CN116755003A - Test evaluation device and method for disposable electroencephalogram probe - Google Patents
Test evaluation device and method for disposable electroencephalogram probe Download PDFInfo
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- CN116755003A CN116755003A CN202310681458.7A CN202310681458A CN116755003A CN 116755003 A CN116755003 A CN 116755003A CN 202310681458 A CN202310681458 A CN 202310681458A CN 116755003 A CN116755003 A CN 116755003A
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- 239000000523 sample Substances 0.000 title claims abstract description 169
- 238000012360 testing method Methods 0.000 title claims abstract description 89
- 238000011156 evaluation Methods 0.000 title claims abstract description 75
- 238000000034 method Methods 0.000 title abstract description 13
- 230000008878 coupling Effects 0.000 claims abstract description 126
- 238000010168 coupling process Methods 0.000 claims abstract description 126
- 238000005859 coupling reaction Methods 0.000 claims abstract description 126
- 230000005284 excitation Effects 0.000 claims abstract description 123
- 238000001514 detection method Methods 0.000 claims abstract description 102
- 230000007274 generation of a signal involved in cell-cell signaling Effects 0.000 claims abstract description 32
- 230000001681 protective effect Effects 0.000 claims abstract description 14
- 238000005259 measurement Methods 0.000 claims description 14
- 239000012811 non-conductive material Substances 0.000 claims description 3
- 210000004556 brain Anatomy 0.000 abstract description 7
- 230000005540 biological transmission Effects 0.000 abstract description 3
- 238000010586 diagram Methods 0.000 description 9
- 230000009286 beneficial effect Effects 0.000 description 8
- 238000004519 manufacturing process Methods 0.000 description 8
- 230000008569 process Effects 0.000 description 8
- 239000004020 conductor Substances 0.000 description 6
- 238000013461 design Methods 0.000 description 5
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 3
- 239000000853 adhesive Substances 0.000 description 3
- 230000001070 adhesive effect Effects 0.000 description 3
- 238000004458 analytical method Methods 0.000 description 3
- 229910052802 copper Inorganic materials 0.000 description 3
- 239000010949 copper Substances 0.000 description 3
- 230000008054 signal transmission Effects 0.000 description 3
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 2
- 239000003990 capacitor Substances 0.000 description 2
- 230000008859 change Effects 0.000 description 2
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 2
- 229910052737 gold Inorganic materials 0.000 description 2
- 239000010931 gold Substances 0.000 description 2
- 239000011810 insulating material Substances 0.000 description 2
- 238000010998 test method Methods 0.000 description 2
- 229910052718 tin Inorganic materials 0.000 description 2
- 239000011135 tin Substances 0.000 description 2
- 206010002091 Anaesthesia Diseases 0.000 description 1
- 230000002159 abnormal effect Effects 0.000 description 1
- 230000005856 abnormality Effects 0.000 description 1
- 230000003321 amplification Effects 0.000 description 1
- 230000037005 anaesthesia Effects 0.000 description 1
- 230000000712 assembly Effects 0.000 description 1
- 238000000429 assembly Methods 0.000 description 1
- 210000005013 brain tissue Anatomy 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 230000007797 corrosion Effects 0.000 description 1
- 238000005260 corrosion Methods 0.000 description 1
- 238000004925 denaturation Methods 0.000 description 1
- 230000036425 denaturation Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 239000013072 incoming material Substances 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 239000007769 metal material Substances 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 238000003199 nucleic acid amplification method Methods 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 230000000737 periodic effect Effects 0.000 description 1
- 238000004886 process control Methods 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 238000013441 quality evaluation Methods 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 239000007779 soft material Substances 0.000 description 1
- 238000001179 sorption measurement Methods 0.000 description 1
- 230000002123 temporal effect Effects 0.000 description 1
- 230000009466 transformation Effects 0.000 description 1
- 238000000844 transformation Methods 0.000 description 1
Classifications
-
- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B5/00—Measuring for diagnostic purposes; Identification of persons
- A61B5/24—Detecting, measuring or recording bioelectric or biomagnetic signals of the body or parts thereof
- A61B5/316—Modalities, i.e. specific diagnostic methods
- A61B5/369—Electroencephalography [EEG]
- A61B5/386—Accessories or supplementary instruments therefor
-
- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B5/00—Measuring for diagnostic purposes; Identification of persons
- A61B5/24—Detecting, measuring or recording bioelectric or biomagnetic signals of the body or parts thereof
- A61B5/25—Bioelectric electrodes therefor
- A61B5/271—Arrangements of electrodes with cords, cables or leads, e.g. single leads or patient cord assemblies
- A61B5/273—Connection of cords, cables or leads to electrodes
-
- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B5/00—Measuring for diagnostic purposes; Identification of persons
- A61B5/24—Detecting, measuring or recording bioelectric or biomagnetic signals of the body or parts thereof
- A61B5/25—Bioelectric electrodes therefor
- A61B5/279—Bioelectric electrodes therefor specially adapted for particular uses
- A61B5/291—Bioelectric electrodes therefor specially adapted for particular uses for electroencephalography [EEG]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/01—Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/66—Testing of connections, e.g. of plugs or non-disconnectable joints
- G01R31/68—Testing of releasable connections, e.g. of terminals mounted on a printed circuit board
Abstract
In the test evaluation device and method of the disposable electroencephalogram probe, a first coupling component comprises a plurality of electric coupling parts which are respectively arranged opposite to one electrode in the external disposable electroencephalogram probe to form a capacitor-like structure corresponding to each electrode; the excitation signal generating component outputs an excitation signal A to each capacitor-like structure; the signal detection component acquires detection signals B corresponding to all electrodes in the disposable electroencephalogram detection probe; the main control component evaluates the detection signal B acquired by the signal detection component according to the excitation signal A output by the excitation signal generation component, and outputs an evaluation result of the external disposable electroencephalogram probe. Under the condition that the protective film attached to the surface of the electrode is not uncovered and the conductive gel state is not damaged, the conductivity of the brain sensor is tested, the frequency and the amplitude of the excitation signal are adjusted according to the situation, and potential fault products with the transmission characteristics not exceeding the threshold can be tested.
Description
Technical Field
The application relates to the technical field of bioelectricity, in particular to a test evaluation device and a test evaluation method of a disposable electroencephalogram probe.
Background
In general, in order to detect electrical signals at multiple points, a plurality of electrode plates are usually attached to external surfaces corresponding to brain tissues of a human body, the electrode plates are usually formed by attaching deformable electrode plates or electrode blocks formed by soft materials with liquid adsorption effects, such as sponges with conductive gel or conductive paste, to conductive lines with corresponding shapes formed by bare drain electrodes on a flexible circuit board, and compared with common metal materials (such as copper, tin, gold and the like), the conductive gel or conductive paste can change conductive characteristics along with the influence of storage time and environment, so that the conductive paste is usually used as a protective film through a plastic suction cover or release liner to protect the adhesive on the probe and the protective film, and the electrode plates can be directly attached to the skin of the human body by tearing off the protective film when in use. The conductive characteristics of the electrode pads determine the quality of signals acquired by the electrode pads, and as electroencephalogram measurement is to acquire signals on a plurality of electrodes simultaneously, perform correlation mathematical operation between the signals to obtain corresponding available multipath signals, and need comprehensive analysis of the multipath signals in subsequent analysis to achieve different analysis purposes, it is required to ensure that each electrode pad can meet certain conductive characteristics (such as response capability to amplitude signals for specific frequencies) besides electrical conduction and consistency. Meanwhile, various problems with potential risks can be introduced in the production, assembly and storage processes of the disposable electroencephalogram probe, so that the quality of the probe is reduced to different degrees. For example, when a circuit board is manufactured, copper leakage occurs in the wires relatively close to the circuit wiring due to process control errors, so that short circuits or low impedance between the wires are caused, and the short circuits or serious signal crosstalk between the wires occur; unexpected conductive particles during similar factory assembly adhere to the circuit board in the gap nearer the two conductive areas, resulting in shorts, etc.
In practical application, the manufactured brain electrical probe is required to test the electrical connection performance, the measured electrical contact is directly contacted with the electrode plate for measurement after the protective film is attached to the electrode plate is removed, the possibility of pollution and damage of the electrode plate is increased, and the probe can not be reused basically for measuring the contact of the measured electrical contact and the electrode plate by adopting the adhesive coating around the electrode plate. For the form of directly measuring electrical contacts, it is not suitable for use in situations where batch detection is required unless the measurement is used immediately.
In the prior art, there are some electrocardiographic probe test devices that can measure the electrical connection characteristics of the probe while the protective film is being applied, but in general, such a measurement device is usually provided for a single electrode sheet, and in the case where there are a plurality of electrodes in the electroencephalogram probe, measurement needs to be performed sequentially, and the measurement efficiency is low. Moreover, the measuring device in the prior art only performs an electrical connection test, can only test whether a corresponding single electrical loop is connected, cannot test specific electrical characteristics, and can not screen out probes with electrical characteristics which are problematic although the probes can be electrically connected, so that potential fault products are very easy to miss, and quite serious consequences can be caused in very strict medical scenes, such as anesthesia depth monitoring in the operation process of a disposable electroencephalogram probe.
The conductive material on the electrode plate has a certain quality guarantee period, the electrical connection characteristic of the conductive material can change along with the storage time, and the test is also required to be carried out on some electroencephalogram probes with longer stock time, so that the faults and potential faults of the electroencephalogram probes caused by the denaturation or failure of the conductive material in the electrode plate and the adhesive material used for adhesion are avoided. However, the performance of all the electroencephalogram probes before use in the production link and the use link is detected, and each electrode plate in each probe is sequentially connected and then tested, so that the efficiency is extremely low.
Disclosure of Invention
The technical scheme of the application aims to solve the technical problems that a test evaluation device and a test evaluation method of a disposable electroencephalogram probe for simultaneously detecting multiple electrode plates based on an electroencephalogram probe topological structure are provided, so that the detection of the electric connection relation corresponding to all electrodes in the electroencephalogram probe can be completed by one-time connection or one-time alignment setting, and the test efficiency is greatly improved; moreover, the method can apply corresponding signal excitation on the basis, detect signal transmission characteristics and screen potential fault products.
The technical scheme for solving the problems is that the test evaluation device of the disposable electroencephalogram probe comprises a first coupling component, an excitation signal generation component, a main control component and a signal detection component; the signal detection component is used for being electrically connected with a conductive joint of an external disposable electroencephalogram detection probe; the first coupling component is used for coupling with each electrode in the external disposable electroencephalogram probe to form a capacitor-like structure corresponding to each electrode; the first coupling component comprises a plurality of electric coupling parts, one electric coupling part is arranged opposite to one electrode in the external disposable electroencephalogram probe, and a capacitor-like structure is formed by coupling; the first coupling component is electrically connected with the excitation signal generation component, and the excitation signal generation component is used for outputting an excitation signal A to each capacitor-like structure; the signal detection component is used for obtaining detection signals B corresponding to all electrodes in the external disposable electroencephalogram detection probe; the main control component is respectively and electrically connected with the excitation signal generation component and the signal detection component, and is used for carrying out one-time electroencephalogram probe evaluation on the detection signal B acquired on the signal detection component according to the excitation signal A output by the excitation signal generation component and outputting an evaluation result of an external one-time electroencephalogram probe.
The topological structure formed by a plurality of electric coupling parts in the first coupling component corresponds to the topological structure of the external disposable electroencephalogram measuring probe to be measured; any one of the first coupling components comprises a conductive electrode slice or a limited conductive area, and the conductive electrode slice or the limited conductive area is electrically connected with the excitation signal generation component; the conductive electrode plate or the limited conductive area is used for being arranged opposite to each electrode in the external disposable electroencephalogram probe and is coupled to form a capacitor-like structure.
Any electric coupling part in the first coupling component comprises a protective film, conductive gel and a conductive electrode plate which are sequentially arranged from bottom to top, wherein the conductive electrode plate is electrically connected with the excitation signal generation component; the conductive electrode plate is used for being arranged opposite to each electrode in the external disposable electroencephalogram probe and is coupled to form a capacitor-like structure.
The first coupling component also comprises a plurality of cables and conductive joints; each cable is respectively and electrically connected with the conductive electrode plate in each electric coupling part, the cable is electrically connected with the conductive joint, and the conductive joint is electrically connected with the excitation signal generation assembly.
The main control component comprises an electroencephalogram detector, and the signal detection component is a signal detection component in the electroencephalogram detector.
The test evaluation device of the disposable electroencephalogram probe further comprises an auxiliary fixing component, wherein the auxiliary fixing component is an auxiliary fixing structure made of a non-conductive material and is used for fixing the disposable electroencephalogram probe to be tested on the first coupling component, so that the relative position between the disposable electroencephalogram probe to be tested and the first coupling component is prevented from being displaced in the detection process; the test evaluation system also comprises a display module or an indicator light module, which is used for displaying the test evaluation state.
The excitation signal generating component generates An excitation signal A which is a group of excitation signals An, and the excitation signals A are input to the disposable electroencephalogram probe from the conductive electrode of the first coupling component; n represents an nth electric coupling portion in the first coupling member; the value of n corresponds to the number of electrodes in the disposable electroencephalogram probe; each electric coupling part of the first coupling component is correspondingly input with an excitation signal; the excitation signals input by the electric coupling parts of the first coupling component are different excitation signals; correspondingly, the signal detection component acquires detection signals B corresponding to the electrodes as a group of detection signals Bn; and (3) evaluating according to a group of detection signals Bn, and outputting an evaluation result of the external disposable electroencephalogram probe.
The technical scheme for solving the problems can also be a test evaluation method of the disposable electroencephalogram probe, which is based on the test evaluation device of the disposable electroencephalogram probe and comprises the following steps: s1: arranging the first coupling component corresponding to each electrode in the disposable electroencephalogram measurement probe to form a capacitor-like structure corresponding to each electrode; s2: the main control component controls the excitation signal generation component and outputs excitation signals An to each capacitor-like structure by means of the first coupling component;
s3: the signal detection component is used for acquiring detection signals Bn corresponding to all electrodes in the external disposable electroencephalogram detection probe under the condition of an excitation signal A; s4: the main control component evaluates according to the acquired detection signal Bn and outputs an evaluation result of the external disposable electroencephalogram probe.
The excitation signal generating component generates An excitation signal A which is a group of excitation signals An, and the excitation signals A are input to the disposable electroencephalogram probe from the conductive electrode of the first coupling component; n represents an nth electric coupling portion in the first coupling member; the value of n corresponds to the number of electrodes in the disposable electroencephalogram probe; each electric coupling part of the first coupling component is correspondingly input with an excitation signal; the excitation signals input by the electric coupling parts of the first coupling component are different excitation signals; correspondingly, the signal detection component acquires detection signals B corresponding to the electrodes as a group of detection signals Bn; and (3) evaluating according to a group of detection signals Bn, and outputting an evaluation result of the external disposable electroencephalogram probe.
The test evaluation method of the disposable electroencephalogram probe comprises any one of the following technical characteristics: feature 1: the excitation signal a is a set of excitation signals An; the excitation signal An includes n signals having different frequencies; evaluating the connection states of each electrode and the corresponding cable of the disposable electroencephalogram probe according to the signal frequency characteristics of a group of detection signals Bn; feature 2: the excitation signal a is a set of excitation signals An; the excitation signal An comprises n signals with different signal amplitudes; and evaluating the connection states of each electrode and the corresponding cable of the disposable electroencephalogram probe according to the signal amplitude characteristics of a group of detection signals Bn.
Compared with the prior art, the application has one of the beneficial effects that the conductivity of the brain sensor is tested in a capacitive coupling mode under the condition that the protective film attached to the surface of the electrode, namely the plastic suction cover or the release film, is not uncovered and the state of the electrode plate and the viscosity of the probe are not damaged.
Compared with the prior art, the application has one of the beneficial effects that the independent signal excitation component is arranged, the frequency and the amplitude of the excitation signal can be adjusted according to the situation, so that the test excitation signal is more matched with the test condition, and the test result is more accurate. In the prior art, the measurement of capacitive taps in conventional test methods of capacitive coupling, such as in multimeters, has focused on measuring the electrical characteristics of the capacitor itself. In the application, the characteristic of the capacitor is not the key point of attention, and the aim is to test the signal transmission capacity of each cable in the whole disposable electroencephalogram probe, whether the cable is connected is the first step, and more importantly, the signal transmission capacity after the cable is connected, such as the signal attenuation condition on a cable line, and the like. The test method can conduct periodic signals with different frequencies and amplitudes to the input channel of the electroencephalogram sensor in a capacitive coupling mode, the test is closer to a real application scene, potential fault products which can be connected but have different transmission characteristics can be screened out, the test efficiency is improved, and the subsequent amplification detection circuit and the processing of the indication circuit are facilitated.
Compared with the prior art, the excitation signal generation assembly has the beneficial effects that the mV-level or even uV-level electroencephalogram signals in a certain frequency band can be simulated to be used as coupling input signals through the frequency-adjustable signal generation circuit and the attenuation circuit, so that the excitation signal generation assembly is more suitable for signal conditions of real application scenes, and the effectiveness of testing is enhanced.
Compared with the prior art, the application has one of the beneficial effects that the topological structure formed by the plurality of electric coupling parts in the first coupling component corresponds to the topological structure of the external disposable electroencephalogram measuring probe to be measured, and the testing efficiency is improved.
Compared with the prior art, the application has one of the beneficial effects that the first coupling component can completely test by using the electrode in the disposable electroencephalogram probe, so that the workload of redesigning the test component is avoided.
Compared with the prior art, the application has the beneficial effects that the whole disposable electroencephalogram probe is used as a part of the test evaluation device, the design workload of the test evaluation device of the disposable electroencephalogram probe is reduced, and the test can be completed only by connecting the excitation signal generating component with one disposable electroencephalogram probe.
Compared with the prior art, the application has the beneficial effects that the electroencephalograph is used as the main control component, the signal detection components are shared, the design workload of the test evaluation device of the disposable electroencephalograph probe is further reduced, the test efficiency is higher, and the test scene is closer to the signal detection condition in the real application environment.
Compared with the prior art, the display module or the indicator light module has one of the beneficial effects of timely displaying the test evaluation state.
Drawings
FIG. 1 is a schematic diagram of the topology of a disposable electroencephalographic probe;
FIG. 2 is a schematic diagram of the electrical connection of the electrodes of the disposable electroencephalogram probe and the electroencephalogram plug;
FIG. 3 is one of the schematic block diagrams of the disposable electroencephalogram probe test evaluation apparatus;
FIG. 4 is a second schematic block diagram of a disposable electroencephalogram probe test evaluation apparatus;
FIG. 5 is a third schematic block diagram of a disposable electroencephalogram probe test evaluation apparatus;
FIG. 6 is a fourth schematic block diagram of a disposable electroencephalogram probe test evaluation apparatus;
fig. 7 is a fifth schematic block diagram of a disposable electroencephalogram probe test evaluation apparatus.
Detailed Description
The present application is described in further detail below with reference to the accompanying drawings.
The following description of the preferred embodiments of the present application is not intended to limit the present application. The description of the preferred embodiments of the present application is merely illustrative of the general principles of the application. The embodiments described in this disclosure are only some, but not all, embodiments of the application. All other embodiments, which can be made by those skilled in the art based on the embodiments of the application without making any inventive effort, are intended to be within the scope of the application.
In the description of the present application, it should be understood that the terms "center," "longitudinal," "transverse," "length," "width," "thickness," "up," "down," "front," "back," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," "clockwise," "counterclockwise," etc. indicate orientations or positional relationships based on the orientation or positional relationships shown in the drawings are merely for convenience in describing the present application and to simplify the description, and do not indicate or imply that the device or element being referred to must have a specific orientation, be configured and operated in a specific orientation, and therefore should not be construed as limiting the present application. Furthermore, the terms "first," "second," and technical features numbered with numerals such as Arabic numerals 1, 2, 3, etc., and such numbers as "A" and "B" are used for descriptive purposes only and are not intended to represent a temporal or spatial sequential relationship for ease of illustration; and are not to be construed as indicating or implying a relative importance or implicitly indicating the number of technical features indicated. Thus, features defining "first", "second", and numbered with numerals 1, 2, 3, etc., may explicitly or implicitly include one or more such features. In the description of the present application, the meaning of "a number" is two or more, unless explicitly defined otherwise.
As shown in fig. 3, in an embodiment of a test evaluation device of a disposable electroencephalogram probe, the test evaluation device comprises a first coupling component, an excitation signal generation component, a main control component and a signal detection component; the signal detection component is used for being electrically connected with a conductive joint of an external disposable electroencephalogram detection probe; the first coupling component is used for coupling with each electrode in the external disposable electroencephalogram probe to form a capacitor-like structure corresponding to each electrode; the first coupling component comprises a plurality of electric coupling parts, one electric coupling part is arranged opposite to one electrode in the external disposable electroencephalogram probe, and a capacitor-like structure is formed by coupling; the first coupling component is electrically connected with the excitation signal generation component, and the excitation signal generation component is used for outputting an excitation signal A to each capacitor-like structure; the signal detection component is used for obtaining detection signals B corresponding to all electrodes in the external disposable electroencephalogram detection probe; the main control component is respectively and electrically connected with the excitation signal generation component and the signal detection component, and is used for carrying out one-time electroencephalogram probe evaluation on the detection signal B acquired on the signal detection component according to the excitation signal A output by the excitation signal generation component and outputting an evaluation result of an external one-time electroencephalogram probe.
As shown in fig. 1, a schematic diagram of the topology structure of the disposable electroencephalogram probe shows the topology structure formed by each electrode in the disposable electroencephalogram probe; the topology is merely an illustration of a spatial structure, and the actual topology may be a wide variety of specific structures. The specific topological structure of the first coupling component in the application needs to correspond to the topological structure of the disposable electroencephalogram measurement probe to be detected actually. The topological structure formed by a plurality of electric coupling parts in the first coupling component corresponds to the topological structure of the external disposable electroencephalogram measuring probe to be measured; any one of the first coupling components comprises a conductive electrode slice or a limited conductive area, and the conductive electrode slice or the limited conductive area is electrically connected with the excitation signal generation component; the conductive electrode plate or the limited conductive area is used for being arranged opposite to each electrode in the external disposable electroencephalogram probe and is coupled to form a capacitor-like structure. The plug in fig. 1 and 2 is a conductive connector of the disposable electroencephalogram probe, and is used for connecting the disposable electroencephalogram probe with external equipment such as a monitor host.
As shown in fig. 2, the electrical connection schematic diagram of each electrode of the disposable electroencephalogram probe and the electroencephalogram plug; in practice, each electrode of the disposable electroencephalogram probe corresponds to each independent electric connection wire, and the electric connection wires can be independent cables coated with insulating materials or can be fixed in a single cable after each electric connection wire is coated with the insulating materials. The test and evaluation device of the disposable brain electrical measurement probe is used for detecting whether the electrical connection characteristics of the electrical connection wires are normal or not. One end of each electric connecting wire in the disposable brain electrical measurement probe is electrically connected with the conductive electrode slice, and the other end of the electric connecting wire is electrically connected with the electric connecting column corresponding to the conductive joint or the plug. The conventional probe-like measurement is to test the connection characteristics of each electrical connection wire independently, generally only test whether the electrical connection wire can conduct energy to transmit signals, the specific connection characteristics of the electrical connection wire cannot be further detected, and further test and evaluation cannot be performed on whether short circuits exist among a plurality of electrical connection wires.
The topological structure formed by the plurality of electric coupling parts in the first coupling assembly corresponds to the topological structure of the external disposable electroencephalogram probe to be tested, so that the testing efficiency is greatly improved, the plurality of electrodes and cables in the disposable electroencephalogram probe can be tested by one test connection, the test of one-by-one connection is avoided, and the testing efficiency is improved.
The first coupling component is a specially manufactured first coupling component, which can be made of conductive materials which are more stable than conductive materials (conductive gel, conductive paste and the like) on the disposable brain electrode, such as tin, copper, gold sheets or conductive areas with specific conductive elements prepared by a specific process, has better resistance to corrosion caused by environmental changes, and can be corrected in a way of calibrating and correcting the first coupling component regularly, so that the stability and the standardization of the first coupling component serving as a reference point are ensured.
As shown in fig. 4, in the embodiment of the test evaluation device of the disposable electroencephalogram probe, the capacitor-like structure includes a conductive electrode sheet, a conductive gel, a protective film in the electric coupling part, and a protective film, a conductive gel, and a conductive electrode sheet in the external disposable electroencephalogram probe. The structure of the first coupling component is completely consistent with that of the front part of the disposable electroencephalogram probe, the structure of the front part of the disposable electroencephalogram probe can be directly used as the first coupling component, the manufacturing cost is saved, and the device can be used as a test evaluation device of the disposable electroencephalogram probe in certain emergency or clinical sites. Any electric coupling part in the first coupling component comprises a protective film, conductive gel and a conductive electrode plate which are sequentially arranged from bottom to top, wherein the conductive electrode plate is electrically connected with the excitation signal generation component; the conductive electrode plate is used for being arranged opposite to each electrode in the external disposable electroencephalogram probe and is coupled to form a capacitor-like structure. The protective film, the conductive gel and the conductive electrode sheet structure which are sequentially arranged in the electric coupling part are completely consistent with the electrode arrangement in the external disposable electroencephalogram probe from bottom to top, so that the first coupling component can completely test by using the electrode in the disposable electroencephalogram probe, and the workload of redesigning the test component is avoided. Furthermore, the completely symmetrical structure is used for coupling, so that the consistency of capacitive coupling is higher, and inconsistency caused by the design problem of an electric coupling part is avoided. When the test evaluation device fails, the whole replacement is very convenient, and the efficiency is higher.
In the dedicated test section of the production, the solution in fig. 3 is more robust than the solution in fig. 4 with another disposable electroencephalogram electrode as the first coupling element, the solution in fig. 3 being a preferred option for the dedicated test section of the production.
In an embodiment of the test evaluation device of the disposable electroencephalogram probe, as shown in fig. 5, the first coupling component further includes a plurality of cables and conductive joints; each cable is respectively and electrically connected with the conductive electrode plate in each electric coupling part, the cable is electrically connected with the conductive joint, and the conductive joint is electrically connected with the excitation signal generation assembly. The disposable electroencephalogram probe is integrally used as a part of the test evaluation device, so that the design workload of the test evaluation device of the disposable electroencephalogram probe is reduced, and the test can be completed only by connecting the excitation signal generating component with one disposable electroencephalogram probe.
In an embodiment of the test evaluation device of the disposable electroencephalogram probe, as shown in fig. 6, the main control component comprises an electroencephalogram meter, and the signal detection component is a signal detection component in the electroencephalogram meter. The electroencephalogram is used as a main control component, the signal detection components are shared, the design workload of a test evaluation device of the disposable electroencephalogram probe is further reduced, the test efficiency is higher, and the test scene is closer to the signal detection conditions in the real application environment.
In some embodiments of the test and evaluation device for a disposable electroencephalogram probe, which are not shown in the drawings, the test and evaluation device further comprises an auxiliary fixing component, wherein the auxiliary fixing component is an auxiliary fixing structure made of a non-conductive material and is used for fixing the disposable electroencephalogram probe to be tested on the first coupling component, so that the relative position between the disposable electroencephalogram probe to be tested and the first coupling component is not displaced in the detection process; the test evaluation system also comprises a display module or an indicator light module, which is used for displaying the test evaluation state.
In the embodiment of the test evaluation device of the disposable electroencephalogram probe shown in fig. 7, the excitation signal generating component generates the excitation signal a as a set of excitation signals An, and the excitation signals are input to the disposable electroencephalogram probe from the conductive electrode of the first coupling component; n represents an nth electric coupling portion in the first coupling member; the value of n corresponds to the number of electrodes in the disposable electroencephalogram probe; each electric coupling part of the first coupling component is correspondingly input with an excitation signal; the excitation signals input by the electric coupling parts of the first coupling component are different excitation signals; correspondingly, the signal detection component acquires detection signals B corresponding to the electrodes as a group of detection signals Bn; and (3) evaluating according to a group of detection signals Bn, and outputting an evaluation result of the external disposable electroencephalogram probe.
In an embodiment of the test evaluation method of the disposable electroencephalogram probe, the test evaluation device based on the disposable electroencephalogram probe comprises the following steps: s1: arranging the first coupling component corresponding to each electrode in the disposable electroencephalogram measurement probe to form a capacitor-like structure corresponding to each electrode; s2: the main control component controls the excitation signal generation component and outputs excitation signals An to each capacitor-like structure by means of the first coupling component; s3: the signal detection component is used for acquiring detection signals Bn corresponding to all electrodes in the external disposable electroencephalogram detection probe under the condition of an excitation signal A; s4: the main control component evaluates according to the acquired detection signal Bn and outputs an evaluation result of the external disposable electroencephalogram probe. n is a natural number of 1 or more.
In some embodiments, under the condition that the consistency of the characteristics of the circuit to be tested formed by each electrode in the disposable electroencephalogram probe and the related conductive connecting wire and conductive connecting column is high, the excitation signals output to each capacitor-like structure can adopt the same signal, and whether the disposable electroencephalogram probe is normal can be judged according to the consistency of the acquired detection signals Bn.
In some embodiments, under the condition that the consistency of the characteristics of the circuit to be tested formed by each electrode, the related conductive connecting wire and the conductive connecting column in the disposable electroencephalogram probe is not high, the excitation signals output to each capacitor-like structure can be respectively input into corresponding electric connecting paths by adopting a group of signals matched with the characteristics of the circuit to be tested. As shown in fig. 7, the excitation signal generating component generates An excitation signal a as a group of excitation signals An, and the excitation signals a are input to the disposable electroencephalogram probe from the conductive electrode of the first coupling component; n represents the nth electrical coupling portion of the first coupling element, n being 5 in fig. 7; the value of n corresponds to the number of electrodes in the disposable electroencephalogram probe; each electric coupling part of the first coupling component is correspondingly input with an excitation signal; the excitation signals input by the electric coupling parts of the first coupling component are different excitation signals; correspondingly, the signal detection component acquires detection signals B corresponding to the electrodes as a group of detection signals Bn; and (3) evaluating according to a group of detection signals Bn, and outputting an evaluation result of the external disposable electroencephalogram probe.
In some embodiments, excitation signal a is a set of excitation signals An; the excitation signal An includes n signals having different frequencies; and evaluating the connection states of each electrode and the corresponding cable of the disposable electroencephalogram probe according to the signal frequency characteristics of a group of detection signals Bn.
In some embodiments, excitation signal a is a set of excitation signals An; the excitation signal An comprises n signals with different signal amplitudes; and evaluating the connection states of each electrode and the corresponding cable of the disposable electroencephalogram probe according to the signal amplitude characteristics of a group of detection signals Bn.
As in fig. 7, the excitation signals A1 to A5 may be excitation signals of different frequencies or different amplitudes. If the electrical connection of the disposable electroencephalogram probes is normal, the frequency characteristics or the amplitude of the detection signals B1 to B5 are expected to be normal, and if the frequency characteristics or the amplitude characteristics of the detection signals B1 to B5 are not expected, the disposable electroencephalogram probes are abnormal. Not only can the abnormality be detected, but also the specific fault type of the disposable electroencephalogram probe can be identified and judged through the corresponding relation between the excitation signals A1 to A5 and the detection signals B1 to B5.
The signal detection component acquires detection signals Bn of signals An by all electrodes in the disposable electroencephalogram probe to be detected, if Bn reaches a certain range of amplitude, frequency and waveform characteristics, the disposable electroencephalogram probe to be detected is judged to be qualified, and meanwhile, the disposable electroencephalogram probe to be detected can be further subjected to grading evaluation in a finer manner, and the disposable electroencephalogram probe to be detected is not limited to be qualified or unqualified. The method has important significance for quality inspection and evaluation of incoming materials of the probe conductive material in production, and quality evaluation and expiration time prediction of the probe in the subsequent storage process. Waveform characteristics include characteristics of slopes, inflection point positions and the like after specific mathematical transformations.
In addition, in the whole production process of the disposable electroencephalogram probe, the line independence between the electrodes is poor due to various problems, for example, two electrodes should be independently wired too close, the process error control during the production of a circuit board is not up to standard, and the phenomenon of short circuit or too low impedance occurs between the two lines, so that mutual interference, short circuit and the like are formed between two or more electrodes, the electrodes are simultaneously measured, whether the electrodes have the problems of crosstalk, short circuit and the like can be detected, and the problems of crosstalk and the like can be identified by sending different designated trigger signals, namely excitation signals, to the conductive areas on the first coupling assemblies corresponding to the different electrodes, and analyzing signals received by the different probes on the disposable probe.
If the amplitude of part of the signals in the detection signals B1 to B5 is too low or tends to zero, the condition that the corresponding electric connection path of the signals is broken or the impedance is too high is indicated; when crosstalk occurs in a part of signals in the detection signals B1 to B5, it is indicated that the electrical connection paths corresponding to the signals have crosstalk or are shorted with each other.
The test evaluation device of the disposable electroencephalogram probe comprises a plurality of electric coupling parts which are respectively arranged opposite to one electrode in the external disposable electroencephalogram probe in the first coupling component to form a capacitor-like structure corresponding to each electrode; the excitation signal generating component outputs an excitation signal A to each capacitor-like structure; the signal detection component acquires detection signals B corresponding to all electrodes in the disposable electroencephalogram detection probe; the main control component evaluates the detection signal B acquired by the signal detection component according to the excitation signal A output by the excitation signal generation component, and outputs an evaluation result of the external disposable electroencephalogram probe. Under the condition that the protective film attached to the surface of the electrode is not uncovered and the state of the electrode plate is not damaged, the conductivity of the brain sensor is tested, the frequency and the amplitude of the excitation signal are adjusted according to the situation, and potential fault products with the transmission characteristics not exceeding the threshold can be tested.
The foregoing description is only illustrative of the present application and is not intended to limit the scope of the application, and all equivalent structures or equivalent processes or direct or indirect application in other related arts are included in the scope of the present application.
Claims (10)
1. A test and evaluation device of a disposable electroencephalogram probe is characterized in that,
the device comprises a first coupling component, an excitation signal generation component, a main control component and a signal detection component; the signal detection component is used for being electrically connected with a conductive joint of an external disposable electroencephalogram detection probe;
the first coupling component is used for coupling with each electrode in the external disposable electroencephalogram probe to form a capacitor-like structure corresponding to each electrode;
the first coupling component comprises a plurality of electric coupling parts, one electric coupling part is arranged opposite to one electrode in the external disposable electroencephalogram probe, and a capacitor-like structure is formed by coupling;
the first coupling component is electrically connected with the excitation signal generation component, and the excitation signal generation component is used for outputting an excitation signal A to each capacitor-like structure; the signal detection component is used for obtaining detection signals B corresponding to all electrodes in the external disposable electroencephalogram detection probe;
the main control component is respectively and electrically connected with the excitation signal generation component and the signal detection component, and is used for carrying out one-time electroencephalogram probe evaluation on the detection signal B acquired on the signal detection component according to the excitation signal A output by the excitation signal generation component and outputting an evaluation result of an external one-time electroencephalogram probe.
2. The test evaluation device of a disposable electroencephalogram probe according to claim 1, wherein,
the topological structure formed by a plurality of electric coupling parts in the first coupling component corresponds to the topological structure of the external disposable electroencephalogram measuring probe to be measured;
any one of the first coupling components comprises a conductive electrode slice or a limited conductive area, and the conductive electrode slice or the limited conductive area is electrically connected with the excitation signal generation component; the conductive electrode plate or the limited conductive area is used for being arranged opposite to each electrode in the external disposable electroencephalogram probe and is coupled to form a capacitor-like structure.
3. The test evaluation device of a disposable electroencephalogram probe according to claim 2, wherein,
any electric coupling part in the first coupling component comprises a protective film, conductive gel and a conductive electrode plate which are sequentially arranged from bottom to top, wherein the conductive electrode plate is electrically connected with the excitation signal generation component;
the conductive electrode plate is used for being arranged opposite to each electrode in the external disposable electroencephalogram probe and is coupled to form a capacitor-like structure.
4. The test evaluation device of a disposable electroencephalogram probe according to claim 3, wherein,
the first coupling component also comprises a plurality of cables and conductive joints; each cable is respectively and electrically connected with the conductive electrode plate in each electric coupling part, the cable is electrically connected with the conductive joint, and the conductive joint is electrically connected with the excitation signal generation assembly.
5. The test evaluation device of a disposable electroencephalogram probe as set forth in claim 4, wherein,
the main control component comprises an electroencephalogram detector, and the signal detection component is a signal detection component in the electroencephalogram detector.
6. The test evaluation device of a disposable electroencephalogram probe according to claim 1, wherein,
the auxiliary fixing assembly is an auxiliary fixing structure made of non-conductive materials and is used for fixing the disposable electroencephalogram probe to be tested on the first coupling assembly;
the test evaluation system also comprises a display module or an indicator light module, which is used for displaying the test evaluation state.
7. The test evaluation device of a disposable electroencephalogram probe according to claim 2, wherein,
the excitation signal generating component generates An excitation signal A which is a group of excitation signals An, and the excitation signals A are input to the disposable electroencephalogram probe from the conductive electrode of the first coupling component; n represents an nth electric coupling portion in the first coupling member; the value of n corresponds to the number of electrodes in the disposable electroencephalogram probe;
each electric coupling part of the first coupling component is correspondingly input with an excitation signal; the excitation signals input by the electric coupling parts of the first coupling component are different excitation signals;
correspondingly, the signal detection component acquires detection signals B corresponding to the electrodes as a group of detection signals Bn; and (3) evaluating according to a group of detection signals Bn, and outputting an evaluation result of the external disposable electroencephalogram probe.
8. A test evaluation method of a disposable electroencephalogram probe is characterized in that,
test evaluation device based on a disposable electroencephalogram probe according to any of the previous claims 1 to 7, comprising the steps of:
s1: arranging the first coupling component corresponding to each electrode in the disposable electroencephalogram measurement probe to form a capacitor-like structure corresponding to each electrode;
s2: the main control component controls the excitation signal generation component and outputs excitation signals An to each capacitor-like structure by means of the first coupling component;
s3: the signal detection component is used for acquiring detection signals Bn corresponding to all electrodes in the external disposable electroencephalogram detection probe under the condition of an excitation signal A;
s4: the main control component evaluates according to the acquired detection signal Bn and outputs an evaluation result of the external disposable electroencephalogram probe.
9. The test evaluation method of a disposable electroencephalogram probe according to claim 8, characterized in that,
the excitation signal generating component generates An excitation signal A which is a group of excitation signals An, and the excitation signals A are input to the disposable electroencephalogram probe from the conductive electrode of the first coupling component; n represents an nth electric coupling portion in the first coupling member; the value of n corresponds to the number of electrodes in the disposable electroencephalogram probe;
each electric coupling part of the first coupling component is correspondingly input with an excitation signal; the excitation signals input by the electric coupling parts of the first coupling component are different excitation signals;
correspondingly, the signal detection component acquires detection signals B corresponding to the electrodes as a group of detection signals Bn; and (3) evaluating according to a group of detection signals Bn, and outputting an evaluation result of the external disposable electroencephalogram probe.
10. The test evaluation method of a disposable electroencephalogram probe according to claim 8, characterized in that,
comprising any one of the following technical characteristics:
feature 1: the excitation signal a is a set of excitation signals An; the excitation signal An includes n signals having different frequencies; evaluating the connection states of each electrode and the corresponding cable of the disposable electroencephalogram probe according to the signal frequency characteristics of a group of detection signals Bn;
feature 2: the excitation signal a is a set of excitation signals An; the excitation signal An comprises n signals with different signal amplitudes; and evaluating the connection states of each electrode and the corresponding cable of the disposable electroencephalogram probe according to the signal amplitude characteristics of a group of detection signals Bn.
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