CN116908094A - Surface defect detection device, method and system based on displacement light source - Google Patents
Surface defect detection device, method and system based on displacement light source Download PDFInfo
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Abstract
The application is suitable for the technical field of automatic defect detection, and provides a surface defect detection device, method and system based on a displacement light source. A surface defect inspection apparatus, the apparatus comprising: the detection light source is used for irradiating the surface to be detected; the detection camera is used for shooting the surface to be detected; the detection device is used for changing the irradiation angle of the detection light source to the surface to be detected and changing the shooting angle of the detection camera to the surface to be detected; and the positioning mechanical arm is connected with the detection device and used for changing the position and the orientation of the detection device in space. According to the application, aiming at the characteristics of complex curved surfaces on the surface of the automobile, high-precision defect detection can be performed, manual intervention is not needed in the whole detection process, the detection speed and accuracy of the surface defects are obviously improved, and the omission ratio is reduced.
Description
Technical Field
The application belongs to the technical field of automatic defect detection, and particularly relates to a surface defect detection device, method and system based on a displacement light source.
Background
The surface painting refers to spraying a layer of attached paint material on the surface of the material, thereby protecting the original surface of the material and improving the aesthetic degree and the like. For example, in the automobile manufacturing process, when the welding of the frame and the shell is completed, the next procedure is to paint the surface of the automobile. The paint spraying type includes transparent paint, metallic paint, pearl paint, etc.
Defects of the paint surface during spraying and abrasion during use are difficult to avoid, such as scratches, depressions, missing blocks, protrusions, etc., so that it is very necessary to detect and count whether the surface has defects or not, and the number and type of the defects.
For example, in the automotive related industry, detection of automotive paint conditions is required. However, the curves on the surface of the automobile body are various, the structure is complex, and the detection of the paint surface of the automobile still adopts a manpower detection mode at present. One automobile often needs to consume more than 10 working hours of a worker, and the whole detection process needs to be in bending labor; and visual fatigue is easy to generate when the operator works for a long time, subjective judgment on a involution standard is influenced, the probability of missing detection is high, the defect data is statistically discrete, and the missing detection rate is high. The existing detection by adopting a mechanical device is difficult to deal with complex and various automobile surface curved surfaces, and has poor accuracy and high omission ratio.
It can be seen that the existing detection precision for surface defects is low and the omission ratio is high.
Disclosure of Invention
The embodiment of the application aims to solve the problems of low detection precision and high omission factor of the existing surface defects.
The embodiment of the application is realized by providing a surface defect detection device based on a displacement light source, which comprises the following components: the detection light source is used for irradiating the surface to be detected; the detection camera is used for shooting the surface to be detected; the detection device is used for changing the irradiation angle of the detection light source to the surface to be detected and changing the shooting angle of the detection camera to the surface to be detected; and the positioning mechanical arm is connected with the detection device and used for changing the position and the orientation of the detection device in space.
Another object of an embodiment of the present application is to provide a surface defect detecting method based on a displacement light source, which is applied to the surface defect detecting device, and the method includes: acquiring digital three-dimensional model data of a surface to be detected, and selecting a detection point from the surface to be detected; based on the digital three-dimensional model data, obtaining a normal line of the surface to be detected at a detection point; based on a digital model of the detection device, adjusting the spatial position of the detection device to enable any point position on the intrados of the detection device to be located on the normal; illuminating the surface to be detected by using the detection light source, and acquiring image information of the surface to be detected by using the detection camera; and analyzing the image information to generate a surface defect detection result.
Another object of the embodiments of the present application is to provide a surface defect detecting system based on a displacement light source, where the system includes at least two surface defect detecting devices based on a displacement light source, and each detecting device uses a surface defect detecting method based on a displacement light source to detect a surface defect.
According to the surface defect detection device based on the displacement light source, provided by the embodiment of the application, high-precision defect detection can be performed according to the complex curved surface characteristics of the automobile surface, manual intervention is not needed in the whole detection process, the detection speed and accuracy of the surface defect are obviously improved, and the omission ratio is reduced.
Drawings
Fig. 1 is a perspective view of a displacement light source-based surface defect detection device based on a displacement light source according to an embodiment of the present application;
fig. 2 is a perspective view of a structure of a detection device according to an embodiment of the present application;
FIG. 3 is a diagram of an operating environment of a surface defect detection method based on a displacement light source according to an embodiment of the present application;
FIG. 4 is a flowchart illustrating a surface defect detection method based on a displacement light source according to an embodiment of the present application;
FIG. 5 is a schematic diagram of a detection result of a surface defect detection method based on a displacement light source according to an embodiment of the present application;
FIG. 6 is a schematic diagram of a surface defect detection system based on a displacement light source according to an embodiment of the present application;
fig. 7 is a schematic diagram of a computer device according to an embodiment of the present application.
In the accompanying drawings: 10. detecting a light source; 20. detecting a camera; 30. a detection device; 40. positioning a mechanical arm; 110. a surface defect detection device based on a displacement light source; 120. a computer device.
Detailed Description
The present application will be described in further detail with reference to the drawings and examples, in order to make the objects, technical solutions and advantages of the present application more apparent. It should be understood that the specific embodiments described herein are for purposes of illustration only and are not intended to limit the scope of the application.
It will be understood that the terms "first," "second," and the like, as used herein, may be used to describe various elements, but these elements are not limited by these terms unless otherwise specified. These terms are only used to distinguish one element from another element. For example, a first xx device may be referred to as a second xx device, and similarly, a second xx device may be referred to as a first xx device, without departing from the scope of this disclosure.
As shown in fig. 1, in one embodiment, a surface defect detection device based on a displacement light source is provided, the device comprising: a detection light source 10 for irradiating a surface to be detected; a detection camera 20 for photographing a surface to be detected; a detection device 30, wherein the detection light source 10 and the detection camera 20 are arranged on the detection device 30, and the detection device 30 is used for changing the irradiation angle of the detection light source 10 to the surface to be detected and changing the shooting angle of the detection camera 20 to the surface to be detected; and a positioning mechanical arm 40 connected with the detection device 30 for changing the position and orientation of the detection device 30 in space.
In the embodiment of the present application, the detection light source 10 can illuminate the surface to be detected, and the detection camera 20 can shoot the surface to be detected and can obtain the light obtained by illuminating the surface to be detected by the detection light source 10. The arrangement of the detection light source 10 can facilitate the processing of a system or an automatic algorithm of the detection image acquired by the detection camera 20 and make the defects of the paint surface more easily exposed. The detection light source 10 may be arranged in such a way that defects of the paint surface are more easily revealed, for example: monochromatic strong light, a stripe light source, array light sources which are arranged horizontally and longitudinally, and the like. The detection camera 20 may be a camera or sensor or the like that facilitates detection of defects, such as an RGB-D type camera. The detection light source 10 and the detection camera 20 can be fixed on the detection device 30, and the detection device 30 can be used for changing the irradiation angle of the detection light source 10 to the surface to be detected and changing the shooting angle of the detection camera 20 to the surface to be detected. It is known to those skilled in the art that the included angle between the inspection camera 20 and the surface to be inspected can be the included angle between the center line of the inspection camera lens and the surface to be inspected, and the included angle between the inspection light source 10 and the surface to be inspected can be the included angle between the normal line of the center point of the panel of the flat panel inspection light source 10 and the surface to be inspected. The manner of changing the above-mentioned angle is not particularly limited, and for example, a rotatable base, a mechanical arm, a slide rail, a slide way, etc. are provided on the detecting device 30, and the detecting camera 20 or the detecting light source 10 is provided on the above-mentioned structure, so as to change the shooting angle and the irradiation angle of the surface to be detected. The positioning mechanical arm 40 may have more degrees of freedom, and the position and orientation of the detection device 30 in space may be changed by a plurality of rotatable joints or telescopic rods.
In the embodiment of the application, because the types of surface defects such as morphology, size, arrangement and the like are more, certain defects are not easy to reveal under a fixed irradiation or shooting angle, and the defects which are not easy to reveal under a specific range of angles can be highlighted by adopting the changeable irradiation angle and the changeable shooting angle, so that the visibility of the defects and the detection precision of a system are obviously improved. Although the mechanical arm can also change the spatial position of the detection device 30, and further change the spatial positions of the detection light source 10 and the detection camera 20, the system detection precision and the detection speed are significantly reduced by moving the positioning mechanical arm 40 to change the irradiation angle and the shooting angle due to the limitation of factors such as low running speed and poor positioning precision of the positioning mechanical arm 40, and the calibration effect is affected. Therefore, during the detection, the positioning mechanical arm 40 can be moved to a specific height at a corresponding position of a certain detection surface, the positioning mechanical arm 40 is kept stable, the included angle between the detection light source 10 and/or the detection camera 20 and the surface to be detected is changed, and the surface defect is acquired and analyzed through the data acquired by the detection camera 20.
In the embodiment of the application, by setting the changeable irradiation angle of the detection light source 10 and the shooting angle of the detection camera 20 and matching with the detection device 30 with changeable positions and orientations, the scheme can carry out targeted high-precision defect detection on each detection point to be detected according to the characteristics of the object to be detected on the surface with a complex curved surface, manual intervention is not needed in the whole detection process, the detection speed and accuracy of the surface defects are obviously improved, and the omission factor is reduced.
In one embodiment of the present application, a guide rail is disposed on the detection device 30, and the detection light source 10 and the detection camera 20 are slidably connected to the detection device 30 through the guide rail.
In the embodiment of the present application, the detection device 30 is provided with a guide rail, and the guide rail can be used to define the movement path of the detection camera 20 and the detection light source 10. The detection light source 10 and the detection camera 20 may be disposed on the same detection rail or may be disposed on separate detection rails. The structure of the detecting device 30 may take various forms, such as a linear, a folded line, an incomplete semicircular arc, etc., and the guide rail may be adaptively changed according to different structural forms of the detecting device 30. The detection light source 10 and the detection camera 20 may be slidably connected to the detection device 30 in various manners, for example, by sliding a rail through a structure such as a chute, a rack, a driving belt, etc. The arrangement positions of the detection light source 10 and the detection camera 20 on the detection track can be adjusted accordingly as required. When the detection camera 20 and the detection light source 10 slide on the detection device 30, the angle between the detection light source 10 and the plane to be detected and the angle between the detection camera 20 and the plane to be detected can be changed.
As an embodiment of the present application, the detecting device 30 is in a semi-circular shape, the positioning mechanical arm 40 is connected to the geometric center position of the outer arc surface of the detecting device 30, and the detecting camera 20 and the detecting light source 10 are respectively located at two sides of the geometric center position of the inner arc surface of the detecting device 30.
In the embodiment of the present application, the overall structure of the detection device 30 is in a semicircular shape and is arranged in a central symmetry manner, when the detection is performed, the detection camera 20 and the detection light source 10 are respectively positioned at two sides of the geometric center position of the intrados of the detection device 30, and light is emitted from the detection light source 10, reflected by the surface to be detected, and then received by the detection camera 20. Preferably, the detecting device 30 adopts an incomplete semicircle shape, the inner angle corresponding to the arc is set to 150 degrees, and the radius of the arc is set to 60cm. The symmetrical structure is beneficial to simplifying the light path, reducing the manufacturing cost and facilitating the exposure of defects and the later processing of images.
In one embodiment of the application, the paint surface of the automobile is subjected to defect detection. The ideal included angles required by the surfaces of different materials are different. For example, for a mirror finish, it is preferable that the normal angle between the detection camera 20 and the detection light source 10 is 90 °; for sheet metal and frosted paint surfaces, the included angle between the center normal line of the detection camera 20 and the normal line of the detection light source 10 needs to be set to be more than 120 degrees, so as to obtain clearer stripe light reflection. Because the paint surface only needs a small angle to see the specular reflection component, the scheme can automatically detect and automatically adjust the specular reflection components of different paint surfaces.
As an embodiment of the present application, the detection light source 10 is composed of a plurality of diffuse reflection light bands parallel to each other.
In the embodiment of the application, the detection light source 10 can adopt diffuse reflection stripe light, the number of the stripes can be adjusted according to the needs, preferably, the number of the stripes is 10-20, and the light source consists of a plurality of programmable LED luminous stripes. The advantages of using a diffuse reflective light source are: when paint surface defect detection is carried out, diffuse reflection light is usually required to irradiate the surface of a sample, and the diffuse reflection light can not obviously reflect on the surface but can be absorbed and scattered by the surface of the sample, so that the detection result can reflect the quality condition of the surface more accurately; the specular reflection light irradiates on the surface of the sample, so that obvious reflection can be generated on the surface, and the deviation of the detection result is larger. The adoption of the stripe light source has the advantages that: the detection precision and the detection speed are improved advantageously: the stripe light source can provide high-precision three-dimensional shape information, and other complex optical instruments are not needed to process light or digital signals, so that the acquisition of a camera and the data processing calculation are facilitated, the detection efficiency is improved, and the time and the cost are saved; the application range is wider: the stripe light source is applicable to various materials such as metal, plastic and the like, has good universality and can be widely applied to surface defect detection in different fields.
As an embodiment of the present application, one end of the positioning mechanical arm 40 is fixed on the base, and the other end is connected to the detecting device 30; the positioning robot 40 has at least 6 degrees of freedom for adjusting the detection device 30 to any position and any orientation in space.
In the embodiment of the present application, the 6-degree-of-freedom specifiable mechanical arm 40 is capable of arranging the positioning rail at an arbitrary position in a spatial three-dimensional position, and has the capability of arbitrarily orienting in space, and the positioning mechanical arm 40 can achieve the above-described functions by rotating, expanding, contracting, and the like in three orthogonal directions. For example, linear movement in three directions and rotational movement in three directions may be performed. Through the multi-degree-of-freedom arrangement, the device 30 to be detected can be moved to different sites to face different surfaces to be detected, so that the device 30 can adapt to the surfaces to be detected in different positions, sizes and forms, and the detection precision and applicability of the device are improved.
As shown in fig. 2, as an embodiment of the present application, the detecting device 30 is in a semicircular shape, the positioning mechanical arm 40 is connected to the geometric center position of the outer arc surface of the detecting device 30, and the detecting camera 20 and the detecting light source 10 are respectively located at two sides of the geometric center position of the inner arc surface of the detecting device 30.
In the embodiment of the present application, as shown in fig. 2, an annular detection device 30 is provided, the guide rail is in a semicircular shape and has a central symmetry structure, the positioning mechanical arm 40 is fixedly connected with the geometric center position of the outer arc surface of the detection device 30, and the detection camera 20 and the detection light source 10 are respectively located at two sides of the geometric center position of the inner arc surface of the detection device 30. The detection camera 20 and the detection light source 10 are arranged on respective bases, and the bases are meshed and connected with a toothed rail arranged on the outer cambered surface of the detection device 30 under the control of respective motors, and can freely move on the toothed rail according to requirements. By means of the arrangement mode, the detection camera 20 is enabled to capture detection light emitted by the detection light source 10 more easily, and the symmetrical structure is combined, so that the processing of data received by the detection camera 20 is enabled to be more convenient, and the calculated amount of the data is reduced.
As an embodiment of the present application, the detecting camera 20 is configured to collect three primary color information of a surface to be detected and distance information of the detecting camera 20 from the surface to be detected.
In the embodiment of the present application, the detection camera 20 may receive the light or the radiation emitted by the detection light source 10, and preferably, the detection camera 20 employs a camera head including an RGB-D module. The RGB is used for acquiring three primary colors, and the depth module is used for acquiring distance information of the detection camera 20 from the surface to be detected. Preferably, the detection camera 20 is adjusted to a distance of 21cm-55cm from the plane to be detected, and the visual field of the camera is 30 degrees.
Fig. 3 is an application environment diagram of a surface defect detecting method based on a displacement light source according to an embodiment of the present application, as shown in fig. 3, in the application environment, the surface defect detecting device 110 based on the displacement light source and the computer device 120 are included. A surface defect detection method based on a displacement light source may be run in the computer device 120.
The computer device 120 may be a small controller composed of a small single chip microcomputer or the like, may be a large computer device, may be an independent physical server or terminal, or may be a server group composed of physical servers, or may be a remote controller based on cloud computing services such as a cloud server, or the like. The surface defect detecting device 110 based on the displacement light source may be the surface defect detecting device based on the light source, but is not limited thereto.
The computer device 120 may be connected to the surface defect detecting device 110 based on the displacement light source through a wired or wireless network, etc., and may control the surface defect detecting device 110 based on the displacement light source and collect and process information collected by the surface defect detecting device 110 based on the displacement light source, which is not limited herein.
As shown in fig. 4, in one embodiment, a surface defect detection method based on a displacement light source is provided, and this embodiment is mainly exemplified by the application of the method to the computer device 120 in fig. 3. The surface defect detection method based on the displacement light source specifically comprises the following steps:
step S202, digital three-dimensional model data of a surface to be detected are obtained, and a detection point is selected from the surface to be detected.
In the embodiment of the application, the system firstly acquires the digital three-dimensional model of the surface to be detected, for example, the three-dimensional stereogram of the whole structure of the automobile is input into the system, and the system can acquire the three-dimensional model data of all the surfaces of the whole automobile surface according to a corresponding algorithm and the like. At this time, the system may automatically divide the three-dimensional model data of all the surfaces into a plurality of small-sized areas to be detected, set each area to be detected as a surface to be detected, and automatically divide each surface to be detected according to the three-dimensional structure of the automobile surface so as to achieve the optimal detection effect. In this step, a point to be detected is also selected from the surface to be detected, for example, a center of gravity or a geometric center of the surface to be detected is selected as the point to be detected.
It can be understood that after the system acquires the three-dimensional model data of all the surfaces of the whole automobile surface, the system can also directly generate a plurality of to-be-detected points according to the model data, and detect each to-be-detected point one by one.
Step S204, based on the digital three-dimensional model data, the normal line of the surface to be detected at the position of the detection point to be detected is obtained.
Step S206, based on the digital model of the detection device, adjusting the spatial position of the detection device to enable any point position on the intrados of the detection device to be located on the normal line.
In the embodiment of the application, the normal of the surface to be detected at the position of the detection point can be automatically generated by a digital three-dimensional model. The resulting cap may refer to: and taking the detection point to be detected as an origin, and taking the space vector coordinates of normal rays of the surface to be detected at the detection point to be detected. After the normal limit is obtained, the detection device 30 is moved to the corresponding position of the surface to be detected by the mechanical arm of the positioning machine. Specifically, the position of any point on the detecting device 30 may be located on the normal line, and by this way, the spatial positions of the detecting device 30 and the plane to be detected are opposite, so that the detecting camera 20 and the detecting light source 10 can shoot and irradiate the plane to be detected conveniently.
Step S208, the detection light source 10 is used to irradiate the surface to be detected, and the detection camera 20 is used to collect the image information of the surface to be detected;
step S210, analyzing the image information to generate a surface defect detection result.
In the embodiment of the present application, the light obtained by irradiating the surface to be detected by the detection light source 10 may be obtained by the detection method shown in fig. 5 by irradiating the surface to be detected by the detection light source 10 and photographing the surface to be detected by the detection camera 20. The arrangement of the detection light source 10 can facilitate the processing of a system or an automatic algorithm of the detection image acquired by the detection camera 20 and make the defects of the paint surface more easily exposed. The analysis of the image may be automated using an algorithm.
In one embodiment of the application, the detection device 30 is used in paint detection of an automotive surface. The working distance between the detection camera 20 and the surface to be detected is 21cm-55cm, the visual field range of the detection camera 20 is 30 degrees, flaws such as particles, scratches, flow marks, concave-convex, shrinkage cavities and the like can be identified, flaws smaller than 0.3mm can be measured, and the single scanning time is smaller than 60 seconds. As shown in fig. 6, the types of the 4 defects collected by the camera and the corresponding defect schematic diagrams obtained after processing by the automatic algorithm are respectively shown, and the types of the defects from left to right are particles, scratches, pits and bumps in sequence. By the method, defects are easier to be identified and counted, and the detection precision is remarkably improved.
In the embodiment of the application, aiming at the complex curved surface characteristics of the automobile surface, each to-be-detected point is subjected to targeted high-precision defect detection through the changeable irradiation angle of the detection light source 10 and the shooting angle of the detection camera 20, manual intervention is not needed in the whole detection process, the detection speed and accuracy of the surface defects are obviously improved, and the omission ratio is reduced.
As an embodiment of the present application, when the detecting device 30 is semi-circular, the method for adjusting the spatial position of the detecting device 30 is as follows: the geometric center of the intrados of the detecting means 30 is located on the normal.
In the embodiment of the present application, the geometric center of the intrados of the detecting device 30 is located on the normal line, so that the shot positions of the detecting camera 20 and the detecting light source 10 are more symmetrical, which is convenient for computer calculation and image processing, and is beneficial for reducing the computation load of the computer for relevant graphic processing.
As an embodiment of the present application, the method for illuminating the surface to be detected by using the detection light source 10 and photographing the surface to be detected by using the detection camera 20 includes: the included angle between the detection camera 20 and the surface to be detected is kept unchanged, and the included angle between the detection light source 10 and the surface to be detected is changed, so that the detection light source 10 slides within the range of 0-90 degrees.
In the embodiment of the present application, when the surface to be detected is detected, the position of the detection camera 20 may be kept unchanged, and the angle between the detection light source 10 and the surface to be detected is changed, for example, the angle between the detection light source 10 is changed between 0 ° and 90 °. During the course of the angle change, the camera 20 is detected and the shots are continued or taken at intervals. For example, from the detection light source 10 and the surface to be detected having an included angle of 0 °, 5 ° and 10 ° … …, respectively, are photographed at intervals. Thereby make the detection more accurate, reduce the omission ratio. The shooting times can be automatically or manually adjusted according to the preset total detection time.
As an embodiment of the application, the method further comprises: the included angle between the detection light source 10 and the surface to be detected is kept unchanged, and the included angle between the detection camera 20 and the surface to be detected is changed, so that the detection camera 20 slides within the range of 15-75 degrees.
In the embodiment of the present application, when the surface to be detected is detected, the position of the detection light source 10 may be kept unchanged, and the angle between the detection camera 20 and the surface to be detected is changed, for example, so that the angle between the detection camera 20 is changed between 15 ° and 75 °. During the course of the angle change, the camera 20 is detected and the shots are continued or taken at intervals. For example, from an angle of 15 ° between the detection camera 20 and the surface to be detected, the imaging is performed at intervals of 15 °, 20 °, 25 °, … …, respectively. Thereby make the detection more accurate, reduce the omission ratio. The shooting times can be automatically or manually adjusted according to the preset total detection time.
As shown in fig. 6, as an embodiment of the present application, there is provided a surface defect detecting system based on a displacement light source, the system including at least two of the above-described surface defect detecting devices 30 based on a displacement light source, each of the detecting devices 30 detecting a surface defect using the above-described surface defect detecting method based on a displacement light source.
In the embodiment of the application, one surface defect detection device based on the displacement light source in the surface defect detection system based on the displacement light source can be arranged as one surface defect detection device, and in order to improve the detection efficiency, at least two detection devices are preferred, and the two detection devices can be arranged at two sides of an object to be detected. The whole detection cost of the system is low; high aging, and can be checked all the day; the screening rate is stable and is not influenced by continuous working time; and flaw data is automatically collected, so that the accuracy is high. The detection of surface defects can be performed by using a deep learning detection algorithm to judge and classify the defects of the image based on the acquired image.
As shown in fig. 6, a set of surface defect detection system based on a displacement light source is applied to detect the paint surface of an automobile, the automobile to be detected is arranged on a production line, and 6 surface defect detection devices based on the displacement light source are arranged on the periphery of the automobile. During detection, after the detected automobile moves to a detection area, according to the three-dimensional model of the automobile surface, the six groups of positioning mechanical arms 40 traverse the areas, which are required to be detected, of the six automobile surfaces by using acquisition equipment, wherein the detection ranges of the different positioning mechanical arms 40 can be partially overlapped. The six sets of positioning mechanical arms 40 drive the detection camera 20 and the detection light source 10 which are fixed on the circular arc detection device 30, the sampling point range detected by each positioning mechanical arm 40 is divided according to the contour of the automobile surface, full-range imaging of the automobile surface is carried out, and the image defect is judged through an algorithm after imaging. The whole detection cost is low; high aging, and can be checked all the day; the screening rate is stable and is not influenced by continuous working time; and flaw data is automatically collected, so that the accuracy is high. The detection of surface defects can be performed by using a deep learning detection algorithm to judge and classify the defects of the image based on the acquired image.
In one embodiment of the application, the vehicle is carried to the detection position by the conveyor belt, the mechanical arm drives the camera module to the detection position of the vehicle, and the normal direction of the corresponding point surface is calculated according to the three-dimensional model of the vehicle. The six groups of mechanical arms are adjusted to enable the center line of the acquisition device to point to the corresponding surface point and be parallel to the normal direction, shooting is carried out under different included angles of the detection light source 10 and the detection camera 20 after initial positioning is completed, and multiple shooting or video shooting is needed for each included angle of the detection light source 10 and the detection camera 20. The shooting mode can be that the detection camera is not moving, the detection light source 10 sweeps around the corresponding angle, so that flaws are exposed, the six groups of camera modules complete the depth information of the current camera module and the surface of the detected automobile, after the RGB information is detected, corresponding images or videos are obtained, and then a corresponding detection algorithm is called to identify, classify and position the flaws.
In the embodiment of the present application, the description of a surface defect detection device based on a displacement light source and the description of a surface defect detection method based on a displacement light source are referred to above, and are not repeated here. Through the arrangement of the scheme, the changeable detection light source 10 irradiation angle and the shooting angle of the detection camera 20 are matched with the detection device 30 with changeable positions and orientations, so that the scheme can detect each to-be-detected point with high accuracy according to the characteristics of the to-be-detected object with the surface with a complex curved surface, manual intervention is not needed in the whole detection process, the detection speed and accuracy of the surface defects are obviously improved, and the omission ratio is reduced.
FIG. 7 illustrates an internal block diagram of a computer device in one embodiment. The computer device may be specifically computer device 120 of FIG. 1. As shown in fig. 7, the computer device includes a processor, a memory, a network interface, an input device, and a display screen connected by a system bus. The memory includes a nonvolatile storage medium and an internal memory. The non-volatile storage medium of the computer device stores an operating system and may also store a computer program which, when executed by a processor, causes the processor to implement a surface defect detection method based on a displacement light source. The internal memory may also store a computer program which, when executed by the processor, causes the processor to perform a surface defect detection method based on the displacement light source. The display screen of the computer equipment can be a liquid crystal display screen or an electronic ink display screen, the input device of the computer equipment can be a touch layer covered on the display screen, can also be keys, a track ball or a touch pad arranged on the shell of the computer equipment, and can also be an external keyboard, a touch pad or a mouse and the like.
It will be appreciated by those skilled in the art that the structure shown in FIG. 7 is merely a block diagram of some of the structures associated with the present inventive arrangements and is not limiting of the computer device to which the present inventive arrangements may be applied, and that a particular computer device may include more or fewer components than shown, or may combine some of the components, or have a different arrangement of components.
It should be understood that, although the steps in the flowcharts of the embodiments of the present application are shown in order as indicated by the arrows, these steps are not necessarily performed in order as indicated by the arrows. The steps are not strictly limited to the order of execution unless explicitly recited herein, and the steps may be executed in other orders. Moreover, at least some of the steps in various embodiments may include multiple sub-steps or stages that are not necessarily performed at the same time, but may be performed at different times, nor do the order in which the sub-steps or stages are performed necessarily performed in sequence, but may be performed alternately or alternately with at least a portion of the sub-steps or stages of other steps or other steps.
Those skilled in the art will appreciate that all or part of the processes in the methods of the above embodiments may be implemented by a computer program for instructing relevant hardware, where the program may be stored in a non-volatile computer readable storage medium, and where the program, when executed, may include processes in the embodiments of the methods described above. Any reference to memory, storage, database, or other medium used in embodiments provided herein may include non-volatile and/or volatile memory. The nonvolatile memory can include Read Only Memory (ROM), programmable ROM (PROM), electrically Programmable ROM (EPROM), electrically Erasable Programmable ROM (EEPROM), or flash memory. Volatile memory can include Random Access Memory (RAM) or external cache memory. By way of illustration and not limitation, RAM is available in a variety of forms such as Static RAM (SRAM), dynamic RAM (DRAM), synchronous DRAM (SDRAM), double Data Rate SDRAM (DDRSDRAM), enhanced SDRAM (ESDRAM), synchronous Link DRAM (SLDRAM), memory bus direct RAM (RDRAM), direct memory bus dynamic RAM (DRDRAM), and memory bus dynamic RAM (RDRAM), among others.
The technical features of the above-described embodiments may be arbitrarily combined, and all possible combinations of the technical features in the above-described embodiments are not described for brevity of description, however, as long as there is no contradiction between the combinations of the technical features, they should be considered as the scope of the description.
The foregoing examples illustrate only a few embodiments of the application and are described in detail herein without thereby limiting the scope of the application. It should be noted that it will be apparent to those skilled in the art that several variations and modifications can be made without departing from the spirit of the application, which are all within the scope of the application. Accordingly, the scope of protection of the present application is to be determined by the appended claims.
Claims (10)
1. A surface defect detection device based on a displacement light source, the device comprising:
the detection light source is used for irradiating the surface to be detected;
the detection camera is used for shooting the surface to be detected;
the detection device is used for changing the irradiation angle of the detection light source to the surface to be detected and changing the shooting angle of the detection camera to the surface to be detected;
and the positioning mechanical arm is connected with the detection device and used for changing the position and the orientation of the detection device in space.
2. The surface defect detection device based on a displacement light source according to claim 1, wherein a guide rail is arranged on the detection device, and the detection light source and the detection camera are both in sliding connection with the detection device through the guide rail.
3. The surface defect detection device based on the displacement light source according to claim 2, wherein the detection device is in a semicircular shape, the positioning mechanical arm is connected with the geometric center position of the outer arc surface of the detection device, and the detection camera and the detection light source are respectively positioned at two sides of the geometric center position of the inner arc surface of the detection device.
4. The surface defect detection device based on the displacement light source according to claim 1, wherein the detection light source is composed of a plurality of diffuse reflection light bands parallel to each other, and the detection camera is used for collecting three primary color information of a surface to be detected and distance information of the detection camera from the surface to be detected.
5. The surface defect detection device based on a displacement light source according to claim 1, wherein one end of the positioning mechanical arm is fixed on a base, and the other end is connected with the detection device;
the positioning mechanical arm has at least 6 degrees of freedom and is used for adjusting the detection device to any position and any orientation in space.
6. A surface defect detection method based on a displacement light source, characterized in that it is applied to a surface defect detection apparatus based on a displacement light source as claimed in any one of claims 1 to 5, the method comprising:
acquiring digital three-dimensional model data of a surface to be detected, and selecting a detection point from the surface to be detected;
based on the digital three-dimensional model data, obtaining a normal line of the surface to be detected at a detection point;
based on a digital model of the detection device, adjusting the spatial position of the detection device to enable any point position on the detection device to be located on the normal;
illuminating the surface to be detected by using the detection light source, and acquiring image information of the surface to be detected by using the detection camera;
and analyzing the image information to generate a surface defect detection result.
7. The method for detecting surface defects based on a displacement light source according to claim 6, wherein when the detecting device is semi-circular, the method for adjusting the spatial position of the detecting device is as follows:
and enabling the geometric center of the intrados of the detection device to be positioned on the normal line.
8. The method for detecting surface defects based on a displacement light source according to claim 6, wherein the method for irradiating the surface to be detected by using the detection light source and photographing the surface to be detected by using the detection camera comprises the following steps:
and keeping the included angle between the detection camera and the surface to be detected unchanged, and changing the included angle between the detection light source and the surface to be detected, so that the detection light source slides within the range of 0-90 degrees.
9. The method of claim 6, further comprising:
and keeping the included angle between the detection light source and the surface to be detected unchanged, and changing the included angle between the detection camera and the surface to be detected, so that the detection camera slides within the range of 15-75 degrees.
10. A surface defect detection system based on a displacement light source, characterized in that the system comprises at least two surface defect detection devices based on a displacement light source according to any one of claims 1-5, each of the detection devices applying a surface defect detection method based on a displacement light source according to any one of claims 6-9 for detecting surface defects.
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