CN116840515A - Impedance detection probe and impedance detection device - Google Patents
Impedance detection probe and impedance detection device Download PDFInfo
- Publication number
- CN116840515A CN116840515A CN202310778425.4A CN202310778425A CN116840515A CN 116840515 A CN116840515 A CN 116840515A CN 202310778425 A CN202310778425 A CN 202310778425A CN 116840515 A CN116840515 A CN 116840515A
- Authority
- CN
- China
- Prior art keywords
- probe
- impedance detection
- plug
- mounting
- impedance
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000523 sample Substances 0.000 title claims abstract description 181
- 238000001514 detection method Methods 0.000 title claims abstract description 102
- 238000001125 extrusion Methods 0.000 claims abstract description 4
- 230000005540 biological transmission Effects 0.000 claims description 8
- 230000002093 peripheral effect Effects 0.000 claims description 4
- 238000003860 storage Methods 0.000 claims description 4
- 238000003825 pressing Methods 0.000 claims description 2
- 230000009286 beneficial effect Effects 0.000 abstract description 9
- 238000007689 inspection Methods 0.000 abstract description 8
- 238000003466 welding Methods 0.000 description 19
- 238000009434 installation Methods 0.000 description 6
- 239000002184 metal Substances 0.000 description 4
- 238000004544 sputter deposition Methods 0.000 description 4
- 230000006835 compression Effects 0.000 description 2
- 238000007906 compression Methods 0.000 description 2
- 230000002950 deficient Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06705—Apparatus for holding or moving single probes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07392—Multiple probes manipulating each probe element or tip individually
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Measurement Of Resistance Or Impedance (AREA)
Abstract
The present disclosure relates to the technical field of impedance detection equipment, and provides an impedance detection probe and an impedance detection device, wherein the impedance detection probe comprises a mounting piece, a first probe and a second probe; the mounting piece is provided with a first mounting part and a second mounting part; the first probe is arranged on the mounting piece through the first mounting part and is provided with a first probe plug which can axially stretch along the first probe plug; the second probe is arranged on the mounting piece through a second mounting part and is provided with a second probe plug which can axially stretch along the second probe plug; the first probe plug and the second probe plug are located at different plane heights, and can axially shrink along the self when being in butt extrusion with the point to be tested. The latter includes the former, and all has the beneficial effect that detection efficiency is low, adaptable machinery realizes full-automatic inspection.
Description
Technical Field
The disclosure relates to the technical field of impedance detection equipment, and in particular relates to an impedance detection probe and an impedance detection device.
Background
When detecting the impedance of each welding point position of a circuit board piece in the prior art, most of detection personnel carry out manual impedance detection on each point position through a universal meter, two detection probes of the universal meter in the prior art are independent of each other, the detection personnel can operate with both hands when detecting, and especially when the welding point position to be detected of the circuit board piece, a metal sputtering layer and a metal node are more, the detection personnel is low in detection efficiency one by one, and moreover, the problem of missing detection is easy to occur, so that the risk of defective product output exists.
In view of this, a new type of impedance detection probe and impedance detection device are needed in the market, which are used for solving the problems of low efficiency and easy missing detection existing in the manual detection of welding points of the multimeter in the prior art.
Disclosure of Invention
The embodiment of the disclosure provides an impedance detection probe and an impedance detection device, which aim to solve the problems of low efficiency and easy missing detection existing when a universal meter manually detects welding points, metal sputtering layers and metal nodes in the prior art.
The embodiment of the disclosure provides an impedance detection probe including a mounting, a first probe, and a second probe;
the mounting piece is provided with a first mounting part and a second mounting part;
the first probe is mounted on the mounting piece through the first mounting part and is provided with a first probe plug which can axially stretch along the first probe plug;
the second probe is mounted on the mounting piece through the second mounting part and is provided with a second probe plug which can axially stretch along the second probe plug;
the first probe plug and the second probe plug are located at different plane heights, and can axially shrink along the self axis when being in butt extrusion with the point to be tested.
In an embodiment, the first probe and the second probe are respectively provided with a storage cavity inside;
an elastic piece is further arranged in the accommodating cavity, and one ends of the first probe plug and the second probe plug are connected and installed in the accommodating cavity through the elastic piece respectively;
the elastic piece applies elastic force to the first probe plug and the second probe plug in the direction away from the storage cavity respectively;
and the first probe plug and the second probe plug can press the elastic piece and at least partially shrink the containing cavity when being abutted.
In one embodiment, the mounting member includes a mounting base and a snap-fit cover removably engaged with the mounting base;
the first installation part and the second installation part are correspondingly arranged in the installation base and the buckling cover along the thickness direction.
In one embodiment, the mounting base has an end face for the snap-fit cover to cover;
positioning flaring corresponding to the first installation part and the second installation part are respectively arranged in the end face;
positioning convex edges are respectively arranged on the peripheral walls of the first probe and the second probe;
the first probe and the second probe are inserted into the positioning flaring through the positioning convex edge.
In an embodiment, the impedance detection probe further comprises an electrical terminal for detachable connection with the processing device;
the first probe and the second probe are respectively and electrically connected with the electric terminal through respective leads.
In addition, the embodiment of the disclosure also provides an impedance detection device, which comprises a mounting frame, a driving piece, a product jig and the impedance detection probe;
the driving piece, the product jig and the impedance detection probe are correspondingly and respectively arranged on the mounting frame;
the product jig is used for accommodating products to be tested;
the impedance detection probes are arranged in a plurality and respectively correspond to the to-be-detected points in the to-be-detected product one by one;
the driving piece is in transmission connection with a plurality of the impedance detection probes, and can drive the impedance detection probes to synchronously move and squeeze towards the product jig.
In an embodiment, the impedance detection device further includes a data processing module;
the data processing module is respectively and electrically connected with the plurality of impedance detection probes and is used for receiving and processing detection information of the impedance detection probes.
In an embodiment, the impedance detection device is further movably arranged on the mounting frame and is in transmission connection with the lifting plate of the driving piece;
the data processing module and the impedance detection probe are respectively arranged on one side of the lifting plate, which is opposite to the product jig.
In one embodiment, the mounting frame comprises an upper support plate, a lower support plate and a guide shaft connecting the upper support plate and the lower support plate along the thickness direction of the mounting frame;
the driving piece is arranged on one side of the upper supporting plate, which is opposite to the lower supporting plate;
the product jig is arranged on one side of the lower supporting plate, which faces the upper supporting plate;
the lifting plate is movably sleeved on the guide shaft.
In an implementation mode, a guide hole is further formed in the lifting plate, and a guide shaft sleeve is arranged in the guide hole;
the lifting plate is movably sleeved on the guide shaft through the guide shaft sleeve.
Compared with the prior art, the technical scheme provided by the embodiment of the disclosure has the following advantages:
when the impedance detection probe provided by the embodiment of the disclosure is specifically used, the impedance detection probe is only required to be correspondingly abutted against the welding point in the circuit board, and the first probe and the second probe can be correspondingly abutted against and extruded with two sputtering surfaces with different heights in the welding point level step surface respectively, so that the first probe and the second probe can be cooperated to correspondingly detect the impedance information of the welding point.
The impedance detection probe does not need to be operated by two hands, and an maintainer can finish the rapid inspection of the impedance of the welding point by one hand, or correspondingly set the impedance detection probe in an automatic mechanical arm or a driving machine, so that the full-automatic inspection of the impedance of the welding point is realized, and the impedance detection probe has the advantages of simple structure, low detection efficiency and full-automatic inspection realized by an adaptable machine or machine.
In addition, the embodiment of the disclosure provides an impedance detection device, including the impedance detection probe, which can achieve all the beneficial effects thereof, and is not described herein.
It should be understood that the description in this section is not intended to identify key or critical features of the embodiments of the disclosure, nor is it intended to be used to limit the scope of the disclosure. Other features of the present disclosure will become apparent from the following specification.
Drawings
The above, as well as additional purposes, features, and advantages of exemplary embodiments of the present disclosure will become readily apparent from the following detailed description when read in conjunction with the accompanying drawings. Several embodiments of the present disclosure are illustrated by way of example, and not by way of limitation, in the figures of the accompanying drawings, in which:
in the drawings, the same or corresponding reference numerals indicate the same or corresponding parts.
FIG. 1 illustrates a self-contained perspective view of an impedance sensing probe provided by an embodiment of the present disclosure;
FIG. 2 illustrates a vertical cross-sectional view of an impedance sensing probe provided by an embodiment of the present disclosure;
FIG. 3 illustrates an exploded view of an impedance detection device provided by an embodiment of the present disclosure;
fig. 4 is a schematic diagram of a data processing module in the impedance detecting apparatus according to the embodiment of the disclosure.
The reference numerals in the figures illustrate: 1. a mounting member; 11. a first mounting portion; 12. a second mounting portion; 13. a mounting base; 131. positioning flaring; 14. a buckling cover; 2. a first probe; 21. a first probe plug; 3. a second probe; 31. a second probe plug; 4. an electrical terminal; 5. a mounting frame; 51. an upper support plate; 52. a lower support plate; 53. a guide shaft; 6. a driving member; 7. a product jig; 8. a data processing module; 9. a lifting plate; 91. and a guide shaft sleeve.
Detailed Description
In order to make the objects, features and advantages of the present disclosure more comprehensible, the technical solutions in the embodiments of the present disclosure will be clearly described in conjunction with the accompanying drawings in the embodiments of the present disclosure, and it is apparent that the described embodiments are only some embodiments of the present disclosure, but not all embodiments. Based on the embodiments in this disclosure, all other embodiments that a person skilled in the art would obtain without making any inventive effort are within the scope of protection of this disclosure.
Embodiments of the present disclosure will be described in detail below with reference to the accompanying drawings.
As shown in conjunction with fig. 1 and 2, an embodiment of the present disclosure provides an impedance detection probe including a mount 1, a first probe 2, and a second probe 3; the mounting piece 1 is provided with a first mounting part 11 and a second mounting part 12; the first probe 2 is attached to the attachment 1 by the first attachment portion 11, and has a first probe plug 21 that is retractable in the axial direction thereof; the second probe 3 is attached to the attachment 1 by the second attachment portion 12, and has a second probe plug 31 that is retractable in the axial direction thereof; the first probe plug 21 and the second probe plug 31 are located at different plane heights, and can be axially contracted along the self axis when being pressed against the point to be tested.
The impedance detection probe can be specifically applied to the impedance inspection of each welding point in the circuit board, when an maintainer is specifically used, the impedance detection probe is only required to be correspondingly abutted against the welding point in the circuit board, the first probe head 21 and the second probe head 31 can be correspondingly abutted against and extruded with two sputtering surfaces with different heights in the welding point level ladder surface respectively, and thus the first probe head 2 and the second probe head 3 can be cooperated to correspondingly detect the impedance information of the welding point.
Compared with the mode that maintainer detects the welding point position through universal meter both hands among the prior art, this impedance detection probe need not the operation of both hands, and maintainer single hand operation can accomplish the quick inspection of welding point position impedance, perhaps corresponds this impedance detection probe and set up in automatic arm, or drive machine, realizes the full-automatic inspection of welding point position impedance, and the impedance detection probe that this disclosed embodiment provided has simple structure, detection efficiency is low, adaptable machinery or machine realize the beneficial effect of full-automatic inspection.
Of course, it should be noted that, in the impedance detection probe, the first probe 2 and the second probe 3 need to be electrically connected with the corresponding impedance detection circuit and the impedance detection component to ensure the normal detection function.
In an embodiment, the first probe 2 and the second probe 3 are respectively provided with a storage cavity; an elastic piece 4 is also arranged in the accommodating cavity, and one ends of the first probe plug 21 and the second probe plug 31 are respectively connected and installed in the accommodating cavity through the elastic piece 4; the elastic piece 4 applies elastic force to the first probe plug 21 and the second probe plug 31 in the direction away from the accommodating cavity; and the first probe pin 21, the second probe pin 31 are capable of pressing the elastic member 4 and at least partially contracting the receiving cavity upon abutment.
Specifically, as described in further detail with reference to fig. 1 and 2, the receiving cavities inside the first probe 2 and the second probe 3 may specifically be disposed to extend along the axial directions of the two, and the elastic member 4 may specifically be disposed to abut against a compression spring mounted on the inner cavity wall of the receiving cavity, and be connected to one ends of the first probe plug 21 and the second probe plug 31 located in the receiving cavity, where the elastic member 4 and the compression deformation of the elastic member itself may apply an elastic force to the first probe plug 21 and the second probe plug 31 in a direction away from the receiving cavity, and the first probe plug 21 and the second probe plug 31 may further press the elastic member 4 and further contract in the receiving cavity when abutting.
The specific setting mode of the accommodating cavity and the elastic piece 4 has the beneficial effects of simple structure and capability of stably realizing the telescopic movement of the first probe plug 21 and the second probe plug 31.
In one embodiment, the mounting member 1 includes a mounting base 13 and a snap-fit cover 14 removably engaged with the mounting base 11; the first mounting portion 11 and the second mounting portion 12 are correspondingly opened in the mounting base 13 and the locking cover 14 in the thickness direction.
Specifically, as described in further detail with reference to fig. 1 and 2, the mounting member 1 is specifically configured as a mounting base 13 and a fastening cover 14 having separate structures, and the first mounting portion 11 and the second mounting portion 12 are correspondingly disposed in the mounting base 13 and the fastening cover 14 along the thickness direction, so that when the fastening cover 14 is correspondingly disposed on the mounting base 11, the first mounting portion 11 and the second mounting portion 12 can be correspondingly disposed.
The mounting base 13 and the fastening cover 14 may be fastened and fixed by means of a barb plug, a screw connection, or the like.
The specific arrangement mode of the mounting member 1 has the advantages of simple structure, convenience for processing and manufacturing respectively, and convenience for mounting the first probe plug 21 and the second probe plug 31.
In one embodiment, the mounting base 13 has an end face for the snap-fit cover 14 to cover; positioning flares 131 corresponding to the first mounting part 11 and the second mounting part 12 are respectively formed in the end surfaces; the peripheral walls of the first probe 2 and the second probe 3 are respectively provided with a positioning convex edge; the first probe 2 and the second probe 3 are positioned and inserted into the positioning flaring 131 through the positioning convex edge.
Specifically, as further detailed in connection with fig. 1 and 2, the diameter of the positioning flaring 131 may be specifically set to be greater than the diameter of the first mounting portion 11 or the second mounting portion 12 by 2-3 mm, so that the positioning flaring 131 and the first mounting portion 11 or the second mounting portion 12 may form a structure similar to a "stepped hole" at the end face, the first probe 2 and the second probe 3 may be correspondingly positioned and inserted into the positioning flaring 131 through the positioning protruding edges of the peripheral walls of the first probe 2 and the second probe 3, and after the fastening cover 14 covers and fastens the mounting base 13, the first probe 2 and the second probe 3 finally realize stable installation in the mounting member 1.
The specific arrangement mode of the positioning flaring 131 and the positioning convex edge has the beneficial effects of simple structure and convenience in positioning and mounting the first probe 2 and the second probe 3.
In an embodiment, the impedance detection probe further comprises an electrical connection terminal 4 for detachable connection with the processing means; the first probe 2 and the second probe 3 are electrically connected to the electrical terminal 4 via respective wires.
Specifically, as described in further detail with reference to fig. 1 and 4, the first probe 2 and the second probe 3 are electrically connected to the electrical terminal 4 through respective wires, so that the electrical terminal 4 can be connected to a processing device by a detachable connection, and the processing device calculates the detection information of the first probe 2 and the second probe 3.
The specific arrangement mode of the electric connection terminal 4 has the beneficial effect of being convenient for the flexible connection of the first probe 2 and the second probe 3.
In addition, the embodiment of the disclosure also provides an impedance detection device, which comprises a mounting frame 5, a driving piece 6, a product jig 7 and the impedance detection probe; the driving piece 6, the product jig 7 and the impedance detection probe are correspondingly and respectively arranged on the mounting frame 5; the product jig 7 is used for accommodating a product to be tested; the impedance detection probes are arranged in a plurality and respectively correspond to the to-be-detected points in the to-be-detected product one by one; the driving piece 6 is in transmission connection with a plurality of impedance detection probes, and can drive the impedance detection probes to synchronously move and squeeze towards the product jig 7.
Specifically, referring to fig. 3 and fig. 4, the impedance detecting device includes the impedance detecting probe, so that all the beneficial effects of the impedance detecting probe can be achieved, and the description is omitted herein.
In addition, the driving member 6 may be specifically configured to drive an air cylinder, and the driving member 6 is in transmission connection with a plurality of impedance detection probes, so that the plurality of impedance detection probes can simultaneously and correspondingly perform impedance detection on a plurality of welding points in a product to be tested by driving the plurality of impedance detection probes to synchronously move and squeeze towards the product fixture 7.
In an embodiment, the impedance detection device further comprises a data processing module 8; the data processing module 8 is electrically connected with the plurality of impedance detection probes respectively and is used for receiving and processing detection information of the impedance detection probes.
Specifically, as described in further detail with reference to fig. 3 and fig. 4, the data processing module 8 may be specifically but not limited to be configured as a PLC, and the detection information of each impedance detection probe is correspondingly processed and recorded by the data processing module 8, so that a detector can intuitively understand the impedance information of a plurality of welding points in the product to be detected at one time, and determine whether the product to be detected has a quality problem more clearly.
In one embodiment, the impedance detection device is also movably arranged on the mounting frame 5 and is in transmission connection with the lifting plate 9 of the driving piece 6; the data processing module 8 and the impedance detection probe are respectively arranged on one side of the lifting plate 9, which is opposite to the product jig 7.
Specifically, as described in further detail with reference to fig. 3 and 4, by arranging the lifting plate 9 and connecting the lifting plate with the driving member 6 in a transmission manner, the plurality of impedance detection probes are respectively mounted on one side of the lifting plate 9 opposite to the product fixture 7, and when the driving member 6 drives the lifting plate 9 to move towards the product fixture 7, the plurality of impedance detection probes can correspondingly move to abut against a plurality of welding points of the product to be measured in the extrusion product fixture 7.
The specific setting mode of the lifting plate 9 has the beneficial effects of simple structure and convenience for the driving piece 6 to synchronously drive a plurality of impedance detection probes.
In one embodiment, the mounting frame 5 includes an upper support plate 51, a lower support plate 52, and a guide shaft 53 connecting the two in the thickness direction thereof; the driving piece 6 is arranged on one side of the upper supporting plate 51 opposite to the lower supporting plate 52; the product jig 7 is arranged on one side of the lower supporting plate 52 facing the upper supporting plate 51; the lifting plate 9 is movably sleeved on the guide shaft 53.
Specifically, as described in further detail with reference to fig. 3 and 4, the mounting frame 5 is specifically configured to be an upper support plate 51, a lower support plate 52, and a guide shaft 53 connecting the two in the thickness direction thereof, so that the three can form a frame-like structure. The driving piece 6 is arranged on one side of the upper supporting plate 51, which is opposite to the lower supporting plate 52, the product jig 7 is arranged on one side of the lower supporting plate 52, which faces the upper supporting plate 51, and the lifting plate 9 is movably sleeved on the guide shaft 53, so that the lifting plate 9 can be driven to move towards the product jig 7 when the driving piece 6 is started, and the guide shaft 53 can also play a role in guiding and limiting the lifting plate 9.
The specific setting mode of the mounting frame 5 has the beneficial effects of simple structure and capability of guiding and limiting the lifting movement of the lifting plate 9.
In an embodiment, the lifting plate 9 is further provided with a guide hole, and the guide hole is provided with a guide shaft sleeve 91; the lifting plate 9 is movably sleeved on the guide shaft 53 through the guide shaft sleeve 91.
Specifically, as described in further detail with reference to fig. 3, the guide shaft sleeve 91 is provided in the guide hole of the lifter plate 9, and the guide shaft 53 is movably fitted around the guide shaft sleeve 91, so that the frictional resistance between the lifter plate 9 and the guide shaft 53 can be reduced, and the lifting movement of the lifter plate 9 can be made smoother.
Furthermore, the terms "first," "second," and the like, are used for descriptive purposes only and are not to be construed as indicating or implying a relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defining "a first" or "a second" may explicitly or implicitly include at least one such feature. In the description of the present disclosure, the meaning of "a plurality" is two or more, unless explicitly defined otherwise.
The foregoing is merely specific embodiments of the disclosure, but the protection scope of the disclosure is not limited thereto, and any person skilled in the art can easily think about changes or substitutions within the technical scope of the disclosure, and it is intended to cover the scope of the disclosure. Therefore, the protection scope of the present disclosure shall be subject to the protection scope of the claims.
Claims (10)
1. An impedance sensing probe, comprising:
a mounting member (1) provided with a first mounting portion (11) and a second mounting portion (12);
a first probe (2) which is attached to the attachment (1) by the first attachment portion (11) and has a first probe plug (21) that can extend and retract in the axial direction of the first probe plug;
a second probe (3) which is attached to the attachment (1) by the second attachment portion (12) and has a second probe plug (31) which is capable of expanding and contracting in the axial direction thereof;
the first probe plug (21) and the second probe plug (31) are located at different plane heights, and can axially shrink along the self axis when being in butt extrusion with a point to be tested.
2. The impedance detection probe according to claim 1, wherein the first probe (2) and the second probe (3) are respectively provided with a storage cavity inside;
an elastic piece (4) is further arranged in the accommodating cavity, and one ends of the first probe plug (21) and the second probe plug (31) are respectively connected and installed in the accommodating cavity through the elastic piece (4);
the elastic piece (4) applies elastic force to the first probe plug (21) and the second probe plug (31) in the direction away from the accommodating cavity;
and the first probe plug (21), the second probe plug (31) are capable of pressing the elastic piece (4) and at least partially contracting the containing cavity when in abutting connection.
3. Impedance detection probe according to claim 1, characterized in that the mounting (1) comprises a mounting base (13) and a snap-on cover (14) removably covering the mounting base (11);
the first mounting part (11) and the second mounting part (12) are correspondingly arranged in the mounting base (13) and the buckling cover (14) along the thickness direction.
4. An impedance detection probe according to claim 3, wherein the mounting base (13) has an end face for the snap-fit cover (14) to cover;
positioning flares (131) corresponding to the first mounting part (11) and the second mounting part (12) are respectively formed in the end faces;
the peripheral walls of the first probe (2) and the second probe (3) are respectively provided with a positioning convex edge;
the first probe (2) and the second probe (3) are positioned and inserted into the positioning flaring (131) through the positioning convex edge.
5. Impedance detection probe according to claim 1, characterized in that it further comprises an electrical connection terminal (4) for detachable connection with a processing device;
the first probe (2) and the second probe (3) are respectively and electrically connected with the electric terminal (4) through respective leads.
6. An impedance detecting apparatus, comprising: -a mounting frame (5), a driving member (6), a product fixture (7) and an impedance detection probe according to any one of claims 1 to 5;
the driving piece (6), the product jig (7) and the impedance detection probe are correspondingly and respectively arranged on the mounting frame (5);
the product jig (7) is used for bearing a product to be tested;
the impedance detection probes are arranged in a plurality and respectively correspond to the to-be-detected points in the to-be-detected product one by one;
the driving piece (6) is in transmission connection with a plurality of impedance detection probes, and can drive the impedance detection probes to synchronously move and squeeze towards the product jig (7).
7. Impedance detection device according to claim 6, characterized in that the impedance detection device further comprises a data processing module (8);
the data processing module (8) is respectively and electrically connected with the plurality of impedance detection probes and is used for receiving and processing detection information of the impedance detection probes.
8. The impedance detection device according to claim 7, characterized in that the impedance detection device is also movably arranged on the mounting frame (5) and is in transmission connection with the lifting plate (9) of the driving member (6);
the data processing module (8) and the impedance detection probe are respectively arranged on one side of the lifting plate (9) opposite to the product jig (7).
9. Impedance detection device according to claim 8, wherein the mounting frame (5) comprises an upper support plate (51), a lower support plate (52), and a guide shaft (53) connecting the two in the direction of its thickness;
the driving piece (6) is arranged at one side of the upper supporting plate (51) opposite to the lower supporting plate (52);
one side;
the lifting plate (9) is movably sleeved on the guide shaft (53).
10. The impedance detection device according to claim 9, wherein a guiding hole is further formed in the lifting plate (9), and a guiding shaft sleeve (91) is disposed in the guiding hole;
the lifting plate (9) is movably sleeved on the guide shaft (53) through the guide shaft sleeve (91).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202310778425.4A CN116840515A (en) | 2023-06-28 | 2023-06-28 | Impedance detection probe and impedance detection device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202310778425.4A CN116840515A (en) | 2023-06-28 | 2023-06-28 | Impedance detection probe and impedance detection device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN116840515A true CN116840515A (en) | 2023-10-03 |
Family
ID=88173727
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202310778425.4A Pending CN116840515A (en) | 2023-06-28 | 2023-06-28 | Impedance detection probe and impedance detection device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN116840515A (en) |
-
2023
- 2023-06-28 CN CN202310778425.4A patent/CN116840515A/en active Pending
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN111504243B (en) | Detection device and detection method suitable for detecting terminal assembly depth of cable connector | |
| CN111637810B (en) | Quick change device for thread connection and disconnection detection equipment | |
| US6130547A (en) | Test apparatus for printed circuit board and assembly kit therefor | |
| CN116840515A (en) | Impedance detection probe and impedance detection device | |
| CN211123220U (en) | Flat cable testing device | |
| CN213364974U (en) | Test tool fixture for detecting PCBA circuit | |
| CN115508233A (en) | FPC (Flexible printed Circuit) bending life and electrical performance detection device | |
| CN212965014U (en) | ICT test auxiliary jig | |
| EP4050740A1 (en) | Automatic insertion and removal device for connector, automatic insertion method, automatic removal method, and computer-readable storage medium | |
| CN114487508A (en) | Detection equipment for ejector pin of function test fixture | |
| CN114460338A (en) | Rotary probe contact module | |
| CN110567348B (en) | Device and method for detecting gap of automobile transmission shaft assembly | |
| CN210037149U (en) | Optical fiber line loss detection device | |
| CN210269895U (en) | Magnetic-sensing speed measurement sensor based on Hall effect | |
| US6164982A (en) | IC socket for holding IC having multiple parallel pins | |
| CN111257737A (en) | Circuit board testing equipment | |
| CN117471554A (en) | Glue overflow detecting device | |
| CN214537665U (en) | Bush detection device | |
| CN113922182B (en) | Board-end connector assembly testing machine | |
| JP2887195B2 (en) | measuring device | |
| CN220829540U (en) | Comprehensive tester for power line | |
| CN210089656U (en) | Probe assembly and PCB detection device with same | |
| CN211401034U (en) | FFC winding displacement thickness recognition device | |
| CN220690772U (en) | Detection device for paint drawing test | |
| CN220542119U (en) | Instrument test board |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination |