s2, obtaining a coating speed V and a coating width L during coating;
s3, calculating the average wet film coating surface density M according to the volume flow Q of the slurry, the density rho of the slurry, the coating speed V and the coating width L ave ；
S4, obtaining the solid content alpha of the slurry;
s5, according to the average wet film coating surface density M ave Calculating the average dry film coating surface density m by adding the solid content alpha of the slurry ave 。
Further described, the detection method provided by the application is used for detecting the coating surface density of the coating device on line.
The surface density refers to the mass per unit area of the coating layer of the lithium battery.
The wet film coating surface density refers to the mass per unit area of the coating layer which still contains the solvent before or after baking.
The dry film coating surface density refers to the mass of the coating per unit area after the coating is dried.
Further, the detection method calculates the average wet film coating surface density M by obtaining the volume flow Q of the slurry before entering the first coating mechanism, the density ρ of the slurry, and the solid content α of the slurry in the coating apparatus, and obtaining the coating speed V and the coating width L at the time of coating ave 。
The volume flow rate Q of the slurry refers to the volume of the slurry flowing in a unit time before the slurry enters the first coating mechanism in the coating device. The density ρ of the slurry refers to the mass per unit volume. The solid content alpha of the slurry refers to the percentage of the mass of solid components in the total mass of the slurry in the positive/negative electrode slurry of the lithium battery.
The coating speed V is the speed of the substrate when the slurry is coated on the substrate. The coating width L refers to the width of coverage of the slurry on the substrate.
Further, by the volume flow rate Q of the obtained slurry, the density ρ of the slurry, the coating speed V and the coating width L, the average wet film coating surface density M can be calculated ave This step calculates the average wet film coating areal density M before baking ave 。
Further by way of illustration, the average dry film coating areal density can be calculated from the slurry solids content obtained and the calculated average wet film coating areal density.
In the prior art, the dry film coating surface density is usually measured after baking the coating, but in order to avoid cracking of the coating, the coating is in a wet film state when coming out of the oven, i.e. the baked coating contains a certain amount of solvent, which results in a measured dry film coating surface density that is greater than the actual dry film coating surface density.
By the above detection method, the above problems can be avoided. The detection method of the application is to calculate the surface density of the average wet film coating and the surface density of the average dry film coating by on-line detection and by acquiring the relevant parameters of the slurry and the relevant parameters of the coating before baking the coating. Therefore, the accurate coating surface density can be obtained, the detection method optimizes the production process of the lithium battery pole piece, and improves the production efficiency of the pole piece.
In one embodiment, the coating layer density is calculated by a computer program based on the received slurry density, slurry volumetric flow, slurry solids content, coating speed, and coating width.
In another embodiment, the coating areal density can be calculated from the calculation formulas based on the density of the received slurry, the volumetric flow rate of the slurry, the slurry solids content, the coating speed, and the coating width.
Alternatively, in the S3, the average wet film coating surface density M is calculated by the following formula ave ：
Further described, according to the volume flow rate Q of the obtained slurry, the density ρ of the slurry, the coating speed V and the coating width L, according to the principle of conservation of the volume flow, the flow rate is calculated by the formulaThe average wet film coating areal density can be calculated.
Alternatively, in said S5, the average dry film coating surface density m is calculated by the formula ave ：
m ave ＝M ave ·α。
Further described, according to the slurry solid content, the formula is adoptedThe average dry film coating areal density applied to the substrate is calculated.
Optionally, the detection method further comprises the following steps:
s6, obtaining a coating thickness percentage t, and according to the coating thickness percentage t and the average dry film coating surface density m ave The dry film coating surface density m was calculated.
Further described, in step S5, an average dry film coating is obtainedAreal density, the actual areal density at the various locations has a certain deviation from the average areal density during coating, in order to determine the exact distribution of the areal density of the coating, the percentage of the coating thickness at the various locations is obtained by the formula m=t×m ave And calculating the dry film coating surface densities of different positions to obtain accurate distribution data of the dry film coating surface densities.
In one embodiment, the detection method further comprises the steps of:
s6, obtaining the thickness percentage t of the wet coating, and according to the thickness percentage t of the wet coating and the average wet film coating surface density M ave The wet film coating surface density M was calculated.
Further, in step S3, an average wet film coating surface density is obtained, and the actual surface densities at different positions have a certain deviation from the average surface density during the coating process, and in order to determine the accurate distribution of the coating surface densities, the percentage of the coating thickness at different positions is obtained by obtaining the formula m=t×m ave The wet film coating surface densities at different locations are calculated to obtain accurate distribution data of the wet film coating surface densities.
Optionally, in the step S6, a measurement period is set, and a coating thickness distribution T in the coating width direction of each measurement period is obtained i ＝f i (x) Calculating the average thickness of the coating according to the coating thickness distribution at different positions in one measuring period
wherein ,Ti For the coating thickness of the ith measurement period, f i For the coating thickness distribution in the ith measurement period, x is the position of the coating in the width direction;
according to T i Andthe coating thickness percentages t at different positions in the coating width direction were calculated.
Further described, a measurement is setAnd one measuring period is the thickness of the measured coating in the width direction, and the thickness of the coating at different positions in the width direction can be measured in one measuring period, so that a plurality of coating thickness data can be obtained. Wherein the thickness distribution in one measurement period is T i ＝f i (x)。
As a further explanation of the present application,the average thickness of the coating over a measurement period. By passing throughThe percentage of coating thickness at different positions in the same measuring period can be calculated.
In a specific embodiment.
The detection method is used for detecting the surface density of the wet film coating and the surface density of the dry film coating aiming at a graphite water-based slurry. In contrast, the same slurry and the same coating parameters were used, and the dry film weight measurement device in the prior art was also used simultaneously to collect on-line weight data, comparing the measurement differences of the detection method of the present application and the conventional areal density measurement results.
Table 1 shows coating-related parameters
After the coating process was stabilized, measurement data of the volume flow rate Q of the slurry, the density ρ of the slurry, the coating speed V, the coating width L, and the solid content α of the slurry were collected.
Table 2 coating parameter collection table
According to the formulaThe average dry film surface density is calculated to be m ave ＝105.32g/m 2 。
The coating is measured by a laser thickness gauge, the thickness distribution of the coating width is measured, and the formula is passedThe calculation of the thickness percentage of 13 measurements in a single measurement cycle is calculated as shown in table 3.
Table 3: calculation of thickness percentage (Single cycle)
The results of the calculations of tables 3 and 4 are combined and passed through the formula Average dry film coating surface Density m ave The exact width-wise distribution of the dry film coating areal density can be calculated by multiplying the coating thickness percentages t at different positions in the width direction, as shown in table 4.
TABLE 4 accurate distribution of dry film coating areal Density (Single cycle)
By contrast, the wet film coated pole piece was baked, after the solvent in the wet film coating was completely removed, the same position of the pole piece was scanned using a conventional areal density meter, and the dry film coating areal density measurement results are shown in table 5.
Table 5 scanning results of conventional areal densitometer
By comparing the detection method of the application with the measurement results (table 4 and table 5) of the conventional surface density measurement equipment, the difference of the single-period measurement average value of the detection method and the conventional surface density measurement equipment is 0.1%, and meanwhile, the transverse distribution trend of the surface density is consistent, so that the measurement result of the detection method of the application is proved to be accurate and reliable.
In another specific embodiment.
This example uses the same material system and coating parameters as the above example, collects wet film coating layer density data during 2000 meters of coating using the detection method of the present application at a location upstream of the oven, and collects dry film coating layer density data using a prior art surface density measurement device at a location downstream of the oven, and compares the data collected by the two methods and devices, the comparison results are shown in table 6.
TABLE 6 comparison of the detection method of the present application with the surface Density measurement results of conventional technology
The data show that the average value, standard deviation and quantile of the surface density data of the coating collected by the detection method are similar to those of the data collected by the method in the prior art, and the measurement result of the detection method is accurate and reliable.
According to a second aspect of embodiments of the present application, there is provided a computer readable storage medium having stored thereon a computer program which, when executed by a processor, implements the above-described detection method.
According to a third aspect of the embodiments of the present application, there is provided a coating apparatus 100, the coating apparatus 100 including:
a first coating mechanism 5, wherein the first coating mechanism 5 is used for covering the slurry on the substrate to form a coating layer;
a density detection mechanism 2 for detecting the density of the slurry;
a volume flow detection mechanism 4 for detecting a volume flow of the slurry;
the slurry solid content detection mechanism 3 is used for detecting the solid content of the slurry;
the coating device comprises a speed measuring mechanism 6 and a first width measuring mechanism 7, wherein the speed measuring mechanism 6 is used for detecting the coating speed, and the first width measuring mechanism 7 is used for detecting the width of a coating;
the calculation module is respectively in communication connection with the density detection mechanism 2, the volume flow detection mechanism 4, the slurry solid content detection mechanism 3, the speed measurement mechanism 6 and the first width measurement mechanism 7.
The present application provides a coating apparatus 100 for implementing the above-described method for detecting the coating surface density.
As shown in fig. 1, the coating apparatus 100 includes a first coating mechanism 5, wherein the first coating mechanism 5 is a coating die for covering a surface of a substrate with a paste to form a coating layer.
As shown in fig. 1, the coating apparatus 100 includes a density detecting means 2, a volume flow detecting means 4, and a slurry solid content detecting means 3. The density detection mechanism 2 is used for detecting the density of the slurry, the volume flow detection mechanism 4 is used for detecting the volume flow of the slurry, and the slurry solid content detection mechanism 3 is used for detecting the solid content of the slurry.
As shown in fig. 1, the coating apparatus 100 further includes a speed measuring mechanism 6 and a first width measuring mechanism 7.
Preferably, the speed measuring mechanism 6 and the first width measuring mechanism 7 are provided at the side ends of the first coating mechanism 5. The speed measuring mechanism 6 is used for detecting the tape moving speed of the base material, and the first width measuring mechanism 7 is used for detecting the width of the coating on the base material.
In a preferred embodiment, the coating device 100 further comprises a calculation module, wherein the density detection mechanism 2, the volume flow detection mechanism 4, the slurry solid content detection mechanism 3, the speed measurement mechanism 6 and the first width measurement mechanism 7 are all in communication connection with the calculation module, wherein the density detection mechanism 2 transmits detected data to the calculation module, the volume flow detection mechanism 4 transmits detected data to the calculation module, the slurry solid content detection mechanism 3 transmits detected data to the calculation module, the speed measurement mechanism 6 transmits detected data to the calculation module, the first width measurement mechanism 7 transmits detected data to the calculation module, and the calculation module calculates the coating surface density through the received detected data.
In one embodiment, the calculation module stores a computer program for calculating the coating areal density, and the calculation module can calculate the coating areal density by the computer program based on the received slurry density, slurry volumetric flow, slurry solids content, coating speed, and coating width.
In another embodiment, a calculation formula for calculating the surface density of the coating is stored in the calculation module, and the calculation module can calculate the surface density of the coating according to the calculation formula according to the received density of the slurry, the volume flow rate of the slurry, the solid content of the slurry, the coating speed and the coating width.
According to the volume flow Q of the obtained slurry, the density rho of the slurry, the coating speed V and the coating width L, according to the principle of conservation of the volume flow, the method passes through the formulaThe average wet film coating areal density can be calculated. According to the slurry solid content, by this formula +.>The average dry film coating areal density applied to the substrate is calculated.
Optionally, the coating device 100 further comprises a feeding mechanism 1, the feeding mechanism 1 is disposed upstream of the first coating mechanism 5, and the density detecting mechanism 2, the volumetric flow detecting mechanism 4 and the slurry solid content detecting mechanism 3 are disposed between the feeding mechanism 1 and the first coating mechanism 5.
As shown in fig. 1, the coating device 100 further comprises a feeding mechanism 1, the feeding mechanism 1 being arranged upstream of the first coating mechanism 5 and being connected to the first coating mechanism 5, wherein the density detection mechanism 2, the volume flow detection mechanism 4 and the slurry solid content detection mechanism 3 are arranged between the feeding mechanism 1. The slurry flowing out of the feeding mechanism 1 is subjected to processes such as stirring, the slurry is uniform, and the detection data is accurate, so that calculation errors are reduced.
Optionally, the coating device 100 further includes a first thickness measuring mechanism 8, where the first thickness measuring mechanism 8 is disposed downstream of the first width measuring mechanism 7, the first thickness measuring mechanism 8 is configured to detect a thickness of the coating, and the first thickness measuring mechanism 8 is communicatively connected to the computing module.
As shown in fig. 1, the coating apparatus 100 further includes a first thickness measuring mechanism 8, where the first thickness measuring mechanism 8 is disposed downstream of the first width measuring mechanism 7, and the first thickness measuring mechanism is used for detecting a thickness of the coating, and the first thickness measuring mechanism 8 is communicatively connected to a calculating module, and the calculating module receives data detected by the first thickness measuring mechanism 8, and further calculates an areal density of the coating according to the detected data.
Further illustratively, the first thickness measuring mechanism 8 may be a thickness gauge. Preferably, the thickness gauge employs a non-contact thickness gauge, such as a laser thickness gauge.
Further, as shown in fig. 2, the thickness gauge includes a first sensor 81 and a second sensor 82, the first sensor 81 and the second sensor 82 are symmetrically arranged with respect to the wet film coating, and the first sensor 81 and the second sensor 82 precisely measure the distance from the probe to the surface of the coating by the principle of light reflection. In operation, the first sensor 81 measures the distance d to the upper surface of the coating 1 The second sensor 82 measures the distance d from the lower surface of the substrate 2 The fixed distance D between the first sensor 81 and the second sensor 82 allows the thickness measurement of the coating to be calculated as (D-D) 1 -d 2 )。
Optionally, the coating device 100 further includes a second coating mechanism, a second width measurement mechanism, and a second thickness measurement mechanism, where the second coating mechanism is disposed downstream of the first thickness measurement mechanism 8, the second thickness measurement mechanism is disposed downstream of the second coating mechanism, the width measurement mechanism is disposed between the second coating mechanism and the second thickness measurement mechanism, and the second width measurement mechanism and the second thickness measurement mechanism are respectively in communication connection with the computing module.
Further, the rising price of raw materials and the increasing labor cost in the lithium battery manufacturing industry lead to the reduction of manufacturing profits in the industry, so that cost reduction is a core requirement of the industry.
In a lithium battery manufacturing production line, a coating process is one of the processes with the largest energy consumption, mainly due to the fact that an oven for baking a coating is high in power, low in heat utilization rate and the like. The conventional process flow of the coating production line is that firstly, slurry is coated on one surface of an empty substrate, and the empty substrate is rolled after being dried in an oven; and then, coating the slurry on the other surface after rolling, and putting the other surface into a baking oven to bake and dry, and rolling to finish the coating process. One surface enters the two-time oven, and the two-time oven belongs to unnecessary repeated operation which cannot be avoided, so that manpower and material resources are wasted, and the manufacturing cost is increased.
In the prior art, a double-sided simultaneous coating process is adopted, and the materials enter an oven for baking, so that the production efficiency can be improved, and the manufacturing cost is greatly reduced. But the slurry is simultaneously applied to both surfaces of the substrate due to the double-sided simultaneous coating process. The surface density measuring device in the prior art is arranged at the downstream position of the oven, so that the surface densities of the coating on the two sides cannot be effectively distinguished, and the coating quality cannot be effectively monitored.
In a preferred embodiment of the present application, the coating apparatus 100 is further provided with a second coating mechanism, a second width measuring mechanism, and a second thickness measuring mechanism, wherein the second coating mechanism coats the other surface of the substrate with the paste. The second width measuring mechanism is used for detecting the width of the coating on the other surface, the second thickness measuring device is used for measuring the thickness of the side layer on the other surface, and the measured data can be used for calculating the surface density of the coating on the other surface by the detection method, so that the surface density monitoring requirement of the double-surface simultaneous coating process is met.
Further stated, the second width measuring mechanism is in communication connection with the computing module, and the second width measuring mechanism transmits detected data to the computing module; the second thickness measuring mechanism is in communication connection with the calculating module, the second thickness measuring mechanism transmits detected data to the calculating module, and the calculating module calculates the coating surface density of the other surface according to the received detected data.
Optionally, the coating device 100 further comprises an oven 10, the oven 10 being arranged downstream of the second thickness measuring device or the first thickness measuring device 8.
Further illustratively, the detection method of the present application is performed prior to baking the coating. In embodiments where a single layer substrate is coated, oven 10 is disposed downstream of first thickness measurement device 8.
In embodiments where a double layer substrate is coated, oven 10 is positioned downstream of the second thickness measurement device.
The application measures the surface density of the wet film coating by an indirect method, and needs special instruments for measuring the slurry density, the slurry solid content, the slurry volume flow, the coating speed and the coating width, and the measurement error of each instrument is accumulated into a final measurement result, so that the measurement error of the existing measurement components is analyzed, and the measurement error of the coating surface density obtained by a calculation method is +/-0.15 percent, which is equivalent to the measurement error of the off-line measurement coating surface density equipment (generally using an electronic scale) in the prior art, thus the wet coating surface density measurement method is reliable.
TABLE 7 error list of the wet coating areal Density measurement device of the application
As shown in fig. 3, in a preferred embodiment, the density detecting means 2 and the volume flow detecting means 4 in the above embodiment are replaced with the mass flow detecting means 9, and the conversion relation between the volume flow meter and the measurement result of the volume flow meter is:
Q quality of ＝ρ·Q Volume of
wherein ,QQuality of Refer to the measurement result of the mass flowmeter, ρ refers to the slurry density, Q Volume of Volume refers to the measurement of a volumetric flow meter.
Further, the mass flow rate detection means 9 can be used in place of the density detection means 2 and the volume flow rate detection means 4 to increase the calculation rate and to save the cost of the coating apparatus 100.
According to a fourth aspect of embodiments of the present application, there is provided a coating line equipped with the coating apparatus 100 described above.
While certain specific embodiments of the application have been described in detail by way of example, it will be appreciated by those skilled in the art that the above examples are for illustration only and are not intended to limit the scope of the application. It will be appreciated by those skilled in the art that modifications may be made to the above embodiments without departing from the scope and spirit of the application. The scope of the application is defined by the appended claims.
Claims (12)
1. A method for detecting the areal density of a coating, the method comprising the steps of:
s1, obtaining the volume flow Q of slurry and the density rho of the slurry;
s2, obtaining a coating speed V and a coating width L during coating;
s3, calculating the average wet film coating surface density M according to the volume flow Q of the slurry, the density rho of the slurry, the coating speed V and the coating width L ave ；
S4, obtaining the solid content alpha of the slurry;
s5, according to the average wet film coating surface density M ave Calculating the average dry film coating surface density m by adding the solid content alpha of the slurry ave 。
2. The method according to claim 1, wherein in S3, the average wet film coating area density M is calculated by the following formula ave ：
3. The method according to claim 1, wherein in S5, the average dry film coating surface density m is calculated by the following formula ave ：
m ave ＝M ave ·α。
4. The method of detection according to claim 1, further comprising the steps of:
s6, obtaining the coating thickness percentage t, and calculating the dry film coating surface density m through the following formula:
m＝t*m ave 。
5. the method according to claim 4, wherein in said S6, a measurement period is set, and a coating thickness distribution T in a coating width direction of each of said measurement periods is obtained i ＝f i (x) Calculating the average thickness of the coating according to the coating thickness distribution at different positions in one measuring period
wherein ,Ti For the coating thickness of the ith measurement period, f i For the coating thickness distribution in the ith measurement period, x is the position of the coating in the width direction;
the percent coating thickness t at different positions in the coating width direction was calculated by the following formula:
wherein ,for one measuring periodAverage thickness of the coating at different locations of (a) is provided.
6. A computer readable storage medium having stored thereon a computer program which, when executed by a processor, implements the detection method according to any of claims 1 to 5.
7. A coating apparatus, characterized in that the coating apparatus comprises:
a first coating mechanism for applying a slurry to a substrate to form a coating;
a density detection mechanism for detecting the density of the slurry;
the volume flow detection mechanism is used for detecting the volume flow of the slurry;
the slurry solid content detection mechanism is used for detecting the solid content of the slurry;
the coating device comprises a speed measuring mechanism and a first width measuring mechanism, wherein the speed measuring mechanism is used for detecting the coating speed, and the first width measuring mechanism is used for detecting the coating width;
the calculating module is respectively in communication connection with the density detecting mechanism, the volume flow detecting mechanism, the slurry solid content detecting mechanism, the speed measuring mechanism and the first width measuring mechanism; the calculation module is used for receiving the density of the slurry, the volume flow of the slurry, the solid content of the slurry, the coating speed and the coating width, and calculating the coating surface density according to the density of the slurry, the volume flow of the slurry, the solid content of the slurry, the coating speed and the coating width.
8. The coating device of claim 7, further comprising a feed mechanism disposed upstream of the first coating mechanism, the density detection mechanism, the volumetric flow detection mechanism, and the slurry solids detection mechanism being disposed between the feed mechanism and the first coating mechanism.
9. The coating apparatus of claim 7 or 8, further comprising a first thickness measurement mechanism disposed downstream of the first width measurement mechanism for detecting a thickness of the coating, the first thickness measurement mechanism being communicatively coupled to the computing module.
10. The coating device of claim 9, further comprising a second coating mechanism, a second width measurement mechanism, and a second thickness measurement mechanism, the second coating mechanism disposed downstream of the first thickness measurement mechanism, the second thickness measurement mechanism disposed downstream of the second coating mechanism, the width measurement mechanism disposed between the second coating mechanism and the second thickness measurement mechanism, the second width measurement mechanism and the second thickness measurement mechanism being communicatively coupled to the computing module, respectively.
11. The coating apparatus of claim 10, further comprising an oven disposed downstream of the second thickness measurement apparatus or the first thickness measurement apparatus.
12. A coating line, characterized in that it is equipped with a coating device according to any one of claims 7-11.
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