CN116819418A - Detection device for IC chip test seat - Google Patents
Detection device for IC chip test seat Download PDFInfo
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- CN116819418A CN116819418A CN202310852373.0A CN202310852373A CN116819418A CN 116819418 A CN116819418 A CN 116819418A CN 202310852373 A CN202310852373 A CN 202310852373A CN 116819418 A CN116819418 A CN 116819418A
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- 238000012360 testing method Methods 0.000 title claims abstract description 216
- 238000001514 detection method Methods 0.000 title claims abstract description 46
- 230000007246 mechanism Effects 0.000 claims abstract description 65
- 238000012545 processing Methods 0.000 claims abstract description 15
- 230000005540 biological transmission Effects 0.000 claims abstract description 8
- 230000002457 bidirectional effect Effects 0.000 claims description 16
- 238000003825 pressing Methods 0.000 claims description 9
- 238000003860 storage Methods 0.000 claims description 9
- 230000033001 locomotion Effects 0.000 claims description 8
- 230000006978 adaptation Effects 0.000 claims description 4
- 230000005611 electricity Effects 0.000 claims 1
- 238000000034 method Methods 0.000 abstract description 7
- 230000008569 process Effects 0.000 abstract description 7
- 239000000463 material Substances 0.000 description 5
- 230000002950 deficient Effects 0.000 description 4
- 230000000694 effects Effects 0.000 description 4
- 238000004519 manufacturing process Methods 0.000 description 4
- 230000008859 change Effects 0.000 description 2
- 238000003780 insertion Methods 0.000 description 2
- 230000037431 insertion Effects 0.000 description 2
- 238000009434 installation Methods 0.000 description 2
- 238000004806 packaging method and process Methods 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000005096 rolling process Methods 0.000 description 1
- 238000012216 screening Methods 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
- 230000001360 synchronised effect Effects 0.000 description 1
- 238000011179 visual inspection Methods 0.000 description 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
- B65G—TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
- B65G15/00—Conveyors having endless load-conveying surfaces, i.e. belts and like continuous members, to which tractive effort is transmitted by means other than endless driving elements of similar configuration
- B65G15/30—Belts or like endless load-carriers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The invention is suitable for the technical field of test seat detection, and provides a detection device for an IC chip test seat, which comprises a bottom plate: and the two conveying mechanisms are respectively arranged at the two ends of the top of the bottom plate and used for conveying the test, and the positioning mechanism is arranged above the conveying mechanism and used for supporting the test seat in an auxiliary manner. This detection device for IC chip test seat, through expanding the test seat and inserting between two test boards, after the supporting seat test seat moved to the proper position in the mounting bracket inner chamber, through adjusting the interval between roof and the fixed plate, detect in the chip inserts the standing groove to the test seat, the stitch inserts through the spread groove and is linked together with the circuit board, when the circuit is linked together, the processing chip on the circuit board processes the back signal and makes the warning light through power supply wire transmission, then detect and pass through, reach the detection demand of carrying out size and normal use to the chip, detect the test seat through continuous type, satisfy and detect more and the function detection demand to the test seat of quantity.
Description
Technical Field
The invention belongs to the technical field of integrated circuit test seat detection, and particularly relates to a detection device for an IC chip test seat.
Background
In order to ensure that the chip meets the requirements of downstream customers, semiconductor testing is performed throughout the entire process of chip production. The test corresponding to the related process is mainly divided into chip design, wafer manufacturing and packaging test, wherein the packaging test comprises burn-in test and electrical test, the burn-in test needs to use a chip test seat, which is also called IC Socket, IC test seat and IC Socket, the test Socket mainly plays a role of connection and conduction for verifying the application function of an integrated circuit, and the test Socket is a static connector between a PCB and an IC, so that the replacement test of the chip is more convenient, and the chip is not required to be repeatedly welded and taken down all the time, thereby reducing the damage of the IC and the PCB and achieving the quick and efficient test effect.
When using an IC test socket to burn-in a semiconductor chip, it is very important to ensure that the chip is mounted correctly, and when mounting the chip into the IC test socket, it is mainly classified into automatic chip loading and manual chip loading, and manual chip loading is very common in a specific use process, and it meets the requirement that a technician is required to manually mount the chip onto the IC test socket in an environment where test requirements are not very severe or equipment is not very complicated.
The testing device is characterized in that the internal contacts and pins of the IC test seat are required to be ensured to be reliably and electrically connected with the placed test chip respectively, the pins are required to be ensured to be normally and electrically connected with a subsequent test circuit board, the test is required to be carried out before the IC test seat leaves a factory, the existing test is generally carried out by visual inspection, whether the pins are vertical or not, whether the contacts are uniformly arranged at intervals and the corresponding test seat size or the data such as the whole size and the pins are detected through calipers, the detection mode is particularly time-consuming, when the number of leaves of the factory is large, a large number of test seats are required to be detected, the surface states of the test seats can only be checked while the requirement of quick detection cannot be met, and whether the test seats are normally used or not cannot be detected.
Disclosure of Invention
The invention provides a detection device for an IC chip test seat, which aims to solve the problems that the test seat cannot be detected quickly, the appearance size of the test seat is simply detected, and whether the test seat can be used normally cannot be obtained.
The invention is realized in such a way that a detection device for an IC chip test seat comprises a bottom plate:
the two conveying mechanisms are respectively arranged at the two ends of the top of the bottom plate and used for conveying the test, and the positioning mechanism is arranged above the conveying mechanism and used for supporting the test seat in an auxiliary manner;
the device comprises a bottom plate, a mounting rack, a top plate, a pressing mechanism, a mounting plate, a detection chip, a detection device and a control device, wherein the mounting rack is arranged at the top of the bottom plate and between two conveying mechanisms, the top plate is arranged at the top of an inner cavity of the mounting rack, the pressing mechanism is arranged at the bottom of the top plate and used for testing whether a contact normally works, the pressing mechanism is arranged at the mounting plate at the bottom of the top plate, and the detection chip is detachably arranged at the bottom of the mounting plate;
the test device comprises a fixing plate arranged at the lower part of an inner cavity of the mounting frame, a test mechanism arranged at the top of the fixing plate, a chain plate conveyor belt arranged at the top of the fixing plate, a circuit board arranged in the inner cavity of the chain plate conveyor belt, a connecting groove arranged on the circuit board and used for inserting a pin of a test seat, a processing chip arranged on the circuit board, a storage chip arranged on the circuit board, and a power supply module arranged on the circuit board, wherein the processing chip and the storage chip are electrically connected to achieve the purpose of signal receiving;
the inner cavity of the mounting frame is provided with an adjusting mechanism for driving the pressing mechanism and the testing mechanism to move.
Preferably, the conveying mechanism comprises a fixing frame arranged at one end of the top of the bottom plate, the fixing frame is concave, a chain plate conveying belt is arranged in an inner cavity of the fixing frame, a plurality of supporting seats are uniformly arranged on the surface of the chain plate conveying belt at intervals, and a friction layer is arranged at the top end of each supporting seat.
Preferably, the positioning mechanism comprises two test boards respectively arranged on two sides of the top of the fixing frame, the bottoms of the test boards are respectively fixedly connected with the tops of the two fixing frames, an auxiliary wheel for supporting and assisting movement of the test seat is arranged on the inner wall surface of the mounting groove, the mounting groove is formed in the inner side surface of the test board, the test boards are C-shaped through the mounting groove, and the two test boards are arranged in a mirror image mode.
Preferably, the bottom of the top plate is rotatably and transversely provided with a screw rod, the surface of the screw rod is provided with a screw rod sleeve, the bottom of the screw rod sleeve is fixedly connected with the top of the mounting plate, and the surface of the screw rod sleeve is in sliding connection with the bottom of the top plate.
Preferably, the adjusting mechanism comprises a bidirectional threaded rod which is rotatably and vertically arranged at two ends of the top of the inner wall surface of the mounting frame, threads at two ends of the surface of the bidirectional threaded rod are opposite, a threaded block is arranged at the top end of the surface of the bidirectional threaded rod, two ends of the top plate are fixedly connected with the surfaces of the threaded block respectively, a threaded sleeve is arranged at the bottom end of the surface of the bidirectional threaded rod, and two threaded sleeves are fixedly connected with two ends of the fixing plate respectively.
Preferably, the surface of the mounting frame is provided with a prompt lamp, the fixed frame is provided with a power supply wire electrically connected with the prompt lamp, and the fixed frame is provided with a transmission wire connected with the server
Preferably, two the top of two-way threaded rod surfaces all is provided with the belt pulley, and two the belt pulley passes through belt drive and connects, one end the top of two-way threaded rod runs through to the top of mounting bracket, the top of mounting bracket is provided with the drive two-way threaded rod pivoted servo motor.
Preferably, the rear end of bottom plate is provided with the brace table, the top of brace table seted up with the discharge gate of test seat looks adaptation, the bottom of brace table rotationally is provided with and is used for right the shutoff board of discharge gate shutoff, the top slidable of brace table is provided with the pushing plate, the front side of test plate rear end is provided with the curb plate, the top of curb plate is provided with the top and is open receipts workbin.
Preferably, an electric sliding rail is arranged on the outer side surface of the supporting table, a connecting block is arranged on the driving part of the electric sliding rail, a connecting plate is arranged at the top of the connecting block, and the other end of the connecting plate is connected with the surface of the pushing plate.
Preferably, the bottom of brace table rotationally is provided with the dwang, the bottom of brace table is provided with the driving motor who is used for driving dwang pivoted, the surface of dwang is provided with the accessory plate, the shape of accessory plate be L shape and the bottom with the fixed surface of shutoff board is connected.
Advantageous effects
Compared with the prior art, the invention has the beneficial effects that: the invention relates to a detection device for an IC chip test seat, which comprises:
(1) The test seat is unfolded and inserted between the two test boards, the distance between the two test boards is the width of the test seat, the supporting seat is in contact with the bottom of the test seat, after the test seat moves to a proper position in the inner cavity of the mounting frame, the test chips are respectively inserted into the placing grooves of the test seat by adjusting the distance between the top plate and the fixing plate, pins are inserted into the placing grooves of the test seat and are communicated with the circuit board through the connecting grooves, when the circuit is communicated, the processing chips on the circuit board process signals, after the processing chips, to enable the prompt lamps to be lightened through power supply wire transmission, then the detection is carried out, the detection requirements on the size and normal use of the chips are met, the test seats are continuously detected, the detection quantity is more, and the function detection requirements on the test seats are met.
(2) When the prompt lamp is not lightened to test that the representative test seat is defective, the test seat after detection is moved to the rear end supporting seat, the test seat after detection is conveyed to the supporting table through the rear end supporting seat, the test seat which is qualified in detection is dropped and collected through the discharge hole, the test seat which is unqualified in detection is rotated by the rotating rod to enable the auxiliary plate to drive the plugging plate to plug the discharge hole, the electric sliding rail drives the connecting block to move, the connecting plate drives the pushing plate to move, the unqualified test seat is collected into the inner cavity of the material receiving box, the test seats which are qualified and unqualified in detection are classified, manual screening is not needed, and the working efficiency is improved.
(3) The position of the screw rod sleeve can be adjusted left and right through forward or reverse rotation of the screw rod, so that the position of the detection chip is adjusted, the detection chip is detachably connected with the mounting plate, the test seats of different types can be adapted, and the detection requirements of different test seats are met.
Drawings
FIG. 1 is a schematic cross-sectional side view of the present invention;
FIG. 2 is a schematic top cross-sectional view of the structure of the present invention;
FIG. 3 is a schematic side view of the plugging, auxiliary and pusher plates of the present invention;
FIG. 4 is an enlarged schematic view of the structure A in FIG. 2 according to the present invention;
FIG. 5 is a schematic view of a discharge port, a pusher plate and a structure of the present invention;
FIG. 6 is a schematic side view of the mounting structure of the present invention.
In the figure: 1. a bottom plate; 2. a fixing frame; 3. an auxiliary plate; 4. a link plate conveyor belt; 5. a support base; 6. a mounting frame; 7. a top plate; 8. a mounting plate; 9. a detection chip; 10. a fixing plate; 11. a fixed frame; 12. a circuit board; 13. a connecting groove; 14. a processing chip; 15. storing the chip; 16. a power supply module; 17. a power supply wire; 18. a warning light; 19. a transmission wire; 20. a two-way threaded rod; 21. a screw block; 22. a thread sleeve; 23. an electric slide rail; 24. a screw rod; 25. a screw rod sleeve; 26. an auxiliary wheel; 27. a belt pulley; 28. a connecting block; 29. a connecting plate; 30. a pushing plate; 31. a rotating lever; 32. an auxiliary plate; 33. a plugging plate; 34. a side plate; 35. a material receiving box; 36. a discharge port; 37. a driving motor; 38. a servo motor; 39. and a support table.
Description of the embodiments
The present invention will be described in further detail with reference to the drawings and examples, in order to make the objects, technical solutions and advantages of the present invention more apparent. It should be understood that the specific embodiments described herein are for purposes of illustration only and are not intended to limit the scope of the invention.
Referring to fig. 1-3, the present invention provides a technical solution: a detection device for IC chip test seat comprises a bottom plate 1: two conveying mechanisms which are respectively arranged at the two ends of the top of the bottom plate 1 and used for conveying the test are arranged above the conveying mechanisms and used for supporting the test seat in an auxiliary manner.
When detecting the test seat, two conveying mechanisms are respectively arranged at the front end and the rear end of the top of the bottom plate 1, a certain distance exists between the two conveying mechanisms for placing the space of the subsequent installation frame 6, meanwhile, the positioning mechanism is arranged above the conveying mechanisms, the bottom of the positioning mechanism is fixedly connected with the top of the rack of the conveying mechanism, the positioning mechanism is used for carrying out auxiliary conveying on the test seat, when the test seat is arranged between the front end conveying mechanism and the two conveying mechanisms, the positioning mechanism can support the test seat, and the test seat is prevented from falling and the subsequent processing flow is ensured.
The mounting frame 6 is arranged at the top of the bottom plate 1 and between the two conveying mechanisms, the top plate 7 is arranged at the top of the inner cavity of the fixing frame 2, the bottom of the top plate 7 is provided with a pressing mechanism for testing whether the contact works normally, the pressing mechanism is arranged at the mounting plate 8 at the bottom of the top plate 7, and the detection chip 9 is detachably arranged at the bottom of the mounting plate 8;
the mounting frame 6 is arranged between the two conveying mechanisms, through holes for the test seats to enter and exit are formed in the front side and the rear side of the surface of the mounting frame 6, the test seats are guaranteed to normally enter the inner cavity of the mounting frame 6, the test seats are processed through the pushing mechanism, a certain distance exists between the two conveying mechanisms, after the test seats after detection through the pushing mechanism are completed, the undetected test seats are conveyed forwards through the conveying mechanism at the front end, and then the test seats detected through the pushing mechanism are pushed to move towards the conveying mechanism at the rear end.
The mounting panel 8 can slide along the bottom horizontal direction of roof 7, and the standing groove of chip is correspondingly placed to the convenient different specifications of follow-up change of specific user demand, and then guarantees the test seat of adaptation different specifications and size, satisfies different user demands, detects chip 9 detachably and locates the bottom of mounting panel 8 simultaneously, detects the chip of chip 9 and is standard chip, can normal use guarantee the demand of circular telegram test, detects chip 9 accessible bolt and mounting panel 8's bottom and is connected, according to specific user demand selectivity dismantles the change.
The test device comprises a fixing plate 10 arranged at the lower part of the inner cavity of a mounting frame 6, a test mechanism arranged at the top of the fixing plate 10, a test mechanism used for testing whether pins normally work, the test mechanism comprises a chain plate conveyor belt 4 arranged at the top of the fixing plate 10, a circuit board 12 arranged at the inner cavity of the chain plate conveyor belt 4, a connecting groove 13 arranged on the circuit board 12 and used for inserting the pins of the test seat, a processing chip 14 arranged on the circuit board 12, a storage chip 15 arranged on the circuit board 12, a power supply module 16 arranged on the circuit board 12, wherein the processing chip 14 and the storage chip 15 are electrically connected to achieve the purpose of signal receiving;
the fixed plate 10 can be selectively moved upwards or downwards according to specific use requirements, and then the connecting groove 13 arranged on the testing mechanism is connected with pins at the bottom of the testing seat at corresponding positions, meanwhile, the detection chip 9 is inserted into a placing groove in the testing seat and is contacted with contacts in the testing seat, when the testing seat cannot be used normally or the contacted voltage contacts are problematic, the processing chip 14 processes signals, the storage chip 15 processes and stores received signals, and the time is correspondingly classified and stored, so that the detection of the specific production line is facilitated, the subsequent maintenance is facilitated, the power supply module 16 provides power support for the circuit board 12, and the normal use of the processing chip 14 and the storage chip 15 is ensured.
The inner cavity of the mounting frame 6 is provided with an adjusting mechanism for driving the pressing mechanism and the testing mechanism to move.
Whether the corresponding function can be normally used to the test seat at the designated position or not can be detected through the adjusting mechanism, and the subsequent use effect is ensured.
Further, a prompt lamp 18 is arranged on the surface of the mounting frame 6, a power supply wire 17 electrically connected with the prompt lamp 18 is arranged on the fixed frame 11, and a transmission wire 19 connected with the server is arranged on the fixed frame 11.
In this embodiment, when the pins on the detection chip 9 and the test seat are inserted into the connection slot 13 on the fixed frame 11 to be electrically connected, the processing chip 14 sends a control signal to control the indicator lamp 18 to be turned on by the power supply wire 17, when the indicator lamp 18 is turned on, the indicator lamp 18 indicates that the test seat is normally used, when the indicator lamp 18 cannot be turned on, the indicator lamp indicates that the test seat cannot normally work, whether the test seat is normally used is rapidly obtained, the corresponding data stored by the storage chip 15 is sent to the server through the transmission wire 19, the data is visually stored through the server, the subsequent detection of the corresponding date and time period is facilitated, the specific production line is conveniently queried, and the subsequent adjustment is facilitated.
Further, conveying mechanism is including locating the mount 2 of bottom plate 1 top one end, and the shape of mount 2 is the character of 'kou' shape, and the inner chamber of mount 2 is provided with link joint conveyer belt 4, and the even interval in surface of link joint conveyer belt 4 is provided with a plurality of supporting seat 5, and the top of supporting seat 5 is provided with the friction layer.
In this embodiment, the shape of mount 2 is the concave shape, and link joint conveyer belt 4 sets up in the mount 2 inner chamber and its through electric drive and then makes link joint conveyer belt 4 rotate, and then guarantees that link joint conveyer belt 4 will place the test seat of its surface and carry, and supporting seat 5 is contacted with the bottom of test seat simultaneously, supports the test seat and lifts, guarantees that the stitch of test seat can not be direct with the surface of link joint conveyer belt 4 contact, simultaneously through the frictional layer that the supporting seat 5 top set up, guarantees frictional force and conveying effect.
Further, positioning mechanism includes two test boards 3 of locating mount 2 top both sides respectively, and the bottom of test board 3 is provided with the auxiliary wheel 26 that is used for supporting and auxiliary movement to the test seat with the top fixed connection of two mounts 2 respectively, the medial surface of test board 3 has seted up the mounting groove, and makes the shape of test board 3 be the C font through the mounting groove, and the shape mirror image of two test boards 3 sets up.
In this embodiment, two test boards 3 form the C font through the mounting groove respectively, but two C font test boards 3 are the mirror image setting, and then guarantee the demand of normal use, test board 3 sets up to the rear end direction along the front end of bottom plate 1, two test boards 3 set up the both sides at mount 2 top respectively, and the bottom of test board 3 respectively with the mount 2 top fixed connection of front end and rear end, and the width when the test seat is flat to be lain is satisfied to the distance between two test boards 3, and fix a position the both sides of test seat respectively through two mounting groove grooves.
The two test boards 3 can be detachably connected with the surface of the fixing frame 2 through bolts, so that the test boards 3 can be selectively replaced according to specific use requirements, and the distance between the two test boards 3 is adjusted, so that the test seats with different widths and sizes can be adapted.
The top, the bottom and the inner side of the inner wall surface of the mounting groove are respectively provided with rollers for assisting the rolling of the test seat, so that the normal conveying of the test seat is guaranteed, and meanwhile, when the width of the test seat is large and the standard width of the test seat is not matched with the standard width of the test seat, the test seat cannot be put into between the two test boards 3 and conveyed through the conveying mechanism.
Further, the bottom of the top plate 7 is rotatably and transversely provided with a screw rod 24, the surface of the screw rod 24 is provided with a screw rod sleeve 25, the bottom of the screw rod sleeve 25 is fixedly connected with the top of the mounting plate 8, and the surface of the screw rod sleeve 25 is in sliding connection with the bottom of the top plate 7.
In this embodiment, the bottom of roof 7 is provided with the installation piece that is used for installing lead screw 24, and then satisfies the forward or reverse rotation demand of lead screw 24, through forward or reverse rotation lead screw 24, makes the lead screw cover 25 of its surface along the length of lead screw 24 to one end or the other end direction motion, and then adjusts the position of mounting panel 8 to adjust the position of detecting chip 9, make its different demands of standing groove on the multiple test seat of adaptation, satisfy the test seat demand of different specifications.
Further, adjustment mechanism is including rotationally vertical setting in the two-way threaded rod 20 at mounting bracket 6 internal face top both ends, and the screw thread at two ends is opposite on two-way threaded rod 20 surface, and the top on two-way threaded rod 20 surface is provided with screw thread piece 21, and the both ends of roof 7 respectively with two screw thread piece 21 fixed surface connection, the bottom on two-way threaded rod 20 surface is provided with thread bush 22, two thread bushes 22 respectively with the both ends fixed connection of fixed plate 10.
In this embodiment, two bidirectional threaded rods 20 are provided, and the two bidirectional threaded rods 20 rotate forward or backward synchronously, and because the threaded blocks 21 and the threaded sleeves 22 are respectively arranged at the top end and the bottom end of the bidirectional threaded rods 20, and because the threads at the top end and the bottom end of the bidirectional threaded rods 20 are opposite, the mutual approaching or mutual separating of the threaded blocks 21 and the threaded sleeves 22 can be satisfied, and meanwhile, the movement ranges of the threaded blocks 21 and the threaded sleeves 22 need to satisfy the insertion of the detection chip 9 into the corresponding test seat placing groove, and meanwhile, the connecting grooves 13 on the fixing frame 11 enable pins at the bottom of the test seat to be inserted.
Further, the belt pulleys 27 are arranged at the top ends of the surfaces of the two bidirectional threaded rods 20, the two belt pulleys 27 are connected through belt transmission, the top end of one bidirectional threaded rod 20 penetrates through the top of the mounting frame 6, and a servo motor 38 for driving the bidirectional threaded rod 20 to rotate is arranged at the top of the mounting frame 6.
In this embodiment, when the servo motor 38 drives the bi-directional threaded rod 20 connected to the output shaft thereof to rotate forward or backward, the two bi-directional threaded rods 20 are further rotated synchronously, so that the two threaded blocks 21 and the two threaded sleeves 22 move synchronously, thereby ensuring the movement requirements of the fixing plate 10 and the top plate 7, and the two threaded blocks 21 and the two threaded sleeves 22 are respectively connected with the inner wall surface of the mounting frame 6 in a sliding manner.
Further, the rear end of the bottom plate 1 is provided with a supporting table 39, a discharge hole 36 matched with the test seat is formed in the top of the supporting table 39, a plugging plate 33 for plugging the discharge hole 36 is rotatably arranged at the bottom of the supporting table 39, a pushing plate 30 is slidably arranged at the top of the supporting table 39, a side plate 34 is arranged at the front side of the rear end of the test plate 3, and a material receiving box 35 with an open top is arranged at the top of the side plate 34.
In this embodiment, the bottom end of the bottom plate 1 may be provided with a conveyor belt corresponding to the supporting table 39, so that the test seat normally used after the test is completed moves onto the conveyor belt through the discharge hole 36, and the test seat after the normal use detection is conveyed through the conveyor belt.
And detect the test seat that does not accord with unable normal use, then block up the discharge gate 36 through shutoff board 33, after unqualified test seat moves to shutoff board 33, make it collect in the inner chamber of receiving box 35 through the promotion of pushing away flitch 30, and then reach the collection demand to the defective goods.
Further, a rotating rod 31 is rotatably disposed at the bottom of the supporting table 39, a driving motor 37 for driving the rotating rod 31 to rotate is disposed at the bottom of the supporting table 39, an auxiliary plate 32 is disposed on the surface of the rotating rod 31, the auxiliary plate 32 is L-shaped, and the bottom end of the auxiliary plate 32 is fixedly connected with the surface of the plugging plate 33.
In this embodiment, the rotating rod 31 can rotate forward or backward, so that the auxiliary plate 32 drives the plugging plate 33 to plug or cancel the plugging of the discharge port 36, and the L-shaped auxiliary plate 32 meets the movement requirement of the plugging plate 33, and the rotating rod 31 is driven to rotate by the driving motor 37.
Further, an electric slide rail 23 is provided on the outer side surface of the support table 39, a connecting block 28 is provided on the driving part of the electric slide rail 23, a connecting plate 29 is provided on the top of the connecting block 28, and the other end of the connecting plate 29 is connected with the surface of the pushing plate 30.
In this embodiment, the sliding part of the electric slide rail 23 drives the connecting block 28 to move along the surface of the electric slide rail 23, the connecting plate 29 drives the pushing plate 30 to move, and the defective product test seat on the supporting table 39 is pushed into the material receiving box 35 for collection.
The working principle and the using flow of the invention are as follows: after the invention is installed, the test seat is unfolded and inserted between the two test boards 3, the distance between the two test boards 3 is the width of the test seat for detection, the supporting seat 5 on the chain plate conveyor belt 4 is contacted with the bottom of the test seat, the test seat is supported and protected from the contact of the surface of the chain plate conveyor belt 4, after the test seat is moved to a proper position in the inner cavity of the mounting frame 6 by the movement of the front end chain plate conveyor belt 4, the thread blocks 21 and the thread sleeves 22 are mutually close by the synchronous forward rotation of the two bidirectional threaded rods 20, the distance between the top plate 7 and the fixed plate 10 is further adjusted, the detection chips 9 are respectively inserted into the placing grooves of the test seat, the pins are communicated with the circuit board 12 by the insertion grooves 13, the processed signals on the circuit board 12 are transmitted by the power supply lead 17 to enable the indicator lamp 18 to be lightened after the processing chips 14, and when the indicator lamp 18 is lightened, the indicator lamp 18 shows that the test seat fails the test.
When the prompt lamp 18 is not lightened to indicate that the test seat is defective, the chain plate conveyor belt 4 at the front end conveys the test seat to be detected into the inner cavity of the mounting frame 6, the test seat to be detected pushes the test seat to be detected to move onto the rear end supporting seat 5, the test seat to be detected is conveyed onto the supporting table 39 through the rear end supporting seat 5, the test seat to be detected is dropped and collected through the discharge hole 36, the auxiliary plate 32 drives the plugging plate 33 to plug the discharge hole 36 through the rotation of the rotating rod 31, and the electric sliding rail 23 drives the connecting block 28 to move so that the connecting plate 29 drives the pushing plate 30 to move, so that the test seat to be detected is collected into the inner cavity of the material receiving box 35.
The position of the screw rod sleeve 25 can be adjusted left and right through forward or reverse rotation of the screw rod 24, so that the position of the detection chip 9 is adjusted, the detection chip 9 is detachably connected with the mounting plate 8, the test seats of different types can be adapted, and the detection requirements of different test seats can be met.
The foregoing description of the preferred embodiments of the invention is not intended to be limiting, but rather is intended to cover all modifications, equivalents, and alternatives falling within the spirit and principles of the invention.
Claims (10)
1. The utility model provides a detection device for IC chip test seat which characterized in that: comprises a bottom plate (1):
two conveying mechanisms which are respectively arranged at two ends of the top of the bottom plate (1) and used for conveying tests, and a positioning mechanism which is arranged above the conveying mechanisms and used for supporting the test seat in an auxiliary way;
the device comprises a mounting frame (6) arranged at the top of a bottom plate (1) and positioned between two conveying mechanisms, a top plate (7) arranged at the top of an inner cavity of the mounting frame (2), a pressing mechanism arranged at the bottom of the top plate (7) and used for testing whether contacts work normally, a mounting plate (8) arranged at the bottom of the top plate (7) and a detection chip (9) detachably arranged at the bottom of the mounting plate (8);
the test device comprises a fixing plate (10) arranged at the lower part of an inner cavity of a mounting frame (6), a test mechanism arranged at the top of the fixing plate (10), a test mechanism used for testing whether pins work normally or not, the test mechanism comprises a chain plate conveying belt (4) arranged at the top of the fixing plate (10), a circuit board (12) arranged in the inner cavity of the chain plate conveying belt (4), a connecting groove (13) arranged on the circuit board (12) and used for inserting pins of a test seat, a processing chip (14) arranged on the circuit board (12), a storage chip (15) arranged on the circuit board (12), and a power supply module (16) arranged on the circuit board (12) and used for achieving the purpose of signal receiving through electric connection of the processing chip (14) and the storage chip (15);
the inner cavity of the mounting frame (6) is provided with an adjusting mechanism for driving the pressing mechanism and the testing mechanism to move.
2. The IC chip test socket testing apparatus according to claim 1, wherein: the conveying mechanism comprises a fixing frame (2) arranged at one end of the top of the bottom plate (1), the fixing frame (2) is concave, a chain plate conveying belt (4) is arranged in an inner cavity of the fixing frame (2), a plurality of supporting seats (5) are uniformly arranged on the surface of the chain plate conveying belt (4) at intervals, and friction layers are arranged on the top ends of the supporting seats (5).
3. The IC chip test socket testing apparatus according to claim 1, wherein: the positioning mechanism comprises two test boards (3) which are respectively arranged on two sides of the top of the fixing frame (2), the bottoms of the test boards (3) are respectively fixedly connected with the tops of the two fixing frames (2), an auxiliary wheel (26) which is used for supporting and assisting movement of a test seat is arranged on the inner wall surface of the mounting groove, the inner side surface of the test board (3) is provided with the mounting groove, and the test boards (3) are C-shaped through the mounting groove, and the two test boards (3) are arranged in a mirror image mode.
4. The IC chip test socket testing apparatus according to claim 1, wherein: the bottom of roof (7) rotationally transversely is provided with lead screw (24), the surface of lead screw (24) is provided with screw sleeve (25), the bottom of screw sleeve (25) with the top fixed connection of mounting panel (8), the surface of screw sleeve (25) with the bottom sliding connection of roof (7).
5. The IC chip test socket testing apparatus according to claim 1, wherein: the adjusting mechanism comprises a bidirectional threaded rod (20) which is vertically arranged at two ends of the top of the inner wall surface of the mounting frame (6) in a rotatable mode, threads at two ends of the surface of the bidirectional threaded rod (20) are opposite, a threaded block (21) is arranged at the top end of the surface of the bidirectional threaded rod (20), two ends of the top plate (7) are fixedly connected with the surfaces of the threaded block (21) respectively, a threaded sleeve (22) is arranged at the bottom end of the surface of the bidirectional threaded rod (20), and two threaded sleeves (22) are fixedly connected with two ends of the fixing plate (10) respectively.
6. The IC chip test socket testing apparatus according to claim 1, wherein: the surface of mounting bracket (6) is provided with warning light (18), be equipped with on fixed frame (11) with power supply wire (17) that warning light (18) electricity is connected, be equipped with transmission wire (19) that are connected with the server on fixed frame (11).
7. The IC chip test socket testing apparatus according to claim 5, wherein: two the top on two-way threaded rod (20) surface all is provided with belt pulley (27), two belt pulley (27) are connected through belt drive, one end the top of two-way threaded rod (20) runs through to the top of mounting bracket (6), the top of mounting bracket (6) is provided with the drive two-way threaded rod (20) pivoted servo motor (38).
8. The IC chip test socket testing apparatus according to claim 1, wherein: the rear end of bottom plate (1) is provided with supporting bench (39), discharge gate (36) with test seat looks adaptation have been seted up at the top of supporting bench (39), the bottom of supporting bench (39) rotationally is provided with and is used for right shutoff board (33) of discharge gate (36) shutoff, the top slidable of supporting bench (39) is provided with pushing away flitch (30), the front side of test board (3) rear end is provided with curb plate (34), the top of curb plate (34) is provided with top for uncovered receipts workbin (35).
9. The IC chip test socket testing apparatus according to claim 8, wherein: the supporting table is characterized in that an electric sliding rail (23) is arranged on the outer side face of the supporting table (39), a connecting block (28) is arranged on a driving part of the electric sliding rail (23), a connecting plate (29) is arranged at the top of the connecting block (28), and the other end of the connecting plate (29) is connected with the surface of the pushing plate (30).
10. The IC chip test socket testing apparatus according to claim 8, wherein: the bottom of brace table (39) rotationally is provided with dwang (31), the bottom of brace table (39) is provided with driving motor (37) that are used for driving dwang (31) pivoted, the surface of dwang (31) is provided with auxiliary plate (32), the shape of auxiliary plate (32) is L shape and bottom with the fixed surface of shutoff board (33) is connected.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202310852373.0A CN116819418A (en) | 2023-07-12 | 2023-07-12 | Detection device for IC chip test seat |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202310852373.0A CN116819418A (en) | 2023-07-12 | 2023-07-12 | Detection device for IC chip test seat |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN116819418A true CN116819418A (en) | 2023-09-29 |
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ID=88112638
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202310852373.0A Pending CN116819418A (en) | 2023-07-12 | 2023-07-12 | Detection device for IC chip test seat |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN116819418A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117406067A (en) * | 2023-12-11 | 2024-01-16 | 上海捷策创电子科技有限公司 | Pressure detection device and method for chip test seat |
-
2023
- 2023-07-12 CN CN202310852373.0A patent/CN116819418A/en active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117406067A (en) * | 2023-12-11 | 2024-01-16 | 上海捷策创电子科技有限公司 | Pressure detection device and method for chip test seat |
| CN117406067B (en) * | 2023-12-11 | 2024-02-13 | 上海捷策创电子科技有限公司 | Pressure detection device and method for chip test seat |
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