CN116743643A - Communication circuit testing device and method - Google Patents

Abstract

The invention discloses a communication circuit testing device and a method. The test device comprises: regional controller, EMC load case, communication conversion module and host computer. The area controller is provided with a communication circuit module to be tested; the EMC load box is provided with a shielding layer, a sensor unit and a test port, the sensor unit is used for receiving an instruction sent by the tested communication circuit module and feeding back data in the sensor unit to the tested communication circuit module, and the test port is used for connecting test equipment; the upper computer is communicated with the regional controller through the communication conversion module and is used for configuring a shift register related to the test of the tested communication circuit module after the regional controller works; wherein, regional controller and EMC load box set up in EMC laboratory. According to the embodiment of the invention, the EMC load box is used for shielding electromagnetic interference, so that the influence of the electromagnetic interference on the sensor unit is reduced, the accuracy of EMC test is improved, and the test cost is reduced.

Description

Communication circuit testing device and method

Technical Field

The present invention relates to the field of communications testing technologies, and in particular, to a communications circuit testing device and method.

Background

Along with the improvement of the integration level of the vehicle control system, the types and the number of signals are more and more, and the traditional analog interface circuit module and the traditional PWM interface circuit module for processing the sensor signals are gradually replaced by a communication circuit module which accords with the functional safety level, has higher compatibility and occupies less pins of the area controller connector, for example, a PSI5 communication circuit module. In the prior art, a PSI5 signal board card pair is mostly adopted as a signal source of the PSI5 communication circuit module in the test of the PSI5 communication circuit module.

However, the PSI5 signal board has a high cost, and the PSI5 signal board cannot adapt to the EMC test environment, so that the EMC test accuracy of the PSI5 communication circuit module is poor.

Disclosure of Invention

The invention provides a communication circuit testing device and a communication circuit testing method, which are used for improving the accuracy of EMC (electro magnetic compatibility) testing and reducing the testing cost.

According to an aspect of the present invention, there is provided a communication circuit testing apparatus, comprising:

the area controller is provided with a communication circuit module to be tested;

the EMC load box is connected with the regional controller; the EMC load box is provided with a shielding layer, and the shielding layer is used for shielding interference signals; the EMC load box is provided with a sensor unit, the sensor unit is used for receiving an instruction sent by the tested communication circuit module and feeding back data in the sensor unit to the tested communication circuit module, and the EMC load box is provided with a test port which is used for connecting test equipment;

the upper computer is connected with the communication conversion module between the upper computer and the EMC load box, and is communicated with the regional controller through the communication conversion module, and the upper computer is used for configuring a shift register associated with testing the tested communication circuit module after the regional controller works;

wherein, regional controller with EMC load case sets up in EMC laboratory.

Optionally, the EMC load box includes: an analog unit and a signal transmission unit;

the simulation unit is used for providing a simulation environment for the sensor unit;

the signal transmission unit is used for receiving the control signal sent by the area controller, and is connected with the area controller.

Optionally, the communication conversion module includes: the communication conversion unit and the optical fiber bridging unit;

the communication conversion unit is used for converting the USB signal into a CAN signal or converting the CAN signal into the USB signal; the first end of the communication conversion unit is connected with the upper computer, and the second end of the communication conversion unit is connected with the optical fiber bridging unit;

the optical fiber bridging unit is used for transferring signals outside the EMC laboratory to the inside of the EMC laboratory or transferring signals inside the EMC laboratory to the outside of the EMC laboratory; the second end of the optical fiber bridging unit is connected with the tested communication circuit module.

Optionally, the optical fiber bridging unit includes: the optical system comprises a first optical bridge, a second optical bridge and an optical fiber;

the first optical bridge and the second optical bridge are both used for signal conversion, so that the CAN signal is converted into an optical signal, or the optical signal is converted into the CAN signal;

the first optical bridge is arranged outside the EMC laboratory, the first end of the first optical bridge is used as the first end of the optical fiber bridging unit, the second end of the first optical bridge is connected with the first end of the second optical bridge through the optical fiber, and the second end of the second optical bridge is used as the second end of the optical fiber bridging unit.

Optionally, the test device further comprises: an artificial power supply network;

the artificial power supply network is used for providing power for the EMC load box and is connected with the EMC load box;

and the EMC load box is connected with the tested communication circuit module by adopting twisted pair wires.

Optionally, an antenna is arranged in the EMC laboratory, and the antenna is used for generating the interference signal;

the tested communication circuit module is a PSI5 communication circuit module, a driving control pin of a transceiver chip of the PSI5 communication circuit module is used for controlling power supply of a driving pin, the driving pin of the transceiver chip is used for controlling power supply of a first signal output pin of the transceiver chip and power supply of a second signal output pin of the transceiver chip, the first signal output pin of the transceiver chip and the second signal output pin of the transceiver chip are used for supplying power to the sensor unit and are used for communicating with the sensor unit, the first signal output pin of the transceiver chip is connected with the sensor unit through a first resistance-capacitance matching unit, the second signal output pin of the transceiver chip is connected with the sensor unit through a second resistance-capacitance matching unit, the first high level end of the transceiver chip is connected with the first low level end of the transceiver chip through a sixth capacitor, the second high level end of the transceiver chip is connected with the second low level end of the transceiver chip through a seventh capacitor, the sixth capacitor is used for providing trigger voltage for the sensor unit, the seventh capacitor is used for providing trigger voltage for the sensor unit, the first output pin of the transceiver chip is used for interrupting signal transmission and data reading, the second output pin of the transceiver chip is used for interrupting signal transmission and data reading, the enabling pin of the transceiver chip, the clock pin of the transceiver chip, the data input pin of the transceiver chip and the data output pin of the transceiver chip are used for transmitting register control signals and serial data in the transceiver chip, the reset pin of the transceiver chip is used to reset the transceiver chip.

According to another aspect of the present invention, there is provided a communication circuit testing method applied to the communication circuit testing apparatus described in any one of the above embodiments, the communication circuit testing method including:

the upper computer generates a configuration instruction according to the interactive content;

the regional controller configures the communication circuit module to be tested according to the configuration instruction;

the communication circuit module to be tested acquires a sensing signal;

the area controller generates a control signal according to the sensing signal;

the upper computer performs function test on the communication of the tested communication circuit module according to the control signal;

the upper computer acquires serial data of the tested communication circuit module;

and the upper computer tests the power supply voltage, the superposition voltage of the signal output port and the trigger voltage of the tested communication circuit module according to the serial data.

Optionally, the step of configuring the tested communication circuit module by the area controller according to the configuration instruction includes:

setting a general register;

setting a channel control register;

setting a channel related register;

a diagnostic register is set.

Optionally, the step of setting the general purpose register includes:

setting the synchronous pulse length of a transceiver chip of the tested communication circuit module, a method for generating an engineering mode pulse and an external clock;

setting a verification mode of the sensor unit;

setting output voltage of a driving pin of a transceiver chip of the tested communication circuit module;

the step of setting the channel control register includes:

setting whether the output voltage of a driving pin of a transceiver chip of the tested communication circuit module is enabled or not;

setting whether a signal output pin of a transceiver chip of the tested communication circuit module is enabled or not;

the step of setting the channel dependent register comprises:

setting synchronous pulse voltage, quiescent current limit value, number of connected sensor units and communication rate of a signal output pin of a transceiver chip of the tested communication circuit module;

setting whether an output pin of a transceiver chip of the tested communication circuit module is an interrupt output or not;

the step of setting a diagnostic register includes:

setting an output undervoltage fault, a ground short-circuit fault, a ground leakage current fault, a power supply short-circuit fault and a short-circuit fault between adjacent channels of the tested communication circuit module;

setting an open circuit fault of the sensor unit

According to the embodiment of the invention, the sensor unit is protected by arranging the shielding layer in the EMC load box, the test port is arranged in the EMC load box, the fault condition of the sensor unit is simulated, the tested communication circuit module is configured by the upper computer and the communication conversion module, and the function and the interface voltage of the tested communication circuit module are tested after the configuration is completed. According to the embodiment of the invention, the EMC load box is used for shielding electromagnetic interference, so that the influence of the electromagnetic interference on the sensor unit is reduced, the accuracy of EMC test is improved, and the test cost is reduced.

It should be understood that the description in this section is not intended to identify key or critical features of the embodiments of the invention or to delineate the scope of the invention. Other features of the present invention will become apparent from the description that follows.

Drawings

In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings required for the description of the embodiments will be briefly described below, and it is apparent that the drawings in the following description are only some embodiments of the present invention, and other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.

Fig. 1 is a schematic structural diagram of a communication circuit testing device according to an embodiment of the present invention;

FIG. 2 is a schematic diagram of a human-computer interface of an upper computer according to an embodiment of the present invention;

fig. 3 is a schematic circuit diagram of a measured communication circuit module according to an embodiment of the present invention;

FIG. 4 is a flowchart of a method for testing a communication circuit according to an embodiment of the present invention;

fig. 5 is a flowchart of a configuration of a communication circuit module to be tested according to an embodiment of the present invention.

Detailed Description

In order that those skilled in the art will better understand the present invention, a technical solution in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in which it is apparent that the described embodiments are only some embodiments of the present invention, not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the present invention without making any inventive effort, shall fall within the scope of the present invention.

It should be noted that the terms "first," "second," and the like in the description and the claims of the present invention and the above figures are used for distinguishing between similar objects and not necessarily for describing a particular sequential or chronological order. It is to be understood that the data so used may be interchanged where appropriate such that the embodiments of the invention described herein may be implemented in sequences other than those illustrated or otherwise described herein. Furthermore, the terms "comprises," "comprising," and "having," and any variations thereof, are intended to cover a non-exclusive inclusion, such that a process, method, system, article, or apparatus that comprises a list of steps or elements is not necessarily limited to those steps or elements expressly listed but may include other steps or elements not expressly listed or inherent to such process, method, article, or apparatus.

The embodiment of the invention provides a communication circuit testing device which is used for testing a communication module of an automobile controller. Fig. 1 is a schematic structural diagram of a communication circuit testing device according to an embodiment of the present invention. Referring to fig. 1, the test apparatus includes: a regional controller 110, an EMC load box 120, and an upper computer 130.

The area controller 110 is provided with a communication circuit module 111 to be tested; the EMC load box 120 is connected with the zone controller 110; the EMC load box 120 is provided with a shielding layer for shielding interference signals; the EMC load box 120 is provided with a sensor unit, the sensor unit is used for receiving an instruction sent by the communication circuit module 111 to be tested and feeding back data in the sensor unit to the communication circuit module 111 to be tested, the EMC load box 120 is provided with a test port 121, and the test port 121 is used for connecting test equipment; the test equipment is used for simulating the fault of the sensor unit and testing the connection between the tested communication circuit module 111 and the sensor unit. In addition, the test port 121 is also used for manually extracting signals during testing, so as to manually test the tested communication circuit module 111.

A communication conversion module 140 is connected between the upper computer 130 and the EMC load box 120, the upper computer 130 communicates with the regional controller 110 through the communication conversion module 140, and the communication conversion module 140 is used for converting a signal format. The upper computer 130 is configured to perform a shift register configuration associated with testing on the tested communication circuit module 111 after the regional controller 110 works; wherein the area controller 110 and the EMC load box 120 are provided in an EMC laboratory (Electro Magnetic Compatibility Lab, electromagnetic compatibility laboratory).

It is understood that EMC experiments refer to testing of the ability of a device or system to perform satisfactorily in its electromagnetic environment and not to create intolerable electromagnetic interference to any device in its environment. Since there are various electromagnetic interferences in the EMC laboratory, in order to reduce the influence of the electromagnetic interferences on the sensor unit, a shielding layer is provided in the EMC load box 120 to provide a good working environment for the sensor unit.

Fig. 2 is a schematic diagram of a human-computer interface of an upper computer according to an embodiment of the present invention. Referring to fig. 2, the area controller 110 is activated or triggered, illustratively, prior to testing the communication circuit module under test 111. The triggering manner of the area controller 110 may be, for example, that the area controller 110 is triggered according to a key door signal, so that the area controller 110 enters a normal working state. Next, the upper computer 130 sets the communication signal and the file storage path of the communication conversion module 140.

After the setting of the communication conversion module 140 is completed, the upper computer 130 configures registers in the tested communication circuit module 111 in the area controller 110, so that the tested communication circuit module 111 works normally, and the upper computer 130 can communicate with the sensor unit through the tested communication circuit module 111, and the area controller 110 can communicate with the sensor unit through the tested communication circuit module 111. It should be noted that the sensor unit is used to sense the environment in which it is located, and the environmental variable sensed by the sensor unit depends on the sensor unit itself. The sensor unit may be a height sensor or an acceleration sensor, and the height sensor is used for sensing the height of the sensor, the acceleration sensor is used for sensing the acceleration of the sensor at the current moment, and the embodiment is not limited in this regard.

It can be appreciated that the communication circuit testing device provided by the embodiment of the invention can test various types of communication circuit modules, and the communication circuit module to be tested can communicate with the regional controller, and the type of the communication circuit module 111 to be tested is not limited in this embodiment. For easy understanding, the present embodiment will be described by taking the PSI5 communication module as the measured communication circuit module 111.

Table 1 exemplarily shows the formats of the registers of the measured communication circuit module, and the register formats of the measured communication circuit module are shown in table 1.

TABLE 1

In the process of configuring the register in the tested communication circuit module 111 in the regional controller 110 by the upper computer 130, the upper computer 130 firstly converts the configuration instruction into the CAN communication format through the communication conversion module 140 and sends the CAN communication format to the regional controller 110, and the regional controller 110 configures the tested communication circuit module 111 according to the configuration instruction. Table 2 exemplarily shows a message data table of the upper computer 130 when the area controller 110 configures the tested communication circuit module 111, and specific message data can refer to table 2.

TABLE 2

In addition, the measured communication circuit module 111 transmits serial data to the upper computer 130, and the upper computer 130 analyzes the power supply voltage, the superposition voltage of the signal output port and the trigger voltage of the measured communication circuit module 110 according to the serial data, compares the analyzed data with normal data, and writes the comparison result into the work report.

After the configuration of the communication circuit module 111 to be tested is completed by the host computer 130, the function of the communication circuit module 111 to be tested is tested.

When the test equipment does not send a test instruction to the sensor unit, the sensor unit sends the sensing data to the area controller 110 through the tested communication module 111. The regional controller 110 generates a control command according to the sensing data, and sends the control command to the upper computer 130 through the measured communication circuit module 111. When the upper computer 130 receives the control instruction, it indicates that the tested communication circuit module works normally; when the upper computer 130 does not receive the control instruction, it indicates that the tested communication circuit module works abnormally.

When the test equipment does not send a test instruction to the sensor unit, the sensor unit sends the sensor fault data to the upper computer 130 through the tested communication module 111. When the upper computer receives the fault data, the communication circuit module is normally tested; and when the upper computer does not receive the fault data, the abnormal operation of the tested communication circuit module is indicated.

The upper computer 130 generates a test report according to the above test results and outputs the test report. Table 3 exemplarily gives a partial test report, and for specific test contents, please refer to table 3.

TABLE 3 Table 3

In the embodiment of the invention, the sensor unit is protected by arranging the shielding layer in the EMC load box 120, the test port 121 is arranged in the EMC load box 120, the fault condition of the sensor unit is simulated, the tested communication circuit module 111 is configured by the upper computer 130 and the communication conversion module 140, and the function and the interface voltage of the tested communication circuit module 111 are tested after the configuration is completed. According to the embodiment of the invention, the EMC load box is used for shielding electromagnetic interference, so that the influence of the electromagnetic interference on the sensor unit is reduced, the accuracy of EMC test is improved, and the test cost is reduced.

On the basis of the above embodiment, optionally, the EMC load box includes: an analog unit and a signal transmission unit.

The simulation unit is used for providing a simulation environment for the sensor unit. The signal transmission unit is configured to receive a control signal sent by the area controller 110, and is connected to the area controller 110.

Specifically, the simulation unit is used for simulating an external environment and providing a plurality of different sensing data for EMC test. The signal transmission unit is used for bridging the communication conversion module 140 and the communication circuit module 111 to be tested, so as to realize connection between the upper computer 130 and the regional controller 110. Since there are various electromagnetic interferences in the EMC laboratory, a signal transmission unit is disposed in the EMC load box 120, so that the control signal and serial data sent by the regional controller 110 are transmitted to the upper computer 130 through the data transmission unit, so as to reduce the influence of the electromagnetic interferences on the control signal and the serial data.

Optionally, with continued reference to fig. 1, the communication conversion module 140 includes: a communication conversion unit 141 and an optical fiber bridging unit 142.

The communication conversion unit 141 is configured to convert a USB signal into a CAN signal, or convert a CAN signal into a USB signal; the first end of the communication conversion unit 141 is connected to the host computer, and the second end of the communication conversion unit 141 is connected to the optical fiber bridging unit 142.

It CAN be understood that the external communication mode of the upper computer 130 is USB communication, and the external communication mode of the regional controller 110 is CAN communication. When the host computer 130 communicates with the zone controller 110, a communication format conversion is required. Accordingly, the communication conversion unit 141 is provided in the communication conversion module 140 so that the upper computer 130 can communicate with the zone controller 110.

The optical fiber bridging unit is used for transferring signals outside the EMC laboratory to the inside of the EMC laboratory or transferring signals inside the EMC laboratory to the outside of the EMC laboratory; the second end of the optical fiber bridging unit is connected with the communication circuit module to be tested.

It will be appreciated that since the EMC laboratory environment is different from the EMC laboratory environment, the optical fiber is used for switching when the control signal and serial data are transmitted in and out of the EMC laboratory. Because the signal form transmitted in the optical fiber is an optical signal, the optical signal transmission is not affected by the change of electromagnetic environment. Therefore, the CAN signal is converted into the optical signal for transmission by transmission in and out of the EMC laboratory, and the optical signal is converted into the CAN signal after the environmental conversion is completed, so that the influence of the environmental conversion on the test result is reduced.

Optionally, with continued reference to fig. 1, based on the above embodiment, the optical fiber bridging unit includes: a first optical bridge 1421, a second optical bridge 1422, and optical fibers.

The first optical bridge 1421 and the second optical bridge 1422 are both used for signal conversion, to convert a CAN signal into an optical signal, or to convert an optical signal into a CAN signal; the first optical bridge 1421 is disposed outside the EMC laboratory, the first end of the first optical bridge 1421 is used as the first end of the optical fiber bridging unit, the second end of the first optical bridge 1421 is connected to the first end of the second optical bridge 1422 through an optical fiber, and the second end of the second optical bridge 1422 is used as the second end of the optical fiber bridging unit.

Optionally, with continued reference to fig. 1, based on the foregoing embodiment, the testing apparatus further includes: an artificial power supply network 150.

The artificial power supply network 150 is used for providing power for the EMC load box 120, and the artificial power supply network 150 is connected with the EMC load box 120; the EMC load box 120 is connected with the communication circuit module 111 to be tested by twisted pair.

In particular, twisted pair is the most commonly used transmission medium in integrated wiring engineering and consists of two copper wires with insulating protective layers. Two insulated copper wires are twisted together according to a certain density, and the electric wave radiated by each wire in transmission can be counteracted by the electric wave emitted by the other wire, so that the degree of signal interference is effectively reduced.

It should be noted that, the tested communication circuit module 111 is a PSI5 communication circuit module, and the PSI5 communication signal is characterized in that the voltage power supply line and the signal line adopt the same line for transmission, and the data on the signal line adopts manchester coding for digital transmission, and the communication rate is two kinds of 125kbps and 189 kbps.

Optionally, with continued reference to fig. 1, an antenna 160 is provided in the emc laboratory, the antenna 160 being used to generate the interference signal, on the basis of the above-described embodiments.

Fig. 3 is a schematic circuit diagram of a tested communication circuit module according to an embodiment of the present invention. Illustratively, referring to fig. 3, the communication circuit module 111 under test is a PSI5 communication circuit module, the driving control pin VGS of the transceiver chip 200 of the PSI5 communication circuit module is used to control the power supply of the driving pin VAS, the driving pin VAS of the transceiver chip 200 is used to control the power supply of the first signal output pin PSI1 of the transceiver chip 200 and the power supply of the second signal output pin PSI2 of the transceiver chip 200, the first signal output pin PSI1 of the transceiver chip 200 and the second signal output pin PSI2 of the transceiver chip 200 are used to power the sensor unit, and for communicating with the sensor unit, the first signal output pin PSI1 of the transceiver chip 200 is connected with the sensor unit through the first resistive-capacitive matching unit 210, the second signal output pin PSI2 of the transceiver chip 200 is connected with the sensor unit through the second resistive-capacitive matching unit 220, the first high level pin BH1 of the transceiver chip 200 is connected to the first low level pin BL1 of the transceiver chip 200 through a sixth capacitor C6, the second high level pin BH2 of the transceiver chip 200 is connected to the second low level pin BL2 of the transceiver chip 200 through a seventh capacitor C7, the sixth capacitor C6 is used to supply a trigger voltage to the sensor unit, the seventh capacitor C7 is used to supply a trigger voltage to the sensor unit, the first output pin DOUT1 of the transceiver chip 200 is used to interrupt signal transmission and data reading, the second output pin DOUT2 of the transceiver chip 200 is used to interrupt signal transmission and data reading, the enable pin CS of the transceiver chip 200, the clock pin SCLK of the transceiver chip 200, the data input pin MOSI of the transceiver chip 200 and the data output pin MISO of the transceiver chip 200 are used to transmit a register control signal and serial data within the transceiver chip 200, the reset pin RESETN of the transceiver chip 200 is used to reset the transceiver chip 200.

Specifically, the drive control pin VGS of the transceiver chip 200 of the PMOSI5 communication circuit module controls the conduction of the external MOS transistor Q1 to supply power to the drive pin VAS, the first signal output pin PMOSI1 and the second signal output pin PMOSI2 are powered by the drive pin VAS of the chip, the first capacitor C1 and the second capacitor C2 are two power supply filter capacitors of the drive pin VAS, and the first signal output pin PMOSI1 and the second signal output pin PMOSI2 supply power to and communicate with the sensor unit; the sixth capacitor C6 and the seventh capacitor C7 are two bootstrap capacitors, and the sixth capacitor C6 and the seventh capacitor C7 provide pulse voltages for triggering an external sensor; the second resistor R2, the ninth capacitor C9 and the eighth capacitor C8 are matching resistance-capacitances of the first signal output pin PMOSI 1; the third resistor R3, the tenth capacitor C10 and the eleventh capacitor C11 are matching resistance-capacitances of the second signal output pin PMOSI 2; the first output pin DOUT1 and the second output pin DOUT2 are used as interrupt pins, MCU signals are interrupted after the internal register is full, data are read, the fourth resistor R4 is a redundant resistor of the first output pin DDOUT1, and the fifth resistor R5 is a redundant resistor of the second output pin; the enable pin CS, the clock pin SCLK, the data input pin MOSI and the data output pin MISO of the transceiver chip 200 are respectively connected to the corresponding four pins on the area controller 110 for transmitting the control signals and serial data of the registers in the transceiver chip 200, wherein the enable pin CS is pulled up to +5v through the seventh resistor R7, and the data output pin MISO is pulled up to +5v through the eighth resistor R8.

The embodiment of the invention also provides a communication circuit testing method which is applied to the communication circuit testing device provided by any embodiment. Fig. 4 is a flowchart of a method for testing a communication circuit according to an embodiment of the present invention. Referring to fig. 4, the communication circuit testing method includes:

s110, the upper computer generates a configuration instruction according to the interactive content.

Specifically, a man-machine interaction interface is arranged in the upper computer, a user can input configuration information through the man-machine interaction interface, and the upper computer generates a corresponding configuration instruction according to the configuration information and sends the configuration instruction to the regional controller. It should be noted that the upper computer may be a computer, and the specific form of the upper computer is not limited in this embodiment, and the set upper computer may meet the use requirement.

S120, the regional controller configures the tested communication circuit module according to the configuration instruction.

Specifically, the regional controller receives a configuration instruction sent by the upper computer, analyzes the configuration instruction, and configures a register of the tested communication circuit module according to the analyzed instruction.

S130, the communication circuit module to be tested acquires a sensing signal.

Specifically, the sensor unit transmits the sensing data to the communication circuit to be tested.

And S140, the area controller generates a control signal according to the sensing signal.

Specifically, the communication format adopted by the communication between the measured communication circuit module and the sensor unit is PSI5 communication. Therefore, after receiving the sensing data, the tested communication circuit module also performs format conversion on the sensing data, and converts the sensing data format into a format which can be identified by the area controller. The regional controller generates a control signal according to the converted sensing data and sends the control signal to the upper computer.

And S150, the upper computer performs function test on the communication of the tested communication circuit module according to the control signal.

Specifically, when the upper computer receives the control instruction, the tested communication circuit module is indicated to work normally; when the upper computer does not receive the control instruction, the abnormal operation of the tested communication circuit module is indicated.

S160, the upper computer acquires serial data of the tested communication circuit module.

The area controller sends a debug command to the communication circuit module under test, and the communication circuit module under test generates serial data according to the debug command and sends the serial data to the area controller. The regional controller transmits the serial data to the host computer.

S170, the upper computer tests the power supply voltage of the tested communication circuit module, the superposition voltage of the signal output port and the trigger voltage according to the serial data.

The upper computer analyzes the serial data sent by the area controller, obtains the power supply voltage of the tested communication circuit module, the superposition voltage of the signal output port and the trigger voltage, and compares the tested voltage with the corresponding reference value to obtain the test result.

Fig. 5 is a flowchart of a configuration of a communication circuit module to be tested according to an embodiment of the present invention. Optionally, referring to fig. 5, the step of configuring the area controller according to the configuration instruction by using the measured communication circuit module includes:

s121, setting a general register.

Illustratively, the synchronization pulse length of the transceiver chip of the tested communication circuit module, the method for generating the working mode pulse and the external clock are set, the verification mode of the sensor unit is set, and the output voltage of the driving pin of the transceiver chip of the tested communication circuit module is set.

S122, setting a channel control register.

For example, whether the output voltage of the driving pin of the transceiver chip of the tested communication circuit module is enabled or not is set, and whether the signal output pin of the transceiver chip of the tested communication circuit module is enabled or not is set.

S123, setting a channel related register.

The synchronous pulse voltage, the quiescent current limit value, the number of connected sensor units and the communication rate of the signal output pins of the transceiver chip of the tested communication circuit module are set, and whether the output pins of the transceiver chip of the tested communication circuit module are interrupt outputs or not is set. It should be noted that, the number of channels included in different tested communication circuit modules is different, and when the tested communication circuit module includes a plurality of channels, a channel related register of each channel needs to be set.

S124, setting a diagnosis register.

Specifically, the under-voltage fault, the short-circuit fault to ground, the earth leakage fault, the power short-circuit fault and the short-circuit fault between adjacent channels of the tested communication circuit module are set, and the open-circuit fault of the sensor unit is set.

It should be noted that the specific setting content may be determined according to the tested communication circuit module during the actual test, which is not limited in this embodiment.

It should be appreciated that various forms of the flows shown above may be used to reorder, add, or delete steps. For example, the steps described in the present invention may be performed in parallel, sequentially, or in a different order, so long as the desired results of the technical solution of the present invention are achieved, and the present invention is not limited herein.

The above embodiments do not limit the scope of the present invention. It will be apparent to those skilled in the art that various modifications, combinations, sub-combinations and alternatives are possible, depending on design requirements and other factors. Any modifications, equivalent substitutions and improvements made within the spirit and principles of the present invention should be included in the scope of the present invention.

Claims (9)

1. A communication circuit testing apparatus, comprising:

the area controller is provided with a communication circuit module to be tested;

the EMC load box is connected with the regional controller; the EMC load box is provided with a shielding layer, and the shielding layer is used for shielding interference signals; the EMC load box is provided with a sensor unit, the sensor unit is used for receiving an instruction sent by the tested communication circuit module and feeding back data in the sensor unit to the tested communication circuit module, and the EMC load box is provided with a test port which is used for connecting test equipment;

the upper computer is connected with the communication conversion module between the upper computer and the EMC load box, and is communicated with the regional controller through the communication conversion module, and the upper computer is used for configuring a shift register associated with testing the tested communication circuit module after the regional controller works;

wherein, regional controller with EMC load case sets up in EMC laboratory.

2. The communication circuit testing device of claim 1, wherein the EMC load box comprises: an analog unit and a signal transmission unit;

the simulation unit is used for providing a simulation environment for the sensor unit;

the signal transmission unit is used for receiving the control signal sent by the area controller, and is connected with the area controller.

3. The communication circuit testing device of claim 1, wherein the communication conversion module comprises: the communication conversion unit and the optical fiber bridging unit;

the communication conversion unit is used for converting the USB signal into a CAN signal or converting the CAN signal into the USB signal; the first end of the communication conversion unit is connected with the upper computer, and the second end of the communication conversion unit is connected with the optical fiber bridging unit;

the optical fiber bridging unit is used for transferring signals outside the EMC laboratory to the inside of the EMC laboratory or transferring signals inside the EMC laboratory to the outside of the EMC laboratory; the second end of the optical fiber bridging unit is connected with the tested communication circuit module.

4. A communication circuit testing device according to claim 3, wherein the optical fiber bridging unit comprises: the optical system comprises a first optical bridge, a second optical bridge and an optical fiber;

the first optical bridge and the second optical bridge are both used for signal conversion, so that the CAN signal is converted into an optical signal, or the optical signal is converted into the CAN signal;

the first optical bridge is arranged outside the EMC laboratory, the first end of the first optical bridge is used as the first end of the optical fiber bridging unit, the second end of the first optical bridge is connected with the first end of the second optical bridge through the optical fiber, and the second end of the second optical bridge is used as the second end of the optical fiber bridging unit.

5. The communication circuit testing device of claim 1, further comprising: an artificial power supply network;

the artificial power supply network is used for providing power for the EMC load box and is connected with the EMC load box;

and the EMC load box is connected with the tested communication circuit module by adopting twisted pair wires.

6. The communication circuit testing device according to claim 1, wherein an antenna is provided in the EMC laboratory, the antenna being configured to generate the interference signal;

the tested communication circuit module is a PSI5 communication circuit module, a driving control pin of a transceiver chip of the PSI5 communication circuit module is used for controlling power supply of a driving pin, the driving pin of the transceiver chip is used for controlling power supply of a first signal output pin of the transceiver chip and power supply of a second signal output pin of the transceiver chip, the first signal output pin of the transceiver chip and the second signal output pin of the transceiver chip are used for supplying power to the sensor unit and are used for communicating with the sensor unit, the first signal output pin of the transceiver chip is connected with the sensor unit through a first resistance-capacitance matching unit, the second signal output pin of the transceiver chip is connected with the sensor unit through a second resistance-capacitance matching unit, the first high level end of the transceiver chip is connected with the first low level end of the transceiver chip through a sixth capacitor, the second high level end of the transceiver chip is connected with the second low level end of the transceiver chip through a seventh capacitor, the sixth capacitor is used for providing trigger voltage for the sensor unit, the seventh capacitor is used for providing trigger voltage for the sensor unit, the first output pin of the transceiver chip is used for interrupting signal transmission and data reading, the second output pin of the transceiver chip is used for interrupting signal transmission and data reading, the enabling pin of the transceiver chip, the clock pin of the transceiver chip, the data input pin of the transceiver chip and the data output pin of the transceiver chip are used for transmitting register control signals and serial data in the transceiver chip, the reset pin of the transceiver chip is used to reset the transceiver chip.

7. A communication circuit testing method, which is applied to the communication circuit testing device of any one of claims 1 to 6, comprising:

the upper computer generates a configuration instruction according to the interactive content;

the regional controller configures the communication circuit module to be tested according to the configuration instruction;

the communication circuit module to be tested acquires a sensing signal;

the area controller generates a control signal according to the sensing signal;

the upper computer performs function test on the communication of the tested communication circuit module according to the control signal;

the upper computer acquires serial data of the tested communication circuit module;

and the upper computer tests the power supply voltage, the superposition voltage of the signal output port and the trigger voltage of the tested communication circuit module according to the serial data.

8. The method according to claim 7, wherein the step of configuring the communication circuit module under test by the area controller according to the configuration instruction comprises:

setting a general register;

setting a channel control register;

setting a channel related register;

a diagnostic register is set.

9. The method of claim 8, wherein the step of setting a general purpose register comprises:

setting the synchronous pulse length of a transceiver chip of the tested communication circuit module, a method for generating an engineering mode pulse and an external clock;

setting a verification mode of the sensor unit;

setting output voltage of a driving pin of a transceiver chip of the tested communication circuit module;

the step of setting the channel control register includes:

setting whether the output voltage of a driving pin of a transceiver chip of the tested communication circuit module is enabled or not;

setting whether a signal output pin of a transceiver chip of the tested communication circuit module is enabled or not;

the step of setting the channel dependent register comprises:

setting synchronous pulse voltage, quiescent current limit value, number of connected sensor units and communication rate of a signal output pin of a transceiver chip of the tested communication circuit module;

setting whether an output pin of a transceiver chip of the tested communication circuit module is an interrupt output or not;

the step of setting a diagnostic register includes:

setting an output undervoltage fault, a ground short-circuit fault, a ground leakage current fault, a power supply short-circuit fault and a short-circuit fault between adjacent channels of the tested communication circuit module;

an open circuit fault of the sensor unit is set.