CN116775392A - Chip communication testing method and device, electronic equipment and storage medium - Google Patents
Chip communication testing method and device, electronic equipment and storage medium Download PDFInfo
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- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
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Abstract
The application provides a method and a device for testing chip communication, electronic equipment and a storage medium, wherein the method comprises the following steps: responding to a target setting instruction added on a protocol event interface, and loading a field setting interface corresponding to the target setting instruction; the field setting interface displays a test item field and a test result field corresponding to the target setting instruction; responding to the selected target communication protocol and configuration format on the field setting interface, and converting the test item information added at the test item field according to the configuration format to generate target test data; and transmitting the target test data to a testing machine based on the target communication protocol, acquiring a test result of the chip to be tested generated by the testing machine, converting the test result, and filling the test result into the test result field. The testing efficiency of the chip is improved, so that data among different applications can be transmitted and interacted in a standardized and unified manner, and the utilization rate of the data is improved.
Description
Technical Field
The present application relates to the field of semiconductor testing technologies, and in particular, to a method and apparatus for testing chip communications, an electronic device, and a storage medium.
Background
In the chip test process, the bus protocol is a very important part, and can ensure that different external devices can communicate with the main control, and simultaneously ensure the stability and reliability of communication interaction. The bus protocol can greatly simplify the design and test work of the chip, and can improve the compatibility and maintainability of the chip. In actual use, an application protocol is required in addition to the bus protocol. The application protocol is used for solving the problems of format, semantics and the like in data transmission between different applications. During data communication, different types of data in different formats may need to be transmitted between different applications. If only the communication protocol at the bottom layer is used for data transmission test, the problems of data format mismatch, difficult data analysis and the like exist. Therefore, how to improve the efficiency of the chip communication test and the normalization of the data format becomes a non-trivial technical problem.
Disclosure of Invention
Accordingly, an object of the present application is to provide a method, an apparatus, an electronic device, and a storage medium for testing chip communication, by adding a target setting instruction on a protocol event interface, and converting test item information added in a test item field to generate target test data, and using the target test data to complete a communication test of a chip to be tested, so as to improve the test efficiency of the chip, and enable data between different applications to be transmitted and interacted in a standardized and unified manner, thereby improving the utilization rate of the data.
The embodiment of the application provides a method for testing chip communication, which comprises the following steps:
responding to a target setting instruction added on a protocol event interface, and loading a field setting interface corresponding to the target setting instruction; the field setting interface displays a test item field and a test result field corresponding to the target setting instruction;
responding to the selected target communication protocol and configuration format on the field setting interface, and converting the test item information added at the test item field according to the configuration format to generate target test data;
and transmitting the target test data to a testing machine based on the target communication protocol, acquiring a test result of the chip to be tested generated by the testing machine, converting the test result, and filling the test result into the test result field.
In one possible implementation manner, before loading the field setting interface corresponding to the target setting instruction, the testing method further includes:
responding to a protocol name instruction added on a protocol event interface, and loading a node configuration interface corresponding to the protocol name instruction;
setting a test item field and a test result field corresponding to the target setting instruction in the node configuration interface;
wherein the test item field and the test result field each include a field name, a field type, a field length, a field storage order, a field location, a bit mask of the field, and a data type of the field.
In one possible implementation manner, the generating the target test data in response to the target communication protocol selected on the field setting interface and the configuration format by converting the test item information added at the test item field according to the configuration format includes:
responding to the target communication protocol selected by a user from a plurality of reference communication protocols in a drop-down box on the field setting interface, and setting a serialization format corresponding to the test item field and an inverse serialization format corresponding to the test result field;
and converting the serialization format of the test item information added in the test item field to generate target test data.
In one possible implementation, the test results are converted by:
and converting the test result based on the reverse serialization format corresponding to the test result field, and determining the converted test result.
In one possible implementation manner, after the converting, in response to the target communication protocol and the configuration format selected on the field setting interface, the test item information added at the test item field according to the configuration format, and generating the target test data, the test method further includes:
responding to a save instruction of the target setting instruction on the protocol event interface, and saving the target setting instruction as a bookmark; the bookmark comprises name information of the target setting instruction and description information of the target setting instruction.
In one possible implementation, after the saving the target setting instruction on the response to the protocol event interface, saving the target setting instruction as a bookmark, the test method further includes:
detecting whether the reference test item information for retesting the chip to be tested is consistent with the test item information;
if yes, carrying out communication test on the chip to be tested based on the bookmark;
if not, changing the test item information in the bookmark into the reference test item information, and carrying out communication test on the chip based on the changed bookmark.
In one possible implementation, the reference communication protocol is any one of the following bus protocols:
UART bus protocol, I2C bus protocol, SPI bus protocol, USB bus protocol and PCIE bus protocol.
The embodiment of the application also provides a device for testing chip communication, which comprises:
the loading module is used for responding to the target setting instruction added on the protocol event interface and loading a field setting interface corresponding to the target setting instruction; the field setting interface displays a test item field and a test result field corresponding to the target setting instruction;
the generating module is used for responding to the target communication protocol and the configuration format selected on the field setting interface, converting the test item information added at the test item field according to the configuration format and generating target test data;
the determining module is used for sending the target test data to a testing machine based on the target communication protocol, obtaining a test result of the chip to be tested generated by the testing machine, converting the test result and filling the test result into the test result field.
The embodiment of the application also provides electronic equipment, which comprises: the system comprises a processor, a memory and a bus, wherein the memory stores machine-readable instructions executable by the processor, the processor and the memory communicate through the bus when the electronic device is running, and the machine-readable instructions are executed by the processor to perform the steps of the chip communication test method.
The embodiments of the present application also provide a computer readable storage medium having stored thereon a computer program which, when executed by a processor, performs the steps of a method for testing chip communications as described above.
The embodiment of the application provides a method and a device for testing chip communication, electronic equipment and a storage medium, wherein the method for testing chip communication comprises the following steps: responding to a target setting instruction added on a protocol event interface, and loading a field setting interface corresponding to the target setting instruction; the field setting interface displays a test item field and a test result field corresponding to the target setting instruction; responding to the selected target communication protocol and configuration format on the field setting interface, and converting the test item information added at the test item field according to the configuration format to generate target test data; and transmitting the target test data to a testing machine based on the target communication protocol, acquiring a test result of the chip to be tested generated by the testing machine, converting the test result, and filling the test result into the test result field. The method comprises the steps of adding a target setting instruction on a protocol event interface, converting test item information added in a test item field to generate target test data, completing communication test of a chip to be tested by using the target test data, improving the test efficiency of the chip, enabling data among different applications to be transmitted and interacted in a standardized and unified manner, and improving the utilization rate of the data.
In order to make the above objects, features and advantages of the present application more comprehensible, preferred embodiments accompanied with figures are described in detail below.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings that are needed in the embodiments will be briefly described below, it being understood that the following drawings only illustrate some embodiments of the present application and therefore should not be considered as limiting the scope, and other related drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
FIG. 1 is a flow chart of a method for testing chip communication according to an embodiment of the present application;
FIG. 2 is a schematic diagram of a protocol event interface according to an embodiment of the present application;
FIG. 3 is a schematic diagram of a chip communication testing apparatus according to an embodiment of the present application;
FIG. 4 is a schematic diagram of a chip communication testing apparatus according to an embodiment of the present application;
fig. 5 is a schematic structural diagram of an electronic device according to an embodiment of the present application.
Detailed Description
For the purpose of making the objects, technical solutions and advantages of the embodiments of the present application more apparent, the technical solutions of the embodiments of the present application will be clearly and completely described with reference to the accompanying drawings in the embodiments of the present application, and it should be understood that the drawings in the present application are for the purpose of illustration and description only and are not intended to limit the scope of the present application. In addition, it should be understood that the schematic drawings are not drawn to scale. A flowchart, as used in this disclosure, illustrates operations implemented according to some embodiments of the present application. It should be appreciated that the operations of the flow diagrams may be implemented out of order and that steps without logical context may be performed in reverse order or concurrently. Moreover, one or more other operations may be added to or removed from the flow diagrams by those skilled in the art under the direction of the present disclosure.
In addition, the described embodiments are only some, but not all, embodiments of the application. The components of the embodiments of the present application generally described and illustrated in the figures herein may be arranged and designed in a wide variety of different configurations. Thus, the following detailed description of the embodiments of the application, as presented in the figures, is not intended to limit the scope of the application, as claimed, but is merely representative of selected embodiments of the application. All other embodiments, which can be made by a person skilled in the art based on embodiments of the application without making any inventive effort, fall within the scope of the application.
In order to enable one skilled in the art to utilize the present disclosure, the following embodiments are provided in connection with a particular application scenario, "communication test of a chip", and the generic principles defined herein may be applied to other embodiments and application scenarios without departing from the spirit or scope of the disclosure.
The method, the device, the electronic equipment or the computer readable storage medium can be applied to any scene requiring communication test of the chip, the embodiment of the application does not limit specific application scenes, and any scheme using the method, the device, the electronic equipment and the storage medium for testing chip communication provided by the embodiment of the application is within the protection scope of the application.
First, an application scenario to which the present application is applicable will be described. The application can be applied to the technical field of semiconductor test.
According to research, the bus protocol is a very important part in the chip test process, and can ensure that different external devices can communicate with a master control, and meanwhile, the stability and reliability of communication interaction can be ensured. The bus protocol can greatly simplify the design and test work of the chip, and can improve the compatibility and maintainability of the chip. In actual use, an application protocol is required in addition to the bus protocol. The application protocol is used for solving the problems of format, semantics and the like in data transmission between different applications. During data communication, different types of data in different formats may need to be transmitted between different applications. If only the communication protocol at the bottom layer is used for data transmission test, the problems of data format mismatch, difficult data analysis and the like exist. Therefore, how to improve the efficiency of the chip communication test and the normalization of the data format becomes a non-trivial technical problem.
Based on the above, the embodiment of the application provides a chip communication test method, which adds a target setting instruction on a protocol event interface, converts test item information added in a test item field to generate target test data, and utilizes the target test data to complete the communication test of a chip to be tested, thereby improving the test efficiency of the chip, enabling data among different applications to be transmitted and interacted in a standardized and unified manner, and improving the utilization rate of the data.
Referring to fig. 1, fig. 1 is a flowchart of a method for testing chip communication according to an embodiment of the application. As shown in fig. 1, a test method provided by an embodiment of the present application includes:
s101: responding to a target setting instruction added on a protocol event interface, and loading a field setting interface corresponding to the target setting instruction; and the field setting interface displays a test item field and a test result field corresponding to the target setting instruction.
In the step, the server responds to a target setting instruction added on a protocol event interface by a user, and loads a field setting interface corresponding to the target setting instruction.
The target setting instruction is an instruction for setting an application protocol, for example, in the application protocol, request Message (Request Message) and reply Message (reply Message is result information corresponding to the Request Message) are generally defined by using a specific format and structure. For example, information specifying a specific field, tag, coding scheme, and the like. This ensures unification and specification of data formats and semantics between different applications. In this scenario, the described protocol Message view may set different Request Message and Response Message and customize a field list, including name, type, length, storage order, location, bitmask, data type and data.
The test item field corresponding to the target setting instruction is set for the field corresponding to the request information, and the test result field is set for the field corresponding to the reply information.
In one possible implementation manner, before loading the field setting interface corresponding to the target setting instruction, the testing method further includes:
a: and responding to the protocol name instruction added on the protocol event interface, and loading a node configuration interface corresponding to the protocol name instruction.
Here, the server responds to the protocol name instruction added by the user on the protocol event interface, and loads the node configuration interface corresponding to the protocol name instruction.
The node configuration interface displays the instruction child node, the bookmark child node and the message child node in a tree structure.
B: and setting a test item field and a test result field corresponding to the target setting instruction in the node configuration interface.
Here, the test item field and the test result field corresponding to the target setting instruction are set in the node configuration interface.
Wherein the test item field and the test result field each include a field name, a field type, a field length, a field storage order, a field location, a bit mask of the field, and a data type of the field.
Here, the field name is the meaning of the identification field, as a unique identification of the field; the field types include Char, byte, int, int16, int32, int64; the field length corresponds to the type and is 1, 2, 4 and 8 respectively; the field storage order is the byte sequence order used when storing and transmitting multi-byte data, big Endian and Little Endian, respectively. The field position is the offset of the field relative to the head address and is used for supplementing and occupying the space; the bit mask of the field is that operations such as bit-wise AND, bit-wise OR, bit-wise XOR and the like can be carried out on the data through the bit mask so as to realize operations such as reading, clearing, setting and the like of the bits. The data type of the field contains Constant, range, enum, any, a value is selected or entered depending on the different data type.
For example, a Message Type is added by clicking on a node configuration interface corresponding to a protocol name instruction, a Message child node named DirectReadReqMsgType is defined, and a Field Setup interface will appear by clicking on the Message child node. Inputting the information corresponding to the test item Field and the test result Field, clicking the add button will add to the Field List, and then will dynamically load the defined fields into the protocol event view.
S102: and responding to the selected target communication protocol and the configuration format on the field setting interface, and converting the test item information added at the test item field according to the configuration format to generate target test data.
In the step, the target communication protocol and the configuration format selected on the field setting interface are responded, and the test item information added at the test item field is converted according to the configuration format to generate target test data.
The test item information is test data of the chip to be tested, and the test item information needs to be manually or automatically added at the test item field.
For example, clicking on the add target setting instruction on the protocol name instruction defines a node of the target setting instruction named DirectRead, and selects a predefined test item field and a test result field, clicking on the add target setting instruction causes a Command sub-node to appear, a field setting interface of DirectRead Command to appear, request Serialization in the field setting interface is a parsing format for setting test item information, instrument Preset is a target communication protocol set by a selection instrument, and a unserviceability is a parsing format for setting test results. The Request Message module dynamically loads the test item field corresponding to the selected target setting instruction. The Response Message module dynamically loads the test result field corresponding to the selected target setting instruction.
In one possible implementation manner, the generating the target test data in response to the target communication protocol selected on the field setting interface and the configuration format by converting the test item information added at the test item field according to the configuration format includes:
a: and setting a serialization format corresponding to the test item field and an inverse serialization format corresponding to the test result field in response to the target communication protocol selected by a user from a plurality of reference communication protocols in a drop-down box on the field setting interface.
Here, in response to a target communication protocol selected by a user among a plurality of reference communication protocols in a drop-down box on a field setting interface, a serialization format corresponding to a test item field and an inverse serialization format corresponding to a test result field are set.
Wherein the reference communication protocol is any one of the following bus protocols:
UART bus protocol, I2C bus protocol, SPI bus protocol, USB bus protocol and PCIE bus protocol.
b: and converting the serialization format of the test item information added in the test item field to generate target test data.
Here, the test item information added at the test item field is converted in a serialization format to generate target test data, so that a user can intuitively understand the target test data.
S103: and transmitting the target test data to a testing machine based on the target communication protocol, acquiring a test result of the chip to be tested generated by the testing machine, converting the test result, and filling the test result into the test result field.
In the step, target test data are sent to a testing machine according to a target communication protocol, a test result of a chip to be tested, which is generated by the testing machine, is obtained, and the test result is converted and then is filled into a test result field.
And filling the converted test result into each test result field.
In one possible implementation, the test results are converted by:
and converting the test result based on the reverse serialization format corresponding to the test result field, and determining the converted test result.
Here, the test result is converted according to the reverse serialization format corresponding to the test result field, and the converted test result is determined.
In one possible implementation manner, after the converting, in response to the target communication protocol and the configuration format selected on the field setting interface, the test item information added at the test item field according to the configuration format, and generating the target test data, the test method further includes:
responding to a save instruction of the target setting instruction on the protocol event interface, and saving the target setting instruction as a bookmark; the bookmark comprises name information of the target setting instruction and description information of the target setting instruction.
Here, in response to an instruction of saving the target setting instruction on the protocol event interface by the user, saving the target setting instruction as a bookmark, so that the communication test can be performed on the chip by directly using the target configuration instruction.
The bookmark comprises name information of the target setting instruction and description information of the target setting instruction.
In one possible implementation, after the saving the target setting instruction on the response to the protocol event interface, saving the target setting instruction as a bookmark, the test method further includes:
(1): and detecting whether the reference test item information for retesting the chip to be tested is consistent with the test item information.
Here, it is detected whether the reference test item information for retesting the chip to be tested is identical with the test item information.
(2): if yes, carrying out communication test on the chip to be tested based on the bookmark; if not, changing the test item information in the bookmark into the reference test item information, and carrying out communication test on the chip based on the changed bookmark.
If the communication signals are consistent, the communication test is directly carried out on the chip to be tested according to the bookmark; if not, changing the test item information in the bookmark into reference test item information, and carrying out communication test on the chip according to the changed bookmark without changing other configuration information in the bookmark.
In the scheme, a bookmark function is added, and a user can select to store a set setting instruction as a bookmark so as to use the bookmark for multiple times. In the protocol event view, a user can select and save a currently set setting instruction as a bookmark, wherein the bookmark comprises a name and description information. The user can view and execute the saved events through the bookmark list at any time. Therefore, the user can conveniently manage and repeatedly execute the common test tasks, and the test efficiency and accuracy are improved.
Further, referring to fig. 2, fig. 2 is a schematic diagram of a protocol event interface according to an embodiment of the present application. As shown in fig. 2, request Serialization is a parsing format for setting test item information, instrument Preset is a target communication protocol set by a selection instrument, and Deserialization is a parsing format for setting test results. The Request Message module dynamically loads the test item field corresponding to the selected target setting instruction. The Response Message module dynamically loads the test result field corresponding to the selected target setting instruction. Channel mode is the channel type, channel address is the channel address, serialed Bytes are the target test data, and Received Bytes are the converted test result.
The scheme realizes a friendly GUI interactive interface, so that a user can easily customize an application protocol and accurately control the application protocol, and the efficiency and the accuracy of the test are improved. A variety of data types and formats are supported, including constant, range, enumeration, arbitrary type, etc., to meet the specific needs of data transfer between different applications. And a plurality of bus protocols are supported, including universal bus protocols such as UART, I2C, SPI and the like, and high-speed communication bus protocols such as USB, PCIE and the like, so that different communication requirements are met. And bookmark storage and automatic test scripts are supported, so that a user can manage and repeatedly execute commonly used test tasks conveniently, and the automation degree and efficiency of the test are improved. And the testing work of chip communication function and capability is flexibly, efficiently and automatically completed.
The embodiment of the application provides a method for testing chip communication, which is characterized by comprising the following steps: responding to a target setting instruction added on a protocol event interface, and loading a field setting interface corresponding to the target setting instruction; the field setting interface displays a test item field and a test result field corresponding to the target setting instruction; responding to the selected target communication protocol and configuration format on the field setting interface, and converting the test item information added at the test item field according to the configuration format to generate target test data; and transmitting the target test data to a testing machine based on the target communication protocol, acquiring a test result of the chip to be tested generated by the testing machine, converting the test result, and filling the test result into the test result field. The method comprises the steps of adding a target setting instruction on a protocol event interface, converting test item information added in a test item field to generate target test data, completing communication test of a chip to be tested by using the target test data, improving the test efficiency of the chip, enabling data among different applications to be transmitted and interacted in a standardized and unified manner, and improving the utilization rate of the data.
Referring to fig. 3 and fig. 4, fig. 3 is a schematic structural diagram of a chip communication testing device according to an embodiment of the application; fig. 4 is a schematic structural diagram of a chip communication testing device according to an embodiment of the present application. As shown in fig. 3, the chip communication test apparatus 300 includes:
the loading module 310 is configured to respond to a target setting instruction added on a protocol event interface, and load a field setting interface corresponding to the target setting instruction; the field setting interface displays a test item field and a test result field corresponding to the target setting instruction;
a generating module 320, configured to respond to the target communication protocol and the configuration format selected on the field setting interface, and convert the test item information added at the test item field according to the configuration format, so as to generate target test data;
and the determining module 330 is configured to send the target test data to a testing machine based on the target communication protocol, obtain a test result of the chip to be tested generated by the testing machine, convert the test result, and fill the test result into the test result field.
Further, as shown in fig. 4, the testing apparatus 300 further includes a setting module 340, where the setting module 340 is configured to:
responding to a protocol name instruction added on a protocol event interface, and loading a node configuration interface corresponding to the protocol name instruction;
setting a test item field and a test result field corresponding to the target setting instruction in the node configuration interface;
wherein the test item field and the test result field each include a field name, a field type, a field length, a field storage order, a field location, a bit mask of the field, and a data type of the field.
Further, when the generating module 320 is configured to convert the test item information added at the test item field according to the configuration format and the target communication protocol and the configuration format selected on the field setting interface, and generate the target test data, the generating module 320 is specifically configured to:
responding to the target communication protocol selected by a user from a plurality of reference communication protocols in a drop-down box on the field setting interface, and setting a serialization format corresponding to the test item field and an inverse serialization format corresponding to the test result field;
and converting the serialization format of the test item information added in the test item field to generate target test data.
Further, the determination module 330 converts the test result by:
and converting the test result based on the reverse serialization format corresponding to the test result field, and determining the converted test result.
Further, as shown in FIG. 4, the test apparatus 300 further comprises a bookmark module 350, wherein the bookmark module 350 is configured to:
responding to a save instruction of the target setting instruction on the protocol event interface, and saving the target setting instruction as a bookmark; the bookmark comprises name information of the target setting instruction and description information of the target setting instruction.
Further, the bookmark module 350 is further configured to:
detecting whether the reference test item information for retesting the chip to be tested is consistent with the test item information;
if yes, carrying out communication test on the chip to be tested based on the bookmark;
if not, changing the test item information in the bookmark into the reference test item information, and carrying out communication test on the chip based on the changed bookmark.
The embodiment of the application provides a device for testing chip communication, which comprises: the loading module is used for responding to the target setting instruction added on the protocol event interface and loading a field setting interface corresponding to the target setting instruction; the field setting interface displays a test item field and a test result field corresponding to the target setting instruction; the generating module is used for responding to the target communication protocol and the configuration format selected on the field setting interface, converting the test item information added at the test item field according to the configuration format and generating target test data; the determining module is used for sending the target test data to a testing machine based on the target communication protocol, obtaining a test result of the chip to be tested generated by the testing machine, converting the test result and filling the test result into the test result field. The method comprises the steps of adding a target setting instruction on a protocol event interface, converting test item information added in a test item field to generate target test data, completing communication test of a chip to be tested by using the target test data, improving the test efficiency of the chip, enabling data among different applications to be transmitted and interacted in a standardized and unified manner, and improving the utilization rate of the data.
Referring to fig. 5, fig. 5 is a schematic structural diagram of an electronic device according to an embodiment of the application. As shown in fig. 5, the electronic device 500 includes a processor 510, a memory 520, and a bus 530.
The memory 520 stores machine-readable instructions executable by the processor 510, and when the electronic device 500 is running, the processor 510 communicates with the memory 520 through the bus 530, and when the machine-readable instructions are executed by the processor 510, the steps of the method for testing chip communications in the method embodiment shown in fig. 1 can be executed, and detailed description thereof will be omitted.
The embodiment of the present application further provides a computer readable storage medium, where a computer program is stored, and when the computer program is executed by a processor, the steps of the method for testing chip communications in the method embodiment shown in fig. 1 may be executed, and a specific implementation manner may refer to the method embodiment and will not be described herein.
It will be clear to those skilled in the art that, for convenience and brevity of description, specific working procedures of the above-described systems, apparatuses and units may refer to corresponding procedures in the foregoing method embodiments, and are not repeated herein.
In the several embodiments provided by the present application, it should be understood that the disclosed systems, devices, and methods may be implemented in other manners. The above-described apparatus embodiments are merely illustrative, for example, the division of the units is merely a logical function division, and there may be other manners of division in actual implementation, and for example, multiple units or components may be combined or integrated into another system, or some features may be omitted, or not performed. Alternatively, the coupling or direct coupling or communication connection shown or discussed with each other may be through some communication interface, device or unit indirect coupling or communication connection, which may be in electrical, mechanical or other form.
The units described as separate units may or may not be physically separate, and units shown as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the solution of this embodiment.
In addition, each functional unit in the embodiments of the present application may be integrated in one processing unit, or each unit may exist alone physically, or two or more units may be integrated in one unit.
The functions, if implemented in the form of software functional units and sold or used as a stand-alone product, may be stored in a non-volatile computer readable storage medium executable by a processor. Based on this understanding, the technical solution of the present application may be embodied essentially or in a part contributing to the prior art or in a part of the technical solution, in the form of a software product stored in a storage medium, comprising several instructions for causing a computer device (which may be a personal computer, a server, a network device, etc.) to perform all or part of the steps of the method according to the embodiments of the present application. And the aforementioned storage medium includes: a U-disk, a removable hard disk, a Read-Only Memory (ROM), a random access Memory (Random Access Memory, RAM), a magnetic disk, or an optical disk, or other various media capable of storing program codes.
Finally, it should be noted that: the above examples are only specific embodiments of the present application, and are not intended to limit the scope of the present application, but it should be understood by those skilled in the art that the present application is not limited thereto, and that the present application is described in detail with reference to the foregoing examples: any person skilled in the art may modify or easily conceive of the technical solution described in the foregoing embodiments, or perform equivalent substitution of some of the technical features, while remaining within the technical scope of the present disclosure; such modifications, changes or substitutions do not depart from the spirit and scope of the technical solutions of the embodiments of the present application, and are intended to be included in the scope of the present application. Therefore, the protection scope of the application is subject to the protection scope of the claims.
Claims (10)
1. A method for testing chip communications, the method comprising:
responding to a target setting instruction added on a protocol event interface, and loading a field setting interface corresponding to the target setting instruction; the field setting interface displays a test item field and a test result field corresponding to the target setting instruction;
responding to the selected target communication protocol and configuration format on the field setting interface, and converting the test item information added at the test item field according to the configuration format to generate target test data;
and transmitting the target test data to a testing machine based on the target communication protocol, acquiring a test result of the chip to be tested generated by the testing machine, converting the test result, and filling the test result into the test result field.
2. The test method of claim 1, wherein prior to loading a field setting interface corresponding to a target setting instruction added to the response protocol event interface, the test method further comprises:
responding to a protocol name instruction added on a protocol event interface, and loading a node configuration interface corresponding to the protocol name instruction;
setting a test item field and a test result field corresponding to the target setting instruction in the node configuration interface;
wherein the test item field and the test result field each include a field name, a field type, a field length, a field storage order, a field location, a bit mask of the field, and a data type of the field.
3. The test method of claim 1, wherein the converting, in response to the selected target communication protocol and the configuration format on the field setting interface, the test item information added at the test item field according to the configuration format, generates target test data, comprising:
responding to the target communication protocol selected by a user from a plurality of reference communication protocols in a drop-down box on the field setting interface, and setting a serialization format corresponding to the test item field and an inverse serialization format corresponding to the test result field;
and converting the serialization format of the test item information added in the test item field to generate target test data.
4. A test method according to claim 3, characterized in that the test results are converted by:
and converting the test result based on the reverse serialization format corresponding to the test result field, and determining the converted test result.
5. The test method of claim 1, wherein after said converting the test item information added at the test item field in accordance with the configuration format in response to the target communication protocol and the configuration format selected on the field setting interface to generate the target test data, the test method further comprises:
responding to a save instruction of the target setting instruction on the protocol event interface, and saving the target setting instruction as a bookmark; the bookmark comprises name information of the target setting instruction and description information of the target setting instruction.
6. The method of claim 5, wherein after saving the target setting instruction as a bookmark in response to the save instruction for the target setting instruction on the protocol event interface, the method further comprises:
detecting whether the reference test item information for retesting the chip to be tested is consistent with the test item information;
if yes, carrying out communication test on the chip to be tested based on the bookmark;
if not, changing the test item information in the bookmark into the reference test item information, and carrying out communication test on the chip based on the changed bookmark.
7. A test method according to claim 3, wherein the reference communication protocol is any one of the following bus protocols:
UART bus protocol, I2C bus protocol, SPI bus protocol, USB bus protocol and PCIE bus protocol.
8. A test apparatus for chip communication, the test apparatus comprising:
the loading module is used for responding to the target setting instruction added on the protocol event interface and loading a field setting interface corresponding to the target setting instruction; the field setting interface displays a test item field and a test result field corresponding to the target setting instruction;
the generating module is used for responding to the target communication protocol and the configuration format selected on the field setting interface, converting the test item information added at the test item field according to the configuration format and generating target test data;
the determining module is used for sending the target test data to a testing machine based on the target communication protocol, obtaining a test result of the chip to be tested generated by the testing machine, converting the test result and filling the test result into the test result field.
9. An electronic device, comprising: a processor, a memory and a bus, said memory storing machine readable instructions executable by said processor, said processor and said memory communicating via said bus when the electronic device is running, said machine readable instructions being executed by said processor to perform the steps of the method of testing chip communication according to any one of claims 1 to 7.
10. A computer-readable storage medium, on which a computer program is stored which, when being executed by a processor, performs the steps of the method for testing chip communication according to any of claims 1 to 7.
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN117192343A (en) * | 2023-11-08 | 2023-12-08 | 珠海芯业测控有限公司 | Chip testing method based on auxiliary system, electronic equipment and medium |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN117192343A (en) * | 2023-11-08 | 2023-12-08 | 珠海芯业测控有限公司 | Chip testing method based on auxiliary system, electronic equipment and medium |
| CN117192343B (en) * | 2023-11-08 | 2024-01-23 | 珠海芯业测控有限公司 | Chip testing method based on auxiliary system, electronic equipment and medium |
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